MIC test device and test method

Abstract

The invention discloses a MIC test device and a test method, and relates to the field of microphone testing. The MIC test device uses a sound card module to output an audio test signal, and a sounding module converts the audio test signal into an audio test signal simulating human voice and outputs it. After at least one MIC to be tested receives the audio test signal converted into the audio test signal simulating human voice, at least one MIC to be tested outputs an undecoded test signal to be analyzed, and then at least one undecoded test signal to be analyzed is sent to a decoding module for decoding to obtain at least one decoded test signal to be analyzed, and at least one decoded test signal to be analyzed is transmitted to an analysis module through a sound card module for analysis to determine the quality of at least one MIC. By placing at least one MIC to be tested in the MIC test device, multiple MIC tests can be implemented, the test process of the MIC is optimized, the test efficiency of the MIC is improved, and the production efficiency of the MIC is further improved.

Description

Technical Field

[0001] The present invention relates to the field of microphone testing, and in particular to a MIC testing device and a testing method. Background Art

[0002] MEMS MIC (micro-electromechanical system microphone) is a micro-capacitor composed of a silicon diaphragm and a silicon back plate, which can convert sound pressure changes into capacitance changes, and then convert and amplify them into electrical signals through an ASIC chip to achieve sound-to-electric conversion. During the MEMS MIC processing, due to the precise structure of the MEMS MIC, its testing process is cumbersome, and the testing process requires manual testing once, which has low testing efficiency, thus affecting the efficiency of product production and causing the product delivery date to be unable to be met. Summary of the invention

[0003] Therefore, the technical problem to be solved by the present invention is to overcome / alleviate the problem of low production efficiency of MEMS MIC in the prior art, thereby providing a MIC testing device, comprising:

[0004] A sound card module, used for outputting an audio test signal and transmitting at least one decoded test signal to be analyzed;

[0005] A sound module, connected to the sound card module, for receiving the audio test signal and converting the audio test signal into an audio test signal simulating a human voice;

[0006] The test module is used to fix at least one MIC to be tested in the test module, so that the at least one MIC to be tested receives the audio test signal converted into the simulated human voice, and outputs at least one undecoded test signal to be analyzed;

[0007] A decoding module, connected to the test module and the sound card module respectively, for performing audio decoding on the at least one undecoded test signal to be analyzed, and outputting at least one decoded test signal to be analyzed;

[0008] The analysis module is connected to the sound card module and is used to receive the at least one decoded test signal to be analyzed, analyze the at least one decoded test signal to be analyzed, and determine the quality of the at least one MIC to be tested.

[0009] Optionally, the sound card module includes:

[0010] at least one output unit, connected to the sound module, for outputting the audio test signal;

[0011] At least one input unit, each of which is connected to the decoding module and the testing module respectively, and is used to receive a decoded test signal to be analyzed and an undecoded test signal to be analyzed.

[0012] Optionally, the sound card module further includes:

[0013] a communication unit, connected to the analysis module, and configured to transmit the at least one decoded test signal to be analyzed;

[0014] The power supply unit is used to provide electrical energy for the normal operation of the sound card module.

[0015] Optionally, test modules including:

[0016] A carrying component, used for carrying at least one MIC to be tested;

[0017] A limit assembly, disposed on the bearing assembly, for limiting the movement of the MIC to be tested;

[0018] The test component is arranged on the carrying component and does not overlap with the limiting component; when the test component is close to the carrying component, the test point of the MIC to be tested overlaps with the test component, and the test component is respectively connected to the decoding module and the sound card module.

[0019] Optionally, the bearing assembly comprises:

[0020] A first carrier, used for carrying a MIC to be tested;

[0021] A second bearing member, used for bearing the first bearing member;

[0022] The third bearing member is used to bear the second bearing member, and the thickness of the first bearing member is smaller than the thickness of the second bearing member or the third bearing member.

[0023] Optionally, test components including:

[0024] At least one test pin card, the test end of the test pin card corresponds to the test point of the MIC to be tested, and the connection end of the test pin card corresponds to the decoding channel of the decoding module.

[0025] Optionally, the test component further includes:

[0026] A pre-pressing assembly is used to make the test needle card contact with the bearing assembly.

[0027] Optionally, the test component further includes:

[0028] The upper cover body, the cavity formed by the upper cover body and the bearing assembly partly fits together to accommodate at least one MIC to be tested, the pre-pressing assembly is connected to the upper surface of the upper cover body, and the test pin is arranged at the part of the upper cover body close to the MIC to be tested.

[0029] The present application also provides a MIC testing method, which is applied to the MIC testing device described above, and includes:

[0030] Controlling the sound card module to send an audio test signal to the sound module, and the sound module converts the audio test signal into an audio test signal simulating human voice after receiving the audio test signal;

[0031] When at least one MIC to be tested on the test module receives the audio test signal converted into a simulated human voice, it outputs at least one undecoded test signal to be analyzed;

[0032] The decoding module receives the at least one undecoded test signal to be analyzed and performs audio decoding, and then outputs at least one decoded test signal to be analyzed;

[0033] The analysis module receives the at least one decoded test signal to be analyzed, analyzes the at least one decoded test signal to be analyzed, and determines the quality of the at least one MIC to be tested.

[0034] Optionally, the analysis module receives the at least one decoded test signal to be analyzed, analyzes the at least one decoded test signal to be analyzed, and determines the quality of the at least one MIC to be tested, including:

[0035] Obtaining at least one decoded test signal to be analyzed;

[0036] Extracting DC voltage information from the at least one decoded test signal to be analyzed, and converting the DC voltage information into measurement information;

[0037] Determining whether the measurement information meets a preset target range;

[0038] If the measurement information meets the preset target range, the MIC corresponding to the measurement information is determined as a good product.

[0039] The MIC test device provided in the present application includes: a sound card module, a sound module, a test module, a decoding module and an analysis module. In the present application, the sound card module is used to output an audio test signal to the sound module, and the sound module converts the audio test signal into an audio test signal simulating human voice. Then, at least one MIC to be tested arranged in the test module receives the audio test signal converted into a simulated human voice. After the MIC to be tested receives the audio test signal converted into a simulated human voice, at least one MIC to be tested outputs an undecoded test signal to be analyzed. Then, at least one undecoded test signal to be analyzed is sent to the decoding module for decoding to obtain at least one decoded test signal to be analyzed. The at least one decoded test signal to be analyzed is transmitted to the analysis module through the sound card module for analysis to determine the quality of at least one MIC. Therefore, by placing at least one MIC to be tested in the MIC test device, it is possible to test multiple MICs, optimize the test process of the MIC, improve the test efficiency of the MIC, and further improve the production efficiency of the MIC. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the specific implementation methods of the present invention or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0041] Figure 1 A schematic diagram of the structure of a MIC testing device provided in this application.

[0042] Figure 2 This is a schematic diagram of the structure of the sound card module in the MIC testing device provided in an embodiment of the present application.

[0043] Figure 3 This is a schematic diagram of the structure of the sound card module in the MIC testing device provided in an embodiment of the present application.

[0044] Figure 4 A schematic diagram of the process of the MIC test method provided in the embodiment of the present application.

[0045] Figure 5 This is a flowchart of steps S41 to S44 in the MIC testing method provided in an embodiment of the present application.

[0046] Reference numerals:

[0047] 1-sound card module; 2-sound module; 3-test module; 4-decoding module; 5-analysis module; 11-output unit; 12-input unit; 13-communication unit; 14-power supply unit; 31-carrying component; 32-limiting component; 33-testing component; 311-first carrier; 312-second carrier; 313-third carrier; 331 test needle card; 34-pre-pressing component. DETAILED DESCRIPTION

[0048] The technical solution of the present invention will be described clearly and completely below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0049] In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", and "third" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.

[0050] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, it can also be the internal connection of two components, it can be a wireless connection, or it can be a wired connection. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0051] In addition, the technical features involved in the different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0052] It should be noted that, since the existing MEMS MIC (MEMS Microphone) is manually inspected by operators individually, and the existing MEMS MIC (hereinafter referred to as MIC) needs to be protected from moisture, sun, shock, pressure, etc. during inspection or testing to prevent MIC failure, which in turn affects the MIC test efficiency and MIC production efficiency. To this end, the present application provides a MIC test device and method that uses a MIC test device to detect multiple MICs at a time, and at the same time, using the test device to perform MIC testing can also reduce or avoid the possibility of MIC failure, thereby improving the MIC detection efficiency and production efficiency to meet customer needs.

[0053] like Figure 1 As shown, it is a structural schematic diagram of a MIC test device provided by the present application, wherein the MIC test device provided by the present application includes: a sound card module 1, a sound module 2, a test module 3, a decoding module 4 and an analysis module 5, wherein the decoding module 4 is connected to the sound card module 1.

[0054] The sound card module 1 is respectively connected to the sound generating module 2, the decoding module 4 and the analyzing module 5. The sound card module 1 is used to output an audio test signal and transmit at least one decoded test signal to be analyzed.

[0055] The sound module 2 is connected to the sound card module 1 , and is used for receiving an audio test signal and converting the audio test signal into an audio test signal simulating a human voice.

[0056] The test module 3 is connected to the decoding module 4 and the sound card module 1. The test module 3 is used to fix at least one MIC to be tested, so that the at least one MIC to be tested receives an audio test signal converted into a simulated human voice and outputs at least one undecoded test signal to be analyzed.

[0057] The decoding module 4 is connected to the test module 3 and the sound card module 1 respectively. The decoding module 4 is used to perform audio decoding on at least one undecoded test signal to be analyzed, and output at least one decoded test signal to be analyzed.

[0058] The analysis module 5 is connected to the sound card module 1 and is used for receiving at least one decoded test signal to be analyzed, analyzing at least one decoded test signal to be analyzed, and determining the quality of at least one MIC to be tested.

[0059] The MIC testing device provided in the present application utilizes the sound card module 1 to output an audio test signal to the sound module 2, and the sound module 2 converts the audio test signal into an audio test signal simulating a human voice, and then at least one MIC to be tested arranged in the test module 3 receives the audio test signal converted into a simulated human voice, and after the MIC to be tested receives the audio test signal converted into a simulated human voice, at least one MIC to be tested outputs an undecoded test signal to be analyzed, and then at least one undecoded test signal to be analyzed is sent to the decoding module 4 for decoding to obtain at least one decoded test signal to be analyzed, and at least one decoded test signal to be analyzed is transmitted to the analysis module 5 through the sound card module 1 for analysis to determine the quality of at least one MIC to be tested. Therefore, by placing at least one MIC to be tested in the MIC testing device, multiple MIC tests can be implemented, the test process of the MIC can be optimized, the test efficiency of the MIC can be improved, and the production efficiency of the MIC can be further improved.

[0060] For ease of understanding, the working process of the MIC test device provided by the present application will be described by taking the test of 4 MICs as an example. Specifically, when the user needs to use the MIC test device provided by the present application to test the MIC, the user can place 4 MICs in the test module 3, wherein the 4 MICs can be a single MIC or 4 contiguous / assembled MICs, and then the user sends a control instruction to the sound card module 1 through the terminal or the control center or the analysis module 5 to control the sound card module 1 to send an audio test signal to the sound module 2, and when the sound module 2 receives the audio test signal, the sound module 2 converts the audio test signal into an audio test signal simulating human voice, and after the audio test signal simulating human voice is sent and received by the 4 MICs in the test module 3, the 4 MICs send the received audio test signal simulating human voice to the decoding module 4 for decoding, and send the 4 MIC test signals to be analyzed output after decoding to the analysis module 5, and finally the analysis module 5 judges the good condition of the samples of the 4 MICs and determines the good MIC among the 4 MICs.

[0061] In this embodiment, multiple MICs to be tested are placed in a MIC test device for one test, thereby alleviating the tediousness of a single MCI test, optimizing the test process, and ensuring the consistency of the current MIC test conditions, thereby improving the MIC test series and improving the efficiency of product production.

[0062] Combination Figure 2 and Figure 3The MIC test device provided in the present application is based on the above-mentioned MIC test device, and its sound card module 1 includes: at least one output unit 11 and at least one input unit 12, wherein at least one output unit 11 is connected to the sound module 2, and the output unit 11 is used to output an audio test signal; at least one input unit 12, wherein each input unit 12 is respectively connected to the decoding module 4 and the test module 3, and the input unit 12 is used to receive the decoded test signal to be analyzed and the undecoded test signal to be analyzed.

[0063] In this embodiment, at least one input unit 12 and at least one output unit 11 are provided to implement testing of multiple MICs at the same time, thereby increasing the MIC test speed and improving the MIC productivity; and by utilizing multiple input units 12 and multiple output units 11, synchronous multi-channel testing can be implemented to save MIC test time and improve test efficiency.

[0064] Optionally, the sound card module 1 further includes: a communication unit 13 and a power supply unit 14, the communication unit 13 is connected to the analysis module 5, and the communication unit 13 is used to transmit at least one decoded test signal to be analyzed. The power supply unit 14 is used to provide electrical energy for the normal operation of the sound card module 1. The communication unit 13 is provided to facilitate the transmission of test data, so as to more flexibly analyze the test data of the MIC, so as to quickly determine the quality of the MIC.

[0065] Optionally, the test module 3 is also connected to the sound card module 1. In order to ensure that the data measured by the test module 3 is the same as the data output by the sound card module 1, the signal directly collected by the test module 3 can also be sent to the sound card module 1 for comparison and verification to ensure the accuracy of the test data, thereby improving the accuracy and yield rate of the MIC test results, reducing the possibility of program review, and thus improving the MIC test efficiency.

[0066] The test module 3 in the MIC test device provided in the embodiment of the present application includes: a carrying component 31, a limiting component 32 and a test component 33, wherein the carrying component 31 is used to carry at least one MIC to be tested.

[0067] In this embodiment, the carrier assembly 31 may include: a first carrier 311 , a second carrier 312 and a third carrier 313 , wherein the first carrier 311 is used to carry the MIC to be tested; the second carrier 312 is used to carry the first carrier 311 , and the third carrier 313 is used to carry the second carrier 312 .

[0068] In this embodiment, the third carrier 313 is a product tray, the thickness of which is 5 mm, and is used to carry at least one MIC product. The second carrier 312 is a tray carrier plate, the thickness of which is 10 mm, and the tray carrier plate is used to carry the product tray. The first carrier 311 is a substrate, the thickness of which is 10 mm, and the substrate is used to carry the second carrier 312 and the third carrier 313. The carrier is provided to protect the MIC so that it can be stably placed in the test module 3, and to eliminate / reduce the influence of the external environment on the MIC.

[0069] Optionally, the thickness of the first carrier 311 is smaller than the thickness of the second carrier 312 or the third carrier 313 , the bearing area of ​​the first carrier 311 is smaller than the bearing area of ​​the second carrier 312 , and the bearing area of ​​the second carrier 312 is smaller than the bearing area of ​​the third carrier 313 .

[0070] In this embodiment, since the test module 3 is in a sealed cavity when testing the MIC, and in order to obtain the best test effect, the MIC to be tested needs to be set in the central area of ​​the test module 3 as much as possible, and since the thickness of the first carrier 311 is less than the thickness of the second carrier 312 or the third carrier 313, it is ensured that the MIC in the cavity can obtain the test signal at the first time.

[0071] The limiting assembly 32 is disposed on the carrying assembly 31 , and the limiting assembly 32 is used to limit the movement of the MIC to be tested.

[0072] In this embodiment, the limit assembly 32 is a limit block, and its thickness is 11 mm. The limit cover is set on the MIC, and the cavity formed by the limit block and the bearing assembly 31 is used to place at least one MIC to be tested. The limit assembly 32 is set to avoid the MIC to be tested from moving due to the vibration of the sound field during the test, which affects the test results. Therefore, the limit assembly 32 is set to ensure the accuracy of the test and the efficiency of product testing.

[0073] The test component 33 can be arranged on the carrying component 31, and the test component 33 does not overlap with the limiting component 32; when the test component 33 is close to the carrying component 31, the test point of the MIC to be tested overlaps with the test component 33, and the test component 33 is connected to the decoding module 4 and the sound card module 1 respectively.

[0074] Optionally, the test component 33 includes:

[0075] At least one test pin card 331 , the test end of the test pin card 331 corresponds to the test point of the MIC to be tested, and the connection end of the test pin card 331 corresponds to the decoding channel of the decoding module 4 .

[0076] In this embodiment, the test pin card 331 is composed of three pins and a spring wire, and its function is to contact the pads of the MIC for data transmission and power supply, so as to drive multiple MICs to work.

[0077] Optionally, the test component 33 further includes:

[0078] The pre-pressing member 34 is used to make the test pin card 331 contact with the carrier assembly 31 .

[0079] In this embodiment, the pre-pressing member 34 is a pre-pressing block, which is set to pre-press the vicinity of the MIC to be tested to prevent sound leakage. Then the test needle card 331 will test the MIC and feed back information to the MIC, and send the output result to the analysis module 5.

[0080] Optionally, the test component 33 further includes:

[0081] The quick clamp is used to move toward the MIC to fix the MIC to prevent the movement of the MIC to affect the test result when the MIC to be tested is tested.

[0082] In this embodiment, the sound card module 1 may be an all-in-one sound card, the sound module 2 may be a sound wave generator, the analysis module 5 may be a controller or a computer, the decoding module 4 may be a decoder, and the test module 3 may be a test fixture; Figures 1 to 3As shown, the sound wave generator is used to simulate a module that emits sound similar to an artificial mouth; the sound wave generator is connected to the sound card integrated machine through a connecting line, and the sound card integrated machine outputs a sound wave signal to the sound wave generator; the signal of the sound wave generator is transmitted to the MIC to be tested through a test fixture, and when the MIC to be tested receives the sound wave generator signal, it is transmitted to the decoder; the decoder receives the signal and transmits it to the sound card integrated machine; then the signal of the sound card integrated machine is transmitted to the computer and the test audio software in the computer judges the received signal; finally, the test result is output by the test software of the computer. The audio test signal is outputted through the sound card module 1, and the sound module 2 converts the audio test signal into a sound signal with stable frequency and decibel, that is, converts it into an audio test signal simulating human voice. Then, the MIC to be tested in the test module 3 senses / receives the audio test signal converted into a simulated human voice, and converts the signal into an AC signal with relatively stable amplitude that is the same as the standard sound source, that is, the undecoded test signal to be analyzed. Then, the undecoded test signal to be analyzed is sent to the decoding module 4 for decoding and outputting the AC-to-DC signal, and after linearly amplifying the signal, a relatively stable DC voltage signal is output, that is, the decoded test signal to be analyzed. Then, the decoded test signal to be analyzed is sent to the analysis module 5 for analysis. If the amplitude information / effective information of the decoded test signal to be analyzed is within the target range, the MIC corresponding to the decoded test signal to be analyzed can be determined as a good product, otherwise it is a defective product.

[0083] In this embodiment, the bearing assembly 31 and the limiting assembly 32 can be combined to form a test cavity required for testing the MIC. Performing the MIC test in the cavity can reduce environmental and external interference on the MIC and ensure the stability and accuracy of the MIC test.

[0084] Optionally, the decoding module 4 may be a decoder, which converts the digital MIC signal into an analog signal, and then sends the signal to the sound card module 1, and finally passes it to the analysis module 5 through the sound card module 1 for display, and the display result is a standard decibel value.

[0085] Optionally, the analysis module 5 may be a computer or a terminal server, which is used to analyze the test signal to be analyzed, determine and output the quality of the measured multiple MICs.

[0086] like Figures 4 to 5 As shown, an embodiment of the present application provides a MIC testing method, the MIC testing method provided by the present application, the MIC testing method is applied to the above-mentioned MIC testing device, and the MIC testing method includes:

[0087] S1, controlling the sound card module to send an audio test signal to the sound module, and the sound module converts the audio test signal into an audio test signal simulating human voice after receiving the audio test signal;

[0088] S2: when at least one MIC to be tested on the test module receives an audio test signal converted into a simulated human voice, it outputs at least one undecoded test signal to be analyzed;

[0089] S3, the decoding module receives at least one undecoded test signal to be analyzed and performs audio decoding, and then outputs at least one decoded test signal to be analyzed;

[0090] S4, the analysis module receives at least one decoded test signal to be analyzed, analyzes the at least one decoded test signal to be analyzed, and determines the quality of at least one MIC to be tested.

[0091] In this embodiment, the user needs to place the MIC to be tested into the test module in advance, and then the user controls the analysis module to send an analysis instruction to the sound card module. After receiving the analysis instruction, the sound card module sends a corresponding test signal (audio test signal) to the sound module according to the analysis instruction, where the sound card module needs to convert the test signal (electrical signal) into a sound wave signal for transmission.

[0092] When the single or multiple MICs in the test module receive and transmit the sound wave signal, the sound wave signal is converted into an electrical signal (undecoded test signal to be analyzed), and then the electrical signal is sent to the decoding unit for test signal decoding, and then the decoded single or multiple signals are sent to the sound card module, which formats or organizes the signal data, and then sends the corresponding signal (decoded test signal to be analyzed) to the analysis module for analysis and identification to determine the quality of the tested MIC, where the test parameters or test items can be determined according to the MIC industry test standards. For example: the judgment of MIC good products can be based on the requirements of the MIC specification book, for example: the Goertek MIC full-band (100HZ-8000HZ) specification requirement is -38±3DB, then the test result in this range is a good product.

[0093] Optionally, the analysis module may be a terminal device or a computer.

[0094] Optionally, the analysis module receives at least one decoded test signal to be analyzed, analyzes at least one decoded test signal to be analyzed, and determines the quality of at least one MIC to be tested, including:

[0095] S41, obtaining at least one decoded test signal to be analyzed;

[0096] S42, extracting DC voltage information from at least one decoded test signal to be analyzed, and converting the DC voltage information into measurement information;

[0097] S43, determining whether the measurement information meets a preset target range;

[0098] S44: If the measurement information meets the preset target range, the MIC corresponding to the measurement information is determined as a good product.

[0099] In this embodiment, when the control sound card module sends an audio test signal (i.e., an electrical signal) to the sound module, the sound module receives the audio test signal and converts the audio test signal into an audio test signal simulating human voice (i.e., a sound signal with a stable frequency and decibel emitted by a standard sound source); when at least one MIC to be tested on the test module receives the audio test signal converted into a simulated human voice, at least one undecoded test signal to be analyzed is output, and at this time, the undecoded test signal to be analyzed can be a sound that is sensed by the microphone, and the microphone will output an AC signal with the same amplitude as the standard sound source and relatively stable amplitude; then the decoding module receives at least one undecoded test signal to be analyzed and performs audio decoding, and then outputs at least one decoded test signal to be analyzed; the decoded test signal to be analyzed can be an AC signal that is converted by the AC to DC module and the linear amplification module in the decoding module, and outputs a relatively stable DC voltage signal; then the analysis module measures the DC voltage to achieve the purpose of measuring the AC signal (amplitude or effective value) output by the microphone, wherein in the process of analyzing the AC signal, if its amplitude or effective value is within the set upper and lower limits, the microphone is a good product. Otherwise, it is a defective product. Optionally, the preset target range may be determined based on industry testing requirements.

[0100] Obviously, the above embodiments are merely examples for the purpose of clear explanation, and are not intended to limit the implementation methods. For those skilled in the art, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the implementation methods here. The obvious changes or modifications derived therefrom are still within the scope of protection of the invention.

Claims

1. A MIC test device, characterized in that: include: A sound card module, used for outputting an audio test signal and transmitting at least one decoded test signal to be analyzed; A sound module, connected to the sound card module, for receiving the audio test signal and converting the audio test signal into an audio test signal simulating a human voice; A test module, used for fixing at least one MIC to be tested in the test module, so that the at least one MIC to be tested receives the audio test signal converted into the simulated human voice, and outputs at least one undecoded test signal to be analyzed; A decoding module, connected to the test module and the sound card module respectively, for performing audio decoding on the at least one undecoded test signal to be analyzed, and outputting at least one decoded test signal to be analyzed; The analysis module is connected to the sound card module and is used to receive the at least one decoded test signal to be analyzed, analyze the at least one decoded test signal to be analyzed, and determine the quality of the at least one MIC to be tested.

2. The MIC test device according to claim 1, characterized in that: The sound card module comprises: at least one output unit, connected to the sound module, for outputting the audio test signal; At least one input unit, each of which is connected to the decoding module and the testing module respectively, and is used to receive a decoded test signal to be analyzed and an undecoded test signal to be analyzed.

3. The MIC test device according to claim 2, characterized in that: The sound card module also includes: a communication unit, connected to the analysis module, and configured to transmit the at least one decoded test signal to be analyzed; The power supply unit is used to provide electrical energy for the normal operation of the sound card module.

4. The MIC test device according to claim 1, characterized in that: The test module comprises: A carrying component, used for carrying at least one MIC to be tested; A limit assembly, disposed on the bearing assembly, for limiting the movement of the MIC to be tested; The test component is arranged on the carrying component and does not overlap with the limiting component; when the test component is close to the carrying component, the test point of the MIC to be tested overlaps with the test component, and the test component is respectively connected to the decoding module and the sound card module.

5. The MIC test device according to claim 4, characterized in that: The bearing assembly comprises: A first carrier, used for carrying a MIC to be tested; A second bearing member, used for bearing the first bearing member; The third bearing member is used to bear the second bearing member, and the thickness of the first bearing member is smaller than the thickness of the second bearing member or the third bearing member.

6. The MIC test device according to claim 4, characterized in that: The test component comprises: At least one test pin card, the test end of the test pin card corresponds to the test point of the MIC to be tested, and the connection end of the test pin card corresponds to the decoding channel of the decoding module.

7. The MIC testing device according to claim 6, characterized in that: The test component further includes: A pre-pressing member is used to make the test needle card contact with the bearing assembly.

8. The MIC testing device according to claim 7, characterized in that: The test component further includes: The quick clamp is used to move closer to the MIC to fix the MIC to be tested.

9. A MIC testing method, characterized in that: The MIC testing method is applied to the MIC testing device according to any one of claims 1 to 8, and the MIC testing method includes: Controlling the sound card module to send an audio test signal to the sound module, and the sound module converts the audio test signal into an audio test signal simulating human voice after receiving the audio test signal; When at least one MIC to be tested on the test module receives the audio test signal converted into a simulated human voice, it outputs at least one undecoded test signal to be analyzed; The decoding module receives the at least one undecoded test signal to be analyzed and performs audio decoding, and then outputs at least one decoded test signal to be analyzed; The analysis module receives the at least one decoded test signal to be analyzed, analyzes the at least one decoded test signal to be analyzed, and determines the quality of the at least one MIC to be tested.

10. The MIC testing method according to claim 9, wherein the analyzing module receives the at least one decoded test signal to be analyzed, analyzes the at least one decoded test signal to be analyzed, and determines the quality of the at least one MIC to be tested, comprising: Acquire at least one decoded test signal to be analyzed; Extracting DC voltage information from the at least one decoded test signal to be analyzed, and converting the DC voltage information into measurement information; Determining whether the measurement information meets a preset target range; If the measurement information meets the preset target range, the MIC corresponding to the measurement information is determined as a good product.

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