DC-DC converter test method, device and system and storage medium

Abstract

The invention discloses a DC-DC converter test method, device and system and a storage medium. According to the testing method of the DC-DC converter, the DC-DC converter is controlled to be electrically connected with the control host through the testing transfer box, and after the board card side of the DC-DC converter and the control host are electrically connected with the simulator, the control host is controlled to complete automatic burning of a single board function testing program. The manual burning time is reduced; according to the method, the DC-DC converter is controlled to complete at least one single board function test, at least one complete machine function test, at least one aging function test and aging function retest after the DC-DC converter completes encapsulation, test indexes of the DC-DC converter are automatically judged, the production test efficiency is improved, and subsequent maintenance and upgrading are facilitated.

Description

Technical Field

[0001] The present invention relates to the technical field of DC-DC converters, and in particular to a testing method, device, system and storage medium for a DC-DC converter. Background Art

[0002] DC-DC converters are voltage conversion control devices that can convert input high-voltage DC power into output low-voltage DC power through efficient voltage conversion. The demand for them has increased dramatically in recent years.

[0003] At present, in the production test of DC-DC converters, testers are required to manually burn the test program, manually confirm the instrument data, and judge the test results based on the test indicators and communication data. In addition, the single-board and whole-machine test environment of the DC-DC converter is complex to set up, the connections are confusing, and the versatility of the test interface is poor, resulting in a long test time and low test efficiency for the DC-DC converter. Summary of the invention

[0004] The present invention provides a DC-DC converter testing method, device, system and storage medium to solve the current problems of long testing time and low testing efficiency of DC-DC converters.

[0005] According to one aspect of the present invention, a test method for a DC-DC converter is provided, wherein the DC-DC converter is applied to a test system for a DC-DC converter, wherein the test system for the DC-DC converter comprises a control host, a test adapter box, a simulator, a programmable power supply, and an electronic load, and wherein the test method for the DC-DC converter comprises:

[0006] Controlling the DC-DC converter to be electrically connected to the control host through the test adapter box, and after the board side of the DC-DC converter and the control host are electrically connected to the emulator respectively, controlling the control host to complete the burning of the single board function test program, and controlling the DC-DC converter to complete at least one single board function test;

[0007] Controlling the DC-DC converter to be electrically connected to the electronic load through the test adapter box, and after the control host is electrically connected to the electronic load, controlling the DC-DC converter to complete at least one whole machine function test;

[0008] After completing the whole machine function test, the control host is controlled to complete the burning of the aging program, and the DC-DC converter is controlled to complete at least one aging function test, and the DC-DC converter completes the aging function retest after potting.

[0009] According to another aspect of the present invention, a test device for a DC-DC converter is provided, wherein the DC-DC converter is applied to a test system for a DC-DC converter, wherein the test system for the DC-DC converter comprises a control host, a test adapter box, a simulator, a programmable power supply, and an electronic load, and wherein the test device for the DC-DC converter comprises:

[0010] A single board function test module, used to control the DC-DC converter to be electrically connected to the control host through the test adapter box, and after the board side of the DC-DC converter and the control host are electrically connected to the emulator respectively, control the control host to complete the burning of the single board function test program, and control the DC-DC converter to complete at least one single board function test;

[0011] A whole machine function test module, used to control the DC-DC converter to be electrically connected to the electronic load through the test adapter box, and after the control host is electrically connected to the electronic load, control the DC-DC converter to complete at least one whole machine function test;

[0012] The aging function test module is used to control the control host to complete the burning of the aging program after completing the whole machine function test, and control the DC-DC converter to complete at least one aging function test, and the aging function retest of the DC-DC converter after potting.

[0013] According to another aspect of the present invention, a test system for a DC-DC converter is provided, the test system for the DC-DC converter comprising a DC-DC converter, a control host, a test adapter box, a simulator, a programmable power supply and an electronic load, the DC-DC converter being electrically connected to the test adapter box and the simulator respectively, the test adapter box being electrically connected to the control host, the programmable power supply and the electronic load respectively, the control host being electrically connected to the programmable power supply, the simulator and the electronic load respectively;

[0014] The test system of the DC-DC converter also includes:

[0015] at least one processor; and,

[0016] a memory communicatively connected to the at least one processor; wherein,

[0017] The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute the DC-DC converter testing method described in any embodiment of the present invention.

[0018] According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the DC-DC converter test method described in any embodiment of the present invention when executed.

[0019] The technical solution of the embodiment of the present invention controls the DC-DC converter to be electrically connected to the control host through the test adapter box, and after the board side of the DC-DC converter and the control host are electrically connected to the emulator respectively, controls the control host to complete automatic burning of the single-board function test program, thereby reducing the manual burning time; and controls the DC-DC converter to complete at least one single-board function test, at least one whole-machine function test, at least one aging function test, and the DC-DC converter to complete the aging function retest after potting, automatically determines the test indicators of the DC-DC converter, improves production test efficiency, and facilitates subsequent maintenance and upgrades.

[0020] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0022] Figure 1 is a flow chart of a DC-DC converter testing method provided according to Embodiment 1 of the present invention;

[0023] Figure 2 is a system block diagram of a DC-DC converter test system provided according to Embodiment 1 of the present invention;

[0024] Figure 3 This is a system block diagram of a DC-DC converter aging function test provided according to Embodiment 1 of the present invention;

[0025] Figure 4 is a flow chart of a DC-DC converter testing method provided according to Embodiment 2 of the present invention;

[0026] Figure 5 is a structural schematic diagram of a DC-DC converter testing device provided according to Embodiment 3 of the present invention;

[0027] Figure 6The present invention is a schematic diagram of the structure of a DC-DC converter testing system for implementing the DC-DC converter testing method according to an embodiment of the present invention. DETAILED DESCRIPTION

[0028] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0029] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0030] Embodiment 1

[0031] Figure 1 A flowchart of a DC-DC converter test method is provided for the first embodiment of the present invention. This embodiment is applicable to the case where customized development of 500W-DC-DC converter test requirements is realized in a semi-simulation environment. The DC-DC converter test method can be executed by a DC-DC converter test device. The DC-DC converter test device can be implemented in the form of hardware and / or software. The DC-DC converter test device can be configured in a DC-DC converter test system. The DC-DC converter is applied to a DC-DC converter test system. The DC-DC converter test system includes a control host, a test adapter box, a simulator, a programmable power supply, and an electronic load, such as Figure 1 As shown, the test method of the DC-DC converter includes:

[0032] S110, control the DC-DC converter to be electrically connected to the control host through the test adapter box, and after the board side of the DC-DC converter and the control host are electrically connected to the emulator respectively, control the control host to complete the burning of the single board function test program, and control the DC-DC converter to complete at least one single board function test.

[0033] Among them, the DC-DC converter in this embodiment can be a 500W-DC-DC converter. The 500W-DC-DC converter can convert the high-voltage power supply into the low-voltage power supply required by the weak-current signal system through a high-frequency inverter isolation circuit, thereby providing a stable power supply for the vehicle-mounted low-voltage weak-current system. It can also be other types of DC-DC converters, and this embodiment does not impose any special restrictions on this.

[0034] See also Figure 2 As shown, the test system of the DC-DC converter includes a DC-DC converter, a control host, a test adapter box, an emulator, two programmable power supplies (programmable power supply 1DC345V and programmable power supply 2DC12V) and an electronic load. The control host includes a CPU module, a DO module and a CAN communication module. The test environment is set up before the test of the DC-DC converter. The CAN communication module (DB25 female connector) in the control host and the test adapter box (DB25 female connector) are connected to two CAN channels L and one CAN channel H through a CAN communication cable. The TE-2pin-282080-1 pin 1 and the TE-2pin-282080-1 pin 2 of the test adapter box are electrically connected to the communication interface of the DC-DC converter (the communication interface includes the CAN channel H and the CAN channel L) through the CAN communication cable. The SANCO-HV06-0216(X)-00 The red line of 02 pin A input positive pole and the black line of SANCO-HV06-0216(X)-0002 pin B input negative pole are electrically connected to the high voltage input interface on the board side of the DC-DC converter through the high voltage input cable (the high voltage input interface includes J11 (screw hole: M4) and J12 (screw hole: M4)). The positive output of DJ70219Y-7.8-21 pin 1 of the test adapter box and the negative output of DJ70219Y-7.8-21 are connected. Pin 2 outputs the positive pole, which is electrically connected to the low-voltage output interface on the board side of the DC-DC converter through a low-voltage input cable (the low-voltage output interface includes J13 (connected to the 14V positive pole of the weak-current output, screw hole: M5) and J14 (connected to the 14V positive pole of the weak-current output, screw hole: M5)). The simulator can electrically connect the download line to the 5-pin DuPont line female connector on the board side of the DC-DC converter and the USB port of the CPU module in the control host through a 5-pin download socket.

[0035] It can be known that after the test environment of the DC-DC converter is built, the control host can be controlled to complete the burning of the single board function test program, and the burning result of the single board function test program can be displayed in real time through the test interface of the DC-DC converter, that is, the test interface of the DC-DC converter can display "burning of the single board function test program passed" or "burning of the single board function test program failed", or other words can be displayed, and this embodiment does not impose any restrictions on this. Further, after the burning of the single board function test program passes, the test interface of the DC-DC converter can be cleared and wait for the next state display.

[0036] On the basis of the above, when performing a single-board functional test, first record the product number of the current DC-DC converter and the current ambient temperature, so as to better confirm the basic information of the current DC-DC converter and the environment in which it is located, and provide a reference for the subsequent use of the DC-DC converter. Specifically, the single-board functional test of the DC-DC converter is performed through the pre-burned single-board functional test program, and the current test status can be continuously updated through the CAN communication data column on the test interface of the DC-DC converter. After the test is completed, the single-board functional test report is automatically saved to the specified folder of the control host. At the same time, the save status of the single-board functional test result can be displayed in the save result status bar on the test interface of the DC-DC converter, and "Save Completed" can be displayed in the save result status bar. Further, the test result is automatically cleared after a period of time (for example, 2 seconds), waiting for the next test command to be executed.

[0037] In this embodiment, the single board function test includes CAN communication wake-up low power consumption test, board temperature test, strong power input overvoltage and undervoltage test, auxiliary power supply voltage test and single board hardware no-load test; specifically, the DC-DC converter is controlled to complete at least one single board function test among the CAN communication wake-up low power consumption test, board temperature test, strong power input overvoltage and undervoltage test, auxiliary power supply voltage test and single board hardware no-load test, that is, the single board function test in this embodiment can perform a single automatic single board function test or an automatic single board function test of all items.

[0038] It should be noted that, according to the 500W-DC-DC converter communication protocol, the single board function test in this embodiment can parse the meaning of different bytes, and make judgments with reference to the test indicators to give the single board function test results.

[0039] S120, controlling the DC-DC converter to be electrically connected to the electronic load through the test adapter box, and after controlling the host to be electrically connected to the electronic load, controlling the DC-DC converter to complete at least one whole machine function test.

[0040] On the basis of the above, after the single board function test is completed, the DC-DC converter is assembled into a case. Figure 2 As shown, a wire loop can be made on the test adapter box side to be electrically connected to the programmable power supply through an electronic load connection cable (1M, the electronic load connection cable can withstand a maximum current of 60A).

[0041] On the basis of the above, when conducting the whole machine function test, first record the product number of the current DC-DC converter and the current ambient temperature, so as to better confirm the basic information of the current DC-DC converter and the environment in which it is located, and provide a reference for the subsequent use of the DC-DC converter. Specifically, the whole machine function test of the DC-DC converter is carried out through the pre-burned whole machine function test program, and the CAN communication data column on the test interface of the DC-DC converter can be continuously updated to reflect the current test status, that is, the current value and voltage value of the electronic load are monitored, and when the electronic load is judged to be in an abnormal state according to the current value and voltage value, the DC-DC converter is controlled to stop the whole machine function test. If it is detected that the electronic load is in an abnormal state, the whole machine function test is stopped immediately and the strong power input power switch is turned off.

[0042] Furthermore, after the test is completed, the whole machine function test report is automatically saved to the designated folder of the control host. At the same time, the saving status of the whole machine function test result can be displayed in the saving result status bar on the test interface of the DC-DC converter, that is, "Saving Completed" can be displayed in the saving result status bar. Furthermore, the test result is automatically cleared after a period of time (for example, 2 seconds) to wait for the next test command to be executed.

[0043] In this embodiment, the whole machine function test includes a 345V no-load test, a 345V half-load test, a 345V full-load test, a current test, a 225V no-load test, a 225V half-load test, a 225V full-load test, a 400V no-load test, a 400V half-load test and a 400V full-load test; specifically, the DC-DC converter is controlled to complete at least one of the whole machine function tests of the 345V no-load test, the 345V half-load test, the 345V full-load test, the current test, the 225V no-load test, the 225V half-load test, the 225V full-load test, the 400V no-load test, the 400V half-load test and the 400V full-load test.

[0044] It should be noted that, according to the 500W-DC-DC converter communication protocol, the whole machine function test in this embodiment can parse the meaning of different bytes, and make judgments with reference to the test indicators to give the whole machine function test results.

[0045] S130, after completing the whole machine function test, controlling the control host to complete the burning of the aging program, and controlling the DC-DC converter to complete at least one aging function test, and the DC-DC converter to complete the aging function retest after potting.

[0046] On the basis of the above, after the whole machine function test is completed, the simulator is connected (the simulator in this embodiment can be an XDS110 simulator), and the control host can be controlled to complete the burning of the aging program. The burning result of the aging program can be displayed in real time through the test interface of the DC-DC converter, that is, the test interface of the DC-DC converter can display "burning of aging passed" or "burning of aging program failed", or other words can be displayed, and this embodiment does not impose any restrictions on this. Further, after the burning of the aging program passes, the test interface of the DC-DC converter can be cleared and wait for the next state display.

[0047] It should be noted that after the burning is completed, the aging program is verified to confirm whether the burning is successful. The no-load test, half-load test (300W), full-load test (500W) and maximum current test are performed at the rated voltage of 345V.

[0048] On the basis of the above, the DC-DC converter is tested for aging function through the pre-burned aging function test program. The current test status can be continuously updated through the CAN communication data column on the test interface of the DC-DC converter, that is, the current value and voltage value of the electronic load are monitored, and when the electronic load is judged to be in an abnormal state according to the current value and voltage value, the DC-DC converter is controlled to stop the aging function test. If the electronic load is detected to be in an abnormal state, the aging function test is stopped immediately and the strong power input power switch is turned off.

[0049] Furthermore, after the test is completed, the aging function test report is automatically saved to the designated folder of the control host. At the same time, the saving status of the aging function test result can be displayed in the saving result status bar on the test interface of the DC-DC converter, that is, "Saving Completed" can be displayed in the saving result status bar. Furthermore, the test result is automatically cleared after a period of time (for example, 2 seconds) to wait for the next test command to be executed.

[0050] In this embodiment, because it is necessary to verify again whether the DC-DC converter function is normal after the aging function test, the aging function test identification bit can be switched to the first identification indicating that the aging function test is completed. Furthermore, after the control host recognizes the first identification, it confirms that the DC-DC converter has completed the aging function test, and switches the first identification to the second identification of the aging function retest. The first identification and the second identification can be used to distinguish whether it is the aging program burning verification or the retest verification after the aging is completed.

[0051] The aging function retest of the DC-DC converter after potting is an aging test in a high temperature environment, and it is necessary to control the DC-DC converter to be connected to the aging equipment after potting. Figure 3 As shown, the old chemical equipment is controlled to run with load to complete the aging function test, and the aging function is retested after the aging function test is completed. The old chemical equipment is used to maintain load operation for several hours during the aging test.

[0052] Among them, the aging equipment consists of an aging load resistor, a DC-DC converter interface, a load switching switch and an indicator light. The aging load resistor uses a high temperature resistant and fast heat dissipation winding resistor (0.28~0.5Ω, 1500W) for load testing during the aging process; the DC-DC device interface includes a CAN terminal 2pin, a voltage (380V 3A) input terminal 2pin, and a 12V power supply input terminal 2pin, which are used to connect to the DC-DC device for power supply and CAN communication; the load switching switch is used to connect the load resistor to the DC-DC device output interface; when the load is not connected, the indicator light of the switching switch is off, and after the load resistor is connected, the indicator light of the switching switch is on. The size of the DC-DC converter placement and installation position can be 35cm×10cm×10cm, and this embodiment does not impose any special restrictions on this.

[0053] For details, see Figure 3 As shown, the battery 12V is connected to the old chemical equipment 12V interface, the power supply panel is connected to the old chemical equipment high voltage input interface, and it is set to 345V power supply. Figure 3 The control host in the control is set to 250kbps. The control host sends data to make the DC-DC converter enter the normal mode. The data state of the first byte of the received data (output voltage) is observed to be within the range of 88-8C, indicating that the DC-DC converter has output. Further, the load switching switch of the aging chemical equipment is closed, and the green indicator light on the load switching switch is on. At this time, it is operated with load. The data state of the first byte of the received data (output voltage) is observed to be within the range of 88-8C, and the value is slightly lower than before loading. Based on this, after 1-2 hours of aging function test, the aging function test record is completed, and the load switching switch is closed.

[0054] After the aging function test is completed, wait for the DC-DC converter to return to normal temperature and retest the aging function. Specifically, the aging function test of the DC-DC converter is performed through the pre-burned aging function test program, and the CAN communication data column on the test interface of the DC-DC converter can be continuously updated to reflect the current test status, that is, the current value and voltage value of the electronic load are monitored, and when the electronic load is judged to be in an abnormal state based on the current value and voltage value, the DC-DC converter is controlled to stop the aging function test. If the electronic load is detected to be in an abnormal state, the aging function test is stopped immediately and the strong power input power switch is turned off.

[0055] Furthermore, after the test is completed, the aging function test report is automatically saved to the designated folder of the control host. At the same time, the saving status of the aging function test result can be displayed in the saving result status bar on the test interface of the DC-DC converter, that is, "Saving Completed" can be displayed in the saving result status bar. Furthermore, the test result is automatically cleared after a period of time (for example, 2 seconds) to wait for the next test command to be executed.

[0056] Based on the above embodiments, continue to refer to Figure 3 As shown, after the multiple DC-DC converters are potted, they are connected to the corresponding aging equipment respectively, so that the aging function retest of the multiple DC-DC converters can be performed at the same time. This embodiment does not impose any limitation on it.

[0057] The technical solution of the embodiment of the present invention is that a DC-DC converter is applied to a test system of a DC-DC converter. The test system of the DC-DC converter includes a control host, a test adapter box, an emulator, a programmable power supply and an electronic load. The test method of the DC-DC converter includes: controlling the DC-DC converter to be electrically connected to the control host through the test adapter box, and after the board side of the DC-DC converter and the control host are electrically connected to the emulator respectively, controlling the control host to complete the burning of the single-board function test program, and controlling the DC-DC converter to complete at least one single-board function test; controlling the DC-DC converter to be electrically connected to the electronic load through the test adapter box, and after the control host is electrically connected to the electronic load, controlling the DC-DC converter to complete at least one whole machine function test; after completing the whole machine function test, controlling the control host to complete the burning of the aging program, and controlling the DC-DC converter to complete at least one aging function test, and completing the aging function retest of the DC-DC converter after potting.

[0058] Embodiment 2

[0059] Figure 4The flowchart of a DC-DC converter test method provided in the second embodiment of the present invention is provided. This embodiment provides an optional implementation method based on the above embodiment. The DC-DC converter is applied to a DC-DC converter test system. The DC-DC converter test system includes a control host, a test adapter box, a simulator, a programmable power supply and an electronic load, such as Figure 4 As shown, the test method of the DC-DC converter includes:

[0060] S210, control the DC-DC converter to be electrically connected to the control host through the test adapter box, and after the board side of the DC-DC converter and the control host are electrically connected to the emulator respectively, control the control host to complete the burning of the single board function test program.

[0061] S211, determine whether the control DC-DC converter has completed the single board function test, if so, execute step S212, if not, execute step S210.

[0062] Among them, the single board functional test includes CAN communication wake-up low power consumption test, board temperature test, strong power input overvoltage and undervoltage test, auxiliary power supply voltage test and single board hardware no-load test.

[0063] Continue to see Figure 2 As shown, the test steps of the CAN communication wake-up low power test include: 1) Control the program-controlled power supply to input a weak 12V voltage (no strong power input) and check back that the current is less than 10mA; 2) Send a wake-up low power command to the DC-DC converter according to the CAN communication protocol. After the command is sent, the control host can receive 8 bytes of data and the received data status is constantly refreshed. The control host reads back the power input current of about 100mA, and the DC-DC converter enters normal mode; 3) The control host sends the low-power CAN data, the control host data refresh stops and the read-back input current is less than 10mA, then the DC-DC converter enters low power mode. Further, if the conditions in the above test steps are met, the CAN communication wake-up low power test is completed, and the weak power supply 12V voltage input is automatically turned off.

[0064] During the board temperature test, the program-controlled power supply is controlled to input a weak 12V voltage (no strong power input). The board temperature test is to send a wake-up low-power command to the DC-DC converter according to the CAN communication protocol. After the command is sent, the control host can receive 8 bytes of data and the receiving data status is constantly refreshed. The byte corresponding to the temperature in the CAN communication protocol is read, and the chip temperature is analyzed and compared with the ambient temperature filled in before the test. If the error is within 1°C, the board temperature test passes, otherwise the board temperature test fails. Further, after the board temperature test is completed, the weak power supply 12V voltage input is automatically turned off.

[0065] During the overvoltage and undervoltage test of the strong power input, the programmable power supply is controlled to input a weak 12V voltage (no strong power input). The test steps of the strong power input overvoltage and undervoltage test include: 1) sending a wake-up low-power command to the DC-DC converter according to the CAN communication protocol. After the command is sent, 8 bytes of data can be received and the received data status is constantly refreshed. The strong power supply outputs a 150V voltage and analyzes whether the corresponding byte status is undervoltage according to the communication protocol (undervoltage status at this time); 2) Control the strong power supply to output a 250V voltage, and analyze the byte status of the CAN communication data from undervoltage to normal status (normal status at this time); 3) Control the strong power supply to output a 420V voltage, and analyze the byte status of the CAN communication data as still overvoltage status (overvoltage status at this time); 4) Control the strong power supply to output a 400V voltage, and analyze the byte status of the CAN communication data as normal (normal status at this time); 5) Control to turn off the strong power supply output, and analyze the byte status of the CAN communication data as undervoltage (undervoltage status at this time). Furthermore, after the overvoltage and undervoltage tests of the strong power input are completed, the weak power supply 12V voltage input is automatically turned off.

[0066] The auxiliary power supply voltage test is judged by the voltage when there is no-load output. Therefore, the auxiliary power supply voltage test is consistent with the single-board hardware no-load test method. The specific test steps include: 1) Control the power supply input weak 12V voltage (no strong power input); 2) Send a wake-up low-power command to the DC-DC converter according to the CAN communication protocol. After the command is sent, 8 bytes of data can be received and the received data status is constantly refreshed; 3) Control the strong power supply to output 345V voltage, and analyze the byte status of the CAN communication data from undervoltage to normal state (normal state at this time); 4) According to the CAN communication protocol, It is recommended to send strong power conversion CAN data to the DC-DC converter, read back the 12V weak power input current of about 150mA, the system enters the strong power conversion output mode, read the CAN data bytes and parse according to the protocol to find that the state is strong power conversion enabled, and the output voltage is 13.5-14.5V; 5) Control to turn off the 12V weak power input, read the CAN data bytes and parse according to the protocol to find that the output voltage is 13.5-14.5V; 6) After the auxiliary power supply voltage test or the single-board hardware no-load test is completed, the 345V strong power input is automatically turned off and data reception is stopped.

[0067] S212, after controlling the DC-DC converter to be electrically connected to the electronic load through the test adapter box and controlling the host to be electrically connected to the electronic load, assembling the housing of the DC-DC converter.

[0068] S213, judging whether the control DC-DC converter has completed the whole machine function test, if so, executing step S214, if not, executing step S210.

[0069] Among them, the whole machine function test includes 345V no-load test, 345V half-load test, 345V full-load test, current test, 225V no-load test, 225V half-load test, 225V full-load test, 400V no-load test, 400V half-load test and 400V full-load test.

[0070] Continue to see Figure 2 As shown in the figure, the test steps of the 345V no-load test include: 1) Control the power supply to input a weak 12V voltage (no strong power input) and check that the current is less than 10mA; 2) Send a wake-up low-power command to the DC-DC converter according to the CAN communication protocol. After the command is sent, 8 bytes of data can be received and the received data status is continuously refreshed. The read-back power supply input current is controlled to be about 100mA, and the DC-DC converter enters the normal mode; 3) Control the strong power supply to output a 345V voltage, and analyze the byte status of the CAN communication data from undervoltage to normal state (normal state at this time); 4) Send a strong power conversion C to the DC-DC converter according to the CAN communication protocol. AN data, read back the 12V weak power input current of about 150mA, then the DC-DC converter enters the strong power conversion output mode, read the CAN data bytes and parse according to the protocol to find that the state is strong power conversion enabled, and the output voltage is 13.5-14.5V; 5) Control to turn off the 12V weak power input, read the CAN data bytes and parse according to the protocol to find that the output voltage is 13.5-14.5V; 6) Close the switch connected to the simulated load, control the output of the simulated load to 0W, read the CAN data bytes and parse according to the protocol to find that the output voltage is 13.5-14.5V; 7) Turn off the strong power, and the 345V no-load test stops.

[0071] The test steps of the 345V half-load test include: 1) Control the power supply to input a weak 12V voltage (no strong power input) and check that the current is less than 10mA; 2) Send a wake-up low-power command to the DC-DC converter according to the CAN communication protocol. After the command is sent, 8 bytes of data can be received and the received data status is constantly refreshed. The read-back power input current is controlled to be about 100mA, and the DC-DC converter enters normal mode; 3) Control the strong power supply to output a 345V voltage, and parse the byte status of the CAN communication data from undervoltage to normal (normal at this time); 4) Send strong power conversion CAN data to the DC-DC converter according to the CAN communication protocol. The input current of the 12V weak power supply is read back to be about 150mA, and the DC-DC converter enters the high-power conversion output mode. The CAN data bytes are read and parsed according to the protocol to find that the state at this time is high-power conversion enabled, and the output voltage is parsed to be 13.5-14.5V; 5) Control to turn off the 12V weak power supply input, read the CAN data bytes and parse according to the protocol to find that the output voltage at this time is 13.5-14.5V; 6) Close the switch connected to the simulated load, and the software program controls the output of the simulated load to 300W. The current value of the load at this time is read back to be 17A-23A, and the voltage value is 13.5-14.5V; 7) Turn off the high power, and the 345V half-load test stops.

[0072] The test steps of the 345V full load test include: 1) Control the power supply to input a weak 12V voltage (no strong power input) and check back the current is less than 10mA; 2) Send a wake-up low-power command to the DC-DC converter according to the CAN communication protocol. After the command is sent, 8 bytes of data can be received and the received data status is constantly refreshed. The power input current is controlled to be about 100mA, and the DC-DC converter enters the normal mode; 3) Control the strong power supply to output 345V voltage, and parse the byte status of the CAN communication data from undervoltage to normal state (normal state at this time); 4) Send the strong power conversion CAN data according to the CAN communication protocol, read back 12 V weak power input current is about 150mA, then the DC-DC converter enters the strong power conversion output mode, reads the CAN data bytes and parses according to the protocol to find that the state is strong power conversion enabled, and the output voltage is 13.5-14.5V; 5) Control to turn off the 12V weak power input, read the CAN data bytes and parse according to the protocol to find that the output voltage is 13.5-14.5V; 6) Close the switch connected to the simulated load, the software program controls the output of the simulated load to 500W, and reads back that the current value of the load is 32A-38A and the voltage value is 13.5-14.5V; 7) Turn off the strong power, and the 345V full load test stops.

[0073] The current test is a 345V maximum current test. The test steps of the current test include: 1) Control the power supply to input a weak 12V voltage (no strong power input) and check back that the current is less than 10mA; 2) According to the CAN communication protocol, send a wake-up low-power command to the DC-DC converter. After the command is sent, 8 bytes of data can be received and the received data status is constantly refreshed. The control read-back power input current is about 100mA, and the DC-DC converter enters normal mode; 3) Control the strong power supply to output 345V voltage, and parse the byte status of the CAN communication data from undervoltage to normal state (normal state at this time); 4) According to the CAN communication protocol, send strong power conversion CAN data to the DC-DC converter, read back the 12V weak power input current of about 150mA, then the DC- The DC converter enters the high-power conversion output mode, reads the CAN data bytes and parses according to the protocol to find that the state at this time is high-power conversion enabled, and the output voltage is parsed as 13.5-14.5V; 5) Control to turn off the 12V weak-power input, read the CAN data bytes and parse according to the protocol to find that the output voltage at this time is 13.5-14.5V; 6) Close the switch connected to the simulated load, the software program controls the output of the simulated load to 500W, and the current value of the load at this time is read back to be 32A-38A, and the voltage value is 13.5-14.5V; 7) Close the switch connected to the simulated load, the software program controls the output of the simulated load to 700W, and the current value of the load at this time is read back to be 45A-55A, and the voltage value is 11-13V; 8) Turn off the high power and the current test stops.

[0074] It should be noted that the normal input voltage range of the DC-DC converter is 225V-400V. The two boundary input voltages are tested in turn at no-load, half-load (300W), and full load (500W), that is, 225V no-load test, 225V half-load test, 225V full-load test, 400V no-load test, 400V half-load test and 400V full-load test. The test steps under the rated voltage of 345V are repeated, and this embodiment will not be repeated here.

[0075] S214, after completing the whole machine function test, controlling the control host to complete the burning of the aging program.

[0076] S215, determining whether the DC-DC converter has completed the aging function test, if so, executing step S216, if not, executing step S210.

[0077] It can be understood that in determining whether the DC-DC converter has completed the aging function test, the test process of performing no-load test, half-load test (300W), full-load test (500W) and current test at a rated voltage of 345V is the same as the test process of the whole machine function test, and this embodiment will not be repeated here.

[0078] S216, controlling the DC-DC converter to perform aging function retest after potting is completed.

[0079] S217, determining whether the DC-DC converter has completed the aging function retest, if so, executing step S218, if not, executing step S210.

[0080] S218. Complete the packaging of the DC-DC converter.

[0081] The technical solution of the embodiment of the present invention can realize automatic burning of the test program, reduce the time of manual burning, and automatically determine the test indicators and automatically control the power on and off of the power supply to ensure the safe testing of the DC-DC converter. On the other hand, the single board and the whole machine test interface are integrated in a test adapter box to ensure that the test environment construction and wiring of the DC-DC converter are neat, simple and easy to operate. After the test of the DC-DC converter is completed, the test report of the DC-DC converter is automatically generated, which can meet the test requirements of different types of safety signal machines and save the test reports, improve the test efficiency of DC-DC converter production, and facilitate subsequent maintenance and upgrades.

[0082] Embodiment 3

[0083] Figure 5 The structure diagram of a DC-DC converter test device provided in the third embodiment of the present invention. The DC-DC converter is applied to a DC-DC converter test system, and the DC-DC converter test system includes a control host, a test adapter box, a simulator, a programmable power supply and an electronic load, such as Figure 5 As shown, the test device of the DC-DC converter includes:

[0084] The single board function test module 310 is used to control the DC-DC converter to be electrically connected to the control host through the test adapter box, and after the board side of the DC-DC converter and the control host are electrically connected to the emulator respectively, control the control host to complete the burning of the single board function test program, and control the DC-DC converter to complete at least one single board function test;

[0085] The whole machine function test module 320 is used to control the DC-DC converter to be electrically connected to the electronic load through the test adapter box, and after the host is electrically connected to the electronic load, control the DC-DC converter to complete at least one whole machine function test;

[0086] The aging function test module 330 is used to control the host to complete the burning of the aging program after completing the whole machine function test, and control the DC-DC converter to complete at least one aging function test, and the aging function retest of the DC-DC converter after potting.

[0087] Optional, single board function test includes CAN communication wake-up low power consumption test, board temperature test, strong power input overvoltage and undervoltage test, auxiliary power supply voltage test and single board hardware no-load test;

[0088] Control the DC-DC converter to complete at least one single board functional test, specifically for:

[0089] Control the DC-DC converter to complete at least one single board function test among the CAN communication wake-up low power consumption test, board temperature test, strong power input overvoltage and undervoltage test, auxiliary power supply voltage test and single board hardware no-load test.

[0090] Optionally, when controlling the DC-DC converter to complete at least one whole machine function test, it also includes:

[0091] The current value and voltage value of the electronic load are monitored, and when it is determined that the electronic load is in an abnormal state according to the current value and the voltage value, the DC-DC converter is controlled to stop the whole machine function test.

[0092] Optional, whole machine function test includes 345V no-load test, 345V half-load test, 345V full-load test, current test, 225V no-load test, 225V half-load test, 225V full-load test, 400V no-load test, 400V half-load test and 400V full-load test;

[0093] Control the DC-DC converter to complete at least one whole machine function test, specifically for:

[0094] Control the DC-DC converter to complete at least one whole machine function test of 345V no-load test, 345V half-load test, 345V full-load test, current test, 225V no-load test, 225V half-load test, 225V full-load test, 400V no-load test, 400V half-load test and 400V full-load test.

[0095] Optionally, the test device for the DC-DC converter further includes:

[0096] A first identification generating module, used for switching the aging function test identification bit to a first identification of aging function test completion;

[0097] The second identification switching module is used to confirm that the DC-DC converter completes the aging function test after the control host recognizes the first identification, and switches the first identification to the second identification for aging function retest.

[0098] Optionally, control the DC-DC converter to complete the aging function retest after potting, specifically for:

[0099] After the DC-DC converter is potted, it is connected to the aging equipment. The aging equipment is controlled to run with load to complete the aging function test. After the aging function test is completed, the aging function is retested.

[0100] Optionally, control the DC-DC converter to complete the aging function retest after potting, specifically for:

[0101] After the potting of multiple DC-DC converters is completed, they are connected to the corresponding aging equipment respectively, and the aging function of multiple DC-DC converters is retested at the same time.

[0102] The DC-DC converter test device provided in the embodiment of the present invention can execute the DC-DC converter test method provided in any embodiment of the present invention, and has corresponding functional modules and beneficial effects for executing the DC-DC converter test method.

[0103] Embodiment 4

[0104] Continue to see Figure 2 As shown, the test system of the DC-DC converter includes a DC-DC converter, a control host, a test adapter box, a simulator, a programmable power supply and an electronic load, the DC-DC converter is electrically connected to the test adapter box and the simulator respectively, the test adapter box is electrically connected to the control host, the programmable power supply and the electronic load respectively, and the control host is electrically connected to the programmable power supply, the simulator and the electronic load respectively.

[0105] The control host includes a CPU module, a DO module and a CAN communication module. The CPU module is used to realize test logic control, program control of power supply, electronic load and simulator, and judgment of various test item indicators. The DO module calls its API function through the CPU module to output or disconnect dry contacts, thereby controlling the action of the relay inside the test adapter box, and indirectly realizing the on and off of the 12V electrical signal of the DC-DC converter; the CAN communication module is used to call its API function through the CPU module, send control commands for the DC-DC converter, and receive DC-DC converter data. According to the CAN communication protocol, the CAN communication data of the DC-DC converter can obtain the working status of the DC-DC converter.

[0106] When the DO module node in the control host outputs, the internal relay of the test adapter box closes and connects the 12V electrical signal required for the DC-DC converter to the DC-DC converter; when the DO module node in the control host disconnects the output, the internal relay of the test adapter box disconnects and disconnects the 12V electrical signal required for the DC-DC converter. At the same time, the test adapter box also introduces the output interface of the electronic load, programmable power supply 1, programmable power supply 2 and the CAN communication interface of the host unit, and uniformly adapts the DC-DC converter connector interface, making the environment construction more convenient and regular.

[0107] The programmable power supply is used to provide the power supply required for the operation of the DC-DC converter, to perform program burning and functional testing, and to automatically shut down the power supply after the program burning or testing is completed to ensure the safety of the DC-DC converter tester.

[0108] The electronic load is a simulated load. It is used to provide the output load of the DC-DC converter and implement the whole-machine load function test of the DC-DC converter. The electronic load can be controlled by the program software of the control host to output different loads required for the test of the DC-DC converter.

[0109] Figure 6 FIG. 4 is a schematic diagram showing a DC-DC converter test system 410 that can be used to implement an embodiment of the present invention. Figure 6 As shown, the test system 410 of the DC-DC converter also includes at least one processor 411, and a memory connected to the communication of at least one processor 411, such as a read-only memory (ROM 412), a random access memory (RAM 413), etc., wherein the memory stores a computer program that can be executed by at least one processor, and the processor 411 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM 412) or the computer program loaded from the storage unit 418 to the random access memory (RAM 413). In RAM 413, various programs and data required for the operation of the test system 410 of the DC-DC converter can also be stored. The processor 411, ROM 412 and RAM 413 are connected to each other through a bus 414. An I / O (input / output) interface 415 is also connected to the bus 414.

[0110] Multiple components in the DC-DC converter test system 410 are connected to the I / O interface 415, including: an input unit 416, such as a keyboard, a mouse, etc.; an output unit 417, such as various types of displays, speakers, etc.; a storage unit 418, such as a disk, an optical disk, etc.; and a communication unit 419, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 419 allows the DC-DC converter test system 410 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0111] The processor 411 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the processor 411 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 411 performs the various methods and processes described above, such as a test method for a DC-DC converter.

[0112] In some embodiments, the test method of the DC-DC converter can be implemented as a computer program, which is tangibly contained in a computer-readable storage medium, such as a storage unit 418. In some embodiments, part or all of the computer program can be loaded and / or installed on the test system 410 of the DC-DC converter via ROM 412 and / or communication unit 419. When the computer program is loaded into RAM 413 and executed by processor 411, one or more steps of the test method of the DC-DC converter described above can be executed. Alternatively, in other embodiments, processor 411 can be configured to execute the test method of the DC-DC converter by any other appropriate means (e.g., by means of firmware).

[0113] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0114] Computer programs for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that when the computer program is executed by the processor, the functions / operations specified in the flow chart and / or block diagram are implemented. The computer program may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.

[0115] In the context of the present invention, a computer-readable storage medium may be a tangible medium that may contain or store a computer program for use by or in combination with an instruction execution system, device or equipment. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or equipment, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. A more specific example of a machine-readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0116] In order to provide interaction with the user, the systems and techniques described herein can be implemented on a test system for a DC-DC converter, which has: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or a trackball), through which the user can provide input to the test system for the DC-DC converter. Other types of devices can also be used to provide interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and the input from the user can be received in any form (including acoustic input, voice input, or tactile input).

[0117] The systems and techniques described herein may be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0118] A computing system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The client and server relationship is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services.

[0119] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and this document does not limit this.

[0120] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A DC-DC converter test method, wherein the DC-DC converter is applied to a DC-DC converter test system, wherein the DC-DC converter test system comprises a control host, a test adapter box, a simulator, a programmable power supply and an electronic load, wherein: The testing method of the DC-DC converter comprises: Controlling the DC-DC converter to be electrically connected to the control host through the test adapter box, and after the board side of the DC-DC converter and the control host are electrically connected to the emulator respectively, controlling the control host to complete the burning of the single board function test program, and controlling the DC-DC converter to complete at least one single board function test; Controlling the DC-DC converter to be electrically connected to the electronic load through the test adapter box, and after the control host is electrically connected to the electronic load, controlling the DC-DC converter to complete at least one whole machine function test; After completing the whole machine function test, the control host is controlled to complete the burning of the aging program, and the DC-DC converter is controlled to complete at least one aging function test, and the DC-DC converter completes the aging function retest after potting.

2. The DC-DC converter testing method according to claim 1, characterized in that: The single board function test includes CAN communication wake-up low power consumption test, board temperature test, strong power input overvoltage and undervoltage test, auxiliary power supply voltage test and single board hardware no-load test; Controlling the DC-DC converter to complete at least one single board function test, including: Control the DC-DC converter to complete at least one single board function test among the CAN communication wake-up low power consumption test, the board temperature test, the strong power input overvoltage and undervoltage test, the auxiliary power supply voltage test, and the single board hardware no-load test.

3. The DC-DC converter testing method according to claim 1, characterized in that: When controlling the DC-DC converter to complete at least one whole machine function test, it also includes: The current value and the voltage value of the electronic load are monitored, and when it is determined that the electronic load is in an abnormal state according to the current value and the voltage value, the DC-DC converter is controlled to stop performing the whole machine function test.

4. The DC-DC converter testing method according to claim 1, characterized in that: The whole machine function test includes 345V no-load test, 345V half-load test, 345V full-load test, current test, 225V no-load test, 225V half-load test, 225V full-load test, 400V no-load test, 400V half-load test and 400V full-load test; Controlling the DC-DC converter to complete at least one whole machine function test, including: Control the DC-DC converter to complete at least one whole machine function test among the 345V no-load test, the 345V half-load test, the 345V full-load test, the current test, the 225V no-load test, the 225V half-load test, the 225V full-load test, the 400V no-load test, the 400V half-load test and the 400V full-load test.

5. The DC-DC converter testing method according to claim 1, characterized in that: After controlling the DC-DC converter to complete at least one aging function test, the method further includes: Switching the aging function test flag to the first flag of aging function test completion; After the control host recognizes the first identifier, it confirms that the DC-DC converter completes the aging function test, and switches the first identifier to a second identifier for aging function retest.

6. The DC-DC converter testing method according to claim 1, characterized in that: Controlling the DC-DC converter to complete the aging function retest after potting, including: After the DC-DC converter is potted, it is connected to the aging equipment, the aging equipment is controlled to run with load to complete the aging function test, and the aging function is retested after the aging function test is completed.

7. The DC-DC converter testing method according to claim 1, characterized in that: Controlling the DC-DC converter to complete the aging function retest after potting, including: After the potting is completed, the plurality of DC-DC converters are controlled to be connected to corresponding aging equipment respectively, and the aging function of the plurality of DC-DC converters is retested at the same time.

8. A test device for a DC-DC converter, wherein the DC-DC converter is applied to a test system for a DC-DC converter, wherein the test system for the DC-DC converter comprises a control host, a test adapter box, a simulator, a programmable power supply and an electronic load, wherein: The testing device of the DC-DC converter comprises: A single board function test module, used to control the DC-DC converter to be electrically connected to the control host through the test adapter box, and after the board side of the DC-DC converter and the control host are electrically connected to the emulator respectively, control the control host to complete the burning of the single board function test program, and control the DC-DC converter to complete at least one single board function test; A whole machine function test module, used to control the DC-DC converter to be electrically connected to the electronic load through the test adapter box, and after the control host is electrically connected to the electronic load, control the DC-DC converter to complete at least one whole machine function test; The aging function test module is used to control the control host to complete the burning of the aging program after completing the whole machine function test, and control the DC-DC converter to complete at least one aging function test, and the aging function retest of the DC-DC converter after potting.

9. A DC-DC converter test system, characterized in that: The test system of the DC-DC converter comprises a DC-DC converter, a control host, a test adapter box, a simulator, a programmable power supply and an electronic load, wherein the DC-DC converter is electrically connected to the test adapter box and the simulator respectively, the test adapter box is electrically connected to the control host, the programmable power supply and the electronic load respectively, and the control host is electrically connected to the programmable power supply, the simulator and the electronic load respectively; The test system of the DC-DC converter also includes: at least one processor; and, a memory communicatively connected to the at least one processor; wherein, The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can perform the DC-DC converter testing method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the DC-DC converter testing method according to any one of claims 1 to 7 when the processor executes the computer instructions.

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