A cable life prediction method, system, electronic device and storage medium

Abstract

The present invention discloses a cable life prediction method, system, electronic device and storage medium. The scheme determines the aging temperature parameters of the cable sample by conducting a preliminary experiment on the cable sample; determines the life test scheme according to the determined aging temperature parameters, conducts a life test on the cable sample, and collects test data; substitutes the obtained test data into a preset life model, and determines the remaining life data of the cable according to a preset performance threshold; determines the aging temperature parameters of the cable sample by a preliminary experiment, conducts a physical life test on the cable sample based on the aging temperature parameters, collects the performance degradation data of the cable from the perspective of the aging mechanism of the cable, constructs a physical life model to determine the remaining life of the cable, considers the failure mechanism of the cable, and improves the prediction accuracy. The embodiments of the present invention can be widely used in the field of cable detection technology.

Description

Technical Field

[0001] The present invention relates to the field of cable detection technology, and in particular to a cable life prediction method, system, electronic equipment and storage medium. Background Art

[0002] As the basic components of EMU trains, the safety and reliability of wires and cables are important prerequisites for ensuring the safe operation of EMU trains. In actual applications, under the dual influence of the working environment and the heat generated by the current flowing through the conductive cores, the insulation layer of the wires and cables will gradually reduce or lose its insulation or mechanical properties, thereby shortening the service life of the wires and cables. Therefore, it is necessary to regularly maintain the wires and cables in use and evaluate their remaining life. The existing evaluation or prediction methods mainly use sensors to collect the aging characteristic data of wires and cables for prediction, without considering the cable failure mechanism, and have low prediction accuracy. Summary of the invention

[0003] The main purpose of the embodiments of the present invention is to provide a cable life prediction method, system, electronic device and storage medium, which can improve the prediction accuracy.

[0004] To achieve the above object, an embodiment of the present invention provides a method for predicting cable life, the method comprising:

[0005] Conduct preliminary experiments on cable samples to determine aging temperature parameters;

[0006] Performing a life test on the cable sample according to the aging temperature parameter to determine a test data set;

[0007] The cable sample is predicted according to the test data set, the preset life model and the preset performance threshold to obtain the remaining life of the cable.

[0008] In some embodiments, the conducting of a preliminary experiment on the cable sample to determine the aging temperature parameter specifically includes:

[0009] Performing thermogravimetric analysis on the cable sample to determine the thermal decomposition temperature, and determining a plurality of experimental temperatures according to the thermal decomposition temperature and a preset temperature interval;

[0010] Performing performance tests on the cable sample according to the several experimental temperatures and the first test time to determine several performance values; and comparing the several performance values ​​with the first preset threshold value respectively;

[0011] If the performance value is less than the first preset threshold, the experimental temperature corresponding to the performance value is used as the preselected experimental temperature; and the maximum value of the preselected experimental temperatures is used as the aging temperature parameter.

[0012] In some embodiments, performing a life test on the cable sample according to the aging temperature parameter to determine a test data set specifically includes:

[0013] Determine a test temperature set according to the aging temperature parameter, and perform a life test on the cable sample according to the test temperature set;

[0014] The cable sample is subjected to a performance test according to a preset period to determine the test data set.

[0015] In some embodiments, predicting the cable sample according to the test data set, the preset life model and the preset performance threshold to obtain the remaining life of the cable specifically includes:

[0016] Calculate according to the test data set and a first preset formula to determine a first parameter;

[0017] Calculating according to the first parameter, the test data set and a second preset formula to determine a second parameter and a plurality of third parameters;

[0018] Calculate according to the third parameters and the third preset formula to determine a fourth parameter;

[0019] Substituting the first parameter, the second parameter, the fourth parameter and the preset performance threshold into the preset life model for calculation, the remaining life of the cable is obtained.

[0020] In some embodiments, the preset life model is established according to the following method:

[0021] Performing an accelerated life test on a sample cable to determine sample data; analyzing the sample data to determine sample characteristic data; wherein the sample data includes any one or more of breaking force data, breaking elongation data, breakdown voltage data, and insulation resistance transformation data;

[0022] Analyze the sample characteristic data to determine a first formula; perform calculations based on the sample characteristic data, the first formula, and a preset criterion to determine a first parameter estimation value;

[0023] Performing logarithmic transformation on the first formula to determine a second formula; performing calculation based on the sample characteristic data and the second formula to determine a second model parameter set; wherein the second model parameter set includes speed constants and test constants corresponding to a number of different test temperatures;

[0024] Calculate the mean of the experimental constants of the second model parameter set to determine the estimated value of the third parameter; calculate according to the velocity constant of the second model parameter set and the third formula to determine the estimated value of the fourth parameter;

[0025] The first parameter estimate, the third parameter estimate and the fourth parameter estimate are substituted into the third formula to determine the preset life model.

[0026] In some embodiments, analyzing the sample data to determine sample characteristic data specifically includes:

[0027] Draw a change curve graph according to the sample data, determine change trend data according to the change curve graph; compare the change trend data with preset conditions;

[0028] If the change trend data meets the preset condition, the sample data corresponding to the change trend data is used as the sample feature data.

[0029] In some embodiments, the preset criteria are:

[0030]

[0031] Where I is the residual sum of squares, p is the number of test temperatures, n is the number of test points of the cable, and y ij is the test value of the characteristic index of the cable at the jth test point at the i-th test temperature, is the predicted value of the characteristic index of the cable at the jth test point at the i-th test temperature.

[0032] To achieve the above object, another aspect of an embodiment of the present invention provides a cable life prediction system, the system comprising:

[0033] The first module is used to conduct preliminary experiments on cable samples to determine aging temperature parameters;

[0034] The second module is used to perform a life test on the cable sample according to the aging temperature parameter to determine a test data set;

[0035] The third module is used to predict the cable sample according to the test data set, the preset life model and the preset performance threshold to obtain the remaining life of the cable.

[0036] To achieve the above objective, another aspect of an embodiment of the present application provides an electronic device, the electronic device comprising a memory and a processor, the memory storing a computer program, and the processor implementing the above-mentioned method when executing the computer program.

[0037] To achieve the above-mentioned purpose, another aspect of an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method described above is implemented.

[0038] Implementation of the embodiments of the present invention includes the following beneficial effects: the embodiments provide a cable life prediction method, system, electronic device and storage medium, which determines the aging temperature parameters of the cable sample by conducting a preliminary experiment on the cable sample; determines a life test scheme according to the determined aging temperature parameters, conducts a life test on the cable sample, and collects test data; substitutes the obtained test data into a preset life model, and determines the remaining life data of the cable according to a preset performance threshold; determines the aging temperature parameters of the cable sample through a preliminary experiment, conducts a physical life test on the cable sample based on the aging temperature parameters, collects the performance degradation data of the cable from the perspective of the aging mechanism of the cable, constructs a physical life model to determine the remaining life of the cable, considers the failure mechanism of the cable, and improves the prediction accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 It is a schematic diagram of the steps of a cable life prediction method provided by an embodiment of the present invention;

[0040] Figure 2 It is a schematic flow chart of the steps of determining an aging temperature parameter in a cable life prediction method provided by an embodiment of the present invention;

[0041] Figure 3 It is a schematic flow chart of the steps of determining a test data set in a cable life prediction method provided by an embodiment of the present invention;

[0042] Figure 4 It is a schematic flow chart of the steps of predicting the remaining life of a cable in a cable life prediction method provided by an embodiment of the present invention;

[0043] Figure 5 It is a schematic flow chart of the steps of establishing a preset life model in a cable life prediction method provided by an embodiment of the present invention;

[0044] Figure 6 It is a schematic flow chart of the steps of determining sample characteristic data in a cable life prediction method provided by an embodiment of the present invention;

[0045] Figure 7 It is a schematic diagram of a technical route in a specific embodiment provided by an embodiment of the present invention;

[0046] Figure 8 It is a schematic diagram of a technical solution in a specific embodiment provided by an embodiment of the present invention;

[0047] Fig. 9 is a performance degradation curve diagram of the elongation at break of an old cable in a specific embodiment provided by an embodiment of the present invention;

[0048] Fig.10is a performance degradation curve diagram of the elongation at break of a new cable in a specific embodiment provided by an embodiment of the present invention;

[0049] Fig.11 It is a structural block diagram of a cable life prediction system provided by an embodiment of the present invention;

[0050] Fig.12 It is a schematic diagram of the hardware structure of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0051] The present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments. The step numbers in the following embodiments are only provided for the convenience of explanation and description, and the order between the steps is not limited in any way. The execution order of each step in the embodiment can be adaptively adjusted according to the understanding of those skilled in the art.

[0052] In the following description, reference is made to “some embodiments”, which describe a subset of all possible embodiments, but it will be understood that “some embodiments” may be the same subset or different subsets of all possible embodiments and may be combined with each other without conflict.

[0053] In the following description, the terms "first\second\third" involved are merely used to distinguish similar objects and do not represent a specific ordering of the objects. It can be understood that "first\second\third" can be interchanged with a specific order or sequence where permitted, so that the embodiments of the present invention described herein can be implemented in an order other than that illustrated or described herein.

[0054] Unless otherwise defined, all technical and scientific terms used in the embodiments of the present invention have the same meanings as those commonly understood by those skilled in the art of the present invention. The terms used in the embodiments of the present invention are only for the purpose of describing the embodiments of the present invention and are not intended to limit the present invention.

[0055] Figure 1 is an optional flow chart of a cable life prediction method provided by an embodiment of the present invention. Figure 1 The method may include but is not limited to steps S101 to S103.

[0056] Step S101, conducting a preliminary experiment on a cable sample to determine an aging temperature parameter;

[0057] Step S102, performing a life test on the cable sample according to the aging temperature parameter to determine a test data set;

[0058] Step S103, predicting the cable sample according to the test data set, the preset life model and the preset performance threshold to obtain the remaining life of the cable.

[0059] In steps S101 to S103 shown in the embodiment of the present application, wires and cables for which life prediction is required are selected, a cable sample is selected based on the selected wires and cables for an aging life test, the performance degradation or degradation of the wires and cables under working conditions is simulated, and data such as performance indicators of the wires and cables in the aging life test are collected to obtain test data; the collected test data are input into a pre-established physical model of the cable life, corresponding evaluation parameters are estimated based on the collected test data, and the life of the wires and cables at a certain storage temperature is predicted in combination with the constructed physical model of the cable life; further, by setting a certain performance threshold, the remaining life of the wires and cables until their performance degrades to the set threshold can be determined in combination with the test data and the physical model of the cable life.

[0060] In step S101 of some embodiments, a preliminary experiment scheme may be formulated according to the use environment of the wire and cable to determine the aging temperature parameter. The preliminary experiment scheme may also be formulated according to factors affecting the life of the wire and cable, but is not limited thereto.

[0061] See also Figure 2 In some embodiments, step S101 may include but is not limited to steps S201 to S203:

[0062] Step S201, performing thermogravimetric analysis on the cable sample to determine the thermal decomposition temperature, and determining a number of experimental temperatures according to the thermal decomposition temperature and a preset temperature interval;

[0063] Step S202, performing performance tests on the cable sample according to a plurality of experimental temperatures and a first test time, respectively, to determine a plurality of performance values; and comparing the plurality of performance values ​​with a first preset threshold value respectively;

[0064] Step S203: if the performance value is less than the first preset threshold, the experimental temperature corresponding to the performance value is used as the pre-selected experimental temperature; and the minimum value of the pre-selected experimental temperatures is used as the aging temperature parameter.

[0065] In step S201 of some embodiments, an accelerated life test is performed on cable samples of wires and cables that need life prediction to simulate the performance degradation or deterioration of the wires and cables under usage conditions; since wires and cables are mainly affected by ambient temperature and Joule heat of current, temperature is used as the main influencing factor to perform life tests on cable samples; the cable samples are experimentally analyzed by a thermogravimetric analyzer to determine the thermal decomposition temperature at which the outer insulation layer of the cable sample begins to decompose and fail, and a number of aging test temperatures are set in descending order according to the thermal decomposition temperature and a set temperature interval for subsequent preliminary testing of the cable samples.

[0066] In step S202 of some embodiments, aging tests are performed on the cable samples according to several set aging test temperatures, and the cable samples are taken out for performance testing after a first test time to determine the performance values ​​of the cable samples at different aging test temperatures; illustratively, the elongation at break is tested on the taken out cable samples to determine the corresponding elongation at break; the performance values ​​corresponding to the different temperatures obtained by the test are compared with the preset performance thresholds to determine the maximum aging temperature of the cable sample.

[0067] In step S203 of some embodiments, the performance parameters of the cable sample after the pre-experiment are compared with a set performance threshold, such as 80% before aging. If the performance parameters of the cable sample after the pre-experiment are greater than or equal to the set performance threshold, it means that the current experimental temperature is too low and cannot be used as the maximum aging temperature; if the performance value of the cable sample after the pre-experiment is less than the set performance threshold, it means that at this temperature, the performance of the cable sample is significantly degraded, which can be used as the maximum aging temperature of the cable sample; further, if multiple aging test temperatures at which the performance of the cable samples is significantly degraded appear in the pre-experiment, the lowest temperature value is selected as the maximum aging temperature.

[0068] See also Figure 3 In some embodiments, step S102 may include but is not limited to steps S301 to S302:

[0069] Step S301, determining a test temperature set according to the aging temperature parameter, and performing a life test on the cable sample according to the test temperature set;

[0070] Step S302, performing performance testing on the cable sample according to a preset cycle to determine a test data set.

[0071] In step S301 of some embodiments, after the maximum aging temperature of the cable sample is determined through preliminary experiments, several aging test temperatures are set according to the set temperature interval with the maximum aging temperature as the upper limit; illustratively, at least four aging test temperatures are determined according to the maximum aging temperature, and the temperature interval between adjacent temperatures is 10°C; the cable sample is subjected to an accelerated life test according to the set aging test temperature to determine the characteristics of physical performance failure of the cable sample at different temperatures.

[0072] In step S302 of some embodiments, during the accelerated life test of the cable sample, the cable sample is taken out periodically for performance testing; for example, the mechanical properties of the cable sample are tested, or the electrical properties of the outer insulation layer of the cable sample are tested; the test results of each performance test are recorded to obtain a test data set; in order to subsequently predict the remaining life of the cable sample; further, the accelerated life test of the cable sample can be terminated after a certain number of regular tests, or the accelerated life test can be terminated after a certain period of time, such as 24 hours; the accelerated life test can also be terminated after the performance of the cable sample degrades to below a certain threshold after the accelerated life test; it can be determined according to the specific circumstances, and the present embodiment is not limited to this.

[0073] See also Figure 4 In some embodiments, step S103 may include but is not limited to steps S401 to S404:

[0074] Step S401, performing calculation according to the test data set and a first preset formula to determine a first parameter;

[0075] Step S402, performing calculations according to the first parameter, the test data set, and the second preset formula to determine the second parameter and a plurality of third parameters;

[0076] Step S403, performing calculation according to the plurality of third parameters and the third preset formula to determine a fourth parameter;

[0077] Step S404: Substitute the first parameter, the second parameter, the fourth parameter and the preset performance threshold into the preset life model for calculation to obtain the remaining life of the cable.

[0078] In step S401 of some embodiments, after completing the accelerated life test of the cable sample, the characteristic parameters are first calculated according to the recorded test data set; in this embodiment, the elongation at break in the test data set is selected to calculate the characteristic parameters, and the calculation is performed according to the following formula:

[0079]

[0080] Among them, y ij is the characteristic parameter of elongation at break, ε ij is the test value of the elongation at break of the cable sample at the i-th aging temperature and the j-th test; ε0 is the elongation at break of the cable sample in the initial state; after the characteristic parameters are calculated, the calculated characteristic parameters are substituted into the set formula to calculate the residual sum of squares, and the empirical parameters of the life model are estimated by the method of successive approximation; in this embodiment, through multiple iterative calculations, the empirical parameters of the model corresponding to several groups of different residual sums of squares are obtained, and the empirical parameters of the model corresponding to the minimum residual sum of squares are selected.

[0081] In step S402 of some embodiments, after the empirical parameters are determined, fitting analysis and transformation are performed on the test data set to obtain an expression in the following form:

[0082] Y=a+bX

[0083] Among them, Y=lgy is the logarithmic value of the test value y of the cable sample characteristic parameter, a=lgB is the logarithmic value of the test constant B, is a constant related to the rate of change of performance related to temperature, X = τ α , are the parameters of aging time and empirical parameters; substitute the recorded test data set into the expression of fitting analysis, use the least square method to solve, and obtain the parameters a and b in the expression. According to the obtained parameters a and b, the test constant and rate constant of different test temperatures are calculated.

[0084] In step S403 of some embodiments, the test constants corresponding to different test temperatures are averaged and used as the test constant estimates of the accelerated life test of the cable sample at several set aging test temperatures; and the relationship between the temperature-related performance change rate constant K and the aging temperature obeys the Arrhenius formula, which is as follows:

[0085]

[0086] Among them, K is the rate constant, A is the frequency factor, E is the surface activation energy, R is the gas constant, and T is the aging temperature; after logarithmic transformation of the Arrhenius formula, the following expression is obtained:

[0087] W=C+DZ

[0088] Among them, W = lgK, C = lgA, Z=T -1 ; The transformed expression is solved by the least square method to obtain the estimated values ​​of the parameters C and D in the expression, and then the speed constant K at different test temperatures is calculated. The test temperature is extended to the working temperature or storage temperature of the cable sample, and the corresponding speed constant can be determined according to the temperature.

[0089] In step S404 of some embodiments, the calculated empirical constants and test constants, as well as the speed constants determined according to the temperature, are substituted into the established physical life model of the cable to determine the threshold of performance degradation and the corresponding remaining life of the cable at the storage temperature or the operating temperature.

[0090] See also Figure 5In some embodiments, before performing step S103, a cable life prediction method provided by an embodiment of the present invention further includes constructing a cable life model. The construction of the life model may include but is not limited to steps S501 to S505:

[0091] Step S501, performing an accelerated life test on a sample cable to determine sample data; analyzing the sample data to determine sample characteristic data; wherein the sample data includes any one or more of breaking force data, breaking elongation data, breakdown voltage data, and insulation resistance transformation data;

[0092] Step S502, analyzing the sample characteristic data to determine a first formula; performing calculations based on the sample characteristic data, the first formula, and a preset criterion to determine a first parameter estimation value;

[0093] Step S503, performing logarithmic transformation on the first formula to determine a second formula; performing calculations based on the sample characteristic data and the second formula to determine a second model parameter set; wherein the second model parameter set includes velocity constants and test constants corresponding to a number of different test temperatures;

[0094] Step S504, performing mean calculation on the test constants of the second model parameter set to determine the estimated value of the third parameter; performing calculation based on the speed constants of the second model parameter set and the third formula to determine the estimated value of the fourth parameter;

[0095] Step S505, substituting the first parameter estimate, the third parameter estimate and the fourth parameter estimate into the third formula to determine a preset life model.

[0096] In step S501 of some embodiments, before predicting the life of the cable sample, it is necessary to establish a physical life model based on the physical performance degradation characteristics of the cable harness; perform thermogravimetric analysis and preliminary experiments on the sample cable to determine the maximum aging temperature of the sample cable, determine several accelerated life test aging temperatures based on the determined maximum aging temperature, test the sample cable based on several accelerated life test aging temperatures, and obtain cable performance parameters at different test temperatures as sample data; analyze the sample data, select performance parameters with significant performance degradation trends as characteristic parameters, and construct a life model based on the characteristic parameters; in this embodiment, perform breaking force detection, breaking elongation detection, breakdown voltage detection, and insulation resistance transformer detection on the sample cable at different test temperatures.

[0097] In step S502 of some embodiments, the selected characteristic parameters are analyzed and fitted to obtain the following formula:

[0098]

[0099] Where y is the ratio of the tensile strength at any aging time τ to the tensile strength before the aging test, B is the test constant, K is the temperature-related performance change rate constant, τ is the aging time, and α is the empirical constant; the test data of the characteristic parameters are substituted into the formula obtained by the fitting analysis, and the empirical constant α is estimated by the successive approximation method to minimize the following formula:

[0100]

[0101] Where I is the residual sum of squares, p is the number of test temperatures, n is the number of test points of the cable, and y ij is the test value of the characteristic index of the cable at the jth test point at the i-th test temperature, is the predicted value of the characteristic index of the cable at the jth test point at the i-th test temperature;

[0102] In step S503 of some embodiments, after the empirical constant α is determined, the fitting analysis formula is logarithmically transformed to obtain the following formula:

[0103] Y=a+bX where, Y=lgy, a=lgB, X=τ α ; Substitute the test data of characteristic parameters into the converted formula, use the least square method to estimate the parameters a and b in the converted formula, and then calculate the velocity constant K and test constant B of the sample cable at different test temperatures, where K i =-2.303b i , B i =10a i , i is the i-th test temperature. In step S504 of some embodiments, the mean of the test constants at different test temperatures is calculated as the estimated value of the test constant:

[0104]

[0105] in, is the estimated value of the test constant, p is the number of test temperatures, B i is the test constant of the ith test temperature; through analysis, the relationship between the rate constant K and the aging temperature T obeys the Arrhenius formula:

[0106]

[0107] Among them, K is the rate constant, A is the frequency factor, E is the surface activation energy, r is the gas constant, and T is the aging temperature; the Arrhenius formula is logarithmically transformed to obtain the following formula:

[0108] W=C+DZ

[0109] Among them, W = lgK, C = lgA, Z=T -1 The transformed expression is solved by the least square method to obtain the estimated values ​​of the parameters C and D in the expression, and then the rate constant K at different test temperatures is calculated. In step S505 of some embodiments, the calculated empirical constant α, test constant B and rate constant K are substituted into the fitting analysis formula to obtain the prediction equation of the performance change at the storage temperature:

[0110]

[0111] Where y is the ratio of the tensile strength at any aging time τ to the tensile strength before the aging test, is the estimated value of the experimental constant, is the rate constant at storage temperature, τ is the aging time, and α is the empirical constant. According to the prediction equation, given the performance threshold, the storage period can be determined:

[0112]

[0113] Among them, τ is the aging time, α is the empirical constant, is the rate constant at storage temperature, is the estimated value of the experimental constant, and y0 is the given performance threshold.

[0114] See also Figure 6 , in some embodiments, step S501 may include but is not limited to steps S601 to S602: step S601, drawing a change curve graph according to sample data, determining change trend data according to the change curve graph; comparing the change trend data with preset conditions;

[0115] Step S602: If the change trend data meets the preset conditions, the sample data corresponding to the change trend data is used as sample feature data.

[0116] In step S601 of some embodiments, an accelerated life test is performed on the sample cable to obtain mechanical property data and electrical property data of the sample cable, including breaking force, elongation at break, breakdown voltage and insulation resistance transformation data, and a trend curve graph is drawn based on the test data. Based on the drawn trend curve graph, the degradation pattern of the electrical and mechanical properties of the wires and cables under the action of thermal stress over time is analyzed.

[0117] In step S602 of some embodiments, the degradation rules of different performance indicators of the wire and cable are analyzed according to the drawn trend curve chart. If the degradation trend of a certain performance indicator of the wire and cable over time is not obvious, such as the degradation rate of the performance indicator is less than a certain threshold, or it shows an increasing trend, then the performance indicator cannot be used as a characteristic parameter; if the degradation trend of a certain performance indicator of the wire and cable over time is obvious, then the performance indicator is selected as the characteristic parameter.

[0118] The following is a detailed description and explanation of the solution of the embodiment of the present invention in conjunction with a specific application example:

[0119] See also Figure 7 , Figure 7 A technical roadmap for a cable life prediction method proposed by an embodiment of the present invention is provided. Figure 8 The technical scheme shown analyzes the use environment of the new and old wires and cables, the types or modes of possible failures, and life-sensitive parameters to determine the factors affecting the life; determines the test stress according to the possible failure mode of the use environment, determines the monitoring or test parameters according to the possible failure mode and life-sensitive parameters, formulates a test plan according to the determined test stress and monitoring or test parameters, and conducts type tests and functional performance tests on the new and old wires and cables according to the formulated test plan, such as thermogravimetric analysis and aging experiments; based on the experimental test results of the type test and functional performance test, conducts life tests on the new and old wires and cables, and conducts failure tests on the wires and cables regularly during the life test, and tests the mechanical and electrical properties of the wires and cables, such as tensile strength, hardness, insulation, and pressure resistance; obtains the performance degradation data of the new and old wires and cables through life tests and failure tests, processes and analyzes the obtained performance degradation data, and draws a performance degradation curve; analyzes the drawn performance degradation curve and determines that the characteristic parameter affecting the life of the wires and cables is the elongation at break data, as shown in the following table:

[0120] Table 1

[0121]

[0122] The performance degradation curves of the new and old wires and cables regarding the elongation at break are as follows: Fig. 9 and Fig.10 As shown in the table below, the life model parameters of the new and old wires and cables are fitted based on the elongation at break, as shown in the table below:

[0123] Table 2

[0124]

[0125] The physical life model of wires and cables is established based on the fitted model parameters:

[0126]

[0127] The data of the physical life test of wires and cables is input into the physical life model of the established wires and cables for analysis and calculation. When the retention rate of the cable's elongation at break reaches 50%, the remaining service life of the wires and cables is predicted, that is, Solve to x 新 =1847h. At the same time, based on the performance degradation curve and physical life model, different wires and cables can be selected, the failure mode of wires and cables can be evaluated, the maintenance and repair plan can be optimized, and the service life of wires and cables can be extended.

[0128] Implementation of the embodiments of the present invention includes the following beneficial effects: the embodiments provide a cable life prediction method, system, electronic device and storage medium, which determines the aging temperature parameters of the cable sample by conducting a preliminary experiment on the cable sample; determines a life test scheme according to the determined aging temperature parameters, conducts a life test on the cable sample, and collects test data; substitutes the obtained test data into a preset life model, and determines the remaining life data of the cable according to a preset performance threshold; determines the aging temperature parameters of the cable sample through a preliminary experiment, conducts a physical life test on the cable sample based on the aging temperature parameters, collects the performance degradation data of the cable from the perspective of the aging mechanism of the cable, constructs a physical life model to determine the remaining life of the cable, considers the failure mechanism of the cable, and improves the prediction accuracy.

[0129] like Fig.11 As shown, an embodiment of the present invention further provides a cable life prediction system, which can implement the above-mentioned cable life prediction method, and the system includes:

[0130] The first module is used to conduct preliminary experiments on cable samples to determine aging temperature parameters;

[0131] The second module is used to perform a life test on the cable sample according to the aging temperature parameter to determine a test data set;

[0132] The third module is used to predict the cable sample according to the test data set, the preset life model and the preset performance threshold to obtain the remaining life of the cable.

[0133] It can be seen that the contents of the above method embodiments are all applicable to the present system embodiments, the functions specifically implemented by the present system embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0134] The embodiment of the present application also provides an electronic device, the electronic device includes a memory and a processor, the memory stores a computer program, and the processor implements the above-mentioned cable life prediction method when executing the computer program. The electronic device can be any intelligent terminal including a tablet computer, a car computer, etc.

[0135] It can be understood that the contents of the above method embodiments are all applicable to the present device embodiments, the functions specifically implemented by the present device embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0136] See also Fig.12 , Fig.12 The hardware structure of an electronic device of another embodiment is illustrated, and the electronic device includes:

[0137] The processor 1201 may be implemented by a general-purpose CPU (Central Processing Unit), a microprocessor, an application-specific integrated circuit (Application Specific Integrated Circuit, ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of the present application;

[0138] The memory 1202 can be implemented in the form of a read-only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM). The memory 1202 can store an operating system and other application programs. When the technical solution provided in the embodiment of this specification is implemented by software or firmware, the relevant program code is stored in the memory 1202, and the processor 1201 calls and executes a cable life prediction method in the embodiment of this application;

[0139] Input / output interface 1203, used to implement information input and output;

[0140] The communication interface 1204 is used to realize the communication interaction between the device and other devices. The communication can be realized through a wired manner (such as USB, network cable, etc.) or a wireless manner (such as mobile network, WIFI, Bluetooth, etc.);

[0141] A bus 1205 that transmits information between various components of the device (e.g., the processor 1201, the memory 1202, the input / output interface 1203, and the communication interface 1204);

[0142] The processor 1201 , the memory 1202 , the input / output interface 1203 and the communication interface 1204 are connected to each other in communication within the device via the bus 1205 .

[0143] Among them, the memory, as a non-transient computer-readable storage medium, can be used to store non-transient software programs and non-transient computer executable programs. The memory may include a high-speed random access memory, and may also include a non-transient memory, such as at least one disk storage device, a flash memory device, or other non-transient solid-state storage device. In some embodiments, the memory may optionally include a remote memory remotely arranged relative to the processor, and these remote memories may be connected to the processor via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0144] In addition, the embodiment of the present application also discloses a computer program product or a computer program, and the computer program product or the computer program is stored in a computer-readable storage medium. The processor of the computer device can read the computer program from the computer-readable storage medium, and the processor executes the computer program, so that the computer device performs the above method. Similarly, the contents in the above method embodiment are all applicable to the storage medium embodiment, and the functions specifically implemented by the storage medium embodiment are the same as those in the above method embodiment, and the beneficial effects achieved are also the same as those achieved by the above method embodiment.

[0145] An embodiment of the present application also provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the above-mentioned cable life prediction method is implemented.

[0146] It can be understood that the contents of the above method embodiments are all applicable to the present storage medium embodiments, the functions specifically implemented by the present storage medium embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0147] It is understood that all or some steps and systems in the disclosed method above can be implemented as software, firmware, hardware and appropriate combinations thereof. Some physical components or all physical components can be implemented as software executed by a processor, such as a central processing unit, a digital signal processor or a microprocessor, or implemented as hardware, or implemented as an integrated circuit, such as an application-specific integrated circuit. Such software can be distributed on a computer-readable medium, and the computer-readable medium can include a computer storage medium (or a non-transitory medium) and a communication medium (or a temporary medium). As known to those of ordinary skill in the art, the term computer storage medium includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information (such as computer-readable instructions, data structures, program modules or other data). Computer storage media include, but are not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disk (DVD) or other optical disk storage, magnetic cassette, magnetic tape, disk storage or other magnetic storage device, or any other medium that can be used to store desired information and can be accessed by a computer. Furthermore, it is well known to those skilled in the art that communication media typically embodies computer readable instructions, data structures, program modules, or other data in a modulated data signal such as a carrier wave or other transport mechanism, and may include any information delivery media.

[0148] The above is a specific description of the preferred implementation of the present invention, but the invention is not limited to the embodiments. Those skilled in the art may make various equivalent modifications or substitutions without violating the spirit of the present invention. These equivalent modifications or substitutions are all included in the scope defined by the claims of this application.

Claims

1. A cable life prediction method, characterized in that: The method comprises: Conduct preliminary experiments on cable samples to determine aging temperature parameters; Performing a life test on the cable sample according to the aging temperature parameter to determine a test data set; The cable sample is predicted according to the test data set, the preset life model and the preset performance threshold to obtain the remaining life of the cable.

2. The method according to claim 1, characterized in that: The preliminary experiment on the cable sample is carried out to determine the aging temperature parameters, specifically including: Performing thermogravimetric analysis on the cable sample to determine the thermal decomposition temperature, and determining a plurality of experimental temperatures according to the thermal decomposition temperature and a preset temperature interval; Performing performance tests on the cable sample according to the several experimental temperatures and the first test time to determine several performance values; and comparing the several performance values ​​with the first preset threshold value respectively; If the performance value is less than the first preset threshold, the experimental temperature corresponding to the performance value is used as the pre-selected experimental temperature; and the minimum value of the pre-selected experimental temperatures is used as the aging temperature parameter.

3. The method according to claim 1, characterized in that The performing of a life test on the cable sample according to the aging temperature parameter to determine a test data set specifically includes: Determine a test temperature set according to the aging temperature parameter, and perform a life test on the cable sample according to the test temperature set; The cable sample is subjected to a performance test according to a preset period to determine the test data set.

4. The method according to claim 1, characterized in that: The predicting of the cable sample according to the test data set, the preset life model and the preset performance threshold to obtain the remaining life of the cable specifically includes: Calculate according to the test data set and a first preset formula to determine a first parameter; Calculating according to the first parameter, the test data set and a second preset formula to determine a second parameter and a plurality of third parameters; Calculate according to the third parameters and the third preset formula to determine a fourth parameter; Substituting the first parameter, the second parameter, the fourth parameter and the preset performance threshold into the preset life model for calculation, the remaining life of the cable is obtained.

5. The method according to claim 1, characterized in that The preset life model is established according to the following method: Performing an accelerated life test on a sample cable to determine sample data; analyzing the sample data to determine sample characteristic data; wherein the sample data includes any one or more of breaking force data, breaking elongation data, breakdown voltage data, and insulation resistance transformation data; Analyze the sample characteristic data to determine a first formula; perform calculations based on the sample characteristic data, the first formula, and a preset criterion to determine a first parameter estimation value; Performing logarithmic transformation on the first formula to determine a second formula; performing calculation based on the sample characteristic data and the second formula to determine a second model parameter set; wherein the second model parameter set includes speed constants and test constants corresponding to a number of different test temperatures; Calculate the mean of the experimental constants of the second model parameter set to determine the estimated value of the third parameter; calculate according to the velocity constant of the second model parameter set and the third formula to determine the estimated value of the fourth parameter; The first parameter estimate, the third parameter estimate and the fourth parameter estimate are substituted into the third formula to determine the preset life model.

6. The method according to claim 5, characterized in that The analyzing the sample data to determine the sample characteristic data specifically includes: Draw a change curve graph according to the sample data, determine change trend data according to the change curve graph; compare the change trend data with preset conditions; If the change trend data meets the preset condition, the sample data corresponding to the change trend data is used as the sample feature data.

7. The method according to claim 5, characterized in that The preset criteria are: Where I is the residual sum of squares, p is the number of test temperatures, n is the number of test points of the cable; y ij is the test value of the characteristic index of the cable at the jth test point at the i-th test temperature; is the predicted value of the characteristic index of the cable at the jth test point at the i-th test temperature.

8. A cable life prediction system, characterized in that: include: The first module is used to conduct preliminary experiments on cable samples to determine aging temperature parameters; The second module is used to perform a life test on the cable sample according to the aging temperature parameter to determine a test data set; The third module is used to predict the cable sample according to the test data set, the preset life model and the preset performance threshold to obtain the remaining life of the cable.

9. An electronic device, characterized in that: include: at least one processor; at least one memory for storing at least one program; When the at least one program is executed by the at least one processor, the at least one processor implements the method according to any one of claims 1 to 7.

10. A computer-readable storage medium storing a program executable by a processor, characterized in that: The processor-executable program is used to perform the method according to any one of claims 1 to 7 when executed by the processor.

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