Measurement machine management and control method and device, electronic equipment and storage medium

Abstract

The invention provides a measurement machine management and control method and device, electronic equipment and a storage medium, and the method comprises the steps: collecting the measurement data of a measurement machine for each piece of target equipment, the measurement data comprising a plurality of measurement index data; determining a measurement state monitoring chart of each measurement index under the measurement machine table according to a plurality of measurement index data of the measurement machine table for each target device, the measurement state monitoring chart reflecting measurement fluctuation generated by the measurement index under the corresponding measurement machine table; according to the measurement state monitoring chart corresponding to each measurement machine, a machine measurement state report corresponding to the measurement machine is generated, the machine measurement state report records data reflecting the overall measurement condition of the measurement machine, the measurement state is evaluated by collecting the measurement data corresponding to the measurement machine, the state of the measurement machine can be monitored in real time, and the measurement efficiency is improved. And the consistency and the reliability of product quality are ensured.

Description

Technical Field

[0001] The present application relates to the technical field of statistical process control, and in particular to a control method, device, electronic equipment and storage medium for a measuring machine. Background Art

[0002] Measurement equipment and statistical process control (SPC) play a vital role in the manufacturing industry. Through the data collected by measurement equipment and the application of SPC tools, the quality of the production process can be effectively monitored and controlled to ensure the consistency and reliability of product quality.

[0003] In most SPC cases provided in the prior art, there is no relevant data statistics for the control of the measuring machine, so it is impossible to reflect the specific conditions of the measuring machine, and therefore it is impossible to determine the corresponding measurement level of the measuring machine. If the measurement results of the measuring machine continue to be unstable, it will affect the product quality. Summary of the invention

[0004] In view of this, the purpose of the present application is to provide at least a measuring machine control method, device, electronic device and storage medium, which can evaluate the measurement status by collecting measurement data corresponding to the measuring machine, monitor the measuring machine status in real time, and ensure the consistency and reliability of product quality.

[0005] This application mainly includes the following aspects:

[0006] In a first aspect, an embodiment of the present application provides a method for controlling a measuring machine, the method comprising: collecting measurement data of the measuring machine for each target device, the measurement data comprising a plurality of measurement index data; determining a measurement status monitoring chart of each measurement index under the measuring machine based on the plurality of measurement index data of the measuring machine for each target device, the measurement status monitoring chart reflecting the measurement fluctuations generated by the measurement index under the corresponding measuring machine; generating a machine measurement status report corresponding to the measuring machine based on the measurement status monitoring chart corresponding to each measuring machine, the machine measurement status report recording data reflecting the overall measurement status of the measuring machine.

[0007] In a possible implementation, before collecting measurement data of each target device by the measuring machine, the method further includes: configuring a standard sample for the measuring machine; and determining a standard value corresponding to each measurement indicator of the standard sample.

[0008] In one possible implementation, the measurement indicator data includes multiple measurement indicators and an actual measurement value corresponding to each measurement indicator, wherein a measurement status monitoring chart of each measurement indicator under the measurement machine is determined in the following manner: for each target device, a measurement fluctuation value corresponding to the measurement indicator is determined, where the measurement fluctuation value is the difference between the actual measurement value corresponding to the measurement indicator and a standard value; and based on the measurement fluctuation value corresponding to the measurement indicator under each target device, a measurement status monitoring chart of the measurement indicator under the measurement machine is drawn and generated.

[0009] In one possible implementation, a machine measurement status report corresponding to the measuring machine is generated in the following manner: a plurality of measuring machines are grouped according to the measuring machine model to obtain a plurality of measurement groups; for each measurement group, the following processing is performed: based on the measurement status monitoring chart of each measuring machine in the measurement group under each measurement indicator, the target control limit corresponding to each measurement indicator is determined; based on the target control limit corresponding to each measurement indicator, the status monitoring result corresponding to each measuring machine in the measurement group is determined; based on the status monitoring result corresponding to the measuring machine, a machine measurement status report is generated.

[0010] In one possible implementation, the target control limit includes a target upper control limit and a target lower control limit, wherein the target control limit corresponding to the measurement indicator in each measurement group is determined in the following manner: according to the measurement status monitoring chart of each measuring machine in the measurement group under the measurement indicator, the calculated upper control limit and the calculated lower control limit of each measuring machine under the measurement indicator are calculated respectively; the minimum calculated upper control limit of multiple measuring machines in the measurement group under the measurement indicator is determined as the target upper control limit of the measurement indicator in the measurement group; the maximum calculated lower control limit of multiple measuring machines in the measurement group under the measurement indicator is determined as the target lower control limit of the measurement indicator in the measurement group.

[0011] In one possible implementation, the calculated upper control limit and the calculated lower control limit corresponding to the measurement indicator under each measuring machine are calculated in the following manner: according to the measurement status monitoring chart corresponding to the measurement indicator under the measuring machine, a plurality of measurement fluctuation values ​​corresponding to the measurement indicator under the measuring machine are determined; the mean and the standard deviation corresponding to the plurality of measurement fluctuation values ​​are calculated; according to the mean and the standard deviation, the calculated upper control limit and the calculated lower control limit corresponding to the measurement indicator under the measuring machine are determined.

[0012] In a possible implementation, the status monitoring result corresponding to the measuring machine is determined in the following manner: for each measurement indicator, the following processing is performed: the control range of the measuring machine under the measurement indicator is determined by the target upper control limit and the target lower control limit corresponding to the measuring machine under the measurement indicator; for each measurement fluctuation value corresponding to the measurement machine under the measurement indicator, it is determined whether the measurement fluctuation value is in the control range; if the measurement fluctuation value belongs to the control range, the actual measurement value corresponding to the measurement fluctuation value is marked as qualified measurement data; if the measurement fluctuation value does not belong to the control range, the actual measurement value corresponding to the measurement fluctuation value is marked as abnormal data; the status monitoring result is generated by the qualified measurement data and abnormal data corresponding to each measurement indicator of the measuring machine.

[0013] In a second aspect, an embodiment of the present application also provides a control device for a measuring machine, the device comprising: a collection module, used to collect measurement data of the measuring machine for each target device, the measurement data comprising multiple measurement index data; a determination module, used to determine a measurement status monitoring chart of each measurement index under the measuring machine based on the multiple measurement index data of each target device by the measuring machine, the measurement status monitoring chart reflects the measurement fluctuations generated by the measurement index under the corresponding measuring machine; a generation module, used to generate a machine measurement status report corresponding to the measuring machine based on the measurement status monitoring chart corresponding to each measuring machine, the machine measurement status report records data reflecting the overall measurement status of the measuring machine.

[0014] In a third aspect, an embodiment of the present application further provides an electronic device, comprising: a processor, a memory and a bus, the memory storing machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate through the bus, and the machine-readable instructions are executed by the processor to execute the steps of the control method of the measuring machine in the above-mentioned first aspect or any possible implementation method of the first aspect.

[0015] In a fourth aspect, an embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of controlling the measuring machine in the above-mentioned first aspect or any possible implementation manner of the first aspect are executed.

[0016] The embodiments of the present application provide a control method, device, electronic device and storage medium for a measuring machine, including: collecting measurement data of the measuring machine for each target device, the measurement data including multiple measurement index data; determining a measurement status monitoring chart of each measurement index under the measuring machine according to the multiple measurement index data of each target device, the measurement status monitoring chart reflects the measurement fluctuations generated by the measurement index under the corresponding measuring machine; generating a machine measurement status report corresponding to the measuring machine according to the measurement status monitoring chart corresponding to each measuring machine, the machine measurement status report records data reflecting the overall measurement status of the measuring machine, and by collecting the measurement data corresponding to the measuring machine to evaluate the measurement status, it is possible to monitor the state of the measuring machine in real time to ensure the consistency and reliability of product quality.

[0017] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 A flow chart of a control method for a measuring machine provided in an embodiment of the present application is shown;

[0020] Figure 2 A functional module diagram of a control device for a measuring machine provided in an embodiment of the present application is shown;

[0021] Figure 3 A schematic structural diagram of an electronic device provided in an embodiment of the present application is shown. DETAILED DESCRIPTION

[0022] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. It should be understood that the drawings in the present application only serve the purpose of explanation and description and are not used to limit the scope of protection of the present application. In addition, it should be understood that the schematic drawings are not drawn in real proportion. The flowchart used in this application shows the operations implemented according to some embodiments of the present application. It should be understood that the operations of the flowchart can be implemented out of sequence, and the steps without logical context can be reversed in order or implemented simultaneously. In addition, those skilled in the art, under the guidance of the content of the present application, can add one or more other operations to the flowchart, or remove one or more operations from the flowchart.

[0023] In addition, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.

[0024] Measurement equipment and statistical process control (SPC) play a vital role in the manufacturing industry. Through the data collected by measurement equipment and the application of SPC tools, the quality of the production process can be effectively monitored and controlled to ensure the consistency and reliability of product quality.

[0025] In most SPC cases provided in the prior art, there is no relevant data statistics for the control of the measuring machine, so it is impossible to reflect the specific conditions of the measuring machine, and therefore it is impossible to determine the corresponding measurement level of the measuring machine. If the measurement results of the measuring machine continue to be unstable, it will affect the product quality.

[0026] Based on this, the embodiments of the present application provide a method, device, electronic device and storage medium for controlling a measuring machine, which can evaluate the measurement status by collecting the measurement data corresponding to the measuring machine, and can monitor the measurement machine status in real time to ensure the consistency and reliability of product quality, as follows:

[0027] See also Figure 1 , Figure 1 FIG. 1 is a flow chart showing a control method of a measuring machine provided in an embodiment of the present application. Figure 1As shown, the method provided in the embodiment of the present application comprises the following steps:

[0028] S100, collecting measurement data of each target device by a measurement machine.

[0029] The measurement data includes multiple measurement indicator data.

[0030] S200 , determining a measurement status monitoring chart of each measurement indicator under the measuring machine according to a plurality of measurement indicator data of each target device by the measuring machine.

[0031] The measurement status monitoring chart reflects the measurement fluctuations of the measurement indicators under the corresponding measurement machine.

[0032] S300 , generating a machine measurement status report corresponding to each measuring machine according to the measurement status monitoring chart corresponding to each measuring machine.

[0033] The machine measurement status report records the data reflecting the overall measurement status of the measurement machine.

[0034] In step S100 to step S300, during the process of measuring the target device by the measuring machine, multiple measurement indicators are involved, and the measurement indicators include but are not limited to at least one of the following items: diameter, thickness and parallelism. The measurement indicator data includes multiple measurement indicators and the actual measurement value corresponding to each measurement indicator. In the present application, by collecting multiple measurement indicator data of each target device by the measuring machine and the actual measurement value corresponding to each measurement indicator and performing statistical analysis, a measurement status monitoring chart reflecting the measurement fluctuations generated by the measurement indicator under the corresponding measuring machine is obtained. Through the measurement status monitoring chart corresponding to each measuring machine, the overall operating status of the measuring machine is determined, which is convenient for the user to make corresponding adjustments to the measuring machine according to the overall operating status of the measuring machine, thereby ensuring the subsequent production quality of the target device and improving the production accuracy of the target device.

[0035] In one example, the measuring machine pre-sets multiple measurement indicators for the target device and can pre-add corresponding specified data type tags for each measurement indicator. The specified data type tags can be MSPC type or SPC type, which facilitates data diversion during the data processing of the entire SPC process or MSPC process, and is more convenient for subsequent statistical analysis.

[0036] In a preferred embodiment, before executing step S100, the method further includes:

[0037] Configure standard samples for the measuring machine and determine the standard value corresponding to each measuring indicator of the standard samples.

[0038] In a specific implementation, before executing step S100, it is necessary to first set a standard sample corresponding to the target device for the measuring machine, and set the standard value corresponding to each measurement indicator of the standard sample, that is, the measuring machine measures the target device according to the given standard sample.

[0039] In a preferred embodiment, step S200 includes:

[0040] For each target device, determine the measurement fluctuation value corresponding to the measurement indicator. The measurement fluctuation value is the difference between the actual measurement value corresponding to the measurement indicator and the standard value. According to the measurement fluctuation value corresponding to the measurement indicator under each target device, draw and generate a measurement status monitoring chart of the measurement indicator under the measuring machine.

[0041] Specifically, for the measuring machine, the actual measurement value of each target device under each measurement indicator is collected through EDC (Electronic Data Capture), and then for each measurement indicator, the measurement waveform value corresponding to the measurement indicator under each target device is calculated. The corresponding measurement status monitoring chart is formed by the measurement waveform value corresponding to the measurement indicator under each target device. The measurement status monitoring chart allows the user to view the measurement status of the measuring machine more intuitively.

[0042] In a preferred embodiment, step S300 includes:

[0043] Multiple measuring machines are grouped according to the measuring machine models to obtain multiple measurement groups. For each measurement group, the following processing is performed: based on the measurement status monitoring chart of each measuring machine in the measurement group under each measurement indicator, the target control limit corresponding to each measurement indicator is determined; based on the target control limit corresponding to each measurement indicator, the status monitoring result corresponding to each measuring machine in the measurement group is determined; based on the status monitoring result corresponding to the measuring machine, a machine measurement status report is generated.

[0044] In a specific embodiment, the method of the present application can be applied to a measuring machine cluster, which includes multiple measuring machines. The multiple measuring machines execute measurement tasks on the target device in parallel. Due to the different models of the measuring machines, the standard samples set for different models of measuring machines are also different. Therefore, it is necessary to group the multiple measuring machines according to the measuring machine models to obtain multiple measurement groups. The standard samples configured for the measuring machines in the same measurement group and the standard values ​​corresponding to each measurement indicator are the same.

[0045] After the grouping is completed, calculations are performed on each measurement group separately. Specifically, for each measurement group, it is necessary to first determine the target control limits of the measuring machines in the measurement group under each measurement indicator. In this application, the target control limits are used to monitor and evaluate the stability and measurement quality of the measurement process of the measuring machines. In this application, the target control limits are used to determine whether the measurement process of the measurement indicators of the measuring machines is under controlled state. After determining the target control limits corresponding to each measurement indicator, the status monitoring results corresponding to each measuring machine in the measurement group can be obtained.

[0046] In a preferred embodiment, the target control limit includes a target upper control limit and a target lower control limit, wherein the target control limit corresponding to the measurement indicator in each measurement group is determined by:

[0047] According to the measurement status monitoring chart of each measuring machine in the measurement group under the measurement index, the calculated upper control limit and the calculated lower control limit of each measuring machine under the measurement index are calculated respectively, and the minimum calculated upper control limit of multiple measuring machines in the measurement group under the measurement index is determined as the target upper control limit of the measurement index in the measurement group, and the maximum calculated lower control limit of multiple measuring machines in the measurement group under the measurement index is determined as the target lower control limit of the measurement index in the measurement group.

[0048] Specifically, for each measuring machine in the measurement group, it is necessary to calculate the calculated upper control limit and the calculated lower control limit corresponding to the measurement indicator under the measurement machine respectively, and then select the most stringent calculated upper control limit as the target upper control limit and the most stringent calculated lower control limit as the target lower control limit based on the calculated upper control limit and the calculated lower control limit corresponding to the measurement indicator under each measurement machine in the measurement group. Specifically, the most stringent calculated upper control limit is the minimum calculated upper control limit of multiple measurement machines in the measurement group under the measurement indicator. Similarly, the most stringent calculated lower control limit is the maximum calculated upper control limit of multiple measurement machines in the measurement group under the measurement indicator.

[0049] In another preferred embodiment, the upper control limit and the lower control limit corresponding to the measurement indicator at each measurement machine are calculated in the following manner:

[0050] According to the measurement status monitoring chart corresponding to the measurement indicator under the measurement machine, determine multiple measurement fluctuation values ​​corresponding to the measurement indicator under the measurement machine, calculate the mean and standard deviation corresponding to the multiple measurement fluctuation values, and determine the calculated upper control limit and the calculated lower control limit corresponding to the measurement indicator under the measurement machine based on the mean and the standard deviation.

[0051] In a specific embodiment, for a measuring machine A, if the measuring machine measures a total of N target devices, then the following is calculated:

[0052]

[0053] In this formula, It represents the fluctuation mean of the measurement indicator under the measurement machine A, X i It represents the measurement fluctuation value corresponding to the measurement index obtained by measuring the i-th target device by measuring machine A.

[0054] Determine Then calculate the corresponding standard deviation of the measured indicator under measuring machine A:

[0055]

[0056] Among them, σ represents the fluctuation standard deviation of the measurement indicator under the measurement machine A.

[0057] Then calculate:

[0058] The calculated upper control limit corresponding to the measurement indicator

[0059] Calculated lower control limit corresponding to the measurement indicator

[0060] In a preferred embodiment, the status monitoring result corresponding to the measuring machine is determined by:

[0061] For each measurement indicator, perform the following processing:

[0062] The control range of the measuring machine under the measurement indicator is determined by the target upper control limit and the target lower control limit corresponding to the measuring machine under the measurement indicator. For each measurement fluctuation value corresponding to the measuring machine under the measurement indicator, it is determined whether the measurement fluctuation value is in the control range. If the measurement fluctuation value belongs to the control range, the actual measurement value corresponding to the measurement fluctuation value is marked as qualified measurement data. If the measurement fluctuation value does not belong to the control range, the actual measurement value corresponding to the measurement fluctuation value is marked as abnormal data. The status monitoring result is generated by the qualified measurement data and abnormal data corresponding to each measurement indicator of the measuring machine.

[0063] In one example, specifically, after determining the control range corresponding to each measurement machine under each measurement indicator, taking one of the target measurement indicators as an example, assuming that the measurement machine measures a total of 10 target devices, among the 10 actual measurement values ​​output by the measurement machine for the target measurement indicator, 3 actual measurement values ​​are not in the control range, then these 3 actual measurement values ​​are marked as abnormal data, and the other 7 actual measurement values ​​are marked as measurement and value data. The data anomaly probability of the measurement machine for the measurement indicator can also be counted. When the data anomaly probability exceeds the preset abnormal threshold, a measurement machine alarm prompt is generated, and the measurement machine alarm prompt is used as a status abnormality result.

[0064] Based on the same application concept, the embodiment of the present application also provides a control device for a measuring machine corresponding to the control method for a measuring machine provided in the above embodiment. Since the principle of solving the problem by the device in the embodiment of the present application is similar to the control method for a measuring machine in the above embodiment of the present application, the implementation of the device can refer to the implementation of the method, and the repeated parts will not be repeated.

[0065] See also Figure 2 2 shows a functional module diagram of a control device for a measuring machine provided in an embodiment of the present application. Figure 2 As shown, the device comprises:

[0066] A collection module 400 is used to collect measurement data of each target device from a measurement machine, where the measurement data includes a plurality of measurement index data;

[0067] The determination module 410 is used to determine a measurement status monitoring chart of each measurement indicator under the measurement machine according to the multiple measurement indicator data of each target device by the measurement machine, wherein the measurement status monitoring chart reflects the measurement fluctuation generated by the measurement indicator under the corresponding measurement machine;

[0068] The generating module 420 is used to generate a machine measurement status report corresponding to each measuring machine according to the measurement status monitoring chart corresponding to each measuring machine. The machine measurement status report records data reflecting the overall measurement status of the measuring machine.

[0069] Based on the same application idea, please refer to Figure 3 , Figure 3 FIG. 1 shows a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. Figure 3 As shown, the electronic device 500 includes: a processor 510, a memory 520 and a bus 530. The memory 520 stores machine-readable instructions executable by the processor 510. When the electronic device 500 is running, the processor 510 and the memory 520 communicate through the bus 530. The machine-readable instructions are executed by the processor 510 when it is running, such as the steps of the control device method of the measuring machine provided in any of the above embodiments.

[0070] Based on the same application concept, an embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the control device method for the measuring machine provided in the above embodiment are executed.

[0071] Those skilled in the art can clearly understand that, for the convenience and simplicity of description, the specific working process of the system and device described above can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here. In the several embodiments provided in the present application, it should be understood that the disclosed system, device and method can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0072] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0073] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0074] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a non-volatile computer-readable storage medium that is executable by a processor. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM), random access memory (RAM), disk or optical disk, etc., various media that can store program codes.

[0075] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A control method for a measuring machine, characterized in that: The method comprises: Collecting measurement data of each target device from a measurement machine, wherein the measurement data includes a plurality of measurement indicator data; Determine a measurement status monitoring chart of each measurement indicator under the measurement machine according to the measurement indicator data of each target device, wherein the measurement status monitoring chart reflects the measurement fluctuations generated by the measurement indicator under the corresponding measurement machine; According to the measurement status monitoring chart corresponding to each measuring machine, a machine measurement status report corresponding to the measuring machine is generated, and the machine measurement status report records data reflecting the overall measurement status of the measuring machine.

2. The method according to claim 1, characterized in that Before collecting the measurement data of each target device by the measurement machine, the method further includes: Configuring standard samples for the measuring machine; Determine the standard value corresponding to each measurement indicator of the standard sample.

3. The method according to claim 2, characterized in that The measurement index data includes multiple measurement indexes and actual measurement values ​​corresponding to each measurement index. The measurement status monitoring chart of each measurement indicator under the measurement machine is determined by the following method: For each target device, determining a measurement fluctuation value corresponding to the measurement indicator, wherein the measurement fluctuation value is a difference between an actual measurement value corresponding to the measurement indicator and a standard value; According to the measurement fluctuation value corresponding to the measurement indicator under each target device, a measurement status monitoring chart of the measurement indicator under the measurement machine is drawn and generated.

4. The method according to claim 2, characterized in that: Generate the machine measurement status report corresponding to the measurement machine in the following ways: Group multiple measuring machines according to their models to obtain multiple measuring groups; For each measurement group, perform the following processing: According to the measurement status monitoring chart of each measuring machine in the measurement group under each measurement indicator, determine the target control limit corresponding to each measurement indicator, and according to the target control limit corresponding to each measurement indicator, determine the status monitoring result corresponding to each measuring machine in the measurement group; Generate a measurement status report of the measuring machine according to the status monitoring result corresponding to the measuring machine.

5. The method according to claim 4, characterized in that The target control limit includes the target upper control limit and the target lower control limit. The target control limits corresponding to the measurement indicators in each measurement group are determined in the following ways: According to the measurement status monitoring chart of each measuring machine in the measurement group under the measurement index, respectively calculate the calculation upper control limit and the calculation lower control limit of each measuring machine under the measurement index; Determine the minimum calculated upper control limit of the multiple measuring machines in the measurement group under the measurement index as the target upper control limit of the measurement index in the measurement group; The maximum calculated lower control limit of the measurement indicators of the multiple measurement machines in the measurement group is determined as the target lower control limit of the measurement indicator in the measurement group.

6. The method according to claim 5, characterized in that The upper and lower control limits of the measurement indicators corresponding to each measuring machine are calculated in the following way: Determine a plurality of measurement fluctuation values ​​corresponding to the measurement indicator under the measurement machine according to a measurement status monitoring chart corresponding to the measurement indicator under the measurement machine; Calculating means and standard deviations corresponding to the plurality of measured fluctuation values; According to the mean value and the standard deviation, the calculated upper control limit and the calculated lower control limit corresponding to the measurement indicator under the measurement machine are determined.

7. The method according to claim 5, characterized in that Determine the status monitoring results corresponding to the measuring machine by the following methods: For each measurement indicator, perform the following processing: Determine the control range of the measuring machine under the measurement indicator based on the target upper control limit and target lower control limit corresponding to the measurement machine under the measurement indicator; For each measurement fluctuation value corresponding to the measurement indicator of the measuring machine, determining whether the measurement fluctuation value is within the control range; If the measurement fluctuation value belongs to the control interval, the actual measurement value corresponding to the measurement fluctuation value is marked as qualified measurement data; If the measurement fluctuation value does not belong to the control interval, the actual measurement value corresponding to the measurement fluctuation value is marked as abnormal data; The state monitoring results are generated by the measurement qualified data and abnormal data corresponding to each measurement indicator of the measuring machine.

8. A control device for a measuring machine, characterized in that: The device comprises: A collection module, used to collect measurement data of each target device from a measurement machine, wherein the measurement data includes a plurality of measurement index data; A determination module, configured to determine a measurement status monitoring chart of each measurement indicator under the measurement machine according to a plurality of measurement indicator data of each target device measured by the measurement machine, wherein the measurement status monitoring chart reflects the measurement fluctuations generated by the measurement indicator under the corresponding measurement machine; The generating module is used to generate a machine measurement status report corresponding to each measuring machine according to the measurement status monitoring chart corresponding to each measuring machine, wherein the machine measurement status report records data reflecting the overall measurement status of the measuring machine.

9. An electronic device, characterized in that: include: A processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate through the bus, and the machine-readable instructions are executed by the processor to execute the steps of the control method of the measuring machine as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the control method of the measuring machine according to any one of claims 1 to 7 are executed.

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