Processing method, device and system for repairing solar cell and storage medium

Abstract

The invention discloses a processing method, device and system for repairing a solar cell, and a storage medium. The processing method comprises the following steps: determining performance parameters of the solar cell; performing equivalent model fitting according to the performance parameters, and determining a series resistance value in an equivalent model of the solar cell and a first capacitance value and a first resistance value in a capacitance branch; according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters, determining the to-be-applied duration and the to-be-applied voltage waveform of the solar cell; wherein the to-be-applied duration and the to-be-applied voltage waveform are used for performing forward bias voltage recovery on the solar cell so as to repair the solar cell. Therefore, specific forward bias voltage and application duration can be adaptively applied to the solar cells with different structures and different components, and the recovery of the performance of the solar cells is facilitated.

Description

Technical Field

[0001] The present application relates to the field of photovoltaic power generation technology, and in particular to a processing method, device, system and storage medium for repairing solar cells. Background Art

[0002] Solar cells (such as perovskite cells) have shown great potential in the energy field due to their excellent photoelectric conversion efficiency. However, in actual working conditions, there is a large amount of ion movement in solar cells, which leads to the decline of solar cell performance.

[0003] In the related art, a bias voltage is usually applied to the solar cell to restore the ion movement in the solar cell; however, the existing solutions usually apply a fixed bias voltage repair strategy to the solar cell, which may cause unnecessary ion movement damage and is not conducive to the repair of the solar cell performance. Summary of the invention

[0004] The present application proposes a processing method, device, system and storage medium for repairing solar cells, which can adaptively apply a specific forward bias voltage and application duration to solar cells of different structures and components, thereby facilitating the recovery of solar cell performance.

[0005] The technical solution of this application is implemented as follows: In a first aspect, an embodiment of the present application provides a processing method for repairing a solar cell, the processing method comprising: Determine the performance parameters of solar cells; Perform equivalent model fitting according to the performance parameters to determine the series resistance value in the equivalent model of the solar cell and the first capacitance value and the first resistance value in the capacitance branch; According to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters, the time to be applied and the waveform of the voltage to be applied of the solar cell are determined; wherein the time to be applied and the waveform of the voltage to be applied are used to perform forward bias recovery on the solar cell to repair the solar cell.

[0006] Through the above technical means, the performance parameters of the solar cell are first determined; then, the equivalent model is fitted according to the performance parameters of the solar cell to determine the series resistance value in the equivalent model of the solar cell and the first capacitance value and the first resistance value in the capacitance branch; then, according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters, the time to be applied and the voltage waveform to be applied of the solar cell are determined to achieve forward bias recovery of the solar cell. In this way, the parameters of each component in the equivalent model of the solar cell are determined by the performance parameters of the solar cell, and the time to be applied and the voltage waveform to be applied required for the solar cell are calculated according to the parameters of each component and the maximum power parameter; in this way, the required time to be applied and the voltage waveform to be applied can be determined adaptively for solar cells of different structures and different components, respectively, so as to apply customized forward bias to different solar cells, which is not only conducive to the recovery of the performance of the solar cell, but also can avoid the additional damage to the ion movement of the solar cell caused by the illogical forward bias in the related technology, thereby protecting the internal structure of the solar cell from further damage, and further improving the recovery efficiency and performance of the solar cell.

[0007] In some embodiments, the time to be applied and the waveform of the voltage to be applied of the solar cell are determined according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters, including: determining the time to be applied according to the first capacitance value and the first resistance value; determining the waveform of the voltage to be applied according to the series resistance value and the maximum power parameter.

[0008] Through the above technical means, due to the migration of ions in the solar cell, there is a capacitance effect in the solar cell, such as a perovskite battery; according to the principle of capacitor charging and discharging, it can be known that the time required for the first capacitor to be fully charged is related to the first capacitor and the first resistor of the capacitor branch, so the first capacitor and the first resistor can be used to determine the duration to be applied; and when the first capacitor is fully charged, the solar cell operates at the maximum power point, so the maximum power parameter and the series resistance value can also be used to determine the voltage waveform to be applied. In this way, based on the principle of capacitor charging and discharging and the equivalent model of the solar cell, the method of forward bias recovery of the solar cell is determined, and the first capacitor in the equivalent model of the solar cell can be fully charged, which can eliminate the capacitance effect caused by ion migration, so that the ions can be restored to the original state to the greatest extent, and the performance recovery of the solar cell is better achieved.

[0009] In some embodiments, determining the time to be applied according to the first capacitance value and the first resistance value includes: multiplying the first capacitance value and the first resistance value to obtain a time constant; and setting the time to be applied to the product of the time constant and a preset value.

[0010] Through the above technical means, according to the principle of capacitor charging and discharging, it can be known that the voltage value of the capacitor fully charged is 3 to 5 times the time constant required, and the time constant is related to the first capacitance value and the first resistance value. In this way, the time to be applied is set to the product of the time constant and the preset value, and the first capacitor in the equivalent model of the solar cell can be fully charged. At this time, the capacitor branch in the equivalent model is in a disconnected state, thereby eliminating the capacitance effect caused by ion migration.

[0011] In some embodiments, the voltage waveform to be applied is determined based on the series resistance value and the maximum power parameter, including: determining the initial voltage value; determining the termination voltage value based on the series resistance value and the maximum power parameter; generating the voltage waveform to be applied based on the initial voltage value and the termination voltage value, and the change trend of the voltage waveform to be applied conforms to the change trend of the capacitor charging waveform curve.

[0012] Through the above-mentioned technical means, according to the principle of capacitor charging and discharging, it can be known that the charging process of the capacitor is related to the initial voltage value and the termination voltage value. The termination voltage value determined according to the series resistance value and the maximum power parameter makes the first capacitor in a fully charged state, and then a voltage waveform to be applied that conforms to the capacitor charging waveform curve is generated according to the initial voltage value and the termination voltage value. In this way, the first capacitor in the equivalent model of the solar cell can be fully charged. At this time, the capacitor branch in the equivalent model is in a disconnected state, thereby eliminating the capacitance effect caused by ion migration and restoring the ions to their original state to the greatest extent, that is, properly restoring the state of the ions; and according to the voltage waveform to be applied, the performance recovery of the solar cell can be better achieved, and the photoelectric conversion efficiency of the solar cell can be restored to the greatest extent.

[0013] In some embodiments, the maximum power parameters include a maximum power voltage value and a maximum power current value; accordingly, the termination voltage value is determined according to the series resistance value and the maximum power parameters, including: adding the product of the maximum power current value and the series resistance value to the maximum power voltage value to obtain the termination voltage value.

[0014] Through the above-mentioned technical means, the termination voltage value is determined by the maximum power voltage value, the maximum power current value and the series resistance value, so that the first capacitor in the equivalent model of the solar cell can be in a fully charged state. At this time, the capacitor branch in the equivalent model is in a disconnected state, thereby eliminating the capacitance effect caused by ion migration and restoring the ions to their original state to the greatest extent, which is conducive to achieving performance recovery of the solar cell.

[0015] In some embodiments, the voltage waveform to be applied is determined based on the series resistance value and the maximum power parameter, including: determining the target applied voltage value based on the series resistance value and the maximum power parameter; setting the voltage values ​​to be applied of the voltage waveform to be applied at different times to be equal to the target applied voltage value.

[0016] Through the above-mentioned technical means, the target applied voltage value is determined according to the series resistance value and the maximum power parameter. The solar cell is fixedly forward biased and restored by the target applied voltage value. The first capacitor in the equivalent model of the solar cell can also be fully charged. At this time, the capacitor branch in the equivalent model is in a disconnected state, thereby eliminating the capacitive effect caused by ion migration and restoring the ions to their original state to the greatest extent, that is, properly restoring the state of the ions, which is conducive to achieving performance recovery of the solar cell and can also restore the photoelectric conversion efficiency of the solar cell to the greatest extent.

[0017] In some embodiments, after repairing the solar cell, the processing method also includes: determining updated performance parameters based on a preset time interval; performing equivalent model fitting according to the updated performance parameters to determine the series resistance value, the first capacitance value and the first resistance value in the updated equivalent model; determining an updated time to be applied and an updated voltage waveform to be applied according to the series resistance value, the first capacitance value and the first resistance value in the updated equivalent model and the updated maximum power parameter; wherein the updated time to be applied and the updated voltage waveform to be applied are used for the next forward bias recovery of the solar cell.

[0018] Through the above technical means, after repairing the solar cell, the performance parameters are updated at preset time intervals, and the parameters of each device in the equivalent model are updated based on the updated performance parameters. In this way, customized forward bias and application duration can be applied to solar cells with different aging degrees, that is, solar cells with different aging degrees can adaptively determine different forward bias waveforms and application durations, which can avoid additional damage to the ion movement of the solar cell due to illogical forward bias application, and can also significantly improve the recovery efficiency and performance of the solar cell.

[0019] In some embodiments, the time interval for the solar cell to perform the volt-ampere characteristic test is shorter than the time interval for the solar cell to perform the forward bias recovery.

[0020] Through the above-mentioned technical means, the time interval for the solar cell to perform the volt-ampere characteristic test is shorter than the time interval for the solar cell to perform the forward bias recovery. In this way, more accurate volt-ampere characteristic test data can be obtained when calculating the relevant values ​​of the forward bias, which is beneficial to improve the accuracy of the parameters used to calculate the equivalent model, and then more accurate application time and voltage waveform to be applied can be obtained, so that the performance recovery of the solar cell can be realized to the greatest extent, thereby improving the efficiency of the solar cell.

[0021] In a second aspect, an embodiment of the present application provides a processing device for repairing a solar cell, the processing device comprising a determination unit, a modeling unit and a processing unit, wherein: a determination unit configured to determine a performance parameter of the solar cell; A modeling unit is configured to perform equivalent model fitting according to the performance parameters to determine a series resistance value in the equivalent model of the solar cell and a first capacitance value and a first resistance value in the capacitance branch; The processing unit is configured to determine the time to be applied and the waveform of the voltage to be applied of the solar cell according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters; wherein the time to be applied and the waveform of the voltage to be applied are used to perform forward bias recovery on the solar cell to repair the solar cell.

[0022] Through the above-mentioned technical means, the parameters of each component in the equivalent model of the solar cell are determined by the performance parameters of the solar cell, and the required application time and voltage waveform to be applied for the solar cell are calculated according to the parameters of each component and the maximum power parameters; in this way, the required application time and voltage waveform to be applied can be adaptively determined for solar cells of different structures and components, respectively, so as to apply customized forward bias voltages to different solar cells, which is not only conducive to realizing the recovery of solar cell performance, but also can avoid the additional damage to the ion movement of the solar cell caused by the illogical forward bias voltage applied in the related technology.

[0023] In a third aspect, an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by at least one processor, the method as described in any one of the first aspects is implemented.

[0024] In a fourth aspect, an embodiment of the present application provides a solar cell repair system, the repair system comprising a solar cell, a control device, a repair device and a testing device, the testing device is connected to the solar cell, and the repair device is connected to the control device and the solar cell respectively: wherein: A testing device is configured to provide a voltage signal to the solar cell, perform a volt-ampere characteristic test on the solar cell, obtain a current signal generated by the solar cell, and send the voltage signal and the current signal to the control device; The control device is configured to determine the performance parameters of the solar cell based on the voltage signal and the current signal; perform equivalent model fitting according to the performance parameters to determine the series resistance value in the equivalent model of the solar cell and the first capacitance value and the first resistance value in the capacitance branch; and determine the time to be applied and the voltage waveform to be applied of the solar cell according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters; and send the time to be applied and the voltage waveform to be applied to the repair device; The repair device is configured to perform forward bias recovery on the solar cell according to the time to be applied and the voltage waveform to be applied, so as to repair the solar cell.

[0025] Through the above-mentioned technical means, the volt-ampere characteristic test of the solar cell is carried out through the testing device, so that the control device determines the parameters of each component in the equivalent model of the solar cell, and the control device calculates the required application time and the voltage waveform to be applied for the solar cell according to the parameters of each component and the maximum power parameter; in this way, the required application time and the voltage waveform to be applied can be adaptively determined for solar cells of different structures and components, respectively, so as to apply customized forward bias voltages to different solar cells, which is not only conducive to realizing the recovery of solar cell performance, but also can avoid the additional damage to the ion movement of the solar cell caused by the illogical forward bias voltage applied in the related technology, thereby protecting the internal structure of the solar cell from further damage, and further improving the recovery efficiency and performance of the solar cell.

[0026] In some embodiments, the repair system also includes a signal collecting device, and the signal collecting device is connected to the testing device and the control device respectively; wherein: the signal collecting device is configured to receive a voltage signal sent by the testing device and a current signal generated by the solar cell, and send the voltage signal and the current signal to the control device so that the control device can determine the performance parameters of the solar cell.

[0027] Through the above-mentioned technical means, the signal collection device receives the voltage signal sent by the test device and the current signal generated by the solar cell, and sends the voltage signal and the current signal to the control device, so that the control device can accurately determine the performance parameters of the solar cell, and then enable the control device to determine the application time and the voltage waveform to be applied required for forward bias recovery, which is conducive to achieving the recovery of solar cell performance.

[0028] In some embodiments, the repair system further includes a light simulation device, and the light simulation device is connected to the control device; wherein: the light simulation device is configured to receive a control signal sent by the control device, and perform light simulation on the solar cell according to the control signal.

[0029] Through the above-mentioned technical means, when performing repair tests on solar cells, the light simulation device can simulate a variety of lighting conditions, such as simulating the alternating light and dark process under natural conditions, so that the solar cells can be repaired and tested under different lighting conditions, thereby improving the repair efficiency of solar cells.

[0030] It should be understood that the above general description and the following detailed description are merely exemplary and explanatory, and are not intended to limit the technical solutions of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1 A schematic diagram of a processing method provided in an embodiment of the present application Figure 1 ; Figure 2 A schematic diagram of the composition structure of an equivalent model provided in an embodiment of the present application; Figure 3 A schematic diagram of a processing method provided in an embodiment of the present application Figure 2 ; Figure 4 A fitting schematic diagram of a capacitor charging model provided in an embodiment of the present application; Figure 5 A schematic diagram of a processing method provided in an embodiment of the present application Figure 3 ; Figure 6 A schematic diagram of a processing method provided in an embodiment of the present application Figure 4 ; Figure 7 A schematic diagram of the structure of a processing device provided in an embodiment of the present application; Figure 8 A schematic diagram of the structure of a repair system provided in an embodiment of the present application; Fig. 9 A schematic diagram of an application framework of a repair system provided in an embodiment of the present application; Fig.10 A schematic diagram of a processing method provided in an embodiment of the present application Figure 5 ; Fig.11 A schematic diagram of a processing method provided in an embodiment of the present application Figure 6 . DETAILED DESCRIPTION

[0032] In order to enable a more detailed understanding of the features and technical contents of the embodiments of the present application, the implementation of the embodiments of the present application is described in detail below in conjunction with the accompanying drawings. The attached drawings are for reference only and are not used to limit the embodiments of the present application.

[0033] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein are only for the purpose of describing the embodiments of this application and are not intended to limit this application.

[0034] In the following description, reference is made to “some embodiments”, which describe a subset of all possible embodiments, but it will be understood that “some embodiments” may be the same subset or different subsets of all possible embodiments and may be combined with each other without conflict.

[0035] It should also be pointed out that the terms "first\second\third" involved in the embodiments of the present application are only used to distinguish similar objects and do not represent a specific ordering of the objects. It can be understood that "first\second\third" can be interchanged in a specific order or sequence where permitted, so that the embodiments of the present application described here can be implemented in an order other than that illustrated or described here.

[0036] In addition, the reference to "embodiment" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiment may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0037] The following is an introduction to the relevant terms and technologies of this application.

[0038] Ion migration (or ion movement) mainly refers to the movement of ions inside solar cell materials under the action of external electric fields or concentration gradients. This migration phenomenon is closely related to factors such as the crystal structure, defects, temperature and external electric field of solar cells. Specifically, taking perovskite solar cells (abbreviated as "perovskite cells") as an example, the perovskite crystals as the photoactive layer are composed of weak ionic bonds and van der Waals interactions, which leads to a large number of ions in perovskite cells leaving their original lattice positions and moving under actual working conditions (specific light and voltage). Among them, the concentration of mobile ions can reach 10 15 ~10 17 Cubic centimeters to the negative first power (cm -3 ).

[0039] Photoelectric conversion efficiency is also known as power conversion efficiency (PCE), which measures the ability of solar cells to convert light energy into electrical energy. The value of photoelectric conversion efficiency is a percentage. The test equipment for solar cells uses the standard spectrum of the global horizontal irradiance spectrum (Air Mass 1.5 Global, AM1.5G); this spectrum is obtained after artificial correction based on the actual AM1.5G spectrum, and its light intensity is 1000 watts per square meter (W / ㎡). If a cell area is 154 square centimeters (cm 2 ), if it is irradiated with AM1.5G standard light, the energy on it is 15.4W. If after testing, the battery power is 2.6 watts (W), then its conversion efficiency is 2.6 / 15.4=16.88%.

[0040] The absolute recovery rate is defined as the difference between the average retained power of the experimental group and the control group before and after aging. The retained power of a solar cell refers to the output power of the solar cell under specific conditions. Specifically, the retained power usually refers to the output power under standard lighting conditions (for example, the light intensity per square meter is 1000 watts); the average retained power is the average of the retained powers of multiple solar cells.

[0041] The current-voltage (IV) test is a test method used to study the relationship between current and voltage. In electrical engineering, IV testing is a basic experiment that measures the IV curves of components such as resistors, diodes, and power supplies to understand the electrical properties of components and their applications in circuits. The purpose of IV testing is to obtain data on the relationship between current and voltage. By drawing the IV curve, the performance characteristics of the components can be analyzed, which is very important for understanding and optimizing circuit design. Especially in the development of the solar energy industry, the effective implementation of IV testing is crucial to improving the testing methods and testing capabilities of solar cells. This is one of the keys to accelerating the development and expansion of the solar cell industry. Through IV testing, the performance of solar cells can be evaluated to ensure that they can effectively convert and utilize solar energy, thereby providing support for solving the energy crisis and rationally utilizing solar energy resources.

[0042] Working condition test of solar cells (light-dark alternation test): Solar cells are not always in the same sunlight intensity under working conditions, but in different sunlight intensities according to the change of the solar altitude angle. Generally, the state of solar cells can be divided into light state and dark state. Therefore, in the process of performance and stability testing, light-dark alternation test is usually used to simulate the actual performance of the device.

[0043] Maximum power output (Pmax) refers to the maximum power output that a solar cell can generate under specific conditions. The maximum power output is measured under standard test conditions (STC), which include a certain solar irradiance, the distribution of the solar spectrum, and the temperature of the solar cell. Specifically, the STC defined by the European Commission includes conditions where the surface temperature of the solar cell is 25 degrees Celsius (℃) and the solar radiation intensity is 1000W / m². Under these conditions, the maximum power that a solar cell module can output is its maximum output power.

[0044] In a resistor-capacitor (RC) circuit, the time constant (which can be represented by "τ") can be equal to the product of the resistance and the capacitance, which is an important parameter of the RC circuit. The time constant represents the time required for the circuit to transition from one steady-state condition to another steady-state condition under step-change input conditions. For an RC circuit, the time constant is defined as the product of the resistance value and the capacitance value, that is, τ=RC. This constant plays an important role in circuit analysis and design, especially in describing the transition reaction time process of the circuit. The time constant represents the time required for a physical quantity to decay from the maximum value to 1 / e of the maximum value. For a quantity that decays exponentially, the time required for its amplitude to decay to 1 / e times is the time constant. In an RC circuit, the time constant determines the speed at which the capacitor charges or discharges. When the capacitor is charged to 63%, it takes 1 time constant; when it is charged to 95%, it takes 3 time constants. Therefore, by adjusting the values ​​of the resistor and capacitor, the transition reaction time of the RC circuit can be controlled to meet different application requirements.

[0045] The PN junction of a solar cell is its core component. The PN junction is formed at the interface of a P-type semiconductor and an N-type semiconductor by using different doping processes to make them on the same silicon wafer. In an N-type semiconductor, there are many electrons and few holes; in a P-type semiconductor, there are many holes and few electrons. When these two semiconductors combine to form a PN junction, the presence of a carrier concentration gradient between them leads to the diffusion movement of holes from the P region to the N region and electrons from the N region to the P region. Near the PN junction, due to the diffusion movement of carriers, a space charge region is formed, in which the charges generate an electric field pointing from the N region to the P region, i.e., a built-in electric field. A forward biased PN junction refers to a state in which the P region (the hole transport layer side in the perovskite device) is connected to the positive pole of the power supply, the N region (the electron transport layer side in the perovskite device) is connected to the negative pole of the power supply, the PN junction barrier width becomes smaller, and the current through the PN junction increases.

[0046] In addition, based on the capacitor charging and discharging theory, the relationship between voltage and charging time can be obtained as follows: (1) in, is the voltage value on the capacitor at time t, is the initial voltage value on the capacitor, is the termination voltage value on the capacitor; τ is the time constant, and τ=RC, R is the resistance, and C is the capacitance. Formula (1) describes the voltage value on the capacitor when the solar cell is charged when there is a capacitance effect in the solar cell. There is an exponential relationship between the current and the charging time t. Similarly, the relationship between the current and the charging time can be obtained by deducing as follows: (2) in, is the current value on the capacitor at time t, is the initial current value on the capacitor, is the termination current value on the capacitor; usually, in an RC circuit, the time constant determines the speed of charging or discharging the capacitor. When the capacitor is charged to 63%, it takes 1 time constant; when it is charged to 95%, it takes 3 time constants. Therefore, by adjusting the values ​​of resistance and capacitance, the transition reaction time of the RC circuit can be controlled to meet different application requirements.

[0047] With the development of new energy, photovoltaic power generation systems have been widely used. Photovoltaic power generation systems are power generation systems that use the photovoltaic effect of semiconductor materials to directly convert solar radiation energy into electrical energy. Such systems are usually composed of solar cells, controllers, inverters, batteries and other accessories. Among them, solar cells are the core part of the entire photovoltaic power generation system, which is used to convert solar energy into DC power.

[0048] For example, taking solar cells, such as perovskite cells, as an example, they have excellent photoelectric conversion efficiency and have received widespread attention. However, the perovskite crystals as the photoactive layer are composed of weak ionic bonds and van der Waals interactions, which leads to a large amount of ion movement in perovskite cells under actual working conditions.

[0049] Here, due to the induction of the built-in electric field, ions tend to gather at the edge, resulting in a rapid deterioration in device efficiency. In addition, when ions move into the charge transport layer, they may change the energy level structure of the charge transport layer, thereby affecting the charge collection efficiency; react with the metal back contact to form an insulating layer and change the work function, thereby affecting the charge collection efficiency; lose electrons and convert into halogen gas and volatilize, resulting in a decrease in the long-term stability of the perovskite device, etc. All of the above results will lead to a decrease in the long-term stability of the perovskite device. Therefore, preventing the loss of ions in the perovskite layer and thus ensuring the stability of the perovskite layer structure is of great significance to the efficiency and stability of the device.

[0050] Although the related art proposes to use interface buffer layers, enhance the bond energy in the perovskite crystal structure and other methods to block the movement of ions in perovskite, the structure of the perovskite ion crystal still cannot prevent the movement of ions on a long time scale. In addition, the related art also proposes a method of applying a bias using special equipment to restore the movement of ions in perovskite. However, the above methods do not provide the logic of bias application, which will lack effective guidance for the perovskite battery industry, which is still in the initial stage of industrialization and has many routes. For example, in the related art, solar cells are usually restored to ion movement in solar cells by applying a bias; however, this method usually tests solar cells of specific structures and components to obtain the applied voltage and application time required to apply the bias, and the applied voltage and application method are both fixed values, which may cause excessive ion movement and cannot be applied to solar cells of different structures and components.

[0051] Based on this, the embodiment of the present application provides a processing method for repairing solar cells, first determining the performance parameters of the solar cell; then performing equivalent model fitting according to the performance parameters of the solar cell, determining the series resistance value in the equivalent model of the solar cell and the first capacitance value and the first resistance value in the capacitance branch; then determining the time to be applied and the voltage waveform to be applied of the solar cell according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters, so as to achieve forward bias recovery of the solar cell. In this way, the parameters of each component in the equivalent model of the solar cell are determined by the performance parameters of the solar cell, and the time to be applied and the voltage waveform to be applied required for the solar cell are calculated according to the parameters of each component and the maximum power parameter; in this way, the required time to be applied and the voltage waveform to be applied can be determined adaptively for solar cells of different structures and different components, respectively, so as to apply customized forward bias for different solar cells, which is not only conducive to realizing the recovery of the performance of the solar cell, but also can avoid the additional damage to the ion movement of the solar cell caused by the illogical forward bias in the related technology, thereby protecting the internal structure of the solar cell from further damage, and further improving the recovery efficiency and performance of the solar cell.

[0052] The present application is further described in detail below through the accompanying drawings and specific embodiments.

[0053] In one embodiment of the present application, Figure 1 A schematic diagram of a processing method provided in an embodiment of the present application Figure 1 .like Figure 1 As shown, the processing method may include: S101, determining performance parameters of a solar cell.

[0054] In the embodiment of the present application, the solar cell may be a perovskite cell. Here, the solar cell may be referred to as a solar cell, or may be referred to as a photovoltaic device, or may also be referred to as a device, without specific limitation.

[0055] In the implementation of the present application, the volt-ampere characteristic test of the solar cell can be performed by the testing device, and the IV curve can be obtained by the volt-ampere characteristic test, and the performance parameters corresponding to the IV curve can be obtained by analyzing the IV curve. Among them, the performance parameters may include open circuit voltage Voc, short circuit current Isc, maximum power parameter, fill factor FF and maximum conversion efficiency Eff, etc. Among them, the maximum power parameter may include maximum power voltage V MPP and maximum power current I MPPHere, the maximum power voltage may also be referred to as the maximum power point voltage, the maximum power current may also be referred to as the maximum power point current, and the IV test may also be referred to as the IV sweep.

[0056] In the embodiment of the present application, the volt-ampere characteristic test of the solar cell can be carried out by connecting a measuring device, etc. Specifically, under the irradiation of simulated sunlight, the bias voltage is gradually applied and the current value under different bias voltages is recorded, so as to draw the IV curve of the solar cell, and analyze the performance parameters such as the open circuit voltage, short circuit current, maximum output parameter and fill factor accordingly. Here, if a test device with high measurement accuracy is used, such as an active meter, then an accurate IV curve can be obtained by performing an IV test on the solar cell once; if a test device with low sampling measurement accuracy is used, such as an electronic load, then it is necessary to perform multiple IV tests on the solar cell (for example, 10 times) to obtain multiple IV curves, and then average these multiple IV curves to obtain an IV curve and use it as the final IV curve, or select the IV curve in the middle of these multiple IV curves and use it as the final required IV curve. There is no specific limitation on this, and it is sufficient to obtain an accurate IV curve.

[0057] In addition, in the embodiment of the present application, since solar cells with different components, structures and aging degrees have different equivalent models and corresponding IV curves, an IV test can be performed on a fresh solar cell to obtain a corresponding IV curve and obtain an equivalent model corresponding to the solar cell.

[0058] It should also be noted that when performing the initial IV test on the solar cell, the solar cell needs to be pre-processed. For example, the solar cell is first treated in the dark state, and then after being placed for a period of time, the solar cell is treated in the light state. This can obtain a stable IV curve and avoid the problem of inaccurate IV curve obtained due to the metastable state of solar cells such as perovskite cells.

[0059] S102, performing equivalent model fitting according to the performance parameters to determine the series resistance value in the equivalent model of the solar cell and the first capacitance value and the first resistance value in the capacitance branch.

[0060] In the embodiment of the present application, there is an obvious capacitance effect in solar cells such as perovskite cells, and there is no obvious capacitance effect in inorganic solar cells such as silicon and selenium; the main reason is: for solar cells such as silicon, copper indium gallium selenide, their chemical bonds are ionic bonds, or stronger chemical bonds, and the ion migration phenomenon is not obvious; while for perovskite cells, the bonding of their chemical bonds is relatively weak, and there is an obvious phenomenon of ion migration, resulting in an obvious capacitance effect. Therefore, for solar cells with capacitance effect, such as perovskite cells, after obtaining performance parameters, an equivalent model describing the characteristics of solar cells and an RC circuit model describing the characteristics of capacitance are combined for fitting to determine the equivalent model of the solar cell. In other words, the data obtained by IV testing can be used to derive the specific values ​​of components such as resistance, capacitance, and inductance in the equivalent circuit, thereby establishing an accurate equivalent model. Here, the equivalent model can be called an equivalent circuit, or an equivalent circuit model, or an equivalent circuit.

[0061] In the embodiments of the present application, Figure 2 A schematic diagram of the composition structure of an equivalent model provided in an embodiment of the present application. Figure 2 The equivalent model shown in is obtained by fitting the data obtained by IV testing of a perovskite cell, the device structure of which is FTO / NiOX / Perovskite / C60 / ALD-SnOX / Cu. Figure 2 As shown, the equivalent circuit of the solar cell includes a current source Bi, a diode D, a first capacitor C, a first resistor R, a parallel resistor R sh and series resistance R s For the connection relationship of each equivalent component, please refer to Figure 2 Here, the first capacitor C and the first resistor form a capacitor branch, that is, an RC circuit; based on the principle of capacitor charging and discharging, after the capacitor in the capacitor branch is fully charged, the capacitor branch where the first capacitor and the first resistor are located is disconnected. At this time, the external voltage on both sides of the positive and negative motors is the maximum power voltage, and flows through the series resistor R s The circuit is the maximum power current. In addition, at the maximum power output of the solar cell, the voltage on both sides of the positive and negative electrodes is the maximum power voltage, flowing through the series resistor R s The circuit has the maximum power current.

[0062] Here, the device structure of FTO / NiOX / Perovskite / C60 / ALD-SnOX / Cu is explained in detail: FTO is fluorine-doped tin oxide, which is a transparent conductive substrate. It is the starting point of the perovskite cell and has high light transmittance and excellent conductivity, allowing sunlight to enter the cell and effectively collect the generated current; NiOX is nickel oxide, as part of the hole transport layer, used to collect and transport the photogenerated holes generated by the perovskite layer; Perovskite is perovskite, the perovskite layer is the core part of the perovskite cell, as a light absorption layer material, it absorbs sunlight and generates electron-hole pairs. C60 is fullerene, and the C60 layer is usually used as part of the electron transport layer to efficiently export photogenerated electrons from the perovskite layer to the external circuit; ALD-SnOX is atomic layer deposited tin oxide, as an electron transport layer or interface modification layer, used to further optimize the electron transport performance of the cell; Cu is copper, used to collect the current generated by the perovskite cell and output it to the external circuit.

[0063] It should be noted that Figure 2 It is only an equivalent circuit schematic diagram of a perovskite battery, which includes a capacitor branch, and an equivalent circuit diagram of the characteristics of a perovskite battery can be reflected. Here, the design for different device structures may cause the specific forms of each element in the equivalent circuit to be different, such as including two capacitors and a resistor in the capacitor branch, and these two capacitors and this resistor are all connected in series. However, the equivalent circuit for different device structures may be different from this characteristic, and the calculation of the applied voltage and application duration required for forward bias recovery is not affected, that is, the processing method for solar cell repair provided by the present application can still be used, that is, the processing method for solar cell repair provided by the present application embodiment can be applied to different device structures, different components and different aging degrees of solar cells. Customized forward bias recovery is applied, and it is calmly avoided that the bias without logic is applied to cause additional damage to the ion movement of the device.

[0064] S103, determining the time to be applied and the waveform of the voltage to be applied of the solar cell according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters; wherein the time to be applied and the waveform of the voltage to be applied are used to perform forward bias recovery on the solar cell to repair the solar cell.

[0065] In the embodiment of the present application, the time to be applied to the solar cell and the voltage waveform to be applied can be determined by the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameter, so that the forward bias of the solar cell can be restored to repair the solar cell. Here, the voltage waveform to be applied can also be referred to as a forward bias waveform.

[0066] It should be noted that the PN junction of a solar cell is its core component. The PN junction is formed by using different doping processes to make a P-type semiconductor (high hole concentration) and an N-type semiconductor (high electron concentration) on the same silicon wafer. Taking a perovskite cell as an example, its PN junction is in a negative bias state when working, which leads to ion migration. At this time, a forward bias needs to be applied to properly restore the ion state so that the perovskite cell can restore its performance. It can also be understood that solar cells have ion movement under light. For perovskite cells, their lattices are too soft, making the bonds between ions very thin and easily torn under light, causing some ions to run away, and these running ions are the main reason for the attenuation of most devices. The purpose of forward bias recovery is to restore these ions to their original positions before they completely damage the device, thereby restoring the performance of the device to the greatest extent.

[0067] In some embodiments, the time interval for the solar cell to perform the volt-ampere characteristic test is shorter than the time interval for the solar cell to perform the forward bias recovery.

[0068] In the embodiment of the present application, the time interval for the volt-ampere characteristic test of the solar cell is shorter than the time interval for the forward bias recovery of the solar cell. For example, if the forward bias recovery is performed once a day, then the IV test can be performed at time intervals of 3 hours, 12 hours, etc. in the light state to obtain the required time to be applied and the voltage waveform to be applied for the forward bias recovery, and the solar cell is forward biased in the dark state; if the normal bias recovery is performed once every three days, then the IV test can be performed in the light state every day to obtain the required time to be applied and the voltage waveform to be applied for the forward bias recovery, and the solar cell is forward biased in the dark state on the third day. It should also be noted that in the embodiment of the present application, the volt-ampere characteristic test of the solar cell is first performed to determine the performance parameters of the solar cell, and then the forward bias recovery method is determined, and then the forward bias recovery of the solar cell is performed according to the determined forward bias recovery method to achieve the recovery of the solar cell performance.

[0069] That is to say, the time interval for the solar cell to perform the volt-ampere characteristic test is shorter than the time interval for the solar cell to perform the forward bias recovery. In this way, more accurate volt-ampere characteristic test data can be obtained when calculating the relevant values ​​of the forward bias, which is beneficial to improve the accuracy of the parameters used to calculate the equivalent model, and then more accurate application time and voltage waveform can be obtained, so as to maximize the performance recovery of the solar cell and thus improve the efficiency of the solar cell.

[0070] In this way, the time interval for the solar cell to perform the volt-ampere characteristic test is shorter than the time interval for the solar cell to perform the forward bias recovery. In this way, a specific forward bias repair method can be applied according to the actual situation of the solar cell, such as the degree of aging. This can maximize the performance recovery of the solar cell and thereby improve the efficiency of the solar cell.

[0071] An embodiment of the present application provides a processing method for repairing solar cells, which determines the parameters of each component in the equivalent model of the solar cell through the performance parameters of the solar cell, and calculates the required application time and voltage waveform to be applied for the solar cell according to the parameters of each component and the maximum power parameter; in this way, the required application time and voltage waveform to be applied can be adaptively determined for solar cells of different structures and components, respectively, so as to apply customized forward bias voltages to different solar cells, which is not only conducive to realizing the recovery of solar cell performance, but also can avoid the additional damage to the ion movement of the solar cell caused by the illogical forward bias voltage applied in the related technology, thereby protecting the internal structure of the solar cell from further damage, and further improving the recovery efficiency and performance of the solar cell.

[0072] In another embodiment of the present application, Figure 3 A schematic diagram of a processing method provided in an embodiment of the present application Figure 2 .exist Figure 1 On the basis of Figure 3 As shown, determining the time to be applied and the waveform of the voltage to be applied of the solar cell according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters may include: S301, determining a time to be applied according to a first capacitance value and a first resistance value.

[0073] In the embodiment of the present application, after obtaining the equivalent model of the solar cell, the solar cell is placed under working conditions to work. For example, a solar light simulation device can be used to simulate the illumination of the solar cell so that the solar cell works under the light state. Then, the device is used to scan the maximum power output point of the device, and IV scanning is performed at a given time interval, so that the series resistance is obtained by recording the IV scanning. R s , short-circuit current Isc and other key performance parameters. At the same time, based on the principle of capacitor charging and discharging, the curve of voltage changing with charging time obeys formula (1), that is, ; When the device is at a fixed bias voltage, the resistance of the first resistor R of the capacitor branch remains unchanged. Then, formula (1) can be evolved into formula (2), that is, Simplify to get Here, by fitting the curve of the power rise section under working conditions, the time constant can be obtained: . Figure 4 A schematic diagram of a capacitor charging model provided in an embodiment of the present application. Figure 4 As shown in the figure, the horizontal axis represents time in seconds (s or sec); the vertical axis represents current in amperes (A); the circle represents the original data, and the bold dashed line represents the fitting curve obtained by fitting the original data. The corresponding relationship of the fitting curve is shown in formula (3). Through fitting, the time constant can be obtained as , and the goodness of fit R 2 is 0.9452, close to 1, indicating that the fit is very good and the data is highly reliable. 2 , is an important indicator for measuring the model fitting effect, and its value is between 0 and 1. The closer to 1, the better the model fitting. That is, in the embodiment of the present application, based on the principle of capacitor charging and discharging, the time applied constant can be directly obtained according to the first capacitance value and the first resistance value.

[0074] (3) In some embodiments, determining the time to be applied based on the first capacitance value and the first resistance value may include: multiplying the first capacitance value and the first resistance value to obtain a time constant; and setting the time to be applied to the product of the time constant and a preset value.

[0075] In an embodiment of the present application, time constant = first capacitance value × first resistance value. Since perovskite battery-type solar cells have a capacitive effect, based on the principle of capacitor charging and discharging, when the charging time is 3 time constants, the capacitor voltage is charged to 95%, when the charging time is 4 time constants, the capacitor voltage is charged to 98%, and when the charging time is 5 time constants, the capacitor voltage is charged to 100%, that is, the preset value can be any value in the interval [3,5]. In the relevant technology, it is generally believed that the capacitor voltage is fully charged when it reaches 95%. In a specific embodiment, the preset value is equal to 3.

[0076] In this way, due to the ion migration in the solar cell, there is a capacitance effect in the solar cell, such as the perovskite battery. According to the capacitance charging and discharging principle, the time required for the capacitor to be fully charged is 3 to 5 times the time constant, and the time constant is related to the first capacitance value and the first resistance value. In this way, the time to be applied is set to the product of the time constant and the preset value. In this way, the first capacitor in the equivalent model of the solar cell can be fully charged. At this time, the capacitance branch in the equivalent model is in a disconnected state, thereby eliminating the capacitance effect caused by ion migration, which is beneficial to the performance recovery of the solar cell and can also maximize the recovery of the photoelectric conversion efficiency of the solar cell.

[0077] S302, determining a voltage waveform to be applied according to the series resistance value and the maximum power parameter.

[0078] In an embodiment of the present application, based on the series resistance value and the maximum power parameters, specifically based on the series-parallel resistance value, the maximum power voltage and the maximum power current, the voltage waveform to be applied required for forward bias recovery can be obtained to repair the forward bias of the solar cell.

[0079] In some embodiments, determining the voltage waveform to be applied based on the series resistance and the maximum power parameter may include: determining the target applied voltage value based on the series resistance value and the maximum power parameter; setting the voltage values ​​to be applied of the voltage waveform to be applied at different times to be equal to the target applied voltage value.

[0080] In the embodiment of the present application, the maximum power parameter may include a maximum power current value and a maximum power voltage value; accordingly, the product of the maximum power current value and the series resistance value and the maximum power voltage value are added to obtain the target applied voltage value, that is, the target applied voltage value = maximum power current value × series resistance value + maximum power voltage value. Then, the voltage values ​​to be applied at different times of the voltage waveform to be applied are all set to be equal to the target applied voltage value, and at this time, the waveform curve of the voltage waveform to be applied is a straight line.

[0081] Table 1

[0082] In an embodiment of the present application, Table 1 is a schematic table 1 of the power retention difference between the experimental group and the control group after two weeks of aging under working conditions provided in an embodiment of the present application. In Table 1, the time to be applied for the forward bias repair of the experimental group is 3 times the time constant, and the voltage waveform to be applied is the voltage value to be applied at different times, which is set to be equal to the target applied voltage value, that is, the applied voltage is a forward fixed bias; the control group does not adopt forward bias recovery. It can be seen from Table 1 that after two weeks of forward bias recovery, the devices in the experimental group achieved an absolute power recovery of 25% relative to the devices in the control group. In other words, the forward bias repair proposed in the present application can help prevent further degradation of the internal structure of solar cells, thereby improving the efficiency of solar cells.

[0083] In the embodiments of the present application, the required applied voltage value can be quickly calculated based on the performance parameters and equivalent model of the solar cell (such as maximum power parameters and series resistance), without the need for complex experiments and adjustments, and the recovery efficiency and performance of the solar cell can be improved; in addition, by determining the voltage value applied for forward bias recovery based on the equivalent model and maximum power parameters of the solar cell, it can help prevent further degradation of the internal structure of the solar cell, help to re-establish or restore the normal working state of the solar cell, and thereby improve the efficiency of the solar cell.

[0084] In this way, the target applied voltage value is determined according to the series resistance value and the maximum power parameter, and the solar cell is fixedly forward biased by the target applied voltage value. The first capacitor in the equivalent model of the solar cell can also be fully charged. At this time, the capacitor branch in the equivalent model is in a disconnected state, thereby eliminating the capacitive effect caused by ion migration and restoring the ions to their original state to the greatest extent, that is, properly restoring the state of the ions, which is conducive to achieving performance recovery of the solar cell and can also restore the photoelectric conversion efficiency of the solar cell to the greatest extent.

[0085] In some embodiments, Figure 5 As shown, determining the voltage waveform to be applied according to the series resistance value and the maximum power parameter may also include: S501, determining an initial voltage value.

[0086] In the implementation of the present application, the initial voltage value is the initial voltage value on the first capacitor in the capacitor branch in the equivalent model. Here, the initial voltage value can be set to 0.

[0087] S502, determining a termination voltage value according to the series resistance value and the maximum power parameter.

[0088] In the implementation of the present application, the maximum power parameter may include a maximum power voltage value and a maximum power current value. In some embodiments, for step S502, it may include: adding the product of the maximum power current value and the series resistance value to the maximum power voltage value to obtain a termination voltage value. In other words, the termination voltage value = maximum power current value × series resistance value + maximum power voltage value.

[0089] Here, when the solar cell is at the maximum power point, its output power reaches the maximum. By determining the termination voltage value based on the maximum power voltage value, the maximum power current value and the series resistance value, the first capacitor in the equivalent model of the solar cell can be fully charged. At this time, the capacitor branch in the equivalent model is disconnected, thereby eliminating the capacitance effect caused by ion migration and restoring the ions to their original state to the greatest extent, which is conducive to the performance recovery of the solar cell.

[0090] S503, generating a voltage waveform to be applied according to the initial voltage value and the final voltage value, wherein a variation trend of the voltage waveform to be applied conforms to a variation trend of the capacitor charging waveform curve.

[0091] In the embodiment of the present application, the variation trend of the voltage waveform to be applied conforms to the variation trend of the capacitor charge and discharge waveform curve, that is, the voltage waveform to be applied can be ;in, is the applied voltage value at time t, is the initial voltage value, is the termination voltage value, Here, the time constant = the first capacitance value × the first resistance value.

[0092] Table 2

[0093] In an embodiment of the present application, Table 2 is a schematic table 2 of the power retention difference between the experimental group and the control group after two weeks of aging under working conditions provided in an embodiment of the present application. In Table 2, the time to be applied for the forward bias repair performed on the experimental group is 3 times the time constant, and the changing trend of the voltage waveform to be applied is consistent with the changing trend of the capacitor charging waveform curve, that is, the applied voltage is a forward bias; the control group does not adopt forward bias recovery. It can be seen from Table 2 that after two weeks of forward bias recovery, the devices in the experimental group achieved 30% absolute power recovery relative to the devices in the control group. In this way, the forward bias repair proposed in the present application can help prevent further degradation of the internal structure of the solar cell, thereby improving the efficiency of the solar cell.

[0094] In this way, according to the principle of capacitor charging and discharging, the charging process of the capacitor is related to the initial voltage value and the termination voltage value. The termination voltage value determined according to the series resistance value and the maximum power parameter makes the first capacitor in a fully charged state, and then a voltage waveform to be applied that conforms to the capacitor charging waveform curve is generated according to the initial voltage value and the termination voltage value. In this way, the first capacitor in the equivalent model of the solar cell can be fully charged. At this time, the capacitor branch in the equivalent model is in a disconnected state, thereby eliminating the capacitance effect caused by ion migration and restoring the ions to their original state to the greatest extent, that is, properly restoring the state of the ions; and according to the voltage waveform to be applied, the performance recovery of the solar cell can be better achieved, and the photoelectric conversion efficiency of the solar cell can be restored to the greatest extent.

[0095] The embodiment of the present application provides a processing method for repairing solar cells, because the migration of ions in the solar cell causes the existence of a capacitance effect in the solar cell, such as a perovskite cell; according to the principle of capacitor charging and discharging, it is known that the time required for the first capacitor to be fully charged is related to the first capacitor and the first resistor of the capacitor branch, so the first capacitor and the first resistor can be used to determine the duration to be applied; and when the first capacitor is fully charged, the solar cell operates at the maximum power point, so the maximum power parameter and the series resistance value can also be used to determine the voltage waveform to be applied. In this way, based on the principle of capacitor charging and discharging and the equivalent model of the solar cell, the way to restore the forward bias voltage of the solar cell is determined, and the first capacitor in the equivalent model of the solar cell can be fully charged, which can eliminate the capacitance effect caused by ion migration, so that the ions can be restored to the original state to the greatest extent, that is, the state of the ions is properly restored, and the performance recovery of the solar cell is better achieved, and the photoelectric conversion efficiency of the solar cell can be restored to the greatest extent.

[0096] In another embodiment of the present application, Figure 6 A schematic diagram of a processing method provided in an embodiment of the present application Figure 4 .like Figure 6 As shown, after repairing the solar cell, the processing method may include: S601, determining updated performance parameters based on a preset time interval.

[0097] In the embodiment of the present application, the preset time interval may be half a day, or may be a day, or may be a week, and the specific situation may be determined by the time interval for forward bias recovery. For example, if forward bias recovery is required once a day, the preset time interval may be half a day or a day; or if forward bias recovery is required once a week, the preset time interval may be a week or a day, and it is determined according to the actual situation, and there is no specific limitation on this.

[0098] It should be noted that the volt-ampere characteristic test of the solar cell is not limited to one test, and the test to be performed on the volt-ampere characteristic test of the solar cell can be determined according to the accuracy of the test instrument, as described in the above embodiment for details.

[0099] S602, performing equivalent model fitting according to the updated performance parameters to determine the series resistance value, the first capacitance value, and the first resistance value in the updated equivalent model.

[0100] S603, determining an updated time to be applied and an updated voltage waveform to be applied according to the series resistance value, the first capacitance value, the first resistance value and the updated maximum power parameter in the updated equivalent model; wherein the updated time to be applied and the updated voltage waveform to be applied are used for the next forward bias recovery of the solar cell.

[0101] In an embodiment of the present application, the IV curve of the device is periodically tested under working conditions to determine the updated series resistance value, the first capacitance value, the first resistance value and the updated maximum power parameter in the equivalent model, and then the updated application time and the updated voltage waveform to be applied are determined. In this way, the corresponding forward bias recovery can be performed on solar cells with different degrees of aging to restore the performance of the solar cells to the greatest extent.

[0102] Here, the attenuation analysis of each functional layer of the device under working conditions is obtained; for example, for devices that obey non-single diode model equivalent circuits, there will be relative changes in the parameters of each diode and the corresponding capacitor branch, which can be used to analyze the aging mechanism of the device.

[0103] That is to say, in the embodiment of the present application, IV testing is continued to be performed on the recovered device to update the parameters in the equivalent model and the maximum power parameters, and then a specific forward bias recovery is applied to the same device structure under different aging conditions. For example, the voltage and duration applied when the same device works at 100% are different from the voltage and duration applied when the device works at 90%.

[0104] The embodiment of the present application provides a processing method for solar cell repair, which updates performance parameters at preset time intervals, and updates the parameters of each device in the equivalent model based on the updated performance parameters. In this way, customized forward bias and application duration can be applied to solar cells with different aging degrees, that is, solar cells with different aging degrees can adaptively determine different forward bias waveforms and application durations, which can avoid additional damage to the movement of solar cell ions caused by illogical forward bias application, and can also significantly improve the recovery efficiency and performance of solar cells.

[0105] In another embodiment of the present application, based on the same inventive concept as the above-mentioned embodiment, Figure 7 A schematic diagram of the composition structure of a processing device provided in an embodiment of the present application. As shown in the figure, the processing device 70 may include a determination unit 701, a modeling unit 702 and a processing unit 703, wherein: A determination unit 701 is configured to determine a performance parameter of a solar cell; A modeling unit 702 is configured to perform equivalent model fitting according to the performance parameters to determine a series resistance value in an equivalent model of the solar cell and a first capacitance value and a first resistance value in a capacitance branch; The processing unit 703 is configured to determine the time to be applied and the waveform of the voltage to be applied of the solar cell according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters; wherein the time to be applied and the waveform of the voltage to be applied are used to perform forward bias recovery on the solar cell to repair the solar cell.

[0106] In some embodiments, the processing unit 703 is further configured to determine the duration of the voltage to be applied according to the first capacitance value and the first resistance value; and to determine the waveform of the voltage to be applied according to the series resistance value and the maximum power parameter.

[0107] In some embodiments, the processing unit 703 is further configured to perform a multiplication operation on the first capacitance value and the first resistance value to obtain a time constant; and set the time length to be applied to be the product of the time constant and a preset value.

[0108] In some embodiments, the determination unit 701 is further configured to determine an initial voltage value; determine a termination voltage value based on the series resistance value and the maximum power parameter; the processing unit 703 is further configured to generate a voltage waveform to be applied based on the initial voltage value and the termination voltage value, and the change trend of the voltage waveform to be applied conforms to the change trend of the capacitor charging waveform curve.

[0109] In some embodiments, the maximum power parameter includes a maximum power voltage value and a maximum power current value; the processing unit 703 is further configured to add the product of the maximum power current value and the series resistance value to the maximum power voltage value to obtain a termination voltage value.

[0110] In some embodiments, the processing unit 703 is further configured to determine a target applied voltage value according to the series resistance value and the maximum power parameter; and set the voltage values ​​to be applied at different times of the voltage waveform to be applied to be equal to the target applied voltage value.

[0111] In some implementations, after repairing the solar cell, the determination unit 701 is further configured to determine an updated performance parameter based on a preset time interval; the modeling unit 702 is further configured to perform equivalent model fitting according to the updated performance parameters, and determine the series resistance value, the first capacitance value, and the first resistance value in the updated equivalent model; the processing unit 703 is further configured to determine an updated time to be applied and an updated voltage waveform to be applied according to the series resistance value, the first capacitance value, and the first resistance value in the updated equivalent model and the updated maximum power parameter; wherein the updated time to be applied and the updated voltage waveform to be applied are used for the next forward bias recovery of the solar cell.

[0112] In some embodiments, the time interval for the solar cell to perform the volt-ampere characteristic test is shorter than the time interval for the solar cell to perform the forward bias recovery.

[0113] The description of the above device embodiment is similar to the description of the above method embodiment, and has similar beneficial effects as the method embodiment. For technical details not disclosed in the device embodiment of the present application, please refer to the description of the method embodiment of the present application for understanding.

[0114] In yet another embodiment of the present application, Figure 8 A schematic diagram of the structure of a repair system provided in an embodiment of the present application. Figure 8 As shown, the repair system 80 may include a solar cell 801, a control device 802, a repair device 803 and a testing device 804, wherein the testing device 804 is connected to the solar cell 801, and the repair device 803 is connected to the control device 802 and the solar cell 801 respectively: The testing device 804 is configured to provide a voltage signal to the solar cell, perform a volt-ampere characteristic test on the solar cell, obtain a current signal generated by the solar cell, and send the voltage signal and the current signal to the control device 802; The control device 802 is configured to determine the performance parameters of the solar cell based on the voltage signal and the current signal; perform equivalent model fitting according to the performance parameters to determine the series resistance value in the equivalent model of the solar cell and the first capacitance value and the first resistance value in the capacitance branch; and determine the time to be applied and the voltage waveform to be applied of the solar cell according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters; and send the time to be applied and the voltage waveform to be applied to the repair device 803; The repair device 803 is configured to perform forward bias recovery on the solar cell according to the time to be applied and the voltage waveform to be applied, so as to repair the solar cell.

[0115] In the embodiments of the present application, the testing device may be an active electric meter or an electronic load, etc., which can perform IV testing on solar cells; the repair device may be a device in which a timer and a voltage source are integrated, or the repair device may include a timer and a voltage source, etc., which can restore the forward bias of the solar cell; the control device may be called a controller, which may be a microcontroller or a programmable logic controller, etc.; the solar cell may be a solar cell with a capacitive effect, such as a perovskite cell; there is no specific limitation on these.

[0116] In this way, the volt-ampere characteristic test of the solar cell is carried out by the test device, so that the control device determines the parameters of each component in the equivalent model of the solar cell, and the control device calculates the required application time and the voltage waveform to be applied for the solar cell according to the parameters of each component and the maximum power parameter; in this way, the required application time and the voltage waveform to be applied can be adaptively determined for solar cells of different structures and components, respectively, so as to apply customized forward bias voltages to different solar cells, which is not only conducive to realizing the recovery of solar cell performance, but also can avoid the additional damage to the ion movement of the solar cell caused by the illogical forward bias voltage applied in the related technology, thereby protecting the internal structure of the solar cell from further damage, and further improving the recovery efficiency and performance of the solar cell.

[0117] In some embodiments, continuing as Figure 8 As shown, the repair system 80 may further include a signal collecting device 805, and the signal collecting device 805 is connected to the testing device 804 and the control device 802 respectively; wherein: The signal collecting device 805 is configured to receive the voltage signal sent by the testing device and the current signal generated by the solar cell, and send the voltage signal and the current signal to the control device 802 so that the control device 802 can determine the performance parameters of the solar cell 801 .

[0118] In the embodiment of the present application, the signal collection device 805 is used to collect the current signal generated by the solar cell and the voltage signal applied by the testing device, and transmit them to the control device 802 .

[0119] In this way, the signal collection device receives the voltage signal sent by the test device and the current signal generated by the solar cell, and sends the voltage signal and the current signal to the control device, so that the control device can accurately determine the performance parameters of the solar cell, and then enable the control device to determine the application time and voltage waveform required for forward bias recovery, which is conducive to achieving the recovery of solar cell performance.

[0120] In some embodiments, continuing as Figure 8 As shown, the repair system 80 further includes a light simulation device 806, and the light simulation device 806 is connected to the control device 802; wherein: The light simulation device 806 is configured to receive the control signal sent by the control device 802 and perform light simulation on the solar cell 801 according to the control signal.

[0121] In the embodiment of the present application, the illumination simulation device may be referred to as a sunlight simulation device. The illumination simulation device can simulate a variety of illumination conditions, such as full sunlight, cloudy days, morning and evening, and other illuminations of different intensities, so that the solar cell can be tested under different illumination conditions to obtain the required performance parameters of the solar cell. In addition, the control signal is used to instruct the illumination simulation device to perform illumination simulation on the solar cell. Specifically, the illumination simulation can be performed on the solar cell during the IV test so that the solar cell can work under the working conditions, or the solar cell is insufficiently illuminated during operation, and the illumination simulation device simulates the illumination of the solar energy. There is no specific limitation on this.

[0122] In this way, when performing repair tests on solar cells, the light simulation device can simulate a variety of lighting conditions, such as simulating the light-dark alternation process under natural conditions, so that the solar cells can be repaired and tested under different lighting conditions, thereby improving the repair efficiency of the solar cells.

[0123] In some embodiments, the testing device 804 and the repairing device 803 are integrated into an active electricity meter.

[0124] In this way, integrating the testing device and the repairing device into the active electric meter can not only reduce the complexity of circuit connection, but also simplify the repair process of the solar cell and improve efficiency.

[0125] In some embodiments, the control device 802 may include at least the processing device 70 described in any one of the above embodiments. In other words, the control device 802 is used to execute the processing method described in any one of the above embodiments.

[0126] In some embodiments, based on the above-mentioned repair system 80, Fig. 9 This is a schematic diagram of an application framework of a repair system provided in an embodiment of the present application. Fig. 9 As shown, the application framework includes a solar cell 801, a control device 802, a signal collection device 805, an active electric meter 901 and a sunlight simulation device 902. Here, the test device and the repair device are integrated into the active electric meter. In addition, the active electric meter can also be replaced by an electronic load, a voltage source and a timer.

[0127] In the embodiment of the present application, the solar cell 801 may include a clear edge region a1, a back electrode a2, a conductive tape a3, an inner and outer shunt point a4, an inner and outer shunt point a5, and an insulating tape, etc. The various components of the solar cell work together to achieve efficient and stable power conversion, so as to ensure that the solar cell panel can work long-term and reliably.

[0128] In the embodiment of the present application, the sunlight simulation device 902 is the illumination simulation device in the above embodiment. When monitoring the light-dark alternation characteristics of the device, actual power station data or the sunlight simulation device 902 can be used for illumination simulation, that is, the sunlight simulation device can be used to simulate the light-dark alternation process under natural conditions.

[0129] In addition, in the embodiment of the present application, the active meter 901 is connected to the solar cell 801, and is used to apply a program-controlled bias voltage signal to the solar cell 801, thereby stimulating the solar cell to generate a current signal. Among them, the active meter can also be replaced with a device that can generate a voltage signal in advance, such as an electronic load, a multimeter, etc. In addition, the signal collection device 805 is respectively connected to the active meter 901 and the control device 802, and is used to collect the current signal generated by the solar cell 801 and the bias voltage signal applied by the active meter 901.

[0130] The description of the above system embodiment is similar to the description of the above method embodiment, and has similar beneficial effects as the method embodiment. For technical details not disclosed in the system embodiment of the present application, please refer to the description of the method embodiment of the present application for understanding.

[0131] In yet another embodiment of the present application, a solar cell repair system based on the aforementioned embodiment, Fig.10 A schematic diagram of a processing method provided in an embodiment of the present application Figure 5 .like Fig.10 As shown, the processing method may include: S1001, connect the device to a test device.

[0132] In an embodiment of the present application, the device may be a perovskite battery. First, an electrical connection is established between the device and the test device, so as to perform subsequent IV testing and continuously monitor performance parameters. Here, the test device may perform IV testing on the device, and the control device may analyze the data obtained from the IV testing, etc.

[0133] S1002, perform IV test on the device.

[0134] In this application, IV test is performed on the device to obtain IV curve and corresponding performance parameters. Here, since devices with different components, structures and aging degrees have different equivalent circuits and corresponding IV curves, it is necessary to perform IV test on fresh devices to obtain IV curve and corresponding performance parameters to determine the equivalent model of the device.

[0135] S1003, determine an equivalent model of the device.

[0136] In the embodiment of the present application, the performance parameters obtained by IV test can be simulated to obtain the equivalent model of the corresponding device. Figure 2 The equivalent model shown in Figure 2 is Figure 2 As shown, the equivalent circuit of the solar cell includes a current source Bi, a diode D, a first capacitor C, a first resistor R, a parallel resistor R sh and series resistance R s For the connection relationship of each equivalent component, please refer to Figure 2 In addition, at the maximum power output of the solar cell, the voltage on both sides of the positive and negative electrodes is the maximum power voltage, flowing through the series resistor R s The circuit has the maximum power current.

[0137] S1004, placing the device under working conditions to continuously monitor performance parameters of the device.

[0138] In the embodiment of the present application, the device is placed under working conditions, the maximum power output point of the device is scanned by a test device, and IV scanning is performed at a given interval (wherein the scanning time interval is shorter than the time interval for applying the forward bias recovery voltage), so that the series resistance is obtained by recording the IV scanning. R s , short-circuit current Isc and other key performance parameters. At the same time, based on the principle of capacitor charging and discharging, the curve of voltage changing with charging time obeys formula (1), that is, ; When the device is at a fixed bias voltage, the resistance of the first resistor of the capacitor branch remains unchanged. Then, formula (1) can be evolved into formula (2), that is, Simplify to get Here, by fitting the curve of the power rise section under working conditions, the time constant can be obtained: .like Figure 4 As shown, the time constant can be obtained by fitting , goodness of fit R 2 It is 0.9452, which is close to 1, indicating that the fit is very good and the data is highly reliable.

[0139] S1005, determining a forward bias waveform.

[0140] In the embodiment of the present application, the solar cell is disconnected from the test device and connected to the repair device to restore the forward bias of the solar cell. For components with a fixed system, a fixed recovery process can be used. After the solar cell is disconnected from the test device, an external voltage application device can be used to restore the forward bias of the component.

[0141] In the embodiment of the present application, there are two schemes for forward bias voltage recovery. Scheme 1: The applied amplitude of the forward bias voltage is set to V MPP + I MPP R s , the duration of the application is set to 3 times the time constant, and the direction is set to connect the positive pole of the external power supply to the FTO side, so as to apply a forward bias; that is, the voltage waveform to be applied is set to the same voltage value at different times, and the voltage value to be applied = (maximum power current value × series resistance value + maximum power voltage value). Solution 2: Use Applied as a waveform where the initial positive bias (i.e. the initial voltage value) is 0V, and the end point is positive bias (i.e. the termination voltage value) is V MPP + I MPP R s , time constant The time constant (3 ), the direction is set so that the positive pole of the external power supply is connected to the FTO side, thereby applying a forward bias; that is, the changing trend of the voltage waveform to be applied conforms to the changing trend of the capacitor charging waveform curve.

[0142] S1006, forward bias recovery is performed on the device.

[0143] In the embodiment of the present application, in step S1005, the forward bias recovery application method is determined, and the forward bias recovery is applied to the device. The experimental results of Scheme 1 and Scheme 2 are shown in Table 1 and Table 2 above, respectively. It can be seen that after two weeks of bias recovery, the experimental group devices corresponding to Scheme 1 and Scheme 2 respectively achieve 25% and 30% absolute power recovery relative to the control group devices.

[0144] In the embodiments of the present application, for a perovskite cell with a fixed device structure, the failure process of the device during aging can also be analyzed, and forward bias recovery can be applied in a targeted manner. Fig.10 On the basis of Fig.11 As shown, the processing method may include: S1101, connect the device to a test device.

[0145] S1102, perform IV test on the device.

[0146] S1103, determine an equivalent model of the device.

[0147] S1104, placing the device under working conditions to continuously monitor performance parameters of the device.

[0148] S1105, update parameters in the equivalent model.

[0149] S1106, determining a forward bias waveform.

[0150] S1107, forward bias recovery is performed on the device.

[0151] In the embodiment of the present application, the process of steps S1101 to S1104 is similar to the process of steps S1001 to S1004, and the process of steps S1106 to S1107 is similar to the process of steps S1005 to S1006. Fig.10 On the basis of Fig.11 Step S1105 is added to obtain corresponding performance parameters by periodically testing the IV curve of the device under working conditions, thereby updating the parameters in the equivalent circuit model obtained in step 804, and further obtaining the attenuation analysis of each functional layer of the device under working conditions. For example, for devices that obey the equivalent circuit of the non-single diode model, there will be relative changes in the parameters of each diode and the corresponding capacitor branch, which can be used to analyze the aging mechanism of the device. Then, targeted forward bias recovery is applied to devices with different aging degrees to restore the performance of the device to the greatest extent.

[0152] The embodiment of the present application provides a processing method for repairing solar cells, specifically a forward bias recovery method for perovskite cells based on an equivalent model. The specific implementation of the aforementioned embodiment is described in detail through the above embodiment. It can be seen that, unlike the ion barrier layer, illogical bias voltage and other methods in the related art, the processing method proposed in the present application provides a universal application logic based on the equivalent model of different perovskite cells, and specifically applies a forward variable bias voltage (duration, initial positive bias voltage, terminal positive bias voltage) of a specific waveform, which can adapt to the changes in device structure, component, and aging degree, thereby realizing the recovery of device performance. Compared with the device aged in the working condition, the absolute recovery rate of the device with additional bias recovery can reach 30%. And unlike the strategies such as illogical bias voltage in the related art, the processing method proposed in the present application can restore the ion state appropriately, thereby avoiding the unnecessary ion movement damage caused by the illogical application of forward bias to the perovskite component, that is, a customized forward bias can be applied to components with different structures, components, and aging degrees, thereby avoiding the additional damage to the ion movement of the device caused by the illogical bias application.

[0153] An embodiment of the present application provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by at least one processor, the steps of the method described in any one of the aforementioned embodiments are implemented.

[0154] An embodiment of the present application also provides a computer program product, including a computer program or instructions, which, when executed by a processor, implements the steps of the method described in any of the aforementioned embodiments.

[0155] It should be noted here that the description of the above storage medium and device embodiments is similar to the description of the above method embodiments, and has similar beneficial effects as the method embodiments. For technical details not disclosed in the storage medium and device embodiments of this application, please refer to the description of the method embodiments of this application for understanding.

[0156] Those skilled in the art should understand that the embodiments of the present application can be provided as methods, systems or computer program products, etc. Therefore, the present application can be in the form of hardware embodiments, software embodiments, or embodiments combining software and hardware. Moreover, the present application can be in the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage and optical storage, etc.) containing computer-usable program codes.

[0157] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0158] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0159] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0160] It should be noted that, in this application, the terms "include", "comprises" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, product or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, product or device. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, product or device including the element.

[0161] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0162] The methods disclosed in several method embodiments provided in this application can be arbitrarily combined without conflict to obtain new method embodiments.

[0163] The features disclosed in several product embodiments provided in this application can be arbitrarily combined without conflict to obtain new product embodiments.

[0164] The features disclosed in several method or device embodiments provided in this application can be arbitrarily combined without conflict to obtain new method embodiments or device embodiments.

[0165] The above description is only a specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application.

Claims

1. A processing method for repairing solar cells, characterized in that: The processing method comprises: Determining performance parameters of the solar cell; Performing equivalent model fitting according to the performance parameters to determine a series resistance value in the equivalent model of the solar cell and a first capacitance value and a first resistance value in the capacitance branch; The time to be applied and the waveform of the voltage to be applied of the solar cell are determined according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters; wherein the time to be applied and the waveform of the voltage to be applied are used to perform forward bias recovery on the solar cell to repair the solar cell.

2. The processing method according to claim 1, characterized in that: The step of determining the time to be applied and the waveform of the voltage to be applied of the solar cell according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters comprises: Determining the duration of the application according to the first capacitance value and the first resistance value; The voltage waveform to be applied is determined according to the series resistance value and the maximum power parameter.

3. The processing method according to claim 2, characterized in that: The step of determining the duration of application according to the first capacitance value and the first resistance value includes: Performing a multiplication operation on the first capacitance value and the first resistance value to obtain a time constant; The duration to be applied is set to be the product of the time constant and a preset value.

4. The processing method according to claim 2, characterized in that: The step of determining the voltage waveform to be applied according to the series resistance value and the maximum power parameter comprises: Determine the initial voltage value; Determining a termination voltage value according to the series resistance value and the maximum power parameter; The voltage waveform to be applied is generated according to the initial voltage value and the termination voltage value, and the variation trend of the voltage waveform to be applied conforms to the variation trend of the capacitor charging waveform curve.

5. The processing method according to claim 4, characterized in that: The maximum power parameter includes a maximum power voltage value and a maximum power current value; accordingly, determining a termination voltage value according to the series resistance value and the maximum power parameter includes: The product of the maximum power current value and the series resistance value is added to the maximum power voltage value to obtain the termination voltage value.

6. The processing method according to claim 2, characterized in that: The step of determining the voltage waveform to be applied according to the series resistance value and the maximum power parameter comprises: Determining a target applied voltage value according to the series resistance value and the maximum power parameter; The voltage values ​​to be applied of the voltage waveform to be applied at different times are all set to be equal to the target applied voltage values.

7. The processing method according to any one of claims 1 to 6, characterized in that: After repairing the solar cell, the processing method further comprises: Determining the updated performance parameter based on a preset time interval; Perform equivalent model fitting according to the updated performance parameters to determine the updated series resistance value, the first capacitance value and the first resistance value in the equivalent model; According to the updated series resistance value, the first capacitance value, the first resistance value and the updated maximum power parameter in the equivalent model, the updated time to be applied and the updated voltage waveform to be applied are determined; wherein the updated time to be applied and the updated voltage waveform to be applied are used for the next forward bias recovery of the solar cell.

8. The processing method according to any one of claims 1 to 6, characterized in that: The time interval for the solar cell to perform a volt-ampere characteristic test is shorter than the time interval for the solar cell to perform a forward bias recovery test.

9. A processing device for repairing solar cells, characterized in that: The processing device comprises a determining unit, a modeling unit and a processing unit, wherein: The determining unit is configured to determine a performance parameter of the solar cell; The modeling unit is configured to perform equivalent model fitting according to the performance parameters to determine the series resistance value in the equivalent model of the solar cell and the first capacitance value and the first resistance value in the capacitance branch; The processing unit is configured to determine the time to be applied and the waveform of the voltage to be applied of the solar cell according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters; wherein the time to be applied and the waveform of the voltage to be applied are used to perform forward bias recovery on the solar cell to repair the solar cell.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the processing method for repairing a solar cell according to any one of claims 1 to 8 is implemented.

11. A solar cell repair system, characterized in that: The repair system comprises a solar cell, a control device, a testing device and a repair device, wherein the testing device is connected to the solar cell, and the repair device is connected to the control device and the solar cell respectively; wherein: The testing device is configured to provide a voltage signal to the solar cell, perform a volt-ampere characteristic test on the solar cell, obtain a current signal generated by the solar cell, and send the voltage signal and the current signal to the control device; The control device is configured to determine the performance parameters of the solar cell based on the voltage signal and the current signal; perform equivalent model fitting according to the performance parameters to determine the series resistance value in the equivalent model of the solar cell and the first capacitance value and the first resistance value in the capacitance branch; and determine the time to be applied and the voltage waveform to be applied of the solar cell according to the first capacitance value, the first resistance value, the series resistance value and the maximum power parameter in the performance parameters; and send the time to be applied and the voltage waveform to be applied to the repair device; The repair device is configured to perform forward bias recovery on the solar cell according to the to-be-applied time and the to-be-applied voltage waveform, so as to repair the solar cell.

12. The repair system according to claim 11, characterized in that: The repair system further comprises a signal collecting device, and the signal collecting device is connected to the testing device and the control device respectively; wherein: The signal collecting device is configured to receive the voltage signal sent by the testing device and the current signal generated by the solar cell, and send the voltage signal and the current signal to the control device so that the control device can determine the performance parameters of the solar cell.

13. The repair system according to claim 11 or 12, characterized in that: The repair system further comprises a light simulation device, and the light simulation device is connected to the control device; wherein: The light simulation device is configured to receive a control signal sent by the control device and perform light simulation on the solar cell according to the control signal.

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