On-site in-situ calibration method and device for a non-contact blade vibration measurement device

Abstract

The present invention discloses an on-site in-situ calibration method and device for a non-contact blade vibration measurement device, relating to the technical field of non-contact blade vibration testing, including: S1, obtaining a voltage-time lookup table file according to vibration parameter information; S2, obtaining an optical pulse signal simulating blade rotation according to the voltage-time lookup table file; S3, obtaining an on-site in-situ calibration result of the non-contact blade vibration measurement device according to the optical pulse signal simulating blade rotation and the vibration parameter information. The present invention can achieve the calibration of the non-contact vibration measurement device and the evaluation of errors in-situ with high fidelity; it can be executed multiple times before the test without disassembling and assembling relevant test equipment, and the operation is portable; pulse waveforms can be injected into multiple sensors simultaneously, and the overall on-site in-situ calibration and error evaluation of all measurement channels and measurement devices can be performed at one time, and the comprehensive performance index situation of the equipment when all channels are working simultaneously can be detected, which is convenient and fast.

Description

Technical Field

[0001] The present invention belongs to the technical field of non-contact blade vibration testing, and particularly relates to a method and device for on-site in-situ calibration of a non-contact blade vibration measurement device. Background Art

[0002] The rotating rotor blade is the core work element of major equipment such as aeroengines, gas turbines, and steam turbines. Its health status directly determines the operation safety and efficiency of the equipment. Among them, blade vibration is the most direct reflection of the blade health status. Therefore, non-contact vibration measurement of the blade is crucial.

[0003] Currently, non-contact blade vibration measurement devices based on the tip-timing principle have been widely used to achieve online monitoring of the vibration of all blades. Among them, the sensors in the non-contact blade vibration measurement device are mainly Y-type light intensity reflection fiber optic sensors, that is, a fiber optic bundle composed of 1 transmitting fiber and 6 or more receiving fibers. The basic principle is that the transmitting fiber projects a laser light source (stable laser light intensity) in the direction of the blade tip. When the blade sweeps across the sensor probe, the tip reflection light is received by the receiving fibers around the transmitting fiber. The returned light is converted into a voltage through photoelectric conversion. That is, when the blade sweeps across once, the device receives a pulse voltage signal. The pulse voltage signal carries blade vibration information. In particular, the advance or delay of the pulse arrival time reflects the blade vibration displacement. The non-contact blade vibration measurement device analyzes the arrival time data of multiple sensors through algorithms to obtain the blade vibration amplitude, frequency, etc.

[0004] However, currently, the blade vibration measurement device based on the tip-timing principle lacks a perfect calibration method and cannot prove the measurement accuracy of the device through metrological verification to meet the test requirements. The existing method is to measure the test blade in the rotating state with the device and the strain gauge simultaneously in the laboratory, and verify the accuracy of the device by comparison. However, the method has limitations in use, and the disadvantages are as follows: (1) The measurement positions of the strain gauge and the device are different, there are measurement errors, and there are unknown systematic errors when calibrating the measurement accuracy of the device; (2) Special test blades need to be designed, and the test period is long; (3) When conducting a comparative test in the laboratory, there are certain differences in its working environment, the installation layout and connection of the sensors and other parts of the device and the on-site test.

[0005] In addition, the on-site working environment is complex. The installation of the sensor measuring point on the casing is time-consuming and laborious, and the distance between the measuring point and other parts of the device is usually far, and long optical signals and electrical signals need to be transmitted. Therefore, when the device has been integrated and installed, if the device can be calibrated under the on-site in-situ conditions, more accurate and real measurement accuracy (uncertainty) can be obtained, so as to be used to evaluate whether the device meets the test requirements and the quality of the test data.

[0006] Therefore, how to achieve on-site in-situ calibration of non-contact blade vibration measurement equipment and determine the measurement accuracy of the installed non-contact blade vibration measurement equipment is an urgent problem to be solved by those skilled in the art. Summary of the Invention

[0007] The object of the present invention is to provide a method and device for on-site in-situ calibration of non-contact blade vibration measurement equipment, so as to solve the problem that it is difficult to perform on-site in-situ calibration of current non-contact blade vibration measurement equipment. Without modification on the premise that the non-contact blade vibration measurement equipment is installed on-site, a rotating blade sweeping sensor pulse waveform is generated by the on-site in-situ calibration device, the semiconductor laser light source is modulated, and input into the sensor transmitting optical fiber, and then transmitted to the tip of the stationary blade and reflected back to the receiving optical fiber. The output amplitude, frequency and other parameters are obtained through signal processing, and the on-site in-situ calibration of the non-contact blade vibration measurement equipment is realized by comparing with the input value.

[0008] On the one hand, to achieve the above object, the present invention provides a method for on-site in-situ calibration of non-contact blade vibration measurement equipment, including the following steps:

[0009] S1. Obtain a voltage-time look-up table file according to vibration parameter information;

[0010] S2. Obtain an optical pulse signal simulating blade rotation according to the voltage-time look-up table file;

[0011] S3. Obtain the on-site in-situ calibration result of the non-contact blade vibration measurement equipment according to the optical pulse signal simulating blade rotation and the vibration parameter information.

[0012] Optionally, obtaining a voltage-time look-up table file according to vibration parameter information includes:

[0013] Obtain vibration parameter information;

[0014] Obtain blade vibration parameter information according to the vibration parameter information;

[0015] Obtain a central time series according to the blade vibration parameter information;

[0016] Based on the central time series, use signal waveform characteristics to perform segmentation to obtain time segmentation points;

[0017] Obtain a function analysis expression according to the time segmentation points;

[0018] Obtain the voltage-time look-up table file according to the function analysis expression and the time segmentation points;

[0019] Among them, obtaining the signal waveform of the blade sweeping the sensor probe is used as the signal waveform characteristic.

[0020] Optionally, the vibration parameter information includes blade vibration parameter information and on-site test information;

[0021] Among them, the blade vibration parameter information includes blade vibration frequency, blade vibration amplitude, blade vibration phase, blade rotation speed, and tip linear velocity, and the on-site test information includes the number of blades, tip diameter, spot diameter, sensor working distance, and sensor installation angle.

[0022] Optionally, the function analysis expression includes a 0 - t a segment function analysis expression, t a - t b segment function analysis expression, t b - t c segment function analysis expression, and t c - t d segment function analysis expression;

[0023] The 0 - t a segment function analysis expression is:

[0024]

[0025] The t a - t b segment function analysis expression is:

[0026]

[0027] The t b - t c segment function analysis expression is:

[0028]

[0029] The t c - t d segment function analysis expression is:

[0030]

[0031] Among them, t a is a the time division point at time, tb is b the time segmentation point at time t c is c the time segmentation point at time t d is d the time segmentation point at time F 1( t ) is 0 - t a segment function analytical expression, L 1 is a fixed value, indicating no light or weak light reception return, F 2( t ) is t a - t b segment function analytical expression, L 2 is the voltage at the maximum received light intensity under the working distance of the sensor, w 1 is t a - t b standard deviation of the segment function, t is time, F 3( t ) is t b - t c segment function analytical expression, w 2 is t c - t d standard deviation of the segment function, F 4( t ) is t c - t d segment function analytical expression.

[0032] Optionally, obtaining the optical pulse signal simulating the rotation of the blade according to the voltage - time look - up table file includes:

[0033] Obtaining discrete voltage values according to the voltage - time look - up table file;

[0034] Performing circuit smoothing processing on the discrete voltage values to obtain a continuous voltage pulse waveform;

[0035] Converting according to the continuous voltage pulse waveform to obtain the drive current value of the semiconductor laser light source;

[0036] Modulating using the drive current value of the semiconductor laser light source to obtain the optical pulse signal simulating the rotation of the blade.

[0037] Optionally, obtaining the on-site in-situ calibration result of the non-contact blade vibration measurement device according to the optical pulse signal simulating blade rotation and the vibration parameter information includes:

[0038] Obtaining a voltage signal simulating blade rotation by using the optical pulse signal simulating blade rotation;

[0039] Obtaining blade vibration calibration parameter information by using the calibrated non-contact blade vibration measurement system according to the voltage signal simulating blade rotation;

[0040] Comparing the blade vibration calibration parameter information with the blade vibration parameter information to obtain the on-site in-situ calibration result of the non-contact blade vibration measurement device.

[0041] On the other hand, to achieve the above object, the present invention provides an on-site in-situ calibration device for a non-contact blade vibration measurement device, including a blade vibration parameter input device, a simulated blade vibration voltage waveform generator, and a voltage-light intensity controller;

[0042] The blade vibration parameter input device is used to input the vibration parameter information required for the on-site in-situ calibration device;

[0043] The simulated blade vibration potential waveform generator is used to obtain a voltage-time look-up table file according to the vibration parameter information;

[0044] The voltage-light intensity controller is used to obtain an optical pulse signal simulating blade rotation according to the voltage-time look-up table file.

[0045] Compared with the closest prior art, the beneficial effects of the present invention are:

[0046] The present invention can achieve the calibration of the non-contact vibration measurement device and the evaluation of errors with high fidelity in-situ; the calibration method of the present invention can be executed multiple times before the test, without disassembling and assembling the relevant test equipment, and the operation is portable; the calibration method of the present invention can inject pulse waveforms into multiple sensors simultaneously, and can perform overall in-situ calibration and error evaluation on all measurement channels and measurement devices at one time, and can detect the comprehensive performance index of the device when all channels are working simultaneously, which is convenient and fast. Description of the Drawings

[0047] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for the description of the specific embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0048] Figure 1 Schematic diagram of an on-site in-situ calibration device for a non-contact blade vibration measurement device according to an embodiment of the present invention;

[0049] Figure 2 Flowchart of a method for on-site in-situ calibration of a non-contact blade vibration measurement device according to an embodiment of the present invention;

[0050] Figure 3 Flowchart of generating a sensor voltage-time look-up table file with blade vibration information by using the piecewise function analytical formula method proposed in an embodiment of the present invention;

[0051] Figure 4 Piecewise function analysis model diagram of the sensor voltage waveform proposed in an embodiment of the present invention;

[0052] Figure 5 Flowchart of generating a voltage-time look-up table file by using the strain test comparison and the method of collecting waveforms by a high-speed acquisition card proposed in an embodiment of the present invention;

[0053] Figure 6 Flowchart of signal processing of a voltage-light intensity controller proposed in an embodiment of the present invention. Specific embodiments

[0054] To make the objectives, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the specific embodiments of the present invention and the corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0055] The terms used in the embodiments part of the present invention are only for explaining the specific embodiments of the present invention, rather than aiming to limit the present invention.

[0056] Such as Figure 1As shown in the figure, the on-site in-situ calibration device of the non-contact blade vibration measurement device is composed of a blade vibration parameter input device, a simulated blade vibration voltage waveform generator, and a voltage-light intensity controller connected in sequence. The blade vibration parameter input device is used to set the blade vibration parameter information required by the on-site in-situ calibration device. The blade vibration parameter information includes information such as blade vibration frequency, blade vibration amplitude, blade vibration phase, blade rotation speed, tip linear velocity, etc., as well as information such as the number of blades in the on-site test, tip diameter, spot diameter, sensor working distance, sensor installation angle, etc. In addition, the blade vibration parameter input device can be implemented through keys, touch screens, keyboards, files, etc. The simulated moving blade vibration voltage waveform generator is used to receive the blade vibration parameter information set by the blade vibration parameter input device, and generate a voltage-time lookup table file with blade vibration parameter information according to the blade vibration parameter information. It can run on processor platforms such as CPU, MPU, and FPGA, and write corresponding programs to implement this function. The voltage-light intensity controller is used to read the voltage-time lookup table file, smooth and generate a continuous voltage pulse waveform, and convert the voltage pulse waveform into a current pulse waveform, and can modulate the light intensity of the semiconductor laser light source.

[0057] Example 1 is as Figure 2 shown. The embodiment of the present invention provides a method for on-site in-situ calibration of a non-contact blade vibration measurement device, including the following steps:

[0058] S1. Obtain a voltage-time lookup table file according to the vibration parameter information;

[0059] S2. Obtain an optical pulse signal simulating blade rotation according to the voltage-time lookup table file;

[0060] S3. Obtain the on-site in-situ calibration result of the non-contact blade vibration measurement device according to the optical pulse signal simulating blade rotation and the vibration parameter information.

[0061] S1 specifically includes:

[0062] Obtain vibration parameter information;

[0063] Obtain blade vibration parameter information according to the vibration parameter information;

[0064] Obtain the central time series according to the blade vibration parameter information;

[0065] Based on the central time series, use signal waveform characteristics to perform segmentation to obtain time segmentation points;

[0066] Obtain the function analysis expression according to the time segmentation points;

[0067] Obtain the voltage-time lookup table file according to the function analysis expression and the time segmentation points;

[0068] Among them, the signal waveform of the blade sweeping across the sensor probe is obtained as the signal waveform feature.

[0069] Furthermore, the vibration parameter information includes blade vibration parameter information and field test information;

[0070] Among them, the blade vibration parameter information includes blade vibration frequency, blade vibration amplitude, blade vibration phase, blade rotation speed, and tip linear velocity, and the field test information includes the number of blades, tip diameter, spot diameter, sensor working distance, and sensor installation angle.

[0071] Furthermore, the function analytical expression includes 0 - t a segment function analytical expression, t a - t b segment function analytical expression, t b - t c segment function analytical expression, and t c - t d segment function analytical expression;

[0072] The 0 - t a segment function analytical expression is:

[0073]

[0074] The t a - t b segment function analytical expression is:

[0075]

[0076] The t b - t c segment function analytical expression is:

[0077]

[0078] The t c - t d segment function analytical expression is:

[0079]

[0080] Among them, t a is a the time segmentation point at time t b is b the time segmentation point at time t c is c the time segmentation point at time t d is d the time segmentation point at time F 1( t ) is the analytical expression of the 0- t a segment function, L 1 is a fixed value, indicating no light or weak light reception return, F 2( t ) is t a - t b the analytical expression of the segment function, L 2 is the voltage at the maximum received light intensity under the working distance of the sensor, w 1 is t a - t b the standard deviation of the segment function, t is time, F 3( t ) is t b - t c the analytical expression of the segment function, w 2 is t c - t d the standard deviation of the segment function, F 4( t ) is t c - t d the analytical expression of the segment function.

[0081] S2 specifically includes:

[0082] Obtain discrete voltage values according to the voltage-time lookup table file;

[0083] Perform circuit smoothing processing on the discrete voltage values to obtain a continuous voltage pulse waveform;

[0084] Perform conversion on the continuous voltage pulse waveform to obtain the drive current value of the semiconductor laser light source;

[0085] The driving current value of the semiconductor laser light source is used for modulation to obtain the optical pulse signal simulating the rotation of the blade.

[0086] S3 specifically includes:

[0087] The voltage signal simulating the rotation of the blade is obtained by using the optical pulse signal simulating the rotation of the blade;

[0088] According to the voltage signal simulating the rotation of the blade, the blade vibration calibration parameter information is obtained by using the calibrated non-contact blade vibration measurement system;

[0089] The on-site in-situ calibration result of the non-contact blade vibration measurement device is obtained by comparing the blade vibration calibration parameter information with the blade vibration parameter information.

[0090] As Figure 1 shown, the on-site in-situ calibration device of the non-contact blade vibration measurement device includes a blade vibration parameter input device, a simulated blade vibration voltage waveform generator and a voltage-light intensity controller;

[0091] The blade vibration parameter input device is used to input the vibration parameter information required by the on-site in-situ calibration device;

[0092] The simulated blade vibration potential waveform generator is used to obtain a voltage-time look-up table file according to the vibration parameter information;

[0093] The voltage-light intensity controller is used to obtain the optical pulse signal simulating the rotation of the blade according to the voltage-time look-up table file.

[0094] Example 2 As Figure 1 shown, this embodiment provides an on-site in-situ calibration method for a non-contact blade vibration measurement device, including the following steps:

[0095] Step 1, obtain the vibration blade parameters, specifically:

[0096] Vibration blade parameter information such as the preset theoretical blade vibration frequency, blade vibration amplitude, blade vibration phase, blade rotation speed, tip linear velocity, etc., and on-site test information such as the number of blades, tip diameter, spot diameter, sensor working distance, sensor installation angle, etc. in the on-site test are input into the blade vibration parameter input device. Among them, the blade vibration parameter input device can be implemented through keys, touch screens, keyboards, files, etc.

[0097] Step 2, obtain a voltage-time look-up table file according to the vibration parameter information, specifically:

[0098] According to the vibration parameter information, the simulated moving blade vibration voltage waveform generator generates a voltage-time lookup table file with blade vibration information. As shown in Table 1, the schematic table of the voltage-time lookup table file, the voltage values of each sensor correspond one by one with time. In addition, the voltage-time lookup table file can also be directly imported by the blade vibration parameter input device, or the previously saved voltage-time lookup table file can be called. Among them, the simulated moving blade vibration voltage waveform generator can run on processor platforms such as CPU, MPU, and FPGA, and corresponding programs are written to implement this function.

[0099] Table 1

[0100]

[0101] Step 2 designs two methods for generating voltage waveforms with blade vibration information. One is to calculate and generate the voltage-time lookup table file using the piecewise function analytical formula method, and the other is to generate the voltage-time lookup table file by comparing the measured waveform of the strain gauge with the waveform collected by the high-speed acquisition card. Specifically:

[0102] Step 2.1, as Figure 3 shown, the detailed steps for generating the voltage-time lookup table file based on the piecewise function analytical formula method of vibration parameter information are as follows:

[0103] Step 2.1.1, obtain the blade vibration parameter information according to the vibration parameter information, that is, obtain the blade rotation speed, tip linear velocity, and the vibration frequency, amplitude, phase, etc. of each blade according to the vibration parameter information;

[0104] Step 2.1.2, calculate the central time sequence { t i} of each blade reaching the sensor according to the blade vibration parameter information, where { t i} can be calculated according to the existing classical tip timing theory and blade vibration theory formulas;

[0105] Step 2.1.3, based on the central time sequence, divide the waveform of each blade according to the signal waveform characteristics of the blade sweeping across the sensor probe to obtain the time segmentation points ( t a , t b , t c , t d ), as Figure 4 shown, divide the signal waveform of one blade into 4 segments, and the time segmentation points are respectively t a , t b , tc , t d . Time segmentation points t a , t b , t c , t d can respectively calculate through the time when the blade reaches the sensor center t i , holding time A, rise time B, number of blades, rotational speed, etc. Among them, the holding time A is related to the tip thickness h and tip linear velocity v of the blade, and the simplified calculation is A = h / v; the rise time B is related to the spot diameter d and tip linear velocity v, and the simplified calculation is B = d / v;

[0106] Step 2.1.4. Calculate the analytical expression of each segment function according to the time segmentation points F ( t ), specifically including:

[0107] (1) 0 - t a Segment function analytical expression F 1( t ) is expressed as:

[0108]

[0109] Among them, L 1 is a certain fixed value, indicating no light or weak light reception and return;

[0110] (2) t a - t b Segment function analytical expression F 2( t ) is expressed as:

[0111]

[0112] Among them, t a - t b The segment function analytical expression is represented by the left half of the Gaussian function, and the rise time B can take w 3 times of L 2 is the voltage at the maximum received light intensity under the working distance of the sensor, w 1 is t a - t b The standard deviation of the segment function, t is time;

[0113] (3) t b - t c Analytical expression of piecewise function F 3( t ) is expressed as:

[0114]

[0115] (4) t c - t d Analytical expression of piecewise function F 4( t ) is expressed as:

[0116]

[0117] Among them, w 2 is t c - t d the standard deviation of the piecewise function, t c - t d the analytical expression of the piecewise function is similar to that of t a - t b section, t c - t d the analytical expression of the piecewise function uses the right half formula of the Gaussian function;

[0118] Step 2.1.5, and so on. Calculate the next blade voltage-time data according to the analytical expression and segmentation point of each piecewise function, and finally continuously generate the voltage-time lookup table file.

[0119] Step 2.2, as Figure 5 shown, the detailed steps to generate the voltage-time lookup table file by using the method of comparing the measured waveforms collected by the strain gauge and the high-speed acquisition card based on the vibration parameter information are as follows:

[0120] Step 2.2.1, Use the strain gauge to obtain the true vibration frequency and amplitude of the blade. Specifically:

[0121] Conduct a rotating blade vibration measurement experiment, that is, make the rotating rotor work, and use the strain gauge to measure the true vibration frequency, amplitude, etc. of the blade;

[0122] Step 2.2.2, When measuring with the strain gauge, use the non-contact blade vibration measurement device to synchronously monitor the waveform of the blade sweeping through the sensor;

[0123] Step 2.2.3: Based on the waveform of the blade passing sensor, use a high-speed acquisition card to acquire the original voltage waveform when the blade passes the sensor to obtain the original voltage waveform data;

[0124] Step 2.2.4: Obtain a voltage-time lookup table file according to the original voltage waveform data. Specifically:

[0125] Store the voltage and corresponding time in the original voltage waveform as a voltage-time lookup table file.

[0126] Step 3: Obtain an optical pulse signal simulating blade rotation according to the voltage-time lookup table file. Specifically:

[0127] The voltage-light intensity controller reads the lookup table file to smooth and generate a continuous voltage pulse waveform, which contains information such as the known blade vibration frequency, amplitude, and phase. Then, the voltage-light intensity controller converts the voltage pulse waveform into a current pulse waveform and injects it into the semiconductor laser light source. The light intensity of the semiconductor laser light source is modulated by the injected current pulse waveform, and an optical pulse signal simulating blade rotation is emitted and enters the transmitting optical fiber of the calibrated non-contact blade vibration measurement device;

[0128] As Figure 6 shown, the detailed steps of the signal processing flow of the voltage-light intensity controller are as follows:

[0129] Step 3.1: Generate precise time (moments) using a high-resolution clock;

[0130] Step 3.2: Obtain discrete voltage values according to the voltage-time lookup table file and the precise time, that is, obtain the output discrete voltage value corresponding to the precise time according to the voltage-time lookup table file or obtain the discrete voltage value by interpolating the voltage values at the previous and subsequent moments in the voltage-time lookup table file;

[0131] Step 3.3: Perform circuit smoothing processing on the discrete voltage values to obtain a continuous voltage pulse waveform;

[0132] Step 3.4: Obtain the drive current value of the semiconductor laser light source through circuit conversion according to the continuous voltage pulse waveform;

[0133] Step 3.5: Modulate using the drive current value of the semiconductor laser light source to obtain an optical pulse signal simulating blade rotation. Specifically:

[0134] Drive and modulate the drive current value of the semiconductor laser light source, and couple it into the transmitting optical fiber of the sensor to obtain an optical pulse signal simulating blade rotation.

[0135] Step 4. Obtain the on-site in-situ calibration result of the non-contact blade vibration measurement device according to the optical pulse signal simulating blade rotation and the vibration parameter information. Specifically:

[0136] The optical pulse signal simulating blade rotation is emitted to the blade tip (at this time, the rotating rotor is in a stopped state and has not started running), and returns to the preamplifier for photoelectric conversion through the blade tip and the receiving optical fiber of the sensor, and is converted into a voltage signal simulating blade rotation; then the signal processing of the calibrated non-contact blade vibration measurement system outputs blade vibration calibration parameter information such as blade vibration frequency, amplitude, and phase. By comparing with the preset blade vibration parameter information such as blade vibration frequency, amplitude, and phase, the measurement accuracy, measurement error, etc. of the non-contact blade vibration measurement device can be calculated and evaluated, and then the on-site in-situ calibration result of the non-contact blade vibration measurement device can be obtained.

[0137] Those skilled in the art should understand that the embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present invention can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0138] The present invention is described with reference to the flowcharts and / or block diagrams of methods, apparatuses (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or block in the flowchart and / or block diagram can be implemented by computer program instructions, and the combination of processes and / or blocks in the flowchart and / or block diagram can also be implemented by computer program instructions. These computer program instructions can be provided to the processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing devices to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing devices generate a device for implementing the functions specified in Figure 1 one process or multiple processes and / or blocks Figure 1 one block or multiple blocks.

[0139] These computer program instructions can also be stored in a computer-readable memory capable of guiding a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer-readable memory generate a manufactured product including an instruction device, and the instruction device implements the functions specified in Figure 1 one process or multiple processes and / or blocks Figure 1 one block or multiple blocks.

[0140] These computer program instructions can also be loaded onto a computer or other programmable data processing apparatus, so that a series of operation steps are performed on the computer or other programmable apparatus to produce a computer-implemented process, thereby providing instructions for implementing the steps specified in one process or a plurality of processes and / or blocks Figure 1 in one block or a plurality of blocks Figure 1 of the functions specified in the flow(s).

[0141] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit them. Although the present invention has been described in detail with reference to the above embodiments, those of ordinary skill in the art should understand that modifications or equivalent replacements can still be made to the specific embodiments of the present invention. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention shall be covered by the protection scope of the claims of the present invention.

Claims

1. A method for on-site in-situ calibration of a non-contact blade vibration measurement device, characterized in that, Specifically, it includes the following steps: S1. Obtain a voltage-time look-up table file according to vibration parameter information; Obtaining a voltage-time look-up table file according to vibration parameter information includes: Obtain vibration parameter information; Obtain blade vibration parameter information according to the vibration parameter information; Obtain a central time series according to the blade vibration parameter information; Based on the central time series, use signal waveform features to perform segmentation to obtain time segmentation points; Obtain a function analysis expression according to the time segmentation points; Obtain the voltage-time look-up table file according to the function analysis expression and the time segmentation points; Wherein, obtain the signal waveform of the blade sweeping across the sensor probe as the signal waveform feature; S2. Obtain an optical pulse signal simulating blade rotation according to the voltage-time look-up table file; S3. Obtain the on-site in-situ calibration result of the non-contact blade vibration measurement device according to the optical pulse signal simulating blade rotation and the vibration parameter information.

2. The in-situ calibration method of the non-contact blade vibration measurement device according to claim 1, characterized in that, The vibration parameter information includes blade vibration parameter information and on-site test information; Wherein, the blade vibration parameter information includes blade vibration frequency, blade vibration amplitude, blade vibration phase, blade rotation speed and tip linear velocity, and the on-site test information includes the number of blades, tip diameter, spot diameter, sensor working distance and sensor installation angle.

3. The on-site in-situ calibration method of the non-contact blade vibration measurement device according to claim 2, characterized in that, The function parsing expression includes 0 - t a piecewise function parsing expressions, t a - t b piecewise function parsing expressions, t b - t c piecewise function parsing expressions and t c - t d piecewise function parsing expressions; The 0- t a piecewise function analytical expression is: ； The said t a - t b The analytical expression of the piecewise function is: ； The said t b - t c The analytical expression of the piecewise function is as follows: ； The described t c - t d The analytical expression of the piecewise function is: ； Among them, t a is a the time segmentation point at time t b is b the time segmentation point at time t c is c the time segmentation point at time t d is d the time segmentation point at time F 1( t ) is the analytical expression of the piecewise function from 0 - t a segment, L 1 is a fixed value, indicating no light or weak light reception return, F 2( t ) is t a - t b segment analytical expression, L 2 is the voltage at the maximum received light intensity under the working distance of the sensor, w 1 is t a - t b the standard deviation of the segment function, t is time, F 3( t ) is t b - t c segment analytical expression, w 2 is t c - t d the standard deviation of the segment function, F 4( t ) is t c - t d segment analytical expression.

4. The on-site in-situ calibration method of the non-contact blade vibration measurement device according to claim 1, characterized in that, Obtaining an optical pulse signal simulating blade rotation according to the voltage-time look-up table file includes: Obtain discrete voltage values according to the voltage-time look-up table file; Perform circuit smoothing processing on the discrete voltage values to obtain a continuous voltage pulse waveform; Perform conversion according to the continuous voltage pulse waveform to obtain the drive current value of the semiconductor laser light source; Use the drive current value of the semiconductor laser light source for modulation to obtain the optical pulse signal simulating blade rotation.

5. The on-site in-situ calibration method of the non-contact blade vibration measurement device according to claim 2, characterized in that, Obtaining the on-site in-situ calibration result of the non-contact blade vibration measurement device according to the optical pulse signal simulating blade rotation and the vibration parameter information includes: Obtain a voltage signal simulating blade rotation by using the optical pulse signal simulating blade rotation; Obtain blade vibration calibration parameter information by using the voltage signal simulating blade rotation and the calibrated non-contact blade vibration measurement system; Compare the blade vibration calibration parameter information with the blade vibration parameter information to obtain the on-site in-situ calibration result of the non-contact blade vibration measurement device.

6. An on-site in-situ calibration device for a non-contact blade vibration measurement device, which implements the method according to any one of claims 1-5, characterized in that, It includes a blade vibration parameter input device, an analog blade vibration voltage waveform generator and a voltage-light intensity controller; The blade vibration parameter input device is used to input the vibration parameter information required by the on-site in-situ calibration device; The analog blade vibration voltage waveform generator is used to obtain a voltage-time look-up table file according to the vibration parameter information; The voltage-light intensity controller is used to obtain an optical pulse signal simulating blade rotation according to the voltage-time look-up table file.

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