High-frequency active differential signal probe and control method thereof

Abstract

The invention is applicable to the technical field of signal detection, and particularly relates to a high-frequency active differential signal probe and a control method thereof, a high-performance active differential probe is realized by using a high-performance operational amplifier, combining a low-ripple positive and negative power supply and combining a full-shielding shell through optimizing a circuit structure and using fewer devices; differential measurement of signals is realized, a low-cost differential probe is realized, and a signal measurement threshold is greatly reduced; the method has significance in promoting technical progress, has high measurement performance, and can meet most measurement requirements.

Description

Technical Field

[0001] The present application belongs to the technical field of signal detection, and in particular, relates to a high-frequency active differential signal probe and a control method thereof. Background Art

[0002] At present, differential probes are widely used in various signal measurements, among which applications below 1 GHz are more common. Among them, active differential probes have advantages in measuring high-frequency signals and are suitable for high-speed data transmission and RF applications.

[0003] In the existing technology, although traditional high-frequency active differential signal probes can improve bandwidth, they rely on complex circuit design and high-cost components, resulting in excessively high overall costs and are difficult to meet the needs of scenarios such as high-speed communications. Summary of the invention

[0004] The embodiments of the present application provide a high-frequency active differential signal probe and a control method thereof, which can improve the problem that the high-frequency active differential signal probe relies on complex circuit design and high-cost components, resulting in excessively high overall cost and difficulty in meeting the requirements of scenarios such as high-speed communications.

[0005] In a first aspect, an embodiment of the present application provides a high-frequency active differential signal probe, comprising a shielding shell, and an input interface module, a signal conditioning module, a differential amplifier module, a low-ripple power supply module, and an output interface module arranged inside the shielding shell; The input interface module is used to receive a differential signal; The signal conditioning module is electrically connected to the input interface module, and is used to receive the differential signal transmitted by the input interface module and pre-process the differential signal; The differential amplification module is electrically connected to the signal conditioning module, and is used to receive the pre-processed differential signal transmitted by the signal conditioning module to realize differential signal amplification; The low ripple power supply module is used to provide positive and negative power supplies for the differential amplifier module; The output interface module is used to output the amplified differential signal as a single-ended signal.

[0006] The above technical solutions in the embodiments of the present application have at least the following technical effects: The high-frequency active differential signal probe provided in the embodiment of the present application utilizes a high-performance operational amplifier, combined with a low-ripple positive and negative power supply, and a fully shielded housing. By optimizing the circuit structure, a high-performance active differential probe is implemented using fewer components, differential measurement of signals is achieved, and a low-cost differential probe is implemented, which greatly reduces the threshold for signal measurement. This is of great significance for promoting technological progress, has high measurement performance, and can meet most measurement needs.

[0007] In a second aspect, an embodiment of the present application provides a high-frequency active differential signal probe control method, comprising: Receiving a differential signal, and performing real-time detection on the amplitude of the differential signal to obtain a real-time detection result of the amplitude of the differential signal; Based on the real-time detection result of the amplitude of the differential signal, triggering 0 / 6 / 12dB attenuation gear switching, attenuating the differential signal, and obtaining a time domain reflection waveform of the attenuated differential signal; According to the time domain reflection waveform of the attenuated differential signal, a target impedance matching parameter is obtained by a fast impedance estimation algorithm; Adjusting the matching network parameters according to the target impedance matching parameters to obtain the signal amplitude fluctuation amount after the matching network parameters are adjusted; Based on the signal amplitude fluctuation amount after the matching network parameters are adjusted, a proportional-integral (PI) control algorithm is used to adjust the gain of the operational amplifier to obtain a time domain characteristic of the power supply ripple after the gain is adjusted; Based on the time domain characteristics of the power supply ripple after gain adjustment, a sliding average filtering algorithm is executed to generate a ripple suppression parameter.

[0008] In a third aspect, an embodiment of the present application provides a high-frequency active differential signal probe control system, comprising: A receiving unit, used for receiving a differential signal, and performing real-time detection on the amplitude of the differential signal to obtain a real-time detection result of the amplitude of the differential signal; A switching unit, configured to trigger a 0 / 6 / 12 dB attenuation gear switch based on the real-time detection result of the amplitude of the differential signal, attenuate the differential signal, and obtain a time domain reflection waveform of the attenuated differential signal; A generating unit, configured to obtain a target impedance matching parameter by a fast impedance estimation algorithm according to the time domain reflection waveform of the attenuated differential signal; A parameter unit, used to adjust the matching network parameters according to the target impedance matching parameters to obtain the signal amplitude fluctuation amount after the matching network parameters are adjusted; A characteristic unit, used to adjust the gain of the operational amplifier using a proportional-integral (PI) control algorithm based on the signal amplitude fluctuation amount after the matching network parameters are adjusted, so as to obtain a time domain characteristic of the power supply ripple after the gain is adjusted; The suppression unit is used to generate a ripple suppression parameter by executing a sliding average filtering algorithm based on the time domain characteristics of the power supply ripple after gain adjustment.

[0009] In a fourth aspect, an embodiment of the present application provides a high-frequency active differential signal probe, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the method described in any one of the above aspects when executing the computer program.

[0010] In a fifth aspect, an embodiment of the present application provides a computer program product. When the computer program product runs on a high-frequency active differential signal probe, the high-frequency active differential signal probe executes the method of any one of the above aspects.

[0011] It can be understood that the beneficial effects of the second to fourth aspects mentioned above can be found in the relevant descriptions in the above aspects and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0013] Figure 1 It is a circuit diagram of a high-frequency active differential signal probe provided in one embodiment of the present application; Figure 2 It is a flowchart of a high-frequency active differential signal probe control method provided by an embodiment of the present application; Figure 3 It is a structural schematic diagram of a high-frequency active differential signal probe control system provided by an embodiment of the present application; Figure 4 It is a structural schematic diagram of a high-frequency active differential signal probe provided in one embodiment of the present application. DETAILED DESCRIPTION

[0014] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0015] It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, wholes, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or combinations thereof.

[0016] It should also be understood that the term “and / or” used in the specification and appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0017] As used in the specification of this application and the appended claims, the term "if" can be interpreted as "when" or "uponce" or "in response to determining" or "in response to detecting" depending on the context. Similarly, the phrase "if it is determined" or "if the described condition or event is detected" can be interpreted as meaning "uponce it is determined" or "in response to determining" or "uponce the described condition or event is detected" or "in response to detecting the described condition or event" depending on the context.

[0018] In addition, in the description of the present application specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance.

[0019] References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0020] Although traditional high-frequency active differential signal probes have achieved improved bandwidth indicators through multi-level signal conditioning and compensation technology, their core design relies on complex hardware architectures such as customized integrated circuits and multi-layer impedance matching networks, which greatly increases the complexity of circuit design, resulting in high overall costs and a significant increase in the threshold for production and debugging.

[0021] To solve the above problems, the embodiment of the present application provides a high-frequency active differential signal probe and a control method thereof. In this method, by adopting a high-performance operational amplifier, combined with a low-ripple positive and negative power supply, and combined with a fully shielded housing, by optimizing the circuit structure, a high-performance active differential probe is realized with fewer components, differential measurement of signals is realized, and a low-cost differential probe is realized, which greatly reduces the threshold for signal measurement, is of significance for promoting technological progress, has high measurement performance, and can meet most measurement needs.

[0022] The high-frequency active differential signal probe and the control method thereof provided in the embodiments of the present application have important application value in many fields, especially in power electronic equipment, high-speed serial bus, automobile safety testing, integrated circuit testing, aerospace and national defense security and other fields.

[0023] The high-frequency active differential signal probe and the control method thereof provided in the embodiments of the present application can be applied in the research and development of power electronic equipment and transmission systems to measure differential signals in high voltage and high current environments to ensure the stability and reliability of the system.

[0024] The high-frequency active differential signal probe and its control method provided in the embodiment of the present application can be used in the design, verification, debugging and verification of high-speed serial buses (such as USB, PCIe, etc.), and can accurately measure the rise time, fall time, peak voltage and other parameters of the high-speed signal, providing engineers with accurate test data.

[0025] In order to better understand the high-frequency active differential signal probe provided in the embodiment of the present application, the technical solution of the high-frequency active differential signal probe provided in the embodiment of the present application is exemplarily introduced below.

[0026] Figure 1 The circuit diagram of the high-frequency active differential signal probe of the present invention is shown in FIG. The high-frequency active differential signal probe includes the following structures: A shielding shell, and an input interface module, a signal conditioning module, a differential amplifier module, a low ripple power supply module and an output interface module arranged inside the shielding shell; The input interface module is used to receive differential signals; The signal conditioning module is electrically connected to the input interface module, and is used to receive the differential signal transmitted by the input interface module and pre-process the differential signal; The differential amplifier module is electrically connected to the signal conditioning module and is used to receive the pre-processed differential signal transmitted by the signal conditioning module to realize differential signal amplification; A low ripple power supply module is used to provide positive and negative power supplies for the differential amplifier module; The output interface module is used to output the amplified differential signal as a single-ended signal.

[0027] The high-frequency active differential signal probe provided in this embodiment is integrated in a shielded shell, covering input, signal conditioning, differential amplification, low-ripple power supply and output interface modules. The shielded shell resists interference and ensures stability; the input module accurately receives signals; the conditioning module pre-processes and optimizes signal quality; the differential amplification module stably amplifies signals with the support of a low-ripple power supply; the output module converts differentials to single-ended to enhance compatibility. The high-frequency active differential signal probe provided in this embodiment optimizes the circuit structure to achieve a low-cost differential probe with high measurement performance, can meet most measurement requirements, and greatly reduce the threshold for signal measurement, which is of significance for promoting technological progress.

[0028] In some embodiments, the input interface module includes two symmetrically configured BNC input ports for receiving differential signal inputs; the input interface module can accurately match differential signal characteristics and reduce distortion to ensure accurate signal reception.

[0029] In some embodiments, the signal conditioning module includes an adjustable attenuator and an impedance matching circuit; the adjustable attenuator is electrically connected to the input interface module and the impedance matching circuit, is composed of a PIN diode array, supports three-level attenuation adjustment of 0 / 6 / 12dB, and is used to attenuate and adjust the differential signal transmitted by the input interface module; the impedance matching circuit is electrically connected to the adjustable attenuator and the differential amplifier module, and uses a 50Ω coaxial transmission line equivalent impedance model to perform impedance matching on the differential signal processed by the adjustable attenuator; the signal conditioning module can accurately attenuate and impedance match the differential signal, reduce signal distortion and interference during transmission and processing, and improve the purity of the signal.

[0030] In some embodiments, the differential amplifier module includes an LT6400 high-performance operational amplifier; the LT6400 high-performance operational amplifier is electrically connected to the signal conditioning module and the low-ripple power supply module, and is used to receive the pre-processed differential signal transmitted by the signal conditioning module to realize differential signal amplification; the differential amplifier module can efficiently and accurately amplify the differential signal pre-processed by the signal conditioning module, accurately restore the characteristics of the signal, and provide a reliable signal for subsequent measurement and analysis.

[0031] In some embodiments, the low ripple power supply module includes positive and negative power supplies and an LT3045 ultra-low noise linear regulator; the positive and negative power supplies are electrically connected to the LT3045 ultra-low noise linear regulator; the LT3045 ultra-low noise linear regulator is electrically connected to the positive and negative power supplies and the differential amplifier module; the ripple coefficient of the low ripple power supply module is no more than 1mV, and is used to provide positive and negative power supplies for the differential amplifier module; the low ripple power supply module can reduce the interference of power supply noise on the amplified signal, ensure the stable performance of the differential amplifier module, and further improve the accuracy of signal processing.

[0032] In some embodiments, the output interface module includes a single-ended buffer amplifier and a BNC connector; the single-ended buffer amplifier is electrically connected to the differential amplifier module and the BNC connector; the BNC connector is electrically connected to the single-ended buffer amplifier, and is used to output the amplified differential signal as a single-ended signal to achieve a measurement bandwidth of not less than 1.5 GHz; the output interface module achieves a measurement bandwidth of not less than 1.5 GHz, can meet the measurement requirements of high-frequency signals, and improves the application range and measurement performance of the probe.

[0033] In some embodiments, the shielding shell includes a conductive isolation layer and a conductive rubber ring; the conductive isolation layer of the shielding shell is composed of a copper-plated silver film; a plurality of layers of conductive rubber rings are provided at the joint between the input interface module and the shielding shell; the shielding shell can reduce signal distortion and errors caused by electromagnetic interference, protect the internal circuit from the influence of external environmental factors, and extend the service life of the probe.

[0034] The embodiment of the present application also provides a high-frequency active differential signal probe control method. The high-frequency active differential signal probe control method provided in the embodiment of the present application can be applied to a high-frequency active differential signal probe. In this case, the high-frequency active differential signal probe is the executor of the high-frequency active differential signal probe control method provided in the embodiment of the present application. The embodiment of the present application does not impose any restrictions on the specific type of the high-frequency active differential signal probe.

[0035] Figure 2 A schematic flow chart of a high-frequency active differential signal probe provided in an embodiment of the present application is shown. The high-frequency active differential signal probe control method includes: S100, receiving a differential signal, and performing real-time detection on the amplitude of the differential signal to obtain a real-time detection result of the amplitude of the differential signal.

[0036] It can be understood that differential signaling is a way of transmitting signals through two signal lines (positive and negative), which can effectively suppress common mode noise. In order to eliminate high-frequency noise, the signal can be filtered and the root mean square value (RMS) and peak value of the signal can be calculated using a sliding window. The window size can be dynamically adjusted according to the signal characteristics. Wavelet transform can be introduced to separate the transient components of the signal, and combined with machine learning models (such as support vector machines) to identify abnormal amplitudes (such as burst noise), so as to achieve high-precision real-time amplitude detection and obtain the real-time amplitude detection results of the differential signal.

[0037] S200, based on the real-time detection result of the amplitude of the differential signal, trigger the 0 / 6 / 12dB attenuation gear switching, attenuate the differential signal, and obtain the time domain reflection waveform of the attenuated differential signal.

[0038] It can be understood that the need to switch the attenuation gear can be determined based on the real-time detection result of the amplitude of the differential signal. If the amplitude of the differential signal exceeds the preset threshold, the gear can be switched through the programmable attenuator (such as 0dB, 6dB, 12dB). The programmable attenuator is driven by a digital control signal and can quickly adjust the attenuation. The attenuated differential signal will be recorded in its time domain reflection waveform. In order to improve the accuracy of waveform acquisition, oversampling technology can be used, combined with the weighted average method to remove random noise. The time domain reflection waveform reflects the reflection of the differential signal in the transmission path. The waveform spectrum can be analyzed by Fourier transform to identify the main reflection frequency components, providing data support for subsequent impedance matching.

[0039] S300, obtaining target impedance matching parameters through a fast impedance estimation algorithm according to the time domain reflection waveform of the attenuated differential signal.

[0040] It can be understood that the time domain reflection waveform can be preprocessed, and the weighted average method can be used to smooth the waveform and remove noise. The Fourier transform can be used to analyze the waveform spectrum and extract the main reflection frequency components. Based on the time domain reflection waveform, the recursive least squares method (RLS) can be applied to update the impedance estimation results in real time to ensure fast convergence in a dynamic environment. Genetic algorithms can be introduced to optimize impedance matching parameters and find the global optimal solution in a complex environment. The matching network parameters include capacitance and inductance values, which can be combined with the table lookup method and interpolation method to ensure parameter accuracy.

[0041] In a possible implementation, S300, obtaining a target impedance matching parameter by a fast impedance estimation algorithm according to a time domain reflection waveform of the attenuated differential signal, includes: S310 , extracting a rising edge slope as an impedance deviation according to a time domain reflection waveform of the attenuated differential signal.

[0042] It can be understood that the rising edge can be detected from the time domain reflection waveform and its slope can be calculated. The rising edge slope reflects the rate of change of the differential signal from low level to high level, and is an important indicator for evaluating the impedance matching. The sliding window peak detection algorithm can be used, combined with the local maximum search technology to extract the accurate rising edge. The actual slope is compared with the ideal slope (the slope when 50Ω is matched) to obtain the impedance deviation. Wavelet transform can be introduced to separate the transient component of the signal, and digital filtering technology can be combined to improve the accuracy of slope calculation.

[0043] S320: Convert the impedance deviation into a matching network capacitance adjustment value through a pre-stored impedance-capacitance mapping table.

[0044] It can be understood that the pre-stored impedance-capacitance mapping table can be queried according to the impedance deviation to find the corresponding capacitance adjustment value. The table lookup method can be combined with the interpolation method to ensure the accuracy of the capacitance value. The impedance-capacitance mapping table is generated based on a large amount of experimental data, covering the impedance-capacitance correspondence under different frequency and temperature conditions. The target value in the impedance-capacitance mapping table can be quickly located by introducing a binary search algorithm.

[0045] S330, when it is detected that the standing wave ratio exceeds the first preset threshold, the capacitance adjustment value is iteratively adjusted until the standing wave ratio is lower than the second preset threshold, thereby obtaining a target impedance matching parameter.

[0046] It can be understood that the VSWR of the current signal path can be used to evaluate the degree of signal reflection. If the VSWR is greater than 1.5:1, the capacitance value in the matching network can be adjusted iteratively and the VSWR can be remeasured. In order to optimize the adjustment process, the Newton iteration method can be used to quickly approach the target value. After each adjustment, the VSWR change trend can be recorded, and the capacitance value step size can be dynamically adjusted according to the trend to speed up the convergence. When the VSWR is less than 1.3:1, the final 50Ω matching network parameters are generated.

[0047] Optionally, S330, when it is detected that the standing wave ratio exceeds a first preset threshold, the capacitance adjustment value is iteratively adjusted until the standing wave ratio is lower than a second preset threshold, to obtain a target impedance matching parameter, including: S331, updating the capacitance value based on a nonlinear iterative algorithm, calculating the functional relationship between the standing wave ratio and the capacitance value in real time, and adjusting the iteration step size according to the changing trend of the functional relationship between the standing wave ratio and the capacitance value.

[0048] It can be understood that when updating the capacitance value based on the nonlinear iterative algorithm, the nonlinear mapping relationship between the standing wave ratio and the capacitance value can be constructed by real-time monitoring of the dynamic response characteristics of the standing wave ratio with the change of the capacitance value. The standing wave ratio data points after the capacitance adjustment can be continuously collected to fit a nonlinear response curve with curvature characteristics, and the iteration direction and step size can be intelligently selected based on the curve shape. When it is detected that the standing wave ratio decrease rate is lower than the preset rate threshold (such as the standing wave ratio decrease amplitude per unit time is less than 0.1:1), the capacitance adjustment step size is automatically increased to break through the local flat area; when the standing wave ratio fluctuation amplitude exceeds the tolerance range (such as the difference between two adjacent measurement values ​​exceeds 0.15:1), the step size is reduced to avoid oscillation divergence. The inflection point characteristics of the response curve can be identified by curvature analysis, and sub-step fine adjustment can be enabled in areas with high nonlinearity (such as steep curve sections), while a large step size is used to quickly approach the target value in the approximate linear area to achieve a dynamic balance between convergence speed and stability.

[0049] Exemplarily, S331, updating the capacitance value based on a nonlinear iterative algorithm, calculating the functional relationship between the standing wave ratio and the capacitance value in real time, and adjusting the iteration step size according to the changing trend of the functional relationship between the standing wave ratio and the capacitance value, includes: S3311, updating the capacitance value based on a nonlinear iterative algorithm, establishing a nonlinear response curve of the standing wave ratio-capacitance change, and calculating the curvature of the nonlinear response curve in real time.

[0050] It can be understood that when establishing a nonlinear response curve of standing wave ratio-capacitance change, a continuous and differentiable curve model can be generated by polynomial interpolation or spline fitting algorithm, and the curvature parameter can be calculated in real time to quantify the curvature of the curve. The curvature calculation is based on the principle of differential geometry, and the key inflection points in the adjustment process can be dynamically identified by analyzing the changing characteristics of the second-order derivative of the curve. For example, when a sudden increase in the curvature of the nonlinear response curve is detected, it indicates that the current capacitance value is close to the sensitive critical point of the nonlinear response area. At this time, it automatically switches to the fine-tuning mode of the auxiliary capacitor to avoid the rough adjustment of the main capacitor causing drastic fluctuations in the standing wave ratio. The intelligent switching of the adjustment strategy can be achieved through curvature threshold judgment (such as when the curvature exceeds the preset threshold value), which significantly improves the robustness in complex nonlinear scenarios.

[0051] S3312, according to the curvature of the nonlinear response curve, when the rate of decrease of the standing wave ratio is lower than a preset rate threshold, the step length is increased, and when the fluctuation amplitude of the standing wave ratio exceeds a preset fluctuation threshold, the step length is decreased.

[0052] It can be understood that the curvature-based step control strategy can achieve real-time optimization of adjustment parameters by dynamically analyzing the geometric characteristics of the response curve. When the rate of decrease of the standing wave ratio is lower than the preset rate threshold, it is determined that the current is in a low sensitivity area, and the inefficient adjustment interval is quickly crossed by doubling the step length (such as from 0.5pF to 1.0pF); when the standing wave ratio fluctuation amplitude exceeds the preset fluctuation threshold, the step length attenuation mechanism is enabled (such as reducing the step length to 0.2pF), and the adjustment effectiveness is verified in combination with the direction of phase angle change.

[0053] Before iteratively adjusting the capacitance value, the method further includes: S340, determining the standing wave ratio of the signal path, and calculating the deviation between the measured impedance and the target impedance.

[0054] It can be understood that when determining the standing wave ratio of the signal path, the real-time reflection coefficient amplitude and phase angle can be obtained, and the current impedance value can be calculated through the transmission line theoretical model. By performing vector difference operations on the real and imaginary parts of the measured impedance and the target impedance (such as 50Ω), two-dimensional evaluation parameters of modulus deviation and phase deviation are generated, where the modulus deviation represents the static error of the impedance amplitude, and the phase deviation reflects the degree of delay distortion of signal transmission.

[0055] S350, when both the standing wave ratio and the deviation exceed the corresponding thresholds, the iterative adjustment process is triggered.

[0056] It can be understood that the standing wave ratio is a direct representation of the signal reflection intensity. When it exceeds the threshold (for example, 1.5:1), it means that there is a significant impedance mismatch in the transmission path, which may cause signal energy reflection, resulting in reduced equipment efficiency or hardware damage; and when the impedance deviation (the percentage difference between the measured impedance and the target impedance) exceeds the threshold (for example, 10%), it quantifies the degree of deviation of the current matching state from a vector perspective. The standing wave ratio and deviation comprehensively reflect the mismatch problems in the two dimensions of amplitude and phase. Only when both exceed the limit at the same time is it determined that there is a substantial impedance anomaly, thereby avoiding false triggering caused by fluctuations in a single parameter (such as an instantaneous increase in the standing wave ratio caused by a short-term temperature drift). The dual-threshold fusion judgment strategy of the standing wave ratio and deviation not only prevents frequent misadjustments caused by oversensitivity, but also avoids systemic risks caused by missed judgments, so that the adjustment action is accurately triggered only when it is really necessary, providing highly reliable start conditions for iterative optimization.

[0057] S400, adjusting matching network parameters according to target impedance matching parameters to obtain signal amplitude fluctuation amount after the matching network parameters are adjusted.

[0058] It can be understood that the matching network parameters can be adjusted according to the target impedance matching parameters, the signal amplitude before and after the matching network parameters are adjusted can be recorded, and the amplitude fluctuation (such as the difference between the maximum and minimum values) can be calculated. The signal amplitude can be monitored in real time by sliding window technology, and the random noise can be removed by combining the weighted average method. The amplitude fluctuation reflects the change in signal stability and is an important indicator for evaluating the adjustment effect of the matching network. An adaptive algorithm can be introduced to dynamically adjust the matching parameters, and the adjustment strategy can be corrected in real time according to the amplitude fluctuation.

[0059] S500, based on the signal amplitude fluctuation after the matching network parameters are adjusted, uses a proportional-integral (PI) control algorithm to adjust the operational amplifier gain and obtains the power supply ripple time domain characteristics after gain adjustment.

[0060] It can be understood that according to the amplitude fluctuation, the proportional-integral (PI) control algorithm can be used to calculate the gain adjustment value. The proportional term is used to quickly respond to error changes, and the integral term is used to eliminate steady-state errors. An adaptive parameter adjustment function can be introduced to dynamically adjust the proportional coefficient K according to the signal characteristics. p and the integration coefficient K i After gain adjustment, the time domain characteristics of the power supply ripple are recorded, and the ripple envelope is extracted through Hilbert transform to analyze its low-frequency characteristics. The PI control algorithm can be optimized through fuzzy logic to enhance the adaptability to nonlinear changes.

[0061] S600, based on the time domain characteristics of the power supply ripple after gain adjustment, a sliding average filtering algorithm is executed to generate a ripple suppression parameter.

[0062] It can be understood that the time domain characteristics of the power supply ripple after gain adjustment can be extracted, and the average ripple value in the window can be calculated by the sliding average filtering algorithm. The sensitivity to recent data can be enhanced by introducing the exponentially weighted moving average (EWMA) algorithm. The sliding window size can be dynamically adjusted according to the signal change rate to optimize the filtering effect. The main characteristics of the ripple can be extracted by principal component analysis (PCA) and targeted suppression parameters can be generated. In order to further improve the suppression effect, a multi-stage filtering mechanism is introduced to suppress ripples of different frequency components separately.

[0063] In a possible implementation, S600, based on the time domain characteristics of the power supply ripple after gain adjustment, executing a sliding average filtering algorithm to generate a ripple suppression parameter includes: S610, based on the time domain characteristics of the power ripple after gain adjustment, calculate the peak value of the ripple peak within the most recent 10 ms window.

[0064] It can be understood that a 10ms time window can be pre-set to detect the ripple peak from the time domain characteristics of the power supply ripple after gain adjustment and calculate its peak value. The accurate peak value can be extracted by the sliding window peak detection algorithm combined with the local maximum search technology. In order to eliminate noise interference, the transient component of the signal can be separated by wavelet transform to improve the accuracy of peak calculation. The peak data is recorded in real time and used to evaluate the ripple suppression effect.

[0065] S620: When the peak value of the ripple peak exceeds 1 mV, activate the pre-stored filter coefficient combination to suppress the ripple.

[0066] It can be understood that it is possible to detect whether the ripple peak value exceeds 1mV. If it exceeds, the preset filter coefficient combination (such as the parameters of the Butterworth filter or the Chebyshev filter) can be activated, and the digital filtering algorithm can be applied to further suppress the power supply ripple. The filter coefficient combination is generated based on a large amount of experimental data, covering the ripple characteristics of different frequencies and amplitudes. The filter parameters can be dynamically adjusted according to the ripple characteristics by introducing adaptive filtering technology. The suppression effect is monitored in real time, and the filter coefficient combination is dynamically optimized through the feedback control mechanism. High-performance active differential probes are realized through fewer devices, differential measurement of signals is realized, and low-cost differential probes are realized, which greatly reduces the threshold for signal measurement, is meaningful for promoting technological progress, has high measurement performance, and can meet most measurement needs.

[0067] Corresponding to the high-frequency active differential signal probe control method of the above embodiment, the embodiment of the present application also provides a high-frequency active differential signal probe control system, and each unit of the system can implement each step of the high-frequency active differential signal probe control method. Figure 3 A structural block diagram of a high-frequency active differential signal probe control system provided in an embodiment of the present application is shown. For ease of explanation, only the parts related to the embodiment of the present application are shown.

[0068] Reference Figure 3 , the high frequency active differential signal probe control system includes: A receiving unit, used for receiving a differential signal, and performing real-time detection on the amplitude of the differential signal to obtain a real-time detection result of the amplitude of the differential signal; A switching unit, configured to trigger a 0 / 6 / 12 dB attenuation gear switch based on the real-time detection result of the amplitude of the differential signal, attenuate the differential signal, and obtain a time domain reflection waveform of the attenuated differential signal; A generating unit, configured to obtain a target impedance matching parameter by a fast impedance estimation algorithm according to the time domain reflection waveform of the attenuated differential signal; A parameter unit, used to adjust the matching network parameters according to the target impedance matching parameters to obtain the signal amplitude fluctuation amount after the matching network parameters are adjusted; A characteristic unit, used to adjust the gain of the operational amplifier using a proportional-integral (PI) control algorithm based on the signal amplitude fluctuation amount after the matching network parameters are adjusted, so as to obtain a time domain characteristic of the power supply ripple after the gain is adjusted; The suppression unit is used to generate a ripple suppression parameter by executing a sliding average filtering algorithm based on the time domain characteristics of the power supply ripple after gain adjustment.

[0069] It should be noted that the information interaction, execution process, etc. between the above-mentioned systems / units are based on the same concept as the method embodiment of the present application. Their specific functions and technical effects can be found in the method embodiment part and will not be repeated here.

[0070] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the system can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit module can exist physically separately, or two or more unit modules can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0071] The embodiment of the present application also provides a high-frequency active differential signal probe, Figure 4 This is a schematic diagram of the structure of a high-frequency active differential signal probe provided in one embodiment of the present application. Figure 4 As shown, the high-frequency active differential signal probe 6 of this embodiment includes: at least one processor 60 ( Figure 4 Only one is shown), at least one memory 61 ( Figure 4 Only one is shown in the figure) and a computer program 62 stored in the at least one memory 61 and executable on the at least one processor 60. When the processor 60 executes the computer program 62, the high-frequency active differential signal probe 6 implements the steps in any of the above-mentioned high-frequency active differential signal probe control method embodiments, or the high-frequency active differential signal probe 6 implements the functions of each unit in the above-mentioned device embodiments.

[0072] Exemplarily, the computer program 62 may be divided into one or more units, which are stored in the memory 61 and executed by the processor 60 to complete the present application. The one or more units may be a series of computer program instruction segments capable of completing specific functions, which are used to describe the execution process of the computer program 62 in the high-frequency active differential signal probe 6.

[0073] The high-frequency active differential signal probe can be a variety of signal detection devices. The high-frequency active differential signal probe can include but is not limited to a processor 60 and a memory 61. Those skilled in the art can understand that Figure 4This is only an example of the high-frequency active differential signal probe 6 and does not constitute a limitation of the high-frequency active differential signal probe 6. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components, for example, it may also include input and output devices, network access devices, buses, etc.

[0074] The processor 60 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0075] In some embodiments, the memory 61 may be an internal storage unit of the high-frequency active differential signal probe 6, such as a hard disk or memory of the high-frequency active differential signal probe 6. In other embodiments, the memory 61 may also be an external storage device of the high-frequency active differential signal probe 6, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the high-frequency active differential signal probe 6. Further, the memory 61 may also include both the internal storage unit of the high-frequency active differential signal probe 6 and an external storage device. The memory 61 is used to store an operating system, an application program, a boot loader (BootLoader), data, and other programs, such as the program code of the computer program. The memory 61 may also be used to temporarily store data that has been output or is to be output.

[0076] An embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in any of the above method embodiments are implemented.

[0077] An embodiment of the present application provides a computer program product. When the computer program product runs on a high-frequency active differential signal probe, the high-frequency active differential signal probe implements the steps in any of the above method embodiments.

[0078] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, which can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by the processor, the steps of the above-mentioned method embodiments can be implemented. Among them, the computer program includes computer program code, which can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium can at least include: any entity or device that can carry the computer program code to the high-frequency active differential signal probe, recording medium, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, RandomAccess Memory), electric carrier signal, telecommunication signal and software distribution medium. For example, a USB flash drive, a mobile hard disk, a magnetic disk or an optical disk. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electric carrier signals and telecommunication signals.

[0079] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0080] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0081] In the embodiments provided in the present application, it should be understood that the disclosed high-frequency active differential signal probe control system / high-frequency active differential signal probe and method can be implemented in other ways. For example, the high-frequency active differential signal probe control system / high-frequency active differential signal probe embodiment described above is merely schematic. For example, the division of the units is merely a logical function division. There may be other division methods in actual implementation, such as multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection through some interfaces, devices or units, which may be electrical, mechanical or other forms.

[0082] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0083] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A high-frequency active differential signal probe, characterized in that: It comprises a shielding shell, and an input interface module, a signal conditioning module, a differential amplifier module, a low ripple power supply module and an output interface module which are arranged inside the shielding shell; The input interface module is used to receive a differential signal; The signal conditioning module is electrically connected to the input interface module, and is used to receive the differential signal transmitted by the input interface module and pre-process the differential signal; The differential amplification module is electrically connected to the signal conditioning module, and is used to receive the pre-processed differential signal transmitted by the signal conditioning module to realize differential signal amplification; The low ripple power supply module is used to provide positive and negative power supplies for the differential amplifier module; The output interface module is used to output the amplified differential signal as a single-ended signal.

2. The high-frequency active differential signal probe according to claim 1, characterized in that: The input interface module includes two symmetrically configured BNC input ports for receiving differential signal inputs.

3. The high-frequency active differential signal probe according to claim 1, characterized in that: The signal conditioning module includes an adjustable attenuator and an impedance matching circuit; the adjustable attenuator is electrically connected to the input interface module and the impedance matching circuit, is composed of a PIN diode array, supports three-level attenuation adjustment of 0 / 6 / 12dB, and is used to attenuate and adjust the differential signal transmitted by the input interface module; the impedance matching circuit is electrically connected to the adjustable attenuator and the differential amplification module, and adopts a 50Ω coaxial transmission line equivalent impedance model to impedance match the differential signal processed by the adjustable attenuator.

4. The high-frequency active differential signal probe according to claim 1, characterized in that: The differential amplification module includes an LT6400 high-performance operational amplifier; the LT6400 high-performance operational amplifier is electrically connected to the signal conditioning module and the low-ripple power supply module, and is used to receive the pre-processed differential signal transmitted by the signal conditioning module to realize differential signal amplification.

5. The high-frequency active differential signal probe according to claim 1, characterized in that: The low ripple power supply module includes positive and negative power supplies and an LT3045 ultra-low noise linear regulator; the positive and negative power supplies are electrically connected to the LT3045 ultra-low noise linear regulator; the LT3045 ultra-low noise linear regulator is electrically connected to the positive and negative power supplies and the differential amplifier module; the ripple coefficient of the low ripple power supply module is not greater than 1mV, and is used to provide positive and negative power supplies for the differential amplifier module.

6. The high-frequency active differential signal probe according to claim 1, characterized in that: The output interface module includes a single-ended buffer amplifier and a BNC connector; the single-ended buffer amplifier is electrically connected to the differential amplifier module and the BNC connector; the BNC connector is electrically connected to the single-ended buffer amplifier, and is used to output the amplified differential signal as a single-ended signal to achieve a measurement bandwidth of not less than 1.5 GHz.

7. The high-frequency active differential signal probe according to claim 1, characterized in that: The shielding shell comprises a conductive isolation layer and a conductive rubber ring; the conductive isolation layer of the shielding shell is composed of a copper-silver-plated film; and multiple layers of the conductive rubber ring are arranged at the junction of the input interface module and the shielding shell.

8. A high-frequency active differential signal probe control method, characterized in that: Applied to the high-frequency active differential signal probe according to any one of claims 1 to 7, the method comprising: Receiving a differential signal, and performing real-time detection on the amplitude of the differential signal to obtain a real-time detection result of the amplitude of the differential signal; Based on the real-time detection result of the amplitude of the differential signal, triggering 0 / 6 / 12dB attenuation gear switching, attenuating the differential signal, and obtaining a time domain reflection waveform of the attenuated differential signal; According to the time domain reflection waveform of the attenuated differential signal, a target impedance matching parameter is obtained by a fast impedance estimation algorithm; Adjusting the matching network parameters according to the target impedance matching parameters to obtain the signal amplitude fluctuation amount after the matching network parameters are adjusted; Based on the signal amplitude fluctuation amount after the matching network parameters are adjusted, a proportional-integral (PI) control algorithm is used to adjust the gain of the operational amplifier to obtain a time domain characteristic of the power supply ripple after the gain is adjusted; Based on the time domain characteristics of the power supply ripple after gain adjustment, a sliding average filtering algorithm is executed to generate a ripple suppression parameter.

9. The high-frequency active differential signal probe control method according to claim 8, characterized in that: The target impedance matching parameter is estimated by a fast impedance estimation algorithm according to the time domain reflection waveform of the attenuated differential signal, including: Extracting the rising edge slope as the impedance deviation according to the time domain reflection waveform of the attenuated differential signal; Converting the impedance deviation into a matching network capacitance adjustment value through a pre-stored impedance-capacitance mapping table; When it is detected that the standing wave ratio exceeds the first preset threshold, the capacitance adjustment value is iteratively adjusted until the standing wave ratio is lower than the second preset threshold, thereby obtaining the target impedance matching parameter.

10. The high-frequency active differential signal probe control method according to claim 8, characterized in that: The method of executing a sliding average filtering algorithm to generate a ripple suppression parameter based on the power ripple time domain characteristics after gain adjustment includes: Based on the time domain characteristics of the power ripple after gain adjustment, calculate the peak value of the ripple peak within the most recent 10ms window; When the peak value of the ripple peak exceeds 1 mV, the pre-stored filter coefficient combination is activated to perform ripple suppression.

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