Method and device for processing particulate matters in perovskite photovoltaic module and photovoltaic module

Abstract

The invention discloses a method and device for treating particulate matters in a perovskite photovoltaic module and the photovoltaic module, and the method comprises the steps: carrying out the first purging of a perovskite photovoltaic module semi-finished product with an electrode layer at the top, and obtaining a to-be-detected perovskite photovoltaic module semi-finished product; determining spatial geometric information of target particles in the semi-finished product of the perovskite photovoltaic module to be detected; determining the position of the target particulate matter based on the spatial geometric information of the target particulate matter, and grinding the target particulate matter to obtain a ground perovskite photovoltaic module semi-finished product; and carrying out second purging treatment on the ground perovskite photovoltaic module semi-finished product to obtain the repaired perovskite photovoltaic module semi-finished product. According to the invention, the probability that particulate matters influencing the packaging effect exist in the semi-finished product of the perovskite photovoltaic module to be detected can be reduced, so that the packaging effect of the perovskite photovoltaic module can be improved, and the stability and the service life of the perovskite photovoltaic module can be improved.

Description

Technical Field

[0001] The present invention relates to the field of perovskite solar cells, and in particular to a method and device for processing particulate matter in a perovskite photovoltaic module, and a photovoltaic module. Background Art

[0002] Driven by the global energy structure transformation and sustainable development needs, renewable energy technology is developing rapidly, and solar energy technology has attracted particular attention. Perovskite solar cells, as the third-generation solar cell technology, have become the focus of research due to their high photoelectric conversion efficiency, low cost and simple manufacturing process.

[0003] The preparation process of perovskite photovoltaic modules mainly includes: depositing the hole transport layer, perovskite layer, electron transport layer and electrode layer on the TCO glass substrate in sequence, followed by thin film encapsulation, lamination of butyl adhesive, POE adhesive layer and cover glass encapsulation, and finally laminating tempered glass on the back of the TCO glass to complete the preparation of perovskite photovoltaic modules.

[0004] However, there is a key problem in this process: during the laser edge cleaning process and the process of transporting the semi-finished perovskite photovoltaic module, that is, after the electrode layer is prepared and before the thin film encapsulation layer is prepared, a large amount of dust and particles are easily attached to the surface of the semi-finished perovskite photovoltaic module. If these particles are encapsulated inside the perovskite photovoltaic module, especially those that are too large, it is very easy to cause the thin film encapsulation layer to fail to completely encapsulate the semi-finished perovskite photovoltaic module, resulting in encapsulation failure, and then the stability of the perovskite photovoltaic module is poor. Summary of the invention

[0005] The purpose of the present invention is to provide a method, device and photovoltaic module for processing particulate matter in a perovskite photovoltaic module, so as to overcome the deficiency of the prior art that particulate matter attached to the surface of the electrode layer of the perovskite photovoltaic module cannot be effectively removed, thereby affecting the packaging effect.

[0006] In order to achieve the above object, the present invention adopts the following technical solution: In a first aspect, the present invention provides a method for treating particulate matter in a perovskite photovoltaic module, characterized in that it comprises the following steps: S1, the semi-finished product of the perovskite photovoltaic module with the electrode layer on the top is subjected to the first purge treatment to obtain the semi-finished product of the perovskite photovoltaic module to be tested; S2, obtaining spatial geometric information of the target particles in the semi-finished perovskite photovoltaic module to be detected; the spatial geometric information includes: the plane coordinates, diameter and height value of the target particles; S3, grinding the target particles based on the spatial geometric information of the target particles to obtain a semi-finished perovskite photovoltaic module after grinding; S4, performing a second purge treatment on the ground semi-finished perovskite photovoltaic module to obtain a repaired semi-finished perovskite photovoltaic module.

[0007] Furthermore, obtaining the spatial geometric information of the target particles in the semi-finished perovskite photovoltaic module to be detected in S2 includes: Scanning the entire surface of the semi-finished perovskite photovoltaic module to be inspected to obtain image information of the semi-finished perovskite photovoltaic module to be inspected; Comparing the image information of the semi-finished perovskite photovoltaic module to be inspected with the image information of a normal semi-finished perovskite photovoltaic module to determine the plane coordinates of the target particles in the semi-finished perovskite photovoltaic module to be inspected; Based on the plane coordinates of the target particle, the diameter and height value of the target particle are determined.

[0008] Furthermore, the diameter of the target particles is greater than 100 μm, and / or the height of the target particles is greater than 5 μm.

[0009] Furthermore, in S3, based on the spatial geometric information of the target particles, the target particles are ground to obtain a semi-finished perovskite photovoltaic module after the grinding process, including: S31, setting a remaining height value of the target particle, wherein the remaining height value of the target particle is less than or equal to 5 μm; S32, determining a grinding processing area of ​​the target particles based on the spatial geometric information of the target particles; S33, performing grinding processing on the grinding processing area so that the actual height value of the target particle is less than or equal to the remaining height value of the target particle; S34, repeat S32 and S33 until the actual height values ​​of the target particles are less than or equal to the remaining height values ​​of the target particles, so as to obtain a semi-finished perovskite photovoltaic module after grinding.

[0010] Furthermore, the first purging treatment refers to purging the particles on the surface of the electrode layer of the semi-finished perovskite photovoltaic module with nitrogen; and the second purging treatment refers to purging the dust generated during the grinding process with nitrogen.

[0011] Furthermore, after S4, the method further includes: Testing and comparing the repaired semi-finished perovskite photovoltaic module; If the semi-finished perovskite photovoltaic module after the repair process is judged to be qualified, the semi-finished perovskite photovoltaic module after the repair process is transported to the next process; If the repaired semi-finished perovskite photovoltaic module is judged to be unqualified, S1-S4 are repeated.

[0012] In a second aspect, the present invention provides a device for treating particulate matter in a perovskite photovoltaic module, comprising: A first purge module is used to perform a first purge treatment on the semi-finished perovskite photovoltaic module with an electrode layer on the top to obtain a semi-finished perovskite photovoltaic module to be tested; An acquisition module is used to acquire spatial geometric information of target particles in the semi-finished perovskite photovoltaic module to be detected; the spatial geometric information includes: plane coordinates, diameter size and height value of the target particles; A grinding module, used for grinding the target particles based on the spatial geometric information of the target particles to obtain a semi-finished perovskite photovoltaic module after grinding; The second purge module is used to perform a second purge on the ground semi-finished perovskite photovoltaic module to obtain a repaired semi-finished perovskite photovoltaic module.

[0013] Furthermore, the acquisition module acquires the spatial geometric information of the target particles in the semi-finished perovskite photovoltaic module to be detected, including: A scanning unit, used for scanning the entire surface of the semi-finished perovskite photovoltaic module to be inspected to obtain image information of the semi-finished perovskite photovoltaic module to be inspected; A first determination unit is used to compare the image information of the semi-finished perovskite photovoltaic module to be detected with the image information of the semi-finished normal perovskite photovoltaic module to determine the plane coordinates of the target particles in the semi-finished perovskite photovoltaic module to be detected; The second determining unit is used to determine the diameter and height value of the target particle according to the plane coordinates of the target particle.

[0014] Furthermore, the grinding module grinds the target particles based on the spatial geometric information of the target particles to obtain a semi-finished perovskite photovoltaic module after grinding, including: A setting unit, used to set a remaining height value of the target particle, wherein the remaining height value of the target particle is less than or equal to 5 μm; A third determining unit, configured to determine a grinding processing area of ​​the target particles according to the spatial geometric information of the target particles; A grinding unit, used for performing grinding processing on the grinding processing area so that the actual height value of the target particles is less than or equal to the residual height value of the target particles; The grinding is stopped until the actual height values ​​of the target particles are less than or equal to the remaining height values ​​of the target particles, so as to obtain a semi-finished perovskite photovoltaic module after grinding.

[0015] In a third aspect, the present invention provides a perovskite photovoltaic module obtained by processing using the above method.

[0016] Compared with the prior art, the present invention has the following beneficial technical effects: A method for processing particulate matter in a perovskite photovoltaic module, first, the method removes small-sized, easy-to-blow-off, and low-adhesion particulate matter on the surface of a semi-finished perovskite photovoltaic module after the electrode layer is prepared on the top through a first purge treatment, and obtains a semi-finished perovskite photovoltaic module to be detected, and then determines the spatial geometric information of the target particulate matter in the semi-finished perovskite photovoltaic module to be detected to ensure the accuracy of the subsequent grinding treatment, so that the target particulate matter can be accurately located and processed; based on the obtained spatial geometric information of the target particulate matter, the position of the target particulate matter is determined and the target particulate matter is ground to obtain a semi-finished perovskite photovoltaic module after the grinding treatment, and finally, the semi-finished perovskite photovoltaic module after the grinding treatment is subjected to a second purge treatment to ensure the cleanliness of the surface of the semi-finished perovskite photovoltaic module after the grinding treatment. The method detects and grinds the target particulate matter present in the perovskite photovoltaic module to be detected to remove the target particulate matter attached to the surface of the electrode layer in the perovskite photovoltaic module. Thereby, it can be ensured that in the subsequent process of depositing a thin film encapsulation layer, the problem of encapsulation failure is not likely to occur, thereby improving the stability of the perovskite photovoltaic module and the life of the perovskite photovoltaic module. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 Schematic diagram of a method for treating particulate matter in a perovskite photovoltaic module according to an embodiment of the present invention; Figure 2 This is a schematic diagram of the structure of a semi-finished perovskite photovoltaic module to be tested in the method for processing particulate matter in a perovskite photovoltaic module in an embodiment of the present invention; Figure 3 A schematic diagram of using an optical detection device for detection in an embodiment of the present invention; Figure 4 Schematic diagram of target particles existing in a perovskite photovoltaic module to be detected in an embodiment of the present invention; Figure 5 A schematic diagram of grinding using a grinding and repairing device in an embodiment of the present invention; Figure 6 is a schematic diagram of a perovskite photovoltaic module that has not been ground, provided in an embodiment of the present invention; Figure 7It is a schematic diagram of a perovskite photovoltaic module after grinding provided by an embodiment of the present invention.

[0018] In the figure, 1. target particles; 2. TCO glass; 3. first carrier transport layer; 4. perovskite layer; 5. second carrier transport layer; 6. electrode layer; 7. optical detection scanning camera; 8. grinding tape. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0020] In the description of the present invention, it is to be understood that the terms “center”, “longitudinal”, “lateral”, “length”, “width”, “thickness”, “up”, “down”, “front”, “back”, “left”, “right”, “vertical”, “horizontal”, “top”, “bottom”, “inside”, “outside”, “clockwise”, “counterclockwise”, etc., indicating orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0021] In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "provided with", "set / connected", "connected", etc. should be understood in a broad sense. For example, "connected" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0022] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "several" is two or more, unless otherwise clearly and specifically defined.

[0023] The present application provides a method for processing particulate matter in a perovskite photovoltaic module, and a device for processing particulate matter in a perovskite photovoltaic module is provided. The device for processing particulate matter in a perovskite photovoltaic module may specifically include: The first purge module is used to perform a first purge treatment on the semi-finished perovskite photovoltaic module with an electrode layer on the top to obtain the semi-finished perovskite photovoltaic module to be tested.

[0024] In the present application, the first purge module may include a purge device, for example, the purge device may be used to purge the entire surface of the semi-finished perovskite photovoltaic module with the electrode layer on the top. The purge device may include: a nitrogen air gun, a USC dry ultrasonic cleaning machine.

[0025] The acquisition module is used to acquire the spatial geometric information of the target particles in the semi-finished perovskite photovoltaic module to be detected. Here, the spatial geometric information may include: the plane coordinates, diameter and height value of the target particles.

[0026] In the present application, the acquisition module may include an optical detection device and a computer device. For example, an optical detection device may be used to acquire image information of a semi-finished perovskite photovoltaic module to be detected. The optical detection device may include an optical detection scanning camera.

[0027] Afterwards, the computer device can obtain image information of the semi-finished perovskite photovoltaic module to be inspected, and compare the image information of the semi-finished perovskite photovoltaic module to be inspected with the image information of the semi-finished perovskite photovoltaic module of a normal state.

[0028] Here, the computer device can be a computer, a server, a server cluster consisting of several servers, or a cloud computing service center.

[0029] In this application, the acquisition module acquires the spatial geometric information of the target particles in the semi-finished perovskite photovoltaic module to be detected, including: A scanning unit, used for scanning the entire surface of the semi-finished perovskite photovoltaic module to be inspected, to obtain image information of the semi-finished perovskite photovoltaic module to be inspected; A first determination unit is used to compare the image information of the semi-finished perovskite photovoltaic module to be detected with the image information of the semi-finished normal perovskite photovoltaic module to determine the plane coordinates of the target particles in the semi-finished perovskite photovoltaic module to be detected; The second determining unit is used to determine the diameter and height value of the target particle according to the plane coordinates of the target particle.

[0030] The grinding module is used to grind the target particles based on the spatial geometric information of the target particles to obtain a semi-finished perovskite photovoltaic module after grinding.

[0031] In the embodiment of the present application, the grinding module may include a grinding and repairing device and a computer device. For example, the grinding and repairing device may be used to grind the target particles in the semi-finished perovskite photovoltaic module to be inspected. The grinding and repairing device may include a grinding tape.

[0032] In the present application, the grinding module grinds the target particles based on the spatial geometric information of the target particles to obtain a semi-finished perovskite photovoltaic module after grinding, including: A setting unit, used to set a residual height value of the target particle, the residual height value of the target particle is less than or equal to 5 μm; A third determining unit is used to determine a grinding processing area of ​​the target particles according to the spatial geometric information of the target particles; A grinding unit, used for grinding the grinding processing area so that the actual height value of the target particles is less than or equal to the residual height value of the target particles; The grinding is stopped until the actual height values ​​of the target particles are less than or equal to the remaining height values ​​of the target particles, so as to obtain a semi-finished perovskite photovoltaic module after grinding.

[0033] The second purge module is used to perform a second purge on the semi-finished perovskite photovoltaic module after the grinding process to obtain the semi-finished perovskite photovoltaic module after the repair process; In the present application, the second purge module may include a purge device. For example, the purge device may be used to perform a second purge treatment on the semi-finished perovskite photovoltaic module after grinding. The purge device may include: a nitrogen air gun, a USC dry ultrasonic cleaning machine.

[0034] In the present application, the computer device can establish a communication connection with the optical detection device and the grinding and repairing device through a wired network or a wireless network.

[0035] Please refer to Figure 1 The method for treating particulate matter in a perovskite photovoltaic module comprises: Step S1, performing a first purge treatment on the semi-finished perovskite photovoltaic module with the electrode layer on the top to obtain the semi-finished perovskite photovoltaic module to be tested.

[0036] In the embodiment of the present application, the semi-finished perovskite photovoltaic module with an electrode layer on the top refers to: after preparing a first carrier transport layer, a perovskite layer, a second carrier transport layer, and an electrode layer in sequence on the TCO glass, a semi-finished module with an electrode layer on the top is obtained.

[0037] For example, a semi-finished perovskite photovoltaic module with an electrode layer on top is Figure 2As shown, the bottom is TCO glass 2, and the first carrier transport layer 3, the perovskite layer 4, the second carrier transport layer 5 and the electrode layer 6 are sequentially deposited on it. It should be noted that the first carrier transport layer 3 can be one of the hole transport layer and the electron transport layer, and the second carrier transport layer 5 can be the other of the hole transport layer and the electron transport layer, which is not limited in the embodiment of the present application.

[0038] In the present application, the staff can use a purge device to perform a first purge treatment on the semi-finished perovskite photovoltaic module with an electrode layer on the top to obtain the semi-finished perovskite photovoltaic module to be tested. It should be noted that the first purge treatment can use nitrogen to purge the particles on the surface of the electrode layer of the semi-finished perovskite photovoltaic module. For example, the staff can use a nitrogen air gun to spray high-concentration nitrogen to purge the entire surface of the semi-finished perovskite photovoltaic module with an electrode layer on the top. In this case, it can be ensured that the purge equipment first removes the particles with smaller size and lower adhesion on the surface of the semi-finished perovskite photovoltaic module with an electrode layer on the top.

[0039] Step S2: obtaining spatial geometric information of target particles in the semi-finished perovskite photovoltaic module to be detected. Here, the spatial geometric information of the target particles may include: the plane coordinates of the target particles, the diameter of the target particles, and the height value of the target particles.

[0040] In an embodiment of the present application, after obtaining the semi-finished perovskite photovoltaic module to be inspected, the computer device can obtain the spatial geometric information of the target particles in the semi-finished perovskite photovoltaic module to be inspected.

[0041] First, after obtaining the semi-finished product of the perovskite photovoltaic module to be inspected, the optical inspection scanning camera in the optical inspection equipment can be used to scan the entire surface of the semi-finished product of the perovskite photovoltaic module to be inspected to obtain image information of the semi-finished product of the perovskite photovoltaic module to be inspected. For example, after the staff places the semi-finished product of the perovskite photovoltaic module to be inspected on the inspection table of the optical inspection equipment, the control system in the optical inspection equipment can control the optical inspection scanning camera to move along the first direction X, and / or, can control the optical inspection scanning camera to move along the second direction Y. Among them, the first direction X and the second direction Y can intersect. In one possible implementation method, the first direction X and the second direction Y can be perpendicular.

[0042] In this way, it can be ensured that the optical detection scanning camera in the optical detection equipment can perform full-surface scanning of the semi-finished perovskite photovoltaic module to be detected in all directions to obtain image information of the semi-finished perovskite photovoltaic module to be detected.

[0043] Afterwards, the optical inspection device can synchronously transmit the image information of the semi-finished perovskite photovoltaic module to be inspected to the computer device. The computer device can compare the image information of the semi-finished perovskite photovoltaic module to be inspected with the image information of the semi-finished normal perovskite photovoltaic module to determine the plane coordinates of the target particles in the semi-finished perovskite photovoltaic module to be inspected.

[0044] Subsequently, the diameter and height of the target particles can be further determined based on the plane coordinates of the target particles in the semi-finished perovskite photovoltaic module to be detected.

[0045] Step S3: grinding the target particles based on the spatial geometric information of the target particles to obtain a ground perovskite photovoltaic module semi-finished product. Here, the diameter of the target particles can be greater than 100 μm, and / or the height of the target particles can be greater than 5 μm.

[0046] It should be noted that in the pre-setting of the computer equipment, the diameter of the target particles is greater than 100μm, that is, if there is a region on the membrane surface of the perovskite photovoltaic module to be detected with particles with a diameter greater than 100μm, then this region will be identified as having the target particles. And / or, the height value of the target particles is greater than 5μm, that is, if there is a region on the membrane surface of the perovskite photovoltaic module to be detected with particles with a height greater than 5μm, then this region will be identified as having the target particles.

[0047] In the embodiment of the present application, the specific operation of obtaining the semi-finished perovskite photovoltaic module after grinding is as follows: S31, setting the remaining height value of the target particles. Here, the remaining height value of the target particles is less than or equal to 5 μm; It should be noted that the remaining height value of the target particle refers to the theoretical height distance between the top of the target particle and the reference plane of the perovskite photovoltaic module to be tested in the direction perpendicular to the thickness of the semi-finished perovskite photovoltaic module.

[0048] Here, when using the grinding and repair equipment to grind the target particles, it is necessary to first determine the theoretical height distance between the top of the target particles and the reference plane of the perovskite photovoltaic module to be tested. Here, the upper surface of the electrode layer in the perovskite photovoltaic module to be tested can be used as the reference plane, that is, it is necessary to determine that the height distance between the top of the target particles and the upper surface of the electrode layer in the perovskite photovoltaic module to be tested has a value range of less than or equal to 5μm.

[0049] The semi-finished perovskite photovoltaic module needs to be thin-film encapsulated later to prevent water and oxygen in the environment from corroding the perovskite photovoltaic module. In this case, it is usually necessary to ensure that the thin-film encapsulation layer during the subsequent thin-film encapsulation can completely cover the semi-finished perovskite photovoltaic module.

[0050] The thin film encapsulation layer may include: a first inorganic encapsulation layer, an organic encapsulation layer and a second inorganic encapsulation layer stacked in layers, wherein the thickness of the first inorganic encapsulation layer and the second inorganic encapsulation layer are both about 1 μm, and the thickness of the organic encapsulation layer is in the range of 15 μm-50 μm.

[0051] In this case, if it is necessary to ensure that the thin film encapsulation layer can completely cover the semi-finished perovskite photovoltaic module, it is necessary to set the remaining height value of the target particles to be less than or equal to 5μm, so as to ensure that the height of the target particles can be lower than the thickness of the thin film encapsulation layer, thereby ensuring that the thin film encapsulation layer can completely cover the semi-finished perovskite photovoltaic module, and it is not easy to have the problem of encapsulation failure, thereby improving the stability of the perovskite photovoltaic module and increasing the life of the perovskite photovoltaic module.

[0052] For example, when the thickness of the organic encapsulation layer in the thin film encapsulation layer is set to 15 μm, the remaining height value of the target particles needs to be set to be less than or equal to 5 μm. In this case, it can be ensured that after the target particles are ground using the grinding and repair equipment, the actual height of the target particles can be less than or equal to 5 μm, so that the thin film encapsulation layer can completely cover the target particles, thereby ensuring that the perovskite layer in the perovskite photovoltaic module is not easily corroded by water and oxygen, thereby improving the stability of the semi-finished perovskite photovoltaic module.

[0053] S32, determining a grinding processing area of ​​the target particles based on the spatial geometric information of the target particles; In the present application, after the computer device obtains the spatial geometric information of the target particles in the semi-finished perovskite photovoltaic module to be detected, that is, after the computer device obtains the plane coordinates of the target particles and the diameter size of the target particles in the semi-finished perovskite photovoltaic module to be detected, the computer device can determine the grinding processing area of ​​the target particles based on the plane coordinates of the target particles, the diameter size of the target particles and the height value of the target particles.

[0054] S33, performing grinding processing on the grinding processing area so that the actual height value of the target particles is less than or equal to the residual height value of the target particles; It should be noted that the actual height value of the target particles refers to the actual height value of the target particles along the direction perpendicular to the thickness of the semi-finished perovskite photovoltaic module after the grinding treatment area is ground.

[0055] In the present application, after the computer equipment determines the grinding processing area of ​​the target particles based on the plane coordinates of the target particles and the diameter size of the target particles, the computer equipment synchronizes these data to the grinding and repair equipment, and transports the semi-finished perovskite photovoltaic module to be inspected to the grinding and repair equipment platform. The grinding and repair equipment can move the guide rail to move the grinding tape 8 in the grinding and repair equipment to above the grinding processing area where the target particles are located according to the synchronized center point position coordinates of the target particles and the diameter size of the target particles.

[0056] Among them, the control system in the grinding and repairing equipment can control the grinding tape 8 in the grinding and repairing equipment to move along the first direction X, and / or can control the grinding tape 8 in the grinding and repairing equipment to move along the second direction Y, so that the grinding tape 8 in the grinding and repairing equipment can be accurately moved to the grinding processing area of ​​the target particles.

[0057] Here, after the grinding and repairing equipment is accurately positioned at the grinding processing area of ​​the target particles, the control system in the grinding and repairing equipment is used to control the grinding tape 8 to grind the top surface of the target particles according to the preset remaining height value of the target particles.

[0058] S34, repeat S32 and S33 until the actual height values ​​of the target particles are less than or equal to the remaining height values ​​of the target particles, so as to obtain a semi-finished perovskite photovoltaic module after grinding.

[0059] In the present application, the target particles in the semi-finished perovskite photovoltaic module to be tested can be ground in sequence until the actual height values ​​of all the target particles in the semi-finished perovskite photovoltaic module to be tested are less than or equal to the remaining height values ​​of the target particles, thereby obtaining the semi-finished perovskite photovoltaic module after grinding.

[0060] Step S4, performing a second purge treatment on the ground semi-finished perovskite photovoltaic module to obtain a repaired semi-finished perovskite photovoltaic module.

[0061] In the present application, after grinding the target particles to obtain the ground perovskite photovoltaic module semi-finished product, the staff can use a purge device to perform a second purge on the ground perovskite photovoltaic module semi-finished product to obtain a repaired perovskite photovoltaic module semi-finished product.

[0062] It should be noted that the second purge process can use nitrogen to blow away the dust generated during the grinding process of the semi-finished perovskite photovoltaic module after the grinding process. For example, the staff can use a nitrogen air gun to spray high-concentration nitrogen to purge the surface of the semi-finished perovskite photovoltaic module after the grinding process to prevent the dust from causing pollution in the subsequent process.

[0063] In the embodiment of the present application, after step S4, the method further includes: Test and compare the semi-finished products of perovskite photovoltaic modules after repair; If the semi-finished perovskite photovoltaic module after the repair process is judged to be qualified, the semi-finished perovskite photovoltaic module after the repair process is transported to the next process; If the repaired semi-finished perovskite photovoltaic module is judged to be unqualified, steps S1 to S4 are repeated.

[0064] The method detects and grinds the target particles present in the perovskite photovoltaic module to be detected, so as to remove the target particles attached to the surface of the electrode layer in the perovskite photovoltaic module. This ensures that in the subsequent deposition of the thin film encapsulation layer, the problem of encapsulation failure is not likely to occur, thereby improving the stability of the perovskite photovoltaic module and the life of the perovskite photovoltaic module.

[0065] Here, if Figure 6 As shown, for the unpolished perovskite photovoltaic module: under the test conditions of temperature of 85°C and humidity of 85%, the perovskite layer in the perovskite photovoltaic module is extremely susceptible to corrosion by water and oxygen in the environment. The color of the perovskite layer changes from black to yellow during the test, and its stability is poor.

[0066] In the present application, as a specific embodiment, first, the staff can use a nitrogen air gun to perform a first purge treatment on the semi-finished perovskite photovoltaic module with an electrode layer on the top to obtain the semi-finished perovskite photovoltaic module to be tested.

[0067] Afterwards, the staff can move the semi-finished perovskite photovoltaic component to be inspected to the inspection table of the optical inspection equipment, and use the optical inspection scanning camera in the optical inspection equipment to scan the entire surface of the semi-finished perovskite photovoltaic component to be inspected along the first direction X and / or along the second direction Y to obtain image information of the semi-finished perovskite photovoltaic component to be inspected.

[0068] Subsequently, the computer equipment can compare the image information of the semi-finished perovskite photovoltaic module to be inspected with the image information of the semi-finished normal perovskite photovoltaic module to determine that the plane coordinates of the target particles in the semi-finished perovskite photovoltaic module to be inspected are (10,53), the diameter of the target particles at the corresponding coordinate position is: 172μm, and the height value of the target particles at the corresponding coordinate position is 7.33μm; the plane coordinates of the target particles are (55,102), the diameter of the target particles at the corresponding coordinate position is: 113μm, and the height value of the target particles at the corresponding coordinate position is 11.25μm; the plane coordinates of the target particles are (17,33), the diameter of the target particles at the corresponding plane coordinate position is: 137μm, and the height value of the target particles at the corresponding coordinate position is 8.95μm.

[0069] Then, the computer device can determine the grinding processing area of ​​the target particles according to the plane coordinates of the target particles and the diameter of the target particles. That is, the plane coordinates of the target particles can be defined as (10, 53), the diameter of the target particles at the corresponding plane coordinate position is 172 μm, and the height value of the target particles at the corresponding coordinate position is 7.33 μm. The area is the first grinding processing area; the plane coordinates of the target particles can be defined as (55, 102), the diameter of the target particles at the corresponding coordinate position is 113 μm, and the height value of the target particles at the corresponding coordinate position is 11.25 μm. The area is the second grinding processing area; the plane coordinates of the target particles can be defined as (17, 33), the diameter of the target particles at the corresponding plane coordinate position is 137 μm, and the height value of the target particles at the corresponding coordinate position is 8.95 μm.

[0070] The computer device can synchronize the plane coordinates of the target particles and the diameter data of the target particles at the corresponding plane coordinate positions to the grinding and repairing device. It should be noted that since the subsequent process flow requires the thickness of the organic encapsulation layer in the thin film encapsulation layer to be set at 15μm, the remaining height value of the target particles needs to be set to 3μm.

[0071] Here, the grinding and repairing equipment can position the grinding tape in the grinding and repairing equipment above the first grinding treatment area according to the plane coordinates (10, 53) of the target particles and the diameter of the target particles at the corresponding plane coordinate position of 172 μm. After that, the staff can use the grinding tape to grind the first grinding treatment area so that the actual height value of the target particles is less than or equal to 5 μm.

[0072] The grinding and repair equipment can position the grinding tape in the grinding and repair equipment above the second grinding treatment area according to the plane coordinates (55,102) of the target particles and the diameter of the target particles at the corresponding coordinate position of 113μm. After that, the staff can use the grinding tape to grind the second grinding treatment area so that the actual height value of the target particles is less than or equal to 5μm.

[0073] The grinding and repairing equipment can position the grinding tape in the grinding and repairing equipment above the third grinding treatment area according to the plane coordinates (17, 33) of the target particles and the diameter of the target particles at the corresponding plane coordinate position of 137 μm. After that, the staff can use the grinding tape to grind the third grinding treatment area so that the actual height value of the target particles is less than or equal to 5 μm.

[0074] Table 1 shows the grinding results of the perovskite photovoltaic module after grinding using the method of the present application

[0075] Finally, the staff can use a nitrogen air gun to perform a second purge on the ground perovskite photovoltaic module semi-finished products.

[0076] In this application, if Figure 7 As shown, the perovskite photovoltaic module obtained by the method of the present application: under the test conditions of temperature of 85°C and humidity of 85%, the color of the perovskite layer did not change significantly, the packaging effect of the perovskite photovoltaic module was significantly improved, and the perovskite photovoltaic module obtained by the method of the present application had good stability. After 1000 hours of aging test, the photoelectric conversion efficiency of the perovskite photovoltaic module obtained by the method of the present application decreased by less than 1%.

[0077] In some preferred embodiments of the present invention, a perovskite photovoltaic module is also provided, which can be obtained by the above method. It should be noted that the structure and material selection of the perovskite photovoltaic module are subject to the ability of those skilled in the art to implement, and the embodiments of the present application do not limit this.

[0078] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited by the above embodiments. The above embodiments and descriptions are only preferred examples of the present invention and are not intended to limit the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which fall within the scope of the present invention. The scope of protection of the present invention is defined by the attached claims and their equivalents.

Claims

1. A method for treating particulate matter in a perovskite photovoltaic module, characterized in that: The following steps are involved: S1, performing a first purge treatment on the semi-finished perovskite photovoltaic module with an electrode layer on the top to obtain a semi-finished perovskite photovoltaic module to be tested; S2, obtaining spatial geometric information of the target particles in the semi-finished perovskite photovoltaic module to be detected; the spatial geometric information includes: the plane coordinates, diameter and height value of the target particles; S3, grinding the target particles based on the spatial geometric information of the target particles to obtain a semi-finished perovskite photovoltaic module after grinding; S4, performing a second purge treatment on the ground semi-finished perovskite photovoltaic module to obtain a repaired semi-finished perovskite photovoltaic module.

2. The method for treating particulate matter in a perovskite photovoltaic module according to claim 1, characterized in that: The step S2 of obtaining the spatial geometric information of the target particles in the semi-finished perovskite photovoltaic module to be detected includes: Scanning the entire surface of the semi-finished perovskite photovoltaic module to be inspected to obtain image information of the semi-finished perovskite photovoltaic module to be inspected; Comparing the image information of the semi-finished perovskite photovoltaic module to be inspected with the image information of the semi-finished normal perovskite photovoltaic module to determine the plane coordinates of the target particles in the semi-finished perovskite photovoltaic module to be inspected; Based on the plane coordinates of the target particle, the diameter and height value of the target particle are determined.

3. The method for treating particulate matter in a perovskite photovoltaic module according to claim 2, characterized in that: The diameter of the target particles is greater than 100 μm, and / or the height of the target particles is greater than 5 μm.

4. The method for treating particulate matter in a perovskite photovoltaic module according to claim 1, characterized in that: In S3, based on the spatial geometric information of the target particles, the target particles are ground to obtain a ground perovskite photovoltaic module semi-finished product, including: S31, setting a remaining height value of the target particle, wherein the remaining height value of the target particle is less than or equal to 5 μm; S32, determining a grinding processing area of ​​the target particles based on the spatial geometric information of the target particles; S33, performing grinding processing on the grinding processing area so that the actual height value of the target particle is less than or equal to the remaining height value of the target particle; S34, repeat S32 and S33 until the actual height values ​​of the target particles are less than or equal to the remaining height values ​​of the target particles, so as to obtain a semi-finished perovskite photovoltaic module after grinding.

5. The method for treating particulate matter in a perovskite photovoltaic module according to claim 1, characterized in that: The first purging treatment refers to the use of nitrogen to purge the particles on the surface of the electrode layer of the semi-finished perovskite photovoltaic module; the second purging treatment refers to the use of nitrogen to purge the dust generated during the grinding process.

6. The method for treating particulate matter in a perovskite photovoltaic module according to claim 1, characterized in that: After S4, the method further includes: Testing and comparing the repaired semi-finished perovskite photovoltaic module; If the semi-finished perovskite photovoltaic module after the repair process is judged to be qualified, the semi-finished perovskite photovoltaic module after the repair process is transported to the next process; If the repaired semi-finished perovskite photovoltaic module is judged to be unqualified, S1-S4 are repeated.

7. A device for treating particulate matter in a perovskite photovoltaic module, characterized in that: include: A first purge module is used to perform a first purge treatment on the semi-finished perovskite photovoltaic module with an electrode layer on the top to obtain a semi-finished perovskite photovoltaic module to be tested; An acquisition module, used to acquire spatial geometric information of target particles in the semi-finished perovskite photovoltaic module to be detected; The spatial geometric information includes: the plane coordinates, diameter and height of the target particle; A grinding module, used for grinding the target particles based on the spatial geometric information of the target particles to obtain a semi-finished perovskite photovoltaic module after grinding; The second purge module is used to perform a second purge on the ground semi-finished perovskite photovoltaic module to obtain a repaired semi-finished perovskite photovoltaic module.

8. The device for treating particulate matter in a perovskite photovoltaic module according to claim 7, characterized in that: The acquisition module acquires the spatial geometric information of the target particles in the semi-finished perovskite photovoltaic module to be detected, including: A scanning unit, used for scanning the entire surface of the semi-finished perovskite photovoltaic module to be inspected to obtain image information of the semi-finished perovskite photovoltaic module to be inspected; A first determination unit is used to compare the image information of the semi-finished perovskite photovoltaic module to be detected with the image information of the semi-finished perovskite photovoltaic module of a normal state, so as to determine the plane coordinates of the target particles in the semi-finished perovskite photovoltaic module to be detected; The second determining unit is used to determine the diameter and height value of the target particle according to the plane coordinates of the target particle.

9. The device for treating particulate matter in a perovskite photovoltaic module according to claim 7, characterized in that: The grinding module grinds the target particles based on the spatial geometric information of the target particles to obtain a semi-finished perovskite photovoltaic module after grinding, including: A setting unit, used to set a remaining height value of the target particle, wherein the remaining height value of the target particle is less than or equal to 5 μm; A third determining unit, configured to determine a grinding processing area of ​​the target particles according to the spatial geometric information of the target particles; A grinding unit, used for performing grinding processing on the grinding processing area so that the actual height value of the target particles is less than or equal to the residual height value of the target particles; The grinding is stopped until the actual height values ​​of the target particles are less than or equal to the remaining height values ​​of the target particles, so as to obtain a semi-finished perovskite photovoltaic module after grinding.

10. A perovskite photovoltaic module, characterized in that: The method is applied to obtain the product according to any one of claims 1 to 6.

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