High-precision TEM pre-sample blanking device and using method

Abstract

The invention discloses a high-precision TEM pre-sample blanking device and a using method, and belongs to the field of TEM pre-sample blanking. The high-precision TEM pre-sample blanking device comprises a blanking base, a material jacking assembly arranged in the blanking base, a blanking platform arranged at the top end of the blanking base, a transparent pressing piece arranged at the top end of the blanking platform and a multi-mode blanking mechanism arranged above the transparent pressing piece; the multi-mode blanking mechanism comprises a driving part, a transmission part connected with the output end of the bottom of the driving part and a mode switching part connected with the output end of the transmission part. The mode switching part comprises a TEM in-situ stretching blanking assembly and a TEM microscopic characterization blanking assembly. The high-precision TEM pre-sample blanking device and the using method have the advantages of being high in blanking precision and efficiency, capable of preventing the sample from warping, flexible to use, low in manufacturing cost and the like, and can be widely applied to the fields of performance characterization of welding joints of deep sea equipment and the like.

Description

Technical Field

[0001] The invention relates to the technical field of TEM pre-sample punching, and in particular to a high-precision TEM pre-sample punching device and a use method thereof. Background Art

[0002] Welding is an indispensable key process in the assembly of deep-sea equipment. The mechanical properties of welded joints are directly related to the safety and reliability of these equipment in extreme environments. Due to the unique challenges of the deep-sea environment, deep-sea equipment usually uses thicker plates and connects them through multi-layer and multi-pass welding processes. However, this complex welding process is accompanied by the influence of thermal cycles, forming different microstructural characteristics at different welding passes, resulting in significant differences in the mechanical properties of various parts. Specifically, it is manifested in the inconsistency of performance indicators such as strength and toughness, which directly affects the overall load-bearing capacity of the welded joint.

[0003] In order to fully understand the performance characteristics and microstructural evolution of deep-sea equipment welded joints, it is necessary to accurately characterize the microstructure and organizational changes during in-situ mechanical experiments under high resolution of transmission electron microscopy (TEM). This study helps to reveal the microstructural differences and deformation mechanisms of different regions, and provide a scientific basis for optimizing welding processes.

[0004] Specifically, the weld joint consists of three parts: the base material, the heat-affected zone and the weld. During the welding process, the distance between the base material and the center of the weld determines the difference in peak temperature and high temperature retention time, which in turn forms the near heat-affected zone, the middle heat-affected zone and the far heat-affected zone. The width of the entire heat-affected zone is usually between 2mm and 3mm. In the thickness direction, due to the effect of multiple thermal cycles, microstructure regions with different scales are formed inside the weld joint.

[0005] The current blanking dies used to prepare TEM characterization specimens have the following drawbacks: 1. It is mainly suitable for homogeneous materials, and is limited by the accuracy requirements of the sampling position, so its adaptability is poor. 2. Existing devices are difficult to effectively handle TEM characterization pre-specimens with heterogeneous microstructures and TEM in-situ tensile pre-specimens. 3. The thickness of the blanking specimen is usually no more than 60 microns, and obvious warping is prone to occur during the blanking process. After the blanking is completed, the remaining material will move with the upper punch, making it difficult to achieve effective blanking. 4. When taking the material, the surface of the sample is easily scratched or deformed, which seriously affects the surface quality and characterization results of the subsequent TEM sample. Summary of the invention

[0006] The purpose of the present invention is to provide a high-precision TEM pre-sample punching device and a use method to solve the above technical problems.

[0007] To achieve the above-mentioned purpose, the present invention provides a high-precision TEM pre-sample blanking device, comprising a blanking base, a material lifting assembly arranged inside the blanking base, a blanking platform placed on the top of the blanking base, a transparent pressing plate placed on the top of the blanking platform, and a multi-mode blanking mechanism arranged above the transparent pressing plate, the multi-mode blanking mechanism comprising a driving component, a transmission component connected to the bottom output end of the driving component, and a mode switching component connected to the output end of the transmission component, the mode switching component comprising a TEM in-situ stretching blanking component and a TEM microscopic characterization blanking component.

[0008] Preferably, the bottom end of the punching base is fixed to the top end of the base through a fastening screw, and a connecting arm is also fixed to the top end of the base, and the connecting arm is respectively assembled and connected with the driving component and the transmission component; The driving component includes a cantilever block with one end fixed to the top of the connecting arm by a fastening screw, a rotating pressure plate vertically rotating at the other end of the cantilever block, and a lower pressure rod threadedly connected to the outer circumference of the rotating pressure plate. The rotating pressure plate is elliptical.

[0009] Preferably, the transmission component includes a fixed block assembled on the connecting arm and a punch rod vertically slidably connected to the fixed block, a limiting cylinder is fixed on the fixed block and at a position corresponding to the punch rod, the limiting cylinder is vertically slidably connected to the bottom end of the punch rod, the top end of the punch rod is threadedly connected to the bottom end of the lower pressing block, the top end of the lower pressing block is crimped with the bottom end of the rotating pressing plate, and a first compression spring is arranged on the punch rod between the lower pressing block and the limiting cylinder; In a natural state, the bottom end of the punch rod is flush with the bottom end of the fixed block.

[0010] Preferably, the mode switching component comprises a rotating block arranged at the bottom end of the fixed block via a limited rotating assembly, two mounting holes are axially symmetrically provided inside the rotating block, and a TEM in-situ stretching and blanking assembly and a TEM microscopic characterization and blanking assembly are respectively arranged in the two mounting holes; The TEM in-situ stretching and blanking assembly comprises a TEM in-situ stretching sample punch arranged in one of the mounting holes via a second compression spring; The TEM microscopic characterization punching assembly comprises a TEM circular sample punch which is arranged in another mounting hole via a third compression spring.

[0011] Preferably, the limit rotation assembly includes a screw fixed to the top of the rotating block, which passes through a rotating hole opened in the center of the fixed block and is threadedly connected to a limit column arranged at the top of the fixed block. Two baffles are fixed to the bottom end of the limit column corresponding to the positions of the TEM in-situ tensile specimen punch and the TEM circular specimen punch, respectively. The baffles extend into a limit hole opened concentrically with the rotating hole, and two limit baffles are axially symmetrically fixed between the inner wall of the limit hole and the outer wall of the rotating hole. The baffles rotate in a range surrounded by the two limit baffles.

[0012] Preferably, the ejection assembly includes a TEM circular sample ejection rod and a TEM in-situ tensile sample ejection rod. The bottom end of the TEM circular sample ejection rod is vertically slidably arranged inside the blanking base via a fourth compression spring. A convex ring is integrally formed in the middle of the TEM circular sample ejection rod. The TEM circular sample ejection rod at the top of the convex ring is vertically slidably connected to the inside of the TEM in-situ tensile sample ejection rod.

[0013] Preferably, the transparent pressing sheet is a glass plate, the four corners of the glass plate are respectively overlapped with the bosses at the four corners of the top of the punching platform, the bottom of the punching platform is threadedly connected with the top of the punching base, a sample to be processed is clamped between the glass plate and the top of the punching platform, and a processing hole is left on the glass plate corresponding to the processing position of the sample to be processed; In the natural state, the top of the ejector rod of the TEM circular specimen and the top of the ejector rod of the TEM in-situ tensile specimen are flush with the top of the blanking platform, and the ejector rod of the TEM circular specimen and the ejector rod of the EM in-situ tensile specimen are aligned with the processed hole.

[0014] Preferably, a cross positioning line is provided on the top of the punching platform, and the intersection of the cross positioning line coincides with the machining center of the sample to be machined.

[0015] A method for using a high-precision TEM pre-sample punching device comprises the following steps: S1. Remove the transparent pressing sheet and place the sample to be processed on the blanking platform, and make the processing center of the sample to be processed coincide with the intersection of the cross positioning lines on the blanking platform; S2. Reinstall the transparent pressing sheet and align the processing hole of the transparent pressing sheet with the processing position of the sample to be processed; S3, the lower pressing rod is rotated downward, the lower pressing rod drives the rotating pressing plate to rotate and press the lower pressing block downward, the lower pressing block drives the punch rod to move downward, the first compression spring stores energy, and then presses the TEM in-situ tensile sample punch or the TEM circular sample punch downward, the TEM in-situ tensile sample punch or the TEM circular sample punch passes through the processing hole and cooperates with the TEM in-situ tensile sample ejector rod or the TEM circular sample ejector rod to achieve blanking of the sample to be processed, at this time, the second compression spring or the third compression spring and the fourth compression spring store energy; S4. After the punching is completed, the lower pressure rod is released, and the punch is reset under the restoring force of the first compression spring. At the same time, the TEM in-situ tensile specimen punch or the TEM circular specimen punch is reset under the restoring force of the second compression spring or the third compression spring. S5. Remove the transparent pressing plate, and the TEM circular specimen ejector rod and the TEM in-situ tensile specimen ejector rod are reset under the restoring force of the fourth compression spring to complete the ejection.

[0016] Preferably, in step S3, when the processing mode needs to be changed, the rotating block is rotated horizontally to drive the limit column to rotate, and then drive the baffle rod to rotate until the baffle rod rotates from the current baffle position to the next baffle position, completing the mode switching.

[0017] Therefore, the present invention adopts the above-mentioned high-precision TEM pre-sample punching device and use method, which has the following beneficial effects: 1. Improve blanking accuracy and efficiency: Through the precise positioning of the blanking platform and the observable transparent pressure plate, accurate blanking of small specific areas of the welded joint sample can be achieved, significantly improving the accuracy of the blanking position; At the same time, the punching process is optimized, human operation errors are reduced, and punching efficiency is improved.

[0018] 2. Prevent warping of thin specimens: The designed transparent pressing sheet can effectively prevent warping of thin specimens with a thickness of ≤60 µm during the blanking process, ensuring the flatness and quality of the specimens; 3. Improve the applicability of the device: integrate punches of different shapes and flexibly switch modes, such as switching between TEM characterization pre-specimens and TEM in-situ tensile pre-specimens; 4. Reduce manufacturing costs: Modular design reduces the time and cost of mold replacement and debugging, and significantly reduces the total cost of mold design, manufacturing, debugging and maintenance.

[0019] The technical solution of the present invention is further described in detail below through the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 A three-dimensional diagram of a high-precision TEM pre-sample punching device according to the present invention; Figure 2 A vertical cross-sectional view of a high-precision TEM pre-sample blanking device according to the present invention; Figure 3 This is a schematic diagram of the structure of a fixed block of a high-precision TEM pre-sample punching device according to the present invention; Figure 4 The present invention is a schematic diagram of the structure of a material ejection assembly of a high-precision TEM pre-sample blanking device.

[0021] Reference numerals 1. Base; 2. Punching base; 3. Transparent pressing sheet; 4. Limiting cylinder; 5. First compression spring; 6. Punch rod; 7. Lower pressure block; 8. Lower pressure rod; 9. Rotating pressure plate; 10. Cantilever block; 11. Limiting column; 12. Connecting arm; 13. Fixed block; 14. Rotating block; 15. Punching platform; 16. TEM in-situ tensile specimen punch; 17. TEM round specimen punch; 18. TEM round specimen ejector rod; 19. TEM in-situ tensile specimen ejector rod; 20. Specimen to be processed; 21. Processing hole; 22. Stop rod; 23. Screw; 24. Second compression spring; 25. Third compression spring; 26. Limiting hole; 27. Limiting baffle; 28. Rotating hole; 29. ​​Convex ring; 30. Fourth compression spring; 31. Positioning cylinder. DETAILED DESCRIPTION

[0022] In order to make the purpose, technical scheme and advantages disclosed in the embodiments of the present invention clearer, the embodiments of the present invention are further described in detail in combination with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the embodiments of the present invention and are not used to limit the embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application. Examples of the embodiments are shown in the accompanying drawings, where the same or similar reference numerals throughout represent the same or similar elements or elements with the same or similar functions.

[0023] It should be noted that the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or server that includes a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units that are not explicitly listed or inherent to these processes, methods, products or devices.

[0024] The embodiments of the present invention are described in detail below in conjunction with the accompanying drawings.

[0025] like Figure 1-Figure 4 As shown, a high-precision TEM pre-sample blanking device includes a blanking base 2, a material lifting assembly arranged inside the blanking base 2, a blanking platform 15 placed on the top of the blanking base 2, a transparent pressing plate 3 placed on the top of the blanking platform 15, and a multi-mode blanking mechanism arranged above the transparent pressing plate 3, the multi-mode blanking mechanism includes a driving component, a transmission component connected to the bottom output end of the driving component, and a mode switching component connected to the output end of the transmission component, the mode switching component includes a TEM in-situ stretching blanking component and a TEM microscopic characterization blanking component.

[0026] Specifically, the bottom end of the punching base 2 is fixed to the top end of the base 1 by fastening screws, and a connecting arm 12 is also fixed to the top end of the base 1, and the connecting arm 12 is assembled and connected with the driving component and the transmission component respectively; the driving component includes a cantilever block 10 fixed to the top end of the connecting arm 12 by fastening screws at one end, a rotating pressure plate 9 vertically rotated at the other end of the cantilever block 10, and a lower pressure rod 8 threadedly connected to the outer circumferential side of the rotating pressure plate 9, and the rotating pressure plate 9 is elliptical.

[0027] The transmission component includes a fixed block 13 assembled on the connecting arm 12 and a punch rod 6 vertically slidably connected to the fixed block 13. A limiting cylinder 4 is fixed on the fixed block 13 and corresponds to the position of the punch rod 6. The limiting cylinder 4 is vertically slidably connected to the bottom end of the punch rod 6. The top end of the punch rod 6 is threadedly connected to the bottom end of the lower pressure block 7. The top end of the lower pressure block 7 is crimped with the bottom end of the rotating pressure plate 9, and a first compression spring 5 is arranged on the punch rod 6 between the lower pressure block 7 and the limiting cylinder 4. In the natural state, the bottom end of the punch rod 6 is flush with the bottom end of the fixed block 13.

[0028] The mode switching component includes a rotating block 14 which is arranged at the bottom end of the fixed block 13 via a limited rotating assembly. Two mounting holes are axially symmetrically provided inside the rotating block 14. A TEM in-situ stretching and blanking assembly and a TEM microscopic characterization and blanking assembly are respectively arranged in the two mounting holes; the TEM in-situ stretching and blanking assembly includes a TEM in-situ stretching sample punch 16 which is arranged in one of the mounting holes via a second compression spring 24; the TEM microscopic characterization and blanking assembly includes a TEM circular sample punch 17 which is arranged in the other mounting hole via a third compression spring 25.

[0029] The limit rotation assembly includes a screw rod 23 fixed to the top of the rotating block 14. The screw rod 23 passes through a rotating hole 28 opened in the center of the fixed block 13 and is threadedly connected to a limit column 11 arranged at the top of the fixed block 13. Two baffles 22 are fixed at the bottom end of the limit column 11 and correspond to the positions of the TEM in-situ tensile specimen punch 16 and the TEM circular specimen punch 17 respectively. The baffle rod 22 extends into a limit hole 26 opened concentrically with the rotating hole 28. Two limit baffles 27 are axially symmetrically fixed between the inner wall of the limit hole 26 and the outer wall of the rotating hole 28. The baffle rod 22 rotates in the interval surrounded by the two limit baffles 27.

[0030] The ejection assembly includes a TEM circular sample ejection rod 18 and a TEM in-situ tensile sample ejection rod 19. The bottom end of the TEM circular sample ejection rod 18 is vertically slidably arranged inside the blanking base 2 via a fourth compression spring 30. A convex ring 29 is integrally formed at the middle part of the TEM circular sample ejection rod 18. The TEM circular sample ejection rod 18 at the top of the convex ring 29 is vertically slidably connected to the inside of the TEM in-situ tensile sample ejection rod 19. A positioning cylinder 31 is sleeved on the TEM circular sample ejection rod 18 below the convex ring 29. A fourth compression spring 30 is sleeved on the TEM circular sample ejection rod 18 between the positioning cylinder 31 and the convex ring 29. The positioning cylinder 31 is arranged inside the blanking base 2 via a positioning ejector screw.

[0031] The transparent pressing sheet 3 is a glass plate, the four corners of the glass plate are respectively overlapped with the bosses at the four corners of the top of the punching platform 15, the bottom of the punching platform 15 is threadedly connected with the top of the punching base 2, a sample 20 to be processed is clamped between the glass plate and the top of the punching platform 15, and a processing hole 21 is left on the glass plate at the processing position corresponding to the sample 20 to be processed; In the natural state, the top of the TEM circular sample ejector rod 18 and the top of the TEM in-situ tensile sample ejector rod 19 are flush with the top of the blanking platform 15, and the TEM circular sample ejector rod and the EM in-situ tensile sample ejector rod are aligned with the processed hole.

[0032] A cross positioning line is provided on the top of the punching platform 15 , and the intersection of the cross positioning line coincides with the machining center of the sample 20 to be machined.

[0033] A method for using a high-precision TEM pre-sample punching device comprises the following steps: S1, remove the transparent pressing sheet 3, place the sample 20 to be processed on the blanking platform 15, and make the processing center of the sample 20 to be processed coincide with the intersection of the cross positioning lines on the blanking platform 15, and align the punch rod 6 with the TEM in-situ tensile sample punch 16 or the TEM circular sample punch 17 in the original state; S2, reinstall the transparent pressing sheet 3, and align the processing hole 21 of the transparent pressing sheet 3 with the processing position of the sample 20 to be processed; S3, the lower pressing rod 8 is rotated downward, and the lower pressing rod 8 drives the rotating pressing plate 9 to rotate and press the lower pressing block 7 downward, and the lower pressing block 7 drives the punch 6 to move downward, and the first compression spring 5 stores energy, and then presses the TEM in-situ tensile sample punch 16 or the TEM circular sample punch 17 downward, and the TEM in-situ tensile sample punch 16 or the TEM circular sample punch 17 passes through the processing hole 21 and cooperates with the TEM in-situ tensile sample ejector rod 19 or the TEM circular sample ejector rod 18 (in this embodiment, when the TEM in-situ tensile sample punch 16 is selected, the TEM in-situ tensile sample punch 16 is used as a punch, and cooperates with the TEM in-situ tensile sample ejector rod 19 as a die to achieve blanking, and similarly, the TEM circular sample punch 17 cooperates with the TEM circular sample ejector rod 18 to achieve blanking), so as to achieve blanking of the sample 20 to be processed, and at this time, the second compression spring 24 or the third compression spring 25 and the fourth compression spring 30 store energy; In step S3, when the processing mode needs to be changed, the rotating block 14 is rotated horizontally to drive the limit column 11 to rotate, and then the baffle rod 22 is driven to rotate until the baffle rod 22 is rotated from the current baffle position to another baffle position (in this embodiment, it can be rotated horizontally 180° to reach the position), and the mode switching is completed. For example, when it is necessary to punch the TEM in-situ tensile pre-sample, the rotating block 14 is rotated to align the TEM in-situ tensile sample punch 16 with the punch rod 6; when the TEM microscopic characterization sample is required, the rotating block 14 is rotated to align the TEM circular sample punch 17 with the punch rod 6.

[0034] S4, after the punching is completed, the lower pressure rod 8 is released, and the punch rod 6 is reset under the restoring force of the first compression spring 5, and at the same time, the TEM in-situ tensile sample punch 16 or the TEM circular sample punch 17 is reset under the restoring force of the second compression spring 24 or the third compression spring 25; S5. Remove the transparent pressing plate, and the TEM circular sample ejection rod 18 and the TEM in-situ tensile sample ejection rod 19 are reset under the restoring force of the fourth compression spring 30 to complete the ejection.

[0035] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that they can still modify or replace the technical solution of the present invention with equivalents, and these modifications or equivalent replacements cannot cause the modified technical solution to deviate from the spirit and scope of the technical solution of the present invention.

Claims

1. A high-precision TEM pre-sample punching device, characterized in that: It includes a blanking base, a material lifting component arranged inside the blanking base, a blanking platform placed on the top of the blanking base, a transparent pressing sheet placed on the top of the blanking platform, and a multi-mode blanking mechanism arranged above the transparent pressing sheet. The multi-mode blanking mechanism includes a driving component, a transmission component connected to the bottom output end of the driving component, and a mode switching component connected to the output end of the transmission component. The mode switching component includes a TEM in-situ stretching blanking component and a TEM microscopic characterization blanking component.

2. A high-precision TEM pre-sample punching device according to claim 1, characterized in that: The bottom end of the punching base is fixed to the top end of the base through a fastening screw, and a connecting arm is also fixed to the top end of the base, and the connecting arm is respectively assembled and connected with the driving component and the transmission component; The driving component includes a cantilever block with one end fixed to the top of the connecting arm by a fastening screw, a rotating pressure plate vertically rotating at the other end of the cantilever block, and a lower pressure rod threadedly connected to the outer circumference of the rotating pressure plate. The rotating pressure plate is elliptical.

3. A high-precision TEM pre-sample punching device according to claim 2, characterized in that: The transmission component includes a fixed block assembled on the connecting arm and a punch rod vertically slidably connected to the fixed block, a limiting cylinder is fixed on the fixed block and corresponds to the position of the punch rod, the limiting cylinder is vertically slidably connected to the bottom end of the punch rod, the top end of the punch rod is threadedly connected to the bottom end of the lower pressing block, the top end of the lower pressing block is crimped to the bottom end of the rotating pressing plate, and a first compression spring is arranged on the punch rod between the lower pressing block and the limiting cylinder; In a natural state, the bottom end of the punch rod is flush with the bottom end of the fixed block.

4. A high-precision TEM pre-sample punching device according to claim 3, characterized in that: The mode switching component includes a rotating block arranged at the bottom end of the fixed block via a limited rotating assembly, and two mounting holes are axially symmetrically provided inside the rotating block, and a TEM in-situ stretching and blanking assembly and a TEM microscopic characterization and blanking assembly are respectively arranged in the two mounting holes; The TEM in-situ stretching and blanking assembly comprises a TEM in-situ stretching sample punch arranged in one of the mounting holes via a second compression spring; The TEM microscopic characterization punching assembly comprises a TEM circular sample punch which is arranged in another mounting hole via a third compression spring.

5. A high-precision TEM pre-sample punching device according to claim 4, characterized in that: The limit rotation assembly includes a screw fixed to the top of the rotating block. The screw passes through a rotating hole opened in the center of the fixed block and is threadedly connected to a limit column arranged at the top of the fixed block. Two baffles are fixed to the bottom of the limit column corresponding to the positions of the TEM in-situ tensile specimen punch and the TEM circular specimen punch respectively. The baffles extend into a limit hole opened concentrically with the rotating hole. Two limit baffles are axially symmetrically fixed between the inner wall of the limit hole and the outer wall of the rotating hole. The baffles rotate in a range surrounded by the two limit baffles.

6. A high-precision TEM pre-sample punching device according to claim 5, characterized in that: The ejection assembly comprises a TEM circular sample ejection rod and a TEM in-situ tensile sample ejection rod. The bottom end of the TEM circular sample ejection rod is vertically slidably arranged inside the blanking base via a fourth compression spring. A convex ring is integrally formed in the middle of the TEM circular sample ejection rod. The TEM circular sample ejection rod at the top end of the convex ring is vertically slidably connected to the inside of the TEM in-situ tensile sample ejection rod.

7. A high-precision TEM pre-sample punching device according to claim 6, characterized in that: The transparent pressing sheet is a glass plate, the four corners of the glass plate are respectively overlapped with the bosses at the four corners of the top of the punching platform, the bottom of the punching platform is threadedly connected with the top of the punching base, a sample to be processed is clamped between the glass plate and the top of the punching platform, and a processing hole is left on the glass plate corresponding to the processing position of the sample to be processed; In the natural state, the top of the ejector rod of the TEM circular specimen and the top of the ejector rod of the TEM in-situ tensile specimen are flush with the top of the blanking platform, and the ejector rod of the TEM circular specimen and the ejector rod of the EM in-situ tensile specimen are aligned with the processed hole.

8. A high-precision TEM pre-sample punching device according to claim 7, characterized in that: A cross positioning line is provided on the top of the punching platform, and the intersection of the cross positioning line coincides with the machining center of the sample to be processed.

9. A method for using a high-precision TEM pre-sample punching device according to claim 8, characterized in that: The following steps are involved: S1. Remove the transparent pressing sheet and place the sample to be processed on the blanking platform, and make the processing center of the sample to be processed coincide with the intersection of the cross positioning lines on the blanking platform; S2. Reinstall the transparent pressing sheet and align the processing hole of the transparent pressing sheet with the processing position of the sample to be processed; S3, the lower pressing rod is rotated downward, the lower pressing rod drives the rotating pressing plate to rotate and press the lower pressing block downward, the lower pressing block drives the punch rod to move downward, the first compression spring stores energy, and then presses the TEM in-situ tensile sample punch or the TEM circular sample punch downward, the TEM in-situ tensile sample punch or the TEM circular sample punch passes through the processing hole and cooperates with the TEM in-situ tensile sample ejector rod or the TEM circular sample ejector rod to achieve blanking of the sample to be processed, at this time, the second compression spring or the third compression spring and the fourth compression spring store energy; S4. After the punching is completed, the lower pressure rod is released, and the punch is reset under the restoring force of the first compression spring. At the same time, the TEM in-situ tensile specimen punch or the TEM circular specimen punch is reset under the restoring force of the second compression spring or the third compression spring; S5. Remove the transparent pressing plate, and the TEM circular specimen ejector rod and the TEM in-situ tensile specimen ejector rod are reset under the restoring force of the fourth compression spring to complete the ejection.

10. The method for using the high-precision TEM pre-sample punching device according to claim 9, characterized in that: In step S3, when the processing mode needs to be changed, the rotating block is rotated horizontally to drive the limit column to rotate, and then drive the baffle rod to rotate until the baffle rod rotates from the current baffle position to the next baffle position, completing the mode switching.

Images