Flaw detection method and device for turnout switch rail
By setting up a flaw detection instrument on the switch tip rail, transmitting ultrasonic waves and receiving reflected echoes, combined with the comparison of the preset first curve, the problem of the inability to accurately detect internal damage in the switch tip rail in the prior art is solved, and higher flaw detection accuracy and less missed detection are achieved.
Patent Information
- Application Number
- CN202411790016.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-06
- Publication Date
- 2025-04-18
AI Technical Summary
The existing switch tip rail detection technology cannot accurately detect the damage inside the switch tip rail, and there is a problem of high possibility of missed detection and low flaw detection accuracy.
By setting up an actual flaw detection instrument to emit ultrasonic waves to the tip at the far rail end of the switch to be tested, receiving reflected echoes, and by extracting the maximum peak echo, obtaining the flaw detection distance, and comparing it with the preset first curve, it is possible to determine whether there is damage to the switch to be tested.
It reduces the occurrence of missed detection, improves the flaw detection accuracy, and can effectively detect damage inside the switch tip rail.
Smart Images

Figure CN119846059A_ABST
Abstract
Description
Technical Field
[0001] The embodiments of the present invention relate to the technical field of rail flaw detection, and in particular to a method and device for detecting damage of a turnout point rail. Background Art
[0002] The switch rail is an important infrastructure for guiding the operation of railway locomotives, and its health status affects the comfort and safety of driving. With the increase in train speed and carrying capacity, the switch rail is prone to peeling, cracking and other damages under the impact, extrusion and friction of high-speed locomotive wheels. If it is not discovered in time, the damage will expand and cause the switch rail to break, resulting in a train derailment accident. Therefore, it is necessary to regularly inspect the switch rail for damage, so as to timely grasp the damage of the switch rail and ensure driving safety.
[0003] In the related technology, electromagnetic detection technology or machine vision detection technology is usually used to detect damage to the turnout point rail. However, electromagnetic detection technology and machine vision detection technology can only detect the surface of the component, and cannot accurately detect the damage inside the turnout point rail. In summary, the existing turnout point rail detection technology has the problems of high possibility of missed detection and low flaw detection accuracy. Summary of the invention
[0004] The purpose of the present invention is to at least provide a method and device for detecting damage of a turnout point rail, which can at least solve the problems of high possibility of missed detection and low flaw detection accuracy, at least reduce the occurrence of missed detection and improve flaw detection accuracy.
[0005] In order to solve the above technical problems, at least one embodiment of the present application provides a method for detecting damage of a turnout point rail, wherein a real flaw detector is provided at the far rail end of the turnout point rail to be tested, and the real flaw detector is used to transmit real ultrasonic waves to the tip of the turnout point rail to be tested and receive real reflected echoes, and the damage detection method comprises:
[0006] Extracting the echo with the largest peak value from the actual reflected echo to obtain the actual end face echo;
[0007] Acquiring the distance between the actual flaw detection instrument and the tip to obtain an actual flaw detection distance;
[0008] Compare the maximum amplitude of the reference end face echo at the reference flaw detection distance equal to the actual flaw detection distance determined from the preset first curve with the maximum amplitude of the actual end face echo; wherein the preset first curve is the functional relationship between the reference flaw detection distance between the reference flaw detection instrument and the tip and the maximum amplitude of the reference end face echo when the experimental turnout point rail is in an undamaged state;
[0009] When the maximum amplitude of the actual end face echo is smaller than the maximum amplitude of the reference end face echo, it is determined that the switch point rail to be tested is in a damaged state.
[0010] At least one embodiment of the present application further provides a damage detection device for a turnout point rail, comprising: an actual flaw detection instrument is provided at the far rail end of the turnout point rail to be tested, the actual flaw detection instrument is used to transmit an actual ultrasonic wave to the tip of the turnout point rail to be tested, and receive an actual reflected echo, the damage detection device comprising:
[0011] An actual end face echo module, used for extracting the echo with the largest peak value from the actual reflected echo to obtain the actual end face echo;
[0012] An actual flaw detection distance module, used to obtain the distance between the actual flaw detection instrument and the tip to obtain the actual flaw detection distance;
[0013] A damage state judgment module, used for comparing the maximum amplitude of the reference end face echo at a reference flaw detection distance equal to the actual flaw detection distance determined from a preset first curve with the maximum amplitude of the actual end face echo; wherein the preset first curve is a functional relationship between a reference flaw detection distance between a reference flaw detection instrument and the tip and the maximum amplitude of the reference end face echo when the experimental turnout point rail is in a non-damaged state;
[0014] The damage state determination module is used to determine that the switch point rail to be tested is in a damaged state when the maximum amplitude of the actual end face echo is smaller than the maximum amplitude of the reference end face echo.
[0015] At least one embodiment of the present application also provides an electronic device, comprising: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the above-mentioned method for detecting damage to a turnout point rail.
[0016] At least one embodiment of the present application further provides a computer-readable storage medium storing a computer program, wherein the computer program implements the above-mentioned method for detecting damage of a turnout point rail when executed by a processor.
[0017] The embodiments of the present application provide a method and device for detecting damage to a switch point rail. An actual flaw detector is provided at the far rail end of the switch point rail to be tested. The actual flaw detector is used to emit an actual ultrasonic wave to the tip of the switch point rail to be tested. The actual ultrasonic wave is transmitted from the actual flaw detector to the tip. The actual ultrasonic wave is reflected by the tip and may also be reflected by the damaged part to generate an actual reflected echo. The actual reflected echo is transmitted to the actual flaw detector. The actual flaw detector receives the actual reflected echo. The damage detection method includes: since the tip can reflect the energy of the actual ultrasonic wave to the maximum extent, the echo with the largest peak value is extracted from the actual reflected echo to obtain an actual end face echo representing the reflection from the tip; the distance between the actual flaw detector and the tip is obtained to obtain the actual flaw detection distance. The distance between the actual flaw detector and the tip can be predetermined when the actual flaw detector is installed. Before the test, reference flaw detectors are installed at different positions of the experimental turnout point rail for testing. The installation positions of the reference flaw detectors are different, and the reference flaw detection distances between the corresponding reference flaw detectors and the tip are different. The experimental turnout point rail is in an undamaged state. The reference flaw detector emits a reference ultrasonic wave that is the same as the actual ultrasonic wave, receives a reference reflected echo, extracts a reference end face echo from the reference reflected echo, and fits the maximum amplitude of the reference end face echo under different reference flaw detection distances to obtain a preset first curve. In the preset first curve, a reference flaw detection distance equal to the actual flaw detection distance is determined, and the maximum amplitude of the reference end face echo under the reference flaw detection distance is determined. The maximum amplitude of the reference end face echo is compared with the maximum amplitude of the actual end face echo. When the maximum amplitude of the actual end face echo is less than the maximum amplitude of the reference end face echo, it indicates that there is a damaged part that consumes the energy of the actual ultrasonic wave, resulting in a reduction in the energy of the actual end face echo, and a reduction in the maximum amplitude of the actual end face echo, and it is determined that the turnout point rail to be tested is in a damaged state. Therefore, the actual ultrasonic wave can propagate inside the switch point rail to be tested, detect the inside of the switch point rail to be tested, and analyze the actual reflected echo to determine whether there is damage inside the switch point rail to be tested, reduce the occurrence of missed detection, and improve the accuracy of flaw detection. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] One or more embodiments are exemplarily described by the pictures in the corresponding drawings, and these exemplary descriptions do not constitute limitations on the embodiments.
[0019] Figure 1 is a flow chart of a method for detecting damage of a turnout point rail provided by an embodiment of the present application;
[0020] Figure 2 It is a flow chart of the implementation of the damage detection method of the turnout point rail provided by one embodiment of the present invention;
[0021] Figure 3 is a schematic structural diagram of a turnout point rail provided by an embodiment of the present invention;
[0022] Figure 4 is a schematic diagram of comparison between the end face echo corresponding to the switch point rail to be tested and the first curve provided by an embodiment of the present invention;
[0023] Figure 5 is a flowchart for determining the damage state of a switch point rail to be tested provided by an embodiment of the present invention;
[0024] Figure 6 It is a schematic diagram of providing damage on the rail bottom part of a turnout point rail according to an embodiment of the present invention;
[0025] Figure 7 It is a schematic diagram of providing damage on the rail head portion of a turnout point rail provided by an embodiment of the present invention;
[0026] Figure 8 It is a schematic diagram of comparing the damage echo of the turnout point rail to be tested and the damage type of transverse peeling and falling blocks, and the second curve of different damage hole equivalents provided by an embodiment of the present invention;
[0027] Fig. 9 It is a schematic diagram of comparison of the damage echo of the turnout point rail to be tested and the transverse peeling and block breaking damage type, and the second curve of different damage hole equivalents provided by another embodiment of the present invention;
[0028] Fig.10 is a schematic diagram comparing the amplified end face echo and the first curve provided by an embodiment of the present invention;
[0029] Fig.11 It is a schematic diagram of comparison between the amplified damage echo and the lateral spalling damage type and the second curve of different damage hole equivalents provided by an embodiment of the present invention;
[0030] Fig.12 is a schematic structural diagram of a damage detection device for a turnout point rail provided in an embodiment of the present invention;
[0031] Fig.13 is a schematic diagram of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION
[0032] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the embodiments of the present application will be described in detail below in conjunction with the accompanying drawings. However, it will be appreciated by those skilled in the art that in the present application, many technical details are proposed in order to enable the reader to better understand the present application. However, even without these technical details and various changes and modifications based on the following embodiments, the technical scheme claimed in the present application can also be implemented. The division of the following embodiments is for the convenience of description, and the specific implementation of the present application should not be construed as any limitation, and the various embodiments can be combined and referenced with each other under the premise of no contradiction.
[0033] In order to facilitate understanding of the embodiments of the present application, relevant content about turnout point rail damage detection is first introduced here.
[0034] The switch point rail is an important infrastructure for guiding the operation of railway locomotives, and its health status affects the comfort and safety of driving. Therefore, it is necessary to regularly inspect the switch point rail for damage, so as to timely grasp the damage condition of the switch point rail and ensure driving safety. In related technologies, electromagnetic detection technology or machine vision detection technology is usually used to detect damage to the switch point rail. However, electromagnetic detection technology and machine vision detection technology can only realize surface detection of components, and cannot accurately detect the damage inside the switch point rail. In other words, the existing switch point detection technology has the problem of high possibility of missed detection and low flaw detection accuracy.
[0035] In order to solve the above-mentioned technical problems of high possibility of missed detection and low flaw detection accuracy, the present invention proposes a damage detection method for a turnout point rail. The implementation details of the damage detection method for the turnout point rail of this embodiment are specifically described below. The following content is only the implementation details provided for easy understanding and is not necessary for the implementation of this solution.
[0036] Embodiment 1:
[0037] The damage detection method of the turnout rail of this embodiment can be applied to electronic devices with communication, computing and data storage capabilities. The specific process can be as follows: Figure 1 and Figure 2 As shown, including:
[0038] Step 110: extracting the echo with the largest peak value from the actual reflected echo to obtain the actual end face echo.
[0039] Specifically, an actual flaw detector is provided at the far rail end of the switch point rail to be measured, and the actual flaw detector is used to transmit actual ultrasonic waves to the tip of the switch point rail to be measured and receive actual reflected echoes. The actual flaw detector is provided at the rail bottom of the switch point rail to be measured. The switch point rail to be measured transmits actual ultrasonic waves, and the actual ultrasonic guided waves propagate inside the switch point rail to be measured toward the tip of the switch point rail to be measured, and are reflected by the tip, and may also be reflected by damage to generate actual reflected echoes. Exemplarily, in order to widen the detection range, the switch point rail to be measured between the actual flaw detector and the tip belongs to the detection range, and the distance between the actual flaw detector and the tip can be adjusted to adjust the detection range of the switch point rail to be measured. The larger the distance between the actual flaw detector and the tip is adjusted, the larger the detection range of the switch point rail to be measured is. The actual end face echo is the echo generated by the reflection of the actual ultrasonic guided wave at the tip of the switch point rail to be measured. The tip is the largest section on the switch point rail to be measured. When the actual ultrasonic guided wave propagates to the tip of the switch point rail to be measured, the energy of the actual ultrasonic guided wave will be completely reflected by the tip. The reflected wave with the largest amplitude in the actual reflected echo is determined as the actual end face echo. The step of determining the actual end face echo may include: obtaining the envelope of the actual reflected echo, obtaining the peak value of the envelope of the actual reflected echo, and obtaining the actual end face echo. Among all the echoes of the actual reflected echo, the one with the largest peak value is determined as the actual end face echo.
[0040] Step 120, acquiring the distance between the actual flaw detection instrument and the tip to obtain an actual flaw detection distance.
[0041] Specifically, before the damage detection is performed on the turnout point rail to be tested, the actual flaw detection instrument is pre-installed manually, so that the actual flaw detection distance between the actual flaw detection instrument and the tip can be predetermined.
[0042] Step 130, comparing the maximum amplitude of the reference end face echo at a reference flaw detection distance equal to the actual flaw detection distance determined from a preset first curve with the maximum amplitude of the actual end face echo; wherein the preset first curve is a functional relationship between a reference flaw detection distance between a reference flaw detection instrument and the tip and the maximum amplitude of the reference end face echo when the test turnout point rail is in an undamaged state.
[0043] Specifically, the preset first curve is used to characterize the functional relationship between the reference flaw detection distance between the reference flaw detection instrument and the tip and the maximum amplitude of the reference end face echo on the experimental turnout point rail in an undamaged state, which is a reference basis for detecting the actual end face echo. Before the damage detection of the turnout point rail to be tested is performed, an ultrasonic test is performed on the experimental turnout point rail in an undamaged state to obtain a sample that fits the preset first curve. The experimental turnout point rail can be the same point rail as the turnout point rail to be tested, or it can be a point rail of the same type as the turnout point rail to be tested. In the process of testing the preset first curve, the experimental turnout point rail is in an undamaged state, and the reference flaw detection instrument can be the same flaw detection instrument as the actual flaw detection instrument, or it can be a flaw detection instrument of the same model. The reference flaw detection instrument emits a reference ultrasonic guided wave that is the same as the actual ultrasonic guided wave, and the actual ultrasonic guided wave and the reference ultrasonic guided wave have equal values in parameters such as wavelength and amplitude. The tip of the experimental turnout point rail is used as the starting point for distance calibration, and the distance calibration is performed on the experimental turnout point rail according to the preset step length, and multiple preset calibration points are determined. The reference flaw detector is set at each preset calibration point. The reference flaw detector at each preset calibration point transmits a reference ultrasonic wave identical to the actual ultrasonic wave to the tip, receives a reference reflected echo, extracts a reference end face echo from the reference reflected echo, and determines the maximum amplitude of the reference end face echo in the reference reflected echo, thereby obtaining the maximum amplitude of the end face echo corresponding to the reference flaw detector when the reference flaw detector is located at different preset calibration points, that is, the sample data of the reference flaw detection distance and the maximum amplitude of the reference end face echo. The maximum amplitude of the reference end face echo is used as the ordinate, and the reference flaw detection distance between the reference flaw detector and the tip of the experimental turnout point rail is used as the abscissa. According to the sample data of the reference flaw detection distance and the maximum amplitude of the reference end face echo, a curve fitting is performed, and the preset first curve is determined using the least squares method. In the process of testing the preset first curve, the gain value of the reference flaw detector can be kept fixed to improve the accuracy of the preset first curve. The gain value of the reference flaw detector is used to adjust the amplitude of the reference reflected echo.
[0044] In order to further improve the accuracy of the preset first curve and eliminate accidental errors, ultrasonic tests are repeated multiple times to obtain multiple identical or similar preset first curves. Multiple identical or similar preset first curves refer to the same or similar maximum amplitudes of the reference end face echoes corresponding to the reference flaw detection distances on the preset first curves. Similarity can be understood as the difference in the maximum amplitudes of the reference end face echoes is within the error range. The average value of the maximum amplitudes of the reference end face echoes corresponding to the reference flaw detection distances on multiple identical or similar preset first curves is calculated, and the average value is used as the maximum amplitude of the reference end face echoes corresponding to the reference flaw detection distances on the final preset first curve, thereby obtaining the final preset first curve.
[0045] In this embodiment, it is taken into consideration that the temperature change of the experimental turnout point rail will cause the amplitude of the reference ultrasonic wave to change, and thus the amplitude of the reference reflected echo to change. During the test of the preset first curve, the temperature of the experimental turnout point rail can be kept unchanged, and the temperature corresponding to the preset first curve can be recorded accordingly.
[0046] Step 140: When the maximum amplitude of the actual end face echo is smaller than the maximum amplitude of the reference end face echo, it is determined that the switch point rail to be tested is in a damaged state.
[0047] In a specific implementation, when the actual ultrasonic wave propagates inside the switch point rail to be tested, if it encounters damage inside the switch point rail to be tested, a part of the energy of the actual ultrasonic wave will be reflected in the form of a reflected wave, resulting in the weakening of the energy of the actual ultrasonic wave reaching the tip of the switch point rail to be tested, thereby causing the maximum amplitude of the reference end face echo to decrease. The actual flaw detection distance of the actual flaw detection instrument set on the switch point rail to be tested is obtained, and based on the actual flaw detection distance, a reference flaw detection distance that is the same as the actual flaw detection distance is determined in a preset first curve, and the maximum amplitude of the reference end face echo corresponding to the reference flaw detection distance that is the same as the actual flaw detection distance in a non-damaged state is determined. By comparing the maximum amplitude of the actual end face echo with the maximum amplitude of the reference end face echo represented by the preset first curve, it is determined whether the switch point rail to be tested has damage. The presence of damage will weaken the energy of the actual ultrasonic wave, resulting in a decrease in the maximum amplitude of the actual end face echo, thereby determining the presence of damage in the switch point rail.
[0048] In the damage detection method of the turnout rail of the present embodiment, an actual flaw detection instrument is provided at the far rail end of the turnout rail to be tested, and the actual flaw detection instrument is used to emit an actual ultrasonic wave to the tip of the turnout rail to be tested, and the actual ultrasonic wave is transmitted from the actual flaw detection instrument to the tip, and the actual ultrasonic wave is reflected by the tip and may also be reflected by the damaged part to generate an actual reflected echo, which is transmitted to the actual flaw detection instrument and received by the actual flaw detection instrument. The damage detection method includes: since the tip can reflect the energy of the actual ultrasonic wave to the maximum extent, an echo with the largest peak value is extracted from the actual reflected echo to obtain an actual end face echo representing the reflection generated by the tip; and the distance between the actual flaw detection instrument and the tip is obtained to obtain the actual flaw detection distance, and the distance between the actual flaw detection instrument and the tip can be predetermined when the actual flaw detection instrument is installed. Before the test, reference flaw detectors are installed at different positions of the experimental turnout point rail for testing. The installation positions of the reference flaw detectors are different, and the reference flaw detection distances between the corresponding reference flaw detectors and the tip are different. The experimental turnout point rail is in an undamaged state. The reference flaw detector emits a reference ultrasonic wave that is the same as the actual ultrasonic wave, receives a reference reflected echo, extracts a reference end face echo from the reference reflected echo, and fits the maximum amplitude of the reference end face echo under different reference flaw detection distances to obtain a preset first curve. In the preset first curve, a reference flaw detection distance equal to the actual flaw detection distance is determined, and the maximum amplitude of the reference end face echo under the reference flaw detection distance is determined. The maximum amplitude of the reference end face echo is compared with the maximum amplitude of the actual end face echo. When the maximum amplitude of the actual end face echo is less than the maximum amplitude of the reference end face echo, it indicates that there is a damaged part that consumes the energy of the actual ultrasonic wave, resulting in a reduction in the energy of the actual end face echo, and a reduction in the maximum amplitude of the actual end face echo, and it is determined that the turnout point rail to be tested is in a damaged state. Therefore, the actual ultrasonic wave can propagate inside the switch point rail to be tested, detect the inside of the switch point rail to be tested, and analyze the actual reflected echo to determine whether there is damage inside the switch point rail to be tested, reduce the occurrence of missed detection, and improve the accuracy of flaw detection.
[0049] In one embodiment, the damage detection method further includes:
[0050] Acquire the actual rail temperature of the test turnout point rail, calculate the difference between the actual rail temperature and the reference rail temperature, and obtain the actual rail temperature difference; wherein the reference rail temperature is the temperature of the test turnout point rail when measuring the preset first curve;
[0051] Based on a preset temperature compensation relationship, the amplitude compensation amount is calculated according to the actual track temperature difference; wherein the preset temperature compensation relationship is the relationship between the change in the temperature of the experimental turnout point rail and the change in the maximum amplitude of the reference end face echo of the experimental turnout point rail;
[0052] The actual end face echo is compensated by using the amplitude compensation amount to obtain the actual end face echo after temperature compensation.
[0053] In this embodiment, during the process of testing the preset first curve, the temperature of the experimental turnout point rail remains unchanged, and the temperature is recorded accordingly as the reference rail temperature. First, the actual rail temperature of the turnout point rail to be tested is obtained. When the actual rail temperature is inconsistent with the reference rail temperature, the difference between the actual rail temperature and the reference rail temperature is calculated to obtain the actual track temperature difference. Subsequently, the actual track temperature difference is input into the preset temperature compensation relationship to calculate the amplitude compensation amount. The preset temperature compensation relationship is the relationship between the change in the temperature of the test turnout point rail and the change in the maximum amplitude of the reference end face echo of the test turnout point rail; then, based on the amplitude compensation amount, the actual end face echo of the turnout point rail to be tested is amplitude compensated, and the maximum amplitude of the actual end face echo is added to the amplitude compensation amount to obtain the maximum amplitude of the actual end face echo after temperature compensation. When performing damage detection on the turnout point rail to be tested, the actual rail temperature of the turnout point rail to be tested needs to be determined in advance. If the actual rail temperature of the turnout point rail to be tested is inconsistent with the reference rail temperature, the maximum amplitude of the actual end face echo corresponding to the turnout point rail to be tested needs to be temperature compensated, and the maximum amplitude of the actual end face echo after temperature compensation is compared with the maximum amplitude of the reference end face echo represented by the preset first curve to determine whether the turnout point rail to be tested is damaged. If the maximum amplitude of the actual end face echo after temperature compensation is less than the maximum amplitude of the reference end face echo of the preset first curve at the reference detection distance that is the same as the actual detection distance, it is determined that the turnout point rail to be tested is damaged.
[0054] In one embodiment, the preset temperature compensation relationship includes several primary compensation formulas and secondary compensation formulas; the primary compensation formula is used to quantify the relationship between the change in performance of the preset environmental factor and the change in the temperature of the experimental turnout point rail, and different primary compensation formulas quantify different performances of the preset environmental factors; the secondary compensation formula is used to quantify the relationship between the change in performance of each of the preset environmental factors and the change in the maximum amplitude of the reference end face echo of the experimental turnout point rail.
[0055] In this embodiment, each first-level compensation formula quantifies the relationship between the change in the performance of the preset environmental factor and the change in the temperature of the test turnout point rail, and different first-level compensation formulas quantify different performances of the preset environmental factors. The influence of temperature on the test turnout point rail is determined by studying the influence of temperature change on the test turnout point rail. The first-level compensation formula is determined by studying the influence of the performance of the preset environmental factor on the test turnout point rail at different point rail temperatures. The point rail temperature of the test turnout point rail is changed, the change in the point rail temperature is recorded, the change in the performance of the preset environmental factor is detected, and the relationship between the change in the performance of the preset environmental factor and the change in the point rail temperature of the test turnout point rail is fitted to obtain the first-level compensation formula under the performance of the preset environmental factor. The preset environmental factor is, for example, an experimental flaw detector, a coupling agent for the test turnout point rail, and an experimental turnout point rail. Performance is used to characterize the pros and cons of the usable state of the preset environmental factor. The first-level compensation formula includes a compensation formula for temperature change on the flaw detector, a compensation formula for temperature change on the coupling agent, and a compensation formula for temperature change on the turnout point rail. The secondary compensation formula quantifies the relationship between the change in the performance of each preset environmental factor and the change in the maximum amplitude of the reference end face echo of the experimental turnout point rail. The change in the performance of each preset environmental factor calculated by the primary compensation formula is input into the secondary compensation formula, and the change in the maximum amplitude of the reference end face echo of the experimental turnout point rail is calculated as the amplitude compensation. The secondary compensation formula is the influence of the change in the performance of the flaw detector, the change in the performance of the coupling agent, and the change in the performance of the turnout point rail on the maximum amplitude of the reference end face echo of the experimental turnout point rail. When the performance of the flaw detector, the coupling agent, and the turnout point rail changes, the change in the maximum amplitude of the reference end face echo of the experimental turnout point rail is recorded, and the relationship between the change in the performance of the flaw detector, the change in the performance of the coupling agent, the change in the performance of the turnout point rail, and the change in the maximum amplitude of the reference end face echo is fitted to obtain the secondary compensation formula.
[0056] In this embodiment, the influence of the change in the temperature of the point rail on the performance of the flaw detector, the influence of the temperature change on the performance of the coupling agent, and the influence of the temperature change on the state of the switch point rail can be measured respectively by controlling the variables, so as to fit and determine the three first-level compensation formulas of the compensation formula for the flaw detector, the compensation formula for the coupling agent, and the compensation formula for the switch point rail according to the change in the performance of the flaw detector, the change in the performance of the coupling agent, the change in the performance of the switch point rail, and the change in the maximum amplitude of the reference end face echo. Among them, when performing the flaw detection test of the switch point rail, the coupling agent is set between the flaw detector and the switch point rail. The compensation formula for the temperature change to the flaw detector is Δy 1 =a 1 Δx+b 1 The compensation formula for the temperature change on the coupling agent is Δy 2=a 2 Δx+b 2 The compensation formula for temperature change on the switch rail is Δy 3 =a 3 Δx+b 3 Among them, Δx is the change in the temperature of the experimental turnout point rail, which is characterized by the difference between the actual rail temperature and the reference rail temperature, that is, the actual rail temperature difference, and Δy 1 is the change in the performance of the flaw detection instrument, Δy 2 is the change in the performance of the coupling agent, Δy 3 is the change in the performance of the turnout point rail, a 1 、a 2 、a 3 、b 1 、b 2 、b 3 Respectively represent different fitting coefficients. By designing a laboratory experiment, the temperature of the high and low temperature alternating damp heat test box is adjusted from low to high with a fixed step length to different values, and the ultrasonic guided wave signals at different point rail temperatures are collected for analysis. By designing the above temperature experiment, the variables are controlled during the experiment.
[0057] In this embodiment, the effects of the performance of the flaw detector, the performance of the coupling agent, and the state of the turnout point rail on the maximum amplitude of the reference end face echo are comprehensively considered, so as to determine the relationship between the change in the performance of the flaw detector, the change in the performance of the coupling agent, the change in the performance of the turnout point rail, and the maximum amplitude of the reference end face echo, i.e., the secondary compensation formula. The secondary compensation formula is Δy=k 1 Δy 1 +k 2 Δy 2 +k 3 Δy 3 , where Δy 1 is the change in the performance of the flaw detection instrument, Δy 2 is the change in the performance of the coupling agent, Δy 3 is the change in the performance of the turnout rail, Δy represents the change in the maximum amplitude of the reference end echo of the experimental turnout rail, k 1 Indicates the weight coefficient corresponding to the flaw detection instrument, k 2 Indicates the weight coefficient corresponding to the coupling agent, k 3 Indicates the weight coefficient corresponding to the turnout point rail. Taking into account the degree to which the above main factors are affected by temperature, the secondary compensation formula is obtained. The coefficients k1, k2, and k3 are obtained from a large amount of experimental data through the above temperature experiment, and are expressed as the degree to which various influencing factors are affected by temperature.
[0058] In this embodiment, the difference between the actual rail temperature and the reference rail temperature of the preset first curve, that is, the actual rail temperature difference, is substituted into the first-level compensation formula Δx to determine the change in the performance of the flaw detection instrument caused by the temperature change Δy 1 , the change in the performance of the coupling agent Δy 2 , the change in the performance of the turnout point rail Δy 3 , and then the change in the performance of the flaw detection instrument Δy 1 , the change in the performance of the coupling agent Δy 2 , the change in the performance of the turnout point rail Δy 3 Substitute the secondary compensation formula to obtain the amplitude compensation amount, and compensate the amplitude compensation amount to the actual end face echo of the turnout point rail to be measured, so as to obtain the actual end face echo after temperature compensation.
[0059] In this embodiment, the maximum amplitude of the reference end face echo of the experimental turnout point rail in an undamaged state at the actual flaw detection distance of the actual flaw detection instrument is first determined according to the preset first curve, and then the actual end face echo after temperature compensation is compared with the maximum amplitude of the reference end face echo of the experimental turnout point rail in an undamaged state at the actual flaw detection distance to determine whether the turnout point rail to be tested is damaged, see Figure 4 When the actual end face echo after temperature compensation is less than the maximum amplitude of the reference end face echo of the experimental turnout point rail in an undamaged state at the actual flaw detection distance, it is determined that the turnout point rail to be tested is in a damaged state. If the actual end face echo after temperature compensation is greater than or equal to the maximum amplitude of the reference end face echo of the experimental turnout point rail in an undamaged state at the actual flaw detection distance, it is determined that there is no damage inside the turnout point rail to be tested. The internal damage absorbs the energy of the actual ultrasonic wave, resulting in a decrease in the actual reflected echo, which in turn causes a decrease in the maximum amplitude of the actual end face echo.
[0060] In one embodiment, after the step of determining that the switch point rail to be tested is in a damaged state, the following steps are included:
[0061] Extracting an echo that meets a preset damage feature from the actual reflected echo to obtain an actual damage echo; wherein the preset damage feature is an echo feature that distinguishes the actual damage echo from the actual end face echo;
[0062] Detecting the time at the peak of the actual end face echo to obtain the first ultrasonic waveguide propagation time, and detecting the time at the peak of the actual damage echo to obtain the second ultrasonic waveguide propagation time;
[0063] Based on the damage position calculation formula, the actual damage distance between the damage and the tip is calculated according to the propagation time of the first ultrasonic waveguide and the propagation time of the second ultrasonic waveguide; wherein the damage position calculation formula is as follows:
[0064]
[0065] Wherein, L represents the actual damage distance between the damage and the tip, V represents the propagation velocity of the ultrasonic guided wave, T1 represents the propagation time of the first ultrasonic guided wave, and T2 represents the propagation time of the second ultrasonic guided wave.
[0066] In this embodiment, when it is determined that the switch rail to be tested is in a damaged state, the damage echo in the actual reflected echo of the switch rail to be tested is determined according to the actual reflected echo of the switch rail to be tested. When the actual ultrasonic wave propagates inside the switch rail to be tested, if it encounters damage inside the switch rail to be tested, a part of the energy of the actual ultrasonic wave will be reflected in the form of a reflected wave, forming an actual damage echo. That is to say, the actual damage echo refers to the echo generated by the actual ultrasonic wave being transmitted to the damaged position inside the switch rail to be tested and reflected by the damage. The actual damage echo and the actual end face echo are obtained by reflection at different positions, and the physical properties at the reflection positions are different, such as the area at the reflection positions. Therefore, the actual damage echo and the actual end face echo are different. The preset damage feature is the echo feature that distinguishes the actual damage echo from the actual end face echo. For example, since the damage is between the actual flaw detector and the tip, the actual ultrasonic wave passes through the damage position first, so the actual damage echo reaches the actual flaw detector earlier than the actual end face echo. Then the preset damage feature is that the time at the peak is earlier than the time at the peak of the actual end face echo. The area of the tip reflecting the actual ultrasonic wave is larger than the area of the damage reflecting the actual ultrasonic wave, so the maximum amplitude of the actual end face echo generated by the tip reflection is larger than the maximum amplitude of the actual damage echo. The preset damage feature can be set to the time at the peak being earlier than the time at the peak of the actual end face echo and the maximum amplitude being larger than the maximum amplitude of the actual damage echo. Therefore, the envelope algorithm can be used to compare the maximum amplitude, extract the echo whose peak time is earlier than the peak time of the actual end face echo and whose maximum amplitude is greater than the maximum amplitude of the actual damage echo, and obtain the actual damage echo. Detect the time at the peak of the actual end face echo to obtain the first ultrasonic waveguide propagation time T 1 , the first ultrasonic wave propagation time T 1 It is the time from the actual end face echo to the actual ultrasonic emission time. The time at the peak of the actual damage echo is detected to obtain the second ultrasonic wave propagation time T 2 , the time from the actual ultrasonic emission time to the actual damage echo is calculated based on the damage location formula Wherein L represents the actual damage distance between the damage and the tip, V represents the propagation velocity of ultrasonic guided waves, T1 represents the propagation time of the first ultrasonic waveguide, and T2 represents the propagation time of the second ultrasonic waveguide, and the actual damage distance between the damage and the tip is calculated.
[0067] In one embodiment, after the step of determining that the switch point rail to be tested is in a damaged state, the following steps are included:
[0068] Acquire a preset second curve under different preset damage states; wherein the preset second curve is a functional relationship between a preset damage distance between a preset damage and the tip and a maximum amplitude of the reference damage echo when the test turnout point rail is in the preset damage state;
[0069] When the preset damage distance is the actual damage distance, the reference damage echo of the preset second curve whose maximum amplitude is closest to the maximum amplitude of the actual damage echo is selected to obtain an echo with similar damage degree, and determine that the damage degree of the turnout point rail to be measured is similar to the preset damage state of the preset second curve where the echo with similar damage degree is located.
[0070] In this embodiment, during the test of the preset second curve, ultrasonic tests are respectively performed using experimental turnout points in different preset damage states. For the test of the preset second curve in a preset damage state, multiple experimental turnout points with the same preset damage state but different preset damage distances between the preset damage and the tip are selected, and a reference flaw detection instrument is set at the same position of each experimental turnout point, and reference ultrasonic waves are respectively emitted to the tip, and reference reflected echoes are received, and the maximum amplitude of the reference damage echo of each experimental turnout point is calculated to obtain the maximum amplitude of the reference damage echo of each experimental turnout point with different preset damage distances, and the preset damage distance and the maximum amplitude of the reference damage echo are fitted to obtain the preset second curve in the preset damage state. The above experiment is performed for different preset damage states to obtain the preset second curves in different preset damage states.
[0071] The maximum amplitude of the actual damage echo is compared with each preset second curve respectively. On each preset second curve, the maximum amplitude of the reference damage echo when the preset damage distance is the actual damage distance is determined. The minimum maximum amplitude of the reference damage echo is selected from the maximum amplitudes of the reference damage echoes that are greater than or equal to the maximum amplitude of the actual damage echo as the upper limit of the damage state assessment. The reference damage echo is used as an echo with similar damage degree. The maximum amplitude of the largest reference damage echo among the maximum amplitudes is selected as the lower limit of the damage state evaluation. The reference damage echo serves as another echo with similar damage degree. The actual damage echo is close to the two echoes with similar damage degrees. The upper limit of the damage state evaluation and the lower limit of the damage state evaluation are the maximum amplitude of the reference damage echo closest to the maximum amplitude of the actual damage echo, indicating that at the current actual damage distance, the damage state of the switch point rail to be measured is between the upper limit of the damage state evaluation and the lower limit of the damage state evaluation.
[0072] In this embodiment, the preset damage state includes damage type and damage size. By setting damage of different damage types and / or different damage sizes on the experimental turnout point rail, ultrasonic guided wave flaw detection is performed for each preset damage state, and the maximum amplitude of the reference damage echo is recorded, so as to determine the relationship between the preset damage distance and the maximum amplitude of the reference damage echo.
[0073] The damage types include transverse peeling and crack damage. The crack damage includes surface cracks and internal cracks. The internal cracks mainly include black core damage and white core damage. Transverse peeling and crack damage can be set at the rail bottom part and rail head part of the turnout point rail. Each preset damage state corresponds to a damage type and a damage size. For each preset damage state, ultrasonic flaw detection can be performed by a reference flaw detection instrument, and the maximum amplitude of the reference damage echo can be recorded accordingly to determine the relationship between the preset damage distance and the maximum amplitude of the reference damage echo. The maximum amplitude of the reference damage echo is used as the ordinate, and the distance between the preset damage and the tip of the experimental turnout point rail, that is, the preset damage distance, is used as the abscissa to draw the preset second curve under the preset damage state. When ultrasonic flaw detection is performed on the experimental turnout point rail, the gain value of the reference flaw detection instrument is always kept fixed, so that the preset second curve under each preset damage state is measured and drawn under the condition of the same gain value.
[0074] In this embodiment, in order to eliminate accidental errors, for each preset damage state, ultrasonic flaw detection is repeatedly performed on the experimental turnout point rail to obtain multiple identical or similar preset second curves under the preset damage state, and the average of the maximum amplitudes of the reference damage echoes of the preset second curves is calculated to obtain the final preset second curve under the preset damage state.
[0075] In this embodiment, for each preset second curve with the same damage type and different damage sizes, the minimum maximum amplitude of the reference damage echo is selected from the maximum amplitudes of the reference damage echoes that are greater than or equal to the maximum amplitude of the actual damage echo as the upper limit for evaluating the damage state, and the reference damage echo is used as a similar damage degree echo. The maximum amplitude of the largest reference damage echo is selected from the maximum amplitudes of the reference damage echoes that are less than or equal to the maximum amplitude of the actual damage echo as the lower limit for evaluating the damage state, and the reference damage echo is used as another similar damage degree echo. The actual damage echo is close to the two similar damage degree echoes, and the upper limit for evaluating the damage state and the lower limit for evaluating the damage state are the maximum amplitudes of the reference damage echoes that are closest to the maximum amplitude of the actual damage echo, indicating that at the current actual damage distance, the damage size of the switch point rail to be measured is between the damage size corresponding to the upper limit for evaluating the damage state and the damage size corresponding to the lower limit for evaluating the damage state.
[0076] In one embodiment, the method further comprises:
[0077] When the maximum amplitude of the actual damage echo is smaller than the maximum amplitude of the reference damage echo of each of the preset second curves, amplifying the reflected echo until the maximum amplitude of the actual end face echo reaches the maximum amplitude of the reference end face echo when the reference flaw detection distance under the preset first curve is the actual flaw detection distance;
[0078] Extracting an echo that meets the preset damage characteristics from the amplified reflected echo to obtain a calibrated damage echo;
[0079] When the preset damage distance is the actual damage distance, the reference damage echo of the preset second curve whose maximum amplitude is closest to the maximum amplitude of the calibration damage echo is selected to obtain a degree-updated similar echo, and determine that the damage degree of the turnout point rail to be measured is similar to the preset damage state of the preset second curve where the degree-updated similar echo is located.
[0080] In this embodiment, when the maximum amplitude of the actual damage echo is smaller than the maximum amplitude of the reference damage echo of each of the preset second curves, it may be due to the different gain values of the reference flaw detection instrument and the actual flaw detection instrument in the experimental tests of the preset first curve and the preset second curve. In order to further accurately determine the size of the damage, the actual reflected echo of the turnout point rail to be measured is amplified, for example, by the gain value, until the maximum amplitude of the actual end face echo in the actual reflected echo is equal to the preset amplitude in the preset first curve, so as to obtain the amplified actual reflected echo, wherein the preset amplitude is the maximum amplitude of the reference end face echo when the reference flaw detection distance under the preset first curve is the actual flaw detection distance, and can also be specifically defined as the minimum value among the maximum amplitudes of the reference end face echoes of each preset first curve when the reference flaw detection distance is the actual flaw detection distance.
[0081] An echo that meets the preset damage characteristics is extracted from the amplified reflected echo to obtain a calibrated damage echo. For each preset second curve with the same damage type but different damage sizes, the minimum maximum amplitude of the reference damage echo is selected from the maximum amplitudes of the reference damage echoes that are greater than or equal to the maximum amplitude of the calibration damage echo as the upper limit of the damage state evaluation, and the reference damage echo is used as a degree-updated similar echo. The maximum amplitude of the largest reference damage echo is selected from the maximum amplitudes of the reference damage echoes that are less than or equal to the maximum amplitude of the calibration damage echo as the lower limit of the damage state evaluation, and the reference damage echo is used as another degree-updated similar echo. The calibration damage echo is close to the two degree-updated similar echoes, and the upper limit of the damage state evaluation and the lower limit of the damage state evaluation are the maximum amplitudes of the reference damage echoes that are closest to the maximum amplitude of the calibration damage echo, indicating that at the current actual damage distance, the damage size of the turnout point rail to be measured is between the damage size corresponding to the upper limit of the damage state evaluation and the damage size corresponding to the lower limit of the damage state evaluation.
[0082] In this embodiment, when the actual rail temperature is inconsistent with the reference rail temperature, the difference between the actual rail temperature and the reference rail temperature is calculated to obtain the actual rail temperature difference; wherein the reference rail temperature is the temperature of the point rail of the experimental turnout point rail when measuring the preset first curve; based on the preset temperature compensation relationship, the amplitude compensation amount is calculated according to the actual rail temperature difference; the actual end face echo is compensated by the amplitude compensation amount to obtain the actual end face echo after temperature compensation; when the actual end face echo is less than the maximum amplitude of the reference end face echo under the reference flaw detection distance of each preset first curve and the maximum amplitude of the actual damage echo is greater than the maximum amplitude of the reference damage echo of a preset second curve amplify the actual reflected echo until the maximum amplitude of the actual end face echo reaches the maximum amplitude of the reference end face echo when the reference flaw detection distance under the preset first curve is the actual flaw detection distance; extract the echo that meets the preset damage feature from the amplified reflected echo to obtain the calibration damage echo; when the preset damage distance is the actual damage distance, select the reference damage echo of the preset second curve whose maximum amplitude is closest to the maximum amplitude of the calibration damage echo to obtain a degree-updated similar echo, and determine that the damage degree of the turnout point rail to be measured is similar to the preset damage state of the preset second curve where the degree-updated similar echo is located.
[0083] In one embodiment, the method further comprises:
[0084] Obtaining a preset third curve under different preset damage equivalents; wherein the preset third curve is a functional relationship between a preset damage distance between a preset damage and the tip and a maximum amplitude of a reference damage echo of the experimental turnout point rail under the preset damage equivalent;
[0085] When the preset damage distance is the actual damage distance, the maximum amplitude of the actual damage echo is compared with the maximum amplitude of the reference damage echo of each of the preset third curves to determine the damage level of the turnout point rail to be tested. The damage level is determined by dividing the intervals using the maximum amplitude of each of the reference damage echoes.
[0086] In this embodiment, for each damage type, a preset third curve under different preset damage equivalents is obtained respectively, for example, a preset third curve corresponding to the first preset damage hole equivalent is obtained as a damage recording line, a third curve corresponding to the second preset damage hole equivalent is obtained as a damage assessment line, and a third curve corresponding to the third preset damage hole equivalent is obtained as a damage scrapping line. Among them, the first preset damage hole equivalent is smaller than the second preset damage hole equivalent, and the second preset damage hole equivalent is smaller than the third preset damage hole equivalent. The preset third curve is the functional relationship between the preset damage distance between the preset damage and the tip of the experimental turnout point rail under the corresponding preset damage equivalent and the maximum amplitude of the reference damage echo. For a damage type and a preset damage under a preset damage equivalent, a preset damage that meets the damage type and the preset damage equivalent is set on each experimental turnout point rail. The preset damage of different experimental turnout points has different distances from the tip, that is, the preset damage distance. A reference flaw detection instrument is installed at the same position of each experimental turnout point rail to perform ultrasonic flaw detection test, and the maximum amplitude of each reference damage echo is recorded. The preset damage distance and the maximum amplitude of the reference damage echo are fitted to obtain the preset third curve under the damage type and the preset damage equivalent. For each damage type, each preset third curve with the same preset damage distance and the actual damage distance but different preset damage equivalent is obtained, and the maximum amplitude of the actual damage echo is compared with the maximum amplitude of the reference damage echo of each preset third curve to determine the damage level of the turnout point rail to be tested. For example, for each damage type, when the maximum amplitude of the actual damage echo is smaller than the maximum amplitude of the reference damage echo of the damage record line, it is determined that the turnout point rail to be tested has no damage; when the maximum amplitude of the actual damage echo is larger than the maximum amplitude of the reference damage echo of the damage record line and smaller than the maximum amplitude of the reference damage echo of the damage assessment line, it is determined that the turnout point rail to be tested has damage and the damage is minor; when the maximum amplitude of the actual damage echo is larger than the maximum amplitude of the reference damage echo of the damage assessment line and smaller than the maximum amplitude of the reference damage echo of the damage judgment line, it is determined that the turnout point rail to be tested has damage and the damage is major; when the maximum amplitude of the actual damage echo is larger than the maximum amplitude of the reference damage echo of the damage judgment line, it is determined that the damage of the turnout point rail to be tested has reached the scrap level and needs to be stopped immediately.
[0087] Embodiment 2:
[0088] The damage detection method of the turnout rail of this embodiment can be applied to electronic devices with communication, computing and data storage capabilities. The specific process can be as follows: Figure 2 As shown, including:
[0089] Step 101, obtaining the reflected echo of the switch point rail to be tested. The reflected echo is generated by the ultrasonic guided wave emitted by the flaw detection device arranged on the switch point rail to be tested and reflected by the switch point rail to be tested.
[0090] In an embodiment of the present invention, the flaw detection device can be set at the bottom of the turnout point rail. The flaw detection device sends ultrasonic guided waves, which propagate inside the turnout point rail to be tested toward the tip of the turnout point rail and reflect to generate a reflected echo. Exemplarily, in order to widen the detection range, the flaw detection device can be set at the far end of the turnout point rail.
[0091] Step 102: Based on the reflected echo of the turnout point rail to be measured, determine the end face echo in the reflected echo.
[0092] Here, the end face echo refers to the echo generated by the reflection of the ultrasonic guided wave at the tip of the switch point rail.
[0093] The tip of the turnout rail is the largest cross-section on the turnout rail. When the ultrasonic guided wave propagates to the tip position of the turnout rail, the ultrasonic guided wave energy will be completely reflected by the tip. Based on this, the embodiment of the present invention can determine the reflected wave with the largest amplitude in the reflected echo as the end face echo. First, the envelope of the transmitted echo signal is obtained, and then the peak value of the envelope is obtained. Among all the echoes, the one with the largest peak value is determined to be the end face reflection echo. Analysis of other echoes can also be used for damage detection. However, in this step, only the echo with the largest peak value in the echo (end face echo) is extracted and compared with the first curve.
[0094] Step 103, obtaining a preset first curve, and determining whether the switch point rail to be tested is damaged based on the end face echo and the first curve.
[0095] The preset first curve is used to characterize the corresponding relationship between the position of the flaw detection device and the maximum amplitude of the end face echo on the turnout point rail in an undamaged state.
[0096] Here, the first curve can be obtained by the following method: Figure 3, taking the tip of the turnout rail as the starting point for distance calibration, performing distance calibration on the turnout rail according to a preset step length, and determining multiple preset calibration points. The flaw detection device is set at the preset calibration point to emit ultrasonic guided waves, and correspondingly receives reflected echoes. According to the received reflected echo, the maximum amplitude of the end face echo in the reflected echo is determined, so as to obtain the maximum amplitude of the end face echo corresponding to the flaw detection device at different preset calibration points. The maximum amplitude of the end face echo is used as the ordinate, and the distance between the flaw detection device and the tip of the turnout rail is used as the abscissa, so as to draw the first curve. In the process of making the first curve, the gain value of the flaw detection device can be kept fixed at all times to improve the accuracy of the first curve. Here, the gain value of the flaw detection device affects the amplitude of the reflected echo.
[0097] To further improve the accuracy of the first curve and eliminate accidental errors, the embodiment of the present invention can repeat the above method multiple times to obtain multiple identical or similar first curves, and then determine the final first curve based on the multiple identical or similar first curves.
[0098] Here, multiple identical or similar first curves mean that the maximum amplitudes of the end face echoes corresponding to the distance values on the first curves are identical or similar. The average value of the maximum amplitudes of the end face echoes corresponding to the distance values on the multiple identical or similar first curves is determined as the maximum amplitude of the end face echoes corresponding to the distance values on the final first curve, thereby obtaining the final first curve. Among them, similar can be understood as being within the error range.
[0099] In addition, it should be noted that the present application takes into account that the temperature change of the turnout point rail will cause the amplitude of the ultrasonic guided wave to change, and then the amplitude of the reflected echo to change. Therefore, in the embodiment of the present invention, in the process of making the first curve, the temperature of the turnout point rail can be kept constant, and the temperature corresponding to the first curve can be recorded accordingly. And when the turnout point rail to be tested is inspected for damage, the temperature of the turnout point rail to be tested needs to be determined in advance. If the temperature of the turnout point rail to be tested is inconsistent with the temperature corresponding to the first curve, it is necessary to perform temperature compensation on the maximum amplitude of the end face echo corresponding to the turnout point rail to be tested, and compare the maximum amplitude after temperature compensation with the maximum amplitude of the end face echo in the above-mentioned damage-free state to determine whether the turnout point rail to be tested is damaged.
[0100] The embodiment of the present invention can determine whether there is damage on the switch point rail to be tested based on the end face echo and the first curve. When the ultrasonic guided wave propagates inside the switch point rail, if it encounters damage inside the switch point rail, a part of the ultrasonic guided wave energy will be reflected in the form of a reflected wave, which weakens the ultrasonic guided wave energy reaching the tip of the switch point rail, thereby causing the maximum amplitude of the end face echo to decrease. Therefore, in the embodiment of the present invention, by comparing the end face echo with the preset first curve, it is determined whether there is damage on the switch point rail to be tested. Compare the peak values of the end face echo. The presence of damage will weaken the guided wave energy, resulting in a decrease in the peak value of the end face echo. Thereby determining the presence of damage in the point rail.
[0101] In some embodiments, when determining whether the switch point rail to be tested is damaged, the current position of the flaw detection device set on the switch point rail to be tested can be first obtained, and then, based on the current position and the first curve, the maximum amplitude of the end face echo corresponding to the current position in the undamaged state is determined. Next, the end face echo of the switch point rail to be tested is temperature compensated to obtain the temperature compensated end face echo. If the maximum amplitude of the temperature compensated end face echo is less than the maximum amplitude of the end face echo corresponding to the current position, it is determined that the switch point rail to be tested is damaged.
[0102] Among them, the specific process of temperature compensation is as follows:
[0103] First, determine the temperature difference between the rail temperature of the turnout rail to be measured and the reference rail temperature corresponding to the first curve; then, determine the amplitude compensation amount based on the temperature difference and the preset temperature compensation formula; then, based on the amplitude compensation amount, perform amplitude compensation on the end face echo of the turnout rail to be measured to obtain the end face echo after temperature compensation. The reference rail temperature is the rail temperature measured when making the first curve, which is obtained by actual measurement when making the first curve. This temperature value is obtained when making the first curve.
[0104] Here, the preset temperature compensation formula includes a primary compensation formula and a secondary compensation formula; wherein,
[0105] The first-level compensation formula includes: the compensation formula for temperature change to the flaw detection device, the compensation formula for temperature change to the coupling agent, and the compensation formula for temperature change to the turnout point rail.
[0106] The secondary compensation formula includes: the amplitude compensation formula for the end face echo caused by the change of the flaw detection device, the change of the coupling agent, and the change of the turnout point rail.
[0107] In the embodiment of the present invention, the influence of temperature change on the performance of the flaw detection device, the influence of temperature change on the performance of the coupling agent, and the influence of temperature change on the state of the turnout point rail can be measured respectively by controlling variables, so as to determine the compensation formula of temperature change on the flaw detection device, the compensation formula of temperature change on the coupling agent, and the compensation formula of temperature change on the turnout point rail according to the measurement data fitting. When performing flaw detection on the turnout point rail, the coupling agent is set between the flaw detection device and the turnout point rail.
[0108] Next, the impact of the performance of the flaw detection device, the performance of the coupling agent and the state of the turnout point rail on the amplitude of the end face echo is comprehensively considered, so as to determine the amplitude compensation formula for the end face echo caused by changes in the flaw detection device, the coupling agent and the turnout point rail.
[0109] Here, the compensation formula for temperature change of the flaw detection device can be expressed as: Δy 1 =a 1 Δx+b 1 ;
[0110] The compensation formula for the temperature change of the coupling agent can be expressed as: Δy 2 =a 2 Δx+b 2 ;
[0111] The compensation formula for temperature change of turnout point rail can be expressed as: Δy 3 =a 3 Δx+b 3 .
[0112] Temperature changes can affect the performance or status of flaw detection devices, coupling agents, and turnout rails. By designing laboratory experiments, the temperature of the high and low temperature alternating damp heat test chamber is adjusted from low to high with fixed steps to different values. Ultrasonic guided wave signals at different temperatures are collected for analysis. 1 , Δy 2 , Δy 3 They respectively represent the influence of temperature on the flaw detection device, coupling agent, and turnout point rail. Because temperature has the greatest and most significant influence on these three properties. By designing the above temperature experiment, the variables are controlled during the experiment.
[0113] The amplitude compensation formula for the reflected echo caused by the change of the flaw detection device, the change of the coupling agent, and the change of the turnout point rail can be expressed as: Δy = k 1 Δy 1 +k 2 Δy 2 +k 3 Δy 3 .
[0114] Among them, Δy 1represents the performance change of the flaw detection device, Δx represents the temperature change, Δy 2 Indicates the change in coupling agent performance, Δy 3 represents the state change of the turnout point rail, a 1 、a 2 、a 3 、b 1 、b 2 、b 3 They represent different fitting coefficients, Δy represents the amplitude change, k 1 Indicates the weight coefficient corresponding to the flaw detection device, k 2 Indicates the weight coefficient corresponding to the coupling agent, k 3 Indicates the weight coefficient corresponding to the turnout point rail. The compensation formula is obtained by comprehensively considering the degree to which the above main factors are affected by temperature. Δy represents the amplitude change of the maximum amplitude of the signal collected at any position. It is expressed as the change in amplitude due to the combined influence of several influencing factors. The coefficients k1, k2, and k3 are obtained from the analysis of a large amount of experimental data through the above temperature experiment, and are expressed as the degree to which various influencing factors are affected by temperature.
[0115] Substituting the temperature difference between the rail temperature of the turnout point rail to be measured and the reference rail temperature corresponding to the first curve into the above compensation formula, the amplitude change caused by the temperature change (i.e., Δy 1 , Δy 2 , Δy 3 ). The amplitude variation is compensated to the end face echo of the switch point rail to be measured, and the end face echo after temperature compensation can be obtained.
[0116] That is to say, the maximum amplitude of the end face echo in the undamaged state corresponding to the current position of the flaw detection device on the turnout point rail to be tested is first determined according to the first curve, and then the maximum amplitude of the end face echo after temperature compensation is compared with the maximum amplitude of the end face echo in the undamaged state to determine whether the turnout point rail to be tested is damaged.
[0117] For example, see Figure 4 When the maximum amplitude of the end echo after temperature compensation is less than the maximum amplitude of the end echo in the above-mentioned undamaged state, it is determined that the switch point rail to be tested has damage. If the maximum amplitude of the end echo after temperature compensation is greater than or equal to the maximum amplitude of the end echo in the above-mentioned undamaged state, it is determined that there is no damage inside the switch point rail to be tested.
[0118] The embodiment of the present invention obtains the reflected echo of the turnout rail to be tested, and then determines the end face echo in the reflected echo based on the reflected echo of the turnout rail to be tested; then, the end face echo is temperature compensated, and based on the temperature-compensated end face echo and a preset first curve, it is determined whether the turnout rail to be tested is damaged. The first curve is used to characterize the correspondence between the position of the flaw detection device and the maximum amplitude of the end face echo on the turnout rail in a non-damaged state. Among them, when the ultrasonic guided wave propagates inside the turnout rail, if it encounters damage inside the turnout rail, a part of the ultrasonic guided wave energy will be reflected in the form of a reflected wave, so that the ultrasonic guided wave energy reaching the tip of the turnout rail is weakened, thereby causing the maximum amplitude of the end face echo to decrease. The embodiment of the present invention determines whether the turnout rail to be tested is damaged through the cross-sectional echo and the preset first curve, which can effectively improve the damage detection accuracy of the turnout rail to be tested. The reflected reflected wave and the reflected echo are the same wave. Because the internal damage absorbs the ultrasonic guided wave energy, the reflected wave is reduced, and then the maximum amplitude is reduced. The end face of the switch rail can be regarded as the largest damage in the switch rail. The ultrasonic guided wave propagates to the end face and reflects, which is the wave with the largest amplitude in the reflected echo. The reflected echo of the damage is a wave with a much smaller amplitude than the end face reflected echo. It can be extracted by comparing the size through the envelope algorithm.
[0119] According to the above method, it can be determined whether there is damage inside the turnout point rail to be tested. The embodiment of the present invention further determines the damage position and damage state inside the turnout point rail to be tested on the basis of determining that there is damage inside the turnout point rail to be tested. Next, the method for determining the damage position and damage state inside the turnout point rail to be tested is introduced.
[0120] In some embodiments, see Figure 5 After determining whether the switch point rail to be tested is damaged, the following steps may also be performed:
[0121] Step 401: If it is determined that the switch point rail to be tested is damaged, a damage echo in the reflected echo of the switch point rail to be tested is determined according to the reflected echo of the switch point rail to be tested.
[0122] When ultrasonic guided waves propagate inside the switch point rail, if they encounter damage inside the switch point rail, part of the ultrasonic guided wave energy will be reflected in the form of reflected waves, forming damage echoes. In other words, damage echoes refer to the echoes generated by ultrasonic guided waves being transmitted to the damaged position inside the switch point rail to be tested and reflected from the damage.
[0123] The maximum amplitude of the damage echo is lower than the maximum amplitude of the end face echo, and the damage echo returns before the end face echo and reaches the flaw detection device. Therefore, in the embodiment of the present invention, the echo whose maximum amplitude is smaller than the maximum amplitude of the end face echo and whose time is earlier than the time corresponding to the end face echo is determined as the damage echo. The end face of the pointed rail is regarded as the largest damage, and there cannot be a larger damage than it between the flaw detection device and the end face, and the maximum amplitude of the damage echo is lower than the maximum amplitude of the end face echo. The damage is located between the flaw detection device and the end face of the pointed rail, and the time when the ultrasonic guided wave receives the damage echo must be earlier than the cross-section echo. Determining the time at the peak of the end face echo can determine the propagation time of the first ultrasonic waveguide and the propagation time of the second ultrasonic waveguide.
[0124] Step 402, determining the damaged position of the switch point rail to be tested according to the damaged echo in the reflected echo of the switch point rail to be tested.
[0125] The reflected echo of the switch rail to be tested includes an end face echo and a damage echo. Among them, the end face echo is obtained by the reflection of the tip of the switch rail to be tested, and the damage echo is obtained by the reflection of the damage inside the switch rail to be tested. According to the end face echo and the damage echo, the time when the ultrasonic guided wave reaches the tip position of the switch rail to be tested and the time when the ultrasonic guided wave reaches the damage position of the switch rail to be tested can be determined respectively, and then combined with the propagation speed of the ultrasonic guided wave, the distance between the damage position and the tip of the switch rail to be tested can be determined.
[0126] In some embodiments, when determining the damaged position of the switch point rail to be measured, the first ultrasonic waveguide propagation time corresponding to the end face echo can be determined based on the end face echo in the reflected echo of the switch point rail to be measured; and the second ultrasonic waveguide propagation time corresponding to the damaged echo can be determined based on the damaged echo in the reflected echo of the switch point rail to be measured; then, based on the time difference between the first ultrasonic waveguide propagation time and the second ultrasonic waveguide propagation time, and the propagation speed of the ultrasonic waveguide, the distance between the damage of the switch point rail to be measured and the tip of the switch point rail to be measured is determined, and based on the distance, the damaged position of the switch point rail to be measured is determined.
[0127] In the embodiment of the present invention, the distance between the damage and the tip of the sharp rail to be measured is used to represent the damage position of the sharp rail to be measured.
[0128] In some embodiments, the Determine the distance between the damage on the switch point rail to be tested and the tip of the switch point rail to be tested.
[0129] Where L represents the distance between the damage of the switch rail to be tested and the tip of the switch rail to be tested, V represents the propagation speed of the ultrasonic guided wave, and T 1 represents the propagation time of the first ultrasonic waveguide, T 2 represents the second ultrasonic waveguide propagation time.
[0130] Step 403, obtaining the second curve under different damage states, and determining the damage state of the turnout rail to be tested based on the damage echo in the reflected echo of the turnout rail to be tested, the damage position of the turnout rail to be tested, and the second curve under different damage states.
[0131] Among them, the second curve under different damage states is used to characterize the corresponding relationship between the damage position and the maximum amplitude of the damage echo on the turnout point rail under different damage states. The second curve under different damage states can be prepared according to the following method:
[0132] The turnout point rail is pre-set with different damage states. Among them, the damage state mainly includes the damage type and the damage size. By setting damage of different types and sizes on the turnout point rail, and performing ultrasonic guided wave flaw detection on each damage state, the maximum amplitude of the damage echo is recorded accordingly, so as to determine the correspondence between the distance between the damage of the turnout point rail and the tip of the turnout point rail and the maximum amplitude of the damage echo.
[0133] Among them, the damage types mainly include: transverse peeling damage and crack damage. Here, crack damage mainly includes surface cracks and internal cracks. Among them, internal cracks mainly include black core damage and white core damage.
[0134] Exemplarily, the embodiments of the present invention respectively set the lengths of lateral spalling and chipping damage to be 2.35mm, 4.35mm, 6.35mm, 8.35mm, 10.5mm, 12.5mm, 14.5mm and 15mm, and the depth to be 3mm. The damage hole equivalents of the above-mentioned lateral spalling and chipping damage are φ3mm, φ4.08mm, φ4.93mm, φ5.65mm, φ6.33mm, φ6.91mm, φ7.44mm and φ7.57mm, respectively. In addition, the embodiments of the present invention respectively set the damage hole equivalents to be φ2.9mm, φ2.98mm and φ3.3mm, and the depths are all flat-bottom holes of 40% of the wall thickness, which are used to characterize crack damage of different sizes. Here, the damage hole equivalent is used to characterize the damage size.
[0135] See also Figure 6 and Figure 7 The above-mentioned transverse peeling and cracking damages of different sizes can be set at the rail bottom part and rail head part of the turnout point rail.
[0136] Each damage state corresponds to a damage type and a damage size. For each damage state, ultrasonic flaw detection can be performed using a flaw detection device, and the maximum amplitude of the damage echo can be recorded accordingly, so as to determine the correspondence between the distance between the damage and the tip and the maximum amplitude of the damage echo. The maximum amplitude of the damage echo is used as the ordinate, and the distance between the damage of the turnout point rail and the tip of the turnout point rail is used as the abscissa, so as to draw the second curve under the damage state. Among them, when making the second curve under different damage states, the gain value of the flaw detection device can be kept fixed at all times and be the same as the gain value when making the first curve.
[0137] Similarly, in order to eliminate accidental errors, the above method can be repeated multiple times for each damage state to obtain multiple identical or similar second curves under the damage state, and then the final second curve under the damage state is determined based on the multiple identical or similar second curves.
[0138] Accordingly, the present application takes into account that the temperature change of the turnout rail will cause the amplitude of the ultrasonic guided wave to change, and then the amplitude of the reflected echo to change. Therefore, in the embodiment of the present invention, in the process of making the second curve under different damage states, the temperature of the turnout rail can be kept constant and the same as the temperature of the turnout rail corresponding to the first curve, that is, the same as the reference rail temperature corresponding to the first curve. And when the turnout rail to be tested is tested for damage detection, the temperature of the turnout rail to be tested needs to be determined in advance. If the temperature of the turnout rail to be tested is inconsistent with the temperature corresponding to the second curve, the maximum amplitude of the end face echo corresponding to the turnout rail to be tested needs to be temperature compensated, and the maximum amplitude after temperature compensation is compared with the second curve under the above-mentioned different damage states to determine the damage state of the turnout rail to be tested. The specific temperature compensation process is detailed in the above embodiment and will not be repeated here. Except for the first curve, each curve corresponds to a different damage state. The damage state can be determined by comparing the measured maximum damage amplitude with the curve.
[0139] In some embodiments, when determining the damage state of the switch point rail to be tested based on the damage echo in the reflected echo of the switch point rail to be tested, the damage position of the switch point rail to be tested, and the second curves under different damage states, it is possible to first
[0140] Based on the damage position on the turnout rail to be measured (the distance L between the damage on the turnout rail of the second curve and the tip of the turnout rail), and the second curve under different damage states, the maximum amplitude of the damage echo corresponding to the damage position of the turnout rail to be measured under different damage states is determined, and it is determined as the first amplitude;
[0141] Next, the maximum amplitude of the damaged echo in the reflected echo of the switch point rail to be tested is determined and determined as the second amplitude;
[0142] Then, from the first amplitudes under different damage states, the maximum value of each first amplitude smaller than the second amplitude and the minimum value of each first amplitude larger than the second amplitude are determined, that is, the maximum amplitude of the damage echo is compared with the second curve.
[0143] Finally, the damage state of the switch point rail to be tested is determined according to the damage state corresponding to the maximum value of each first amplitude smaller than the second amplitude and the damage state corresponding to the minimum value of each first amplitude larger than the second amplitude. Except for the first curve, each curve corresponds to a different damage state, and the damage state can be determined by comparing the measured maximum damage amplitude with the curve.
[0144] Here, it is considered that the damage state mainly includes the damage type and the damage size. When determining the maximum value among the first amplitudes smaller than the second amplitude from the first amplitudes under different damage states, the embodiment of the present invention can determine the maximum value among the first amplitudes smaller than the second amplitude for the second curves of the same damage type and different damage sizes. Correspondingly, for the second curves of the same damage type and different damage sizes, determine the minimum value among the first amplitudes greater than the second amplitude. There are two main types of damage: transverse spalling and cracks. The damage types are unified into hole equivalents of different pore sizes. Different hole equivalents correspond to different curves, and the damage type is judged while comparing the measured signal with the curve.
[0145] Among them, the second amplitude is greater than the first amplitude, which means that the damage size corresponding to the second amplitude is greater than the damage size corresponding to the first amplitude. The second amplitude is less than the first amplitude, which means that the damage size corresponding to the second amplitude is less than the damage size corresponding to the first amplitude.
[0146] In the embodiment of the present invention, based on the second curve of the same damage type and different damage sizes, the maximum value of each first amplitude smaller than the second amplitude and the minimum value of each first amplitude larger than the second amplitude can be determined, and then the damage size corresponding to the maximum value of each first amplitude smaller than the second amplitude and the damage size corresponding to the minimum value of each first amplitude larger than the second amplitude can be determined to determine the corresponding damage size when the damage of the turnout point rail to be measured belongs to the above damage type.
[0147] For example, see Figure 8, the distance between the damage of the turnout rail to be tested and the tip of the turnout rail to be tested is 8m. By comparing the maximum amplitude of the damage echo of the turnout rail to be tested with the second curve of the transverse peeling and falling block damage type and different damage sizes, it can be determined that the maximum amplitude of the damage echo of the turnout rail to be tested is greater than the maximum amplitude of the damage echo corresponding to the φ3mm hole equivalent, and less than the maximum amplitude of the damage echo corresponding to the φ6.33mm hole equivalent. It can be determined that when the damage of the turnout rail to be tested is transverse peeling and falling block damage, its damage hole equivalent is greater than φ3mm and less than φ6.33mm.
[0148] Accordingly, the maximum amplitude of the damage echo of the switch point rail to be tested can also be compared with the second curve of the crack damage type and different damage sizes to determine the damage size when the damage of the switch point rail to be tested is crack damage.
[0149] Through the above method, the damaged position of the switch point rail to be tested, as well as the possible damage type and its corresponding damage size can be effectively determined, so as to prompt the staff to check and repair it in time.
[0150] See also Fig. 9 In actual damage detection, the maximum amplitude of the end face echo of the turnout rail to be tested may be smaller than the maximum amplitude of the end face echo in the undamaged state. However, the maximum amplitude of the damage echo is smaller than the maximum amplitude of the corresponding damage echo under each damage state. This leads to the problem that the size of the damage cannot be accurately determined. This may be due to the fact that the gain value of the flaw detection device when making the first curve and the second curve is different from the gain value of the flaw detection device used when flaw detection is performed on the turnout rail to be tested. In order to further accurately determine the size of the damage, the reflected echo of the turnout rail to be tested can be amplified to further accurately determine the size of the damage. For specific methods, please refer to the following:
[0151] If the first amplitude under different damage states is greater than the second amplitude, the reflected echo of the switch point rail to be measured is amplified until the maximum amplitude of the end face echo in the reflected echo is equal to the preset amplitude in the first curve, and the amplified reflected echo is obtained (when the amplitude value of the end face echo of the tip touches a first curve, the amplification is stopped. The amplified second amplitude after the tip touches the first curve is taken as the amplified reflected echo); wherein the preset amplitude is the maximum amplitude of the end face echo corresponding to the current position of the flaw detection device set on the switch point rail to be measured in the undamaged state. The preset amplitude is in the first curve, and is indeed the amplitude of the tip. But it has nothing to do with the second amplitude, which is the amplitude of the damage echo.
[0152] See also Fig.10, the reflected echo of the turnout rail to be tested is amplified until the maximum amplitude of the end face echo reaches the maximum amplitude of the end face echo at the corresponding position in the first curve, and the amplified reflected echo is obtained. Here, the reflected echo of the turnout rail to be tested can be amplified by increasing the gain value of the flaw detection device (that is, multiplying the reflected echo of the turnout rail to be tested by a coefficient greater than 1).
[0153] Determine the maximum amplitude of the damaged echo in the amplified reflected echo, determine it as the new second amplitude, and jump to execute the steps of determining the maximum value of each first amplitude smaller than the second amplitude and the minimum value of each first amplitude larger than the second amplitude from the first amplitudes under different damage states, so as to determine the damage state of the switch point rail to be tested.
[0154] By increasing the gain value of the flaw detection device, the maximum amplitude of the damage echo can be increased, and the increased maximum amplitude is determined as the new second amplitude, and the step of respectively determining the maximum value of each first amplitude smaller than the second amplitude and the minimum value of each first amplitude larger than the second amplitude from the first amplitudes under different damage states is jumped again to determine the maximum value of each first amplitude smaller than the second amplitude and the minimum value of each first amplitude larger than the second amplitude; and the damage size of the switch point rail to be tested is determined according to the damage size corresponding to the maximum value of each first amplitude smaller than the second amplitude and the damage size corresponding to the minimum value of each first amplitude larger than the second amplitude.
[0155] For example, see Fig.11 By increasing the gain of the flaw detection device, the maximum amplitude of the damage echo of the switch point rail to be tested can be amplified. The maximum amplitude of the amplified damage echo is compared with the second curve of the transverse peeling and blocking damage type and different damage sizes. It can be determined that the maximum amplitude of the damage echo of the switch point rail to be tested is greater than the maximum amplitude of the damage echo corresponding to the φ6.33mm hole equivalent, and less than the maximum amplitude of the damage echo corresponding to the φ7.57mm hole equivalent. It can be determined that when the damage of the switch point rail to be tested is transverse peeling and blocking damage, its damage hole equivalent is greater than φ6.33mm and less than φ7.57mm.
[0156] Similarly, the maximum amplitude of the amplified damage echo is compared with the second curve of the crack damage type and different damage sizes, so as to determine the damage size of the switch point rail to be tested when the damage is crack damage.
[0157] The embodiment of the present invention also provides another method for determining the damage state when determining the damage state. The specific process is as follows:
[0158] For each damage type, a third curve corresponding to a first preset damage hole equivalent, a third curve corresponding to a second preset damage hole equivalent, and a third curve corresponding to a third preset damage hole equivalent are obtained respectively. The first preset damage hole equivalent is smaller than the second preset damage hole equivalent, and the second preset damage hole equivalent is smaller than the third preset damage hole equivalent. Here, the third curves corresponding to different damage hole equivalents are used to characterize the corresponding relationship between the damage position and the maximum amplitude of the damage echo under different damage hole equivalents.
[0159] Here, the third curve corresponding to the first preset damaged hole equivalent is the damage recording line, the third curve corresponding to the second preset damaged hole equivalent is the damage assessment line, and the third curve corresponding to the third preset damaged hole equivalent is the damage scrap line.
[0160] Exemplarily, the minimum damage hole equivalent may be determined as the first preset damage hole equivalent, the maximum damage hole equivalent may be determined as the third preset damage hole equivalent, and the medium damage hole equivalent may be determined as the second preset damage hole equivalent, wherein the medium damage hole equivalent is greater than the minimum damage hole equivalent and less than the maximum damage hole equivalent. Exemplarily, for the transverse spalling and chipping damage type, the minimum damage hole equivalent may be φ3mm. The medium damage hole equivalent may be φ5.65mm. The maximum damage hole equivalent may be φ7.57mm.
[0161] In the embodiment of the present invention, for the damage recording line, damage assessment line and damage scrapping line corresponding to each damage type, the maximum amplitude of the damage echo corresponding to the damaged position of the turnout point rail to be tested (i.e., the above-mentioned second amplitude) can be compared with the maximum amplitude at the corresponding position on the damage recording line, the damage assessment line and the damage scrapping line. If the second amplitude is smaller than the maximum amplitude at the corresponding position on the damage recording line, it is determined that there is no damage on the turnout point rail to be tested. If the second amplitude is greater than or equal to the maximum amplitude at the corresponding position on the damage recording line, and is smaller than the maximum amplitude at the corresponding position on the damage assessment line, it is determined that there is damage on the turnout point rail to be tested, and the damage is small.
[0162] If the second amplitude is greater than or equal to the maximum amplitude at the corresponding position on the damage assessment line, and less than the maximum amplitude at the corresponding position on the damage scrap line, it is determined that the damage on the turnout point rail to be tested is large, but has not yet reached the scrap level. If the second amplitude is greater than or equal to the maximum amplitude at the corresponding position on the damage scrap line, it is determined that the damage on the turnout point rail to be tested has reached the scrap level and needs to be stopped immediately.
[0163] The embodiment of the present invention provides a damage recording line, a damage assessment line and a damage rejection line corresponding to each damage type, which can determine the damage level of the point rail to be tested when the damage on the point rail to be tested belongs to the damage type, thereby helping the staff to quickly understand the damage degree of the point rail to be tested.
[0164] In a possible implementation, determining whether the switch point rail to be tested is damaged based on the end face echo and the first curve includes:
[0165] Acquire the current position of the flaw detection device disposed on the turnout point rail to be tested, and determine the maximum amplitude of the end face echo corresponding to the current position in a non-damaged state based on the current position and the first curve;
[0166] Performing temperature compensation on the end face echo of the switch rail to be measured to obtain a temperature compensated end face echo;
[0167] If the maximum amplitude of the temperature-compensated end face echo is smaller than the maximum amplitude of the end face echo corresponding to the current position, it is determined that the switch point rail to be tested is damaged.
[0168] In a possible implementation, temperature compensation is performed on the end face echo of the switch rail to be measured to obtain the temperature compensated end face echo, including:
[0169] Determine the temperature difference between the rail temperature of the turnout point rail to be measured and the reference rail temperature corresponding to the first curve;
[0170] Determine the amplitude compensation amount based on the temperature difference and a preset temperature compensation formula;
[0171] Based on the amplitude compensation amount, amplitude compensation is performed on the end face echo of the switch point rail to be measured to obtain a temperature compensated end face echo;
[0172] The preset temperature compensation formula includes a primary compensation formula and a secondary compensation formula; wherein the primary compensation formula includes: a compensation formula for temperature change to the flaw detection device, a compensation formula for temperature change to the coupling agent, and a compensation formula for temperature change to the turnout point rail;
[0173] The secondary compensation formula includes: compensation formula for the amplitude of the end face echo due to changes in the flaw detection device, changes in the coupling agent, and changes in the turnout point rail.
[0174] In a possible implementation manner, after determining whether the switch point rail to be tested is damaged, the method further includes:
[0175] If it is determined that the switch rail to be tested is damaged, determining a damage echo in the reflected echo of the switch rail to be tested according to the reflected echo of the switch rail to be tested;
[0176] Determining the damaged position of the turnout rail to be tested according to the damaged echo in the reflected echo of the turnout rail to be tested;
[0177] Acquire the second curves under different damage states, and determine the damage state of the turnout rail to be measured based on the damage echo in the reflected echo of the turnout rail to be measured, the damage position of the turnout rail to be measured, and the second curves under different damage states;
[0178] The second curves under different damage states are used to characterize the corresponding relationship between the damage position and the maximum amplitude of the damage echo on the turnout point rail under different damage states.
[0179] In a possible implementation, determining the damaged position of the switch rail to be tested according to the damaged echo in the reflected echo of the switch rail to be tested includes:
[0180] Determining the propagation time of the first ultrasonic waveguide corresponding to the end surface echo according to the end surface echo in the reflected echo of the turnout point rail to be measured;
[0181] Determining a second ultrasonic waveguide propagation time corresponding to the damage echo according to the damage echo in the reflected echo of the switch point rail to be measured;
[0182] According to the time difference between the propagation time of the first ultrasonic waveguide and the propagation time of the second ultrasonic waveguide, and the propagation speed of the ultrasonic guided wave, the distance between the damage of the switch point rail to be measured and the tip of the switch point rail to be measured is determined, and based on the distance, the damaged position of the switch point rail to be measured is determined.
[0183] In a possible implementation, determining the damage state of the turnout rail to be measured based on a damage echo in the reflected echo of the turnout rail to be measured, a damage position of the turnout rail to be measured, and a second curve under different damage states includes:
[0184] Based on the damage position on the switch point rail to be measured and the second curves under different damage states, the maximum amplitude of the damage echo corresponding to the damage position of the switch point rail to be measured under different damage states is determined, and the maximum amplitude is determined as the first amplitude;
[0185] Determine the maximum amplitude of the damaged echo in the reflected echo of the switch point rail to be tested, and determine it as the second amplitude;
[0186] From the first amplitudes in different damage states, respectively determine the maximum value among the first amplitudes that are smaller than the second amplitude, and the minimum value among the first amplitudes that are larger than the second amplitude;
[0187] The damage state of the switch point rail to be tested is determined according to the damage state corresponding to the maximum value of each first amplitude smaller than the second amplitude and the damage state corresponding to the minimum value of each first amplitude larger than the second amplitude.
[0188] In a possible implementation, the method further includes:
[0189] If the first amplitudes under different damage states are all greater than the second amplitudes, the reflected echo of the switch point rail to be tested is amplified until the maximum amplitude of the end face echo in the reflected echo is equal to the preset amplitude in the first curve, so as to obtain the amplified reflected echo; wherein the preset amplitude is the maximum amplitude of the end face echo corresponding to the current position of the flaw detection device set on the switch point rail to be tested in the non-damaged state;
[0190] Determine the maximum amplitude of the damage echo in the amplified reflected echo, determine it as a new second amplitude, and jump to execute the steps of determining the maximum value of each first amplitude smaller than the second amplitude and the minimum value of each first amplitude larger than the second amplitude from the first amplitudes under different damage states, so as to determine the damage state of the switch point rail to be tested.
[0191] In a possible implementation, determining the distance between the damage of the switch point rail to be measured and the tip of the switch point rail to be measured according to the time difference between the propagation time of the first ultrasonic waveguide and the propagation time of the second ultrasonic waveguide and the propagation speed of the ultrasonic guided wave includes:
[0192] according to Determine the distance between the damage of the switch rail to be tested and the tip of the switch rail to be tested;
[0193] Where L represents the distance between the damage of the switch rail to be tested and the tip of the switch rail to be tested, V represents the propagation speed of the ultrasonic guided wave, and T 1 represents the propagation time of the first ultrasonic waveguide, T 2 represents the propagation time of the second ultrasonic wave.
[0194] In this embodiment, the reflected echo of the turnout rail to be tested is obtained, and then, based on the reflected echo of the turnout rail to be tested, the end face echo in the reflected echo is determined; then, based on the end face echo and a preset first curve, it is determined whether the turnout rail to be tested is damaged. The first curve is used to characterize the correspondence between the position of the flaw detection device and the maximum amplitude of the end face echo on the turnout rail in an undamaged state. Among them, when the ultrasonic guided wave propagates inside the turnout rail, if it encounters damage inside the turnout rail, a part of the ultrasonic guided wave energy will be reflected in the form of a reflected wave, which weakens the ultrasonic guided wave energy reaching the tip of the turnout rail, thereby causing the maximum amplitude of the end face echo to decrease. The embodiment of the present invention determines whether the turnout rail to be tested is damaged by using the cross-sectional echo and the preset first curve, which can effectively improve the damage detection accuracy of the turnout rail to be tested.
[0195] In this embodiment, in order to improve the damage detection accuracy of the turnout point rail, the end face echo is determined based on the reflected echo generated by the ultrasonic guided wave reflected by the turnout point rail to be tested, and the maximum amplitude of the end face echo and the preset first curve are used to determine whether the turnout point rail to be tested is damaged. The first curve is used to characterize the correspondence between the position of the flaw detection device and the maximum amplitude of the end face echo on the turnout point rail in an undamaged state. When the ultrasonic guided wave propagates inside the turnout point rail, if it encounters damage inside the turnout point rail, it will cause the amplitude of the end face echo in the reflected echo to change. Therefore, in this application, based on the end face echo of the turnout point rail to be tested and the preset first curve, it is determined whether the turnout point rail to be tested is damaged, thereby effectively improving the damage detection accuracy of the turnout point rail to be tested.
[0196] Embodiment three:
[0197] Another embodiment of the present application relates to a damage detection device for a turnout rail. The implementation details of the damage detection device for the turnout rail of this embodiment are specifically described below. The following content is only for the convenience of understanding the implementation details, and is not necessary for the implementation of this solution. The damage detection device for the turnout rail of this embodiment includes an actual end face echo module, an actual flaw detection distance module, a damage state judgment module, and a damage state determination module; wherein,
[0198] An actual end face echo module, used for extracting the echo with the largest peak value from the actual reflected echo to obtain the actual end face echo;
[0199] An actual flaw detection distance module, used to obtain the distance between the actual flaw detection instrument and the tip to obtain the actual flaw detection distance;
[0200] A damage state judgment module, used for comparing the maximum amplitude of the reference end face echo at a reference flaw detection distance equal to the actual flaw detection distance determined from a preset first curve with the maximum amplitude of the actual end face echo; wherein the preset first curve is a functional relationship between a reference flaw detection distance between a reference flaw detection instrument and the tip and the maximum amplitude of the reference end face echo when the experimental turnout point rail is in a non-damaged state;
[0201] The damage state determination module is used to determine that the switch point rail to be tested is in a damaged state when the maximum amplitude of the actual end face echo is smaller than the maximum amplitude of the reference end face echo.
[0202] It is worth mentioning that the damage detection device for the turnout point rail described in this embodiment can be used to execute any step of the embodiment of the damage detection method for the turnout point rail described above. The modules involved in this embodiment are all logic modules. In practical applications, a logic unit can be a physical unit, or a part of a physical unit, or can be implemented as a combination of multiple physical units. In addition, in order to highlight the innovative part of this application, this embodiment does not introduce units that are not closely related to solving the technical problems proposed by this application, but this does not mean that there are no other units in this embodiment.
[0203] Embodiment 4:
[0204] Another embodiment of the present application relates to a damage detection device for a turnout point rail. The implementation details of the damage detection device for the turnout point rail of this embodiment are specifically described below. The following content is only for the convenience of understanding the implementation details, and is not necessary for the implementation of this solution. The damage detection device for the turnout point rail of this embodiment is as follows: Fig.12 As shown, it includes an acquisition module 111, a determination module 112 and a detection module 113.
[0205] The acquisition module 111 is used to acquire the reflected echo of the switch point rail to be tested; the reflected echo is generated by the ultrasonic guided wave emitted by the flaw detection device arranged on the switch point rail to be tested and reflected by the switch point rail to be tested;
[0206] A determination module 112, configured to determine an end face echo in the reflected echo based on the reflected echo of the turnout point rail to be measured;
[0207] The detection module 113 is used to obtain a preset first curve and determine whether the switch point rail to be tested is damaged based on the end face echo and the first curve;
[0208] The preset first curve is used to characterize the corresponding relationship between the position of the flaw detection device and the maximum amplitude of the end face echo on the turnout point rail in an undamaged state.
[0209] In a possible implementation, the detection module 113 is specifically configured to:
[0210] Acquire the current position of the flaw detection device disposed on the turnout point rail to be tested, and determine the maximum amplitude of the end face echo corresponding to the current position in a non-damaged state based on the current position and the first curve;
[0211] Performing temperature compensation on the end face echo of the switch rail to be measured to obtain the end face echo after temperature compensation;
[0212] If the maximum amplitude of the end face echo after temperature compensation is smaller than the maximum amplitude of the end face echo corresponding to the current position, it is determined that the switch point rail to be tested is damaged.
[0213] In a possible implementation, the detection module 113 is specifically configured to:
[0214] Determine the temperature difference between the rail temperature of the turnout point rail to be measured and the reference rail temperature corresponding to the first curve;
[0215] Based on the temperature difference and the preset temperature compensation formula, the amplitude compensation amount is determined;
[0216] Based on the amplitude compensation amount, the end face echo of the switch point rail to be measured is subjected to amplitude compensation to obtain the end face echo after temperature compensation;
[0217] The preset temperature compensation formula includes a primary compensation formula and a secondary compensation formula; wherein the primary compensation formula includes: a compensation formula for temperature change to the flaw detection device, a compensation formula for temperature change to the coupling agent, and a compensation formula for temperature change to the turnout point rail;
[0218] The secondary compensation formula includes: compensation formula for the amplitude of the end face echo due to changes in the flaw detection device, changes in the coupling agent, and changes in the turnout point rail.
[0219] In a possible implementation, the detection module 113 is further configured to:
[0220] If it is determined that the switch point rail to be tested is damaged, then according to the reflected echo of the switch point rail to be tested, a damaged echo in the reflected echo of the switch point rail to be tested is determined;
[0221] Determine the damaged position of the switch rail to be tested according to the damaged echo in the reflected echo of the switch rail to be tested;
[0222] Acquire the second curves under different damage states, and determine the damage state of the turnout rail to be measured based on the damage echo in the reflected echo of the turnout rail to be measured, the damage position of the turnout rail to be measured, and the second curves under different damage states;
[0223] The second curves under different damage states are used to characterize the corresponding relationship between the damage position and the maximum amplitude of the damage echo on the turnout point rail under different damage states.
[0224] In a possible implementation, the detection module 113 is specifically configured to:
[0225] Determine the propagation time of the first ultrasonic waveguide corresponding to the end face echo according to the end face echo in the reflected echo of the turnout point rail to be measured;
[0226] Determine the propagation time of the second ultrasonic waveguide corresponding to the damage echo according to the damage echo in the reflected echo of the switch point rail to be measured;
[0227] According to the time difference between the propagation time of the first ultrasonic waveguide and the propagation time of the second ultrasonic waveguide, and the propagation speed of the ultrasonic guided wave, the distance between the damage of the switch point rail to be measured and the tip of the switch point rail to be measured is determined, and based on the distance, the damaged position of the switch point rail to be measured is determined.
[0228] In a possible implementation, the detection module 113 is specifically configured to:
[0229] Based on the damage position on the switch point rail to be measured and the second curves under different damage states, the maximum amplitude of the damage echo corresponding to the damage position of the switch point rail to be measured under different damage states is determined, and it is determined as the first amplitude;
[0230] Determine the maximum amplitude of the damaged echo in the reflected echo of the switch point rail to be tested, and determine it as the second amplitude;
[0231] From the first amplitudes in different damage states, respectively determine the maximum value among the first amplitudes that are smaller than the second amplitude, and the minimum value among the first amplitudes that are larger than the second amplitude;
[0232] The damage state of the switch point rail to be tested is determined according to the damage state corresponding to the maximum value of each first amplitude smaller than the second amplitude and the damage state corresponding to the minimum value of each first amplitude larger than the second amplitude.
[0233] In a possible implementation, the detection module 113 is further configured to:
[0234] If the first amplitudes under different damage states are all greater than the second amplitudes, the reflected echo of the switch point rail to be measured is amplified until the maximum amplitude of the end face echo in the reflected echo is equal to the preset amplitude in the first curve, thereby obtaining the amplified reflected echo; wherein the preset amplitude is the maximum amplitude of the end face echo corresponding to the current position of the flaw detection device set on the switch point rail to be measured in the non-damaged state;
[0235] Determine the maximum amplitude of the damaged echo in the amplified reflected echo, determine it as the new second amplitude, and jump to execute the steps of determining the maximum value of each first amplitude smaller than the second amplitude and the minimum value of each first amplitude larger than the second amplitude from the first amplitudes under different damage states, so as to determine the damage state of the switch point rail to be tested.
[0236] In a possible implementation, the detection module 113 is specifically configured to:
[0237] according to Determine the distance between the damage of the switch rail to be tested and the tip of the switch rail to be tested;
[0238] Where L represents the distance between the damage of the switch rail to be tested and the tip of the switch rail to be tested, V represents the propagation speed of the ultrasonic guided wave, and T 1 represents the propagation time of the first ultrasonic waveguide, T 2 represents the second ultrasonic waveguide propagation time.
[0239] It is worth mentioning that the damage detection device for the turnout point rail described in this embodiment can be used to execute any step of the embodiment of the damage detection method for the turnout point rail described above. The modules involved in this embodiment are all logic modules. In practical applications, a logic unit can be a physical unit, or a part of a physical unit, or can be implemented as a combination of multiple physical units. In addition, in order to highlight the innovative part of this application, this embodiment does not introduce units that are not closely related to solving the technical problems proposed by this application, but this does not mean that there are no other units in this embodiment.
[0240] Embodiment five:
[0241] Another embodiment of the present application relates to an electronic device, comprising: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the damage detection method for the turnout point rail in the above-mentioned embodiments.
[0242] Among them, the memory and the processor are connected in a bus manner, and the bus may include any number of interconnected buses and bridges, and the bus connects various circuits of one or more processors and memories together. The bus can also connect various other circuits such as peripherals, voltage regulators, and power management circuits, which are well known in the art and are therefore not further described herein. The bus interface provides an interface between the bus and the transceiver. The transceiver can be one element or multiple elements, such as multiple receivers and transmitters, providing a unit for communicating with various other devices on a transmission medium. The data processed by the processor is transmitted on a wireless medium via an antenna, and further, the antenna also receives data and transmits the data to the processor.
[0243] The processor is responsible for managing the bus and general processing, and can also provide various functions, including timing, peripheral interfaces, voltage regulation, power management, and other control functions. Memory can be used to store data used by the processor when performing operations.
[0244] like Fig.13As shown, the electronic device 12 of this embodiment includes: a processor 120, a memory 121, and a computer program 122 stored in the memory 121 and executable on the processor 120. When the processor 120 executes the computer program 122, the steps in the above-mentioned embodiments of the damage detection method for the switch point rail are implemented, for example Figure 1 Alternatively, when the processor 120 executes the computer program 122, the functions of each module / unit in the above-mentioned device embodiments are realized, for example Fig.11 The functions of modules 111 to 113 are shown.
[0245] Exemplarily, the computer program 122 may be divided into one or more modules / units, which are stored in the memory 121 and executed by the processor 120 to implement the present invention. The one or more modules / units may be a series of computer program instruction segments capable of implementing specific functions, which are used to describe the execution process of the computer program 122 in the electronic device 12. For example, the computer program 122 may be divided into Figure 4 Modules / units 41 to 43 are shown.
[0246] The electronic device 12 may be a computing device such as a desktop computer, a notebook, a PDA, or a cloud server. The electronic device 12 may include, but is not limited to, a processor 120 and a memory 121. Those skilled in the art will appreciate that Fig.12 It is only an example of the electronic device 12 and does not constitute a limitation of the electronic device 12. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the electronic device may also include input and output devices, network access devices, buses, etc.
[0247] The processor 120 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.
[0248] The memory 121 may be an internal storage unit of the electronic device 12, such as a hard disk or memory of the electronic device 12. The memory 121 may also be an external storage device of the electronic device 12, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc. equipped on the electronic device 12. Further, the memory 121 may also include both an internal storage unit of the electronic device 12 and an external storage device. The memory 121 is used to store the computer program and other programs and data required by the electronic device. The memory 121 may also be used to temporarily store data that has been output or is to be output.
[0249] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.
[0250] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.
[0251] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.
[0252] In the embodiments provided by the present invention, it should be understood that the disclosed devices / electronic devices and methods can be implemented in other ways. For example, the device / electronic device embodiments described above are only schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.
[0253] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
[0254] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.
[0255] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium.
[0256] Embodiment six:
[0257] Another embodiment of the present application relates to a computer-readable storage medium storing a computer program, which implements the above method embodiment when executed by a processor.
[0258] That is, those skilled in the art can understand that all or part of the steps in the above-mentioned embodiment method can be completed by instructing the relevant hardware through a program, and the program is stored in a storage medium, including a number of instructions to enable a device (which can be a single-chip microcomputer, chip, etc.) or a processor to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (Read-Only Memory, referred to as: ROM), random access memory (Random Access Memory, referred to as: RAM), disk or optical disk and other media that can store program codes.
[0259] Those skilled in the art can understand that the above embodiments are specific embodiments for implementing the present application, and in practical applications, various changes can be made to them in form and detail without departing from the spirit and scope of the present application. The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit them; although the present invention is described in detail with reference to the above embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the above embodiments, or replace some of the technical features therein by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should be included in the protection scope of the present invention.
Claims
1. A method for detecting damage of a turnout point rail, characterized in that: The far rail end of the switch rail to be tested is provided with an actual flaw detection instrument, and the actual flaw detection instrument is used to transmit actual ultrasonic waves to the tip of the switch rail to be tested and receive actual reflected echoes. The damage detection method includes: Extracting the echo with the largest peak value from the actual reflected echo to obtain the actual end face echo; Acquiring the distance between the actual flaw detection instrument and the tip to obtain an actual flaw detection distance; Compare the maximum amplitude of the reference end face echo at the reference flaw detection distance equal to the actual flaw detection distance determined from the preset first curve with the maximum amplitude of the actual end face echo; wherein the preset first curve is the functional relationship between the reference flaw detection distance between the reference flaw detection instrument and the tip and the maximum amplitude of the reference end face echo when the experimental turnout point rail is in an undamaged state; When the maximum amplitude of the actual end face echo is smaller than the maximum amplitude of the reference end face echo, it is determined that the switch point rail to be tested is in a damaged state.
2. The damage detection method according to claim 1, characterized in that: The damage detection method further comprises: Acquire the actual rail temperature of the test turnout point rail, calculate the difference between the actual rail temperature and the reference rail temperature, and obtain the actual rail temperature difference; wherein the reference rail temperature is the temperature of the test turnout point rail when measuring the preset first curve; Based on a preset temperature compensation relationship, the amplitude compensation amount is calculated according to the actual track temperature difference; wherein the preset temperature compensation relationship is the relationship between the change in the temperature of the experimental turnout point rail and the change in the maximum amplitude of the reference end face echo of the experimental turnout point rail; The actual end face echo is compensated by using the amplitude compensation amount to obtain the actual end face echo after temperature compensation.
3. The damage detection method according to claim 1, characterized in that: The preset temperature compensation relationship includes several primary compensation formulas and secondary compensation formulas; the primary compensation formula is used to quantify the relationship between the change in performance of the preset environmental factor and the change in the temperature of the point rail of the experimental turnout point rail, and different primary compensation formulas quantify different performances of the preset environmental factors, and the secondary compensation formula is used to quantify the relationship between the change in performance of each of the preset environmental factors and the change in the maximum amplitude of the reference end face echo of the experimental turnout point rail.
4. The damage detection method according to claim 1, characterized in that: After the step of determining that the switch point rail to be tested is in a damaged state, the method further comprises: Extracting an echo that meets a preset damage feature from the actual reflected echo to obtain an actual damage echo; wherein the preset damage feature is an echo feature that distinguishes the actual damage echo from the actual end face echo; Detecting the time at the peak of the actual end face echo to obtain the first ultrasonic waveguide propagation time, and detecting the time at the peak of the actual damage echo to obtain the second ultrasonic waveguide propagation time; Based on the damage position calculation formula, the actual damage distance between the damage and the tip is calculated according to the propagation time of the first ultrasonic waveguide and the propagation time of the second ultrasonic waveguide; wherein the damage position calculation formula is as follows: Wherein, L represents the actual damage distance between the damage and the tip, V represents the propagation velocity of the ultrasonic guided wave, T1 represents the propagation time of the first ultrasonic guided wave, and T2 represents the propagation time of the second ultrasonic guided wave.
5. The damage detection method according to claim 4, characterized in that: After the step of determining that the switch point rail to be tested is in a damaged state, the method further comprises: Acquire a preset second curve under different preset damage states; wherein the preset second curve is a functional relationship between a preset damage distance between a preset damage and the tip and a maximum amplitude of the reference damage echo when the test turnout point rail is in the preset damage state; When the preset damage distance is the actual damage distance, the reference damage echo of the preset second curve whose maximum amplitude is closest to the maximum amplitude of the actual damage echo is selected to obtain an echo with similar damage degree, and determine that the damage degree of the turnout point rail to be measured is similar to the preset damage state of the preset second curve where the echo with similar damage degree is located.
6. The damage detection method according to claim 5, characterized in that: The method further comprises: When the maximum amplitude of the actual damage echo is smaller than the maximum amplitude of the reference damage echo of each of the preset second curves, amplifying the reflected echo until the maximum amplitude of the actual end face echo reaches the maximum amplitude of the reference end face echo when the reference flaw detection distance under the preset first curve is the actual flaw detection distance; Extracting an echo that meets the preset damage characteristics from the amplified reflected echo to obtain a calibrated damage echo; When the preset damage distance is the actual damage distance, the reference damage echo of the preset second curve whose maximum amplitude is closest to the maximum amplitude of the calibration damage echo is selected to obtain a degree-updated similar echo, and determine that the damage degree of the turnout point rail to be measured is similar to the preset damage state of the preset second curve where the degree-updated similar echo is located.
7. The damage detection method according to claim 4, characterized in that: The method further comprises: Obtaining a preset third curve under different preset damage equivalents; wherein the preset third curve is a functional relationship between a preset damage distance between a preset damage and the tip and a maximum amplitude of a reference damage echo of the experimental turnout point rail under the preset damage equivalent; When the preset damage distance is the actual damage distance, the maximum amplitude of the actual damage echo is compared with the maximum amplitude of the reference damage echo of each of the preset third curves to determine the damage level of the turnout point rail to be tested. The damage level is determined by dividing the intervals using the maximum amplitude of each of the reference damage echoes.
8. A damage detection device for a turnout point rail, characterized in that: The far rail end of the switch rail to be tested is provided with an actual flaw detection instrument, and the actual flaw detection instrument is used to transmit actual ultrasonic waves to the tip of the switch rail to be tested and receive actual reflected echoes. The damage detection device includes: An actual end face echo module, used for extracting the echo with the largest peak value from the actual reflected echo to obtain the actual end face echo; An actual flaw detection distance module, used to obtain the distance between the actual flaw detection instrument and the tip to obtain the actual flaw detection distance; A damage state judgment module, used for comparing the maximum amplitude of the reference end face echo at a reference flaw detection distance equal to the actual flaw detection distance determined from a preset first curve with the maximum amplitude of the actual end face echo; wherein the preset first curve is a functional relationship between a reference flaw detection distance between a reference flaw detection instrument and the tip and the maximum amplitude of the reference end face echo when the experimental turnout point rail is in a non-damaged state; The damage state determination module is used to determine that the switch point rail to be tested is in a damaged state when the maximum amplitude of the actual end face echo is smaller than the maximum amplitude of the reference end face echo.
9. An electronic device, characterized in that: include: at least one processor; as well as, a memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the damage detection method for the turnout point rail as described in any one of claims 1 to 7.
10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the damage detection method for a turnout point rail according to any one of claims 1 to 7 is implemented.