Automatic chip test head detection device of mechanical arm

Abstract

The invention relates to the technical field of detection devices, in particular to a mechanical arm automatic chip test head detection device. According to the technical scheme, the computer case comprises a bottom plate used for supporting, a case base is fixedly arranged on the upper surface of the bottom plate, and a stand column body is fixedly arranged on the upper surface of the case base; the silver feeding guide rail is fixedly arranged on one side of the stand column body, a sliding block is arranged on the silver feeding guide rail in a sliding mode, a first step arm assembly is arranged at one end of the sliding block in a clamped mode, and a second step arm assembly is rotationally arranged at one end of the first step arm assembly; and the testing head assembly is arranged at one end of the second-stage arm assembly and is used for detecting the clasped brake block. The chip testing head can be accurately positioned and fixed, it is ensured that the testing head cannot move in the detection process, and therefore the detection precision is effectively improved. Meanwhile, the automatic operation of the mechanical arm can quickly complete the detection process, so that the time loss of manual operation is reduced, and the detection efficiency is greatly improved.

Description

Technical Field

[0001] The present invention relates to the technical field of detection devices, and in particular to a robot arm automated chip test head detection device. Background Art

[0002] As the chip industry is booming, the functions of chips are becoming more and more complex, and the degree of integration is constantly rising, which puts strict requirements on the detection of chip test heads. As a key link in ensuring chip quality, the accuracy and efficiency of chip test heads directly affect the performance and production efficiency of chips. Existing chip test head detection methods mostly use fixed detection devices. In this way, the detection equipment is fixed in position and can only detect a few specific positions of the test head. It is like being restricted to work in a small space and it is difficult to reach every corner of the chip test head. As the chip size gradually decreases and the internal structure becomes more and more sophisticated, the shortcomings in comprehensive detection are becoming more and more prominent. A large number of potential defects cannot be discovered in time, resulting in an increased risk of defective chips entering the market. Manual operation is not only slow, but also operators are prone to fatigue after working for a long time, resulting in an increase in operational errors, further slowing down the detection process, which not only increases production costs, but also makes it difficult to meet the market's urgent demand for chips.

[0003] To this end, the present invention proposes a robot arm automated chip test head detection device. Summary of the invention

[0004] The purpose of the present invention is to address the problem that a chip test head detection method in the background technology mostly adopts a fixed detection device. In this method, the detection equipment is fixed in position and can only detect a limited number of specific positions of the test head. It is like being restricted to work in a small space and it is difficult to reach every corner of the chip test head. As the chip size gradually shrinks and the internal structure becomes more and more sophisticated, the shortcomings in the comprehensiveness of detection become more and more prominent. A large number of potential defects cannot be discovered in time, resulting in an increased risk of defective chips entering the market. Manual operation is not only slow, but also the operator is prone to fatigue after working for a long time, resulting in an increase in operational errors, further slowing down the detection process, which not only increases production costs, but also makes it difficult to meet the market's urgent demand for chips. A robotic arm automated chip test head detection device is proposed.

[0005] The technical solution of the present invention: A robotic arm automated chip test head detection device, comprising: a base plate for support, a chassis base is fixedly provided on the upper surface of the base plate, a column body is fixedly provided on the upper surface of the chassis base; an upper silver guide rail is fixedly provided on one side of the column body, a slider is slidably provided on the upper silver guide rail, a first-step arm assembly is clamped on one end of the slider, a second-step arm assembly is rotatably provided on one end of the first-step arm assembly; a test head assembly is provided at one end of the second-step arm assembly for detecting the clamping brake block.

[0006] Optionally, the first step arm assembly includes a slider connecting plate clamped at one end of the slider, a group of first rotating joint supports are fixedly arranged on one side of the slider connecting plate, a first rotating shaft is rotatably arranged between the first rotating joint supports, a group of joint seats are sleeved on the outer wall of the first rotating shaft, a joint center balance block is fixedly arranged between the joint seats, one end of the joint center balance block is sleeved with the first rotating shaft, a first rotating shaft locking assembly for limiting is arranged at one end of the first rotating shaft, a large diameter thrust bearing is penetrated at one end of the joint seat, a second rotating shaft is rotatably arranged between the large diameter thrust bearings, and a second rotating shaft locking assembly for limiting is sleeved at one end of the second rotating shaft.

[0007] Optionally, the second-step arm assembly includes a second joint seat that is sleeved on the outer wall of the large-diameter thrust bearing, a third rotating shaft is rotatably arranged at one end of the second joint seat, a second rotating joint support is sleeved on the outer wall of the third rotating shaft, a third rotating shaft locking assembly for limiting the second joint seat is arranged on one side of the second rotating joint support, and the third rotating shaft locking assembly is sleeved on the second joint seat.

[0008] Optionally, the test head assembly includes a dividing plate base fixedly arranged at one end of the second rotating joint support, a plurality of plunger mounting blocks are clamped on the outer wall of the dividing plate base, a fixed position plunger is arranged on one side of the plunger mounting block, a large diameter dividing plate is fixedly arranged on one side of the dividing plate base, a rotating column is arranged on one side of the large diameter dividing plate, a large diameter tapered bearing is installed inside the rotating column, a large diameter bearing pressure plate is arranged on one side of the large diameter tapered bearing, a cylindrical locating pin is arranged on one side of the large diameter bearing pressure plate, and a brake clamping assembly is fixedly arranged on the side wall of the dividing plate base.

[0009] Optionally, the first rotating shaft locking assembly, the second rotating shaft locking assembly and the third rotating shaft locking assembly have the same structure and include a locking block, one side of the locking block is provided with a mounting hole, one side of the locking block is provided with a handle mounting position, and the handle mounting position is internally threadedly connected to a handle.

[0010] Optionally, the brake clamping assembly includes a brake clamping block, which is clamped with the large-diameter dividing plate, a mounting connection hole is provided on one side of the brake clamping block, and a handle mounting hole is provided on one side of the brake clamping block.

[0011] Optionally, the bottom surface of the base plate is provided with a plurality of foot cups and universal wheels.

[0012] Optionally, an integrated bracket is fixedly provided on one side of the column body, and a slider limit block is fixedly provided on the other side.

[0013] Optionally, a top cover plate is fixedly disposed on the top of the column body.

[0014] Optionally, a guide rail clamp is fixedly provided on the side of the slider connecting plate, and a lower limit positioning quick-plug is fixedly provided on one side of the slider connecting plate.

[0015] Compared with the prior art, the present invention has the following beneficial technical effects:

[0016] The present invention can realize flexible movement and precise positioning of the test head assembly in multiple dimensions by setting the silver guide rail, slider and multi-stage arm assembly. The multi-axis rotation design of the first-stage arm assembly and the second-stage arm assembly enables the test head to easily reach various detection positions of the chip test head. Compared with the traditional fixed detection method, the comprehensiveness and accuracy of the detection are greatly improved.

[0017] Furthermore, the present invention can accurately position and fix the chip test head through the structures such as the indexing plate base and the large-diameter indexing plate in the test head assembly, in conjunction with the fixed position plunger and other components, to ensure that the test head will not be displaced during the detection process, thereby effectively improving the detection accuracy. At the same time, the automated operation of the robotic arm can quickly complete the detection process, reducing the time loss of manual operation and greatly improving the detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 A schematic structural diagram of a robot arm automated chip test head detection device of the present invention is given;

[0019] Figure 2 The present invention is given Figure 1 A schematic diagram of the connection structure of the first-stage arm assembly, the second-stage arm assembly, and the test head assembly;

[0020] Figure 3 The present invention is given Figure 2 Schematic diagram of the structure of the first-stage arm assembly;

[0021] Figure 4 The present invention is given Figure 2 The schematic diagram of the structure of the second-stage arm assembly;

[0022] Figure 5 The present invention is given Figure 2 A schematic diagram of the structure of the test head assembly;

[0023] Figure 6 The present invention is given Figure 3 and Figure 4 A schematic diagram of the structure of the first rotating shaft locking assembly, the second rotating shaft locking assembly and the third rotating shaft locking assembly;

[0024] Figure 7 The present invention is given Figure 5 Schematic diagram of the structure of the brake clamping assembly.

[0025] Reference numerals:

[0026] 1. Bottom plate; 2. Chassis base; 3. Column body; 4. Hiwin guide rail; 5. Slider;

[0027] 6. First-stage arm assembly; 61. Slider connecting plate; 62. First rotary joint support; 63. First rotary axis; 64. Joint seat; 65. Joint center balance block; 66. First rotary axis locking assembly; 67. Large-diameter thrust bearing; 68. Second rotary axis; 69. Second rotary axis locking assembly;

[0028] 7. Second-stage arm assembly; 71. Second joint seat; 72. Third rotation axis; 73. Second rotation joint support; 74. Third rotation axis locking assembly;

[0029] 8. Test head assembly; 81. Indexing plate base; 82. Plunger mounting block; 83. Fixed position plunger; 84. Large diameter indexing plate; 85. Rotating column; 86. Large diameter tapered bearing; 87. Large diameter bearing pressure plate; 88. Cylindrical positioning pin; 89. Brake clamping assembly; 891. Brake clamping block; 892. Mounting connection hole; 893. Handle mounting hole;

[0030] 91. Locking block; 92. Mounting hole; 93. Handle mounting position; 94. Handle;

[0031] 10. Foot cup; 11. Universal wheel; 12. Integrated bracket; 13. Slider limit block; 14. Top cover; 15. Guide rail clamp; 16. Lower limit positioning quick plug. DETAILED DESCRIPTION

[0032] The technical solution of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0033] The components of the embodiments of the present invention generally described and shown in the drawings herein may be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the present invention.

[0034] Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in the field without making any creative work shall fall within the scope of protection of the present invention.

[0035] In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", and "third" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.

[0036] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0037] Example

[0038] like Figure 1 and Figure 2As shown, a robot arm automated chip test head detection device proposed by the present invention comprises: a base plate 1 for support, a chassis base 2 is fixedly arranged on the upper surface of the base plate 1, and a column body 3 is fixedly arranged on the upper surface of the chassis base 2. The base plate 1 is the basic support structure of the entire device, which provides a stable installation platform for the entire detection device. A plurality of foot cups 10 and universal wheels 11 are arranged on its bottom surface. The foot cups 10 mainly play the role of stable support, stably placing the device on the work surface, avoiding displacement of the device due to vibration or other external forces during the test process, and ensuring the accuracy and safety of the test; the universal wheels 11 provide convenience for the movement of the device. When the device needs to be adjusted or moved to a different test area, the device can be easily pushed, which improves the mobility and flexibility of the device. The chassis base 2, as an intermediate component connecting the base plate 1 and the column body 3, plays the role of transition and bearing, ensuring that the column body 3 can be firmly installed on the base plate 1. The column body 3 is an important supporting structure of the device. One side of the column body 3 is fixedly provided with an integrated bracket 12, which can provide an installation position for other auxiliary equipment or components to achieve the integration of different functional components; the other side is fixedly provided with a slider limit block 13, which can limit the sliding range of the slider 5, prevent the slider 5 from exceeding the predetermined range during the sliding process, and ensure the safety and stability of the entire mechanical arm movement; the top of the column body 3 is fixedly provided with a top cover plate 14, which plays a role in protecting the internal structure of the column, preventing dust and debris from entering the interior of the column, and can also enhance the overall structural strength of the column to a certain extent. The upper silver guide rail 4 is fixedly provided on one side of the column body 3, and the slider 5 is slidably provided on the upper silver guide rail 4. The upper silver guide rail 4 provides a precise linear motion guide for the sliding of the slider 5, ensuring that the slider 5 moves along the preset linear trajectory, thereby driving the subsequent mechanical arm components to make precise position adjustments. One end of the slider 5 is clamped with a first-stage arm assembly 6, and the slider 5, as a component connecting the upper silver guide rail 4 and the first-stage arm assembly 6, transmits the linear motion to the first-stage arm assembly 6. A second-stage arm assembly 7 is rotatably provided at one end of the first-stage arm assembly 6; a test head assembly 8 is provided at one end of the second-stage arm assembly 7 for testing the clamping brake block.

[0039] like Figure 2 and Figure 3As shown, the first-stage arm assembly 6 includes a slider connecting plate 61 that is clamped and arranged at one end of the slider 5. A group of first rotating joint supports 62 are fixedly arranged on one side of the slider connecting plate 61. The slider connecting plate 61 acts as a bridge connecting the slider 5 and other components of the first-stage arm assembly 6, and transmits the force and movement from the slider 5 to subsequent components. A first rotating shaft 63 is rotatably arranged between the first rotating joint supports 62. The first rotating joint supports 62 provide rotating support for the first rotating shaft 63, so that the first rotating shaft 63 can rotate around its own axis. A group of joint seats 64 are sleeved on the outer wall of the first rotating shaft 63. A joint center balance block 65 is fixedly arranged between the joint seats 64. The joint seats 64 provide support and connection basis for the rotation of the first-stage arm. One end of the joint center balance block 65 is sleeved with the first rotating shaft 63. The main function of the joint center balance block 65 is to balance the center of gravity of the first-stage arm during the rotation process, avoid unstable rotation due to center of gravity offset, and ensure the stability and reliability of the first-stage arm in the rotation operation. One end of the first rotating shaft 63 is provided with a first rotating shaft locking assembly 66 for limiting. The first rotating shaft locking assembly 66 can lock the first rotating shaft 63 when needed to prevent it from unnecessary rotation, ensure the stability of the first step arm at a specific position, and improve the test accuracy and safety. A large-diameter thrust bearing 67 is provided through one end of the joint seat 64, and a second rotating shaft 68 is rotatably provided between the large-diameter thrust bearings 67. The large-diameter thrust bearings 67 can withstand large axial and radial loads, provide reliable support and smooth rotation conditions for the rotation of the second rotating shaft 68, and ensure that the second rotating shaft 68 will not get stuck or damaged due to the large load during the rotation process. One end of the second rotating shaft 68 is sleeved with a second rotating shaft locking assembly 69 for limiting. Its function is similar to that of the first rotating shaft locking assembly 66, and is used to lock the second rotating shaft 68 to ensure that the relative position between the second step arm and the first step arm can be kept fixed when needed.

[0040] like Figure 2 and Figure 4As shown, the second-stage arm assembly 7 includes a second joint seat 71 sleeved on the outer wall of the large-warp thrust bearing 67, and a third rotating shaft 72 is rotatably provided at one end of the second joint seat 71. The second joint seat 71 is an important supporting and connecting component of the second-stage arm assembly 7, and the second-stage arm is connected to the first-stage arm through the large-warp thrust bearing 67. The outer wall of the third rotating shaft 72 is sleeved with a second rotating joint support 73, and the third rotating shaft 72 enables the second-stage arm to perform a rotating motion relative to the second joint seat 71, thereby achieving a more flexible posture adjustment of the second-stage arm. A third rotating shaft locking assembly 74 for limiting the second joint seat 71 is provided on one side of the second rotating joint support 73. The third rotating shaft locking assembly 74 is sleeved on the second joint seat 71, and the rotation of the second-stage arm can be limited by the third rotating shaft locking assembly 74, so as to ensure that the second-stage arm remains in the desired position during the test operation, and to avoid position displacement caused by external force or other factors, thereby affecting the test results.

[0041] like Figure 2 and Figure 5 As shown, the test head assembly 8 includes a dividing plate base 81 fixedly arranged at one end of the second rotating joint support 73. The dividing plate base 81 is the installation base of the test head assembly, and the test head assembly is fixed on the second-stage arm assembly 7. The outer wall of the dividing plate base 81 is provided with a plurality of plunger mounting blocks 82, and a fixed position plunger 83 is provided on one side of the plunger mounting block 82. The plunger mounting block 82 can provide a clamping installation position for other components, and the fixed position plunger 83 can position and fix other components to ensure the relative position relationship between different components and ensure the accuracy and stability during the test. A large-diameter dividing plate 84 is fixedly arranged on one side of the dividing plate base 81, and a rotating column 85 is provided on one side of the large-diameter dividing plate 84. The large-diameter dividing plate 84 may be used to accurately control the rotation angle of the test head, realize chip testing at different angles, and improve the coverage and accuracy of the test. A large-diameter tapered bearing 86 is installed inside the rotating column 85. The large-diameter tapered bearing 86 provides support and smooth rotation conditions for the rotation of the rotating column 85. It has the ability to withstand large axial and radial loads, ensuring the stability and reliability of the rotating column 85 during the rotation process. A large-diameter bearing pressure plate 87 is provided on one side of the large-diameter tapered bearing 86, and a cylindrical positioning pin 88 is provided on one side of the large-diameter bearing pressure plate 87. The large-diameter bearing pressure plate 87 is mainly used to fix and clamp the large-diameter tapered bearing 86 to ensure the normal operation of the bearing. The cylindrical positioning pin 88 can position other components to ensure assembly accuracy. A brake clamping assembly 89 is fixedly provided on the side wall of the dividing plate base 81. The brake clamping assembly 89 can clamp the large-diameter dividing plate 84 when necessary to prevent it from rotating, ensuring that the position of the test head remains stable during the test operation to avoid test errors caused by rotation.

[0042] like Figure 3 , Figure 4 and Figure 6 As shown, the first rotating shaft locking assembly 66, the second rotating shaft locking assembly 69 and the third rotating shaft locking assembly 74 have the same structure and include a locking block 91, a mounting hole 92 is provided on one side of the locking block 91, a handle mounting position 93 is provided on one side of the locking block 91, the locking block 91 provides basic structural support for the locking assembly, the mounting hole 92 can be used to install the locking assembly on the corresponding rotating shaft, the internal thread of the handle mounting position 93 is connected to a handle 94, and the locking and unlocking operations of the corresponding rotating shaft can be conveniently achieved by operating the handle 94, which provides a convenient operation method for the operator and improves the operability and ease of use of the equipment.

[0043] like Figure 5 and Figure 7 As shown, the brake clamping assembly 89 includes a brake clamping block 891, which is clamped with the large-diameter dividing plate 84. The brake clamping block 891 is a component that is in direct contact with the large-diameter dividing plate 84 to realize the clamping function. A mounting connection hole 892 is provided on one side of the brake clamping block 891. The mounting connection hole 892 can be used to install other components related to the clamping operation, such as transmission components for connecting the clamping force, etc. A handle mounting hole 893 is provided on one side of the brake clamping block 891, on which a handle can be installed to facilitate the operator to manually operate the brake clamping block 891 to clamp and release.

[0044] In addition, a guide rail clamp 15 is fixedly provided on the side of the slider connecting plate 61. The guide rail clamp 15 can brake the movement of the slider 5 when necessary to stop it at the current position, thereby ensuring that the slider 5 remains stable during certain operations; a lower limit positioning quick plug 16 is fixedly provided on one side of the slider connecting plate 61. The lower limit positioning quick plug 16 can accurately position the lower limit position of the slider 5, thereby ensuring that the slider 5 does not exceed the lower limit position during the sliding process, thereby avoiding collision between the slider 5 and other components or causing damage to the equipment.

[0045] The working principle of this embodiment is as follows: first, through the cooperation of the upper silver guide rail 4 and the slider 5, the linear motion of the robot arm in the vertical direction is realized, and the height of the detection device can be adjusted to meet the detection requirements of the chip test head at different height positions.

[0046] The first rotating axis 63 and the second rotating axis 68 in the first-stage arm assembly 6, and the third rotating axis 72 in the second-stage arm assembly 7, constitute a multi-axis rotating system. Through the different angle combinations of these three rotating axes, the test head assembly 8 can reach any position and posture in three-dimensional space, thereby realizing all-round detection of the chip test head.

[0047] The first rotating shaft locking assembly 66, the second rotating shaft locking assembly 69 and the third rotating shaft locking assembly 74 can fix the rotating shafts after adjusting their angles, thereby ensuring the stability of the robot arm during the detection process and avoiding the accuracy of the detection result being affected by the shaking of the robot arm.

[0048] The indexing plate base 81 and the large-diameter indexing plate 84 in the test head assembly 8, in conjunction with the fixed position plunger 83, can accurately position and fix the chip test head. During the testing process, components such as the large-diameter tapered bearing 86, the large-diameter bearing pressure plate 87 and the cylindrical positioning pin 88 ensure the stability and accuracy of the test head assembly 8 itself.

[0049] The brake clamping block 891 in the brake clamping assembly 89 can firmly clamp the chip test head by clamping with the large-diameter dividing plate 84, thereby preventing the chip test head from being displaced during the detection process and ensuring the reliability of the detection result.

[0050] In addition, the foot cup 10 and universal wheel 11 on the bottom surface of the base plate 1 allow the device to be moved by the universal wheel when it needs to be moved. After reaching the appropriate position, the height of the foot cup 10 can be adjusted to stably fix the device on the workbench. The integrated bracket 12 on one side of the column body 3 can be used to install other auxiliary equipment, and the slider limit block 13 on the other side can prevent the slider 5 from exceeding the limit position during movement, thereby protecting the equipment. The top cover plate 14 on the top of the column body 3 can prevent debris from falling into the equipment and affecting the normal operation of the equipment. The guide rail clamp 15 on the side of the slider connecting plate 61 can fix the slider 5 on the guide rail when needed, and the lower limit positioning quick plug 16 on one side of the slider connecting plate 61 can be used to determine the lower limit position of the slider 5 to ensure the safety and stability of the equipment operation.

[0051] The above specific embodiment is only an optional embodiment of the present invention. Based on the technical solution of the present invention and the relevant inspiration of the above embodiment, those skilled in the art can make various alternative improvements and combinations to the above specific embodiment.

Claims

1. A robotic arm automated chip test head detection device, characterized in that: include: A base plate (1) for supporting, a chassis base (2) being fixedly arranged on the upper surface of the base plate (1), and a column body (3) being fixedly arranged on the upper surface of the chassis base (2); An upper silver guide rail (4) is fixedly arranged on one side of the column body (3), a slider (5) is slidably arranged on the upper silver guide rail (4), a first-step arm assembly (6) is clamped and arranged at one end of the slider (5), and a second-step arm assembly (7) is rotatably arranged at one end of the first-step arm assembly (6); A test head assembly (8) is arranged at one end of the second-stage arm assembly (7) and is used for testing the clamping brake block.

2. The robot arm automated chip test head detection device according to claim 1, characterized in that: The first step arm assembly (6) comprises a slider connecting plate (61) which is clamped on one end of the slider (5); a group of first rotating joint supports (62) are fixedly arranged on one side of the slider connecting plate (61); a first rotating shaft (63) is rotatably arranged between the first rotating joint supports (62); a group of joint seats (64) are sleeved on the outer wall of the first rotating shaft (63); a joint center balance block (65) is fixedly arranged between the joint seats (64); one end of the joint center balance block (65) is sleeved with the first rotating shaft (63); a first rotating shaft locking assembly (66) for limiting position is arranged at one end of the first rotating shaft (63); a large diameter thrust bearing (67) is penetrated through one end of the joint seat (64); a second rotating shaft (68) is rotatably arranged between the large diameter thrust bearings (67); a second rotating shaft (68) is sleeved on one end of the second rotating shaft (68) for limiting position.

3. The robot arm automated chip test head detection device according to claim 2, characterized in that: The second step arm assembly (7) comprises a second joint seat (71) sleeved on the outer wall of the large diameter thrust bearing (67); a third rotating shaft (72) is rotatably provided at one end of the second joint seat (71); a second rotating joint support (73) is sleeved on the outer wall of the third rotating shaft (72); a third rotating shaft locking assembly (74) for limiting the second joint seat (71) is provided on one side of the second rotating joint support (73); and the third rotating shaft locking assembly (74) is sleeved on the second joint seat (71).

4. The robot arm automated chip test head detection device according to claim 3, characterized in that: The test head assembly (8) includes a dividing plate base (81) fixedly arranged at one end of the second rotating joint support (73), a plurality of plunger mounting blocks (82) are clamped on the outer wall of the dividing plate base (81), a fixed position plunger (83) is arranged on one side of the plunger mounting block (82), a large diameter dividing plate (84) is fixedly arranged on one side of the dividing plate base (81), a rotating column (85) is arranged on one side of the large diameter dividing plate (84), a large diameter tapered bearing (86) is installed inside the rotating column (85), a large diameter bearing pressure plate (87) is arranged on one side of the large diameter tapered bearing (86), a cylindrical positioning pin (88) is arranged on one side of the large diameter bearing pressure plate (87), and a brake clamping assembly (89) is fixedly arranged on the side wall of the dividing plate base (81).

5. The robot arm automated chip test head detection device according to claim 4, characterized in that: The first rotating shaft locking assembly (66), the second rotating shaft locking assembly (69) and the third rotating shaft locking assembly (74) have the same structure and include a locking block (91), a mounting hole (92) is provided on one side of the locking block (91), a handle mounting position (93) is provided on one side of the locking block (91), and a handle (94) is connected to the internal thread of the handle mounting position (93).

6. The robot arm automated chip test head detection device according to claim 5, characterized in that: The brake clamping assembly (89) comprises a brake clamping block (891), the brake clamping block (891) is clamped with the large-diameter dividing plate (84), a mounting connection hole (892) is provided on one side of the brake clamping block (891), and a handle mounting hole (893) is provided on one side of the brake clamping block (891).

7. The robot arm automated chip test head detection device according to claim 1, characterized in that: The bottom surface of the bottom plate (1) is provided with a plurality of foot cups (10) and universal wheels (11).

8. The robot arm automated chip test head detection device according to claim 1, characterized in that: An integrated bracket (12) is fixedly provided on one side of the column body (3), and a slider limit block (13) is fixedly provided on the other side.

9. The robot arm automated chip test head detection device according to claim 1, characterized in that: A top cover plate (14) is fixedly arranged on the top of the column body (3).

10. The robot arm automated chip test head detection device according to claim 2, characterized in that: A guide rail clamp (15) is fixedly provided on the side of the slider connecting plate (61), and a lower limit positioning quick plug (16) is fixedly provided on one side of the slider connecting plate (61).

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