Anti-stabbing structure, electronic equipment and electronic equipment anti-stabbing method
By setting conductive parts on the periphery of the encryption unit of the electronic device and triggering the encryption link short-circuit alarm when the probe is pierced, the shortcomings in preventing physical spikes in the prior art are solved, and an efficient and reliable spike-proof effect is achieved.
Patent Information
- Application Number
- CN202411998798.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-31
- Publication Date
- 2025-04-18
AI Technical Summary
When the prior art prevents electronic devices from obtaining encrypted information through physical spy, there are problems such as affecting heat dissipation, increasing weight and cost, high computing resources consumption, risk of cracking, complex structure, affecting signal integrity, increasing power consumption, high false alarm rate and easy to be destroyed.
A piercing-proof structure is designed, including arranging a first conductive member and a second conductive member on the outer periphery of the encryption unit on the main board, the first conductive member is electrically connected to the encryption link, and the second conductive member is grounded. When the probe penetrates from the outer circumference, a short circuit is formed between the conductive members, triggering an encryption link alarm.
It realizes that without affecting the performance of electronic equipment, effectively prevents physical spiking behavior, improves safety and reliability, reduces the misjudgment rate and failure rate, and avoids the problem of excessive equipment costs.
Smart Images

Figure CN119848945A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of information security protection technology, and in particular to an anti-peek structure, an electronic device, and an anti-peek method for an electronic device. Background Art
[0002] Electronic devices containing encrypted information, such as POS machines, often face various security threats in actual use, and the most common one is to obtain the encrypted information inside through physical probing. The physical probing process is to penetrate the shell with a probe or other probing tool and make the probe contact the electronic components containing encrypted information.
[0003] In order to reduce the risk of physical probing of devices to obtain encrypted information, existing protection methods generally include physical shielding, encryption algorithms, signal obfuscation, sensor monitoring, and coating protection. Among them, physical shielding will affect the heat dissipation of electronic components, while increasing weight and cost. Encryption algorithms require a large amount of computing resources and have potential vulnerabilities such as the risk of being cracked. Signal obfuscation will increase the complexity of the structure and affect the signal integrity of the electronic device itself. Sensor monitoring refers to monitoring probing behavior around electronic components or monitoring electrical signals such as current. On the one hand, it will also increase the power consumption of the device, and on the other hand, its false alarm rate is high. Coating protection is easily damaged and its protection effect is limited. Summary of the invention
[0004] In view of this, the purpose of the present application is to provide an anti-peek structure, an electronic device and an anti-peek method for an electronic device, so as to solve all or part of the above problems.
[0005] In order to achieve the above technical objectives, the first aspect of the present application provides an anti-penetration structure, including: a main board;
[0006] An encryption unit is provided on the main board;
[0007] On the main board, a first conductive member and a second conductive member are sequentially arranged on the periphery of the encryption unit;
[0008] One of the first conductive member and the second conductive member is electrically connected to an encryption link, and the other is grounded. When a probe inserted from the outer periphery of the encryption unit contacts the first conductive member and the second conductive member, the encryption link alarms.
[0009] Further, the first conductive member and the second conductive member include a leaky copper structure;
[0010] The copper leakage structure is covered with a conductive layer.
[0011] Furthermore, a plurality of the first conductive members and a plurality of the second conductive members are arranged on the periphery of the encryption unit;
[0012] A plurality of the first conductive members are arranged at intervals and connected to each other through a conductive layer;
[0013] A plurality of the second conductive members are arranged at intervals and connected to each other through a conductive layer.
[0014] Furthermore, a plurality of the first conductive members and a plurality of the second conductive members are arranged on the periphery of the encryption unit;
[0015] A plurality of the first conductive members are arranged at intervals;
[0016] A plurality of the second conductive members are arranged at intervals;
[0017] The separation distance between two adjacent first conductive members is smaller than a preset distance;
[0018] The separation distance between two adjacent second conductive members is smaller than a preset distance.
[0019] Furthermore, the first conductive member and the second conductive member are alternately arranged on the main board.
[0020] Furthermore, the outer periphery of the encryption unit is provided with a first conductive member and a second conductive member;
[0021] The first conductive member is disposed around the outer circumference of the encryption unit;
[0022] The second conductive element is disposed around the outer circumference of the first conductive element.
[0023] Furthermore, the first conductive member is electrically connected to the encrypted link, and the second conductive member is grounded.
[0024] Furthermore, the conductive layer is a tin layer.
[0025] A second aspect of the present application provides an electronic device, comprising any of the anti-peek structures described above.
[0026] A third aspect of the present application is a method for preventing electronic equipment from being pried into, comprising:
[0027] S1. Arrange a first conductive member and a second conductive member in sequence on the periphery of the encryption unit;
[0028] S2. Electrically connect one of the first conductive member and the second conductive member to an encryption link, and ground the other one, so that when a probe inserted from the outer periphery of the encryption unit contacts the first conductive member and the second conductive member, the encryption link alarms.
[0029] It can be seen from the above technical scheme that the present application provides an anti-peek structure, an electronic device and an anti-peek method for an electronic device; wherein the anti-peek structure comprises: a main board; an encryption unit is arranged on the main board; on the main board, a first conductive member and a second conductive member are sequentially arranged on the periphery of the encryption unit; one of the first conductive member and the second conductive member is electrically connected to an encryption link, and the other is grounded, and when a probe inserted from the periphery of the encryption unit contacts the first conductive member and the second conductive member, the encryption link alarms.
[0030] In this solution, the first conductive member and the second conductive member can be arranged in the direction where the encryption unit may be probed; when the probing person attempts to probe with a tool, as the probing tool gradually goes deeper, the probing tool will connect the first conductive member and the second conductive member, causing the encryption link to short-circuit, thereby causing circuit abnormality and triggering an alarm mechanism, thereby exposing the probing behavior.
[0031] The anti-peek structure provided by this solution is compatible with the other protection methods mentioned above, and when used alone, it will not cause problems such as poor heat dissipation of the encryption unit, increased equipment weight, algorithm vulnerabilities or risk of being cracked, impact on the encryption unit's own signal, high false alarm rate or easy destruction, and has a wider applicability. BRIEF DESCRIPTION OF THE DRAWINGS
[0032] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.
[0033] Figure 1 A schematic diagram of an anti-penetration structure provided in an embodiment of the present application;
[0034] Figure 2 A schematic diagram of the arrangement of the first conductive member and the second conductive member of an anti-probing structure provided in an embodiment of the present application;
[0035] In the figure: 10, main board; 11, encryption unit; 12, first conductive member; 13, second conductive member. DETAILED DESCRIPTION
[0036] The technical solutions of the embodiments of the present application will be described clearly and completely below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the specification of the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection requested by the present application.
[0037] In the description of the embodiments of the present application, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, which are only for the convenience of describing the embodiments of the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the embodiments of the present application. In addition, the terms "first", "second", and "third" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance.
[0038] In the description of the embodiments of the present application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a replaceable connection, or an integral connection, it can be a mechanical connection, it can be an electrical connection, it can be a direct connection, it can be indirectly connected through an intermediate medium, and it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the embodiments of the present application can be understood according to specific circumstances.
[0039] See also Figure 1 In the first aspect of the embodiment of the present application, an anti-spying structure is provided, including: a main board 10; an encryption unit 11 is arranged on the main board 10. The encryption unit 11 refers to a device or area containing encrypted information and requiring anti-spying, such as an IC card holder, a key pad, etc.
[0040] On the main board 10, a first conductive member 12 and a second conductive member 13 are sequentially arranged on the periphery of the encryption unit 11. Among them, the first conductive member 12 and the second conductive member 13 are arranged in the direction of the encryption unit 11 to be probed; specifically, the direction of being probed refers to the direction in which the encryption unit 11 may be physically probed by a probe or other probing tool; for example, the main board 10 is arranged in a shell whose front end face, left end face and rear end face are all sealed by welding or the like, then the right end face of the shell, that is, the right end face of the encryption unit 11 is the direction of being probed. In actual application, in the device where the anti-probing structure is actually applied, which directions of the encryption unit 11 are the ways of being probed, the staff can judge according to the existing technology. That is, in this embodiment, the first conductive member 12 and the second conductive member 13 are arranged in the direction in which the encryption unit 11 may be probed. As an anti-probing structure, the possible probing directions of the first conductive member 12 and the second conductive member 13 are arranged have different options according to different usage scenarios, specifically, the two can protect the encryption unit 11 in the possible probing direction.
[0041] The first conductive member 12 and the second conductive member 13 are isolated from each other on the mainboard 10, that is, there is no direct electrical connection between the two. In this embodiment, one of the first conductive member 12 and the second conductive member 13 is electrically connected to the encryption link, and the other is grounded. The encryption link refers to the link on the mainboard for alarm. Grounding refers to the ground wire connected to the reference ground in the device.
[0042] When the probe is inserted into the outer peripheral direction of the encryption unit 11, as the probe or other probing tools penetrate deeper, the probe will contact the first conductive member 12 and the second conductive member 13 before contacting the encryption unit 11, so that the probing tool, the first conductive member 12 and the second conductive member 13 form a complete loop, thereby causing the encryption link to short-circuit and cause a circuit abnormality alarm, notifying the system of the existence of probing behavior. Among them, the circuit abnormality alarm will send an alarm signal, which can be a sound signal, a photoelectric signal, an information signal, etc. The anti-probing structure provided in this embodiment does not require complex hardware or software support, has the advantages of simple manufacturing, and is more widely applicable; and, through the combination of the first conductive member 12 and the second conductive member 13, when the probing behavior occurs, the alarm mechanism can be triggered in time, with high sensitivity, low misjudgment rate and failure rate, so it is more reliable. At the same time, the first conductive member 12 and the second conductive member 13 are easy to obtain, so it will not cause excessive equipment cost burden.
[0043] As an implementation, see Figure 2 A first conductive member 12 and a second conductive member 13 are arranged on the periphery of the encryption unit 11; the first conductive member 12 is arranged around the periphery of the encryption unit 11. Correspondingly, the second conductive member 13 is arranged around the periphery of the first conductive member 12, so that the first conductive member 12 and the second conductive member 13 can provide anti-peek protection for the encryption unit 11 from all directions, thereby improving the effectiveness of the protection.
[0044] In one embodiment, the first conductive member 12 is electrically connected to the encryption link; the second conductive member 13 is grounded. Since the first conductive member 12 is closer to the encryption unit 11 than the second conductive member 13, in this embodiment, the encryption link can be set at a position closer to the encryption unit 11, so that the grounded second conductive member 13 can play a certain protective role on the first conductive member 12 connected to the encryption link, so that the encryption link has a better protection effect.
[0045] It should be noted that a chip is provided on the mainboard 10. At the same time, the chip is electrically connected to the encryption unit 11. When the encryption link is short-circuited, the chip can stop the operation of the encryption unit 11 or the encryption unit 11 and the nearby area after receiving its alarm signal.
[0046] See also Figure 1 and Figure 2, the second conductive member 13 is arranged on the periphery of the first conductive member 12. When the probing tool gradually goes deeper and closer to the encryption unit 11, the probing tool will first contact the second conductive member 13 and be grounded, and then when the probing tool contacts the first conductive member 12, the encryption link can be immediately grounded and short-circuited.
[0047] As an embodiment, the first conductive member 12 and the second conductive member 13 include a copper leak structure. The copper leak structure is covered with a conductive layer. In practical applications, the method of opening a copper leak as a signal point in the direction where the encryption unit 11 may be probed is easy to implement and has the effect of simple processing.
[0048] In one embodiment, on the main board 10, an encryption link and a grounding line are arranged on the periphery of the encryption unit 11; the first conductive member 12 can be formed by setting a copper leakage area on the encryption link; and the second conductive member 13 can be formed by setting a copper leakage area on the grounding line.
[0049] As an embodiment, the conductive layer may be a tin layer. The tin layer may be made of silver solder or other alloy solders, which have good fluidity and wettability and are helpful in forming a uniform tin layer. In addition, the tin layer can enhance the conductivity and mechanical properties of the first conductive member 12 and the second conductive member 13.
[0050] In one embodiment, a plurality of first conductive members 12 and a plurality of second conductive members 13 are disposed on the periphery of the encryption unit 11; the plurality of first conductive members 12 are disposed at intervals and connected to each other through a conductive layer; the plurality of second conductive members 13 are disposed at intervals and connected to each other through a conductive layer. That is, in this embodiment, the plurality of first conductive members 12 are connected to each other through a conductive layer to form a continuous region; the plurality of first conductive members 12 are connected to each other through a conductive layer to form a continuous region.
[0051] The anti-peek structure provided in this embodiment can, in the actual production process, first open multiple copper leakage areas on the mainboard 10, and then cover the conductive layer by soldering and other processes, so that the first conductive component 12 is connected into one piece and the second conductive component 13 is connected into one piece, thereby achieving comprehensive protection of the encryption unit 11.
[0052] In another embodiment, a plurality of first conductive members 12 and a plurality of second conductive members 13 are arranged on the periphery of the encryption unit 11; the plurality of first conductive members 12 are arranged at intervals; the plurality of second conductive members 13 are arranged at intervals; the separation distance between two adjacent first conductive members 12 is less than a preset distance; the separation distance between two adjacent second conductive members 13 is less than or equal to a preset distance.
[0053] In this embodiment, the isolation distance refers to the insulation distance between two conductive members. Taking the first conductive member 12 as an example, when no conductive layer is provided on the first conductive member 12, the isolation distance between two adjacent first conductive members 12 refers to the spacing between two adjacent first conductive members 12. When a conductive layer is provided on the first conductive member 12, the isolation distance between two adjacent first conductive members 12 refers to the spacing between the conductive layers between two adjacent first conductive members 12.
[0054] In this embodiment, the preset distance may be 0.5 mm. The inventors have found that in this embodiment, setting the separation distance of the first conductive members 12 and the separation distance of the second conductive members 13 to be less than 0.5 mm can ensure that the existing physical probing tools will contact the first conductive member 12 and the second conductive member 13 when passing through the first conductive member 12 or the second conductive member 13, thereby triggering the short circuit of the encrypted link.
[0055] In practical applications, the inventors have found that the thickness of the conductive layer is preferably between 20 and 50 microns. Within this thickness range, the tin layer has good conductivity and mechanical strength while meeting the feasibility of the manufacturing process.
[0056] In practical applications, after the tin layer is coated, it is necessary to use detection tools to perform size detection, appearance detection and effect verification to ensure that the thickness of the tin layer meets the requirements, thereby achieving an effective anti-penetration function. Among them, the tools for size detection and appearance detection can be, for example, a microscope or a thickness measuring instrument.
[0057] In one embodiment, the plurality of first conductive elements 12 and the plurality of second conductive elements 13 are alternately disposed on the main board 10 .
[0058] The staggered arrangement of the first conductive members 12 and the second conductive members 13 can reduce the number of copper leakage structures that need to be arranged, and in the presence of a separation distance, this embodiment can improve the fault tolerance of the conductive layer arrangement.
[0059] Specifically, in the case of staggered setting, when there is a separation distance that does not meet the preset distance requirement, the probe may still trigger an abnormality in the encrypted link after contacting the encryption unit 11. For example, if there is a separation distance on the second conductive member 13 that does not meet the preset distance, and the probe happens to pass through this place, due to the staggered setting, as the probe goes deeper, the probe will inevitably contact the first conductive member 12, and after the probe contacts the encryption unit 11, the probe will electrically connect the encryption unit 11 and the first conductive member 12, thereby triggering an abnormality in the encrypted link, so that the encrypted link can also trigger an alarm.
[0060] In one embodiment, the width of the first conductive member 12 is 0.5 mm to 1 mm, and / or the width of the second conductive member 13 is 1 mm to 2 mm. The widths of the first conductive member 12 and the second conductive member 13 refer to their dimensions in the direction of approaching and moving away from the encryption unit 11.
[0061] In application, the inventors found that the width of the first conductive member 12 is between 0.5 mm and 1 mm, which can ensure that the probe can trigger a short circuit when it contacts the first conductive member 12 without affecting the normal circuit function. The width of the second conductive member 13 is between 1 mm and 2 mm, which can increase the probability of probe contact and improve the reliability of anti-probing.
[0062] It should be noted that the lengths of the first conductive member 12 and the second conductive member 13 can be set according to actual application requirements. Preferably, the second conductive member 13 is longer than the first conductive member 12, and the second conductive member 13 covers the periphery of the first conductive member 12 to ensure that the probe contacts the second conductive member 13 first.
[0063] An embodiment of a second aspect of the present application provides an electronic device, comprising the anti-peek structure in any one of the above embodiments.
[0064] Among them, the electronic devices may be, for example, mobile payment terminals (such as POS machines), encryption modules inside automated teller machines (ATMs), encryption communication devices, bank cards with chips, encryption modules of industrial automation controllers, pinpads, etc.
[0065] The third aspect of the present application provides an electronic device anti-peek method, including:
[0066] S1, sequentially arrange a first conductive member 12 and a second conductive member 13 on the periphery of the encryption unit 11;
[0067] S2. Electrically connect one of the first conductive member 12 and the second conductive member 13 to the encryption link, and ground the other one, so that when the probe inserted from the outer periphery of the encryption unit 11 contacts the first conductive member 12 and the second conductive member 13, the encryption link alarms.
[0068] The anti-peek method provided in this embodiment can be used to prepare the anti-peek structure in any of the above embodiments to achieve effective and reliable protection for the encryption unit 11.
[0069] As a further improvement, after step S1, the following steps are further included:
[0070] S11, providing a conductive layer on the first conductive member 12 and the second conductive member 13;
[0071] S12, detecting whether the thickness of the conductive layer meets the first preset size requirement, and if not, issuing a first alarm signal.
[0072] In this embodiment, the first preset size requirement is 20 to 50 microns. That is, the thickness of the conductive layer meets the first preset requirement if it is within the range of 20 to 50 microns. By testing the thickness of the conductive layer, it can be ensured that the conductive layer has good mechanical properties, can meet the manufacturing process requirements, and does not affect the installation of the mainboard 10 on the device.
[0073] As a further improvement, after step S1, the following steps are further included:
[0074] S13, detecting whether the spacing size of the conductive layer meets the second preset size requirement, and if not, issuing a second alarm signal;
[0075] In this embodiment, the first conductive member 12 and the second conductive member 13 each include a plurality of conductive members; detecting the spacing size of the conductive layer includes detecting the spacing between adjacent conductive layers on the plurality of first conductive members 12 and detecting the spacing between adjacent conductive layers on the plurality of second conductive members 13. In this embodiment, the second preset size requirement may be the above-mentioned preset distance.
[0076] By detecting the spacing size of the conductive layer, it can be ensured that the first conductive member 12 and the second conductive member 13 can effectively protect the encryption unit 11 .
[0077] The above are only preferred embodiments of the present application and are not intended to limit the present invention. Although the present application has been described in detail with reference to the examples, those skilled in the art can still modify the technical solutions recorded in the aforementioned examples or make equivalent substitutions for some of the technical features therein. However, any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application should be included in the protection scope of the present application.
Claims
1. An anti-penetration structure, characterized in that: include: Mainboard (10); The main board (10) is provided with an encryption unit (11); On the main board (10), a first conductive member (12) and a second conductive member (13) are sequentially arranged on the periphery of the encryption unit (11); One of the first conductive member (12) and the second conductive member (13) is electrically connected to an encryption link, and the other is grounded. When a probe inserted from the outer circumference of the encryption unit (11) contacts the first conductive member (12) and the second conductive member (13), the encryption link alarms.
2. The anti-penetration structure according to claim 1, characterized in that: The first conductive member (12) and the second conductive member (13) comprise a copper leakage structure; The copper leakage structure is covered with a conductive layer.
3. The anti-penetration structure according to claim 2, characterized in that: A plurality of the first conductive members (12) and a plurality of the second conductive members (13) are arranged on the periphery of the encryption unit (11); A plurality of the first conductive members (12) are arranged at intervals and connected to each other via a conductive layer; A plurality of the second conductive members (13) are arranged at intervals and connected to each other via a conductive layer.
4. The anti-penetration structure according to claim 2, characterized in that: A plurality of the first conductive members (12) and a plurality of the second conductive members (13) are arranged on the periphery of the encryption unit (11); A plurality of the first conductive members (12) are arranged at intervals; A plurality of the second conductive members (13) are arranged at intervals; The separation distance between two adjacent first conductive members (12) is smaller than a preset distance; The separation distance between two adjacent second conductive members (13) is smaller than a preset distance.
5. The anti-penetration structure according to claim 4, characterized in that: The first conductive member (12) and the second conductive member (13) are arranged alternately on the main board (10).
6. The anti-penetration structure according to claim 2, characterized in that: The outer periphery of the encryption unit (11) is provided with a first conductive member (12) and a second conductive member (13); The first conductive member (12) is arranged around the outer circumference of the encryption unit (11); The second conductive member (13) is arranged around the outer circumference of the first conductive member (12).
7. The anti-penetration structure according to any one of claims 1 to 6, characterized in that: The first conductive member (12) is electrically connected to the encrypted link, and the second conductive member (13) is grounded.
8. The anti-penetration structure according to claim 2, characterized in that: The conductive layer is a tin layer.
9. An electronic device, characterized in that: The invention comprises the anti-penetration structure according to any one of claims 1 to 8.
10. A method for preventing electronic equipment from being pried into, characterized in that: include: S1. Arranging a first conductive member (12) and a second conductive member (13) in sequence on the periphery of the encryption unit (11); S2. Electrically connect one of the first conductive member (12) and the second conductive member (13) to the encryption link, and ground the other, so that when a probe inserted from the outer periphery of the encryption unit (11) contacts the first conductive member (12) and the second conductive member (13), the encryption link alarms.