Detector retraining method of optical measurement assembly

Abstract

The invention discloses a detector retraining method for an optical measurement assembly, and the method specifically comprises the steps: enabling the optical measurement assembly to enter a retraining process when the imaging of a detector in the optical measurement assembly is abnormal; closing an imaging function of the detector, and reconfiguring a clock of the detector to enable the detector to enter a configuration state; calling the configuration data from the optical measurement assembly, configuring the detector, and enabling the detector to generate training data; traversing the configuration data in the optical measurement assembly, and judging whether the training data reaches a condition for ending a re-training process or not; and when the training data reaches the condition of ending the retraining process, restarting the imaging function of the detector.

Description

Technical Field

[0001] The present invention relates to the field of aerospace technology, and in particular to a detector retraining method of an optical measurement component. Background Art

[0002] As more and more scholars and engineers study space exploration technology, the functions and performance of spacecraft have been greatly optimized and improved. Satellites are one of the key spacecraft to achieve space exploration missions and are widely used in space environment detection, disaster prevention and mitigation, and various scientific experiments. As one of the important components required for satellites, optical measurement components can provide high-precision inertial attitude measurement information. Optical measurement components rely on detectors to obtain space image information, thereby realizing subsequent image processing and other functions.

[0003] However, the space environment is complex and changeable, which places higher demands on the reliability and safety of optical measurement components. As an important input data source for optical measurement components, the normal operation of the detector is the basis for the optical measurement components to achieve their intended functions. Obviously, if the data provided by the detector is wrong, the image processing data output by the optical measurement component will no longer be accurate. Therefore, a method is needed to ensure the reliability of data transmission of optical measurement components. Summary of the invention

[0004] The purpose of the present invention is to provide a detector retraining method for an optical measurement assembly, thereby improving the safety and reliability of the optical measurement assembly during on-orbit operation.

[0005] In order to achieve the above object, the present invention provides a detector retraining method of an optical measurement component, the specific steps of which include:

[0006] Step 1: The detector imaging in the optical measurement component is abnormal, so that the optical measurement component enters the retraining process;

[0007] Step 2, turning off the imaging function of the detector, reconfiguring the clock of the detector, and making the detector enter the configuration state;

[0008] Step 3, retrieving configuration data from the optical measurement component, configuring the detector, and enabling the detector to generate training data;

[0009] Step 4, traverse the configuration data in the optical measurement component and determine whether the training data meets the conditions for ending the retraining process; when the training data meets the conditions for ending the retraining process, restart the imaging function of the detector.

[0010] Optionally, the training data includes:

[0011] Detector status information, generated by the detector, which can indicate a normal working state or an abnormal imaging state of the detector;

[0012] The training progress is represented by 4-byte wide data, which divides the detector training progress process into 11 stages;

[0013] The number of training times is the number of times the detector operates according to the configuration data.

[0014] Optionally, the stages of the training progress include: start training, wait for power supply, clock configuration, SPI configuration, wait for stability, bit alignment, word alignment, channel alignment, wait for interaction, training completion, and normal imaging.

[0015] Optionally, the condition for ending the retraining process is that the training progress is normal imaging and the detector state information is a normal working state.

[0016] Optionally, the detector is capable of collecting optical signals sent by the object under test and converting the optical signals into electrical signals; the detector also includes a low voltage differential signal interface for transmitting electrical signals.

[0017] Optionally, the optical measurement assembly is capable of transmitting an image to a ground workbench, and the optical measurement assembly further comprises:

[0018] The optical measurement chip is connected to the detector by two-way signals, receives the detector status information and electrical signals sent by the detector, and can generate a drive signal set to transmit to the detector to configure the detector;

[0019] The optical measurement processor is connected to the optical measurement chip via a bidirectional signal, receives a request signal sent by the optical measurement chip, calls configuration data, and transmits the configuration data to the optical measurement chip;

[0020] A memory, connected to the optical measurement processor by signal, stores configuration data of a plurality of groups of detectors, and transmits the configuration data to the optical measurement processor;

[0021] The data transmission device is connected to the optical measurement chip and the ground workbench by signals, transmits the instructions of the ground workbench to the optical measurement chip, and transmits the electrical signals of the detector received by the optical measurement chip to the ground workbench, so that the ground workbench can receive the image.

[0022] Optionally, the optical measurement chip comprises:

[0023] A clock management unit, connected to the detector signal, generates different clock frequencies and adjusts the phase of the clock signal to reduce delays and errors in the signal transmission process;

[0024] Random access memory can temporarily store the electrical signals sent by the detector.

[0025] Optionally, in step 3, the optical measurement chip sends a configuration request to the optical measurement processor; the optical measurement processor retrieves a set of configuration data of the detector from the memory, and then transmits the set of configuration data to the optical measurement chip; the optical measurement chip converts the set of configuration data into an optical signal, and transmits the optical signal corresponding to the set of configuration data as a drive signal set to the detector, thereby completing the configuration of the detector;

[0026] The detector operates according to the set of configuration data to generate training data, and sends the training data to the optical measurement chip; the optical measurement chip forwards the training data to the ground workbench through the data transmission device, and the ground workbench records the set of configuration data and its corresponding training data.

[0027] Optionally, in step 2, the clock signal of the clock management unit in the optical measurement chip is converted from a low level to a high level, and the clock signal is transmitted to the detector to reconfigure the clock of the detector and control the synchronization of the detector and the optical measurement chip.

[0028] Optionally, in step 1, when the optical measurement chip receives detector status information, and the detector status information indicates that the detector is in an abnormal imaging state, the optical measurement chip sends a detector retraining instruction to the ground workbench through the data transmission device; when the optical measurement chip receives the confirmation retraining instruction sent by the ground workbench through the data transmission device, the optical measurement component will enter the retraining process.

[0029] Compared with the prior art, the technical solution of the present invention has at least the following beneficial effects:

[0030] The present invention adds a detector retraining function to the optical measurement component, detects the detector status information of the detector to determine the operating status of the detector, and starts the detector retraining process when the detector is in an abnormal imaging state, thereby ensuring rapid diagnosis and repair of detector faults in the retraining process, allowing the optical measurement component to quickly restore the image processing function after the detector is abnormal, thereby improving the safety and reliability of the optical measurement component during on-orbit operation.

[0031] The present invention ensures stable signal transmission between the detector and the optical measurement chip by reconfiguring the detector clock in the retraining process; and divides the detector retraining process into 11 stages, records the stage of the retraining process corresponding to the configuration data in the training data generated after the detector is configured, and then sends the training data to a ground workbench, so that the ground workbench can judge the fault of the detector according to the training stage in the training data; at the same time, by traversing the configuration data in the retraining process, the fault of the detector can be quickly repaired, and the optical measurement component can be quickly diagnosed and modified. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 It is a structural diagram of the optical measurement component in the present invention.

[0033] Figure 2 The present invention is a flowchart of a detector retraining method of an optical measurement component.

[0034] In the figure, 1-detector, 2-optical measurement chip, 3-optical measurement processor, 4-memory, 5-data transmission device. DETAILED DESCRIPTION

[0035] The technical solution of the present invention will be described clearly and completely below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0036] In the description of the present invention, it should be noted that the terms "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", and "third" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.

[0037] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0038] like Figure 1 As shown, the optical measurement component is installed on the satellite, which can detect space images and transmit the images to the ground workbench to realize the transmission of star map information. The optical measurement component includes: a detector 1, an optical measurement chip 2, an optical measurement processor 3, a memory 4, and a data transmission device 5.

[0039] The detector 1 can generate detector status information to reflect the working status of the detector 1; and the detector 1 can collect the optical signal sent by the measured object and convert the optical signal into an electrical signal. The optical measurement chip 2 is connected to the detector in a bidirectional signal manner, and can receive the detector status information and the electrical signal containing the image information sent by the detector 1; the optical measurement chip 2 is a chip based on FPGA (Field Programmable Gate Array) technology, which can dynamically adjust the optical signal, and generate a drive signal set according to the detector status information and transmit it to the detector 1 to realize the configuration of the detector 1. The optical measurement processor 3 communicates bidirectionally with the optical measurement chip 2 through the SPI register, can receive the request signal sent by the optical measurement chip 2, call the configuration data, and transmit the configuration data to the optical measurement chip 2. The memory 4 adopts FLASH flash memory technology, is connected to the optical measurement processor 3 by signal, can store several groups of configuration data of the detector 1, and transmit the configuration data to the optical measurement processor 3. The data transmission device 5 is connected to the optical measurement chip 2 and the ground workbench in a bidirectional signal manner, can transmit the indication of the ground workbench to the optical measurement chip 2, and transmits the electrical signal of the detector 1 received by the optical measurement chip 2 to the ground workbench, so that the ground workbench can receive the image.

[0040] Furthermore, the optical measurement chip 2 includes: a clock management unit (DCM) and a random access memory (BRAM). The clock management unit is connected to the detector 1 signal, and can generate different clock frequencies, and adjust the phase of the clock signal to reduce the delay and error in the signal transmission process. The random access memory can temporarily store the image data sent by the detector 1 (i.e., the electrical signal sent by the detector 1).

[0041] Furthermore, the detector 1 includes a low voltage differential signal (LVDS) interface for transmitting electrical signals, so that image data can be transmitted between the detector 1 and the optical measurement chip 2 efficiently, quickly and stably.

[0042] like Figure 2As shown, the present invention provides a detector retraining method for an optical measurement component. When the optical detection component starts working, the detector 1 sends the detector status information to the optical measurement chip 2, and the optical measurement chip 2 determines the working state of the detector 1 according to the detector status information. When the detector 1 is in an abnormal imaging state, the optical measurement component enters the retraining process. At this time, the detector 1 sends the detector status information to the optical measurement chip 2; the optical measurement chip 2 processes the detector status information, generates a configuration request (i.e., reads the SPI register signal), and sends the configuration request to the optical measurement processor 3; the optical measurement processor 3 retrieves a set of configuration data from the memory 4 according to the configuration request, and sends the configuration data to the optical measurement chip 2, and then the optical measurement chip 2 converts the configuration data into an optical signal, and generates a drive signal set and sends it to the detector 1; the detector 1 executes the drive signal set, adjusts the configuration parameters of the detector 1, and trains the detector 1.

[0043] Repeat the above process to traverse the configuration data, and send the detector status information sent by the detector 1 to the optical measurement chip 2 to the ground workbench through the data transmission device 5, and the ground workbench records the training data of the detector 1 until the detector 1 is in normal working state. When the detector 1 is working normally, the detector 1 receives the optical signal of the object to be measured, converts it into an electrical signal, and then sends it to the optical measurement chip 2; the optical measurement chip 2 filters and de-noises the electrical signal, and forwards the processed electrical signal to the ground workbench through the data transmission device 5, so that the ground workbench obtains a real-time image of the object to be measured.

[0044] Specifically, the detector retraining method of the optical measurement assembly specifically includes:

[0045] Step 1: The detector imaging is abnormal, causing the optical measurement component to enter the retraining process.

[0046] When the detector 1 starts working, the detector 1 sends the detector status information to the optical measurement chip 2. The detector status information is a binary variable, including: normal working state and abnormal imaging state; when the detector 1 is in the normal working state, the detector status information is 0; when the detector 1 is in the abnormal imaging state, the detector status information is 1.

[0047] When the detector 1 is in an abnormal imaging state, the detector state information of the detector 1 is 1, and the detector state information is sent to the optical measurement chip 2. The detector state information received by the optical measurement chip 2 changes from 0 to 1 (that is, the detector 1 changes from a normal working state to an abnormal imaging state), and sends a detector retraining instruction to the ground workbench through the data transmission device 5. When the optical measurement chip 2 receives the confirmation retraining instruction sent by the ground workbench through the data transmission device 5, the optical measurement component will enter the retraining process.

[0048] Step 2, reconfigure the detector's clock.

[0049] When the optical measurement component enters the retraining process, the detector 1 is powered off and then powered on again to complete the initialization of the configuration data in the detector 1 and turn off the imaging function of the detector 1.

[0050] After the optical measurement chip 2 receives the confirmation retraining instruction, the clock signal of the clock management unit in the optical measurement chip 2 changes from 0 to 1, indicating that the clock signal is converted from a low level to a high level, and the clock signal is transmitted to the detector 1, so that the clock of the detector 1 is reconfigured, and the detector 1 is controlled to be synchronized with the optical measurement chip 2, ensuring that the signal transmission between the detector 1 and the optical measurement chip 2 is correct. At this time, the detector 1 enters the configuration state.

[0051] Step 3: Configure the detector and forward the retraining data to the ground station.

[0052] When the detector 1 is powered off and then powered on again, it takes at least 10ms for the current in the detector 1 to stabilize. At this time, the detector 1 can be configured.

[0053] The optical measurement chip 2 sends a configuration request to the optical measurement processor 3 through the SPI register; the optical measurement processor 3 retrieves a set of configuration data of the detector 1 from the memory 4, and then transmits the set of configuration data to the optical measurement chip 2 through the SPI register; the optical measurement chip 2 converts the set of configuration data into an optical signal, and transmits the optical signal corresponding to the set of configuration data to the detector 1 as a driving signal set, thereby completing the configuration of the detector 1.

[0054] The detector 1 operates according to the set of configuration data, completes the bit alignment, word alignment and channel alignment operations of the configuration data, generates training data, and sends the training data to the optical measurement chip 2; the optical measurement chip 2 forwards the training data to the ground workbench through the data transmission device 5, and the ground workbench records the set of configuration data and its corresponding training data.

[0055] Specifically, the configuration data is a set of parameters required for the operation of the detector 1, and each set of the configuration data includes: exposure time, high gain of a programmable gain amplifier (PGA), low gain parameters of a programmable gain amplifier, gain parameters of an analog-to-digital converter (ADC), high gain black level (black), and low gain black level.

[0056] Specifically, the training data of the detector 1 includes: detector status information, training progress and training times. The training progress is represented by 4-byte wide data, and the training progress process of the detector 1 is divided into 11 stages. The 11 stages of the training progress include: start training (0000), wait for power supply (0001), clock configuration (0010), SPI configuration (0011), wait for stability (i.e., wait for the detector 1 to complete entering configuration data) (0100), bit alignment (0101), word alignment (0110), channel alignment (0111), wait for interaction (ITR) (1000), training completion (1001), normal imaging (1010). When the training progress of the detector 1 is 1010, it means that the detector 1 has the ability to work normally. The training times are the times that the detector 1 operates according to the configuration data.

[0057] Step 4: traverse the configuration data, end the retraining process, and restart the imaging function of the detector.

[0058] The optical measurement chip 2 judges the detector status information in each set of training data. At this time, the detector 1 is in the training progress stage of waiting for interaction (1000). When the detector status information is 1, it means that the detector 1 is still in an abnormal imaging state, and it is necessary to continue to traverse the configuration data in the memory 4, so that the detector 1 repeats the training progress stages of SPI configuration (0011), waiting for stability (0100), bit alignment (0101), word alignment (0110), channel alignment (0111), and waiting for interaction (1000) until the detector status information becomes 0. When the detector 1 finishes traversing the configuration data, the detector 1 is in the training progress stage of training completion (1001). When the optical measurement chip 2 receives the detector status information of 0, the detector 1 is in the training progress stage of normal imaging (1010).

[0059] When the detector status information in the training data is 0 and the training progress of detector 1 is 1010, the condition for ending the retraining process is met. At this time, the detector 1 has completed the reset retraining and can image normally. At this time, the image data in the random access memory in the optical measurement chip 2 is cleared, the imaging function of the detector 1 is restarted, and the detector 1 is controlled to complete the image transmission.

[0060] In summary, the present invention determines the operating status of the detector by detecting the detector status information of the detector, starts the detector retraining process when the detector is in an abnormal imaging state, reconfigures the detector clock, and traverses the configuration data of the detector, so that the detector can quickly diagnose and repair faults in the retraining process, thereby improving the safety and reliability of the optical measurement component during on-orbit operation.

[0061] Although the content of the present invention has been described in detail through the above preferred embodiments, it should be appreciated that the above description should not be considered as a limitation of the present invention. After reading the above content, it will be apparent to those skilled in the art that various modifications and substitutions of the present invention will occur. Therefore, the protection scope of the present invention should be limited by the appended claims.

Claims

1. A detector retraining method for an optical measurement component, characterized in that: The specific steps include: Step 1: The detector imaging in the optical measurement component is abnormal, so that the optical measurement component enters the retraining process; Step 2, turning off the imaging function of the detector, reconfiguring the clock of the detector, and making the detector enter the configuration state; Step 3, retrieving configuration data from the optical measurement component, configuring the detector, and enabling the detector to generate training data; Step 4, traverse the configuration data in the optical measurement component and determine whether the training data meets the conditions for ending the retraining process; when the training data meets the conditions for ending the retraining process, restart the imaging function of the detector.

2. The detector retraining method of the optical measurement assembly according to claim 1, characterized in that: The training data includes: Detector status information, generated by the detector, which can indicate a normal working state or an abnormal imaging state of the detector; The training progress is represented by 4-byte wide data, which divides the detector training progress process into 11 stages; The number of training times is the number of times the detector operates according to the configuration data.

3. The detector retraining method of the optical measurement assembly according to claim 1, characterized in that: The stages of the training progress include: start training, wait for power supply, clock configuration, SPI configuration, wait for stability, bit alignment, word alignment, channel alignment, wait for interaction, training completion, and normal imaging.

4. The detector retraining method of the optical measurement assembly according to claim 3, characterized in that: The condition for ending the retraining process is that the training progress is normal imaging and the detector state information is a normal working state.

5. The detector retraining method of the optical measurement assembly according to claim 1, characterized in that: The detector is capable of collecting optical signals sent by the object being measured and converting the optical signals into electrical signals; The detector also includes a low voltage differential signal interface for transmitting electrical signals.

6. The detector retraining method of the optical measurement assembly according to claim 5, characterized in that: The optical measurement assembly is capable of transmitting an image to a ground workbench, and the optical measurement assembly further comprises: The optical measurement chip is connected to the detector by two-way signals, receives the detector status information and electrical signals sent by the detector, and can generate a drive signal set to transmit to the detector to configure the detector; The optical measurement processor is connected to the optical measurement chip via a bidirectional signal, receives a request signal sent by the optical measurement chip, calls configuration data, and transmits the configuration data to the optical measurement chip; A memory, connected to the optical measurement processor by signal, stores configuration data of a plurality of groups of detectors, and transmits the configuration data to the optical measurement processor; The data transmission device is connected to the optical measurement chip and the ground workbench by signals, transmits the instructions of the ground workbench to the optical measurement chip, and transmits the electrical signals of the detector received by the optical measurement chip to the ground workbench, so that the ground workbench can receive the image.

7. The detector retraining method of the optical measurement assembly according to claim 6, characterized in that: The optical measurement chip comprises: A clock management unit, connected to the detector signal, generates different clock frequencies and adjusts the phase of the clock signal to reduce delays and errors in the signal transmission process; Random access memory can temporarily store the electrical signals sent by the detector.

8. The detector retraining method of the optical measurement assembly according to claim 6, characterized in that: In step 3, the optical measurement chip sends a configuration request to the optical measurement processor; and the optical measurement processor retrieves a set of detector configuration data from the memory, and then transmits the set of configuration data to the optical measurement chip; The optical measurement chip converts the set of configuration data into an optical signal, and transmits the optical signal corresponding to the set of configuration data as a driving signal set to the detector, thereby completing the configuration of the detector; The detector operates according to the set of configuration data to generate training data, and sends the training data to the optical measurement chip; the optical measurement chip forwards the training data to the ground workbench through the data transmission device, and the ground workbench records the set of configuration data and its corresponding training data.

9. The detector retraining method of the optical measurement assembly according to claim 7, characterized in that: In step 2, the clock signal of the clock management unit in the optical measurement chip is converted from a low level to a high level, and the clock signal is transmitted to the detector, so that the clock of the detector is reconfigured and the detector is controlled to be synchronized with the optical measurement chip.

10. The detector retraining method of the optical measurement assembly according to claim 6, characterized in that: In the step 1, when the optical measurement chip receives the detector status information, and the detector status information indicates that the detector is in an abnormal imaging state, the optical measurement chip sends a detector retraining instruction to the ground workbench through the data transmission device; when the optical measurement chip receives the confirmation retraining instruction sent by the ground workbench through the data transmission device, the optical measurement component will enter the retraining process.

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