High-frequency transformer short circuit testing device and control system thereof

Abstract

The invention discloses a high-frequency transformer short-circuit testing device and a control system thereof, the high-frequency transformer short-circuit testing device comprises a base, a fixed module and a slidable module, an adjustable distance exists between the fixed module and the slidable module, detachable female headers are arranged on the fixed module and the slidable module, and the whole body is made of plastic parts. A plurality of hollow pipeline structures which are uniformly distributed are arranged in the base, each hollow pipeline is provided with a jack, the base is provided with control buttons which are in one-to-one correspondence with the jacks on the detachable female header, logic for controlling the circuit board exists between the control buttons and the conductive metal pins, one side of the whole base is connected with a test wire, and the test wire is connected with the test circuit. The connector is connected with an external testing device. According to the invention, the pin to be tested can be controlled, the other pins are short-circuited, and the device can adapt to different pin spacing requirements and can flexibly cope with the change of various pin row pitches.

Description

Technical Field

[0001] The invention relates to the field of high-frequency transformer testing devices, and in particular to a high-frequency transformer short-circuit testing device and a control system thereof. Background Art

[0002] With the development of power electronics technology, high-frequency transformers are widely used in power electronic devices such as switching power supplies, inverters, and electronic ballasts due to their small size, light weight, and high efficiency. Especially in low-power applications, high-frequency transformers are one of the indispensable key components, and the performance of high-frequency transformers directly affects the stability and reliability of the entire system. In order to ensure the quality of high-frequency transformers, testing during the sample preparation stage is particularly important, especially the test of short-circuit inductance. Small-power high-frequency transformers usually use a sandwich winding method, which can effectively reduce the influence of parasitic capacitance and increase the operating frequency of the transformer. During the sample preparation stage, it is necessary to test various performance indicators of the high-frequency transformer, including the measurement of important parameters such as short-circuit inductance.

[0003] The traditional test method is to manually short the untested pins and then measure the inductance value of the specified pins. This method is acceptable when the sample is small, but it is inefficient and prone to errors in batch testing.

[0004] However, the inventors of this application found that the above technology has at least the following technical problems in the process of implementing the technical solution of the invention in the embodiment of this application:

[0005] 1. Different pin spacings make it difficult for traditional test devices in the prior art to adapt to a variety of products;

[0006] 2. The short-circuit inductance test of high-frequency transformers is difficult and inefficient during the sample preparation stage;

[0007] 3. Some human errors are unavoidable. Summary of the invention

[0008] The embodiments of the present application provide a high-frequency transformer short-circuit test device and a control system thereof, thereby solving the problems in the prior art of difficulty in adapting to key parameters of different pins, high testing difficulty and low efficiency when testing short-circuit inductance of high-frequency transformers in the sample preparation stage, thereby achieving the technical effect of enhancing the adaptability of the test device, improving test efficiency and ensuring test accuracy.

[0009] The present application provides a high-frequency transformer short-circuit test device, comprising:

[0010] Pedestal;

[0011] A fixed module, wherein the fixed module is fixedly installed on one side above the base;

[0012] A slidable module, the slidable module is arranged on the other side of the fixed module, wherein the slidable module;

[0013] Wherein, there is an adjustable spacing between the fixed module and the slidable module;

[0014] A detachable female header, the detachable female header is placed above the fixed module and the slidable module, and is connected to the fixed module and the slidable module;

[0015] A control button, the control button is fixedly mounted on the base and is located at one end of the base and is spaced apart from the fixed module and the slidable module;

[0016] A test line, which is fixedly mounted on a side of the base and is located on the other side of the control button;

[0017] Furthermore, there is a guide rail groove inside the base, and it is arranged below the slidable module;

[0018] Furthermore, a dual-motor driven slide rail is provided inside the slidable module and is controlled by a motor assembly;

[0019] Furthermore, the exterior of the detachable female header is composed of a plastic part to prevent electrical conduction, and a hollow uniformly arranged pipe structure exists in the plastic part, and the jack is located in the hollow pipe of the plastic part, and corresponds one-to-one with the conductive metal pins below;

[0020] Furthermore, the fixed module and the slidable module are of the same rectangular parallelepiped structure;

[0021] Furthermore, the jacks may be multiple and arranged corresponding to the control buttons;

[0022] Further, the dual-motor driven slide rail is a T-shaped structure, the motor assembly is provided with a motor mounting seat, the motor mounting seat is connected to the slide rail, the dual-motor driven slide rail is provided with a transmission gap connected to the inside, and the control signal input source of the motor assembly is an MCU;

[0023] Furthermore, the guide rail groove is an inverted T structure, and the gap between the guide rail grooves is larger than the transmission gap of the slide rail;

[0024] The present application provides a control system for a high-frequency transformer short-circuit test device, comprising:

[0025] Identification module: identifies the model and pin identification of the inserted high-frequency transformer;

[0026] Configuration module: automatically configures the parameters required for testing according to the identified high-frequency transformer model;

[0027] Test module: controls the switching of short circuits through control buttons, communicates with external test instruments, automatically starts the test program, and obtains test results;

[0028] Analysis module: automatically records test results and provides data analysis based on the test results;

[0029] Control module: real-time monitoring of production process parameter information, including short-circuit current, etc., adjusting and analyzing problems in the production process based on the parameter information, and generating early warning information to feed back to management personnel.

[0030] According to the present invention, a control system and a test module of a high-frequency transformer short-circuit test device are provided, comprising:

[0031] Control unit: according to the pin to be tested, press the control button corresponding to the jack to control the switching of the short-circuit current;

[0032] Test unit: communicates with external test instruments, automatically starts the test program, and obtains test results;

[0033] According to the present invention, a control system and an analysis module of a high-frequency transformer short-circuit test device are provided, comprising:

[0034] Recording unit: records the data obtained by the test unit and stores it;

[0035] Analysis unit: performs data analysis based on the test results obtained by the recording unit;

[0036] According to the present invention, a control system and a control module of a high-frequency transformer short-circuit test device are provided, comprising:

[0037] Detection unit: real-time monitoring of the performance information of the identification module, configuration module, test module, and analysis module;

[0038] Feedback unit: generates warning information based on the abnormal information and adjustment information, and feeds back to the management personnel.

[0039] One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages:

[0040] 1. Due to the use of detachable modular headers, the problem that traditional test devices are difficult to adapt to a variety of products due to different pin spacing is effectively solved, thereby supporting the testing needs of a variety of products.

[0041] 2. Due to the design of adjustable spacing, the problem of difficulty and low efficiency in short-circuit inductance testing of high-frequency transformers during sample preparation is effectively solved, thereby improving the flexibility and efficiency of the test.

[0042] 3. Due to the use of a control system, the human errors caused by the short-circuit test of the high-frequency transformer are effectively solved, thereby improving the automation of the test process and the reliability of the data. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 This is a three-dimensional diagram of the external structure of the test device in the embodiment of the present application;

[0044] Figure 2 This is a structural stereogram of a detachable female connector in an embodiment of the present application;

[0045] Figure 3 A three-dimensional diagram of the external structure of the test device for exchanging the fixed module and the slidable module in the embodiment of the present application;

[0046] Figure 4 This is a structural stereogram of the dual-drive motor slide rail in the embodiment of the present application;

[0047] Figure 5 A cross-sectional view of the guide rail groove in the embodiment of the present application;

[0048] Figure 6 This is a schematic diagram of the structure of a control circuit board matched with a control button in an embodiment of the present application;

[0049] Figure 7 This is a schematic diagram of the control system structure of the high-frequency transformer short-circuit test device in the embodiment of the present application;

[0050] Figure 8 This is a structural schematic diagram of a test module of a control system of a high-frequency transformer short-circuit test device in an embodiment of the present application;

[0051] Fig. 9 This is a structural diagram of an analysis module of a control system for a high-frequency transformer short-circuit test device in an embodiment of the present application;

[0052] Fig.10 This is a structural schematic diagram of a control module of a control system of a high-frequency transformer short-circuit test device in an embodiment of the present application;

[0053] Fig.11 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application;

[0054] In the figure: (1), base; (2), fixed module; (3), sliding module; (4), detachable female header; (5), control button; (6), test line; (7), plastic part; (8), jack; (9), conductive metal pin; (10), dual motor drive slide rail; (11), motor assembly; (12), gear box; (13), guide rail groove; (701), identification module; (702), configuration module; (703), test module; (704), analysis module; (705), control module; (801), control unit; (802), test unit; (901), recording unit; (902), analysis unit; (1001), detection unit; (1002), feedback unit; (1101), processor; (1102), communication interface; (1103), memory; (1104), communication bus. DETAILED DESCRIPTION

[0055] In order to better understand the above technical solution, the above technical solution will be described in detail below in conjunction with the drawings and specific implementation methods of the specification. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0056] In the description of the present invention, it should be noted that the terms "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside", etc. indicate directions or positional relationships based on the directions or positional relationships shown in the accompanying drawings. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific direction, be constructed and operated in a specific direction. Therefore, they cannot be understood as limitations on the present invention.

[0057] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0058] See also Figure 1-6 ,The present invention provides a technical solution: a high-frequency transformer short-circuit test device;

[0059] Embodiment 1

[0060] like Figure 1 and Figure 2As shown, it includes a base (1), a fixed module (2) arranged on the left side of the base (1), and a slidable module (3) arranged on the right side of the base (1). There is an adjustable distance between the fixed module (2). The sliding of the slidable module (3) drives the adjustable distance to increase or decrease, thereby solving the problem caused by the different pin spacings of the high-frequency transformer. A detachable female header (4) is respectively arranged above the fixed module (2) and the slidable module (3). The exterior of the detachable female header (4) is composed of a plastic part (7), and the interior presents a uniformly distributed hollow pipe structure. Each hollow pipe has a socket (8), and each socket (8) has a conductive metal pin (9) corresponding to it below it. The socket (8) can be multiple, and preferably 6. According to the different pin spacings of the high-frequency transformer, the detachable module can be used to replace the sockets with different pin spacings. The mother header (4) is provided with a row of control buttons (5) on the left side of the base (1), and is a rectangular solid structure. A control circuit board logic exists between the control buttons (5) and the detachable mother header (4), and the control buttons (5) are at a certain distance from the fixed module (2) and the slidable module (3). The control buttons (5) are numbered 1-8 from left to right, and correspond to the jacks (8) on the detachable mother header (4) in a one-to-one manner. By pressing the control button (5) numbered 1, the conductive metal pins (9) corresponding to the control buttons (5) represented by other 2-8 are short-circuited, thereby controlling the pins (9) to be tested. The test line (6) is connected to the base (1) at the right side of the base (1) as a whole. The test line (6) is used to transmit the signal of the selected pin of the high-frequency transformer to an external test instrument to measure the inductance value.

[0061] Embodiment 2

[0062] like Figure 2 and Figure 3 As shown, in the embodiment of the present application, the fixed module (2) and the slidable module (3) can be replaced without affecting the use of the device, specifically:

[0063] The invention comprises a base (1), a slidable module (3) arranged on the left side of the base (1), and a fixed module (2) arranged on the right side of the base (1). An adjustable spacing exists between the slidable module (3) and the fixed module (2). The sliding of the slidable module (3) drives the adjustable spacing to increase or decrease, thereby solving the problem caused by different pin spacings of high-frequency transformers. A detachable female header (4) is respectively arranged above the fixed module (2) and the slidable module (3). The exterior of the detachable female header (4) is composed of a plastic part (7), and the interior presents a uniformly distributed hollow pipe structure. Each hollow pipe has a socket (8), and each socket (8) has a conductive metal pin (9) corresponding to it below it. The socket (8) can be multiple, and preferably 8. According to the different pin spacings of the high-frequency transformer, the detachable module can be used to replace the headers with different pin spacings. The mother (4) is provided with a row of control buttons (5) on the left side of the base (1), which is a rectangular solid structure. A control circuit board logic exists between the control buttons (5) and the detachable mother row (4), and the control buttons (5) are at a certain distance from the fixed module (2) and the slidable module (3). The control buttons (5) are numbered 1-6 from left to right, and correspond to the jacks (8) on the detachable mother row (4) in a one-to-one manner. By pressing the control button (5) numbered 1, the conductive metal pins (9) corresponding to the control buttons (5) represented by other 2-6 are short-circuited, thereby controlling the pins (9) to be tested. The test line (6) is connected to the base (1) at the right side of the base (1) as a whole. The test line (6) is used to transmit the signal of the selected pin of the high-frequency transformer to an external test instrument to measure the inductance value.

[0064] Embodiment 3

[0065] like Figure 4 and Figure 5 As shown, a dual-motor driven slide rail (10) is arranged to be installed inside the slidable module (3), and the dual-motor driven slide rail (10) includes a slide rail I and a slide rail II. The slide rails I and II are symmetrical in structure and present a T-shaped structure. The slide rails I and II respectively have transmission gaps connected to the inside. The slide rails I and II are respectively provided with motor components (11) for driving their respective slide rails. The motor components (11) are vertically arranged. The transmission components of the slide rails include a gear box (12). The guide rail grooves (13) are installed inside the base (1) and present an inverted T structure. There is a gap between the guide rail grooves (13), and the gap between the guide rail grooves (13) is larger than the transmission gap between the slide rails I and the slide rail II.

[0066] When the motor assembly (11) receives a signal from the ECU module, the motor drives the slide rails I and II to move left and right on the guide rail groove (13) by connecting the gear boxes (13) inside the slide rails I and II, thereby achieving left and right movement of the slidable module (3).

[0067] Embodiment 4

[0068] like Figure 6 As shown, a control circuit that controls the pins to be tested and the other pins are short-circuited includes a control power supply, a control button, and a conductive metal pin. When the control button is not pressed, the conductive metal pin is short-circuited. The circuit and circuit principle of pressing each button are the same. Taking pressing the control button 1 as an example again, the control switch of the control button 1 is pressed, and the wire through the conductive metal pin is connected, and the pin corresponding to the control button 1 is connected, and the other pins continue to be in a state of being short-circuited by the wire.

[0069] Embodiment 5

[0070] like Figure 7-10 As shown, the present application provides a control system for a high-frequency transformer short-circuit test device, the system comprising:

[0071] Identification module (701): identifies the model and pin identification of the inserted high-frequency transformer;

[0072] Configuration module (702): automatically configures parameters required for testing according to the identified high-frequency transformer model;

[0073] Testing module (703): controls the switching of the short circuit through a control button, communicates with an external testing instrument, automatically starts the testing program, and obtains the testing results;

[0074] Analysis module (704): automatically records test results and provides data analysis based on the test results;

[0075] Control module (705): monitors the production process parameter information in real time, the parameter information includes short-circuit current, etc., adjusts and analyzes the problems existing in the production process according to the parameter information, and generates early warning information to feedback to the management personnel.

[0076] like Figure 8 As shown, the present invention provides a control system for a high-frequency transformer short-circuit test device, a test module (703), comprising:

[0077] Control unit (801): according to the pin to be tested, press the control button corresponding to the jack to control the switching of the short circuit;

[0078] Testing unit (802): communicates with external testing instruments, automatically starts the testing program, and obtains the testing results;

[0079] like Fig. 9 As shown, the present invention provides a control system of a high-frequency transformer short-circuit test device, an analysis module (704), comprising:

[0080] Recording unit (901): records the data obtained by the test unit and stores it;

[0081] Analysis unit (902): performs data analysis based on the test results obtained by the recording unit;

[0082] like Fig.10 As shown, the present invention provides a control system for a high-frequency transformer short-circuit test device, a control module (705), comprising:

[0083] Detection unit (1001): real-time monitoring of performance information of the identification module, configuration module, test module, and analysis module;

[0084] Feedback unit (1002): generates warning information based on the abnormal information and adjustment information, and feeds back to the management personnel.

[0085] like Fig.11 As shown, the electronic device includes a processor (1101), a communication interface (1102), a memory (1103) and a communication bus (1104), wherein the processor (1101), the communication interface (1102) and the memory (1103) communicate with each other via the communication bus (1104). The processor (1101) can call the logic instructions in the memory (1103) to execute a control system for a high-frequency transformer short-circuit test device, the system comprising: an identification module (701): identifying the model and pin parameters of an inserted high-frequency transformer; a configuration module (702): automatically configuring the parameters required for the test according to the identified high-frequency transformer model; a test module (703): controlling the switching of the short-circuit circuit through a control button, communicating with an external test instrument, automatically starting the test program, and obtaining the test results; an analysis module (704): automatically recording the test results and providing data analysis according to the test results; and a control module (705): real-time monitoring of production process parameter information, the parameter information including temperature, etc., adjusting and analyzing problems existing in the production process according to the parameter information, and generating early warning information for feedback to management personnel.

[0086] In addition, the logic instructions in the above-mentioned memory (1103) can be implemented in the form of software functional units and sold or used as independent products, and can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the present invention, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: various media for storing program codes such as a USB flash drive, a mobile hard disk, a system memory, a random access memory, a magnetic disk or an optical disk.

[0087] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.

Claims

1. A high-frequency transformer short-circuit test device, characterized in that: The short circuit testing device comprises: A base (1), wherein the base (1) comprises: A guide rail groove (12), wherein the guide rail groove (12) is arranged inside the base; A fixing module (2), wherein the fixing module (2) is fixedly mounted on one side above the base (1); A slidable module (3), wherein the slidable module (3) is arranged on the other side of the fixed module (2), wherein the slidable module (3) comprises: A dual-motor driven slide rail (10), wherein the dual-motor driven slide rail (10) is arranged inside the slidable module (3); A motor assembly (11), wherein the motor assembly (11) is located above the dual-motor driven slide rail (10); There is an adjustable distance between the fixed module (2) and the slidable module (3); A detachable female header (4), the detachable female header (4) is placed above the fixed module (2) and the slidable module (3), and is connected to the fixed module (2) and the slidable module (3), wherein the detachable female header (4) comprises: A plastic part (7), wherein the plastic part (7) has a hollow uniformly arranged pipe structure; A plug hole (8), wherein the plug hole (8) is located in the pipe structure of the plastic part (7); Conductive metal pins (9), the conductive metal pins (9) corresponding one to one with the sockets (8) above them; A control button (5), wherein the control button (5) is fixedly mounted on the base (1) and is located at one end of the base (1) and is spaced apart from the fixed module (2) and the slidable module (3). A test line (6), wherein the test line (6) is fixedly mounted on a side of the base (1) and is located on the other side of the control button (5).

2. A high-frequency transformer short-circuit test device as claimed in claim 1, characterized in that: The fixed module (2) and the slidable module (3) are of the same rectangular parallelepiped structure.

3. A high-frequency transformer short-circuit test device as claimed in claim 1, characterized in that: There are a plurality of jacks (8), which are distributed correspondingly to the control buttons (5).

4. A high-frequency transformer short-circuit test device as claimed in claim 1, characterized in that: The dual-motor driven slide rail (10) is a T-shaped structure, the motor assembly (11) is provided with a motor mounting seat, the motor mounting seat is connected to the slide rail (10), the dual-motor driven slide rail (10) is provided with a transmission gap connected to the inside, and the control signal input source of the motor assembly (11) is an MCU.

5. A high-frequency transformer short-circuit test device as claimed in claim 1, characterized in that: The guide rail groove (13) is arranged below the slidable module (3), and the guide rail groove (12) is an inverted T structure, and the gap between the guide rail grooves (13) is larger than the transmission gap of the slide rail (10).

6. A control system for a high-frequency transformer short-circuit test device as claimed in claims 1-6, characterized in that: include: Identification module (701): identifies the model and pin identification of the inserted high-frequency transformer; Configuration module (702): automatically configures parameters required for testing according to the identified high-frequency transformer model; Testing module (703): controls the switching of the short circuit through a control button, communicates with an external testing instrument, automatically starts the testing program, and obtains the testing results; Analysis module (704): automatically records test results and provides data analysis based on the test results; Control module (705): monitors the production process parameter information in real time, the parameter information includes short-circuit current, etc., adjusts and analyzes the problems existing in the production process according to the parameter information, and generates early warning information to feedback to the management personnel.

7. The control system of a high-frequency transformer short-circuit test device as claimed in claim 7, characterized in that: The test module (703) includes: Control unit (801): according to the pin to be tested, press the control button (5) corresponding to the jack to control the switching of the short circuit; Test unit (802): communicates with external test instruments, automatically starts the test program, and obtains the test results.

8. The control system of a high-frequency transformer short-circuit test device as claimed in claim 7, characterized in that: The analysis module (704) comprises: Recording unit (901): records the data obtained by the test unit and stores it; Analysis unit (902): performs data analysis based on the test results obtained by the recording unit.

9. The control system of a high-frequency transformer short-circuit test device as claimed in claim 7, characterized in that: The control module (705) comprises: Detection unit (1001): real-time monitoring of performance information of the identification module, configuration module, test module, and analysis module; Feedback unit (1002): generates warning information based on the abnormal information and adjustment information, and feeds back to the management personnel.

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