Pressure, temperature metrology calibration method and system based on current reconstruction

Abstract

The application relates to a pressure and temperature measurement calibration method and device based on current reconstruction, and is based on an improved verification calibration system, which comprises a sequence wave emission module, a pressure measuring instrument and a temperature measuring instrument. The sequence wave emission module is configured to output a modulated current to an independent bus in a set sequence; the pressure measuring instrument is configured to superimpose a pressure current on the independent bus according to a pressure measurement result; the temperature measuring instrument is configured to superimpose a temperature current on the independent bus according to a temperature measurement result; a first sequence of modulated currents and a second sequence of modulated currents are collected respectively; the first sequence of modulated currents is deconstructed to obtain a pressure calibration value; and the second sequence of modulated currents is deconstructed to obtain a temperature calibration value. Based on this, when multiple temperature or pressure instruments are provided, sampling is completed by using one modulated current, and each temperature calibration value and pressure calibration value is obtained, so that the sampling cost of the system is effectively reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of intelligent verification and calibration systems, in particular to a pressure and temperature measurement calibration method and system based on current reconstruction. BACKGROUND

[0002] A verification and calibration system is a system for verifying and calibrating measuring instruments and equipment, aiming to ensure the accuracy and reliability of measurement results. Verification and calibration are two different activities, but they both involve the evaluation of the accuracy and reliability of measuring equipment. Verification and calibration systems are widely used in various measuring instruments and equipment, such as temperature sensors, pressure gauges, electronic scales, etc., and are generally used as complete solutions for laboratories and industrial applications.

[0003] Currently, with the development of Internet of Things technology and intelligent hardware technology, the system integration and data integration capabilities of verification and calibration system solutions are becoming higher and higher, and multiple instruments and equipment usually need to be processed uniformly. In the verification and calibration system, pressure and temperature are the two most critical measurement parameters. In an integrated system, the detection data of pressure and temperature need to be converted into electrical signals for standard data processing and measurement calibration. In the current verification and calibration system, pressure and temperature detection is based on different instruments and equipment, and the converted electrical sampling circuit also needs to be set up with multiple channels according to the number of instruments and equipment, resulting in multiple output lines and multiple sampling deployments in the overall structure, which leads to high hardware costs. SUMMARY

[0004] In view of the above analysis, the embodiments of the present application aim to provide a pressure and temperature measurement calibration method and device based on current reconstruction, to solve the problem of high hardware cost caused by the multiple output lines and multiple sampling deployments in the overall structure, which is caused by the need to set up multiple channels for the converted electrical sampling circuit according to the number of instruments and equipment in the current technology implementation results.

[0005] The embodiments of the present application provide a pressure and temperature measurement calibration method based on current reconstruction, applied to a verification and calibration system.

[0006] The verification and calibration system includes:

[0007] A sequence wave emitting module is configured to output modulated current to an independent bus in a set sequence;

[0008] A pressure measuring instrument is configured to superimpose pressure current on the independent bus according to the pressure measurement result; wherein the pressure current is superimposed on the modulated current of the first sequence;

[0009] a temperature measuring instrument configured to superimpose a temperature current onto the independent bus according to a temperature measurement result; wherein the temperature current is superimposed onto the second sequence of modulation currents;

[0010] comprising steps of:

[0011] respectively collecting the first sequence of modulation currents and the second sequence of modulation currents;

[0012] deconstructing the first sequence of modulation currents to obtain a pressure calibration value;

[0013] deconstructing the second sequence of modulation currents to obtain a temperature calibration value.

[0014] The pressure and temperature calibration method based on current reconstruction according to the embodiments of the present application is based on an improved verification and calibration system, which comprises a sequence wave transmitting module, a pressure measuring instrument and a temperature measuring instrument. The sequence wave transmitting module is configured to output modulation currents to the independent bus in a set sequence; the pressure measuring instrument is configured to superimpose a pressure current onto the independent bus according to a pressure measurement result; wherein the pressure current is superimposed onto the first sequence of modulation currents; the temperature measuring instrument is configured to superimpose a temperature current onto the independent bus according to a temperature measurement result; wherein the temperature current is superimposed onto the second sequence of modulation currents. The first sequence of modulation currents and the second sequence of modulation currents are respectively collected; the first sequence of modulation currents is deconstructed to obtain a pressure calibration value; and the second sequence of modulation currents is deconstructed to obtain a temperature calibration value. Based on this, when there are multiple temperature or pressure instruments, sampling is completed by one modulation current, and each temperature calibration value and pressure calibration value is obtained, thereby effectively reducing the sampling cost of the system.

[0015] As one of the optional embodiments, the sequence wave transmitting module is configured to output the modulation currents in a four-segment wave transmitting manner.

[0016] As one of the optional embodiments, the process of deconstructing the first sequence of modulation currents to obtain a pressure calibration value comprises steps of:

[0017] inserting a pressure current into the starting segment of the first sequence, obtaining a first sampling current in a sampling sequence window, and reconstructing a pressure calibration value according to the first sampling current.

[0018] As one of the optional embodiments, the process of inserting a pressure current into the starting segment of the first sequence, obtaining a first sampling current in a sampling sequence window, and reconstructing a pressure calibration value according to the first sampling current comprises steps of:

[0019] decomposing the pressure current into two effective pressure vectors and inserting them into the starting segment of the first sequence;

[0020] sampling a first sampling current in a window period formed by the effective pressure vector;

[0021] reconstructing the first sampling current into a three-phase current and calculating a root mean square value of the three-phase current as the pressure calibration value.

[0022] As one of the optional embodiments, the process of deconstructing the second sequence of temperature current to obtain a temperature calibration value includes the steps of:

[0023] inserting a temperature current at the beginning of the second sequence and obtaining a second sampling current in a sampling sequence window, and reconstructing a temperature calibration value according to the second sampling current.

[0024] As one of the optional embodiments, the process of inserting a temperature current at the beginning of the second sequence and obtaining a second sampling current in a sampling sequence window, and reconstructing a temperature calibration value according to the second sampling current includes the steps of:

[0025] decomposing the temperature current into two effective temperature vectors and inserting the two effective temperature vectors at the beginning of the second sequence;

[0026] sampling a second sampling current in a window period formed by the effective temperature vector;

[0027] reconstructing the second sampling current into a three-phase current and calculating a root mean square value of the three-phase current as the temperature calibration value.

[0028] As one of the optional embodiments, the process further includes the steps of:

[0029] looking up a pressure measurement value corresponding to the pressure calibration value according to a lookup table method;

[0030] looking up a temperature measurement value corresponding to the temperature calibration value according to a lookup table method.

[0031] The embodiments of the present application also provide a pressure and temperature measurement calibration device based on current reconstruction, which comprises:

[0032] application to a verification and calibration system;

[0033] The verification and calibration system comprises:

[0034] a sequence wave emitting module configured to output a modulated current to an independent bus according to a set sequence;

[0035] a pressure measuring instrument configured to superimpose a pressure current on the independent bus according to a pressure measurement result; wherein the pressure current is superimposed on the modulated current of the first sequence;

[0036] The temperature measuring instrument is configured to superimpose a temperature current on the independent bus according to a temperature measurement result; wherein the temperature current is superimposed on the second sequence of modulation currents;

[0037] The method comprises:

[0038] The current acquisition module is configured to acquire the first sequence of modulation currents and the second sequence of modulation currents respectively;

[0039] The first deconstruction module is configured to deconstruct the first sequence of modulation currents to obtain a pressure calibration value;

[0040] The second deconstruction module is configured to deconstruct the second sequence of modulation currents to obtain a temperature calibration value.

[0041] The pressure and temperature measurement calibration device based on current reconstruction according to the embodiments of the present application is based on an improved verification calibration system, which comprises a sequence wave transmitting module, a pressure measuring instrument and a temperature measuring instrument. The sequence wave transmitting module is configured to output modulation currents to an independent bus in a set sequence; the pressure measuring instrument is configured to superimpose a pressure current on the independent bus according to a pressure measurement result; wherein the pressure current is superimposed on the first sequence of modulation currents; the temperature measuring instrument is configured to superimpose a temperature current on the independent bus according to a temperature measurement result; wherein the temperature current is superimposed on the second sequence of modulation currents. The first sequence of modulation currents and the second sequence of modulation currents are acquired respectively; the first sequence of modulation currents is deconstructed to obtain a pressure calibration value; and the second sequence of modulation currents is deconstructed to obtain a temperature calibration value. Based on this, when multiple temperature or pressure instruments are provided, sampling is completed by one sequence of modulation currents, and each temperature calibration value and pressure calibration value is obtained, thereby effectively reducing the sampling cost of the system.

[0042] At least one embodiment of the present application further provides a data control device, comprising:

[0043] One or more memories, which non-transiently store computer executable instructions;

[0044] One or more processors configured to run the computer executable instructions, wherein the computer executable instructions, when run by the one or more processors, implement the pressure and temperature measurement calibration method based on current reconstruction according to any embodiment of the present application.

[0045] The data control device described above is based on an improved verification calibration system, which includes a sequence wave emission module, a pressure measuring instrument and a temperature measuring instrument. The sequence wave emission module is configured to output a modulated current to an independent bus in a set sequence; the pressure measuring instrument is configured to superimpose a pressure current on the independent bus according to a pressure measurement result; wherein the pressure current is superimposed on the modulated current of the first sequence; the temperature measuring instrument is configured to superimpose a temperature current on the independent bus according to a temperature measurement result; wherein the temperature current is superimposed on the modulated current of the second sequence. The modulated current of the first sequence and the modulated current of the second sequence are collected respectively; the modulated current of the first sequence is deconstructed to obtain a pressure calibration value; and the modulated current of the second sequence is deconstructed to obtain a temperature calibration value. Based on this, when multiple temperature or pressure instrument devices are provided, sampling is completed by using one modulated current to obtain each temperature calibration value and pressure calibration value, thereby effectively reducing the sampling cost of the system.

[0046] The at least one embodiment of the present application also provides a non-transitory computer-readable storage medium, wherein the non-transitory computer-readable storage medium stores computer executable instructions, and the computer executable instructions are executed by a processor to implement the current reconstruction based pressure and temperature metering calibration method according to any embodiment of the present application.

[0047] The non-transitory computer-readable storage medium described above is based on an improved verification calibration system, which includes a sequence wave emission module, a pressure measuring instrument and a temperature measuring instrument. The sequence wave emission module is configured to output a modulated current to an independent bus in a set sequence; the pressure measuring instrument is configured to superimpose a pressure current on the independent bus according to a pressure measurement result; wherein the pressure current is superimposed on the modulated current of the first sequence; the temperature measuring instrument is configured to superimpose a temperature current on the independent bus according to a temperature measurement result; wherein the temperature current is superimposed on the modulated current of the second sequence. The modulated current of the first sequence and the modulated current of the second sequence are collected respectively; the modulated current of the first sequence is deconstructed to obtain a pressure calibration value; and the modulated current of the second sequence is deconstructed to obtain a temperature calibration value. Based on this, when multiple temperature or pressure instrument devices are provided, sampling is completed by using one modulated current to obtain each temperature calibration value and pressure calibration value, thereby effectively reducing the sampling cost of the system. BRIEF DESCRIPTION OF DRAWINGS

[0048] Figure 1 The flow chart of the current reconstruction based pressure and temperature metering calibration method of an application embodiment;

[0049] Figure 2 The structure schematic diagram of the improved verification calibration system;

[0050] Figure 3 The wave emission mode schematic diagram of the sequence wave emission module;

[0051] Figure 4 a time diagram for a conventional firing mode;

[0052] Figure 5 a time diagram for a four-segment firing mode;

[0053] Figure 6 a flow chart of a preferred embodiment of a current reconstruction based pressure, temperature metrology calibration method;

[0054] Figure 7 a flow chart of a preferred embodiment of a current reconstruction based pressure, temperature metrology calibration method;

[0055] Figure 8 a block diagram of a current reconstruction based pressure, temperature metrology calibration apparatus of a preferred embodiment;

[0056] Figure 9 a schematic block diagram of a data control apparatus provided by the present application;

[0057] Figure 10 a schematic diagram of a non-transitory computer readable storage medium provided by the present application. DETAILED DESCRIPTION

[0058] In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions of the embodiments of the present application will be described clearly and completely below with reference to the drawings of the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the described embodiments of the present application, all other embodiments obtained by those of ordinary skill in the art without any creative effort fall within the scope of protection of the present application.

[0059] Unless otherwise defined, technical or scientific terms used in the present application shall have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. Unless otherwise defined, the terms "first", "second", and the like, used in the present application do not necessarily mean any sequential or chronological order, but can be used to distinguish different components. The terms "comprises", "comprising", "includes", "including" and the like, mean including but not limited to, and the like. The terms "connected", "coupled", or the like, do not necessarily mean physically or mechanically connected or coupled, but can include electrical connection or coupling, whether direct or indirect. The terms "upper", "lower", "left", "right", and the like, are only used to indicate relative positional relationships, and when the absolute positions of the described objects are changed, the relative positional relationships may also be changed accordingly.

[0060] For keeping the following description of the embodiments of the present application clear and brief, the detailed description of some known functions and known components is omitted.

[0061] The embodiments of the present application provide a pressure and temperature metrological calibration method based on current reconstruction.

[0062] Figure 1 A flow chart of the pressure and temperature metrological calibration method based on current reconstruction of an embodiment of the present application is shown in Figure 1 The pressure and temperature metrological calibration method based on current reconstruction of an embodiment of the present application includes steps S100 to S102.

[0063] S100, a first sequence of modulation currents and a second sequence of modulation currents are collected respectively;

[0064] S101, the first sequence of modulation currents is deconstructed to obtain pressure calibration values;

[0065] S102, the second sequence of modulation currents is deconstructed to obtain temperature calibration values.

[0066] The execution subject executes steps S100 to S102, and the improved verification and calibration system is based on, as shown in Figure 2 The improved verification and calibration system includes:

[0067] The sequence wave emitting module 10 is configured to output modulation currents I base to the independent bus BUS in a set sequence;

[0068] The pressure measuring instrument 11 is configured to superimpose pressure currents I P on the independent bus BUS according to pressure measurement results; wherein the pressure currents I P are superimposed on the first sequence of modulation currents I base ;

[0069] The temperature measuring instrument 12 is configured to superimpose temperature currents I T on the independent bus BUS according to temperature measurement results; wherein the temperature currents I T are superimposed on the second sequence of modulation currents I base ;

[0070] The sequence generation module outputs a blank modulated current in the form of PWM pulses, forming different sequences based on the PWM pulse format. These different sequences constitute sectors. Pressure measuring instruments generate an analog signal of pressure current after detecting pressure, or temperature measuring instruments generate an analog signal of temperature current after detecting pressure. These analog signals are superimposed on the corresponding sequence of modulated current. Depending on the sequence / sector differences, analog signals from multiple different instruments are carried on the same modulated current in a time-division manner. Subsequent sampling circuits only need to acquire this modulated current; the number of sampling circuits is not limited by the increase in the number of instruments.

[0071] Preferably, the sequence waveform module is configured to output modulated current using a four-segment waveform method.

[0072] Figure 3 A schematic diagram of the transmission modes of the sequence transmission module, as shown below. Figure 3 As shown, the sequence waveform generation module uses a four-segment waveform generation, comprising six sectors. Taking the first sector as an example, if V is to be output... ref Voltage needs to be synthesized using adjacent effective vectors V1 and V2. The specific synthesis method is as follows:

[0073]

[0074] T s =T0 + T1 + T2;

[0075]

[0076] Where Ts is the PWM carrier period of the sequence waveform generation module, V0 is the zero vector, V1 and V2 are adjacent effective vectors, T0 is the zero vector's duration, and T1 and T2 are adjacent effective vectors' durations. ref V is the desired output voltage. dc θ represents the independent bus voltage, and θ is the angle between the output voltage vector and the V1 vector.

[0077] Figure 4 This is a time-based diagram of a conventional wave transmission method, such as... Figure 4 As shown, conventional wave transmission will evenly distribute the duration of T1, T2, and T0. In the first sector, in and Only when the independent bus current flows through the capacitor can the modulation current be sampled and reconstructed. Or When the current is very short, due to the influence of dead zone and sampling bandwidth, it is impossible to sample the current of the independent bus. Moreover, since T1 or T2 itself is very short, it must be divided into two equal parts. and It is not conducive to sampling.

[0078] Therefore in the preferred mode of the application embodiment, four-segment wave emission is adopted to concentrate the effective self-effect vectors in the middle, and two new Tz effective vectors are added in the beginning segment of each wave emission, and the current sampling action is completed at the same time for the two effective vectors, while in order not to change the effective vector action time, T1 and T2 are re-adjusted, and the calculation formula is as follows:

[0079]

[0080]

[0081] As shown in Figure 5 , the PWM wave emission is no longer symmetric about the center, and the effective vectors T1 or T2 are concentrated in the middle, and the sampling of the U-phase current Iu is completed in the first Tz segment, such as ADC1 in Figure 5 , the sampling of the W-phase current Iw is completed in the second Tz segment, such as ADC2 in Figure 5 , and the V-phase current Iv = -Iu-Iw. Here is the sampling timing for the first sector, and the others are similar.

[0082] Based on four-segment wave emission, as shown in Figure 6 , the process of decomposing the modulation current in the first sequence in step S101 to obtain the pressure calibration value includes step S200:

[0083] S200, inserting a pressure current in the beginning segment of the first sequence, and obtaining a first sampling current in a sampling sequence window, and reconstructing a pressure calibration value according to the first sampling current.

[0084] As shown in Figure 6 , the process of decomposing the temperature current in the second sequence in step S102 to obtain the temperature calibration value includes step S201:

[0085] S201, inserting a temperature current in the beginning segment of the second sequence, and obtaining a second sampling current in a sampling sequence window, and reconstructing a temperature calibration value according to the second sampling current.

[0086] As shown in Figure 7 , the process of inserting a pressure current in the beginning segment of the first sequence in step S200 and obtaining a first sampling current in a sampling sequence window according to the first sampling current to reconstruct a pressure calibration value includes steps S300 to S302:

[0087] S300, decomposing the pressure current into two effective pressure vectors, and inserting the beginning segment of the first sequence;

[0088] S301, completing the sampling of the first sampling current in the window period constituted by the effective pressure vectors;

[0089] S302, reconstruct the first sampling current into three-phase current, and calculate the effective value of the three-phase current as the pressure calibration value.

[0090] As shown in Figure 7 the second sequence, and obtain the second sampling current in the sampling sequence window, and the process of reconstructing the temperature calibration value according to the second sampling current includes steps S400 to S402:

[0091] S400, decompose the temperature current into two effective temperature vectors, and insert the beginning segment of the second sequence;

[0092] S401, complete the sampling of the second sampling current in the window period composed of the effective temperature vectors;

[0093] S402, reconstruct the second sampling current into three-phase current, and calculate the effective value of the three-phase current as the temperature calibration value.

[0094] In steps S300 to S302, the effective pressure vector is distributed to V1, V2, and the calculation of three-phase current Iu, Iw and Iv is performed, and the effective value of the three-phase current Iu, Iw and Iv is taken as the pressure calibration value.

[0095] Similarly, in steps S400 to S402, the effective temperature vector is distributed to V1, V2, and the calculation of three-phase current Iu, Iw and Iv is performed, and the effective value of the three-phase current Iu, Iw and Iv is taken as the temperature calibration value.

[0096] Preferably, as shown in Figure 6 the preferred embodiment of the current reconstruction-based pressure and temperature metering calibration method further includes steps S202 and S203:

[0097] S202, according to the table lookup method, find the pressure metering value corresponding to the pressure calibration value;

[0098] S203, according to the table lookup method, find the temperature metering value corresponding to the temperature calibration value.

[0099] According to the table lookup method, the corresponding metering value is determined according to the pre-calibration to obtain accurate pressure and temperature metering results.

[0100] The current reconstruction-based pressure and temperature metrological calibration method of any embodiment of the present disclosure is based on an improved verification calibration system, which includes a sequence wave emission module, a pressure measuring instrument, and a temperature measuring instrument. The sequence wave emission module is configured to output modulated currents to independent bus bars in a set sequence; the pressure measuring instrument is configured to superimpose pressure currents on the independent bus bars according to pressure measurement results; wherein the pressure currents are superimposed on the modulated currents of the first sequence; the temperature measuring instrument is configured to superimpose temperature currents on the independent bus bars according to temperature measurement results; wherein the temperature currents are superimposed on the modulated currents of the second sequence. The modulated currents of the first sequence and the modulated currents of the second sequence are collected respectively; the modulated currents of the first sequence are deconstructed to obtain pressure calibration values; the modulated currents of the second sequence are deconstructed to obtain temperature calibration values. Based on this, when multiple temperature or pressure instruments are provided, sampling is completed by one modulated current to obtain temperature calibration values and pressure calibration values, effectively reducing the sampling cost of the system.

[0101] The present application also provides a current reconstruction-based pressure and temperature metrological calibration device.

[0102] Figure 8 For the current reconstruction-based pressure and temperature metrological calibration device of an application embodiment, a module structure diagram is shown in Figure 8 The current reconstruction-based pressure and temperature metrological calibration device of an application embodiment includes:

[0103] The current acquisition module 100 is configured to collect the modulated currents of the first sequence and the modulated currents of the second sequence respectively;

[0104] The first deconstruction module 101 is configured to deconstruct the modulated currents of the first sequence to obtain pressure calibration values;

[0105] The second deconstruction module 102 is configured to deconstruct the modulated currents of the second sequence to obtain temperature calibration values.

[0106] The pressure and temperature measurement calibration device based on current reconstruction provided by the embodiments of the present application is based on an improved verification calibration system, which comprises a sequence wave transmitting module, a pressure measuring instrument and a temperature measuring instrument. The sequence wave transmitting module is configured to output modulated currents to independent bus lines in a set sequence; the pressure measuring instrument is configured to superimpose pressure currents on the independent bus lines according to pressure measurement results; wherein the pressure currents are superimposed on the modulated currents of the first sequence; the temperature measuring instrument is configured to superimpose temperature currents on the independent bus lines according to temperature measurement results; wherein the temperature currents are superimposed on the modulated currents of the second sequence. The modulated currents of the first sequence and the modulated currents of the second sequence are collected respectively; the modulated currents of the first sequence are deconstructed to obtain pressure calibration values; the modulated currents of the second sequence are deconstructed to obtain temperature calibration values. Based on this, when multiple temperature or pressure instruments are provided, sampling is completed by one modulated current to obtain temperature calibration values and pressure calibration values, which effectively reduces the sampling cost of the system.

[0107] The at least one embodiment of the present application also provides a data control device. Figure 9 A schematic block diagram of a data control device provided by the at least one embodiment of the present application is shown in FIG. 2. For example, as shown in FIG. 2, the data control device 20 can include one or more memories 200 and one or more processors 201. The memory 200 is used to non-transiently store computer executable instructions; the processor 201 is used to run the computer executable instructions, which can make the processor 201 perform one or more steps in the pressure and temperature measurement calibration method based on current reconstruction according to any embodiment of the present application when the computer executable instructions are run by the processor 201. Figure 9

[0108] The specific implementation of each step of the pressure and temperature measurement calibration method based on current reconstruction and related explanations can be referred to the related content in the above embodiments of the pressure and temperature measurement calibration method based on current reconstruction, which will not be repeated here. It should be noted that, Figure 9 The components of the data control device 20 shown in FIG. 2 are only exemplary and not limiting, and the data control device 20 can also have other components according to actual application needs.

[0109] ​In one of the embodiments, the processor 201 and the memory 200 can communicate with each other directly or indirectly. For example, the processor 201 and the memory 200 can communicate with each other through a network connection. The network can include a wireless network, a wired network, and / or any combination of a wireless network and a wired network, and the type and function of the network are not limited herein. For another example, the processor 201 and the memory 200 can also communicate with each other through a bus connection. The bus can be a peripheral component interconnect (PCI) bus or an extended industry standard architecture (EISA) bus, etc. For example, the processor 201 and the memory 200 can be arranged at a remote data server end (cloud end) or a distributed energy system end (local end), and can also be arranged at a client end (for example, a mobile device such as a mobile phone, etc.). For example, the processor 201 can be a central processing unit (CPU), a tensor processing unit (TPU), or a graphics processing unit (GPU), etc. having data processing capability and / or instruction execution capability, and can control other components in the data prediction apparatus 20 to perform desired functions. The central processing unit (CPU) can be X86 or ARM architecture, etc.

[0110] In one of the embodiments, the memory 200 can include one or more computer program products in any combination, and the computer program product can include various forms of computer readable storage media, such as volatile memory and / or non-volatile memory. For example, the volatile memory can include random access memory (RAM), cache memory, etc. The non-volatile memory can include read-only memory (ROM), hard disk, erasable programmable read-only memory (EPROM), compact disc read-only memory (CD-ROM), USB memory, flash memory, etc. One or more computer executable instructions can be stored on the computer readable storage medium, and the processor 201 can run the computer executable instructions to implement various functions of the data prediction apparatus 20. Various application programs and various data used and / or generated by the application programs can also be stored in the memory 200.

[0111] It should be noted that the data control apparatus 20 can achieve similar technical effects as the foregoing pressure and temperature metering calibration method based on current reconstruction, and the repeated parts will not be described herein.

[0112] The at least one embodiment of the present application also provides a non-transitory computer readable storage medium. Figure 10 A schematic diagram of a non-transitory computer readable storage medium provided by at least one embodiment of the present application is shown in FIG. 8. For example, as shown in FIG. 8, the non-transitory computer readable storage medium can include a computer program product 800. The computer program product 800 can include a computer readable storage medium 801. The computer readable storage medium 801 can include one or more computer readable program instructions 802. The one or more computer readable program instructions 802 can be executable by a processor 201 to implement various functions of the data prediction apparatus 20. Figure 10The one or more computer-executable instructions 301 can be non-transitorily stored in the non-transitory computer-readable storage medium 30, as shown. For example, the one or more computer-executable instructions 301, when executed by a computer, can cause the computer to perform one or more steps of the current-reconstruction-based pressure, temperature metrology calibration method according to any one of the embodiments of the present application.

[0113] In one of the embodiments, the non-transitory computer-readable storage medium 30 can be applied in the data control device 20 described above, for example, it can be the memory 200 in the data control device 20.

[0114] In one of the embodiments, the description about the non-transitory computer-readable storage medium 30 can refer to the description about the memory 200 in the embodiments of the data control device 20, and the repeated parts will not be described herein.

[0115] It should be noted that the memory 200 stores different non-transitory computer-executable instructions, and the data control device 20 corresponds to a firmware upgrade device, which can cause the processor 201 to perform one or more steps of the current-reconstruction-based pressure, temperature metrology calibration method according to any one of the embodiments of the present application when the computer-executable instructions are executed by the processor 201.

[0116] For the present application, the following points need to be explained:

[0117] (1) The drawings of the embodiments of the present application only involve the structures involved in the embodiments of the present application, and other structures can refer to the general design.

[0118] (2) For the sake of clarity, in the drawings used to describe the embodiments of the present application, the thickness and size of the layers or structures are exaggerated. It can be understood that when an element such as a layer, film, region, or substrate is referred to as being "on" or "under" another element, it can be "directly" on or under the other element, or there can be an intermediate element.

[0119] (3) The embodiments of the present application and the features in the embodiments can be combined with each other to obtain new embodiments without conflict. The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto, and the protection scope of the present application should be subject to the protection scope of the claims.

[0120] The technical features of the above embodiments can be combined arbitrarily, and for the sake of brevity, not all possible combinations of the technical features in the above embodiments are described, however, as long as the combinations of the technical features do not conflict, they should be considered as the scope of the present application.

[0121] The above embodiments only express several implementation ways of the present application, and the description is specific and detailed, but it should not be understood as a limitation to the patent scope of the application. It should be pointed out that for ordinary skilled in the art, without departing from the concept of the present application, several modifications and improvements can be made, which all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application should be subject to the appended claims.

Claims

1. A method for pressure, temperature metrological calibration based on current reconstruction, characterized in that, The application is applied to a verification and calibration system. The verification and calibration system comprises: A sequence wave emission module configured to output modulated currents to the independent bus in a four-segment wave emission manner according to a set sequence; The sequence wave emitting module adopts four-stage wave emitting, including six sectors; each sector outputs V ref voltage, using adjacent effective vectors V 1 and V 2 de-synthesis, and the specific synthesis mode is as follows: ; To Adjust, calculate as follows: ; ; ; wherein, is a PWM carrier period of the sequence generator module, is a zero vector, is a neighboring active vector, is a zero vector action time, is a neighboring active vector action time, is a desired output voltage, is an independent bus voltage, is an output voltage vector and is a vector angle, is a period of the new active vector; a pressure measuring instrument is configured to superimpose a pressure current on the independent bus according to a pressure measurement result; wherein the pressure current is superimposed on the modulated current of the first sequence. A temperature measuring instrument configured to superimpose a temperature current on the independent bus according to a temperature measurement result; wherein the temperature current is superimposed on the modulated current of the second sequence; The method comprises the steps of: collecting the modulated current of the first sequence and the modulated current of the second sequence respectively; inserting a pressure current at the beginning segment of the first sequence and obtaining a first sampling current in a sampling sequence window, and reconstructing a pressure calibration value according to the first sampling current; inserting a temperature current at the beginning segment of the second sequence and obtaining a second sampling current in a sampling sequence window, and reconstructing a temperature calibration value according to the second sampling current.

2. The current-reconstruction-based pressure, temperature metrology calibration method of claim 1, wherein, The process of inserting the pressure current at the beginning segment of the first sequence, obtaining the first sampling current in the sampling sequence window, and reconstructing the pressure calibration value according to the first sampling current comprises the steps of: decomposing the pressure current into two effective pressure vectors and inserting the effective pressure vectors at the beginning segment of the first sequence; completing the sampling of the first sampling current in a window period formed by the effective pressure vectors; reconstructing the first sampling current into a three-phase current and calculating the effective value of the three-phase current as the pressure calibration value.

3. The current-reconstruction-based pressure, temperature metrology calibration method of claim 1, wherein, The process of inserting the temperature current at the beginning segment of the second sequence, obtaining the second sampling current in the sampling sequence window, and reconstructing the temperature calibration value according to the second sampling current comprises the steps of: decomposing the temperature current into two effective temperature vectors and inserting the effective temperature vectors at the beginning segment of the second sequence; completing the sampling of the second sampling current in a window period formed by the effective temperature vectors; reconstructing the second sampling current into a three-phase current and calculating the effective value of the three-phase current as the temperature calibration value.

4. The current-reconstruction-based pressure, temperature metrology calibration method of claim 1, wherein, The method further comprises the steps of: finding a pressure measurement value corresponding to the pressure calibration value according to a lookup table method; finding a temperature measurement value corresponding to the temperature calibration value according to a lookup table method.

5. A pressure, temperature metrological calibration device based on current reconstruction, characterized by, The application is applied to a verification and calibration system. The verification and calibration system comprises: A sequence wave emission module configured to output modulated currents to the independent bus in a four-segment wave emission manner according to a set sequence; The sequence generating module adopts four-segment generating, including 6 sectors; each sector outputs V ref voltage, using adjacent effective vectors V 1 and V 2 de-synthesis, the specific synthesis mode is as follows: ; ; to adjust, calculated as follows: ; ; ; wherein, is the PWM carrier period of the sequence generator module, is the zero vector, is the adjacent active vector, is the zero vector action time, is the adjacent active vector action time, is the desired output voltage, is the independent bus voltage, is the output voltage vector and is the angle between the output voltage vector and the vector; is the period of the new active vector; A pressure measuring instrument configured to superimpose a pressure current on the independent bus according to a pressure measurement result; wherein the pressure current is superimposed on the modulated current of the first sequence; A temperature measuring instrument configured to superimpose a temperature current on the independent bus according to a temperature measurement result; wherein the temperature current is superimposed on the modulated current of the second sequence; The method comprises the steps of: collecting the modulated current of the first sequence and the modulated current of the second sequence respectively; inserting a pressure current at the beginning segment of the first sequence and obtaining a first sampling current in a sampling sequence window, and reconstructing a pressure calibration value according to the first sampling current; inserting a temperature current at the beginning segment of the second sequence and obtaining a second sampling current in a sampling sequence window, and reconstructing a temperature calibration value according to the second sampling current.

6. A data control device, characterized by comprising: The method comprises the steps of: one or more memories non-transitorily storing computer executable instructions; One or more processors configured to execute computer-executable instructions, wherein the computer-executable instructions when executed by the one or more processors implement the method for calibrating pressure and temperature measurements based on current reconstruction according to any one of claims 1 to 4.

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