Test system model generation method and device, medium and equipment

Abstract

The embodiment of the invention discloses a test system model generation method and device, a medium and equipment, and relates to the technical field of automated tests.Third-party equipment is regarded as a special tested product for common modeling, the third-party equipment is integrated into whole test system modeling, the modeling range is expanded, the universality is enhanced, and the test system model generation efficiency is improved. After the electrical connection mode of the target third-party equipment is obtained, the number of channels of different signal types can be sorted out, the total number of signal type channels required by the test of the tested product is obtained after merging statistics, finally, a test station model is obtained after model constraint is loaded, and a test result is obtained by combining the initial modeling conditions of the tested product and the third-party equipment. According to the invention, the adapter model and the test cable model are quickly generated, the modeling of the test system is completed, and the effect of modeling the test system by the third-party equipment is improved.

Description

Technical Field

[0001] The present application relates to the field of automated testing technology, and in particular to a test system model generation method, device, medium and equipment. Background Art

[0002] In the field of general signal-oriented automated testing, the current mainstream methods require modeling of the test system and the product under test. The main components of the test system include test stations and adapters. The mainstream method for modeling the test system still uses manual design, and the degree of automation and efficiency are insufficient. Especially when third-party equipment is involved, the existing methods are less effective and can only generate local models. There is no unified modeling method and the versatility is limited. Summary of the invention

[0003] The main purpose of the present application is to provide a test system model generation method, device, medium and equipment, aiming to solve the problem in the prior art that the effect of modeling the test system involving third-party equipment is poor.

[0004] To achieve the above objectives, the technical solutions adopted in the embodiments of the present application are as follows: In a first aspect, an embodiment of the present application provides a method for generating a test system model, comprising the following steps: Modeling the product under test and the third-party device respectively to obtain a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device; Matching the first virtual interface with the second virtual interface to select a target third-party device; Acquire a second electrical interface of the target third-party device according to an electrical connection method of the target third-party device; The first electrical interface and the second electrical interface of the target third-party device are combined and counted to obtain the total number of signal type channels required for the test; Load model constraints according to the total number of signal type channels required for the test to obtain a test station model; An adapter model and a test cable model are generated according to the test resource electrical interface, the first electrical interface, the second electrical interface and the adapter front panel constraints of the test station model.

[0005] In a possible implementation of the first aspect, generating an adapter model and a test cable model according to a test resource electrical interface, a first electrical interface, a second electrical interface, and an adapter front panel constraint of a test station model includes: According to the test resource electrical interface, the first electrical interface and the second electrical interface of the test station model, a first mapping relationship between the test resource electrical interface and the product under test and the third-party device is obtained; Generate a second mapping relationship from the front panel of the adapter to the rear panel of the adapter, and a third mapping relationship from the connector port of the rear panel of the adapter to the product under test and the third-party device according to the first mapping relationship and the constraint of the front panel of the adapter; According to the second mapping relationship and the third mapping relationship, the adapter model and the test cable model are determined respectively.

[0006] In a possible implementation of the first aspect, the model constraints include test station model constraints and adapter model constraints. The test station model constraints include test station model constraints, backplane bus type constraints, and function card slot quantity constraints. The adapter model constraints include adapter front panel constraints and adapter rear panel constraints.

[0007] In a possible implementation manner of the first aspect, before loading the model constraints according to the total number of signal type channels required for the test and obtaining the test station model, the method further includes: Define the adapter front panel constraints based on the fact that the number of channels that each signal type can pass through on the adapter front panel is not less than the total number of signal type channels required for the test.

[0008] In a possible implementation of the first aspect, loading a model constraint according to the total number of signal type channels required for testing to obtain a test station model includes: Load the adapter front panel constraints and the test station model constraints according to the total number of signal type channels required for the test to obtain the test station model.

[0009] In a possible implementation of the first aspect, before acquiring the second electrical interface of the target third-party device according to the electrical connection mode of the target third-party device, the method further includes: According to the network port control and program-controlled power supply of the target third-party device, confirm whether to perform electrical interface analysis to obtain the electrical connection method of the target third-party device.

[0010] In a possible implementation of the first aspect, the modeling method for modeling the product under test and the third-party equipment respectively includes electrical interface modeling and virtual indicator modeling. The electrical interface modeling is used to define the signal type of each channel of the connector and the meaning of the pins in the channel. The virtual indicator modeling is used to define the performance indicators of non-electrical interface signals.

[0011] In a second aspect, an embodiment of the present application provides a test system model generation device, including: A modeling module, the modeling module is used to model the product under test and the third-party device respectively, to obtain a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device; A matching module, the matching module is used to match the first virtual interface and the second virtual interface to select a target third-party device; An acquisition module, the acquisition module is used to acquire a second electrical interface of the target third-party device according to an electrical connection mode of the target third-party device; A statistics module, the statistics module is used to combine and count the first electrical interface and the second electrical interface of the target third-party device to obtain the total number of signal type channels required for the test; The constraint module is used to load the model constraints according to the total number of signal type channels required for the test, and obtain the test station model; A generation module is used to generate an adapter model and a test cable model according to the test resource electrical interface, the first electrical interface, the second electrical interface and the adapter front panel constraints of the test station model.

[0012] In a third aspect, an embodiment of the present application provides a computer-readable storage medium storing a computer program. When the computer program is loaded and executed by a processor, the test system model generation method provided in any one of the first aspects above is implemented.

[0013] In a fourth aspect, an embodiment of the present application provides an electronic device, including a processor and a memory, wherein: The memory is used to store computer programs; The processor is used to load and execute a computer program so that the electronic device executes the test system model generation method provided in any one of the first aspects above.

[0014] Compared with the prior art, the beneficial effects of this application are: The present application embodiment proposes a test system model generation method, device, medium and equipment, the method comprising: modeling a product under test and a third-party device respectively, obtaining a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device; matching the first virtual interface and the second virtual interface to select a target third-party device; obtaining the second electrical interface of the target third-party device according to the electrical connection method of the target third-party device; merging the first electrical interface and the second electrical interface of the target third-party device and performing statistics to obtain the total number of signal type channels required for the test; loading model constraints according to the total number of signal type channels required for the test to obtain a test station model; generating an adapter model and a test cable model according to the test resource electrical interface, the first electrical interface, the second electrical interface and the adapter rear panel constraints of the test station model. This application treats the third-party device as a special product under test and models it together, and uses it to assist in the testing of the product under test. Since the third-party device will also be linked to the test resources through a specific signal port, matching the virtual interface to determine the target third-party device is also ready for the electrical interface merge statistics, and the third-party device is integrated into the modeling of the entire test system, which expands the modeling scope and enhances versatility. After obtaining the electrical connection method of the target third-party device, the number of channels of different signal types can be sorted out, and the total number of signal type channels required for testing the product under test can be obtained after merge statistics. Finally, the test station model is obtained after loading the model constraints. Combined with the initial modeling of the product under test and the third-party device, the adapter model and the test cable model are quickly generated to complete the modeling of the test system, which improves the effect of modeling the test system involving third-party devices. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 A schematic diagram of the structure of an electronic device of a hardware operating environment involved in an embodiment of the present application; Figure 2 A flow chart of a test system model generation method provided in an embodiment of the present application; Figure 3 A schematic diagram of a flow chart of obtaining an electrical connection mode of a target third-party device in a test system model generation method provided in an embodiment of the present application; Figure 4 A schematic diagram of a module of a test system model generating device provided in an embodiment of the present application; Markings in the figure: 101 - processor, 102 - communication bus, 103 - network interface, 104 - user interface, 105 - memory. DETAILED DESCRIPTION

[0016] It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0017] See attached Figure 1 , attached Figure 1 This is a schematic diagram of the structure of an electronic device of the hardware operating environment involved in the embodiment of the present application. The electronic device may include: a processor 101, such as a central processing unit (CPU), a communication bus 102, a user interface 104, a network interface 103, and a memory 105. Among them, the communication bus 102 is used to realize the connection and communication between these components. The user interface 104 may include a display (Display), an input unit such as a keyboard (Keyboard), and the user interface 104 may also include a standard wired interface and a wireless interface. The network interface 103 may optionally include a standard wired interface and a wireless interface (such as a wireless fidelity (WIreless-FIdelity, WI-FI) interface). The memory 105 may optionally be a storage device independent of the aforementioned processor 101. The memory 105 may be a high-speed random access memory (RAM) memory, or it may be a stable non-volatile memory (NVM), such as at least one disk storage. The processor 101 may be a general-purpose processor, including a central processing unit, a network processor, etc., or it may be a digital signal processor, an application-specific integrated circuit, a field programmable gate array or other programmable logic device, a discrete gate or transistor logic device, or a discrete hardware component.

[0018] Those skilled in the art will appreciate that Figure 1 The structure shown in the figure does not constitute a limitation on the electronic device, and may include more or less components than shown in the figure, or combine certain components, or arrange the components differently.

[0019] As attached Figure 1 As shown, the memory 105 as a storage medium may include an operating system, a network communication module, a user interface module, and a test system model generating device.

[0020] In the attached Figure 1 In the electronic device shown, the network interface 103 is mainly used for data communication with the network server; the user interface 104 is mainly used for data interaction with the user; the processor 101 and the memory 105 in the present application can be set in the electronic device, and the electronic device calls the test system model generation device stored in the memory 105 through the processor 101, and executes the test system model generation method provided in the embodiment of the present application.

[0021] See attached Figure 2 Based on the hardware device of the aforementioned embodiment, an embodiment of the present application provides a test system model generation method, comprising the following steps: S10: Modeling the product under test and the third-party device respectively to obtain a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device.

[0022] In the specific implementation process, the product under test (UUT) can be any electronic and electrical system, such as a radio altimeter. Third-party equipment generally refers to equipment that cannot be added to a traditional test chassis and is used to assist in product testing, such as a turntable, radar target simulator, communication and navigation simulator, altimeter simulator, atmospheric pressure simulator, etc. Modeling mainly includes two parts, namely: the modeling methods for modeling the product under test and third-party equipment respectively include electrical interface modeling and virtual indicator modeling. Electrical interface modeling is used to define the signal type of each channel of the connector and the meaning of the pins in the channel. Virtual indicator modeling is used to define the performance indicators of non-electrical interface signals.

[0023] One part is the electrical interface modeling, which is based on the ICD (interface control file) modeling of the electrical interface, which is used to define the signal type of each channel of the connector and the meaning of the pins in the channel, and the signal classification includes bus, analog, discrete, pulse, etc.; the other part is the virtual indicator modeling, which is used to define the functions and performance indicators that cannot be described by the connector channel, that is, the performance indicators of non-electrical interface signals. For example, if the product under test is a radio altimeter, the performance description of its non-electrical interface signals includes maximum measurement altitude, maximum lifting speed, altitude accuracy, lifting speed accuracy, etc. The modeling of the product under test and the third-party equipment adopts the same method, that is, the third-party equipment is regarded as a special UUT, and its modeling content is consistent with the UUT. The difference is that the third-party equipment is used to assist the testing of the product under test.

[0024] S20: Match the first virtual interface and the second virtual interface to select a target third-party device.

[0025] During the specific implementation process, according to the virtual indicators determined above, that is, the first virtual interface of the product under test and the second virtual interface of the third-party device, a third-party device that meets the test requirements is matched and selected, recorded as the target third-party device, and the selected third-party device is used to assist the UUT test. Since the third-party device will also be linked to the test resources through a specific signal port, this will prepare for the total electrical interface statistics required for subsequent testing of the UUT.

[0026] S30: Acquire a second electrical interface of the target third-party device according to the electrical connection mode of the target third-party device.

[0027] In a specific implementation process, by acquiring the electrical connection mode of the target third-party device, sorting out the number of channels of different signal types, and determining the second electrical interface of the target third-party device, specifically, according to the electrical connection mode of the target third-party device, before acquiring the second electrical interface of the target third-party device, the method further includes: According to the network port control and program-controlled power supply of the target third-party device, confirm whether to perform electrical interface analysis to obtain the electrical connection method of the target third-party device.

[0028] The process of obtaining the electrical connection method of the target third-party device is as follows: Figure 3 As shown in the figure, if the target third-party device is only controlled through the network port and does not require program-controlled power supply, there is no need to perform electrical connection analysis. You only need to connect the third-party device to the switch and directly control it through the measurement and control host. If the target third-party device is only controlled through the network port but requires program-controlled power supply, an electrical connection analysis is required. If the target third-party device contains other types of signals besides the network port, such as bus, analog quantity, discrete quantity, etc., an electrical connection analysis is required.

[0029] S40: The first electrical interface and the second electrical interface of the target third-party device are combined and counted to obtain the total number of signal type channels required for the test.

[0030] During the specific implementation process, the first electrical interface and the second electrical interface of the target third-party device are combined and counted to obtain the total number of signal type channels required for the UUT test. It should be noted that when obtaining the electrical connection method of the target third-party device, only the second electrical interface of the target third-party device is combined and counted when electrical connection analysis is required.

[0031] S50: Load model constraints according to the total number of signal type channels required for the test to obtain a test station model.

[0032] During the specific implementation process, model constraints can be established in advance and used to directly generate a test station model when the aforementioned conditions are determined, which is one part of the test system modeling. The model constraints include test station model constraints and adapter model constraints. The test station model constraints include test station model constraints, backplane bus type constraints, and function card slot quantity constraints. The adapter model constraints include adapter front panel constraints and adapter rear panel constraints.

[0033] The front panel of the adapter faces the UUT, and the rear panel faces the test station. The front panel constraints are the constraints of its connectors and pins. The constraints are the connector numbers and the signal types of the pins, such as pins 1 to 20 for AD / DA signals, pins 21 to 40 for DIO signals, pins 41 to 50 for RS422 signals, and pins 51 to 60 for CAN signals. When performing adapter adaptation, it should be noted that the result of automatic adaptation can be a combination of multiple adapters or a single adapter. The adaptation principle is that the sum of the number of channels of the same signal type is not less than the combined statistical result of the electrical interface, that is: load the model constraints according to the total number of channels of the signal type required for the test, and before obtaining the test station model, the method also includes: Define the adapter front panel constraints based on the fact that the number of channels that each signal type can pass through on the adapter front panel is not less than the total number of signal type channels required for the test.

[0034] In one embodiment, loading model constraints according to the total number of signal type channels required for testing to obtain a test station model includes: Load the adapter front panel constraints and the test station model constraints according to the total number of signal type channels required for the test to obtain the test station model.

[0035] In the specific implementation process, because in terms of physical connection, the cross-linking between the general adapter and the same type of test station is customized, adapters of different structural sizes cannot be combined with different test stations, so the adapter model is required to be uniquely bound to the same model of test station. Therefore, when the adapter is loaded and automatically adapted, it also means that the selection of the test station is completed synchronously. According to the constraints of the test station, the resource board that meets the test requirements is placed in the corresponding slot of the corresponding test station, the test station model is generated, and the configuration of the resource board in each slot of the test station is realized. It should be noted that if there are constraints on the back panel of the adapter, the constraints on the back panel of the adapter need to be loaded.

[0036] S60: Generate an adapter model and a test cable model according to the test resource electrical interface, the first electrical interface, the second electrical interface and the adapter front panel constraints of the test station model.

[0037] In the specific implementation process, the resource cards of each slot in the test station are determined in the above steps, which also determines the definition of each port of the resource card, that is, the test resource electrical interface. Combined with the modeling of the first electrical interface and the second electrical interface, the model is determined according to the corresponding mapping relationship. Specifically: according to the test resource electrical interface, the first electrical interface, the second electrical interface and the adapter front panel constraints of the test station model, the adapter model and the test cable model are generated, including: According to the test resource electrical interface, the first electrical interface and the second electrical interface of the test station model, a first mapping relationship between the test resource electrical interface and the product under test and the third-party device is obtained; Generate a second mapping relationship from the front panel of the adapter to the rear panel of the adapter, and a third mapping relationship from the connector port of the rear panel of the adapter to the product under test and the third-party device according to the first mapping relationship and the constraint of the front panel of the adapter; According to the second mapping relationship and the third mapping relationship, the adapter model and the test cable model are determined respectively.

[0038] Based on the definition of each port of the resource card, combined with the modeling of the first electrical interface and the second electrical interface, the mapping relationship between each port in each resource card and the UUT or third-party device can be realized, that is, the first mapping relationship. Combined with the adapter front panel constraints, the mapping relationship from the adapter front panel to the rear panel (adapter model), that is, the second mapping relationship, and the mapping relationship from the adapter rear panel connector port to the UUT or third-party device connector port (test cable model), that is, the third mapping relationship, can be generated simultaneously. At this point, the unified modeling of the test system is completed.

[0039] In this embodiment, the third-party device is regarded as a special product under test and modeled together, and is used to assist in the testing of the product under test. Since the third-party device will also be linked to the test resources through a specific signal port, matching the virtual interface to determine the target third-party device is also ready for the electrical interface merging statistics. The third-party device is integrated into the modeling of the entire test system, which expands the modeling scope and enhances versatility. After obtaining the electrical connection method of the target third-party device, the number of channels of different signal types can be sorted out, and the total number of signal type channels required for testing the product under test can be obtained after merging statistics. Finally, the test station model is obtained after loading the model constraints. Combined with the initial modeling of the product under test and the third-party device, the adapter model and the test cable model are quickly generated to complete the modeling of the test system, thereby improving the effect of modeling the test system involving third-party devices.

[0040] See attached Figure 4 Based on the same inventive concept as in the above-mentioned embodiment, the embodiment of the present application further provides a test system model generating device, comprising: A modeling module, the modeling module is used to model the product under test and the third-party device respectively, to obtain a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device; A matching module, the matching module is used to match the first virtual interface and the second virtual interface to select a target third-party device; An acquisition module, the acquisition module is used to acquire a second electrical interface of the target third-party device according to an electrical connection mode of the target third-party device; A statistics module, the statistics module is used to combine and count the first electrical interface and the second electrical interface of the target third-party device to obtain the total number of signal type channels required for the test; The constraint module is used to load the model constraints according to the total number of signal type channels required for the test, and obtain the test station model; A generation module is used to generate an adapter model and a test cable model according to the test resource electrical interface, the first electrical interface, the second electrical interface and the adapter front panel constraints of the test station model.

[0041] Those skilled in the art should understand that the division of the various modules in the embodiment is merely a division of logical functions, and in actual application, all or part of them can be integrated into one or more actual carriers, and these modules can be implemented entirely in the form of software called by a processing unit, or entirely in the form of hardware, or in the form of a combination of software and hardware. It should be noted that each module in the test system model generation device in this embodiment corresponds one-to-one to each step in the test system model generation method in the aforementioned embodiment. Therefore, the specific implementation of this embodiment can refer to the implementation of the aforementioned test system model generation method, which will not be repeated here.

[0042] Based on the same inventive concept as in the aforementioned embodiment, an embodiment of the present application further provides a computer-readable storage medium storing a computer program, which, when loaded and executed by a processor, implements a test system model generation method as provided in an embodiment of the present application.

[0043] Based on the same inventive concept as in the above-mentioned embodiment, an embodiment of the present application further provides an electronic device, including a processor and a memory, wherein: The memory is used to store computer programs; The processor is used to load and execute a computer program so that the electronic device executes the test system model generation method provided in the embodiment of the present application.

[0044] In some embodiments, the computer readable storage medium may be a memory such as FRAM, ROM, PROM, EPROM, EEPROM, flash memory, magnetic surface memory, optical disk, or CD-ROM; or various devices including one or any combination of the above memories. The computer may be various computing devices including intelligent terminals and servers.

[0045] In some embodiments, executable instructions may be in the form of a program, software, software module, script or code, written in any form of programming language (including compiled or interpreted languages, or declarative or procedural languages), and may be deployed in any form, including as a stand-alone program or as a module, component, subroutine or other unit suitable for use in a computing environment.

[0046] As an example, executable instructions may, but need not, correspond to a file in a file system, may be stored as part of a file storing other programs or data, such as in one or more scripts in a HyperText Markup Language (HTML) document, in a single file dedicated to the program in question, or in multiple coordinated files (e.g., files storing one or more modules, subroutines, or code portions).

[0047] By way of example, executable instructions may be deployed to be executed on one computing device, or on multiple computing devices located at one site, or on multiple computing devices distributed across multiple sites and interconnected by a communication network.

[0048] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or system including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or system. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or system including the element.

[0049] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0050] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as a read-only memory / random access memory, a magnetic disk, or an optical disk), and includes a number of instructions for enabling a multimedia terminal device (which can be a mobile phone, a computer, a television receiver, or a network device, etc.) to execute the methods described in each embodiment of the present application.

[0051] In summary, the present application provides a test system model generation method, device, medium and equipment, the method including: modeling the product under test and the third-party device respectively, obtaining the first electrical interface and the first virtual interface of the product under test, and the second electrical interface and the second virtual interface of the third-party device; matching the first virtual interface and the second virtual interface to select the target third-party device; obtaining the second electrical interface of the target third-party device according to the electrical connection method of the target third-party device; merging the first electrical interface and the second electrical interface of the target third-party device and performing statistics to obtain the total number of signal type channels required for the test; loading the model constraints according to the total number of signal type channels required for the test to obtain the test station model; generating the adapter model and the test cable model according to the test resource electrical interface, the first electrical interface, the second electrical interface and the adapter back panel constraints of the test station model. This application treats the third-party device as a special product under test and models it together, and uses it to assist in the testing of the product under test. Since the third-party device will also be linked to the test resources through a specific signal port, matching the virtual interface to determine the target third-party device is also ready for the electrical interface merge statistics, and the third-party device is integrated into the modeling of the entire test system, which expands the modeling scope and enhances versatility. After obtaining the electrical connection method of the target third-party device, the number of channels of different signal types can be sorted out, and the total number of signal type channels required for testing the product under test can be obtained after merge statistics. Finally, the test station model is obtained after loading the model constraints. Combined with the initial modeling of the product under test and the third-party device, the adapter model and the test cable model are quickly generated to complete the modeling of the test system, which improves the effect of modeling the test system involving third-party devices.

[0052] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application should be included in the protection scope of the present application.

Claims

1. A test system model generation method, characterized in that: The following steps are involved: Modeling the product under test and the third-party device respectively to obtain a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device; Matching the first virtual interface with the second virtual interface to select a target third-party device; Acquire the second electrical interface of the target third-party device according to the electrical connection mode of the target third-party device; The first electrical interface and the second electrical interface of the target third-party device are combined and counted to obtain the total number of signal type channels required for the test; Load model constraints according to the total number of signal type channels required for the test to obtain a test station model; An adapter model and a test cable model are generated according to the test resource electrical interface of the test station model, the first electrical interface, the second electrical interface, and the adapter front panel constraints.

2. The test system model generation method according to claim 1, characterized in that: The step of generating an adapter model and a test cable model according to the test resource electrical interface of the test station model, the first electrical interface, the second electrical interface, and the adapter front panel constraint comprises: According to the test resource electrical interface of the test station model, the first electrical interface and the second electrical interface, obtaining a first mapping relationship between the test resource electrical interface and the product under test and the third-party device; Generate, according to the first mapping relationship and the adapter front panel constraint, a second mapping relationship from the adapter front panel to the adapter rear panel, and a third mapping relationship from the connector port of the adapter rear panel to the tested product and the third-party device; According to the second mapping relationship and the third mapping relationship, an adapter model and a test cable model are determined respectively.

3. The test system model generation method according to claim 1, characterized in that: The model constraints include test station model constraints and adapter model constraints. The test station model constraints include test station model constraints, backplane bus type constraints, and function card slot quantity constraints. The adapter model constraints include adapter front panel constraints and adapter rear panel constraints.

4. The test system model generation method according to claim 3, characterized in that: Before loading the model constraints according to the total number of signal type channels required for the test and obtaining the test station model, the method further includes: The adapter front panel constraints are defined based on the number of channels that each signal type can pass through on the adapter front panel being not less than the total number of signal type channels required for the test.

5. The test system model generation method according to claim 3, characterized in that: The step of loading the model constraints according to the total number of signal type channels required for the test to obtain the test station model comprises: The adapter front panel constraints and the test station model constraints are loaded according to the total number of signal type channels required for the test to obtain a test station model.

6. The test system model generation method according to claim 1, characterized in that: Before acquiring the second electrical interface of the target third-party device according to the electrical connection mode of the target third-party device, the method further includes: According to the network port control status and program-controlled power supply status of the target third-party device, determine whether to perform electrical interface analysis to obtain the electrical connection method of the target third-party device.

7. The test system model generation method according to claim 1, characterized in that: The modeling method for modeling the tested product and the third-party equipment respectively includes electrical interface modeling and virtual indicator modeling. The electrical interface modeling is used to define the signal type of each channel of the connector and the meaning of the pins in the channel, and the virtual indicator modeling is used to define the performance indicators of non-electrical interface signals.

8. A test system model generation device, characterized in that: include: A modeling module, the modeling module is used to model the product under test and the third-party device respectively, to obtain a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device; A matching module, the matching module is used to match the first virtual interface with the second virtual interface to select a target third-party device; an acquisition module, the acquisition module being used to acquire the second electrical interface of the target third-party device according to the electrical connection mode of the target third-party device; A statistical module, the statistical module is used to combine the first electrical interface and the second electrical interface of the target third-party device and perform statistics to obtain the total number of signal type channels required for the test; A constraint module, the constraint module is used to load the model constraint according to the total number of signal type channels required for the test to obtain a test station model; A generation module is used to generate an adapter model and a test cable model according to the test resource electrical interface of the test station model, the first electrical interface, the second electrical interface and the adapter front panel constraints.

9. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is loaded and executed by a processor, the test system model generation method according to any one of claims 1 to 7 is implemented.

10. An electronic device, characterized in that: comprising a processor and a memory, wherein: The memory is used to store computer programs; The processor is used to load and execute the computer program so that the electronic device executes the test system model generation method according to any one of claims 1 to 7.

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