Electrical testing system

Abstract

The present invention discloses an electrical testing system, belonging to the field of electrical testing, which comprises: a turntable device including a turntable and a carrier, the carrier can accommodate two substrates side by side, and the substrate includes a first part and a second part; a first testing device adapted to test the substrates of the carrier at the first testing position, which includes a first testing mechanism, a second testing mechanism and a third testing mechanism, the first testing mechanism is located above the first part of one of the substrates at the first testing position, the second testing mechanism is located above the second part of the same substrate, and the third testing mechanism is located above the second part of the other substrate at the first testing position; a third testing device, symmetrically arranged with the first testing device on both sides of the center line of the turntable; a second testing device located between the first testing device and the third testing device; the second part is close to the edge of the turntable, and the third testing mechanism is close to the second testing device. With the above structure, the present invention improves the testing efficiency and the testing devices are more compact with each other.

Description

Technical Field

[0001] The present invention relates to the technical field of substrate electrical testing, and particularly relates to an electrical testing system. Background Art

[0002] After the electrical substrate (circuit board) is processed, it is necessary to comprehensively detect its circuits, components, etc. to ensure the qualified ex-factory of the substrate. The substrate usually includes a rigid first part and a flexible second part, and both the first part and the second part need to be electrically tested. For example, Chinese invention patent CN202110758541.0 discloses a substrate detection system and a detection method, which includes a turntable and a plurality of detection mechanisms distributed along the circumferential direction of the turntable. A carrier for accommodating the substrate is provided on the turntable, and the carrier can sequentially flow through each test position driven by the turntable. The plurality of detection mechanisms are respectively arranged at different test positions to perform different item tests. However, the above carrier can only accommodate one substrate, that is, only one substrate can be tested at each test position, resulting in low test efficiency.

[0003] Therefore, it is necessary to improve the existing technology to overcome the defects in the existing technology. Summary of the Invention

[0004] The purpose of the present invention is to provide an electrical testing system, which can improve the test efficiency and make the various test devices located at the turntable more compact, so as to minimize the overall volume of the test system as much as possible.

[0005] The purpose of the present invention is achieved by the following technical solutions: An electrical testing system includes:

[0006] A turntable device, including a turntable and a plurality of carriers provided on the turntable. The carriers can accommodate two substrates side by side along the tangential direction of the turntable. The substrate includes a first part and a second part arranged along the radial direction of the turntable. The turntable is adapted to drive the carriers to rotate to a first test position, a second test position, and a third test position;

[0007] A first test device, adapted to test the substrate of the carrier at the first test position, which includes a first test mechanism, a second test mechanism, and a third test mechanism. The first test mechanism is located above the first part of one of the substrates at the first test position, the second test mechanism is located above the second part of the same substrate, and the third test mechanism is located above the second part of the other substrate at the first test position;

[0008] A third test device, having the same structure as the first test device, and adapted to test the substrate of the carrier at the third test position. The third test device and the first test device are symmetrically arranged on both sides of the center line of the turntable;

[0009] a second testing device, located between the first testing device and the third testing device, and adapted to test the substrate of the carrier at the second testing position;

[0010] The second part is closer to the edge of the turntable than the first part, and the third testing mechanism is closer to the second testing device than the first testing mechanism and / or the second testing mechanism.

[0011] Further, the first testing mechanism and the second testing mechanism are arranged side by side along the radial direction of the turntable, and the second testing mechanism and the third testing mechanism are arranged side by side along the tangential direction of the turntable.

[0012] Further, the first testing mechanism, the second testing mechanism and the third testing mechanism each include:

[0013] First alignment platform;

[0014] A first lifting driving member, arranged at an output end of the first alignment platform;

[0015] A first test head connected to an output end of the first lifting drive member;

[0016] The first test head corresponds to the test point of the first part and / or the second part in response to the driving of the first alignment platform, and the first test head contacts or moves away from the test point in response to the driving of the first lifting drive member.

[0017] Furthermore, the first testing device further comprises a lifting mechanism located below the turntable, and the lifting mechanism comprises:

[0018] Lifting drive parts;

[0019] A magnetic member connected to the output end of the lifting drive member and arranged opposite to the third testing mechanism;

[0020] Wherein, a Hall sensor is provided on the second part, and the magnetic component is suitable for being driven by the lifting driving component to approach the Hall sensor.

[0021] Furthermore, the second testing device comprises:

[0022] A fourth testing mechanism, located above a first portion of one of the substrates at the second testing position;

[0023] a fifth testing mechanism, located above the second portion of the same substrate, wherein the fifth testing mechanism and the fourth testing mechanism are arranged side by side along the radial direction of the turntable;

[0024] A transfer mechanism, drivingly connected to the fourth testing mechanism and the fifth testing mechanism;

[0025] Wherein, the fourth testing mechanism and the fifth testing mechanism are adapted to move tangentially along the turntable to different substrates at the second testing position under the drive of the transfer mechanism.

[0026] Furthermore, both the fourth testing mechanism and the fifth testing mechanism include:

[0027] A second alignment platform;

[0028] A second lifting drive member provided at the output end of the second alignment platform;

[0029] A second testing head connected to the output end of the second lifting drive member;

[0030] Wherein, the second testing head corresponds to the to-be-tested positions of the first part and / or the second part in response to the drive of the second alignment platform, and the second testing head contacts or moves away from the to-be-tested positions in response to the drive of the second lifting drive member.

[0031] Furthermore, the electrical testing system includes a hoisting frame, and the hoisting frame includes a hoisting plate located above the turntable. The first testing mechanism, the second testing mechanism, the third testing mechanism, the fourth testing mechanism and the fifth testing mechanism are all arranged on the hoisting plate.

[0032] Furthermore, the turntable is adapted to drive the carrier to sequentially rotate to the loading / unloading position, the photographing position, the first testing position, the second testing position and the third testing position. The electrical testing system includes:

[0033] A handling device adapted to load and unload the substrate of the carrier at the loading / unloading position;

[0034] A vision device adapted to perform vision positioning on the substrate of the carrier at the photographing position.

[0035] Furthermore, the handling device includes:

[0036] A manipulator, with a mounting plate provided at its output end;

[0037] A fixed picking and placing mechanism for picking and placing the substrate, which is arranged on the mounting plate;

[0038] A movable picking and placing mechanism for picking and placing the substrate, which is arranged on the mounting plate and can be lifted and lowered along the vertical direction;

[0039] Among them, the number of the fixed pick-and-place mechanism and the movable pick-and-place mechanism is two groups each. The two groups of fixed pick-and-place mechanisms are adapted to correspond to the substrates on the carrier one by one under the drive of the manipulator, and the two groups of movable pick-and-place mechanisms are adapted to correspond to the substrates on the carrier one by one under the drive of the manipulator.

[0040] Further, the vision device includes a vision mechanism. The number of the vision mechanisms is two groups, and they correspond to two substrates on the carrier one by one. Each vision mechanism includes two vision cameras to respectively correspond to the first part and the second part of the substrate.

[0041] Compared with the prior art, the present invention has the following beneficial effects: The carrier in the present invention can accommodate two substrates at the same time, so that the test devices at the test positions can test two substrates at the same time, improving the test efficiency; The test system includes a first test device, a second test device and a third test device arranged in sequence along the circumferential direction of the turntable. The first part and the second part of the substrate on the carrier are arranged along the radial direction of the turntable, and the second part is close to the edge of the turntable. The first test device includes a first test mechanism, a second test mechanism and a third test mechanism. The first test mechanism is located above the first part of one of the substrates at the first test position, the second test mechanism is located above the second part of the same substrate, and the third test mechanism is located above the second part of the other substrate at the first test position, so as to form an avoidance space above the first part of the other substrate. Since the third test mechanism is close to the second test device, the second test device and the first test device can be as close as possible without interference, making the overall test system more compact; The third test device and the first test device have the same structure, and the third test device and the first test device are symmetrically arranged on both sides of the center line of the turntable, so that the third test device and the second test device can be as close as possible without interference. While further improving the overall compactness of the test system, the first test device and the second test device can be complementary, that is, one of the substrates that is not tested by the first test mechanism and the second test mechanism at the first test position can be tested at the third test position, and the other substrate that is not tested by the third test mechanism at the first test position can be tested at the third test position; With the above structure, the present invention can test a preset number of items of the substrate while greatly improving the test efficiency and minimizing the overall volume of the system as much as possible, improving the space adaptability. Description of the Drawings

[0042] Figure 1 is a schematic structural diagram of the electrical test system of the present invention.

[0043] Figure 2 is a schematic structural diagram of the turntable part of the present invention.

[0044] Figure 3 is Figure 2Top view schematic diagram after removing the lifting frame.

[0045] Figure 4 is Figure 2 Schematic diagram of the structure after removing the lifting frame.

[0046] Figure 5 It is a schematic diagram of the structure of the vehicle in the present invention.

[0047] Figure 6 It is a schematic diagram of the structure of the first test device in the present invention.

[0048] Figure 7 It is a schematic diagram of the structure of the lifting mechanism in the present invention.

[0049] Figure 8 It is a schematic diagram of the structure of the second test device in the present invention.

[0050] Figure 9 It is a schematic diagram of the structure of the handling device in the present invention.

[0051] Figure 10 It is an installation schematic diagram of the fixed pick-and-place mechanism and the movable pick-and-place mechanism in the present invention.

[0052] Figure 11 It is a schematic diagram of the structure of the vision mechanism in the present invention.

[0053] Explanation of reference numerals:

[0054] 100, Turntable device; 110, Turntable; 111, Center line; 120, Carrier; 121, Carrier plate; 122, Positioning groove; 130, Substrate; 131, First part; 132, Second part; 133, Hall sensor; 200, First test device; 210, First test mechanism; 220, Second test mechanism; 230, Third test mechanism; 241, First alignment platform; 242, First lifting drive; 243, First test head; 250, Jacking mechanism; 251, Jacking drive; 252, Magnetic part; 260, First connecting plate; 300, Second test device; 310, Fourth test mechanism; 320, Fifth test mechanism; 330, Transfer mechanism; 341, Second alignment platform; 342, Second lifting drive; 343, Second test head; 350, Second connecting plate; 400, Third test device; 500, Hoisting frame; 510, Column; 520, Hoisting plate; 600, Handling device; 610, Manipulator; 611, Mounting plate; 620, Fixed picking and placing mechanism; 630, Movable picking and placing mechanism; 641, Bracket; 6411, Connecting part; 642, Sliding plate; 643, Suction head; 644, Third lifting drive; 645, Elastic part; 700, Vision device; 710, Vision mechanism; 711, Vision camera; 712, Third connecting plate; 713, Light source; 800, Conveyor device; 810, Tray. Detailed implementation manners

[0055] To make the above objects, features, and advantages of the present application more obvious and understandable, the following will describe in detail the specific implementation manners of the present application with reference to the accompanying drawings. It can be understood that the specific embodiments described herein are only used to explain the present application, rather than limiting the present application. Additionally, it should be noted that for the sake of description, only parts related to the present application are shown in the drawings, rather than all the structures. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts fall within the scope of protection of the present application.

[0056] The terms "including" and "having" and any variations thereof in the present application are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not limited to the listed steps or units, but optionally further includes steps or units not listed, or optionally further includes other steps or units inherent to these processes, methods, products, or devices.

[0057] References to "embodiments" in this specification mean that a particular feature, structure, or characteristic described in connection with an embodiment can be included in at least one embodiment of the present application. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0058] Please refer to Figures 1 to 4 As shown, a electrical testing system corresponding to a preferred embodiment of the present invention includes: a turntable device 100, including a turntable 110 and a plurality of carriers 120 provided on the turntable 110. The carriers 120 can accommodate two substrates 130 side by side along the tangent of the turntable 110. The substrates 130 include a first part 131 and a second part 132 arranged radially along the turntable 110. The turntable 110 is adapted to drive the carriers 120 to rotate to a first test position, a second test position, and a third test position; a first testing device 200, adapted to test the substrate 130 on the carrier 120 at the first test position, which includes a first testing mechanism 210, a second testing mechanism 220, and a third testing mechanism 230. The first testing mechanism 210 is located above the first part 131 of one of the substrates 130 at the first test position, the second testing mechanism 220 is located above the second part 132 of the same substrate 130, and the third testing mechanism 230 is located above the second part 132 of the other substrate 130 at the first test position; a third testing device 400, having the same structure as the first testing device 200, and adapted to test the substrate 130 on the carrier 120 at the third test position. The third testing device 400 and the first testing device 200 are symmetrically arranged on both sides of the center line 111 of the turntable 110; a second testing device 300, located between the first testing device 200 and the third testing device 400, and adapted to test the substrate 130 of the carrier 120 at the second test position; wherein, the second part 132 is closer to the edge of the turntable 110 than the first part 131, and the third testing mechanism 230 is closer to the second testing device 300 than the first testing mechanism 210 and / or the second testing mechanism 220.

[0059] The vehicle 120 in the present invention can accommodate two substrates 130 simultaneously, enabling the testing device at the testing position to test two substrates 130 simultaneously, thereby improving the testing efficiency. The testing system includes a first testing device 200, a second testing device 300, and a third testing device 400 arranged in sequence along the circumferential direction of the turntable 110. The first part 131 and the second part 132 of the substrate 130 on the vehicle 120 are arranged along the radial direction of the turntable 110, and the second part 132 is close to the edge of the turntable 110. The first testing device 200 includes a first testing mechanism 210, a second testing mechanism 220, and a third testing mechanism 230. The first testing mechanism 210 is located above the first part 131 of one of the substrates 130 at the first testing position, the second testing mechanism 220 is located above the second part 132 of the same substrate 130, and the third testing mechanism 230 is located above the second part 132 of the other substrate 130 at the first testing position, so as to form an avoidance space above the first part 131 of the other substrate 130. Since the third testing mechanism 230 is close to the second testing device 300, the second testing device 300 and the first testing device 200 can be as close as possible without interference, making the overall testing system more compact. The third testing device 400 has the same structure as the first testing device 200, and the third testing device 400 and the first testing device 200 are symmetrically arranged on both sides of the center line 111 of the turntable 110, enabling the third testing device 400 and the second testing device 300 to be as close as possible without interference. While further improving the overall compactness of the testing system, the first testing device 200 and the second testing device 300 can complement each other, that is, one of the substrates 130 not tested by the first testing mechanism 210 and the second testing mechanism 220 at the first testing position can be tested at the third testing position, and the other substrate 130 not tested by the third testing mechanism 230 at the first testing position can be tested at the third testing position. With the above structure, the present invention can test a preset number of items of the substrate 130 while greatly improving the testing efficiency and minimizing the overall volume of the system as much as possible, thereby improving the space adaptability.

[0060] Further, referring to Figure 5As shown, the first part 131 is a rigid plate, and the second part 132 is a strip-shaped flexible plate. One end of the second part 132 is connected to the first part 131, and the other end extends along the radial direction of the turntable 110. Measuring points to be tested are provided on both the first part 131 and the second part 132. The carrier 120 includes a carrier plate 121 fixed to the turntable 110. The length direction of the carrier plate 121 is parallel to the tangential direction of the turntable 110, and the width direction is parallel to the radial direction of the turntable 110. A positioning groove 122 is formed by the carrier plate 121 recessing inward from its top surface. The contour of the positioning groove 122 is adapted to the first part 131, and the first part 131 is adapted to be embedded and positioned in the positioning groove 122. The number of the positioning grooves 122 is two, and they are arranged side by side at intervals along the length direction of the carrier plate 121, so that the carrier 120 can accommodate two substrates 130 at the same time. A vacuum channel (not shown in the figure) is formed in the carrier plate 121, and a plurality of adsorption holes (not shown in the figure) communicating with the vacuum channel are opened on the top surface of the carrier plate 121. The adsorption holes correspond to the first part 131 and the second part 132 respectively to adsorb the first part 131 and the second part 132.

[0061] Further, referring to Figure 4 and Figure 6 As shown, the first testing mechanism 210 and the second testing mechanism 220 are arranged side by side along the radial direction of the turntable 110, and the second testing mechanism 220 and the third testing mechanism 230 are arranged side by side along the tangential direction of the turntable 110. The width direction of the carrier 120 at the first testing position is parallel to the arrangement direction of the first testing mechanism 210 and the second testing mechanism 220, and the length direction of the carrier 120 at the first testing position is parallel to the arrangement direction of the second testing mechanism 220 and the third testing mechanism 230.

[0062] The first testing mechanism 210, the second testing mechanism 220 and the third testing mechanism 230 have the same or substantially the same structure. All three include a first alignment platform 241, a first lifting driving member 242 and a first testing head 243. The first alignment platform 241 is specifically a UVW alignment platform, which can finely adjust the first testing head 243 according to the actual position of the measuring points to be tested on the substrate 130 on the carrier 120. The first lifting driving member 242 is arranged at the output end of the first alignment platform 241. The first lifting driving member 242 can adopt a linear cylinder or an electric cylinder, and is preferably a cylinder in this embodiment. The first testing head 243 is connected to the output end of the first lifting driving member 242, and it can contact the measuring point to be tested to achieve electrical connection. The first testing head 243 is a well-known structure, and will not be elaborated herein. The first testing head 243 corresponds to the measuring points to be tested on the first part 131 and / or the second part 132 in response to the driving of the first alignment platform 241, and the first testing head 243 contacts or moves away from the measuring point to be tested in response to the driving of the first lifting driving member 242.

[0063] In this embodiment, the first testing mechanism 210 is specifically used to test the partial circuit state on the first part 131, the second testing mechanism 220 is used to test the partial circuit state on the second part 132, and the third testing mechanism 230 is used to test another partial circuit state on the second part 132. The present invention will not be specifically expanded here, and the test items can be adjusted according to actual needs.

[0064] Furthermore, depending on the actual substrate 130, there is a case where the Hall sensor 133 is provided on the second portion 132, so another test item needs to test the operating state of the Hall sensor 133. As a preferred embodiment, the first test device 200 further includes a lifting mechanism 250 located below the turntable 110. Figure 7 As shown, the lifting mechanism 250 includes a lifting drive 251 and a magnetic member 252. The lifting drive 251 is a cylinder arranged in the vertical direction. The magnetic member 252 is a magnet, which is connected to the output end of the lifting drive 251. The magnetic member 252 is arranged opposite to the third testing mechanism 230. The magnetic member 252 is suitable for approaching the Hall sensor 133 under the drive of the lifting drive 251, and then cooperates with the third testing mechanism 230 to obtain the operating state of the Hall sensor 133. Preferably, the carrier plate 121 and the turntable 110 are both provided with avoidance holes for avoiding the Hall sensor 133 in the vertical direction, and the magnetic member 252 is suitable for passing through the avoidance holes to cooperate with the Hall sensor 133.

[0065] Further, in this embodiment, the second testing device 300 is used to test the inductance, capacitance and resistance of the electronic components on the substrate 130, and the time required for the second testing device 300 to test is less than the time required for the first testing device 200 and / or the second testing device 300 to test. Figure 4 and Figure 8 As shown, the second test device 300 includes a fourth test mechanism 310, a fifth test mechanism 320 and a transfer mechanism 330. The fourth test mechanism 310 and the fifth test mechanism 320 are arranged side by side along the radial direction of the turntable 110, the fourth test mechanism 310 is located above the first part 131 of one of the substrates 130 in the second test position, and the fifth test mechanism 320 is located above the second part 132 of the same substrate 130. The width direction of the carrier 120 in the second test position is parallel to the arrangement direction of the fourth test mechanism 310 and the fifth test mechanism 320. The transfer direction of the transfer mechanism 330 is parallel to the length direction of the carrier 120 in the second test position, and the transfer mechanism 330 is transmission-connected to the fourth test mechanism 310 and the fifth test mechanism 320. The transfer mechanism 330 is specifically a linear module composed of a motor and a lead screw. The fourth test mechanism 310 and the fifth test mechanism 320 are suitable for moving along the tangential direction of the turntable 110 to different substrates 130 at the second test position under the drive of the transfer mechanism 330 .

[0066] By adopting the above structure, after one of the substrates 130 on the second test-position vehicle 120 is tested, the transfer mechanism 330 can transfer the fourth test mechanism 310 and the fifth test mechanism 320 above another substrate 130 to continue the test, which can avoid setting two sets of the fourth test mechanism 310 and the fifth test mechanism 320, reduce the production cost, and since the second test device 300 takes a short time for testing, it will not greatly affect the overall test efficiency.

[0067] Furthermore, the structures of the fourth test mechanism 310 and the fifth test mechanism 320 are substantially the same. Both of them include a second alignment platform 341, a second lifting driving member 342, and a second test head 343. The second alignment platform 341 is specifically a UVW alignment platform, which can finely adjust the second test head 343 according to the actual position of the to-be-tested points on the substrate 130 on the vehicle 120. The second lifting driving member 342 is arranged at the output end of the second alignment platform 341. The second lifting driving member 342 can adopt a linear cylinder or an electric cylinder, and is preferably a cylinder in this embodiment. The second test head 343 is connected to the output end of the second lifting driving member 342, and can contact the to-be-tested points to achieve electrical connection. The second test head 343 is a well-known structure, and will not be elaborated herein. The second test head 343 corresponds to the to-be-tested points of the first part 131 and / or the second part 132 in response to the driving of the second alignment platform 341, and the second test head 343 contacts or moves away from the to-be-tested points in response to the driving of the second lifting driving member 342.

[0068] Furthermore, referring to Figure 2 、 Figure 4 、 Figure 6 and Figure 8 as shown, the electrical test system includes a hoisting frame 500. The hoisting frame 500 includes columns 510 and a hoisting plate 520. There are several columns 510, which are arranged around the turntable 110. The hoisting plate 520 is fixed to the tops of the several columns 510 and is located above the turntable 110. The first test mechanism 210, the second test mechanism 220, the third test mechanism 230, the fourth test mechanism 310, and the fifth test mechanism 320 are all arranged on the hoisting plate 520.

[0069] Specifically, the first alignment platform 241, the first lifting drive 242, and the first test head 243 are arranged in sequence from top to bottom. A plurality of first alignment platforms 241 of the first test device 200 are fixed to the bottom of the hoisting plate 520 through the first connecting plate 260. The outer contour of the first connecting plate 260 is adapted to the outer contour formed after the arrangement of the plurality of first alignment platforms 241, so as to prevent the first connecting plate 260 from obstructing the second test device 300. The second alignment platform 341, the second lifting drive 342, and the second test head 343 are arranged in sequence from top to bottom. The transfer mechanism 330 is located above the second alignment platform 341 and is fixed to the bottom of the hoisting plate 520. Two second alignment platforms 341 are fixed to the output end of the transfer mechanism 330 through the second connecting plate 350.

[0070] Further, returning Figure 1 and Figure 2 As shown, the turntable 110 is adapted to drive the carrier 120 to sequentially rotate to the loading / unloading position, the photographing position, the first test position, the second test position, and the third test position and then return to the loading / unloading position. The electrical test system further includes a handling device 600 and a vision device 700. The handling device 600, the vision device 700, the first test device 200, the second test device 300, and the third test device 400 are arranged in sequence along the circumferential direction of the turntable 110. The handling device 600 is adapted to load and unload the substrate 130 of the carrier 120 at the loading / unloading position. The vision device 700 is adapted to perform visual positioning on the substrate 130 on the carrier 120 at the photographing position, so that the first alignment platform 241 and the second alignment platform 341 can be finely adjusted according to the actual positions of the points to be tested on the substrate 130.

[0071] Further, referring to Figure 9 and Figure 10 As shown, the handling device 600 includes a manipulator 610, a fixed picking and placing mechanism 620, and a movable picking and placing mechanism 630. An installation plate 611 is provided at the output end of the manipulator 610. The fixed picking and placing mechanism 620 and the movable picking and placing mechanism 630 are both arranged on the installation plate 611 and are used for picking and placing the substrate 130. In this embodiment, the number of the fixed picking and placing mechanism 620 and the movable picking and placing mechanism 630 is two groups each, and they are arranged side by side and alternately. The two groups of fixed picking and placing mechanisms 620 are adapted to correspond to the substrates 130 on the carrier 120 one by one under the drive of the manipulator 610. The two groups of movable picking and placing mechanisms 630 are adapted to correspond to the substrates 130 on the carrier 120 one by one under the drive of the manipulator 610. The movable picking and placing mechanism 630 can lift and lower along the vertical direction to avoid interference with the fixed picking and placing mechanism 620. By adopting the above structure, one of the two groups of fixed picking and placing mechanisms 620 and the two groups of movable picking and placing mechanisms 630 can simultaneously pick up two tested substrates 130 from the carrier 120, and the other one can place two other substrates 130 to be tested into the carrier 120, improving the loading and unloading efficiency of the substrate 130.

[0072] Specifically, the fixed pick-and-place mechanism 620 and the movable pick-and-place mechanism 630 have similar structures. Both include a bracket 641, a sliding plate 642, and a suction head 643. The bracket 641 of the fixed pick-and-place mechanism 620 is fixed to the mounting plate 611. The movable pick-and-place mechanism 630 further includes a third lifting drive 644. The third lifting drive 644 is a linear cylinder, which is connected to the mounting plate 611 and has its output end connected to the bracket 641, thereby driving the bracket 641 to lift in the vertical direction. The sliding plate 642 is slidably connected to the bracket 641 in the vertical direction. Specifically, a slide rail structure arranged in the vertical direction can be provided between the sliding plate 642 and the bracket 641. The suction head 643 is fixed to the bottom of the sliding plate 642 and is adapted to adsorb or release the substrate 130. The suction head 643 is a conventional structure and will not be elaborated herein in the present invention.

[0073] Preferably, the bracket 641 has a connecting portion 6411 opposite to the top of the sliding plate 642. The fixed pick-and-place mechanism 620 and the movable pick-and-place mechanism 630 further include an elastic member 645, which is specifically a spring and is connected between the connecting portion 6411 and the top of the sliding plate 642. The elastic member 645 contracts in response to the upward sliding of the sliding plate 642 to be buffered when the suction head 643 approaches the substrate 130 downward, so as to avoid damaging the suction head 643 and / or the substrate 130.

[0074] Further, referring to Figure 11 As shown, the vision device 700 includes a vision mechanism 710 located above the turntable 110. The number of vision mechanisms 710 is two groups and corresponds one-to-one to two substrates 130 on the carrier 120 in the shooting position. Each vision mechanism 710 includes two vision cameras 711 to correspond to the first part 131 and the second part 132 of the substrate 130 respectively, so as to improve the shooting accuracy. The vision mechanism 710 further includes a third connecting plate 712 and a light source 713. The third connecting plate 712 is connected to the bottom of the hoisting plate 520. The vision cameras 711 and the light source 713 are both installed on the third connecting plate 712. The light source 713 is an annular light source and is located below the two vision cameras 711 to irradiate the substrate 130 on the carrier 120.

[0075] Further, referring to Figure 1 As shown, the battery cell testing system further includes a conveying device 800 and a defective product collecting device (not shown in the figure). The conveying device 800 is used to convey the substrate 130 to be detected to the handling device 600 and receive the qualified substrate 130 after detection. The defective product collecting device is used to receive the unqualified substrate 130 after detection. The conveying device 800 is specifically a conveying line for conveying the tray 810 containing the substrate 130, which is a well-known structure and will not be elaborated herein in the present invention.

[0076] The working process of the electrical testing system of the present invention is as follows: The handling device 600 grabs two substrates 130 to be tested in the loading tray 810 of the conveying device 800 and transports them to the carrier 120 at the loading and unloading position; The carrier 120 rotates to the photographing position driven by the turntable 110. At the photographing position, the vision device 700 can photograph the substrate 130 on the carrier 120 to obtain its position information. Then, the first testing device 200, the second testing device 300, and the third testing device 400 are finely adjusted according to the position information of the substrate 130 to ensure accurate alignment with the substrate 130; Then, the carrier 120 rotates to the first testing position driven by the turntable 110. The first part 131 of the substrate 130 located upstream corresponds to the first testing mechanism 210, the second part 132 corresponds to the second testing mechanism 220, the second part 132 of the substrate 130 located downstream corresponds to the third testing mechanism 230, the lifting mechanism 250 corresponds to the Hall sensor 133 of the substrate 130 located downstream. The first testing mechanism 210, the second testing mechanism 220, and the third testing mechanism 230 move downward to make electrical contact with the corresponding parts to complete the testing of some items. At the same time, the lifting mechanism 250 moves upward to approach the Hall sensor 133, so that the third testing mechanism 230 can also test the Hall sensor 133; After the testing is completed, the first testing device 200 resets. The carrier 120 rotates to the second testing position driven by the turntable 110. The fourth testing mechanism 310 and the fifth testing mechanism 320 respectively correspond to the first part 131 and the second part 132 of the substrate 130 located upstream. The fourth testing mechanism 310 and the fifth testing mechanism 320 move downward to make electrical contact with the corresponding parts to complete the testing of some items. After the testing is completed, the fourth testing mechanism 310 and the fifth testing mechanism 320 reset upward and move to the substrate 130 located downstream driven by the transfer mechanism 330, so that the fourth testing mechanism 310 and the fifth testing mechanism 320 respectively correspond to the first part 131 and the second part 132 of the downstream substrate 130 to complete the testing of the downstream substrate 130; After the testing of the substrate 130 at the second testing position is completed, the second testing device 300 resets. The carrier 120 rotates to the third testing position driven by the turntable 110. At this time, the second part 132 of the substrate 130 located upstream corresponds to the third testing mechanism 230 of the third testing device 400, and the Hall sensor 133 of this substrate 130 corresponds to the lifting mechanism 250. The first part 131 and the second part 132 of the substrate 130 located downstream respectively correspond to the first testing mechanism 210 and the second testing mechanism 220 of the third testing device 400, so that the first testing device 200 and the third testing device 400 complement each other to avoid omission of the testing items of the substrate 130;After the substrate 130 at the third test position is tested, the carrier 120 is rotated to the loading and unloading position under the drive of the turntable 110. The handling device 600 removes the tested substrate 130 from the carrier 120, and places the substrate 130 to be tested back on the carrier 120. The handling device 600 places the qualified substrate 130 back on the conveying device 800, and places the unqualified substrate 130 in the defective product collection device; repeating the above actions to achieve continuous testing of the substrate 130.

[0077] The above description is only the implementation mode of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made by using the content of the specification and drawings of the present application, or directly or indirectly applied in other related technical fields, shall be included in the patent protection scope of the present application by the same token.

Claims

1. An electrical testing system, characterized in that, include: A turntable device (100) comprises a turntable (110) and a plurality of carriers (120) arranged on the turntable (110), wherein the carriers (120) can accommodate two substrates (130) side by side along a tangential direction of the turntable (110), the substrate (130) comprising a first part (131) and a second part (132) arranged radially along the turntable (110), and the turntable (110) is suitable for driving the carriers (120) to flow to a first test position, a second test position, and a third test position; A first testing device (200) is suitable for testing the substrate (130) of the carrier (120) at the first testing position, and comprises a first testing mechanism (210), a second testing mechanism (220) and a third testing mechanism (230); the first testing mechanism (210) and the second testing mechanism (220) are arranged side by side in a radial direction of the turntable (110); the second testing mechanism (220) and the third testing mechanism (230) are arranged side by side in a tangential direction of the turntable (110); the first testing mechanism (210) is located above a first portion (131) of one of the substrates (130) at the first testing position; the second testing mechanism (220) is located above a second portion (132) of the same substrate (130); and the third testing mechanism (230) is located above a second portion (132) of another substrate (130) at the first testing position; A third testing device (400) having the same structure as the first testing device (200) and being suitable for testing the substrate (130) of the carrier (120) at the third testing position, the third testing device (400) and the first testing device (200) being symmetrically arranged on both sides of a center line (111) of the turntable (110); The second testing device (300) is located between the first testing device (200) and the third testing device (400) and is suitable for testing the substrate (130) of the carrier (120) at the second testing position. The second testing device (300) comprises: A fourth testing mechanism (310) is located above a first portion (131) of one of the substrates (130) at the second testing position; a fifth testing mechanism (320) located above the second portion (132) of the same substrate (130), the fifth testing mechanism (320) and the fourth testing mechanism (310) being arranged side by side in a radial direction of the turntable (110); A transfer mechanism (330) is transmission-connected to the fourth testing mechanism (310) and the fifth testing mechanism (320); The fourth testing mechanism (310) and the fifth testing mechanism (320) are adapted to be moved along the tangential direction of the turntable (110) to a substrate (130) different from the second testing position under the drive of the transfer mechanism (330); Wherein, the second part (132) is closer to the edge of the turntable (110) than the first part (131), and the third testing mechanism (230) is closer to the second testing device (300) than the first testing mechanism (210) and / or the second testing mechanism (220).

2. The electrical testing system according to claim 1, wherein The first testing mechanism (210), the second testing mechanism (220), and the third testing mechanism (230) all include: A first alignment platform (241); A first lifting driving member (242) provided at the output end of the first alignment platform (241); A first testing head (243) connected to the output end of the first lifting driving member (242); Wherein, the first testing head (243) corresponds to the point to be tested of the first part (131) and / or the second part (132) in response to the driving of the first alignment platform (241), and the first testing head (243) contacts or moves away from the point to be tested in response to the driving of the first lifting driving member (242).

3. The electrical testing system according to claim 1, wherein The first testing device (200) further includes a jacking mechanism (250) located below the turntable (110), and the jacking mechanism (250) includes: A jacking driving member (251); A magnetic member (252) connected to the output end of the jacking driving member (251) and arranged opposite to the third testing mechanism (230); Wherein, a Hall sensor (133) is provided on the second part (132), and the magnetic member (252) is adapted to approach the Hall sensor (133) under the driving of the jacking driving member (251).

4. The electrical testing system according to claim 1, wherein, The fourth testing mechanism (310) and the fifth testing mechanism (320) both include: A second alignment platform (341); A second lifting driving member (342) provided at the output end of the second alignment platform (341); A second testing head (343) connected to the output end of the second lifting driving member (342); Wherein, the second testing head (343) corresponds to the point to be tested of the first part (131) and / or the second part (132) in response to the driving of the second alignment platform (341), and the second testing head (343) contacts or moves away from the point to be tested in response to the driving of the second lifting driving member (342).

5. The electrical testing system according to claim 1, characterized in that The electrical testing system includes a hoisting frame (500), and the hoisting frame (500) includes a hoisting plate (520) located above the turntable (110). The first testing mechanism (210), the second testing mechanism (220), the third testing mechanism (230), the fourth testing mechanism (310), and the fifth testing mechanism (320) are all arranged on the hoisting plate (520).

6. The electrical testing system according to claim 1, wherein The turntable (110) is adapted to drive the carrier (120) to sequentially rotate to the loading / unloading position, the photographing position, the first testing position, the second testing position, and the third testing position. The electrical testing system includes: A handling device (600), adapted to load and unload a substrate (130) of the vehicle (120) at the loading and unloading position; A vision device (700), adapted to perform vision positioning on the substrate (130) of the vehicle (120) at the shooting position.

7. The electrical testing system according to claim 6, wherein, The handling device (600) includes: A manipulator (610), with a mounting plate (611) provided at its output end; A fixed picking and placing mechanism (620), used for picking and placing the substrate (130), which is arranged on the mounting plate (611); A movable picking and placing mechanism (630), used for picking and placing the substrate (130), which is arranged on the mounting plate (611) and can move up and down along the vertical direction; Wherein, the number of the fixed picking and placing mechanism (620) and the movable picking and placing mechanism (630) is two groups each. The two groups of the fixed picking and placing mechanisms (620) are adapted to correspond to the substrates (130) on the vehicle (120) one by one under the drive of the manipulator (610), and the two groups of the movable picking and placing mechanisms (630) are adapted to correspond to the substrates (130) on the vehicle (120) one by one under the drive of the manipulator (610).

8. The electrical testing system according to claim 6, characterized in that The vision device (700) includes a vision mechanism (710). The number of the vision mechanisms (710) is two groups, and they correspond to two substrates (130) on the vehicle (120) one by one. Each vision mechanism (710) includes two vision cameras (711) to respectively correspond to the first part (131) and the second part (132) of the substrate (130).

Images