Electronic load system, power supply test method, electronic equipment and storage medium

Abstract

The invention discloses an electronic load system, a power supply test method, an electronic device and a storage medium, and relates to the technical field of electrics. A main control circuit can provide a reference voltage for a current sampling and control circuit, and can also obtain load current setting parameters; the current sampling and control circuit determines a control voltage mainly by acquiring a sampling voltage and comparing the sampling voltage with a reference voltage so as to control an on-resistor in the power circuit through the control voltage and further control the magnitude of the current passing through the on-resistor, and meanwhile, the change rate of the current can be controlled due to a load current parameter. Therefore, the rapid change of the load current can be realized. Therefore, the technical problems of how to realize the rapid change of the current and improve the accuracy of the test result can be solved, and the technical effects of meeting the rapid change requirement of the current and improving the test result are achieved.

Description

Technical Field

[0001] The present application relates to the field of electrical technology, and in particular to an electronic load system and a power supply testing method, an electronic device and a storage medium. Background Art

[0002] In the field of electronic technology, board-level power integrity testing is a key link in ensuring the quality of circuit board power. As an important part of board-level power integrity testing, dynamic load testing is mainly used to evaluate the responsiveness and stability of the power supply when the load changes rapidly. At present, dynamic load testing is mainly implemented by electronic load meters.

[0003] In the integrity test of the board-level power supply, the DC circuit with a digital chip as the load has a high requirement for the current change slope. However, the existing electronic load system or instrument has a low nominal maximum load slope and actually fails to meet the nominal index, and is unable to quickly change the current, which leads to inaccurate test results. Summary of the invention

[0004] The present application provides an electronic load system and a power supply testing method, an electronic device and a storage medium, so as to at least solve the problem that the existing electronic load system or instrument in the related art has a low nominal maximum load slope and actually fails to reach the nominal index, and cannot quickly change the current, thus causing inaccurate test results.

[0005] The present application provides an electronic load system, including: a main control circuit, a current sampling and control circuit, a power circuit, and a working power supply circuit. A working power supply circuit, used for providing working voltage to the main control circuit; A main control circuit is used to obtain pre-configured load current parameters, convert the operating voltage into a reference voltage based on the load current parameters, and transmit the reference voltage to the current sampling and control circuit; wherein the reference voltage is a stable voltage value used as a reference standard in the electronic load system; The current sampling and control circuit is used to perform voltage sampling processing from the power circuit to obtain a sampled voltage, and to perform differential operation processing based on the sampled voltage and a reference voltage to obtain a control voltage, and transmit the control voltage to the power circuit; A power circuit is used to adjust the size of the on-resistance in the power circuit according to the control voltage, and adjust the size of the current according to the adjusted on-resistance and the load current parameter to obtain a target current, wherein the load current parameter is at least used to control the rate of adjusting the size of the current.

[0006] The present application also provides a power supply testing method, which is applied to the above-mentioned electronic load system, including: Obtaining pre-configured load current parameters, and converting the operating voltage into a reference voltage based on the load current parameters; wherein the reference voltage is a stable voltage value used as a reference standard in the electronic load system; Performing voltage sampling processing from a power circuit of an electronic load system to obtain a sampled voltage, and performing differential operation processing based on the sampled voltage and a reference voltage to obtain a control voltage; wherein the electronic load system is a pre-built system for power supply testing; The on-resistance in the power circuit is adjusted according to the control voltage, and the current is adjusted according to the adjusted on-resistance and the load current parameter to obtain a target current, wherein the load current parameter is at least used to control the rate at which the current is adjusted.

[0007] The present application also provides a power supply testing device, comprising: An acquisition unit, used to acquire a pre-configured load current parameter, and convert the operating voltage into a reference voltage based on the load current parameter; wherein the reference voltage is a stable voltage value used as a reference standard in the electronic load system; The sampling unit is used to perform voltage sampling processing from the power circuit of the electronic load system to obtain a sampled voltage; An operation unit, used for performing differential operation processing according to the sampled voltage and the reference voltage to obtain a control voltage; wherein the electronic load system is a pre-built system for power supply testing; The adjustment unit is used to adjust the size of the on-resistance in the power circuit according to the control voltage, and adjust the size of the current according to the adjusted on-resistance and the load current parameter to obtain the target current, wherein the load current parameter is at least used to control the rate of adjusting the size of the current.

[0008] The present application also provides an electronic device, comprising: a memory for storing a computer program; and a processor for implementing the steps of any one of the above-mentioned power supply testing methods when executing the computer program.

[0009] The present application also provides a computer-readable storage medium, in which a computer program is stored, wherein when the computer program is executed by a processor, the steps of any of the above-mentioned power supply testing methods are implemented.

[0010] The present application also provides a computer program product, including a computer program, which implements the steps of any of the above-mentioned power supply testing methods when executed by a processor.

[0011] Through the electronic load system and power supply test method, electronic device and storage medium of the present application, the main control circuit can give a reference voltage to the current sampling and control circuit, and can also obtain the load current setting parameters. The current sampling and control circuit mainly determines the control voltage by collecting the sampling voltage and comparing it with the reference voltage, so as to control the on-resistance in the power circuit through the control voltage, and then control the magnitude of the current passing through the on-resistance. At the same time, since the load current parameter can control the rate of change of the current, the rapid change of the load current can be achieved. Therefore, the technical problem of how to achieve rapid change of current and improve the accuracy of the test results can be solved, so as to meet the demand for rapid change of current and improve the technical effect of the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] In order to more clearly illustrate the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0013] Figure 1 A schematic diagram of the structure of an electronic load system provided in an embodiment of the present application; Figure 2 A working block diagram of an electronic load system provided in an embodiment of the present application; Figure 3 A schematic diagram of a page of a host computer provided in an embodiment of the present application; Figure 4 A schematic diagram of a current control loop provided in an embodiment of the present application; Figure 5 A schematic diagram of a flow chart of a power supply testing method provided in an embodiment of the present application; Figure 6 A schematic diagram of the structure of a power supply testing device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0014] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0015] It should be noted that, in the description of this application, the terms "include", "comprise" or any other variant thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. The terms "first", "second", etc. in this application are used to distinguish similar objects, and are not used to describe a specific order or sequence.

[0016] In order to enable those skilled in the art to better understand the present application, the present application is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0017] In conjunction with the specific application environment architecture or the specific hardware architecture on which the execution of the power supply testing method depends, the specific application environment architecture or the specific hardware architecture is described herein.

[0018] Figure 1 This is a structural schematic diagram of an electronic load system provided in the present application. The execution of the power supply testing method depends on the electronic load system.

[0019] like Figure 1 As shown, the electronic load system includes: a main control circuit 11, a current sampling and control circuit 12, a power circuit 13, and a working power supply circuit 14. A working power supply circuit 14, used for providing a working voltage to the main control circuit 11; The main control circuit 11 is used to obtain pre-configured load current parameters, convert the operating voltage into a reference voltage based on the load current parameters, and transmit the reference voltage to the current sampling and control circuit 12; The current sampling and control circuit 12 is used to perform voltage sampling processing from the power circuit to obtain a sampled voltage, and perform differential operation processing based on the sampled voltage and a reference voltage to obtain a control voltage, and transmit the control voltage to the power circuit 13; The power circuit 13 is used to adjust the size of the on-resistance in the power circuit according to the control voltage, and adjust the size of the current according to the adjusted on-resistance and the load current parameter to obtain the target current, wherein the load current parameter is at least used to control the rate of adjusting the size of the current.

[0020] Among them, the main control circuit 11 can be a digital control circuit composed of STM32F103 as the main control chip. Its main function is to give a reference voltage to the current sampling and control circuit 12 through the digital-to-analog conversion (DAC) function to control the current passing through the metal-oxide-semiconductor (MOS); it can also communicate with the host computer to obtain the load current setting parameters, and can also realize multi-machine parallel operation through the integrated circuit bus (Inter-Integrated Circuit, IIC). The current sampling and control circuit 12 is mainly composed of an operational amplifier. By collecting the current value flowing through the MOS and comparing it with the given value of the main control chip, the on-resistance of the MOS is controlled, and then the magnitude of the current passing through the MOS is controlled. The power circuit 13 is mainly composed of four MOS (on-resistance), which is used as a load to absorb current. Due to its ability to quickly turn on and off, it can achieve the effect of rapid change of load current. The main function of the working power supply circuit 14 is to provide the necessary power supply voltage for the main control circuit 11 to ensure that the entire electronic load system can work normally. Its components include but are not limited to: power adapter, voltage regulator and other components to ensure that the output voltage is stable and meets the requirements of the main control circuit 11.

[0021] Furthermore, in order to facilitate understanding of the embodiments of the present application, the present application also provides a working block diagram of an electronic load system, such as Figure 2 As shown, the main control circuit is connected to the host computer, the working power supply circuit and the current sampling and control circuit, and the power circuit is connected to the device to be detected and the current sampling and control circuit.

[0022] The main control circuit 11 serves as the control center of the system, including but not limited to: a main control chip, a digital analog conversion module (DAC), a communication interface and a logic control unit. The main control chip (such as STM32F103) receives the load current parameters set by the external host computer through the communication interface, including but not limited to: target current value, current change rate, extreme current duration, etc. The digital analog conversion module converts the target current value in the load current parameter into a corresponding reference voltage signal.

[0023] The current sampling and control circuit 12 includes but is not limited to: a voltage sampling module, a differential operational amplifier and a signal driving unit. The voltage sampling module obtains a small voltage drop signal (i.e., a sampling voltage) corresponding to the actual current flowing through the load by connecting the detection points across the sampling resistor in the power circuit 13. The differential operational amplifier performs multi-stage amplification and signal conditioning on the sampling voltage, and performs differential operation with the reference voltage output by the main control circuit to generate a control voltage representing the error. After the control voltage is enhanced in driving capability by the signal driving unit (such as a voltage follower composed of transistors), it is transmitted to the power circuit 13 for adjusting the size of the on-resistance in the power circuit. Through the closed-loop feedback mechanism, the dynamic difference between the sampling voltage and the reference voltage is corrected in real time to ensure accurate tracking of the output current.

[0024] The power circuit 13 is composed of a power metal oxide semiconductor field effect transistor (MOS) connected in parallel, a sampling resistor and a gate control network. As a variable load device, the on-resistance of MOS is controlled by the gate voltage. When the control voltage is applied to the gate of the MOS, its on-resistance is dynamically adjusted as the voltage changes, thereby changing the current value flowing through the MOS. The sampling resistor is connected in series in the load loop, and its resistance is in the milliohm level, which is used to convert the current value into a measurable voltage signal for the current sampling and control circuit 12 to perform feedback calculation. The parallel design of multiple MOS not only expands the maximum current carrying capacity of the system, but also realizes the fine adjustment of the on-resistance through independent gate control. The current change rate set in the load current parameter is finally converted into the adjustment speed of the on-resistance in the power circuit 13 through the programming control of the reference voltage change rate by the main control circuit 11, thereby realizing the controllable slope of the output current.

[0025] The working power supply circuit 14 is the energy supply unit of the system, and its functions include but are not limited to: converting the external input voltage into a stable low-voltage DC power supply to provide an adaptive working voltage for the main control circuit 11 and other functional modules. The working voltage usually includes a multi-level voltage output, for example: generating 5V and 3.3V power supplies through a low-dropout linear regulator (LDO), which are used to drive the digital control unit and the analog signal processing circuit respectively, to ensure that each module operates in a low-noise, high-stability power supply environment.

[0026] The pre-configured load current parameters include, but are not limited to: the minimum value of the load current, the maximum value of the load current, the maximum current duration, the minimum current duration, and the current change rate (A / us). At the same time, the load current parameters, as external input control variables, cover dimensions such as the target current extreme value, the rate of change, and the duration. The rate of change is defined by the amount of current change per unit time (such as A / μs), which is mapped to the slope of the reference voltage signal by the main control circuit 11, thereby controlling the adjustment step interval and amplitude of the on-resistance in the power circuit 13. For example: in the stage where the current rises from the minimum value to the maximum value, the system decomposes the target current into multiple discrete steps, each step corresponds to an incremental change in the reference voltage, and achieves precise control of the overall slope through a preset time interval. The parameterized control mechanism enables the electronic load system to simulate the transient current characteristics of the digital chip load, which is suitable for high-demand scenarios such as power supply dynamic response testing.

[0027] Through the electronic load system of the present application, the main control circuit can give a reference voltage to the current sampling and control circuit, and can also obtain the load current setting parameters. The current sampling and control circuit mainly determines the control voltage by collecting the sampling voltage and comparing it with the reference voltage, so as to control the on-resistance in the power circuit through the control voltage, and then control the magnitude of the current passing through the on-resistance. At the same time, since the load current parameter can control the rate of change of the current, the rapid change of the load current can be achieved. Therefore, the technical problem of how to achieve rapid change of current and improve the accuracy of the test results can be solved, so as to meet the demand for rapid change of current and improve the technical effect of the test results.

[0028] In an achievable embodiment of the present application, the main control circuit 11 includes: a main control chip 111, a communication interface 112, The communication interface 112 is used to obtain a configuration instruction for pre-configuring load current parameters from a preset host device; wherein the configuration instruction includes parameter information of the load current parameters; The main control chip 111 is used to perform parameter configuration processing in the electronic load system according to the configuration instructions and parameter information to obtain load current parameters; The main control chip 111 is also used to perform voltage conversion processing on the working voltage based on the load current parameter through a digital-to-analog conversion function, and output a reference voltage through a first preset pin of the main control chip.

[0029] Among them, the hardware part of the main control circuit 11 includes but is not limited to: a main control chip 111, a crystal oscillator, a status indicator light, a program burning interface, a communication interface 112 (such as: a universal asynchronous receiver / transmitter (URAT) interface, an inter-integrated circuit (I2C) interface, a controller area network (CAN) interface), a load switch, etc. The main control chip 111 is the control center of the device and is responsible for the normal operation of the device. After the device is powered on, the main control chip 111 first receives the instructions sent by the host computer through the URAT interface to complete the setting of load current related parameters (i.e., load current parameters). The DAC function of the main control chip 111 can output different voltages of 0-3V (i.e., reference voltage) through the first preset pin to control the current value passing through the MOS. The current change rate (A / us) can be controlled by controlling the change rate of the output voltage value of the first preset pin of the main control chip 111. Multiple devices can be interconnected through the I2C interface to achieve multi-machine parallel operation and increase the upper limit of the maximum load current. The load-pulling switch can control the load-pulling when a single machine is connected and can also achieve the common load-pulling of each device when multiple machines are connected in parallel.

[0030] The main control chip 111 is the core processing unit of the main control circuit 11, integrating a digital analog conversion module (DAC), a multi-task scheduling function and high-speed computing capability, and is responsible for executing parameter configuration processing and voltage conversion processing. The communication interface 112 is a data exchange channel between the main control circuit 11 and external devices, supporting a variety of industrial standard protocols, and can receive configuration instructions from a preset host device (such as a computer or an industrial computer) and transmit the parameter information in the instruction to the main control chip 111. At the same time, regarding the host device, the present application provides a page schematic diagram of the host, such as Figure 3 As shown, parameter information of load current parameters can be provided through the host computer device.

[0031] The first preset pin is the physical output port of the main control chip 111, which transmits the generated reference voltage signal to the current sampling and control circuit 12. The first preset pin is connected to the external filter network through a low-impedance drive circuit to reduce noise interference and voltage drop during signal transmission. For example, the 20# pin of the STM32F103 chip is configured as the first preset pin, and its output voltage range covers 0-3.3V, corresponding to the preset extreme value range of the load current.

[0032] The coordinated design of the main control chip 111 and the communication interface 112 realizes the flexible configuration and high dynamic response capability of the electronic load system, so that the system can adapt to different host computer environments and support remote control and automated test scenarios. The main control chip 111 converts complex load current requirements into executable voltage control sequences through parameter configuration processing, and combines the digital-to-analog conversion function to achieve high-precision reference voltage output, ensuring the controllability and repeatability of the current adjustment process, so that the electronic load system can quickly respond to host computer instructions, accurately simulate various load transient characteristics, and provide highly reliable dynamic load simulation capabilities for power supply testing.

[0033] In an achievable embodiment of the present application, the power circuit 13 includes: a sampling resistor 131, The sampling resistor 131 is used to determine the sampling position of the current sampling and control circuit 12 for performing voltage sampling processing from the power circuit 13 .

[0034] Among them, the sampling resistor 131 is a key sensing element in the power circuit. It is made of low-resistance, high-precision materials (such as manganese-copper alloy) and is connected in series in the main loop of the load current. The resistance of the sampling resistor 131 is designed to be in the milliohm level (for example, 1mΩ), which produces a small voltage drop that is linearly related to the current value when carrying a large current, while avoiding the introduction of significant additional power consumption. The two ends of the sampling resistor 131 form a physical sampling position for voltage sampling processing, that is, when the current flows through the resistor, the voltage difference across the resistor directly reflects the instantaneous current value. By placing the sampling resistor 131 on the main current path of the power circuit, it is ensured that all currents flowing through the load are accurately captured, providing a true feedback signal for closed-loop control.

[0035] The precise layout and parameter design of the sampling resistor 131 significantly improve the reliability of current detection and the stability of system control. By placing the sampling resistor 131 at a key position in the main current path, the system can capture the true value of the load current in real time and provide a high-fidelity signal source for closed-loop feedback.

[0036] In an achievable embodiment of the present application, the current sampling and control circuit 12 is further used for: Perform current sampling processing from the position of the sampling resistor 131 in the power circuit 13 to obtain a sampling current; The voltage is calculated based on the sampled current and the sampling resistor 131 in the power circuit 13 to obtain the sampled voltage.

[0037] The sampling current is the result output of the current sampling process, and its value represents the actual load current currently flowing through the power circuit 13. The acquisition of the sampling current depends on the coordinated optimization of the physical properties of the sampling resistor 131 and the circuit design: the low resistance characteristic of the sampling resistor 131 ensures that its power loss in a large current scenario is controllable, while the high-precision material and temperature compensation design (such as copper-manganese alloy and thermistor compensation network) ensure the stability of the resistance value, so that the calculation result of the sampling current is not affected by ambient temperature fluctuations.

[0038] The voltage calculation process is a step of converting the sampled current into an equivalent voltage signal. The current sampling and control circuit 12 can multiply the sampled current with the known resistance value of the sampling resistor 131 based on Ohm's law to generate the corresponding sampled voltage. The sampled voltage, as the output result of the voltage calculation process, is the core feedback variable of the closed-loop control loop. The sampled voltage and the reference voltage output by the main control circuit 11 are input to the differential operational amplifier together to generate a control voltage that represents the deviation between the target current and the actual current.

[0039] The current sampling and control circuit realizes high-fidelity capture and precise conversion of current signals through the combination of physical sampling and algorithm calculation. The current sampling process is directly related to the main current path of the power circuit 13 to ensure the real-time and authenticity of the feedback signal. The voltage calculation process converts the current value into a voltage signal, which is compared with the reference voltage of the main control circuit 11 in the same dimension, simplifying the design complexity of the closed-loop control logic.

[0040] In an achievable embodiment of the present application, the current sampling and control circuit 12 includes: an operational amplifier 121, The operational amplifier 121 includes a first differential amplifier circuit 1211 and a second differential amplifier circuit 1212; The first differential amplifier circuit 1211 is used to perform voltage amplification processing on the sampled voltage to obtain an amplified sampled voltage, and perform voltage comparison processing on the amplified sampled voltage and a reference voltage to obtain a voltage comparison result; The first differential amplifier circuit 1211 is further used to perform proportional and integral operations according to the voltage comparison result to obtain an initial control voltage; The second differential amplifier circuit 1212 is used to perform voltage amplification processing on the initial control voltage to obtain a control voltage.

[0041] The current sampling and control circuit 12 includes but is not limited to: an operational amplifier 121, a transistor, the operational amplifier 121 is (for example: LM358), and there are two differential operational amplifier circuits (a first differential amplifier circuit 1211 and a second differential amplifier circuit 1212) inside the operational amplifier. One of the differential operational amplifier circuits (the first differential amplifier circuit 1211) is connected to the voltage at both ends of the sampling resistor 131 through two pins (for example: pin 3# and pin 2#) of the operational amplifier 121, and then the voltage signal at both ends of the sampling resistor 131 is amplified by a preset multiple (for example: 30 times) through the first differential amplifier circuit 1211 and output to the subsequent operational circuit. Another differential amplifier circuit (second differential amplifier circuit 1212) is connected to the output end of the previous stage operation through another pin (e.g., pin 6) of the operational amplifier 121, and one pin (e.g., pin 5) of the operational amplifier 121 is connected to the first preset pin of the main control chip 111. After differential operation and amplification of the two pins (i.e., pin 5 and pin 6), the control voltage is amplified by a preset multiple (e.g., 100 times) and output to the pin (e.g., pin 7) of the operational amplifier 121. The voltage output from pin 7 of the operational amplifier 121 acts on the base of the transistor through a resistor. The transistor and the resistor here form a voltage follower circuit, which is mainly used to improve the driving capability of the output voltage of pin 7 of the operational amplifier 121.

[0042] The function of the current sampling and control circuit 12 is to collect the voltage across the sampling resistor 131, and use the differential operation circuit to amplify the voltage across the sampling resistor 131 by 30 times. The amplified voltage is then differentially operated with the voltage value (reference voltage) output by the first preset pin of the main control chip 111 to obtain a control voltage. The control voltage controls the on-resistance of the MOS through the transistor to enhance the driving capability, thereby achieving the purpose of controlling the current flowing through the MOS.

[0043] The cascade design of the first differential amplifier circuit 1211 and the second differential amplifier circuit 1212 realizes hierarchical optimization of signal conditioning and error correction. The first differential amplifier circuit 1211 converts the weak current feedback signal into an error correction value through high-precision differential amplification and proportional integral operation, thereby effectively suppressing external interference and improving system stability; the second differential amplifier circuit 1212 ensures that the amplitude and purity of the control voltage meet the driving requirements of the power device through secondary gain enhancement and noise filtering.

[0044] In an achievable embodiment of the present application, the current sampling and control circuit 12 is further used for: When it is determined according to the voltage comparison result that the amplified sampled voltage is greater than the reference voltage, performing a difference calculation process according to the amplified sampled voltage and the reference voltage to obtain a first voltage difference; Performing proportional and integral operations on the first voltage difference to obtain a first initial control voltage, and performing voltage amplification on the first initial control voltage to obtain a first control voltage; wherein the first control voltage is used to increase and adjust the on-resistance in the power circuit; When it is determined according to the voltage comparison result that the amplified sampled voltage is less than the reference voltage, a difference calculation process is performed according to the amplified sampled voltage and the reference voltage to obtain a second voltage difference; Proportional and integral operations are performed on the second voltage difference to obtain a second initial control voltage, and the second initial control voltage is amplified to obtain a second control voltage; wherein the second control voltage is used to reduce and adjust the on-resistance in the power circuit.

[0045] The voltage comparison result is the logic output of the first differential amplifier circuit comparing the amplified sampled voltage with the reference voltage. When the amplified sampled voltage is greater than the reference voltage, it indicates that the actual load current exceeds the target setting value, and the current needs to be reduced by adjusting the on-resistance of the power device; conversely, if the amplified sampled voltage is less than the reference voltage, it indicates that the actual current does not reach the target value, and the on-resistance needs to be reduced to increase the current.

[0046] The difference calculation process quantifies the deviation between the sampling voltage and the reference voltage based on the voltage comparison result. When the amplified sampling voltage is greater than the reference voltage, the positive difference between the two (i.e., the first voltage difference) is calculated. This difference is a positive voltage signal, reflecting the severity of the current overshoot; when the amplified sampling voltage is less than the reference voltage, the negative difference between the two (i.e., the second voltage difference) is calculated. This difference is a negative voltage signal, reflecting the deviation of insufficient current.

[0047] The proportional and integral operation process applies control algorithms to the first voltage difference and the second voltage difference respectively. For the first voltage difference (positive deviation), the proportional operation module generates a correction amount proportional to the deviation amount according to the preset proportional coefficient, and the integral operation module accumulates and integrates the duration of the deviation, and the two are superimposed to form a first initial control voltage. This voltage is a negative signal, which is amplified by the second differential amplifier circuit to generate a first control voltage. Its high level drives the gate voltage of the MOS device in the power circuit 13 to increase, thereby increasing the on-resistance and forcing the load current to decrease to approach the target value. For the second voltage difference (negative deviation), the proportional integral operation generates a positive second initial control voltage, which is amplified to form a second control voltage, and its low level drives the gate voltage of the MOS device to decrease, reducing the on-resistance and causing the load current to rise to the set range.

[0048] The dual-path difference processing mechanism of the current sampling and control circuit 12 realizes bidirectional precise control of the load current. By distinguishing overshoot and undershoot states and applying differentiated control strategies, the system can quickly respond to current deviations and avoid oscillation or overshoot problems that may be caused by unidirectional regulation. The introduction of proportional-integral operation not only improves the dynamic response speed, but also effectively suppresses the steady-state error through the cumulative effect of the integral term, ensuring strict tracking of the current value during long-term operation.

[0049] In an achievable embodiment of the present application, the power circuit 13 is further used to transmit the target current to the device to be detected; The power circuit 13 is further used to adjust the current according to the adjusted on-resistance and the preset current change slope included in the load current parameter to obtain a target current.

[0050] Among them, through closed-loop control and dynamic adjustment mechanism, the precisely programmed target current is applied to the device to be detected, and the controllable change of the current waveform is achieved based on the preset current change slope. As the final execution unit of the load current, the power circuit 13 has the dual functions of current transmission and dynamic regulation.

[0051] The power circuit 13 significantly improves the reliability and scenario adaptability of power supply testing through accurate transmission and dynamic adjustment of target current.

[0052] In an achievable embodiment of the present application, the power circuit 13 is further used for: The on-resistance in the power circuit is increased and adjusted according to the first control voltage, and the current is reduced according to the adjusted on-resistance and load current parameters; The on-resistance in the power circuit is reduced and adjusted according to the second control voltage, and the current is increased according to the adjusted on-resistance and load current parameters.

[0053] Among them, the bidirectional dynamic adjustment capability of the power circuit gives the electronic load system extremely high scene adaptability and control accuracy. Through the precise drive of the first control voltage and the second control voltage, the system can complete the current increase and decrease regulation within the microsecond time scale, accurately reproducing the transient current characteristics of the digital chip load. The closed-loop adjustment mechanism of the on-resistance effectively suppresses the influence of non-ideal factors such as device parameter discreteness and temperature drift on current control, ensuring that the linear adjustment characteristics are maintained within a wide current range (such as: 0A to 30A).

[0054] In an achievable embodiment of the present application, in order to understand the current control process of the present application, the present application also provides a current control loop schematic diagram, such as Figure 4As shown, the sampling resistor and MOS are resistors in the power circuit 13, the MOS is an on-resistance, the differential amplifier circuit is a circuit in the current sampling and control circuit 12 (including a first differential amplifier circuit 1211 and a second differential amplifier circuit 1212), the microcontroller output represents the digital-to-analog (DA) output of the microcontroller, that is, the working voltage output in the working power supply circuit 14, the proportional-integral-derivative (PID) represents the process of generating a control voltage according to the sampling voltage and the reference voltage through the PID algorithm, and the gate-source voltage (Voltage between Gate and Source, VGS) is the control voltage.

[0055] An embodiment of the present application provides a capacity expansion and updating method, and the method is described in detail in conjunction with the execution flow of the capacity expansion and updating method.

[0056] like Figure 5 As shown, Figure 5 A schematic diagram of a power supply testing method provided in this application, the power supply testing method is applied to Figure 1 The described electronic load system comprises: Step 501, obtaining a pre-configured load current parameter, and converting the operating voltage into a reference voltage based on the load current parameter; wherein the reference voltage is a stable voltage value used as a reference standard in the electronic load system.

[0057] In an embodiment of the present application, the device to be tested is connected to an electronic load system. Before the electronic load system works, the host computer needs to set its parameters according to the test requirements of the device to be tested. After the load switch of the electronic load system is started, the electronic load system will perform current pulling processing according to the set load current parameters.

[0058] The load current parameters are pre-configured by the host computer and transmitted to the main control circuit of the electronic load system. The main control circuit converts the load current parameters in digital form into an analog voltage signal, namely, a reference voltage, through a digital-to-analog conversion function (DAC).

[0059] The reference voltage is used as the setting reference for closed-loop control, and its amplitude is linearly proportional to the target current value. For example, in the current-voltage mapping table, the target current of 30A corresponds to a reference voltage of 3V. The stability of the reference voltage is guaranteed by the high-precision reference source and low-noise power supply circuit of the main control circuit, ensuring that the voltage value used as the reference standard has no drift or fluctuation during the dynamic test process. At the same time, the rate of change in the load current parameter is interpreted by the main control chip as a slope control instruction of the reference voltage. By adjusting the step interval and amplitude of the DAC output value, the linear rise or fall of the reference voltage is achieved, thereby indirectly controlling the rate of current change.

[0060] Step 502, sampling a voltage from a power circuit of an electronic load system to obtain a sampled voltage, and performing a differential operation on the sampled voltage and a reference voltage to obtain a control voltage; wherein the electronic load system is a pre-built system for power supply testing.

[0061] In an embodiment of the present application, a sampling resistor connected in series in a power circuit of an electronic load system converts the current flowing through the load into a millivolt voltage drop signal, and the current sampling and control circuit collects and amplifies the voltage across the sampling resistor through a high-precision differential amplifier to obtain a sampling voltage representing the actual current value. After filtering and conditioning, the sampling voltage is input into the differential operational amplifier together with the reference voltage for differential operation. The essence of differential operation is to calculate the algebraic difference between the reference voltage and the sampling voltage to generate an error signal (i.e., control voltage) reflecting the direction and amplitude of the current deviation. For example: when the sampling voltage is lower than the reference voltage, the difference operation result is a positive polarity signal, indicating that the actual current has not reached the target value and the load current needs to be increased; otherwise, it is a negative polarity signal, indicating that the current needs to be reduced. In this process, the high common mode rejection ratio characteristics of the differential operational amplifier effectively filter out ground noise and common mode interference, ensuring the accuracy of error extraction.

[0062] Step 503, adjusting the on-resistance in the power circuit according to the control voltage, and adjusting the current according to the adjusted on-resistance and the load current parameter to obtain a target current, wherein the load current parameter is at least used to control the rate of adjusting the current.

[0063] In the embodiment of the present application, the control voltage is amplified and applied to the gate of the parallel MOS device in the power circuit, and the magnitude of the MOS on-resistance is changed by adjusting the gate voltage. When the control voltage increases, the conductive channel of the MOS becomes narrower, the on-resistance increases, and the current flowing through the load decreases; conversely, when the control voltage decreases, the on-resistance decreases, and the load current increases accordingly.

[0064] The adjustment process is combined with the preset change rate in the load current parameter. For example, in a scenario where the current increases at a rate of 10A / μs, the system increases the target current value every microsecond. The adjusted on-resistance and the real-time current value form a negative feedback loop, so that the load current is finally stabilized in the target range, completing the dynamic load test of the device to be tested.

[0065] Through the electronic load system and power supply test method, electronic device and storage medium of the present application, the main control circuit can give a reference voltage to the current sampling and control circuit, and can also obtain the load current setting parameters. The current sampling and control circuit mainly determines the control voltage by collecting the sampling voltage and comparing it with the reference voltage, so as to control the on-resistance in the power circuit through the control voltage, and then control the magnitude of the current passing through the on-resistance. At the same time, since the load current parameter can control the rate of change of the current, the rapid change of the load current can be achieved. Therefore, the technical problem of how to achieve rapid change of current and improve the accuracy of the test results can be solved, so as to meet the demand for rapid change of current and improve the technical effect of the test results.

[0066] In an achievable embodiment of the present application, differential operation processing is performed based on the sampling voltage and the reference voltage, and it can also be implemented in but not limited to the following ways: performing voltage amplification processing on the sampling voltage to obtain an amplified sampling voltage, and performing voltage comparison processing on the amplified sampling voltage and the reference voltage to obtain a voltage comparison result; performing proportional and integral operation processing on the voltage comparison result to obtain an initial control voltage, and performing voltage amplification processing on the initial control voltage to obtain a control voltage.

[0067] In the embodiments of the present application, the collaborative design of multi-stage voltage amplification and proportional-integral regulation gives the differential operation processing high precision and strong robustness. The voltage amplification process converts weak current signals into usable feedback with high signal-to-noise ratio through gain enhancement and common-mode suppression; the voltage comparison process realizes real-time dynamic calibration between target value and actual value, providing accurate error input for closed-loop control; the proportional-integral operation takes into account transient response speed and long-term regulation accuracy through algorithm fusion; the secondary voltage amplification ensures that the control signal has voltage and current margin to drive the power device.

[0068] This processing flow enables the electronic load system to quickly converge to the target current under complex working conditions and maintain stable output under load changes or external interference, providing a highly reliable methodological basis for dynamic performance testing of power supplies.

[0069] In an achievable embodiment of the present application, when obtaining the control voltage, it can also be implemented in the following manner but not limited to: when it is determined according to the voltage comparison result that the amplified sampled voltage is greater than the reference voltage, a difference calculation is performed based on the amplified sampled voltage and the reference voltage to obtain a first voltage difference; proportional and integral operations are performed based on the first voltage difference to obtain a first initial control voltage, and the first initial control voltage is voltage amplified to obtain a first control voltage; wherein the first control voltage is used to increase the size of the on-resistance in the power circuit; when it is determined according to the voltage comparison result that the amplified sampled voltage is less than the reference voltage, a difference calculation is performed based on the amplified sampled voltage and the reference voltage to obtain a second voltage difference; proportional and integral operations are performed based on the second voltage difference to obtain a second initial control voltage, and the second initial control voltage is voltage amplified to obtain a second control voltage; wherein the second control voltage is used to decrease the size of the on-resistance in the power circuit.

[0070] In the embodiments of the present application, the bidirectional regulation mechanism based on the voltage comparison results significantly improves the dynamic performance and steady-state accuracy of the power supply testing method. The independent processing strategies for overshoot and undershoot states enable the system to apply optimal regulation parameters for different deviation characteristics, avoiding response hysteresis or overshoot oscillation caused by unidirectional regulation. The differentiated configuration of parameters for proportional integral operation effectively suppresses the integral saturation phenomenon while ensuring rapid deviation correction, ensuring the stable convergence of the system under sudden load. The directional adjustment of the on-resistance combined with the nonlinear electrical characteristics of the MOS device realizes efficient linear control of the current, so that the equipment to be tested can expose the true performance characteristics in various dynamic test scenarios.

[0071] The bidirectional control voltage generation and driving mechanism provides underlying support for the accurate reproduction of complex load waveforms, meeting the diverse needs of high-precision power supply verification.

[0072] In an achievable embodiment of the present application, when adjusting the current, it can also be implemented by but not limited to the following methods: increasing the on-resistance in the power circuit according to the first control voltage, reducing the current according to the adjusted on-resistance and the load current parameters to obtain the target current; or decreasing the on-resistance in the power circuit according to the second control voltage, increasing the current according to the adjusted on-resistance and the load current parameters to obtain the target current.

[0073] In the embodiment of the present application, the bidirectional current adjustment mechanism endows the power supply test method with extremely high scene adaptability and control flexibility. The independent driving logic of the first control voltage and the second control voltage enables the system to quickly respond to the overshoot and undershoot of the current, avoiding response hysteresis or steady-state error accumulation caused by unidirectional adjustment.

[0074] In summary, this application can achieve the following technical effects: The present application can provide a reference voltage to the current sampling and control circuit through the main control circuit, and can also obtain the load current setting parameters. The current sampling and control circuit mainly determines the control voltage by collecting the sampling voltage and comparing it with the reference voltage, so as to control the on-resistance in the power circuit through the control voltage, and then control the magnitude of the current passing through the on-resistance. At the same time, since the load current parameter can control the rate of change of the current, the rapid change of the load current can be achieved. Therefore, the technical problem of how to achieve rapid change of current and improve the accuracy of the test results can be solved, so as to meet the demand for rapid change of current and improve the technical effect of the test results.

[0075] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method.

[0076] The embodiment of the present application also provides a power supply testing device, Figure 6 A schematic diagram of the structure of a power supply test device provided in this application, such as Figure 6 As shown, including: An acquisition unit 61 is used to acquire a pre-configured load current parameter, and convert the operating voltage into a reference voltage based on the load current parameter; wherein the reference voltage is a stable voltage value used as a reference standard in the electronic load system; The sampling unit 62 is used to perform voltage sampling processing from the power circuit of the electronic load system to obtain a sampled voltage; The operation unit 63 is used to perform differential operation processing according to the sampled voltage and the reference voltage to obtain the control voltage; wherein the electronic load system is a pre-built system for power supply testing; The adjustment unit 64 is used to adjust the size of the on-resistance in the power circuit according to the control voltage, and adjust the size of the current according to the adjusted on-resistance and the load current parameter to obtain the target current, wherein the load current parameter is at least used to control the rate of adjusting the size of the current.

[0077] In one embodiment of the present application, the computing unit 63 is further configured to: Performing voltage amplification processing on the sampled voltage to obtain an amplified sampled voltage, and performing voltage comparison processing on the amplified sampled voltage and a reference voltage to obtain a voltage comparison result; Proportional and integral operations are performed on the voltage comparison result to obtain an initial control voltage, and the initial control voltage is amplified to obtain a control voltage.

[0078] In one embodiment of the present application, the computing unit 63 is further configured to: When it is determined according to the voltage comparison result that the amplified sampled voltage is greater than the reference voltage, performing a difference calculation process according to the amplified sampled voltage and the reference voltage to obtain a first voltage difference; Performing proportional and integral operations on the first voltage difference to obtain a first initial control voltage, and performing voltage amplification on the first initial control voltage to obtain a first control voltage; wherein the first control voltage is used to increase and adjust the magnitude of the on-resistance in the power circuit; When it is determined according to the voltage comparison result that the amplified sampled voltage is less than the reference voltage, a difference calculation process is performed according to the amplified sampled voltage and the reference voltage to obtain a second voltage difference; Proportional and integral operations are performed on the second voltage difference to obtain a second initial control voltage, and the second initial control voltage is amplified to obtain a second control voltage; wherein the second control voltage is used to reduce and adjust the size of the on-resistance in the power circuit.

[0079] In one embodiment of the present application, the adjustment unit 64 is further configured to: The on-resistance in the power circuit is increased and adjusted according to the first control voltage, and the current is reduced according to the adjusted on-resistance and the load current parameter to obtain the target current; or, The on-resistance in the power circuit is reduced and adjusted according to the second control voltage, and the current is increased according to the adjusted on-resistance and load current parameters to obtain the target current.

[0080] The description of the features in the embodiment corresponding to the power supply testing device can refer to the relevant description of the embodiment corresponding to the power supply testing method, which will not be repeated here.

[0081] An embodiment of the present application further provides an electronic device, comprising a memory and a processor, wherein a computer program is stored in the memory, and the processor is configured to run the computer program to execute the steps in any one of the above-mentioned power supply testing method embodiments.

[0082] An embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to execute the steps of any of the above-mentioned power supply testing method embodiments when running.

[0083] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk or an optical disk.

[0084] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps in any one of the above power supply testing method embodiments are implemented.

[0085] An embodiment of the present application further provides another computer program product, including a non-volatile computer-readable storage medium, wherein the non-volatile computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in any of the above-mentioned power supply testing method embodiments are implemented.

[0086] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in the above description according to function. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0087] The electronic load system and power supply test method, electronic device and storage medium provided by the present application are introduced in detail above. Specific examples are used herein to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method and core idea of ​​the present application. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present application, several improvements and modifications can be made to the present application, and these improvements and modifications also fall within the scope of protection of the claims of the present application.

Claims

1. An electronic load system, characterized in that: include: Main control circuit, current sampling and control circuit, power circuit, working power supply circuit, The working power supply circuit is used to provide working voltage to the main control circuit; The main control circuit is used to obtain pre-configured load current parameters, convert the operating voltage into a reference voltage based on the load current parameters, and transmit the reference voltage to the current sampling and control circuit; The current sampling and control circuit is used to perform voltage sampling processing from the power circuit to obtain a sampled voltage, perform differential operation processing based on the sampled voltage and the reference voltage to obtain a control voltage, and transmit the control voltage to the power circuit; The power circuit is used to adjust the size of the on-resistance in the power circuit according to the control voltage, and adjust the size of the current according to the adjusted on-resistance and the load current parameter to obtain a target current, wherein the load current parameter is at least used to control the rate of adjusting the size of the current.

2. The electronic load system according to claim 1, characterized in that: The main control circuit includes: a main control chip, a communication interface, The communication interface is used to obtain a configuration instruction for pre-configuring the load current parameter from a preset host device; wherein the configuration instruction includes parameter information of the load current parameter; The main control chip is used to perform parameter configuration processing in the electronic load system according to the configuration instruction and the parameter information to obtain the load current parameter; The main control chip is also used to perform voltage conversion processing on the working voltage based on the load current parameter through a digital-to-analog conversion function, and output the reference voltage through a first preset pin of the main control chip.

3. The electronic load system according to claim 1, characterized in that: The power circuit comprises: a sampling resistor, The sampling resistor is used to determine the sampling position of the current sampling and control circuit for performing voltage sampling processing from the power circuit.

4. The electronic load system according to claim 3, characterized in that: The current sampling and control circuit is also used for: Perform current sampling processing from the position of the sampling resistor in the power circuit to obtain a sampling current; The sampling voltage is obtained by performing voltage calculation processing according to the sampling current and the sampling resistor in the power circuit.

5. The electronic load system according to claim 4, characterized in that: The current sampling and control circuit comprises: an operational amplifier, The operational amplifier includes a first differential amplifier circuit and a second differential amplifier circuit; The first differential amplifier circuit is used to perform voltage amplification processing on the sampled voltage to obtain an amplified sampled voltage, and perform voltage comparison processing on the amplified sampled voltage and the reference voltage to obtain a voltage comparison result; The first differential amplifier circuit is further used to perform proportional and integral operations according to the voltage comparison result to obtain an initial control voltage; The second differential amplifier circuit is used to perform voltage amplification processing on the initial control voltage to obtain the control voltage.

6. The electronic load system according to claim 5, characterized in that: The current sampling and control circuit is also used for: When it is determined according to the voltage comparison result that the amplified sampled voltage is greater than the reference voltage, performing a difference calculation process according to the amplified sampled voltage and the reference voltage to obtain a first voltage difference; Performing proportional and integral operations on the first voltage difference to obtain a first initial control voltage, and performing voltage amplification on the first initial control voltage to obtain a first control voltage; wherein the first control voltage is used to increase and adjust the on-resistance in the power circuit; When it is determined according to the voltage comparison result that the amplified sampled voltage is less than the reference voltage, performing a difference calculation process according to the amplified sampled voltage and the reference voltage to obtain a second voltage difference; Proportional and integral operations are performed on the second voltage difference to obtain a second initial control voltage, and the second initial control voltage is amplified to obtain a second control voltage; wherein the second control voltage is used to reduce and adjust the on-resistance in the power circuit.

7. The electronic load system according to claim 1, characterized in that: The power circuit is also used to transmit the target current to the device to be detected; The power circuit is further used to adjust the magnitude of the current according to the adjusted on-resistance and the preset current change slope included in the load current parameter to obtain the target current.

8. The electronic load system according to claim 6, characterized in that: The power circuit is also used for: increasing the on-resistance in the power circuit according to the first control voltage, and reducing the current according to the adjusted on-resistance and the load current parameter; The on-resistance in the power circuit is reduced and adjusted according to the second control voltage, and the current is increased according to the adjusted on-resistance and the load current parameter.

9. A power supply testing method, characterized in that: The power supply testing method is applied to the electronic load system according to any one of claims 1 to 8, comprising: Obtaining a pre-configured load current parameter, and converting the operating voltage into a reference voltage based on the load current parameter; wherein the reference voltage is a stable voltage value used as a reference standard in the electronic load system; Performing voltage sampling processing on a power circuit of an electronic load system to obtain a sampled voltage, and performing differential operation processing on the sampled voltage and the reference voltage to obtain a control voltage; wherein the electronic load system is a pre-built system for power supply testing; The on-resistance in the power circuit is adjusted according to the control voltage, and the current is adjusted according to the adjusted on-resistance and the load current parameter to obtain a target current, wherein the load current parameter is at least used to control the rate at which the current is adjusted.

10. The power supply testing method according to claim 9, characterized in that: The step of performing differential operation on the sampled voltage and the reference voltage to obtain the control voltage comprises: Performing voltage amplification processing on the sampled voltage to obtain an amplified sampled voltage, and performing voltage comparison processing on the amplified sampled voltage and the reference voltage to obtain a voltage comparison result; Proportional and integral operations are performed on the voltage comparison result to obtain an initial control voltage, and voltage amplification is performed on the initial control voltage to obtain the control voltage.

11. The power supply testing method according to claim 10, characterized in that: The performing proportional and integral operations on the voltage comparison result to obtain an initial control voltage, and performing voltage amplification on the initial control voltage to obtain the control voltage comprises: When it is determined according to the voltage comparison result that the amplified sampled voltage is greater than the reference voltage, performing a difference calculation process according to the amplified sampled voltage and the reference voltage to obtain a first voltage difference; Performing proportional and integral operations on the first voltage difference to obtain a first initial control voltage, and performing voltage amplification on the first initial control voltage to obtain a first control voltage; wherein the first control voltage is used to increase and adjust the magnitude of the on-resistance in the power circuit; When it is determined according to the voltage comparison result that the amplified sampled voltage is less than the reference voltage, performing a difference calculation process according to the amplified sampled voltage and the reference voltage to obtain a second voltage difference; Proportional and integral operations are performed on the second voltage difference to obtain a second initial control voltage, and the second initial control voltage is amplified to obtain a second control voltage; wherein the second control voltage is used to reduce and adjust the size of the on-resistance in the power circuit.

12. The power supply testing method according to claim 11, characterized in that: The step of adjusting the magnitude of the on-resistance in the power circuit according to the control voltage, and adjusting the magnitude of the current according to the adjusted on-resistance and the load current parameter to obtain the target current comprises: The on-resistance in the power circuit is increased and adjusted according to the first control voltage, and the current is reduced according to the adjusted on-resistance and the load current parameter to obtain the target current; or, The on-resistance in the power circuit is reduced and adjusted according to the second control voltage, and the current is increased according to the adjusted on-resistance and the load current parameter to obtain the target current.

13. An electronic device, characterized in that: include: Memory for storing computer programs; A processor, configured to implement the steps of the power supply testing method as claimed in any one of claims 9 to 12 when executing the computer program.

14. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, wherein the computer program, when executed by a processor, implements the steps of the power supply testing method according to any one of claims 9 to 12.

15. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the power supply testing method according to any one of claims 9 to 12 are implemented.

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