Filament current self-correction method and device, computer equipment and storage medium

Abstract

The invention relates to the technical field of X-ray machine equipment, and discloses a filament current self-correction method and device, computer equipment and a storage medium, and the method specifically comprises the steps: obtaining a tube voltage set value, a tube current set value, a preset characteristic value threshold value, and filament current characteristics, tube current characteristics and tube voltage characteristics in an exposure process in response to a self-correction instruction; determining a target characteristic value; comparing the target characteristic value with a preset characteristic value threshold value, and determining a self-correction result; determining a self-correction mode based on the tube voltage set value and the tube current set value under the condition of indicating that self-correction needs to be carried out; based on the filament current characteristics, the tube current characteristics, the tube voltage characteristics, the training tube data set and the self-correction data set, determining a self-correction variable quantity; filament current self-correction is carried out based on the self-correction variable quantity and the self-correction mode, so that the data accuracy of filament correction and the dynamic performance of tube current are improved, the performance stability of the X-ray tube is improved, and the service life of the X-ray tube is prolonged.

Description

Technical Field

[0001] The present invention relates to the technical field of X-ray machine equipment, and in particular to a filament current self-correction method, device, computer equipment and storage medium. Background Art

[0002] X-ray detection has important applications in hospital patient diagnosis, industrial non-destructive testing, station security inspection and other fields. As the core component of X-ray detection, the X-ray tube is a vacuum diode working under high voltage. The X-ray tube contains two electrodes, an anode and a cathode: one is a filament for emitting electrons, which serves as the cathode, and the other is a target for receiving electron bombardment, which serves as the anode. The power supply part of the X-ray tube contains at least a low-voltage power supply for heating the filament and a high-voltage generator for applying high voltage to the two electrodes.

[0003] The X-ray tube has a cathode and an anode, and the filament current is set at the cathode. During the operation of the X-ray tube, the cathode filament passes through the current, the filament temperature rises, and it has the ability to emit electrons. At this time, a high voltage is applied to the cathode and cathode to convert part of the electrical energy into the tube current of the X-ray. Since there is a strong nonlinear relationship between the tube current and the filament current, each X-ray tube needs to calibrate the corresponding relationship between the tube current and the filament current before use. Usually, it is done by exposing at each working point of the filament current and testing to obtain the corresponding tube current value. Repeating a large number of tests can obtain the corresponding relationship between the tube current and the filament current. This process is called tube training. The performance of an X-ray tube is affected by many factors, such as the number of uses, the life of the filament, and the vacuum degree of the tube. During the entire life cycle of the X-ray tube, the performance of the X-ray tube can remain stable for a period of time after training, and then will gradually decline. Therefore, multiple trainings are required during the entire life cycle of the X-ray tube to maintain the stability of the X-ray tube performance. However, each training will collect a large amount of test data and perform a large amount of exposure, which accelerates the aging of the filament and seriously shortens the service life of the X-ray tube. Therefore, a new filament current self-correction method is needed to reduce filament aging and increase the service life of the X-ray tube. Summary of the invention

[0004] In view of this, the present invention provides a filament current self-correction method, device, computer equipment and storage medium to solve the problem of rapid aging and short service life of the filament in the X-ray tube.

[0005] In a first aspect, the present invention provides a filament current self-correction method, the method comprising:

[0006] In response to the self-calibration instruction, a tube voltage setting value, a tube current setting value, and a preset characteristic value threshold are obtained, and an exposure condition is turned on to obtain a filament current characteristic, a tube current characteristic, and a tube voltage characteristic during the exposure process;

[0007] Based on the filament current feature, the tube current feature and the tube voltage feature, the features are input into a feature extraction function to determine a target feature value;

[0008] Based on the target characteristic value and the preset characteristic value threshold, a comparison is performed to determine a self-correction result;

[0009] When the self-calibration result indicates that self-calibration is required, determining a self-calibration mode based on the tube voltage setting value and the tube current setting value;

[0010] Based on the filament current characteristics, the tube current characteristics, the tube voltage characteristics, the tube training data set and the self-correction data set, a change amount calculation is performed to determine a self-correction change amount;

[0011] Based on the self-correction variation and the self-correction mode, self-correction of the filament current is performed.

[0012] The filament current self-correction method provided by the embodiment of the present invention obtains the tube voltage setting value, the tube current setting value, the preset characteristic value threshold value, and starts the exposure condition in response to the self-correction instruction, thereby obtaining the filament current characteristics, the tube current characteristics, and the tube voltage characteristics during the exposure process; the filament current characteristics, the tube current characteristics, and the tube voltage characteristics are input into the feature extraction function to extract the target characteristic value, thereby improving the spatial instability of the data solution, the generalization ability of the correction model, and the calculation accuracy; and then the target characteristic value is compared with the preset characteristic value threshold value to determine the self-correction result, and the self-correction result is indicated in the self-correction result. When self-correction is required, the self-correction mode is determined based on the tube voltage setting value and the tube current setting value; the change amount is calculated based on the filament current characteristics, the tube current characteristics and the tube voltage characteristics, the training data set and the self-correction data set to determine the self-correction change amount; further, based on the self-correction change amount and the self-correction mode, the filament current is self-corrected, which makes up for the filament correction data deviation and the damage to the tube current dynamic performance caused by the tube differences, the training process and the filament aging, improves the output performance stability of the X-ray tube throughout the life cycle, and increases the service life of the X-ray tube.

[0013] In an optional embodiment, the target characteristic value includes a characteristic extreme value, a characteristic average value, a characteristic root mean square, a deviation extreme value and a deviation average value; the filament current characteristic, the tube current characteristic and the tube voltage characteristic are input into a feature extraction function to determine the target characteristic value, including:

[0014] The filament current characteristic, the tube current characteristic and the tube voltage characteristic in the exposure process are respectively subjected to extreme value calculation, average value calculation and characteristic root mean square calculation to obtain the characteristic extreme value, characteristic average value and characteristic root mean square corresponding to the filament current, the tube current and the tube voltage respectively;

[0015] Based on the characteristic extreme values ​​and the characteristic average values ​​corresponding to the filament current, the tube current, and the tube voltage, respectively, and the preset characteristic extreme values ​​and the preset characteristic average values ​​corresponding to the filament current, the tube current, and the tube voltage, respectively, a difference calculation is performed to determine the deviation extreme values ​​and the deviation average values ​​corresponding to the filament current, the tube current, and the tube voltage, respectively.

[0016] The filament current self-correction method provided by the embodiment of the present invention calculates extreme values, average values ​​and characteristic root mean squares of the filament current characteristics, tube current characteristics and tube voltage characteristics during the exposure process, respectively, to obtain characteristic extreme values, characteristic average values ​​and characteristic root mean squares corresponding to the filament current, tube current and tube voltage, respectively, and then performs mathematical calculations to obtain deviation extreme values ​​and deviation average values ​​corresponding to the filament current, tube current and tube voltage, respectively, and then the determined target characteristic values ​​can be used to determine the self-correction results, thereby improving the rationality and comprehensiveness of determining the self-correction results, and thereby improving the accuracy of performing the self-correction.

[0017] In an optional implementation, the self-correction mode includes a point correction mode, a tube current line correction mode, a tube voltage line correction mode and a surface correction mode; based on the tube voltage setting value and the tube current setting value, determining the self-correction mode includes:

[0018] Get the current tube voltage and current tube current corresponding to each data point;

[0019] In the case that there is a data point in each of the data points, the current tube voltage corresponding to the data point is equal to the tube voltage setting value, and the corresponding current tube current is equal to the tube current setting value, determining that the self-calibration mode is a point calibration mode;

[0020] In the case that there is a data point in each of the data points, the current tube voltage corresponding to which is equal to the tube voltage setting value, the corresponding current tube current is less than the tube current setting value, and the current tube current corresponding to the next data point of the data point is greater than the tube current setting value, determining that the self-calibration mode is the tube current linear calibration mode;

[0021] In the case that among each of the data points, the current tube voltage corresponding to a certain data point is less than the tube voltage setting value, the current tube voltage corresponding to a data point next to the certain data point is greater than the tube voltage setting value, and the tube current corresponding to the certain data point is equal to the tube current setting value, determining that the self-calibration mode is the tube voltage line calibration mode;

[0022] In the case that among each of the data points, there is a data point corresponding to the current tube voltage which is less than the tube voltage setting value, the current tube voltage which is corresponding to the next data point of the data point is greater than the tube voltage setting value, the current tube current which is corresponding to the data point is less than the tube current setting value, and the current tube current which is corresponding to the next data point of the data point is greater than the tube current setting value, the self-correction mode is determined to be the surface correction mode.

[0023] The filament current self-correction method provided in the embodiment of the present invention determines the self-correction mode through the current tube voltage, the current tube current, the tube current setting value and the tube voltage setting value corresponding to each data point, and performs corresponding filament current self-correction based on the determined self-correction mode, thereby improving the efficiency of filament current self-correction.

[0024] In an optional embodiment, the method further includes:

[0025] Get the learning factor coefficient;

[0026] Based on the target eigenvalue and the preset eigenvalue threshold, a comparison is performed to obtain an eigenvalue approximation result;

[0027] Determining an exposure weight coefficient based on the characteristic value approximation result;

[0028] Determining a correction coefficient based on the learning factor coefficient and the exposure weight coefficient;

[0029] Based on the correction coefficient, a correction strength corresponding to the self-correction mode is determined.

[0030] The filament current self-correction method provided by the embodiment of the present invention ensures the accuracy of the filament current self-correction, thereby ensuring the dynamic performance of the tube current and improving the output performance stability of the X-ray tube throughout its life cycle by comparing the target characteristic value with the preset characteristic threshold, and determining the exposure weight coefficient based on the characteristic value approach result determined by the comparison, and then determining the correction coefficient based on the learning factor function and the exposure weight coefficient, and determining the correction strength.

[0031] In an optional embodiment, the method further includes:

[0032] Obtaining a preset self-correction change threshold;

[0033] Based on the self-correction variation and the preset self-correction variation threshold, a comparison is performed to determine a variation comparison result;

[0034] In a case where the variation comparison result indicates that there is no abnormality in the self-correction variation, self-correction of the filament current is performed based on the self-correction variation and the self-correction mode.

[0035] The filament current self-correction method provided in the embodiment of the present invention determines the variation comparison result by comparing the self-correction variation with a preset self-correction variation threshold, and when the variation comparison result indicates that there is no abnormality in the self-correction variation, performs self-correction of the filament current based on the self-correction variation and the self-correction mode, thereby improving the accuracy of self-correction.

[0036] In an optional embodiment, the method further includes:

[0037] When the variation comparison result indicates that the self-correction variation is abnormal, the variation calculation is performed again based on the filament current characteristics, the tube current characteristics, the tube voltage characteristics, the tube training data set and the self-correction data set.

[0038] The filament current self-correction method provided in the embodiment of the present invention improves the rationality and rigor of the technical solution of the present application by listing the situations in which the variation comparison result indicates that the self-correction variation is abnormal.

[0039] In an optional embodiment, the method further includes:

[0040] The training data set and the self-correction data set are acquired by a host computer; and the host computer sends the training data set and the self-correction data set to a central processor, so that the central processor performs current self-correction of the filament current.

[0041] The filament current self-calibration method provided in the embodiment of the present invention reduces the consumption of the central processing unit and improves the efficiency of the filament current self-calibration by using a host computer to obtain a training data set and a self-calibration data set.

[0042] In a second aspect, the present invention provides a filament current self-correction device, the device comprising:

[0043] An acquisition module, for acquiring a tube voltage setting value, a tube current setting value, a preset characteristic value threshold value, and starting an exposure condition in response to a self-calibration instruction, and obtaining a filament current characteristic, a tube current characteristic, and a tube voltage characteristic during the exposure process;

[0044] A first determination module is used to determine a target feature value based on the filament current feature, the tube current feature and the tube voltage feature, which are input into a feature extraction function;

[0045] A second determination module is used to compare the target characteristic value and the preset characteristic value threshold to determine the self-correction result;

[0046] A third determination module is used to determine a self-calibration mode based on the tube voltage setting value and the tube current setting value when the self-calibration result indicates that self-calibration is required;

[0047] A fourth determination module, configured to calculate a change amount based on the filament current characteristic, the tube current characteristic, the tube voltage characteristic, the tube training data set and the self-correction data set, and determine a self-correction change amount;

[0048] The self-correction module is used to perform self-correction of the filament current based on the self-correction variation and the self-correction mode.

[0049] In a third aspect, the present invention provides a computer device, comprising: a memory and a processor, the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the filament current self-correction method of the first aspect or any corresponding embodiment thereof by executing the computer instructions.

[0050] In a fourth aspect, the present invention provides a computer-readable storage medium having computer instructions stored thereon, the computer instructions being used to enable a computer to execute the filament current self-correction method of the first aspect or any corresponding embodiment thereof.

[0051] In a fifth aspect, the present invention provides a computer program product, comprising computer instructions for causing a computer to execute the filament current self-correction method of the first aspect or any corresponding embodiment thereof. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] In order to more clearly illustrate the specific implementation methods of the present invention or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0053] Figure 1 is a flow chart of a filament current self-correction method according to an embodiment of the present invention;

[0054] Figure 2 This is the change diagram of the filament current before and after self-correction;

[0055] Figure 3 It is the curve change diagram of the training data set;

[0056] Figure 4 is a schematic diagram of a filament current self-correction device according to an embodiment of the present invention;

[0057] Figure 5It is a structural schematic diagram of a computer device provided by an optional embodiment of the present invention. DETAILED DESCRIPTION

[0058] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0059] X-ray detection has important applications in hospital patient diagnosis, industrial non-destructive testing, station security inspection and other fields. As the core component of X-ray detection, the X-ray tube is a vacuum diode working under high voltage. The X-ray tube contains two electrodes, an anode and a cathode: one is a filament for emitting electrons, which serves as the cathode, and the other is a target for receiving electron bombardment, which serves as the anode. The power supply part of the X-ray tube contains at least a low-voltage power supply for heating the filament and a high-voltage generator for applying high voltage to the two electrodes.

[0060] The X-ray tube has a cathode and an anode, and a filament current is set at the cathode. During the operation of the X-ray tube, the cathode filament passes through the current, the filament temperature rises, and it has the ability to emit electrons. At this time, a high voltage is applied to the positive and negative electrodes to convert part of the electrical energy into the tube current of the X-ray. Since there is a strong nonlinear relationship between the tube current and the filament current, each X-ray tube needs to calibrate the corresponding relationship between the tube current and the filament current before use. Usually, it is through exposure at each working point of the filament current, and the corresponding tube current value is obtained by testing. Repeating a large number of tests can obtain the corresponding relationship between the tube current and the filament current. This process is called training. The performance of the X-ray tube is affected by many factors such as the number of uses, the life of the filament, and the vacuum degree of the tube. During the entire life cycle of the X-ray tube, the performance of the X-ray tube can remain stable for a period of time after the training, and then it will gradually decline. Therefore, multiple trainings are required to maintain the stability of the X-ray tube performance during the entire life cycle of the X-ray tube. However, each training will collect a large amount of test data and perform a large amount of exposure, thereby accelerating the aging of the filament and seriously shortening the service life of the X-ray tube. Therefore, the present application proposes a new filament current self-correction method.

[0061] According to an embodiment of the present invention, an embodiment of a filament current self-correction method is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0062] In this embodiment, a filament current self-calibration method is provided, which can be used in an X-ray tube. Figure 1 is a flow chart of a filament current self-correction method according to an embodiment of the present invention. Figure 1 As shown, the process includes the following steps:

[0063] Step S101, in response to a self-calibration instruction, obtain a tube voltage setting value, a tube current setting value, a preset characteristic value threshold, and start exposure conditions to obtain filament current characteristics, tube current characteristics, and tube voltage characteristics during exposure.

[0064] In a specific embodiment, the tube voltage setting value may be a set exposure tube voltage value; the tube current setting value may be a set exposure tube current value; the preset characteristic value threshold may be a preset standard value of the characteristic value; the filament current characteristic may be a waveform characteristic of the filament current during the exposure process; the tube current characteristic may be a tube current waveform characteristic during the exposure process; and the tube voltage characteristic may be a tube voltage waveform characteristic during the exposure process.

[0065] Specifically, after the user issues a filament current self-calibration instruction, the antenna responds to the user's self-calibration instruction and performs self-calibration of the antenna filament current. Furthermore, the tube voltage setting value, the tube current setting value, and the preset characteristic value threshold are first obtained. Furthermore, the exposure condition of the antenna is turned on to obtain the filament current characteristics, tube current characteristics, and tube voltage characteristics during the exposure process.

[0066] Step S102, based on the filament current characteristics, tube current characteristics and tube voltage characteristics, they are input into a feature extraction function to determine a target feature value.

[0067] In a specific embodiment, the target characteristic value may be a corrected characteristic value obtained by calculation; specifically, a feature extraction function is constructed in the present application to extract the target characteristic value, and optionally, the filament current characteristic, tube current characteristic and tube voltage characteristic obtained during the exposure process are input into the feature extraction function to extract the target characteristic value.

[0068] Step S103, comparing the target eigenvalue and the preset eigenvalue threshold to determine the self-correction result.

[0069] In a specific embodiment, the self-calibration result is used to indicate whether the filament current needs to be self-calibrated; specifically, the target characteristic value obtained above is compared with the preset characteristic value threshold. When the target characteristic value is greater than the preset characteristic value threshold, the self-calibration result is determined to be that the filament current needs to be self-calibrated. When the target characteristic value is not greater than the preset characteristic value threshold, the self-calibration result is determined to be that the filament current does not need to be self-calibrated.

[0070] Step S104: when the self-calibration result indicates that self-calibration is required, a self-calibration mode is determined based on the tube voltage setting value and the tube current setting value.

[0071] In a specific embodiment, the self-correction mode can be a different mode for correcting the filament current system; specifically, when the self-correction result indicates that self-correction is required, that is, when the filament current needs to be self-corrected, based on the tube voltage setting value and the tube current setting value, they are input into the self-correction function to obtain the data value corresponding to the self-correction mode, and then the self-correction mode is determined based on the data value corresponding to the self-correction mode.

[0072] Step S105 , based on the filament current characteristics, the tube current characteristics, the tube voltage characteristics, the tube training data set and the self-correction data set, a change amount calculation is performed to determine the self-correction change amount.

[0073] In a specific embodiment, the tube training data set can be a tube current obtained by collecting the tube current output by the X-ray tube at different tube voltages and different filament currents; the self-correction data set can be an initialized self-correction data set stored in the device; specifically, based on the filament current characteristics, tube current characteristics, tube voltage characteristics, the tube training data set and the self-correction data set are input into the variation calculation function to calculate the self-correction variation.

[0074] Step S106 , performing self-calibration of the filament current based on the self-calibration variation and the self-calibration mode.

[0075] In a specific embodiment, based on the self-correction variation, in the self-correction mode determined above, self-correction of the filament current is performed, optionally, Figure 2 This is a graph showing the changes in the filament current before and after self-correction.

[0076] In an optional embodiment, the method further comprises:

[0077] The training data set and the self-correction data set are acquired by a host computer; and the host computer sends the training data set and the self-correction data set to a central processor, so that the central processor performs current self-correction of the filament current.

[0078] In a specific embodiment, the host computer will also receive the self-correction instruction, that is, respond to obtain the training tube data set and the self-correction data set. Specifically, the obtained training tube data set can be derived from the data obtained in the X-ray tube data manual and the training tube mode. Specifically, the X-ray tube data manual contains the X-ray tube filament current calibration curve, constructs the training tube data set, and in the training tube mode, the actual exposure collects the tube current output by the X-ray tube at different tube voltages and different filament currents to obtain the training tube data set; specifically, the obtained self-correction data set can be derived from the initialization self-correction data set stored in the same life cycle stage of the same model X-ray tube, and the training tube data set If obtained by calculation in the training tube mode is different from the actual filament current deviation. Optionally, in the case where the self-correction data set has no data source, the self-correction data set can be assigned to 0; further, in the case where the host computer obtains the training tube data set and the self-correction data set, the obtained training tube data set and the self-correction data set are sent to the central processing unit, so that the central processing unit performs current self-correction of the filament current based on the training tube data set and the self-correction data set. Optionally, Figure 3 This is the curve change diagram of the training data set.

[0079] In an optional embodiment, the target characteristic value includes a characteristic extreme value, a characteristic average value, a characteristic root mean square, a deviation extreme value and a deviation average value; the above step S102 includes:

[0080] Step S1021, performing extreme value calculation, average value calculation and characteristic root mean square calculation on the filament current characteristic, the tube current characteristic and the tube voltage characteristic during the exposure process, respectively, to obtain the characteristic extreme value, the characteristic average value and the characteristic root mean square corresponding to the filament current, the tube current and the tube voltage, respectively;

[0081] Step S1022, based on the characteristic extreme values, the characteristic average values ​​corresponding to the filament current, the tube current, and the tube voltage respectively, and the preset characteristic extreme values, the preset characteristic average values ​​corresponding to the filament current, the tube current, and the tube voltage respectively, difference calculation is performed to determine the deviation extreme values ​​and the deviation average values ​​corresponding to the filament current, the tube current, and the tube voltage respectively.

[0082] In a specific embodiment, after the filament current characteristics, tube current characteristics and tube voltage characteristics are extracted using a feature extraction function, extreme value calculation, average value calculation and characteristic root mean square calculation are observed and performed. Specifically, the extreme value can be directly obtained using observation, and the average value and characteristic root mean square are calculated accordingly based on a calculation formula. Accordingly, the characteristic extreme value, characteristic average value and characteristic root mean square corresponding to the filament current, tube current and tube voltage are obtained respectively. Furthermore, based on the characteristic extreme value and characteristic average value corresponding to the filament current, tube current and tube voltage respectively and the preset characteristic extreme value and preset characteristic average value corresponding to the filament current, tube current and tube voltage respectively, a difference calculation is performed to determine the deviation extreme value and deviation average value corresponding to the filament current, tube current and tube voltage respectively. Optionally, the corresponding deviation extreme value and deviation average value are calculated respectively.

[0083] In an optional embodiment, the self-correction mode includes a point correction mode, a tube current line correction mode, a tube voltage line correction mode and a surface correction mode; the above step S104 includes:

[0084] Step S1041, obtaining the current tube voltage and current tube current corresponding to each data point;

[0085] Step S1042, determining that the self-calibration mode is a point calibration mode when there is a data point in each of the data points corresponding to the current tube voltage being equal to the tube voltage setting value and the corresponding current tube current being equal to the tube current setting value;

[0086] Step S1043, when there is a data point in each of the data points where the current tube voltage is equal to the tube voltage setting value, the corresponding current tube current is less than the tube current setting value, and the current tube current is greater than the tube current setting value at the next data point of the data point, determining that the self-calibration mode is the tube current linear calibration mode;

[0087] Step S1044, when there is a data point in each of the data points where the current tube voltage corresponding to the data point is less than the tube voltage setting value, the current tube voltage corresponding to the next data point of the data point is greater than the tube voltage setting value, and the tube current corresponding to the data point is equal to the tube current setting value, determining that the self-calibration mode is the tube voltage line calibration mode;

[0088] Step S1045: Determine that the self-correction mode is the surface correction mode when there is a data point in each of the data points where the current tube voltage corresponding to the data point is less than the tube voltage setting value, the current tube voltage corresponding to the data point next to the data point is greater than the tube voltage setting value, the current tube current corresponding to the data point is less than the tube current setting value, and the current tube current corresponding to the data point next to the data point is greater than the tube current setting value.

[0089] In a specific embodiment, the point correction mode may be a mode for correcting only one data point; the tube current line correction mode may be a correction mode for correcting only two data points corresponding to the tube current; the tube voltage correction mode may be a correction mode for correcting only two data points corresponding to the tube voltage; the surface correction mode may be a correction mode for correcting multiple data points corresponding to the tube voltage and the tube current; specifically, firstly obtain the current tube voltage and the current tube current corresponding to each data point, compare the current tube voltage of each data point with the tube voltage setting value, and compare the current tube current of each data point with the tube current setting value, and then determine that the self-correction mode is the point correction mode when there is a data point in each data point where the current tube voltage corresponding to the data point is equal to the tube voltage setting value and the corresponding current tube current is equal to the tube current setting value;

[0090] Optionally, when there is a data point in each data point where the current tube voltage corresponding to the data point is less than the tube voltage setting value, the current tube voltage corresponding to the next data point of the data point is greater than the tube voltage setting value, and the current tube current corresponding to the data point is equal to the tube current setting value, the self-calibration mode is determined to be the tube voltage line calibration mode;

[0091] Optionally, when there is a data point in each data point where the current tube voltage corresponding to the data point is equal to the tube voltage setting value, the corresponding current tube current is less than the tube current setting value, and the current tube current corresponding to the next data point of the data point is greater than the tube current setting value, the self-calibration mode is determined to be the tube current linear calibration mode;

[0092] Optionally, when among each data point there is a data point whose corresponding current tube voltage is less than the tube voltage setting value, the current tube voltage corresponding to the next data point of the data point is greater than the tube voltage setting value, the current tube current corresponding to the data point is less than the tube current setting value, and the current tube current corresponding to the next data point of the data point is greater than the tube current setting value, the self-correction mode is determined to be the surface correction mode.

[0093] In an optional embodiment, the above step 104 further includes:

[0094] Step a1, obtaining the learning factor coefficient;

[0095] Step a2, comparing the target eigenvalue and the preset eigenvalue threshold to obtain an eigenvalue approximation result;

[0096] Step a3, determining an exposure weight coefficient based on the characteristic value approach result;

[0097] Step a4, determining a correction coefficient based on the learning factor coefficient and the exposure weight coefficient;

[0098] Step a5: determining the correction strength corresponding to the self-correction mode based on the correction coefficient.

[0099] In a specific embodiment, the learning factor coefficient is selected based on the characteristics of the X-ray tube, the correction work performance and the correction work experience. In order to ensure the convergence of the correction process, the learning factor coefficient must be <1; the eigenvalue approach result is used to indicate the degree to which the target eigenvalue approaches the preset eigenvalue threshold; the exposure weight coefficient can be the degree of similarity between the target eigenvalue and the preset eigenvalue threshold; the correction coefficient can be the degree coefficient of self-correction of the filament current; specifically, the target eigenvalue obtained above is compared with the preset eigenvalue threshold to obtain the characteristic approach result, and then based on the characteristic approach result, the exposure weight coefficient corresponding to the target eigenvalue and the preset eigenvalue threshold is determined, and further, the learning factor coefficient and the exposure weight coefficient are mathematically calculated to obtain the correction coefficient, and further, based on the correction coefficient, the correction strength corresponding to the self-correction mode is determined.

[0100] In an optional embodiment, the method further comprises:

[0101] Step b1, obtaining a preset self-correction change threshold;

[0102] Based on the self-correction variation and the preset self-correction variation threshold, a comparison is performed to determine a variation comparison result;

[0103] In a case where the variation comparison result indicates that there is no abnormality in the self-correction variation, self-correction of the filament current is performed based on the self-correction variation and the self-correction mode.

[0104] In a specific embodiment, the preset self-correction change threshold may be a preset standard value of the self-correction change; the change comparison result is used to indicate whether there is an abnormality in the self-correction change; optionally, when the self-correction change is greater than the preset self-correction change threshold, it is determined that the change comparison result indicates that there is an abnormality in the self-correction change, and when the self-correction change is not greater than the preset self-correction change threshold, it is determined that the change comparison result indicates that there is no abnormality in the self-correction change; specifically, a pre-stored preset self-correction change threshold is obtained, and the aforementioned acquired self-correction change is compared with the preset self-correction change threshold, and accordingly, a change comparison result is determined, and further, when the change comparison result indicates that there is no abnormality in the self-correction change, current self-correction of the filament current is performed based on the self-correction change in the aforementioned determined self-correction mode.

[0105] In an optional embodiment, the method further comprises:

[0106] Step c1, when the variation comparison result indicates that the self-correction variation is abnormal, recalculating the variation based on the filament current characteristics, the tube current characteristics and the tube voltage characteristics, the training tube data set and the self-correction data set.

[0107] In a specific embodiment, when the variation comparison result indicates that there is an abnormality in the self-correction variation, the variation is recalculated based on the filament current characteristics, tube current characteristics and tube voltage characteristics, the training tube data set and the self-correction data set, which are input into the variation calculation function.

[0108] The filament current self-correction method provided by the embodiment of the present invention obtains the tube voltage setting value, the tube current setting value, the preset characteristic value threshold value, and starts the exposure condition in response to the self-correction instruction, thereby obtaining the filament current characteristics, the tube current characteristics, and the tube voltage characteristics during the exposure process; the filament current characteristics, the tube current characteristics, and the tube voltage characteristics are input into the feature extraction function to extract the target characteristic value, thereby improving the spatial instability of the data solution, the generalization ability of the correction model, and the calculation accuracy; and then the target characteristic value is compared with the preset characteristic value threshold value to determine the self-correction result, and the self-correction result is indicated in the self-correction result. When self-correction is required, the self-correction mode is determined based on the tube voltage setting value and the tube current setting value; the change amount is calculated based on the filament current characteristics, the tube current characteristics and the tube voltage characteristics, the training data set and the self-correction data set to determine the self-correction change amount; further, based on the self-correction change amount and the self-correction mode, the filament current is self-corrected, which makes up for the filament correction data deviation and the damage to the tube current dynamic performance caused by the tube differences, the training process and the filament aging, improves the output performance stability of the X-ray tube throughout the life cycle, and increases the service life of the X-ray tube.

[0109] In this embodiment, a filament current self-correction device is also provided, which is used to implement the above embodiments and preferred implementations, and will not be repeated here. As used below, the term "module" can be a combination of software and / or hardware that implements a predetermined function. Although the device described in the following embodiments is preferably implemented in software, the implementation of hardware, or a combination of software and hardware, is also possible and conceivable.

[0110] This embodiment provides a filament current self-correction device, such as Figure 4 As shown, including:

[0111] The acquisition module 401 is used to respond to the self-calibration instruction, acquire the tube voltage setting value, the tube current setting value, the preset characteristic value threshold, and start the exposure condition to obtain the filament current characteristic, the tube current characteristic and the tube voltage characteristic during the exposure process;

[0112] A first determination module 402 is used to determine a target feature value based on the filament current feature, the tube current feature and the tube voltage feature, which are input into a feature extraction function;

[0113] A second determination module 403 is used to compare the target characteristic value and the preset characteristic value threshold to determine the self-correction result;

[0114] A third determination module 404 is configured to determine a self-calibration mode based on the tube voltage setting value and the tube current setting value when the self-calibration result indicates that self-calibration is required;

[0115] A fourth determination module 405 is used to calculate the variation based on the filament current characteristics, the tube current characteristics, the tube voltage characteristics, the tube training data set and the self-correction data set to determine the self-correction variation;

[0116] The self-correction module 406 is used to perform self-correction of the filament current based on the self-correction variation and the self-correction mode.

[0117] In an optional embodiment, the target characteristic value includes a characteristic extreme value, a characteristic average value, a characteristic root mean square, a deviation extreme value and a deviation average value; the first determination module 402 includes:

[0118] A first calculation unit is used to perform extreme value calculation, average value calculation and characteristic root mean square calculation on the filament current characteristic, the tube current characteristic and the tube voltage characteristic during the exposure process, respectively, to obtain the characteristic extreme value, the characteristic average value and the characteristic root mean square corresponding to the filament current, the tube current and the tube voltage, respectively;

[0119] A second calculation unit is used to perform difference calculation based on the characteristic extreme values ​​and characteristic average values ​​corresponding to the filament current, the tube current, and the tube voltage respectively and the preset characteristic extreme values ​​and preset characteristic average values ​​corresponding to the filament current, the tube current, and the tube voltage respectively, to determine the deviation extreme values ​​and the deviation average values ​​corresponding to the filament current, the tube current, and the tube voltage respectively.

[0120] In an optional embodiment, the self-correction mode includes a point correction mode, a tube current line correction mode, a tube voltage line correction mode and a surface correction mode; the third determination module 404 includes:

[0121] A current acquisition unit is used to acquire the current tube voltage and current tube current corresponding to each data point;

[0122] a point correction unit, configured to determine that the self-correction mode is a point correction mode when there is a data point in each of the data points corresponding to a current tube voltage that is equal to the tube voltage setting value and a corresponding current tube current that is equal to the tube current setting value;

[0123] a tube current linear correction unit, configured to determine that the self-correction mode is a tube current linear correction mode when, in each of the data points, there is a data point corresponding to a current tube voltage that is equal to the tube voltage setting value, the corresponding current tube current is less than the tube current setting value, and a data point next to the data point corresponding to a current tube current that is greater than the tube current setting value;

[0124] a tube voltage line correction unit, configured to determine that the self-correction mode is a tube voltage line correction mode when, among each of the data points, there is a data point corresponding to a current tube voltage that is less than the tube voltage setting value, a data point next to the data point corresponding to a current tube voltage that is greater than the tube voltage setting value, and a tube current that is corresponding to the data point is equal to the tube current setting value;

[0125] The surface correction unit is used to determine that the self-correction mode is the surface correction mode when there is a data point among each of the data points, the current tube voltage corresponding to which is less than the tube voltage setting value, the current tube voltage corresponding to the data point next to the data point is greater than the tube voltage setting value, the current tube current corresponding to which is less than the tube current setting value, and the current tube current corresponding to the data point next to the data point is greater than the tube current setting value.

[0126] In an optional embodiment, the device further comprises:

[0127] A learning acquisition unit, used for acquiring learning factor coefficients;

[0128] An approach determination unit, configured to compare the target feature value with the preset feature value threshold to obtain a feature value approach result;

[0129] An exposure weight unit, used to determine an exposure weight coefficient based on the characteristic value approach result;

[0130] a correction coefficient determination unit, configured to determine a correction coefficient based on the learning factor coefficient and the exposure weight coefficient;

[0131] A force determination unit is used to determine the correction force corresponding to the self-correction mode based on the correction coefficient.

[0132] In an optional embodiment, the device further comprises:

[0133] A threshold value acquisition unit, used to acquire a preset self-correction change threshold value;

[0134] a variation comparison unit, configured to compare the self-correction variation with the preset self-correction variation threshold to determine a variation comparison result;

[0135] The non-abnormal unit is used to perform self-correction of the filament current based on the self-correction change amount and the self-correction mode when the change amount comparison result indicates that the self-correction change amount does not have abnormality.

[0136] In an optional embodiment, the device further includes an abnormality unit, configured to:

[0137] When the variation comparison result indicates that the self-correction variation is abnormal, the variation calculation is performed again based on the filament current characteristics, the tube current characteristics, the tube voltage characteristics, the tube training data set and the self-correction data set.

[0138] In an optional embodiment, the apparatus further includes a data set acquisition unit, configured to:

[0139] The training data set and the self-correction data set are acquired by a host computer; and the host computer sends the training data set and the self-correction data set to a central processor, so that the central processor performs current self-correction of the filament current.

[0140] The further functional description of each of the above modules and units is the same as that of the above corresponding embodiments and will not be repeated here.

[0141] The filament current self-correction device in this embodiment is presented in the form of a functional unit, where the unit refers to an ASIC (Application Specific Integrated Circuit) circuit, a processor and memory that executes one or more software or fixed programs, and / or other devices that can provide the above functions.

[0142] The embodiment of the present invention also provides a computer device having the above Figure 4 The filament current self-correction device shown.

[0143] See also Figure 5 , Figure 5 is a schematic diagram of the structure of a computer device provided by an optional embodiment of the present invention, such as Figure 5 As shown, the computer device includes: one or more processors 10, a memory 20, and interfaces for connecting various components, including high-speed interfaces and low-speed interfaces. Various components are connected to each other using different buses for communication, and can be installed on a common mainboard or installed in other ways as needed. The processor can process the instructions executed in the computer device, including instructions stored in or on the memory to display the graphical information of the GUI on an external input / output device (such as, a display device coupled to the interface). In some optional embodiments, if necessary, multiple processors and / or multiple buses can be used together with multiple memories and multiple memories. Similarly, multiple computer devices can be connected, and each device provides some necessary operations (for example, as a server array, a group of blade servers, or a multi-processor system). Figure 5 A processor 10 is taken as an example.

[0144] The processor 10 may be a central processing unit, a network processor or a combination thereof. The processor 10 may further include a hardware chip. The hardware chip may be a dedicated integrated circuit, a programmable logic device or a combination thereof. The programmable logic device may be a complex programmable logic device, a field programmable gate array, a general purpose array logic or any combination thereof.

[0145] The memory 20 stores instructions executable by at least one processor 10, so that the at least one processor 10 executes the method shown in the above embodiment.

[0146] The memory 20 may include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application required for at least one function; the data storage area may store data created according to the use of the computer device, etc. In addition, the memory 20 may include a high-speed random access memory, and may also include a non-transient memory, such as at least one disk storage device, a flash memory device, or other non-transient solid-state storage device. In some optional embodiments, the memory 20 may optionally include a memory remotely arranged relative to the processor 10, and these remote memories may be connected to the computer device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0147] The memory 20 may include a volatile memory, such as a random access memory; the memory may also include a non-volatile memory, such as a flash memory, a hard disk or a solid state drive; the memory 20 may also include a combination of the above types of memory.

[0148] The computer device also includes an input device 30 and an output device 40. The processor 10, the memory 20, the input device 30 and the output device 40 may be connected via a bus or other means. Figure 5 The example of connecting through bus is taken in the following.

[0149] The input device 30 can receive input digital or character information, and generate key signal input related to the user settings and function control of the computer device, such as a touch screen, a keypad, a mouse, a track pad, a touch pad, an indicator bar, one or more mouse buttons, a trackball, a joystick, etc. The output device 40 may include a display device, an auxiliary lighting device (e.g., an LED) and a tactile feedback device (e.g., a vibration motor), etc. The above-mentioned display device includes but is not limited to a liquid crystal display, a light emitting diode, a display and a plasma display. In some optional embodiments, the display device can be a touch screen.

[0150] The embodiment of the present invention also provides a computer-readable storage medium. The method according to the embodiment of the present invention can be implemented in hardware, firmware, or can be implemented as a computer code that can be recorded in a storage medium, or can be implemented as a computer code that is originally stored in a remote storage medium or a non-temporary machine-readable storage medium and will be stored in a local storage medium through a network download, so that the method described herein can be stored in such software processing on a storage medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware. Among them, the storage medium can be a magnetic disk, an optical disk, a read-only storage memory, a random access memory, a flash memory, a hard disk or a solid-state hard disk, etc.; further, the storage medium can also include a combination of the above types of memories. It can be understood that a computer, a processor, a microprocessor controller, or programmable hardware includes a storage component that can store or receive software or computer code. When the software or computer code is accessed and executed by a computer, a processor, or hardware, the method shown in the above embodiment is implemented.

[0151] A part of the present invention may be applied as a computer program product, such as a computer program instruction, which, when executed by a computer, can call or provide the method and / or technical solution according to the present invention through the operation of the computer. Those skilled in the art should understand that the existence of the computer program instruction in a computer-readable medium includes, but is not limited to, a source file, an executable file, an installation package file, etc., and accordingly, the way in which the computer program instruction is executed by the computer includes, but is not limited to: the computer directly executes the instruction, or the computer compiles the instruction and then executes the corresponding compiled program, or the computer reads and executes the instruction, or the computer reads and installs the instruction and then executes the corresponding installed program. Here, the computer-readable medium may be any available computer-readable storage medium or communication medium accessible to the computer.

[0152] Although the embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations are all within the scope defined by the appended claims.

Claims

1. A filament current self-correction method, characterized in that: The method comprises: In response to the self-calibration instruction, a tube voltage setting value, a tube current setting value, and a preset characteristic value threshold are obtained, and an exposure condition is turned on to obtain a filament current characteristic, a tube current characteristic, and a tube voltage characteristic during the exposure process; Based on the filament current feature, the tube current feature and the tube voltage feature, the features are input into a feature extraction function to determine a target feature value; Based on the target characteristic value and the preset characteristic value threshold, a comparison is performed to determine a self-correction result; When the self-calibration result indicates that self-calibration is required, determining a self-calibration mode based on the tube voltage setting value and the tube current setting value; Based on the filament current characteristics, the tube current characteristics, the tube voltage characteristics, the tube training data set and the self-correction data set, a change amount calculation is performed to determine a self-correction change amount; Based on the self-correction variation and the self-correction mode, self-correction of the filament current is performed.

2. The method according to claim 1, characterized in that The target characteristic value includes a characteristic extreme value, a characteristic average value, a characteristic root mean square, a deviation extreme value and a deviation average value; the filament current characteristic, the tube current characteristic and the tube voltage characteristic are input into a characteristic extraction function to determine the target characteristic value, including: The filament current characteristic, the tube current characteristic and the tube voltage characteristic in the exposure process are respectively subjected to extreme value calculation, average value calculation and characteristic root mean square calculation to obtain the characteristic extreme value, characteristic average value and characteristic root mean square corresponding to the filament current, the tube current and the tube voltage respectively; Based on the characteristic extreme values ​​and the characteristic average values ​​corresponding to the filament current, the tube current, and the tube voltage, respectively, and the preset characteristic extreme values ​​and the preset characteristic average values ​​corresponding to the filament current, the tube current, and the tube voltage, respectively, a difference calculation is performed to determine the deviation extreme values ​​and the deviation average values ​​corresponding to the filament current, the tube current, and the tube voltage, respectively.

3. The method according to claim 1, characterized in that The self-correction mode includes a point correction mode, a tube current line correction mode, a tube voltage line correction mode and a surface correction mode; the self-correction mode is determined based on the tube voltage setting value and the tube current setting value, including: Get the current tube voltage and current tube current corresponding to each data point; In the case that there is a data point in each of the data points, the current tube voltage corresponding to the data point is equal to the tube voltage setting value, and the corresponding current tube current is equal to the tube current setting value, determining that the self-calibration mode is a point calibration mode; In the case that there is a data point in each of the data points, the current tube voltage corresponding to which is equal to the tube voltage setting value, the corresponding current tube current is less than the tube current setting value, and the current tube current corresponding to the next data point of the data point is greater than the tube current setting value, determining that the self-calibration mode is the tube current linear calibration mode; In the case that among each of the data points, the current tube voltage corresponding to a certain data point is less than the tube voltage setting value, the current tube voltage corresponding to a data point next to the certain data point is greater than the tube voltage setting value, and the tube current corresponding to the certain data point is equal to the tube current setting value, determining that the self-calibration mode is the tube voltage line calibration mode; In the case that among each of the data points, there is a data point corresponding to the current tube voltage which is less than the tube voltage setting value, the current tube voltage which is corresponding to the next data point of the data point is greater than the tube voltage setting value, the current tube current which is corresponding to the data point is less than the tube current setting value, and the current tube current which is corresponding to the next data point of the data point is greater than the tube current setting value, the self-correction mode is determined to be the surface correction mode.

4. The method according to claim 1, characterized in that: The method further comprises: Get the learning factor coefficient; Based on the target eigenvalue and the preset eigenvalue threshold, a comparison is performed to obtain an eigenvalue approximation result; Determining an exposure weight coefficient based on the characteristic value approximation result; Determining a correction coefficient based on the learning factor coefficient and the exposure weight coefficient; Based on the correction coefficient, a correction strength corresponding to the self-correction mode is determined.

5. The method according to claim 1, characterized in that The method further comprises: Obtaining a preset self-correction change threshold; Based on the self-correction variation and the preset self-correction variation threshold, a comparison is performed to determine a variation comparison result; In a case where the variation comparison result indicates that there is no abnormality in the self-correction variation, self-correction of the filament current is performed based on the self-correction variation and the self-correction mode.

6. The method according to claim 5, characterized in that The method further comprises: When the variation comparison result indicates that the self-correction variation is abnormal, the variation calculation is performed again based on the filament current characteristics, the tube current characteristics, the tube voltage characteristics, the tube training data set and the self-correction data set.

7. The method according to claim 1, characterized in that The method further comprises: The training data set and the self-correction data set are acquired by a host computer; and the host computer sends the training data set and the self-correction data set to a central processor, so that the central processor performs current self-correction of the filament current.

8. A current self-correcting device, characterized in that: The device comprises: An acquisition module, for acquiring a tube voltage setting value, a tube current setting value, a preset characteristic value threshold value, and starting an exposure condition in response to a self-calibration instruction, and obtaining a filament current characteristic, a tube current characteristic, and a tube voltage characteristic during the exposure process; A first determination module is used to determine a target feature value based on the filament current feature, the tube current feature and the tube voltage feature, which are input into a feature extraction function; A second determination module is used to compare the target characteristic value and the preset characteristic value threshold to determine the self-correction result; A third determination module is used to determine a self-calibration mode based on the tube voltage setting value and the tube current setting value when the self-calibration result indicates that self-calibration is required; A fourth determination module, configured to calculate a change amount based on the filament current characteristic, the tube current characteristic, the tube voltage characteristic, the tube training data set and the self-correction data set, and determine a self-correction change amount; The self-correction module is used to perform self-correction of the filament current based on the self-correction variation and the self-correction mode.

9. A computer device, characterized in that: include: A memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the filament current self-correction method according to any one of claims 1 to 7 by executing the computer instructions.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a computer to execute the filament current self-correction method according to any one of claims 1 to 7.

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