Spectrometer device and system for detecting incident radiation generated by object

Abstract

Spectrometer devices and systems for detecting incident radiation generated by an object. The invention relates to a spectrometer device (100) and a spectrometer system (500) for detecting incident radiation generated by an object (200). The spectrometer device (100) and spectrometer system (500) for detecting incident radiation generated by an object (200) comprise a measurement window (120), a detector array (130), an optical filter (140), and at least one optical element (300), and at least one optical element (300) configured for modifying the field of view (134) of the at least one pixelated sensor (132) by increasing at least one overlap between the fields of view (134) of the at least two pixelated sensors (132), where the at least one optical element (300) comprises a first mirror selected from at least one of: o a first planar mirror (330); or o a first imaging mirror (336), and wherein the at least one optical element (300) comprises a second mirror selected from at least one of: o a second planar mirror (332); or o a second imaging mirror (334). The invention shows the advantage that the spectrometer device (100) and spectrometer system (500) are robust for the granularity of the object (200), in particular by providing sensor signals that can be correlated in a common measurement result, as the overlap of the field of view (134) of the individual pixelated sensor (132) is increased.

Description

Technical Field

[0001] The invention relates to a spectrometer device and a spectrometer system for detecting incident radiation generated by an object. Such a spectrometer device and such a spectrometer system can generally be used for research or monitoring purposes. Background Art

[0002] Optical metrology systems typically enable reliable, rapid, and non-invasive measurements for a wide range of applications including, but not limited to, imaging, microscopy, distance measurement, spectroscopy, astronomy, each of which often has multiple variations and implementations.

[0003] In particular, in diffuse reflectance spectroscopy, apparently granular objects can be measured. Such granular objects are known from agricultural applications and may include, but are not limited to, grain and / or soil. Additionally, such granular objects are known from material sorting applications, which include, but are not limited to, plastic sorting or fabric sorting. However, other kinds of applications are possible as well.

[0004] A spectrometer arrangement using multiple sensors each having a separate field of view may be sensitive to the granularity of an object, in particular when the width of the separate fields of view and the distance between two adjacent fields of view may be in the order of magnitude of the typical structural size and / or the correlation length of the object. In particular, in the case where the separate fields of view of the multiple sensors may be directed to different parts of the object, the sensor signals generated by the separate sensors may be affected by the granularity of the object. It may be desirable that the signals of the separate sensors may have to be combined. As an example, the separate sensors may measure partitions of the spectrum so that only the combination of the separate sensor signals may give the full spectrum. For such measurements, the dependence of the separate sensor signals on the granularity may affect the combination of the separate sensor signals and may even introduce measurement errors.

[0005] US2015 / 0288894 A1 discloses a spectral camera for generating a spectral output. The spectral camera has an objective lens for generating an image, a reflector array, a filter array, and a sensor array at a focal plane, the filter array being used to pass different passbands of the spectrum for different optical channels in the arranged optical channels to project multiple optical channels onto different parts of the same focal plane, and the sensor array being used to simultaneously detect filtered image copies. By using a reflector, there may be less optical degradation, and the tradeoff between cost and optical quality may be better. By projecting the optical channels onto different parts of the same focal plane, a single sensor or a plurality of coplanar sensors may be used to simultaneously detect different optical channels, which facilitates simpler alignment and manufacturing.

[0006] US2002 / 0039186 A1 relates to a spectroscopic analysis system and method for determining physical and chemical properties of a sample by measuring optical characteristics of light emitted from the sample. In one embodiment, a probe head used with a spectrometer includes a reflector for irradiating a sample volume arranged circumferentially around a light source of the probe head. In another embodiment, the probe head includes an optical blocking element for forcing the light path between the light source and an optical pickup optically connected to the spectrometer into the sample. The probe head also includes a reference shutter for selectively blocking light emitted from the sample from reaching the optical pickup to facilitate calibration of the spectrometer.

[0007] US2017292908 A1 discloses a spectrometer system that can be used to determine one or more spectra of an object, and the one or more spectra can be associated with one or more attributes of the object that are relevant to a user. Although the spectrometer system can take many forms, in many cases, the system includes a spectrometer and a processing device that communicates with the spectrometer and a remote server, wherein the spectrometer is physically integrated with the device. The function of the device can be different from that of the spectrometer, such as a consumer appliance or device.

[0008] US 5 729 011 A discloses a spectral device capable of simultaneously generating spectral images corresponding to a plurality of wavelengths and a spectral image recording device capable of recording the generated spectral images, wherein an image generating unit generates a plurality of identical images from a single input image by dividing a pupil of an optical system, a first spectral unit generates a plurality of first spectral images corresponding to the plurality of identical images by extracting predetermined wavelength components respectively corresponding to each of the plurality of identical images, and a second spectral unit generates a plurality of second spectral images corresponding to corresponding first spectral images among the first spectral images corresponding to the plurality of identical images by extracting predetermined wavelength components respectively corresponding to each of the first spectral images.

[0009] CN 114 360 364A discloses a multi-spectral imaging module and a portable display device, and relates to the technical field of imaging spectrum detection instruments. The multi-spectral imaging module includes a main reflector for correcting aberrations, a microlens array, an array optical filter, and a detector arranged in sequence along an optical path. The number of channels of the microlens array corresponds to the number of channels of the array optical filter to form a plurality of imaging channels. The light beam emitted by the main reflector sequentially passes through the microlens array and the array optical filter, so that light of different wavelength bands of the light beam is imaged at corresponding positions of the detector through corresponding imaging channels, and multi-spectral imaging is realized. The microlens array mode is adopted, and a data cube of an object can be obtained by one-time collection.

[0010] Problem to be solved

[0011] It is therefore desirable to provide a spectrometer device and a spectrometer system that at least partially overcome the problems of the prior art. It is further desirable to provide a spectrometer device and a spectrometer system that are robust to the particle size of the object, in particular by providing sensor signals that can be combined into a common measurand, in particular a spectrum. Summary of the invention

[0012] This problem is solved by a spectrometer device and a spectrometer system having the features of the independent claims. Advantageous embodiments are listed in the dependent claims as well as in the entire description, which can be implemented individually or in any arbitrary combination.

[0013] In a first aspect of the invention, a spectrometer device for detecting incident radiation generated by an object is described. The spectrometer device comprises:

[0014] - a measurement window configured to receive incident radiation generated by the object into the spectrometer device;

[0015] a detector array comprising at least two pixelated sensors, each pixelated sensor having a field of view designed to receive at least a portion of the incident radiation, wherein each pixelated sensor is configured to generate at least one detector signal related to the received incident radiation;

[0016] - an optical filter, wherein the optical filter is arranged within the field of view of the at least two pixelated sensors, wherein the optical filter is configured to generate a spectrum of at least two separate wavelength signals from the incident radiation and to transmit the at least two separate wavelength signals to the respective at least one pixelated sensor;

[0017] - at least one optical element configured for modifying the field of view of at least one pixelated sensor by increasing at least one overlap between the fields of view of the at least two pixelated sensors.

[0018] As used herein, the term "spectrometer device" is a broad term and will be given its ordinary and conventional meaning for a person skilled in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, a device capable of recording signal intensities of corresponding wavelengths with respect to a spectrum or a subdivision thereof (such as a wavelength interval), wherein the signal intensities may preferably be provided in the form of a sensor signal, in particular at least one of an electrical signal or an optical signal, which may be used for further evaluation. In a spectrometer device according to the present invention, an optical filter may be used to separate the incident radiation into a spectrum of multiple separated wavelength signals, the respective intensities of which are determined by using a detector array, as described in more detail below.

[0019] As used herein, the term "radiation" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, waves and / or particles that carry energy. The radiation may be electromagnetic radiation. The electromagnetic radiation may be formed by at least one electromagnetic field wave. The electromagnetic radiation may be selected from at least one of the following: radio waves; microwaves; infrared; visible light; ultraviolet light; X-rays; or gamma rays. Specifically, the electromagnetic radiation may be light. Light may be electromagnetic radiation perceptible to the human eye. Visible light may generally be defined as having a wavelength in the range of 380nm to 760nm between infrared and ultraviolet. Infrared light may generally be defined as having a wavelength in the range of more than 760nm to 1mm.

[0020] As used herein, the term "object" is a broad term and will be given its ordinary and conventional meaning for a person of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, any object that may be a living object and / or a non-living object. Thus, as an example, the at least one object may include one or more components and / or one or more parts of a component, wherein the at least one component or at least one part thereof may include at least one component that can provide a spectrum suitable for research. Additionally or alternatively, the object may be or may include one or more organisms and / or one or more parts thereof, such as one or more body parts of a human (e.g., a human) or an animal, in particular a part of a human or animal skin. Additionally or alternatively, the object may be a granular object, in particular wherein the granular object includes at least one of the following: grains; ground seeds; silage; chopped plastic; or food. Thus, the object may be a mixture of separable components. Alternatively or in addition, the object may have an internal structure, in particular wherein the object may be selected from at least one of wood, concrete or sausages.

[0021] The term "measurement window" refers to a contact surface and / or a placement surface for an object to be investigated. Before a process of measuring a spectrum can be started, the object to be investigated can be placed against the measurement window. During the measurement process, the object can remain against the measurement window, in particular until the measurement process can be completed. Thereby, measurement conditions, in particular the distance and / or orientation between the spectrometer device and the object can be defined. The measurement window can allow incident radiation to pass into the spectrometer device, in particular to the optical filter. The measurement window can transmit the incident radiation.

[0022] As used herein, the term "accepting incident radiation" (or any grammatical variation thereof) is a broad term and is to be given its ordinary and customary meaning to one of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, allowing incident radiation to enter the spectrometer device. Thereby, the incident radiation may be transmitted, in particular transmitted, through the measurement window into the spectrometer device.

[0023] As used herein, the term "detector array" is a broad term and will be given its ordinary and conventional meaning for a person skilled in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, a series of optical sensors, which may be preferably arranged as a one-dimensional matrix in a single line along the length of the variable-length filter, or arranged in more than one line, especially two, three or four parallel lines, especially in the form of a two-dimensional matrix, so as to receive as much of the intensity of the incident light as possible. Therefore, the number of pixels N in one direction may be higher than the number of pixels M in the other direction, so that a one-dimensional 1x N matrix or a rectangular two-dimensional Mx N matrix may be obtained, where M<10 and N≥10, preferably N≥20, more preferably N≥50. In addition, the matrices used herein may also be placed in a staggered arrangement. In the present invention, each of the optical sensors as used therein may have the same or similar optical sensitivity within a tolerance level, especially for ease of manufacturing the optical sensor series. Alternatively, each of the optical sensors as used in the optical sensor series may exhibit a varying optical sensitivity that may vary according to the varying transmission characteristics of the variable length filter, such as by providing an increasing or decreasing variation in optical sensitivity with wavelength along the optical sensor series. However, other types of arrangements may also be possible. The detector array may be arranged within a housing of the spectrometer device.

[0024] As used herein, the term "pixelated sensor" is a broad term and will be given its ordinary and conventional meaning for a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, a detector designed to generate at least one of a sensor signal, preferably an electronic signal or an optical signal associated with the intensity of the incident radiation impinging on an individual pixelated sensor. The sensor signal may be an analog signal and / or a digital signal. Accordingly, the electronic signals of adjacent pixelated sensors may be generated simultaneously or in a temporally continuous manner. For example, during a row scan or a line scan, a series of electronic signals corresponding to a series of individual pixel sensors arranged in a straight line may be generated. In addition, these individual pixel sensors may preferably be active pixel sensors, which may be suitable for amplifying the electronic signal before providing it to an external evaluation unit. For this purpose, the pixelated sensor may include one or more signal processing devices, such as one or more filters and / or analog-to-digital converters, for processing and / or preprocessing the electronic signal.

[0025] As used herein, the term "field of view" is a broad term and is to be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, the geometric extent of the observable world that can be observed by the respective sensor. In particular, the field of view of the optical measurement device corresponds to the solid angle at which the respective sensor is sensitive to radiation generated by at least one object or a portion thereof. Radiation that may be generated within the field of view of the respective sensor may be incident on the spectrometer device, may be capable of generating at least one detector signal in at least one of the sensors, and may therefore be detected by this sensor.

[0026] As used herein, the term "optical filter" is a broad term and will be given its ordinary and conventional meaning for those of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, a filter that modifies and / or selects incident radiation depending on at least one indicator (specifically the wavelength, polarization state and / or direction of the incident radiation). The transfer function of the optical filter may depend on the at least one specific indicator. In particular, the propagation direction of the incident radiation transmitted by the optical filter may depend on the at least one indicator, in particular wherein other characteristics of the incident radiation may remain unchanged as much as possible at the same time. The optical filter may generate a spectrum of the incident radiation, in particular by separating the incident radiation into at least two different wavelength signals. The at least two different wavelength signals may be transmitted to different pixelated sensors, whereby these pixelated sensors may detect the corresponding wavelength signals incident on the pixelated sensors and / or may generate corresponding sensor signals. The optical filter may be arranged in the housing of the spectrometer device. As used herein, the term "spectrum" is a broad term and will be given its ordinary and conventional meaning for those of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, partitions of the optical spectral range, in particular partitions of incident radiation. Each partition of the spectrum (in particular, each wavelength signal of the at least two different wavelength signals) may be composed of an optical signal, which may be defined by a signal wavelength and a corresponding signal intensity.

[0027] As used herein, the term "optical element" is a broad term and will be given its ordinary and conventional meaning for a person of ordinary skill in the art and will not be limited to a special or custom meaning. The term may specifically refer to, but is not limited to, an element that affects incident radiation in a manner that affects the propagation direction of at least a portion of the incident radiation. The optical element may affect the direction in a manner that can increase the optical path length between the measurement window and the detector array. Thus, the optical element may affect at least one field of view of at least one sensor. The optical element may be arranged in the housing of the spectrometer device. As used herein, the term "modify" (or any grammatical variation thereof) is a broad term and will be given its ordinary and conventional meaning for a person of ordinary skill in the art and will not be limited to a special or custom meaning. The term may specifically refer to, but is not limited to, adjusting at least one field of view by acting on the incident radiation, particularly by diverting at least a portion of the incident radiation. As used herein, the term "increase at least one overlap between fields of view" (or any grammatical variation thereof) is a broad term and will be given its ordinary and conventional meaning for a person of ordinary skill in the art and will not be limited to a special or custom meaning. The term may specifically refer to, but is not limited to, enlarging the absolute amount and / or ratio of the three-dimensional space covered by the fields of view of the at least two pixelated sensors simultaneously or at the same time, in particular in the three-dimensional space within and / or directly behind the measurement window, wherein the term "behind" refers to the propagation direction of the incident radiation relative to the measurement window. The at least one optical element may be configured to modify the field of view of each of the at least two pixelated sensors for increasing at least one overlap between the fields of view, in particular in the same way.

[0028] Increasing at least one overlap between the fields of view of the at least two pixelated sensors may result in at least one increased overlap region including a measurement spot on the measurement window for each field of view of the at least two pixelated sensors. As used herein, the term "measurement spot" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, a surface on the measurement window generated by the field of view from which the corresponding pixelated sensor can detect radiation.

[0029] The optical filter may be selected from or may include at least one of the following:

[0030] - variable length filter;

[0031] - static filter;

[0032] - Tunable filters, in particular MEMS Fabry-Perot cavities;

[0033] - optical lenses; or

[0034] -Diffractive elements.

[0035] The optical filter may be selected from or may include further components as described below.

[0036] As used herein, the term "length variable filter" is a broad term and will be given its ordinary and conventional meaning for ordinary technicians in the field and is not limited to a special or customized meaning. The term can specifically refer to, but is not limited to, an optical filter including multiple individual filter elements, preferably multiple interference filter elements, which can be in a continuous arrangement. In this article, each filter element can form a bandpass with a variable center wavelength for each spatial position on the filter in a single dimension (the dimension is usually represented by the term "length") preferably continuously along the receiving surface of the length variable filter. The variable center wavelength can be a linear function of the spatial position of each filter element, in which case the length variable filter is usually referred to as a "linear variable filter" or its abbreviation "LVF". However, other types of functions can be applied to the relationship between the variable center wavelength and the spatial position on these individual filter elements. In this article, these individual filter elements can be located on a transparent substrate, which can particularly include at least one material that can show a high level of optical transparency in the infrared (IR) spectral range, especially in the near infrared (NIR) spectral range as described in more detail below, thereby achieving a variable spectral characteristic of the filter along the length of the filter, especially a continuously changing spectral characteristic. In particular, the variable length filter may be a wedge filter which may be adapted to carry at least one responsive coating on a transparent substrate, wherein the responsive coating may exhibit spatially variable properties, in particular spatially variable thickness. However, other kinds of variable length filters which may comprise other materials or may exhibit additional spatially variable properties may also be feasible. At a normal angle of incidence of the incident light beam, each of the filter elements as comprised by the variable length filter may have a bandpass width which may be a fraction of the central wavelength of the particular filter, typically a few percent.

[0037] As used herein, the term "static filter" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, an optical filter, particularly a bandpass filter, that blocks and / or selects light of a predetermined wavelength range, particularly by reflection and / or absorption. The wavelength range may be fixed. The fixed wavelength length may be unchangeable and / or static. The optical properties of a static filter may not be time-varying.

[0038] As used herein, the term "tunable filter" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, an optical filter that blocks and / or selects light of an adjustable wavelength range. The optical properties of a tunable filter may be time-varying. An interferometer may be used as a tunable filter, specifically a Fabry-Perot interferometer, a Mach-Zehnder interferometer and / or a Michelson interferometer. Alternatively, an angle-dependent wavelength shift of a static filter may be utilized. This may be achieved using at least one micro-electromechanical system MEMS, wherein the moving part of the interferometer is implemented using a microactuator.

[0039] As used herein, the term "lens" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, a transparent unit, particularly an article, wherein at least one surface of the object is curved, particularly in a spherical manner. Incident radiation may be refracted at at least one surface of an optical lens, particularly depending on the wavelength of the incident radiation. The incident radiation may be deflected by a converging optical lens to the center of a light beam generated by the incident radiation. Alternatively, the incident radiation may be deflected outwardly from the light beam by a diverging optical lens. The optical lens may have a convex surface for collecting the incident radiation and / or a concave surface for dispersing the incident radiation.

[0040] As used herein, the term "diffractive element" is a broad term and is to be given its ordinary and customary meaning to those of ordinary skill in the art and is not limited to a special or customary meaning. The term may specifically refer to, but is not limited to, an article for shaping incident radiation by diffracting the incident radiation at a grating.

[0041] The variable length filter may include at least two bandpass filters, wherein each bandpass filter may be assigned to a corresponding pixelated sensor by being arranged in the field of view of the corresponding pixelated sensor, wherein each bandpass filter may be configured to select at least one wavelength of the incident radiation received. As used herein, the term "bandpass filter" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, an optical filter that only allows incident radiation with a wavelength within a predefined range to pass. Incident radiation with a wavelength below and / or above the predefined range may be blocked or may be significantly attenuated. The selected at least one wavelength may be within the predefined range. The selected at least one wavelength may be transmitted to the corresponding pixelated sensor. As used herein, the term "assigned to the corresponding pixelated sensor" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, transmitting the received incident radiation to the corresponding pixelated sensor. Thereby, the at least two band pass filters may be arranged in a manner such that each of the at least two band pass filters is placed within the field of view of a different pixelated sensor.

[0042] The ratio between the at least one overlapping area generated by the measurement spots of each field of view of the at least two pixelated sensors and the combined area generated by the measurement spots of each field of view of the at least two pixelated sensors on the measurement window can be at least 60%, 70%, 80% or 90%. As used herein, the term "overlapping area" is a broad term and will be given its ordinary and conventional meaning to those of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, an area on the measurement window generated by the intersection of each measurement spot of the at least two pixelated sensors. The entire overlapping area may include at least a portion of each measurement spot. As used herein, the term "combined area" is a broad term and will be given its ordinary and conventional meaning to those of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, an area on the measurement window generated by the accumulation of each field of view of the at least two pixelated sensors. The combined area includes each measurement spot of the at least two pixelated sensors.

[0043] Each field of view may be conical, in particular wherein each field of view may have a half-width at half maximum FWHM opening angle γ of less than 60°, 40° or 20°. The conical field of view may produce a circular or elliptical measurement spot. Other forms may be possible for the measurement spot and / or the field of view. Exemplarily, the measurement spot produced may be quadratic or rectangular. The opening angle γ may be the inner angle of the vertex at the origin of the field of view.

[0044] Another ratio between the distance between the two main rays of the field of view of at least two adjacent pixelated sensors of the at least two pixelated sensors on the measurement window and the width of the measurement spot of each field of view of the at least two adjacent pixelated sensors can be lower than 35%, 25%, 15%, 10%, 8% or 5%. This is particularly true when the field of view of at least two adjacent pixelated sensors can produce a circular measurement spot (wherein the width of the measurement spot can be the same). As used herein, the term "main ray" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but not limited to, the central axis of the field of view. Alternatively or in addition, the main ray may be the axis of symmetry of the field of view. Alternatively or in addition, the main ray may originate from the origin of the field of view and intersect with the center point of the measurement spot. As used herein, the term "width" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but not limited to, the distance from the center point of the measurement spot to the periphery of the measurement spot. The width can be the diameter of the measurement spot.

[0045] The detectable wavelength range of the incident radiation may be at least one of the following:

[0046] - from 400 nm to 10 μm, in particular from 400 nm to 1 μm;

[0047] - from 900 nm to 3 μm, in particular wherein the at least two pixelated sensors are PbS sensors; or

[0048] - from 600 nm to 5 μm, in particular wherein the at least two pixelated sensors are PbSe sensors.

[0049] As used herein, the term "detectable range" is a broad term and is to be given its ordinary and customary meaning to one of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, a wavelength range of the incident radiation that is capable of generating at least one detector signal when impinging on a pixelated sensor. Incident radiation having a wavelength below the detectable wavelength or above the detectable wavelength range may not be detectable and, thus, may not generate a detector signal when the incident radiation impinges on the pixelated sensor.

[0050] The at least two pixelated sensors can be arranged adjacent to each other on a detector plane, in particular, wherein the detector plane can be a flat plane. As used herein, the term "detector plane" is a broad term and will be given its ordinary and conventional meaning for a person of ordinary skill in the art and is not limited to a special or customized meaning. The term specifically may refer to, but is not limited to, an extended, particularly flat, two-dimensional abstract object or concrete object on which a pixelated sensor is arranged. The detector plane can be formed by the at least two pixelated sensors. In addition to the at least two pixelated sensors, no additional elements may be required to produce the plane. Alternatively or in addition, the detector plane may include at least one additional element. The at least two pixelated sensors can be arranged on the at least one additional element. The at least two pixelated sensors can be arranged in a straight line. Thus, the at least two pixelated sensors can be arranged front and back in a single direction. The measurement window can be parallel to the detector plane.

[0051] The at least two bandpass filters can be arranged on the filter surface. Alternatively or in addition, the at least two bandpass filters can be arranged in a straight line on the filter surface. The filter surface can be curved. As used herein, the term "filter surface" is a broad term and will be given its ordinary and conventional meaning for ordinary technicians in the field and is not limited to special or customized meanings. The term can specifically refer to but is not limited to an extended, particularly curved two-dimensional abstract object or concrete object on which a bandpass filter is arranged. The filter surface can be formed by the at least two bandpass filters. In addition to the at least two bandpass filters, no additional elements may be required to produce the filter surface. Alternatively or in addition, the filter surface can include at least one additional element, in particular, the at least two bandpass filters can be arranged on the at least one additional element. The at least two bandpass filters can be arranged in a straight line. Thus, the at least two pixelated sensors can be arranged front and back in one direction. The measurement window can be parallel to the filter surface. The detector plane can be parallel to the filter surface.

[0052] At least one bandpass filter can be aligned with the corresponding pixelated sensor with respect to the corresponding field of view of the corresponding pixelated sensor, in particular with respect to the main ray of the field of view of the corresponding pixelated sensor. As used herein, the term "aligned" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term can specifically refer to but is not limited to that the at least one bandpass filter is arranged within the field of view, in particular at least one main ray within the field of view intersects the at least one bandpass filter.

[0053] The optical path length between the measurement window and the detector plane may be 50 μm to 30 cm, 100 μm to 50 mm, or 500 μm to 15 mm. As used herein, the term "optical path length" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, the distance that incident radiation propagates within the spectrometer device, particularly taking into account the at least one optical element. The optical path length may be 1 to 5 times longer than the geometric path length.

[0054] Due to the at least one optical element modifying the field of view of at least one pixelated sensor, the field of view of the first pixelated sensor of the at least two pixelated sensors can be tilted relative to the field of view of the second pixelated sensor of the at least two pixelated sensors. By tilting the respective fields of view, the respective chief rays can be tilted, in particular at the measurement window. As used herein, the term "tilted" (or any grammatical variation thereof, in particular the term "tilted") is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, having different orientations. The pixelated sensors may be considered to be tilted when, in particular in the measurement window or directly behind the measurement window, the chief rays of the field of view of the first pixelated sensor point in a different direction than the chief rays of the field of view of the second pixelated sensor. In the case where the chief rays of the field of view of the first pixelated sensor may point in a different direction than the chief rays of the field of view of the second pixelated sensor, the respective chief rays may point in a different direction in the measurement window or directly behind the measurement window.

[0055] The at least one optical element may include at least one aperture for trimming the field of view of the at least one pixelated sensor, in particular and thereby aligning the main ray of the field of view of the at least one pixelated sensor, in particular aligning the main ray towards the center of the at least one overlapping area. As used herein, the term "trim" (or any grammatical variation thereof) is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, modifying something to make it a desired shape. Exemplarily, the field of view may be shrunk and / or narrowed by blocking a portion of the incident radiation, in particular by using an aperture. As used herein, the term "aperture" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, an optical unit configured to limit the cross-section of a beam and / or field of view, in particular the cross-section of a beam generated by the received incident radiation.

[0056] The at least one optical element may comprise at least one further aperture for shaping the field of view of the at least one further pixelated sensor, in particular and thereby aligning a further chief ray of the field of view of the at least one further pixelated sensor, in particular towards the center of the at least one overlapping region. The angle α between the chief ray and the further chief ray at the measurement window may be higher than 0°, 5°, 10°, 20°, 40° or 60°.

[0057] Each bandpass filter may have an acceptance angle, wherein at least one or each bandpass filter may be arranged in such a manner that a corresponding principal ray of the field of view illuminates the corresponding bandpass filter within the acceptance angle. As used herein, the term "acceptance angle" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, a predefined angle at which a principal ray can maximally intersect a bandpass filter to allow the bandpass filter to have optimal performance. In particular, the offset between incident radiation generated by the bandpass filter may be within an acceptable range, particularly when the principal ray intersects the bandpass at an angle less than the acceptance angle. Alternatively or in addition, the offset of the wavelength of incident radiation generated by the bandpass filter may be within an acceptable range, particularly when the principal ray intersects the bandpass at an angle less than the acceptance angle. The central axis of the cone defined by the acceptance angle of the at least one or each bandpass filter may be parallel to the corresponding principal ray intersecting the corresponding optical filter. The receiving surface of each bandpass filter may define a normal orientation, wherein at least one or each bandpass filter may be arranged in such a way that a corresponding principal ray of the field of view impinging on the receiving surface of the corresponding bandpass filter is parallel to the normal orientation. The optical filter may comprise a curved filter surface, in particular wherein the at least two bandpass filters may be arranged on a curved filter surface.

[0058] The at least one optical element may include at least one reflector, in particular a plane reflector or an imaging reflector. As used herein, the term "reflector" is a broad term and will be given its ordinary and conventional meaning for a person of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, an optical unit having a reflective surface, which is used to reflect at least a portion of the radiation irradiated on the reflective surface, in particular at least a portion of the incident radiation. A typical reflector can reflect at least 5% of the radiation incident on the reflector. In addition, typically, the reflector can preferably reflect at least 50%, or more preferably at least 90%, of the radiation incident on the reflector. The reflector may have a type selected from at least one of the following: a dielectric reflector, in particular a distributed Bragg reflector; or a metallized reflector, in particular metallized with gold, silver and / or aluminum. The substrate of the reflector may include at least one inorganic material and / or at least one organic material, in particular plastic and / or glass.

[0059] As used herein, the term "plane reflector" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, a reflector having a plane reflective surface. A plane reflector may reflect incident radiation in such a way that the direction of the reflected incident radiation does not depend on the position on the plane reflector where the incident radiation impinges on the plane reflector. When the incident radiation is reflected by the plane reflector, the width of the light beam produced by the incident radiation may remain constant. The plane reflector may have a flat reflective surface.

[0060] As used herein, the term "imaging reflector" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, a reflector having a reflective surface formed in such a way that the incident radiation and / or the field of view of the at least one pixelated sensor is focused on at least one focal point provided by the imaging reflector. The field of view of the at least one pixelated sensor may be focused at a measurement window. Thereby, the field of view may be narrowed at the measurement window. Thus, the imaging reflector may reflect the incident radiation in such a way that the direction of the reflected incident radiation depends on the position on the imaging reflector where the incident radiation strikes the plane reflector. The imaging reflector may be a concave reflector.

[0061] The imaging mirror may be selected from at least one of the following:

[0062] - curved reflector;

[0063] -Freeform mirrors.

[0064] As used herein, the term "curved reflector" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and will not be limited to a special or custom meaning. The term may specifically refer to, but is not limited to, a reflector having a curved reflective surface. A curved reflector may have a reflective surface that is at least partially curved, specifically a reflective surface that is at least partially concave. As used herein, the term "free-form surface reflector" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and will not be limited to a special or custom meaning. The term may specifically refer to, but is not limited to, a reflector having a surface that can be described using a polynomial function.

[0065] Since the at least one optical element modifies the field of view of the at least one pixelated sensor, the field of view of the at least one pixelated sensor may be folded by increasing the length of the optical path between the detector array and the measurement window. As used herein, the term "folded" (or any grammatical variation thereof, in particular "folded") is a broad term and is to be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, directing incident radiation in such a way that the length of the optical path of the incident radiation propagating from the measurement window to the at least one pixelated sensor (in particular inside the spectrometer device, in particular inside the housing of the spectrometer device) is increased by using an optical element. The length of the optical path may in particular be increased relative to the length of the optical path of the incident radiation propagating from the measurement window to the at least one pixelated sensor in the absence of the optical element. The field of view of the at least one pixelated sensor may be folded by modifying the direction of the chief ray of the corresponding field of view to have a directional component parallel to the detector array, in particular wherein the angle between the detector array and the chief ray direction may be less than 0°, 20°, 40°, 60° or 80°, more particularly wherein the directional component may account for at least 50%, 60%, 70%, 80%, 90% or 100% of the chief ray direction. As used herein, the term "directional component" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, a vector pointing in a direction parallel to the extension of the detector array.

[0066] The at least one optical element can focus the field of view of the at least one pixelated sensor, in particular on the measurement window, more particularly on the at least one overlapping area. Focusing can be produced by modifying the field of view of the at least one pixelated sensor by the at least one optical element. As used herein, the term "focusing" (or any grammatical variation thereof) is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term specifically may refer to but is not limited to narrowing the width of the corresponding field of view. The at least one optical element may include at least one imaging reflector for focusing the corresponding field of view. The imaging reflector may be arranged within the corresponding field of view.

[0067] Since the at least one optical element modifies the field of view of the at least one pixelated sensor, the main light of the field of view of the at least one pixelated sensor can be turned, in particular, toward the main light of the other field of view of the other pixelated sensor of the at least two pixelated sensors, and more particularly toward the center of the at least one overlapping area. As used herein, the term "turn" (or any grammatical variation thereof) is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The term may specifically refer to but is not limited to modifying the direction of the corresponding main light. The at least one optical element may include at least one imaging reflector for turning the corresponding field of view. The imaging reflector may be arranged within the corresponding field of view. Alternatively or in addition, the at least one optical element may include at least one plane reflector for turning the corresponding field of view. The plane reflector may be arranged within the corresponding field of view.

[0068] The at least one optical element comprises a first reflector selected from at least one of the following:

[0069] - a first plane reflector; or

[0070] - a first imaging mirror,

[0071] And wherein the at least one optical element comprises a second reflector, the second reflector being selected from at least one of the following:

[0072] - a second plane reflector; or

[0073] - a second imaging mirror, and

[0074] In particular, the at least one optical element may comprise a further reflector, the further reflector being selected from at least one of the following:

[0075] - an additional flat mirror; or

[0076] - Additional imaging mirrors.

[0077] Thus, the following combinations may be possible: a first plane mirror and a second plane mirror; a first imaging mirror and a second plane mirror; a first plane mirror and a second imaging mirror; a first imaging mirror and a second imaging mirror; a first plane mirror and a second plane mirror and a further plane mirror; a first imaging mirror and a second plane mirror and a further plane mirror; a first plane mirror and a second imaging mirror and a further plane mirror; a first plane mirror and a second imaging mirror and a further plane mirror; a first plane mirror and a second plane mirror and a further imaging mirror; a first imaging mirror and a second plane mirror and a further imaging mirror; a first plane mirror and a second plane mirror and a further imaging mirror; a first plane mirror and a second imaging mirror and a further imaging mirror. Further combinations may also be possible.

[0078] The at least one optical element may include a first plane reflector and a second plane reflector, wherein the first plane reflector may be arranged in front of the second plane reflector in the incident direction of the incident radiation. The arrangement of the first plane reflector and the second plane reflector may increase the at least one overlapping area, which at least one overlapping area includes the measurement spot of each field of view of the at least two pixelated sensors on the measurement window. The arrangement of the first plane reflector and the second plane reflector may fold at least one or each field of view by increasing the optical path length between the detector array and the measurement window. The first plane reflector may reflect the incident radiation toward or onto the second plane reflector, wherein the second plane reflector may reflect the incident radiation toward or onto the optical filter. The reflective surface of the first plane reflector and the reflective surface of the second plane reflector may be parallel.

[0079] The at least one optical element may include a first plane reflector and a second imaging reflector, wherein the first plane reflector may be arranged in front of the second imaging reflector in the direction of incidence of the incident radiation. The arrangement of the first plane reflector and the second imaging reflector may increase the at least one overlapping area, which includes the measurement spot of each field of view of the at least two pixelated sensors on the measurement window. The arrangement of the first plane reflector and the second imaging reflector may fold at least one or each field of view by increasing the corresponding optical path length between the detector array and the measurement window. The first plane reflector may reflect the incident radiation toward or onto the second imaging reflector, wherein the second imaging reflector may reflect the incident radiation toward or onto the optical filter. The second imaging reflector may focus the field of view of the at least two pixelated sensors at the measurement window. Alternatively or in addition, the at least one chief ray of the field of view of the at least two pixelated sensors may be directed by the second imaging reflector towards the center of the at least one overlapping area at the measurement window.

[0080] The at least one optical element may include a first imaging mirror and a second plane mirror, wherein the first imaging mirror may be arranged in front of the second plane mirror in the direction of incidence of the incident radiation. The arrangement of the first imaging mirror and the second plane mirror may increase the at least one overlapping area, the at least one overlapping area including the measurement spot of each field of view of the at least two pixelated sensors on the measurement window. The arrangement of the first imaging mirror and the second plane mirror may fold at least one or each field of view by increasing the optical path length between the detector array and the measurement window. The first imaging mirror may reflect the incident radiation toward or onto the second plane mirror, wherein the second plane mirror may reflect the incident radiation toward or onto the optical filter. The first imaging mirror may focus the field of view of the at least two pixelated sensors at the measurement window. Alternatively or in addition, at least one or each chief ray of the field of view of the at least two pixelated sensors may be directed by the first imaging mirror towards the center of the at least one overlapping area at the measurement window.

[0081] The at least one optical element may include a first imaging mirror and a second imaging mirror, wherein the first imaging mirror may be arranged in front of the second imaging mirror in the direction of incidence of the incident radiation. The arrangement of the first imaging mirror and the second imaging mirror may increase the at least one overlapping area, the at least one overlapping area including the measurement spot of each field of view of the at least two pixelated sensors on the measurement window. The arrangement of the first imaging mirror and the second imaging mirror may fold at least one or each field of view by increasing the optical path length between the detector array and the measurement window. The first imaging mirror may reflect the incident radiation toward or onto the second imaging mirror, wherein the second imaging mirror may reflect the incident radiation toward or onto the optical filter. The first imaging mirror and the second imaging mirror may focus the field of view of the at least two pixelated sensors at the measurement window. Alternatively or in addition, at least one or each chief ray of the field of view of the at least two pixelated sensors may be directed by the first imaging mirror and the second imaging mirror towards the center of the at least one overlapping area at the measurement window.

[0082] The at least one optical element may include an additional imaging mirror. The additional imaging mirror may reflect incident radiation from the second plane mirror towards or onto the optical filter. The first imaging mirror may reflect incident radiation towards or onto the second imaging mirror, wherein the second imaging mirror may reflect incident radiation towards or onto the additional imaging mirror, wherein the additional imaging mirror may reflect incident radiation towards or onto the optical filter. The additional imaging mirror may further focus the field of view of the at least two pixelated sensors at the measurement window. Alternatively or in addition, the at least one or each chief ray of the field of view of the at least two pixelated sensors may be further directed by the additional imaging mirror towards the center of the at least one overlapping area window.

[0083] The at least one optical element may increase the incident radiation optical path length from the measurement window to the detector array by at least 50 μm to 30 cm, 100 μm to 50 mm, or 500 μm to 15 mm. The optical path length between the first reflector and the second reflector may be at least 50 μm to 30 cm, 100 μm to 50 mm, or 500 μm to 15 mm. The optical path length between the second reflector and the further reflector may be at least 50 μm to 30 cm, 100 μm to 50 mm, or 500 μm to 15 mm.

[0084] The detector array may comprise at least two further pixelated sensors, wherein the at least one optical element may be configured to produce at least one further overlap between the fields of view of the at least two further pixelated sensors at the measurement window, in particular, the at least one further overlap region comprises a further measurement spot of each further field of view of the at least two further pixelated sensors. The further overlap region may not intersect with any other overlap region.

[0085] The spectrometer device may include at least one radiation emitting element, wherein the at least one radiation emitting element may be configured to emit optical radiation. The at least one radiation emitting element may be a part of the spectrometer device within the housing. Alternatively or additionally, the at least one radiation emitting element may also be arranged outside the housing, for example, as a separate radiation emitting element. The at least one radiation emitting element may be configured to provide sufficient emission in a desired spectral range.

[0086] The at least one radiation emitting element may in particular be comprised by at least one of a thermal radiator or a semiconductor-based radiation source. In this context, the semiconductor-based radiation source may in particular be selected from at least one of a light emitting diode (LED) or a laser, in particular a laser diode.

[0087] The thermal radiator can be selected from an incandescent lamp or a thermal infrared emitter. As used herein, the term "incandescent lamp" is a broad term and will be given its ordinary and conventional meaning for ordinary technicians in the field and will not be limited to a special or customized meaning. The term can specifically refer to, but is not limited to, an electric lamp with a heatable element (such as a heated filament) that can be heated to a temperature at which it emits light, especially infrared light. Therefore, an incandescent lamp can be regarded as a thermal emitter within the infrared spectrum, and the emission power of an incandescent lamp decreases with increasing wavelength. The thermal radiator can be selected from an incandescent lamp or a thermal infrared emitter. As used herein, the term "thermal infrared emitter" is a broad term and will be given its ordinary and conventional meaning for ordinary technicians in the field and will not be limited to a special or customized meaning. The term can specifically refer to, but is not limited to, a micro-machined thermal emitting device that includes a radiation emitting surface that emits light radiation to be monitored as a radiation emitting element.

[0088] In another aspect of the present invention, a spectrometer system is described. The spectrometer device comprises:

[0089] - a spectrometer device according to any one of the preceding claims for detecting incident radiation generated by an object; and

[0090] - an evaluation device configured to determine information related to the spectrum of the object by evaluating at least one detector signal provided by the spectrometer device.

[0091] As used herein, the term "evaluation device" is a broad term and will be given its ordinary and conventional meaning for a person of ordinary skill in the art and is not limited to a special or custom meaning. The term may specifically refer to, but is not limited to, any device designed to generate at least one desired information, particularly related to the spectrum of an object. For this purpose, the evaluation unit may be or may include one or more integrated circuits (such as one or more application specific integrated circuits (ASICs)) and / or one or more data processing devices (such as one or more of a computer, a digital signal processor (DSP), a field programmable gate array (FPGA)), preferably one or more microcomputers and / or microcontrollers, in particular included by at least one mobile communication device, particularly selected from a smart phone, a tablet computer or a laptop computer; however, other embodiments may also be feasible. Additional components may be included, such as one or more pre-processing devices and / or data acquisition devices, such as one or more devices for receiving and / or pre-processing detector signals, such as one or more AD converters and / or one or more filters. As used herein, the detector signal is provided by a spectrometer device, in particular by a detector array of a spectrometer device. Further, the evaluation unit may include one or more data storage devices. Further, the evaluation unit may include one or more interfaces, such as one or more wireless interfaces and / or one or more wired interfaces.

[0092] Definitions or characteristics given for these further aspects may also apply to the spectrometer system.Typically, this may further apply to any embodiments and any claims presented below.

[0093] The above-described spectrometer device and spectrometer system have considerable advantages over the prior art. Overall, the spectrometer device and the spectrometer system are therefore robust with respect to the granularity of the object, in particular by providing sensor signals that can be correlated in a common measurement result, since the fields of view of the individual pixelated sensors have an increased overlap, in particular at the measurement window, and thus measurements can be made at the same location of the object, whereby the effects of the pixelated sensors on the light signal due to the granularity of the sample each have the same effect.

[0094] Thus, the effect of the granularity of the object may only affect the overall signal level, especially since all channels can look at the same spot of light towards the object. However, this may not affect the spectral contrast of the measured signal. This can be thought of as analogous to color measurement in the visible region, where a color mixture of two components can be brighter or darker without losing the ratio of the two components.

[0095] As used herein, the terms "having", "including" or "comprising" or any arbitrary grammatical variant thereof are used in a non-exclusive manner. Thus, these terms may refer to the absence of additional features in the entity described in this context in addition to the features introduced by these terms, or the presence of one or more additional features. As an example, the expressions "A has B", "A includes B" and "A contains B" may refer to the absence of other elements in A in addition to B (i.e., A consists only and solely of B), or the presence of one or more additional elements in entity A in addition to B (such as element C, elements C and D or even additional elements).

[0096] Further, it should be noted that the terms "at least one", "one or more" or similar expressions indicating that a feature or element may occur once or more than once will typically be used only once when introducing the corresponding feature or element. In this article, in most cases, when referring to the corresponding feature or element, the expression "at least one" or "one or more" is not repeated, but in fact, the corresponding feature or element may occur once or more than once.

[0097] Further, as used herein, the terms "preferably", "more preferably", "particularly", "more particularly", "specifically", "more specifically" or similar terms are used in conjunction with optional features without limiting the possibilities of alternatives. Therefore, the features introduced by these terms are optional features and are not intended to limit the scope of the claims in any way. As the skilled person will recognize, the present invention can be implemented by using alternative features. Similarly, the features introduced by "in an embodiment of the present invention" or similar expressions are intended to be optional features, without any limitation on alternative embodiments of the present invention, without any limitation on the scope of the present invention, and without any limitation on the possibility of combining the features introduced in this manner with other optional or non-optional features of the present invention.

[0098] Summarizing and without excluding further possible embodiments, the following embodiments may be envisaged:

[0099] Embodiment 1: A spectrometer device for detecting incident radiation generated by an object, the spectrometer device comprising:

[0100] - a measurement window configured to receive incident radiation generated by the object into the spectrometer device;

[0101] a detector array comprising at least two pixelated sensors, each pixelated sensor having a field of view designed to receive at least a portion of the incident radiation, wherein each pixelated sensor is configured to generate at least one detector signal related to the received incident radiation;

[0102] - an optical filter, wherein the optical filter is arranged within the field of view of the at least two pixelated sensors, wherein the optical filter is configured to generate a spectrum of at least two separate wavelength signals from the incident radiation and to transmit the at least two separate wavelength signals to the respective at least one pixelated sensor;

[0103] - at least one optical element configured for modifying the field of view of at least one pixelated sensor by increasing at least one overlap between the fields of view of the at least two pixelated sensors.

[0104] Embodiment 2: A spectrometer device according to the previous embodiment, wherein increasing at least one overlap between the fields of view of the at least two pixelated sensors results in at least one increased overlap area, and the overlap area includes a measurement spot of each field of view of the at least two pixelated sensors on the measurement window.

[0105] Embodiment 3: The spectrometer device according to any one of the preceding embodiments, wherein the optical filter is selected from or includes at least one of the following:

[0106] - variable length filter;

[0107] - static filter;

[0108] - Tunable filters, in particular MEMS Fabry-Perot cavities;

[0109] - optical lenses; or

[0110] -Diffractive elements.

[0111] Embodiment 4: A spectrometer device according to the previous embodiment, wherein the variable-length filter comprises at least two bandpass filters, wherein each bandpass filter is assigned to the corresponding pixelated sensor by being arranged within the field of view of the corresponding pixelated sensor, wherein each bandpass filter is configured to select at least one wavelength of the received incident radiation.

[0112] Embodiment 5: The spectrometer device according to any one of the preceding embodiments, wherein the at least one optical element is configured to modify the field of view of each of the at least two pixelated sensors for increasing at least one overlap between these fields of view.

[0113] Embodiment 6: A spectrometer device according to any one of the preceding four embodiments, wherein a ratio between the at least one overlapping area generated by the measurement spot of each field of view of the at least two pixelated sensors and a combined area generated by the measurement spot of each field of view of the at least two pixelated sensors on the measurement window is at least 60%, 70%, 80% or 90%.

[0114] Embodiment 7: The spectrometer device according to any one of the preceding embodiments, wherein each field of view is conical, in particular wherein each field of view has a full width at half maximum (FWHM) opening angle γ of less than 60°, 40° or 20°.

[0115] Embodiment 8: A spectrometer device according to any one of the preceding embodiments, wherein another ratio between the distance between two main light rays of the field of view of at least two adjacent pixelated sensors among the at least two pixelated sensors on the measurement window and the width of the measurement spot of each field of view of the at least two adjacent pixelated sensors is less than 35%, 25%, 15%, 10%, 8% or 5%.

[0116] Embodiment 9: The spectrometer device according to any one of the preceding embodiments, wherein the detectable wavelength range of the incident radiation is at least one of the following:

[0117] - from 400 nm to 10 μm, in particular from 400 nm to 1 μm;

[0118] - from 900 nm to 3 μm, in particular wherein the at least two pixelated sensors are PbS sensors; or

[0119] - from 600 nm to 5 μm, in particular wherein the at least two pixelated sensors are PbSe sensors.

[0120] Embodiment 10: The spectrometer device according to any of the preceding embodiments, wherein the at least two pixelated sensors are arranged adjacent to each other on a detector plane, in particular wherein the detector plane is a flat plane.

[0121] Embodiment 11: The spectrometer device according to any one of the preceding embodiments, wherein the at least two pixelated sensors are arranged in a straight line.

[0122] Embodiment 12: The spectrometer device according to any one of the preceding eight embodiments, wherein the at least two bandpass filters are arranged on a filter surface, in particular, wherein the filter surface is curved.

[0123] Embodiment 13: The spectrometer device according to the previous embodiment, wherein the at least two bandpass filters are arranged in a straight line.

[0124] Embodiment 14: The spectrometer device according to any one of the preceding ten embodiments, wherein each bandpass filter is aligned with the corresponding pixelated sensor with respect to the corresponding field of view of the corresponding pixelated sensor, in particular with respect to the main ray of the field of view of the corresponding pixelated sensor.

[0125] Embodiment 15: The spectrometer device according to any one of the preceding three embodiments, wherein the measurement window is parallel to the filter surface.

[0126] Embodiment 16: The spectrometer device according to any one of the preceding six embodiments, wherein the measurement window is parallel to the detector plane.

[0127] Embodiment 17: The spectrometer device according to any one of the preceding seven embodiments, wherein the optical path length between the measurement window and the detector plane is 50 μm to 30 cm, 100 μm to 50 mm, or 500 μm to 15 mm.

[0128] Embodiment 18: A spectrometer device according to any one of the preceding embodiments, wherein, due to the at least one optical element modifying the field of view of the at least one pixelated sensor, the field of view of the first pixelated sensor among the at least two pixelated sensors is tilted relative to the field of view of the second pixelated sensor among the at least two pixelated sensors.

[0129] Embodiment 19: A spectrometer device according to any one of the preceding embodiments, wherein the at least one optical element comprises at least one aperture, which is used to trim the field of view of at least one pixelated sensor, in particular and thereby align the main light of the field of view of at least one pixelated sensor, in particular toward the center of the at least one overlapping area.

[0130] Embodiment 20: A spectrometer device according to the two preceding embodiments, wherein the angle α between the principal ray and the further principal ray at the measurement window is greater than 0°, 5°, 10°, 20°, 40° or 60°, in particular because the field of view of the first pixelated sensor having the principal ray is tilted relative to the field of view of the second pixelated sensor having the further principal ray.

[0131] Embodiment 21: A spectrometer device according to any one of the preceding embodiments, wherein each bandpass filter has an acceptance angle, wherein at least one or each bandpass filter is arranged in such a way that a corresponding principal ray of the field of view illuminates the corresponding bandpass filter within the acceptance angle.

[0132] Embodiment 22: A spectrometer device according to any one of the preceding embodiments, wherein the receiving surface of each bandpass filter defines a normal orientation, wherein at least one or each bandpass filter is arranged in such a way that the corresponding principal light ray of the field of view impinging on the receiving surface of the corresponding bandpass filter is parallel to the normal orientation.

[0133] Embodiment 23: The spectrometer device according to any one of the preceding embodiments, wherein the optical filter comprises a curved filter surface, in particular wherein the at least two bandpass filters are arranged on the curved filter surface.

[0134] Embodiment 24: The spectrometer device according to any one of the preceding embodiments, wherein the at least one optical element comprises at least one reflector, in particular a plane reflector or an imaging reflector.

[0135] Embodiment 25: The spectrometer device according to the previous embodiment, wherein the imaging reflector is selected from at least one of the following:

[0136] - curved reflector;

[0137] -Freeform mirrors.

[0138] Embodiment 26: A spectrometer device according to any one of the preceding embodiments, wherein, since the at least one optical element modifies the field of view of the at least one pixelated sensor, the field of view of the at least one pixelated sensor is folded by increasing the optical path length between the detector array and the measurement window.

[0139] Embodiment 27: A spectrometer device according to the preceding embodiments, wherein the field of view of the at least one pixelated sensor is folded by modifying the direction of the main light of the corresponding field of view to have a directional component parallel to the detector array, in particular wherein the angle between the detector array and the direction of the main light is less than 0°, 20°, 40°, 60° or 80°, more particularly wherein the directional component accounts for at least 50%, 60%, 70%, 80%, 90% or 100% of the direction of the main light.

[0140] Embodiment 28: The spectrometer device according to any one of the preceding embodiments, wherein the optical element comprises a mirror, in particular an imaging mirror.

[0141] Embodiment 29: A spectrometer device according to any one of the preceding embodiments, wherein, since the at least one optical element modifies the field of view of the at least one pixelated sensor, the field of view of the at least one pixelated sensor is focused, particularly on the measurement window, and more particularly on the at least one overlapping area.

[0142] Embodiment 30: A spectrometer device according to any one of the preceding embodiments, wherein, because the at least one optical element modifies the field of view of the at least one pixelated sensor, the main light of the field of view of the at least one pixelated sensor is deflected, in particular, the main light of the other field of view of at least one other pixelated sensor of the at least two pixelated sensors is deflected toward the center of the at least one overlapping area.

[0143] Embodiment 31: A spectrometer device according to any one of the preceding seven embodiments, wherein the plane reflector has a flat reflective surface.

[0144] Embodiment 32: The spectrometer device according to any one of the preceding eight embodiments, wherein the imaging reflector has a reflective surface that is at least partially curved, specifically at least partially concave.

[0145] Embodiment 33: The spectrometer device according to any one of the preceding embodiments, wherein the at least one optical element comprises a first reflector, the first reflector being specifically selected from at least one of the following:

[0146] - a first plane reflector; or

[0147] - a first imaging mirror,

[0148] And wherein the at least one optical element comprises a second reflector, the second reflector being in particular selected from at least one of the following:

[0149] - a second plane reflector; or

[0150] - a second imaging mirror, and

[0151] In particular, wherein the at least one optical element comprises a further reflector, the further reflector being in particular selected from at least one of the following:

[0152] - an additional flat mirror; or

[0153] - Additional imaging mirrors.

[0154] Embodiment 34: The spectrometer device according to any one of the preceding embodiments, wherein the at least one optical element comprises a first plane mirror and a second plane mirror, wherein the first plane mirror is arranged in front of the second plane mirror in the incident direction of the incident radiation.

[0155] Embodiment 35: The spectrometer device according to the previous embodiment, wherein the arrangement of the first plane mirror and the second plane mirror increases the at least one overlapping area, and the at least one overlapping area includes the measurement spot of each field of view of the at least two pixelated sensors on the measurement window.

[0156] Embodiment 36: The spectrometer device according to any one of the two preceding embodiments, wherein the arrangement of the first plane mirror and the second plane mirror folds at least one or each field of view by increasing the optical path length between the detector array and the measurement window.

[0157] Embodiment 37: A spectrometer device according to any one of the three preceding embodiments, wherein the first plane mirror reflects the incident radiation toward or onto the second plane mirror, and wherein the second plane mirror reflects the incident radiation toward or onto the optical filter.

[0158] Embodiment 38: The spectrometer device according to any one of the preceding four embodiments, wherein the reflective surface of the first plane reflector and the reflective surface of the second plane reflector are parallel.

[0159] Embodiment 39: A spectrometer device according to any one of the preceding embodiments, wherein the at least one optical element comprises a first plane reflector and a second imaging reflector, wherein the first plane reflector is arranged in front of the second imaging reflector in the incident direction of the incident radiation.

[0160] Embodiment 40: The spectrometer device according to the previous embodiment, wherein the arrangement of the first plane reflector and the second imaging reflector increases the at least one overlapping area, and the at least one overlapping area includes the measurement spot of each field of view of the at least two pixelated sensors on the measurement window.

[0161] Embodiment 41: The spectrometer device according to any one of the two preceding embodiments, wherein the arrangement of the first plane reflector and the second imaging reflector folds at least one or each field of view by increasing the optical path length between the detector array and the measurement window.

[0162] Embodiment 42: A spectrometer device according to any one of the three preceding embodiments, wherein the first plane mirror reflects the incident radiation toward or onto the second imaging mirror, and wherein the second imaging mirror reflects the incident radiation toward or onto the optical filter.

[0163] Embodiment 43: The spectrometer device according to any one of the preceding four embodiments, wherein a second imaging mirror focuses the field of view of the at least two pixelated sensors at the measurement window.

[0164] Embodiment 44: The spectrometer device according to the previous embodiment, wherein the at least one optical element comprises a first imaging mirror and a second plane mirror, wherein the first imaging mirror is arranged in front of the second plane mirror in the incident direction of the incident radiation.

[0165] Embodiment 45: The spectrometer device according to the previous embodiment, wherein the arrangement of the first imaging reflector and the second plane reflector increases the at least one overlapping area, and the at least one overlapping area includes the measurement spot of each field of view of the at least two pixelated sensors on the measurement window.

[0166] Embodiment 46: The spectrometer device according to any one of the two preceding embodiments, wherein the arrangement of the first imaging reflector and the second plane reflector folds at least one or each field of view by increasing the optical path length between the detector array and the measurement window.

[0167] Embodiment 47: According to any one of the three preceding embodiments, the spectrometer device, wherein the first imaging reflector reflects the incident radiation toward or onto the second plane reflector, and wherein the second plane reflector reflects the incident radiation toward or onto the optical filter.

[0168] Embodiment 48: The spectrometer device according to any one of the preceding four embodiments, wherein the first imaging reflector focuses the field of view of the at least two pixelated sensors at the measurement window.

[0169] Embodiment 49: A spectrometer device according to any one of the preceding embodiments, wherein the at least one optical element comprises a first imaging reflector and a second imaging reflector, wherein the first imaging reflector is arranged in front of the second imaging reflector in the incident direction of the incident radiation.

[0170] Embodiment 50: The spectrometer device according to the previous embodiment, wherein the arrangement of the first imaging reflector and the second imaging reflector increases the at least one overlapping area, and the at least one overlapping area includes the measurement spot of each field of view of the at least two pixelated sensors on the measurement window.

[0171] Embodiment 51: The spectrometer device according to any one of the two preceding embodiments, wherein the arrangement of the first imaging reflector and the second imaging reflector folds at least one or each field of view by increasing the optical path length between the detector array and the measurement window.

[0172] Embodiment 52: A spectrometer device according to any one of the three preceding embodiments, wherein the first imaging reflector reflects the incident radiation toward or onto the second imaging reflector, and wherein the second imaging reflector reflects the incident radiation toward or onto the optical filter.

[0173] Embodiment 53: The spectrometer device according to any one of the preceding four embodiments, wherein the first imaging reflector and the second focus focus the field of view of the at least two pixelated sensors at the measurement window.

[0174] Embodiment 55: The spectrometer device according to any one of the preceding five embodiments, wherein the at least one optical element comprises an additional imaging mirror.

[0175] Embodiment 56: The spectrometer device according to the preceding embodiment, wherein the further imaging mirror reflects incident radiation from the second plane mirror towards or onto the optical filter.

[0176] Embodiment 57: A spectrometer device according to any one of the two preceding embodiments, wherein the first imaging reflector reflects the incident radiation toward or onto the second imaging reflector, wherein the second imaging reflector reflects the incident radiation toward or onto the other imaging reflector, wherein the other imaging reflector reflects the incident radiation toward or onto the optical filter.

[0177] Embodiment 58: The spectrometer device according to any one of the three preceding embodiments, wherein an additional imaging mirror further focuses the field of view of the at least two pixelated sensors at the measurement window.

[0178] Embodiment 59: The spectrometer device according to any one of the preceding embodiments, wherein the at least one optical element increases the optical path length of the incident radiation from the measurement window to the detector array by at least 50 μm to 30 cm, 100 μm to 50 mm, or 500 μm to 15 mm.

[0179] Embodiment 60: A spectrometer device according to any one of the preceding twenty-seven embodiments, wherein the optical path length between the first reflector and the second reflector is at least 50 μm to 30 cm, 100 μm to 50 mm, or 500 μm to 15 mm.

[0180] Embodiment 61: The spectrometer device according to any one of the preceding twenty-eight embodiments, wherein the optical path length between the second reflector and the additional reflector is at least 50 μm to 30 cm, 100 μm to 50 mm, or 500 μm to 15 mm.

[0181] Embodiment 62: A spectrometer device according to the preceding embodiment, wherein the detector array comprises at least two additional pixelated sensors, wherein the at least one optical element is configured to produce at least one additional overlap between the fields of view of the at least two additional pixelated sensors at the measurement window, in particular, the at least one additional overlap region comprises an additional measurement spot for each additional field of view of the at least two additional pixelated sensors.

[0182] Embodiment 63: The spectrometer device according to any one of the preceding embodiments, wherein the spectrometer device comprises at least one radiation emitting element, wherein the at least one radiation emitting element is configured to emit optical radiation.

[0183] Embodiment 64: The spectrometer device according to the preceding embodiment, wherein the at least one radiation emitting element is comprised by at least one of a thermal radiator or a semiconductor-based radiation source.

[0184] Embodiment 65: The spectrometer device according to the previous embodiment, wherein the thermal radiator is selected from an incandescent lamp or a thermal infrared emitter.

[0185] Embodiment 66: A spectrometer system, comprising:

[0186] - a spectrometer arrangement according to any of the preceding embodiments for detecting incident radiation generated by an object; and

[0187] - an evaluation device configured to determine information related to the spectrum of the object by evaluating at least one detector signal provided by the spectrometer device. BRIEF DESCRIPTION OF THE DRAWINGS

[0188] Other optional features and embodiments will be disclosed in more detail in the subsequent description of the embodiments, preferably in conjunction with the dependent claims. Wherein, as the skilled person will recognize, the corresponding optional features can be implemented in an independent manner and in any arbitrary feasible combination. The scope of the present invention is not limited by the preferred embodiments. The embodiments are schematically depicted in the accompanying drawings. Wherein, the same reference numerals in these drawings represent the same or functionally equivalent elements.

[0189] In the attached picture:

[0190] Figure 1 A first spectrometer arrangement without optical elements is shown exemplarily; and

[0191] Figure 2 A second spectrometer device having optical elements, in particular two apertures, is shown by way of example; and

[0192] Figure 3 A third spectrometer device having an optical element, in particular a plane mirror, is shown by way of example; and

[0193] Figure 4 A fourth spectrometer device having optical elements, in particular two plane mirrors, is shown by way of example; and

[0194] Figure 5 A fifth spectrometer device having optical elements, in particular a plane mirror and an imaging mirror, is shown by way of example; and

[0195] Figure 6 A sixth spectrometer device is shown by way of example with optical elements, in particular a plane mirror and an imaging mirror in another arrangement; and

[0196] Figure 7 A seventh spectrometer arrangement is shown by way of example with optical elements, in particular three imaging mirrors. DETAILED DESCRIPTION

[0197] according to Figure 1 The spectrometer device 100 for detecting incident radiation generated by the object 200 comprises a measurement window 120 configured to receive incident radiation generated by the object 200 into a housing 110 of the spectrometer device 100 .

[0198] The detectable wavelength range of the incident radiation can be in the range from 400nm to 10μm, in particular from 400nm to 1μm, and / or from 900nm to 3μm (particularly wherein the at least two pixelated sensors 132 may be PbS sensors), and / or in the range from 600nm to 5μm (particularly wherein the at least two pixelated sensors 132 may be PbSe sensors).

[0199] The spectrometer device 100 further comprises a detector array 130 comprising at least two pixelated sensors 132, each pixelated sensor having a field of view 134 designed to receive at least a portion of incident radiation, wherein each pixelated sensor 132 is configured to generate at least one detector signal related to the received incident radiation.

[0200] Typically, each field of view 134 may be conical, in particular wherein each field of view 134 may have a half-width at half maximum FWHM opening angle γ of less than 60°, 40° or 20°. At least one optical element 300 may be configured to modify the field of view 134 of each pixelated sensor 132 so as to increase at least one overlap between the fields of view 134, such as Figures 2 to 7 As shown in the example.

[0201] The spectrometer device 100 further comprises an optical filter 140, wherein the optical filter is arranged within the field of view 134 of the at least two pixelated sensors 132, wherein the optical filter 140 is configured to generate a spectrum of at least two separated wavelength signals from the incident radiation and transmit the at least two separated wavelength signals to the corresponding at least one pixelated sensor 132. The measurement window 120 may be parallel to a filter surface including the at least two pixelated sensors 132.

[0202] Each field of view 134 may be sensitive to granularity of the object 200 that may be generated by components 210 of the object 200, since the width a of the field of view 134 and the distance s between two adjacent fields of view 134 are in the order of magnitude of a typical structure size g of components 210 of the object 200. In particular, in case the fields of view 134 are directed toward different parts of the object 200, the sensor signal generated by the pixelated sensor 132 may be affected by the granularity of the object 200.

[0203] Typically, the spectrometer device 100 may include at least one radiation emitting element 600. The at least one radiation emitting element 600 may be configured to emit optical radiation. The at least one radiation emitting element 600 may be comprised of a thermal radiator and / or a semiconductor-based radiation source. The thermal radiator may be an incandescent lamp and / or a thermal infrared emitter.

[0204] Further typically, the evaluation device 400 may be configured for determining information related to the spectrum of the object 200 by evaluating at least one detector signal provided by the spectrometer device 100. The evaluation device 400 and the spectrometer device 100 may be comprised by a spectrometer system 500.

[0205] according to Figure 2 , the spectrometer device 100 for detecting incident radiation generated by the object 200 further comprises at least one optical element 300, which is configured to modify the field of view 134 of at least one pixelated sensor 132 by increasing at least one overlap between the fields of view 134 of the at least two pixelated sensors 132. Thereby, the at least one overlap between the fields of view 134 of the at least two pixelated sensors 132 can obtain at least one increased overlap area 136, which includes the measurement spot of each field of view 134 of the at least two pixelated sensors 132 on the measurement window 120.

[0206] Further, a ratio between the at least one overlapping area 136 generated by the measurement spots of each field of view 134 of the at least two pixelated sensors 132 and a combined area 138 generated by the measurement spots of each field of view 134 of the at least two pixelated sensors 132 on the measurement window 120 may be at least 60%, 70%, 80% or 90%. Another ratio between a distance between two chief rays 135 of the fields of view 134 of at least two adjacent pixelated sensors 132 on the measurement window 120 and a width a of the measurement spots of each field of view 134 of the at least two adjacent pixelated sensors 132 may be lower than 35%, 25%, 15%, 10%, 8% or 5%.

[0207] The at least one optical element 300 may be or may include at least one aperture 310 for shaping the field of view 134 of the at least one pixelated sensor 132, such as Figure 2 As exemplarily depicted in FIG. 1 , a chief ray 135 of the field of view 134 of the at least one pixelated sensor 132 can thereby be aligned, in particular towards the center of the overlap region 136. The at least one optical element 300 can include at least one further aperture 320 for shaping the field of view 134 of the at least one further pixelated sensor 132, in particular and thereby aligning a further chief ray 135 of the field of view 134 of the at least one further pixelated sensor 132, in particular towards the center of the overlap region 136, as Figure 2 The angle α between the chief ray and the further chief ray 135 at the measuring window 120 can be higher than 0°, 5°, 10°, 20°, 40° or 60°.

[0208] The optical filter 140 may be selected from or may include a variable length filter and / or a static filter and / or a tunable filter (particularly a MEMS Fabry-Perot resonant cavity) and / or an optical lens and / or a diffractive element. The variable length filter may include at least two band pass filters 142, wherein each band pass filter 142 may be assigned to a respective pixelated sensor 132 by being arranged within the field of view 134 of the respective pixelated sensor 132. Each band pass filter 142 may be configured to select at least one wavelength or wavelength range of the received incident radiation.

[0209] The at least two pixelated sensors 132 may be arranged adjacent to each other on a detector plane, in particular wherein the detector plane may be a flat plane. The at least two pixelated sensors 132 may be arranged in a straight line. The at least two bandpass filters 142 may be arranged on a filter surface, in particular wherein the filter surface is curved. The at least two bandpass filters 142 may be arranged in a straight line. Each bandpass filter 142 may be aligned with the respective pixelated sensor 132 with respect to the respective field of view 134 of the respective pixelated sensor 132, in particular with respect to the chief ray 135 of the field of view 134 of the respective pixelated sensor 132.

[0210] Each bandpass filter 142 may have an acceptance angle, wherein at least one or each bandpass filter 142 may be arranged in such a way that a corresponding chief ray 135 of the field of view 134 strikes the corresponding bandpass filter 142 within the acceptance angle. A receiving surface of each bandpass filter 142 may define a normal orientation, wherein at least one or each bandpass filter 142 may be arranged in such a way that a corresponding chief ray 135 of the field of view 134 striking the receiving surface of the corresponding bandpass filter 142 is parallel to the normal orientation. The optical filter 140 may include a curved filter surface, in particular wherein the at least two bandpass filters 142 may be arranged on a curved filter surface.

[0211] The measurement window 120 may be parallel to the detector plane.The optical path length between the measurement window 120 and the detector plane may be between 50 μm and 30 cm or between 100 μm and 50 mm or between 500 μm and 15 mm.

[0212] Alternatively or additionally, the at least one optical element 300 may include a plane mirror.The plane mirror may have a flat reflective surface. Figure 3, a spectrometer device 100 comprising only plane mirrors is depicted. Alternatively or additionally, the at least one optical element 300 may in particular comprise only imaging mirrors. The imaging mirror may be a curved mirror and / or a freeform mirror. The imaging mirror may have an at least partially curved reflecting surface, in particular an at least partially concave reflecting surface. The imaging mirror may focus the field of view 134 of the at least two pixelated sensors 132 at the measurement window 120. In particular, by using plane mirrors and / or curved mirrors, the at least one optical element 300 may fold the at least one field of view 134 or each field of view 134 by increasing the respective optical path length between the detector array 130 and the measurement window 120.

[0213] At least one field of view 134 or each field of view 134 can be folded by modifying the direction of the main light 135 of the corresponding field of view 134 to have a directional component parallel to the detector array 130, in particular wherein the angle between the detector array and the direction of the main light is less than 0°, 20°, 40°, 60° or 80°, more particularly wherein the directional component accounts for at least 50%, 60%, 70%, 80%, 90% or 100% of the direction of the main light ray 135.

[0214] Typically, the at least one optical element 300 may include a first mirror, in particular a first plane mirror 330 or a first imaging mirror 336, and the at least one optical element 300 may include a second mirror, in particular a second plane mirror 332 or a second imaging mirror 334. In addition, the at least one optical element 300 may include a further mirror, in particular a further plane mirror or a further imaging mirror 338.

[0215] Alternatively or additionally, such as Figure 4 As exemplarily shown in FIG. 1 , the at least one optical element 300 may include a first plane mirror 330 and a second plane mirror 332, wherein the first plane mirror 330 may be arranged in front of the second plane mirror 332 in the incident direction of the incident radiation. The arrangement of the first plane mirror 330 and the second plane mirror 332 may increase the at least one overlapping area 136, which includes the measurement spot of each field of view 134 of the at least two pixelated sensors 132 on the measurement window 120. The arrangement of the first plane mirror 330 and the second plane mirror 332 may fold at least one or each field of view 134 by increasing the corresponding optical path length between the detector array 130 and the measurement window 120.

[0216] The first plane reflector 330 can reflect incident radiation toward or onto the second plane reflector 332, wherein the second plane reflector 332 can reflect incident radiation toward or onto the optical filter 140. The reflective surface of the first plane reflector 330 and the reflective surface of the second plane reflector 332 can be parallel.

[0217] Alternatively or additionally, such as Figure 5 As exemplarily shown in FIG. 1 , the at least one optical element 300 may include a first plane reflector 330 and a second imaging reflector 334, wherein the first plane reflector 330 may be arranged in front of the second imaging reflector 334 in the incident direction of the incident radiation. The arrangement of the first plane reflector 330 and the second imaging reflector 334 may increase the at least one overlapping area 136, which includes the measurement spot of each field of view 134 of the at least two pixelated sensors 132 on the measurement window 120.

[0218] The arrangement of the first plane mirror 330 and the second imaging mirror 334 may fold at least one or each field of view 134 by increasing the respective optical path length between the detector array 130 and the measurement window 120. The first plane mirror 330 may reflect incident radiation towards or onto the second imaging mirror 334, wherein the second imaging mirror 334 may reflect incident radiation towards or onto the optical filter 140. The second focusing 334 mirror may focus the field of view 134 of the at least one pixelated sensor 132 at the measurement window 120. Alternatively or additionally, the chief light 135 of the field of view 134 of the at least two pixelated sensors 132 may be directed by the second imaging mirror 334 towards the center of the at least one overlapping region 136 at the measurement window 120.

[0219] Alternatively or additionally, such as Figure 6 As exemplarily shown in FIG. 1 , the at least one optical element 300 may include a first imaging mirror 336 and a second plane mirror 332, wherein the first imaging mirror 336 may be arranged in front of the second plane mirror 332 in the incident direction of the incident radiation. The arrangement of the first imaging mirror 336 and the second plane mirror 332 may increase the at least one overlapping area 136, which includes the measurement spot of each field of view 134 of the at least two pixelated sensors 132 on the measurement window 120.

[0220] The arrangement of the first imaging mirror 336 and the second plane mirror 332 may fold at least one or each field of view 134 by increasing the respective optical path length between the detector array 130 and the measurement window 120. The first imaging mirror 336 may reflect incident radiation toward or onto the second plane mirror 332, wherein the second plane mirror 332 may reflect incident radiation toward or onto the optical filter 140. The first imaging mirror 336 may focus the field of view 134 of the at least one pixelated sensor 132 at the measurement window 120. Alternatively or additionally, the chief light 135 of the field of view 134 of the at least two pixelated sensors 132 may be directed by the first imaging mirror 336 towards the center of the at least one overlapping region 136 at the measurement window 120.

[0221] Alternatively or additionally, such as Figure 7 As exemplarily shown in FIG. 1 , the at least one optical element 300 may include a first imaging mirror 336 and a second imaging mirror 334, wherein the first imaging mirror 336 may be arranged in front of the second imaging mirror 334 in the incident direction of the incident radiation. The arrangement of the first imaging mirror 336 and the second imaging mirror 334 may increase the at least one overlapping area 136, which includes the measurement spot of each field of view 134 of the at least two pixelated sensors 132 on the measurement window 120.

[0222] The arrangement of the first imaging mirror 336 and the second imaging mirror 334 may fold at least one or each field of view 134 by increasing the respective optical path length between the detector array 130 and the measurement window 120. The first imaging mirror 336 may reflect incident radiation toward or onto the second imaging mirror 334, wherein the second imaging mirror 334 may reflect incident radiation toward or onto the optical filter 140. The first imaging mirror 336 and the second imaging mirror 334 may focus the field of view 134 of the at least two pixelated sensors 132 at the measurement window 120. Alternatively or in addition, the chief light rays 135 of the field of view 134 of the at least two pixelated sensors 132 may be directed toward each other at the measurement window 120 by the first imaging mirror 336 and the second imaging mirror 334.

[0223] Alternatively, if Figure 7As depicted, the at least one optical element 300 may include an additional imaging mirror 338. The additional imaging mirror 338 may reflect incident radiation from the second imaging mirror 334 toward or onto the optical filter 140. The first imaging mirror 336 may reflect incident radiation toward or onto the second imaging mirror 334, wherein the second imaging mirror 334 may reflect incident radiation toward or onto the additional imaging mirror 338, wherein the additional imaging mirror 338 may reflect incident radiation toward or onto the optical filter 140. The additional imaging mirror 338 may further focus the field of view 134 of the at least one pixelated sensor 132 at the measurement window 120. Alternatively or additionally, the chief rays 135 of the field of view 134 of the at least two pixelated sensors 132 may be further directed toward each other at the measurement window 120 by the additional imaging mirror 338. Alternatively, the further reflector may be a further plane reflector.

[0224] Typically, the at least one optical element 300 may increase the incident radiation optical path length from the measurement window 120 to the detector array 130 by at least 50 μm to 30 cm, 100 μm to 50 mm, or 500 μm to 15 mm. The optical path length between the first reflector and the second reflector may be at least 50 μm to 30 cm, 100 μm to 50 mm, or 500 μm to 15 mm. The optical path length between the second reflector and the further reflector may be at least 50 μm to 30 cm, 100 μm to 50 mm, or 500 μm to 15 mm.

[0225] Typically, the detector array 130 may include at least two additional pixelated sensors 132, wherein the at least one optical element 300 may be configured to produce at least one additional overlap between the fields of view 134 of the at least two additional pixelated sensors 132 at the measurement window 120, in particular, at least one additional overlap area 136 may include an additional measurement spot for each additional field of view 134 of the at least two additional pixelated sensors 132.

[0226] List of Reference Numerals

[0227] 100 Spectrometer Device

[0228] 110 Housing

[0229] 120 Measurement window

[0230] 130 Detector Array

[0231] 132 pixel sensor

[0232] 134 Field of view

[0233] 135 Main Ray

[0234] 136 Overlapping Area

[0235] 138 Combined Area

[0236] 140 Optical Filter

[0237] 142 Bandpass filter

[0238] 200 objects

[0239] 210 Components

[0240] 300 Optical Components

[0241] 310 aperture

[0242] 320 Additional aperture

[0243] 330 First plane reflector

[0244] 332 Second plane reflector

[0245] 334 Second imaging mirror

[0246] 336 First imaging mirror

[0247] 338 Additional imaging mirrors

[0248] 400 Evaluation Devices

[0249] 500 Spectrometer System

[0250] 600 Radiation Emitting Element

[0251] a Width

[0252] g Structure size

[0253] s distance

Claims

1. A spectrometer device (100) for detecting incident radiation generated by an object (200), the spectrometer device comprising: a measurement window (120) configured to receive incident radiation generated by an object (200) into the spectrometer device (100), wherein the measurement window (120) is at least one of the following: a contact surface, a placement surface for the object (200) to be investigated; a detector array (130) comprising at least two pixelated sensors (132), each pixelated sensor having a field of view (134) designed to receive at least a portion of the incident radiation, wherein each pixelated sensor (132) is configured to generate at least one detector signal related to the received incident radiation; an optical filter (140), wherein the optical filter (140) is arranged within the field of view (134) of the at least two pixelated sensors (132), wherein the optical filter (140) is configured to generate a spectrum of at least two separate wavelength signals from the incident radiation and transmit the at least two separate wavelength signals to the corresponding at least one pixelated sensor (132); at least one optical element (300) configured to modify the field of view (134) of at least one pixelated sensor (132) by increasing at least one overlap between the fields of view (134) of the at least two pixelated sensors (132), wherein the at least one optical element (300) comprises a first reflector selected from at least one of the following: o a first plane reflector (330); or ○ A first imaging reflector (336), And wherein the at least one optical element (300) comprises a second reflector, the second reflector being selected from at least one of the following: o a second plane reflector (332); or ○ Second imaging reflector (334).

2. The spectrometer device (100) according to the preceding claim, wherein Increasing at least one overlap between the fields of view (134) of the at least two pixelated sensors (132) results in at least one increased overlap region (136), the overlap region comprising a measurement spot of each field of view (134) of the at least two pixelated sensors (132) on the measurement window (120).

3. The spectrometer device (100) according to any one of the preceding claims, wherein: The optical filter (140) is a variable length filter, wherein the variable length filter comprises at least two band pass filters (142), wherein each band pass filter (142) is assigned to a corresponding pixelated sensor (132) by being arranged within a field of view (134) of the corresponding pixelated sensor (132), wherein each band pass filter (142) is configured to select at least one wavelength of received incident radiation.

4. The spectrometer device (100) according to claim 2, wherein: A ratio between the at least one overlapping area (136) produced by the measurement spots of each field of view (134) of the at least two pixelated sensors (132) and a combined area (138) produced by the measurement spots of each field of view (134) of the at least two pixelated sensors (132) on the measurement window (120) is at least 60%, 70%, 80% or 90%.

5. The spectrometer device (100) according to any one of the preceding claims, wherein: Because the at least one optical element (300) modifies the field of view (134) of the at least one pixelated sensor (132), the field of view (134) of a first pixelated sensor (132) of the at least two pixelated sensors (132) is tilted relative to the field of view (134) of a second pixelated sensor (132) of the at least two pixelated sensors (132).

6. The spectrometer device (100) according to any one of the preceding claims, wherein: The at least one optical element (300) includes at least one aperture (310, 320) for shaping a field of view (134) of the at least one pixelated sensor (132).

7. The spectrometer device (100) according to any one of the preceding claims, wherein: The at least one optical element (300) comprises at least one mirror, in particular a plane mirror or an imaging mirror.

8. The spectrometer device (100) according to any one of the preceding claims, wherein: Since the at least one optical element (300) modifies the field of view (134) of the at least one pixelated sensor (132), the field of view (134) of the at least one pixelated sensor (132) is folded by increasing the optical path length between the detector array (130) and the measurement window (120).

9. The spectrometer device (100) according to the preceding claim, wherein: The field of view (134) of the at least one pixelated sensor (132) is folded by modifying the direction of a chief ray (135) of the field of view (134) to have a directional component parallel to the detector array (130), wherein an angle between the detector array and the direction of the chief ray is less than 0°, 20°, 40°, 60° or 80°.

10. The spectrometer device (100) according to any one of the preceding claims, wherein: As a result of the at least one optical element (300) modifying the field of view (134) of the at least one pixelated sensor (132), the field of view (134) of the at least one pixelated sensor (132) is brought into focus.

11. The spectrometer device (100) according to any one of the preceding claims, wherein: As a result of the at least one optical element (300) modifying the field of view (134) of the at least one pixelated sensor (132), a chief ray (135) of the field of view (134) of the at least one pixelated sensor (132) is diverted.

12. The spectrometer device (100) according to any one of the preceding claims, wherein: The at least one optical element (300) comprises an additional reflector, the additional reflector being selected from at least one of the following: - an additional flat mirror; or - Additional imaging mirrors (338).

13. The spectrometer device (100) according to any one of the preceding claims, wherein: The spectrometer device (100) comprises at least one radiation emitting element (600), wherein the at least one radiation emitting element (600) is configured to emit optical radiation.

14. A spectrometer system (500), comprising: - A spectrometer device (100) for detecting incident radiation generated by an object (200) according to any one of the preceding claims; as well as An evaluation device (400) configured to determine information relating to the spectrum of the object (200) by evaluating at least one detector signal provided by the spectrometer device (100).

Images