Test fixture

Abstract

The invention belongs to the technical field of electronic equipment testing, and particularly relates to a test fixture which is used for solving the technical problems of disordered lines and low operation efficiency. The test fixture is applied to a test sample with a false battery, and comprises a supporting part, and a first mounting part and a second mounting part which are arranged on the first side of the supporting part. The supporting part is provided with a plurality of clamping grooves arranged at intervals in the first direction, and each clamping groove penetrates through the supporting part and is configured to be used for installing a test sample. The first mounting part and the second mounting part are arranged at an interval and are configured to be connected with a positive electrode column and a negative electrode column which are arranged at an interval, and the positive electrode column and the negative electrode column are electrically connected with the fake battery. Test samples are installed through the clamping grooves, stacking of the test samples is reduced, false batteries are connected through the positive electrode columns and the negative electrode columns between the first installation part and the second installation part, the false batteries of all the test samples are externally connected with a power source in a unified mode through the positive electrode columns and the negative electrode columns, the complexity of circuit arrangement is reduced, stacking of circuits is reduced, and operation is convenient.

Description

Technical Field

[0001] The embodiments of the present invention relate to the technical field of electronic equipment testing, and in particular to a testing fixture. Background Art

[0002] With the development of science and technology, mobile phones, laptops, tablet computers and other electronic devices have become important tools in people's lives and work. People have higher and higher requirements for mobile phones, tablet computers and other electronic devices, and need to conduct reliability tests on electronic devices. The reliability test of electronic devices includes many environmental limit tests, such as double 85 test, temperature cycle test, etc.

[0003] Among them, the double 85 test is also called the high and low temperature humidity test. After aging the test sample under the condition of 85℃ / 85%RH, the performance changes of the test sample before and after aging are compared to test its heat and humidity resistance. The temperature cycle test is also called the thermal cycle test and the high and low temperature cycle test. The test sample is exposed to a preset high and low temperature alternating test environment to simulate the impact of the alternating temperature environment on the mechanical and electrical properties of the test sample, so as to test its ability to withstand repeated temperature changes in a short period of time and the thermal matching performance between different structural materials.

[0004] In the above test process, it is necessary to adjust parameters such as voltage and current, or to maintain constant current and voltage for a long time. Usually, fake batteries are used to replace real batteries to power the test samples. Fake batteries require external power supply, that is, fake batteries introduce power equipment and then output to the test samples to power the test samples. However, the test samples using fake batteries need to be connected to an external power supply, which makes the test environment lines chaotic and the operation efficiency is low. Summary of the invention

[0005] In view of the above problems, an embodiment of the present invention provides a test fixture to reduce circuit confusion and improve operation efficiency.

[0006] An embodiment of the present invention provides a test fixture, which is applied to a test sample with a dummy battery. The test fixture includes: a support portion, and a first mounting portion and a second mounting portion arranged on a first side of the support portion, the support portion having a plurality of slots arranged at intervals along a first direction, each of the slots passing through the support portion and configured to install the test sample, the first mounting portion and the second mounting portion being arranged at intervals, and being configured to connect positive electrode columns and negative electrode columns arranged at intervals, and the positive electrode columns and the negative electrode columns being electrically connected to the dummy battery.

[0007] In some possible embodiments, two mounting holes are disposed on surfaces of the first mounting portion and the second mounting portion that are opposite to each other, and the two mounting holes are configured to be respectively penetrated by the positive electrode column and the negative electrode column;

[0008] The first mounting portion and the second mounting portion are both provided with two threaded holes respectively connected to the two mounting holes, and the extension direction of the threaded holes intersects with the extension direction of the connected mounting holes. Each of the threaded holes is correspondingly connected to a first fastener to fix the corresponding positive electrode column or negative electrode column in the mounting hole.

[0009] In some possible embodiments, the test fixture also includes an isolation plate connected between the first mounting portion and the second mounting portion, wherein the isolation plate is located between the two mounting holes of the first mounting portion and between the two mounting holes of the second mounting portion to isolate the positive electrode column from the negative electrode column.

[0010] In some possible embodiments, the first mounting portion and the second mounting portion are respectively located on two sides of the plurality of card slots and are lower than the bottoms of the plurality of card slots;

[0011] And / or, the support portion, the first mounting portion and the second mounting portion are all made of bakelite.

[0012] In some possible embodiments, the support portion includes a first side plate and a second side plate that are oppositely arranged, and a connecting plate that is arranged between the first side plate and the second side plate, and the first mounting portion and the second mounting portion are arranged on a side of the first side plate that is away from the second side plate;

[0013] The first side plate and the second side plate are respectively provided with a plurality of first card slots and second card slots arranged at intervals, the first card slots and the second card slots respectively penetrate the first side plate and the second side plate, and the openings of the first card slots and the openings of the second card slots are both away from the connecting plate, each first card slot corresponds to one second card slot, and the corresponding first card slots and second card slots form the card slot.

[0014] In some possible embodiments, the first card slot and the second card slot each include two side walls arranged opposite to each other, and a bottom wall connecting the two side walls, and each of the side walls is inclined relative to the bottom wall, and the inclination directions are the same.

[0015] In some possible embodiments, a plurality of ventilation holes arranged at intervals are provided on the connecting plate, and at least some of the plurality of ventilation holes are located between the first side plate and the second side plate.

[0016] In some possible embodiments, the second card slot is directly opposite to the first card slot, and a slot width of the first card slot is greater than a slot width of the second card slot.

[0017] In some possible embodiments, the test fixture further includes a limit member disposed on the second side of the support portion, one end of the limit member is connected below the slot, and the other end of the limit member is opposite to the slot and higher than the bottom of the slot.

[0018] In some possible embodiments, the limiting member includes a base plate and a baffle, one end of the base plate is connected to a surface of the support portion facing away from the mounting portion, the other end of the base plate is connected to one end of the baffle, and the other end of the baffle extends toward the opening of the slot and is opposite to the slot.

[0019] The test fixture of the embodiment of the present invention has at least the following advantages:

[0020] The test fixture in the embodiment of the present invention includes a support portion, a first mounting portion, and a second mounting portion. The support portion has a plurality of slots arranged at intervals along a first direction, each slot passing through the support portion, and is configured to install a test sample. The first mounting portion and the second mounting portion are arranged on a first side of the support portion and are spaced apart from each other. The first mounting portion and the second mounting portion are configured to be connected to a positive electrode column and a negative electrode column spaced apart, and the positive electrode column and the negative electrode column are electrically connected to a dummy battery. The test sample is installed through the slot to reduce the stacking of the test samples, and the dummy battery is connected through the positive electrode column and the negative electrode column between the first mounting portion and the second mounting portion, so that each dummy battery is uniformly connected to an external power supply through the positive electrode column and the negative electrode column, thereby reducing the complexity of the circuit layout, reducing the stacking of the circuit, and facilitating operation.

[0021] In addition to the technical problems solved by the embodiments of the present invention described above, the technical features that constitute the technical scheme, and the beneficial effects brought about by the technical features of the technical scheme, other technical problems that can be solved by the test fixture provided by the embodiments of the present invention, other technical features included in the technical scheme, and the beneficial effects brought about by these technical features will be further described in detail in the specific implementation methods. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0023] Figure 1 is a three-dimensional diagram of a test fixture in an embodiment of the present invention;

[0024] Figure 2 for Figure 1 A top view of

[0025] Figure 3 for Figure 1 Bottom view of

[0026] Figure 4 for Figure 1 Front view of

[0027] Figure 5 for Figure 1 Rear view of

[0028] Figure 6 for Figure 1 Left view of

[0029] Figure 7 for Figure 1 Right view of .

[0030] Description of reference numerals:

[0031] 10-test fixture; 11-first side plate;

[0032] 12-second side plate; 13-connecting plate;

[0033] 14-limiting member; 15-bottom plate;

[0034] 16- baffle; 21- first card slot;

[0035] 22-second card slot; 23-ventilation hole;

[0036] 31-first mounting portion; 32-second mounting portion;

[0037] 33-isolation plate; 41-first mounting hole;

[0038] 42-second mounting hole; 43-third mounting hole;

[0039] 44- fourth mounting hole; 45- fifth mounting hole;

[0040] 51-first threaded hole; 52-second threaded hole;

[0041] 53-third threaded hole; 54-fourth threaded hole. DETAILED DESCRIPTION

[0042] There are problems of confusing circuits and low operating efficiency in the related technology. The inventors have found that the reason is that each test sample is installed with a dummy battery, and each dummy battery needs to be connected to an external power supply, that is, each test sample needs to be connected to an external power supply. The circuit is complicated, and circuit stacking is prone to occur, which is inconvenient to operate. There are also many problem points in the circuit, which makes the test results inaccurate.

[0043] As the number of test samples increases, the test space is limited, resulting in stacking between test samples. On the one hand, there is a problem of high local temperature of the test samples, resulting in inaccurate test results; on the other hand, the installation and disassembly of fake batteries, as well as the connection of fake batteries to external power supplies are inconvenient, resulting in low test efficiency.

[0044] An embodiment of the present invention provides a test fixture, which includes a support portion, a first mounting portion, and a second mounting portion. The support portion has a plurality of slots arranged at intervals along a first direction, each slot passing through the support portion, and the test sample is installed through the slot, thereby reducing the stacking of the test sample and facilitating operation. The first mounting portion and the second mounting portion are arranged on a first side of the support portion, and are configured to be connected with a positive electrode column and a negative electrode column arranged at intervals, and the positive electrode column and the negative electrode column are electrically connected to a dummy battery of the test sample, thereby reducing the complexity of the circuit layout, reducing the stacking of the circuit, and facilitating operation.

[0045] In order to make the above-mentioned purposes, features and advantages of the embodiments of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work belong to the scope of protection of the present invention.

[0046] See also Figures 1 to 7 The embodiment of the present invention provides a test fixture 10, which is applied to a test sample with a dummy battery, that is, the test sample is installed with a dummy battery. The dummy battery is used to power the test sample to test the test sample, and the test sample can be a mobile phone, a notebook, a tablet computer, etc. The dummy battery of the test sample is connected to an external power supply by using the test fixture 10, which can reduce line confusion and stacking and improve operation efficiency.

[0047] The test fixture 10 includes a support portion, a first mounting portion 31 and a second mounting portion 32. The first mounting portion 31 and the second mounting portion 32 are arranged on a first side of the support portion. Figure 1 As shown, the first side of the support portion is the front side of the support portion. The support portion is used to install the test sample, the first mounting portion 31 and the second mounting portion 32 are used to connect the positive electrode column and the negative electrode column, the positive electrode column and the negative electrode column are spaced between the first mounting portion 31 and the second mounting portion 32, and are electrically connected to the dummy battery.

[0048] Exemplarily, the positive electrode column and the negative electrode column can both be copper rods, and the diameter of the copper rod is 2-3 mm, for example, the diameter of the copper rod in the embodiment of the present invention is 2 mm. One end of the positive electrode column and the negative electrode column are fixedly connected to the first mounting portion 31, and the other end of the positive electrode column and the negative electrode column are fixedly connected to the second mounting portion 32. The positive electrode column and the negative electrode column are respectively connected to the positive and negative electrodes of the external power supply, and are connected to the positive and negative electrodes of the dummy battery to power the dummy battery.

[0049] Specifically, the positive electrode column is connected to the positive electrode of the external power source and the positive electrode of the dummy battery, and the negative electrode column is connected to the negative electrode of the external power source and the negative electrode of the dummy battery. For example, the positive electrode of the external power source, the negative electrode of the external power source, the positive electrode of the dummy battery, and the negative electrode of the dummy battery are respectively connected to the clip through wires, and the clip is clamped on the corresponding positive electrode column or negative electrode column to achieve electrical connection between the dummy battery and the external power source.

[0050] Next, combine Figures 1 to 7 , the structures of the first mounting portion 31 and the second mounting portion 32 are described.

[0051] like Figures 1 to 7 As shown, the first mounting portion 31 and the second mounting portion 32 can be columns, such as a cylinder, an elliptical cylinder, a cuboid or a cube. In the embodiment of the present invention, the first mounting portion 31 and the second mounting portion 32 are both cuboids to facilitate the setting of mounting holes and threaded holes.

[0052] In order to fix the positive electrode column and the negative electrode column, two mounting holes are provided on the surfaces of the first mounting portion 31 and the second mounting portion 32 facing each other, and the two mounting holes are configured to be respectively penetrated by the positive electrode column and the negative electrode column. Figure 1 As shown, the first mounting portion 31 and the second mounting portion 32 can be arranged along a first direction ( Figure 1 The X direction shown in the figure) is relatively arranged and spaced apart.

[0053] The first mounting portion 31 is located on the left side, and the second mounting portion 32 is located on the right side. Two mounting holes are provided on the right side of the first mounting portion 31, and two mounting holes are provided on the left side of the second mounting portion 32. The mounting holes may be through holes or blind holes. The two mounting holes of the first mounting portion 31 correspond to the two mounting holes of the second mounting portion 32, respectively, and the two corresponding mounting holes respectively accommodate the two ends of the positive electrode column, and the other two corresponding mounting holes respectively accommodate the two ends of the negative electrode column.

[0054] The first mounting portion 31 and the second mounting portion 32 are both provided with two threaded holes respectively connected to the two mounting holes, and the extension direction of the threaded holes intersects with the extension direction of the connected mounting holes. Each threaded hole is correspondingly connected to a first fastener to fix the corresponding positive electrode column or negative electrode column in the mounting hole.

[0055] like Figure 1 As shown, the upper side surfaces of the first mounting portion 31 and the second mounting portion 32 are each provided with two threaded holes, and the two threaded holes of the first mounting portion 31 are respectively connected with the two mounting holes of the first mounting portion 31, and the extending directions thereof intersect. The two threaded holes of the second mounting portion 32 are respectively connected with the two mounting holes of the second mounting portion 32, and the extending directions thereof intersect.

[0056] Each threaded hole is threadedly provided with a first fastener, which is connected to the corresponding threaded hole and extends into the corresponding mounting hole and abuts against the positive electrode column or the negative electrode column in the mounting hole to fix the positive electrode column or the negative electrode column. This arrangement facilitates the replacement of the positive electrode column and the negative electrode column.

[0057] The corresponding threaded hole refers to the threaded hole where the first fastener is located, and the corresponding mounting hole refers to the mounting hole connected to the threaded hole where the first fastener is located. The first fastener can be a screw, a stud, etc. The material of the first fastener is stainless steel to ensure the strength of the first fastener and avoid damage to the first fastener.

[0058] For ease of understanding, the two mounting holes on the first mounting portion 31 are respectively defined as the first mounting hole 41 and the second mounting hole 42, the two threaded holes on the first mounting portion 31 are respectively defined as the first threaded hole 51 and the second threaded hole 52, the two mounting holes on the second mounting portion 32 are respectively defined as the third mounting hole 43 and the fourth mounting hole 44, and the two threaded holes on the second mounting portion 32 are respectively defined as the third threaded hole 53 and the fourth threaded hole 54.

[0059] Among them, one end of the positive electrode column is disposed in the first mounting hole 41, the other end of the positive electrode column is disposed in the second mounting hole 42, one end of the negative electrode column is disposed in the third mounting hole 43, and the other end of the negative electrode column is disposed in the fourth mounting hole 44. The first mounting hole 41 is connected to the first threaded hole 51, the second mounting hole 42 is connected to the second threaded hole 52, the third mounting hole 43 is connected to the third threaded hole 53, and the fourth mounting hole 44 is connected to the fourth threaded hole 54.

[0060] The first threaded hole 51, the second threaded hole 52, the third threaded hole 53 and the fourth threaded hole 54 are respectively threadedly connected with the first fastener. The first fastener located in the first threaded hole 51 extends into the first mounting hole 41 and abuts against one end of the positive electrode column, and the first fastener located in the second threaded hole 52 extends into the second mounting hole 42 and abuts against the other end of the positive electrode column. The first fastener located in the third threaded hole 53 extends into the third mounting hole 43 and abuts against one end of the negative electrode column, and the first fastener located in the fourth threaded hole 54 extends into the fourth mounting hole 44 and abuts against the other end of the negative electrode column.

[0061] In order to isolate the positive electrode column and the negative electrode column to avoid a short circuit between the two, in some possible examples, the test fixture 10 also includes an isolation plate 33, and the isolation plate 33 is connected to the isolation plate 33 between the first mounting portion 31 and the second mounting portion 32, and the isolation plate 33 is located between the two mounting holes of the first mounting portion 31 and between the two mounting holes of the second mounting portion 32 to isolate the positive electrode column and the negative electrode column to avoid accidental short circuit between the positive electrode column and the negative electrode column, and to avoid accidental short circuit between the lines connected to the positive electrode column and the lines connected to the negative electrode column.

[0062] The thickness of the isolation plate 33, the thickness of the first mounting portion 31, and the thickness of the second mounting portion 32 may be equal, so that the corresponding surfaces of the isolation plate 33, the first mounting portion 31, and the second mounting portion 32 are aligned. Figure 1 As shown, the upper surfaces of the isolation plate 33, the first mounting portion 31 and the second mounting portion 32 are aligned, and the lower surfaces of the isolation plate 33, the first mounting portion 31 and the second mounting portion 32 are aligned. A positive electrode column and a negative electrode column are respectively arranged on both sides of the isolation plate 33. The isolation plate 33 is made of insulating material, which can be the same as the material of the first mounting portion 31 and the second mounting portion 32. For example, the isolation plate 33, the first mounting portion 31 and the second mounting portion 32 are an integrated structure.

[0063] Next, combine Figures 1 to 7 , the structure of the support portion is described.

[0064] like Figures 1 to 7 As shown, the support portion has a plurality of slots, for example, the support portion is provided with ten slots. The plurality of slots are arranged at intervals along the first direction, for example, the plurality of slots are arranged at equal intervals. Each slot passes through the support portion so that both ends of the test sample can extend outward from the slot. Each slot is configured to install a test sample. With such an arrangement, the test fixture 10 can be installed with a plurality of test samples, which connects the plurality of test samples and an external power supply to simplify the circuit.

[0065] In order to facilitate the external connection of each test sample, in some possible examples, the first mounting portion 31 and the second mounting portion 32 are respectively provided on both sides of the plurality of slots, that is, the first mounting portion 31 and the second mounting portion 32 are respectively located on both sides of the plurality of slots, and the plurality of slots are located between the first mounting portion 31 and the second mounting portion 32. In this way, the spacing between the first mounting portion 31 and the second mounting portion 32 is large, and a longer positive electrode column and a longer negative electrode column can be provided. At the same time, each slot can correspond to part of the positive electrode column and the negative electrode column, so as to facilitate the connection of the test sample with the positive electrode column and the negative electrode column.

[0066] like Figure 1As shown, the first mounting portion 31 and the second mounting portion 32 are lower than the bottoms of the multiple slots, so that the positive electrode column and the negative electrode column are staggered with the multiple slots, that is, along the extension direction of the slots, the positive electrode column and the negative electrode column are not opposite to the multiple slots, thereby preventing the positive electrode column and the negative electrode column from affecting the installation and removal of the test sample.

[0067] It is understandable that the first mounting portion 31, the second mounting portion 32 and the support portion are all made of insulating materials. Exemplarily, the first mounting portion 31, the second mounting portion 32 and the support portion are all made of bakelite, which has high temperature resistance, low temperature resistance, corrosion resistance and other properties, and can ensure the insulation performance and service life of the test fixture 10.

[0068] Continue reading Figures 1 to 7 The support portion includes a first side plate 11, a second side plate 12 and a connecting plate 13. The first side plate 11 and the second side plate 12 are arranged opposite to each other. For example, the first side plate 11 and the second side plate 12 are arranged opposite to each other along the second direction. Figure 1 The first side plate 11 is provided with a first mounting portion 31 and a second mounting portion 32 on a side away from the second side plate 12. Figure 1 As shown, a first mounting portion 31 and a second mounting portion 32 are provided on the front side of the first side plate 11 .

[0069] The first side plate 11 and the second side plate 12 are respectively provided with a plurality of first card slots 21 and second card slots 22 arranged at intervals, and the first card slots 21 and the second card slots 22 respectively penetrate the first side plate 11 and the second side plate 12. Figure 1 As shown, the first side plate 11 is provided with a plurality of first card slots 21, which are arranged at intervals along the first direction and all penetrate the first side plate 11 along the second direction. The second side plate 12 is provided with a plurality of second card slots 22, which are arranged at intervals along the first direction and all penetrate the second side plate 12 along the second direction.

[0070] The opening of the first card slot 21 and the opening of the second card slot 22 are both away from the connecting plate 13, so that the test sample is placed in the first card slot 21 and the second card slot 22 along the opening of the first card slot 21 and the opening of the second card slot 22. Among them, the opening of the first card slot 21 and the opening of the second card slot 22 can face upward. In this way, the test sample is placed in the first card slot 21 and the second card slot 22 from top to bottom, and is kept in the first card slot 21 and the second card slot 22 under the action of its own gravity, and has good stability.

[0071] Each first slot 21 corresponds to a second slot 22, and the corresponding first slots 21 and second slots 22 form a slot, that is, each slot includes a first slot 21 and a corresponding second slot 22. Part of the same test sample is located in the first slot 21, and part of the same test sample is located in the corresponding second slot 22, and the test sample is supported and limited by the corresponding first slots 21 and second slots 22.

[0072] In some possible examples, the first card slot 21 and the second card slot 22 each include two side walls arranged opposite to each other, and a bottom wall connecting the two side walls, each side wall being arranged obliquely relative to the bottom wall, and the inclination direction is the same. The two opposite side walls of the first card slot 21 are inclined in the same direction compared to the bottom wall of the first card slot 21, for example, the two side walls of the first card slot 21 are inclined to the right compared to the bottom wall of the first card slot 21. The two opposite side walls of the second card slot 22 are inclined in the same direction compared to the bottom wall of the second card slot 22, and are in the same direction as the two side walls of the first card slot 21 are inclined in the same direction compared to the bottom wall of the first card slot 21, for example, the two side walls of the second card slot 22 are also inclined to the right compared to the bottom wall of the second card slot 22. In this way, the test sample is arranged obliquely, which can reduce its shaking in the first card slot 21 and the second card slot 22, and maintain the stability of the test sample.

[0073] The angles of inclination of the side walls relative to the bottom wall are the same, for example, 5°, and in this way, the width of the first card slot 21 from the bottom wall to the opening is equal, and the width of the second card slot 22 from the bottom wall to the opening is equal. Optionally, the second card slot 22 is directly opposite to the first card slot 21, and the width of the first card slot 21 is greater than the width of the second card slot 22. Exemplarily, one side wall of the second card slot 22 is aligned with the side wall on the same side of the corresponding first card slot 21, and the other side wall of the second card slot 22 is offset with the other side wall of the corresponding first card slot 21, and the position is closer.

[0074] like Figure 1 As shown, the left side wall of the second slot 22 is aligned with the left side wall of the corresponding first slot 21, and the right side wall of the second slot 22 is on the left side of the right side wall of the corresponding first slot 21. In this way, the first slot 21 is wider, which is convenient for installing the test sample.

[0075] Continue reading Figures 1 to 7 , the connecting plate 13 is connected between the first side plate 11 and the second side plate 12. For example, one end of the connecting plate 13 is connected to the surface of the first side plate 11 facing the second side plate 12, and the other end of the connecting plate 13 is connected to the surface of the second side plate 12 facing the first side plate 11. Along the first direction, the two ends of the connecting plate 13 are respectively flush with the two ends of the first side plate 11 and the two ends of the second side plate 12. Figure 1As shown, the left end of the connecting plate 13, the left end of the first side plate 11, and the left end of the second side plate 12 are flush, and the right end of the connecting plate 13, the right end of the first side plate 11, and the right end of the second side plate 12 are flush.

[0076] In some possible implementations, the first side plate 11 and the second side plate 12 are both provided with a fifth mounting hole 45, and the surface of the connecting plate 13 facing the first side plate 11 and the surface of the connecting plate 13 facing the second side plate 12 are both provided with a fifth threaded hole. The second fastener is inserted into the fifth mounting hole 45 and connected with the fifth threaded hole, so as to fix the first side plate 11, the second side plate 12 and the connecting plate 13. Such a configuration facilitates the replacement of the first side plate 11, the second side plate 12 and the connecting plate 13. The second fastener can be a screw, a stud, etc., and the material of the second fastener is stainless steel to ensure the strength of the second fastener and avoid damage to the second fastener.

[0077] Continue reading Figures 1 to 7 , the connecting plate 13 is located below the first card slot 21 and the second card slot 22, so as to be spaced apart from the first card slot 21 and the second card slot 22 to avoid contact between the connecting plate 13 and the test sample, so that the first card slot 21 and the second card slot 22 support the test sample. Among them, a plurality of ventilation holes 23 arranged at intervals are provided on the connecting plate 13, and at least part of the plurality of ventilation holes 23 are located between the first side plate 11 and the second side plate 12, so as to ventilate and cool the test sample, reduce the excessive local temperature of the test sample, thereby avoiding the injection of other conditions during the test process and ensuring the accuracy of the test results. Exemplarily, the number of ventilation holes 23 is greater than or equal to the number of the first card slot 21, and greater than or equal to the number of the second card slot 22, so as to ensure the ventilation effect, so that each test sample can effectively dissipate heat.

[0078] In order to further reduce the shaking of the test sample and ensure the stability of the test sample, the test fixture 10 also includes a limiter 14, which is arranged on the second side of the support portion, that is, the limiter 14 is arranged on the side of the support portion away from the first mounting portion 31 and the second mounting portion 32. For example, the first mounting portion 31 and the second mounting portion 32 are arranged on the second side plate 12, and the limiter 14 is arranged on the second side plate 12. One end of the limiter 14 is connected to the bottom of the card slot, and the other end of the limiter 14 is opposite to the card slot and higher than the bottom of the card slot, so as to limit the protruding part of the test sample and further prevent the test sample from moving and deviating along the card slot.

[0079] In some possible implementations, the limit member 14 includes a base plate 15 and a baffle 16, one end of the base plate 15 is connected to the surface of the support portion facing away from the mounting portion, the other end of the base plate 15 is connected to one end of the baffle 16, and the other end of the baffle 16 extends toward the opening of the slot and is opposite to the slot.

[0080] Specifically, one end of the bottom plate 15 is connected to the second side plate 12, and the other end of the bottom plate 15 is away from the baffle 16. The two ends of the baffle 16 are respectively flush with the two ends of the second side plate 12 to limit the test sample in each second slot 22. The baffle 16 can be flush with the second side plate 12, and the top surface of the baffle 16 is lower than the top surface of the second side plate 12 and higher than the bottom wall of the second slot 22.

[0081] In summary, the test fixture 10 in the embodiment of the present invention includes a support portion, a first mounting portion 31 and a second mounting portion 32. The support portion has a plurality of slots arranged at intervals along a first direction, each slot passing through the support portion, and is configured to install a test sample. The first mounting portion 31 and the second mounting portion 32 are arranged on a first side of the support portion, and are spaced apart. The first mounting portion 31 and the second mounting portion 32 are configured to connect the positive electrode column and the negative electrode column arranged at intervals, and the positive electrode column and the negative electrode column are electrically connected to the dummy battery. The test sample is installed by the slot, and the stacking of the test sample is reduced, which is convenient for operation. The first mounting portion 31 and the second mounting portion 32 are arranged on the first side of the support portion, and are configured to connect the positive electrode column and the negative electrode column arranged at intervals, and the positive electrode column and the negative electrode column are electrically connected to the dummy battery of the test sample, which reduces the complexity of the circuit layout, reduces the stacking of the circuit, and is convenient for operation.

[0082] The various embodiments or implementation methods in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments, and the same or similar parts between the various embodiments can be referenced to each other.

[0083] Those skilled in the art should understand that, in the disclosure of the present invention, the orientation or position relationship indicated by the terms "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc. are based on the orientation or position relationship shown in the drawings, which are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred system or element must have a specific orientation, be constructed and operate in a specific orientation. Therefore, the above terms should not be understood as limiting the present invention.

[0084] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiments or examples are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0085] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A test fixture, characterized in that: Applicable to a test sample with a dummy battery, the test fixture comprises: a support portion, and a first mounting portion and a second mounting portion arranged on a first side of the support portion, the support portion having a plurality of slots arranged at intervals along a first direction, each of the slots passing through the support portion and configured to mount the test sample, the first mounting portion and the second mounting portion being arranged at intervals, and being configured to connect positive electrode columns and negative electrode columns arranged at intervals, the positive electrode columns and the negative electrode columns being electrically connected to the dummy battery.

2. The test fixture according to claim 1, characterized in that: Two mounting holes are provided on surfaces of the first mounting portion and the second mounting portion facing each other, and the two mounting holes are configured to be respectively penetrated by the positive electrode column and the negative electrode column; The first mounting portion and the second mounting portion are both provided with two threaded holes respectively connected to the two mounting holes, and the extension direction of the threaded holes intersects with the extension direction of the connected mounting holes. Each of the threaded holes is correspondingly connected to a first fastener to fix the corresponding positive electrode column or negative electrode column in the mounting hole.

3. The test fixture according to claim 2, characterized in that: The test fixture also includes an isolation plate connected between the first mounting portion and the second mounting portion, the isolation plate is located between the two mounting holes of the first mounting portion and between the two mounting holes of the second mounting portion to isolate the positive electrode column from the negative electrode column.

4. The test fixture according to claim 1, characterized in that: The first mounting portion and the second mounting portion are respectively located on two sides of the plurality of card slots and are lower than the bottoms of the plurality of card slots; And / or, the support portion, the first mounting portion and the second mounting portion are all made of bakelite.

5. The test fixture according to any one of claims 1 to 4, characterized in that: The support portion includes a first side plate and a second side plate that are oppositely arranged, and a connecting plate that is arranged between the first side plate and the second side plate, and the first mounting portion and the second mounting portion are arranged on a side of the first side plate that is away from the second side plate; The first side plate and the second side plate are respectively provided with a plurality of first card slots and second card slots arranged at intervals, the first card slots and the second card slots respectively penetrate the first side plate and the second side plate, and the openings of the first card slots and the openings of the second card slots are both away from the connecting plate, each first card slot corresponds to one second card slot, and the corresponding first card slots and second card slots form the card slot.

6. The test fixture according to claim 5, characterized in that: The first card slot and the second card slot each include two side walls arranged opposite to each other, and a bottom wall connecting the two side walls, and each of the side walls is inclined relative to the bottom wall, and the inclination directions are the same.

7. The test fixture according to claim 5, characterized in that: The connecting plate is provided with a plurality of ventilation holes arranged at intervals, and at least some of the plurality of ventilation holes are located between the first side plate and the second side plate.

8. The test fixture according to claim 5, characterized in that: The second card slot is directly opposite to the first card slot, and the slot width of the first card slot is greater than the slot width of the second card slot.

9. The test fixture according to any one of claims 1 to 4, characterized in that: The test fixture further includes a limiting member disposed on the second side of the support portion, one end of the limiting member is connected below the card slot, and the other end of the limiting member is opposite to the card slot and higher than the bottom of the card slot.

10. The test fixture according to claim 9, characterized in that: The limiting member includes a base plate and a baffle, one end of the base plate is connected to the surface of the support portion away from the mounting portion, the other end of the base plate is connected to one end of the baffle, and the other end of the baffle extends toward the opening of the slot and is opposite to the slot.

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