RDC test fixture
By designing an RDC test fixture that includes elastic connection components and modular structures, the problems of large residual impedance, single applicability, hard contact and unreasonable structural design in the existing RDC test fixtures are solved, and efficient and reliable multi-size specification components are achieved, reducing costs and extending service life.
Patent Information
- Application Number
- CN202411970704.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-30
- Publication Date
- 2025-04-29
AI Technical Summary
The existing RDC test fixtures have problems such as large residual impedance, single applicability, hard contact between the test head and the components, and unreasonable structural design, which affect the accuracy, efficiency and reliability of the test.
An RDC test fixture including a base, PCB test board, test positioning board, test indenter and elastic connection assembly is designed to provide appropriate contact force through elastic connection assembly, avoid hard contact, and make each component detachable through modular design to adapt to component testing of different sizes and specifications.
The design significantly reduces testing costs, improves testing efficiency and reliability, extends the service life of components, simplifies maintenance processes and reduces maintenance costs.
Smart Images
Figure CN119901993A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of RDC testing technology, and in particular to an RDC testing fixture. Background Art
[0002] With the rapid development of the electronics manufacturing industry, the DC resistance (RDC) test of electronic components (including but not limited to capacitors, inductors and transformers) has become a core link to ensure product quality and reliability. As electronic components are becoming increasingly miniaturized and high-performance, the requirements for RDC testing technology are becoming more stringent. However, the current RDC testing technology faces several technical bottlenecks in practical applications, which are specifically manifested in the following aspects: Although there are many RDC test fixtures in the domestic market, these fixtures generally have large residual impedance, which seriously affects the accuracy and efficiency of the test. The increase in residual impedance may not only cause the test results to deviate from the true value, but also may affect the subsequent application effect of electronic components due to the accumulation of test errors.
[0003] The applicability of the test fixture. Existing RDC test fixtures often have a relatively single applicability and are difficult to meet the testing needs of electronic components of different sizes. With the miniaturization and diversification of electronic components, this single-applicability fixture can no longer meet the diversified needs of the market. Therefore, it is particularly important to develop an RDC test fixture that can adapt to the testing of electronic components of various sizes.
[0004] The contact problem between the test head and the components under test. During the RDC test process, the direct contact between the test head and the components under test often causes damage to the components under test. This hard contact method not only reduces the repeatability of the test, but also increases the scrap rate of the components under test, thereby increasing production costs. Therefore, how to improve the contact method between the test head and the components under test and reduce damage during the test process is one of the problems that need to be solved in the current RDC test technology.
[0005] The unreasonable design of the fixture structure. Existing RDC test fixtures often have unreasonable structural designs, such as being unable to be disassembled and key components unable to be replaced independently after being worn. These problems not only limit the maintenance and service life of the fixture, but also increase the maintenance and replacement costs. Summary of the invention
[0006] In order to overcome the deficiencies of the prior art, the present application provides an RDC test fixture, which aims to reduce the scrap rate and production costs of tested components while extending the service life of the test fixture.
[0007] The technical means adopted by the present invention to solve the technical problem is: an RDC test fixture, the improvement of which is that it includes a base, a PCB test board, a test positioning board, a test pressure head and an elastic connection component, wherein: The PCB test board is detachably mounted on the base, the test positioning plate is detachably mounted on the PCB test board, one end of the test pressure head faces the test positioning plate and is tightly attached to the PCB test board, and the other end is detachably mounted on the elastic connection component; the elastic connection component is used to drive the test pressure head to move toward the test positioning plate so that the test pressure head presses the tested components onto the test positioning plate.
[0008] The elastic connection assembly in the above technical solution includes a connection block, a spring and a connection shaft, wherein: The test pressure head is detachably mounted on the connecting block, and the other end of the connecting block is connected to the connecting shaft; the spring sleeve is arranged on the connecting shaft and is tightly attached to the connecting block, and the other end of the connecting shaft passes through a first through hole arranged on the base.
[0009] In the above technical solution, the base is recessed downward to form an empty groove, and the elastic connecting component is accommodated in the empty groove.
[0010] In the above technical solution, a handle is provided at the end of the connecting shaft after passing through the first through hole.
[0011] In the above technical solution, a second through hole is provided on the connecting block, a guide pin is slidably connected in the second through hole, and the other end of the guide pin is fixedly connected in the base.
[0012] In the above technical solution, a buckle and a buckle fixing pin are also provided on the base. The buckle is arranged in the niche of the base through the buckle fixing pin. One end of the buckle is exposed in the niche, and the other end can move freely between the niche and the handle.
[0013] The test positioning plate in the above technical solution is an inclined surface structure facing the test pressure head, a guide groove is arranged in the center of the inclined surface, and chamfers for positioning components are provided on both sides; the test pressure head is a stepped structure facing one end of the test positioning plate, a notch-shaped limit groove is arranged in the center of the stepped structure, and the other end is an inclined surface structure, and a through hole is arranged on the test pressure head.
[0014] In the above technical solution, a lead-out terminal is reserved on the PCB test board for connecting the test circuit.
[0015] The spring elastic coefficient in the above technical solution is 0.48-0.52N / mm, the length is 14.8-15.2mm, and the movable distance of the measured component is 0mm-5mm.
[0016] In the above technical solution, the PCB test board and the base, the test positioning plate and the PCB test board, and the test pressure head and the elastic connection component are all detachably connected through screws and screw holes.
[0017] The beneficial effects of the present invention are: The present invention can easily adapt to electronic components of different sizes for RDC testing by simply replacing the test pressure head, which greatly broadens the application scope of the test fixture, meets the diversified testing needs of electronic components on the market, reduces testing costs, and improves testing efficiency.
[0018] The present invention utilizes an elastic connection component to provide appropriate contact force, which effectively avoids hard contact between the test pressure head and the component under test during the test process, thereby ensuring that the component is intact after multiple tests, which not only extends the service life of the component under test, but also improves the repeatability and reliability of the test.
[0019] All parts of the present invention can be independently processed and manufactured, and are designed to be detachable, so that worn parts can be easily replaced. This design not only simplifies the maintenance process, but also reduces the consumption cost and improves the economy and practicality of the test fixture. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] Figure 1 A schematic diagram of the structure of an RDC test fixture shown in an embodiment of the present invention; Figure 2 A schematic diagram of the structure of a connection assembly shown in an embodiment of the present invention; Figure 3 Another schematic diagram of the structure of the connection assembly shown in an embodiment of the present invention; Figure 4 A schematic diagram of a test positioning plate and a test pressure head according to an embodiment of the present invention. DETAILED DESCRIPTION
[0021] The present invention is further described below in conjunction with the accompanying drawings and embodiments.
[0022] The following will clearly and completely describe the concept, specific structure and technical effects of the present invention in combination with the embodiments and drawings, so as to fully understand the purpose, characteristics and effects of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, other embodiments obtained by technicians in this field without creative work are all within the scope of protection of the present invention. In addition, all the connection / connection relationships involved in the patent do not refer to the direct connection of components, but refer to the formation of a better connection structure by adding or reducing connection accessories according to the specific implementation situation. The various technical features in the invention can be combined interchangeably without conflicting with each other.
[0023] like Figure 1 As shown, the present application provides an RDC test fixture, including a base 1, a PCB test board 2, a test positioning board 3, a test pressure head 4 and an elastic connection component 5, wherein: The PCB test board 2 is detachably mounted on the base 1, the test positioning plate 3 is detachably mounted on the PCB test board 2, one end of the test pressure head 4 is facing the test positioning plate 3 and is tightly attached to the PCB test board 2, and the other end of the test pressure head 4 is detachably mounted on the elastic connection component 5; the elastic connection component 5 is used to drive the test pressure head 4 to move toward the test positioning plate 3, so that the test pressure head 4 presses the components under test onto the test positioning plate 2.
[0024] In a possible implementation, the PCB test board 2 is provided with a lead-out terminal 21 for connecting a test circuit. When the terminals of the component under test are connected to the PCB test board, the PCB test board is connected to the test circuit through the lead-out terminal 21 . At the same time, the PCB test board 2 is provided with a conductive layer for connecting to the two poles of the patch product respectively, the spacing between the conductive layers is 0.2mm, and the conductive layer is covered with a conductive adhesive layer with a thickness of 8-10um and a resistivity of less than 4.0*10-4Ω·cm.
[0025] Through the above embodiments, the residual impedance of the overall test loop can be controlled below 10 mΩ after compensation, which can meet the requirements of high-precision testing.
[0026] In one possible implementation, Figure 2 As shown, the elastic connection assembly 5 includes a connection block 51, a spring 52 and a connection shaft 53, wherein: The test pressure head 4 is detachably installed on the connecting block 51, and the other end of the connecting block 51 is connected to the connecting shaft 53; the spring 52 is sleeved on the connecting shaft 53 and tightly attached to the connecting block 51, and the other end of the connecting shaft 53 passes through the first through hole 11 set on the base 1.
[0027] Optionally, the spring may be replaced by any one of a gas spring, a hydraulic spring, a rubber spring, an elastic connecting rod, an elastic diaphragm, a torsion spring, a leaf spring, a hairspring and a legal strip.
[0028] Through the above embodiments, the present application utilizes an elastic connection assembly to provide appropriate contact force, effectively avoiding hard contact between the test pressure head and the components under test during the test process, thereby ensuring that the components are intact after multiple tests, which not only extends the service life of the components under test, but also improves the repeatability and reliability of the test.
[0029] Optionally, a copper sleeve 54 is further provided between the connecting shaft 53 and the first through hole 11. The copper sleeve 54 is used as an intermediary between the connecting shaft 53 and the first through hole 11 to smooth the surface of the structure and significantly reduce the friction between the two, thereby helping to ensure the stability and durability of the connecting shaft during movement.
[0030] In one possible implementation, see Figure 2 As shown, the base 1 is recessed downward to form a hollow groove 12 , and the elastic connecting component 5 is accommodated in the hollow groove 12 .
[0031] With this design, the space of the base can be used more effectively by accommodating the elastic connection components in the empty grooves. This design makes the structure of the base more compact, reduces unnecessary space waste, and also helps to improve the integration and aesthetics of the entire device. At the same time, when the elastic connection components need to be maintained or replaced, since they are accommodated in the empty grooves, they can be more easily disassembled and replaced. This design reduces the difficulty of maintenance and improves maintenance efficiency.
[0032] In one possible implementation, see Figure 2 As shown, a handle 55 is provided at the end of the connecting shaft 53 after passing through the first through hole 11 .
[0033] Optionally, the handle 55 can be any one of a straight handle, a curved handle (L-shaped, T-shaped), a ring handle, a spherical handle, and a flat handle. In the embodiment of the present application, a round pancake handle is taken as an example, and the handle can be used to quickly pull the connecting rod, thereby driving the movement of the test pressure head.
[0034] In another possible implementation, Figure 1As shown, the base 1 is also provided with a buckle 13 and a buckle fixing pin 14. The buckle 13 is set in the niche 15 of the base 1 through the buckle fixing pin 14. One end of the buckle 13 is exposed in the niche 15, and the other end can move freely between the niche 15 and the handle 55.
[0035] Through the above embodiments, the buckle is arranged in the niche, which not only saves space, but also makes the overall design more compact and neat, which is particularly important for application scenarios with limited space, and can maximize the use of available space. With the buckle, when the handle is tightly fitted with the base due to rebound, the handle can be easily separated from the base by selecting the exposed part of the buckle, making it convenient to push and pull the handle.
[0036] In one possible implementation, Figure 3 As shown, the connecting block 51 is provided with a second through hole 511 , a guide pin 56 is slidably connected in the second through hole 511 , and the other end of the guide pin 56 is fixedly connected in the base 1 .
[0037] Optionally, the guide pin 56 may be fixedly connected to the connection block 51 , and correspondingly, the second through hole 511 is provided on the base 1 , which does not constitute a specific limitation herein.
[0038] Through the limiting effect of the above-mentioned guide pins on the connecting block, when the above-mentioned elastic connecting assembly moves relative to the base, the guide pins can ensure that the connecting block moves along a predetermined path to prevent it from deviating from the correct position; through the fixed connection of the guide pins, the relative position between the connecting block and the base can be ensured to remain accurate, thereby improving the stability and reliability of the entire structure.
[0039] In one possible implementation, Figure 4 As shown, the test positioning plate 3 is an inclined surface structure facing the test pressure head 4, which is convenient for the installation and disassembly of the test positioning plate 3; a guide groove 31 is provided at the center of the inclined surface, and chamfers 32 for positioning components are provided on both sides, which is convenient for the precise positioning of small components; the test pressure head 4 is a stepped structure at one end facing the test positioning plate 3, and the stepped structure cooperates with the test positioning plate 3 to ensure that the components are fixed stably and reliably during testing, thereby reducing parasitic capacitance; a notch-shaped limiting groove 41 is provided at the center of the stepped structure, and the other end is an inclined surface structure, and a through hole 42 is provided on the test pressure head, and the through hole is used to reduce the weight of the test pressure head 4.
[0040] It is worth mentioning that the shape and size of the limit groove 41 of the test pressure head 4 can be precisely designed and matched according to the specific parts of the tested components (such as pins, pads, etc.). This design ensures that the tested components can be stably and accurately positioned on the test positioning board during the test process, avoiding test errors caused by inaccurate positioning. In this way, by designing and matching the test pressure head according to the size specifications of the tested device, the testing of components of various sizes and specifications can be achieved.
[0041] Through the above embodiments, the components to be tested are placed in the test position, the test hole position is released, and the test pressure head is pushed to move along the guide pin toward the direction of the components to be tested under the pulling force of the elastic connection assembly, and the components to be tested are accurately fixed in the limit groove, the components to be tested and the PCB test board are stably connected, and the instrument test line is connected through the PCB test board and the product terminal to form a complete loop to complete the test. The design of the inclined surface makes it easier to align the components when they are inserted or placed on the test positioning board, reducing the difficulty of installation; the existence of the guide groove provides a clear insertion path for the components, further simplifying the installation process; the chamfer design reduces the friction and collision between the components and the test positioning board, which helps to protect the components from damage.
[0042] In a possible implementation, the PCB test board 2 and the base 1, the test positioning plate 3 and the PCB test board 2, and the test pressure head 4 and the elastic connection component 5 are all detachably connected via screws and screw holes.
[0043] Using screws and screw holes for connection can facilitate the assembly and disassembly of various components, which not only simplifies the installation process, but also improves work efficiency. When a component needs to be replaced or repaired, just loosen the corresponding screws to easily remove the component without complicated disassembly work.
[0044] The modular design adopted between the structures of the present application enables the test fixture to be quickly configured and reorganized according to different test requirements, thereby improving the efficiency and flexibility of the test. At the same time, the modular design also reduces the manufacturing cost and maintenance cost of the test fixture, and the worn parts can be replaced independently and conveniently, thus avoiding the high cost of replacing the entire fixture due to the wear of a certain part, thereby providing users with a more economical and practical testing solution.
[0045] The above is a specific description of the preferred implementation of the present invention, but the invention is not limited to the embodiments. Those skilled in the art can make various equivalent modifications or substitutions without violating the spirit of the present invention. These equivalent modifications or substitutions are all included in the scope defined by the claims of this application.
Claims
1. An RDC test fixture, characterized in that: It includes a base, a PCB test board, a test positioning board, a test pressure head and an elastic connection component, wherein: The PCB test board is detachably mounted on the base, the test positioning plate is detachably mounted on the PCB test board, one end of the test pressure head faces the test positioning plate and is tightly attached to the PCB test board, and the other end is detachably mounted on the elastic connection component; the elastic connection component is used to drive the test pressure head to move toward the test positioning plate so that the test pressure head presses the tested components onto the test positioning plate.
2. The RDC test fixture according to claim 1, characterized in that: The elastic connection assembly includes a connection block, a spring and a connection shaft, wherein: The test pressure head is detachably mounted on the connecting block, and the other end of the connecting block is connected to the connecting shaft; the spring sleeve is arranged on the connecting shaft and is tightly attached to the connecting block, and the other end of the connecting shaft passes through a first through hole arranged on the base.
3. The RDC test fixture according to claim 2, characterized in that: The base is recessed downward to form an empty slot, and the elastic connecting component is accommodated in the empty slot.
4. The RDC test fixture according to claim 2, characterized in that: A handle is disposed at the end of the connecting shaft after passing through the first through hole.
5. The RDC test fixture according to claim 4, characterized in that: The connecting block is provided with a second through hole, a guide pin is slidably connected in the second through hole, and the other end of the guide pin is fixedly connected in the base.
6. The RDC test fixture according to claim 4, characterized in that: The base is also provided with a buckle and a buckle fixing pin. The buckle is arranged in the niche of the base through the buckle fixing pin. One end of the buckle is exposed in the niche, and the other end can move freely between the niche and the handle.
7. The RDC test fixture according to claim 1, characterized in that: The test positioning plate is an inclined surface structure facing the test pressure head, a guide groove is provided at the center of the inclined surface, and chamfers for positioning components are provided on both sides; the test pressure head is a stepped structure facing one end of the test positioning plate, a notch-shaped limiting groove is provided at the center of the stepped structure, and the other end is an inclined surface structure, and a through hole is provided on the test pressure head.
8. The RDC test fixture according to claim 1, characterized in that: Lead terminals are reserved on the PCB test board for connecting test circuits.
9. The RDC test fixture according to claim 2, characterized in that: The spring elastic coefficient is 0.48-0.52 N / mm, the length is 14.8-15.2 mm, and the movable distance of the measured component is 0 mm-5 mm.
10. The RDC test fixture according to claim 1, characterized in that: The PCB test board and the base, the test positioning plate and the PCB test board, and the test pressure head and the elastic connection component are all detachably connected via screws and screw holes.