Multi-stage circuit current limiting system for laser radiation resistance
By designing a multi-stage circuit current limiting system for laser radiation resistance, using five types of current limiting circuits to detect and automatically limit the current in real time, the judgment delay problem in single-particle lock protection in the prior art is solved, ensuring the safety of the integrated circuit and improving the response speed.
Patent Information
- Application Number
- CN202510054434.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-14
- Publication Date
- 2025-04-29
AI Technical Summary
The prior art has problems of delay in single-particle lock protection and slow response time, which leads to the inability of integrated circuits to limit current in time after single-particle locking occurs, which may lead to chip burning.
A multi-stage circuit current limiting system for laser radiation resistance is designed, which includes five types of current limiting circuits. Each type of current limiting circuit detects the current value of the integrated circuit in real time through different methods (such as sampling resistors, Hall devices, load switches, etc.), and automatically cuts off the power supply when the current limit is exceeded to ensure the safety of the integrated circuit.
Through real-time detection and automatic current limiting, the problem of judgment delay is effectively solved, ensuring that the integrated circuit can perform current limiting in time after single particles are locked, avoid chip burning, and improve the system's response speed.
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Figure CN119905963A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of satellite communications, and in particular to a multi-stage circuit current limiting system for laser radiation resistance. Background Art
[0002] During the operation in space, the onboard satellite system faces a complex space environment, among which space radiation protection is something that every onboard satellite needs to consider. Single-particle lock protection is an important part of space radiation protection. After a single-particle lock occurs in an integrated circuit, the chip current will increase rapidly. If no protection is performed, the integrated circuit will burn out, causing irreversible failures. Therefore, current limiting of the integrated circuit is an effective measure for single-particle protection. After a single-particle lock occurs, current limiting measures are used to ensure that the integrated circuit current will not cause the chip to burn out, and the lock can be eliminated by powering off and then powering on the chip.
[0003] Figure 1 Disclosed is a power supply current limiting circuit and method for integrated circuit single particle lock protection, which can set different limiting currents according to specific integrated circuits, and adapt to different current limiting requirements by adjusting the sampling resistor and the reference resistor. By comparing the sampling voltage with the reference voltage, it is determined whether the integrated circuit is single particle locked, and this current limiting circuit will automatically shut down and restart the power supply of the integrated circuit in the event of overcurrent, thereby eliminating the single particle lock. However, this method only protects and limits single-channel current, the comparator response time is slow, and it also needs to pass through the delay and shaping processing circuit, the overall circuit response time is slow, and there are obvious application defects such as judgment delay. Summary of the invention
[0004] The present invention provides a multi-stage circuit current limiting system for laser radiation resistance, which can solve the problem of judgment delay.
[0005] The technical solution adopted by the present invention to solve its technical problem is: to provide a laser radiation resistant multi-level circuit current limiting system, including multiple power supplies, the multiple power supplies are used to provide different levels of power to the integrated circuit under test; the enable end of each power supply is connected to the timing control chip, and five types of current limiting circuits are arranged between each power supply and the integrated circuit under test, wherein the first type of current limiting circuit obtains the output current of the power supply through the integrated circuit under test, and uses the universal input and output port to control the restart end of the timing control chip when the output current exceeds the current limit; the second type of current limiting circuit uses a sampling resistor to The real-time current value output by the power supply is converted into a voltage value, and the timing control chip is controlled based on the comparison result between the voltage value and a preset reference voltage; the third type of current limiting circuit obtains the output current of the power supply, and uses the I2C bus to control the current limiting part of the power supply when the output current exceeds the current limit; the fourth type of current limiting circuit converts the real-time current value output by the power supply into a voltage value through a Hall device, and controls the timing control chip based on the comparison result between the voltage value and a preset reference voltage; the fifth type of current limiting circuit limits the output current of the power supply through a load switch.
[0006] The first type of current limiting circuit includes a sampling resistor and a current detection chip, one end of the sampling resistor is connected to the output end of the power supply, and the other end is connected to the power supply end of the integrated circuit under test, and the current detection chip is used to detect the current value passing through the sampling resistor; the output end of the current detection chip is connected to the I2C bus of the integrated circuit under test; the integrated circuit under test obtains the current value detected by the current detection chip, and uses the general input and output port to control the restart end of the timing control chip when the current value exceeds the current limit.
[0007] The second type of current limiting circuit includes a sampling resistor, a current detection amplifier and a voltage comparator; one end of the sampling resistor is connected to the output end of the power supply, and the other end is connected to the power supply end of the integrated circuit under test; the current detection amplifier is used to detect the current value passing through the sampling resistor and convert the current value into a voltage value; the inverting input end of the voltage comparator is connected to the output end of the current detection amplifier, the non-phase input end is connected to the preset reference voltage, and the output end is connected to the input end of the timing control chip; when the voltage value is greater than the preset reference voltage, the output of the voltage comparator controls the timing control chip to cut off the power supply.
[0008] A delay circuit is also arranged between the output end of the voltage comparator and the input end of the timing control chip.
[0009] The third type of current limiting circuit includes a digital potentiometer, a sampling resistor and a current detection chip. The digital potentiometer is connected to the I2C bus of the integrated circuit under test as the current limiting part of the power supply; one end of the sampling resistor is connected to the output end of the power supply, and the other end is connected to the power supply end of the integrated circuit under test. The current detection chip is used to detect the current value passing through the sampling resistor; the output end of the current detection chip is connected to the I2C bus of the integrated circuit under test; the integrated circuit under test obtains the current value detected by the current detection chip, and uses the I2C bus to control the digital potentiometer when the current value exceeds the current limit to achieve real-time current limiting of the power supply.
[0010] The fourth type of current limiting circuit includes a Hall device and a voltage comparator, the positive terminal of the Hall device is connected to the output terminal of the power supply, the negative terminal is connected to the power supply terminal of the integrated circuit under test, the output terminal is connected to the inverting input terminal of the voltage comparator, the non-phase input terminal of the voltage comparator is connected to a preset reference voltage, and the output terminal is connected to the input terminal of the timing control chip; when the voltage value of the output terminal of the Hall device is greater than the preset reference voltage, the output of the voltage comparator controls the timing control chip to cut off the power supply.
[0011] A delay circuit is also arranged between the output end of the voltage comparator and the input end of the timing control chip.
[0012] The fifth type of current limiting circuit includes a load switch, the input end of the load switch is connected to the output end of the power supply, the output end is connected to the power supply end of the integrated circuit under test, the setting end of the load switch is connected to a current limiting resistor, and the current limiting resistor is used to adjust the clamping current of the load switch.
[0013] Beneficial Effects
[0014] Due to the adoption of the above-mentioned technical scheme, the present invention has the following advantages and positive effects compared with the prior art: the present invention can set different limiting currents according to specific circuits and usage scenarios, and adapt to different current limiting requirements by adjusting resistance. In addition, in the circuit, according to the working current size and power-on timing of different sub-circuits, five types of current limiting circuits are used to judge in real time whether the circuit generates overcurrent, and this current limiting circuit will automatically shut down the power supply of the integrated circuit in the event of overcurrent until the current supply of the entire circuit is normal and then turned on again. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 It is a block diagram of a power supply current limiting circuit for integrated circuit single event lock protection in the prior art;
[0016] Figure 2It is a block diagram of a laser radiation resistant multi-stage circuit current limiting system according to an embodiment of the present invention;
[0017] Figure 3 is a graph showing changes in laser test current when the embodiment of the present invention is not used;
[0018] Figure 4 is a graph showing changes in laser test current when using an embodiment of the present invention;
[0019] Figure 5 This is a graph showing the laser test current variation when the embodiment of the present invention is used and the voltage is lowered. DETAILED DESCRIPTION
[0020] The present invention will be further described below in conjunction with specific embodiments. It should be understood that these embodiments are only used to illustrate the present invention and are not intended to limit the scope of the present invention. In addition, it should be understood that after reading the content taught by the present invention, those skilled in the art can make various changes or modifications to the present invention, and these equivalent forms fall within the scope limited by the appended claims of the application equally.
[0021] The embodiments of the present invention relate to a multi-stage circuit current limiting system for laser radiation resistance, such as Figure 2 As shown, it includes multiple power supplies, which are used to provide different levels of power to the integrated circuit under test; the enable end of each power supply is connected to the timing control chip, and five types of current limiting circuits are arranged between each power supply and the integrated circuit under test.
[0022] The first type of current limiting circuit in this embodiment obtains the output current of the power supply through the integrated circuit under test, and uses the general input and output port to control the restart terminal of the timing control chip when the output current exceeds the current limit.
[0023] The first type of current limiting circuit includes a sampling resistor and a current detection chip, one end of the sampling resistor is connected to the output end of the power supply, and the other end is connected to the power supply end of the integrated circuit under test, and the current detection chip is used to detect the current value passing through the sampling resistor; the output end of the current detection chip is connected to the I2C bus of the integrated circuit under test; the integrated circuit under test obtains the current value detected by the current detection chip, and uses the general input and output port to control the restart end of the timing control chip when the current value exceeds the current limit.
[0024] It is not difficult to find that the integrated circuit DUT under test in the current limiting circuit reads the current detection chip through I2C, and then uses GPIO to control the RST of the timing control chip to achieve active current limiting.
[0025] The second type of current limiting circuit converts the real-time current value output by the power supply into a voltage value through a sampling resistor, and controls the timing control chip based on a comparison result between the voltage value and a preset reference voltage.
[0026] The second type of current limiting circuit includes a sampling resistor, a current detection amplifier and a voltage comparator; one end of the sampling resistor is connected to the output end of the power supply, and the other end is connected to the power supply end of the integrated circuit under test; the current detection amplifier is used to detect the current value passing through the sampling resistor and convert the current value into a voltage value; the inverting input end of the voltage comparator is connected to the output end of the current detection amplifier, the non-phase input end is connected to the preset reference voltage, and the output end is connected to the input end of the timing control chip; when the voltage value is greater than the preset reference voltage, the output of the voltage comparator controls the timing control chip to cut off the power supply. In addition, a delay circuit can be set between the output end of the voltage comparator and the input end of the timing control chip, and the delay circuit can avoid the timing problem caused by overcurrent restart.
[0027] It can be seen that the second type of current limiting circuit converts the current value of the sampling resistor into a voltage value through the current detection amplifier, and the voltage comparator outputs the signal to the timing control chip according to the level of the positive and negative ends. When the current exceeds the current limiting setting (that is, the voltage value is greater than the preset voltage), the power supply is controlled to be shut down.
[0028] The third type of current limiting circuit obtains the output current of the power supply, and uses the I2C bus to control the current limiting part of the power supply when the output current exceeds the current limit.
[0029] The third type of circuit includes a digital potentiometer, a sampling resistor and a current detection chip. The digital potentiometer is connected to the I2C bus of the integrated circuit under test as the current limiting part of the power supply; one end of the sampling resistor is connected to the output end of the power supply, and the other end is connected to the power supply end of the integrated circuit under test. The current detection chip is used to detect the current value passing through the sampling resistor; the output end of the current detection chip is connected to the I2C bus of the integrated circuit under test; the integrated circuit under test obtains the current value detected by the current detection chip, and uses the I2C bus to control the digital potentiometer when the current value exceeds the current limit to achieve real-time current limiting of the power supply.
[0030] The third type of current limiting circuit in this embodiment uses a digital potentiometer to control the power supply with current limiting function, and the real-time adjustment of current limiting is achieved through the digital potentiometer.
[0031] The fourth type of current limiting circuit converts the real-time current value output by the power supply into a voltage value through a Hall device, and controls the timing control chip based on the comparison result between the voltage value and a preset reference voltage.
[0032] The fourth type of current limiting circuit includes a Hall device and a voltage comparator, wherein the positive terminal of the Hall device is connected to the output terminal of the power supply, the negative terminal is connected to the power supply terminal of the integrated circuit under test, the output terminal is connected to the inverting input terminal of the voltage comparator, the positive input terminal of the voltage comparator is connected to a preset reference voltage, and the output terminal is connected to the input terminal of the timing control chip; when the voltage value of the output terminal of the Hall device is greater than the preset reference voltage, the output of the voltage comparator controls the timing control chip to cut off the power supply. Similar to the second type of current limiting circuit, a delay circuit can also be set between the output terminal of the voltage comparator and the input terminal of the timing control chip, and the delay circuit can avoid the timing problem caused by overcurrent restart.
[0033] It is not difficult to find that the fourth type of current limiting circuit collects the current value of the line in real time through the Hall device, and converts the current value into a voltage value and outputs it to the voltage comparator. The voltage comparator outputs the signal to the timing control chip according to the level of the positive and negative ends. When the current exceeds the current limiting setting (that is, the voltage value is greater than the preset voltage), the power supply of the line is controlled to be shut down.
[0034] The fifth type of current limiting circuit limits the output current of the power supply through a load switch.
[0035] The fifth type of current limiting circuit includes a load switch, the input end of the load switch is connected to the output end of the power supply, the output end is connected to the power supply end of the integrated circuit under test, the setting end of the load switch is connected to a current limiting resistor, and the current limiting resistor is used to adjust the clamping current of the load switch.
[0036] The fifth type of current limiting circuit in this implementation can clamp the current in real time through the load switch, wherein the magnitude of the clamping current can be adjusted through the resistance value of the current limiting resistor.
[0037] The present invention is further described below by a laser radiation resistance current limiting test of a hardware single board. The background and conditions of the test are shown in Table 1.
[0038] Table 1 Laser radiation resistance current limiting test background and conditions
[0039]
[0040] Without the multi-level circuit current limiting system of this embodiment, when the laser irradiates the chip, each module of the chip is latched, and the current surges. After a period of time, the chip is deformed and damaged due to overheating, and the bulge is burned. The test data is as follows: Figure 3When the multi-level circuit current limiting system of this embodiment is added, the current increases when each module of the chip generates latching, and the current limiting circuit works to clamp the current at the current limiting value. After the single board service is hung, the latch current remains unchanged, and it can return to normal after powering off and then powering on again. The test data is as follows Figure 4 As shown. Based on the addition of the multi-level circuit current limiting system of this embodiment, the voltage is lowered, and the chip modules are not latched. When the laser irradiates the key module, the current drops after the single board service is hung. The test data is as follows Figure 5 shown.
[0041] From the above test data, it can be concluded that the multi-level circuit current limiting system using this embodiment can effectively protect the chip under laser radiation resistance test conditions, and limit the current to the current limiting point after latching occurs. After the system is powered off and reset, all hardware modules and chips can resume normal operation.
Claims
1. A multi-stage circuit current limiting system for laser radiation resistance, characterized in that: The invention comprises a plurality of power supplies, wherein the plurality of power supplies are used to provide different levels of power to the integrated circuit under test; the enable end of each power supply is connected to the timing control chip, and five types of current limiting circuits are arranged between each power supply and the integrated circuit under test, wherein the first type of current limiting circuit obtains the output current of the power supply through the integrated circuit under test, and uses the universal input and output port to control the restart end of the timing control chip when the output current exceeds the current limit; the second type of current limiting circuit converts the real-time current value output by the power supply into a voltage value through a sampling resistor, and controls the timing control chip based on the comparison result between the voltage value and a preset reference voltage; the third type of current limiting circuit obtains the output current of the power supply, and uses the I2C bus to control the current limiting part of the power supply when the output current exceeds the current limit; the fourth type of current limiting circuit converts the real-time current value output by the power supply into a voltage value through a Hall device, and controls the timing control chip based on the comparison result between the voltage value and a preset reference voltage; the fifth type of current limiting circuit limits the output current of the power supply through a load switch.
2. The multi-stage circuit current limiting system for laser radiation resistance according to claim 1 is characterized in that: The first type of current limiting circuit includes a sampling resistor and a current detection chip, one end of the sampling resistor is connected to the output end of the power supply, and the other end is connected to the power supply end of the integrated circuit under test, and the current detection chip is used to detect the current value passing through the sampling resistor; the output end of the current detection chip is connected to the I2C bus of the integrated circuit under test; the integrated circuit under test obtains the current value detected by the current detection chip, and uses the general input and output port to control the restart end of the timing control chip when the current value exceeds the current limit.
3. The multi-stage circuit current limiting system for laser radiation resistance according to claim 1 is characterized in that: The second type of current limiting circuit includes a sampling resistor, a current detection amplifier and a voltage comparator; one end of the sampling resistor is connected to the output end of the power supply, and the other end is connected to the power supply end of the integrated circuit under test; the current detection amplifier is used to detect the current value passing through the sampling resistor and convert the current value into a voltage value; the inverting input end of the voltage comparator is connected to the output end of the current detection amplifier, and the non-inverting input end is connected to a preset reference voltage. The output end is connected to the input end of the timing control chip; when the voltage value is greater than the preset reference voltage, the output of the voltage comparator controls the timing control chip to cut off the power supply.
4. The multi-stage circuit current limiting system for laser radiation resistance according to claim 3 is characterized in that: A delay circuit is also arranged between the output end of the voltage comparator and the input end of the timing control chip.
5. The multi-stage circuit current limiting system for laser radiation resistance according to claim 1 is characterized in that: The third type of current limiting circuit includes a digital potentiometer, a sampling resistor and a current detection chip. The digital potentiometer is connected to the I2C bus of the integrated circuit under test as the current limiting part of the power supply; one end of the sampling resistor is connected to the output end of the power supply, and the other end is connected to the power supply end of the integrated circuit under test. The current detection chip is used to detect the current value passing through the sampling resistor; the output end of the current detection chip is connected to the I2C bus of the integrated circuit under test; the integrated circuit under test obtains the current value detected by the current detection chip, and uses the I2C bus to control the digital potentiometer when the current value exceeds the current limit to achieve real-time current limiting of the power supply.
6. The multi-stage circuit current limiting system for laser radiation resistance according to claim 1 is characterized in that: The fourth type of current limiting circuit includes a Hall device and a voltage comparator, the positive terminal of the Hall device is connected to the output terminal of the power supply, the negative terminal is connected to the power supply terminal of the integrated circuit under test, the output terminal is connected to the inverting input terminal of the voltage comparator, the non-phase input terminal of the voltage comparator is connected to a preset reference voltage, and the output terminal is connected to the input terminal of the timing control chip; when the voltage value of the output terminal of the Hall device is greater than the preset reference voltage, the output of the voltage comparator controls the timing control chip to cut off the power supply.
7. The multi-stage circuit current limiting system for laser radiation resistance according to claim 6, characterized in that: A delay circuit is also arranged between the output end of the voltage comparator and the input end of the timing control chip.
8. The multi-stage circuit current limiting system for laser radiation resistance according to claim 1 is characterized in that: The fifth type of current limiting circuit includes a load switch, the input end of the load switch is connected to the output end of the power supply, the output end is connected to the power supply end of the integrated circuit under test, the setting end of the load switch is connected to a current limiting resistor, and the current limiting resistor is used to adjust the clamping current of the load switch.