Method for recycling photovoltaic module and auxiliary visual inspection method

Abstract

The invention discloses a method for recycling a photovoltaic module and an auxiliary visual inspection method, and the method comprises the steps: obtaining a first image of the photovoltaic module before a backboard layer is removed; according to the first image, the position of the bus bar in the contour of the photovoltaic module is identified, so that thickness measurement and grinding removal are carried out on the backboard layer; obtaining a second image of the photovoltaic module after the backboard layer is removed; according to the second image, identifying an under-grinding area or an over-grinding area on one side, back to the glass layer, of the battery piece; and judging the removal effect of the backboard layer according to the under-grinding area or the over-grinding area. According to the invention, the auxiliary visual detection method is applied to the recovery process of the photovoltaic module, and auxiliary thickness measurement is carried out on the backboard layer by obtaining the coordinate position of the bus bar in the photovoltaic module, so that the backboard layer can be removed; and after the back plate layer is removed, the removal effect of the back plate layer is identified by identifying the under-grinding area and the over-grinding area, so that the recovery efficiency and the intelligent degree of the photovoltaic module can be effectively improved, and the recovery cost is reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of photovoltaic component recycling, and in particular to a method for recycling photovoltaic components and an auxiliary visual detection method. Background Art

[0002] The annual retirement capacity of photovoltaic panels is more than 30 million kilowatts. With the increasing global attention to environmental protection and sustainable development, the recycling of waste photovoltaic panels has become the focus of the industry. In the future, the recycling and treatment of photovoltaics needs to improve the recycling rate and added value and deal with the pollution generated, reduce the impact on the ecological environment, and further enhance the carbon emission reduction effect of the new energy industry. At present, the treatment of photovoltaic panels is mainly divided into physical methods, chemical methods, thermal cracking and other categories. The physical method has been developed due to its advantages such as low energy consumption, low pollution and low carbon emissions.

[0003] The usual physical treatment method is to crush, screen, and sort the photovoltaic panels to obtain backboard particles, glass panel particles, EVA (Ethylene-Vinyl Acetate, ethylene-vinyl acetate copolymer) particles, and silicon particles. The particles are rich in valuable elements or heavy metal elements with high recycling value such as aluminum, copper, tin, silicon, and silver, as well as organic substances such as fluoride. Since the current photovoltaic component processing system has a limited degree of intelligence in the working process and requires a lot of manual participation, it is not conducive to improving the recycling efficiency. Therefore, it is urgent to improve the recycling equipment intelligently. Summary of the invention

[0004] In view of the deficiencies in the prior art, the present invention provides a method for recycling photovoltaic modules and an auxiliary visual detection method, which are beneficial to improving the recycling efficiency and intelligence level of photovoltaic modules, thereby reducing the recycling cost.

[0005] In order to achieve the above-mentioned purpose, the present invention adopts the following technical solutions:

[0006] An auxiliary visual inspection method for recycling photovoltaic modules, wherein the photovoltaic modules include a back plate layer, a battery sheet and a glass layer stacked in sequence, and the auxiliary visual inspection method includes:

[0007] Acquire a first image of the photovoltaic module before the backplane layer is removed;

[0008] According to the first image, the position of the bus bar within the outline of the photovoltaic module is identified, so as to measure the thickness and grind and remove the back plate layer based on the position of the bus bar;

[0009] Acquire a second image of the photovoltaic module after the backplane layer is removed;

[0010] According to the second image, identifying an under-polished area or an over-polished area on a side of the cell facing away from the glass layer;

[0011] The removal effect of the back plate layer is judged according to the under-grinding area or the over-grinding area.

[0012] As one of the implementation methods,

[0013] The step of acquiring the first image comprises:

[0014] Placing the first image acquisition module perpendicular to the transmission direction of the photovoltaic component and facing the side of the photovoltaic component where the glass layer is provided;

[0015] Two strip-shaped light sources are used to obliquely illuminate the bus bar area from opposite sides of the first image acquisition module;

[0016] And / or, the step of identifying the position of the bus bar within the outline of the photovoltaic assembly according to the first image comprises:

[0017] Performing binarization processing on the first image to obtain a first binary image;

[0018] Using a contour extraction algorithm to find contours in the first binary image;

[0019] Performing a minimum bounding rectangle operation on the contour found in the first binary image, screening the minimum bounding rectangle found by traversal according to the area and aspect ratio of the rectangle to determine a rectangular contour that meets the requirements;

[0020] The screened rectangular outlines are marked and displayed on the first image.

[0021] As one implementation manner, the step of identifying the under-grinding area includes:

[0022] Binarizing the second image to obtain a second binary image;

[0023] Accumulating the total area of ​​white pixels in the second binary image to obtain the area of ​​the under-grinded area;

[0024] The step of judging the removal effect of the back plate layer according to the under-grinding area or the over-grinding area comprises:

[0025] Finding contours in the second binary image using a contour extraction algorithm;

[0026] Performing a minimum bounding rectangle operation on the contour in the second binary image, screening the minimum bounding rectangle found through traversal according to the area and aspect ratio of the rectangle to determine a rectangular contour that meets the requirements;

[0027] From the selected rectangular contours, select the one with the largest area as the outermost contour corresponding to the photovoltaic module;

[0028] The under-grinding rate of the back plate layer is determined according to the ratio of the area of ​​the under-grinding region to the area surrounded by the outermost edge contour.

[0029] As one implementation manner, the step of identifying the over-grinding area includes:

[0030] Binarizing the second image to obtain a second binary image;

[0031] Accumulating the total area of ​​black pixels in the second binary image to obtain the area of ​​the over-grinded area;

[0032] The step of judging the removal effect of the back plate layer according to the under-grinding area or the over-grinding area comprises:

[0033] Finding the contour of the second binary image using a contour extraction algorithm;

[0034] Performing a minimum bounding rectangle operation on the contour in the second binary image found, screening the minimum bounding rectangle found by traversal according to the area and aspect ratio of the rectangle to determine the rectangular contour;

[0035] From the selected rectangular contours, select the one with the largest area as the outermost contour corresponding to the photovoltaic module;

[0036] The over-grinding rate of the back plate layer is determined according to the ratio of the area of ​​the over-grinding region to the area surrounded by the outermost edge contour.

[0037] As one implementation manner, the step of acquiring the second image includes:

[0038] A second image acquisition module is arranged perpendicular to the transmission direction of the photovoltaic module and faces the side of the photovoltaic module where the back plate layer is arranged, wherein the second image acquisition module comprises a line scan camera;

[0039] A line scan camera light source is used to obliquely illuminate a scanning area of ​​the second image acquisition module from one side of the second image acquisition module.

[0040] As one implementation mode, it also includes:

[0041] Binarizing the second image to obtain a second binary image;

[0042] identifying the texture of the glass layer according to the second binary image;

[0043] The integrity of the glass layer is determined based on the identified texture of the glass layer.

[0044] As one implementation manner, the step of judging the integrity of the glass layer according to the identified texture of the glass layer includes:

[0045] Finding contours in the second binary image using a contour extraction algorithm;

[0046] Performing a minimum bounding rectangle operation on the contour found in the second binary image, and counting the number of minimum bounding rectangles whose areas are smaller than a preset value found through traversal;

[0047] Whether the glass layer is complete is determined based on the number of minimum circumscribed rectangles whose areas are smaller than a preset value.

[0048] As one implementation mode, it also includes:

[0049] Acquire a third image of the photovoltaic assembly after the solar cell is removed;

[0050] Binarizing the third image to obtain a third binary image;

[0051] Threshold segmentation processing to separate the glass layer area and the residual battery cell area;

[0052] Accumulating the total area of ​​black pixels in the third binary image to obtain the area of ​​the residual battery cell region;

[0053] Using a contour extraction algorithm to find the contour of the third binary image;

[0054] Performing a minimum circumscribed rectangle operation on the contour in the third binary image, traversing to find the minimum circumscribed rectangle with the largest area as the outermost edge contour corresponding to the glass layer;

[0055] The separation effect of the glass layer is determined according to the ratio of the area of ​​the remaining battery cell region to the area surrounded by the outermost edge contour corresponding to the glass layer.

[0056] As one implementation manner, after obtaining the outermost edge contour corresponding to the glass layer, the method further includes:

[0057] The grabbing coordinates of the middle point corresponding to the glass layer in the third binary image are calculated.

[0058] Another object of the present invention is to provide a method for recycling photovoltaic modules, using the above-mentioned auxiliary visual detection method for recycling photovoltaic modules, comprising:

[0059] acquiring a first image of a photovoltaic assembly;

[0060] According to the first image, identifying the position of the bus bar within the outline of the photovoltaic assembly;

[0061] Taking the position of the busbar as a reference, measuring the thickness of the back plate layer and removing it by grinding;

[0062] Acquire a second image of the photovoltaic module after the backplane layer is removed;

[0063] According to the second image, identifying an under-polished area or an over-polished area on a side of the cell facing away from the glass layer;

[0064] The removal effect of the backplane layer is determined according to the under-ground area or the over-ground area.

[0065] This application applies the auxiliary visual detection method to the recycling process of photovoltaic modules. By obtaining the coordinate position of the busbar in the photovoltaic module, the backplane layer is assisted in thickness measurement so as to remove the backplane layer; and after the backplane layer is removed, the removal effect of the backplane layer is identified by identifying the under-grinded area and over-grinded area, which can effectively improve the efficiency and intelligence of photovoltaic module recycling and reduce the recycling cost. In addition, this application can further identify the damage state of the glass layer after removing the backplane layer, and can also evaluate the separation effect of the glass layer and the position coordinates of the glass layer after the glass layer is separated from the battery cell, so as to facilitate the robot arm to grasp it. BRIEF DESCRIPTION OF THE DRAWINGS

[0066] Figure 1 A schematic structural diagram of a photovoltaic assembly according to an embodiment of the present application is shown;

[0067] Figure 2 A schematic diagram showing a flow chart of an auxiliary visual inspection method in a photovoltaic module recycling process according to an embodiment of the present application;

[0068] Figure 3A A schematic diagram of a process for identifying a bus bar in an auxiliary visual inspection method for photovoltaic module recycling according to an embodiment of the present application is shown;

[0069] Figure 3B A schematic diagram showing a method of identifying bus bars during a photovoltaic module recycling process according to an embodiment of the present application is shown;

[0070] Figure 4A A schematic diagram of a process for identifying a backplane layer removal effect in an auxiliary visual inspection method for photovoltaic module recycling according to an embodiment of the present application is shown;

[0071] Figure 4B A schematic diagram showing a method of identifying the removal effect of a backplane layer during a photovoltaic module recycling process according to an embodiment of the present application;

[0072] Figure 5A schematic diagram of a process for identifying a glass layer separation effect in an auxiliary visual inspection method for photovoltaic module recycling according to an embodiment of the present application is shown;

[0073] Figure 6 A schematic diagram showing a process of a photovoltaic module recycling method according to an embodiment of the present application is shown;

[0074] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0075] In this application, the terms "disposed", "provided with", and "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral structure; it can be a mechanical connection, or an electrical connection; it can be a direct connection, or an indirect connection through an intermediate medium, or it can be an internal connection between two devices, elements, or components. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0076] The orientation or position relationship indicated by the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "radial", "circumferential", etc. are based on the orientation or position relationship shown in the drawings and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0077] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0078] In addition, some of the above terms may be used to express other meanings in addition to indicating orientation or positional relationship. For example, the term "on" may also be used to express a certain dependency or connection relationship in some cases. For those of ordinary skill in the art, the specific meanings of these terms in this application can be understood according to specific circumstances.

[0079] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0080] like Figure 1 As shown, a schematic diagram of the structure of the photovoltaic module 10 of this embodiment for recycling is shown, and the photovoltaic module 10 mainly includes a back plate layer 1, a battery cell 2 and a glass layer 3 stacked in sequence, and the two sides of the battery cell 2 can be bonded to the back plate layer 1 and the glass layer 3 through the EVA layer. The bus bar 4 is located on the surface of the battery cell 2 facing the back plate layer 1.

[0081] like Figure 2 As shown, an embodiment of the present application provides a method for recycling photovoltaic components, which uses auxiliary visual detection to improve the intelligence level of component recycling.

[0082] In one embodiment, the auxiliary visual detection method adopted by the recycling method mainly includes:

[0083] S10, obtaining a first image of the photovoltaic module before the backplane layer 1 is removed from the glass layer 3 side;

[0084] S20, identifying the position of the bus bar 4 within the outline of the photovoltaic module according to the first image, so as to measure the thickness and grind and remove the back plate layer 1 based on the position of the bus bar 4;

[0085] S30, acquiring a second image of the photovoltaic module after the back plate layer 1 is removed from the side of the cell 2 facing away from the glass layer 3;

[0086] S40, identifying an under-polished area or an over-polished area on the side of the cell 2 facing away from the glass layer 3 according to the second image;

[0087] S50, judging the removal effect of the back plate layer 1 according to the under-grinding area or the over-grinding area.

[0088] Different from the physical crushing and granulation of the photovoltaic module as a whole, the present application processes the photovoltaic module by first removing the backplane layer 1 and the glass layer 3 on both sides of the cell 2 and then recycling each layer. For example, the upper backplane layer 1 can be removed by grinding, and then the cell 2 can be separated and removed, and finally the glass layer 3 is left.

[0089] For example, during the process of recycling the photovoltaic modules 10, the photovoltaic modules 10 are carried on the surface of the conveyor assembly and are transferred and processed between various stations. In order to facilitate measurement and detection, this embodiment adopts the method of transferring with the glass layer 3 facing downward and the back plate layer 1 facing upward.

[0090] like Figure 3A and Figure 3BAs shown, in one embodiment, the first recognition component for identifying the busbar includes a first image acquisition module 11 and two strip light sources 12. The first image acquisition module 11 can be a camera for capturing and photographing the busbar area near the edge, and the strip light source 12 is used for fill light to eliminate the interference of external shadows and strong light on image processing. Specifically, the two strip light sources 12 are respectively arranged on opposite sides of the first image acquisition module 11, and irradiate toward the surface of the glass layer 3 at an inclined angle. Exemplarily, the irradiation angle of the strip light source 12 is designed to be adjustable, and the irradiation angle of the strip light source 12 can be designed to be 30° to 80°, for example, 45°.

[0091] In step S10, the step of using the first recognition component to acquire the first image to realize the position coordinate positioning of the busbar 4 may specifically include: (1) the first image acquisition module 11 is arranged perpendicular to the transmission direction of the photovoltaic module 10, facing the side of the photovoltaic module 10 where the glass layer 3 is arranged, for example, being arranged directly below the glass layer 3 and facing the surface of the glass layer 3; (2) two bar-shaped light sources 12 are used to obliquely illuminate the busbar 4 area from opposite sides of the first image acquisition module 11, and the two bar-shaped light sources 12 can be respectively located on both sides of the first image acquisition module 11 along the transmission direction of the photovoltaic module 10. The first image corresponds to the glass layer 3, the battery cell 2, the backplane layer 1 and the busbar 4.

[0092] In step S20, based on the first image, identifying the position of the bus bar 4 within the outline of the photovoltaic module 10 may specifically include:

[0093] S210 , binarizing the first image to obtain a first binary image, so as to conveniently separate the image area of ​​the bus bar 4 and the image area of ​​the battery cell 2 from the first binary image.

[0094] The first image may be a grayscale image, which is converted into a binary image after binarization. By using threshold segmentation, the foreground and the background can be clearly separated, and the photovoltaic module 10 can be separated from the background.

[0095] S220, using a contour extraction algorithm (findContours) to find contours in the first binary image;

[0096] S230, performing a minimum bounding rectangle operation on the contour in the first binary image found, screening the minimum bounding rectangle found by traversal according to the area and aspect ratio of the rectangle to determine a rectangular contour that meets the requirements;

[0097] S240: Mark the screened rectangular outlines and display them on the first image.

[0098] In step S240, the selected rectangular contours are the parts corresponding to the busbars 4, which can be highlighted with different colors or with thick outlines to be marked and prominently displayed on the first image. The coordinates of the busbars 4 can be used as reference coordinates for the thickness of the backplane layer 1 to be removed.

[0099] For example, after traversing the found contours, the contours are first filtered using the aspect ratio. If the aspect ratio is not within a specific ratio range, the contour is eliminated. Then, the filtered contours are secondary filtered using the pixel area. Contours smaller than a certain area are eliminated, and only the remaining contours are displayed in bold on the original image.

[0100] Since in step S230, a contour with a specific aspect ratio is found among the filtered minimum circumscribed rectangular contours, and the area is used to constrain the aspect ratio screening result, false detection caused by the aspect ratio of some small areas meeting the requirements can be avoided.

[0101] After the back plate layer 1 is measured for thickness and removed by grinding, the present embodiment can also utilize auxiliary visual detection and identification to evaluate the effect of the back plate layer 1 removal, thereby eliminating the manual identification process.

[0102] like Figure 4A and Figure 4B As shown, in one embodiment, the second recognition component for identifying the effect of backplane layer removal includes a second image acquisition module 21 and a line scan camera light source 22. The second image acquisition module 21 can be a line scan camera. In the recycling production line of the photovoltaic module 10, after the backplane side and 1 are removed, the photovoltaic module 10 can still be transported with the glass side facing down. At this time, the imaging of the backplane layer 1 is scanned and captured by setting a line scan camera at the top of the starting end.

[0103] In one embodiment, the step of acquiring the second image may specifically include:

[0104] (1) The second image acquisition module 21 is arranged perpendicular to the transmission direction of the photovoltaic module 10 and faces the side of the photovoltaic module 10 where the back plate layer 1 is arranged. The second image acquisition module 21 includes a line scan camera;

[0105] (2) A line scan camera light source 22 is used to obliquely illuminate the scanning area of ​​the second image acquisition module 21 from one side of the second image acquisition module 21 .

[0106] This embodiment uses a line scan camera in cooperation with a conveying component to scan a second image of the photovoltaic component, and utilizes a visual system composed of a second recognition component for removing the backplane layer to identify the effect of the backplane removal and determine the state of the glass layer (degree of fragmentation) after the backplane layer is removed.

[0107] For example, the illumination angle of the line scan camera light source 22 is designed to be adjustable, and the illumination angle of the line scan camera light source 22 can be designed to be 30° to 80°, for example, 45°. Setting an angle-adjustable line scan light for lighting can eliminate the interference of external shadows and strong light on image processing.

[0108] Specifically, in one embodiment, in step S40, the step of identifying the under-grinding area (i.e., under-grinding identification) may include:

[0109] S410, performing binarization processing on the second image to obtain a second binary image;

[0110] S420, using a threshold segmentation method to separate the under-polished area of ​​the backplane layer 1 (i.e., the foreground area) and the image area of ​​the cell 2 (i.e., the normal cell background area) from the second binary image;

[0111] S430, accumulating the total area of ​​white pixels in the second binary image to obtain the area of ​​the under-grinded region.

[0112] In the next step S50, the step of judging the removal effect of the back plate layer 1 according to the under-grinding area includes:

[0113] S510, using a contour extraction algorithm (findContours) to find contours in the second binary image;

[0114] S520, performing a minimum bounding rectangle operation on the contour in the second binary image, screening the minimum bounding rectangle found by traversal according to the area and aspect ratio of the rectangle, and determining a rectangular contour that meets the requirements; it should be noted that in this process, non-calibrated areas (such as the battery cell seams and the area where the copper strips are located) are removed;

[0115] S530, selecting the one with the largest area from among the selected rectangular contours as the outermost contour corresponding to the photovoltaic assembly 10;

[0116] S540, determining the under-grinding rate of the backplane layer 1 according to the ratio of the area of ​​the under-grinding region to the area surrounded by the outermost edge contour (pixel area).

[0117] Similar to the steps for identifying under-grinded areas, the steps for identifying over-grinded areas include:

[0118] S412, performing binarization processing on the second image to obtain a second binary image;

[0119] S422, separating the over-grinded area of ​​the cell 2 (i.e., the foreground area) and the image area of ​​the cell 2 (i.e., the normal cell background area) from the second binary image;

[0120] S432, accumulating the total area of ​​black pixels in the second binary image to obtain the area of ​​the over-grinding area;

[0121] In step S50, judging the removal effect of the back plate layer 1 according to the over-grinding area, the step S50 includes:

[0122] S510, using a contour extraction algorithm (findContours) to find the contour of the second binary image;

[0123] S520, performing a minimum bounding rectangle operation on the contour in the found second binary image, and screening the minimum bounding rectangle found by traversal according to the area and aspect ratio of the rectangle to determine the rectangular contour;

[0124] S530, selecting the one with the largest area from among the selected rectangular contours as the outermost contour corresponding to the photovoltaic assembly 10;

[0125] S550, determining the over-grinding rate of the back plate layer 1 according to the ratio of the area of ​​the over-grinding region to the area surrounded by the outermost edge contour.

[0126] After the backplane layer 1 is removed, it is also necessary to determine the effect of the backplane removal on the state of the glass layer (fragmentation degree) and identify broken and intact glass. In one embodiment, the auxiliary visual inspection method further includes:

[0127] S414, performing binarization processing on the second image to obtain a second binary image;

[0128] S424, using threshold segmentation to identify the texture of the glass layer 3 according to the second binary image;

[0129] S434: Determine the integrity of the glass layer 3 according to the identified texture of the glass layer 3.

[0130] In one implementation, step S434 may specifically include:

[0131] S4341, using a contour extraction algorithm to find the contour in the second binary image;

[0132] S4342, performing a minimum bounding rectangle operation on the contour in the found second binary image, and counting the number of minimum bounding rectangles whose areas are smaller than a preset value found through traversal;

[0133] S4343: Determine whether the glass layer 3 is intact based on the number of the smallest circumscribed rectangles whose areas are smaller than a preset value. If the number exceeds a certain value, it is considered to be broken glass, otherwise it is intact glass.

[0134] After step S50 of judging the removal effect of the backplane layer 1, in one embodiment, the separation effect of the glass layer 3 and the battery cell 2 can be further detected by auxiliary vision, and step S60 of positioning the glass layer 3 can be performed. The composition and arrangement of the third identification component in this step can be completely consistent with the second identification component.

[0135] Accordingly, if Figure 5 As shown, the auxiliary visual detection method also includes:

[0136] S610, acquiring a third image of the photovoltaic assembly 10 after the cell 2 is removed;

[0137] S620, performing binarization processing on the third image to obtain a third binary image;

[0138] S630: After the threshold segmentation process, the glass layer 3 region and the transmission component region can be separated, and the glass layer region (ie, the background region) and the residual cell region (ie, the foreground region) can be separated;

[0139] S640, accumulating the total area of ​​black pixels in the third binary image to obtain the area of ​​the remaining battery cell 2;

[0140] S650, using a contour extraction algorithm to find the contour of the third binary image;

[0141] S660, performing a minimum circumscribed rectangle operation on the contour in the third binary image found, traversing to find the minimum circumscribed rectangle with the largest area as the outermost edge contour corresponding to the glass layer 3;

[0142] S670, determining the separation effect of the glass layer 3 according to the ratio of the area of ​​the remaining battery cell 2 to the area surrounded by the outermost edge contour corresponding to the glass layer 3, for example, using a method of separating the glass layer 3 and the battery cell 2.

[0143] Wherein, in step S660, after obtaining the outermost edge contour corresponding to the glass layer 3, the method may further include: calculating the grabbing coordinates of the middle point corresponding to the glass layer 3 in the third binary image so as to facilitate grabbing by the robot arm.

[0144] It is understandable that if Figure 6 As shown, an embodiment of the present invention further provides a method for recycling photovoltaic modules, which adopts the above-mentioned auxiliary visual detection method and mainly includes:

[0145] S10, acquiring a first image of the photovoltaic assembly 10;

[0146] S20, identifying the position of the bus bar 4 within the outline of the photovoltaic component 10 according to the first image;

[0147] S200, taking the position of the bus bar 4 as a reference, measuring the thickness of the back plate layer 1 and removing it by grinding;

[0148] S30, acquiring a second image of the photovoltaic module 10 after the backplane layer 1 is removed;

[0149] S40, identifying an under-polished area or an over-polished area on the side of the cell 2 facing away from the glass layer 3 according to the second image;

[0150] S50, judging the removal effect of the back plate layer 1 according to the under-grinding area or the over-grinding area.

[0151] In some embodiments, the method for recycling photovoltaic modules may further include:

[0152] S500, separating the complete glass layer 3 and the battery cell 2;

[0153] S60, detecting the separation effect of the glass layer 3 and the battery cell 2, and positioning the glass layer 3;

[0154] S600, using a robot arm to grab the glass layer 3 and separate it from the conveying assembly.

[0155] The above is only a specific implementation of the present application. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present application. These improvements and modifications should also be regarded as the scope of protection of the present application.

Claims

1. An auxiliary visual inspection method for photovoltaic module recycling, characterized in that: The photovoltaic module comprises a back plate layer, a battery sheet and a glass layer stacked in sequence, and the auxiliary visual inspection method comprises: Acquire a first image of the photovoltaic module before the backplane layer is removed; According to the first image, the position of the bus bar within the outline of the photovoltaic module is identified, so as to measure the thickness and grind and remove the back plate layer based on the position of the bus bar; Acquire a second image of the photovoltaic module after the backplane layer is removed; According to the second image, identifying an under-polished area or an over-polished area on a side of the cell facing away from the glass layer; The removal effect of the back plate layer is judged according to the under-grinding area or the over-grinding area.

2. The auxiliary visual inspection method for photovoltaic module recycling according to claim 1, characterized in that: The step of acquiring the first image comprises: Placing a first image acquisition module perpendicular to the transmission direction of the photovoltaic component and facing a side of the photovoltaic component where the glass layer is provided; Two strip-shaped light sources are used to obliquely illuminate the bus bar area from opposite sides of the first image acquisition module; And / or, the step of identifying the position of the bus bar within the outline of the photovoltaic assembly according to the first image comprises: Performing binarization processing on the first image to obtain a first binary image; Using a contour extraction algorithm to find contours in the first binary image; Performing a minimum bounding rectangle operation on the contour found in the first binary image, screening the minimum bounding rectangle found by traversal according to the area and aspect ratio of the rectangle to determine a rectangular contour that meets the requirements; The screened rectangular outlines are marked and displayed on the first image.

3. The auxiliary visual inspection method for photovoltaic module recycling according to claim 1, characterized in that: The step of identifying the under-grinded area comprises: Binarizing the second image to obtain a second binary image; Accumulating the total area of ​​white pixels in the second binary image to obtain the area of ​​the under-grinded area; The step of judging the removal effect of the back plate layer according to the under-grinding area or the over-grinding area comprises: Finding contours in the second binary image using a contour extraction algorithm; Performing a minimum bounding rectangle operation on the contour in the second binary image, screening the minimum bounding rectangle found through traversal according to the area and aspect ratio of the rectangle to determine a rectangular contour that meets the requirements; From the selected rectangular contours, select the one with the largest area as the outermost contour corresponding to the photovoltaic module; The under-grinding rate of the back plate layer is determined according to the ratio of the area of ​​the under-grinding region to the area surrounded by the outermost edge contour.

4. The auxiliary visual inspection method for photovoltaic module recycling according to claim 1, characterized in that: The step of identifying the over-grinding area comprises: Binarizing the second image to obtain a second binary image; Accumulating the total area of ​​black pixels in the second binary image to obtain the area of ​​the over-grinded area; The step of judging the removal effect of the back plate layer according to the under-grinding area or the over-grinding area comprises: Finding the contour of the second binary image using a contour extraction algorithm; Performing a minimum bounding rectangle operation on the contour in the second binary image found, screening the minimum bounding rectangle found by traversal according to the area and aspect ratio of the rectangle to determine the rectangular contour; From the selected rectangular contours, select the one with the largest area as the outermost contour corresponding to the photovoltaic module; The over-grinding rate of the back plate layer is determined according to the ratio of the area of ​​the over-grinding region to the area surrounded by the outermost edge contour.

5. The auxiliary visual inspection method for photovoltaic module recycling according to claim 1, characterized in that: The step of acquiring the second image comprises: A second image acquisition module is arranged perpendicular to the transmission direction of the photovoltaic module and faces the side of the photovoltaic module where the back plate layer is arranged, wherein the second image acquisition module comprises a line scan camera; A line scan camera light source is used to obliquely illuminate a scanning area of ​​the second image acquisition module from one side of the second image acquisition module.

6. The auxiliary visual inspection method for photovoltaic module recycling according to claim 1, characterized in that: Also includes: Binarizing the second image to obtain a second binary image; identifying the texture of the glass layer according to the second binary image; The integrity of the glass layer is determined based on the identified texture of the glass layer.

7. The auxiliary visual inspection method for photovoltaic module recycling according to claim 6, characterized in that: The step of judging the integrity of the glass layer according to the identified texture of the glass layer comprises: Finding contours in the second binary image using a contour extraction algorithm; Performing a minimum bounding rectangle operation on the contour found in the second binary image, and counting the number of minimum bounding rectangles whose areas are smaller than a preset value found through traversal; Whether the glass layer is complete is determined based on the number of minimum circumscribed rectangles whose areas are smaller than a preset value.

8. The auxiliary visual inspection method for photovoltaic module recycling according to any one of claims 1 to 7, characterized in that: Also includes: Acquire a third image of the photovoltaic assembly after the solar cell is removed; Binarizing the third image to obtain a third binary image; Threshold segmentation processing to separate the glass layer area and the residual battery cell area; Accumulating the total area of ​​black pixels in the third binary image to obtain the area of ​​the residual battery cell region; Using a contour extraction algorithm to find the contour of the third binary image; Performing a minimum circumscribed rectangle operation on the contour in the third binary image, traversing to find the minimum circumscribed rectangle with the largest area as the outermost edge contour corresponding to the glass layer; The separation effect of the glass layer is determined according to the ratio of the area of ​​the remaining battery cell region to the area surrounded by the outermost edge contour corresponding to the glass layer.

9. The auxiliary visual inspection method for photovoltaic module recycling according to claim 8, characterized in that: After obtaining the outermost edge contour corresponding to the glass layer, the method further includes: The grabbing coordinates of the middle point corresponding to the glass layer in the third binary image are calculated.

10. A method for recycling photovoltaic modules, characterized in that: The auxiliary visual inspection method for photovoltaic module recycling according to any one of claims 1 to 9 comprises: acquiring a first image of a photovoltaic assembly; According to the first image, identifying the position of the bus bar within the outline of the photovoltaic assembly; Taking the position of the busbar as a reference, measuring the thickness of the back plate layer and removing it by grinding; Acquire a second image of the photovoltaic module after the backplane layer is removed; According to the second image, identifying an under-polished area or an over-polished area on a side of the cell facing away from the glass layer; The removal effect of the back plate layer is judged according to the under-grinding area or the over-grinding area.

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