Test method, device, test apparatus, and storage medium

Abstract

The application discloses a test method, a test device, a test apparatus and a storage medium. The method comprises the following steps: performing an in-device coexistence (IDC) problem test procedure on a terminal; confirming whether the terminal detects an IDC problem in the IDC problem test procedure without obtaining a first test result; and generating a second test result for the terminal according to whether the terminal detects the IDC problem in the IDC problem test procedure.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of device testing, and in particular to a testing method and device, testing equipment and a storage medium. BACKGROUND

[0002] In the related art, a minimization of drive test (MDT) function of a wireless network (i.e., a radio access network (RAN)) is defined, and a terminal (also referred to as a user equipment (UE)) can transmit a measurement report (i.e., an MDT measurement report) for MDT via a control plane, and the terminal can output the MDT measurement report according to the definition in the related art. Wireless network quality analysis can be performed by checking a signaling flow and measurement results in the MDT measurement report, which can minimize the workload of drive tests (DTs). In the related art, MDT data (e.g., data in the MDT measurement report) can be collected in two different modes, i.e., an immediate mode and a logged mode. For the logged mode, an in-device co-existence (IDC) mechanism is introduced in the MDT in the related art. In order to verify whether the MDT function of the terminal has an IDC mechanism that meets the requirements of the related art, a test mechanism for an IDC problem is defined in the related art.

[0003] However, the test mechanism in the related art can not accurately determine whether the terminal correctly supports the related function of the IDC problem, i.e., whether the MDT function of the terminal has an IDC mechanism that meets the requirements of the related art. SUMMARY

[0004] To solve the problems in the related art, embodiments of the present application provide a testing method, device, testing equipment and a storage medium.

[0005] The technical solutions of the embodiments of the present application are implemented as follows:

[0006] The embodiments of the present application provide a testing method, which includes the following steps.

[0007] performing an IDC problem test procedure on the terminal;

[0008] confirming whether the terminal detects an IDC problem in the IDC problem test procedure without obtaining the first test result;

[0009] According to whether the terminal detects IDC problem in the IDC problem test procedure, a second test result for the terminal is generated.

[0010] In the foregoing solution, the confirming whether the terminal detects IDC problem in the IDC problem test procedure comprises:

[0011] At least one test condition identical to the IDC problem test procedure is constructed;

[0012] For each test condition in the at least one test condition, at least one index associated with IDC problem is measured for the terminal, and at least one measurement result of the terminal is obtained;

[0013] The at least one measurement result is used to confirm whether the terminal detects IDC problem in the IDC problem test procedure.

[0014] In the foregoing solution, the confirming whether the terminal detects IDC problem in the IDC problem test procedure comprises:

[0015] In the process of executing the IDC problem test procedure on the terminal, for each test condition in the at least one test condition, at least one index associated with IDC problem is measured for the terminal, and at least one measurement result of the terminal is obtained;

[0016] The at least one measurement result is used to confirm whether the terminal detects IDC problem in the IDC problem test procedure.

[0017] In the foregoing solution, for the first test condition, at least one index associated with IDC problem is measured for the terminal;

[0018] Alternatively,

[0019] For the first test condition and the second test condition, at least one index associated with IDC problem is measured for the terminal respectively; wherein,

[0020] In the first test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in a minimum interval state;

[0021] In the second test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in a maximum interval state.

[0022] In the foregoing solution, in the second test condition, the first transmitter is configured to be in an off state.

[0023] The above solutions include at least one of the following metrics related to IDC issues:

[0024] The reference sensitivity of the first receiver of the terminal;

[0025] The throughput of the first receiver of the terminal.

[0026] In the above scheme, the step of using the at least one measurement result to confirm whether the terminal detected an IDC problem in the IDC problem testing process includes:

[0027] If at least one measurement result does not meet the first test requirement, it indicates that the terminal has detected an IDC problem in the IDC problem test process;

[0028] or,

[0029] If at least one measurement result meets the first test requirement, it indicates that the terminal did not detect an IDC problem in the IDC problem test process.

[0030] In the above scheme, the indicators associated with the first test requirement include N, where N is an integer greater than or equal to 1; satisfying the first test requirement includes at least one of the following:

[0031] At least one of the N indicators is better than or equal to the corresponding threshold;

[0032] The change in at least one of the N indicators is better than or equal to the corresponding threshold.

[0033] In the above scheme, satisfying the first test requirement includes at least one of the following:

[0034] The reference sensitivity of the first receiver of the terminal under the first test condition is better than or equal to the first threshold.

[0035] The throughput of the first receiver of the terminal under the first test condition is better than or equal to the second threshold.

[0036] The reference sensitivity change of the first receiver of the terminal under the first test conditions and the second test conditions is better than or equal to the third threshold.

[0037] The throughput change of the first receiver of the terminal under the first test conditions and the second test conditions is better than or equal to a fourth threshold; wherein...

[0038] Under the first test conditions, the working channels of the first receiver and the first transmitter of the terminal are configured to be in a minimum interval state;

[0039] In the second test condition, the operating channel of the first receiver of the terminal and the operating channel of the first transmitter are configured as a maximum interval state.

[0040] In the above solution, the method further includes:

[0041] The third threshold and / or the fourth threshold are determined by using the capability level of the terminal, and different capability levels correspond to different third thresholds and / or fourth thresholds.

[0042] In the above solution, the second test result for the terminal is generated according to whether the terminal detects an IDC problem in the IDC problem test procedure, and the second test result includes:

[0043] In a case where the terminal detects an IDC problem in the IDC problem test procedure, the second test result indicates that the terminal fails the test.

[0044] In a case where the terminal does not detect an IDC problem in the IDC problem test procedure, the second test result indicates that the terminal passes the test.

[0045] Embodiments of the present application also provide a test method, including:

[0046] Confirming whether a terminal detects an IDC problem;

[0047] In a case where it is confirmed that the terminal detects an IDC problem, performing an IDC problem test procedure on the terminal to generate a third test result for the terminal; or

[0048] In a case where it is confirmed that the terminal does not detect an IDC problem, performing an IDC problem construction procedure on the terminal; after the IDC problem construction procedure is completed, performing an IDC problem test procedure on the terminal to generate a third test result for the terminal.

[0049] In the above solution, the confirmation of whether the terminal detects an IDC problem includes:

[0050] Constructing at least one test condition;

[0051] For each test condition in the at least one test condition, measuring at least one index associated with an IDC problem for the terminal to obtain at least one measurement result of the terminal;

[0052] Confirming whether the terminal detects an IDC problem by using the at least one measurement result.

[0053] In the above solution, the index associated with an IDC problem includes at least one of the following:

[0054] a reference sensitivity of a second receiver of the terminal;

[0055] a throughput of the second receiver of the terminal.

[0056] In the foregoing solution, the confirming whether the terminal detects the IDC problem by using the at least one measurement result comprises:

[0057] In a case where the at least one measurement result meets a second test requirement, it is indicated that the terminal does not detect the IDC problem;

[0058] Or,

[0059] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in the non-closed state, and the at least one measurement result meets the second test requirement when the second transmitter of the terminal is configured to be in the closed state, it is indicated that the terminal detects the IDC problem.

[0060] In the foregoing solution, the method further comprises:

[0061] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in the closed state, or,

[0062] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in the non-closed state, and the at least one measurement result also does not meet the second test requirement when the second transmitter of the terminal is configured to be in the closed state,

[0063] generating a fourth test result for the terminal, the fourth test result indicating that the terminal fails the test.

[0064] In the foregoing solution, the indicators associated with the second test requirement comprise N, N being an integer greater than or equal to 1; the at least one of the following is met to meet the second test requirement:

[0065] at least one of the N indicators is better than or equal to a corresponding threshold value;

[0066] a change amount of at least one of the N indicators is better than or equal to a corresponding threshold value.

[0067] In the foregoing solution, the at least one of the following is met to meet the second test requirement:

[0068] a reference sensitivity of the second receiver of the terminal under a third test condition is better than or equal to a fifth threshold value;

[0069] a throughput of the second receiver of the terminal under the third test condition is better than or equal to a sixth threshold value.

[0070] The reference sensitivity variation of the second receiver of the terminal under the third test condition and the fourth test condition is better than or equal to a seventh threshold value;

[0071] The throughput variation of the second receiver of the terminal under the third test condition and the fourth test condition is better than or equal to an eighth threshold value; wherein,

[0072] Under the third test condition, the operating channel of the second receiver of the terminal and the operating channel of the second transmitter are configured to be in a maximum interval state;

[0073] Under the fourth test condition, the operating channel of the second receiver of the terminal and the operating channel of the second transmitter are configured to be in a minimum interval state.

[0074] In the above scheme, the method further comprises:

[0075] Constructing at least one test condition;

[0076] For each test condition in the at least one test condition, measuring at least one index associated with the IDC problem for the terminal to obtain at least one measurement result of the terminal;

[0077] In a case where the at least one measurement result does not meet a second test requirement when the second transmitter of the terminal is configured to be in the off state, or,

[0078] In a case where the at least one measurement result does not meet a second test requirement when the second transmitter of the terminal is configured to be in the off state, and the at least one measurement result also does not meet the second test requirement when the second transmitter of the terminal is configured to be in the off state,

[0079] Generating a fourth test result for the terminal, the fourth test result indicating that the terminal fails the test.

[0080] In the above scheme, after the IDC problem construction process is executed, the IDC problem test process for the terminal comprises:

[0081] In a case where the IDC problem construction process is executed and the IDC problem is detected by the terminal, the IDC problem test process for the terminal is executed.

[0082] In the IDC problem construction process, the working channel of the second receiver and the working channel of the second transmitter of the terminal are configured to be close to each other, or the working channel of the second transmitter is configured to be close to the working channel of the second receiver, or the working channel of the second receiver is configured to be close to the working channel of the second transmitter, based on the fifth test condition as the initial test condition; and in the fifth test condition, the working channel of the second receiver and the working channel of the second transmitter of the terminal are configured to be in a maximum interval state, and the second transmitter is configured to be in an unshut state.

[0083] In the case of a change in the test condition, at least one indicator associated with the IDC problem is measured for the terminal, and at least one measurement result of the terminal is obtained.

[0084] In the case that the at least one measurement result does not meet the third test requirement, it is determined that the IDC problem construction process is completed, and the terminal detects the IDC problem.

[0085] In the above solution, the indicators associated with the third test requirement include N, and N is an integer greater than or equal to 1; the third test requirement is met in at least one of the following ways:

[0086] At least one of the N indicators is better than or equal to a corresponding threshold value;

[0087] The change amount of at least one of the N indicators is better than or equal to a corresponding threshold value.

[0088] In the above solution, the third test requirement is met in at least one of the following ways:

[0089] The reference sensitivity of the second receiver of the terminal is better than or equal to a ninth threshold value;

[0090] The throughput of the second receiver of the terminal is better than or equal to a tenth threshold value;

[0091] The change amount of the reference sensitivity of the second receiver of the terminal under the current test condition and the fifth test condition is better than or equal to an eleventh threshold value;

[0092] The change amount of the throughput of the second receiver of the terminal under the current test condition and the fifth test condition is better than or equal to a twelfth threshold value.

[0093] In the above solution, the IDC problem construction process for the terminal includes:

[0094] The first signal is configured to the terminal, and the first signal can enable the terminal to detect the IDC problem.

[0095] The embodiment of the application further provides a testing device, comprising:

[0096] a first testing unit, configured to perform an IDC problem testing procedure on the terminal;

[0097] a first confirming unit, configured to confirm whether the terminal detects an IDC problem in the IDC problem testing procedure in a case where the first testing result is not obtained;

[0098] a second testing unit, configured to generate a second testing result for the terminal according to whether the terminal detects an IDC problem in the IDC problem testing procedure.

[0099] The embodiment of the application further provides a testing device, comprising:

[0100] a second confirming unit, configured to confirm whether the terminal detects an IDC problem;

[0101] a third testing unit, configured to perform an IDC problem testing procedure on the terminal to generate a third testing result for the terminal in a case where it is confirmed that the terminal detects an IDC problem, or perform an IDC problem construction procedure on the terminal in a case where it is confirmed that the terminal does not detect an IDC problem, and perform an IDC problem testing procedure on the terminal to generate a third testing result for the terminal after the IDC problem construction procedure is performed.

[0102] The embodiment of the application further provides a testing device, comprising: a communication interface and a processor; wherein,

[0103] the processor is configured to perform an IDC problem testing procedure on the terminal, confirm whether the terminal detects an IDC problem in the IDC problem testing procedure in a case where a first testing result is not obtained, and generate a second testing result for the terminal according to whether the terminal detects an IDC problem in the IDC problem testing procedure;

[0104] or,

[0105] the processor is configured to confirm whether the terminal detects an IDC problem, and perform an IDC problem testing procedure on the terminal to generate a third testing result for the terminal in a case where it is confirmed that the terminal detects an IDC problem, or perform an IDC problem construction procedure on the terminal in a case where it is confirmed that the terminal does not detect an IDC problem, and perform an IDC problem testing procedure on the terminal to generate a third testing result for the terminal after the IDC problem construction procedure is performed.

[0106] The embodiment of the present application further provides a test device, comprising a processor and a memory for storing a computer program capable of running on the processor,

[0107] The processor is configured to execute the steps of any of the above methods when running the computer program.

[0108] The embodiment of the present application further provides a storage medium having a computer program stored thereon, wherein the computer program is configured to implement the steps of any of the above methods when executed by a processor.

[0109] The test method, the test device and the storage medium provided by the embodiment of the present application perform the IDC problem test procedure on the terminal; in the case where the first test result is not obtained, it is confirmed whether the terminal detects the IDC problem in the IDC problem test procedure; according to the confirmation of whether the terminal detects the IDC problem in the IDC problem test procedure, the second test result for the terminal is generated; or, it is confirmed whether the terminal detects the IDC problem; in the case where it is confirmed that the terminal detects the IDC problem, the IDC problem test procedure is performed on the terminal to generate the third test result for the terminal, or, in the case where it is confirmed that the terminal does not detect the IDC problem, the IDC problem construction procedure is performed on the terminal; after the IDC problem construction procedure is performed, the IDC problem test procedure is performed on the terminal to generate the third test result for the terminal. The scheme provided by the embodiment of the present application, after the IDC problem test procedure is performed on the terminal, in the case where the terminal does not pass the test, i.e., in the case where the test result (i.e., the first test result) that passes the test is not obtained, it is confirmed whether the terminal detects the IDC problem in the IDC problem test procedure, and the final test result for the terminal is generated according to the confirmation result; or, before the IDC problem test procedure is performed on the terminal, it is confirmed whether the terminal detects the IDC problem, in the case where it is confirmed that the terminal detects the IDC problem, the IDC problem test procedure is performed on the terminal, or, in the case where it is confirmed that the terminal does not detect the IDC problem, the IDC problem construction procedure is performed on the terminal to construct the IDC problem, and then the IDC problem test procedure is performed on the terminal; in this way, the case where the IDC problem does not occur in the process of performing the IDC problem test procedure on the terminal due to the excellent design of the terminal (i.e., the terminal can support the IDC mechanism and can improve the IDC problem) can be avoided to be misjudged as that the terminal does not pass the test, in other words, the qualified terminal that can support the IDC mechanism can be avoided to be misjudged as the unqualified terminal that cannot support the IDC mechanism, so that whether the terminal correctly supports the related function of the IDC problem can be accurately judged, i.e., whether the MDT function of the terminal has the IDC mechanism that meets the related technical requirements can be accurately judged. BRIEF DESCRIPTION OF DRAWINGS

[0110] Figure 1 A flowchart of a test method for an embodiment of the present application;

[0111] Figure 2 A flowchart of another test method for an embodiment of the present application;

[0112] Figure 3 A flowchart of a process for confirming whether a terminal detects an IDC problem for an embodiment of the present application;

[0113] Figure 4 A flowchart of an IDC problem construction process for an embodiment of the present application;

[0114] Figure 5 A flowchart of another IDC problem construction process for an embodiment of the present application;

[0115] Figure 6 A flowchart of a third IDC problem construction process for an embodiment of the present application;

[0116] Figure 7 A flowchart of a fourth IDC problem construction process for an embodiment of the present application;

[0117] Figure 8 A flowchart of a fifth IDC problem construction process for an embodiment of the present application;

[0118] Figure 9 A flowchart of a sixth IDC problem construction process for an embodiment of the present application;

[0119] Figure 10 A structural diagram of a test device for an embodiment of the present application;

[0120] Figure 11 A structural diagram of another test device for an embodiment of the present application;

[0121] Figure 12 A structural diagram of a test apparatus for an embodiment of the present application. DETAILED DESCRIPTION

[0122] The present application will be further described by the following embodiments with reference to the accompanying drawings.

[0123] In the related art, immediate mode MDT data collection is provided by the wireless network and the terminal providing measurement results. The terminal's measurements come from a radio resource control (RRC) measurement report. The wireless network can add power headroom in a medium access control (MAC) layer report, received interference power (RIP) measured on the physical radio interface layer by the cell antenna, and data volume, Internet protocol (IP) throughput, user plane packet delay reporting, and packet loss rate measured by the base station.

[0124] In logged mode, the terminal stores information related to access problems in idle mode, RRC setup failures, random access in handover, and radio link failure (which can include loss of connection and the like). The terminal's MDT event log (i.e., the MDT measurement report described above, which can also be referred to as an MDT report) is sent to the network when requested; after a loss of radio connection (i.e., a disconnection, i.e., a radio link disconnection), the terminal sends the MDT logged mode report (i.e., the MDT measurement report) after the next successful establishment of a radio connection.

[0125] In the related art, the IDC mechanism introduced in the MDT for the logging mode includes: once IDC problem is detected, the terminal suspends logging of the measurement report, and reports the IDC detection identifier (English can be expressed as InDeviceCoexDetected-r17) (the identifier can also be understood as a flag or a marker, English can be expressed as flag) through the measurement report; in other words, when the terminal detects IDC problem, the terminal suspends measurement logging and tags the MDT report with the IDC detection identifier in the measurement information table of the measurement logging (English can be expressed as logMeasInfoList-r16 in VarLogMeasReport). Once the IDC problem is resolved, the terminal will resume measurement logging (English can be expressed as resume the measurement logging) ; in other words, when the IDC problem detected by the terminal is resolved during the last logging interval, the terminal resumes measurement logging (English can be expressed as When the IDC problems detected by the UE is resolved during the last logging interval, UE resume measurement logging).

[0126] In the related art, in order to verify whether the MDT function of the terminal has the IDC mechanism meeting the requirements of the related art, the test mechanism of the IDC problem defined includes: introducing 2.4 gigahertz (GHz) wireless fidelity (Wi-Fi) as an interference source, interfering with the 2300-2400 megahertz (MHz) frequency band (Band n40) of new radio (NR), that is, n40 band, to construct IDC conditions, and then the behavior of whether the terminal will suspend logging and report the IDC detection (English can be expressed as InDeviceCoexDetected-r17) identifier (also can be understood as a flag or a marker, English can be expressed as flag) through the measurement report can be verified; and after the IDC problem is resolved, whether the terminal will have the behavior of resuming measurement logging.

[0127] However, some well-designed terminals can have solutions to improve IDC problems, such as avoiding 2.4 GHz Wi-Fi and Band n40 from working at the same time through software strategies, or adjusting Wi-Fi to a channel far from the working frequency point of the cellular network, or adjusting the working frequency point of the cellular network to a channel far from the working frequency point of Wi-Fi when interference is found. Therefore, even if the test environment is set to 2.4 GHz Wi-Fi and 2300-2400 MHz frequency band (i.e., Band n40), the terminal can not have IDC problems. According to the test mechanism of IDC problems defined in the related art, if a well-designed terminal does not have IDC problems and does not show the expected pause record state, the terminal will be misjudged as not correctly supporting the related functions of IDC problems; in other words, the test mechanism in the related art can not accurately determine whether the terminal correctly supports the related functions of IDC problems, i.e., whether the MDT function of the terminal has the IDC mechanism meeting the requirements of the related art.

[0128] Based on this, in various embodiments of the present application, after performing the IDC problem test procedure on the terminal, if the terminal does not pass the test, i.e., if the test result does not pass the test, it is confirmed whether the terminal detects IDC problems in the IDC problem test procedure, and a final test result for the terminal is generated according to the confirmation result; or, before performing the IDC problem test procedure on the terminal, it is first confirmed whether the terminal detects IDC problems, and then the IDC problem test procedure is performed on the terminal if it is confirmed that the terminal detects IDC problems, or the IDC problem test procedure is performed on the terminal after the IDC problem construction procedure is performed on the terminal to construct IDC problems if it is confirmed that the terminal does not detect IDC problems; in this way, it can be avoided that the case of "IDC problems do not occur in the process of performing the IDC problem test procedure on the terminal due to the well-designed terminal (which can be understood as the terminal being able to support the IDC mechanism and being able to improve IDC problems)" is misjudged as the terminal not passing the test, in other words, it can be avoided that the qualified terminal which can support the IDC mechanism is misjudged as the unqualified terminal which cannot support the IDC mechanism, so that it can be accurately determined whether the terminal correctly supports the related functions of IDC problems, i.e., whether the MDT function of the terminal has the IDC mechanism meeting the requirements of the related art.

[0129] Specifically, the embodiments of the present application provide a test method applied to a test device, such as a test terminal, as shown in the figure, the method comprising: Figure 1 as shown in the figure, the method comprising:

[0130] Step 101: performing an IDC problem test procedure on the terminal;

[0131] Step 102: confirming whether the terminal detects IDC problem in the IDC problem test procedure in the case that the first test result is not obtained;

[0132] Step 103: generating the second test result for the terminal according to the confirmation of whether the terminal detects IDC problem in the IDC problem test procedure.

[0133] In actual application, the terminal can also be referred to as UE, and can also be referred to as device. The test device can also be referred to as instrument, test instrument, test system or system simulator (English can be represented as System Simulator, SS) and the like. The name of the test device is not limited in the embodiments of the present application, as long as the function thereof is realized. In addition, it can be understood that the test device has the ability to interact with the terminal.

[0134] In actual application, the first test result can be understood as the result expected or anticipated by the IDC problem test procedure, that is, the first test result can represent that the terminal passes the IDC problem test or that the IDC problem test is successful. The specific form of the first test result can be set according to the requirement, which is not limited in the embodiments of the present application; for example, the first test result can specifically include the conclusion (English can be expressed as Verdict) of test pass (English can be expressed as Pass, P).

[0135] Specifically, in the process of performing the IDC problem test procedure on the terminal, the test device can construct at least one test condition (English can be expressed as test conditions or Pre-test conditions) expected or anticipated to enable the qualified terminal to detect IDC problem, such as setting the test environment to 2.4GHz WiFi and 2300-2400MHz frequency band (i.e. Band n40) to make the terminal produce IDC problem. Then, the test device can obtain the MDT report of the terminal, and in the case that the terminal has both of the following behaviors or only one of the following behaviors according to the MDT report (i.e. in the case that the terminal has the following behavior 1 and / or behavior 2 according to the MDT report), the test device can determine that the terminal passes the IDC problem test, that is, obtains the first test result:

[0136] Behavior 1, when the terminal detects IDC problem, the terminal suspends measurement logging and tags MDT report within DeviceCoexDetected-r17 flag in logMeasInfoList-r16 in VarLogMeasReport in the measurement information table of measurement logging (English can be expressed as When UE detects IDC problem, UE suspend measurement logging and tag MDT report within DeviceCoexDetected-r17 flag in logMeasInfoList-r16 in VarLogMeasReport);

[0137] Behavior 2, when the IDC problem detected by the terminal is resolved during the last logging interval, the terminal resumes measurement logging (English can be expressed as When the IDC problems detected by the UE is resolved during the last logging interval, UE resume measurement logging).

[0138] In actual application, in the case where it is determined according to the MDT report that the terminal does not have the above-mentioned behavior 1 and / or behavior 2, the test equipment can determine that the first test result is not obtained. At this time, the terminal can be either a non-conforming terminal (also can be called as a non-conforming terminal) that cannot correctly support the IDC mechanism, or a conforming terminal that does not have IDC problem due to good design (it can be understood that the terminal can support the IDC mechanism and can improve the IDC problem). Therefore, the test equipment needs to confirm whether the terminal detects IDC problem in the IDC problem test procedure.

[0139] In actual application, the test equipment can specifically adopt the following two ways to confirm whether the terminal detects IDC problem in the IDC problem test procedure:

[0140] Method 1, the way of testing and verifying IDC problem after testing; that is, after performing the IDC problem test procedure on the terminal, at least one test condition same as the IDC problem test procedure is reproduced, for each test condition, some specific indicators associated with IDC problem are measured on the terminal, and whether the terminal detects IDC problem in the IDC problem test procedure is confirmed by using the measurement result;

[0141] In a second mode, the IDC problem is tested first and verified afterwards. That is, during the IDC problem test procedure, the terminal is first measured for some specific indicators associated with IDC problem for each of the at least one test condition constructed. After the IDC problem test procedure is performed, the measurement results are used to confirm whether the terminal detects IDC problem in the IDC problem test procedure.

[0142] Based on this, in an embodiment, for the first mode, the confirming whether the terminal detects IDC problem in the IDC problem test procedure can include:

[0143] constructing at least one test condition identical to the IDC problem test procedure;

[0144] measuring the terminal for at least one indicator associated with IDC problem for each of the at least one test condition, to obtain at least one measurement result of the terminal;

[0145] using the at least one measurement result to confirm whether the terminal detects IDC problem in the IDC problem test procedure.

[0146] In another embodiment, for the second mode, the confirming whether the terminal detects IDC problem in the IDC problem test procedure can include:

[0147] during the IDC problem test procedure, measuring the terminal for at least one indicator associated with IDC problem for each of the at least one test condition constructed, to obtain at least one measurement result of the terminal;

[0148] using the at least one measurement result to confirm whether the terminal detects IDC problem in the IDC problem test procedure.

[0149] In actual application, the at least one test condition can be understood as a preset condition that is expected to enable a qualified terminal to detect IDC problem, and each test condition can be understood as a network test environment virtually constructed by the test device, or a simulated network test state.

[0150] Specifically, the terminal is internally provided with at least one receiver and at least one transmitter, there can be an IDC problem between one receiver (which can be denoted as a first receiver in the following description) and one transmitter (which can be denoted as a first transmitter in the following description), and the first transmitter is the interference source of the IDC problem. Through a test condition constructed by the test device, the working channel of the first receiver and the working channel of the first transmitter can be passively (understandably, configured to be) presented in a state corresponding to the test condition; the test device can measure at least one index associated with the IDC problem of the terminal in the state, such as measuring the reference sensitivity (expressed in English as Reference sensitivity) and / or the throughput of the first receiver; and according to the obtained at least one measurement result, it is confirmed whether the terminal detects the IDC problem in the IDC problem test process.

[0151] Based on this, in an embodiment, the index associated with the IDC problem can include at least one of the following:

[0152] the reference sensitivity (expressed in English as Reference Sensitivity) of the first receiver of the terminal;

[0153] the throughput of the first receiver of the terminal.

[0154] In actual application, the specific types of the first receiver and the first transmitter can be set according to test requirements, and embodiments of the present application do not limit this. Exemplarily, the type of the first receiver can include an NR receiver (i.e., a 5G receiver), a long term evolution (LTE) receiver (i.e., a 4G receiver), a 6G receiver, or a wireless local area network (WLAN) receiver, etc., and the first receiver can be a receiver of a cellular network or a receiver of a non-cellular network; correspondingly, the first transmitter can include a WLAN transmitter, a licensed assisted access (LAA) receiver, or other NR transmitters and / or LTE transmitters of a cellular operating mode working in an overlapping carrier / frequency band or an adjacent carrier / frequency band of the first receiver, i.e., the type of the first transmitter can be the same as or different from the type of the first receiver. In addition, in the case where the first receiver includes an NR receiver, the throughput of the first receiver can be obtained based on performance tests of synchronization blocks (SSBs) or channel state information reference signals (CSI-RSs).

[0155] In actual application, whether it is the above-mentioned mode 1 or mode 2, after obtaining the at least one measurement result of the terminal, the test device can determine whether the terminal detects an IDC problem in the IDC problem test procedure according to whether the at least one measurement result meets pre-set test requirements (which can be expressed in English as test requirements, and can be denoted as first test requirements in subsequent descriptions); in the case where the at least one measurement result does not meet the first test requirements, it can be determined that the terminal detects an IDC problem in the IDC problem test procedure; in the case where the at least one measurement result meets the first test requirements, it can be determined that the terminal does not detect an IDC problem in the IDC problem test procedure.

[0156] Based on this, in an embodiment, the determining whether the terminal detects an IDC problem in the IDC problem test procedure by using the at least one measurement result can include:

[0157] In the case where the at least one measurement result does not meet the first test requirements, it is characterized (which can be understood as determined) that the terminal detects an IDC problem in the IDC problem test procedure.

[0158] In another embodiment, the confirming whether the terminal detects IDC problem in the IDC problem test procedure using the at least one measurement result can comprise:

[0159] In a case where the at least one measurement result satisfies the first test requirement, it is characterized (may be understood as confirming) that the terminal does not detect IDC problem in the IDC problem test procedure.

[0160] In actual application, the first test requirement can comprise a threshold value corresponding to a specific index associated with IDC problem, which can comprise the following two types:

[0161] Type 1, absolute value threshold; it should be noted that the absolute value is not the mathematical absolute value, but is used to represent the opposite meaning of the relative value, which means a value directly obtained by measurement under a test condition, which can be positive or negative;

[0162] Type 2, relative value threshold; it can be understood as a threshold value of the change amount of the specific index obtained by measurement and calculation under at least two test conditions.

[0163] Based on this, in an embodiment, the index associated with the first test requirement can contain N, N is an integer greater than or equal to 1; satisfying the first test requirement can comprise at least one of the following:

[0164] At least one of the N indexes is better than or equal to the corresponding threshold value;

[0165] The change amount of at least one of the N indexes is better than or equal to the corresponding threshold value.

[0166] In actual application, it can be understood that the number of indexes associated with IDC problem, the number of indexes measured by the terminal, and the number of indexes associated with the first test requirement can be the same or different. Exemplarily, assuming that the total number of indexes associated with IDC problem is 10, the test equipment can measure 5 indexes of the 10 indexes on the terminal, and the first test requirement can be associated with 3 indexes of the 10 indexes, as long as 1 or more indexes (here, the number of the multiple indexes is not greater than the smaller value (i.e., 3) of the number of indexes measured on the terminal (i.e., 5) and the number of indexes associated with the first test requirement (i.e., 3)) of the terminal measured by the test equipment can be better than or equal to the corresponding threshold value, it can be determined that the first test requirement is satisfied; otherwise, it can be determined that the first test requirement is not satisfied.

[0167] In practical application, the actual concept of "better than" depends on whether the corresponding index value is positive or negative. Illustratively, since the value of reference sensitivity is negative, the greater the value of reference sensitivity, the worse the characteristic sensitivity, i.e., the smaller the value of reference sensitivity is better, so the reference sensitivity is better than the corresponding threshold, which means that the reference sensitivity is less than the corresponding threshold; for throughput, since the value of throughput is positive, the greater the value of throughput is better, so the throughput is better than the corresponding threshold, which means that the throughput is greater than the corresponding threshold.

[0168] In practical application, it can be seen from the above description that, in the case where the first test requirement includes an absolute value threshold (i.e., the above-mentioned type 1 threshold), the test equipment can perform measurement of at least one index associated with the IDC problem on the terminal in only one test condition, whether it is the above-mentioned mode 1 or mode 2. In this test condition, the test equipment can configure the operating channel of the first receiver and the operating channel of the first transmitter of the terminal to be in the minimum interval state.

[0169] Based on this, in an embodiment, for the above-mentioned mode 1 and mode 2, in the case where the first test requirement includes an absolute value threshold (i.e., the above-mentioned type 1 threshold), the measurement of at least one index associated with the IDC problem on the terminal can include:

[0170] For the first test condition, the measurement of at least one index associated with the IDC problem on the terminal; wherein, in the first test condition, the operating channel of the first receiver and the operating channel of the first transmitter of the terminal are configured to be in the minimum interval state.

[0171] Correspondingly, the satisfaction of the first test requirement can include at least one of the following:

[0172] The reference sensitivity of the first receiver of the terminal in the first test condition is better than (i.e., less than) or equal to the first threshold;

[0173] The throughput of the first receiver of the terminal in the first test condition is better than (i.e., greater than) or equal to the second threshold.

[0174] In practical application, from the above description, it can be seen that, in the case where the first test requirement comprises a relative value threshold (i.e. the threshold of type 2 described above), the test equipment needs to perform measurement of at least one index associated with the IDC problem on the terminal under at least two test conditions respectively to obtain the variation of each index, whether it is the mode 1 or the mode 2 described above. Therefore, in order to improve the test efficiency, the test equipment can respectively configure the working channel of the first receiver and the working channel of the first transmitter of the terminal to be in the minimum interval state and the maximum interval state under two test conditions, and perform measurement of at least one index associated with the IDC problem on the terminal under the two test conditions respectively.

[0175] Based on this, in an embodiment, for the mode 1 and the mode 2 described above, in the case where the first test requirement comprises a relative value threshold (i.e. the threshold of type 2 described above), the measurement of at least one index associated with the IDC problem on the terminal can comprise:

[0176] performing measurement of at least one index associated with the IDC problem on the terminal under a first test condition and a second test condition respectively; wherein, under the first test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in the minimum interval state; and under the second test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in the maximum interval state.

[0177] Correspondingly, the satisfaction of the first test requirement can comprise at least one of the following:

[0178] the reference sensitivity of the first receiver of the terminal under the first test condition is better than (i.e. less than) or equal to a first threshold;

[0179] the throughput of the first receiver of the terminal under the first test condition is better than (i.e. greater than) or equal to a second threshold;

[0180] the variation of the reference sensitivity of the first receiver of the terminal under the first test condition and the second test condition is better than (i.e. less than) or equal to a third threshold;

[0181] the variation of the throughput of the first receiver of the terminal under the first test condition and the second test condition is better than (i.e. less than) or equal to a fourth threshold.

[0182] In actual application, in the second test condition, in order to configure the working channel of the first receiver of the terminal and the working channel of the first transmitter to be in the maximum interval state, the test device can configure the first transmitter to be in the off state. Specifically, the first transmitter configured to be in the off state can include the following two cases:

[0183] Case 1: power off the first transmitter;

[0184] Case 2: stop the first transmitter from transmitting signals.

[0185] In actual application, the specific values of the first threshold, the second threshold, the third threshold and the fourth threshold can be pre-set according to test requirements. Alternatively, a correlation between different capability levels of the terminal and different values of the thresholds (i.e., the first threshold, the second threshold, the third threshold and the fourth threshold) can be pre-set, and the test device can determine the specific values of the thresholds (i.e., the first threshold, the second threshold, the third threshold and the fourth threshold) according to the capability level of the terminal. For example, a correlation between different capability levels of the terminal and different values of the third threshold and / or the fourth threshold can be pre-set: the first capability level (default capability level) is associated with 3 decibels (dB) (i.e., the third threshold is 3 dB) and / or 50% (i.e., the fourth threshold is 50%), the second capability level is associated with 6 dB (i.e., the third threshold is 6 dB) and / or 75% (i.e., the fourth threshold is 75%), and the third capability level is associated with 1.5 dB (i.e., the third threshold is 1.5 dB) and / or 25% (i.e., the fourth threshold is 25%). The terminal can declare (in English, it can be expressed as declaration) its capability level to the test device by reporting the identifier of the capability level or directly reporting the specific value of the third threshold and / or the fourth threshold, etc. The test device can determine the specific values of the third threshold and / or the fourth threshold according to the capability level declared by the terminal, as the basis for judging whether the terminal detects the IDC problem in the IDC problem test process.

[0186] Based on this, in an embodiment, the method can further include:

[0187] determining the third threshold and / or the fourth threshold according to the capability level of the terminal, wherein different capability levels correspond to different third thresholds and / or fourth thresholds.

[0188] In actual application, after confirming whether the terminal detects the IDC problem in the IDC problem test process, the final test result (i.e., the second test result) for the terminal can be generated according to the confirmation result.

[0189] Based on this, in an embodiment, the generating the second test result for the terminal according to the confirmation of whether the terminal detects IDC problem in the IDC problem test procedure can comprise:

[0190] In the case that the terminal detects IDC problem in the IDC problem test procedure, the second test result represents that the terminal fails the test;

[0191] In the case that the terminal does not detect IDC problem in the IDC problem test procedure, the second test result represents that the terminal passes the test.

[0192] Wherein, in actual application, the specific form of the second test result can be set according to requirements, and the embodiments of the present application do not limit this. Exemplarily, when the second test result represents that the terminal fails the test, the second test result can specifically comprise a test failure (English can be expressed as Fail, abbreviated as F) conclusion (English can be expressed as Verdict); when the second test result represents that the terminal passes the test, the second test result can specifically comprise a test pass (English can be expressed as Pass, abbreviated as P) conclusion.

[0193] In actual application, for example, assuming that the IDC problem is tested after testing and verified (i.e., the above-mentioned manner 1) to confirm whether the terminal detects the IDC problem in the IDC problem test procedure, assuming that the first test requirement comprises an absolute value threshold (i.e., the above-mentioned threshold type 1), assuming that the index associated with the first test requirement comprises the reference sensitivity of the first receiver of the terminal, and assuming that the first receiver is an NR Cell 1 receiver (which can be denoted as NR Cell 1 in the subsequent description) and the first transmitter is a WLAN access point 1 (Cell 27) transmitter (which can be denoted as WLAN AP 1 (Cell 27) in the subsequent description); the test conditions constructed by the system simulator (i.e., the test equipment) in the process of performing the IDC problem test procedure on the terminal and the test conditions constructed when confirming whether the terminal detects the IDC problem in the IDC problem test procedure are shown in Table 1, and the specific steps of the system simulator performing the IDC problem test procedure on the terminal and confirming whether the terminal detects the IDC problem in the IDC problem test procedure are shown in Table 2. In Table 1, "T0" represents the initial test condition; "T1" and "T2" represent two test conditions respectively constructed by the system simulator in the process of performing the IDC problem test procedure; "T3" represents the test condition identical to "T1" reproduced (i.e., reconstructed) by the system simulator when confirming whether the terminal detects the IDC problem in the IDC problem test procedure, i.e., "T3" is equivalent to the first test condition. In Table 2, the IDC problem test procedure specifically comprises steps 1-22, and the conclusion (English can be expressed as Verdict) P obtained in step 22 is the first test result; the specific procedure of the system simulator confirming whether the terminal detects the IDC problem in the IDC problem test procedure comprises steps 23-24.

[0194]

[0195]

[0196] Table 1

[0197]

[0198]

[0199]

[0200]

[0201]

[0202]

[0203] Table 2

[0204] In actual application, for example, assuming that the IDC problem is confirmed by the way of post-test and post-verification IDC problem (i.e. the above-mentioned way 1), assuming that the first test requirement comprises a relative value threshold (i.e. the above-mentioned type 2 threshold), assuming that the index associated with the first test requirement comprises the reference sensitivity of the first receiver of the terminal, and assuming that the first receiver is the NR Cell 1 receiver (which can be recorded as NR Cell 1 in the subsequent description) and the first transmitter is the WLAN AP 1 (Cell 27) transmitter (which can be recorded as WLAN AP 1 (Cell 27) in the subsequent description), the test conditions constructed by the system simulator (i.e. the test equipment) in the process of performing the IDC problem test procedure on the terminal and the test conditions constructed when confirming whether the terminal detects the IDC problem in the IDC problem test procedure are shown in Table 3, and the specific steps of the system simulator performing the IDC problem test procedure on the terminal and confirming whether the terminal detects the IDC problem in the IDC problem test procedure are shown in Table 4. In Table 3, “T0” represents the initial test condition; “T1” and “T2” represent two test conditions respectively constructed by the system simulator in the process of performing the IDC problem test procedure, and “T2” is equivalent to the second test condition; “T3” represents the test condition which is the same as “T1” and is reproduced (i.e. reconstructed) by the system simulator when confirming whether the terminal detects the IDC problem in the IDC problem test procedure, i.e. “T3” is equivalent to the first test condition. In Table 4, the IDC problem test procedure specifically comprises steps 1-22, and the conclusion (English can be expressed as Verdict) P obtained in step 22 is the first test result; the specific process of the system simulator confirming whether the terminal detects the IDC problem in the IDC problem test procedure comprises steps 23-26.

[0205]

[0206]

[0207] Table 3

[0208]

[0209]

[0210]

[0211]

[0212]

[0213]

[0214] Table 4

[0215] In actual application, for example, assuming that the IDC problem is confirmed in the way of testing first and verifying later (i.e. the above-mentioned way 2), assuming that the first test requirement comprises an absolute value threshold (i.e. the above-mentioned threshold of type 1), assuming that the index associated with the first test requirement comprises the reference sensitivity of the first receiver of the terminal, and assuming that the first receiver is the NR Cell 1 receiver (which can be denoted as NR Cell 1 in the following description) and the first transmitter is the WLAN AP 1 (Cell 27) transmitter (which can be denoted as WLAN AP 1 (Cell 27) in the following description), the test conditions constructed by the system simulator (i.e. the test equipment) in the process of performing the IDC problem test procedure on the terminal and the test conditions constructed when confirming whether the terminal detects the IDC problem in the IDC problem test procedure are shown in Table 5, and the specific steps of the system simulator performing the IDC problem test procedure on the terminal and confirming whether the terminal detects the IDC problem in the IDC problem test procedure are shown in Table 6. In Table 5, “T0” represents the initial test condition; “T1” and “T2” represent two test conditions respectively constructed by the system simulator in the process of performing the IDC problem test procedure, and “T1” is equivalent to the first test condition. In Table 6, the IDC problem test procedure specifically comprises steps 1-3, steps 3a-4, and steps 4a-22, and the conclusion (English can be expressed as Verdict) P obtained in step 22 is the first test result; the specific procedure of the system simulator confirming whether the terminal detects the IDC problem in the IDC problem test procedure comprises steps 3aa, 4aa, and 23.

[0216]

[0217] Table 5

[0218]

[0219]

[0220]

[0221]

[0222]

[0223] Table 6

[0224] In actual application, for example, assuming that the IDC problem is confirmed in the way of test-before-verify IDC problem (i.e. the above-mentioned way 2), assuming that the first test requirement comprises a relative value threshold (i.e. the above-mentioned type 2 threshold), assuming that the index associated with the first test requirement comprises the reference sensitivity of the first receiver of the terminal, and assuming that the first receiver is the NR Cell 1 receiver (which can be recorded as NR Cell 1 in the subsequent description) and the first transmitter is the WLAN AP 1 (Cell 27) transmitter (which can be recorded as WLAN AP 1 (Cell 27) in the subsequent description), the test conditions constructed by the system simulator (i.e. the test equipment) in the process of performing the IDC problem test procedure on the terminal and the test conditions constructed when confirming whether the terminal detects the IDC problem in the IDC problem test procedure are shown in Table 7, and the specific steps of the system simulator performing the IDC problem test procedure on the terminal and confirming whether the terminal detects the IDC problem in the IDC problem test procedure are shown in Table 8. In Table 7, “T0” represents the initial test condition, which is equivalent to the second test condition; “T1” and “T2” represent two test conditions respectively constructed by the system simulator in the process of performing the IDC problem test procedure, and “T1” is equivalent to the first test condition. In Table 8, the IDC problem test procedure specifically comprises steps 1-3, steps 3a-4, and steps 4a-22, and the conclusion (English can be expressed as Verdict) P obtained in step 22 is the first test result; the specific procedure of the system simulator confirming whether the terminal detects the IDC problem in the IDC problem test procedure comprises steps 3aa, 4aa, and 23.

[0225]

[0226]

[0227] Table 7

[0228]

[0229]

[0230]

[0231]

[0232]

[0233]

[0234] Table 8

[0235] The embodiments of the present application also provide a testing method applied to a testing device, such as Figure 2 as shown in the figure, the method comprises:

[0236] Step 201: confirming whether the terminal detects IDC problem;

[0237] Step 202: in the case that it is confirmed that the terminal detects IDC problem, performing IDC problem testing procedure on the terminal to generate third testing result for the terminal; or, in the case that it is confirmed that the terminal does not detect IDC problem, performing IDC problem construction procedure on the terminal; after the IDC problem construction procedure is performed, performing IDC problem testing procedure on the terminal to generate third testing result for the terminal.

[0238] In actual application, step 201 can be understood as IDC problem confirmation procedure set before the IDC problem testing procedure, that is, before testing whether the terminal has the above behavior 1, the testing device confirms whether the terminal detects IDC problem; in the case that it is confirmed that the terminal detects IDC problem, the IDC problem testing procedure is performed on the terminal again.

[0239] In actual application, in order to confirm whether the terminal detects IDC problem, the testing device can construct at least one test condition (English can be expressed as test conditions or Pre-test conditions) which is expected to make qualified terminal detect IDC problem. For each test condition, the testing device can measure some specific indexes associated with IDC problem on the terminal, and confirm whether the terminal detects IDC problem by using the measurement result.

[0240] Based on this, in an embodiment, the confirmation of whether the terminal detects IDC problem can comprise:

[0241] constructing at least one test condition;

[0242] measuring at least one index associated with IDC problem on the terminal for each test condition in the at least one test condition, to obtain at least one measurement result of the terminal;

[0243] confirming whether the terminal detects IDC problem by using the at least one measurement result.

[0244] In practical application, the at least one test condition can be understood as a preset condition expected to enable the qualified terminal to detect the IDC problem, and each test condition can be understood as a network test environment virtually created by the test device, or as a simulated network test state.

[0245] Specifically, the terminal is internally provided with at least one receiver and at least one transmitter, and there can be an IDC problem between one receiver (which can be referred to as a second receiver in the following description) and one transmitter (which can be referred to as a second transmitter in the following description), and the second transmitter is the interference source of the IDC problem. Through one test condition created by the test device, the working channel of the second receiver and the working channel of the second transmitter can be passively (which can be understood as being configured to be) presented in a state corresponding to the test condition; the test device can measure at least one index associated with the IDC problem of the terminal in the state, such as measuring the reference sensitivity (which can be expressed in English as Reference sensitivity) and / or the throughput of the second receiver; and according to the obtained at least one measurement result, it is confirmed whether the terminal detects the IDC problem.

[0246] Based on this, in an embodiment, the index associated with the IDC problem can include at least one of the following:

[0247] the reference sensitivity (which can be expressed in English as Reference Sensitivity) of the second receiver of the terminal;

[0248] the throughput of the second receiver of the terminal.

[0249] In actual application, the specific types of the second receiver and the second transmitter can be set according to test requirements, the specific type of the second receiver can be the same as or different from the specific type of the first receiver, and the specific type of the second transmitter can be the same as or different from the specific type of the first transmitter, which is not limited in the embodiments of the present application. For example, the type of the second receiver can include an NR receiver (i.e., a 5G receiver), an LTE receiver (i.e., a 4G receiver), a 6G receiver, or a WLAN receiver, etc., and the second receiver can be a receiver of a cellular network or a receiver of a non-cellular network. Correspondingly, the second transmitter can include a WLAN transmitter, an LAA receiver, or other NR transmitters and / or LTE transmitters of a cellular operating mode working in an overlapping carrier / frequency band or an adjacent carrier / frequency band of the second receiver, i.e., the type of the second transmitter can be the same as or different from the type of the second receiver. In addition, in the case where the second receiver includes an NR receiver, the throughput of the second receiver can be obtained based on the performance test of SSB or CSI-RS.

[0250] In actual application, after obtaining the at least one measurement result of the terminal, the test device can determine whether the terminal detects the IDC problem according to whether the at least one measurement result meets the pre-set test requirements (which can be expressed in English as test requirements, and can be denoted as second test requirements in the subsequent description). For example, a flow of determining whether the terminal detects the IDC problem can be as shown in Figure 3 As shown in the flow, the test device can configure the working channel of the second receiver as X0 (channel X0 is the channel farthest from the working frequency band of the second transmitter) and configure the working channel of the second transmitter as Y0 (channel Y0 is the channel farthest from the working frequency band of the second receiver), thereby constructing a third test condition, in which the working channel of the second receiver and the working channel of the second transmitter are configured in a maximum interval state. In order to further configure the working channel of the second receiver and the working channel of the second transmitter in a maximum interval state, the test device can configure the second transmitter in an off state according to test requirements; the second transmitter configured in an off state can include the following two cases: case 1, powering off the second transmitter; and case 2, stopping the second transmitter from transmitting signals.

[0251] As shown in the flow, the test device can configure the working channel of the second receiver as X0 (channel X0 is the channel farthest from the working frequency band of the second transmitter) and configure the working channel of the second transmitter as Y0 (channel Y0 is the channel farthest from the working frequency band of the second receiver), thereby constructing a third test condition, in which the working channel of the second receiver and the working channel of the second transmitter are configured in a maximum interval state. In order to further configure the working channel of the second receiver and the working channel of the second transmitter in a maximum interval state, the test device can configure the second transmitter in an off state according to test requirements; the second transmitter configured in an off state can include the following two cases: case 1, powering off the second transmitter; and case 2, stopping the second transmitter from transmitting signals. Figure 3As shown, under the third test condition, the test device can measure the reference sensitivity and / or throughput of the second receiver and determine whether the reference sensitivity and / or throughput of the second receiver meets the second test requirement. When the reference sensitivity and / or throughput of the second receiver does not meet the second test requirement, if the interference source (i.e., the second transmitter) is in the off state (i.e., the second transmitter is configured to be in the off state under the third test condition), the test device considers (may be understood as directly determines) that the terminal is a substandard terminal, i.e., the test device can directly generate a fourth test result for the terminal, and the fourth test result represents that the terminal fails the test; if the second transmitter is in the non-off state (i.e., the second transmitter is configured to be in the non-off state under the third test condition), the test device can turn off the second transmitter, and again determine whether the reference sensitivity and / or throughput of the second receiver meets the second test requirement; if the reference sensitivity and / or throughput of the second receiver meets the second test requirement after the second transmitter is turned off, the test device can determine that the terminal detects the IDC problem, and after the second transmitter is turned on again, the terminal can enter an IDC problem test process, i.e., the test device can perform the IDC problem test process on the terminal; if the reference sensitivity and / or throughput of the second receiver still does not meet the second test requirement after the second transmitter is turned off, the test device considers that the terminal is a substandard terminal, i.e., the test device can directly generate a fourth test result for the terminal, and the fourth test result represents that the terminal fails the test. When the reference sensitivity and / or throughput of the second receiver meets the second test requirement, whether the second transmitter is in the off state or not, the test device can determine that the terminal does not detect the IDC problem, and can make the terminal enter an IDC problem construction process, i.e., the test device can perform the IDC problem construction process on the terminal, and after the IDC problem construction process is performed, perform the IDC problem test process on the terminal.

[0252] Based on this, in an embodiment, the determining whether the terminal detects the IDC problem based on the at least one measurement result can include:

[0253] In a case where the at least one measurement result meets a second test requirement, representing that the terminal does not detect the IDC problem; or,

[0254] In a case that the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to be in the un-off state, and the at least one measurement result satisfies the second test requirement when the second transmitter of the terminal is configured to be in the off state, it is characterized that the terminal detects the IDC problem.

[0255] In another embodiment, the method can further include:

[0256] In a case that the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to be in the off state, or

[0257] In a case that the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to be in the un-off state, and the at least one measurement result also does not satisfy the second test requirement when the second transmitter of the terminal is configured to be in the off state,

[0258] generating a fourth test result for the terminal, the fourth test result characterizing that the terminal fails the test.

[0259] In actual application, the specific form of the fourth test result can be set according to requirements. Exemplarily, the fourth test result can specifically include a conclusion (which can be expressed in English as Verdict) of test failure (which can be expressed in English as Fail, abbreviated as F).

[0260] In actual application, the second test requirement can also include an absolute value threshold (i.e., the threshold of the above type 1) and / or a relative value threshold (i.e., the threshold of the above type 2).

[0261] Based on this, in an embodiment, the indicators associated with the second test requirement can contain N, N being an integer greater than or equal to 1; the second test requirement being satisfied can include at least one of the following:

[0262] At least one of the N indicators is better than or equal to the corresponding threshold;

[0263] The change amount of at least one of the N indicators is better than or equal to the corresponding threshold.

[0264] In actual application, it can be understood that, in a case that the second test requirement includes a relative value threshold, in the process of confirming whether the terminal detects the IDC problem, the test device needs to measure at least one indicator associated with the IDC problem of the terminal under at least two test conditions respectively, to obtain the change amount of each indicator.

[0265] Based on this, in an embodiment, the second test requirement being satisfied can include at least one of the following:

[0266] the reference sensitivity of the second receiver of the terminal under the third test condition is better than (i.e. less than) or equal to a fifth threshold value;

[0267] the throughput of the second receiver of the terminal under the third test condition is better than (i.e. greater than) or equal to a sixth threshold value;

[0268] the variation of the reference sensitivity of the second receiver of the terminal under the third test condition and the fourth test condition is better than (i.e. less than) or equal to a seventh threshold value;

[0269] the variation of the throughput of the second receiver of the terminal under the third test condition and the fourth test condition is better than (i.e. less than) or equal to an eighth threshold value; wherein,

[0270] under the third test condition, the operating channel of the second receiver of the terminal and the operating channel of the second transmitter are configured to be in a maximum separation state;

[0271] under the fourth test condition, the operating channel of the second receiver of the terminal and the operating channel of the second transmitter are configured to be in a minimum separation state.

[0272] In actual application, the specific values of the fifth threshold value, the sixth threshold value, the seventh threshold value and the eighth threshold value can be pre-set according to test requirements. Alternatively, a correlation between different capability levels of the terminal and different values of the threshold values (i.e. the fifth threshold value, the sixth threshold value, the seventh threshold value and the eighth threshold value) can be pre-set, and the test equipment can determine the specific values of the threshold values (i.e. the fifth threshold value, the sixth threshold value, the seventh threshold value and the eighth threshold value) according to the capability level of the terminal. Exemplarily, a correlation between different capability levels of the terminal and different values of the seventh threshold value and / or the eighth threshold value can be pre-set: the first capability level (default capability level) is associated with 3dB (i.e. the seventh threshold value is 3dB) and / or 50% (i.e. the eighth threshold value is 50%), the second capability level is associated with 6dB (i.e. the seventh threshold value is 6dB) and / or 75% (i.e. the eighth threshold value is 75%), and the third capability level is associated with 1.5dB (i.e. the seventh threshold value is 1.5dB) and / or 25% (i.e. the eighth threshold value is 25%). The terminal can declare (in English, can be expressed as declaration) its capability level to the test equipment by reporting the identifier of the capability level or directly reporting the specific value of the seventh threshold value and / or the eighth threshold value according to its implementation. The test equipment can determine the specific values of the seventh threshold value and / or the eighth threshold value according to the capability level declared by the terminal, as the basis for judging whether the terminal detects the IDC problem.

[0273] In actual application, in order to further ensure that the terminal can detect the IDC problem in the process of performing the IDC problem test procedure on the terminal, after the IDC problem construction procedure is performed, the test device can again confirm whether the terminal detects the IDC problem (it can be understood as confirming whether the IDC problem is successfully constructed); in the case that it is confirmed that the terminal detects the IDC problem (it can be understood as the IDC problem is successfully constructed), the IDC problem test procedure is performed on the terminal again.

[0274] Based on this, in an embodiment, the IDC problem test procedure performed on the terminal after the IDC problem construction procedure is performed can include:

[0275] In the case that the IDC problem construction procedure is performed and the terminal detects the IDC problem, the IDC problem test procedure is performed on the terminal.

[0276] In actual application, the test device can also confirm again whether the terminal detects the IDC problem in the IDC problem test procedure after the IDC problem test procedure is performed on the terminal, that is, the IDC problem test procedure is performed again on the terminal. Figure 1 The corresponding test method can further accurately determine whether the MDT function of the terminal has the IDC mechanism meeting the related technical requirements.

[0277] In actual application, the test device can also confirm again whether the IDC problem detected by the terminal is solved before testing whether the terminal has the above-mentioned behavior 2 in the process of performing the IDC problem test procedure on the terminal; after it is confirmed that the IDC problem detected by the terminal is solved, the subsequent procedure of the IDC problem test is continued, that is, whether the terminal has the above-mentioned behavior 2 is tested, so that the MDT function of the terminal can be further accurately determined whether it has the IDC mechanism meeting the related technical requirements.

[0278] In actual application, in the process of performing the IDC problem construction procedure on the terminal, first, the test device can configure the working channel of the second receiver as X0 (channel X0 is the channel farthest from the working frequency range of the second transmitter) and the working channel of the second transmitter as Y0 (channel Y0 is the channel farthest from the working frequency range of the second receiver), thereby constructing a fifth test condition, under which the working channel of the second receiver and the working channel of the second transmitter are configured as the maximum interval state, and the second transmitter is configured as the non-closed state. Then, the test device can reconfigure the working channels of the second receiver and / or the second transmitter under the initial test condition of the fifth test condition, adjust the working channels of the second receiver and / or the second transmitter to be closer to each other, and measure at least one index associated with the IDC problem of the terminal when the channel environment changes, confirm whether the IDC problem is detected, i.e., whether the IDC problem is successfully constructed, by judging whether the obtained at least one measurement result meets the third test requirement.

[0279] Based on this, in an embodiment, the method can further include:

[0280] In the IDC problem construction procedure, the working channel of the second receiver and the working channel of the second transmitter of the terminal are configured to be close to each other, or the working channel of the second transmitter of the terminal is configured to be close to the working channel of the second receiver, or the working channel of the second receiver of the terminal is configured to be close to the working channel of the second transmitter, under the initial test condition of the fifth test condition, under which the working channel of the second receiver and the working channel of the second transmitter of the terminal are configured as the maximum interval state, and the second transmitter is configured as the non-closed state.

[0281] In the case of a change in the test condition, at least one index associated with the IDC problem of the terminal is measured, and at least one measurement result of the terminal is obtained.

[0282] In the case that the at least one measurement result does not meet the third test requirement, it is determined that the IDC problem construction procedure is performed, and the IDC problem of the terminal is detected.

[0283] In actual application, at least two test conditions can be constructed in the IDC problem construction process, i.e., a fifth test condition and a sixth test condition. In the sixth test condition, the working channel of the second receiver and the working channel of the second transmitter are configured in a minimum interval state, i.e., the working channel of the second receiver and the working channel of the second transmitter are arranged as close to each other as possible or overlap. For example, it is assumed that the second receiver is an NR Cell 1 receiver (which can be denoted as NR Cell 1 in the following description) and the second transmitter is a WLAN AP 1 (Cell 27) transmitter (which can be denoted as WLAN AP 1 (Cell 27) in the following description). The fifth test condition and the sixth test condition can be as shown in Table 9. In Table 9, "T0" corresponds to the fifth test condition and "T1" corresponds to the sixth test condition.

[0284]

[0285] Table 9

[0286] In actual application, the third test requirement can include an absolute value threshold (i.e., the threshold of Type 1 described above). For example, after the working channel of the second receiver is configured as X0 (channel X0 is the channel farthest from the working frequency range of the second transmitter) and the working channel of the second transmitter is configured as Y0 (channel Y0 is the channel farthest from the working frequency range of the second receiver) to construct the fifth test condition, the test device can measure the reference sensitivity and / or throughput of the second receiver and determine whether the reference sensitivity and / or throughput of the second receiver meets the third test requirement. The third test requirement can include an absolute value threshold corresponding to the reference sensitivity and / or throughput of the second receiver. If the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement, the test device can determine that the terminal has detected an IDC problem. If the reference sensitivity and / or throughput of the second receiver meets the third test requirement, the test device can determine that the terminal has not detected an IDC problem. When the terminal has not detected an IDC problem, the test device can gradually arrange the working channel of the second receiver and the working channel of the second transmitter to be closer to each other. The reference sensitivity and / or throughput of the second receiver needs to be tested each time the working channel of the second receiver and / or the working channel of the second transmitter is adjusted (i.e., the test condition changes) until the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement. At this time, the test device can determine that the terminal detects an IDC problem.

[0287] When the test device configures the working channel of the second receiver and the working channel of the second transmitter to gradually approach each other, as shown in Figure 4 the test device can configure the working channel of the second receiver and the working channel of the second transmitter to approach each other, and determine whether the terminal detects the IDC problem through the third test requirement. If the maximum number of channels of the working frequency band of the second receiver is N (N is an integer greater than 1), then n is a positive integer starting from 1 in the range of [1, N]; if the maximum number of channels of the working frequency band of the second transmitter is M (M is an integer greater than 1), then m is a positive integer starting from 1 in the range of [1, M]. Specifically, as shown in Figure 4 When the measured reference sensitivity and / or throughput of the second receiver meets the third test requirement, the value of m is increased by 1, and the value of n is also increased by 1, that is, the working channel of the second receiver moves one channel in the direction of the working frequency band close to the interference source (i.e., the second transmitter), and the working channel of the second transmitter also moves one channel in the direction of the working frequency band close to the second receiver. At this time, the test device needs to measure the reference sensitivity and / or throughput of the second receiver again, and determine whether the reference sensitivity and / or throughput of the second receiver meets the third test requirement again. If the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement, the test device can determine that the terminal detects the IDC problem at this time, and can enter the subsequent IDC problem test process. Then, the test device can perform the IDC problem test process on the terminal. If the reference sensitivity and / or throughput of the second receiver meets the third test requirement, the terminal still does not detect the IDC problem at this time, so the value of m continues to increase by 1, and the value of n also continues to increase by 1, until the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement. Here, if the terminal has not detected the IDC problem, n=N and m=M can be set, that is, the working channel of the second receiver and the working channel of the second transmitter are both set at a position as close as possible to each other or overlapping, that is, the sixth test condition is constructed. If the terminal does not detect the IDC problem under the sixth test condition, the IDC problem construction fails.

[0288] When the test device configures the working channel of the second receiver and the working channel of the second transmitter to gradually approach each other, as shown in Figure 5As shown, the test equipment can be configured to move the operating channel of the second transmitter closer to the operating channel of the second receiver, and determine whether the terminal has detected an IDC problem through the third test requirement. If the maximum number of channels in the operating frequency band of the second transmitter is M (M is an integer greater than 1), then m takes the value of a positive integer starting from 1 in the range [1, M]. Specifically, as... Figure 5 As shown, when the measured reference sensitivity and / or throughput of the second receiver meets the third test requirement, the value of m increases by 1, meaning the operating channel of the interference source (i.e., the second transmitter) shifts one channel closer to the operating frequency band of the second receiver. At this point, the test equipment needs to measure the reference sensitivity and / or throughput of the second receiver again and determine whether it meets the third test requirement. If the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement, the test equipment can determine that the terminal has detected an IDC problem and can proceed to the subsequent IDC problem test process. Afterward, the test equipment can execute the IDC problem test process on the terminal. If the reference sensitivity and / or throughput of the second receiver meets the third test requirement, the terminal still has not detected an IDC problem, and the value of m continues to increase by 1 until the reference sensitivity and / or throughput of the second receiver no longer meet the third test requirement. Here, if the terminal does not detect the IDC problem, m=M can be set, that is, the working channel of the second transmitter is set as close as possible to or overlaps with the working channel of the second receiver; if the terminal still does not detect the IDC problem, then the IDC problem construction fails.

[0289] When the test equipment is configured to gradually bring the operating channels of the second receiver and the second transmitter closer together, such as Figure 6 As shown, the test equipment can be configured to move the operating channel of the second receiver closer to the operating channel of the second transmitter, and determine whether the terminal has detected an IDC problem through the third test requirement. If the maximum number of channels in the operating frequency band of the second receiver is N (N is an integer greater than 1), then n takes the value of a positive integer starting from 1 in the range [1, N]. Specifically, as... Figure 4As shown, when the measured reference sensitivity and / or throughput of the second receiver meets the third test requirement, the value of n is increased by 1, that is, the working channel of the second receiver is moved to a channel close to the working frequency band of the interference source (that is, the second transmitter); at this time, the test device needs to measure the reference sensitivity and / or throughput of the second receiver again, and judge again whether the reference sensitivity and / or throughput of the second receiver meets the third test requirement; if the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement, at this time the test device can determine that the terminal detects the IDC problem, and can enter the subsequent IDC problem test process; then, the test device can perform the IDC problem test process on the terminal. If the reference sensitivity and / or throughput of the second receiver meets the third test requirement, at this time the terminal still does not detect the IDC problem, and then the value of n is continuously increased by 1 until the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement. Here, if the terminal does not detect the IDC problem, n can be set to N, that is, the working channel of the second receiver is set to a position as close as possible to the working channel of the second transmitter or an overlapping position; if the terminal still does not detect the IDC problem, the IDC problem construction fails.

[0290] In practical applications, the third test requirement may include an absolute value threshold (i.e., the threshold of type 1 above) and a relative value threshold (also known as a change threshold, i.e., the threshold of type 2 above). For example, after configuring the second receiver's operating channel as X0 (channel X0 is the channel furthest from the second transmitter's operating frequency band) and configuring the second transmitter's operating channel as Y0 (channel Y0 is the channel furthest from the second receiver's operating frequency band) to construct the fifth test condition, the test equipment can measure the reference sensitivity and / or throughput of the second receiver and confirm whether the second receiver's reference sensitivity and / or throughput meet the third test requirement. If the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement, the test equipment can determine that the terminal has detected an IDC problem; if the reference sensitivity and / or throughput of the second receiver meets the third test requirement, the test equipment can determine that the terminal has not detected an IDC problem, and can use the currently measured reference sensitivity and / or throughput of the second receiver as a baseline value; when the terminal has not detected an IDC problem, the test equipment can configure the working channel of the second receiver and the working channel of the second transmitter to gradually move closer to each other. Every time the working channel of the second receiver and / or the second transmitter is adjusted once or multiple times (i.e., the test conditions change), the reference sensitivity and / or throughput of the second receiver needs to be tested once, until the change in the reference sensitivity and / or throughput of the second receiver compared to the baseline value reaches a threshold T (for example, the change in reference sensitivity reaches the above-mentioned X dB), then the test equipment can determine that the terminal has detected an IDC problem at this time.

[0291] Specifically, when the test equipment is configured to gradually bring the operating channels of the second receiver and the second transmitter closer together, such as... Figure 7 As shown, the test equipment can be configured so that the working channels of the second receiver and the second transmitter are close to each other, and the terminal determines whether it has detected an IDC problem through the third test requirement (i.e., the change threshold T). If the maximum number of channels in the working frequency band of the second receiver is N (N is an integer greater than 1), then n is a positive integer starting from 1 in the range [1, N]; if the maximum number of channels in the working frequency band of the second transmitter is M (M is an integer greater than 1), then m is a positive integer starting from 1 in the range [1, M]; the threshold T can be a fixed value (e.g., 3dB) when corresponding to the reference sensitivity, and a percentage value (e.g., 50%) when corresponding to the throughput. Specifically, as... Figure 7As shown, once it is determined that the change of the reference sensitivity RefSense_n and / or the throughput TP_n of the second receiver compared to the reference sensitivity RefSense_0 and / or the reference throughput TP_0 of the second receiver is less than the threshold value T, the value of m is increased by 1, and the value of n is also increased by 1, that is, the working channel of the second receiver is moved to the working frequency band close to the interference source (that is, the second transmitter) by one channel, and the working channel of the second transmitter is also moved to the working frequency band close to the second receiver by one channel at the same time; at this time, the test equipment needs to measure the reference sensitivity RefSense_n and / or the throughput TP_n of the second receiver again, and determine again whether the change of RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is less than the threshold value T; if it is determined that the change of RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is not less than the threshold value T, at this time the test equipment can determine that the terminal detects the IDC problem, and can enter the subsequent IDC problem test process; then, the test equipment can perform the IDC problem test process on the terminal. If it is determined that the change of RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is less than the threshold value T, at this time the terminal still does not detect the IDC problem, so the value of m continues to increase by 1, and the value of n also continues to increase by 1, until the change of RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is not less than the threshold value T. Here, if the terminal does not detect the IDC problem all the time, n=N and m=M can be set, that is, the working channel of the second receiver and the working channel of the second transmitter are both set at a position as close as possible to each other or overlapping, that is, the sixth test condition is constructed, and if the terminal does not detect the IDC problem under the sixth test condition, the IDC problem construction fails.

[0292] When the test equipment configures the working channel of the second receiver and the working channel of the second transmitter to gradually approach each other, as shown in FIG. 6, the test equipment can configure the working channel of the second transmitter to approach the working channel of the second receiver, and determine whether the terminal detects the IDC problem through the third test requirement (that is, the change threshold value T). Figure 8 As shown, the test equipment can configure the working channel of the second transmitter to approach the working channel of the second receiver, and determine whether the terminal detects the IDC problem through the third test requirement (that is, the change threshold value T). If the number of channels of the working frequency band of the second transmitter is M (M is an integer greater than 1), then the value of m is a positive integer starting from 1 in the range of [1, M]; the threshold value T can be a certain numerical value (such as 3 dB) corresponding to the reference sensitivity, and can be a percentage numerical value (such as 50%) corresponding to the throughput. Specifically, as shown in FIG. 6, the test equipment can configure the working channel of the second transmitter to approach the working channel of the second receiver, and determine whether the terminal detects the IDC problem through the third test requirement (that is, the change threshold value T). Figure 8As shown, once it is determined that the change of the reference sensitivity RefSense_n and / or the throughput TP_n of the second receiver compared to the reference sensitivity RefSense_0 and / or the reference throughput TP_0 of the second receiver is less than the threshold value T, the value of m is increased by 1, that is, the working channel of the interference source (that is, the second transmitter) is moved to the direction of the working frequency band close to the second receiver by one channel; at this time, the test device needs to measure the reference sensitivity RefSense_n and / or the throughput TP_n of the second receiver again, and determine again whether the change of RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is less than the threshold value T; if it is determined that the change of RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is not less than the threshold value T, at this time the test device can determine that the terminal detects the IDC problem, and can enter the subsequent IDC problem test process; then, the test device can perform the IDC problem test process on the terminal. If it is determined that the change of RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is less than the threshold value T, at this time the terminal still does not detect the IDC problem, and then the value of m continues to increase by 1 until the change of RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is not less than the threshold value T. Here, if the terminal does not detect the IDC problem all the time, m can be set to M, that is, the working channel of the second transmitter is set to the position as close as possible to the working channel of the second receiver or the overlapping position; if the terminal still does not detect the IDC problem, the IDC problem construction fails.

[0293] When the test device configures the working channel of the second receiver to gradually approach the working channel of the second transmitter, as shown in FIG. 6, the test device can configure the working channel of the second receiver to approach the working channel of the second transmitter, and determine whether the terminal detects the IDC problem through the third test requirement (that is, the change threshold value T). Figure 9 As shown, the test device can configure the working channel of the second receiver to approach the working channel of the second transmitter, and determine whether the terminal detects the IDC problem through the third test requirement (that is, the change threshold value T). If the number of channels of the working frequency band of the second receiver is N (N is an integer greater than 1), then n takes a positive integer starting from 1 in the range of [1, N]; when the threshold value T corresponds to the reference sensitivity, it can be a certain numerical value (such as 3 dB), and when it corresponds to the throughput, it can be a percentage numerical value (such as 50%). Specifically, as shown in FIG. 7, the test device can configure the working channel of the second receiver to approach the working channel of the second transmitter, and determine whether the terminal detects the IDC problem through the third test requirement (that is, the change threshold value T). Figure 9As shown, once it is determined that the change of the reference sensitivity RefSense_n and / or the throughput TP_n of the second receiver compared to the reference sensitivity RefSense_0 and / or the reference throughput TP_0 of the second receiver is less than the threshold value T, the value of n is increased by 1, i.e., the working channel of the second receiver is moved to the working frequency band close to the interference source (i.e., the second transmitter) by one channel; at this time, the test device needs to measure the reference sensitivity RefSense_n and / or the throughput TP_n of the second receiver again, and determine again whether the change of RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is less than the threshold value T; if it is determined that the change of RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is not less than the threshold value T, at this time the test device can determine that the terminal detects the IDC problem, and can enter the subsequent IDC problem test process; then, the test device can perform the IDC problem test process on the terminal. If it is determined that the change of RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is less than the threshold value T, at this time the terminal still does not detect the IDC problem, and then the value of n is continuously increased by 1 until the change of RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is not less than the threshold value T. Here, if the terminal does not detect the IDC problem, n can be set to N, i.e., the working channel of the second receiver is set to the position as close as possible to the working channel of the second transmitter or the overlapping position; if the terminal still does not detect the IDC problem, the IDC problem construction fails.

[0294] In actual application, as can be seen from the above description, the third test requirement can also include an absolute value threshold (i.e., the threshold of type 1 described above) and / or a relative value threshold (i.e., the threshold of type 2 described above, i.e., the change threshold T described above).

[0295] Based on this, in an embodiment, the indicators associated with the third test requirement can contain N, N being an integer greater than or equal to 1; satisfying the third test requirement can include at least one of the following:

[0296] At least one of the N indicators is better than or equal to the corresponding threshold value;

[0297] The change of at least one of the N indicators is better than or equal to the corresponding threshold value.

[0298] Specifically, in an embodiment, satisfying the third test requirement can include at least one of the following:

[0299] a reference sensitivity of the second receiver of the terminal is better than (i.e. less than) or equal to a ninth threshold value;

[0300] a throughput of the second receiver of the terminal is better than (i.e. greater than) or equal to a tenth threshold value;

[0301] a variation of the reference sensitivity of the second receiver of the terminal between the current test condition and the fifth test condition is better than (i.e. less than) or equal to an eleventh threshold value (i.e. the variation threshold value T described above);

[0302] a variation of the throughput of the second receiver of the terminal between the current test condition and the fifth test condition is better than (i.e. less than) or equal to a twelfth threshold value (i.e. the variation threshold value T described above).

[0303] In actual application, the eleventh threshold value and / or the twelfth threshold value corresponds to the variation threshold value T described above. The specific values of the ninth threshold value, the tenth threshold value, the eleventh threshold value and the twelfth threshold value can be pre-set according to test requirements. Alternatively, a correlation between different capability levels of the terminal and different values of the threshold values (i.e. the ninth threshold value, the tenth threshold value, the eleventh threshold value and the twelfth threshold value) can be pre-set, and the test equipment can determine the specific values of the threshold values (i.e. the ninth threshold value, the tenth threshold value, the eleventh threshold value and the twelfth threshold value) according to the capability level of the terminal. Exemplarily, a correlation between different capability levels of the terminal and different values of the eleventh threshold value and / or the twelfth threshold value can be pre-set: the first capability level (default capability level) is correlated with 3dB (i.e. the eleventh threshold value is 3dB, i.e. the variation threshold value T is 3dB) and / or 50% (i.e. the twelfth threshold value is 50%, i.e. the variation threshold value T is 50%), the second capability level is correlated with 6dB (i.e. the eleventh threshold value is 6dB, i.e. the variation threshold value T is 6dB) and / or 75% (i.e. the twelfth threshold value is 75%, i.e. the variation threshold value T is 75%), and the third capability level is correlated with 1.5dB (i.e. the eleventh threshold value is 1.5dB, i.e. the variation threshold value T is 1.5dB) and / or 25% (i.e. the twelfth threshold value is 25%, i.e. the variation threshold value T is 25%). The terminal can declare (in English, can be expressed as declaration) its capability level to the test equipment by reporting the identifier of the capability level or directly reporting the specific value of the eleventh threshold value and / or the twelfth threshold value according to its implementation. The test equipment can determine the specific values of the eleventh threshold value and / or the twelfth threshold value according to the capability level declared by the terminal, and use the specific values as the basis for judging whether the IDC problem is detected by the terminal.

[0304] In an embodiment, the IDC problem construction procedure performed on the terminal can include:

[0305] configuring a first signal to the terminal, the first signal enabling the terminal to detect an IDC problem.

[0306] In actual application, the embodiment of the present application does not limit the specific type of the first signal, as long as the function is realized. For example, the first signal can include a man machine interface (MMI) signal or an attention (AT) command. In addition, the first signal can also enable the terminal to solve the detected IDC problem, that is, "the terminal detects the IDC problem" and "the terminal solves the detected IDC problem" can be completed by the MMI or the AT command (English can be expressed as "UE detects IDC problem" and "The IDC problems detected by the UE are resolved" could be done by MMI or AT command).

[0307] The test method provided in the embodiments of the present application performs an IDC problem test procedure on a terminal; in the case where a first test result is not obtained, it is confirmed whether the terminal detects an IDC problem in the IDC problem test procedure; a second test result for the terminal is generated according to whether the terminal detects an IDC problem in the IDC problem test procedure; or, it is confirmed whether the terminal detects an IDC problem; in the case where it is confirmed that the terminal detects an IDC problem, an IDC problem test procedure is performed on the terminal to generate a third test result for the terminal, or, in the case where it is confirmed that the terminal does not detect an IDC problem, an IDC problem construction procedure is performed on the terminal; after the IDC problem construction procedure is performed, an IDC problem test procedure is performed on the terminal to generate a third test result for the terminal. The scheme provided in the embodiments of the present application, after an IDC problem test procedure is performed on a terminal, in the case where the terminal does not pass the test, that is, in the case where a test result (that is, the first test result) that passes the test is not obtained, it is confirmed whether the terminal detects an IDC problem in the IDC problem test procedure, and a final test result for the terminal is generated according to the confirmed result; or, before an IDC problem test procedure is performed on a terminal, it is confirmed whether the terminal detects an IDC problem, in the case where it is confirmed that the terminal detects an IDC problem, an IDC problem test procedure is performed on the terminal, or, in the case where it is confirmed that the terminal does not detect an IDC problem, an IDC problem construction procedure is performed on the terminal to construct an IDC problem, and then an IDC problem test procedure is performed on the terminal; in this way, the case where "an IDC problem does not occur in the process of performing an IDC problem test procedure on a terminal due to excellent design of the terminal (which can be understood as that the terminal can support an IDC mechanism and can improve an IDC problem)" can be avoided to be misjudged as that the terminal does not pass the test, in other words, the problem that a qualified terminal that can support an IDC mechanism is misjudged as a non-qualified terminal that cannot support an IDC mechanism can be avoided, and therefore whether the terminal correctly supports a related function of an IDC problem can be accurately judged, that is, whether an IDC mechanism of an MDT function of the terminal meets a related technical requirement can be accurately judged.

[0308] To implement the method in the embodiments of the present application, the embodiments of the present application further provide a test device arranged on a test equipment, as shown in the figure, the device comprises: Figure 10

[0309] a first test unit 1001, configured to perform an IDC problem test procedure on a terminal;

[0310] a first confirmation unit 1002, configured to, in the case where a first test result is not obtained, confirm whether the terminal detects an IDC problem in the IDC problem test procedure;

[0311] ​The second test unit 1003 is configured to generate a second test result for the terminal according to whether the terminal detects IDC problem in the IDC problem test procedure.

[0312] In an embodiment, the first confirmation unit 1002 is specifically configured to:

[0313] construct at least one test condition same as the IDC problem test procedure;

[0314] measure at least one index associated with IDC problem for the terminal for each test condition in the at least one test condition, to obtain at least one measurement result of the terminal;

[0315] confirm whether the terminal detects IDC problem in the IDC problem test procedure by using the at least one measurement result.

[0316] In an embodiment, the first confirmation unit 1002 is specifically configured to:

[0317] measure at least one index associated with IDC problem for the terminal for each test condition in the at least one test condition constructed in the process of performing the IDC problem test procedure on the terminal, to obtain at least one measurement result of the terminal;

[0318] confirm whether the terminal detects IDC problem in the IDC problem test procedure by using the at least one measurement result.

[0319] In an embodiment, the first confirmation unit 1002 is further configured to:

[0320] measure at least one index associated with IDC problem for the terminal for the first test condition;

[0321] or,

[0322] measure at least one index associated with IDC problem for the terminal for the first test condition and the second test condition respectively; wherein,

[0323] in the first test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured as a minimum interval state;

[0324] in the second test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured as a maximum interval state.

[0325] In an embodiment, the first confirmation unit 1002 is further configured to:

[0326] In a case where the at least one measurement result does not satisfy the first test requirement, the terminal is characterized (may be understood as confirmed) as detecting an IDC problem in the IDC problem test procedure;

[0327] Or,

[0328] In a case where the at least one measurement result satisfies the first test requirement, the terminal is characterized as not detecting an IDC problem in the IDC problem test procedure.

[0329] In an embodiment, the first confirmation unit 1002 is further configured to determine a third threshold and / or a fourth threshold by using a capability level of the terminal, and different capability levels correspond to different third thresholds and / or fourth thresholds.

[0330] In an embodiment, the second test unit 1003 is specifically configured to:

[0331] In a case where the terminal detects an IDC problem in the IDC problem test procedure, it is determined that the second test result characterizes that the terminal fails the test;

[0332] In a case where the terminal does not detect an IDC problem in the IDC problem test procedure, it is determined that the second test result characterizes that the terminal passes the test.

[0333] In actual application, the first test unit 1001 and the first confirmation unit 1002 can be implemented by a processor in combination with a communication interface in a test device; and the second test unit 1003 can be implemented by a processor in the test device.

[0334] To implement the method of the embodiments of the present application, the embodiments of the present application further provide a test device arranged on a test equipment, as shown in Figure 11 The device comprises:

[0335] A second confirmation unit 1101 is configured to confirm whether the terminal detects an IDC problem.

[0336] A third test unit 1102 is configured to, in a case where it is confirmed that the terminal detects an IDC problem, execute an IDC problem test procedure on the terminal to generate a third test result for the terminal; or, in a case where it is confirmed that the terminal does not detect an IDC problem, execute an IDC problem construction procedure on the terminal; and after the IDC problem construction procedure is executed, execute an IDC problem test procedure on the terminal to generate a third test result for the terminal.

[0337] In an embodiment, the second confirmation unit 1101 is specifically configured to:

[0338] Construct at least one test condition;

[0339] For each of the at least one test conditions, the terminal is measured for at least one metric associated with the IDC issue, and at least one measurement result of the terminal is obtained.

[0340] Using the at least one measurement result, confirm whether the terminal has detected an IDC problem.

[0341] In one embodiment, the second confirmation unit 1101 is further configured to:

[0342] If at least one measurement result meets the second test requirement, it indicates (can be understood as confirming) that the terminal has not detected an IDC problem;

[0343] or,

[0344] If at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an on-state, and meets the second test requirement when the second transmitter of the terminal is configured to be in an off state, it indicates that the terminal has detected an IDC problem.

[0345] In one embodiment, the second confirmation unit 1101 is further configured to:

[0346] If at least one measurement result fails to meet the second test requirement when the second transmitter of the terminal is configured to be off, or...

[0347] If at least one measurement result fails to meet the second test requirement when the second transmitter of the terminal is configured to be in an active state, and also fails to meet the second test requirement when the second transmitter of the terminal is configured to be in an active state,

[0348] A fourth test result is generated for the terminal, indicating that the terminal has failed the test.

[0349] In one embodiment, such as Figure 11 As shown, the device may also include a fourth test unit 1103, used for:

[0350] Construct at least one test condition;

[0351] For each of the at least one test conditions, the terminal is measured for at least one metric associated with the IDC issue, and at least one measurement result of the terminal is obtained.

[0352] If at least one measurement result fails to meet the second test requirement when the second transmitter of the terminal is configured to be off, or...

[0353] in a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to the un-closed state, and the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to the closed state,

[0354] generating a fourth test result for the terminal, the fourth test result representing that the terminal fails the test.

[0355] In an embodiment, the third test unit 1102 is further configured to execute the IDC problem test procedure for the terminal in a case where the IDC problem construction procedure is executed and the IDC problem is detected by the terminal.

[0356] In an embodiment, the third test unit 1102 is specifically configured to:

[0357] In the IDC problem construction procedure, a fifth test condition is configured as an initial test condition, the working channel of the second receiver and the working channel of the second transmitter of the terminal are configured to be close to each other, or the working channel of the second transmitter of the terminal is configured to be close to the working channel of the second receiver, or the working channel of the second receiver of the terminal is configured to be close to the working channel of the second transmitter; wherein, in the fifth test condition, the working channel of the second receiver and the working channel of the second transmitter of the terminal are configured to the maximum interval state, and the second transmitter is configured to the un-closed state.

[0358] In a case where the test condition is changed, at least one index associated with the IDC problem is measured for the terminal, and at least one measurement result of the terminal is obtained.

[0359] In a case where the at least one measurement result does not meet the third test requirement, it is determined that the IDC problem construction procedure is executed and the IDC problem is detected by the terminal.

[0360] In an embodiment, the third test unit 1102 is specifically configured to configure a first signal for the terminal, the first signal being capable of enabling the terminal to detect the IDC problem.

[0361] In actual application, the second confirmation unit 1101, the third test unit 1102 and the fourth test unit 1103 can be realized by a processor in a test device in combination with a communication interface.

[0362] It should be noted that the test device provided in the above embodiments is only used for testing, and the division of the above program modules is used as an example. In actual application, the above processing can be completed by different program modules according to needs, that is, the internal structure of the device is divided into different program modules to complete all or part of the above-described processing. In addition, the test device and the test method provided in the above embodiments belong to the same concept, and the specific implementation process is described in the method embodiments, which will not be repeated here.

[0363] Based on the hardware implementation of the above program modules, and in order to implement the method of the embodiments of the present application, the embodiments of the present application also provide a test device, as shown in the following Figure 12 The test device 1200 includes:

[0364] The communication interface 1201 can interact with the terminal.

[0365] The processor 1202 is connected with the communication interface 1201 to realize information interaction with the terminal, and is used to run the computer program to execute the method provided in one or more of the above technical solutions.

[0366] The memory 1203 stores the computer program.

[0367] Specifically, when implementing the test method of the embodiments of the present application, the processor 1202 is configured to:

[0368] perform an IDC problem test process on the terminal;

[0369] confirm whether the terminal detects an IDC problem in the IDC problem test process in the case where the first test result is not obtained;

[0370] generate a second test result for the terminal according to the confirmation of whether the terminal detects an IDC problem in the IDC problem test process.

[0371] In an embodiment, the processor 1202 is further configured to:

[0372] construct at least one test condition same as the IDC problem test process;

[0373] measure at least one index associated with an IDC problem for the terminal for each test condition in the at least one test condition to obtain at least one measurement result of the terminal;

[0374] confirm whether the terminal detects an IDC problem in the IDC problem test process by using the at least one measurement result.

[0375] In an embodiment, the processor 1202 is further configured to:

[0376] In the process of performing the IDC problem test procedure on the terminal, for each of the at least one test condition constructed, the terminal is measured for at least one index associated with IDC problem, to obtain at least one measurement result of the terminal;

[0377] Using the at least one measurement result, it is determined whether the terminal detects IDC problem in the IDC problem test procedure.

[0378] In an embodiment, the processor 1202 is further configured to:

[0379] For the first test condition, the terminal is measured for at least one index associated with IDC problem;

[0380] Alternatively,

[0381] For the first test condition and the second test condition, the terminal is measured for at least one index associated with IDC problem, respectively; wherein,

[0382] In the first test condition, the operating channel of the first receiver of the terminal and the operating channel of the first transmitter are configured to be in a minimum interval state;

[0383] In the second test condition, the operating channel of the first receiver of the terminal and the operating channel of the first transmitter are configured to be in a maximum interval state.

[0384] In an embodiment, the processor 1202 is further configured to:

[0385] In the case that the at least one measurement result does not satisfy the first test requirement, it is indicated (and can be understood as determined) that the terminal detects IDC problem in the IDC problem test procedure;

[0386] Alternatively,

[0387] In the case that the at least one measurement result satisfies the first test requirement, it is indicated that the terminal does not detect IDC problem in the IDC problem test procedure.

[0388] In an embodiment, the processor 1202 is further configured to determine the third threshold and / or the fourth threshold using the capability level of the terminal, wherein different capability levels correspond to different third thresholds and / or fourth thresholds.

[0389] In an embodiment, the processor 1202 is further configured to:

[0390] In a case where the terminal detects an IDC problem in the IDC problem test procedure, it is determined that the second test result represents that the terminal fails the test.

[0391] In a case where the terminal does not detect an IDC problem in the IDC problem test procedure, it is determined that the second test result represents that the terminal passes the test.

[0392] Correspondingly, when another test method of the embodiment of the application is implemented, the processor 1202 is configured to:

[0393] confirm whether the terminal detects an IDC problem;

[0394] in a case where it is confirmed that the terminal detects an IDC problem, perform an IDC problem test procedure on the terminal, and generate a third test result for the terminal; or

[0395] in a case where it is confirmed that the terminal does not detect an IDC problem, perform an IDC problem construction procedure on the terminal, and after the IDC problem construction procedure is performed, perform an IDC problem test procedure on the terminal, and generate a third test result for the terminal.

[0396] In an embodiment, the processor 1202 is further configured to:

[0397] construct at least one test condition;

[0398] for each test condition in the at least one test condition, measure at least one index associated with an IDC problem for the terminal, to obtain at least one measurement result of the terminal;

[0399] confirm whether the terminal detects an IDC problem by using the at least one measurement result.

[0400] In an embodiment, the processor 1202 is further configured to:

[0401] in a case where the at least one measurement result meets a second test requirement, represent (which can be understood as confirm) that the terminal does not detect an IDC problem;

[0402] or

[0403] in a case where the at least one measurement result does not meet the second test requirement when a second transmitter of the terminal is configured to be in an open state, and the at least one measurement result meets the second test requirement when the second transmitter of the terminal is configured to be in a closed state, represent that the terminal detects an IDC problem.

[0404] In an embodiment, the processor 1202 is further configured to:

[0405] in a case where the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the off state, or

[0406] in a case where the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the not-off state, and the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the off state,

[0407] generating a fourth test result for the terminal, the fourth test result representing that the terminal fails the test.

[0408] In an embodiment, the processor 1202 is further configured to:

[0409] constructing at least one test condition;

[0410] performing, for each test condition in the at least one test condition, measurement of at least one index associated with the IDC issue on the terminal, to obtain at least one measurement result of the terminal;

[0411] in a case where the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the off state, or

[0412] in a case where the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the not-off state, and the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the off state,

[0413] generating a fourth test result for the terminal, the fourth test result representing that the terminal fails the test.

[0414] In an embodiment, the processor 1202 is further configured to, in a case where the IDC issue construction procedure is performed and the IDC issue is detected by the terminal, perform the IDC issue test procedure on the terminal.

[0415] In an embodiment, the processor 1202 is further configured to:

[0416] In the IDC problem construction process, a fifth test condition is configured as an initial test condition, and the working channel of the second receiver and the working channel of the second transmitter of the terminal are configured to be close to each other, or the working channel of the second transmitter is configured to be close to the working channel of the second receiver, or the working channel of the second receiver is configured to be close to the working channel of the second transmitter; wherein, in the fifth test condition, the working channel of the second receiver and the working channel of the second transmitter of the terminal are configured to be in a maximum interval state, and the second transmitter is configured to be in an unshut state.

[0417] In the case of a change in the test condition, at least one indicator associated with the IDC problem is measured for the terminal, and at least one measurement result of the terminal is obtained.

[0418] In the case that the at least one measurement result does not meet the third test requirement, it is determined that the IDC problem construction process is executed and the IDC problem is detected by the terminal.

[0419] In an embodiment, the processor 1202 is further configured to configure a first signal for the terminal, and the first signal can enable the terminal to detect the IDC problem.

[0420] It should be noted that the specific processing process of the processor 1202 can be understood with reference to the above method, and will not be described here.

[0421] Of course, in actual application, various components in the test device 1200 are coupled together through the bus system 1204. It can be understood that the bus system 1204 is used to realize the connection and communication between the components. The bus system 1204 includes not only a data bus, but also a power bus, a control bus and a status signal bus. However, in order to clearly illustrate, all kinds of buses are marked as the bus system 1204 in the Figure 12 .

[0422] The memory 1203 in the embodiment of the application is used to store various types of data to support the operation of the test device 1200. Examples of these data include: any computer programs used for operation on the test device 1200.

[0423] The method disclosed in the embodiments of the present application can be applied to the processor 1202 or implemented by the processor 1202. The processor 1202 can be an integrated circuit chip having a signal processing capability. In the implementation process, each step of the above method can be completed by an integrated logic circuit or an instruction in a software form of the processor 1202. The processor 1202 can be a general-purpose processor, a digital signal processor (DSP), or other programmable logic device, discrete gate or transistor logic device, discrete hardware component, etc. The processor 1202 can implement or execute the methods, steps and logic block diagrams disclosed in the embodiments of the present application. The general-purpose processor can be a microprocessor or any conventional processor, etc. In combination with the steps of the method disclosed in the embodiments of the present application, the hardware decoding processor can be directly implemented or executed by a combination of hardware and software modules in the decoding processor. The software module can be located in a storage medium, and the storage medium is located in the memory 1203. The processor 1202 reads the information in the memory 1203 and combines the hardware to complete the steps of the above method.

[0424] In the exemplary embodiments, the test device 1200 can be implemented by one or more application specific integrated circuits (ASICs), DSPs, programmable logic devices (PLDs), complex programmable logic devices (CPLDs), field programmable gate arrays (FPGAs), general-purpose processors, controllers, micro controllers (MCUs), microprocessors (Microprocessors), or other electronic elements, for executing the above method.

[0425] It can be understood that the memory 1203 of the embodiments of the present application can be a volatile memory or a non-volatile memory, and can also include both volatile and non-volatile memories. Among them, the non-volatile memory can be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), a ferromagnetic random access memory (FRAM), a flash memory, a magnetic surface memory, an optical disc, or a compact disc read-only memory (CD-ROM); the magnetic surface memory can be a disk memory or a tape memory. The volatile memory can be a random access memory (RAM) used as an external cache. By way of example but not limitation, many forms of RAM can be used, such as static random access memory (SRAM), synchronous static random access memory (SSRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDR SDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous link dynamic random access memory (SLDRAM), and direct memory bus random access memory (DRRAM).The memory described in the embodiments of the present application is intended to include, but not limited to, these and any other suitable types of memory.

[0426] In the example embodiments, the embodiments of the present application also provide a storage medium, i.e. a computer storage medium, specifically a computer readable storage medium, for example including the memory 1203 storing a computer program, which can be executed by the processor 1202 of the test device 1200 to complete the steps of the foregoing method. The computer readable storage medium can be FRAM, ROM, PROM, EPROM, EEPROM, Flash Memory, magnetic surface memory, optical disc, or CD-ROM, etc.

[0427] It should be noted that "first", "second", etc. are used to distinguish similar objects, and do not necessarily describe a specific order or sequence.

[0428] In addition, the technical solutions described in the embodiments of the present application can be arbitrarily combined without conflict.

[0429] The above is only a preferred embodiment of the present application, and is not intended to limit the protection scope of the present application.

Claims

1. A test method characterized by, The method comprises: performing an in-device coexistence IDC problem test procedure on the terminal; in the absence of a first test result, determining whether the terminal detects an IDC problem in the IDC problem test procedure; generating a second test result for the terminal according to the determination of whether the terminal detects an IDC problem in the IDC problem test procedure.

2. The method of claim 1, wherein, The determination of whether the terminal detects an IDC problem in the IDC problem test procedure comprises: constructing at least one test condition identical to the IDC problem test procedure; performing measurement on at least one index associated with an IDC problem for each test condition in the at least one test condition to obtain at least one measurement result of the terminal; determining whether the terminal detects an IDC problem in the IDC problem test procedure by using the at least one measurement result.

3. The method of claim 1, wherein, The determination of whether the terminal detects an IDC problem in the IDC problem test procedure comprises: in the process of performing the IDC problem test procedure on the terminal, performing measurement on at least one index associated with an IDC problem for each test condition in the at least one test condition to obtain at least one measurement result of the terminal; determining whether the terminal detects an IDC problem in the IDC problem test procedure by using the at least one measurement result.

4. The method of claim 2 or 3, wherein: measurement is performed on at least one index associated with an IDC problem for the terminal under a first test condition; or, measurement is performed on at least one index associated with an IDC problem for the terminal under a first test condition and a second test condition, respectively; wherein: under the first test condition, an operating channel of a first receiver of the terminal and an operating channel of a first transmitter of the terminal are configured to be in a minimum interval state; under the second test condition, the operating channel of the first receiver of the terminal and the operating channel of the first transmitter of the terminal are configured to be in a maximum interval state.

5. The method of claim 4, wherein, under the second test condition, the first transmitter is configured to be in an off state.

6. The method according to claim 2 or 3, characterized in that, The index associated with an IDC problem comprises at least one of: a reference sensitivity of the first receiver of the terminal; a throughput of the first receiver of the terminal.

7. The method of claim 2 or 3, wherein, The determination of whether the terminal detects an IDC problem in the IDC problem test procedure by using the at least one measurement result comprises: in the case that the at least one measurement result does not satisfy a first test requirement, it is indicated that the terminal detects an IDC problem in the IDC problem test procedure; or, in the case that the at least one measurement result satisfies the first test requirement, it is indicated that the terminal does not detect an IDC problem in the IDC problem test procedure.

8. The method of claim 7, wherein, The index associated with the first test requirement comprises N, N being an integer greater than or equal to 1; the satisfaction of the first test requirement comprises at least one of: at least one of the N indexes is better than or equal to a corresponding threshold value; a change amount of at least one of the N indexes is better than or equal to a corresponding threshold value.

9. The method of claim 7, wherein, The first test requirement includes at least one of the following: The reference sensitivity of the first receiver of the terminal under the first test condition is better than or equal to a first threshold value; The throughput of the first receiver of the terminal under the first test condition is better than or equal to a second threshold value; The reference sensitivity variation of the first receiver of the terminal under the first test condition and the second test condition is better than or equal to a third threshold value; The throughput variation of the first receiver of the terminal under the first test condition and the second test condition is better than or equal to a fourth threshold value; wherein Under the first test condition, the operating channel of the first receiver of the terminal and the operating channel of the first transmitter are configured to be in a minimum interval state; Under the second test condition, the operating channel of the first receiver of the terminal and the operating channel of the first transmitter are configured to be in a maximum interval state.

10. The method of claim 9, wherein, The method further includes: Determining the third threshold value and / or the fourth threshold value by using the capability level of the terminal, wherein different capability levels correspond to different third threshold values and / or fourth threshold values.

11. The method of claim 1, wherein, The second test result for the terminal is generated according to whether the terminal detects an IDC problem in the IDC problem test procedure, including: In the case that the terminal detects an IDC problem in the IDC problem test procedure, the second test result indicates that the terminal fails the test; In the case that the terminal does not detect an IDC problem in the IDC problem test procedure, the second test result indicates that the terminal passes the test.

12. A test method characterized by, It includes: Confirming whether the terminal detects an IDC problem; In the case that it is confirmed that the terminal detects an IDC problem, performing an IDC problem test procedure on the terminal to generate a third test result for the terminal; or In the case that it is confirmed that the terminal does not detect an IDC problem, performing an IDC problem construction procedure on the terminal; After the IDC problem construction procedure is performed, performing an IDC problem test procedure on the terminal to generate a third test result for the terminal.

13. The method of claim 12, wherein, The confirmation of whether the terminal detects an IDC problem includes: Constructing at least one test condition; For each test condition in the at least one test condition, measuring at least one index associated with an IDC problem of the terminal to obtain at least one measurement result of the terminal; Using the at least one measurement result, confirming whether the terminal detects an IDC problem.

14. The method of claim 13, wherein, The index associated with an IDC problem includes at least one of the following: The reference sensitivity of the second receiver of the terminal; The throughput of the second receiver of the terminal.

15. The method of claim 13, wherein, The confirmation of whether the terminal detects an IDC problem using the at least one measurement result includes: In the case that the at least one measurement result meets a second test requirement, it is indicated that the terminal does not detect an IDC problem; Or In a case that the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the non-off state, and the at least one measurement result satisfies the second test requirement when the second transmitter of the terminal is configured to the off state, it is characterized that the terminal detects the IDC problem.

16. The method of claim 15, wherein, The method further comprises: In a case that the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the off state, or, In a case that the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the non-off state, and the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the off state, generating a fourth test result for the terminal, the fourth test result characterizing that the terminal fails the test.

17. The method of claim 15, wherein, The indicators associated with the second test requirement include N, N being an integer greater than or equal to 1; the satisfaction of the second test requirement includes at least one of the following: At least one of the N indicators is better than or equal to a corresponding threshold value; A change amount of at least one of the N indicators is better than or equal to a corresponding threshold value.

18. The method of claim 15, wherein, The satisfaction of the second test requirement includes at least one of the following: A reference sensitivity of the second receiver of the terminal under a third test condition is better than or equal to a fifth threshold value; A throughput of the second receiver of the terminal under the third test condition is better than or equal to a sixth threshold value; A change amount of the reference sensitivity of the second receiver of the terminal under the third test condition and a fourth test condition is better than or equal to a seventh threshold value; A change amount of the throughput of the second receiver of the terminal under the third test condition and the fourth test condition is better than or equal to an eighth threshold value; wherein, Under the third test condition, an operating channel of the second receiver of the terminal and an operating channel of the second transmitter are configured to a maximum interval state; Under the fourth test condition, the operating channel of the second receiver of the terminal and the operating channel of the second transmitter are configured to a minimum interval state.

19. The method of claim 12, wherein, The method further comprises: constructing at least one test condition; For each test condition in the at least one test condition, measuring at least one indicator associated with the IDC problem for the terminal, obtaining at least one measurement result of the terminal; In a case that the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the off state, or, In a case that the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the non-off state, and the at least one measurement result does not satisfy the second test requirement when the second transmitter of the terminal is configured to the off state, generating a fourth test result for the terminal, the fourth test result characterizing that the terminal fails the test.

20. The method of claim 12, wherein, After the IDC problem construction process is executed, the IDC problem test process for the terminal is executed, including: In a case that the IDC problem construction procedure is executed and the IDC problem is detected by the terminal, the IDC problem test procedure is executed on the terminal.

21. The method of claim 12, wherein, In the IDC problem construction procedure, a test condition is configured as a fifth test condition, in which the working channel of the second receiver and the working channel of the second transmitter of the terminal are configured to be close to each other, or the working channel of the second transmitter is configured to be close to the working channel of the second receiver, or the working channel of the second receiver is configured to be close to the working channel of the second transmitter; and in the fifth test condition, the working channel of the second receiver and the working channel of the second transmitter of the terminal are configured to be in a maximum interval state, and the second transmitter is configured to be in an un-closed state. In a case that the test condition is changed, at least one index associated with the IDC problem is measured on the terminal, and at least one measurement result of the terminal is obtained. In a case that the at least one measurement result does not satisfy a third test requirement, it is determined that the IDC problem construction procedure is executed and the IDC problem is detected by the terminal.

22. The method of claim 21, wherein, The index associated with the third test requirement includes N, N is an integer greater than or equal to 1; and the third test requirement is satisfied in at least one of the following manners: At least one of the N indexes is better than or equal to a corresponding threshold value; or a change amount of at least one of the N indexes is better than or equal to a corresponding threshold value. The third test requirement is satisfied in at least one of the following manners:

23. The method of claim 21, wherein, The reference sensitivity of the second receiver of the terminal is better than or equal to a ninth threshold value; The throughput of the second receiver of the terminal is better than or equal to a tenth threshold value; A change amount of the reference sensitivity of the second receiver of the terminal under a current test condition and the fifth test condition is better than or equal to an eleventh threshold value; A change amount of the throughput of the second receiver of the terminal under the current test condition and the fifth test condition is better than or equal to a twelfth threshold value. The IDC problem construction procedure executed on the terminal includes:

24. The method of claim 12, wherein, A first signal is configured to the terminal, and the first signal can enable the terminal to detect the IDC problem. It includes:

25. A test device, characterized by A first test unit configured to execute an IDC problem test procedure on the terminal; A first confirmation unit configured to confirm whether the terminal detects the IDC problem in the IDC problem test procedure in a case that a first test result is not obtained; A second test unit configured to generate a second test result for the terminal according to whether the terminal detects the IDC problem in the IDC problem test procedure. It includes:

26. A test device, characterized by A second confirmation unit configured to confirm whether the terminal detects the IDC problem; A third test unit configured to execute an IDC problem test procedure on the terminal to generate a third test result for the terminal in a case that the terminal is confirmed to detect the IDC problem, or execute an IDC problem construction procedure on the terminal in a case that the terminal is confirmed not to detect the IDC problem. ​ After the IDC problem construction procedure is executed, the IDC problem test procedure is executed on the terminal, and a third test result for the terminal is generated.

27. A test apparatus, characterized by The method comprises: a communication interface and a processor; wherein the processor is configured to: execute an IDC problem test procedure on the terminal; confirm whether the terminal detects an IDC problem in the IDC problem test procedure in a case where the first test result is not obtained; and generate a second test result for the terminal according to the confirmation of whether the terminal detects the IDC problem in the IDC problem test procedure; or, the processor is configured to: confirm whether the terminal detects an IDC problem; and in a case where it is confirmed that the terminal detects the IDC problem, execute an IDC problem test procedure on the terminal, and generate a third test result for the terminal; or in a case where it is confirmed that the terminal does not detect the IDC problem, execute an IDC problem construction procedure on the terminal; after the IDC problem construction procedure is executed, execute an IDC problem test procedure on the terminal, and generate a third test result for the terminal.

28. A test apparatus, characterized by The method comprises: a processor and a memory for storing a computer program capable of running on the processor, wherein the processor is configured to execute the steps of the method according to any one of claims 1 to 11, or execute the steps of the method according to any one of claims 12 to 24 when the computer program is run.

29. A storage medium having stored thereon a computer program, characterized in that The computer program, when executed by the processor, implements the steps of the method according to any one of claims 1 to 11, or implements the steps of the method according to any one of claims 12 to 24.

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