Control system and method of near-infrared laser emitting device and laser emitting device

Abstract

The invention discloses a control system and method of a near-infrared laser emission device and the laser emission device, and relates to the technical field of experimental device control, a performance value is generated according to obtained optical performance data, if the performance value is lower than a performance threshold value, an optical element is maintained, and the performance of the emission device is tested; generating abnormal intensity according to the abnormal degree of the test data, if the abnormal intensity exceeds the expectation, optimizing the working parameters of the transmitting device, then analyzing the error degree of the experimental data, if the error degree exceeds the expectation, adjusting the control parameters of the transmitting device, and taking the ratio of the error degree to the adjustment degree of the control parameters as an optimization value; and a corresponding coping strategy is adopted for the transmitting device according to the relation between the optimization value and the optimization threshold value. And targeted treatment measures are taken to realize targeted treatment on the test equipment, so that the accuracy of the obtained test data is higher when the transmitting device is used for actual measurement.

Description

Technical Field

[0001] The present invention relates to the technical field of experimental device control, and in particular to a control system and method for a near-infrared laser emitting device and a laser emitting device. Background Art

[0002] The near-infrared laser emitting device is an advanced device that integrates multiple advantages such as high brightness, narrow linewidth, monochromaticity and tunability. It is widely used in neuroscience research, cell and molecular biology, and biological tissue imaging. It not only helps scientists make breakthrough progress in the level of blood oxygen dependence in the cerebral cortex, fine structures in cells, and deep imaging of biological tissues, but also ensures the reliability of experimental results and the safety of the operation process through its stability and safety design. These characteristics together constitute the indispensable position of near-infrared laser emitting devices in biological and medical research.

[0003] In the Chinese invention patent with application publication number CN107992125A, a control system and method for a thermogravimetric analysis experimental device based on Labview is disclosed, including: an industrial computer, a thermobalance, a temperature controller and a heating furnace, wherein the thyristor trigger output terminal of the temperature controller is connected to the thyristor power module arranged in the heating furnace; the thermocouple terminal of the temperature controller is connected to the thermocouple arranged in the heating furnace; the thermobalance is connected to the crucible containing the sample arranged in the heating furnace; the industrial computer running Labview is connected to the temperature controller and the thermobalance respectively, for receiving temperature data and quality data, which are displayed in the form of waveform charts on the control interface of the industrial computer, and the parameters of the temperature controller and the thermobalance are set on the control interface. The functions of balance control, temperature control, data display and data recording are integrated in the upper computer, which is simple and convenient to operate, and avoids operation near the heating furnace, reducing safety hazards.

[0004] Combined with the above application and the contents of the prior art: When a near-infrared laser emitting device is used for actual experimental measurements, in order to ensure the reliability of the experimental measurement data, it is usually necessary to verify the reliability of the emitting device, such as performing calibration, maintenance, or adjusting the control parameters or some components of the emitting device.

[0005] Existing launch device control systems usually adaptively optimize the various control parameters of the launch device to reduce data errors when the reliability of experimental measurement data is insufficient; however, considering that the environmental conditions in the working area where the launch device is located are abnormal, especially when the temperature and humidity indicators fluctuate greatly, or even when there are high-frequency vibrations, such abnormal environmental conditions will have a certain degree of impact on the components of the launch device, and thus interfere with the experimental measurement results. In this usage scenario, if we still only consider adjusting the various control parameters of the launch device, it may not be able to effectively guarantee the reliability of the experimental measurement data.

[0006] To this end, the present invention provides a control system and method for a near-infrared laser emitting device and a laser emitting device. Summary of the invention

[0007] 1. Technical issues to be resolved In view of the deficiencies of the prior art, the present invention provides a control system, method and laser emitting device for a near-infrared laser emitting device, which generates a performance value through the acquired optical performance data. If the performance value is lower than the performance threshold, the optical element is maintained, and the emitting device is subjected to a performance test. The abnormal density is generated according to the abnormal degree of the test data. If the abnormal density exceeds expectations, the working parameters of the emitting device are optimized, and the error degree of the experimental data is analyzed. If the error degree exceeds expectations, the control parameters of the emitting device are adjusted, and the ratio between the error degree and the adjustment degree of the control parameter is used as the optimization value. According to the relationship between the optimization value and the optimization threshold, a corresponding response strategy is adopted for the emitting device. Targeted treatment measures are taken to achieve targeted treatment of the test equipment, and the acquired experimental data is more accurate; thereby solving the technical problems recorded in the background technology.

[0008] (II) Technical solution To achieve the above objectives, the present invention is implemented through the following technical solutions: A control method for a near-infrared laser emitting device includes collecting environmental condition parameters in a working area, and automatically adjusting the abnormal environmental condition data in the working area if the degree of abnormality of the environmental condition parameters exceeds expectations; Detect the optical element of the transmitting device, generate a performance value from the acquired optical performance data, and if the performance value is lower than the performance threshold, maintain the optical element and restrict the maintenance frequency of the optical element; wherein, the performance value The generation method is as follows:

[0009] In the formula, is the transmittance at time, is the reflectivity at time, is the initial test node, To end the test node, and is the weight coefficient; Perform performance tests on the launch device, identify anomalies in the test data, generate anomaly density based on the degree of anomaly in the test data, and issue an instruction to optimize working parameters to the outside if the anomaly density exceeds expectations; After optimizing the operating parameters of the launch device, analyze the error degree of the experimental data. If the error degree exceeds expectations, adjust the control parameters of the launch device. The ratio between the error degree and the adjustment degree of the control parameter is used as the optimization value. According to the relationship between the optimization value and the optimization threshold, a corresponding response strategy is adopted for the launch device.

[0010] Furthermore, the sensor network collects environmental condition parameters in the working area, obtains corresponding environmental condition parameters, and aggregates and generates an environmental condition data set; Using real-time environmental condition data as input, the trained abnormal environment recognition model is used to identify environmental anomalies. If the number of abnormal environmental condition data occurrences exceeds expectations during the observation period, adjustment equipment is set in the working area.

[0011] Furthermore, when there is abnormal environmental condition data in the working area, the trained automatic control model is used to automatically adjust the abnormal environmental condition data in the working area, and an optical component inspection instruction is issued to the outside.

[0012] Further, after receiving the optical element inspection instruction, the appearance of the optical element of the transmitting device is inspected, the optical performance of the optical element is tested, and the acquired test data is summarized to generate an optical performance data set; A performance value is generated from an optical performance data set of the optical element. If the performance value is lower than expected, a maintenance frequency of the optical element is constrained according to the performance value of the optical element.

[0013] Furthermore, after completing the maintenance of the optical components, the launch device is subjected to a performance test, and corresponding test data is obtained at each test node, and the launch device test data set is generated after being aggregated; The test data is used as input, and the trained abnormal data recognition model is used to identify anomalies in the test data. When an anomaly exists, an abnormal reminder is issued to the outside.

[0014] Furthermore, the abnormal reminders received during the test cycle are recorded, and the time node when the abnormal reminder is received is used as the abnormal node. The abnormal density is constructed in combination with the abnormal degree of each test data; if the abnormal density exceeds the abnormal threshold, a working parameter optimization instruction is issued to the outside, and the abnormal density is constructed in the following way :

[0015] Where: is the abnormal density function, is the abnormal degree of the i-th abnormality, which is the sum of the abnormal proportions of all test data. and The time and location when the i-th anomaly occurs respectively; is the Gaussian kernel function; and Indicates the upper and lower limits of integration in the time dimension; and Represents the upper and lower limits of integration in the spatial dimension.

[0016] Furthermore, after receiving the working parameter optimization instruction, the trained parameter optimization model is used to optimize the working parameters of the launch device, and the control parameters of each experiment are monitored and recorded in real time, and the experimental data is recorded at the same time; the error coefficient of the experimental data is obtained through error analysis, and if the obtained error coefficient exceeds the preset error threshold, the control parameters of the launch device are adjusted.

[0017] Furthermore, after recording the adjustment ratio of each control parameter, the adjustment degree is constructed by the adjustment ratios of several control parameters, and the ratio between the error coefficient and the adjustment degree is used as the optimization value; and the optimization threshold is constructed after sorting several consecutive optimization values ​​along the time axis.

[0018] Furthermore, if the optimization value exceeds the optimization threshold, no further adjustment will be made to the launch device; if the optimization value is within the optimization threshold, the control parameters of the launch device are automatically optimized using the trained parameter control model with the reduction of the error coefficient as the optimization goal; if the optimization value is lower than the optimization threshold, a fault maintenance instruction is issued to the outside.

[0019] The control system of the near-infrared laser emitting device comprises: The environmental adjustment unit collects environmental condition parameters in the working area. If the degree of abnormality of the environmental condition parameters exceeds expectations, the abnormal environmental condition data in the working area is automatically adjusted; A component maintenance unit detects the optical component of the transmitting device, generates a performance value from the acquired optical performance data, and if the performance value is lower than a performance threshold, performs maintenance on the optical component and restricts the maintenance frequency of the optical component; The parameter optimization unit performs performance tests on the launch device, identifies abnormalities in the test data, generates abnormal density based on the abnormality of the test data, and issues a working parameter optimization instruction to the outside if the abnormal density exceeds expectations; The error analysis unit analyzes the error degree of the experimental data after optimizing the operating parameters of the launch device, and adjusts the control parameters of the launch device if the error degree exceeds expectations; The processing unit takes the ratio between the error degree and the adjustment degree of the control parameter as the optimization value, and adopts a corresponding response strategy for the transmitting device according to the relationship between the optimization value and the optimization threshold.

[0020] A near-infrared laser emitting device, comprising at least one processor; The memory is used to store executable instructions, and the instructions are executed by at least one of the processors to enable at least one of the processors to perform the steps of the control method of the near-infrared laser emitting device.

[0021] (III) Beneficial effects The present invention provides a control system, method and laser emitting device for a near-infrared laser emitting device, which have the following beneficial effects: 1. The sensor network monitors the environmental conditions in the working area in real time, and uses the trained abnormal environment recognition model to identify abnormalities. When the environment is abnormal, it can be processed in time to reduce the impact of environmental conditions on actual measurements; when there are abnormalities in the environment in the working area, it automatically adjusts to avoid the frequent occurrence of abnormal environmental conditions, thereby ensuring the reliability of the transmitting device and measurement data.

[0022] 2. Judge and evaluate the performance of optical components. When the performance of optical components is insufficient or damaged, the measurement effect can be guaranteed by maintaining and replacing the optical components. The maintenance frequency of optical components can be constrained by performance values. When the optical components are not replaced, the maintenance frequency and performance can be adapted to each other, which can reduce the number of invalid maintenance and avoid the negative impact of excessive maintenance on optical components.

[0023] 3. Test the performance of the launch device, identify abnormalities of the launch device based on the test data, and determine whether there are any abnormalities or faults in the launch device. By maintaining and repairing the abnormalities and faults, the reliability of the launch device when applied to experimental measurements is higher.

[0024] 4. Determine the current abnormality level of the launch device. If the abnormal launch device has a fault or a certain degree of abnormality, the working parameters of the launch device can be further optimized to ensure the experimental and measurement results.

[0025] 5. By taking corresponding response strategies for the launch device based on the relationship between the optimization value and the optimization threshold, after adjusting the control parameters, targeted processing measures are taken to achieve targeted processing of the test equipment, so that when the launch device is used for actual measurement, the experimental data obtained will be more accurate. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1It is a flow chart of the control method of the launch device of the present invention; Figure 2 It is a schematic diagram of the control system structure of the launch device of the present invention; Figure 3 It is a schematic diagram of the structure of the launch device of the present invention. DETAILED DESCRIPTION

[0027] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0028] See also Figure 1 The present invention provides a control method for a near-infrared laser emitting device, comprising: Step 1: Collect environmental condition parameters in the working area. If the degree of abnormality of the environmental condition parameters exceeds expectations, automatically adjust the abnormal environmental condition data in the working area; The step 1 includes the following contents: Step 101: After defining the working area of ​​the transmitting device, a sensor network is arranged in the working area, and the sensor network includes a temperature sensor, a humidity sensor, a vibration sensor, etc.; the sensor network collects environmental condition parameters in the working area to obtain corresponding environmental condition parameters, including temperature fluctuation, humidity change, mechanical vibration and noise data, etc., and summarizes the obtained environmental condition parameters to generate an environmental condition data set; Step 102: train a convolutional neural network with the labeled sample data to obtain a trained abnormal environment recognition model; use the real-time environmental condition data as input, use the trained abnormal environment recognition model to identify environmental anomalies, and record abnormal environmental condition data when they exist. If the number of occurrences of abnormal environmental condition data exceeds expectations during the observation period, set adjustment equipment in the work area, such as a humidifier and air conditioner; When in use, after determining the working area of ​​the transmitting device, the sensor network monitors the environmental conditions in the working area in real time, and uses the trained abnormal environment recognition model to identify abnormalities. When the environment is abnormal, it can be processed in a timely manner to reduce the impact of environmental conditions on actual measurements.

[0029] Step 103: train the dynamic matrix control algorithm with the labeled sample data to obtain the trained automatic control model, set the target range for each environmental condition parameter, and when there is abnormal environmental condition data in the working area, use the trained automatic control model to automatically adjust the abnormal environmental condition data in the working area, and issue an optical element inspection instruction to the outside after the automatic adjustment is completed; When using, combine the contents in steps 101 to 103: When there are abnormalities in the environment within the working area, automatic adjustment can be achieved with the assistance of various adjustment devices to avoid the frequent occurrence of abnormal environmental conditions and ensure the reliability of the transmitting device and measurement data.

[0030] Existing launch device control systems usually adaptively optimize the various control parameters of the launch device to reduce data errors when the reliability of experimental measurement data is insufficient; however, considering that the environmental conditions in the working area where the launch device is located are abnormal, especially when the temperature and humidity indicators fluctuate greatly, or even when there are high-frequency vibrations, such abnormal environmental conditions will have a certain degree of impact on the components of the launch device, and thus interfere with the experimental measurement results. In this usage scenario, if we still only consider adjusting the various control parameters of the launch device, it may not be able to effectively guarantee the reliability of the experimental measurement data.

[0031] Step 2: Detect the optical element of the transmitting device, generate a performance value from the acquired optical performance data, and if the performance value is lower than the performance threshold, maintain the optical element and restrict the maintenance frequency of the optical element; The step 2 includes the following contents: Step 201: After receiving the optical element inspection instruction, the appearance of the optical element of the transmitting device is inspected. If the appearance is not damaged, the optical performance test of the optical element is performed, that is, the optical element is placed in the laser path, and the laser power and spectral data before and after passing through the optical element, such as transmittance and reflectivity, are recorded. The acquired test data are summarized to generate an optical performance data set; Step 202: Generate a performance value from an optical performance data set of an optical element , the optical performance of the optical element is evaluated according to the performance value, as follows:

[0032] In the formula, is the transmittance at time, is the reflectivity at time, is the initial test node, To end the test node; and is the weight coefficient, and its value falls between 0 and 1; Based on historical data and performance management expectations for optical components, a performance threshold is pre-set; if the performance value is lower than the performance threshold, it means that the current performance of the optical component is abnormal and maintenance of the optical component is required, and a maintenance instruction is issued to the outside; During use, after adjusting and optimizing the environmental conditions in the working area, in order to further improve the reliability of measurement, the performance of the optical components of the transmitting device is tested, and performance values ​​are constructed based on the test data. The performance of the optical components is judged and evaluated based on the performance values. When the performance of the optical components is insufficient or damaged, the optical components are maintained and replaced to ensure the measurement effect.

[0033] Step 203: After receiving the maintenance instruction, according to the performance value of the optical element Constrain the maintenance frequency of optical components as follows:

[0034] Weight coefficient, , To maintain the number of nodes, is the time interval from the ith maintenance node to the jth maintenance node, is the time interval average; Perform maintenance on optical components at maintenance nodes that meet the constraints, including checking for contaminants, blowing off dust, and cleaning with fiber cloths. When using, combine the contents in steps 201 to 203: When optical components need to be maintained, the maintenance frequency of the optical components is constrained by the performance value. When the optical components are not replaced, the maintenance frequency and performance are adapted to each other, which can reduce the number of ineffective maintenance and avoid the negative impact of excessive maintenance on the optical components.

[0035] Step 3: Perform performance test on the transmitting device, identify abnormalities in the test data, generate abnormal density according to the abnormality degree of the test data, and issue an operating parameter optimization instruction to the outside if the abnormal density exceeds expectations; The step three includes the following contents: Step 301: After the maintenance of the optical element is completed, the performance test of the transmitting device is performed within the preset transmitting device test cycle, and the corresponding test data is obtained at each test node, including the response speed and accuracy of the transmitting device, laser power, wavelength and frequency, etc., and the transmitting device test data set is generated after being summarized; The convolutional neural network is trained with the labeled sample data to obtain the trained abnormal data recognition model; the test data is used as input, and the trained abnormal data recognition model is used to identify abnormalities in the test data, and an abnormal reminder is issued to the outside when an abnormality exists; When in use, as a further content, on the basis of maintaining the optical components, the performance of the launching device is tested, and the abnormalities of the launching device are identified based on the acquired test data to determine whether there are currently abnormalities and faults in the launching device. By maintaining and repairing the abnormalities and faults, the reliability of applying it to experimental measurements can be higher.

[0036] Step 302: Record the abnormal reminders received during the test cycle, take the time node when the abnormal reminder is received as the abnormal node, and build the abnormal density in the following way based on the abnormal degree of each test data: :

[0037] Where: is the abnormal density function, is the abnormal degree of the i-th abnormality, which is the sum of the abnormal proportions of all test data. and The time and location when the i-th anomaly occurs respectively; is the Gaussian kernel function; and Indicates the upper and lower limits of integration in the time dimension; and Represents the upper and lower limits of integration in the spatial dimension; Pre-set abnormal thresholds based on historical data and management expectations of launcher performance; If the abnormal density exceeds the abnormal threshold, it means that the current performance of the launch device is insufficient and it may be difficult to achieve the expected effect when applied. It is necessary to adjust the various control parameters of the launch device. At this time, a working parameter optimization instruction is issued to the outside; When used, combine the contents in steps 301 and 302: On the basis of identifying the detection launch device, the abnormality density constructed according to the identification result can be used to judge the current abnormality degree of the launch device. If the abnormal launch device has a fault or a certain degree of abnormality, the working parameters of the launch device can be further optimized to ensure the experimental and measurement effects.

[0038] Step 4: After optimizing the operating parameters of the launch device, analyze the error degree of the experimental data. If the error degree exceeds expectations, adjust the control parameters of the launch device; The step 4 includes the following contents: Step 401: Based on the expected working effect of the transmitting device and the parameter thresholds of the working parameters such as current, voltage and temperature, a simulated annealing algorithm is trained by the labeled sample data to obtain a trained parameter optimization model; After receiving the working parameter optimization instruction, the working parameters of the launch device are optimized using the trained parameter optimization model, and a control parameter acquisition instruction is issued to the outside; Step 402: After receiving the control parameter acquisition instruction, the control parameters of each experiment are monitored and recorded in real time, including laser power, wavelength, pulse frequency, etc., and the experimental data are recorded at the same time; the error value of the experimental data in each sub-period is obtained through error analysis. , as follows:

[0039] in, is the experimental data of the ith experimental data point, is the number of experimental data points; and are variables used to index data points, indicating The sum of data points; The error values ​​of several experimental data are averaged to generate an error coefficient. If the obtained error coefficient exceeds the preset error threshold, the control parameters of the launch device are adjusted, and the error coefficient is matched with the corresponding control parameters, which are summarized and stored; When using, combine the contents in steps 401 and 402: After optimizing the launch device in different aspects and reducing and alleviating possible faults or abnormalities of the launch device, the launch device is put into the experimental state in the working area and the corresponding experimental data is obtained. The error coefficient is obtained through error analysis, and the reliability of the experimental measurement data is judged based on the error coefficient. If the error level is acceptable, it means that the current control and optimization of the launch device have achieved the expected results. If it is lower than expected, it means that the launch device cannot be fully used and adjustment optimization or even fault maintenance is required before the experiment.

[0040] Step 5: The ratio between the error degree and the adjustment degree of the control parameter is used as the optimization value, and a corresponding response strategy is adopted for the launch device according to the relationship between the optimization value and the optimization threshold; The step five includes the following contents: Step 501: After recording the adjustment ratio of each control parameter, under dimensionless conditions, the adjustment degree is constructed from the adjustment ratios of several control parameters. , as follows:

[0041] Weight coefficient: , , ;The weight coefficient can be obtained by referring to the hierarchical analysis method; is the adjustment ratio of the ith control parameter, is the corresponding mean, , p is the number of control parameters; Considering that the larger the experimental error, the greater the adjustment of the control parameters, the error coefficient and the adjustment degree The ratio between ; When the error coefficient is adjusted, the ratio between the adjusted error coefficient and the adjustment amplitude of the control parameter is used as the optimization value, and the current adjustment effect is described and characterized based on the optimization value; Continuously optimize several values Build optimization thresholds after sorting along the time axis , as follows:

[0042] in, , m is the number of optimized values, is the i-th optimized value, is the mean of the optimized values; Step 502: Based on the relationship between the optimization value and the optimization threshold, a corresponding response strategy is adopted for the transmitting device, as follows: If the optimization value exceeds the optimization threshold, no further adjustment will be made to the launch device; If the optimized value is within the optimization threshold, the RBF neural network is trained with the labeled sample data to obtain the trained parameter control model, and the control parameters of the launch device are automatically optimized using the trained parameter control model with the reduction of the error coefficient as the optimization goal; If the optimization value is lower than the optimization threshold, it means that the transmitting device may have a fault and needs maintenance. At this time, a fault maintenance instruction is sent to the outside to perform the fault maintenance. When using, combine the contents in steps 501 and 502: When the launch device is still in the experimental state, a corresponding response strategy is taken for the launch device based on the relationship between the optimization value and the optimization threshold. After the control parameters are adjusted, targeted processing measures are taken to achieve targeted processing of the test equipment, so that when the launch device is used for actual measurement, the experimental data obtained is more accurate.

[0043] The Analytic Hierarchy Process (AHP) is a decision-making method that decomposes decision-related elements into levels such as goals, criteria, and plans, and conducts qualitative and quantitative analysis on this basis. It is particularly suitable for dealing with target systems with hierarchical and staggered evaluation indicators, and when the target value is difficult to describe quantitatively, the AHP is an effective decision-making tool.

[0044] The core of the hierarchical analysis method is to decompose the decision problem into multiple levels to form a hierarchical structure, which usually includes the target level, the criterion level, the sub-criterion level and the solution level. By solving the eigenvector of the judgment matrix, the priority weight of each element of each level to an element of the previous level is obtained, and the final weight of each alternative solution to the total goal is recursively merged by the weighted sum method, so as to find the optimal solution.

[0045] See also Figure 2 The present invention provides a control system for a near-infrared laser emitting device, comprising: The environmental adjustment unit collects environmental condition parameters in the working area. If the degree of abnormality of the environmental condition parameters exceeds expectations, the abnormal environmental condition data in the working area is automatically adjusted; A component maintenance unit detects the optical component of the transmitting device, generates a performance value from the acquired optical performance data, and if the performance value is lower than a performance threshold, performs maintenance on the optical component and restricts the maintenance frequency of the optical component; The parameter optimization unit performs performance tests on the launch device, identifies abnormalities in the test data, generates abnormal density based on the abnormality of the test data, and issues a working parameter optimization instruction to the outside if the abnormal density exceeds expectations; The error analysis unit analyzes the error degree of the experimental data after optimizing the operating parameters of the launch device, and adjusts the control parameters of the launch device if the error degree exceeds expectations; The processing unit takes the ratio between the error degree and the adjustment degree of the control parameter as the optimization value, and adopts a corresponding response strategy for the transmitting device according to the relationship between the optimization value and the optimization threshold.

[0046] See also Figure 3 ,The present invention provides a near-infrared laser emitting device, comprising, at least one processor; The memory is used to store executable instructions, and the instructions are executed by at least one of the processors to enable at least one of the processors to perform the steps of the control method of the near-infrared laser emitting device.

[0047] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0048] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0049] In the several embodiments provided in the present application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the units is only some logical function divisions. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0050] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0051] The above description is only a specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application.

Claims

1. A control method for a near-infrared laser emitting device, characterized in that: include, Collect environmental condition parameters in the working area. If the number of abnormal environmental condition data exceeds expectations, automatically adjust the abnormal environmental condition data in the working area; detect the optical components of the transmitting device and generate performance values ​​from the acquired optical performance data If the performance value is lower than the performance threshold, the optical element is maintained and the maintenance frequency of the optical element is constrained; where the performance value The generation method is as follows: ; In the formula, is the transmittance at time, is the reflectivity at time, is the initial test node, To end the test node, and is the weight coefficient; Perform performance tests on the launch device, identify anomalies in the test data, generate anomaly density based on the degree of anomaly in the test data, and issue an instruction to optimize working parameters to the outside if the anomaly density exceeds expectations; After optimizing the operating parameters of the launch device, analyze the error degree of the experimental data. If the error degree exceeds expectations, adjust the control parameters of the launch device. The ratio between the error degree and the adjustment degree of the control parameter is used as the optimization value. According to the relationship between the optimization value and the optimization threshold, a corresponding response strategy is adopted for the launch device.

2. The control method of the near-infrared laser emitting device according to claim 1, characterized in that: The sensor network collects environmental condition parameters in the working area, obtains corresponding environmental condition parameters, and aggregates and generates an environmental condition data set; Using real-time environmental condition data as input, the trained abnormal environment recognition model is used to identify environmental anomalies. If the number of abnormal environmental condition data occurrences exceeds expectations during the observation period, adjustment equipment is set in the working area.

3. The control method of the near-infrared laser emitting device according to claim 2, characterized in that: When there is abnormal environmental condition data in the working area, the trained automatic control model is used to automatically adjust the abnormal environmental condition data in the working area, and an optical component inspection instruction is issued to the outside; After receiving the optical component inspection instruction, inspect the appearance of the optical component of the launch device, perform an optical performance test on the optical component, and generate an optical performance data set after summarizing the acquired test data; A performance value is generated from an optical performance data set of the optical element. If the performance value is lower than expected, a maintenance frequency of the optical element is constrained according to the performance value of the optical element.

4. The control method of the near-infrared laser emitting device according to claim 3, characterized in that: After completing the maintenance of the optical components, the launch device is tested for performance, and the corresponding test data is obtained at each test node, and the launch device test data set is generated after aggregation; The test data is used as input, and the trained abnormal data recognition model is used to identify anomalies in the test data. When an anomaly exists, an abnormal reminder is issued to the outside.

5. The control method of the near-infrared laser emitting device according to claim 4, characterized in that: Record the abnormal reminders received during the test cycle, take the time node when the abnormal reminder is received as the abnormal node, and build the abnormal density based on the abnormal degree of each test data ; If the abnormal density exceeds the abnormal threshold, an operating parameter optimization instruction is issued to the outside; the abnormal density is constructed as follows : ; Where: is the abnormal density function, is the abnormal degree of the i-th abnormality, which is the sum of the abnormal proportions of all test data. and The time and location when the i-th anomaly occurs respectively; is the Gaussian kernel function; and Indicates the upper and lower limits of integration in the time dimension; and Represents the upper and lower limits of integration in the spatial dimension.

6. The control method of the near-infrared laser emitting device according to claim 5, characterized in that: After receiving the working parameter optimization instruction, the working parameters of the launch device are optimized using the trained parameter optimization model, and the control parameters of each experiment are monitored and recorded in real time, and the experimental data are recorded at the same time; The error coefficient of the experimental data is obtained through error analysis. If the obtained error coefficient exceeds the preset error threshold, the control parameters of the launch device are adjusted.

7. The control method of the near-infrared laser emitting device according to claim 6, characterized in that: After recording the adjustment ratio of each control parameter, the adjustment degree is constructed by the adjustment ratios of several control parameters, and the ratio between the error coefficient and the adjustment degree is used as the optimization value; The optimization threshold is constructed by sorting several consecutive optimization values ​​along the time axis.

8. The control method of the near-infrared laser emitting device according to claim 7, characterized in that: If the optimization value exceeds the optimization threshold, no further adjustment will be made to the launch device; if the optimization value is within the optimization threshold, the control parameters of the launch device are automatically optimized using the trained parameter control model with the reduction of the error coefficient as the optimization goal; if the optimization value is lower than the optimization threshold, a fault maintenance instruction is issued to the outside.

9. A control system for a near-infrared laser emitting device, characterized in that: include, The environmental adjustment unit collects environmental condition parameters in the working area. If the degree of abnormality of the environmental condition parameters exceeds expectations, the abnormal environmental condition data in the working area is automatically adjusted; A component maintenance unit detects the optical component of the transmitting device, generates a performance value from the acquired optical performance data, and if the performance value is lower than a performance threshold, performs maintenance on the optical component and restricts the maintenance frequency of the optical component; The parameter optimization unit performs performance tests on the launch device, identifies abnormalities in the test data, generates abnormal density based on the abnormality of the test data, and issues a working parameter optimization instruction to the outside if the abnormal density exceeds expectations; The error analysis unit analyzes the error degree of the experimental data after optimizing the operating parameters of the launch device, and adjusts the control parameters of the launch device if the error degree exceeds expectations; The processing unit takes the ratio between the error degree and the adjustment degree of the control parameter as the optimization value, and adopts a corresponding response strategy for the transmitting device according to the relationship between the optimization value and the optimization threshold.

10. A near-infrared laser emitting device, characterized in that: include, at least one processor; A memory for storing executable instructions, wherein the instructions are executed by at least one of the processors to enable at least one of the processors to perform the steps of the method according to any one of claims 1 to 8.

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