A Raman polarization adjustment device and method for atomic interferometers

Abstract

This invention relates to a Raman light polarization adjustment device and method for an atomic interferometer. The device includes: a polarization adjustment assembly, comprising an adjustment base and a quarter-wave plate rotatable about its own axis; and a polarization calibration assembly, comprising a prism base, a polarization beam splitter, a first photodetector, and a second photodetector. The prism base has a pinhole aperture. A first beam passing through the pinhole aperture is split into a first reflected beam and a transmitted beam after passing through the polarization beam splitter. A second beam, with a direction opposite to that of the first beam, is split into a second reflected beam after passing through the polarization beam splitter. The first photodetector detects the intensity of the first reflected beam, and the second photodetector detects the intensity of the second reflected beam. This application can perform polarization state measurement and adjustment of circularly polarized Raman light combined with linearly polarized light combined with Raman light, directly on the incident lens of the atomic interferometer, without the need for a polarization analyzer, effectively reducing the complexity of the design and assembly of the Raman light incident lens assembly.

Description

Technical Field

[0001] This invention relates to the field of atomic interferometer technology, and more specifically to a Raman light polarization adjustment device and method for atomic interferometers. Background Technology

[0002] An atomic interferometer manipulates atomic interference through a sequence of Raman light pulses. There are two combinations of Raman light: co-directional and counter-directional. Co-directional Raman light combination requires the two Raman beams to be circularly polarized, while counter-directional Raman light combination requires the two Raman beams to be linearly polarized, with the incident and reflected Raman beams polarized perpendicularly.

[0003] If a co-directional Raman beam combination is required, the polarization state of the laser emitted from the Raman beam incident lens assembly can be directly measured using a polarization analyzer for adjustment. However, the lens needs to be removed from the atomic interferometer's sensing unit before each adjustment and reinstalled afterward. Currently, atomic interferometers are trending towards miniaturization and engineering feasibility, and this adjustment method limits the miniaturization design of the sensing unit and increases the complexity of assembly, adjustment, and maintenance. Conversely, if a counter-directional Raman beam combination is required, the polarization state of the reflected Raman beam cannot be directly measured using a polarization analyzer, and it cannot be guaranteed that the linear polarization states of the incident and reflected Raman beams are perpendicular. Summary of the Invention

[0004] Based on the above description, the present invention provides a Raman light polarization adjustment device and method for an atomic interferometer, so as to solve the problem that the adjustment methods in related technologies are complex and cannot adjust the opposing Raman light combination.

[0005] The technical solution of the present invention to solve the above-mentioned technical problems is as follows:

[0006] In a first aspect, this application provides a Raman light polarization adjustment device for an atomic interferometer, the technical solution of which is as follows:

[0007] A Raman polarization adjustment device for an atomic interferometer, comprising:

[0008] A polarization adjustment assembly includes an adjustment base and a quarter-wave plate connected to the adjustment base, the quarter-wave plate being rotatable relative to the adjustment base about its own axis;

[0009] A polarization calibration component includes a prism mount and a polarizing beam splitter connected to the prism mount, a first photodetector, and a second photodetector. The prism mount is provided with a pinhole aperture. A first beam passing through the pinhole aperture along its axial direction is split into a first reflected beam perpendicular to the original direction and a transmitted beam in the same direction as the original direction after passing through the polarizing beam splitter. A second beam opposite to the direction of the first beam is split into a second reflected beam perpendicular to the original direction after passing through the polarizing beam splitter. The first photodetector is used to detect the light intensity of the first reflected beam, and the second photodetector is used to detect the light intensity of the second reflected beam.

[0010] The adjustment seat is used to connect to the Raman light incident lens of the atomic interferometer and to make the axis of the Raman light incident lens coincide with the axis of the quarter-wave plate. The prism seat is used to connect to the adjustment seat and to make the axis of the pinhole aperture coincide with the axis of the quarter-wave plate. The prism seat can rotate relative to the adjustment seat about the axis of the pinhole aperture.

[0011] Preferably, the polarization calibration assembly includes a calibration base, the prism base is connected to the calibration base and can rotate relative to the calibration base about the aperture axis, and the calibration base and the adjustment base can be detachably connected.

[0012] Preferably, the calibration base has through mounting holes at both ends, the prism base is embedded in the mounting holes and the pinhole aperture axis is coaxial with the mounting holes, the prism base can rotate relative to the calibration base around the pinhole aperture axis, and the calibration base has a through first adjustment groove on its side wall, the first adjustment groove extending circumferentially along the mounting holes.

[0013] Preferably, the prism seat is cylindrical and coaxial with the aperture stop. The mounting hole includes an adjustment section. The prism seat is embedded in the adjustment section and its outer diameter is the same as the diameter of the adjustment section. A first locking bolt is threaded onto the side wall of the calibration seat, which is suitable for pressing the prism seat against the first locking bolt to limit the rotation of the prism seat relative to the mounting cylinder.

[0014] Preferably, the adjusting seat includes a mounting cylinder, the quarter-wave plate is connected to the wave plate seat, the wave plate seat is coaxially arranged around the quarter-wave plate and fixed to the quarter-wave plate, the wave plate seat is embedded in the mounting cylinder and is coaxial with the mounting cylinder, the wave plate seat can rotate relative to the mounting cylinder around the axis of the quarter-wave plate, and a through second adjusting groove is provided on the side wall of the mounting cylinder, the second adjusting groove extending circumferentially along the mounting cylinder.

[0015] Preferably, the inner diameter of the mounting cylinder is the same as the outer diameter of the waveplate seat, and a second locking bolt is threaded on the side wall of the mounting cylinder, which is suitable for pressing the waveplate seat against the second locking bolt to restrict the rotation of the waveplate seat relative to the mounting cylinder.

[0016] Preferably, the transmission extinction ratio and the reflection extinction ratio of the polarizing beam splitter are both not less than 3000:1.

[0017] Secondly, this application provides a Raman light polarization adjustment method for an atomic interferometer, which employs the Raman light polarization adjustment device for an atomic interferometer as described above, including:

[0018] The adjustment base is connected to the Raman light incident lens of the atomic interferometer, and the axis of the Raman light incident lens is aligned with the axis of the quarter-wave plate. The prism base is connected to the adjustment base, and the axis of the pinhole aperture is aligned with the axis of the quarter-wave plate. The quarter-wave plate, the prism base, and the polarizing beam splitter are distributed sequentially in a direction away from the Raman light incident lens.

[0019] If the Raman light is a combination of circularly polarized light, then it includes:

[0020] S11: Fix the prism mount, rotate the waveplate mount until the light intensity I1 of the first reflected beam is the maximum, and record the maximum light intensity at this time as a;

[0021] S12: Fix the prism seat and rotate the waveplate seat so that the light intensity I1 of the first reflected beam and the light intensity I2 of the second reflected beam satisfy I1=2I2=a / 2.

[0022] S13: Fix the waveplate holder and rotate the prism holder. If the values ​​of I1 and I2 remain unchanged, the adjustment of the circular polarization state of the Raman light is completed. If the values ​​of I1 and I2 change, repeat step S12 until the values ​​of I1 and I2 remain unchanged, and the adjustment of the circular polarization state of the Raman light is completed.

[0023] If the Raman light is a combination of linearly polarized light, then it includes:

[0024] S21: Fix the prism holder and rotate the waveplate holder to I1 minimum;

[0025] S22: Fix the waveplate holder and rotate the prism holder to I2 minimum;

[0026] S23: Repeat steps S21 and S22 until I1=I2=0, to complete the adjustment of the polarization state of the Raman light.

[0027] Compared with the prior art, the technical solution of this application has at least the following beneficial technical effects:

[0028] 1. This application incorporates a polarization adjustment component and a polarization calibration component. The polarization adjustment component is mounted on the Raman light incident lens, and the emitted Raman light from the atomic interferometer exits after passing through a quarter-wave plate. During Raman light adjustment, the prism mount in the polarization calibration component is mounted on the adjustment base, aligning the pinhole aperture axis with the quarter-wave plate axis. The quarter-wave plate, the prism mount, and the polarization beam splitter are sequentially distributed along a direction away from the Raman light incident lens. The emitted Raman light from the atomic interferometer passes through the quarter-wave plate, then through the pinhole aperture, and is split into a first reflected beam by the polarization beam splitter; this first beam is the emitted Raman light. The reflected Raman light from the atomic interferometer, passing in the opposite direction to the first beam, is split into a second reflected beam by the polarization beam splitter. A first photodetector and a second photodetector detect the light intensity of the first and second reflected beams, respectively. Therefore, the polarization state of the emitted and reflected Raman light can be evaluated using the polarization beam splitter and the combination of the two photodetectors. The polarization beam splitter can be rotated by rotating the quarter-wave plate and the prism mount, thereby adjusting the size of the first and second reflected beams. This allows for adjustment of the light intensity of the first and second reflected beams to a set value according to the requirements of either circularly or linearly polarized Raman light combinations, achieving Raman light polarization adjustment. Furthermore, it enables adjustment to ensure the polarization states of the incident and reflected Raman light are perpendicular. After adjustment, the polarization calibration assembly can be removed. Therefore, this application can complete the measurement and adjustment of the polarization states of circularly polarized and linearly polarized Raman light combinations. The measurement and adjustment can be performed directly on the Raman light incident lens of the atomic interferometer without the need for a separate polarization analyzer, effectively reducing the complexity of the Raman light incident lens assembly design and assembly.

[0029] 2. The polarization calibration component of this application is equipped with a calibration base, on which the prism base is installed. The calibration base is connected to the adjustment base to connect the prism base to the adjustment base and achieve a rotatable connection. This facilitates the connection between the polarization calibration component and the polarization adjustment component. Furthermore, the polarization calibration component can be used as an integral component for Raman polarization adjustment work, thus improving the ease of use.

[0030] 3. In the adjustment method of this application, the Raman light is adjusted separately for a combination of circularly polarized light and a combination of linearly polarized light. The operation is simple and can quickly complete the adjustment of the polarization state of the Raman light. Attached Figure Description

[0031] Figure 1 This is a schematic diagram of the Raman polarization adjustment device for an atomic interferometer provided in an embodiment of the present invention;

[0032] Figure 2This is a schematic diagram of the structure of the polarization adjustment component and polarization calibration component combined in the Raman light polarization adjustment device for an atomic interferometer provided in an embodiment of the present invention.

[0033] Explanation of reference numerals in the attached figures:

[0034] 1. Polarization adjustment assembly; 11. Adjustment base; 111. Mounting cylinder; 1111. Second adjustment slot; 112. Mounting box; 1121. Receiving cavity; 1122. Connecting plate; 1123. Through hole; 1124. Insert; 1125. Operating hole; 12. Quarter wave plate; 13. Wave plate seat; 14. Pressure ring; 15. Second locking bolt; 2. Polarization calibration assembly; 21. Calibration base; 211. First adjustment slot; 22. Prism seat; 23. Pinhole aperture; 24. Polarization beam splitter prism; 25. First photodetector; 26. Second photodetector; 27. First locking bolt. Detailed Implementation

[0035] To facilitate understanding of this application, a more complete description will be provided below with reference to the accompanying drawings, which illustrate embodiments of the present application. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of this application will be thorough and complete.

[0036] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

[0037] It is understood that spatial relation terms such as "below," "under," "below," "below," "above," "above," etc., can be used here to describe the relationship between one element or feature shown in the figure and other elements or features. It should be understood that, in addition to the orientation shown in the figure, spatial relation terms also include different orientations of the device in use and operation. For example, if the device in the figure is flipped, the element or feature described as "below" or "below" of the other element or feature will be oriented "above" the other element or feature. Therefore, the exemplary terms "below" and "below" can include both upper and lower orientations. Furthermore, the device may also include other orientations (e.g., rotated 90 degrees or other orientations), and the spatial descriptive terms used herein will be interpreted accordingly.

[0038] It should be noted that when one element is considered to be "connected" to another element, it can be directly connected to the other element or connected to the other element through an intermediary element. In the following embodiments, "connection" should be understood as "electrical connection," "communication connection," etc., if the connected circuits, modules, units, etc., have the transmission of electrical signals or data between them.

[0039] When used herein, the singular forms of “a,” “an,” and “the” may also include the plural forms unless the context clearly indicates otherwise. It should also be understood that the terms “comprising,” “including,” or “having,” etc., specify the presence of the stated feature, whole, step, operation, component, part, or combination thereof, but do not preclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts, or combinations thereof.

[0040] Reference Figure 1 and Figure 2 As shown, this application provides a Raman light polarization adjustment device for an atomic interferometer, including a polarization adjustment component 1 and a polarization calibration component 2. The polarization adjustment component 1 is used to adjust the polarization state of the emitted Raman light by connecting it to the Raman light incident lens of the atomic interferometer, and the polarization calibration component 2 is used to measure the polarization state of the emitted Raman light and the reflected Raman light by connecting it to the polarization adjustment component 1.

[0041] Reference Figure 1 and Figure 2 As shown, the polarization adjustment component 1 includes an adjustment base 11 and a quarter-wave plate 12 connected to the adjustment base 11. The quarter-wave plate 12 can rotate relative to the adjustment base 11 about its own axis. The adjustment base 11 is used to connect to the Raman light incident lens of the atomic interferometer and make the axis of the Raman incident lens coincide with the axis of the quarter-wave plate 12.

[0042] Reference Figure 1 and Figure 2 As shown, the adjusting seat 11 includes a mounting cylinder 111, a quarter-wave plate 12 connected to a wave plate seat 13, the wave plate seat 13 being coaxially arranged around the quarter-wave plate 12 and fixed to the quarter-wave plate 12, the wave plate seat 13 being embedded in the mounting cylinder 111 and coaxial with the mounting cylinder 111, and the wave plate seat 13 being able to rotate relative to the mounting cylinder 111 around the axis of the quarter-wave plate 12.

[0043] Reference Figure 1 and Figure 2As shown, specifically, the adjusting seat 11 also includes a connecting plate 1122. The connecting plate 1122 has a through hole 1123. A mounting cylinder 111 is arranged around the through hole 1123 and fixed to the connecting plate 1122. The diameter of the through hole 1123 is smaller than the inner diameter of the mounting cylinder 111. The waveplate seat 13 is embedded in the mounting hole, with one end abutting against the connecting plate 1122. A pressure ring 14 is provided at the end of the mounting cylinder 111 away from the connecting plate 1122. The pressure ring 14 is threadedly connected to the mounting cylinder 111 and contacts the waveplate seat 13. The pressure ring 14 and the connecting plate 1122 cooperate to restrict the axial movement of the waveplate seat 13 and allow the waveplate seat 13 to rotate around the axis of the quarter-wave plate 12. The inner diameter of the mounting cylinder 111 is the same as the outer diameter of the waveplate seat 13 to restrict the radial movement of the waveplate seat 13. Furthermore, bolt holes are provided on the adjustment base 11 for fixed connection with the Raman incident lens, so that the connecting plate 1122 can be fixed on the Raman incident lens by bolts. In the design, when the connecting plate 1122 is fixed on the Raman incident lens, the axis of the quarter-wave plate 12 coincides with the axis of the Raman incident lens. At this time, the Raman light emitted from the Raman incident lens passes through the quarter-wave plate 12 and is emitted. When the wave plate base 13 is rotated to rotate the quarter-wave plate 12, the polarization state of the emitted Raman light can be adjusted.

[0044] Reference Figure 1 and Figure 2 As shown, a second adjustment groove 1111 extends through the side wall of the mounting cylinder 111, allowing a person to rotate the waveplate holder 13 by passing a tool through the groove. Simultaneously, a second locking bolt 15 is threaded onto the side wall of the mounting cylinder 111, suitable for tightening the waveplate holder 13 against the mounting cylinder 111 to restrict its rotation relative to the mounting cylinder 111. When adjusting the Raman polarization state, the second locking bolt 15 is loosened, and a person rotates the waveplate holder 13 through the second adjustment groove 1111, thereby rotating the quarter-wave plate 12. After adjustment, the second locking bolt 15 is tightened against the waveplate holder 13 to restrict its rotation relative to the mounting cylinder 111, thus fixing the quarter-wave plate 12.

[0045] Reference Figure 1 and Figure 2As shown, the polarization calibration assembly 2 includes a prism base 22 and a polarizing beam splitter 24, a first photodetector 25, and a second photodetector 26 connected to the prism base 22. The prism base 22 has a pinhole aperture 23. A first beam passing through the pinhole aperture 23 along its axial direction is split by the polarizing beam splitter 24 into a first reflected beam perpendicular to the original direction and a transmitted beam in the same direction as the original beam. A second beam, opposite in direction to the first beam, is split by the polarizing beam splitter 24 into a second reflected beam perpendicular to the original direction. The first photodetector 25 detects the intensity of the first reflected beam, and the second photodetector 26 detects the intensity of the second reflected beam. In this embodiment, the first and second reflected beams are illustrated with opposite directions.

[0046] Reference Figure 1 and Figure 2 As shown, specifically, the polarizing beam splitter 24, the first photodetector 25, and the second photodetector 26 are all fixed on one side of the prism mount 22. The first photodetector 25 and the second photodetector 26 are located on opposite sides of the polarizing beam splitter 24. When the first photodetector 25 and the second photodetector 26 are set, it must be ensured that the first reflected beam and the second reflected beam are perpendicularly incident on the center of the photosensitive surface of the photodetector. The transmission extinction ratio and the reflection extinction ratio of the polarizing beam splitter 24 are both not less than 3000:1.

[0047] Reference Figure 2As shown, when adjusting the Raman light, the prism mount 22 is installed on the adjustment base 11, and the axis of the pinhole aperture 23 coincides with the axis of the quarter-wave plate 12. The prism mount 22 can rotate relative to the adjustment base 11 around the axis of the pinhole aperture 23. The Raman light emitted from the Raman light incident lens of the atomic interferometer passes through the quarter-wave plate 12 and then through the pinhole aperture 23. After passing through the polarization beam splitter prism 24, it is split into a first reflected beam and a transmitted beam, i.e., the first beam is the emitted Raman light. The transmitted light is reflected by the Raman light reflecting mirror of the atomic interferometer to form a reflected Raman light with the opposite direction to the first beam. The reflected Raman light is split into a second reflected beam by the polarization beam splitter prism 24, i.e., the second beam is the reflected Raman light. The first photodetector 25 and the second photodetector 26 detect the light intensity of the first reflected beam and the second reflected beam, respectively. Thus, the polarization state of the emitted Raman light and the reflected Raman light can be evaluated by the polarization beam splitter prism 24 and the combination of the two photodetectors. Rotating the quarter-wave plate 12 and the prism mount 22 causes the polarization beam splitter 24 to rotate, thereby adjusting the size of the first and second reflected beams. This allows for adjustment of the light intensity of the first and second reflected beams to a set value according to the requirements of either circularly or linearly polarized Raman light combinations, thus achieving Raman light polarization adjustment. It also enables the perpendicularity of the polarization states of the incident and reflected Raman light. After adjustment, the polarization calibration assembly 2 can be removed. This system can measure and adjust the polarization states of both circularly and linearly polarized Raman light combinations, and the measurement and adjustment can be performed directly on the Raman incident lens of the atomic interferometer, eliminating the need for a separate polarization analyzer. This effectively reduces the complexity of designing and assembling the Raman incident lens assembly.

[0048] Reference Figure 1 and Figure 2 As shown, the polarization calibration assembly 2 also includes a calibration base 21, a prism base 22 connected to the calibration base 21 and rotatable relative to the calibration base 21 about the axis of the pinhole aperture 23, and the calibration base 21 and the adjustment base 11 can be detached and connected.

[0049] Reference Figure 1 and Figure 2As shown, the calibration base 21 has through-holes at both ends. The prism base 22 is embedded in the mounting holes, and the axis of the pinhole aperture 23 is coaxial with the mounting holes. The prism base 22 can rotate relative to the calibration base 21 around the axis of the pinhole aperture 23. A through-hole first adjustment groove 211 is provided on the side wall of the calibration base 21, extending circumferentially along the mounting holes. Specifically, the mounting holes include an adjustment section and a receiving section. The diameter of the adjustment section is larger than the diameter of the receiving section. The prism base 22 is embedded in the adjustment section, while the polarizing beam splitter prism 24, the first photodetector 25, and the second photodetector 26 are located in the receiving section. One side of the prism base 22 is in contact with the stepped surface between the adjustment section and the receiving section to restrict the prism base 22 from moving axially toward the receiving section. When it is necessary to rotate the polarizing beam splitter prism 24, a person uses a tool to pass through the first adjustment groove 211 and rotate the prism base 22, thereby rotating the polarizing beam splitter prism 24.

[0050] Reference Figure 1 and Figure 2 As shown, the prism base 22 is further designed to be cylindrical and coaxial with the pinhole aperture 23. The outer diameter of the prism base 22 is the same as the diameter of the adjustment section. A first locking bolt 27 is threaded onto the side wall of the calibration base 21, which is suitable for pressing the prism base 22 against the first locking bolt 27 to restrict the rotation of the prism base 22 relative to the mounting cylinder 111. Thus, the prism base 22 can be fixed by the first locking bolt 27, thereby fixing the polarizing beam splitter prism 24.

[0051] Reference Figure 1 and Figure 2 As shown, furthermore, to quickly install the calibration base 21 onto the adjustment base 11, the adjustment base 11 includes a mounting box 112. The mounting box 112 contains a cylindrical receiving cavity 1121. One end of the receiving cavity 1121 is open, and the end wall of the other end forms a connecting plate 1122. Correspondingly, a through hole 1123 on the connecting plate 1122 connects to the receiving cavity 1121. A socket 1124 for inserting the calibration base 21 is provided on the side wall of the receiving cavity 1121. One side of the calibration base 21 is an arc surface adapted to the inner wall of the receiving cavity 1121. When the calibration base 21 is inserted into the socket 1124 until the arc surface abuts against the side wall of the receiving cavity 1121, the pinhole aperture 23 is coaxial with the quarter-wave plate 12. The calibration base 21 is fixed to the adjustment base 11 by bolts. This allows for quick connection between the polarization calibration assembly 2 and the polarization adjustment assembly 1.

[0052] Reference Figure 1 and Figure 2 As shown, correspondingly, on the side wall of the mounting box 112, at the positions of the first adjustment groove 211 and the first locking bolt 27, there are operation holes 1125 that communicate with the receiving cavity 1121, so that personnel can use tools to rotate the prism seat 22 or tighten the first locking bolt 27 by passing through the operation hole 1125 and the first adjustment groove 211.

[0053] This embodiment also provides a Raman polarization adjustment method for an atomic interferometer, which uses the Raman polarization adjustment device for an atomic interferometer as described above for adjustment, including:

[0054] The adjustment base 11 is connected to the Raman incident lens of the atomic interferometer, with the axis of the Raman incident lens coinciding with the axis of the quarter-wave plate 12. The prism base 22 is connected to the adjustment base 11, with the axis of the pinhole aperture 23 coinciding with the axis of the quarter-wave plate 12. The quarter-wave plate 12, prism base 22, and polarizing beam splitter 24 are arranged sequentially away from the Raman incident lens. Specifically, the adjustment base 11 is fixed to the Raman incident lens with bolts. The calibration base 21 is inserted into the socket 1124 of the adjustment base 11, with the prism base 22 close to the quarter-wave plate 12. After the calibration base 21 is inserted into place, it is fixed to the adjustment base 11 with bolts. At this time, the Raman light emitted from the atomic interferometer passes through the quarter-wave plate 12, the pinhole aperture 23 and the polarizing beam splitter 24 in sequence. When it passes through the polarizing beam splitter 24, it is split into the first reflected beam and the light intensity is detected by the first photodetector 25. The reflected Raman light is split into the second reflected beam after passing through the polarizing beam splitter 24 and the light intensity is detected by the second photodetector 26.

[0055] If the Raman light is a combination of circularly polarized light, the specific adjustment steps include:

[0056] S11: Fix the prism seat 22, rotate the waveplate seat 13 until the light intensity I1 of the first reflected beam is the maximum, and record the maximum light intensity of the first reflected beam at this time as a.

[0057] S12: Fix the prism seat 22 and rotate the waveplate seat 13 so that the light intensity I1 of the first reflected beam and the light intensity I2 of the second reflected beam satisfy I1=2I2=a / 2.

[0058] S13: Fix the waveplate holder 13 and rotate the prism holder 22. If the values ​​of I1 and I2 remain unchanged, the adjustment of the circular polarization state of the Raman light is completed. If the values ​​of I1 and I2 change, repeat step S12 until the values ​​of I1 and I2 remain unchanged, and the adjustment of the circular polarization state of the Raman light is completed.

[0059] If the Raman light is a combination of linearly polarized light, the specific adjustment steps include:

[0060] S21: Fixed prism seat 22, rotating waveplate seat 13 to I1 minimum.

[0061] S22: Fixed waveplate holder 13, rotating prism holder 22 to I2 minimum.

[0062] S23: Repeat steps S21 and S22 until I1=I2=0, to complete the adjustment of the polarization state of the Raman light.

[0063] Furthermore, for Raman light that is a combination of linearly polarized light, polarization can also be adjusted by adjusting the quarter-wave plate in front of the Raman mirror of the atomic interferometer.

[0064] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A Raman light polarization adjustment device for an atomic interferometer, characterized in that, include: The polarization adjustment assembly (1) includes an adjustment base (11) and a quarter-wave plate (12) connected to the adjustment base (11), the quarter-wave plate (12) being rotatable relative to the adjustment base (11) about its own axis; The polarization calibration component (2) includes a prism mount (22) and a polarization beam splitter (24), a first photodetector (25), and a second photodetector (26) connected to the prism mount (22). The prism mount (22) is provided with a pinhole aperture (23). A first beam passing through the pinhole aperture (23) along the axis of the pinhole aperture (23) is split into a first reflected beam perpendicular to the original direction and a transmitted beam in the same direction as the original direction after passing through the polarization beam splitter (24). A second beam opposite to the direction of the first beam is split into a second reflected beam perpendicular to the original direction after passing through the polarization beam splitter (24). The first photodetector (25) is used to detect the light intensity of the first reflected beam, and the second photodetector (26) is used to detect the light intensity of the second reflected beam. The adjustment seat (11) is used to connect to the Raman light incident lens of the atomic interferometer and make the axis of the Raman light incident lens coincide with the axis of the quarter-wave plate (12). The prism seat (22) is used to connect to the adjustment seat (11) and make the axis of the pinhole aperture (23) coincide with the axis of the quarter-wave plate (12). The prism seat (22) can rotate relative to the adjustment seat (11) around the axis of the pinhole aperture (23).

2. The Raman polarization adjustment device for an atomic interferometer according to claim 1, characterized in that: The polarization calibration assembly (2) includes a calibration base (21), the prism base (22) is connected to the calibration base (21) and can rotate relative to the calibration base (21) about the axis of the pinhole aperture (23), and the calibration base (21) and the adjustment base (11) can be detachably connected.

3. The Raman polarization adjustment device for an atomic interferometer according to claim 2, characterized in that: The calibration base (21) is provided with a through mounting hole at both ends. The prism base (22) is embedded in the mounting hole and the axis of the pinhole aperture (23) is coaxial with the mounting hole. The prism base (22) can rotate relative to the calibration base (21) around the axis of the pinhole aperture (23). The side wall of the calibration base (21) is provided with a through first adjustment groove (211) that extends circumferentially along the mounting hole.

4. The Raman polarization adjustment device for an atomic interferometer according to claim 3, characterized in that: The prism seat (22) is cylindrical and coaxial with the aperture stop (23). The mounting hole includes an adjustment section. The prism seat (22) is embedded in the adjustment section and its outer diameter is the same as the diameter of the adjustment section. The calibration seat (21) has a first locking bolt (27) threaded on its side wall, which is suitable for pressing the prism seat (22) against the first locking bolt (27) to restrict the rotation of the prism seat (22) relative to the mounting cylinder (111).

5. The Raman polarization adjustment device for an atomic interferometer according to claim 1, characterized in that: The adjusting seat (11) includes a mounting cylinder (111), the quarter-wave plate (12) is connected to the waveplate seat (13), the waveplate seat (13) is coaxially arranged outside the quarter-wave plate (12) and fixed to the quarter-wave plate (12), the waveplate seat (13) is embedded in the mounting cylinder (111) and is coaxial with the mounting cylinder (111), the waveplate seat (13) can rotate relative to the mounting cylinder (111) around the axis of the quarter-wave plate (12), and a through second adjusting groove (1111) is provided on the side wall of the mounting cylinder (111), the second adjusting groove (1111) extends circumferentially along the mounting cylinder (111).

6. The Raman polarization adjustment device for an atomic interferometer according to claim 5, characterized in that: The inner diameter of the mounting cylinder (111) is the same as the outer diameter of the waveplate seat (13). A second locking bolt (15) is threaded on the side wall of the mounting cylinder (111), which is suitable for pressing the waveplate seat (13) against the second locking bolt (15) to restrict the rotation of the waveplate seat (13) relative to the mounting cylinder (111).

7. The Raman polarization adjustment device for an atomic interferometer according to claim 1, characterized in that: The transmission extinction ratio and reflection extinction ratio of the polarizing beam splitter (24) are both not less than 3000:

1.

8. A method for adjusting the polarization of Raman light in an atomic interferometer, characterized in that, Adjustment is performed using the Raman polarization adjustment device for an atomic interferometer as described in any one of claims 5-6, comprising: Connect the adjustment seat (11) to the Raman light incident lens of the atomic interferometer, and make the axis of the Raman light incident lens coincide with the axis of the quarter-wave plate (12). Connect the prism seat (22) to the adjustment seat (11) and make the axis of the pinhole aperture (23) coincide with the axis of the quarter-wave plate (12). The quarter-wave plate (12), the prism seat (22) and the polarizing beam splitter (24) are distributed in sequence along the direction away from the Raman light incident lens. If the Raman light is a combination of circularly polarized light, then it includes: S11: Fix the prism seat (22), rotate the waveplate seat (13) until the light intensity I1 of the first reflected beam is the maximum, and record the maximum light intensity at this time as a; S12: Fix the prism seat (22) and rotate the waveplate seat (13) so that the light intensity I1 of the first reflected beam and the light intensity I2 of the second reflected beam satisfy I1=2I2=a / 2; S13: Fix the waveplate holder (13) and rotate the prism holder (22). If the values ​​of I1 and I2 remain unchanged, the adjustment of the circular polarization state of the Raman light is completed. If the values ​​of I1 and I2 change, repeat step S12 until the values ​​of I1 and I2 remain unchanged, and the adjustment of the circular polarization state of the Raman light is completed. If the Raman light is a combination of linearly polarized light, then it includes: S21: Fix the prism seat (22) and rotate the waveplate seat (13) to the minimum of I1; S22: Fix the waveplate holder (13) and rotate the prism holder (22) to the minimum of I2; S23: Repeat steps S21 and S22 until I1=I2=0, to complete the adjustment of the polarization state of the Raman light.

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