Over-current detection device and chip aging equipment

Abstract

The embodiment of the invention provides an overcurrent detection device and chip aging equipment, which are used for controlling the on-off of a power supply circuit by controlling the switch control end of the power supply circuit. The power supply circuit comprises a power supply end coupled with a first external power supply and a load end coupled with a load; the over-current detection device comprises an over-current detection circuit which is respectively coupled with a power supply end and a load end so as to detect the output current of the power supply circuit at the load end and generate a control signal for judging whether the output current is over-current according to the output current of the power supply circuit; and the protection circuit is respectively coupled with the over-current detection device and the power supply circuit and is used for controlling the switch control end according to the control signal so as to control the on / off of the power supply circuit. Each to-be-detected chip is provided with an independent detection unit, when a certain chip breaks down, only the power supply of the chip is cut off, and normal work of other chips is not affected.

Description

Technical Field

[0001] The present disclosure relates to the field of chip aging technology, and in particular to an overcurrent detection device and a chip aging equipment. Background Art

[0002] With the increasing development of automotive-grade chips, chip aging tests are particularly important. The main purpose of aging tests is to verify the reliability and stability of chips under long-term operation and ensure that they can meet the strict requirements of the automotive industry in practical applications. Chip aging tests usually last for several days or even weeks to simulate the long-term operation of chips in actual use. Long-term tests not only test the durability of chips, but also place higher requirements on test equipment and environment. In order to improve efficiency, multiple chips are usually placed on the same aging board for parallel testing. This practice can significantly reduce test time and cost, but it also brings new problems. If only relying on board-level protection devices, once a chip fails and causes overcurrent, the board-level protection device will cut off the power supply of the entire aging board. This will cause all other chips that are working normally to be interrupted and need to be restarted, which seriously affects the test efficiency and the accuracy of the results. In addition, once the power supply of the entire board is cut off, it is necessary to check the status of each chip one by one, find the faulty chip and repair or replace it. This process is time-consuming and complicated, which increases the test cost and time. The overcurrent protection method in the related art usually relies on mechanical or physical components such as fuses or thermistors. These components have a long response time and are unable to shut off the current in time, which may cause damage to the equipment in an overcurrent condition. Summary of the invention

[0003] In view of the above-mentioned shortcomings of the prior art, the purpose of the present disclosure is to provide an overcurrent detection device and a chip aging device to solve the problems in the related art.

[0004] In a first aspect, the present disclosure provides an overcurrent detection device, which is used to control the on / off of a power supply circuit by controlling a switch control terminal of the power supply circuit; the power supply circuit includes a power supply terminal coupled to a first external power source and a load terminal coupled to a load; the overcurrent detection device includes: an overcurrent detection circuit, coupled to the power supply end and the load end respectively, to detect an output current of the power supply circuit at the load end, and to generate a control signal for determining whether the output current is overcurrent according to the output current of the power supply circuit; A protection circuit, coupled to the overcurrent detection device and the switch control terminal of the power supply circuit respectively, for controlling the switch control terminal according to the control signal to control the on / off of the power supply circuit; The power supply circuit includes a first switching element, a first end of the first switching element is coupled to the power supply end via a first resistor, a second end of the first switching element is coupled to the load end, and three ends of the first switching element are coupled to the protection circuit, and are configured to control the on and off of the power supply circuit according to the control signal.

[0005] In an embodiment of the first aspect, the protection circuit includes:

[0006] A second switch element, a first end of the second switch element is coupled to a second external power supply via a second resistor, and the first end is also coupled to the switch control end for controlling the on / off of the power supply circuit led out between the power supply end and the load end of the power supply circuit; a second end of the second switch element is grounded, and a third end of the second switch element is coupled to the output end of the overcurrent detection circuit to control the on / off between the first end and the second end according to the control signal, thereby controlling the on / off of the power supply circuit.

[0007] In an embodiment of the first aspect, the protection circuit further includes:

[0008] A third switch element, wherein the first end of the third switch element is grounded, the second end of the third switch element is coupled to the third end of the second switch element, and the third end of the third switch element is coupled to an external enable end to control the on-off between the first end and the third end of the third switch element according to a control signal output by the external enable end, thereby controlling the on-off of the second switch element.

[0009] In an embodiment of the first aspect, the overcurrent detection circuit includes:

[0010] A differential amplifier circuit, respectively coupled to the load end of the power supply circuit and coupled to the power supply end via a bias circuit, for amplifying the voltage difference between the power supply end of the power supply circuit and the load end according to the bias voltage provided by the bias circuit and outputting the amplified voltage;

[0011] The comparison circuit is respectively coupled to the differential amplifier circuit, the load end of the power supply circuit and the protection circuit, and is used to obtain the control signal according to the voltage difference output by the differential amplifier circuit and the output voltage of the power supply circuit.

[0012] In an embodiment of the first aspect, the differential amplifier circuit includes:

[0013] A differential amplifier, comprising a positive phase input terminal, a negative phase input terminal and a differential output terminal; the positive phase input terminal is coupled to the bias circuit;

[0014] An input resistor, one end of the input resistor is coupled to the load end of the power supply circuit, and the other end of the input resistor is coupled to the negative phase input end;

[0015] A first feedback resistor, one end of the first feedback resistor is coupled to the negative phase input end, and the other end of the first feedback resistor is coupled to the differential output end.

[0016] In an embodiment of the first aspect, the bias circuit comprises:

[0017] a third resistor, one end of the third resistor being grounded, and a second end of the third resistor being coupled to the non-inverting input end;

[0018] A fourth resistor, one end of the fourth resistor is coupled to the power supply end of the power supply circuit, and the other end of the fourth resistor is coupled to the non-inverting input end.

[0019] In an embodiment of the first aspect, the comparison circuit comprises:

[0020] A comparator, the comparator comprising a first signal input terminal, a second signal input terminal and a comparison output terminal; the first signal input terminal is coupled to the output terminal of the differential amplifier circuit, and the second signal input terminal is coupled to the load terminal of the power supply circuit;

[0021] A second feedback resistor, one end of the second feedback resistor is coupled to the comparison output terminal, and the other end of the second feedback resistor is coupled to the protection circuit.

[0022] A second aspect of the present disclosure provides a chip aging device, which includes at least one chip to be tested, and the at least one chip to be tested is coupled to any one of the above-mentioned overcurrent detection devices.

[0023] In an embodiment of the second aspect, a plurality of chips to be detected are included, and the chips to be detected are respectively coupled to the overcurrent detection device in a one-to-one correspondence.

[0024] Beneficial effects of the present disclosure: The overcurrent detection device in the present disclosure is used to perform chip-level protection on the chip to be detected. When the current at the load end is overcurrent due to failure of one or more chips or other reasons, the overcurrent detection circuit will detect the overcurrent condition, and only cut off the power supply of the failed chip through the protection circuit, without affecting the normal operation of other chips. The whole board interruption caused by single point failure is avoided, the test efficiency is improved, and unnecessary repeated testing and resource waste are reduced. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 A structural block diagram of a chip aging detection circuit in an embodiment of the present disclosure is shown.

[0026] Figure 2 A circuit connection diagram of a chip aging detection circuit in an embodiment of the present disclosure is shown.

[0027] Figure 3 A structural block diagram showing a specific circuit structure of an overcurrent detection circuit in a chip aging detection circuit in an embodiment of the present disclosure. DETAILED DESCRIPTION

[0028] The following is an explanation of the embodiments of the present disclosure by specific examples, and those skilled in the art can easily understand other advantages and effects of the present disclosure from the information disclosed by the present disclosure. The present disclosure can also be implemented or applied through other different specific embodiments, and the details in the present disclosure can also be modified or changed in various ways according to different viewpoints and application modules without departing from the spirit of the present disclosure. It should be noted that the embodiments in the present disclosure and the features in the embodiments can be combined with each other without conflict.

[0029] The following is a detailed description of the embodiments of the present disclosure with reference to the accompanying drawings so that those skilled in the art can easily implement the present disclosure. The present disclosure can be embodied in many different forms and is not limited to the embodiments described herein.

[0030] In the representations of the present disclosure, the reference terms "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" and the like mean that the specific features, structures, materials or characteristics represented in conjunction with the embodiment or example are included in at least one embodiment or example of the present disclosure. Moreover, the specific features, structures, materials or characteristics represented may be combined in any one or a group of embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine different embodiments or examples represented in the present disclosure and the features of different embodiments or examples, unless they are mutually contradictory.

[0031] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the representation of the present disclosure, "a group" means two or more, unless otherwise clearly and specifically defined.

[0032] In order to clearly describe the present disclosure, components not related to the description are omitted, and the same reference numerals are given to the same or similar components throughout the specification.

[0033] Throughout the specification, when a device is said to be "connected" to another device, this includes not only the case of "direct connection" but also the case of "indirect connection" by placing other elements therebetween. In addition, when a device is said to "include" a certain component, unless otherwise stated, it does not exclude other components, but means that other components may be included.

[0034] Although the terms first, second, etc. are used to represent various elements in this article in some examples, these elements should not be limited by these terms. These terms are only used to distinguish one element from another element. For example, the first interface and the second interface, etc. are represented. Moreover, as used in this article, the singular forms "one", "one" and "the" are intended to also include plural forms, unless there is an opposite indication in the context. It should be further understood that the terms "comprising" and "including" indicate the existence of features, steps, operations, elements, modules, projects, kinds, and / or groups, but do not exclude the existence, occurrence or addition of one or a group of other features, steps, operations, elements, modules, projects, kinds, and / or groups. The terms "or" and "and / or" used herein are interpreted as inclusive, or mean any one or any combination. Therefore, "A, B or C" or "A, B and / or C" means "any of the following: A; B; C; A and B; A and C; B and C; A, B and C". Only when the combination of elements, functions, steps or operations is inherently mutually exclusive in some way, will there be an exception to this definition.

[0035] The technical terms used herein are only used to refer to specific embodiments and are not intended to limit the present disclosure. The singular form used herein also includes the plural form unless the sentence clearly indicates the contrary meaning. The meaning of "including" used in the specification is to specify specific characteristics, regions, integers, steps, operations, elements and / or components, and does not exclude the existence or addition of other characteristics, regions, integers, steps, operations, elements and / or components.

[0036] Although not defined differently, all terms, including technical and scientific terms used herein, have the same meaning as those generally understood by those skilled in the art to which the present disclosure belongs. Terms defined in commonly used dictionaries are additionally interpreted as having meanings consistent with relevant technical literature and the message of the present disclosure, and shall not be overly interpreted as ideal or very formal meanings unless defined.

[0037] The main purpose of the aging test is to verify the reliability and stability of the chip under long-term operation and ensure that it can meet the strict requirements of the automotive industry in actual applications. In related technologies, multiple chips are usually placed on the same aging board for parallel testing. If only relying on board-level protection devices, once a chip fails and causes overcurrent, the board-level protection device will cut off the power supply of the entire aging board. The overcurrent protection methods in related technologies usually rely on mechanical or physical components such as fuses or thermistors. These components have a long response time and cannot cut off the current in time, which may cause damage to the equipment in overcurrent conditions.

[0038] In order to solve the above problems, an overcurrent detection device is provided in an embodiment of the present disclosure. By real-time monitoring of the current change at the load end, once an overcurrent phenomenon is detected, a control signal is generated and the power supply circuit from the power supply end to the load end is cut off to ensure that the device is not damaged. At the same time, each load has an independent overcurrent detection and protection mechanism. When an overcurrent occurs in a load, only the power supply of the load is cut off, and other loads that are working normally are not affected, thereby improving the efficiency and reliability of the system.

[0039] Please also read Figure 1 and Figure 2 .exist Figure 1 In the embodiment, the power supply circuit 100 includes a power supply terminal 101 coupled to a first external power source 1011 and a load terminal 102 coupled to a load 1021. The overcurrent detection device includes: an overcurrent detection circuit 200 and a protection circuit 300.

[0040] Optionally, in Figure 2 In an embodiment, the power supply circuit 100 includes: a first switch element Q1 and a first resistor R1. The first switch element Q1 is used to control the on and off of the power supply circuit 100. The first end of the first switch element Q1 is coupled to the power supply end 101 via the first resistor R1. The second end of the first switch element Q1 is coupled to the load end 102, and the third end of the first switch element Q1 is coupled to the protection circuit 300, which is configured to control the on and off of the power supply circuit 100 according to the control signal. The first resistor R1 is used to limit the maximum current flowing into the first switch element Q1.

[0041] The overcurrent detection circuit 200 monitors the current flowing through the load terminal 102 in the power supply circuit 100 in real time, and determines whether there is an overcurrent condition. When it is detected that the current exceeds the preset safety threshold, the overcurrent detection circuit 200 generates a control signal to indicate that an overcurrent event has occurred. The protection circuit 300 controls the state of the first switch element Q1 according to the control signal output by the overcurrent detection circuit 200, that is, the first switch element Q1 is turned on or off by the control signal, thereby realizing the on-off control of the power supply circuit 100.

[0042] Under normal working conditions, the power supply circuit 100 provides a stable power supply to the load 1021 through the first switch element Q1. At this time, the first switch element Q1 is in a closed state, allowing current to flow from the power supply end 101 to the load end 102. The overcurrent detection circuit 200 continuously monitors the current condition of the load end 102. If it is detected that the current exceeds the set safety limit, a control signal is immediately generated. After receiving the control signal sent by the overcurrent detection circuit 200, the protection circuit 300 responds and sends an instruction to the first switch element Q1 to disconnect it, thereby disconnecting the power supply circuit 100 to prevent excessive current from continuing to flow to the load 1021 and avoid possible damage. When the overcurrent condition is removed, for example, after the fault is repaired or the load 1021 resumes normal operation, the protection circuit 300 can turn on the first switch element Q1 again to restore the normal operation of the power supply circuit 100.

[0043] exist Figure 1 In the embodiment, the overcurrent detection circuit 200 is coupled to the power supply end 101 and the load end 102 respectively to detect the output current of the power supply circuit 100 at the load end 102, and generates a control signal for determining whether the output current is overcurrent according to the output current of the power supply circuit 100.

[0044] Optionally, in Figure 3 In the embodiment, the overcurrent detection circuit 200 includes: a differential amplifier circuit 201 and a comparison circuit 202. Figure 3 In an embodiment, the differential amplifier circuit 201 is respectively coupled to the load end 102 of the power supply circuit 100 and is coupled to the power supply end 101 via a bias circuit 400, and is used to amplify the voltage difference between the power supply end 101 of the power supply circuit 100 and the load end 102 according to the bias voltage provided by the bias circuit 400.

[0045] The comparison circuit 202 is respectively coupled to the differential amplifier circuit 201 , the load end 102 of the power supply circuit 100 , and the protection circuit 300 , and is used to obtain the control signal according to the voltage difference output by the differential amplifier circuit 201 and the output voltage of the power supply circuit 100 .

[0046] Specifically, when the power supply circuit 100 is turned on, the voltage difference between the power supply terminal 101 and the load terminal 102 forms a current flowing into the load 1021 through the load terminal 102. The value of this voltage difference is related to the current value of the load terminal 102. The larger the current, the larger the voltage difference (the voltage on the resistor between the power supply terminal and the load terminal). The differential amplifier circuit 201 calculates the voltage difference between the voltage of the load terminal 102 and the voltage of the power supply terminal 101, and amplifies this voltage difference. Finally, the comparison circuit 202 compares the output voltage of the differential amplifier circuit 201 and the voltage of the load terminal 102 to obtain a corresponding control signal. In some embodiments, the differential amplifier circuit 201 and the comparison circuit 202 can be used to compare the first voltage to be compared, which is amplified by a first amplification factor of the voltage of the power supply terminal 101, with the second voltage to be compared, which is amplified by a second amplification factor of the voltage of the load terminal 102, to determine whether there is an overcurrent. Since the voltage of the power supply terminal 101 is greater than the voltage of the load terminal 102 when the power supply circuit 100 is turned on, the first amplification factor is less than the second amplification factor. For example, assuming that the voltage of the power supply terminal 101 is VDD and the voltage of the load terminal is Vout, a comparison between N×(VDD-Vout) and Vout is implemented, which is equivalent to a comparison between a first voltage to be compared N×VDD and a second voltage to be compared (N+1)×Vout, where N and N+1 are the first amplification factor and the second amplification factor, respectively.

[0047] Under normal working conditions, the current of the load end 102 is small, and the voltage difference (VDD-Vout) is small, so N times (VDD-Vout) is smaller than Vout, that is, N×VDD<(N+1)×Vout. The output end of the comparison circuit 202 remains in a low level state, and the control signal is low. When the current of the load 1021 increases to overcurrent, the voltage difference (VDD-Vout) increases to make N times (VDD-Vout) greater than Vout, and the output end of the comparison circuit 202 outputs a high level control signal.

[0048] Optionally, in Figure 2 In the embodiment, the differential amplifier circuit 201 includes: a differential amplifier U1 , an input resistor R3 , and a first feedback resistor R4 .

[0049] The differential amplifier U1 includes a positive input terminal, a negative input terminal and a differential output terminal; the positive input terminal is coupled to the bias circuit 400; one end of the input resistor R3 is coupled to the load terminal 102 of the power supply circuit 100, and the other end of the input resistor R3 is coupled to the negative input terminal; one end of the first feedback resistor R4 is coupled to the negative input terminal, and the other end of the first feedback resistor R4 is coupled to the differential output terminal.

[0050] Specifically, the input resistor R3 is used to limit the current and protect the differential amplifier U1 from excessive input current. The positive input terminal is coupled to the bias circuit 400 to provide a stable reference voltage. The negative input terminal receives the voltage value from the load terminal 102. The differential amplifier U1 compares the reference voltage at the positive input terminal with the voltage at the load terminal 102 at the negative input terminal, and amplifies the difference between the two. The first feedback resistor R4 is connected between the negative input terminal and the differential output terminal of the differential amplifier U1 to form a negative feedback path. The feedback resistor is also used to set the gain of the differential amplifier U1. The gain can be controlled by adjusting the ratio of the input resistor R3 and the feedback resistor, which is usually expressed as: gain = 1 + (feedback resistor value / input resistor R3 value).

[0051] It can be understood from the above examples that when the current of the load terminal 102 increases, the voltage difference between the load terminal 102 and the power supply terminal will also increase. Therefore, the voltage of the load terminal 102 will be significantly lower than the voltage of the power supply terminal 101. If the current of the load 1021 increases beyond the set safety range, that is, overcurrent, the voltage difference of the load terminal 102 will be large enough to increase the output voltage of the differential amplifier U1, turn on the second switch element Q2 and turn off the first switch element Q1, and disconnect the power supply circuit 100.

[0052] In some embodiments, a capacitor C1 is further provided between the second external power source 210 and the differential amplifier U1 for filtering.

[0053] Optionally, in Figure 2 In the embodiment, the bias circuit 400 includes: a third resistor R5 and a fourth resistor R6.

[0054] One end of the third resistor R5 is grounded, and a second end of the third resistor R5 is coupled to the non-inverting input end.

[0055] One end of the fourth resistor R6 is coupled to the power supply terminal 101 of the power supply circuit 100 , and the other end of the fourth resistor R6 is coupled to the non-inverting input terminal.

[0056] Specifically, in some embodiments, at the connection point of the third resistor R5 and the fourth resistor R6 (i.e., the positive phase input terminal), a voltage division value determined by the ratio of the two resistors is obtained. If the resistance values ​​of the third resistor R5 and the fourth resistor R6 are fixed, then even if the power supply voltage changes slightly, the bias voltage at the positive phase input terminal will remain relatively stable. This stable bias voltage serves as a reference point for the differential amplifier U1, so that the differential amplifier U1 can more accurately compare the load terminal 102 voltage received by the negative phase input terminal. The bias voltage allows the amplifier to operate in its linear region, thereby ensuring that the signal is accurately amplified without distortion.

[0057] Optionally, in Figure 2In the embodiment, the comparison circuit 202 includes: a comparator U2 and a second feedback resistor R7.

[0058] The comparator U2 includes a first signal input terminal, a second signal input terminal and a comparison output terminal; the first signal input terminal is coupled to the output terminal of the differential amplifier circuit, and the second signal input terminal is coupled to the load terminal 102 of the power supply circuit 100 .

[0059] One end of the second feedback resistor R7 is coupled to the comparison output terminal, and the other end of the second feedback resistor R7 is coupled to the protection circuit 300 .

[0060] Specifically, in some embodiments, the comparator U2 is used to compare the voltage difference between the first signal input terminal (positive phase input terminal) from the differential amplifier U1 and the second signal input terminal (negative phase input terminal) from the load terminal 102 of the power supply circuit 100. If the voltage of the first signal input terminal is higher than the voltage of the second signal input terminal, the comparator U2 outputs a high level signal; otherwise, it outputs a low level signal. The second feedback resistor R7 is used for negative feedback, which helps to stabilize the working point of the comparator U2, reduce jitter, and improve the response speed. The feedback resistor can also be used to adjust the threshold voltage of the comparator U2 so that it can be triggered under specific conditions, such as when the current of the load 1021 exceeds a preset safety range. When the comparator U2 detects an overcurrent condition (that is, the output voltage of the differential amplifier U1 exceeds the voltage of the load terminal 102), the comparator U2 outputs a high level signal. The high level signal is transmitted to the protection circuit 300 through the second feedback resistor R7 to trigger a protection action, such as cutting off the power supply.

[0061] exist Figure 1 In the embodiment, the protection circuit 300 is respectively coupled to the overcurrent detection device and the switch control terminal of the power supply circuit 100 , and is used to control the switch control terminal according to the control signal to control the on / off of the power supply circuit 100 .

[0062] Optionally, in Figure 2 In an embodiment, the protection circuit 300 includes:

[0063] A second switch element Q2, a first end of the second switch element Q2 is coupled to the second external power source 210 via a second resistor R2, and the first end is also coupled to a switch control end for controlling the on / off of the power supply circuit 100, which is derived between the power supply end 101 and the load end 102 of the power supply circuit 100, i.e., the third end of the first switch element Q1. A second end of the second switch element Q2 is grounded, and a third end of the second switch element Q2 is coupled to the output end of the overcurrent detection circuit to control the on / off between the first end and the second end according to the control signal, thereby controlling the on / off of the power supply circuit 100.

[0064] Specifically, in some embodiments, under normal circumstances, no overcurrent is detected, and the overcurrent detection circuit 200 outputs a low-level signal. The low-level signal keeps the second switch element Q2 in a closed state (non-conductive). Because the second switch element Q2 is non-conductive, there is no conductive path between its first end and the second end, so the switch control end of the first switch element Q1 in the power supply circuit 100 will not be pulled down to a level that it cannot be conductive, and because the third end of the first switch element Q1 is coupled to the second external power source 210 through the first end of the second switch element Q2, Figure 2 In the embodiment, the first switch element Q1 is an NMOS tube, so it is turned on at a high level, and the second power supply 210 forms a high level at the third end of the first switch element Q1 and is in a conductive state, allowing current to flow from the power supply end 101 to the load end 102, and the system works normally.

[0065] When the overcurrent detection circuit 200 detects that the current of the load 1021 exceeds the preset threshold value / range, i.e., when the overcurrent occurs, a high-level control signal is generated. The high-level signal is transmitted to the third terminal (switch control terminal) of the second switch element Q2, so that the second switch element Q2 is turned on, i.e., a conduction path is formed between the first terminal and the second terminal. After being turned on, the second switch element Q2 pulls down the level of the third terminal of the first switch element Q1 in the power supply circuit 100, thereby cutting off the path of the power supply circuit 100 and stopping the first external power supply 1011 from supplying power to the load 1021 to prevent damage to the components caused by overcurrent. Once the overcurrent condition is relieved, the current decreases, the output signal of the overcurrent detection circuit 200 returns to a low level, and the second switch element Q2 enters the off state again. The switch control terminal in the power supply circuit 100 returns to a normal high-level state, reestablishes the power supply path, and resumes normal power supply.

[0066] Optionally, in Figure 2 In an embodiment, the protection circuit 300 further includes:

[0067] A third switch element Q3, wherein a first end of the third switch element Q3 is grounded, a second end of the third switch element Q3 is coupled to a third end of the second switch element Q2, and a third end of the third switch element Q3 is coupled to an external enable end 310, so as to control the on-off between the first end and the third end of the third switch element Q3 according to a control signal output by the external enable end 310, thereby controlling the on-off of the second switch element Q2.

[0068] The external enable terminal 310 is used to select whether to enable the overcurrent detection circuit 200 .

[0069] Specifically, refer to Figure 2As shown, the external enable terminal 310 can be enabled at a low level. When a low level signal is applied, the third switch element can be an N-type transistor, so the third switch element Q3 is in an off state (not conducting) at this time. Therefore, the voltage of the third terminal (switch control terminal) of the second switch element Q2 is controlled by the output terminal voltage of the overcurrent detection circuit. When there is no overcurrent, the power supply circuit 100 is turned on to allow current to flow from the power supply terminal 101 to the load terminal 102, and the system works normally. Alternatively, when there is an overcurrent, the power supply circuit 100 is disconnected. That is, when the external enable terminal 310 is at a low level, the detection circuit 200 is enabled to detect the current overcurrent situation and disconnect the power supply circuit 100 through the protection circuit 300.

[0070] When a high-level signal is applied to the external enable terminal 310, the third switch element Q3 is turned on. After being turned on, the third switch element Q3 pulls down the switch control terminal (third terminal) of the second switch element Q2 to the ground potential, causing the second switch element Q2 to remain in a non-conducting state. The first switch element Q1 continues to be turned on, and the system maintains normal power supply. In other words, when the external enable terminal 310 is at a high level, the detection circuit 200 is not enabled. Even if the overcurrent detection circuit 200 detects an overcurrent condition and outputs a high-level signal, since the third switch element Q3 has pulled down the switch control terminal of the second switch element Q2 to the ground potential, the second switch element Q2 will not be turned on, and therefore the overcurrent protection will not be triggered.

[0071] In yet another embodiment of the present disclosure, a chip aging device is provided, which includes at least one chip to be tested, and the at least one chip to be tested is coupled to the overcurrent detection device described in any one of the above embodiments.

[0072] Optionally, a plurality of chips to be detected are included, and the chips to be detected are respectively coupled to the overcurrent detection device in a one-to-one correspondence.

[0073] When there are multiple chips to be tested in the device, each chip has an independent overcurrent detection device, ensuring that each chip can be protected separately to prevent the chip aging equipment from cutting off the power supply of the entire chip aging equipment due to overcurrent of a single chip to be tested. When the current overcurrent at the load end is caused by a failure of the chip to be tested, it will be detected by the overcurrent detection circuit, and only the power supply of the chip will be cut off through the protection circuit without affecting the normal operation of other chips. This avoids the interruption of the entire board due to a single point failure, improves the test efficiency, and reduces unnecessary repeated testing and resource waste.

[0074] The above embodiments are merely illustrative of the principles and effects of the present disclosure, and are not intended to limit the present disclosure. Anyone familiar with the technology may modify or change the above embodiments without violating the spirit and scope of the present disclosure. Therefore, all equivalent modifications or changes made by those with ordinary knowledge in the technical field without departing from the spirit and technical ideas disclosed in the present disclosure shall still be covered by the protection scope of the present disclosure.

Claims

1. An overcurrent detection device, characterized in that: Used to control the on / off of the power supply circuit by controlling the switch control terminal of the power supply circuit; The power supply circuit includes a power supply terminal coupled to a first external power source and a load terminal coupled to a load; The overcurrent detection device comprises: an overcurrent detection circuit, coupled to the power supply end and the load end respectively, to detect an output current of the power supply circuit at the load end, and to generate a control signal for determining whether the output current is overcurrent according to the output current of the power supply circuit; A protection circuit, coupled to the overcurrent detection device and the switch control terminal of the power supply circuit respectively, and used for controlling the on and off of the power supply circuit according to the control signal; The power supply circuit includes a first switching element, a first end of the first switching element is coupled to the power supply end via a first resistor, a second end of the first switching element is coupled to the load end, and three ends of the first switching element are coupled to the protection circuit, and are configured to control the on and off of the power supply circuit according to the control signal.

2. The overcurrent detection device according to claim 1, characterized in that: The protection circuit comprises: A second switch element, a first end of the second switch element is coupled to a second external power supply via a second resistor, and the first end is also coupled to the switch control end for controlling the on / off of the power supply circuit led out between the power supply end and the load end of the power supply circuit; the second end of the second switch element is grounded, and the third end of the second switch element is coupled to the output end of the overcurrent detection circuit to control the on / off between the first end and the second end according to the control signal, thereby controlling the on / off of the power supply circuit.

3. The overcurrent detection device according to claim 2, characterized in that: The protection circuit further comprises: A third switch element, wherein a first end of the third switch element is grounded, a second end of the third switch element is coupled to a third end of the second switch element, and a third end of the third switch element is coupled to an external enable end, so as to control the on-off between the first end and the third end of the third switch element according to a control signal output by the external enable end, thereby controlling the on-off of the second switch element.

4. The overcurrent detection device according to claim 1, characterized in that: The overcurrent detection circuit comprises: A differential amplifier circuit, respectively coupled to the load end of the power supply circuit and coupled to the power supply end via a bias circuit, for amplifying the voltage difference between the power supply end of the power supply circuit and the load end according to the bias voltage provided by the bias circuit and outputting the amplified voltage; The comparison circuit is respectively coupled to the differential amplifier circuit, the load end of the power supply circuit and the protection circuit, and is used to obtain the control signal according to the voltage difference output by the differential amplifier circuit and the output voltage of the power supply circuit.

5. The overcurrent detection device according to claim 4, characterized in that: The differential amplifier circuit comprises: A differential amplifier, comprising a positive phase input terminal, a negative phase input terminal and a differential output terminal; the positive phase input terminal is coupled to the bias circuit; An input resistor, one end of the input resistor is coupled to the load end of the power supply circuit, and the other end of the input resistor is coupled to the negative phase input end; A first feedback resistor, one end of the first feedback resistor is coupled to the negative phase input end, and the other end of the first feedback resistor is coupled to the differential output end.

6. The overcurrent detection device according to claim 5, characterized in that: The bias circuit comprises: a third resistor, one end of the third resistor being grounded, and a second end of the third resistor being coupled to the non-inverting input end; A fourth resistor, one end of the fourth resistor is coupled to the power supply end of the power supply circuit, and the other end of the fourth resistor is coupled to the non-inverting input end.

7. The overcurrent detection device according to claim 4, characterized in that: The comparison circuit comprises: A comparator, the comparator comprising a first signal input terminal, a second signal input terminal and a comparison output terminal; the first signal input terminal is coupled to the output terminal of the differential amplifier circuit, and the second signal input terminal is coupled to the load terminal of the power supply circuit; A second feedback resistor, one end of the second feedback resistor is coupled to the comparison output terminal, and the other end of the second feedback resistor is coupled to the protection circuit.

8. A chip aging device, characterized in that: It comprises at least one chip to be tested, and the at least one chip to be tested is coupled to the overcurrent detection device as described in any one of claims 1-7.

9. The chip aging equipment according to claim 8, characterized in that: It comprises a plurality of chips to be detected, and the chips to be detected are respectively coupled to the over-current detection device in a one-to-one correspondence.

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