Radio frequency microsystem test integrated BIT self-checking system

Abstract

The invention relates to an integrated BIT self-checking system for testing a radio frequency microsystem. The integrated BIT self-checking system comprises a BIT core module, a communication module, a relay module, a power supply module, a level conversion module, an input / output interface module and a BIT self-checking software module, the BIT core module is connected with the communication module, the relay module, the power supply module, the level conversion module and the input / output interface module; the input / output interface module is connected with the relay module and the level conversion module; and the BIT self-checking software module is connected with the communication module. The radio frequency micro-system testing system has the advantages that the radio frequency micro-system testing system can be flexibly switched between an electrical performance testing mode and a functional testing mode, the testing and screening requirements of the current radio frequency micro-system are met, and the testing and screening system is reconfigurable, extensible and high in integration level. The power-on and communication modes of the test system are optimized, the test convenience is improved, the use of a direct-current power supply is reduced, and the cost of the test system is reduced.

Description

Technical Field

[0001] The invention relates to a radio frequency microsystem test integrated BIT self-checking system, belonging to the technical field of radio frequency electronic engineering test technology. Background Art

[0002] Active phased array systems have the advantages of fast beam scanning speed, flexible beam pointing, and strong multi-target tracking capabilities. They are widely used in radar, electronic countermeasures, and communication systems.

[0003] In the active phased array system, the RF microsystem has the characteristics of large usage and high value. Its reliability is the key factor affecting whether the entire system can work normally. In order to ensure the quality of the RF microsystem, sufficient testing and screening are required before leaving the factory. Due to the high integration of the RF microsystem and the many index parameters, its test process is complicated, and the test resources and test time are very large. The electrical performance test of the RF microsystem usually includes S parameter test, frequency parameter test, time parameter test, and noise coefficient test. The functional test of the RF microsystem usually includes port impedance test, temperature readback test, and data readback test. At present, the electrical performance test and functional test of the RF microsystem require the use of different test systems and workstations. After switching workstations, it is necessary to rewire, set up instruments, configure software, etc., which is inconvenient to use and inefficient. Multiple workstations not only occupy a large area, but also the cost of multiple test systems is high. If a BIT self-test system for integrated RF microsystem testing can be constructed, the test efficiency of the RF microsystem can be improved and the test coverage can be improved. Summary of the invention

[0004] The present invention proposes an integrated BIT self-test system for radio frequency microsystem testing, which aims to address the above-mentioned problems existing in the prior art. Through the connection relationship of each module and the test mode switching mechanism, the system overcomes the problems of complex operation, incomplete test coverage, low test efficiency, etc. during radio frequency microsystem test screening, and realizes the organic integration of electrical performance testing and functional testing of radio frequency microsystems.

[0005] The technical solution of the present invention is: a BIT self-test system integrating radio frequency microsystem testing, which structure includes a BIT core module, a communication module, a relay module, a power supply module, a level conversion module, an input / output interface module, and a BIT self-test software module; the BIT core module is connected to the communication module, the relay module, the power supply module, the level conversion module and the input / output interface module; the input / output interface module is connected to the relay module and the level conversion module; the BIT self-test software module is connected to the communication module.

[0006] The BIT core module 1 includes an FPGA unit and an MCU unit, and the FPGA unit is connected to the MCU unit and the communication module 2 .

[0007] The communication module includes a USB to four asynchronous serial port circuits and a communication status monitoring module. The USB to four asynchronous serial port circuits are connected to the FPGA unit, the communication status monitoring module, and the BIT self-test software module 7.

[0008] The relay module comprises a relay unit and a transistor protection module, and the relay unit is connected to the FPGA unit and the transistor protection module.

[0009] The power supply module includes a TYPE-C power supply module, a DC power supply module, and a voltage stabilizing module. One end of the voltage stabilizing module is connected to the TYPE-C power supply module and the DC power supply module, and the other end of the voltage stabilizing module is connected to the BIT core module, the communication module, the relay module, and the level conversion module; the power supply module provides energy for each module of the integrated BIT self-test system for radio frequency microsystem testing.

[0010] The level conversion module includes a TTL driver module, an LVTTL driver module, an LVDS driver module and an RS422\485\232 driver module. One end of the TTL driver module, the LVTTL driver module, the LVDS driver module and the RS422\485\232 driver module is connected to the FPGA unit, one end is connected to the relay unit, and the other end is connected to the input / output interface module.

[0011] The input / output interface module includes a control signal input / output module, a voltage output module, and a pulse modulation signal input module. The control signal input / output module is connected to the level conversion module and the FPGA unit. The voltage output module is connected to the power supply module. The pulse modulation signal input module is connected to the level conversion module. The BIT self-test software module includes a serial port sending / receiving module, a data processing module, a data acquisition module, and an instrument control module. The serial port sending / receiving module is connected to the communication module, the data processing module, the data acquisition module, and the instrument control module.

[0012] The working method of the self-checking system includes the following method: 1. The BIT core module receives serial data from the host computer through the communication module, and according to the control requirements of different types of RF microsystems, parses and processes the data and sends it to the level conversion module for driving output or the input / output interface module for direct output; 2. The communication module receives the data sent by the BIT self-test software module and sends it to the BIT core module through the asynchronous serial port; the relay module is used to control the interface direction of the relay and switch the RF microsystem test integrated BIT self-test system to the electrical performance test mode or the functional test mode; 3. The level conversion module drives the control signal sent by the BIT core module to be converted into TTL, LVTTL or LVDS level and then sent to the DUT by the input / output interface module; 4. The input / output interface module connects the transmitting end and the receiving end to transmit the control signal; 5. The BIT self-test software module sends data to the BIT core module through the communication module, controls the operation process of the entire RF microsystem test integrated BIT self-test system, and is used for data collection and recording of test screening.

[0013] The relay module switches the normally closed contact or the normally open contact; if the normally closed contact of the relay module is open, the integrated BIT self-test system for testing the radio frequency microsystem is in the electrical performance test mode, and the control signal sent by the BIT core module passes through the normally closed contact of the relay module and is then sent to the device under test by the input / output interface module; if the normally open contact of the relay module is open, the integrated BIT self-test system for testing the radio frequency microsystem is in the functional test mode, and the port of the device under test is directly connected to a measuring instrument such as a multimeter through the normally open contact of the relay module.

[0014] Beneficial effects of the present invention: 1) The radio frequency microsystem test integrated BIT self-test system of the present invention realizes flexible switching between the two test modes of electrical performance test and functional test of the radio frequency microsystem test system through the switching of relays, which is suitable for the test screening needs of current radio frequency microsystems and has the characteristics of reconfigurability, scalability and high integration.

[0015] 2) The integrated BIT self-test system for RF microsystem testing is implemented through USB to TYPE-C and USB to serial port, which optimizes the power-on and communication methods of the test system, improves the convenience of testing, reduces the use of DC power supply, and reduces the cost of the test system.

[0016] 3) Through the integration of electrical performance testing and functional testing, the integration of the test system is further improved, the test screening capability is enhanced, and the production capacity is effectively increased. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 The figure shows a schematic diagram of a BIT self-test system for integrated radio frequency microsystem testing according to an embodiment of the present invention; Figure 2 The figure is a schematic diagram of the working principle of the BIT core module of an embodiment of the present invention; Figure 3 The figure is a flowchart of the BIT self-checking software module according to an embodiment of the present invention; Figure 4The figure shows a schematic diagram of switching between an electrical performance test and a functional test according to an embodiment of the present invention; Figure 5 The figure shows the connection relationship diagram of various components in the electrical performance test mode of one embodiment of the present invention; Figure 6 FIG. 1 is a diagram showing the connection relationship of various components in a functional test mode according to an embodiment of the present invention.

[0018] In the attached figure, 1-BIT core module, 2-communication module, 3-relay module, 4-power supply module, 5-level conversion module, 6-input / output interface module, 7-BIT self-test software module. DETAILED DESCRIPTION

[0019] The technical solution of the present invention is further explained below in conjunction with the accompanying drawings.

[0020] The embodiment of the present invention discloses a BIT self-test system integrating radio frequency microsystem testing, such as Figure 1 As shown, the radio frequency microsystem test integrated BIT self-test system includes a BIT core module 1, a communication module 2, a relay module 3, a power supply module 4, a level conversion module 5, an input / output interface module 6, and a BIT self-test software module 7. The BIT core module 1 is connected to the communication module 2, the relay module 3, the power supply module 4, the level conversion module 5 and the input / output interface module 6; the input / output interface module 6 is connected to the relay module 3 and the level conversion module 5; and the BIT self-test software module 7 is connected to the communication module 2.

[0021] The BIT core module includes an FPGA unit and an MCU unit, and the FPGA unit is connected to the MCU unit and the communication module. The communication module includes a USB to four asynchronous serial port circuits and a communication status monitoring module, and the USB to four asynchronous serial port circuits are connected to the FPGA unit and the communication status monitoring module. The relay module includes a relay unit and a transistor protection module, and the relay unit is connected to the FPGA unit and the transistor protection module. The power supply module includes a TYPE-C power supply module, a DC power supply module, and a voltage stabilizing module. One end of the voltage stabilizing module is connected to the TYPE-C power supply module and the DC power supply module, and the other end of the voltage stabilizing module is connected to the BIT core module, the communication module, the relay module, and the level conversion module. The level conversion module includes a TTL driver module, an LVTTL driver module, an LVDS driver module and an RS422\485\232 driver module. One end of the TTL driver module, the LVTTL driver module, the LVDS driver module and the RS422\485\232 driver module is connected to the FPGA unit, and the other end of the TTL driver module, the LVTTL driver module, the LVDS driver module and the RS422\485\232 driver module is connected to the input / output interface module. The input / output interface module includes a control signal input / output module, a voltage output module and a pulse modulation signal input module. The control signal input / output module is connected to the level conversion module and the FPGA unit, the voltage output module is connected to the power supply module, and the pulse modulation signal input module is connected to the level conversion module. The BIT self-test software module includes a serial port sending / receiving module, a data processing module, a data acquisition module and an instrument control module. The serial port sending / receiving module is connected to the communication module, the data processing module, the data acquisition module and the instrument control module.

[0022] The BIT core module receives serial data from the host computer through the communication module, and according to the control requirements of different types of RF microsystems, parses and processes the data and sends it to the level conversion module to drive the output or the input / output interface module to directly output. The communication module receives the data sent by the BIT self-test software module and sends it to the BIT core module through the asynchronous serial port. The relay module is used to control the interface direction of the relay and switch the integrated BIT self-test system for RF microsystem testing to the electrical performance test mode or the functional test mode. The power supply module provides energy for each module of the integrated BIT self-test system for RF microsystem testing. The level conversion module drives the control signal sent by the BIT core module, drives it into various types of levels such as TTL, LVTTL, LVDS, etc., and then sends it to the device under test by the input / output interface module. The input / output interface module connects the transmitting end and the receiving end to transmit the control signal. The BIT self-test software module sends data to the BIT core module through the communication module, controls the operation process of the entire integrated BIT self-test system for RF microsystem testing, and is used for data collection and recording of test screening.

[0023] like Figure 2 As shown, the communication module sends data frames and function frames through serial port 1 and serial port 2 respectively. After receiving the data, the FPGA unit parses and stores the data frame and sends the function frame to the MCU unit. The MCU unit parses the function frame in serial mode into the function bit in parallel mode and transmits it back to the FPGA unit. The data frame contains the data content that the FPGA unit needs to distribute, and the function frame contains the project model to distinguish the timing nesting relationship and interface level of the project. After the FPGA unit recognizes the data frame and the data of the function bit, it distributes the corresponding control signal to the level conversion module through the GPIO port.

[0024] like Figure 3 As shown, after the BIT self-test software module is run, the system is initialized first, and then the project model, test parameters, and storage path are selected in sequence. After the configuration operation is correct, the BIT self-test software module sends a control instruction, waits for the response of the device under test, and then controls the instrument to collect data. After the data collection is completed, the data is automatically analyzed and the data results are displayed on the user interface and saved locally.

[0025] like Figure 4As shown, the BIT core module controls the relay module to switch the normally closed contact or the normally open contact. If the normally closed contact of the relay module is open, the integrated BIT self-test system for RF microsystem testing is in the electrical performance test mode, and the control signal sent by the BIT core module passes through the normally closed contact of the relay module and is sent to the device under test by the input / output interface module. If the normally open contact of the relay module is open, the integrated BIT self-test system for RF microsystem testing is in the functional test mode, and the port of the device under test is directly connected to a measuring instrument such as a multimeter through the normally open contact of the relay module.

[0026] like Figure 5 As shown, when the integrated BIT self-test system for RF microsystem testing is in the electrical performance test mode, the BIT self-test software module sends control instructions to the communication module via USB, and the communication module sends data to the BIT core module via asynchronous serial port. The BIT core module receives and parses the data, and distributes the corresponding control signal according to the control requirements of different RF microsystems after the data processing is completed. After the control signal is driven and output by the level conversion module, it passes through the relay module and the input / output interface module in sequence to the device under test. After the device under test responds to the control signal instruction, the BIT self-test software module collects the electrical performance data of the device under test measured by the test instrument via GPIB or serial port. After the collection is completed, the BIT self-test software module sends a new control instruction to the communication module, and so on.

[0027] like Figure 6 As shown, when the integrated BIT self-test system for RF microsystem testing is in functional test mode, the BIT self-test software module sends control instructions to the communication module via USB, and the communication module sends data to the BIT core module via asynchronous serial port. After receiving and parsing the data, the BIT core module identifies it as functional test mode. The BIT core module controls the pin switching of the relay module through the GPIO port, opens the normally open contact, and after the switching is completed, the port of the device under test will be directly connected to the multimeter, and the multimeter can read the port impedance of the pin. The BIT self-test software module can control each relay unit in the relay module in turn through instructions, so that the multimeter can measure the impedance of each port of the device under test in turn. After each pin is switched, the BIT self-test software module can control the multimeter through the serial port to collect the port impedance once, and automatically determine whether it is compliant after the collection is completed and save the test data locally.

[0028] The above is only a preferred embodiment of the present invention, and the present invention is not limited to the above embodiments. It is understood that other improvements and changes directly derived or associated by those skilled in the art without departing from the basic concept of the present invention should be considered to be included in the protection scope of the present invention.

Claims

1. A radio frequency microsystem test integrated BIT self-test system, characterized in that its structure includes a BIT core module, a communication module, a relay module, a power supply module, a level conversion module, an input / output interface module, and a BIT self-test software module; the BIT core module is connected to the communication module, the relay module, the power supply module, the level conversion module and the input / output interface module; the input / output interface module is connected to the relay module and the level conversion module; the BIT self-test software module is connected to the communication module.

2. The radio frequency microsystem test integrated BIT self-test system according to claim 1 is characterized in that The BIT core module 1 includes an FPGA unit and an MCU unit, and the FPGA unit is connected to the MCU unit and the communication module 2 .

3. The radio frequency microsystem test integrated BIT self-test system according to claim 1 is characterized in that The communication module includes a USB to four asynchronous serial port circuits and a communication status monitoring module. The USB to four asynchronous serial port circuits are connected to the FPGA unit, the communication status monitoring module, and the BIT self-test software module 7.

4. The radio frequency microsystem test integrated BIT self-test system according to claim 1 is characterized in that The relay module includes a relay unit and a transistor protection module, and the relay unit is connected to the FPGA unit and the transistor protection module.

5. The radio frequency microsystem test integrated BIT self-test system according to claim 1 is characterized by: The power supply module includes a TYPE-C power supply module, a DC power supply module, and a voltage stabilizing module. One end of the voltage stabilizing module is connected to the TYPE-C power supply module and the DC power supply module, and the other end of the voltage stabilizing module is connected to the BIT core module, the communication module, the relay module, and the level conversion module; the power supply module provides energy for each module of the integrated BIT self-test system for radio frequency microsystem testing.

6. The radio frequency microsystem test integrated BIT self-test system according to claim 1 is characterized by: The level conversion module includes a TTL drive module, an LVTTL drive module, an LVDS drive module and an RS422\485\232 drive module. One end of the TTL drive module, the LVTTL drive module, the LVDS drive module and the RS422\485\232 drive module is connected to the FPGA unit, one end is connected to the relay unit, and the other end is connected to the input / output interface module.

7. The radio frequency microsystem test integrated BIT self-test system according to claim 1 is characterized by: The input / output interface module includes a control signal input / output module, a voltage output module, and a pulse modulation signal input module. The control signal input / output module is connected to the level conversion module and the FPGA unit, the voltage output module is connected to the power supply module, and the pulse modulation signal input module is connected to the level conversion module.

8. The radio frequency microsystem test integrated BIT self-test system according to claim 1 is characterized by: The BIT self-test software module includes a serial port sending / receiving module, a data processing module, a data acquisition module, and an instrument control module. The serial port sending / receiving module is connected to the communication module, the data processing module, the data acquisition module, and the instrument control module.

9. A method for operating the radio frequency microsystem test integrated BIT self-test system according to any one of claims 1 to 9, characterized in that The following methods are included: 1) The BIT core module receives serial data from the host computer through the communication module, and according to the control requirements of different types of RF microsystems, parses and processes the data and sends it to the level conversion module for driving output or the input / output interface module for direct output; 2) The communication module receives the data sent by the BIT self-test software module and sends it to the BIT core module through the asynchronous serial port; the relay module is used to control the interface direction of the relay and switch the RF microsystem test integrated BIT self-test system to the electrical performance test mode or the functional test mode; 3) The level conversion module drives the control signal sent by the BIT core module, drives it into TTL, LVTTL or LVDS level, and then sends it to the device under test by the input / output interface module; 4) The input / output interface module connects the transmitting end and the receiving end to transmit the control signal; 5) The BIT self-test software module sends data to the BIT core module through the communication module, controls the operation process of the entire RF microsystem test integrated BIT self-test system, and is used for data collection and recording of test screening.

10. The working method according to claim 9, characterized in that The method also includes the following steps: the relay module switches the normally closed contact or the normally open contact; if the normally closed contact of the relay module is opened, the integrated BIT self-test system for testing radio frequency microsystem is in an electrical performance test mode, and the control signal sent by the BIT core module passes through the normally closed contact of the relay module and is then sent to the device under test by the input / output interface module; if the normally open contact of the relay module is opened, the integrated BIT self-test system for testing radio frequency microsystem is in a functional test mode, and the port of the device under test is directly connected to a measuring instrument such as a multimeter through the normally open contact of the relay module.

Images