Test method, test tool and test system of embedded drive acquisition equipment

Abstract

The invention discloses a test method, a test tool and a test system of embedded drive acquisition equipment. A test task of a drive acquisition channel of to-be-tested equipment is realized by utilizing an upper computer and source equipment configured according to the architecture of the to-be-tested equipment. Specifically, in response to a test requirement, an upper computer configures a test instruction for controlling a device to be tested and a source device to execute a driving operation and an acquisition operation, and then sends the test instruction to the device to be tested and the source device. The acquisition channel of the to-be-tested device is connected with the driving channel of the source device, so that after the signal acquisition result fed back by the to-be-tested device and the source device is received, the preset output signal information and the signal acquisition result are compared to realize the test task of the driving acquisition channel of the to-be-tested device. The test instruction is configured by the upper computer, the test result is determined, the manual workload is reduced, and the test efficiency is improved.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and more specifically, to a testing method, testing tooling and testing system for an embedded drive acquisition device. Background Art

[0002] Embedded drive acquisition equipment refers to equipment that executes fixed logic through pre-configured embedded chips and realizes the input and output functions of specific signals through drive acquisition hardware circuits. It is widely used in fields such as railways that require a large number of signal representations. In order to ensure that the driving and acquisition functions of embedded drive acquisition equipment are normal, a large number of drive acquisition hardware circuit channels need to be tested when manufacturing embedded drive acquisition equipment.

[0003] At present, manual testing is mainly adopted to realize the test task of the driver acquisition hardware channel. Specifically, the operator manually connects the driver acquisition channel and test instrument of the embedded driver acquisition device to be tested, and configures the driver acquisition channel and test instrument involved in the test project one by one, and then determines the test result according to the feedback information of the embedded driver acquisition device and test instrument.

[0004] The existing testing process is relatively cumbersome and requires a lot of manual operations, which places high demands on the professionalism of the operators. This makes the current testing efficiency low and may cause human errors caused by operators' fatigue over a long period of time. Summary of the invention

[0005] In view of the above problems, the present application is proposed to provide a test method, test tooling and test system for an embedded driver acquisition device, so as to realize the test task of the driver acquisition hardware channel of the embedded driver acquisition device.

[0006] The specific plan is as follows:

[0007] In a first aspect, a test method for an embedded drive acquisition device is provided, which is applied to a host computer, wherein the host computer communicates with a device to be tested and a source device through a communication interface, and the method comprises:

[0008] In response to a test requirement for a drive acquisition channel of the device to be tested, configuring a test instruction;

[0009] Calling the communication interface to send a test instruction to the device to be tested and the source device, wherein the source device is an embedded drive acquisition device configured according to the architecture of the device to be tested, and the test instruction is used to control the device to be tested and the source device to perform a drive operation and an acquisition operation; wherein the drive channel of the device to be tested is connected to the acquisition channel of the source device, and the acquisition channel of the device to be tested is connected to the drive channel of the source device;

[0010] Receiving, via the communication interface, signal acquisition results fed back by the device to be tested and the source device;

[0011] The preset output signal information is compared with the signal acquisition result to determine the test result corresponding to the test instruction.

[0012] In a second aspect, a test fixture for an embedded drive acquisition device is provided, comprising: a host computer and a source device;

[0013] The source device is an embedded drive acquisition device configured according to the architecture of the device to be tested, and is used to provide an acquisition channel connected to the drive channel of the device to be tested and a drive channel connected to the acquisition channel of the device to be tested;

[0014] The host computer is configured with a communication interface, and the communication interface is used to communicate with the source device and the device to be tested; the host computer is configured with a program, and when the program is executed by the processor of the host computer, the following steps are implemented:

[0015] In response to a test requirement for a drive acquisition channel of the device to be tested, configuring a test instruction;

[0016] Calling the communication interface to send a test instruction to the device to be tested and the source device, wherein the test instruction is used to control the device to be tested and the source device to perform a driving operation and a collection operation;

[0017] Receiving, via the communication interface, signal acquisition results fed back by the device to be tested and the source device;

[0018] The preset output signal information is compared with the signal acquisition result to determine the test result corresponding to the test instruction.

[0019] In a third aspect, a test system for an embedded drive acquisition device is provided, comprising: a host computer and a slave computer;

[0020] The lower computer includes: a device to be tested and a source device; wherein the source device is an embedded drive acquisition device configured according to the architecture of the device to be tested, the drive channel of the device to be tested is connected to the acquisition channel of the source device, and the acquisition channel of the device to be tested is connected to the drive channel of the source device;

[0021] The host computer communicates with the device to be tested and the source device through a communication interface. The host computer is configured with a program. When the program is executed by the processor of the host computer, the following steps are implemented:

[0022] In response to a test requirement for a drive acquisition channel of the device to be tested, configuring a test instruction;

[0023] Calling the communication interface to send a test instruction to the device to be tested and the source device, wherein the test instruction is used to control the device to be tested and the source device to perform a driving operation and a collection operation;

[0024] Receiving, via the communication interface, signal acquisition results fed back by the device to be tested and the source device;

[0025] The preset output signal information is compared with the signal acquisition result to determine the test result corresponding to the test instruction.

[0026] By means of the above technical scheme, the present application utilizes a host computer and a source device to realize the test task of the drive acquisition channel of the device to be tested, wherein the source device is an embedded drive acquisition device configured according to the architecture of the device to be tested, and the host computer communicates with the device to be tested and the source device through a communication interface. When testing the drive acquisition channel of the device to be tested, the host computer responds to the test requirements of the drive acquisition channel of the device to be tested, configures the corresponding test instructions; and then calls the communication interface to send the test instructions to the device to be tested and the source device. Since the test instructions are used to control the device to be tested and the source device to perform the drive operation and the acquisition operation, the drive channel of the device to be tested is connected to the acquisition channel of the source device, and the acquisition channel of the device to be tested is connected to the drive channel of the source device, so the test task of the acquisition channel of the device to be tested can be realized by comparing the preset output signal information and the signal information collected by the device to be tested; the test task of the drive channel of the device to be tested can be realized by comparing the preset output signal information and the signal information collected by the source device. The above test scheme, by configuring the test instructions and determining the test results by the host computer, reduces the workload of the tester, can improve the test efficiency to a certain extent, and can avoid human errors to a certain extent. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present application. Also, the same reference symbols are used throughout the accompanying drawings to represent the same components. In the accompanying drawings:

[0028] Figure 1 A schematic diagram showing the connection relationship between the host computer, the device to be tested and the source device is shown;

[0029] Figure 2 It is a flowchart of a testing method of an embedded drive acquisition device according to an embodiment of the present application;

[0030] Figure 3An example of a schematic diagram of the connection relationship between the drive acquisition channel of the device under test DUT and the source device DAS is shown;

[0031] Figure 4 The connection diagram of the driving circuit and the acquisition circuit is illustrated;

[0032] Figure 5 It is a flow chart of another method for testing an embedded drive acquisition device according to an embodiment of the present application;

[0033] Figure 6 It is a structural schematic diagram of a test system for an embedded drive acquisition device according to an embodiment of the present application. DETAILED DESCRIPTION

[0034] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0035] The applicant of this case has found through research that the semi-automatic test task of the driver acquisition hardware channel of the embedded driver acquisition device can be realized by means of a pre-designed traversal enumeration type embedded software program. Specifically, a temporary test program for realizing all test items is written into the device to be tested, so that the device to be tested can automatically execute the script program to realize the corresponding test items. However, in general, the embedded driver acquisition device does not have input and output interfaces such as a display, a mouse, and a keyboard, and only has a few indicator lights indicating the working status. Most embedded driver acquisition devices automatically execute fixed logical functions and input and output functions after power-on. Therefore, there is a problem of difficulty in human-computer interaction, and it is difficult to control the working status manually, and it is also difficult to intuitively obtain the current test status information. For example, controlling the start of the test, controlling the interruption of the test, displaying the test situation during the test, and summarizing and displaying the test results after the test, all require calling the communication interface to perform input control and output inspection of each command one by one. The test operation is relatively cumbersome and inconvenient, and only a simple test log can be generated, which makes it difficult to achieve standardized production and manufacturing test data management tasks.

[0036] The applicant of this case further studied and found that embedded software development is currently mainly based on low-level languages ​​such as C / C++. Therefore, when designing embedded software programs, it is necessary to first build various functional functions to achieve certain testing requirements. In order to achieve all test items, a large number of test programs need to be written, and the design workload is large. In addition, there is a lack of intuitive and convenient debugging tools.

[0037] To solve the above problems, the present application provides a testing method, testing tooling and testing system for an embedded drive acquisition device to implement the testing task of the drive acquisition channel of the embedded drive acquisition device.

[0038] The test method of the embedded driver acquisition device provided by the present application can be applied to a host computer, and the host computer can refer to: a computer with a human-computer interaction function, a storage medium and a communication interface. The host computer can communicate with the device to be tested and the source device through a communication interface, wherein the device to be tested (device under test, DUT) is an embedded driver acquisition device that needs to be tested for driving acquisition channel testing during manufacturing, and the source device (device as source, DAS) is an embedded driver acquisition device configured according to the architecture of the device to be tested, and has the same main architecture and system structure as the device to be tested, and when testing the device to be tested, the drive channel of the device to be tested is connected to the acquisition channel of the source device, and the acquisition channel of the device to be tested is connected to the drive channel of the source device, that is, the source device can be used to provide the drive and acquisition signals required for the device to be tested. In addition, the device to be tested and the source device can be collectively referred to as a lower computer.

[0039] For example, Figure 1 The schematic diagram of the connection relationship between the host computer, the device to be tested and the source device is shown in FIG. Figure 1 As shown, the communication interface 1-1 on the host computer is connected to the communication interface 2-1 on the device under test, the communication interface 1-2 on the host computer is connected to the communication interface 3-1 on the source device, the drive channel of the device under test is connected to the acquisition channel of the source device, and the acquisition channel of the device under test is connected to the drive channel of the source device.

[0040] Figure 2 is a flow chart of a method for testing an embedded drive acquisition device according to an embodiment of the present application, combined with Figure 2 As shown, the method may include the following steps:

[0041] Step S101 : configuring a test instruction in response to a test requirement for a drive acquisition channel of the device to be tested.

[0042] The test instructions can be used to control the device to be tested and the source device to perform driving operations and acquisition operations to meet the test requirements. It should be noted that for embedded drive acquisition devices, the driving channel of the device can perform driving operations to achieve the task of the device outputting voltage, current or other types of signals to the outside; the acquisition channel of the device can perform acquisition operations to achieve the task of the device acquiring voltage, current or other types of signals from the outside.

[0043] In one possible implementation, configuring the test instructions may include organizing a test sequence.

[0044] Exemplarily, assuming that the test task corresponding to the test requirement is to test the driving voltages of driving channels 1 to 5 respectively, the organized test sequence can be used to implement: executing the driving voltage test tasks of driving channel 1, driving channel 2, ..., driving channel 5 in sequence.

[0045] Step S102: calling the communication interface to send a test instruction to the device to be tested and the source device.

[0046] It should be noted that when testing the driving channel, the test instructions sent to the device to be tested are used to control the device to be tested to perform the driving function so that the acquisition channel of the source device can perform signal acquisition; when testing the acquisition channel, the test instructions sent to the source device are used to control the source device to perform the driving function and output a preset output signal so that the acquisition channel of the device to be tested can perform signal acquisition.

[0047] Step S103: receiving the signal acquisition results fed back by the device to be tested and the source device through the communication interface.

[0048] Step S104: compare the preset output signal information with the signal acquisition result to determine the test result corresponding to the test instruction.

[0049] It should be noted that when testing the driving channel, the signal output by the source device (i.e., the preset output signal) and the signal collected by the device to be tested are compared. If the two are consistent, the test passes and the collection channel of the device to be tested is normal; otherwise, the test fails and the collection channel of the device to be tested is abnormal; when testing the collection channel, the signal output by the device to be tested (i.e., the preset output signal) and the signal collected by the source device are compared. If the two are consistent, the test passes and the driving channel of the device to be tested is normal; otherwise, the test fails and the driving channel of the device to be tested is abnormal.

[0050] The test scheme provided by the embodiment of the present application utilizes a host computer and a source device to implement the test task of the drive acquisition channel of the device to be tested. Wherein, the source device is an embedded drive acquisition device configured according to the architecture of the device to be tested, and the host computer communicates with the device to be tested and the source device through a communication interface. When testing the drive acquisition channel of the device to be tested, the host computer responds to the test requirements of the drive acquisition channel of the device to be tested, configures the corresponding test instructions, and then calls the communication interface to send the test instructions to the device to be tested and the source device. Since the test instructions are used to control the device to be tested and the source device to perform drive operations and acquisition operations, the drive channel of the device to be tested is connected to the acquisition channel of the source device, and the acquisition channel of the device to be tested is connected to the drive channel of the source device, so the test task of the acquisition channel of the device to be tested can be realized by comparing the preset output signal information and the signal information collected by the device to be tested; by comparing the preset output signal information and the signal information collected by the source device, the test task of the drive channel of the device to be tested is realized. Compared with the existing test scheme implemented by embedded software program, the test scheme provided by the embodiment of the present application migrates the configuration of test instructions, the organization of test sequence and the logical judgment of collection results from the embedded drive collection device to the host computer. The entire test process is controlled by the host computer, and two-way communication between the host computer and the slave computer is realized through the communication interface, which reduces the workload of testers, improves the test efficiency to a certain extent, and avoids human error. In addition, the test scheme provided by the embodiment of the present application does not need to use test instruments, which reduces the test cost.

[0051] It should be noted that compared with the design task of embedded software programs, it is easier to configure test instructions or organize test sequences through the host computer. The main reason is that with the host computer, testers do not need to frequently enter command lines, and the software program design tasks on the host computer can be implemented based on high-level programming languages ​​with a large number of development libraries. Taking the graphical LabVIEW program as an example, when configuring test instructions and organizing test sequences, you can directly use the existing time measurement, process status polling, event timing control, local configurable file reading and writing, multi-level queue status monitoring, human-computer interaction, information analysis and other function libraries. The possibility of building function functions is relatively small, and the debugging tools are also more intuitive and diverse.

[0052] In some embodiments provided in the present application, the driving acquisition channel of the source device is symmetrical with the driving acquisition channel of the device under test; the driving acquisition channel of the device under test is plug-connected with the driving acquisition channel of the source device.

[0053] That is to say, the source device is an embedded drive acquisition device symmetrically coupled with the device to be tested, and the drive acquisition channel of the source device is symmetrically coupled with the drive acquisition channel of the device to be tested, that is, the drive and acquisition structures of the device to be tested and the source device symmetrical to the device to be tested are symmetrical. Exemplarily, assuming that channel 1 of the device to be tested is a drive channel, channel 1 of the source device symmetrical to it is an acquisition channel. And a group of drive channels and acquisition channels belonging to the device to be tested and the source device respectively also meet the following requirements: the output signal amplitude, response speed and accuracy of the drive channel can meet the acquisition test requirements of the acquisition channel corresponding to the drive channel.

[0054] The above-mentioned plug-in connection may refer to the connection of two channels with the same number or the same position on the device to be tested and the source device. For example, Figure 3 A schematic diagram showing the connection relationship between the drive acquisition channel of a device under test DUT and a source device DAS is shown. Figure 3 As shown, the driving channel 1 of the DAS is connected to the collection channel 1 of the DUT, the driving channel 2 of the DAS is connected to the collection channel 2 of the DUT; the driving channel 3 of the DAS is connected to the collection channel 3 of the DUT; the driving channel 4 of the DAS is connected to the collection channel 4 of the DUT; the driving channel 1 of the DUT is connected to the collection channel 1 of the DAS; and the driving channel 2 of the DUT is connected to the collection channel 2 of the DAS.

[0055] Figure 4 The connection diagram of the driving circuit and the acquisition circuit is shown in the figure. Figure 4 As shown, the impedance in the drive circuit (DriveCircuit, DC) and the acquisition circuit can form a series structure.

[0056] Since the device to be tested is symmetrical with the source device, and the driving acquisition channel of the device to be tested is plug-in connected to the driving acquisition channel of the source device, compared with the connection method using a disordered plug-in interface, this solution can use a unified physical interface, thereby reducing the overall design cost, management cost and implementation difficulty to a certain extent, and can simplify the test architecture, host computer program, test instruction generation solution, etc. to a certain extent.

[0057] In another possible implementation, a connection form in which one driving channel corresponds to multiple acquisition channels, and a connection form in which one acquisition channel corresponds to multiple driving channels can be adopted. Although the above connection form reduces the number of circuits of the driving circuit and the acquisition circuit, it requires additional design of a switching circuit and a switching control module that can match the impedance characteristics of the driving acquisition circuit, which will involve more component types and require additional hardware debugging and verification cycles, increasing development and design costs.

[0058] Therefore, considering the design cost and implementation difficulty, the following solution can be preferred, that is, using a source device that is symmetrical to the device under test, and plugging and connecting the driving acquisition channel of the device under test with the driving acquisition channel of the source device.

[0059] In some embodiments provided in the present application, calling the communication interface to send a test instruction to the device to be tested and a source device corresponding to the device to be tested may include:

[0060] The communication interface is called to send the test instruction to the device to be tested and a source device corresponding to the device to be tested in a frame form.

[0061] It should be noted that, in order to ensure that the test information can be accurately received by the embedded device to a certain extent, the test information can be sent according to the agreed protocol, that is, the test instructions sent by the host computer can be instructions that meet the specified protocol, such as the TCP protocol. To achieve the above purpose, the test instructions can be sent in the form of framing, where framing is the process of converting the test information according to the protocol.

[0062] On the basis of the above, the source device and the device to be tested are pre-burned with a transparent program.

[0063] Among them, the transparent transmission program can be used to convert the test instructions output by the host computer into instructions suitable for the embedded drive acquisition device, and convert the signals collected by the embedded drive acquisition device into signal acquisition results suitable for the host computer. It should be noted that the transparent transmission type is transparent transmission type, which means forwarding the received data without making complex logical judgments on the received data. In this solution, the transparent transmission program can be used to realize the conversion task between communication information suitable for different communication networks.

[0064] For example, assuming that the host computer sends a TCP command to the core processing board of the device to be tested through the TCP protocol, "use the CAN protocol to let the digital board channel 1 collect the current status", then after receiving the TCP command, the core board of the device to be tested extracts the information in the TCP command to configure the CAN command for controlling the digital board channel 1 to collect the current status. After receiving the CAN command, the digital board of the device to be tested collects the current status and returns the current status to the core processing board of the device to be tested. The core processing board of the device to be tested converts the status information received from the digital board into TCP information, and sends the TCP information to the host computer.

[0065] The above scheme adopts the hierarchical isolation communication mode of embedded transparent transmission program + host computer frame assembly. The host computer software can realize complex test sequence organization, test process control and display, test result summary, test requirement configuration and other functions, and then convert the test instructions output by the host computer into instructions suitable for embedded devices through the transparent transmission program to control the embedded driver acquisition device to perform the corresponding drive operation or acquisition operation. Compared with the test scheme of automatically executing script programs built inside the embedded driver acquisition device, this scheme is more concise and clear in the implementation of test tasks, and is easier to expand and adjust. For example, the test instructions configured by the host computer and the organized test sequences are easier to configure, modify and manage. It is easier to implement tasks such as modifying the number of cycles in the test requirements and modifying the judgment threshold during the test, and it can adapt to changes in test requirements such as channel expansion (i.e. increasing the number of driver acquisition boards).

[0066] Correspondingly, the signal information collected by the embedded drive acquisition device can also be converted into signal acquisition results suitable for the host computer through the transparent transmission program, so that the host computer can compare the information and determine the test results. In this process, the tester does not need to perform complex operations such as feedback command line checks, which reduces the requirements for the tester, improves the test efficiency, and can avoid problems such as reduced test reliability caused by manual long-term execution of complex operations.

[0067] In addition, when designing the existing automatic execution script program built inside the embedded drive acquisition device, it is necessary to design and debug a more complex traversal code for the type of embedded chip being tested. The reason is that the number of resources allocated to different embedded chip architectures is different, such as the general purpose input / output ports (GPIO) available in some field programmable gate arrays (Field Programmable Gate Array, FPGA) are distributed differently, and the universal asynchronous receiver-transmitter UART and controller area network bus CAN resource interfaces available in some microcontroller units (Microcontroller Unit; MCU) are different. Therefore, when testing different embedded chips, the existing test scheme needs to design test cases according to different resource distribution situations, that is, it is necessary to traverse the resources to ensure that all interface resources can be tested. The present application scheme can translate the communication content transmitted by the host computer by means of a transparent transmission program. Therefore, the traversal task of resources can be realized by modifying the content of the test configuration file of the host computer software, without modifying the program code, and the difficulty of implementation is relatively low.

[0068] Optionally, the test requirement may correspond to several test items. Figure 5is a flow chart of another method for testing an embedded drive acquisition device according to an embodiment of the present application, combined with Figure 5 As shown, the method may include the following steps:

[0069] Step S201: In response to a test requirement of a drive acquisition channel of a device to be tested, a test configuration file is obtained.

[0070] Step S202: determining a target test item to be tested from a plurality of test items corresponding to the test requirement, and configuring a test instruction of the target test item according to the test configuration file.

[0071] Step S203: calling the communication interface to send a test instruction to the device to be tested and the source device.

[0072] Step S204: receiving the signal acquisition results fed back by the device to be tested and the source device through the communication interface.

[0073] Step S205: Compare the preset output signal information with the signal acquisition result to determine the test result corresponding to the target test item.

[0074] For the relevant description of steps S201-S205, reference may be made to the above-mentioned steps S101-S104.

[0075] Step S206, determine whether the traversal of several test items corresponding to the test requirement is completed, if so, execute step S207, if not, return to execute step S202.

[0076] Step S207: Summarize the test results corresponding to the test items corresponding to the test requirement.

[0077] A test report can be generated based on the test results corresponding to the respective test items. Optionally, the test report can be generated in a standard format by summarizing the results according to preset rules, so as to achieve the test data management task for the embedded drive acquisition device.

[0078] In some embodiments provided in the present application, in response to the test requirement of the drive acquisition channel of the device to be tested, obtaining the test configuration file may include:

[0079] In response to a test requirement of a drive acquisition channel of a device to be tested, searching for a test configuration file corresponding to the test requirement;

[0080] If the search is successful, the test configuration file is read;

[0081] If the search fails, the test configuration file is configured according to the test requirements.

[0082] That is to say, the host computer may include a test configuration file storage unit for storing the test configuration file. It should be noted that, since the host computer has high adaptability, the communication interface on the host computer generally uses a universal interface such as TCP or UART, and the overall test architecture of this solution is generally applicable to various types of embedded driver acquisition devices with communication interfaces. Therefore, when the test requirements are similar, the test environment can be quickly built with the existing test configuration files. In particular, when the test requirements are the same, the test tasks of multiple embedded driver acquisition devices can be implemented directly based on the managed test configuration files.

[0083] In some embodiments provided in the present application, the configuration of the test instruction in response to the test requirement of the drive acquisition channel of the device to be tested may include:

[0084] In the case of receiving a test request manually initiated through the human-computer interaction interface of the host computer, the test request includes a test requirement for a drive acquisition channel of the device to be tested and configures a test instruction.

[0085] The host computer may be configured with a human-machine interaction interface, and the human-machine interaction interface may be connected through the human-machine interaction interface. Testers may participate in the test process through the human-machine interaction interface, such as configuring test requirements and initiating tests.

[0086] Optionally, in response to a test requirement of a drive acquisition channel of the device to be tested, obtaining a test configuration file may include:

[0087] When a test request manually initiated through the human-computer interaction interface of the host computer is received, the test request includes a test requirement for a drive acquisition channel of the device to be tested, and a test configuration file is obtained.

[0088] In some embodiments provided in the present application, the testing method of the embedded drive acquisition device may further include:

[0089] When a test interruption request manually initiated through the human-computer interaction interface of the host computer is received, the communication interface is called to send a test interruption instruction to the device to be tested and the source device, wherein the test interruption instruction is used to interrupt the test.

[0090] In some embodiments provided in the present application, after determining the test result corresponding to the test instruction, the following may also be included:

[0091] The test result corresponding to the test instruction is displayed through the human-computer interaction interface of the host computer.

[0092] Optionally, after summarizing the test results corresponding to the test items corresponding to the test requirement, the following may also be included:

[0093] Display the test results (i.e., test reports) corresponding to each of the summarized test items.

[0094] It should be noted that the existing test scheme lacks output display during the test process, making it difficult to interrupt the test, and when the test requirements change, the only way to meet the changed test requirements is to redesign and burn the embedded program. This solution can display the test results of each test item during the test of the embedded drive acquisition device through the human-computer interaction interface of the host computer, manually control the start, interruption and end of the test process, conveniently modify the test content, and display the generated standard test report after the test.

[0095] In a possible implementation, each step of the test method provided in the embodiment of the present application can be implemented by the test software on the host computer.

[0096] That is to say, the host computer may be pre-configured with an operating system and test software, and optionally, the tester may operate in the test software via a human-computer interaction interface.

[0097] The following is a description of a test device for an embedded driver acquisition device provided in an embodiment of the present application. The test device for an embedded driver acquisition device described below and the test method for an embedded driver acquisition device described above can refer to each other.

[0098] The test device for the embedded drive acquisition device provided in the embodiment of the present application can be applied to a host computer, wherein the host computer communicates with the device to be tested and the source device through a communication interface, and the device may include:

[0099] A test instruction configuration unit, configured to configure a test instruction in response to a test requirement for a drive acquisition channel of the device to be tested;

[0100] A test instruction sending unit is used to call the communication interface to send a test instruction to the device to be tested and the source device, wherein the source device is an embedded drive acquisition device configured according to the architecture of the device to be tested, and the test instruction is used to control the device to be tested and the source device to perform a drive operation and an acquisition operation; wherein the drive channel of the device to be tested is connected to the acquisition channel of the source device, and the acquisition channel of the device to be tested is connected to the drive channel of the source device;

[0101] An acquisition result receiving unit, used for receiving the signal acquisition results fed back by the device to be tested and the source device through the communication interface;

[0102] The test result determination unit is used to compare the preset output signal information with the signal acquisition result to determine the test result corresponding to the test instruction.

[0103] In some embodiments provided in the present application, the driving acquisition channel of the source device is symmetrical with the driving acquisition channel of the device under test; the driving acquisition channel of the device under test is plug-connected with the driving acquisition channel of the source device.

[0104] In some embodiments provided in the present application, the process in which the test instruction sending unit calls the communication interface to send the test instruction to the device to be tested and the source device corresponding to the device to be tested may include:

[0105] The communication interface is called to send the test instruction to the device to be tested and a source device corresponding to the device to be tested in a frame form.

[0106] On the basis of the above, the source device and the device to be tested are pre-burned with a transparent program, and the transparent program is used to convert the test instructions output by the host computer into instructions suitable for the embedded drive acquisition device, and convert the signals collected by the embedded drive acquisition device into signal acquisition results suitable for the host computer.

[0107] In some embodiments provided in the present application, the test requirement may correspond to several test items.

[0108] The process of configuring the test instruction by the test instruction configuration unit in response to the test requirement of the drive acquisition channel of the device to be tested may include:

[0109] Responding to a test requirement of a drive acquisition channel of a device to be tested, obtaining a test configuration file;

[0110] A target test item to be tested is determined from a plurality of test items corresponding to the test requirement, and a test instruction of the target test item is configured according to the test configuration file.

[0111] On the basis of the above, the process in which the test result determination unit compares the preset output signal information with the signal acquisition result to determine the test result corresponding to the test instruction may include:

[0112] Compare the preset output signal information with the signal acquisition result to determine the test result corresponding to the target test item.

[0113] On the basis of the above, the test device of the embedded driver acquisition device may further include a test control unit, which is used to determine whether the traversal of several test items corresponding to the test requirement has been completed after determining the test result corresponding to the target test item; if so, execute the step of summarizing the test results corresponding to the several test items corresponding to the test requirement; if not, output an instruction to the test instruction configuration unit to return to the step of determining the target test item to be tested from the several test items corresponding to the test requirement.

[0114] In some embodiments provided in the present application, the process of obtaining the test configuration file by the test instruction configuration unit in response to the test requirement of the drive acquisition channel of the device to be tested may include:

[0115] In response to a test requirement of a drive acquisition channel of a device to be tested, searching for a test configuration file corresponding to the test requirement;

[0116] If the search is successful, the test configuration file is read;

[0117] If the search fails, the test configuration file is configured according to the test requirements.

[0118] In some embodiments provided in the present application, the process of configuring the test instruction by the test instruction configuration unit in response to the test requirements of the drive acquisition channel of the device to be tested may include:

[0119] In the case of receiving a test request manually initiated through the human-computer interaction interface of the host computer, the test request includes a test requirement for a drive acquisition channel of the device to be tested and configures a test instruction.

[0120] In some embodiments provided in the present application, the test device of the embedded drive acquisition device may also include: an interrupt control unit, which is used to call the communication interface to send a test interrupt instruction to the device to be tested and the source device when a test interrupt request is manually initiated through the human-computer interaction interface of the host computer, and the test interrupt instruction is used to interrupt the test.

[0121] In some embodiments provided in the present application, the testing device of the embedded drive acquisition device may further include: a test result display unit, which is used to display the test result corresponding to the test instruction through the human-computer interaction interface of the host computer after determining the test result corresponding to the test instruction.

[0122] The following is a description of a test fixture for an embedded driver acquisition device provided in an embodiment of the present application. The test fixture for the embedded driver acquisition device may include: a host computer and a source device.

[0123] The source device is an embedded drive acquisition device configured according to the architecture of the device under test, and is used to provide an acquisition channel connected to the drive channel of the device under test and a drive channel connected to the acquisition channel of the device under test.

[0124] The host computer is configured with a communication interface, and the communication interface is used to communicate with the source device and the device to be tested; the host computer is configured with a program, and when the program is executed by the processor of the host computer, the following steps are implemented:

[0125] In response to a test requirement for a drive acquisition channel of the device to be tested, configuring a test instruction;

[0126] Calling the communication interface to send a test instruction to the device to be tested and the source device, wherein the test instruction is used to control the device to be tested and the source device to perform a driving operation and a collection operation;

[0127] Receiving, via the communication interface, signal acquisition results fed back by the device to be tested and the source device;

[0128] The preset output signal information is compared with the signal acquisition result to determine the test result corresponding to the test instruction.

[0129] In some embodiments provided in the present application, the driving acquisition channel of the source device is symmetrical with the driving acquisition channel of the device under test; the driving acquisition channel of the device under test is plug-connected with the driving acquisition channel of the source device.

[0130] In some embodiments provided in the present application, the process in which the host computer calls the communication interface to send a test instruction to the device to be tested and a source device corresponding to the device to be tested may include:

[0131] The communication interface is called to send the test instruction to the device to be tested and a source device corresponding to the device to be tested in a frame form.

[0132] On the basis of the above, the source device and the device to be tested are pre-burned with a transparent program, which can be used to convert the test instructions output by the host computer into instructions suitable for the embedded drive acquisition device, and convert the signals collected by the embedded drive acquisition device into signal acquisition results suitable for the host computer.

[0133] In some embodiments provided in the present application, the test requirement may correspond to several test items.

[0134] On the basis of the above, the process of configuring the test instructions by the host computer in response to the test requirements of the drive acquisition channel of the device to be tested may include:

[0135] Responding to a test requirement of a drive acquisition channel of a device to be tested, obtaining a test configuration file;

[0136] A target test item to be tested is determined from a plurality of test items corresponding to the test requirement, and a test instruction of the target test item is configured according to the test configuration file.

[0137] On the basis of the above, the process in which the host computer compares the preset output signal information with the signal acquisition result to determine the test result corresponding to the test instruction may include:

[0138] Compare the preset output signal information with the signal acquisition result to determine the test result corresponding to the target test item.

[0139] On the basis of the above, after determining the test result corresponding to the target test item, the host computer may further perform the following steps:

[0140] Determine whether the traversal of several test items corresponding to the test requirement is completed;

[0141] If yes, then summarize the test results corresponding to the several test items corresponding to the test requirement;

[0142] If not, return to the step of determining a target test item to be tested from the plurality of test items corresponding to the test requirement.

[0143] In some embodiments provided in the present application, the process of obtaining the test configuration file by the host computer in response to the test requirement of the drive acquisition channel of the device to be tested may include:

[0144] In response to a test requirement of a drive acquisition channel of a device to be tested, searching for a test configuration file corresponding to the test requirement;

[0145] If the search is successful, the test configuration file is read;

[0146] If the search fails, the test configuration file is configured according to the test requirements.

[0147] In some embodiments provided in the present application, the process of configuring the test instructions by the host computer in response to the test requirements of the drive acquisition channel of the device to be tested may include:

[0148] In the case of receiving a test request manually initiated through the human-computer interaction interface of the host computer, the test request includes a test requirement for a drive acquisition channel of the device to be tested and configures a test instruction.

[0149] In some embodiments provided in the present application, the program configured on the host computer, when executed by the processor of the host computer, may further implement the following steps:

[0150] When a test interruption request manually initiated through the human-computer interaction interface of the host computer is received, the communication interface is called to send a test interruption instruction to the device to be tested and the source device, wherein the test interruption instruction is used to interrupt the test.

[0151] In some embodiments provided in the present application, the program configured on the host computer, when executed by the processor of the host computer, may further implement the following steps:

[0152] After the test result corresponding to the test instruction is determined, the test result corresponding to the test instruction is displayed through the human-computer interaction interface of the host computer.

[0153] It should be noted that other descriptions of the host computer and the source device may refer to the above description.

[0154] Figure 6 is a structural diagram of a test system for an embedded drive acquisition device according to an embodiment of the present application, combined with Figure 6 As shown, the system includes: an upper computer 1 and a lower computer;

[0155] The lower computer may include: a device to be tested 2 and a source device 3; wherein the source device 3 is an embedded drive acquisition device configured according to the architecture of the device to be tested 2, the drive channel of the device to be tested 2 is connected to the acquisition channel of the source device 3, and the acquisition channel of the device to be tested 2 is connected to the drive channel of the source device 3.

[0156] The host computer 1 communicates with the device to be tested and the source device through a communication interface. Figure 6 As shown, the communication interface 1-1 on the host computer 1 is connected to the communication interface 2-1 on the device to be tested 2, and the communication interface 1-2 on the host computer is connected to the communication interface 3-1 on the source device. The host computer is configured with a program, and when the program is executed by the processor of the host computer, the following steps are implemented:

[0157] In response to a test requirement for a drive acquisition channel of the device to be tested, configuring a test instruction;

[0158] Calling the communication interface to send a test instruction to the device to be tested and the source device, wherein the test instruction is used to control the device to be tested and the source device to perform a driving operation and a collection operation;

[0159] Receiving, via the communication interface, signal acquisition results fed back by the device to be tested and the source device;

[0160] The preset output signal information is compared with the signal acquisition result to determine the test result corresponding to the test instruction.

[0161] Optionally, other descriptions of the host computer, the source device and the device to be tested may refer to the description of the test method of the above-mentioned embedded drive acquisition device.

[0162] Finally, it should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

[0163] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The various embodiments can be combined as needed, and the same or similar parts can refer to each other.

[0164] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A testing method for an embedded drive acquisition device, characterized in that: Applied to a host computer, the host computer communicates with the device to be tested and the source device through a communication interface, the method comprising: In response to a test requirement for a drive acquisition channel of the device to be tested, configuring a test instruction; Calling the communication interface to send a test instruction to the device to be tested and the source device, wherein the source device is an embedded drive acquisition device configured according to the architecture of the device to be tested, and the test instruction is used to control the device to be tested and the source device to perform a drive operation and an acquisition operation; wherein the drive channel of the device to be tested is connected to the acquisition channel of the source device, and the acquisition channel of the device to be tested is connected to the drive channel of the source device; Receiving, via the communication interface, signal acquisition results fed back by the device to be tested and the source device; The preset output signal information is compared with the signal acquisition result to determine the test result corresponding to the test instruction.

2. The method for testing an embedded drive acquisition device according to claim 1, characterized in that: The driving acquisition channel of the source device is symmetrical to the driving acquisition channel of the device to be tested; the driving acquisition channel of the device to be tested is plug-connected with the driving acquisition channel of the source device.

3. The method for testing an embedded drive acquisition device according to claim 1, characterized in that: The calling of the communication interface to send a test instruction to the device to be tested and a source device corresponding to the device to be tested includes: In the form of a frame, calling the communication interface to send the test instruction to the device to be tested and a source device corresponding to the device to be tested; The source device and the device to be tested are pre-burned with a transparent program, which is used to convert the test instructions output by the host computer into instructions suitable for the embedded drive acquisition device, and convert the signals collected by the embedded drive acquisition device into signal acquisition results suitable for the host computer.

4. The method for testing an embedded drive acquisition device according to claim 1, characterized in that: The test requirement corresponds to a number of test items; The step of configuring a test instruction in response to a test requirement of a drive acquisition channel of a device to be tested includes: Responding to a test requirement of a drive acquisition channel of a device to be tested, obtaining a test configuration file; Determine a target test item to be tested from a plurality of test items corresponding to the test requirement, and configure a test instruction of the target test item according to the test configuration file; The comparing the preset output signal information with the signal acquisition result to determine the test result corresponding to the test instruction includes: Comparing the preset output signal information with the signal acquisition result to determine the test result corresponding to the target test item; After determining the test result corresponding to the target test item, the method further includes: Determine whether the traversal of several test items corresponding to the test requirement is completed; If yes, then summarize the test results corresponding to the several test items corresponding to the test requirement; If not, return to the step of determining a target test item to be tested from the plurality of test items corresponding to the test requirement.

5. The method for testing an embedded drive acquisition device according to claim 4, characterized in that: The step of obtaining a test configuration file in response to a test requirement of a drive acquisition channel of a device to be tested includes: In response to a test requirement of a drive acquisition channel of a device to be tested, searching for a test configuration file corresponding to the test requirement; If the search is successful, the test configuration file is read; If the search fails, the test configuration file is configured according to the test requirements.

6. The method for testing an embedded drive acquisition device according to any one of claims 1 to 3, characterized in that: The step of configuring a test instruction in response to a test requirement of a drive acquisition channel of a device to be tested includes: In the case of receiving a test request manually initiated through the human-computer interaction interface of the host computer, the test request includes a test requirement for a drive acquisition channel of the device to be tested and configures a test instruction.

7. The method for testing an embedded drive acquisition device according to any one of claims 1 to 5, characterized in that: The method further includes: When a test interruption request manually initiated through the human-computer interaction interface of the host computer is received, the communication interface is called to send a test interruption instruction to the device to be tested and the source device, wherein the test interruption instruction is used to interrupt the test.

8. The method for testing an embedded drive acquisition device according to any one of claims 1 to 3, characterized in that: After determining the test result corresponding to the test instruction, the method further includes: The test result corresponding to the test instruction is displayed through the human-computer interaction interface of the host computer.

9. A test fixture for an embedded drive acquisition device, characterized in that: include: Host computer and source equipment; The source device is an embedded drive acquisition device configured according to the architecture of the device to be tested, and is used to provide an acquisition channel connected to the drive channel of the device to be tested and a drive channel connected to the acquisition channel of the device to be tested; The host computer is configured with a communication interface, and the communication interface is used to communicate with the source device and the device to be tested; the host computer is configured with a program, and when the program is executed by the processor of the host computer, the following steps are implemented: In response to a test requirement for a drive acquisition channel of the device to be tested, configuring a test instruction; Calling the communication interface to send a test instruction to the device to be tested and the source device, wherein the test instruction is used to control the device to be tested and the source device to perform a driving operation and a collection operation; Receiving, via the communication interface, signal acquisition results fed back by the device to be tested and the source device; The preset output signal information is compared with the signal acquisition result to determine the test result corresponding to the test instruction.

10. A test system for an embedded drive acquisition device, characterized in that: include: The upper computer and the lower computer; The lower computer includes: a device to be tested and a source device; wherein the source device is an embedded drive acquisition device configured according to the architecture of the device to be tested, the drive channel of the device to be tested is connected to the acquisition channel of the source device, and the acquisition channel of the device to be tested is connected to the drive channel of the source device; The host computer communicates with the device to be tested and the source device through a communication interface. The host computer is configured with a program. When the program is executed by the processor of the host computer, the following steps are implemented: In response to a test requirement for a drive acquisition channel of the device to be tested, configuring a test instruction; Calling the communication interface to send a test instruction to the device to be tested and the source device, wherein the test instruction is used to control the device to be tested and the source device to perform a driving operation and a collection operation; Receiving, via the communication interface, signal acquisition results fed back by the device to be tested and the source device; The preset output signal information is compared with the signal acquisition result to determine the test result corresponding to the test instruction.

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