Radiation-resistant analog-to-digital converter and calibration method

Abstract

The invention particularly relates to an irradiation-resistant analog-to-digital converter and a calibration method, and solves the technical problem of parameter drift caused by irradiation of a reference voltage source of an existing single-chip microcomputer in an irradiation environment. The radiation-resistant analog-to-digital converter comprises a power supply module, a single-chip microcomputer module, a serial port module and a 485 module, the ADC1 receiving end of the single-chip microcomputer module is connected with the output end of the ADC acquisition module. ADC2... ADCN input ends of the single-chip microcomputer module are connected with a device to be collected; the single-chip microcomputer module is used for calculating a drift distance according to the reference voltage and the output voltage of the post-irradiation power supply module, calibrating the output voltage of the to-be-collected equipment in the irradiation environment according to the drift distance, and converting the output voltage into a digital quantity; n > = 3; and the serial port module and the 485 module are used for respectively transmitting the calibrated output voltage of the to-be-collected equipment to a user side. According to the method, the drift amount caused by radiation is calibrated by using the single-chip microcomputer module, and correct data can be sent in a radiation environment.

Description

Technical Field

[0001] The present invention specifically relates to a radiation resistant analog-to-digital converter and a calibration method. Background Art

[0002] As an integrated microcomputer system, the single-chip microcomputer has powerful and diverse functions. It can not only accurately convert various analog signals into digital signals through the built-in ADC (Analog-to-digital converter) for efficient data processing and analysis, but also has serial communication capabilities, supports full-duplex data exchange with external devices, and realizes instant information transmission and equipment control. In addition, the single-chip microcomputer also supports the 485 communication protocol, which can realize long-distance, highly anti-interference multi-point data transmission in complex industrial environments, thus playing a vital role in industrial automation and networked control systems.

[0003] In an irradiated environment, although the microcontroller does not completely fail in function, its parameters will drift. This is because the reference voltage source inside the microcontroller will drift in parameters after being exposed to radiation, which will cause the ADC to fail to work accurately. Summary of the invention

[0004] The purpose of the present invention is to solve the technical problem that the reference voltage source of the existing single-chip microcomputer causes parameter drift in an irradiated environment, and to provide a radiation-resistant analog-to-digital converter and a calibration method.

[0005] In order to achieve the above object, the present invention adopts the following technical solution:

[0006] A radiation-resistant analog-to-digital converter, which is special in that it includes a power module, a single-chip computer module, a serial port module and a 485 module;

[0007] The input end of the ADC acquisition module and the first input end of the single-chip microcomputer module are respectively connected to the output high-voltage end of the power module; the output low-voltage end of the power module is connected to the second input end of the single-chip microcomputer module and is grounded;

[0008] The ADC1 receiving end of the single-chip microcomputer module is connected to the output end of the ADC acquisition module. The ADC acquisition module is used to collect the output voltage of the power module before and after irradiation, and use the output voltage of the power module before irradiation as the reference voltage; the ADC2 of the single-chip microcomputer module is connected to the output end of the ADC acquisition module. N The input end is connected to the device to be collected; the single-chip computer module is used to calculate the drift amount according to the reference voltage and the output voltage of the power module after irradiation, and calibrate the output voltage of the device to be collected under the irradiation environment according to the drift amount, and convert it into a digital quantity; N≥3;

[0009] The input end of the serial port module and the input end of the 485 module are respectively connected to the output end of the single-chip computer module for receiving the calibrated output voltage of the device to be collected; the output end of the serial port module and the output end of the 485 module are respectively used to connect to the user end; the serial port module and the 485 module are used to transmit the calibrated output voltage of the device to be collected to the user end respectively.

[0010] Furthermore, the output voltage of the power module is 3.3V.

[0011] Furthermore, N=3.

[0012] Furthermore, the serial port module adopts a serial port chip; the 485 module adopts a 485 chip; the serial port module and the 485 module are used to transmit the calibrated output voltage of the device to be collected to the user end through the serial port protocol and the 485 protocol respectively.

[0013] A radiation tolerance calibration method is based on the above-mentioned radiation tolerance analog-to-digital converter; the special feature of the method is that it includes the following steps:

[0014] 1] Before irradiation, the output voltage of the power module is collected by the ADC1 receiving end of the single-chip microcomputer module and used as the reference voltage;

[0015] 2] During irradiation, the ADC1 receiving end of the single-chip microcomputer module is used to collect the output voltage of the power module; at the same time, the ADC2…ADC N The input end collects the output voltage of the device to be collected; N≥3;

[0016] 3] The single-chip microcomputer module calculates the drift amount based on the reference voltage and the output voltage of the power module collected by the ADC1 receiving end after irradiation;

[0017] 4] The single-chip microcomputer module calibrates the output voltage of the device to be collected after irradiation according to the drift amount;

[0018] 5] The single-chip microcomputer module converts the output voltage of the device to be collected after calibration into a digital quantity, and transmits it to the user end through the serial port module and the 485 module respectively.

[0019] Furthermore, in step 1], N=3.

[0020] Further, step 3] is specifically as follows:

[0021] The single-chip microcomputer module uses the reference voltage to subtract the output voltage of the power module collected by the ADC1 receiving end after irradiation to obtain the drift amount.

[0022] Further, step 4] is specifically as follows:

[0023] 4.1. Use the ADC2 input terminal of the single-chip microcomputer module to collect the output voltage plus the drift of the device to be collected;

[0024] 4.2. Use the ADC3 input terminal of the single-chip microcomputer module to collect the output voltage plus the drift of the device to be collected.

[0025] Beneficial effects of the present invention:

[0026] 1. The radiation-resistant analog-to-digital converter of the present invention adopts an ADC acquisition module and a single-chip microcomputer module, which can maintain normal operation for a long time in a radiation environment and facilitate the user end to read the real data of the device to be collected.

[0027] 2. The present invention provides a radiation resistance calibration method, which utilizes a single-chip microcomputer module to calibrate the drift caused by radiation and can send correct data in a radiation environment. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a structural schematic diagram of an embodiment of a radiation-resistant analog-to-digital converter of the present invention.

[0029] Description of reference numerals:

[0030] 1-power module, 2-ADC acquisition module, 3-microcontroller module, 4-serial port module, 5-485 module. DETAILED DESCRIPTION

[0031] like Figure 1 As shown, a radiation-resistant analog-to-digital converter includes a power module 1, a single-chip module 3, a serial port module 4 and a 485 module 5; the input end of the ADC acquisition module 2 and the first input end of the single-chip module 3 are respectively connected to the output high-voltage end of the power module 1; the output low-voltage end of the power module 1 is connected to the second input end of the single-chip module 3 and grounded; the ADC1 receiving end of the single-chip module 3 is connected to the output end of the ADC acquisition module 2, and the ADC acquisition module 2 is used to collect the output voltage of the power module 1 before and after irradiation, and use the output voltage of the power module 1 before irradiation as a reference voltage; ADC2 of the single-chip module 3…ADC N The input end is connected to the device to be collected; the single-chip computer module 3 is used to calculate the drift amount according to the reference voltage and the output voltage of the power supply module 1 after irradiation, and calibrate the output voltage of the device to be collected under the irradiation environment according to the drift amount.

[0032] The input end of the serial port module 4 and the input end of the 485 module 5 are respectively connected to the output end of the single-chip computer module 3 for receiving the calibrated output voltage of the device to be collected; the output end of the serial port module 4 is connected to the user end; the output end of the 485 module 5 is connected to the user end; the serial port module 4 and the 485 module 5 are used to transmit the calibrated output voltage of the device to be collected to the user end through the serial port protocol and the 485 protocol respectively.

[0033] In this embodiment, the output voltage of the power module 1 is 3.3V, and N=3. Conventional ADCs will drift in an irradiated environment, and the parameters will be inaccurate after drifting, and they will be in a state of being unusable. By using the radiation-resistant analog-to-digital converter of the present invention, the drift caused by radiation can be calibrated, so that the real data of the device to be collected can be known. The serial port module 4 adopts a serial port chip, and the 485 module 5 adopts a 485 chip; the serial port chip and the 485 chip are dedicated communication chips, which can output serial port signals and 485 signals, and can calibrate the analog quantities of the input terminals of ADC2 and ADC3, and convert them into digital quantities, and transmit them to the user end through the serial port chip and the 485 chip, so that the user end can read the analog quantity information.

[0034] The present invention is based on a radiation resistant calibration method of the above-mentioned radiation resistant analog-to-digital converter, specifically:

[0035] 1] Before irradiation, the output voltage 3.3V of the power module 1 is collected by the ADC1 receiving end of the single-chip module 3 and used as the reference voltage;

[0036] 2] During irradiation, the output voltage of the power module 1 is collected by using the ADC1 receiving end of the single-chip module 3, which is 3.1V; at the same time, the output voltages of the device to be collected are collected by using the ADC2 and ADC3 input ends of the single-chip module 3, which are 1.3V and 1.8V respectively;

[0037] 3] The single-chip computer module 3 calculates the drift amount based on the reference voltage and the output voltage of the power module 1 collected by the ADC1 receiving end after irradiation:

[0038] 3.3-3.1=0.2V

[0039] 4] The single-chip microcomputer module 3 calibrates the output voltage of the device to be collected after irradiation according to the drift amount:

[0040] 1.3+0.2=1.5V

[0041] 1.8+0.2=2V;

[0042] 5] The single-chip microcomputer module 3 converts the output voltage of the device to be collected after calibration into digital quantities 1.5V and 2V, and transmits them to the user end through the serial port module 4 and the 485 module 5 respectively.

[0043] The radiation-resistant analog-to-digital converter of the present invention works in an irradiated environment, and the analog quantity collected by the single-chip computer module 3 will drift with the irradiation. In order to solve the drift problem of the analog quantity collected by the single-chip computer module 3, a power supply module 1 and an ADC acquisition module 2 are introduced, and the single-chip computer module 3 is used to collect a fixed analog value, and the drift caused by the irradiation is calculated. Then the collected data (the data collected at the ADC2 and ADC3 input terminals of the single-chip computer module 3) is corrected to obtain real and reliable data, thereby ensuring that the single-chip computer module 3 works normally and accurately in a radiation environment.

Claims

1. A radiation resistant analog-to-digital converter, characterized in that: It includes a power module (1), a single chip computer module (3), a serial port module (4) and a 485 module (5); The input end of the ADC acquisition module (2) and the first input end of the single-chip computer module (3) are respectively connected to the high-voltage output end of the power module (1); the low-voltage output end of the power module (1) is connected to the second input end of the single-chip computer module (3) and is grounded; The ADC1 receiving end of the single-chip computer module (3) is connected to the output end of the ADC acquisition module (2), and the ADC acquisition module (2) is used to collect the output voltage of the power supply module (1) before and after irradiation, and use the output voltage of the power supply module (1) before irradiation as a reference voltage; the ADC2…ADC N The input end is connected to the device to be collected; the single-chip computer module (3) is used to calculate the drift amount according to the reference voltage and the output voltage of the power supply module (1) after irradiation, and calibrate the output voltage of the device to be collected under the irradiation environment according to the drift amount, and convert it into a digital quantity; N≥3; The input end of the serial port module (4) and the input end of the 485 module (5) are respectively connected to the output end of the single-chip computer module (3) for receiving the calibrated output voltage of the device to be collected; the output end of the serial port module (4) and the output end of the 485 module (5) are respectively used to connect to the user end; the serial port module (4) and the 485 module (5) are used to transmit the calibrated output voltage of the device to be collected to the user end.

2. A radiation resistant analog-to-digital converter according to claim 1, characterized in that: The output voltage of the power module (1) is 3.3V.

3. A radiation resistant analog-to-digital converter according to claim 2, characterized in that: Said N=3.

4. A radiation resistant analog-to-digital converter according to claim 1 or 2, characterized in that: The serial port module (4) adopts a serial port chip; The 485 module (5) uses a 485 chip; The serial port module (4) and the 485 module (5) are used to transmit the calibrated output voltage of the device to be collected to the user end through the serial port protocol and the 485 protocol respectively.

5. A radiation tolerance calibration method, based on a radiation tolerance analog-to-digital converter according to any one of claims 1 to 4; characterized in that: The following steps are involved: 1] Before irradiation, the output voltage of the power supply module (1) is collected by using the ADC1 receiving end of the single-chip computer module (3), and is used as a reference voltage; 2] During irradiation, the output voltage of the power supply module (1) is collected by using the ADC1 receiving end of the single-chip microcomputer module (3); at the same time, the ADC2 ... ADC N The input end collects the output voltage of the device to be collected; N≥3; 3] The single chip computer module (3) calculates the drift amount according to the reference voltage and the output voltage of the power supply module (1) collected by the ADC1 receiving end after irradiation; 4] The single chip computer module (3) calibrates the output voltage of the device to be collected after irradiation according to the drift amount; 5] The single-chip microcomputer module (3) converts the output voltage of the device to be collected after calibration into a digital quantity, and transmits it to the user end through the serial port module (4) and the 485 module (5) respectively.

6. A radiation resistance calibration method according to claim 5, characterized in that: In step 1], N=3.

7. A radiation resistance calibration method according to claim 6, characterized in that: Step 3] Specifically: The single-chip computer module (3) uses a reference voltage to subtract the output voltage of the power supply module (1) collected by the ADC1 receiving end after irradiation to obtain a drift amount.

8. A radiation resistance calibration method according to claim 7, characterized in that: Step 4] Specifically: 4.

1. Using the ADC2 input terminal of the single-chip microcomputer module (3) to collect the output voltage plus the drift of the device to be collected; 4.

2. Use the ADC3 input terminal of the single-chip microcomputer module (3) to collect the output voltage plus the drift of the device to be collected.

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