Quartz crystal resonator inspection marking equipment and process

Abstract

The invention relates to a quartz crystal resonator inspection marking device and process. The quartz crystal resonator inspection marking device comprises a first rotating disc, a second rotating disc and an exchange station. The first rotating disc can rotate around the axis of the first rotating disc and drive the multiple suction nozzles to rotate synchronously. A first positioning mechanism, a first testing mechanism, a second testing mechanism, a third positioning mechanism and a second detecting mechanism are sequentially arranged in the circumferential direction of the first rotating disc. The second rotating disc can rotate around the axis of the second rotating disc and drive the temporary storage tables to rotate synchronously. A second positioning mechanism, a marking mechanism and a first detection mechanism are sequentially arranged in the circumferential direction of the second rotary disc. The exchange station is located at the position right opposite to the first rotary disc and the second rotary disc, located between the first testing mechanism and the second testing mechanism and located between the second positioning mechanism and the first detection mechanism. And at the exchange station, the suction nozzle releases one quartz crystal resonator to the temporary placing table and sucks one quartz crystal resonator from the next temporary placing table. Through the arrangement, manual intervention is not needed, the production efficiency is improved, and management is convenient.

Description

Technical Field

[0001] The invention relates to the technical field of quartz crystal resonator processing, and in particular to a quartz crystal resonator inspection and marking device and process. Background Art

[0002] A quartz crystal resonator is an electronic component that uses the inverse piezoelectric effect of quartz crystal material to generate high-precision oscillation frequencies. Quartz crystal resonators are widely used in electronic devices such as oscillators, timers, clock circuits, and wireless communication systems to ensure accurate timing and frequency stability.

[0003] The processing and production of quartz crystal resonators include basic processing procedures such as cutting, grinding, and coating. Before packaging, the quartz crystal resonator needs to be marked to indicate its parameters, model, batch and other information. In the process of these processing and production, some defective products will inevitably be produced. These defective products may have some appearance defects such as cracks and bends, as well as unqualified performance defects such as electrical parameters and insulation performance, which will cause the oscillation frequency of the quartz crystal resonator to deviate, the frequency stability to decrease, and the signal transmission to be easily interrupted, which will cause the frequency fluctuation to exceed the allowable range during operation, and it will be unable to provide accurate clock signals for electronic equipment, and the life span will be reduced and it will be easy to fail.

[0004] However, in the prior art, during the marking process of the quartz crystal resonator, it is often necessary to manually and repeatedly place the quartz crystal resonator under the laser head of the marking mechanism, and defect detection of the quartz crystal resonator is also often performed by manual screening. Manual participation in the marking and detection of the quartz crystal resonator is inefficient, costly, and has poor detection accuracy. It is also prone to safety accidents and cannot form a coherent and efficient assembly line operation, making it difficult to meet the production needs of large-scale detection and marking. Summary of the invention

[0005] In order to solve the above-mentioned defects, the present invention proposes a quartz crystal resonator inspection and marking device and process.

[0006] The technical solution adopted by the present invention is a quartz crystal resonator inspection and marking device, comprising a first turntable, a second turntable and an exchange station; The first turntable is provided with a plurality of suction nozzles evenly distributed in the circumference thereof, the first turntable can rotate around its axis and drive the plurality of suction nozzles to rotate synchronously, the suction nozzles are used to suck / release the quartz crystal resonator; along the circumference of the first turntable, there are sequentially arranged: a positioning mechanism 1 for positioning the quartz crystal resonator, a testing mechanism 1 for performing an electrical parameter test on the quartz crystal resonator, a testing mechanism 2 for performing an insulation performance test on the quartz crystal resonator, a positioning mechanism 3 for positioning the quartz crystal resonator, and a testing mechanism 2 for performing a bottom visual inspection on the quartz crystal resonator; The second turntable is evenly distributed along its circumference with a plurality of temporary tables for carrying quartz crystal resonators, and a suction port is provided in the middle of the temporary tables; the second turntable can rotate around its axis and drive the plurality of temporary tables to rotate synchronously; along the circumference of the second turntable are sequentially provided: a second positioning mechanism for positioning the quartz crystal resonator, a marking mechanism for marking the quartz crystal resonator, and a detection mechanism for performing a frontal visual inspection of the quartz crystal resonator; The exchange station is located directly opposite the first turntable and the second turntable, and between the test mechanism one and the test mechanism two, and between the positioning mechanism two and the detection mechanism one; at the exchange station, the suction nozzle releases one of the quartz crystal resonators to the temporary placement table, and picks up one of the quartz crystal resonators from the next temporary placement table.

[0007] Furthermore, a feeding station and a loading station are sequentially arranged between the positioning mechanism 1 and the detection mechanism 2 along the rotation direction of the first turntable. The suction nozzle rotated to the loading station sucks the quartz crystal resonator output from the upstream process, and the suction nozzle rotated to the feeding station releases the qualified quartz crystal resonator to the downstream process.

[0008] Furthermore, a first discarding mechanism is provided between the first detection mechanism of the second turntable and the exchange station, and a second discarding mechanism is provided between the second detection mechanism of the first turntable and the feeding station; The quartz crystal resonator that fails the electrical parameter test and / or the front visual inspection is taken away and discarded by the first discarding mechanism, and the quartz crystal resonator that fails the insulation performance test and / or the bottom visual inspection is taken away and discarded by the second discarding mechanism.

[0009] Further, along the rotation direction of the second turntable, a material identification station 1 is provided between the exchange station and the positioning mechanism 2, and / or a material identification station 2 is provided between the marking mechanism and the detection mechanism 1, and / or a material identification station 3 is provided between the discarding mechanism 1 and the exchange station; and / or along the rotation direction of the first turntable, a material identification station 4 is provided between the discarding mechanism 2 and the feeding station; The inspection and marking equipment also includes an optical fiber detection mechanism, which is used to detect whether the quartz crystal resonator is on the material identification station one, the material identification station two, the material identification station three or the material identification station four.

[0010] Furthermore, the marking mechanism includes a marking adjustment mounting seat with adjustable height and angle, a laser installed on the upper end of the marking adjustment mounting seat, and a laser head installed at one end of the laser, wherein the laser is used to generate a laser beam and emit it to the quartz crystal resonator through the laser head.

[0011] Further, the testing mechanism 1 comprises: Probe test mechanism mounting seat; A test probe, used for contacting the electrode of the quartz crystal resonator and acquiring an electrical parameter signal; A test probe board, which is arranged on the probe test mechanism mounting seat, a plurality of the test probes are fixed and signal-connected on the test probe board, and the test probe board outputs an electrical parameter signal through a test probe board connecting wire; The second testing mechanism includes one of an insulation resistance tester, a leakage current tester, an LC comprehensive tester or an electrostatic capacitance scanning tester.

[0012] Further, the detection mechanism 1 includes a mounting and adjusting bracket, and a red light ring light source and a black and white camera mounted on the mounting and adjusting bracket, wherein the black and white camera is located directly above the red light ring light source; the red light ring light source emits light downward directly toward the quartz crystal resonator, and the black and white camera is used to capture an image of the quartz crystal resonator; The second detection mechanism includes a camera part and a light source irradiation part, the camera part includes a camera adjustment mount and a camera arranged on the camera adjustment mount, the camera adjustment mount is used to adjust the position and shooting angle of the camera; the light source irradiation part includes a light source mount, and a reflecting prism and annular light source arranged on the light source mount, the reflecting prism reflects the light irradiated by the annular light source to the bottom of the quartz crystal resonator to the camera at 45 degrees, and the center of the camera and the center of the reflecting prism are on the same horizontal line.

[0013] Further, the positioning mechanism 1 and / or the positioning mechanism 3 each include a positioning motor 1 and a positioning cam mechanism connected in a transmission manner, and four positioning claws arranged orthogonally, the positioning motor 1 drives the positioning cam mechanism to rotate, and the positioning cam mechanism drives the four positioning claws to open / close to perform position correction on the quartz crystal resonator; The second positioning mechanism includes a positioning mounting seat, a second positioning motor and a positioning slide mounted on the positioning mounting seat, and a positioning piece fixedly connected to one end of the positioning slide. The second positioning motor drives the positioning slide to reciprocate and drives the positioning piece to reciprocate.

[0014] Furthermore, the first and second material discarding mechanisms both include a second air nozzle and a collecting mechanism, the blowing force of the airflow ejected by the second air nozzle is greater than the suction force of the suction nozzle; the quartz crystal resonator that fails the electrical parameter test and / or the front visual inspection is blown into the collecting mechanism by the second air nozzle, and the quartz crystal resonator that fails the insulation performance test and / or the bottom visual inspection is blown into the collecting mechanism by the second air nozzle.

[0015] The present invention also discloses a quartz crystal resonator inspection and marking process, based on the above-mentioned quartz crystal resonator inspection and marking equipment, comprising the following steps: The first turntable receives the quartz crystal resonator output from the upstream process and performs electrical parameter tests on it; At the exchange station, the first turntable transports the quartz crystal resonator that has completed the electrical parameter test to the second turntable; The second turntable performs marking and front visual inspection on the quartz crystal resonator received thereon, and the quartz crystal resonator that fails the electrical parameter test or the front visual inspection is discarded; The quartz crystal resonator that has passed the electrical parameter test and the front visual inspection is transported to the first turntable by the second turntable; At the exchange station, the first turntable receives the quartz crystal resonator released by the second turntable, and performs an insulation performance test and a bottom visual inspection on the quartz crystal resonator, and the quartz crystal resonator that fails the insulation performance test or the bottom visual inspection is discarded; The quartz crystal resonator that has passed the insulation performance test and the bottom visual inspection is transported to the downstream process by the first turntable; in, After the suction nozzle located at the exchange station releases the quartz crystal resonator to the temporary placement table located at the exchange station, the first turntable stops rotating and the second turntable continues rotating until the next temporary placement table rotates to the exchange station. After the suction nozzle located at the exchange station sucks the quartz crystal resonator from the temporary placement table, the first turntable starts rotating again, the next suction nozzle rotates to the exchange station and releases the quartz crystal resonator to the temporary placement table, and the above operations are repeated.

[0016] Compared with the prior art, the present invention has the following beneficial effects: The present invention realizes the rapid and accurate transfer of the quartz crystal resonator between different inspection stations through the combination of the first turntable, the suction nozzle, the second turntable and the temporary placement table, without manual intervention, which greatly improves the inspection efficiency. The entire inspection process is automatically carried out according to the preset program, from positioning, electrical parameter testing, marking, front visual inspection, insulation performance testing to bottom visual inspection, each link is closely connected, reducing the inspection time, and can meet the needs of large-scale inspection.

[0017] The inspection and marking equipment integrates multiple inspection methods such as electrical parameter testing, insulation performance testing, front visual inspection and bottom visual inspection, and can conduct a comprehensive and integrated evaluation of the performance and appearance of quartz crystal resonators, ensuring that only qualified products can enter the subsequent production links or markets, improving the quality level of the entire product, enhancing the competitiveness of the product in the market, and also reducing the after-sales maintenance and recall costs caused by product quality problems. The automated turntable transfer, marking and inspection process greatly reduces the manual operation links and reduces the dependence on manpower, which not only saves labor costs, but also avoids human errors and safety accidents caused by factors such as manual operation fatigue and negligence, further improving the stability of the production process and the consistency of product quality.

[0018] The processes on the first turntable and the second turntable are carried out synchronously and operate in coordination, which greatly shortens the production cycle of a single product, can process more products per unit time, significantly improves production efficiency, meets mass production needs, and effectively reduces production costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The present invention is described in detail below with reference to the embodiments and accompanying drawings, wherein: Figure 1 It is a schematic diagram of the overall structure of the quartz crystal resonator testing, marking, inspection and packaging equipment; Figure 2 It is a top view of the quartz crystal resonator testing, marking, inspection and packaging equipment; Figure 3 It is a schematic diagram of a quartz crystal resonator inspection marking device; Figure 4 is a schematic diagram of the first turntable; Figure 5 is a schematic diagram of positioning mechanism 1; Figure 6 is a schematic diagram of test organization one; Figure 7 is a schematic diagram of the second turntable; Figure 8 is a schematic diagram of positioning mechanism 2; Fig. 9 It is a schematic diagram of the marking mechanism; Fig.10 is a schematic diagram of the testing mechanism 1; Fig.11 is a schematic diagram of the second testing mechanism; Fig.12 It is a schematic diagram of the collection mechanism.

[0020] 200. Inspection of marking equipment; 211, first turntable; 212, second turntable; 213, temporary stand; 214, insulation tester; 220, collecting mechanism; 221, collecting mechanism mounting seat; 222, defective material cup; 223, material passing pipe; 230, suction nozzle; 231, filter; 232, vacuum breaking structure; 233, solenoid valve; 240, positioning mechanism 1; 241, positioning claw; 242, positioning cam mechanism; 243, positioning motor 1; 250, positioning mechanism 2; 251, positioning motor 2; 252, positioning slide; 253, positioning sheet; 254, positioning mounting seat; 260. Test mechanism 1; 261. Test probe; 262. Test probe board; 263. Test probe board connecting wire; 264. Probe test mechanism mounting seat; 265. Industrial control host; 270, marking mechanism; 271, marking adjustment mounting seat; 272, laser head; 273, laser; 274, wire connecting the laser to the control host; 275, control host; 280. Detection mechanism 1; 281. Mounting and adjusting bracket; 282. Red light ring light source; 283. Black and white camera; 284. Telecentric lens; 290. Detection mechanism 2; 291. Camera adjustment mounting seat; 292. Camera; 293. Protective cover; 294. Light source mounting seat; 295. Reflection prism; 296. Ring light source; 410, loading station; 420, positioning station 1; 430, testing station 1; 440, testing station 2; 450, positioning station 3; 460, testing station 2; 470, discarding station 2; 480, material identification station 4; 490, feeding station; 510. Exchange workstations; 610, material identification station 1; 620, positioning station 2; 630, marking station; 640, material identification station 2; 650, inspection station 1; 660, discarding station 1; 670, material identification station 3; 700. Quartz crystal resonator. DETAILED DESCRIPTION

[0021] In order to make the purpose, technical scheme and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar components or components with the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be interpreted as limiting the present invention.

[0022] In one embodiment, a quartz crystal resonator inspection marking device 200, see Figure 1-2 , which can be used in quartz crystal resonator testing, marking, detection, and packaging equipment. The quartz crystal resonator inspection and marking equipment 200 includes a first turntable 211, a second turntable 212, and an exchange station 510. The first turntable 211 is mainly used to test the quartz crystal resonator 700, and the turntable is mainly used to mark the quartz crystal resonator 700. The first turntable 211 and the second turntable 212 exchange the quartz crystal resonator 700 at the exchange station 510 to perform different process processing on the quartz crystal resonator 700. Among them, the first turntable 211 and the second turntable 212 can be indexing disks or other rotatable disks.

[0023] A plurality of suction nozzles 230 are evenly fixed around the circumference of the first turntable 211. The first turntable 211 can rotate around its axis and drive the plurality of suction nozzles 230 thereon to rotate synchronously around the axis of the first turntable 211. The suction nozzles 230 are used to absorb / release the quartz crystal resonator 700. The suction nozzles 230 can be connected to a negative pressure vacuum air pipe to absorb and release materials, and a filter 231 can be arranged in the middle to filter the air entering the negative pressure vacuum air pipe to remove dust and impurities. The vacuum breaking structure 232 can also be used to realize automated suction and release operations, improve production efficiency, and reduce errors in manual operation. The specific vacuum breaking structure 232 can be controlled to start and stop by an electromagnetic valve 233.

[0024] A positioning mechanism 240, a testing mechanism 260, a testing mechanism 2, a positioning mechanism 3 and a detection mechanism 2 290 are sequentially arranged along the circumference of the first turntable 211. The positioning mechanism 240 is used to position the quartz crystal resonator 700, the testing mechanism 260 is used to perform electrical parameter tests on the quartz crystal resonator 700, the testing mechanism 2 is used to perform insulation performance tests on the quartz crystal resonator 700, the positioning mechanism 3 is used to position the quartz crystal resonator 700, and the detection mechanism 2 290 is used to perform bottom visual inspection of the quartz crystal resonator 700.

[0025] Specifically, Figure 3As shown, the first positioning station 420, the first testing station 430, the second testing station 440, the third positioning station 450 and the second detection station 460 can be arranged in sequence along the rotation direction of the first turntable 211, and each suction nozzle 230 can be rotated through the first positioning station 420, the first testing station 430, the second testing station 440, the third positioning station 450 and the second detection station 460 in sequence, and the suction nozzle 230 can suck the quartz crystal resonator 700, so that the suction nozzle 230 can drive the quartz crystal resonator 700 to rotate through the first positioning station 420, the first testing station 430, the second testing station 440, the third positioning station 450 and the second detection station 460 in sequence.

[0026] Positioning mechanism 1 240 corresponds to positioning station 1 420, and positioning mechanism 1 240 positions the quartz crystal resonator 700 located at positioning station 1 420. Testing mechanism 1 260 corresponds to testing station 1 430, and testing mechanism 1 260 performs electrical parameter test on the quartz crystal resonator 700 located at testing station 1 430. Testing mechanism 2 corresponds to testing station 2 440, and testing mechanism 2 performs insulation performance test on the quartz crystal resonator 700 located at testing station 2 440. Positioning mechanism 3 corresponds to positioning station 3 450, and positioning mechanism 3 positions the quartz crystal resonator 700 located at positioning station 3 450. Inspection mechanism 2 290 corresponds to inspection station 2 460, and inspection mechanism 2 290 performs bottom visual inspection on the quartz crystal resonator 700 located at inspection station 2 460.

[0027] like Figure 7 As shown, multiple temporary tables 213 for carrying quartz crystal resonators 700 are evenly distributed along the circumference of the second turntable 212. The second turntable 212 can rotate around its axis and drive the multiple temporary tables 213 thereon to rotate synchronously. A second positioning mechanism 250, a marking mechanism 270 and a first detection mechanism 280 are sequentially arranged along the circumference of the second turntable 212. The second positioning mechanism 250 is used to position the quartz crystal resonator 700, the marking mechanism 270 is used to mark the quartz crystal resonator 700, and the first detection mechanism 280 is used to perform front visual inspection on the quartz crystal resonator 700.

[0028] Specifically, Figure 3As shown, the second turntable 212 is provided with a second positioning station 620, a marking station 630 and a first detection station 650 in sequence along its rotation direction, and the temporary table 213 passes through the second positioning station 620, the marking station 630 and the first detection station 650 in sequence during the rotation of the second turntable 212. Under the rotation of the second turntable 212, when the temporary table 213 drives the quartz crystal resonator 700 to rotate to the second positioning station 620, the second positioning mechanism 250 positions the quartz crystal resonator 700 located on the second positioning station 620 to correct the position of the quartz crystal resonator 700 on the temporary table 213, ensuring that its key position parameters such as center and angle meet the requirements of the subsequent marking process. When the temporary table 213 drives the quartz crystal resonator 700 to rotate to the marking station 630, the marking mechanism 270 marks the quartz crystal resonator 700 located on the marking station 630. When the temporary placement table 213 drives the quartz crystal resonator 700 to rotate to the first inspection station 650, the first inspection mechanism 280 performs a front visual inspection on the quartz crystal resonator 700 located at the first inspection station 650. The first inspection mechanism 280 can timely and accurately find various defects and marking problems on the front of the quartz crystal resonator 700, screen out unqualified products at an early stage, avoid defective products from flowing into the next process, and effectively ensure the overall quality of the product.

[0029] Furthermore, a suction port is provided in the middle of the temporary table 213, and the suction port forms a negative pressure by suction, so that the quartz crystal resonator 700 is more stably supported on the temporary table 213, and it is not easy to cause relative displacement with the temporary table 213 when the quartz crystal resonator 700 moves with the temporary table 213. Figure 4 As shown, the air inlet can be connected to a negative pressure vacuum air pipe to suck and release materials, and a filter 231 can be arranged in the middle to filter the air entering the negative pressure vacuum air pipe to remove dust and impurities. The vacuum breaking structure 232 can also be used to realize automatic suction and release operations, improve production efficiency, and reduce errors in manual operation. The specific vacuum breaking structure 232 can be controlled to start and stop by an electromagnetic valve 233.

[0030] The exchange station 510 is located opposite the first turntable 211 and the second turntable 212, and is located between the test mechanism 1 260 and the test mechanism 2, and is located between the positioning mechanism 250 and the detection mechanism 1 280; at the exchange station 510, the suction nozzle 230 releases a quartz crystal resonator 700 to the temporary placement table 213, and absorbs a quartz crystal resonator 700 from the next temporary placement table 213.

[0031] When in use, driven by the rotation of the first turntable 211, the suction nozzle 230 rotates to the first positioning station 420, and the positioning mechanism 1 240 positions the quartz crystal resonator 700 sucked by the suction nozzle 230 at the first positioning station 420, ensuring that it is in an ideal standard position during the subsequent electrical parameter test and insulation performance test, and ensuring the accuracy and reliability of the test results. Then the first turntable 211 drives the suction nozzle 230 to rotate to the first test station 430, and the testing mechanism 1 260 performs an electrical parameter test on the quartz crystal resonator 700 sucked by the suction nozzle 230 at the first test station 430, distinguishing between quartz crystal resonators 700 with qualified electrical parameters and quartz crystal resonators 700 with unqualified electrical parameters.

[0032] Then the first turntable 211 drives the suction nozzle 230 to rotate to the exchange station 510 , and the suction nozzle 230 of the exchange station 510 releases a quartz crystal resonator 700 to the temporary placement table 213 on the second turntable 212 . Under the rotation of the second turntable 212, the temporary table 213 drives the quartz crystal resonator 700 to rotate to the second positioning station 620, and the second positioning mechanism 250 positions the quartz crystal resonator 700 located at the second positioning station 620 to correct the position of the quartz crystal resonator 700 on the temporary table 213; then the temporary table 213 continues to drive the quartz crystal resonator 700 to rotate to the marking station 630, and the marking mechanism 270 marks the quartz crystal resonator 700 located at the marking station 630; then the temporary table 213 drives the quartz crystal resonator 700 to rotate to the first detection station 650, and the first detection mechanism 280 performs a front visual inspection on the quartz crystal resonator 700 located at the first detection station 650.

[0033] After the temporary table 213 drives the quartz crystal resonator 700 to complete the front visual inspection, the second turntable 212 continues to rotate until the temporary table 213 rotates to the exchange station 510. After the suction nozzle 230 of the first turntable 211 sucks the quartz crystal resonator 700 that has completed the marking and front visual inspection, the first turntable 211 drives the suction nozzle 230 to rotate to the second test station 440. The second testing mechanism performs an insulation performance test on the quartz crystal resonator 700 sucked by the suction nozzle 230 at the second test station 440 to distinguish between quartz crystal resonators 700 with qualified insulation performance and quartz crystal resonators 700 with unqualified insulation performance. Then the first turntable 211 drives the suction nozzle 230 to rotate to the third positioning station 450, and the positioning mechanism 3 positions the quartz crystal resonator 700 sucked by the suction nozzle 230 at the third positioning station 450 to ensure that the quartz crystal resonator 700 is still in the correct position after the previous test process, providing a stable test object for the subsequent bottom visual inspection, and ensuring the consistency and accuracy of the inspection image. Then the first turntable 211 drives the suction nozzle 230 to rotate to the second inspection station 460, and the inspection mechanism 290 performs a bottom visual inspection on the quartz crystal resonator 700 sucked by the suction nozzle 230 at the second inspection station 460 to distinguish the quartz crystal resonator 700 with appearance defects on the bottom.

[0034] Through the combination of the first turntable 211, the suction nozzle 230, the second turntable 212 and the temporary table 213, the quartz crystal resonator 700 is quickly and accurately transferred between different inspection stations without manual intervention, which greatly improves the inspection efficiency. The entire inspection process is automatically carried out according to the preset program, from positioning, electrical parameter testing, marking, front visual inspection, insulation performance testing to bottom visual inspection. Each link is closely connected, which reduces the inspection time and can meet the needs of large-scale inspection.

[0035] The inspection and marking equipment 200 integrates multiple inspection methods such as electrical parameter testing, insulation performance testing, front visual inspection and bottom visual inspection, and can conduct a comprehensive and integrated evaluation of the performance and appearance of the quartz crystal resonator 700, ensuring that only qualified products can enter the subsequent production links or market, improving the quality level of the entire product, enhancing the competitiveness of the product in the market, and also reducing the after-sales maintenance and recall costs caused by product quality problems. The automated turntable transfer, marking and inspection process greatly reduces the manual operation links and reduces the dependence on manpower, which not only saves labor costs, but also avoids human errors and safety accidents caused by factors such as manual operation fatigue and negligence, further improving the stability of the production process and the consistency of product quality.

[0036] The processes on the first turntable 211 and the second turntable 212 are carried out synchronously and operate in coordination, which greatly shortens the production cycle of a single product, can process more products per unit time, significantly improves production efficiency, meets mass production needs, and effectively reduces production costs.

[0037] In one embodiment, a feeding station 490 and a loading station 410 are sequentially arranged between the positioning mechanism 1 240 and the detection mechanism 2 290 along the rotation direction of the first turntable 211. The suction nozzle 230 rotates to the loading station 410 to absorb the quartz crystal resonator 700 output from the upstream process, and the suction nozzle 230 rotates to the feeding station 490 to release the qualified quartz crystal resonator 700 to the downstream process.

[0038] Specifically, when the suction nozzle 230 rotates to the loading station 410, its position is precisely aligned with the output end of the upstream process, and the quartz crystal resonator 700 is gently and firmly sucked from the output position of the upstream process through vacuum adsorption or other suitable suction methods, ensuring that no damage is caused to the resonator during the transfer process. The suction nozzle 230 that has sucked the quartz crystal resonator 700 rotates to the first positioning station 420 along with the first turntable 211. The quartz crystal resonator 700 is accurately positioned at this station to prepare for the subsequent inspection process. After a series of inspection processes, when the suction nozzle 230 rotates to the feeding station 490, it is also precisely matched with the input end of the downstream process. At this time, the suction nozzle 230 releases the quartz crystal resonator 700 that has been tested and determined to be qualified to the receiving position of the downstream process, completing the handover of the product.

[0039] By setting the loading station 410 and the feeding station 490 on the first turntable 211, seamless connection with the upstream and downstream processes is achieved, and the detection process of the quartz crystal resonator 700 is integrated into the entire production process, making the material transmission on the production line smoother and more efficient, reducing the stagnation and waiting time in the intermediate links, improving the overall production efficiency, and meeting the needs of large-scale and continuous production. By adjusting the parameters such as the rotation speed of the first turntable 211, the suction and release time of the suction nozzle 230, it can adapt to different production rhythms and product model switching, and it is also convenient to monitor and manage the production process in real time, timely discover and solve possible problems, and improve the intelligence and automation level of the production process.

[0040] The precise suction of the loading station 410 and the accurate release of the feeding station 490 ensure the stable state of the quartz crystal resonator 700 when entering and leaving the inspection process, avoiding product damage or position deviation caused by human operation or improper material transfer, and helping to ensure the accuracy and reliability of the inspection results. Only products that have passed strict inspection and are of qualified quality will enter the downstream process, thereby effectively ensuring the stability and consistency of the product quality of the entire production line, reducing the defective rate and scrap rate, and improving the product yield and market competitiveness.

[0041] In one embodiment, a discarding mechanism 1 is further provided between the detection mechanism 1 280 of the second turntable 212 and the exchange station 510, and a discarding mechanism 2 is further provided between the detection mechanism 290 of the first turntable 211 and the feeding station 490; the quartz crystal resonator 700 that fails the electrical parameter test and / or the front visual inspection is taken away and discarded by the discarding mechanism 1, and the quartz crystal resonator 700 that fails the insulation performance test and / or the bottom visual inspection is taken away and discarded by the discarding mechanism 2. Specifically, along the rotation direction of the second turntable 212, a discarding station 660 is provided between the detection station 650 and the exchange station 510, and the quartz crystal resonator 700 that fails the electrical parameter test and / or the front visual inspection is taken away and discarded by the discarding mechanism 1 at the discarding station 660; along the rotation direction of the first turntable 211, a discarding station 470 is provided between the detection station 460 and the feeding station 490, and the quartz crystal resonator 700 that fails the insulation performance test and / or the bottom visual inspection is taken away and discarded by the discarding mechanism 2 at the discarding station 470.

[0042] Furthermore, the first discarding mechanism includes a second air nozzle and a collection mechanism 220, and the quartz crystal resonator 700 that fails the electrical parameter test or / and the front visual inspection is blown into the collection mechanism 220 by the second air nozzle at the first discarding station 660. The blowing force of the airflow ejected by the second air nozzle is greater than the suction force of the suction nozzle 230, so that the second air nozzle can easily blow away the unqualified products sucked by the suction nozzle 230. The first discarding mechanism and the second discarding mechanism can be set to the same structure, and the first discarding mechanism and the second discarding mechanism can also be set to other structures with the same functions, such as a mechanical gripper type discarding structure, a vacuum suction type discarding structure, an inclined slide type discarding structure, etc.

[0043] In one embodiment, Fig.12As shown, the collection mechanism 220 includes a collection mechanism mounting seat 221, and a defective material cup 222 and a material passing tube 223 arranged on the collection mechanism mounting seat 221. The unqualified quartz crystal resonator 700 falls into the defective material cup 222 through the material tube 223. The collection mechanism mounting seat 221, as the basic supporting component of the entire collection mechanism 220, has sufficient strength to withstand the weight of the defective material cup 222 and the material passing tube 223 and the impact force generated by the unqualified quartz crystal resonator 700 during the falling process, ensuring that the entire collection mechanism 220 will not shake or move during operation. The defective material cup 222 is usually made of transparent or translucent plastic material (such as polycarbonate), which makes it easy for the operator to intuitively observe the number and status of the collected unqualified quartz crystal resonators 700, clean the material cup in time, and avoid the overflow of the material cup causing blockage or failure of the collection system. The feeding tube 223 is made of metal or plastic material (such as a stainless steel tube or a hard plastic tube) with a smooth inner wall, and its inner diameter is slightly larger than the maximum size of the quartz crystal resonator 700 to ensure that unqualified products can pass smoothly under the action of airflow or its own gravity, while minimizing the friction and collision of the product in the tube to prevent the product surface from being damaged or blocking the feeding tube 223 due to jamming.

[0044] In other embodiments, the collection mechanism 220 further includes a cylinder, and the defective material cup 222 includes two. The two defective material cups 222 of the first discarding mechanism are respectively loaded with quartz crystal resonators 700 that fail the electrical parameter test and the quartz crystal resonators 700 that fail the front visual inspection; the two defective material cups 222 of the second discarding mechanism are respectively loaded with quartz crystal resonators 700 that fail the insulation performance test and the quartz crystal resonators 700 that fail the bottom visual inspection, so as to perform subsequent inspection, analysis or recycling of different defective products. The material passing pipe 223 includes two pipes and a pipe head, and the quartz crystal resonator 700 enters different defective material cups 222 from the pipe head and the pipe. The pipe connected to the pipe head is switched according to the cylinder detection result, so as to realize the classified collection of different defective products.

[0045] In one embodiment, along the rotation direction of the second turntable 212, a material identification station 1 610 is provided between the exchange station 510 and the second positioning mechanism 250, and / or a material identification station 2 640 is provided between the marking mechanism 270 and the first detection mechanism 280, and / or a material identification station 3 670 is provided between the first discarding mechanism and the exchange station 510; and / or along the rotation direction of the first turntable 211, a material identification station 480 is provided between the second discarding mechanism and the feeding station 490. The inspection marking device 200 further includes an optical fiber detection mechanism, which is used to detect whether there is a quartz crystal resonator 700 on the material identification station 1 610, the material identification station 2 640, the material identification station 3 670 or the material identification station 480.

[0046] Specifically, a plurality of optical fiber detection mechanisms are provided, and the plurality of optical fiber detection mechanisms are used to detect whether there is a quartz crystal resonator 700 on the temporary table 213. For example, a material identification station 1 610 is provided between the exchange station 510 and the positioning station 2 620 of the second turntable 212, and the optical fiber detection mechanism detects whether there is a quartz crystal resonator 700 on the temporary table 213 at the material identification station 1 610. If there is, the temporary table 213 rotates to the subsequent station and then performs positioning, marking, etc. of the subsequent station. If not, the temporary table 213 idles. A material identification station 2 640 is provided between the marking station 630 and the detection station 1 650 of the second turntable 212, and the optical fiber detection mechanism detects whether there is a quartz crystal resonator 700 on the temporary table 213 at the material identification station 2 640. If there is, the temporary table 213 rotates to the subsequent station and then performs material detection, etc. of the subsequent station. If not, the temporary table 213 idles. A material identification station 480 is provided between the discarding station 470 and the feeding station 490 of the first turntable 211. The optical fiber detection mechanism detects whether there is a quartz crystal resonator 700 on the suction nozzle 230 at the material identification station 480. If so, the suction nozzle 230 rotates to the subsequent station and then unloads the material at the subsequent station. If not, the suction nozzle 230 idles.

[0047] The optical fiber detection mechanism may include a light source, an optical fiber, and an optical detector. The light emitted by the light source is transmitted through the optical fiber to the detection point corresponding to the material identification station. When a quartz crystal resonator 700 exists, the optical signal will change (such as changes in reflection, refraction, scattering, etc.), and then the changed optical signal is transmitted back to the optical detector through the optical fiber. The optical detector converts the change in the optical signal into an electrical signal to determine whether there is a quartz crystal resonator 700. For example, in a reflective optical fiber sensor, if the quartz crystal resonator 700 is in the detection position, the intensity and other characteristics of the reflected light will change, thereby achieving detection. Multiple optical fiber detection mechanisms can detect whether a material exists and control the operation of subsequent stations, avoiding unnecessary operations, reducing equipment loss and energy consumption, and improving production efficiency.

[0048] In one embodiment, Fig. 9As shown, the marking mechanism 270 includes a marking adjustment mounting seat 271, a laser 273 and a laser head 272. The laser 273 is mounted on the upper end of the marking adjustment mounting seat 271, and the laser head 272 is mounted at one end of the laser 273. The laser 273 is used to generate a laser beam and transmit it to the quartz crystal resonator 700 on the marking station 630 through the laser head 272. The laser 273 is used to generate a high-energy laser beam, which can be a Nd:YAG laser 273, a semiconductor laser 273, etc. The laser head 272 is mounted at one end of the laser 273. It is the emission terminal of the laser beam and is responsible for focusing the laser beam generated by the laser 273 and accurately projecting it onto the surface of the quartz crystal resonator 700. Specifically, the laser head 272 can have a red light correction function, and the focal length of the lens can be accurately adjusted within a certain range, and the range can roughly cover from a certain initial value to 100mm. It can use 20W power for laser marking and engraving.

[0049] The height and angle of the marking adjustment mounting seat 271 are adjustable, so that the laser 273 and the laser head 272 can be finely adjusted up and down and left and right. The height and angle adjustment of the marking adjustment mounting seat 271 can be achieved by screw drive, gear adjustment or hydraulic, pneumatic devices, etc. For example, in terms of up and down adjustment, when the screw is rotated, the laser 273 and the laser head 272 can be driven to rise or fall smoothly according to a predetermined accuracy (such as 0.1mm step) to adapt to the quartz crystal resonator 700 marking tasks with different height requirements; in terms of angle adjustment, the use of a rotary joint with a scale or a worm gear mechanism can accurately adjust the inclination angle of the laser 273 and the laser head 272 to ensure that the laser beam is vertically incident on the product surface and ensure the consistency of the marking effect.

[0050] Furthermore, the marking mechanism 270 also includes a laser connected to a control host wire 274, and the laser connected to the control host wire 274 connects the laser 273 and the control host 275 to transmit control signals. The control host 275 has a built-in marking control software, and the operator enters various marking parameters on the human-machine interface of the control host 275, such as laser power, pulse frequency, marking speed, marking pattern and other detailed information. According to these instructions, the control host 275 sends corresponding electrical signals to the laser 273 through the laser connected to the control host wire 274, so as to realize real-time and precise control of the working state of the laser 273. For example, when the laser power needs to be changed, the control host 275 sends a digital signal containing a power adjustment value to the laser 273. After the laser 273 receives it, the internal power regulation circuit responds quickly and adjusts the output laser power to the set value, ensuring that the marking process is flexible and accurate.

[0051] Due to the flexible adjustment characteristics of the marking adjustment mount 271 and the multi-adjustment function of the laser head 272, the marking mechanism 270 can cope with quartz crystal resonators 700 of different specifications and materials, realize accurate and efficient marking operations in the production process, and improve product traceability and identification quality.

[0052] In one embodiment, Figure 6 As shown, the test mechanism 260 includes a probe test mechanism mounting seat 264, a test probe 261 and a test probe plate 262. The test probe 261 is used to contact the electrode of the quartz crystal resonator 700 and obtain an electrical parameter signal. The test probe 261 is usually made of a highly conductive and highly elastic metal material, such as beryllium copper alloy, etc. The head thereof is specially treated to ensure good electrical contact with the electrode of the quartz crystal resonator 700 while avoiding scratching the electrode surface.

[0053] The probe test mechanism mounting seat 264 can be made of metal or high-strength engineering plastics, and has sufficient rigidity and stability to resist external vibration and impact, ensuring that the test probe board 262 and its components will not be displaced or shaken during the test. The test probe board 262 is set on the probe test mechanism mounting seat 264, and multiple test probes 261 are fixed and signal-connected on the test probe board 262. The test probes 261 are fixed on the test probe board 262 through precise welding or crimping technology to ensure that they will not loosen or shift during long-term use, and maintain stable contact performance.

[0054] After the test probe 261 contacts the electrode of the quartz crystal resonator 700, it obtains its electrical parameter signals, and then transmits these signals to the test probe board 262 connected to the signal. The test probe board 262 then outputs the electrical parameter signals through the test probe board connecting wire 263 and transmits them to subsequent test boards and other equipment. The test board displays and records the electrical parameter test results through the industrial control host 265 software, obtains the test results, and thus determines whether the electrical parameters of the quartz crystal resonator 700 are qualified to ensure that each packaged quartz crystal resonator 700 meets the electrical performance requirements.

[0055] In other embodiments, the test mechanism 260 can also be set as other structures, such as a capacitive coupling test structure, an electromagnetic induction test structure, a microelectromechanical system (MEMS) test structure, a system on chip (SoC) test structure, a laser interference test structure, a spectral analysis test structure, etc.

[0056] In one embodiment, testing organization 2 may include a common insulation tester 214 such as an insulation resistance tester, a leakage current tester, an LC comprehensive tester or an electrostatic capacitance scanning tester, which is used to perform insulation performance testing on the quartz crystal resonator 700 to ensure that the insulation performance of each quartz crystal resonator 700 meets the standard and provide reliable quality assurance for subsequent use.

[0057] In one embodiment, Fig.10 As shown, the detection mechanism 1 280 includes a mounting and adjusting bracket 281, a red light ring light source 282 and a black and white camera 283. The red light ring light source 282 and the black and white camera 283 are respectively mounted on the mounting and adjusting bracket 281. The mounting and adjusting bracket 281 can be equipped with multiple sets of guide rails, sliders, screw nut pairs and angle adjustment devices, etc., to achieve fine position adjustment of the red light ring light source 282 and the black and white camera 283 installed thereon in three-dimensional space. The light-emitting element of the red light ring light source 282 usually adopts a high-brightness LED array, which is distributed around to form a ring structure. The red light ring light source 282 provides uniform lighting, eliminates shadows and reflections, and ensures that the camera 292 can clearly capture the image of the quartz crystal resonator 700.

[0058] The black and white camera 283 is used to capture the image of the quartz crystal resonator 700. Its photosensitive element can use a highly sensitive CCD or CMOS chip, which can quickly convert the received light intensity signal into a digital electrical signal. Specifically, the black and white camera 283 can use a 130W pixel resolution to clearly present the detailed features of the product surface. For example, for fonts after laser marking, the black and white camera 283 can accurately distinguish the stroke clarity, edge sharpness, and whether there are subtle missing marking marks, etc., to provide high-precision image data for subsequent visual inspection algorithms. A telecentric lens 284 can be installed at the front end of the black and white camera 283, and the telecentric lens 284 provides high-precision imaging without distortion.

[0059] When working, the red ring light source 282 emits light downward to the quartz crystal resonator 700 on the first detection station 650. The black and white camera 283 is located directly above the red ring light source 282. It uses the good lighting conditions provided by the light source to capture the light reflected from the surface of the quartz crystal resonator 700. With a 130W pixel resolution, it clearly presents the detailed features of the product surface.

[0060] The detection mechanism 280 performs font detection and missing marking detection on the quartz crystal resonator 700 after laser marking and engraving. Through accurate and efficient front visual inspection, unqualified quartz crystal resonators 700 can be screened out at an early stage, avoiding defective products from flowing into subsequent processes and effectively reducing the scrap rate.

[0061] In one embodiment, Fig.11 As shown, the second detection mechanism 290 includes a camera part and a light source irradiation part, the camera part includes a camera adjustment mount 291 and a camera 292 arranged on the camera adjustment mount 291, the camera adjustment mount 291 is used to adjust the position and shooting angle of the camera 292; the light source irradiation part includes a light source mount 294, and a reflecting prism 295 and a ring light source 296 arranged on the light source mount 294. First, the camera 292 is installed with the adjustment mount and the camera 292 as a whole, and then the light source mount 294, the reflecting prism 295 and the ring light source 296 are installed as another whole. The second detection mechanism 290 can perform real-time and accurate bottom visual inspection during the production process to ensure that the bottom quality of each quartz crystal resonator 700 meets the standards, providing reliable quality assurance for subsequent processes.

[0062] The reflecting prism 295 reflects the light from the annular light source 296 to the bottom of the quartz crystal resonator 700 at 45 degrees to the camera 292 , and the center of the camera 292 and the center of the reflecting prism 295 are on the same horizontal line.

[0063] Specifically, the camera adjustment mount 291 is usually composed of guide rails, sliders, rotating joints, and adjusting screws. Through these components, the position of the camera 292 can be accurately adjusted in three-dimensional space, including translation along the X, Y, and Z axes and rotation around each axis, so that the camera 292 can be accurately aligned with the bottom of the quartz crystal resonator 700 to ensure that a clear, complete image that meets the detection requirements is captured. The camera 292 can use a high-resolution, high-frame-rate industrial camera 292, and the focal length and aperture of the lens can be adjusted according to actual detection requirements. The camera 292 is fixed on the camera adjustment mount 291, and a stable connection is achieved by means of screws or bayonet, etc., to ensure that no displacement occurs during the detection process.

[0064] Furthermore, the camera part can also include a protective cover 293, which is tightly installed around the camera 292 and fixed to the camera adjustment mount 291 through a slot or screws. This can prevent dust, debris, water vapor and other impurities in the production environment from contaminating the camera 292 lens and affecting the shooting effect, and can also protect the camera 292 from collision and accidental damage to a certain extent, while not affecting the normal shooting angle and light reception of the camera 292.

[0065] The light source mounting base 294 is generally made of metal, such as stainless steel, to ensure sufficient strength and stability. The light source mounting base 294 is designed with precise mounting holes and positioning structures for fixing the annular light source 296 and the reflecting prism 295, so that the relative positions are kept accurate and stable during the detection process. At the same time, the light source mounting base 294 may also be equipped with a heat dissipation structure, such as a heat sink or a fan, to dissipate the heat generated by the annular light source 296 during operation, ensuring that the luminous intensity and stability of the light source are not affected.

[0066] The reflecting prism 295 can be made of optical glass material with high reflectivity, and its surface is precisely polished to ensure the efficiency and accuracy of light reflection. The reflecting prism 295 is fixed to the light source mounting seat 294 by a special clamp or glue to ensure that its relative position with the ring light source 296 and the camera 292 is accurate. Its reflecting surface is at a 45-degree angle to the light emission direction of the ring light source 296, and can accurately reflect the light emitted by the ring light source 296 to the bottom of the quartz crystal resonator 700, and reflect the light reflected from the bottom to the camera 292 at a 45-degree angle, so as to achieve efficient use and accurate guidance of light.

[0067] The ring light source 296 usually uses a light emitting diode (LED) as a light emitting element, and its light color and intensity can be selected and adjusted according to the material of the bottom of the quartz crystal resonator 700 and the detection requirements. For example, it can emit white, blue, red and other different colors of light, and have different brightness levels. The ring light source 296 is firmly mounted on the light source mounting base 294 by means of screws or buckles, and its internal circuit is connected to the external power controller. The power controller can accurately adjust the brightness, switching time and other parameters of the ring light source 296 to adapt to different detection scenarios and requirements, provide uniform, stable and suitable lighting conditions for the bottom of the quartz crystal resonator 700, enhance the contrast and clarity of the image, and facilitate the camera 292 to capture clear bottom features.

[0068] Since the camera adjustment mount 291 can accurately adjust the position and angle of the camera 292, as well as the precise optical matching relationship between the reflective prism 295, the annular light source 296 and the camera 292, the detection mechanism 290 can obtain a high-definition, high-resolution image of the bottom of the quartz crystal resonator 700, thereby being able to accurately detect subtle quality problems such as tiny cracks, scratches, impurities, packaging defects, etc., which helps to improve product quality standards and reduce the outflow of defective products. For some application fields with extremely high quality requirements, such as the production of quartz crystal resonators 700 in aerospace, medical equipment, etc., it can ensure the reliability and stability of the product and avoid serious consequences caused by minor defects.

[0069] In other embodiments, the second detection mechanism 290 may also be configured as other structures, such as a line scanning camera 292 detection structure, a binocular stereo vision detection structure, a multi-spectral detection structure based on machine vision, etc.

[0070] In one embodiment, Figure 5 As shown, the positioning mechanism 1 240 includes a positioning motor 1 243 and a positioning cam mechanism 242 connected in a transmission manner, and four positioning claws 241 arranged orthogonally, and the four positioning claws 241 calibrate the position of the quartz crystal resonator 700 located in the middle thereof. The positioning motor 1 243 drives the positioning cam mechanism 242 to rotate, and the positioning cam mechanism 242 drives the four positioning claws 241 to open / close to calibrate the position of the quartz crystal resonator 700.

[0071] The positioning motor 243 usually adopts a high-precision servo motor or a stepper motor, and its output shaft is rigidly connected to the input shaft of the positioning cam mechanism 242 through a coupling or a synchronous belt to ensure stable power transmission and accurate transmission ratio. The rotation angle and speed of the motor can be precisely programmed and controlled by the controller, providing a reliable power source for the precise movement of the positioning cam mechanism 242. The positioning cam mechanism 242 is composed of a cam and a follower, and the contour curve of the cam is designed according to the opening and closing action requirements of the four positioning claws 241. When the positioning motor 243 rotates, it drives the cam to rotate, and the cam contour contacts the follower, converting the rotational motion of the motor into the linear reciprocating motion of the follower.

[0072] The four positioning claws 241 are connected to the followers of the positioning cam mechanism 242 through mechanisms such as connecting rods or sliders to form a linkage system. When the cam rotates, the linear motion of the followers drives the four positioning claws 241 to open or close at the same time. For example, the rising section of the cam profile pushes the followers to move outward, driving the positioning claws 241 to open so that the quartz crystal resonator 700 can smoothly enter the positioning area; the falling section of the cam profile retracts the followers inward, pulling the positioning claws 241 to close, and accurately correcting the position of the quartz crystal resonator 700 from four directions.

[0073] The inner side of the positioning claw piece 241 is usually designed with a soft buffer material, such as a rubber pad or a silicone pad, which can provide sufficient clamping force to ensure the stability of the position of the quartz crystal resonator 700 while avoiding scratches or damage to the surface of the resonator.

[0074] Furthermore, the rotation position of the first turntable 211 can also be monitored in real time by a high-precision sensor (such as an encoder). When the quartz crystal resonator 700 sucked by the suction nozzle 230 rotates to the working area of ​​the positioning mechanism 240, the sensor feeds back a signal to the control system, and the control system immediately starts the positioning motor 243.

[0075] The suction nozzle 230 places the quartz crystal resonator 700 near the center of the four positioning claws 241. The positioning claws 241 are driven by the motor and the cam mechanism to open and close, and adjust the position of the resonator so that its center coincides with the preset standard position. The error is controlled within a very small range. Then the suction nozzle 230 absorbs the positioned resonator and transfers it to the next workstation.

[0076] By using the precise control of the positioning motor 243 and the design of the positioning cam mechanism 242, the quartz crystal resonator 700 can be positioned with high precision, and the position deviation of the resonator can be controlled at the micron or even sub-micron level, ensuring that in the subsequent testing, processing and other processes, each operation can be performed at the correct position, greatly improving the consistency and performance stability of the product. For example, for electrical parameter testing, precise positioning can ensure good contact between the test probe and the resonator pin, thereby obtaining accurate test data. The positioning mechanism 240 has a certain versatility. For quartz crystal resonators 700 of different sizes and shapes, precise positioning can be achieved by adjusting the initial position of the positioning claw piece 241 and the contour curve of the cam, and it has strong adaptability. At the same time, due to its relatively simple structure and the firm connection of each component, it has high reliability in long-term production operation, reduces the downtime and product defective rate caused by the failure of the positioning mechanism, and reduces the production cost and maintenance cost.

[0077] The structure of the positioning mechanism 3 can be the same as the positioning mechanism 1 240. In other embodiments, the positioning mechanism 1 240 and the positioning mechanism 3 can also be designed as other positioning structures, such as a pneumatic gripper positioning structure, an electromagnetic adsorption positioning structure, a visual recognition and mechanical arm positioning structure, etc.

[0078] In one embodiment, Figure 8 As shown, the second positioning mechanism 250 includes a positioning mounting seat 254, a second positioning motor 251 and a positioning slide 252 installed on the positioning mounting seat 254, and a positioning plate 253 fixedly connected to one end of the positioning slide 252. The second positioning motor 251 drives the positioning slide 252 to reciprocate and drives the positioning plate 253 to reciprocate.

[0079] The mounting seat can be provided with a series of standard threaded holes, positioning pin holes, guide rail mounting grooves and other connection structures. The positioning motor 251 can be firmly fixed in a predetermined position through bolts, positioning pins and other connectors to ensure that the motor will not be displaced or shaken during operation; at the same time, it can also provide a smooth and highly accurate guide rail support for the positioning slide 252, so that the slide can only move along a predetermined straight line direction. The matching clearance between the guide rail and the slide is extremely small, generally controlled within 0.05mm, to ensure the high precision and stability of the slide movement. The travel of the slide is designed according to the positioning requirements of the quartz crystal resonator 700, usually between 10-50mm, which can not only meet the correction of products in different placement positions, but also avoid structural redundancy and reduced motion accuracy caused by too long a travel.

[0080] After receiving the positioning command issued by the control system, the positioning motor 251 is accurately started according to the preset program and parameters, rotates according to the required speed and direction, and drives the positioning slide 252 to move forward and backward linearly. One end of the slide is firmly fixed with the positioning piece 253 by bolts or welding, so that the positioning piece 253 can move synchronously with the slide. The positioning piece 253 is a component that directly contacts the quartz crystal resonator 700. The selection of its material takes into account both the protection of the product and the effective positioning. Generally, plastic or rubber-coated metal materials with moderate hardness, smooth surface and certain wear resistance are used. The shape of the positioning piece 253 is customized according to the outer contour of the quartz crystal resonator 700, and is usually designed to be compatible with the edge of the product, such as L-shaped, U-shaped, etc., so that when contacting the product, it can accurately apply force from multiple directions to push or adjust the position of the product.

[0081] During operation, the positioning plate 253 gradually approaches the quartz crystal resonator 700 as the positioning slide 252 moves. When it contacts the product, it uses the friction between itself and the product and the driving force transmitted by the slide to gently and accurately correct the position of the product on the temporary placement table 213, ensuring that key position parameters such as the center and angle meet the requirements of subsequent marking or inspection processes.

[0082] In one embodiment, a quartz crystal resonator 700 inspection marking process, based on the above-mentioned quartz crystal resonator inspection marking device 200, includes the following steps: The first rotating disk 211 receives the quartz crystal resonator 700 outputted from the upstream process and performs an electrical parameter test on the quartz crystal resonator 700. Furthermore, before the electrical parameter test, the quartz crystal resonator 700 may be positioned first.

[0083] At the exchange station 510, the first turntable 211 transports the quartz crystal resonator 700 that has completed the electrical parameter test to the second turntable 212; The second turntable 212 performs marking and front visual inspection on the quartz crystal resonator 700 received therein, and the quartz crystal resonator 700 that fails the electrical parameter test or the front visual inspection is discarded. Furthermore, before marking, the presence of the quartz crystal resonator 700 can be detected first, and after the quartz crystal resonator 700 is detected, the quartz crystal resonator 700 is positioned. Before the front visual inspection, the presence of the quartz crystal resonator 700 can also be detected first, and after the quartz crystal resonator 700 is detected, it can be subjected to a front visual inspection.

[0084] The quartz crystal resonator 700 that has passed the electrical parameter test and the front visual inspection is transported by the second turntable 212 to the first turntable 211; At the exchange station 510, the first turntable 211 receives the quartz crystal resonator 700 released by the second turntable 212, and performs an insulation performance test and a bottom visual inspection on it. The quartz crystal resonator 700 that fails the insulation performance test or the bottom visual inspection is discarded. Further, before the second turntable 212 releases the quartz crystal resonator 700, it can also first detect the presence of the quartz crystal resonator 700. After the quartz crystal resonator 700 is detected, the first turntable 211 receives the quartz crystal resonator 700. Before the bottom visual inspection, the quartz crystal resonator 700 can also be positioned first.

[0085] The quartz crystal resonator 700 that has passed the insulation performance test and the bottom visual inspection is transported to the downstream process by the first turntable 211. Furthermore, before the quartz crystal resonator 700 is transported to the downstream process by the first turntable 211, the presence of the quartz crystal resonator 700 can also be detected first, and the quartz crystal resonator 700 can be transported after the presence of the quartz crystal resonator 700 is detected.

[0086] in, After the suction nozzle 230 located at the exchange station 510 releases the quartz crystal resonator 700 to the temporary placement table 213 located at the exchange station 510, the first turntable 211 stops rotating, and the second turntable 212 continues to rotate until the next temporary placement table 213 rotates to the exchange station 510. After the suction nozzle 230 located at the exchange station 510 sucks the quartz crystal resonator 700 from the temporary placement table 213, the first turntable 211 starts rotating again, and the next suction nozzle 230 rotates to the exchange station 510 and releases the quartz crystal resonator 700 to the temporary placement table 213, and the above-mentioned operation is repeated.

[0087] When it is first used, there is no material on the second turntable 212. Therefore, after the suction nozzle 230 releases the quartz crystal resonator 700 at the exchange station 510, it cannot suck the quartz crystal resonator 700 from the next temporary table 213. When the suction nozzle 230 on the first turntable 211 continues to release materials to the temporary table 213 on the second turntable 212 until the temporary table 213 is full of materials, after the suction nozzle 230 releases the quartz crystal resonator 700 at the exchange station 510, it can suck the quartz crystal resonator 700 from the next temporary table 213. From this point on, after the suction nozzle 230 on the first turntable 211 releases a quartz crystal resonator 700 to the second turntable 212 each time, there is no need to wait for the quartz crystal resonator 700 to be marked and visually inspected from the front, and a quartz crystal resonator 700 that has been marked and visually inspected from the front can be directly sucked from the next temporary table 213 on the second turntable 212, and then driven to carry out subsequent processes. After that, the processes on the first turntable 211 and the second turntable 212 are carried out synchronously and operate in coordination. The overall rhythm of the production line is greatly accelerated, and the number of products that can be processed per unit time is significantly increased. The entire process enters a continuous cycle state, and the processes on the first turntable 211 and the second turntable 212 are closely coordinated, and the above operations are continuously repeated according to the established process to ensure that the production line can stably and efficiently output qualified products.

[0088] This process ensures that the electrical parameters, marking quality, insulation performance and appearance quality of the quartz crystal resonator 700 meet the standards through multiple steps, thereby improving the overall quality and reliability of the product. Through automated testing, marking, inspection and packaging processes, manual intervention is reduced, and production efficiency and consistency are improved.

[0089] In the description of this specification, if the terms "embodiment one", "this embodiment", "in an embodiment" and the like appear, it means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in the invention or at least one embodiment or example of the invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example; moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in an appropriate manner.

[0090] In the description of this specification, the terms "connect", "install", "fix", "set", "have", etc. are all understood in a broad sense. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0091] In the description of this specification, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprises", "comprising" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the statement "comprising a ..." does not exclude the presence of other identical elements in the process, method, article or device including the element.

[0092] The above description of the embodiments is to facilitate ordinary technicians in the technical field to understand and apply the technology of this case. People familiar with the technology in this field can obviously easily make various modifications to these examples and apply the general principles described here to other embodiments without creative work. Therefore, this case is not limited to the above embodiments. Modifications to the following situations should all be within the scope of protection of this case: ① A new technical solution implemented based on the technical solution of the present invention and combined with existing common knowledge, the technical effect produced by the new technical solution does not exceed the technical effect of the present invention; ② The equivalent replacement of some features of the technical solution of the present invention by using known technology, the technical effect produced is the same as the technical effect of the present invention; ③ The technical solution of the present invention can be expanded, and the substantive content of the expanded technical solution does not exceed the technical solution of the present invention; ④ The equivalent transformation made by using the contents of the description and drawings of the present invention is directly or indirectly applied to other related technical fields.

Claims

1. A quartz crystal resonator inspection and marking device, characterized in that: It includes a first turntable, a second turntable and an exchange station; The first turntable is provided with a plurality of suction nozzles evenly distributed in the circumference thereof, the first turntable can rotate around its axis and drive the plurality of suction nozzles to rotate synchronously, the suction nozzles are used to suck / release the quartz crystal resonator; along the circumference of the first turntable, there are sequentially arranged: a positioning mechanism 1 for positioning the quartz crystal resonator, a testing mechanism 1 for performing an electrical parameter test on the quartz crystal resonator, a testing mechanism 2 for performing an insulation performance test on the quartz crystal resonator, a positioning mechanism 3 for positioning the quartz crystal resonator, and a testing mechanism 2 for performing a bottom visual inspection on the quartz crystal resonator; The second turntable is evenly distributed along its circumference with a plurality of temporary tables for carrying quartz crystal resonators, and a suction port is provided in the middle of the temporary tables; the second turntable can rotate around its axis and drive the plurality of temporary tables to rotate synchronously; along the circumference of the second turntable are sequentially provided: a second positioning mechanism for positioning the quartz crystal resonator, a marking mechanism for marking the quartz crystal resonator, and a detection mechanism for performing a frontal visual inspection of the quartz crystal resonator; The exchange station is located directly opposite the first turntable and the second turntable, and between the test mechanism one and the test mechanism two, and between the positioning mechanism two and the detection mechanism one; at the exchange station, the suction nozzle releases one of the quartz crystal resonators to the temporary placement table, and picks up one of the quartz crystal resonators from the next temporary placement table.

2. The quartz crystal resonator inspection and marking device according to claim 1, characterized in that: A feeding station and a loading station are sequentially arranged between the positioning mechanism 1 and the detection mechanism 2 along the rotation direction of the first turntable. The suction nozzle rotated to the loading station absorbs the quartz crystal resonator output from the upstream process, and the suction nozzle rotated to the feeding station releases the qualified quartz crystal resonator to the downstream process.

3. The quartz crystal resonator inspection and marking device according to claim 2, characterized in that: A discarding mechanism 1 is also provided between the detection mechanism 1 of the second turntable and the exchange station, and a discarding mechanism 2 is also provided between the detection mechanism 2 of the first turntable and the feeding station; The quartz crystal resonator that fails the electrical parameter test and / or the front visual inspection is taken away and discarded by the first discarding mechanism, and the quartz crystal resonator that fails the insulation performance test and / or the bottom visual inspection is taken away and discarded by the second discarding mechanism.

4. The quartz crystal resonator inspection and marking device according to claim 3, characterized in that: Along the rotation direction of the second turntable, a material identification station 1 is provided between the exchange station and the second positioning mechanism, and / or a material identification station 2 is provided between the marking mechanism and the first detection mechanism, and / or a material identification station 3 is provided between the first discarding mechanism and the exchange station; and / or along the rotation direction of the first turntable, a material identification station 4 is provided between the second discarding mechanism and the feeding station; The inspection and marking equipment also includes an optical fiber detection mechanism, which is used to detect whether the quartz crystal resonator is on the material identification station one, the material identification station two, the material identification station three or the material identification station four.

5. The quartz crystal resonator inspection and marking device according to any one of claims 1 to 4, characterized in that: The marking mechanism includes a marking adjustment mounting seat with adjustable height and angle, a laser installed on the upper end of the marking adjustment mounting seat, and a laser head installed at one end of the laser. The laser is used to generate a laser beam and emit it to the quartz crystal resonator through the laser head.

6. The quartz crystal resonator inspection and marking device according to any one of claims 1 to 4, characterized in that: The testing mechanism 1 comprises: Probe test mechanism mounting seat; A test probe, used for contacting the electrode of the quartz crystal resonator and acquiring an electrical parameter signal; A test probe board, which is arranged on the probe test mechanism mounting seat, a plurality of the test probes are fixed and signal-connected on the test probe board, and the test probe board outputs an electrical parameter signal through a test probe board connecting wire; The second testing mechanism includes one of an insulation resistance tester, a leakage current tester, an LC comprehensive tester or an electrostatic capacitance scanning tester.

7. The quartz crystal resonator inspection and marking device according to any one of claims 1 to 4, characterized in that: The detection mechanism 1 includes a mounting and adjusting bracket, and a red light ring light source and a black and white camera mounted on the mounting and adjusting bracket, wherein the black and white camera is located directly above the red light ring light source; The red light ring light source emits light downwardly toward the quartz crystal resonator, and the black and white camera is used to capture an image of the quartz crystal resonator; The second detection mechanism includes a camera part and a light source irradiation part, the camera part includes a camera adjustment mount and a camera arranged on the camera adjustment mount, the camera adjustment mount is used to adjust the position and shooting angle of the camera; the light source irradiation part includes a light source mount, and a reflecting prism and annular light source arranged on the light source mount, the reflecting prism reflects the light irradiated by the annular light source to the bottom of the quartz crystal resonator to the camera at 45 degrees, and the center of the camera and the center of the reflecting prism are on the same horizontal line.

8. The quartz crystal resonator inspection and marking device according to any one of claims 1 to 4, characterized in that: The positioning mechanism 1 and / or the positioning mechanism 3 both include a positioning motor 1 and a positioning cam mechanism that are transmission-connected, and four positioning claws that are orthogonally arranged, wherein the positioning motor 1 drives the positioning cam mechanism to rotate, and the positioning cam mechanism drives the four positioning claws to open / close to perform position correction on the quartz crystal resonator; The second positioning mechanism includes a positioning mounting seat, a second positioning motor and a positioning slide mounted on the positioning mounting seat, and a positioning piece fixedly connected to one end of the positioning slide. The second positioning motor drives the positioning slide to reciprocate and drives the positioning piece to reciprocate.

9. The quartz crystal resonator inspection and marking device according to claim 3 or 4, characterized in that: The first and second material discarding mechanisms both include a second air nozzle and a collecting mechanism, the blowing force of the airflow ejected by the second air nozzle is greater than the suction force of the suction nozzle; the quartz crystal resonator that fails the electrical parameter test and / or the front visual inspection is blown into the collecting mechanism by the second air nozzle, and the quartz crystal resonator that fails the insulation performance test and / or the bottom visual inspection is blown into the collecting mechanism by the second air nozzle.

10. A quartz crystal resonator inspection and marking process, based on the quartz crystal resonator inspection and marking device according to any one of claims 2 to 9, characterized in that: The following steps are involved: The first turntable receives the quartz crystal resonator output from the upstream process and performs electrical parameter tests on it; At the exchange station, the first turntable transports the quartz crystal resonator that has completed the electrical parameter test to the second turntable; The second turntable performs marking and front visual inspection on the quartz crystal resonator received thereon, and the quartz crystal resonator that fails the electrical parameter test or the front visual inspection is discarded; The quartz crystal resonator that has passed the electrical parameter test and the front visual inspection is transported to the first turntable by the second turntable; At the exchange station, the first turntable receives the quartz crystal resonator released by the second turntable, and performs an insulation performance test and a bottom visual inspection on the quartz crystal resonator, and the quartz crystal resonator that fails the insulation performance test or the bottom visual inspection is discarded; The quartz crystal resonator that has passed the insulation performance test and the bottom visual inspection is transported to the downstream process by the first turntable; in, S110, after the suction nozzle located at the exchange station releases the quartz crystal resonator to the temporary table located at the exchange station, S120, the first turntable stops rotating, and the second turntable continues rotating until the next temporary table rotates to the exchange station, S130, after the suction nozzle located at the exchange station sucks the quartz crystal resonator from the temporary table, S140, the first turntable starts rotating again, and the next suction nozzle rotates to the exchange station; repeat the operations of S110-S140.

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