A demagnetizing device and method

Abstract

The present invention relates to the technical field of magnetic shielding, and discloses a degaussing device and method. The present invention includes: a magnetic shielding device, comprising: a multi-layer shielding layer and at least one target degaussing space; a residual magnetic field acquisition module, comprising: a first acquisition array and a second acquisition array; the first acquisition array includes a plurality of first sensors, and the plurality of first sensors are respectively distributed on the inner surface and the outer surface of the multi-layer shielding layer; the second acquisition array includes a plurality of second sensors, and the plurality of second sensors are respectively distributed in the target degaussing space; a data processing module, connected to the residual magnetic field acquisition module; a degaussing module, connected to the data processing module and the magnetic shielding device respectively. Taking the surface residual magnetic field of the magnetic shielding layer as the determination basis for the degaussing degree, it is possible to more accurately judge whether the degaussing degree of the target degaussing space reaches the expectation. Thus, the degaussing parameters can be adjusted according to the degaussing degree of the target degaussing space, and the degaussing effect of the magnetic shielding device can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of magnetic shielding, and particularly to a degaussing device and method. Background Art

[0002] In order to ensure the shielding effectiveness of a magnetic shielding device or system, it is usually necessary to remove the residual magnetism of the magnetic shielding device itself. Currently, the commonly used degaussing devices mainly include two main components, namely a power supply and a degaussing coil, and their surrounding accessories. And it is usually an open-loop degaussing system, which mainly calculates the degaussing parameters of the degaussing coil according to the absolute residual magnetism inside the magnetic shielding device, and degausses the magnetic shielding device according to the calculated degaussing parameters. However, due to the cumbersome measurement and calculation process of the absolute residual magnetism inside the magnetic shielding device, and the measurement of the absolute residual magnetism is limited by accuracy, and there are also multiple interference factors in its correlation with the degaussing effect, which cannot directly reflect the degaussing degree or effect on the magnetic shielding device, resulting in poor degaussing effect when degaussing according to such a method. Summary of the Invention

[0003] In view of this, the present invention provides a degaussing device and method to solve the problem of the current degaussing effect on the magnetic shielding device.

[0004] In a first aspect, the present invention provides a degaussing device, which includes:

[0005] A magnetic shielding device, including: multiple shielding layers and at least one target degaussing space; the multiple shielding layers are nested in sequence, and the target degaussing space is located between two adjacent shielding layers;

[0006] A residual magnetism acquisition module, including: a first acquisition array and a second acquisition array; the first acquisition array includes multiple first sensors, and the multiple first sensors are respectively distributed on the inner surface and the outer surface of the multiple shielding layers; the second acquisition array includes multiple second sensors, and the multiple second sensors are respectively distributed in the target degaussing space;

[0007] A data processing module, connected to the residual magnetism acquisition module; the data processing module is used to process the residual magnetism data acquired by the first acquisition array and the second acquisition array to determine the degaussing parameters;

[0008] A degaussing module, connected to the data processing module and the magnetic shielding device respectively; the degaussing module is used to degauss the target degaussing space based on the degaussing parameters determined by the data processing module.

[0009] The degaussing device provided by the embodiment of the present invention collects the surface residual magnetism of multiple layers of shielding layers through multiple first sensors in the first acquisition array, collects the spatial residual magnetism of the target degaussing space through multiple second sensors in the second acquisition array, and determines the degaussing parameters of the degaussing module according to the surface residual magnetism of the shielding layer and the spatial residual magnetism of the target degaussing space. Therefore, taking the surface residual magnetism of the magnetic shielding layer as the judgment basis for the degaussing degree, it can more accurately judge whether the degaussing degree of the target degaussing space reaches the expectation. Thus, the degaussing parameters can be adjusted according to the degaussing degree of the target degaussing space, and the degaussing effect of the magnetic shielding device can be improved.

[0010] In an optional implementation manner, the degaussing module includes at least one degaussing unit, and the number of degaussing units is less than or equal to the number of shielding layers;

[0011] Each degaussing unit includes a degaussing power supply and at least one degaussing coil;

[0012] In each degaussing unit, one end of the degaussing coil is wound in the corresponding shielding layer, and the other end is connected to the degaussing power supply.

[0013] The degaussing device provided by the embodiment of the present invention sets degaussing units, and winds the degaussing coils around the corresponding shielding layers, so as to control the degaussing parameters of each layer of shielding layer by controlling the parameters of the degaussing coils of the degaussing power supply, and ensure the degaussing effect of each layer of shielding layer.

[0014] In an optional implementation manner, on the inner surface and / or outer surface of each layer of shielding layer, the first sensors are distributed according to a first preset array;

[0015] In each target degaussing space, the second sensors are distributed according to a second preset array.

[0016] The degaussing device provided by the embodiment of the present invention sets the first sensors to be distributed according to the first preset array on the inner surface and / or outer surface of each layer of shielding layer, so as to ensure the accuracy and reliability of the surface residual magnetism of the shielding layer collected by the first sensors; in each target degaussing space, the second sensors are set to be distributed according to the second preset array, so as to ensure the accuracy and reliability of the spatial residual magnetism of the target degaussing space collected by the second sensors.

[0017] In an optional implementation manner, the device further includes a parameter monitoring module, which is respectively connected to the degaussing module and the data processing module, and the parameter monitoring module is used to measure the degaussing parameters used by the degaussing module.

[0018] The degaussing device provided by the embodiment of the present invention is provided with a parameter monitoring module to measure and monitor the degaussing parameters used by the degaussing module, so as to control the degaussing parameters of the degaussing module near the degaussing parameters calculated by the data processing module, thereby ensuring the degaussing effect on the magnetic shielding device.

[0019] In a second aspect, the present invention provides a degaussing method, which is applied to the degaussing device in the first aspect or any one of the embodiments. The method includes:

[0020] Obtain the design parameters of the magnetic shielding device, and based on the design parameters, determine the minimum surface remanence of each shielding layer;

[0021] Based on the target space remanence and the design parameters, determine the first degaussing parameter of the degaussing module, and degauss the magnetic shielding device based on the first degaussing parameter;

[0022] Obtain the remanence data collected by the first acquisition array and the second acquisition array to determine the first surface remanence of each shielding layer and the first space remanence of each target degaussing space;

[0023] If the first space remanence is greater than the target space remanence, and there is a first surface remanence of a shielding layer greater than the corresponding minimum surface remanence, then based on the first surface remanence and the minimum surface remanence, determine the second degaussing parameter of the degaussing module, and degauss the magnetic shielding device based on the second degaussing parameter.

[0024] The degaussing method provided by the embodiment of the present invention uses the surface remanence of the shielding layer as the basis for judging the degaussing degree, so as to more accurately judge whether the degaussing degree of the target degaussing space reaches the expectation, and based on this, adjust the degaussing parameters of the degaussing module to improve the degaussing effect on the magnetic shielding device.

[0025] In an optional embodiment, the method further includes:

[0026] If the first space remanence reaches the target space remanence, or the first surface remanence of all shielding layers reaches the corresponding minimum surface remanence, then determine the first degaussing parameter as the target degaussing parameter.

[0027] The degaussing method provided by the embodiment of the present invention determines the calculated degaussing parameter as the target degaussing parameter and completes degaussing when the first space remanence reaches the target remanence, that is, the space remanence of the target degaussing space reaches the expectation, or when the first surface remanence reaches the target surface remanence, that is, the surface remanence of all shielding layers cannot be degaussed anymore. Thus, it is determined whether the degaussing degree reaches the expectation based on the surface remanence of the shielding layer and the space remanence of the degaussing space, and the degaussing effect on the magnetic shielding device is improved.

[0028] In an optional embodiment, determining the minimum surface remanence of each shielding layer based on the design parameters includes:

[0029] Perform simulation calculations based on design parameters, and / or extract the surface residual magnetism in the design parameters to obtain the theoretical minimum surface residual magnetism of each shielding layer;

[0030] Test the magnetic shielding device to obtain the actual minimum surface residual magnetism of each shielding layer;

[0031] Verify the actual minimum surface residual magnetism based on the theoretical minimum surface residual magnetism to obtain the minimum surface residual magnetism.

[0032] The degaussing method provided by the embodiment of the present invention verifies the actual minimum surface residual magnetism obtained by actual measurement based on the theoretical minimum surface residual magnetism to obtain the minimum surface residual magnetism, thereby ensuring the accuracy and reliability of the minimum surface residual magnetism used as the basis for judging the degaussing degree during the degaussing process, and thus ensuring the degaussing effect on the magnetic shielding device.

[0033] In an alternative embodiment, obtaining the residual magnetism data collected by the first acquisition array and the second acquisition array to determine the first surface residual magnetism of each shielding layer and the first spatial residual magnetism of each target degaussing space includes:

[0034] Perform data analysis on the residual magnetism data corresponding to each shielding layer respectively to obtain the first surface residual magnetism of each shielding layer;

[0035] Perform data analysis on the residual magnetism data corresponding to each target degaussing space respectively to obtain the first spatial residual magnetism corresponding to each target degaussing space.

[0036] The degaussing method provided by the embodiment of the present invention respectively determines the first surface residual magnetism of each shielding layer and the first spatial residual magnetism of each target degaussing space through data analysis, ensuring that the first surface residual magnetism can fully reflect the residual magnetism situation of the corresponding shielding layer, and ensuring that the first spatial residual magnetism can fully reflect the residual magnetism situation of the corresponding target degaussing space.

[0037] In an alternative embodiment, determining the first degaussing parameter of the degaussing module based on the target spatial residual magnetism and design parameters includes:

[0038] Based on the design parameters, determine the equivalent model corresponding to the magnetic shielding device; the equivalent model is a magnetic shielding model including a single-layer shielding layer;

[0039] Based on the equivalent model and the target spatial residual magnetism, determine the degaussing parameter of the single-layer shielding layer;

[0040] Based on the degaussing parameter of the single-layer shielding layer, determine the first degaussing parameter.

[0041] In an alternative embodiment, determining the second degaussing parameter of the degaussing module based on the first surface residual magnetism and the minimum surface residual magnetism includes:

[0042] If the residual magnetism on the first surface of the shielding layer reaches the corresponding minimum surface residual magnetism, the first demagnetization parameter of the demagnetization unit corresponding to the shielding layer is determined as the second demagnetization parameter of the demagnetization unit.

[0043] If the residual magnetism on the first surface of the shielding layer is greater than the corresponding minimum surface residual magnetism, the second demagnetization parameter of the demagnetization unit is determined based on the first demagnetization parameter of the demagnetization unit corresponding to the shielding layer and a preset demagnetization parameter.

[0044] The demagnetization method provided by the embodiments of the present invention keeps the demagnetization parameter unchanged when the residual magnetism on the first surface of the shielding layer reaches the corresponding minimum surface residual magnetism, and adjusts it on the basis of the first demagnetization parameter when the residual magnetism on the first surface of the shielding layer is greater than the corresponding minimum surface residual magnetism. Thus, the demagnetization is continuously adjusted and iterated in this way, so that the surface residual magnetism of all shielding layers reaches the minimum surface residual magnetism, thereby improving the demagnetization effect of the magnetic shielding device. Description of the Drawings

[0045] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for use in the description of the specific embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0046] Figure 1 It is a schematic structural diagram of a demagnetization device according to an embodiment of the present invention;

[0047] Figure 2 It is a schematic structural diagram of a demagnetization module in a demagnetization device according to an embodiment of the present invention;

[0048] Figure 3 It is a schematic distribution diagram of the first sensors in a demagnetization device according to an embodiment of the present invention;

[0049] Figure 4 It is another schematic distribution diagram of the first sensors in a demagnetization device according to an embodiment of the present invention;

[0050] Figure 5 It is a flowchart of a demagnetization method according to an embodiment of the present invention;

[0051] Reference Signs:

[0052] 1 - Magnetic shielding device; 11 - Shielding layer; 12 - Target demagnetization space; 2 - Residual magnetism acquisition module; 21 - First acquisition array; 22 - Second acquisition array; 3 - Data processing module; 4 - Demagnetization module. Detailed Embodiments

[0053] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0054] In the description of the present application, it should be understood that the orientation or positional relationships indicated by the terms "center", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. are based on the orientation or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present application.

[0055] The terms "first" and "second" are only used for descriptive purposes, and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present application, unless otherwise specified, the meaning of "plurality" is two or more.

[0056] In the description of the present application, it should be noted that, unless otherwise clearly specified and limited, the terms "mounted", "connected", and "coupled" should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or an integral connection; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.

[0057] To ensure the shielding effectiveness of a magnetic shielding device or system, it is usually necessary to remove the residual magnetism of the magnetic shielding device itself. Currently, the commonly used degaussing devices mainly include two main components, namely a power supply and a degaussing coil, and their surrounding accessories, and are usually open-loop degaussing systems. They mainly calculate the degaussing parameters of the degaussing coil based on the absolute residual magnetism inside the magnetic shielding device, and degauss the magnetic shielding device according to the calculated degaussing parameters. However, due to the cumbersome measurement and calculation process of the absolute residual magnetism inside the magnetic shielding device, and the measurement of the absolute residual magnetism being limited by accuracy, and there are also multiple interference factors in its correlation with the degaussing effect, which cannot directly reflect the degaussing degree or effect on the magnetic shielding device, resulting in poor degaussing effect when degaussing according to such a method.

[0058] Based on this, the present invention provides a degaussing device, including: a magnetic shielding device, including: a multi-layer shielding layer and at least one target degaussing space; the multi-layer shielding layers are nested in sequence, and the target degaussing space is located between adjacent two shielding layers; a residual magnetic field acquisition module, including: a first acquisition array and a second acquisition array; the first acquisition array includes a plurality of first sensors, and the plurality of first sensors are respectively distributed on the inner surface and the outer surface of the multi-layer shielding layer; the second acquisition array includes a plurality of second sensors, and the plurality of second sensors are respectively distributed in the target degaussing space; a data processing module, connected to the residual magnetic field acquisition module; the data processing module is configured to process the residual magnetic field data acquired by the first acquisition array and the second acquisition array to determine degaussing parameters; a degaussing module, connected to the data processing module and the magnetic shielding device respectively; the degaussing module is configured to degauss the target degaussing space based on the degaussing parameters determined by the data processing module. By respectively acquiring the surface residual magnetic field of the multi-layer shielding layer through the plurality of first sensors in the first acquisition array, and acquiring the spatial residual magnetic field of the target degaussing space through the plurality of second sensors in the second acquisition array, and determining the degaussing parameters of the degaussing module according to the surface residual magnetic field of the shielding layer and the spatial residual magnetic field of the target degaussing space, thereby using the surface residual magnetic field of the magnetic shielding layer as the judgment basis for the degaussing degree, it can more accurately judge whether the degaussing degree of the target degaussing space reaches the expectation, and thus the degaussing parameters can be adjusted according to the degaussing degree of the target degaussing space, improving the degaussing effect of the magnetic shielding device.

[0059] According to an embodiment of the present invention, there is provided a degaussing device Figure 1 is a schematic structural diagram of a degaussing device according to an embodiment of the present invention, as Figure 1 shown, the device includes: a magnetic shielding device 1, a residual magnetic field acquisition module 2, a data processing module 3, and a degaussing module 4.

[0060] Among them, the magnetic shielding device 1 includes: a multi-layer shielding layer 11 and at least one target degaussing space 12. The multi-layer shielding layers 11 are nested in sequence, so that the magnetic shielding device 1 forms a multi-layer magnetic shielding structure. The target degaussing space 12 is located between adjacent two shielding layers 11; if there is only one target degaussing space 12, then the target degaussing space 12 is the space surrounded by the innermost shielding layer 11 of the magnetic shielding device 1; if there are multiple target degaussing spaces 12, then the number of target degaussing spaces 12 is the same as the number of shielding layers 11. Except that the innermost target degaussing space 12 is completely surrounded by one shielding layer 11, the other target degaussing spaces 12 are located between adjacent two shielding layers 11.

[0061] The residual magnetism acquisition module 2 includes: a first acquisition array 21 and a second acquisition array 22. Among them, the first acquisition array 21 is used to acquire the surface residual magnetism of the shielding layer 11, and the second acquisition array 22 is used to acquire the spatial residual magnetism of the target degaussing space 12. The first acquisition array 21 includes a plurality of first sensors, and the plurality of first sensors are respectively distributed on the inner surface and the outer surface of the multi-layer shielding layer 11 to acquire the residual magnetism data of the inner surface and the outer surface of the shielding layer 11. The second acquisition array 22 includes a plurality of second sensors, and the plurality of second sensors are respectively distributed in the target degaussing space 12 to acquire the residual magnetism data in the target degaussing space 12. Optionally, the first sensor and the second sensor can adopt the same magnetic induction sensor.

[0062] The data processing module 3 is connected to the residual magnetism acquisition module 2. The data processing module 3 serves as the control center for data processing and calculation, and is used to process the residual magnetism data acquired by the first acquisition array 21 and the second acquisition array 22 to determine the degaussing parameters.

[0063] The degaussing module 4 is respectively connected to the data processing module 3 and the magnetic shielding device 1. The degaussing module 4 is used to degauss the target degaussing space 12 based on the degaussing parameters determined by the data processing module 3.

[0064] In an alternative embodiment, Figure 2 is a schematic structural diagram of the degaussing module in a degaussing device according to an embodiment of the present invention. As Figure 2 shown, the degaussing module 4 includes at least one degaussing unit, and the number of degaussing units is less than or equal to the number of shielding layers 11; taking Figure 2 as an example, the number of degaussing units is the same as the number of shielding layers 11. Among them, each degaussing unit includes a degaussing power supply and at least one degaussing coil; in each degaussing unit, one end of the degaussing coil is wound in the corresponding shielding layer 11, and the other end is connected to the degaussing power supply; thus, by setting the degaussing unit, the degaussing coil is wound around the corresponding shielding layer, and by controlling the parameters of the degaussing power supply for the degaussing coil, the degaussing parameters of each layer of the shielding layer 11 are respectively controlled to ensure the degaussing effect of each layer of the shielding layer 11.

[0065] In an alternative embodiment, as Figure 2 shown, each degaussing coil is independent of each other, and it is only controlled by the degaussing power supply connected to it, that is, the degaussing of each layer of the shielding layer 11 is independent of each other. At this time, the number of degaussing units is the same as the number of shielding layers 11, and each degaussing unit includes a degaussing power supply and a degaussing coil.

[0066] In an alternative embodiment, the degaussing coils can also be connected in series or in parallel. In this case, a degaussing unit contains multiple degaussing coils. The degaussing coils connected in series or in parallel are located in the same degaussing unit and are controlled by the degaussing power supply of the same degaussing unit. Compared with the scheme where the degaussing coils are independently connected, the degaussing parameter setting of this scheme is more single and the operation is simpler, but the corresponding degaussing effect is relatively poor. In series connection, the current magnitude on each degaussing coil is equal. At the same time, a higher demand for the power supply voltage is required. In parallel connection, the voltage magnitude on each degaussing coil is equal. At the same time, a higher demand for the power supply current is required.

[0067] In an alternative embodiment, the degaussing coils can be connected, and switches can be arranged between the connection points of the degaussing coils. By controlling the on / off of the switches, series connection, parallel connection, and independent connection of the degaussing coils can be achieved. Among them, the specific method for the switch control to achieve various connection methods can be adjusted according to actual requirements and will not be specifically limited herein.

[0068] In an alternative embodiment, Figure 3 is a schematic diagram of the distribution of the first sensors in a degaussing device according to an embodiment of the present invention. As Figure 3 shown, the first sensors are distributed in an array to form a first acquisition array 21.

[0069] Specifically, on the inner surface and / or outer surface of each layer of the shielding layer 11, the first sensors are distributed according to a first preset array to ensure the accuracy and reliability of the surface residual magnetism of the shielding layer 11 collected by the first sensors. In each target degaussing space 12, the second sensors are distributed according to a second preset array to ensure the accuracy and reliability of the space residual magnetism of the target degaussing space 12 collected by the second sensors.

[0070] In an alternative embodiment, the first sensors on the inner surfaces of different shielding layers 11 are arranged at the same positions corresponding to the shielding layer 11, and the first sensors on the outer surfaces of different shielding layers 11 are arranged at the same positions corresponding to the shielding layer 11. The first sensors on the inner surface and the outer surface of the same shielding layer 11 can be arranged at the same positions corresponding to the shielding layer 11 or at different positions corresponding to the shielding layer 11, which is not specifically limited herein. Figure 3 The distribution schematic diagram shown in

[0071] In an alternative embodiment, considering that the overall surface area of the shielding layer 11 closer to the outside of the magnetic shielding device 1 is larger than the overall surface area of the shielding layer 11 closer to the inside of the magnetic shielding device 1, a larger number of first sensors can be provided on the shielding layer 11 closer to the outside of the magnetic shielding device 1, and a smaller number of first sensors can be provided on the shielding layer 11 closer to the inside of the magnetic shielding device 1. Optionally, the number of the first sensors can be determined according to the induction and detection range of the first sensors, that is, on the surface of the shielding layer 11, the first sensors are arranged at a distance interval corresponding to the detection range of the first sensors, so as to ensure that the residual magnetism on the surface of shielding layers 11 of different sizes can be accurately collected.

[0072] In an alternative embodiment, Figure 4 is another distribution schematic diagram of the first sensors in a degaussing device according to an embodiment of the present invention. As shown in Figure 3 and Figure 4 shown, first sensors can be provided at fixed positions in each layer of the shielding layer 11, that is, the positions shown in Figure 3 and Figure 4 Among them, between these first sensors, according to the distance between these first sensors, actually according to the surface area of the shielding layer 11, first sensors are filled, thereby realizing that a larger number of first sensors are arranged on the shielding layer 11 with a larger surface area. Among them, optionally, as shown in Figure 3 and Figure 4 shown, the fixed positions in the shielding layer 11 can be the four corner positions, corresponding to the rectangular shielding layer shown in Figure 4 That is, the four corner positions of the rectangle, corresponding to the circular shielding layer shown in Figure 3 That is, the four corner positions of the inscribed square of the circle.

[0073] In an alternative embodiment, in order to ensure the measurement accuracy and accuracy of the surface residual magnetism, the measurement position of the first sensor can be set in a preset area range on the surface of the shielding layer, and the residual magnetic field in the vertical direction of the surface of the shielding layer 11 is measured. Among them, the preset area can be a position between 2 cm and 20 cm on the surface of the shielding layer; as a more preferred range, the preset area can be a position between 5 cm and 10 cm on the surface of the shielding layer.

[0074] In an alternative embodiment, within different target degaussing spaces 12, the second sensors are arranged at the same positions. At the same time, considering that the target degaussing space 12 located at the innermost side of the magnetic shielding device 1 has a different three-dimensional structure from other target degaussing spaces 12, that is, other target degaussing spaces 12 are annular, and the innermost target degaussing space 12 is polyhedral or spherical, so the innermost target degaussing space 12 can adopt a sensor array different from that of other target degaussing spaces 12, and second sensors are also arranged inside it to ensure the accuracy of the detection of the spatial residual magnetism of the innermost target degaussing space 12. Correspondingly, for other annular target degaussing spaces 12, the overall volume of the target degaussing space 12 closer to the outer side of the magnetic shielding device 1 is larger than that of the target degaussing space 12 closer to the inner side of the magnetic shielding device 1. Therefore, a larger number of second sensors can be arranged in the target degaussing space 12 closer to the outer side of the magnetic shielding device 1, and a smaller number of second sensors can be arranged in the target degaussing space 12 closer to the inner side of the magnetic shielding device 1. Optionally, the number of second sensors can be determined according to the induction and detection range of the second sensors, that is, inside the target degaussing space 12, the second sensors are arranged at a distance interval corresponding to the detection range of the second sensors, so as to ensure that the spatial residual magnetism of different-sized target degaussing spaces can be accurately collected.

[0075] In an alternative embodiment, the degaussing device further includes a parameter monitoring module, which is respectively connected to the degaussing module 4 and the data processing module 3. The parameter monitoring module is used to measure the degaussing parameters used by the degaussing module 4, and then feedback the measured degaussing parameters to the data processing module 3, so that the data processing module 3 can compare the actual degaussing parameters used by the degaussing module 4 with the calculated degaussing parameters, and adjust the degaussing parameters output by the degaussing module 4 according to the comparison result, so as to control the degaussing parameters used by the degaussing module 4 near the calculated degaussing parameters by the data processing module 3, so as to ensure that the degaussing module 4 degausses the magnetic shielding device 1 according to the degaussing parameters required by the magnetic shielding device 1 and ensure the degaussing effect on the magnetic shielding device 1.

[0076] The degaussing device provided by the embodiment of the present invention collects the surface residual magnetism of the multi-layer shielding layer 11 through multiple first sensors in the first acquisition array 21, collects the spatial residual magnetism of the target degaussing space 12 through multiple second sensors in the second acquisition array 22, and determines the degaussing parameters of the degaussing module 4 according to the surface residual magnetism of the shielding layer 11 and the spatial residual magnetism of the target degaussing space 12. Thus, taking the surface residual magnetism of the magnetic shielding layer 11 as the judgment basis for the degaussing degree, it can more accurately judge whether the degaussing degree of the target degaussing space 12 reaches the expectation. Therefore, the degaussing parameters can be adjusted according to the degaussing degree of the target degaussing space 12, and the degaussing effect on the magnetic shielding device 1 can be improved.

[0077] According to an embodiment of the present invention, an embodiment of a degaussing method is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions. And although the logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in a different order than here.

[0078] In this embodiment, a degaussing method is provided, which can be used for the above-mentioned degaussing device. Figure 5 It is a flowchart of a degaussing method according to an embodiment of the present invention, as Figure 5 shown, this process includes the following steps:

[0079] Step S501, obtain the design parameters of the magnetic shielding device, and based on the design parameters, determine the minimum surface remanence of each layer of the shielding layer.

[0080] In the embodiment of the present invention, the design parameters of the magnetic shielding device 1 include the number and specific structure of the shielding layer 11, the number and specific structure of the target degaussing space 12, and parameters such as material parameters. Through calculation and testing based on the design parameters of the magnetic shielding device 1, the minimum surface remanence of each layer of the shielding layer 11 is determined. The minimum surface remanence is the minimum value that the surface remanence of the shielding layer 11 can reach after the degaussing operation.

[0081] In an alternative embodiment, there are mainly the following methods for calculating the minimum surface remanence:

[0082] The first method, based on the design parameters of the magnetic shielding device, perform simulation calculations, and the calculated minimum surface remanence is the minimum surface remanence under ideal conditions;

[0083] The second method, based on the initial value given in the factory data report of the magnetic shielding device. Since the relevant data of the magnetic shielding device will change to a certain extent after installation, this initial value is the minimum surface remanence relative to the ideal situation and cannot fully reflect the actual surface remanence;

[0084] The third method, set a magnetic field environment to conduct an extreme test on the magnetic shielding device, for example, set the magnetic field environment according to the set maximum parameters for testing to obtain the minimum surface remanence.

[0085] In the embodiments of the present invention, the minimum surface residual magnetism is obtained by combining the above three methods, and the actually measured minimum surface residual magnetism is verified based on the theoretical minimum surface residual magnetism to obtain the minimum surface residual magnetism, so as to ensure the accuracy and reliability of the minimum surface residual magnetism used as the basis for judging the demagnetization degree during the demagnetization process, thereby ensuring the demagnetization effect of the magnetic shielding device 1. Specifically, simulation calculations are performed based on the design parameters, and / or the surface residual magnetism in the design parameters is extracted to obtain the theoretical minimum surface residual magnetism of each shielding layer 11; that is, the theoretical minimum surface residual magnetism is obtained based on the first method and / or the second method. The magnetic shielding device 1 is tested to obtain the actually measured minimum surface residual magnetism of each shielding layer 11; that is, the actually measured minimum surface residual magnetism is obtained based on the third method. The actually measured minimum surface residual magnetism is verified based on the theoretical minimum surface residual magnetism to obtain the minimum surface residual magnetism; wherein, if the difference between the actually measured minimum surface residual magnetism and the theoretical minimum surface residual magnetism is within the acceptable threshold, the actually measured minimum surface residual magnetism can be used as the minimum surface residual magnetism. If the difference between the actually measured minimum surface residual magnetism and the theoretical minimum surface residual magnetism exceeds the acceptable threshold, the parameters used in the test are changed and the test is repeated until the difference between the actually measured minimum surface residual magnetism and the theoretical minimum surface residual magnetism is within the acceptable threshold, and the actually measured minimum surface residual magnetism is used as the minimum surface residual magnetism.

[0086] Step S502: Based on the target space residual magnetism and the design parameters, determine the first demagnetization parameter of the demagnetization module, and demagnetize the magnetic shielding device based on the first demagnetization parameter.

[0087] In the embodiments of the present invention, the target space residual magnetism is set based on the space residual magnetism required by the user, the parameters related to the structure of the magnetic shielding device are determined based on the design parameters, and calculations are performed based on the target space residual magnetism and the parameters related to the structure of the magnetic shielding device to determine the first demagnetization parameter of the demagnetization module 4, that is, the first demagnetization parameter of each demagnetization unit, and demagnetize the magnetic shielding device 1 based on the first demagnetization parameter. Specifically, according to the determined first demagnetization parameter of each demagnetization unit, the output power of the demagnetization power supply in the demagnetization unit is set, and demagnetization is performed through the demagnetization coil.

[0088] In an optional embodiment, the first demagnetization parameter can be determined by calculation based on the equivalent model of a single-layer shielding layer. Specifically, based on the design parameters, the equivalent model corresponding to the magnetic shielding device 1 is determined; wherein, the equivalent model is a magnetic shielding model including a single-layer shielding layer. Based on the equivalent model and the target space residual magnetism, the demagnetization parameter of the single-layer shielding layer is determined; wherein, any formula or method can be used to calculate the demagnetization parameter of the single-layer shielding layer, and no specific limitation is made here. Based on the demagnetization parameter of the single-layer shielding layer, the first demagnetization parameter is determined; wherein, the equivalent corresponding to the actually included shielding layer of the magnetic shielding device 1 is performed on the single-layer shielding layer to obtain the first demagnetization parameter of each shielding layer 11.

[0089] Step S503: Obtain the remanence data collected by the first acquisition array and the second acquisition array to determine the first surface remanence of each layer of shielding layer and the first space remanence of each target degaussing space.

[0090] In the embodiment of the present invention, the remanence data of the first acquisition array 21 and the second acquisition array 22 are obtained, and data statistics and analysis are performed based on the collected remanence data to respectively determine the first surface remanence of each layer of shielding layer 11 and the first space remanence of each target degaussing space 12.

[0091] Specifically, in order to ensure that the first surface remanence can fully reflect the remanence situation of the corresponding shielding layer 11 and the first space remanence can fully reflect the remanence situation of the corresponding target degaussing space 12, data analysis is respectively performed on the remanence data corresponding to each layer of shielding layer 11 to obtain the first surface remanence of each layer of shielding layer 11; data analysis is respectively performed on the remanence data corresponding to each target degaussing space 12 to obtain the first space remanence corresponding to each target degaussing space 12. Among them, the corresponding magnetic field distribution situation can be determined according to the position of each remanence data in the shielding layer 11 or the target degaussing space 12, so as to determine the surface remanence or space remanence based on the magnetic field distribution situation.

[0092] In an optional embodiment, in order to more accurately reflect the surface remanence distribution of the shielding layer 11, the shielding layer 11 can be subdivided into multiple regions, and the magnetic field distribution situation of each region is respectively determined to determine the surface remanence of each region. Correspondingly, when determining the degaussing parameters and performing degaussing based on the degaussing parameters, the corresponding degaussing parameters are respectively determined based on the surface remanence of each region, and degaussing is respectively performed based on the corresponding degaussing parameters.

[0093] Step S504: If the first space remanence is greater than the target space remanence, and there is a first surface remanence of the shielding layer greater than the corresponding minimum surface remanence, then based on the first surface remanence and the minimum surface remanence, determine the second degaussing parameter of the degaussing module, and perform degaussing on the magnetic shielding device based on the second degaussing parameter.

[0094] In the embodiment of the present invention, if the first space remanence is greater than the target space remanence, that is, the space remanence of the target degaussing space 12 does not meet the user's requirements, and there is a first surface remanence of the shielding layer 11 greater than the corresponding minimum surface remanence, that is, the surface remanence of each layer of shielding layer 11 does not reach the minimum, degaussing can be further performed at this time. Therefore, at this time, the first degaussing parameter can be adjusted based on the first surface remanence and the minimum surface remanence to obtain the second degaussing parameter, and the magnetic shielding device 1 is degaussed based on the second degaussing parameter.

[0095] In an alternative embodiment, since there are multiple shielding layers 11 in the magnetic shielding device 1, after the first demagnetization, the residual magnetism on the surface of some shielding layers 11 may have reached the minimum, while the residual magnetism on the surface of some shielding layers 11 can still be further eliminated. Therefore, different methods are adopted for different shielding layers 11 to determine the demagnetization parameters for subsequent demagnetization, that is, the second demagnetization parameters. When the residual magnetism on the first surface of the shielding layer 11 reaches the corresponding minimum surface residual magnetism, the demagnetization parameter remains unchanged. When the residual magnetism on the first surface of the shielding layer 11 is greater than the corresponding minimum surface residual magnetism, it is adjusted based on the first demagnetization parameter. In this way, the demagnetization is continuously adjusted and iterated, so that the surface residual magnetism of all shielding layers 11 reaches the minimum surface residual magnetism, thereby improving the demagnetization effect of the magnetic shielding device 1.

[0096] Specifically, if the residual magnetism on the first surface of the shielding layer 11 reaches the corresponding minimum surface residual magnetism, the first demagnetization parameter of the demagnetization unit corresponding to the shielding layer 11 is determined as the second demagnetization parameter of the demagnetization unit; if the residual magnetism on the first surface of the shielding layer 11 is greater than the corresponding minimum surface residual magnetism, the second demagnetization parameter of the demagnetization unit is determined based on the first demagnetization parameter of the demagnetization unit corresponding to the shielding layer 11 and the preset demagnetization parameter. In particular, if the residual magnetism on the first surface reached the minimum surface residual magnetism during the previous demagnetization, and the residual magnetism on the first surface is greater than the minimum surface residual magnetism during the current demagnetization, the demagnetization parameter for the current demagnetization will still be adjusted. For example, if there are three shielding layers 11, namely shielding layer a, shielding layer b, and shielding layer c, after the first demagnetization, the surface residual magnetism of shielding layer a reaches the minimum surface residual magnetism, while the surface residual magnetism of shielding layer b and shielding layer c has not reached the minimum surface residual magnetism. Then, the demagnetization parameter for the second demagnetization of shielding layer a is the currently used demagnetization parameter, while for shielding layer b and shielding layer c, the demagnetization parameters for the second demagnetization are obtained by adjusting based on the currently used demagnetization parameter; after the second demagnetization, if the surface residual magnetism of shielding layer a exceeds the minimum surface residual magnetism again, the demagnetization parameter for the third demagnetization is obtained by adjusting based on the currently used demagnetization parameter of shielding layer a.

[0097] In an alternative embodiment, after demagnetizing the magnetic shielding device 1, if the first space residual magnetism reaches the target space residual magnetism, that is, the space residual magnetism in the target demagnetization space 12 has reached the user's requirements, or the residual magnetism on the first surface of all shielding layers 11 reaches the corresponding minimum surface residual magnetism, that is, the surface residual magnetism of each shielding layer 11 has reached the minimum and the best demagnetization effect has been achieved, the first demagnetization parameter is determined as the target demagnetization parameter.

[0098] Through the above method, continuously adjust and iterate the degaussing parameters until the residual magnetism in the target degaussing space 12 reaches the target residual magnetism, or the surface residual magnetism of all shielding layers 11 reaches the corresponding minimum surface residual magnetism, and determine the used degaussing parameters as the target degaussing parameters. Subsequently, degauss the magnetic shielding device 1 according to the target degaussing parameters.

[0099] The degaussing method provided by the embodiment of the present invention uses the surface residual magnetism of the shielding layer as the basis for judging the degaussing degree, so as to more accurately judge whether the degaussing degree of the target degaussing space reaches the expectation, and based on this, adjust the degaussing parameters of the degaussing module to improve the degaussing effect of the magnetic shielding device. At the same time, when the first residual magnetism in space reaches the target residual magnetism, that is, the residual magnetism in the target degaussing space reaches the expectation, or when the first surface residual magnetism reaches the target surface residual magnetism, that is, the surface residual magnetism of all shielding layers can no longer be degaussed, determine the calculated degaussing parameters as the target degaussing parameters and complete the degaussing, so as to judge whether the degaussing degree reaches the expectation based on the surface residual magnetism of the shielding layer and the residual magnetism in the degaussing space, and improve the degaussing effect of the magnetic shielding device.

[0100] Although the embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations fall within the scope defined by the present invention.

Claims

1. A degaussing device, characterized in that: The device comprises: A magnetic shielding device (1) comprising: a plurality of shielding layers (11) and at least one target demagnetization space (12); the plurality of shielding layers (11) are nested in sequence, and the target demagnetization space (12) is located between two adjacent shielding layers (11); The residual magnetism acquisition module (2) comprises: a first acquisition array (21) and a second acquisition array (22); the first acquisition array (21) comprises a plurality of first sensors, the plurality of first sensors being respectively distributed on the inner surface and the outer surface of the plurality of shielding layers (11); the second acquisition array (22) comprises a plurality of second sensors, the plurality of second sensors being respectively distributed in the target demagnetization space (12); A data processing module (3) connected to the residual magnetism acquisition module (2); the data processing module (3) is used to process the residual magnetism data acquired by the first acquisition array (21) and the second acquisition array (22) after the magnetic shielding device (1) is demagnetized based on the first demagnetization parameter, determine the first surface residual magnetism of each shielding layer (11) and the first space residual magnetism of each target demagnetization space (12), and determine the second demagnetization parameter of the demagnetization module (4) based on the first surface residual magnetism and the minimum surface residual magnetism when the first space residual magnetism is greater than the target space residual magnetism and there is a case where the first surface residual magnetism of the shielding layer (11) is greater than the corresponding minimum surface residual magnetism; The demagnetization module (4) is connected to the data processing module (3) and the magnetic shielding device (1) respectively; the demagnetization module (4) is used to demagnetize the target demagnetization space (12) based on the demagnetization parameters determined by the data processing module (3).

2. The device according to claim 1, characterized in that The demagnetization module (4) comprises at least one demagnetization unit, and the number of the demagnetization units is less than or equal to the number of the shielding layers (11); Each of the degaussing units comprises a degaussing power supply and at least one degaussing coil; In each of the degaussing units, one end of the degaussing coil is wound in the corresponding shielding layer (11), and the other end is connected to the degaussing power supply.

3. The device according to claim 1, characterized in that On the inner surface and / or outer surface of each shielding layer (11), the first sensors are distributed according to a first preset array; In each of the target demagnetization spaces (12), the second sensors are distributed according to a second preset array.

4. The device according to claim 1, characterized in that The device further comprises a parameter monitoring module, the parameter monitoring module being connected to the demagnetization module (4) and the data processing module (3) respectively, and the parameter monitoring module being used to measure the demagnetization parameters used by the demagnetization module (4).

5. A demagnetization method, characterized in that: Applied to the demagnetization device according to any one of claims 1 to 4, the method comprises: Acquiring design parameters of the magnetic shielding device (1), and determining the minimum surface remanence of each shielding layer (11) based on the design parameters; Based on the target spatial remanence and the design parameter, determining a first demagnetization parameter of the demagnetization module (4), and demagnetizing the magnetic shielding device (1) based on the first demagnetization parameter; Acquiring residual magnetism data collected by the first acquisition array (21) and the second acquisition array (22) to determine the first surface residual magnetism of each shielding layer (11) and the first space residual magnetism of each target demagnetization space (12); If the first spatial remanence is greater than the target spatial remanence, and the first surface remanence of the shielding layer (11) is greater than the corresponding minimum surface remanence, a second demagnetization parameter of the demagnetization module (4) is determined based on the first surface remanence and the minimum surface remanence, and the magnetic shielding device (1) is demagnetized based on the second demagnetization parameter.

6. The method according to claim 5, characterized in that The method further comprises: If the first spatial remanence reaches the target spatial remanence, or the first surface remanence of all the shielding layers (11) reaches the corresponding minimum surface remanence, the first demagnetization parameter is determined as the target demagnetization parameter.

7. The method according to claim 5, characterized in that Determining the minimum surface remanence of each shielding layer (11) based on the design parameters comprises: Performing simulation calculations based on the design parameters, and / or extracting the surface remanence in the design parameters to obtain the theoretical minimum surface remanence of each shielding layer (11); Testing the magnetic shielding device (1) to obtain the actual minimum surface remanence of each shielding layer (11); The actual minimum surface remanence is verified based on the theoretical minimum surface remanence to obtain the minimum surface remanence.

8. The method according to claim 5, characterized in that The step of acquiring the residual magnetism data collected by the first acquisition array (21) and the second acquisition array (22) to determine the first surface residual magnetism of each shielding layer (11) and the first space residual magnetism of each target demagnetization space (12) comprises: Performing data analysis on the remanent magnetization data corresponding to each shielding layer (11) to obtain the first surface remanent magnetization of each shielding layer (11); Data analysis is performed on the residual magnetism data corresponding to each of the target demagnetization spaces (12) to obtain the first spatial residual magnetism corresponding to each of the target demagnetization spaces (12).

9. The method according to claim 5, characterized in that The step of determining the first demagnetization parameter of the demagnetization module (4) based on the target spatial remanence and the design parameter comprises: Based on the design parameters, an equivalent model corresponding to the magnetic shielding device (1) is determined; the equivalent model is a magnetic shielding model including a single shielding layer (11); Determining the demagnetization parameters of the single-layer shielding layer (11) based on the equivalent model and the target spatial remanence; Based on the demagnetization parameter of the single-layer shielding layer (11), the first demagnetization parameter is determined.

10. The method according to claim 5, characterized in that The determining of a second demagnetization parameter of the demagnetization module (4) based on the first surface remanence and the minimum surface remanence comprises: If the first surface remanence of the shielding layer (11) reaches the corresponding minimum surface remanence, determining the first demagnetization parameter of the demagnetization unit corresponding to the shielding layer (11) as the second demagnetization parameter of the demagnetization unit; If the first surface remanence of the shielding layer (11) is greater than the corresponding minimum surface remanence, a second demagnetization parameter of the demagnetization unit is determined based on a first demagnetization parameter of the demagnetization unit corresponding to the shielding layer (11) and a preset demagnetization parameter.

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