Six-Degree-of-Freedom Ground Simulation Test Device and Method for In-Orbit Release of Inspection Quality

Abstract

This application belongs to the field of precision measurement, and specifically discloses a six-degree-of-freedom ground simulation test device and method for in-orbit release of a test mass. The test device includes: a vacuum unit for simulating the space vacuum environment; a secondary pendulum unit disposed inside the vacuum unit for realizing the six-degree-of-freedom movement of the test mass. The secondary pendulum unit includes a primary pendulum body suspended inside the vacuum unit, and a test mass is suspended at a lateral end of the primary pendulum body at its own suspension connection point, and a trimming mass is connected to the other lateral end; a locking and releasing unit disposed inside the vacuum unit for locking and releasing the test mass; and a detection unit for detecting the displacement and deflection of the test mass. The test device of this application can perform a six-degree-of-freedom ground simulation test for in-orbit release of the test mass.

Description

Technical Field

[0001] This application belongs to the field of precision measurement. More specifically, it relates to a six-degree-of-freedom ground simulation test device and method for the in-orbit release of a test mass. Background Art

[0002] Space locking and release technology is one of the core technologies of the space gravitational wave detection program. It is necessary to ensure that the test mass is securely fixed in the motor cage during the satellite launch phase, and after the satellite is in orbit, the test mass is released into space with high positioning accuracy and extremely low residual velocity, and is captured by the electrostatic control system. During the in-orbit release phase, if the release of the test mass fails or the release speed is too high, the capacitance control system cannot control the test mass in the ideal suspension state. Therefore, it is necessary to conduct in-depth research on the locking and release technology on the ground to ensure the smooth progress of in-orbit tests.

[0003] In related technologies, most of the ground tests for locking and releasing adopt single pendulum or torsion pendulum devices to conduct single-degree-of-freedom tests on the motion state of the test mass after release. However, the actual in-orbit locking and release face complex working conditions, and the test mass may have multi-degree-of-freedom motion after release; while most of the existing ground test devices for locking and releasing can only simulate the motion behavior of a single degree of freedom, their simulation ability is insufficient, and the simulation test results usually cannot accurately reflect the actual situation, so improvement is urgently needed. Summary of the Invention

[0004] Aiming at the defects or improvement requirements of the existing technology, this application provides a six-degree-of-freedom ground simulation test device for the in-orbit release of a test mass, aiming to solve the problem of insufficient simulation ability of the existing ground test devices for locking and releasing.

[0005] A six-degree-of-freedom ground simulation test device for the in-orbit release of a test mass provided by this application specifically includes:

[0006] A vacuum unit for simulating the space vacuum environment;

[0007] A secondary pendulum unit arranged inside the vacuum unit for realizing the six-degree-of-freedom motion of the test mass. The secondary pendulum unit includes a primary pendulum body suspended inside the vacuum unit. A test mass is suspended at a lateral end of the primary pendulum body at its own suspension connection point, and a balancing mass is connected to the other lateral end.

[0008] A locking and releasing unit arranged inside the vacuum unit for locking and releasing the test mass;

[0009] A detection unit for detecting the displacement and deflection of the test mass.

[0010] Through the above technical solution conceived by this application, compared with the prior art, this solution adopts a two-stage pendulum unit suspension solution to overcome the gravitational influence of the test mass. In this solution, the test mass can be suspended as a two-stage pendulum body at one end of the first-stage pendulum body, and can perform translational motions in the three directions of the X-axis, Y-axis, and Z-axis, as well as rotations around the suspension wire (i.e., the Z-axis), X-axis, and Y-axis directions. On the basis of using the vacuum unit to simulate the space vacuum environment, it can truly simulate the six-degree-of-freedom motion of the test mass released in orbit; at the same time, the locking and releasing unit can lock the test mass in its equilibrium state of free motion, and cooperate with the detection unit to realize the motion monitoring of the test mass release, so as to realize the high-precision measurement of the test mass motion. Compared with the traditional single pendulum or torsion pendulum device, this solution can simulate multiple degrees of freedom of the test mass, the simulation is more in line with the real situation, and the test results can more accurately reflect the actual situation of the test mass released in orbit.

[0011] As a further preference, the test mass is a planar conductor formed by metal or metal coating.

[0012] As a further preference, the test mass has a hollow structure.

[0013] As a further preference, the part of the test mass in contact with the locking and releasing unit is a detachable part.

[0014] As a further preference, the two-stage pendulum unit further includes a pendulum bracket installed inside the hollow structure. The pendulum bracket is suspended and connected to the first-stage pendulum body through a suspension wire, and the connection node between the pendulum bracket and the suspension wire is located at the centroid / center of the overall structure formed by the hollow structure and the pendulum bracket.

[0015] As a further preference, the detection unit includes:

[0016] Capacitor plates, the capacitor plates are statically arranged in the vacuum unit, and two capacitor plates are distributed on each surface of the test mass. The capacitor plates are independent of the test mass and jointly form a capacitor;

[0017] A sensing circuit, the sensing circuit is connected to the capacitor plates, and is used to detect the capacitance signal generated when the test mass and the capacitor plates move relative to each other and obtain the six-degree-of-freedom displacement and deflection information of the test mass after release based on the capacitance signal.

[0018] As a further preference, the detection unit further includes a plate frame located in the vacuum unit, and each capacitor plate is connected to the plate frame;

[0019] The test mass is non-contactingly located inside the plate frame, and the test mass can move inside the plate frame.

[0020] As a further preference, the locking and releasing unit includes displacement tables disposed on both sides of the inspection mass, with ejector pins mounted on the displacement tables, and the displacement tables are used to drive the ejector pins to lock and release the inspection mass.

[0021] As a further preference, the device further includes a vibration isolation platform, and the vibration isolation platform is used to carry the vacuum unit.

[0022] A testing method provided in the second aspect of the present application adopts the following technical solution:

[0023] A testing method, based on any one of the six-degree-of-freedom ground simulation testing devices for on-orbit release of inspection mass described in the first aspect, includes the following steps:

[0024] Adjust the locking and releasing unit to lock the inspection mass to achieve the simulation of on-orbit locking of the inspection mass.

[0025] Adjust the locking and releasing unit to release the inspection mass, and the inspection mass suspended in the secondary pendulum unit generates six-degree-of-freedom movement and deflection, so as to achieve the simulation of six-degree-of-freedom on-orbit release of the inspection mass.

[0026] After releasing the inspection mass, the displacement and deflection of the inspection mass are detected by the detection unit to obtain the motion information of the inspection mass in six degrees of freedom.

[0027] Generally speaking, compared with the prior art through the above technical solutions conceived by the present application, the following technical advantages are mainly possessed:

[0028] 1. In this solution, the inspection mass is connected to the primary pendulum body by a suspension wire, enabling the inspection mass to perform six-degree-of-freedom displacement and deflection. On this basis, the space vacuum environment is simulated by the vacuum unit, the on-orbit locking and release of the inspection mass are simulated by the locking and releasing unit, and the differential signals generated between the inspection mass and the capacitor plates at the initial state and after release are detected by the detection unit to monitor the displacement and deflection of the inspection mass, so as to achieve the six-degree-of-freedom test of the inspection mass.

[0029] 2. The inspection mass in this solution has a hollow structure, and its centroid / center is at one end of the primary pendulum body by the suspension wire, which makes the inspection mass and the suspension wire form a secondary pendulum structure. On the basis of cooperating with the capacitor plates distributed around the inspection mass, the motion information of the inspection mass in six degrees of freedom can be accurately detected. Description of the Drawings

[0030] Figure 1 is the overall schematic diagram of the six-degree-of-freedom ground simulation testing device for on-orbit release of inspection mass provided by the embodiment of the present invention;

[0031] Figure 2 is the schematic diagram of the inspection mass provided by the embodiment of the present invention;

[0032] Figure 3 It is a schematic diagram of the secondary pendulum unit provided by an embodiment of the present invention;

[0033] Figure 4 It is a schematic diagram of an example of the distribution of capacitor plates provided by an embodiment of the present invention;

[0034] Figure 5 It is a schematic diagram of a capacitive displacement sensing circuit provided by an embodiment of the present invention.

[0035] In all the drawings, the same reference numerals are used to represent the same elements or structures, where:

[0036] 1. Vacuum unit; 2. Secondary pendulum unit; 2-1. Primary pendulum body; 2-2. Trim mass; 2-3. Pendulum support; 2-4. Suspension wire; 2-5. Vacuum guide; 2-6. Sleeve; 3. Test mass; 3-1. Detachable surface; 3-2. Fixed structure; 4. Locking and releasing unit; 4-1. Displacement stage; 4-2. Ejector pin; 4-3. Adapter plate; 5. Detection unit; 5-1. Capacitor plate; 5-2. Plate frame; 5-3. High-voltage amplifier; 5-4. Transformer circuit; 5-5. Front-end circuit; 5-6. AC amplifier circuit; 5-7. Demodulation circuit; 5-8. Low-pass filter circuit; 5-9. ADC converter; 6. Vibration isolation platform. Detailed implementation manners

[0037] In order to make the objectives, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0038] The following combines the attached Figures 1 - 5 to further describe the present application in detail.

[0039] An embodiment of the present application discloses a six-degree-of-freedom ground simulation test device for on-orbit release of a test mass. Referring to Figure 1 , the six-degree-of-freedom ground simulation test device for on-orbit release of a test mass includes a vacuum unit 1, a secondary pendulum unit 2, a locking and releasing unit 4, and a detection unit 5. Among them, the vacuum unit 1 is used to simulate the space vacuum environment; the secondary pendulum unit 2 is arranged inside the vacuum unit 1 and is used to realize the six-degree-of-freedom movement of the test mass 3. The secondary pendulum unit 2 includes a primary pendulum body 2-1 suspended inside the vacuum unit 1. The primary pendulum body 2-1 is suspended and connected with a test mass 3 at a lateral end of its own suspension connection point. The test mass 3 is the secondary pendulum body, and a trim mass 2-2 is connected to the other lateral end to adjust the dynamic characteristics and stability of the test mass 3; the locking and releasing unit 4 is arranged inside the vacuum unit 1 and is used for locking and releasing the test mass 3; and the detection unit 5 is used to detect the displacement and deflection of the test mass 3.

[0040] Further, the vacuum unit 1 is used to simulate the complex working conditions in space. In some embodiments, the vacuum unit 1 has a vacuum chamber with an internal vacuum, which is used to simulate the high vacuum and / or microgravity environment in space, and devices such as the test mass 3 and the locking and releasing unit 4 are arranged in the vacuum chamber.

[0041] In some embodiments, the test mass 3 is preferably a planar conductor formed by metal or metal coating.

[0042] In some embodiments, the test mass 3 is designed as a detachable hollow structure, and the part of the test mass 3 for contacting the locking and releasing unit 4 is preferably a detachable part.

[0043] In some embodiments, as Figure 2 shown, the test mass 3 includes a fixed structure 3-2 and detachable surfaces 3-1 on both sides; the detachable surface 3-1 is the area in contact with the locking and releasing unit, which is convenient for replacing the contact surfaces of different materials to realize the exploration and research of the locking and releasing of the test mass 3; the fixed structure 3-2 is the basic framework of the hollow test mass 3, which is used to realize the suspension installation of the test mass 3.

[0044] In some specific embodiments, the test mass 3 is a standard hollow cube with a size of 50mm×50mm×50mm (in other embodiments, the test mass 3 can also be changed to other feasible structural dimensions). The test mass 3 is composed of detachable surfaces 3-1 on both sides and a fixed structure 3-2, and the material is a gold-platinum alloy, and its surface has been processed by processes such as polishing, grinding, and coating.

[0045] In some embodiments, as Figure 1 and Figure 3 shown, the secondary pendulum unit 2 further includes a vacuum guide 2-5. The vacuum guide 2-5 extends from the outside into the inside of the vacuum unit 1 and is fixed at the top of the vacuum unit 1; the primary pendulum body 2-1 is connected to the vacuum guide 2-5 through a suspension wire 2-4 (i.e., the primary suspension wire). The primary pendulum body 2-1 includes, but is not limited to, a cross bar. When selected as a cross bar, the cross bar is placed horizontally, and the connection point of the cross bar and the suspension wire 2-4 is located at the center of the cross bar.

[0046] Further, in some embodiments, the secondary pendulum unit 2 further includes a pendulum support 2-3. The pendulum support 2-3 is diagonally connected inside the test mass 3; the pendulum support 2-3 is suspended and connected to the primary pendulum body 2-1 through another suspension wire 2-4 (i.e., the secondary suspension wire), and the connection node of the pendulum support 2-3 and the suspension wire 2-4 is located at the centroid / center of the test mass 3 and the pendulum support 2-3. The pendulum support 2-3 includes, but is not limited to, being formed by cross-connecting the centers of two connecting rods, and a sleeve 2-6 for installing the suspension wire 2-4 is preferably provided at the center of the pendulum support 2-3.

[0047] Generally speaking, the suspension connection point of the test mass 3 is preferably the centroid of the whole formed by the test mass 3 and the pendulum support 2-3. When actually manufacturing this device, the center point of the whole formed by the test mass 3 and the pendulum support 2-3 can also be used as the connection node of the suspension wire 2-4, but it should be ensured that the center point is as close as possible to the centroid of the whole formed by the test mass 3 and the pendulum support 2-3.

[0048] Furthermore, the detection unit 5 includes capacitor plates 5-1 and a sensing circuit. Among them, the capacitor plates 5-1 are statically arranged in the vacuum unit 1, and the capacitor plates 5-1 are independent of the test mass 3. Two capacitor plates 5-1 are distributed on each surface of the test mass 3, and the capacitor plates 5-1 and the test mass 3 form a capacitor (i.e., differential capacitor and differential capacitance). The sensing circuit is connected to the capacitor plates 5-1. The sensing circuit is used to detect the capacitance signal generated when the test mass 3 and the capacitor plates 5-1 move relative to each other, and is used to obtain the six-degree-of-freedom displacement and deflection information of the test mass 3 after release based on the capacitance signal.

[0049] Furthermore, to ensure the stability of the capacitor plates 5-1, the detection unit 5 further includes a plate frame 5-2. The plate frame 5-2 remains stationary in the vacuum unit 1 (such as the plate frame 5-2 is placed or connected to the bottom wall of the vacuum chamber of the vacuum unit 1), and each capacitor plate 5-1 is connected to each surface of the plate frame 5-2.

[0050] In addition, the test mass 3 suspended by the suspension wire 2-4 is inside the plate frame 5-2. The test mass 3 is in non-contact with the plate frame 5-2, and the test mass 3 can move inside the plate frame 5-2. Generally speaking, to ensure that the test mass 3 does not touch the substrate frame or the suspension wire 2-4 when moving inside the plate frame 5-2, perforations should be reserved in the test mass 3 and the plate frame 5-2 for the suspension wire 2-4 to penetrate in an interference fit manner.

[0051] Preferably, the plate frame 5-2 is in the shape of a standard cube, and its structural dimensions are related to the receiving dimensions of the test mass 3. Preferably, when the test mass 3 is in a stationary and unlocked state, the test mass 3 can basically remain at the center of the plate frame 5-2.

[0052] For ease of understanding, Figure 4 shows a schematic diagram of the distribution example of the capacitor plates 5-1 from a certain perspective. As Figure 4 shown, after unlocking the test mass 3, the test mass 3 may rotate and displace due to the influence of the complex working condition environment it is in. Since the test mass 3 and the capacitor plates 5-1 form a capacitor, the test mass 3 and the capacitor plates 5-1 will generate a capacitance signal due to relative movement, and then the signal is collected and detected by the sensing circuit.

[0053] Furthermore, asFigure 5 As shown, the sensing circuit includes a high-voltage amplifier 5-3, a transformer circuit 5-4, a front-end circuit 5-5, an AC amplifier circuit 5-6, a demodulation circuit 5-7, a low-pass filter circuit 5-8, and an ADC converter 5-9. Among them, the high-voltage amplifier 5-3 is used to load a high-frequency modulated carrier voltage on the test mass 3 V p , and the transformer circuit 5-4 is used to modulate the capacitance difference signal onto the high-frequency modulated carrier current signal when the hollow test mass 3 moves to generate a capacitance difference signal with the capacitor plate 5-1; the front-end circuit 5-5 (usually including an operational amplifier OP) is used to amplify and convert the current signal modulated by the transformer circuit 5-4 into a voltage signal V a ; the AC amplifier circuit 5-6 is used to perform frequency-selective filtering on the voltage signal V a to obtain a frequency-selective voltage signal V b ; the demodulation circuit 5-7 is used to multiply the frequency-selective voltage signal V b by the modulation signal of the demodulation circuit 5-7 to obtain a modulated voltage signal V c ; the low-pass filter circuit 5-8 is used to filter out the high-frequency signal in the voltage signal V c to obtain a filtered voltage signal V d ; the ADC converter 5-9 is used to perform analog-to-digital conversion on the filtered voltage signal V d to obtain the displacement and deflection information after the test mass 3 is released.

[0054] Further, as Figure 1 shown, for locking and releasing the test mass 3, the locking and releasing mechanism includes displacement tables 4-1 respectively arranged on a set of opposite sides of the test mass 3. A thimble 4-2 is installed on the displacement table 4-1. The displacement table 4-1 is used to drive the thimble 4-2 to move closer to and away from the test mass 3 to perform locking and releasing of the test mass 3, so as to realize the in-orbit locking and releasing simulation of the test mass 3. Preferably, the thimble 4-2 is fixed on the displacement table 4-1 through an adapter plate 4-3. The displacement table 4-1 is preferably a six-degree-of-freedom displacement table 4-1.

[0055] Even further, the device further includes a vibration isolation platform 6. The vibration isolation platform 6 is used to carry the vacuum unit 1 (that is, the vibration isolation platform 6 is placed below the vacuum unit 1, and the vibration isolation platform 6 is usually installed on the ground) to reduce / suppress the influence of external vibration on the vacuum isolation unit 1. The vibration isolation principle of the vibration isolation platform 6 is prior art and will not be elaborated here.

[0056] Further, the six-degree-of-freedom detection described in this solution includes the translation of the test mass 3 in the three directions of X, Y, and Z, the rotation about the secondary suspension wire 2-4, and the rotation about the X and Y axes (similar to a "see-saw"). The origin of this coordinate system is preferably the connection point between the test mass 3 and the secondary suspension wire 2-4.

[0057] It can be understood that after the ejector pin 4-2 releases the test mass 3, the displacement and deflection of the test mass 3 are the influence results under complex factors and working conditions such as the pre-tightening force applied by the ejector pin 4-2 on the test mass 3 and the environment where the test mass 3 is located (such as high vacuum, thermal interference).

[0058] The embodiment of the present application also discloses a test method based on any of the above six-degree-of-freedom ground simulation test devices for on-orbit release of the test mass. This test method includes the following steps:

[0059] S1. Adjust the lock-release unit 4 to lock the test mass 3 to achieve the simulation of on-orbit locking of the test mass 3.

[0060] Specifically, the simulation of on-orbit locking of the test mass 3 includes the following steps:

[0061] S11. Initially adjust the displacement stage 4-1 to align the ejector pins 4-2 on both sides of the test mass 3.

[0062] S12. Adjust the displacement stage 4-1 again to make the ejector pins 4-2 on both sides of the test mass 3 approach the test mass 3 simultaneously until the ejector pins 4-2 on both sides are in contact with the test mass 3 simultaneously, so that the test mass 3 is located at the center of the plate frame 5-2 and remains in a balanced state.

[0063] S13. Apply a preloading force at this contact position through the lock-release unit 4 (for example, apply a driving force towards the test mass 3 to the ejector pin 4-2 through the displacement stage 4-1), thereby locking the test mass 3 to achieve the simulation of on-orbit locking of the test mass 3.

[0064] S2. Adjust the lock-release unit 4 to release the test mass 3, and the test mass 3 suspended in the secondary pendulum unit 2 undergoes six-degree-of-freedom movement and deflection to achieve the simulation of six-degree-of-freedom on-orbit release of the test mass 3;

[0065] Specifically, this step should be carried out after a period of time (this time can be preset or controlled and adjusted based on the actual situation) for the simulation of on-orbit locking of the test mass 3. The ejector pins 4-2 on both sides of the test mass 3 are driven by the displacement stage 4-1 to release the test mass 3 simultaneously, achieving the simulation of six-degree-of-freedom on-orbit release of the test mass 3.

[0066] In this step, the inspection mass 3 may undergo displacement and deflection under the influence of complex factors such as the pre-tightening force applied by the ejector pin 4-2 on the inspection mass 3, the environment where the inspection mass 3 is located (such as high vacuum, thermal interference), and different working conditions.

[0067] S3. Use the detection unit 5 to detect the displacement and deflection of the inspection mass 3 to obtain the motion information of the inspection mass 3 in six degrees of freedom.

[0068] Specifically, in this step, the detection unit 5 will collect the initial equilibrium state when the inspection mass 3 is at the center of the electrode plate frame 5-2 and the differential capacitance signal and differential signal generated between the inspection mass 3 and the capacitance electrode plate 5-1 after the inspection mass 3 is released. Using the relationship between the output voltage of the sensing circuit and the input capacitance difference signal, monitor the displacement and deflection information of the inspection mass 3 to obtain the motion information of the hollow-structured inspection mass 3 in six degrees of freedom.

[0069] Among them, taking Figure 4 as an example, the basic operating principle of the detection unit 5 is as follows:

[0070] The inspection mass 3 generates a differential capacitance signal with the capacitance electrode plates 5-1 on both sides of the opposite surface C 1. C 2. C 3. C 4. When the inspection mass 3 makes a relative movement with the electrode plate frame 5-2, the capacitance distance will change accordingly, and the differential capacitance signal will change accordingly. According to the relationship between the capacitance between the inspection mass 3 and the capacitance electrode plate 5-1 and the displacement x and angle changes, the two opposite capacitances are differentially amplified to obtain the combination C 13 and C 24 . Under the second-order approximation, the difference C 13 , C 24 is linearly combined with x and . For the displacement measurement of the translational degree of freedom, the combination of C 13 + C 24 is adopted. For the measurement of the rotational degree of freedom, the combination of C 13 - C 24 is adopted.

[0071] Specifically, in some specific embodiments, the detection process of the detection unit 5 is as follows:

[0072] After the locking and releasing unit 4 releases the inspection mass 3, a capacitance difference signal is generated due to the movement of the inspection mass 3 C , and a high-frequency modulated carrier voltage is applied to the inspection mass 3 through the high-voltage amplifier 5-3 V p , the capacitance difference signal is modulated onto a high-frequency modulated carrier current signal through the transformer circuit 5-4, and the current signal is amplified and converted into a voltage signal by the front-end circuit 5-5 V a , a frequency-selective voltage signal is obtained through the frequency-selective filtering of the AC amplifier circuit 5-6 V b , which is multiplied by the modulation signal of the demodulation circuit 5-7 to obtain V c , and finally the high-frequency signal is filtered out through the low-pass filter circuit 5-8 to obtain V d , and the signal is subjected to analog-to-digital conversion using the ADC converter 5-9 V d to obtain the displacement and deflection information of the hollow-structured inspection mass 3.

[0073] It should be understood that expressions such as "including" and "may include" used in this application indicate the existence of the disclosed functions, operations, or constituent elements, and do not limit one or more additional functions, operations, and constituent elements. In this application, terms such as "including" and / or "having" can be interpreted as indicating a specific characteristic, number, operation, constituent element, component, or a combination thereof, but cannot be interpreted as excluding the existence or possibility of addition of one or more other characteristics, numbers, operations, constituent elements, components, or a combination thereof.

[0074] It should be understood that the orientation or positional relationship indicated by terms such as "center", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing this application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation to this application.

[0075] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of this application, "a plurality of" means two or more, unless otherwise specifically defined.

[0076] In this application, unless otherwise clearly specified and defined, terms such as "installed", "connected", "linked", "fixed", etc. shall be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or an integral connection; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the communication inside two components. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0077] It is easy for those skilled in the art to understand that the above are only preferred embodiments of this application and are not intended to limit this application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of this application shall be included within the protection scope of this application.

Claims

1. A six-degree-of-freedom ground simulation test device for in-orbit release of inspection quality, characterized in that, Comprising: A vacuum unit (1) for simulating a space vacuum environment; A secondary pendulum unit (2) disposed inside the vacuum unit (1) for realizing six-degree-of-freedom motion of the test mass (3). The secondary pendulum unit (2) includes a primary pendulum body (2-1) suspended inside the vacuum unit (1). At a lateral end of the self-suspension connection point of the primary pendulum body (2-1), a test mass (3) is suspended, and at the other lateral end, a trimming mass (2-2) is connected; A locking and releasing unit (4) disposed inside the vacuum unit (1) for locking and releasing the test mass (3); A detection unit (5) for detecting the displacement and deflection of the test mass (3); The test mass (3) has a hollow structure; The secondary pendulum unit (2) further includes a pendulum support (2-3) installed inside the hollow structure. The pendulum support (2-3) is suspended and connected to the primary pendulum body (2-1) by a suspension wire (2-4), and the connection node of the pendulum support (2-3) and the suspension wire (2-4) is located at the centroid / center of the overall structure formed by the hollow structure and the pendulum support (2-3).

2. The six-degree-of-freedom ground simulation test device according to claim 1, wherein The test mass (3) is a planar conductor formed of metal or metal coating.

3. The six-degree-of-freedom ground simulation test device according to claim 2, wherein The part of the test mass (3) for contacting the locking and releasing unit (4) is a detachable part.

4. The six-degree-of-freedom ground simulation test device according to claim 1, characterized in that, The detection unit (5) includes: Capacitor plates (5-1). The capacitor plates (5-1) are statically disposed inside the vacuum unit (1), and two capacitor plates (5-1) are distributed on each surface of the test mass (3). The capacitor plates (5-1) are independent of the test mass (3) and together form a capacitor; A sensing circuit connected to the capacitor plates (5-1) for detecting the capacitance signal generated when the test mass (3) and the capacitor plates (5-1) move relative to each other, and for obtaining six-degree-of-freedom displacement and deflection information of the test mass (3) after release based on the capacitance signal.

5. The six-degree-of-freedom ground simulation test device according to claim 4, wherein, The detection unit (5) further includes a plate frame (5-2) inside the vacuum unit (1), and each capacitor plate (5-1) is connected to the plate frame (5-2); The test mass (3) is non-contactingly located inside the plate frame (5-2), and the test mass (3) can move inside the plate frame (5-2).

6. The six-degree-of-freedom ground simulation test device according to any one of claims 1-5, characterized in that, The locking and releasing unit (4) includes displacement tables (4-1) provided on both sides of the test mass (3). A thimble (4-2) is installed on the displacement tables (4-1), and the displacement tables (4-1) are used to drive the thimble (4-2) to lock and release the test mass (3).

7. The six-degree-of-freedom ground simulation test device according to any one of claims 1-5, characterized in that The device further includes a vibration isolation platform (6) for carrying the vacuum unit (1).

8. A testing method, based on a six-degree-of-freedom ground simulation testing device for in-orbit release of inspection quality as described in any one of claims 1-7, characterized in that, Including the following steps: Adjust the locking and releasing unit (4) to lock the test mass (3) to realize the simulation of on-orbit locking of the test mass (3); Adjust the locking and releasing unit (4) to release the test mass (3), and the test mass (3) suspended in the secondary pendulum unit (2) generates six-degree-of-freedom movement and deflection to realize the simulation of six-degree-of-freedom on-orbit release of the test mass (3); After releasing the test mass (3), the displacement and deflection of the test mass (3) are detected by the detection unit (5) to obtain the motion information of the test mass (3) in six degrees of freedom.

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