Visible light splitting spectrometer for separating absorption and scattering information of nano material

By designing a visible spectrometer, the advantages of optical design and CMOS cameras are used to separate the absorption and scattering spectrum of nanomaterials, solving the problems of signal interference and misjudgment in the prior art, and improving detection efficiency and accuracy.

CN119985404APending Publication Date: 2025-05-13XIAMEN UNIV
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Patent Information

Application Number
CN202510206615.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-02-25
Publication Date
2025-05-13

AI Technical Summary

Technical Problem

The prior art is difficult to directly distinguish the absorption and scattering spectrum of metal nanomaterials, resulting in signal interference and misjudgment, limiting the performance optimization and application expansion of materials.

Method used

A visible light spectrometer is designed, and the extinction spectrum, absorption spectrum and scattered spectrum are achieved through the combination of light source, beam splitter, slit, spectrometer collimator, grating and CMOS camera, and the simultaneous detection of reference light, scattered light and transmitted light signals of nanomaterials are separated.

Benefits of technology

It realizes effective separation of the absorption and scattering spectrum of nanomaterials, improves detection efficiency and accuracy, and can quickly obtain the full spectrum in the range of 350-1000nm, which is suitable for performance analysis and application research of nanomaterials.

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Abstract

The invention provides a visible light splitting spectrometer for separating absorption and scattering information of a nano material. The visible light splitting spectrometer comprises a light source, a light source focus lens, a first beam splitter, a sample cell, a second beam splitter, an attenuation sheet, a slit front focus lens, a slit, a spectrometer collimating lens, a grating, a spectrometer focus lens and a CMOS camera, the light source outputs divergent light; reflected light of the first beam splitter is used as reference light; transmission light of the first beam splitter excites the sample to scatter light; reflected light of the second beam splitter is used as transmission light; the reference light, the scattered light and the transmission light are focused at different positions of the slit, and the optical grating performs light splitting and is focused at different positions of the CMOS camera; the CMOS camera sets regional imaging, reads three beams of light signals at the same time, and calculates to obtain an extinction spectrum, an absorption spectrum and a scattering spectrum; by utilizing the advantages of optical design and the area array CMOS camera, the simultaneous detection of reference light, scattered light and transmission light signals of a sample is realized, an extinction spectrum, an absorption spectrum and a scattered spectrum are obtained, the detection time is short, and the detection efficiency is high.
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Description

Technical Field

[0001] The invention relates to the technical field of optical analysis instruments, and in particular to a visible light spectrometer for separating absorption and scattering information of nanometer materials. Background Art

[0002] With the rapid development of nanotechnology, metal nanomaterials have attracted much attention due to their unique physical properties. Metal nanomaterials have the characteristics of high chemical reactivity, strong optical absorption and scattering properties, and special localized surface plasmon resonance (LSPR) effect. These characteristics make metal nanomaterials show great application potential in many fields, such as biomedical imaging, optoelectronic devices, sensor development and catalytic reactions.

[0003] In the field of optics, the absorption and scattering properties of metal nanomaterials are at the core of their applications. The absorption property determines the nanomaterial's ability to capture light energy, while the scattering property affects the propagation path and distribution of light in the medium. However, the absorption and scattering processes are often intertwined and difficult to distinguish directly. This mixed effect may lead to signal interference or misjudgment in practical applications, thus limiting the performance optimization and application expansion of metal nanomaterials.

[0004] Due to the mixed effects of absorption and scattering and the complexity of the LSPR effect, separating the absorption and scattering of nanomaterials has become a key issue that needs to be solved urgently. Therefore, developing a method that can effectively separate the absorption and scattering of metal nanomaterials has important scientific value and practical application significance. Summary of the invention

[0005] The present invention aims to solve the problem that absorption and scattering spectra are difficult to distinguish directly, and provides a visible light spectrometer for separating absorption and scattering information of nanomaterials, so as to separate absorption and scattering spectra of nanomaterials.

[0006] In order to solve the above technical problems, the present invention provides a visible light spectrometer for separating absorption and scattering information of nanomaterials, including a light source, a light source focusing mirror, a first beam splitter, a sample pool, a second beam splitter, an attenuation plate, a slit front focusing mirror, a slit, a spectrometer collimator, a grating, a spectrometer focusing mirror and a CMOS camera;

[0007] The light source outputs divergent light after passing through the optical fiber, and then is focused on the center of the sample pool through the light source focusing mirror; the first beam splitter is located in front of the sample pool, and the second beam splitter is located behind the sample pool;

[0008] The divergent light passes through the first beam splitter, and the reflected light of the first beam splitter is used as reference light. The reference light enters the pre-slit focusing mirror after passing through the attenuation plate;

[0009] The first transmitted light of the first beam splitter is focused on the sample pool, the first transmitted light excites the sample in the sample pool to emit scattered light along a 90° direction, and the scattered light enters the pre-slit focusing mirror;

[0010] The light passing through the sample in the sample pool will pass through the second beam splitter, and the reflected light of the second beam splitter will enter the pre-slit focusing mirror after passing through the attenuation plate as the second transmitted light;

[0011] The reference light, scattered light and second transmitted light are converged into a beam through the focusing mirror before the slit, and then focused at different positions of the slit; the reference light, scattered light and second transmitted light simultaneously enter the collimator of the spectrometer and become three beams of parallel light, and then enter the grating for splitting, and after splitting, enter the focusing mirror of the spectrometer and are focused on different positions of the CMOS camera;

[0012] The CMOS camera is a planar array camera, which is used to convert the received three light beams into electrical signals respectively; the CMOS camera is set to image in different regions, and simultaneously reads the three light beams to obtain the extinction spectrum, absorption spectrum, and scattering spectrum after calculation;

[0013] The CMOS camera is connected to a terminal device and software, and the terminal device displays the extinction spectrum, the absorption spectrum, and the scattering spectrum in real time.

[0014] In a preferred embodiment, the light source is a high-power fiber optic light source with a wavelength range of 350nm-2100nm.

[0015] In a preferred embodiment, the width of the slit is set to 70 μm-80 μm; the length of the slit is 6.4 mm, and the distance at which the reference light, the scattered light and the second transmitted light are focused on the slit is 1 mm-2 mm.

[0016] In a preferred embodiment, the grating is a transmission grating.

[0017] In a preferred embodiment, the first beam splitter and the second beam splitter split the incident light into reflected light and transmitted light according to a 1:9 beam splitter, wherein the power of the reflected light accounts for 10% of the total power and the power of the transmitted light accounts for 90% of the total power.

[0018] In a preferred embodiment, the first beam splitter is rotated 45° around a direction perpendicular to the optical axis, and then rotated 1° to 2° around the direction of the optical axis, so that the reflected light of the first beam splitter passes through the attenuation plate as a reference light and enters the pre-slit focusing mirror, and at the same time, the first transmitted light of the first beam splitter is focused on the sample pool.

[0019] In a preferred embodiment, the second beam splitter is rotated 45° around a direction perpendicular to the optical axis, and then rotated 1° to 2° in the opposite direction around the optical axis, so that the reflected light of the second beam splitter passes through the attenuation plate as the second transmitted light and enters the pre-slit focusing mirror.

[0020] In a preferred embodiment, two attenuation plates are provided, wherein one of the attenuation plates is provided directly in front of the first beam splitter, and the other of the attenuation plates is provided directly in front of the second beam splitter.

[0021] In a preferred embodiment, the attenuation plate is a reflective neutral density filter with OD=3.

[0022] Compared with the prior art, the technical solution of the present invention has the following beneficial effects:

[0023] 1. The present invention forms a visible light spectrometer by arranging a light source, a light source focusing mirror, a first beam splitter, a sample pool, a second beam splitter, a slit front focusing mirror, a slit, a spectrometer collimator, a transmission grating, a spectrometer focusing mirror, and a CMOS camera. The spectrum range of the visible light spectrometer can be detected in the range of 350-1000nm, the spectrum range is adjustable, the resolution can reach 1nm, and it can be measured without adding other parts. It is convenient to test with self-written software. In particular, the present invention utilizes the skills of optical design and the advantages of the area array CMOS camera to realize the simultaneous detection of the reference light, scattered light and transmitted light signals of the sample, and then simultaneously obtains the extinction spectrum, absorption spectrum and scattering spectrum, with short detection time and high detection efficiency.

[0024] 2. The existing visible light spectrometer can only measure the extinction spectrum, and the extinction spectrum includes the absorption spectrum and the scattering spectrum. For nanomaterials with strong scattering, if the extinction spectrum is used to characterize its absorption spectrum, it will cause significant deviation. The present invention uses an area array camera to realize the simultaneous collection of reference light, scattered light, and transmitted light, and then measures the extinction spectrum, absorption spectrum, and scattering spectrum.

[0025] 3. The present invention sets up regional imaging, reads three light beams at the same time, and obtains extinction spectrum, absorption spectrum, and scattering spectrum after calculation. The full spectrum within the band of 350-1000nm is obtained in one measurement. The acquisition time can be as low as 1s, and the acquisition speed is fast. The real-time spectrum of dynamic processes such as nanomaterial agglomeration can be collected. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 Schematic diagram of reference light, scattered light and second transmitted light split perpendicular to the slit in a preferred embodiment of the present invention;

[0027] Figure 2 Schematic diagram of the reference light, scattered light and second transmitted light focused on different positions of the slit in a preferred embodiment of the present invention;

[0028] Figure 3 A schematic diagram of an image of a reference light path, a scattered light path and a second transmitted light path captured by a camera in a preferred embodiment of the present invention;

[0029] Figure 4 This is the spectrum obtained after data processing in the preferred embodiment of the present invention.

[0030] Explanation of the accompanying drawings: 1. light source; 2. light source focusing mirror; 3. first beam splitter; 4. sample cell; 5. second beam splitter; 6. focusing mirror before the slit; 7. slit; 8. spectrometer collimator; 9. grating; 10. spectrometer focusing mirror; 11. CMOS camera; 12. reference light; 13. scattered light; 14. second transmitted light. DETAILED DESCRIPTION

[0031] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention; it is obvious that the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments, and all other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making creative work are within the scope of protection of the present invention.

[0032] In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "top / bottom" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific position, be constructed and operated in a specific position, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance.

[0033] In the description of the present invention, it should be noted that, unless otherwise clearly stipulated and limited, the terms "installed", "provided with", "mounted / connected", "connected", etc. should be understood in a broad sense. For example, "connection" can be a wall-mounted connection, a detachable connection, or an integral connection. It can be a mechanical connection or an electrical connection. It can be a direct connection or an indirect connection through an intermediate medium. It can be the internal connection of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0034] refer to Figure 1-Figure 4The present embodiment provides a visible light spectrometer for separating absorption and scattering information of nanomaterials, including a light source 1, a light source focusing mirror 2, a first beam splitter 3, a sample pool 4, a second beam splitter 5, an attenuation plate, a slit pre-focusing mirror 6, a slit 7, a spectrometer collimator 8, a grating 9, a spectrometer focusing mirror 10 and a CMOS camera 11.

[0035] like Figure 1 , the light source 1 outputs divergent light after passing through the optical fiber, and then passes through the light source focusing mirror 2 to focus on the center of the sample pool 4; the first beam splitter 3 is located in front of the sample pool 4, and the second beam splitter 5 is located behind the sample pool 4; the divergent light passes through the first beam splitter 3, and the reflected light of the first beam splitter 3 is used as the reference light 12, and the reference light 12 passes through the attenuation plate and enters the pre-slit focusing mirror 6; the first transmitted light of the first beam splitter 3 is focused on the sample pool 4, and the first transmitted light excites the sample in the sample pool 4 to emit scattered light 13 along a 90° direction, and the scattered light 13 enters the pre-slit focusing mirror 6; the light that passes through the sample in the sample pool 4 will pass through the second beam splitter 5, and the reflected light of the second beam splitter 5 passes through the attenuation plate and enters the pre-slit focusing mirror 6 as the second transmitted light 14; the reference light 12, the scattered light 13 and the second transmitted light 14 are combined into a beam through the pre-slit focusing mirror 6, and then focused at different positions of the slit 7 (such as Figure 2 ); the reference light 12, scattered light 13 and second transmitted light 14 simultaneously enter the spectrometer collimator 8 and become three parallel light beams, and then enter the grating 9 for spectrometry, and then enter the spectrometer focusing mirror 10 to be focused on different positions of the CMOS camera 11; the CMOS camera 11 is a planar array camera, which is used to convert the received three light beams into electrical signals respectively; the CMOS camera 11 is set to image in different regions, and reads the three light beams at the same time to obtain the extinction spectrum, absorption spectrum and scattering spectrum after calculation; the CMOS camera 11 is connected to the terminal device and software, and the CMOS camera 11 sends the electrical signal to the terminal device to display the extinction spectrum, absorption spectrum and scattering spectrum in real time.

[0036] like Figure 3-4 This embodiment provides a visible light spectrometer for separating the absorption and scattering information of nanomaterials. Reference light, scattered light in the 90° direction, and transmitted light can be obtained in one measurement. Then, through data processing and based on the Lambert-Beer law, the extinction spectrum, absorption spectrum, and scattering spectrum can be obtained at one time. In addition, the visible light spectrometer provided in this embodiment can also be used to characterize the dynamic change spectrum of nanomaterials because of its high time resolution. This example can measure scattered light signals and can also be used to measure the turbidity information of samples.

[0037] In this embodiment, the light source is a high-power fiber light source, and the wavelength range of the light source is 350nm-2100nm. The light source outputs divergent light after passing through the optical fiber, and then passes through the light source focusing mirror and the first beam splitter, which divides the divergent light into reflected light and transmitted light. The reflected light of the first beam splitter is used as a reference light signal and passes through the attenuation plate before entering the focusing mirror in front of the slit. The transmitted light of the first beam splitter is focused on the sample pool.

[0038] The transmitted light of the first beam splitter is focused on the sample pool, which will excite the sample to emit scattered light. The scattered light in the 90° direction enters the focusing mirror before the slit as the scattered light signal. The light passing through the sample in the sample pool will pass through the second beam splitter. The reflected light of the second beam splitter will enter the focusing mirror before the slit as the transmitted light signal after passing through the attenuation plate.

[0039] The first beam splitter and the second beam splitter split the incident light into reflected light and transmitted light according to a 1:9 beam splitter, wherein the power of the reflected light accounts for 10% of the total power and the power of the transmitted light accounts for 90% of the total power.

[0040] Preferably, the first beam splitter is rotated 45° around a direction perpendicular to the optical axis, and then rotated 1° to 2° around the direction of the optical axis, so that the reflected light of the first beam splitter passes through the attenuation plate as a reference light and enters the pre-slit focusing mirror, and at the same time, the first transmitted light of the first beam splitter is focused on the sample pool.

[0041] Preferably, the second beam splitter is rotated 45° around a direction perpendicular to the optical axis, and then rotated 1° to 2° in the opposite direction around the optical axis, so that the reflected light of the second beam splitter passes through the attenuation plate as the second transmitted light and enters the pre-slit focusing mirror.

[0042] In this embodiment, the width of the slit is set to 70 μm-80 μm; the length of the slit is 6.4 mm, and the distance at which the reference light, the scattered light and the second transmitted light are focused on the slit is 1 mm-2 mm.

[0043] In this embodiment, the grating is a transmission grating, which can scatter light of different wavelengths to different directions.

[0044] In this embodiment, the attenuation plate adopts a reflective neutral density filter with OD=3. Two attenuation plates are provided, one of which is provided in front of the first beam splitter, and the other is provided in front of the second beam splitter. The purpose is to attenuate the signals of the reference light and the transmitted light, so that the intensities of the reference light, scattered light, and transmitted light signals are in the same order of magnitude, and thus can be simultaneously collected by the CMOS camera.

[0045] The above is only a preferred specific implementation of the present invention, but the design concept of the present invention is not limited to this. Any technician familiar with the technical field who uses this concept to make non-substantial changes to the present invention within the technical scope disclosed by the present invention shall be deemed to infringe the protection scope of the present invention.

Claims

1. A visible light spectrometer for separating absorption and scattering information of nanomaterials, characterized in that: It includes a light source, a light source focusing mirror, a first beam splitter, a sample pool, a second beam splitter, an attenuation plate, a slit front focusing mirror, a slit, a spectrometer collimator, a grating, a spectrometer focusing mirror and a CMOS camera; The light source outputs divergent light after passing through the optical fiber, and then is focused on the center of the sample pool through the light source focusing mirror; the first beam splitter is located in front of the sample pool, and the second beam splitter is located behind the sample pool; The divergent light passes through the first beam splitter, and the reflected light of the first beam splitter is used as reference light. The reference light enters the pre-slit focusing mirror after passing through the attenuation plate; The first transmitted light of the first beam splitter is focused on the sample pool, the first transmitted light excites the sample in the sample pool to emit scattered light along a 90° direction, and the scattered light enters the pre-slit focusing mirror; The light passing through the sample in the sample pool will pass through the second beam splitter, and the reflected light of the second beam splitter will enter the pre-slit focusing mirror after passing through the attenuation plate as the second transmitted light; The reference light, scattered light and second transmitted light are converged into a beam through the focusing mirror before the slit, and then focused at different positions of the slit; the reference light, scattered light and second transmitted light simultaneously enter the collimator of the spectrometer and become three beams of parallel light, and then enter the grating for splitting, and after splitting, enter the focusing mirror of the spectrometer and are focused on different positions of the CMOS camera; The CMOS camera is a planar array camera, which is used to convert the received three light beams into electrical signals respectively; the CMOS camera is set to image in different regions, and simultaneously reads the three light beams to obtain the extinction spectrum, absorption spectrum, and scattering spectrum after calculation; The CMOS camera is connected to a terminal device and software, and the terminal device displays the extinction spectrum, the absorption spectrum, and the scattering spectrum in real time.

2. A visible light spectrometer for separating absorption and scattering information of nanomaterials according to claim 1, characterized in that: The light source is a high-power optical fiber light source with a wavelength range of 350nm-2100nm.

3. A visible light spectrometer for separating absorption and scattering information of nanomaterials according to claim 1, characterized in that: The width of the slit is set to 70 μm-80 μm; the length of the slit is 6.4 mm, and the distance at which the reference light, the scattered light and the second transmitted light are focused on the slit is 1 mm-2 mm.

4. A visible light spectrometer for separating absorption and scattering information of nanomaterials according to claim 1, characterized in that: The grating is a transmission grating.

5. The visible light spectrometer for separating absorption and scattering information of nanomaterials according to claim 1, characterized in that: The first beam splitter and the second beam splitter split the incident light into reflected light and transmitted light according to a 1:9 beam splitter, wherein the power of the reflected light accounts for 10% of the total power and the power of the transmitted light accounts for 90% of the total power.

6. A visible light spectrometer for separating absorption and scattering information of nanomaterials according to claim 5, characterized in that: The first beam splitter is rotated 45° around a direction perpendicular to the optical axis, and then rotated 1° to 2° around the direction of the optical axis, so that the reflected light of the first beam splitter passes through the attenuation plate as a reference light and enters the pre-slit focusing mirror, and at the same time, the first transmitted light of the first beam splitter is focused on the sample pool.

7. A visible light spectrometer for separating absorption and scattering information of nanomaterials according to claim 6, characterized in that: The second beam splitter is rotated 45° around a direction perpendicular to the optical axis, and then rotated 1° to 2° in the opposite direction around the optical axis, so that the reflected light of the second beam splitter passes through the attenuation plate as the second transmitted light and enters the pre-slit focusing mirror.

8. The visible light spectrometer for separating absorption and scattering information of nanomaterials according to claim 1, characterized in that: Two attenuation plates are provided, one of which is provided directly in front of the first beam splitter, and the other is provided directly in front of the second beam splitter.

9. A visible light spectrometer for separating absorption and scattering information of nanomaterials according to claim 8, characterized in that: The attenuation plate is a reflective neutral density filter with OD=3.