Dual-power change-over switch testing device

Abstract

The invention provides a dual-power change-over switch testing device, which comprises a workbench, a clamp and a signal testing assembly, and is characterized in that the signal testing assembly comprises a first mounting seat, a probe seat and a first driving part, and elastic parts are arranged between the probe seat and a first mounting plate and between the probe seat and a second mounting plate; and the front end of the probe seat in the insertion direction is provided with a chamfer which is in sliding fit with the signal terminal socket. When the signal terminal socket is not aligned with the probe seat due to assembly errors, the probe seat moves horizontally close to the signal terminal socket, and the chamfer at the front end of the probe seat is in sliding contact with the signal terminal socket, so that the probe seat moves along the vertical direction relative to the first mounting seat, and the position of the probe seat is automatically adjusted. Compared with the prior art, the conductive probe is not easy to bend or block, the misjudgment rate of equipment is obviously reduced, the one-time first pass yield of a product test is improved, and the production cost of secondary retest and repair confirmation of the product is reduced.

Description

Technical Field

[0001] The invention relates to the technical field of switches, and in particular to a dual power conversion switch testing device. Background Art

[0002] The dual power transfer switch is used in important power consumption areas where long-term power outages are not allowed. When the normal power supply suddenly fails or the power is cut off, it can automatically switch to the backup power supply to achieve unattended continuous power supply.

[0003] When testing the signal port of a conventional dual power switch test device, the signal test conductive probe needs to be inserted into and contacted with the signal terminal socket under the drive of the cylinder. The inventor found in actual use that due to a certain assembly error between the signal terminal socket and the switch body, the socket of the signal terminal socket is not aligned with the conductive probe, and the conductive probe is prone to bend or get stuck when inserted, which not only greatly shortens the service life of the conductive probe and the needle seat, but also has a significant impact on the product test pass rate. Summary of the invention

[0004] Therefore, the technical problem to be solved by the present invention is to overcome the defects of the prior art that the conductive probe is easily bent, resulting in a high misjudgment rate and high production cost, thereby providing a dual power conversion switch testing device with low misjudgment rate and low production cost.

[0005] To this end, the present invention provides a dual power conversion switch testing device, including a workbench, a fixture and a signal testing component, the fixture is arranged on the workbench and is used to fix and install the switch body; the signal testing component includes a first mounting seat, a probe seat and a first driving member, the first mounting seat includes a first mounting plate and a second mounting plate arranged opposite to each other, and a connecting plate connecting the first mounting plate and the second mounting plate, the first mounting plate, the second mounting plate and the connecting plate are enclosed to form a first mounting groove for installing the probe seat, and a first opening connected to the first mounting groove, a plurality of conductive probes extending from the first opening and arranged corresponding to the signal terminal socket on the switch body are installed on the probe seat, the probe seat moves with the first mounting seat, and an elastic member is arranged between one side of the probe seat and the first mounting plate, and an elastic member is arranged between the other side and the second mounting plate, the front end of the probe seat in the insertion direction is provided with a chamfer that slides with the signal terminal socket, the first driving member is connected to the first mounting seat and is used to drive the first mounting seat to move, wherein the moving direction of the first mounting seat is arranged perpendicular to the telescopic direction of the elastic member.

[0006] The probe seat is slidably mounted on the first mounting seat through a first guide structure. The first guide structure includes a first slide rail and a first slider. The first slide rail is arranged on the connecting plate, and the setting direction of the first slide rail is perpendicular to the moving direction of the first mounting seat; the first slider is arranged on the probe seat and is slidably connected to the first slide rail.

[0007] The elastic member is a spring, and a second mounting groove for inserting the end of the spring is formed on the first mounting plate, the second mounting plate and the probe seat.

[0008] The switch body includes a first incoming line terminal and a second incoming line terminal which are arranged up and down. An electrode assembly is provided on the bracket of the workbench. The electrode assembly includes: a third mounting plate and a fourth mounting plate which are arranged in parallel up and down on the bracket and are connected by a connecting column. The third mounting plate is arranged above the first incoming line terminal, and the fourth mounting plate is arranged between the first incoming line terminal and the second incoming line terminal; a first electrode assembly is arranged on the third mounting plate and is used to contact the first incoming line terminal; a second electrode assembly is arranged on the fourth mounting plate and is used to contact the second incoming line terminal; a second driving member is connected to the third mounting plate and is used to drive the third mounting plate to move.

[0009] A lock button for locking the switch body into a dual-part state is provided on the switch body, and a lock button test assembly is provided on the workbench. The lock button test assembly includes a lifting member, a third driving member and a fourth driving member. The lifting member is used to lift the lock button; the third driving member is installed on the fifth mounting plate and connected to the lifting member. The third driving member is used to drive the lifting member to move in the horizontal direction of the workbench; the fourth driving member is arranged on the bracket and connected to the fifth mounting plate. The fourth driving member is used to drive the lifting member to move in the vertical direction of the workbench.

[0010] The fixture is movably mounted on the workbench and has an initial position and a test position. The workbench is provided with a fifth driving member for driving the fixture to switch between the initial position and the test position.

[0011] A second guide structure is arranged between the clamp and the workbench. The second guide structure comprises a second slide rail arranged on the workbench and a second slide block arranged at the bottom of the clamp and slidably connected with the second slide rail.

[0012] The workbench is provided with proximity switches located on both sides of the fifth driving member, wherein only when both sides of the fixture are in contact with the two proximity switches, the control system controls the signal test assembly and the electrode assembly to operate.

[0013] The fixture has positioning columns which are arranged at four corners thereof. The four positioning columns are correspondingly positioned and connected with the card slots of the mounting feet on the left and right sides of the switch body.

[0014] The clamp has positioning blocks corresponding to the front and rear sides of the switch body.

[0015] The technical solution of the present invention has the following advantages: 1. The dual power conversion switch test device provided by the present invention, the signal test assembly includes a first mounting seat, a probe seat and a first driving member, an elastic member is arranged between one side of the probe seat and the first mounting plate of the probe seat, and an elastic member is arranged between the other side and the second mounting plate, the front end of the probe seat in the insertion direction is provided with a chamfer that slides with the signal terminal socket, and the moving direction of the first mounting seat is arranged perpendicular to the expansion and contraction direction of the elastic member, that is, the probe seat can move in the vertical direction relative to the first mounting seat while following the horizontal movement of the first mounting seat. When the signal terminal socket is not aligned with the probe seat due to assembly error, the chamfer at the front end of the probe seat will slide in contact with the signal terminal socket while the probe seat moves horizontally close to the signal terminal socket, so that the probe seat moves in the vertical direction relative to the first mounting seat, thereby automatically adjusting the position of the probe seat to ensure that the conductive probe is inserted into the signal terminal socket. Compared with the prior art, the conductive probe is not easy to bend or get stuck, which significantly reduces the misjudgment rate of the equipment, improves the first pass rate of product testing, and reduces the production cost of secondary retesting and rework confirmation of the product.

[0016] 2. In the dual power switch test device provided by the present invention, the probe seat is slidably mounted on the first mounting seat through a first guide structure, and the first guide structure includes: a first slide rail, which is arranged on the connecting plate, and the setting direction of the first slide rail is perpendicular to the moving direction of the first mounting seat; a first slider, which is arranged on the probe seat and is slidably connected to the first slide rail. By setting the first slider and the first slide rail, it can be ensured that the probe seat can move horizontally synchronously with the first mounting seat, and can also ensure that the probe seat moves in the vertical direction relative to the first mounting seat, which has the advantage of simple structure.

[0017] 3. The dual power conversion switch testing device provided by the present invention comprises an electrode assembly including a third mounting plate, a fourth mounting plate and a second driving member. The third mounting plate and the fourth mounting plate are arranged on the bracket in parallel up and down and are connected by a connecting column. The third mounting plate is arranged above the first incoming terminal and is provided with a first electrode assembly. The fourth mounting plate is arranged between the first incoming terminal and the second incoming terminal and is provided with a second electrode assembly. The second driving member is connected to the third mounting plate and is used to drive the third mounting plate to move. In this way, only one second driving member is required to drive the third mounting plate and the fourth mounting plate to move, thereby driving the first electrode assembly to contact the first incoming terminal and the second electrode assembly to contact the second incoming terminal, and the structure is simpler. It should be noted that the electrode assembly comprises an electrode and a spring. When the cylinder is pressed down, the electrode will first contact the terminal (copper busbar) and then expand and contract upward. The spring on the electrode is compressed, and the spring pressure ensures that the electrode is in good contact with the copper busbar.

[0018] 4. The dual power conversion switch testing device provided by the present invention, the lock button testing assembly includes a lifting member, a third driving member and a fourth driving member. During the test, the third driving member drives the lifting member to be inserted under the lock button, and the fourth driving member drives the lifting member to lift the lock button upward, thereby testing whether the lock button operates normally.

[0019] 5. The dual power conversion switch testing device provided by the present invention has a fixture that may become tilted after being moved for a long time, so that the position of the switch body installed on the fixture may also be offset, resulting in the conductive probe and the electrode being unable to reliably contact the signal terminal socket and the wiring terminal on the switch body. By arranging proximity switches on both sides of the fifth driving member on the workbench, the control system controls the signal test assembly and the electrode assembly to operate only when both sides of the fixture are in contact with the corresponding two proximity switches, thereby ensuring reliable testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the specific implementation methods of the present invention or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0021] Figure 1 A three-dimensional diagram of the dual power conversion switch testing device of the present invention installed on a frame; Figure 2 is a first stereoscopic view of a dual power transfer switch testing device; Figure 3 It is a structural diagram of the signal test component and the switch body; Figure 4 It is a schematic diagram of the explosion structure of the signal test component; Figure 5 is a stereogram of a signal test assembly; Figure 6 It is a side view of a dual power transfer switch test device; Figure 7 is a second stereoscopic view of the dual power transfer switch testing device; Figure 8 It is a schematic diagram of the exploded structure of the switch body and the fixture; Fig. 9 A perspective view of the lock button test assembly.

[0022] Explanation of reference numerals: 1. workbench; 2. fixture; 3. switch body; 4. signal test assembly; 5. first mounting seat; 6. probe seat; 61. chamfer; 62. slot; 7. first driving member; 8. first mounting plate; 9. second mounting plate; 10. connecting plate; 11. first mounting groove; 12. first opening; 13. signal terminal socket; 14. conductive probe; 15. elastic member; 16. first slide rail; 17. first slider; 18. first incoming terminal; 19. second Incoming terminal; 20, bracket; 21, first electrode assembly; 22, second electrode assembly; 23, third mounting plate; 24, fourth mounting plate; 25, connecting column; 26, locking button; 27, pulling member; 28, third driving member; 29, fifth mounting plate; 30, fourth driving member; 31, second slide rail; 32, second slider; 33, proximity switch; 34, positioning column; 35, mounting foot; 36, slot; 37, fifth driving member; 38, positioning block; 39, second mounting slot. DETAILED DESCRIPTION

[0023] The technical solution of the present invention will be described clearly and completely below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0024] In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", and "third" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.

[0025] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0026] In addition, the technical features involved in the different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0027] Example This embodiment provides a dual power conversion switch testing device for testing a dual power conversion switch. Figure 1 and Figure 2 As shown, it includes a workbench 1, a fixture 2, a signal test component 4, an electrode component and a lock button test component.

[0028] Dual power switch, such as Figure 2 and Figure 6 As shown, it includes a switch body 3, a signal terminal socket 13, a first incoming terminal 18, a second incoming terminal 19 and a locking button 26. The signal terminal socket 13 is installed on the side of the switch body 3, and the first incoming terminal 18 and the second incoming terminal 19 are arranged on the switch body 3 from top to bottom. The locking button 26 is used to lock the switch body 3 in a double-split state, making it safer during maintenance. It should be noted that the locking button is an existing mature technology, so its specific structure and working principle are not described in detail.

[0029] The fixture 2 is movably mounted on the workbench 1 and has an initial position and a test position, such as Figure 2 and Figure 8 As shown, the fixture 2 has positioning columns 34 disposed at its four corners, and positioning blocks 38 corresponding to the front and rear sides of the switch body 3. The four positioning columns 34 are correspondingly positioned and connected with the slots 36 of the mounting feet 35 on the left and right sides of the switch body 3. A second guide structure is provided between the fixture 2 and the workbench 1, such as Figure 7 As shown, the second guide structure includes a second slide rail 31 provided on the workbench 1, and a second slider 32 provided at the bottom of the fixture 2 and slidably connected to the second slide rail 31. The workbench 1 is provided with a fifth driving member 37 for driving the fixture 2 to switch between the initial position and the test position, and proximity switches 33 located on both sides of the fifth driving member 37, wherein the control system controls the signal test assembly 4 and the electrode assembly to move only when both sides of the fixture 2 are in contact with the two proximity switches 33. When the fixture 2 is in the initial position, the switch body 3 can be manually placed on the fixture 2, and then the fifth driving member 37 drives the fixture 2 to move to the test position.

[0030] Signal test component 4, such as Figure 2 As shown, it includes a first mounting base 5, a probe base 6 and a first driving member 7. In this embodiment, as Figure 3As shown, the first mounting seat 5 includes a first mounting plate 8 and a second mounting plate 9 which are arranged opposite to each other in the upper and lower parts, and a connecting plate 10 connecting the first mounting plate 8 and the second mounting plate 9, the connecting plate 10 is arranged vertically, the first mounting plate 8, the second mounting plate 9 and the connecting plate 10 are enclosed to form a first mounting groove 11 for mounting the probe seat 6, and a first opening 12 which is connected to the first mounting groove 11, a plurality of conductive probes 14 extending from the first opening 12 and arranged corresponding to the signal terminal sockets 13 on the switch body 3 are installed on the probe seat 6, the probe seat 6 moves with the first mounting seat 5, and an elastic member 15 is arranged between the top and the first mounting plate 8 of the probe seat 6, and an elastic member 15 is arranged between the bottom and the second mounting plate 9, as shown in FIG. Figure 4 and Figure 5 As shown, the probe seat 6 is formed with a slot 62 for inserting the signal terminal socket 13, and the upper and lower sides of the opening of the slot 62 are provided with chamfers 61 that slide with the signal terminal socket 13. The first driving member 7 is connected to the first mounting seat 5 and is used to drive the first mounting seat 5 to move, wherein the moving direction of the first mounting seat 5 is perpendicular to the expansion and contraction direction of the elastic member 15. In this embodiment, the probe seat 6 is slidably mounted on the first mounting seat 5 through a first guide structure, as shown in FIG. Figure 3 and Figure 4 As shown, the first guide structure includes: a first slide rail 16, which is arranged on the inner side of the connecting plate 10, and the setting direction of the first slide rail 16 is perpendicular to the moving direction of the first mounting seat 5; a first slider 17, which is arranged on the probe seat 6 and is slidably connected to the first slide rail 16. The elastic member 15 is a spring, and the first mounting plate 8, the second mounting plate 9 and the probe seat 6 are all formed with a second mounting groove 39 for inserting the end of the spring. When the conductive probe 14 is not in contact with the signal terminal socket, the probe seat 6 is in a centered state under the elastic force of the upper and lower elastic members 15; when the signal terminal socket 13 is not aligned with the probe seat 6 due to assembly error, the probe seat 6 moves horizontally close to the signal terminal socket 13, and the chamfer 61 at its front end will slide in contact with the signal terminal socket 13, so that the probe seat 6 moves in the vertical direction relative to the first mounting seat 5, thereby ensuring that the conductive probe 14 is inserted into the signal terminal socket 13. Compared with the prior art, the probe seat 6 can automatically adjust its position, so that the conductive probe is not easy to bend or get stuck, which significantly reduces the equipment misjudgment rate, improves the first-time pass rate of product testing, and reduces the production cost of secondary retesting and rework confirmation of the product.

[0031] Electrode components, such as Figure 6As shown, it includes: a third mounting plate 23 and a fourth mounting plate 24, which are arranged on the bracket 20 in parallel from top to bottom and connected by a connecting column 25, the third mounting plate 23 is arranged above the first incoming terminal 18, and the fourth mounting plate 24 is arranged between the first incoming terminal 18 and the second incoming terminal 19; a first electrode assembly 21, which is arranged on the third mounting plate 23 and is used to contact the first incoming terminal 18; a second electrode assembly 22, which is arranged on the fourth mounting plate 24 and is used to contact the second incoming terminal 19; a second driving member (not shown in the figure), which is connected to the third mounting plate 23 and is used to drive the third mounting plate 23 to move up and down. It should be noted that the electrode assembly includes an electrode and a spring. When the cylinder is pressed down, the electrode will first contact the terminal (copper bar), and then stretch upward, and the spring on the electrode will be compressed. The spring pressure ensures that the electrode is in good contact with the copper bar. The electrode assembly is an existing mature technology, so its specific structure and working principle are not described in detail.

[0032] Lock button test components, such as Figure 2 and Fig. 9 As shown, it includes: a lifting member 27, used to lift the locking button 26; a third driving member 28, which is installed on the fifth mounting plate 29 and connected to the lifting member 27, and the third driving member 28 is used to drive the lifting member 27 to move along the horizontal direction of the workbench 1; a fourth driving member 30, which is arranged on the bracket 20 and connected to the fifth mounting plate 29, and the fourth driving member 30 is used to drive the lifting member 27 to move along the vertical direction of the workbench 1. During testing, the lifting member 27 is driven by the third driving member 28, and its lower end is horizontally inserted to the bottom of the locking button 26, and then the fourth driving member 30 drives the lifting member 27 to move upward, thereby lifting the locking button 26.

[0033] It should be noted that each driving member is a cylinder.

[0034] Obviously, the above embodiments are merely examples for the purpose of clear explanation, and are not intended to limit the implementation methods. For those skilled in the art, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the implementation methods here. The obvious changes or modifications derived therefrom are still within the scope of protection of the invention.

Claims

1. A dual power switch test device, characterized in that: include: Workbench (1); A clamp (2) is arranged on the workbench (1) and is used to fix and install the switch body (3); A signal test assembly (4) comprises a first mounting seat (5), a probe seat (6) and a first driving member (7); the first mounting seat (5) comprises a first mounting plate (8) and a second mounting plate (9) arranged opposite to each other, and a connecting plate (10) connecting the first mounting plate (8) and the second mounting plate (9); the first mounting plate (8), the second mounting plate (9) and the connecting plate (10) enclose a first mounting groove (11) for mounting the probe seat (6), and a first opening (12) communicating with the first mounting groove (11); the probe seat (6) is provided with a plurality of protruding from the first opening (12) and connected to the switch body (3); A conductive probe (14) is arranged corresponding to the signal terminal socket (13); the probe seat (6) moves following the first mounting seat (5); an elastic member (15) is arranged between one side of the probe seat and the first mounting plate (8) of the probe seat (6); and an elastic member (15) is arranged between the other side and the second mounting plate (9); a chamfer (61) for slidingly matching with the signal terminal socket (13) is arranged at the front end of the probe seat (6) in the insertion direction; the first driving member (7) is connected to the first mounting seat (5) and is used to drive the first mounting seat (5) to move, wherein the moving direction of the first mounting seat (5) is arranged perpendicular to the telescopic direction of the elastic member (15).

2. The dual power switch testing device according to claim 1, characterized in that: The probe seat (6) is slidably mounted on the first mounting seat (5) via a first guide structure, wherein the first guide structure comprises: A first slide rail (16) is arranged on the connecting plate (10), and the arrangement direction of the first slide rail (16) is perpendicular to the movement direction of the first mounting seat (5); A first sliding block (17) is disposed on the probe seat (6) and is slidably connected to the first sliding rail (16).

3. The dual power switch testing device according to claim 1 or 2, characterized in that: The elastic member (15) is a spring, and a second mounting groove (39) for inserting an end of the spring is formed on the first mounting plate (8), the second mounting plate (9) and the probe seat (6).

4. The dual power switch testing device according to claim 1, characterized in that: The switch body (3) comprises a first incoming line terminal (18) and a second incoming line terminal (19) arranged one above the other. An electrode assembly is provided on a bracket (20) of the workbench (1). The electrode assembly comprises: A third mounting plate (23) and a fourth mounting plate (24) are arranged in parallel on the bracket (20) and connected via a connecting column (25); the third mounting plate (23) is arranged above the first incoming terminal (18), and the fourth mounting plate (24) is arranged between the first incoming terminal (18) and the second incoming terminal (19); A first electrode assembly (21), disposed on the third mounting plate (23) and used for contacting the first incoming terminal (18); A second electrode assembly (22), provided on the fourth mounting plate (24), and used for contacting the second incoming terminal (19); A second driving member is connected to the third mounting plate (23) and is used to drive the third mounting plate (23) to move.

5. The dual power switch testing device according to claim 1, characterized in that: The switch body (3) is provided with a lock button (26) for locking the switch body in a dual-split state, and the workbench (1) is provided with a lock button test assembly, the lock button test assembly comprising: A lifting member (27) used for lifting the locking button (26); a third driving member (28) mounted on the fifth mounting plate (29) and connected to the lifting member (27), the third driving member (28) being used to drive the lifting member (27) to move in a horizontal direction of the workbench (1); A fourth driving member (30) is arranged on the bracket (20) and connected to the fifth mounting plate (29), and the fourth driving member (30) is used to drive the lifting member (27) to move in the vertical direction of the workbench (1).

6. The dual power switch testing device according to claim 1, characterized in that: The clamp (2) is movably mounted on a workbench (1) and has an initial position and a test position. The workbench (1) is provided with a fifth driving member (37) for driving the clamp (2) to switch between the initial position and the test position.

7. The dual power switch testing device according to claim 6, characterized in that: A second guide structure is provided between the clamp (2) and the workbench (1), the second guide structure comprising a second slide rail (31) provided on the workbench (1), and a second slide block (32) provided at the bottom of the clamp (2) and slidably connected to the second slide rail (31).

8. The dual power switch testing device according to claim 6 or 7, characterized in that: The workbench (1) has proximity switches (33) located on both sides of the fifth driving member (37), wherein only when both sides of the clamp (2) are in contact with the two proximity switches (33), the control system controls the signal test assembly (4) and the electrode assembly to operate.

9. The dual power switch testing device according to claim 1, characterized in that: The clamp (2) has positioning columns (34) disposed at four corners thereof, and the four positioning columns (34) are correspondingly positioned and connected to the slots (36) of the mounting feet (35) on the left and right sides of the switch body (3).

10. The dual power switch testing device according to claim 9, characterized in that: The clamp (2) has positioning blocks (38) corresponding to the front and rear sides of the switch body (3).

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