Probe device

Abstract

The invention discloses a probe device, which relates to the field of battery preparation devices and comprises a substrate, the substrate is provided with a first end face and a second end face which are opposite to each other, and the substrate is provided with a first through hole, a second through hole and a third through hole which penetrate through the first end face and the second end face at the same time. Shaft sleeve assemblies are arranged on the sides, located on the second end face, of the first through hole and the second through hole, a first probe assembly and a second probe assembly are arranged in the first through hole and the second through hole respectively, and the first probe assembly and the second probe assembly are matched with the corresponding shaft sleeve assemblies in an inserted mode respectively. The first probe assembly and the second probe assembly are arranged on the same side of the substrate, so that the probe device is suitable for the battery with the positive electrode and the negative electrode on the same side. Through plugging cooperation between the first probe assembly and the shaft sleeve assembly and between the second probe assembly and the shaft sleeve assembly, rapid mounting and dismounting of the probe assemblies are realized.

Description

Technical Field

[0001] The present invention relates to the technical field of battery preparation devices, and more particularly to a probe device. Background Art

[0002] Battery probe modules are widely used in various types of battery testing and charging equipment, especially in the fields of new energy vehicles, energy storage systems, etc. With the continuous advancement of battery technology, the requirements for battery testing and charging are becoming higher and higher.

[0003] In the prior art, battery probes are mostly located at both ends of the battery, but such battery probes are not suitable for batteries with positive and negative poles arranged on the same side. In addition, the prior art uses a hard connection method for installation, and the probe and the power supply are fixed with screws. The installation is complicated and not conducive to the maintenance of the probe.

[0004] In summary, how to make the probe suitable for batteries with positive and negative electrodes arranged on the same side and how to quickly install and remove the probe are issues that need to be urgently resolved by those skilled in the art. Summary of the invention

[0005] In view of this, an object of the present invention is to provide a probe device that is effectively applicable to batteries with positive and negative electrodes arranged on the same side and that enables rapid installation and removal of the probe.

[0006] In order to achieve the above object, the present invention provides the following technical solutions:

[0007] A probe device comprises a substrate, wherein the substrate has a first end surface and a second end surface opposite to each other, and a first through hole, a second through hole and a third through hole are provided on the substrate and penetrate the first end surface and the second end surface simultaneously;

[0008] The first through hole and the second through hole are both provided with a shaft sleeve assembly on one side of the second end surface, and the first through hole and the second through hole are respectively provided with a first probe assembly and a second probe assembly, and the first probe assembly and the second probe assembly are respectively plugged and matched with the corresponding shaft sleeve assembly;

[0009] A negative pressure nozzle assembly is arranged in the third through hole, and a limiting structure is arranged on the substrate at the third through hole so that the negative pressure nozzle assembly is limited in the third through hole.

[0010] Preferably, the first probe assembly and the second probe assembly both include:

[0011] A probe body, wherein the interior of the probe body is hollow and a connecting conductor is inserted therein, and a concave annular groove is formed on an outer surface of a side of the probe body close to the shaft sleeve assembly;

[0012] A probe end connected to the probe body, wherein the probe end is hollow and has a collecting piece inserted therein, and the collecting piece is electrically connected to the connecting conductor;

[0013] Each of the sleeve assemblies comprises:

[0014] A shaft bushing, fixedly arranged on one side of the substrate located at the second end surface, a copper block bushing is arranged inside the shaft bushing, a side of the copper block bushing close to the second end surface is circumferentially provided with a plurality of limit buckles engaged with the concave ring groove, a guide shaft is arranged on the shaft portion of the copper block bushing, and the connecting conductor is inserted into the guide shaft;

[0015] The contact copper block is inserted in the copper block bushing, and the guide shaft passes through the shaft portion of the contact copper block.

[0016] Preferably, a plurality of arc-shaped spring pieces are circumferentially arranged on one end of the guide shaft away from the shaft bushing, and the plurality of arc-shaped spring pieces are in close contact with the surface of the connecting conductor.

[0017] Preferably, a second isolation sleeve is provided between the connecting conductor and the inside of the probe body, a first isolation sleeve is provided between the collecting piece and the inside of the probe tip, a sampling spring is provided on the connecting conductor, and two ends of the sampling spring are respectively abutted between the first isolation sleeve and the second isolation sleeve.

[0018] Preferably, a plurality of wiring protrusions are circumferentially arranged on the surface of the contact copper block, the copper block bushing is provided with notches matching with the wiring protrusions, and the shaft bushing is provided with a wiring port for externally connected wires matching with the notches.

[0019] Preferably, insulating bushings are provided in the first through hole and the second through hole, the probe body is inserted in the corresponding insulating bushings, a probe compression spring is sleeved on the probe body, and two ends of the probe compression spring are respectively abutted against the insulating bushing and the probe body.

[0020] Preferably, the end face of the probe body and the end face of the probe tip are fitted with each other, and a set screw threadedly connected to the end face of the probe tip is provided on the probe body to fix the probe body and the probe tip together.

[0021] Preferably, the substrate is provided with mounting seats at the first through hole and at one end of the second through hole located at the second end surface, and each of the shaft bushings is threadedly connected to the corresponding mounting seat so that the shaft bushing is fixed on the substrate.

[0022] Preferably, the negative pressure nozzle assembly includes a nozzle body, which is inserted into the third through hole, and the end of the nozzle body away from the substrate is a bellows structure, and the other end of the nozzle body is provided with a plurality of annular grooves on the circumference, each of the annular grooves is provided with a sealing ring, and each of the sealing rings is provided between the nozzle body and the inner wall of the third through hole.

[0023] Preferably, the limiting structure includes:

[0024] A first hemispherical annular convex body is arranged on one side of the substrate located at the first end surface;

[0025] A second hemispherical annular convex body is arranged on the outer peripheral surface of the nozzle body away from the substrate;

[0026] A nozzle spring is arranged between the first hemispherical annular convex body and the second hemispherical annular convex body, and the nozzle spring includes two first annular wedges clamped on the first hemispherical annular convex body, two second annular wedges clamped on the second hemispherical annular convex body, and a limit spring arranged between the first annular wedges and the second annular wedges;

[0027] A first clamp is provided on the two first annular wedges so that the two first annular wedges can fit tightly against the first hemispherical annular convex body, and a second clamp is provided on the two second annular wedges so that the two second annular wedges can fit tightly against the second hemispherical annular convex body.

[0028] The probe device provided by the present invention arranges the first probe assembly and the second probe assembly on the same side of the substrate, and the first probe assembly and the second probe assembly correspond to the positive electrode and the negative electrode of the battery respectively, so that the probe device is suitable for batteries with the positive and negative electrodes on the same side. In addition, a sleeve assembly is arranged at the position of the first probe assembly and the second probe assembly on the substrate, and the first probe assembly and the second probe assembly are plugged in and matched with the sleeve assembly, so that the first probe assembly and the second probe assembly can be quickly installed and disassembled, which effectively improves the convenience of installation and maintenance of the probe device. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without paying creative work.

[0030] Figure 1 Schematic diagram of the overall structure of the probe device in this embodiment;

[0031] Figure 2 is a cross-sectional view of the overall structure of the probe device in this embodiment;

[0032] Figure 3 is a cross-sectional view of the first probe assembly and the second probe assembly in this embodiment;

[0033] Figure 4 Schematic diagram of the structure of the negative pressure nozzle assembly in this embodiment;

[0034] Figure 5 is a cross-sectional view of the shaft sleeve assembly in this embodiment;

[0035] Figure 6 Schematic diagram of the structure of the substrate in this embodiment;

[0036] Figure 7 It is a cross-sectional view of the assembly of the first probe assembly and the second probe assembly with the sleeve assembly in this embodiment;

[0037] Figure 8 Schematic diagram of the use of the probe device in this embodiment.

[0038] Figure 1-Figure 8 , the reference numerals include:

[0039] 1. First probe assembly; 2. Second probe assembly; 101. Probe body; 102. Probe compression spring; 103. Probe tip; 104. Set screw; 105. Collection piece; 106. First isolation sleeve; 107. Sampling spring; 108. Second isolation sleeve; 109. Connecting conductor;

[0040] 3. Negative pressure nozzle assembly; 301. Nozzle body; 302. First clamp; 303. Sealing ring; 304. Nozzle spring; 305. Second clamp; 306. Limit spring;

[0041] 4. Shaft sleeve assembly; 401. Copper block bushing; 402. Contact copper block; 403. Shaft bushing; 404. Shaft sleeve spring; 405. Guide shaft; 406. Guide shaft spring; 407. Limit buckle;

[0042] 5. Substrate; 501. First end surface; 502. Second end surface; 503. First through hole; 504. Second through hole; 505. Third through hole; 506. Insulating bushing. DETAILED DESCRIPTION

[0043] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0044] Unless otherwise defined, the technical terms or scientific terms used in the disclosure of this application should be understood by people with ordinary skills in the field to which the invention belongs. "First", "second" and similar words used in the present invention do not indicate any order, quantity or importance. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the object being described changes, the relative positional relationship may also change accordingly. The embodiment of the present application discloses a probe device.

[0045] The core of the present invention is to provide a probe device.

[0046] Please refer to Figures 1 to 8 .

[0047] The probe device provided by the present invention includes a substrate 5, which has a first end face 501 and a second end face 502 relative to each other, and is provided with a first through hole 503, a second through hole 504 and a third through hole 505 that simultaneously penetrate the first end face 501 and the second end face 502; the first through hole 503 and the second through hole 504 are both provided with a shaft sleeve assembly 4 on one side of the second end face 502, and the first through hole 503 and the second through hole 504 are respectively provided with a first probe assembly 1 and a second probe assembly 2, and the first probe assembly 1 and the second probe assembly 2 are respectively plugged and matched with the corresponding shaft sleeve assembly 4; a negative pressure suction nozzle assembly 3 is provided in the third through hole 505, and a limiting structure is provided at the third through hole 505 on the substrate 5 so that the negative pressure suction nozzle assembly 3 is limited in the third through hole 505.

[0048] Specifically, the substrate 5 is an elliptical plate, and the portion of the substrate 5 located at the midline is penetrated by a first through hole 503, a second through hole 504 and a third through hole 505 in sequence, and the two ends of the first through hole 503, the second through hole 504 and the third through hole 505 are respectively located on the first end face 501 and the second end face 502 of the substrate 5. The first probe assembly 1 and the second probe assembly 2 are respectively arranged in the first through hole 503 and the second through hole 504, and the first probe assembly 1 and the second probe assembly 2 correspond to the positive and negative poles of the power supply respectively. The substrate 5 is located at the first through hole 503 and the second through hole 504 and on one side of the second end face 502, and the first probe assembly 1 and the second probe assembly 2 are respectively matched with the corresponding shaft sleeve assembly 4, so that the first probe assembly 1 and the second probe assembly 2 can be plugged into the corresponding shaft sleeve assembly 4, thereby realizing the rapid installation and removal of the probe. The third through hole 505 and the first through hole 503 are opened relative to the second through hole 504, the negative pressure suction nozzle assembly 3 is arranged in the third through hole 505, and the negative pressure suction nozzle assembly 3 is limited and arranged in the third through hole 505 through a limiting structure located between the negative pressure suction nozzle assembly 3 and the substrate 5.

[0049] The first probe assembly 1, the second probe assembly 2 and the negative pressure nozzle assembly 3 of the above-mentioned probe device are all located on the same side of the substrate 5, so that it can be better adapted to batteries with positive and negative poles located on the same side. At the same time, the plug-in cooperation between the first probe assembly 1 and the second probe assembly 2 and the sleeve assembly 4 also ensures that the first probe assembly 1 and the second probe assembly 2 can be installed and disassembled faster, effectively improving the convenience of installation and maintenance of the probe device.

[0050] Both the probe assembly and the negative pressure nozzle assembly are designed to move in a single direction, ensuring precise control and efficient operation during the test. At the same time, the probe assembly supports a convenient plug-in installation mechanism, which greatly simplifies the maintenance process, reduces downtime, and provides a strong guarantee for the continuous and stable operation of the automated production line.

[0051] The probe device provided by the present invention is described in more detail below with reference to the accompanying drawings and specific embodiments.

[0052] In a specific embodiment, reference Figures 2 to 7The first probe assembly 1 and the second probe assembly 2 both include a probe body 101 and a probe tip 103 . The probe body 101 is hollow inside and is provided with a connecting conductor 109 . A concave annular groove is formed on the outer surface of one side of the probe body 101 close to the sleeve assembly 4 . The probe tip 103 is connected to the probe body 101. The probe tip 103 is hollow inside and has a collecting piece 105 inserted therein. The collecting piece 105 is electrically connected to the connecting conductor 109. Each sleeve assembly 4 includes a shaft bushing 403 and a contact copper block 402. The shaft bushing 403 is fixedly arranged on one side of the substrate 5 located at the second end face 502. A copper block bushing 401 is arranged in the shaft bushing 403. A plurality of limit buckles 407 that are engaged with the concave ring groove are circumferentially arranged on one side of the copper block bushing 401 close to the second end face 502. A guide shaft 405 is arranged on the shaft portion of the copper block bushing 401. The connecting conductor 109 is inserted in the guide shaft 405. The contact copper block 402 is inserted in the copper block bushing 401, and the guide shaft 405 passes through the shaft portion of the contact copper block 402.

[0053] Specifically, the probe body 101 is a multi-step hollow boss structure, wherein one end close to the probe tip 103 is the head end of the probe body 101, and the other end is the tail end (the head and tail ends of the remaining parts are also set in this way), the head end of the probe body 101 is a hollow concave cylinder, and the concave part is for the convenience of installing the probe tip 103, and the tail end of the probe body 101 is a spherical surface with a concave annular groove. One end of the probe tip 103 is set at the concave part of the head end of the probe body 101, and the end face of the probe tip 103 is in contact with the head end face of the probe body 101, and the other end of the probe tip 103 is used to contact the positive or negative electrode of the battery.

[0054] The probe tip 103 is a hollow cylindrical boss structure, and its contact surface with the positive and negative electrodes of the battery is provided with a gold-plated layer, and it is a tetrahedral multi-convex structure. During use, this structure: first, ensures good contact between the whole and the battery tab; second, enhances heat dissipation on the contact surface; third, pierces the oxide layer on the surface of the battery tab to enhance conductivity. The cylindrical surface of the probe tip 103 is evenly milled with three planes for easy tightening.

[0055] The connecting conductor 109 is inserted into the hollow part of the probe body 101, and one end of the connecting conductor 109 is located in the pit at the head end of the probe body 101, and the collecting piece 105 is inserted in the hollow part of the probe end 103. The connecting conductor 109 can be a benign metal cylindrical conductor with a conical surface at one end. The collecting piece 105 is a temperature-sensing negative pressure collecting piece, and can also be a voltage collecting piece or a temperature collecting piece, and is a multi-step boss cylindrical structure. One end of the collecting piece 105 is also located in the pit at the head end of the probe body 101, and is electrically connected to one end of the connection 109. The end of the collecting piece 105 away from the connecting conductor 109 is a tetrahedral multi-bump structure, and the other end is provided with a screw hole to facilitate the connection with the connecting conductor 109. The collecting piece 105 can be made of a benign metal conductor, and a gold-plated layer is provided on the surface. Optionally, the collecting piece 105 and the connecting conductor 109 can be integrated into one.

[0056] The shaft bushing 403 is arranged on one side of the substrate 5 located at the second end surface 502, and the shaft bushing 403, the first through hole 503 or the second through hole 504 and the probe body 101 are coaxially arranged. The copper block bushing 401 is arranged in cooperation with the contact copper block 402. The copper block bushing 401 is in the shape of a pen cap, and its function is to provide a storage space for the contact copper block 402. The collective shape is adapted to the contact copper block 402. The copper block bushing 401 and the contact copper block 402 are integrated into one and inserted in the shaft bushing 403. The structure of the shaft bushing 403 is adapted to the copper block bushing 401. A circular hole is opened in the middle of the tail end of the shaft bushing 403 and is in a frustum shape. The shaft bushing 403 can be made of non-metallic material, preferably high-performance nylon material.

[0057] A guide shaft 405 is provided in the inner shaft of the shaft bushing 403, and the end of the guide shaft 405 away from the probe body 101 is inserted in turn on the copper block bushing 401 and the contact copper block 402, and the head end of the guide shaft 405 extends out of the copper block bushing 401 and is provided with a guide rod in contact with the copper block 402, and a guide shaft spring 406 is sleeved on the guide rod, and one end of the guide shaft spring 406 abuts against the inner wall of the shaft bushing 403, and the guide shaft spring 406 is used to support the deadweight of the probe assembly to ensure that the probe assembly does not shake easily. The central section of the guide shaft 405 is a hollow thin tube, and the tail end of the guide shaft 405 is a non-metallic disc and a metal cylinder structure.

[0058] A plurality of limit buckles 407 that engage with the concave ring groove are circumferentially arranged on one side of the copper block bushing 401 close to the second end face 502. When the probe body 101 is inserted into the copper block bushing 401, the plurality of limit buckles 407 are snapped into the concave ring groove on the surface of the probe body 101. The limit buckle 407 is an arc-shaped elastic metal sheet. The two ends of the limit buckle 407 are at right angles and are embedded in the copper block bushing 401. They will not fall off by themselves after installation. A protrusion is designed in the middle, and the shape of which is adapted to the concave ring groove of the probe body 101. The elasticity of the metal is used to tightly connect the probe body 101 and the contact copper block 402.

[0059] It should be noted that a shaft sleeve spring 404 is disposed inside the head end of the shaft sleeve 403 , and the bearing spring 404 provides a squeezing force for the guide shaft 405 to ensure reliable contact between the guide shaft 405 and the connecting conductor 109 .

[0060] It should also be noted that the current loop of the probe device in this embodiment is: power module - contact copper block 402 - probe body 101 - probe tip 103 - battery.

[0061] The temperature sensing-negative pressure collection piece 105 is connected to the connecting conductor 109 by threaded connection. The needle surface of the temperature sensing-negative pressure collection piece 105 is slightly higher than the needle surface of the probe head 103, ensuring that the temperature sensing-negative pressure collection piece 105 can contact the battery first.

[0062] Voltage-temperature acquisition circuit: battery-temperature sensor-negative pressure acquisition component 105-connecting conductor 109-guide shaft 405-power module.

[0063] Based on any of the above embodiments, Figures 2 to 7 A plurality of arc-shaped spring pieces are circumferentially arranged at one end of the guide shaft 405 away from the shaft bushing 403 , and the plurality of arc-shaped spring pieces are in close contact with the surface of the connecting conductor 109 .

[0064] Specifically, the connecting conductor 109 on the probe body 101 is inserted into the shaft sleeve 403 along with the probe body 101, and the connecting conductor 109 is also inserted into the guide shaft 405. A plurality of arc-shaped spring pieces are circumferentially arranged at one end of the guide shaft 405 away from the shaft sleeve 403. In the present embodiment, three arc-shaped spring pieces are circumferentially arranged. The arc-shaped spring pieces utilize elastic deformation to closely contact with the connecting conductor 109, thereby ensuring the connection stability of the connecting conductor 109.

[0065] Based on any of the above embodiments, Figures 2 to 7 A second isolation sleeve 108 is provided between the connecting conductor 109 and the inside of the probe body 101, a first isolation sleeve 106 is provided between the collecting piece 105 and the inside of the probe end 103, a sampling spring 107 is sleeved on the connecting conductor 109, and two ends of the sampling spring 107 are respectively abutted between the first isolation sleeve 106 and the second isolation sleeve 108.

[0066] Specifically, the first isolation sleeve 106 and the second isolation sleeve 108 are both hollow boss thin shell cylinders made of hard insulators. The first isolation sleeve 106 and the second isolation sleeve 108 are relatively arranged at the central axis of the first probe assembly 1 or the second probe assembly 2, and are both located in the hollow part of the probe body 101. The first isolation sleeve 106 is located between the collecting piece 105 and the inside of the probe end 103, and the first isolation sleeve 106 is also located in the middle space of the probe end 103. The second isolation sleeve 108 is located between the connecting conductor 109 and the inside of the probe body 101. A sampling spring 107 is arranged between the first isolation sleeve 106 and the second isolation sleeve 108, and is also in the pit space at the head end of the probe body 101, which is adapted to the small distance compression of the collecting piece 105.

[0067] Based on any of the above embodiments, Figures 2 to 7 A plurality of wiring protrusions are circumferentially arranged on the surface of the contact copper block 402, a notch that matches with the wiring protrusion is opened on the copper block bushing 401, and a wiring port for externally connecting a wire and matching with the notch is opened on the shaft bushing 403.

[0068] Specifically, the contact copper block 402 is approximately in the shape of a hemisphere with a straight tube section, with a circular hole in the center and three notches in the circumferential direction. The elastic deformation of the metal is used to provide a certain circumferential gripping force, so that the contact copper block 402 can better contact the tail end of the probe body 101. There are 1-3 wiring bumps evenly distributed on the spherical surface of the contact copper block 402 to provide a position for external wires. Optionally, there may be threaded holes on the wiring bumps. The material is a benign metal conductor. In order to match the wiring bump setting, the conical surface of the tail of the copper block bushing 401 has 1-3 notches, which are compatible with the wiring bumps. The shaft bushing 403 structure is compatible with the copper block bushing 401, and there are notches corresponding to the wiring bumps of the contact copper block 402 in the circumferential direction, which facilitates the linear movement of the external wire.

[0069] Based on any of the above embodiments, Figures 2 to 7 Insulating bushings 506 are provided in the first through hole 503 and the second through hole 504, the probe body 101 is inserted in the corresponding insulating bushings 506, and a probe compression spring 102 is sleeved on the probe body 101, and the two ends of the probe compression spring 102 are respectively abutted against the insulating bushings 506 and the probe body 101.

[0070] Specifically, the first through hole 503 and the second through hole 504 are both provided with an insulating bushing 506, which is a hollow boss thin shell cylinder, whose circumference is located in the first through hole 503 or the second through hole 504, and whose end face abuts against the first end face 501. The probe compression spring 102 is sleeved on the outer circumference of the probe body 101, one end of the probe compression spring 102 abuts against the head end face of the probe body 101, and the other end of the probe compression spring 102 abuts against the end face of the insulating bushing 506. The probe compression spring 102 is located between the probe body 101 and the insulating bushing 506, providing the main pressing force of the probe module.

[0071] Based on any of the above embodiments, the end face of the probe body 101 fits with the end face of the probe tip 103, and a set screw 104 is provided on the probe body 101 and threadedly connected to the end face of the probe tip 103 to fix the probe body 101 and the probe tip 103 together.

[0072] Specifically, the probe tip 103 is a hollow T-shaped boss, and the large end surface of the boss has three threaded holes evenly distributed around the circumference. The large end surface of the boss contacts the front end plane of the probe body 101 and is fixed with a set screw 104, which can be a pin.

[0073] Furthermore, a threaded surface is provided in the hollow portion at the head end of the probe body 101, and the small end face of the boss of the probe end 103 is a threaded cylindrical surface and is threadedly connected to the hollow portion at the head end of the probe body 101, thereby further improving the stability of the connection between the two.

[0074] Based on any of the above embodiments, the substrate 5 is provided with a mounting seat at the first through hole 503 and the second through hole 503 at one end of the second end face 502, and each shaft bushing 403 is threadedly connected to the corresponding mounting seat to fix the shaft bushing 403 on the substrate 5.

[0075] Specifically, the mounting seat (probe tube) is arranged on the base plate 5. The mounting seat is a hollow tube body and is coaxially arranged with the corresponding through hole. A threaded surface is arranged on the outer peripheral surface of the mounting seat. The inner wall of the head end of the corresponding shaft sleeve 403 is matched with an internal thread, which cooperates with the threaded surface on the mounting seat, thereby facilitating the shaft sleeve 403 to be detachably arranged on the base plate 5, and the bearing sleeve 403 is a connecting part between the shaft sleeve assembly 4 and the base plate 5, thereby realizing rapid installation and disassembly between the shaft sleeve assembly 4 and the base plate 5.

[0076] Based on any one of the above embodiments, the negative pressure nozzle assembly includes a nozzle body 301, which is inserted into the third through hole 505, and the end of the nozzle body 301 away from the substrate 5 is a bellows structure, and the other end of the nozzle body 301 is provided with a plurality of annular grooves on the circumference, and a sealing ring 303 is provided in each annular groove, and each sealing ring 303 is provided between the nozzle body 301 and the inner wall of the third through hole 505.

[0077] Specifically, the nozzle body 301 is a cylindrical thin tube, the head end of which is similar to a bellows shape, and the tail end is provided with multiple ring grooves, each of which is provided with a sealing ring 303, and in this embodiment, there are two ring grooves, and the sealing ring can maintain a good vacuum in the tube after being squeezed. The bellows structure can make the nozzle body 301 compatible with a certain range of unevenness when contacting the end face of the battery filling port. The sealing ring 303 can be a sealing fluororubber ring.

[0078] Based on any of the above embodiments, the limiting structure includes a first hemispherical annular convex body, a second hemispherical annular convex body and a suction nozzle spring 304, the first hemispherical annular convex body is arranged on the side of the substrate 5 located at the first end face 501, the second hemispherical annular convex body is arranged on the outer peripheral surface of the suction nozzle body 301 away from the substrate 5, the suction nozzle spring 304 is arranged between the first hemispherical annular convex body and the second hemispherical annular convex body, the suction nozzle spring 304 includes two first annular wedges clamped on the first hemispherical annular convex body, two second annular wedges clamped on the second hemispherical annular convex body and a limiting spring 306 arranged between the first annular wedges and the second annular wedges; the two first annular wedges are provided with a first clamp 302 to make the two first annular wedges fit tightly to the first hemispherical annular convex body, and the two second annular wedges are provided with a second clamp 305 to make the two second annular wedges fit tightly to the second hemispherical annular convex body.

[0079] Specifically, the nozzle spring 304 is composed of a first annular wedge, a second annular wedge and a limit spring 306. In order to install the nozzle spring 304, a first hemispherical annular convex body is provided on the side of the substrate 5 located at the first end face 501, and a second hemispherical annular convex body is provided on the outer peripheral surface of the nozzle body 301 away from the substrate 5. The first annular wedge and the second annular wedge are matched with the first hemispherical annular convex body and the second hemispherical annular convex body respectively, and the shape of the wedge just fits the hemispherical annular convex body so that the two are clamped. In order to make the annular wedge and the hemispherical annular convex body fit more closely, a first clamp 302 is provided on the two first annular wedges so that the two first annular wedges fit closely to the first hemispherical annular convex body, and a second clamp 305 is provided on the two second annular wedges so that the two second annular wedges fit closely to the second hemispherical annular convex body. The clamp uses its own elasticity to tighten the wedge block so that it fits tightly with the hemispherical annular convex body. This structure can facilitate the installation and disassembly of the negative pressure suction nozzle. The negative pressure suction nozzle assembly can be removed as a whole by just loosening the second clamp 305, further improving convenience.

[0080] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referenced to each other.

[0081] The above is a detailed introduction to a probe device provided by the present invention. Specific examples are used herein to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core idea. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present invention, the present invention can also be improved and modified in a number of ways, and these improvements and modifications also fall within the scope of protection of the present invention.

Claims

1. A probe device, characterized in that: Comprising a substrate (5), the substrate (5) having a first end surface (501) and a second end surface (502) opposite to each other, and the substrate (5) is provided with a first through hole (503), a second through hole (504) and a third through hole (505) which simultaneously penetrate the first end surface (501) and the second end surface (502); The first through hole (503) and the second through hole (504) are both provided with a shaft sleeve assembly (4) on one side of the second end surface (502); the first through hole (503) and the second through hole (504) are respectively provided with a first probe assembly (1) and a second probe assembly (2); the first probe assembly (1) and the second probe assembly (2) are respectively plugged into and matched with the corresponding shaft sleeve assembly (4); A negative pressure nozzle assembly (3) is arranged in the third through hole (505), and a limiting structure is arranged on the substrate (5) at the third through hole (505) so that the negative pressure nozzle assembly (3) is limited in the third through hole (505).

2. A probe device according to claim 1, characterized in that: The first probe assembly (1) and the second probe assembly (2) both comprise: A probe body (101), the interior of the probe body (101) being hollow and having a connecting conductor (109) inserted therein, and a concave annular groove being formed on an outer surface of a side of the probe body (101) close to the shaft sleeve assembly (4); A probe end (103) connected to the probe body (101); the interior of the probe end (103) is hollow and a collecting piece (105) is inserted therein; the collecting piece (105) is electrically connected to the connecting conductor (109); Each of the shaft sleeve assemblies (4) comprises: a shaft bushing (403) fixedly arranged on a side of the substrate (5) located at the second end surface (502); a copper block bushing (401) is arranged inside the shaft bushing (403); a plurality of limit buckles (407) that are engaged with the concave ring groove are circumferentially arranged on a side of the copper block bushing (401) close to the second end surface (502); a guide shaft (405) is arranged on the shaft portion of the copper block bushing (401); and the connecting conductor (109) is inserted into the guide shaft (405); The contact copper block (402) is inserted into the copper block bushing (401), and the guide shaft (405) passes through the shaft portion of the contact copper block (402).

3. A probe device according to claim 2, characterized in that: A plurality of arc-shaped spring pieces are circumferentially arranged at one end of the guide shaft (405) away from the shaft bushing (403), and the plurality of arc-shaped spring pieces are in close contact with the surface of the connecting conductor (109).

4. A probe device according to claim 2, characterized in that: A second isolation sleeve (108) is provided between the connecting conductor (109) and the inside of the probe body (101), a first isolation sleeve (106) is provided between the collecting member (105) and the inside of the probe tip (103), a sampling spring (107) is sleeved on the connecting conductor (109), and two ends of the sampling spring (107) are respectively abutted between the first isolation sleeve (106) and the second isolation sleeve (108).

5. A probe device according to claim 2, characterized in that: A plurality of wiring protrusions are circumferentially arranged on the surface of the contact copper block (402), notches matching the wiring protrusions are provided on the copper block bushing (401), and a wiring port for externally connecting a wire and matching the notch is provided on the shaft bushing (403).

6. A probe device according to any one of claims 2 to 5, characterized in that: The first through hole (503) and the second through hole (504) are both provided with insulating bushings (506), the probe body (101) is inserted into the corresponding insulating bushings (506), and a probe compression spring (102) is sleeved on the probe body (101), and the two ends of the probe compression spring (102) are respectively abutted against the insulating bushings (506) and the probe body (101).

7. A probe device according to any one of claims 2 to 5, characterized in that: The end face of the probe body (101) and the end face of the probe tip (103) are fitted together, and a set screw (104) threadedly connected to the end face of the probe tip (103) is provided on the probe body (101) to fix the probe body (101) and the probe tip (103) together.

8. A probe device according to any one of claims 2 to 5, characterized in that: The base plate (5) is provided with a mounting seat at the first through hole (503) and at one end of the second through hole (503) located on the second end surface (502), and each shaft bushing (403) is threadedly connected to the corresponding mounting seat so that the shaft bushing (403) is fixed on the base plate (5).

9. A probe device according to claim 1, characterized in that: The negative pressure nozzle assembly comprises a nozzle body (301), the nozzle body (301) is inserted into the third through hole (505), one end of the nozzle body (301) away from the substrate (5) is a bellows structure, and the other end of the nozzle body (301) is provided with a plurality of annular grooves on its circumference, each of the annular grooves is provided with a sealing ring (303), and each of the sealing rings (303) is provided between the nozzle body (301) and the inner wall of the third through hole (505).

10. A probe device according to claim 9, characterized in that: The limiting structure comprises: A first hemispherical annular convex body, arranged on one side of the substrate (5) located on the first end surface (501); A second hemispherical annular convex body, arranged on the outer peripheral surface of the nozzle body (301) away from the substrate (5); A nozzle spring (304) is arranged between the first hemispherical annular convex body and the second hemispherical annular convex body, and the nozzle spring (304) comprises two first annular wedges clamped on the first hemispherical annular convex body, two second annular wedges clamped on the second hemispherical annular convex body, and a limit spring (306) arranged between the first annular wedges and the second annular wedges; A first clamp (302) is provided on the two first annular wedges so that the two first annular wedges can fit tightly against the first hemispherical annular convex body, and a second clamp (305) is provided on the two second annular wedges so that the two second annular wedges can fit tightly against the second hemispherical annular convex body.

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