A data storage method and system for a bus withstand voltage test device

Abstract

The present invention relates to the technical field of data storage, and relates to a data storage method and system for a bus withstand voltage test device. The method includes collecting test data of each bus, and the lengths of the test data of each bus are the same; performing the first data block division on the test data of the bus to obtain n data blocks with the same length, and determining that the serial number of the i th data block of the bus in time sequence is i ; calculating the similarity between the data blocks with the same serial number of all buses, and taking the similarity mean value of the data block and all data blocks with the same serial number as the stability value of the data block; calculating the outlier degree of each bus; performing duplicate removal on the test data after the second data block division of the test data of the bus; encrypting and storing the duplicate-removed test data of each bus. The present invention avoids the contradiction between the deduplication rate and the storage space saving existing in the traditional deduplication method.

Description

Technical Field

[0001] The present invention generally relates to the technical field of data storage. More specifically, the present invention relates to a data storage method and system for a busbar withstand voltage test device. Background Art

[0002] A busbar withstand voltage test device is a special device used to detect the withstand voltage ability and insulation performance of the insulating material of a busbar (a conductive component in a power system). For example, the voltage breakdown tester of the HCDJC series can perform tests on the withstand voltage time under power frequency voltage. The quality of the busbar insulating material directly affects the performance and lifespan of the electrical system, and the voltage breakdown tester can timely detect potential defects or aging phenomena of the insulating material. Therefore, performing a voltage breakdown test on the busbar can ensure the safe operation of the power system. When performing a busbar withstand voltage test (or called a busbar AC withstand voltage test), it is necessary to determine the test voltage (which is greater than the rated voltage), the test frequency, and the test time, and then test whether a fault occurs (such as a change in resistance or a large leakage current) when the test voltage is applied to the busbar during the continuous test time.

[0003] Some standards (such as GB 50150-2016) require that the busbar withstand voltage test data be stored for at least 1 to 3 years for the traceability of the entire life cycle of the device. If a fault occurs in the busbar or system (such as breakdown, fire), the relevant test data needs to be stored for a long time. Therefore, the storage of the data of the busbar withstand voltage test device is crucial. When storing the data of the busbar withstand voltage test device in the prior art, data is usually stored in layers, block-level deduplication is performed, and data encryption is carried out. Among them, block-level deduplication is performed on the data to reduce redundant data, thereby reducing the computational overhead. The Chinese patent application document with the publication number CN118210718A discloses a test method and device, and this application deduplicates duplicate test data, improving the efficiency and accuracy of the test.

[0004] Conventional deduplication methods, such as block-level deduplication technology (or called block-level deduplication), identify and delete duplicate data blocks through block division and hash operations. If the data blocks obtained after dividing the data are large, the deduplication rate is low, and the saved storage space is large. However, the larger data blocks cover more data content, so they reflect more data characteristics. If the data blocks obtained after dividing the data are small, the deduplication rate is high, but the smaller data blocks reflect fewer data characteristics. Therefore, there is a problem in the prior art that it is difficult to balance the size of the data blocks and the deduplication rate. Summary of the Invention

[0005] To solve the above technical problem that it is difficult to balance the size of the data blocks and the deduplication rate when performing data deduplication, the present invention provides solutions in the following aspects.

[0006] In a first aspect, a data storage method for a bus withstand voltage test device includes: collecting the resistance values or differential voltage values at each moment within a preset time period of each bus under a preset voltage, recorded as test data, and the lengths of the test data of each bus are the same; performing a first data block division on the test data of the bus to obtain a plurality of data blocks with the same length, and determining that the serial number of the i th data block of the bus in time series is i ; calculating the similarity between the data blocks with the same serial number of all buses, and taking the similarity mean value of the data block and all data blocks with the same serial number as the stability value of this data block; calculating the outlier degree of the j th bus : where is the stability value of the data block with serial number j in the test data of the i th bus, is the minimum value of the stability values of all data blocks in the test data of the j th bus, m is the number of all buses. For the data blocks with serial number j except the i th bus, is the stability value corresponding to the k th bus, n is the number of data blocks after block division; performing duplicate removal on the test data after the second data block division of the test data of the bus, where the outlier degree of the bus is negatively correlated with the number of data blocks obtained by the second data block division; encrypting and storing the duplicate-removed test data of each bus.

[0007] The beneficial effects are as follows: After the test data of the bus is block-divided in the present invention, the similarity of each data block compared with the data blocks of the test data of other buses is obtained, and the outlier degree of the test data of the bus compared with the test data of other buses is calculated according to the similarity of each data block of the bus. When the outlier degree corresponding to the bus is large, the length of the data block obtained by block division during duplicate removal of the test data of this bus is small; when the outlier degree corresponding to the bus is small, the length of the data block obtained by block division during duplicate removal of the test data of this bus is large. Based on this, the present invention dynamically adjusts the length of the data block by combining the outlier degree, making the duplicate removal effect of the data block more refined and intelligent, reducing the cost of storing data, and retaining the necessary characteristics of the bus test data, avoiding the contradiction between the duplicate removal rate and the saving of storage space in the traditional duplicate removal method, and providing a more efficient and flexible data processing solution for practical applications.

[0008] Preferably, calculating the similarity between two data blocks with the same serial number but different busbars includes: in response to the hash values between the two data blocks being the same, determining that the similarity between the two data blocks is 1; in response to the hash values between the two data blocks being different and the test data being the resistance values within a preset time period under a preset voltage, calculating the similarity between the two data, where the similarity between the two data blocks is negatively correlated with the Euclidean distance between the two data blocks; in response to the hash values between the two data blocks being different and the test data being the differential voltage values within a preset time period under a preset voltage, determining that the similarity between the two data blocks is the cosine similarity between the two data blocks.

[0009] The beneficial effects are as follows: Using hash values to determine whether data blocks are exactly the same improves the calculation efficiency and reduces resource consumption.

[0010] Preferably, determining whether the hash values of the data blocks with serial number i of the p th busbar and the q th busbar are the same includes: performing hash calculation on the data block with serial number i of the p th busbar through the SHA256 algorithm to obtain a first hash value; performing hash calculation on the data block with serial number i of the q th busbar through the SHA256 algorithm to obtain a second hash value; in response to the first hash value being equal to the second hash value, determining that the hash values of the data blocks with serial number i of the p th busbar and the q th busbar are the same; in response to the first hash value not being equal to the second hash value, determining that the hash values of the data blocks with serial number i of the p th busbar and the q th busbar are different.

[0011] The SHA256 algorithm used in the present invention can ensure data consistency, provide strong anti-collision ability, guarantee data security, and improve efficiency.

[0012] Preferably, the formula for calculating the cosine similarity p between the data blocks with serial number q of the i th busbar and the th busbar is: , where is the differential voltage value at the p th moment in the data block with serial number i of the g th busbar, is the differential voltage value at the q th moment in the data block with serial number i of the g th busbar, p, q , g is a positive integer, t is the number of all moments in the data block.

[0013] Preferably, in response to different hash values between the two data blocks and the test data being the resistance values within a preset time period under a preset voltage, calculate the p th busbar and the q th busbar, and the formula for the similarity between the data blocks with the serial number i is: , where is p th busbar, and the resistance value at the i th moment in the data block with the serial number g , is the resistance value at the q th busbar, and the resistance value at the i th moment in the data block with the serial number g , p , q , g are positive integers, t is the number of all moments in the data block, norm is the standard normalization function.

[0014] Preferably, the formula for calculating the number of the data blocks obtained by the second data block division of the jth busbar is: , where is the maximum value of the outlier degrees of all busbars, is the median of the outlier degrees of all busbars, is the rounding function, which is used to round the value within the parentheses.

[0015] Preferably, after the second data block division of the test data of the j th busbar, the deduplication of the test data of the j th busbar includes: performing the second data block division on the test data of the j th busbar to obtain target data blocks; calculating the hash values of each target data block; in response to the same hash values of at least two target data blocks, retaining one of the target data blocks and deleting the other data blocks to achieve the deduplication of the test data of the j th busbar.

[0016] Preferably, the encryption and storage of the deduplicated test data of each busbar include: obtaining a key, and encrypting the deduplicated test data of each busbar according to the key to obtain encrypted data; storing the encrypted data.

[0017] Preferably, the key is constructed by the AES encryption algorithm.

[0018] The AES encryption algorithm used in the present invention can provide high-strength encryption protection and good performance efficiency.

[0019] In a second aspect, a data storage system for a bus bar withstand voltage test device includes a processor and a memory. The memory stores a computer program, and the processor executes the computer program to implement a data storage method for a bus bar withstand voltage test device as described in any one of the above-mentioned invention contents.

[0020] The beneficial effects of the present invention are as follows:

[0021] For the test data of bus bars with a high outlier degree (i.e., a high probability of failure during the usage stage of the life cycle), the data length of the data blocks obtained by data chunking during the deduplication process is increased to increase data features; for the test data of bus bars with a low outlier degree (i.e., a high probability of failure during the usage stage of the life cycle), the data length of the data blocks obtained by data chunking during the deduplication process is reduced to increase the deduplication rate and reduce the data storage cost. Based on this, by dynamically adjusting the length of the data blocks, the present invention minimizes the cost of storing data while retaining the necessary features of the bus bar test data, avoiding the contradiction between the deduplication rate and the saving of storage space existing in traditional deduplication methods. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] By reading the following detailed description with reference to the accompanying drawings, the above and other objects, features, and advantages of the exemplary embodiments of the present invention will become readily understood. In the drawings, several embodiments of the present invention are shown in an exemplary rather than restrictive manner, and the same or corresponding reference numerals represent the same or corresponding parts, wherein:

[0023] Figure 1 is a schematic flowchart showing the steps of a data storage method for a bus bar withstand voltage test device according to an embodiment of the present invention;

[0024] Figure 2 is a schematic block diagram showing the structure of a data storage system for a bus bar withstand voltage test device according to this embodiment. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0026] The specific embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0027] Figure 1 It is a flowchart schematically showing the steps of a data storage method for a busbar withstand voltage test device according to an embodiment of the present invention.

[0028] like Figure 1 As shown, a data storage method for busbar withstand voltage testing equipment includes steps S1 to S6.

[0029] Step S1: collecting the resistance value or differential voltage value of each bus at each moment in a preset time period under a preset voltage, and recording it as test data.

[0030] The length of the test data of each bus is the same.

[0031] It should be noted that the equipment for voltage withstand testing on the busbar will apply a voltage higher than the rated voltage of the busbar for a certain period of time to check the electrical characteristics and tolerance of the busbar when subjected to high voltage.

[0032] In one embodiment, for a high-voltage busbar with a rated voltage of 10KV and a model of TMY-3, the withstand voltage test equipment applies a test voltage of 42KV (i.e., a preset voltage) to it for 60s (i.e., a preset time period). The resistance value of A relative to phase B, the resistance value of A relative to phase C, and the resistance value of A relative to ground (insulation resistance value) of the busbar at each moment are collected, and the differential voltage of the busbar at each moment is collected. The resistance value used to calculate the similarity is any one of the resistance value of A relative to phase B, the resistance value of A relative to phase C, and the resistance value of A relative to ground.

[0033] In other embodiments, the resistance value of the busbar at each moment is collected: the resistance value of B relative to A phase, the resistance value of B relative to C phase, and the resistance value of B relative to ground (insulation resistance value) at each moment, or the resistance value of C relative to A phase, the resistance value of C relative to B phase, and the resistance value of C relative to ground (insulation resistance value) at each moment.

[0034] It should be noted that the purpose of collecting the resistance value of the busbar is to determine the insulation performance of the busbar under high voltage and ensure the safe operation of the busbar under high voltage; the purpose of collecting the differential voltage of the busbar is to monitor the voltage balance and system stability and help to timely discover potential electrical faults or imbalance problems. In the embodiment of the present invention, the test data of each busbar are all values ​​within the normal range.

[0035] Step S2: first divide the test data of the bus into blocks to obtain multiple data blocks of the same length, and determine the first data block of the bus in the timing sequence. i The sequence number of the data block is i ;

[0036] It should be noted that for the test data of a busbar, n several data blocks. The data blocks are arranged in order from left to right. The serial number of the leftmost first data block is 1, the serial number of the leftmost second data block is 2, and so on.

[0037] In one embodiment, after the test data is segmented, the n length of several data blocks is 4KB (or within the range of 3KB to 4KB). That is to say, in this embodiment, the preset value is determined according to the data length of the test data. n For example, if the data length of the test data is 64KB, then n it is 16.

[0038] Step S3: Calculate the similarity between the data blocks with the same serial number of all busbars. The average similarity of the data block with all data blocks having the same serial number as it is the stability value of this data block.

[0039] It should be noted that since the busbar models are the same, that is, the design, materials, and electrical properties of the busbars are very similar. Therefore, even for different busbars, the electrical characteristics shown in the data blocks with the same serial number will be highly similar. In quality inspection, usually by comparing with the data of other qualified busbars, potential defects can be found. If a certain busbar shows a large difference in electrical performance from other busbars under the same detection conditions, even if the busbar passes the detection and is not determined to be faulty, it may still have potential instability. For example, although the busbar as a whole passes the detection, there may be minor defects or non-uniformities locally. These defects may gradually intensify under long-term operation or certain specific load conditions, resulting in unstable electrical performance of the busbar. Based on this, the average similarity of the data block with all data blocks having the same serial number as it (that is, the stability value of the data block) reflects the difference in electrical performance of the data block compared with other busbars. The larger the stability value of the data block, the smaller the probability of potential defects and the more stable its performance.

[0040] In one embodiment, calculating the similarity between two data blocks of different busbars with the same serial number includes: in response to the hash values of the two data blocks being the same, determining that the similarity between the two data blocks is 1; in response to the hash values of the two data blocks being different, and the test data being the resistance value within a preset time period under a preset voltage, calculating the similarity between the two data, where the similarity between the two data blocks is negatively correlated with the Euclidean distance between the two data blocks; in response to the hash values of the two data blocks being different, and the test data being the differential voltage value within a preset time period under a preset voltage, determining that the similarity between the two data blocks is the cosine similarity between the two data blocks.

[0041] It should be noted that by comparing the hash values of two data blocks, it is determined whether the two data blocks (the two data blocks need to be the same) are exactly the same, and the similarity of the exactly same data blocks is determined to be one, which reduces the subsequent calculation amount and does not require further detailed calculation of the data to confirm that the two data blocks are exactly the same.

[0042] Among them, judging whether the hash values between the p th busbar and the q th busbar for the data block with sequence number i includes: performing hash calculation on the data block with sequence number i of the p th busbar through the SHA256 algorithm to obtain a first hash value; performing hash calculation on the data block with sequence number i of the q th busbar through the SHA256 algorithm to obtain a second hash value; in response to the first hash value being equal to the second hash value, determining that the hash values between the p th busbar and the q th busbar for the data block with sequence number i are the same; in response to the first hash value not being equal to the second hash value, determining that the hash values between the p th busbar and the q th busbar for the data block with sequence number i are different.

[0043] It should be noted that SHA-256 (Secure Hash Algorithm 256-bit) is a cryptographic hash algorithm and belongs to the SHA-2 (Secure Hash Algorithm 2) family. It converts the input data (regardless of the length of the data) into a fixed-length 256-bit (32-byte) hash value.

[0044] Among them, the formula for calculating the cosine similarity p between the q th busbar and the i data block with sequence number is: , where is the differential voltage value at the p th moment in the data block with sequence number i of the g th busbar, is the differential voltage value at the q th moment in the data block with sequence number i of the g th busbar, p , q , g are positive integers, t is the number of all moments in the data block, norm is the standard normalization function.

[0045] It should be noted that each piece of data with a specific serial number in any bus test data corresponds to a stable value. In one embodiment, there are a total of m groups of bus test data, and the stable value of the data block with serial number i in the j-th (group) bus test data is calculated The formula is:

[0046] .

[0047] Where is the stable value of the data block with serial number i in the j-th (group) bus test data;

[0048] Denote the bus test data other than the j-th bus test data as target data. Then there are m - 1 pieces of target data, that is, m - 1 represents the quantity of the target data; is the similarity between the data block with serial number i in the j-th (group) bus test data and the data block with serial number i in the x-th group of target data.

[0049] The calculation of the similarity between any two data blocks with the same serial number and not belonging to the same bus test data has been described above regarding when it is 1, the Euclidean distance between data blocks, or the cosine similarity between data blocks. Therefore, it will not be elaborated here.

[0050] It should be noted that the cosine similarity ignores the amplitude and pays more attention to the change trend. Therefore, using the cosine similarity between data blocks as the similarity between the two can better reflect the similarity of the differential voltage change trends of the two. The greater the cosine similarity between two data blocks, the more similar the differential voltage change trends of the two.

[0051] Among them, in response to the hash values of the two data blocks being different, and the test data being the resistance values within a preset time period under a preset voltage, calculate the p th bus and the q th bus for the data block with serial number i The formula for the similarity is: , where is the resistance value at the p th moment in the data block with serial number i of the g th bus, is the resistance value at the q th moment in the data block with serial number i of the g th bus, p , q , g are positive integers, t is the number of all moments in the data block. is the p th bus and theq The serial number of a busbar is i the Euclidean distance between data blocks.

[0052] It should be noted that the Euclidean distance is sensitive to absolute numerical differences. Therefore, the Euclidean distance calculated based on all the resistance values of two data blocks can more accurately reflect the abnormal resistance values caused by insulation deterioration. The greater the Euclidean distance between two data blocks, the smaller the similarity between them, and the more similar the insulation performance of the busbars reflected by them.

[0053] Step S4: Calculate the outlier degree of each busbar.

[0054] Among them, when calculating the outlier degree j of the -th busbar:

[0055] , where is the stability value of the data block with serial number j in the test data of the i -th busbar, is the minimum value of the stability values of all data blocks in the test data of the j -th busbar, m is the number of all busbars. For the data block with serial number j except the i -th busbar, is the stability value corresponding to the k -th busbar, n is the number of data blocks after partitioning.

[0056] It should be noted that the average similarity of a data block with all data blocks having the same serial number reflects the difference in the electrical performance (insulation ability or current stability after power-on) of the data block compared to other busbars. Therefore, the minimum value of the stability values of all data blocks in the busbar test data reflects the worst electrical performance of the busbar under test conditions. The greater the possibility that the j -th busbar will fail subsequently, and the greater the possibility of using the test data of the j -th busbar. At this time, when partitioning and de-duplicating the data of this busbar, data blocks with a longer data length should be set to retain the data characteristics of the data blocks to a greater extent.

[0057] is the average value of the differences in the stability values of all data blocks with the same serial number between the j -th busbar and the k -th busbar except itself, which reflects the difference in the stability of the test data between the two busbars. Therefore, reflects the difference in stability between the j -th busbar and all busbars except itself. The greater this difference, the greater thej The greater the degree of outlier of the detection data of a busbar, that is, the greater the difference in electrical stability between the j-th busbar and the general busbar, so the j greater the likelihood of the j-th busbar failing subsequently, and the greater the likelihood of using the detection data of the j j-th busbar. At this time, when performing data chunking and deduplication on this busbar, data chunks with a longer data length should be set to retain the data characteristics of the data chunks to a greater extent.

[0058] In summary, the greater, the smaller, the j outlier degree of the j-th busbar the greater, the j greater the probability of the j-th busbar failing during its subsequent life cycle. When performing data chunking and deduplication on this busbar subsequently, data chunks with a longer data length need to be set.

[0059] Step S5: After the second data chunking of the test data of the busbar, deduplicate the test data.

[0060] Among them, the outlier degree of the busbar is negatively correlated with the number of data chunks obtained from the second data chunking.

[0061] In one embodiment, the formula for calculating the j number of data chunks obtained from the second data chunking of the j-th busbar is: , where is the maximum value of the outlier degrees of all busbars, is the median of the outlier degrees of all busbars, is the rounding function, which is used to round the value within the parentheses.

[0062] It should be noted that The median of the outlier degrees of all busbars reflects the stability of the electrical performance of most busbars. Therefore, if the outlier degree of a certain busbar is higher than this median, it means that the performance or state of this busbar has large fluctuations or anomalies, and there may be potential fault risks. Its instability is relatively high, and the possibility of a fault occurring is also greater; if the outlier degree of a certain busbar is lower than this median, it indicates that the state of this busbar is relatively stable, and its performance is more consistent with that of other busbars. Based on this, in the embodiments of the present invention, when the outlier degree of a busbar is higher than this median, the number of data blocks obtained by the second data block division of this busbar is relatively large, and at this time, the length of the data blocks obtained by the second data block division of the busbar is relatively short, increasing the deduplication rate to reduce storage costs; when the outlier degree of a busbar is lower than this median, the number of data blocks obtained by the second data block division of this busbar is relatively small, and at this time, the length of the data blocks obtained by the second data block division of the busbar is relatively long, increasing the characteristics of the test data of the stored busbars.

[0063] Step S6: Encrypt and store the test data after deduplication for each busbar.

[0064] In one embodiment, the encrypting and storing the test data after deduplication for each busbar includes: obtaining a key, and encrypting the test data after deduplication for each busbar according to the key to obtain encrypted data; storing the encrypted data. Among them, the key is constructed by the AES encryption algorithm. Specifically, the AES algorithm uses a key to encrypt and decrypt data, and the length of this key can be 128 bits, 192 bits or 256 bits.

[0065] Figure 2 It schematically shows a structural block diagram of a data storage system for a busbar withstand voltage test device according to an embodiment of the present invention.

[0066] The present invention also provides a data storage system for a busbar withstand voltage test device. As Figure 2 shown, the system includes a processor and a memory, and the memory stores computer program instructions, and when the computer program instructions are executed by the processor, it implements a data storage method for a busbar withstand voltage test device according to the first aspect of the present invention.

[0067] In the present invention, the foregoing memory may be any tangible medium that contains or stores a program, which can be used by or in conjunction with an instruction execution system, apparatus, or device. For example, a computer-readable storage medium may be any suitable magnetic storage medium or magneto-optical storage medium, such as a resistive random access memory (RRAM), a dynamic random access memory (DRAM), a static random access memory (SRAM), an enhanced dynamic random access memory (EDRAM), a high-bandwidth memory (HBM), a hybrid memory cube (HMC), etc., or any other medium that can be used to store the required information and can be accessed by an application, a module, or both. Any such computer storage medium may be part of the device or accessible or connectable to the device. Any application or module described in the present invention may be implemented using computer-readable / executable instructions that can be stored or otherwise held by such a computer-readable medium.

[0068] In the description of this specification, the meanings of "a plurality of" and "several" are at least two, such as two, three, or more, etc., unless otherwise specifically defined.

[0069] Although this specification has shown and described multiple embodiments of the present invention, it will be apparent to those skilled in the art that such embodiments are provided by way of example only. Those skilled in the art will think of many changes, alterations, and alternative ways without departing from the spirit and scope of the present invention. It should be understood that various alternatives to the embodiments of the present invention described herein may be employed in the practice of the present invention.

Claims

1. A data storage method for busbar withstand voltage test equipment, characterized in that: include: Collect the resistance value or differential voltage value of each bus at each moment in a preset time period under a preset voltage, and record it as test data. The length of the test data of each bus is the same; The test data of the bus is first divided into blocks to obtain multiple data blocks of the same length, and the first data block of the bus in terms of timing is determined. i The sequence number of the data block is i ; Calculate the similarity between all data blocks with the same serial number on the bus, and take the average similarity between a data block and all data blocks with the same serial number as the stable value of the data block; Calculate the j The outlier degree of the bus : ,in For the j The serial number of the bus test data is i The stable value of the data block, For the j The minimum value of the stable value of all data blocks in the bus test data, m is the number of all buses, except for j The serial number outside the busbar is i The data block, For the k The stable value corresponding to the busbar is n is the number of data blocks after segmentation; After the test data of the bus is divided into blocks for the second time, the test data is deduplicated, wherein the outlier degree of the bus is negatively correlated with the number of data blocks obtained by the second data division; The test data of each bus after deduplication is encrypted and stored.

2. A data storage method for busbar withstand voltage test equipment according to claim 1, characterized in that: Calculating the similarity between two data blocks with the same sequence number but different buses includes: In response to the hash values ​​between the two data blocks being the same, determining that the similarity between the two data blocks is 1; In response to the hash values ​​between the two data blocks being different and the test data being a resistance value within a preset time period under a preset voltage, the similarity between the two data blocks is calculated, wherein the similarity between the two data blocks is negatively correlated with the Euclidean distance between the two data blocks; in response to the hash values ​​between the two data blocks being different and the test data being a differential voltage value within a preset time period under a preset voltage, the similarity between the two data blocks is determined to be the cosine similarity between the two data blocks.

3. A data storage method for busbar withstand voltage test equipment according to claim 2, characterized in that: Judgement p The busbar and q Whether the hash values ​​of the data blocks with serial number i of the buses are the same includes: The SHA256 algorithm is used to p The data block with the serial number i of the bus is hashed to obtain the first hash value; the first hash value is hashed by the SHA256 algorithm q Perform hash calculation on the data block with serial number i of the bus to obtain a second hash value; In response to the first hash value being equal to the second hash value, determining p The busbar and q The hash values ​​of the data blocks with serial number i on the buses are the same; In response to the first hash value not being equal to the second hash value, determining p The busbar and q The hash values ​​of the data blocks with sequence number i on the buses are different.

4. A data storage method for busbar withstand voltage test equipment according to claim 2, characterized in that: Calculate the p The busbar and q The serial number of the busbar is i The cosine similarity between the data blocks The formula is: ,in for p The serial number of the busbar is i In the data block g The differential voltage value at time For the q The serial number of the busbar is i In the data block g The differential voltage value at time p , q , g is a positive integer, t is the number of all moments in the data block, norm is the standard normalization function.

5. A data storage method for busbar withstand voltage test equipment according to claim 2, characterized in that: In response to the hash values ​​between the two data blocks being different, and the test data being a resistance value within a preset time period under a preset voltage, calculating the p The busbar and q The formula for the similarity between the data blocks with sequence number i in the bus is: ,in for p The serial number of the busbar is i In the data block g The resistance value at the moment, For the q The serial number of the busbar is i In the data block g The resistance value at the moment, p , q , g is a positive integer, t is the number of all moments in the data block.

6. A data storage method for busbar withstand voltage test equipment according to claim 1, characterized in that: Calculate the number of data blocks obtained by the second data segmentation of the jth bus The formula is: ,in is the maximum outlier degree of all busbars, is the median of the outliers of all bus lines, It is a rounding function, which is used to round the value in brackets.

7. A data storage method for busbar withstand voltage test equipment according to claim 1, characterized in that: For j After the test data of the bus is divided into blocks for the second time, j The test data of each bus is deduplicated including: The said j The test data of the busbars is divided into blocks for the second time to obtain target data blocks; Calculate the hash value of each target data block; In response to the hash values ​​of at least two target data blocks being the same, one of the target data blocks is retained and the other data blocks are deleted to achieve the j Deduplication of test data for each bus.

8. A data storage method for busbar withstand voltage test equipment according to claim 1, characterized in that: The encrypting and storing the test data after deduplication of each bus includes: Obtain a key, and encrypt the deduplicated test data of each bus according to the key to obtain encrypted data; The encrypted data is stored.

9. A data storage method for busbar withstand voltage test equipment according to claim 8, characterized in that: The key is constructed by the AES encryption algorithm.

10. A data storage system for a busbar withstand voltage test device, comprising a processor and a memory, wherein the memory stores a computer program, characterized in that: The processor executes the computer program to implement a data storage method for a busbar withstand voltage testing device as described in any one of claims 1 to 9.

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