Method, device and equipment for correcting control rod check curve and medium

CN119993581AActive Publication Date: 2025-05-13CHINA NUCLEAR POWER ENGINEERING COMPANY LTD
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Patent Information

Application Number
CN202510141152.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-02-08
Publication Date
2025-05-13
Estimated Expiration
2045-02-08

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Abstract

The invention provides a correction method, device and equipment for a control rod check curve and a medium, and the correction method comprises the steps: obtaining a reference temperature curve during a load reduction period; correcting the reference temperature curve according to the negative reactivity introduced by xenon to generate a xenon correction curve; calculating an overheating correction curve according to a set balance coefficient, a primary loop completely untracked curve and a xenon correction curve; according to the overheating correction curve and the reference temperature curve, power data in the overheating correction curve and overheating correction power data corresponding to the power data are calculated, and an overheating correction parameter set is generated; and correcting the control rod verification curve according to the overheating correction parameter set to generate a corrected control rod verification curve. According to the correction method, device and equipment for the control rod verification curve and the medium provided by the invention, the control rod verification curve can be corrected so as to adapt to different units.
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Description

Technical Field

[0001] The present invention relates to the field of nuclear power, and in particular to a correction method, device, equipment and medium for a control rod calibration curve. Background Art

[0002] The control rod calibration curve (G9 curve) is an important function for achieving power matching between the primary and secondary circuits of the reactor. In the operation of a nuclear power plant, the G9 curve is used to ensure that the core power of the reactor matches the load of the steam turbine to maintain the safe and efficient operation of the nuclear power plant. At present, the nuclear power units under construction and in operation in China generally adopt a set of G9 curve calibration methods that have been used for a long time. This method is based on reactivity balance calibration and the superheat parameter correction of the curve is performed.

[0003] There are significant differences in the thermal hydraulic characteristics, material properties and operating conditions of different reactor types, but the existing calibration methods almost consistently use the same superheat parameter correction on different reactor types. This may lead to deviations in the calibration results, thus affecting the overall performance and safety of the nuclear power plant. Therefore, there is room for improvement. Summary of the invention

[0004] The object of the present invention is to provide a control rod calibration curve correction method, device, equipment and medium, which can correct the control rod calibration curve to adapt to different units.

[0005] In order to solve the above technical problems, the present invention is achieved through the following technical solutions:

[0006] The present invention provides a method for correcting a control rod calibration curve, comprising:

[0007] During the load reduction period, obtain a reference temperature curve;

[0008] Correcting the reference temperature curve according to the negative reactivity introduced by xenon to generate a xenon correction curve;

[0009] Calculating an overheat correction curve according to a set balance coefficient, a completely untracked curve of a primary circuit, and the xenon correction curve;

[0010] According to the overheat correction curve and the reference temperature curve, the power data in the overheat correction curve and the corresponding overheat correction power data are calculated, and an overheat correction parameter set is generated;

[0011] The control rod calibration curve is corrected according to the overheat correction parameter set to generate a corrected control rod calibration curve.

[0012] In one embodiment of the present invention, the step of obtaining a reference temperature curve during the load reduction period includes:

[0013] Generate a corresponding overcooling protection curve and an overheating protection curve according to the acquired overheating protection data, the undercooling protection data, the first temperature data corresponding to the core when the power data is maximum, and the second temperature data corresponding to the core when the power data is minimum;

[0014] During the load reduction period, a reference temperature curve is generated according to the subcooling temperature curve and the superheating temperature curve.

[0015] In one embodiment of the present invention, the step of generating a reference temperature curve according to the subcooling temperature curve and the superheating temperature curve during the load reduction period includes:

[0016] During the load reduction period, the core is subjected to load reduction processing according to preset conditions, and corresponding reference temperature data is obtained according to the power data;

[0017] The first temperature data, power data and their corresponding reference temperature data are fitted to generate a reference temperature curve.

[0018] In one embodiment of the present invention, the step of correcting the reference temperature curve according to the negative reactivity introduced by xenon to generate a xenon correction curve comprises:

[0019] Obtain power data as a function of the negative reactivity introduced by xenon;

[0020] Calculating power data and corresponding xenon temperature data according to the ratio of the functional relationship to the temperature coefficient, and generating a xenon correction data set;

[0021] The reference temperature curve is corrected according to the xenon correction data set to generate a xenon correction curve.

[0022] In one embodiment of the present invention, the step of correcting the reference temperature curve according to the xenon correction data set to generate a xenon correction curve includes:

[0023] Acquire the power data and the corresponding xenon temperature data in the xenon correction data set, and acquire the power data and the corresponding reference temperature data in the reference temperature curve;

[0024] Calculating the sum of the corresponding xenon temperature data and the corresponding reference temperature data under each power data to generate corresponding xenon corrected temperature data;

[0025] Each power data and its corresponding xenon-corrected temperature data are fitted to generate a xenon correction curve.

[0026] In one embodiment of the present invention, the step of calculating the overheat correction curve according to the set balance coefficient, the first loop completely untracked curve, and the xenon correction curve comprises:

[0027] Setting a loop completely untracked curve according to the first temperature data in the reference temperature curve;

[0028] An overheat correction curve is generated according to the set balance coefficient, the first loop completely untracked curve, and the xenon correction curve.

[0029] In one embodiment of the present invention, the step of setting the balance coefficient and generating the overheat correction curve according to the balance coefficient, the first loop completely untracked curve, and the xenon correction curve comprises:

[0030] Under each power data, determining the constant temperature data of the first loop that does not track the curve at all and the xenon corrected temperature data of the xenon corrected curve;

[0031] Calculating overheat correction temperature data according to the set balance coefficient, the constant temperature data and the corresponding xenon correction temperature data; wherein, under each power data, the difference between the constant temperature data and the overheat correction temperature data is recorded as a first temperature difference, the difference between the overheat correction temperature data and the xenon correction temperature data is recorded as a second temperature difference, and the ratio of the first temperature difference to the corresponding second temperature difference is equal to the balance coefficient;

[0032] Each power data and its corresponding overheat correction temperature data are fitted to generate an overheat correction curve.

[0033] In one embodiment of the present invention, the step of calculating the power data in the overheat correction curve and its corresponding overheat correction power data according to the overheat correction curve and the reference temperature curve, and generating an overheat correction parameter set includes:

[0034] calculating the difference between the corresponding overheat correction temperature data in the overheat correction curve and the corresponding reference temperature data in the reference temperature curve under each power data, and generating temperature difference correction data;

[0035] Inputting the temperature difference correction data corresponding to each power data into the reference temperature curve to calculate the corresponding overheat correction power data;

[0036] An overheat correction parameter set is generated according to each power data and the corresponding overheat correction power data.

[0037] In one embodiment of the present invention, the step of correcting the control rod calibration curve according to the overheat correction parameter set to generate a corrected control rod calibration curve comprises:

[0038] Under each power data, the difference between the corresponding overheating corrected power data and the initial corrected power data in the control rod calibration curve is calculated to generate target correction data; wherein the control rod calibration curve represents the relationship between the power data and the control rod position, and each power data in the control rod calibration curve corresponds to an initial corrected power data and a control rod position;

[0039] Correcting the corresponding power data according to the target correction data to generate corrected power data;

[0040] The corrected power data and the corresponding control rod positions are fitted to generate a corrected control rod calibration curve.

[0041] The present invention also provides a control rod calibration curve correction device, comprising:

[0042] A data acquisition module, used for acquiring a reference temperature curve during a load reduction period;

[0043] A first correction module, used for correcting the reference temperature curve according to the negative reactivity introduced by xenon to generate a xenon correction curve;

[0044] A second correction module is used to calculate an overheat correction curve according to a set balance coefficient, a completely untracked curve of a primary circuit, and the xenon correction curve;

[0045] A data calculation module, used for calculating the power data in the overheat correction curve and the corresponding overheat correction power data according to the overheat correction curve and the reference temperature curve, and generating an overheat correction parameter set;

[0046] The third correction module is used to correct the control rod calibration curve according to the overheat correction parameter set to generate a corrected control rod calibration curve.

[0047] The present invention also provides a computer device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of the control rod calibration curve correction method are implemented.

[0048] The present invention also provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the steps of correcting the control rod calibration curve are implemented.

[0049] As described above, the present invention provides a correction method, device, equipment and medium for a control rod calibration curve, which ensures that the control rod calibration curve can accurately reflect the changes in the physical characteristics of the reactor under different cycles, different loading schemes and different fuel consumption conditions by guiding the correction work of the superheat correction parameters of the control rod calibration curve. By evaluating the risks of overcooling and overheating that may be caused by the temperature of the first circuit during the control rod calibration curve test, the operator is helped to make safer decisions in the test. By setting reasonable superheat correction parameters, the test risks of subsequent control rod calibration can be effectively reduced and the success rate of the test can be improved. The core characteristics and power requirements of different units may be different. By setting personalized superheat correction parameters for different units, the operation control of each unit is ensured to be more accurate and safe. In the first cycle and subsequent cycles, the change of the core isothermal temperature coefficient will affect the thermal hydraulic characteristics of the reactor. Through reasonable superheat correction, these changes can be compensated, the accuracy of temperature control can be ensured, and the risk of subsequent tests can be reduced.

[0050] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0051] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for describing the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.

[0052] Figure 1 It is a flow chart of a method for correcting a control rod calibration curve in one embodiment of the present invention;

[0053] Figure 2 A schematic diagram of an overcooling protection curve, an overheating protection curve, and a reference temperature curve in one embodiment of the present invention;

[0054] Figure 3 A schematic diagram of the negative reactivity of xenon poisoning introduced during load reduction in one embodiment of the present invention;

[0055] Figure 4 It is a schematic diagram of the temperature changes of the first and second circuits during load reduction in one embodiment of the present invention;

[0056] Figure 5 is a schematic diagram of a xenon correction curve in one embodiment of the present invention;

[0057] Figure 6 It is a schematic diagram of a loop in an embodiment of the present invention that does not track the curve at all;

[0058] Figure 7Schematic diagram of an overheat correction curve when the balance coefficient is 3 in one embodiment of the present invention;

[0059] Figure 8 Schematic diagram of an overheat correction curve when the balance coefficient is 4 in one embodiment of the present invention;

[0060] Fig. 9 is a schematic diagram of a control rod calibration curve after correction in one embodiment of the present invention;

[0061] Fig.10 It is a schematic diagram of a control rod calibration curve correction device in one embodiment of the present invention;

[0062] Fig.11 FIG. 4 is a schematic diagram of an electronic device according to an embodiment of the present invention.

[0063] In the figure:

[0064] 100. Data acquisition module; 200. First correction module; 300. Second correction module; 400. Data calculation module; 500. Third correction module; 1. Electronic device; 12. Memory; 13. Processor. DETAILED DESCRIPTION

[0065] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0066] See also Figure 1 The present invention discloses a correction method for a control rod calibration curve, which can be used to correct the control rod calibration curve so that the corrected control rod calibration curve can be applied to overheat correction of units with different technical sequences and different power sizes. The correction method may include the following steps:

[0067] Step S10, during the load reduction period, obtaining a reference temperature curve;

[0068] Step S20, correcting the reference temperature curve according to the negative reactivity introduced by xenon to generate a xenon correction curve;

[0069] Step S30, calculating an overheat correction curve according to a set balance coefficient, a first-loop completely untracked curve, and a xenon correction curve;

[0070] Step S40, calculating the power data in the overheat correction curve and the corresponding overheat correction power data according to the overheat correction curve and the reference temperature curve, and generating an overheat correction parameter set;

[0071] Step S50: Correct the control rod calibration curve according to the overheat correction parameter set to generate a corrected control rod calibration curve.

[0072] In one embodiment, when executing step S10, specifically, step S10 may include the following steps:

[0073] Step S11, generating a corresponding overcooling protection curve and an overheating protection curve according to the acquired overheating protection data, the overcooling protection data, the first temperature data corresponding to the core when the power data is maximum, and the second temperature data corresponding to the core when the power data is minimum;

[0074] Step S12: During the load reduction period, a reference temperature curve is generated according to the subcooling temperature curve and the superheating temperature curve.

[0075] See also Figure 2 In one embodiment, when executing step S11, specifically, the setting of the control rod calibration curve is mainly used to ensure that the reactor achieves power balance between the first and second circuits. The first circuit is the reactor coolant system, and the second circuit is the steam turbine system.

[0076] In one embodiment, during steady-state operation, power balance refers to the matching of the heat energy generated by the reactor with the heat energy demand in the secondary circuit system. Under normal operating conditions, the reactor is in a stable state and the power output is relatively constant. At this time, the control rod calibration curve should ensure the power balance of the primary and secondary circuits, so that the reactor operates in a safe and efficient state.

[0077] In one embodiment, during transients, power balance needs to ensure that the reactor can respond quickly to load changes without triggering protection actions. When load changes or other transient events occur, the reactor needs to quickly adjust power output to match the needs of the secondary circuit. At this time, the control rod calibration curve should ensure power balance between the primary and secondary circuits during transients while preventing the reactor from overheating or overcooling.

[0078] In one embodiment, when there is no significant deviation in the initial control rod position setting, the control of the test transient process mainly focuses on the superheat of the reactor. Superheat refers to the difference between the temperature of the primary circuit coolant and the temperature of the steam at the outlet of the secondary circuit steam generator. The control of superheat needs to take into account the overcooling protection and overheating protection.

[0079] In one embodiment, the overcooling protection means that during the test, the control rod insertion (rod insertion) or the accumulation of xenon poisoning will cause the average temperature of the primary circuit to decrease. In order to prevent the triggering of the overcooling protection signal (C22 signal), when the average temperature of the primary circuit is less than the overcooling protection data (4°C), the load reduction should be stopped. The C22 signal is used to trigger the overcooling protection to prevent the temperature from being too low to cause equipment damage or system failure.

[0080] In one embodiment, overheat protection means that during the test, if the core temperature is too high, the protection valve GCT-A of the steam generator may be opened, thereby causing a safety problem. Therefore, when the core overheats and exceeds the overheat protection data (6°C), the load reduction should be stopped to prevent the core from overheating.

[0081] In one embodiment, a certain unit is used as an example for explanation. The first temperature data corresponding to the core of the unit when the power data is the maximum can be obtained, that is, when it is at 100% power, the primary circuit temperature is 304°C. Subsequently, the second temperature data corresponding to the core of the unit when the power data is the minimum can be obtained, that is, when it is at 0% power, the primary circuit temperature is 292°C. The temperature difference between 100% power and 0% power of the unit is 12°C.

[0082] See also Figure 2 In one embodiment, when drawing the overcooling protection curve, at 100% power, the primary circuit temperature is 304°C, and the minimum allowable temperature is 304°C-4°C=300°C. At 0% power, the primary circuit temperature is 292°C, and the minimum allowable temperature is 292°C-4°C=288°C. At this time, these two points can be connected to draw the overcooling protection curve (such as Figure 2 Subcooling control in -4℃). Figure 2 The horizontal axis represents the power data of the unit, expressed in percentage; the vertical axis represents the relative temperature (temperature relative to the reference temperature of 294°C).

[0083] See also Figure 2 In one embodiment, when drawing the overheat protection curve, at 100% power, the primary circuit temperature is 304°C, and the minimum allowable temperature is 304°C + 6°C = 310°C. At 0% power, the primary circuit temperature is 292°C, and the minimum allowable temperature is 292°C + 6°C = 298°C. At this time, these two points can be connected to draw the overheat protection curve (such as Figure 2 Superheat control in +6℃).

[0084] In one embodiment, when step S12 is executed, specifically, step S12 may include the following steps:

[0085] Step S121: During the load reduction period, the core is subjected to load reduction processing according to preset conditions, and corresponding reference temperature data is obtained according to the power data;

[0086] Step S122: Fit the first temperature data, the power data and their corresponding reference temperature data to generate a reference temperature curve.

[0087] In one embodiment, when executing step S121, specifically, the preset condition can be expressed as the turbine load is reduced from 100% FP to 100MW at a rate of 30MW / min at the beginning of the test, and then reduced to 50% FP at a rate of 50MW / min. For example, at the beginning of the test, the turbine load is reduced from 100% FP (full power). The test is divided into two stages for load reduction: the first stage is to reduce the load by 100MW at a rate of 30MW / min; the second stage is to reduce the load to 50% FP at a rate of 50MW / min. The test goal is to quickly reduce the load of the reactor from 100% FP to 50% FP, and collect the change data of each parameter of the first and second circuits in the process. Among them, the parameters may include power data and reference temperature data. During the load reduction period, it is necessary to record the core power and the corresponding reference temperature data at each moment.

[0088] See also Figure 2 In one embodiment, after obtaining the first temperature data (304°C), the power data and the corresponding reference temperature data, these data can be fitted to generate a reference temperature curve (such as Figure 2 Reference temperature tracking in ).

[0089] In one embodiment, when step S20 is executed, specifically, step S20 may include the following steps:

[0090] Step S21, obtaining a functional relationship between power data and negative reactivity introduced by xenon;

[0091] Step S22, calculating the power data and its corresponding xenon temperature data according to the ratio of the functional relationship to the temperature coefficient, and generating a xenon correction data set;

[0092] Step S23: Correct the reference temperature curve according to the xenon correction data set to generate a xenon correction curve.

[0093] In one embodiment, when step S21 is performed, specifically, xenon poison (Xenon-135) is a strong neutron absorber, and its concentration is closely related to the neutron flux level of the reactor. Neutron flux refers to the number of neutrons passing through a unit area per unit time. The power level of the reactor is mainly determined by the neutron flux. Xenon-135 is mainly produced by the beta decay of the fission product iodine-135. The half-life of iodine-135 is about 6.7 hours, while the half-life of xenon-135 is about 9.2 hours. When the reactor power decreases, the neutron flux decreases, and the production rate of iodine-135 decreases, but its decay rate into xenon-135 is still high, resulting in an increase in the concentration of xenon-135. When the reactor power decreases, the concentration of xenon-135 will first increase to a maximum value, because the decay of iodine-135 continues to produce xenon-135, and the process of absorbing neutrons by xenon-135 slows down. The increase in xenon-135 concentration will absorb more neutrons and introduce negative reactivity, which will cause the core power to further decrease. As the power decreases and the neutron flux decreases further, the production rate of xenon-135 decreases, while its absorption rate remains high, causing its concentration to gradually decrease and tend toward a lower equilibrium value. Among them, only short-term effects (such as within a dozen minutes) are considered in this test process, and long-term effects (such as after a few hours) are not considered.

[0094] See also Figure 3 In one embodiment, during the test, the measurement of the change of xenon toxicity with power is based on a specific value under a specific core power condition. For example, the nuclear power plant physical parameter report will provide the functional relationship between power data and negative reactivity introduced by xenon during the first cycle from full power (100% FP) to 50% FP. At a specific power level, the corresponding negative reactivity value introduced by xenon toxicity can be found. The functional relationship between power data and negative reactivity introduced by xenon can be expressed as: Δρ Xe =-f(Pr). Where, Δρ Xe It is expressed as the negative reactivity introduced by xenon, and Pr is the power data of the core. Figure 3 As shown, Figure 3 The horizontal axis represents the power data of the unit, expressed in the form of percentage, that is, relative power; the vertical axis represents the negative reactivity introduced by xenon, that is, xenon reactivity.

[0095] In one embodiment, the temperature coefficient refers to the change in reactor reactivity when the core temperature changes. During the test, the temperature coefficient is negative, that is, when the core temperature increases, the reactivity decreases; when the core temperature decreases, the reactivity increases. When the power decreases, the xenon poisoning concentration increases, introducing negative reactivity, causing the core power to further decrease. Due to the negative reactivity introduced by the xenon poisoning, the core temperature will first decrease. However, because the temperature coefficient is negative, the decrease in core temperature will cause the reactivity to increase, partially offsetting the negative reactivity of the xenon poisoning, causing the core temperature to partially recover. After the core temperature partially recovers, a positive superheat will be generated. Superheat refers to the difference between the temperature of the primary coolant and the temperature of the steam at the outlet of the secondary steam generator. Therefore, although the power decrease causes the core temperature to decrease, the effect of the temperature coefficient will cause the core temperature to partially recover, thereby generating a positive superheat.

[0096] In one embodiment, when executing step S22, specifically, the moderator temperature coefficient refers to the effect of the temperature change of the moderator (usually light water or heavy water) on the reactor reactivity. The moderator temperature coefficient is a function of power, boron concentration and temperature difference, expressed as: α iso =f(Pr,T avg ,CB), where CB is the boron concentration, which remains unchanged during the test; T avg is the temperature of a circuit, which can also be considered unchanged during the test. At this time, the function of temperature coefficient and power data can be obtained, expressed as: α iso =f(Pr). Then, the reactivity introduced by the change in the moderator temperature coefficient can be expressed as: Temp =α iso (Pr)×ΔT(Pr), where ρ Temp Expressed as reactivity, α iso (Pr) is expressed as a function of the temperature coefficient and the power data, and ΔT(Pr) represents the corresponding xenon temperature data. Finally, the power data and its corresponding xenon temperature data can be calculated based on the ratio of the functional relationship to the temperature coefficient, and a xenon correction data set can be generated. The xenon correction data set represents the risk range of the standard superheat and can be used to characterize the superheat disturbance that may be caused by xenon poisoning in the unit.

[0097] See also Figure 4In one embodiment, during the test load reduction process, the temperature changes of the primary and secondary circuits are in a time-non-equilibrium state. When the turbine load drops rapidly, the average temperature of the secondary circuit will drop rapidly. The temperature control system of the primary circuit will follow the temperature reference value of the secondary circuit for adjustment, but because the core response is relatively delayed, the temperature change will lag behind the secondary circuit. In the initial stage when the load begins to drop, the temperature drop of the primary circuit has just begun to follow the temperature drop of the secondary circuit, so the temperature of the primary circuit will be higher than the temperature in the equilibrium state. The temperature of the primary circuit will lag behind in the transient process, which is manifested as the superheat of the primary circuit. At this time, the reactivity exhibited by the unit mainly comes from the negative reactivity introduced during the control rod insertion process. As Figure 4 As shown, Figure 4 The horizontal axis represents time in seconds; the vertical axis represents temperature; T avg Indicates the primary circuit temperature; T ref Indicates the secondary circuit temperature.

[0098] In one embodiment, when step S23 is executed, specifically, step S23 may include the following steps:

[0099] Step S231, obtaining power data and its corresponding xenon temperature data in the xenon correction data set, and obtaining power data and its corresponding reference temperature data in the reference temperature curve;

[0100] Step S232, calculating the sum of the corresponding xenon temperature data and the corresponding reference temperature data under each power data, and generating corresponding xenon corrected temperature data;

[0101] Step S233: Perform fitting processing on each power data and its corresponding xenon-corrected temperature data to generate a xenon correction curve.

[0102] In one embodiment, when executing step S231, specifically, when the reactor power decreases, the xenon poison concentration will increase first, introducing negative reactivity. This hysteresis change will cause the core temperature to decrease in the early stage, but the temperature change will lag behind the power change. The reference temperature curve needs to be corrected according to the hysteresis change of xenon poisoning to generate a new xenon correction curve. The corrected curve will reflect the hysteresis decrease trend of the core temperature in the early stage of power decrease.

[0103] In one embodiment, the core temperature drops in the early stage due to the negative reactivity introduced by xenon poisoning, and then the core temperature partially recovers due to the negative temperature coefficient, resulting in positive superheat. Therefore, the correction of superheat needs to take this positive change into account. Since the power change of the primary circuit lags behind the decrease of the load of the secondary circuit steam turbine, the change of superheat is uncertain in the early stage of power decrease, so it is corrected to the risk range (soft correction) to ensure safety.

[0104] In one embodiment, the negative reactivity introduced by xenon poisoning is closely related to the power of the primary circuit. When the load of the secondary circuit turbine decreases, the average temperature of the secondary circuit will drop rapidly, but the core power of the primary circuit has not dropped significantly, which is manifested as the average temperature has not dropped. The change in the temperature of the primary circuit lags behind the change in power and needs to be adjusted through the xenon correction curve to ensure that the risk range of the test temperature is within a safe range. Among them, the xenon correction curve refers to the risk range of the test temperature.

[0105] In one embodiment, when the reference temperature curve is corrected, power data and its corresponding xenon temperature data in the xenon correction data set may be obtained, and power data and its corresponding reference temperature data in the reference temperature curve may be obtained.

[0106] In one embodiment, when executing step S232, specifically, at each power data, the corresponding reference temperature data is corrected according to the xenon temperature data to generate the corrected xenon corrected temperature data. For each power data point, the reference temperature data is corrected according to the xenon temperature data to generate the corrected xenon corrected temperature data. The corrected xenon corrected temperature data can be obtained by adding the corresponding xenon temperature data to the corresponding reference temperature data.

[0107] See also Figure 5 In one embodiment, when executing step S233, specifically, each power data and its corresponding corrected xenon temperature data are fitted to generate a xenon correction curve (such as Figure 5 For example, linear regression, polynomial fitting or other suitable mathematical methods can be used for fitting. At the same time, a corresponding supercooling temperature correction curve (such as Figure 5 The supercooling control in -4℃ (xenon toxicity correction)). Based on the xenon correction data set, the corresponding superheat temperature correction curve is generated (such as Figure 5 The superheat control in the control is +6℃ (xenon poison correction). The supercooling temperature correction curve refers to the supercooling temperature curve after xenon poison correction, ensuring that the primary circuit temperature will not be too low when the power decreases. The superheat temperature correction curve refers to the superheat temperature curve after xenon poison correction, ensuring that the primary circuit temperature will not be too high when the power decreases.

[0108] In one embodiment, when step S30 is executed, specifically, step S30 may include the following steps:

[0109] Step S31, setting a loop completely untracked curve according to the first temperature data;

[0110] Step S32: Generate an overheat correction curve according to the set balance coefficient, the first-loop completely untracked curve, and the xenon correction curve.

[0111] See also Figure 6 In one embodiment, when executing step S31, specifically, during the test, the temperature control rod is set to manual mode, and the temperature control rod will not automatically adjust to compensate for the deviation between the core temperature and the reference temperature. During the load reduction process, the temperature of the primary circuit lags behind the reference temperature, resulting in a gradual increase in superheat. In extreme cases, if the primary circuit does not cool down at all during the load reduction process, that is, the primary circuit does not track the curve at all, then the superheat will reach the maximum value.

[0112] See also Figure 6 In one embodiment, in an extreme case, the temperature of the first circuit does not follow the temperature change of the second circuit at all, which is manifested as the temperature of the first circuit remaining unchanged during the load reduction process. In this case, the first circuit does not track the curve at all, which forms a horizontal line, which is significantly different from the downward trend of the reference temperature curve. That is, the first circuit does not track the curve at all (such as Figure 6 One loop in the circuit is not tracked at all (t100%FP).

[0113] In one embodiment, when step S32 is executed, specifically, step S32 may include the following steps:

[0114] Step S321, under each power data, determining the constant temperature data of a loop that does not track the curve at all and the xenon corrected temperature data of the xenon corrected curve;

[0115] Step S322, calculating the overheat correction temperature data according to the set balance coefficient, the constant temperature data and the corresponding xenon correction temperature data; wherein, under each power data, the difference between the constant temperature data and the overheat correction temperature data is recorded as the first temperature difference, and the difference between the overheat correction temperature data and the xenon correction temperature data is recorded as the second temperature difference, and the ratio of the first temperature difference to the corresponding second temperature difference is equal to the balance coefficient;

[0116] Step S323: performing fitting processing on each power data and its corresponding overheat correction temperature data to generate an overheat correction curve.

[0117] In one embodiment, when executing step S321, specifically, the existence of overheat correction is to ensure that under transient conditions, the power of the first circuit can better track the changes in the turbine load of the second circuit, while providing additional safety compensation. When the load of the second circuit turbine drops rapidly, the power response of the first circuit will have a certain lag. If the power rod group is under-inserted (that is, the control rod is not fully inserted), the power of the first circuit will be higher and the average temperature of the first circuit will be higher than the reference temperature. Overheat correction will introduce additional negative reactivity, so that the core has a relatively safe negative feedback compensation during the transient load tracking process. By introducing negative reactivity, it is possible to avoid excessive temperature in the first circuit, thereby preventing the opening of the GCT-A valve and the action of overheat protection.

[0118] In one embodiment, the overheat correction is to correct upward the xenon correction curve that has been corrected for xenon poisoning, which should be tracked and adjusted by the primary circuit temperature, but not more than the primary circuit does not track the temperature line at all. Specifically, under transient conditions, due to the rapid drop in load, the primary circuit temperature may lag behind the reference temperature. The overheat correction ensures that the primary circuit temperature is within a safe range by adjusting the xenon correction curve upward. The upper limit of the overheat correction is the temperature curve under the assumption that the primary circuit does not track the temperature line at all, that is, the temperature curve under the assumption that the primary circuit does not cool down at all during the load reduction process.

[0119] In one embodiment, the larger the overheat correction, the greater the control rod under-insertion, the greater the inherent negative reactivity, and the safer the unit is in transient changes. A larger overheat correction can provide stronger negative feedback, reduce the risk of core temperature increase, and prevent the occurrence of overheat protection action. An overheat correction that is too large will cause the primary circuit temperature to further lag behind the reference temperature, affecting the load tracking performance of the reactor.

[0120] In one embodiment, during the control rod calibration curve calibration test of different units, the superheat in the transient process is close to the protection and test stop edge. Specifically, the superheat approaching the protection edge means that the primary circuit temperature is close to or exceeds the overheat protection setting value (such as 310°C), and there is a potential risk of triggering the protection action. In order to avoid the occurrence of the protection action, the test may need to be stopped or the parameters adjusted to ensure safety.

[0121] In one embodiment, when setting the overheat correction, it is necessary to find a balance between safety and load following performance. Therefore, a balance coefficient can be set to determine the constant temperature data of a circuit that does not follow the curve at all and the xenon corrected temperature data of the xenon corrected curve under each power data.

[0122] See also Figure 7 and Figure 8In one embodiment, when executing step S322, specifically, the overheat correction temperature data T2 can be calculated according to the balance coefficient a, the constant temperature data T1 and the corresponding xenon correction temperature data T3. Wherein, a = (T1-T2) / (T2-T3). Wherein, T1 represents the temperature difference between the full power of the core and the zero power of the core, which is represented as 12°C here. Figure 7 and Figure 8 In the figure, it is the constant temperature data corresponding to a circuit without tracking line. T2 is the overheat correction temperature data corresponding to the corrected overheat correction curve. Figure 7 and Figure 8 In the figure, the superheat correction temperature data corresponding to the new superheat correction (tsuperheat correction) is shown. T3 is the correction temperature data corresponding to the xenon correction curve. Figure 7 and Figure 8 The corrected temperature data corresponding to the reference temperature xenon poisoning correction (t reference temperature after xenon poisoning correction) is shown in FIG.

[0123] See also Figure 7 and Figure 8 In one embodiment, under each power data, the difference between the constant temperature data and the overheat correction temperature data is recorded as the first temperature difference (T1-T2), and the difference between the overheat correction temperature data and the xenon correction temperature data is recorded as the second temperature difference (T2-T3), and the ratio of the first temperature difference to the corresponding second temperature difference is equal to the balance coefficient.

[0124] See also Figure 7 and Figure 8 In one embodiment, when executing step S323, specifically, after obtaining each power data and its corresponding overheat correction temperature data, a fitting process may be performed on them to generate an overheat correction curve. Figure 7 In the figure, when a=3, the corresponding overheat correction curve can be fitted. Figure 8 In the example, when a=4, the corresponding overheat correction curve can be fitted. In this embodiment, the specific size of a can be set according to actual needs (for example, the size of a can be set by considering the decay of the control rod value and the change of neutronic characteristics caused by the change of the core loading scheme after loading). The smaller a is, the closer the fitted overheat correction curve is to the line without tracking in the first loop; the larger a is, the closer the fitted overheat correction curve is to the reference temperature xenon poisoning correction (t is the reference temperature after xenon poisoning correction).

[0125] In one embodiment, when step S40 is executed, specifically, step S40 may include the following steps:

[0126] Step S41, calculating the difference between the corresponding overheat correction temperature data in the overheat correction curve and the corresponding reference temperature data in the reference temperature curve under each power data, and generating temperature difference correction data;

[0127] Step S42, inputting the temperature difference correction data corresponding to each power data into the reference temperature curve to calculate the corresponding overheat correction power data;

[0128] Step S43: Generate an overheat correction parameter set according to each power data and the corresponding overheat correction power data.

[0129] In one embodiment, when step S41 is executed, specifically, under each power data, the overheat correction temperature data in the overheat correction curve can be determined, and the reference temperature data in the reference temperature curve can be determined. Subsequently, for each power data, the difference between the overheat correction temperature data and the corresponding reference temperature data can be calculated and recorded as temperature difference correction data. At this time, for each power data, there will be a corresponding temperature difference correction data.

[0130] See also Figure 7 and Figure 8 In one embodiment, when executing step S42, specifically, since the reference temperature curve is linear, the corresponding power data drop range can be determined according to the temperature difference correction data, that is, for each temperature difference correction data, the corresponding overheat correction power data can be calculated according to the reference temperature curve. Figure 7 and Figure 8 It can be seen that when the power data decreases from 100% to 50%, the corresponding temperature data in the reference temperature curve decreases from 12°C to 6°C. Since the reference temperature curve is linear, the slope and intercept of the reference temperature curve can be calculated based on the above data. After obtaining the function of the reference temperature curve, the temperature difference correction data can be input into the above function to calculate the corresponding overheat correction power data. For example, when the temperature difference correction data is 0.3°C (from 9°C to 8.7°C), the power data can be reduced from 75% to 72.5%, that is, the overheat correction power data is 2.5%.

[0131] In one embodiment, when step S43 is executed, specifically, for each power data, there will be a corresponding temperature difference correction data. For each temperature difference correction data, there will be a corresponding overheat correction power data. Therefore, for each power data, there will be a corresponding overheat correction power data. Finally, an overheat correction parameter set can be generated according to each power data and the corresponding overheat correction power data.

[0132] In one embodiment, as shown in Table 1 and Table 2, when a=3 and 4, the corresponding overheat correction curve can be fitted. At this time, each power data (Pe) and the corresponding overheat correction power data (dPe) can be calculated according to the above process.

[0133] Table 1: Overheat correction parameter set when the balance factor is equal to 3.

[0134] Pe(%FP) 100 97.24 94.48 91.71 90.79 87.72 83.12 dPe(%FP) 0 0.59 1.17 1.76 1.68 2.13 2.97 Pe(%FP) 78.51 73.91 69.31 64.70 60.10 55.49 50.89 dPe(%FP) 3.91 4.96 5.59 5.18 5.81 6.13 6.65

[0135] Table 2: Overheat correction parameter set when the balance factor is equal to 4.

[0136] Pe(%FP) 100 97.24 94.48 91.71 90.79 87.72 83.12 dPe(%FP) 0 0.47 0.94 1.41 1.34 1.71 2.38 Pe(%FP) 78.51 73.91 69.31 64.70 60.10 55.49 50.89 dPe(%FP) 3.13 3.97 4.47 4.14 4.65 4.90 5.32

[0137] In one embodiment, when step S50 is executed, specifically, step S50 may include the following steps:

[0138] Step S51, under each power data, calculating the difference between the corresponding overheating corrected power data and the corresponding initial corrected power data in the control rod calibration curve, and generating target corrected data; wherein the control rod calibration curve represents the relationship between the power data and the control rod position, and each power data in the control rod calibration curve corresponds to an initial corrected power data and a control rod position;

[0139] Step S52, correcting the corresponding power data according to the target correction data to generate corrected power data;

[0140] Step S53: Fitting the corrected power data with the corresponding control rod positions to generate a corrected control rod calibration curve.

[0141] See also Fig. 9 And Table 3, in one embodiment, when executing step S51, specifically, the initial corrected power data corresponding to each power data can be determined by the control rod calibration curve.

[0142] Table 3: Power data in the control rod calibration curve and the corresponding initial corrected power data.

[0143] Pe(%FP) 100 95 79 75 47 35 0 dPe(%FP) 0 0 3.1 4.2 4.2 6.8 6.8

[0144] In one embodiment, under each power data, the control rod calibration curve corresponds to an initial corrected power data, and the overheat correction parameter set corresponds to an overheat correction power data. At this time, for each power data, the difference between the initial corrected power data and the corresponding overheat correction power data can be calculated and recorded as the target correction data.

[0145] See also Fig. 9In one embodiment, when executing step S52, specifically, after the power data and the corresponding target correction data are obtained, the corresponding power data can be corrected according to the target correction data to generate corrected power data.

[0146] In one embodiment, when executing step S53, specifically, since each power data corresponds to a control rod position, after the corrected power data is obtained, each corrected power data also corresponds to a control rod position. At this time, the corrected power data and the corresponding control rod position can be fitted to generate a corrected control rod calibration curve (such as Fig. 9 The uncorrected curve refers to the control rod calibration curve that has not been corrected. The preset curve refers to the curve calculated according to the parameters of the unit. Fig. 9 The horizontal axis in can be expressed as the control rod position, and the vertical axis is expressed as the core power. The core power is a specific value. When fitting, the power data expressed in percentage form can be converted into power data expressed in specific values. For example, the power data at 100% FP can correspond to 1080MW / min, or 1060MW / min.

[0147] It can be seen that in the above scheme, by guiding the correction of the superheat correction parameters of the control rod calibration curve, it is ensured that the control rod calibration curve can accurately reflect the changes in the physical characteristics of the reactor under different cycles, different loading schemes and different burnup conditions. By evaluating the risks of overcooling and overheating that may be caused by the temperature of the primary circuit during the control rod calibration curve test, it helps the operator make safer decisions in the test. By setting reasonable superheat correction parameters, the test risks of subsequent control rod calibration can be effectively reduced and the success rate of the test can be improved. The core characteristics and power requirements of different units may be different. By setting personalized superheat correction parameters for different units, the operation control of each unit can be ensured to be more accurate and safe. In the first cycle and subsequent cycles, the changes in the core isothermal temperature coefficient will affect the thermal hydraulic characteristics of the reactor. Through reasonable superheat correction, these changes can be compensated, ensuring the accuracy of temperature control and reducing the risks of subsequent tests.

[0148] It should be understood that the order of execution of the steps in the above embodiment does not necessarily mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiment of the present invention.

[0149] See also Fig.10The present invention also provides a correction device for a control rod calibration curve, which corresponds to the correction method in the above embodiment. The correction device may include a data acquisition module 100, a first correction module 200, a second correction module 300, a data calculation module 400, and a third correction module 500. The functions of each module are as follows:

[0150] In one embodiment, the data acquisition module 100 may be used to acquire a reference temperature curve during a load reduction period.

[0151] In one embodiment, the first correction module 200 may be used to correct the reference temperature curve according to the negative reactivity introduced by xenon to generate a xenon correction curve.

[0152] In one embodiment, the second correction module 300 can be used to calculate the overheat correction curve according to the set balance coefficient, the first loop completely untracked curve, and the xenon correction curve.

[0153] In one embodiment, the data calculation module 400 may be used to calculate the power data in the overheat correction curve and its corresponding overheat correction power data according to the overheat correction curve and the reference temperature curve, and generate an overheat correction parameter set.

[0154] In one embodiment, the third correction module 500 may be used to correct the control rod calibration curve according to the overheat correction parameter set to generate a corrected control rod calibration curve.

[0155] For the specific definition of the correction device, please refer to the definition of the correction method above, which will not be repeated here. Each module in the above correction device can be implemented in whole or in part by software, hardware and a combination thereof. Each of the above modules can be embedded in or independent of the memory in the computer device in the form of hardware, or can be stored in the memory in the computer device in the form of software, so that the memory can call and execute the operations corresponding to each of the above modules.

[0156] See also Fig.11 In one embodiment, the electronic device 1 may include a memory 12, a processor 13 and a bus, and may also include a computer program stored in the memory 12 and executable on the processor 13, such as a program for correcting a control rod calibration curve.

[0157] In one embodiment, the memory 12 includes at least one type of readable storage medium, and the readable storage medium includes a flash memory, a mobile hard disk, a multimedia card, a card-type memory (e.g., SD or DX memory, etc.), a magnetic memory, a disk, an optical disk, etc. In some embodiments, the memory 12 may be an internal storage unit of the electronic device 1, such as a mobile hard disk of the electronic device 1. In other embodiments, the memory 12 may also be an external storage device of the electronic device 1, such as a plug-in mobile hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card, etc. equipped on the electronic device 1. Further, the memory 12 may also include both an internal storage unit of the electronic device 1 and an external storage device. The memory 12 may not only be used to store application software and various types of data installed in the electronic device 1, such as the code for the correction of the control rod calibration curve, etc., but may also be used to temporarily store data that has been output or is to be output.

[0158] In one embodiment, the processor 13 may be composed of an integrated circuit, for example, a single packaged integrated circuit, or a plurality of packaged integrated circuits with the same or different functions, including one or more central processing units (CPUs), microprocessors, digital processing chips, graphics processors, and combinations of various control chips. The processor 13 is the control core (Control Unit) of the electronic device 1, and uses various interfaces and lines to connect various components of the entire electronic device 1, and executes or executes programs or modules stored in the memory 12 (such as a program for correcting the control rod calibration curve, etc.), and calls data stored in the memory 12 to execute various functions of the electronic device 1 and process data.

[0159] In one embodiment, the processor 13 executes the operating system and various installed application programs of the electronic device 1. The processor 13 executes the application programs to implement the steps in the control rod calibration curve correction method.

[0160] In one embodiment, the computer program may be divided into one or more modules, one or more modules are stored in the memory 12, and executed by the processor 13 to complete the present application. One or more modules may be a series of computer program instruction segments capable of completing specific functions, and the instruction segments are used to describe the execution process of the computer program in the electronic device 1. For example, the computer program may be divided into a data acquisition module 100, a first correction module 200, a second correction module 300, a data calculation module 400, and a third correction module 500.

[0161] The embodiments of the present invention disclosed above are only used to help illustrate the present invention. The embodiments do not describe all the details in detail, nor do they limit the invention to the specific embodiments described. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that those skilled in the art can understand and use the present invention well. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. A method for correcting a control rod calibration curve, characterized in that: include: During the load reduction period, obtain a reference temperature curve; Correcting the reference temperature curve according to the negative reactivity introduced by xenon to generate a xenon correction curve; Calculating an overheat correction curve according to a set balance coefficient, a completely untracked curve of a primary circuit, and the xenon correction curve; According to the overheat correction curve and the reference temperature curve, the power data in the overheat correction curve and the corresponding overheat correction power data are calculated, and an overheat correction parameter set is generated; The control rod calibration curve is corrected according to the overheat correction parameter set to generate a corrected control rod calibration curve.

2. The method for correcting the control rod calibration curve according to claim 1, characterized in that: During the load reduction period, the step of obtaining a reference temperature curve comprises: Generate a corresponding overcooling protection curve and an overheating protection curve according to the acquired overheating protection data, the undercooling protection data, the first temperature data corresponding to the core when the power data is maximum, and the second temperature data corresponding to the core when the power data is minimum; During the load reduction period, a reference temperature curve is generated according to the subcooling temperature curve and the superheating temperature curve.

3. The method for correcting the control rod calibration curve according to claim 2, characterized in that: The step of generating a reference temperature curve according to the subcooling temperature curve and the superheating temperature curve during the load reduction period includes: During the load reduction period, the core is subjected to load reduction processing according to preset conditions, and corresponding reference temperature data is obtained according to the power data; The first temperature data, power data and their corresponding reference temperature data are fitted to generate a reference temperature curve.

4. The method for correcting the control rod calibration curve according to claim 3, characterized in that: The step of correcting the reference temperature curve according to the negative reactivity introduced by xenon to generate a xenon correction curve comprises: Obtain power data as a function of the negative reactivity introduced by xenon; Calculating power data and corresponding xenon temperature data according to the ratio of the functional relationship to the temperature coefficient, and generating a xenon correction data set; The reference temperature curve is corrected according to the xenon correction data set to generate a xenon correction curve.

5. The method for correcting the control rod calibration curve according to claim 4, characterized in that: The step of correcting the reference temperature curve according to the xenon correction data set to generate a xenon correction curve comprises: Acquire the power data and the corresponding xenon temperature data in the xenon correction data set, and acquire the power data and the corresponding reference temperature data in the reference temperature curve; Calculating the sum of the corresponding xenon temperature data and the corresponding reference temperature data under each power data to generate corresponding xenon corrected temperature data; Each power data and its corresponding xenon-corrected temperature data are fitted to generate a xenon correction curve.

6. The method for correcting the control rod calibration curve according to claim 3, characterized in that: The step of calculating the overheat correction curve according to the set balance coefficient, the first loop completely untracked curve, and the xenon correction curve comprises: Setting a loop completely untracked curve according to the first temperature data in the reference temperature curve; An overheat correction curve is generated according to the set balance coefficient, the first loop completely untracked curve, and the xenon correction curve.

7. The method for correcting the control rod calibration curve according to claim 6, characterized in that: The step of setting the balance coefficient and generating an overheat correction curve according to the balance coefficient, the first loop completely untracked curve, and the xenon correction curve comprises: Under each power data, determining the constant temperature data of the first loop that does not track the curve at all and the xenon corrected temperature data of the xenon corrected curve; Calculating overheat correction temperature data according to the set balance coefficient, the constant temperature data and the corresponding xenon correction temperature data; wherein, under each power data, the difference between the constant temperature data and the overheat correction temperature data is recorded as a first temperature difference, the difference between the overheat correction temperature data and the xenon correction temperature data is recorded as a second temperature difference, and the ratio of the first temperature difference to the corresponding second temperature difference is equal to the balance coefficient; Each power data and its corresponding overheat correction temperature data are fitted to generate an overheat correction curve.

8. The method for correcting a control rod calibration curve according to claim 1, characterized in that: The step of calculating the power data in the overheat correction curve and the corresponding overheat correction power data according to the overheat correction curve and the reference temperature curve, and generating an overheat correction parameter set comprises: calculating the difference between the corresponding overheat correction temperature data in the overheat correction curve and the corresponding reference temperature data in the reference temperature curve under each power data, and generating temperature difference correction data; Inputting the temperature difference correction data corresponding to each power data into the reference temperature curve to calculate the corresponding overheat correction power data; An overheat correction parameter set is generated according to each power data and the corresponding overheat correction power data.

9. The method for correcting a control rod calibration curve according to claim 1, characterized in that: The step of correcting the control rod calibration curve according to the overheat correction parameter set to generate a corrected control rod calibration curve comprises: Under each power data, the difference between the corresponding overheating corrected power data and the corresponding initial corrected power data in the control rod calibration curve is calculated to generate target correction data; wherein the control rod calibration curve represents the relationship between the power data and the control rod position, and each power data in the control rod calibration curve corresponds to an initial corrected power data and a control rod position; Correcting the corresponding power data according to the target correction data to generate corrected power data; The corrected power data and the corresponding control rod positions are fitted to generate a corrected control rod calibration curve.

10. A control rod calibration curve correction device, characterized in that: include: A data acquisition module, used for acquiring a reference temperature curve during a load reduction period; A first correction module, used for correcting the reference temperature curve according to the negative reactivity introduced by xenon to generate a xenon correction curve; A second correction module is used to calculate an overheat correction curve according to a set balance coefficient, a completely untracked curve of a primary circuit, and the xenon correction curve; A data calculation module, used for calculating the power data in the overheat correction curve and the corresponding overheat correction power data according to the overheat correction curve and the reference temperature curve, and generating an overheat correction parameter set; The third correction module is used to correct the control rod calibration curve according to the overheat correction parameter set to generate a corrected control rod calibration curve.

11. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method for correcting the control rod calibration curve according to any one of claims 1 to 9 are implemented.

12. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the step of correcting the control rod calibration curve according to any one of claims 1 to 9 is implemented.

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