Adjustable transfer system for chip testing

Abstract

An adjustable transfer system for chip testing, the adjustable transfer system comprising: an adjustable tray configured to accommodate chips to be tested, the array arrangement of the chips to be tested on the adjustable tray being configured to be adjusted to match a test fixture array, the adjustable tray comprising: a tray frame; the first grid bars are arranged in the tray frame, extend in the first direction, are arranged in parallel and are configured to be capable of sliding in the second direction, and the first direction is orthogonal to the second direction; the second grid bars are arranged in the tray frame, extend in the second direction, are arranged in parallel upwards and are configured to slide in the first direction, and the adjustable transporter is configured to pick up a to-be-tested chip from the adjustable tray and transport the to-be-tested chip to the test clamp array. The adjustable transporter comprises a plurality of pick-up components arranged in an array, and the array arrangement of the pick-up components is configured to be adjusted to be matched with the test fixture array.

Description

Technical Field

[0001] The present disclosure relates to the field of chip testing, and in particular, to an adjustable transport system for chip testing. Background Art

[0002] In the packaged chip test, in order to meet the test requirements of some small batches, customization, special packaging or packaged chips without ready-made robot testing. Usually, manual testing is adopted. Generally, a hand-held suction pen is used to grab the chip from the chip tray, put it into the test fixture, cover the fixture cover, and then perform electrical testing. In manual testing, the hand-held test suction pen can only transfer a single packaged chip, which is inefficient. Summary of the invention

[0003] The present disclosure provides an adjustable transport system for chip testing, the adjustable transport system comprising:

[0004] An adjustable tray is configured to accommodate the chips to be tested, and the array arrangement of the chips to be tested on the adjustable tray is configured to be adjusted to match the array of the test fixture, and the adjustable tray includes:

[0005] Pallet frames;

[0006] A plurality of first bars are arranged in the tray frame, extending along a first direction and arranged parallel to each other, and configured to be able to slide along a second direction, wherein the first direction is orthogonal to the second direction;

[0007] a plurality of second bars, arranged in the tray frame, extending along the second direction and arranged upwardly in parallel, and configured to be able to slide along the first direction, and

[0008] The adjustable transporter is configured to pick up the chip to be tested from the adjustable tray and transport it to the test fixture array. The adjustable transporter includes a plurality of picking components arranged in an array. The array arrangement of the picking components is configured to be adjusted to match the test fixture array.

[0009] In some embodiments, each first grid bar includes a through hole, the through hole penetrates the first grid bar along the second direction, the through hole is a long strip-shaped through hole extending along the first direction, and the through hole is configured to allow the plurality of second grid bars to pass through.

[0010] In some embodiments, each second grid bar comprises:

[0011] A fence rod extending along the second direction and passing through the through holes of the plurality of first fence bars; and a plurality of sliders arranged on the fence rod and configured to slide along the extending direction of the fence rod,

[0012] Wherein, each slider is arranged between two adjacent first bars or between the side wall of the tray frame and the first bar closest to the side wall of the tray frame, and the through hole does not allow the slider to pass through.

[0013] In some embodiments, the top surfaces of the tray frame, the first grid bars, and the sliding blocks are substantially located on the same horizontal plane.

[0014] In some embodiments, a length of the slider in the second direction is less than or equal to a size of the chip.

[0015] In some embodiments, the adjustable transporter comprises:

[0016] A casing having a hollow structure;

[0017] A first T-tube and a second T-tube are arranged opposite to each other, wherein the first T-tube comprises a first guide tube and a first connecting tube perpendicular to each other, and the second T-tube comprises a second guide tube and a second connecting tube perpendicular to each other, and a first free end of the first connecting tube away from the first guide tube and a second free end of the second connecting tube away from the second guide tube are slidably inserted into two ends of the sleeve respectively so that the first guide tube and the second guide tube are arranged in parallel;

[0018] The first group of picking components and the second group of picking components are slidably disposed on the first guide tube and the second guide tube, respectively.

[0019] In some embodiments, the adjustable transporter further comprises:

[0020] A handle is arranged on the sleeve, and one end of the handle away from the sleeve is connected to a suction device, and the suction device is connected to each picking component through a pipeline arranged inside the adjustable transporter.

[0021] In some embodiments, the adjustable transporter further comprises:

[0022] A first locking member, disposed on the sleeve, configured to lock the position of the first connecting tube and / or the second connecting tube relative to the sleeve; and / or

[0023] A second locking member is disposed on the first guide tube and / or the second guide tube, and is configured to lock the position of the first group of picking components relative to the first guide tube and / or the position of the second group of picking components relative to the second guide tube.

[0024] In some embodiments, the adjustable transporter comprises:

[0025] A cross sleeve having a hollow structure;

[0026] Four sliding tubes, slidably inserted into four free ends of the cross sleeve;

[0027] Four picking components are respectively arranged at free ends of the four sliding tubes away from the cross sleeve.

[0028] In some embodiments, the adjustable transporter further comprises:

[0029] The squeezable handle is arranged on the cross sleeve. When the squeezable handle is switched from a squeezed state to a relaxed state, the four picking components perform a picking operation. When the squeezable handle is switched from a relaxed state to a squeezed state, the four picking components perform a releasing operation.

[0030] The above solution of the embodiment of the present disclosure can have the following beneficial effects:

[0031] In the adjustable transport system, the adjustable transporter has multiple picking devices arranged in an array, which can pick up and transport multiple chips to be tested at one time, thereby improving the test efficiency of packaged chips. The adjustable tray can be suitable for accommodating packaged chips of various sizes by adjusting the positions of the first grid bar and the second grid bar, and the array arrangement of the chips to be tested on the adjustable tray can be adjusted according to the test fixture array. At the same time, the array arrangement of the picking components of the adjustable transporter matches the test fixture array, so as to realize the rapid transport of the packaged chips on the adjustable tray to the test fixture array for testing. It is suitable for packaged chips of different sizes and test fixture arrays of different layouts, thereby improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] The drawings herein are incorporated into the specification and constitute a part of the specification, showing embodiments consistent with the present disclosure, and together with the specification, are used to explain the principles of the present disclosure. Obviously, the drawings described below are only some embodiments of the present disclosure, and for ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. In the drawings:

[0033] Figure 1 A schematic diagram of the structure of an adjustable tray in an adjustable transport system for chip testing provided in some embodiments of the present disclosure;

[0034] Figure 2 A schematic diagram of the structure of a test fixture assembly provided for some embodiments of the present disclosure;

[0035] Figure 3 A schematic diagram of the structure of an adjustable transporter in an adjustable transport system for chip testing provided in some embodiments of the present disclosure;

[0036] Figure 4A schematic structural diagram of another perspective of an adjustable transporter in an adjustable transport system for chip testing provided by some embodiments of the present disclosure;

[0037] Figure 5 A schematic diagram of a partial structure of an adjustable transporter in an adjustable transport system for chip testing provided in some embodiments of the present disclosure;

[0038] Figure 6 A schematic diagram of the structure of an adjustable transporter in an adjustable transport system for chip testing provided in other embodiments of the present disclosure. DETAILED DESCRIPTION

[0039] In order to make the purpose, technical solutions and advantages of the present disclosure clearer, the present disclosure will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present disclosure, rather than all of the embodiments. Based on the embodiments in the present disclosure, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present disclosure.

[0040] The terms used in the embodiments of the present disclosure are only for the purpose of describing specific embodiments, and are not intended to limit the present disclosure. The singular forms "a", "said" and "the" used in the embodiments of the present disclosure and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings, and "multiple" generally includes at least two.

[0041] It should be understood that the term "and / or" used in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0042] It should be understood that although the terms first, second, third, etc. may be used to describe the embodiments of the present disclosure, they should not be limited to these terms.

[0043] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a product or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such product or device. In the absence of more restrictions, the elements defined by the sentence "comprises a" do not exclude the presence of other identical elements in the product or device including the elements.

[0044] The present disclosure provides an adjustable transfer system for chip testing, the adjustable transfer system comprising: an adjustable tray, configured to accommodate chips to be tested, the array arrangement of the chips to be tested on the adjustable tray is configured to be adjusted to match the test fixture array, the adjustable tray comprises: a tray frame; a plurality of first bars, arranged in the tray frame, extending along a first direction and arranged parallel to each other, and configured to be able to slide along a second direction, wherein the first direction is orthogonal to the second direction; a plurality of second bars, arranged in the tray frame, extending along the second direction and arranged upward in parallel, and configured to be able to slide along the first direction; and an adjustable transporter, configured to pick up the chips to be tested from the adjustable tray and transfer them to the test fixture array, the adjustable transporter comprising a plurality of picking components arranged in an array, the array arrangement of the picking components being configured to be adjusted to match the test fixture array.

[0045] In the present disclosure, the adjustable tray can be suitable for accommodating packaged chips of various different sizes by adjusting the positions of the first grid bar and the second grid bar, and the array arrangement of the chips to be tested on the adjustable tray can be adjusted according to the test fixture array. At the same time, the array arrangement of the picking components of the adjustable transporter matches the test fixture array, so as to realize the rapid transfer of the packaged chips on the adjustable tray to the test fixture array for testing. It is suitable for packaged chips of different sizes and test fixture arrays of different layouts, thereby improving testing efficiency.

[0046] The optional embodiments of the present disclosure are described in detail below with reference to the accompanying drawings.

[0047] Figure 1 A schematic diagram of the structure of an adjustable tray in an adjustable transport system for chip testing provided in some embodiments of the present disclosure. Figure 2 A schematic diagram of the structure of a test fixture assembly provided in some embodiments of the present disclosure.

[0048] like Figure 1 to Figure 2 As shown, the present disclosure provides an adjustable transport system for chip testing, wherein the adjustable transport system includes an adjustable tray 10 and an adjustable transporter.

[0049] The adjustable tray 10 is configured to accommodate chips to be tested, such as packaged chips. The array arrangement of the chips to be tested on the adjustable tray 10 is configured to be adjusted to match the test fixture array on the test fixture assembly 20 .

[0050] The test fixture assembly 20 includes a circuit board 21 and a plurality of test fixtures 22 arranged on the circuit board 21. The test fixtures 22 are arranged in an array on the circuit board 21. Each test fixture can accommodate a chip to be tested. The plurality of test fixtures 22 on the test fixture assembly 20 can simultaneously provide tests for the plurality of chips to be tested, such as electrical tests. The test fixture assemblies 20 used for different types of chips to be tested may be different, and the sizes and array arrangements of the test fixtures 22 on the test fixture assembly 20 may be different. In order to be applicable to manual rapid testing of a variety of packaged chips, the adjustable tray 10 is designed to be adjustable, suitable for accommodating a variety of packaged chips, and can adjust the array arrangement of the chips to be tested on the adjustable tray 10 according to the array arrangement of the test fixtures 22 on the test fixture assembly 20 corresponding to the chips to be tested so that the two match each other, so as to facilitate the transfer of a plurality of chips to be tested to the plurality of test fixtures 22 on the test fixture assembly 20 at one time, thereby improving the test efficiency.

[0051] The adjustable pallet 10 includes: a pallet frame 13 and a plurality of first bars 11 and a plurality of second bars 12 located in the pallet frame 13. The pallet frame 13 is a rectangular frame, and a plurality of first bars 11 are arranged in the pallet frame 13, extending along a first direction X and arranged parallel to each other, and the plurality of first bars 11 can slide along a second direction Y, wherein the first direction X is orthogonal to the second direction Y. A pair of inner side walls of the pallet frame 13 extending along the second direction Y are provided with first slide rails 14, and both ends of each first bar 11 are respectively slidably connected to the first slide rails 14 arranged opposite to each other, so that each first bar 11 can slide along the second direction Y.

[0052] A plurality of second bars 12 are arranged in the tray frame 13, extending along the second direction Y and arranged upwardly in parallel, and the plurality of second bars 12 can slide along the first direction X. A pair of inner side walls of the tray frame 13 extending along the first direction X are provided with second slide rails 15, and both ends of each second bar 12 are respectively slidably connected to the second slide rails 15 arranged opposite to each other, so that each second bar 12 can slide along the first direction X.

[0053] In some embodiments, the sliding mode of the first bar 11 and the first slide rail 14 and / or the sliding mode of the second bar 12 and the second slide rail 15 is damped sliding, which can make the first bar 11 and / or the second bar 12 stay stably at the set position. In other embodiments, a locking piece can be further set for the first bar 11 and / or the second bar 12 to lock it at the set position.

[0054] By adjusting the sliding positions of the plurality of first grid bars 11 and the plurality of second grid bars 12, a receiving position suitable for the size of the chip to be tested can be formed on the adjustable tray 10, and the positions between the receiving positions are adjusted to form an array arrangement of the receiving positions. By adjusting the array arrangement of the receiving positions of the chip to be tested on the adjustable tray 10 so that it matches the array arrangement of the test fixture 22 on the test fixture assembly 20, it is ensured that the array arrangement of the chip to be tested on the adjustable tray 10 matches the array arrangement of the test fixture 22 on the test fixture assembly 20, so that multiple chips to be tested can be transferred to multiple test fixtures 22 on the test fixture assembly 20 at one time, thereby improving the test efficiency.

[0055] The adjustable transporter is configured to pick up the chips to be tested from the adjustable tray 10 and transport them to the test fixture array on the test fixture assembly 20. The adjustable transporter includes a plurality of picking components arranged in an array, and the array arrangement of the picking components is configured to be adjusted to match the array arrangement of the test fixtures 22 on the test fixture assembly 20. The adjustable transporter can transport a plurality of chips to be tested from the adjustable tray 10 to the test fixture array on the test fixture assembly 20 at one time, thereby improving the test efficiency.

[0056] In some embodiments, Figure 1 As shown, each first grid bar 11 includes a through hole 111, and the through hole 111 penetrates the first grid bar 11 along the second direction Y. The through hole 111 is a long strip-shaped through hole extending along the first direction X. The through hole 111 is configured to allow the plurality of second grid bars 12 to pass through. In this way, the sliding of the plurality of first grid bars 11 along the first slide rail 14 and the sliding of the plurality of second grid bars 12 along the second slide rail 15 do not affect each other.

[0057] In some embodiments, Figure 1 As shown, each second fence bar 12 includes a fence rod 121 and a plurality of sliders 122. The fence rod 121 extends along the second direction Y and passes through the through holes 111 of the plurality of first fence bars 11. The plurality of sliders 122 are arranged on the fence rod 121 and are configured to slide along the extension direction of the fence rod 121, that is, the plurality of sliders 122 are slidably connected to the fence rod 121, and the sliders 122, for example, have a slide groove, which can be sleeved on the fence rod 121.

[0058] Each slider 122 is disposed between two adjacent first bars 11 or between the side wall of the tray frame 13 and the first bar 11 closest to the side wall of the tray frame 13, and the through hole 111 does not allow the slider 122 to pass through. The top surface of the slider 122 is higher than the top surface of the bar 121, and when the packaged chip is accommodated in the adjustable tray 10, the top surface of the slider 122 can support the side of the packaged chip.

[0059] In some embodiments, the top surfaces of the tray frame 13, the first grid bar 11, and the slider 122 are substantially located on the same horizontal plane. In the adjustable tray 10, the tray frame 13 and the plurality of first grid bars 11 and the plurality of second grid bars 12 at adjustable positions are staggered to form a receiving position suitable for the size of the chip to be tested. When the packaged chip is placed in the adjustable tray 10, the edge of the packaged chip needs to be supported by the tray frame 13, the first grid bar 11 and / or the slider 122 of the second grid bar 12. The above design allows the packaged chip placed in the adjustable tray 10 to obtain stable support.

[0060] In some embodiments, the length of the slider 122 in the second direction Y is less than or equal to the size of the packaged chip. The length of the slider 122 in the second direction Y determines the minimum size of the package that can be accommodated on the adjustable tray 10 .

[0061] Figure 3 A schematic diagram of the structure of an adjustable transporter in an adjustable transport system for chip testing provided in some embodiments of the present disclosure, Figure 4 A schematic diagram of another perspective of an adjustable transporter in an adjustable transport system for chip testing provided in some embodiments of the present disclosure. Figure 3 and Figure 4 As shown, the adjustable transporter 30 includes a sleeve 33, a first T-tube 31 and a second T-tube 32 arranged opposite to each other, and a plurality of picking components 34. The sleeve 33 has a hollow structure, the first T-tube 31 and the second T-tube 32 arranged opposite to each other are arranged on both sides of the sleeve 33 and matched with the sleeve 33, and the picking component 34 is, for example, a vacuum adsorption component.

[0062] The first T-tube 31 includes a first guide tube 311 and a first connecting tube 312 which are perpendicular to each other, and the second T-tube 32 includes a second guide tube 321 and a second connecting tube 322 which are perpendicular to each other. The first free end of the first connecting tube 312 away from the first guide tube 311 and the second free end of the second connecting tube 322 away from the second guide tube 321 can be slidably inserted into the two ends of the sleeve 33 respectively so that the first guide tube 311 and the second guide tube 321 are arranged in parallel, and as the first free end of the first connecting tube 312 away from the first guide tube 311 and the second free end of the second connecting tube 322 away from the second guide tube 321 slide in the sleeve 33, the distance between the first guide tube 311 and the second guide tube 321 can be adjusted.

[0063] The plurality of picking components 34 are evenly divided into two groups, namely, a first group of picking components and a second group of picking components, which are slidably disposed on the first guide tube 311 and the second guide tube 321, respectively. The arrangement of the picking components 34 on the first guide tube 311 and / or the second guide tube 321 is adjusted in this way.

[0064] In this way, the size of the 2×N array arrangement formed by the four picking components 43 of the multiple picking components of the adjustable transporter 30 can be adjusted, where N is a positive integer and N≥1.

[0065] Figure 5 A schematic diagram of a partial structure of an adjustable transporter in an adjustable transport system for chip testing provided in some embodiments of the present disclosure. Figures 3 to 5 As shown, Figure 5 Take the second T-tube 32 as an example. The bottom surface of the second guide tube 321 of the second T-tube 32 has a sliding groove 3211, and the picking component 34 includes a picking plate 341 and a sliding block 342 connected to the picking plate 341. The sliding block 342 is slidably arranged in the sliding groove 3211, so that the second group of picking components connected to the second guide tube 321 of the second T-tube 32 can adjust its distribution on the second guide tube 321. The first T-tube 31 has a similar structure, which will not be repeated here.

[0066] By adjusting the distance between the first guide tube 311 of the first T-tube 31 and the second guide tube 321 of the second T-tube 32, as well as the spacing between the picking components 34 on the first guide tube 311 and the second guide tube 321, the array arrangement of the picking components 34 of the adjustable transporter 30 can be adjusted so that the array arrangement matches the array arrangement of the test fixtures 22 on the test fixture assembly 20 and the array arrangement of the chips to be tested on the adjustable tray 10, so that the adjustable transporter can be used to transfer multiple chips to be tested from the adjustable tray 10 to multiple test fixtures 22 on the test fixture assembly 20 at one time, thereby improving the test efficiency.

[0067] In some embodiments, in combination Figures 3 to 5 As shown, the adjustable transporter 30 further includes a handle 35, which is disposed on the sleeve 33, and one end of the handle 35 has, for example, a connecting portion 351, which is configured to be detachably connected to the sleeve 33. The handle 35 is, for example, in the shape of a hollow cylinder, and one end of the handle 35 away from the sleeve 33 is connected to a suction device, which is connected to each picking-up component 34 through a pipeline disposed inside the adjustable transporter 30 to provide suction for the picking-up component 34. In some embodiments, the suction provided by each picking-up component 34 can be individually controlled.

[0068] In some embodiments, in combination Figures 3 to 5As shown, the adjustable transporter also includes a first locking member 361 and a second locking member 362.

[0069] The first locking member 361 is disposed on the sleeve 33 and is configured to lock the position of the first connecting tube 312 and / or the second connecting tube 322 relative to the sleeve 33, thereby fixing the distance between the first connecting tube 312 and the second connecting tube 322.

[0070] The second locking piece 362 is disposed on the first guide tube 311 and / or the second guide tube 321, and is configured to lock the position of the first group of picking components relative to the first guide tube 311 and / or the position of the second group of picking components relative to the second guide tube 312, thereby locking the position distribution of the picking components 34 on the first guide tube 311 and / or the second guide tube 321 to ensure the stability of the transfer of the chip to be tested.

[0071] In some embodiments, Figure 5 As shown, a strip groove 3212 is provided on the side of the second guide tube 321 of the second T-tube 32 away from the sleeve 33, and the second locking member 362 passes through the strip groove 3212 and is threadedly connected with the sliding block 342 of the picking component 34. When the picking component 34 needs to be fixed on the second guide tube 321, the second locking member 362 can be tightened toward the sliding block 342, so that the second locking member 362 and the sliding block 342 tighten the side wall of the second guide tube 321 away from the sleeve 33. The first T-tube 31 side has a similar structure, which will not be repeated here.

[0072] Figure 6 A schematic diagram of the structure of an adjustable transporter in an adjustable transport system for chip testing provided in other embodiments of the present disclosure, such as Figure 6 As shown, the adjustable transporter 40 includes a cross sleeve 41 , four sets of sliding tubes 42 and four picking components 43 .

[0073] The cross sleeve 41 has a hollow structure, and four sliding tubes 42 can be slidably inserted into the four free ends of the cross sleeve 41. Four picking components 43, such as vacuum adsorption components, are respectively arranged at the free ends of the four sliding tubes 42 away from the cross sleeve 41. With the adjustment of the insertion depth of the four sliding tubes 42 in the four free ends of the cross sleeve 41, the size of the 2×2 array arrangement formed by the four picking components 43 can be adjusted. This makes the array arrangement match the array arrangement of the test fixture 22 on the test fixture assembly 20 and the array arrangement of the chips to be tested on the adjustable tray 10, so that the four chips to be tested can be transported from the adjustable tray 10 to multiple test fixtures 22 on the test fixture assembly 20 at one time using the adjustable transporter, thereby improving the test efficiency.

[0074] In some embodiments, Figure 6 As shown, the adjustable transporter 40 also includes: a squeezable handle 44, which is arranged on the cross sleeve 41 and is sealedly connected to the cross sleeve, and the four sliding tubes 4 are also sealedly connected to the four free ends of the cross sleeve 41. When the squeezable handle 44 is switched from a squeezed state to a relaxed state, a low pressure is formed in the squeezable handle 44, and the four picking components 43 perform a picking operation. When the squeezable handle 44 is switched from a relaxed state to a squeezed state, the gas in the squeezable handle 44 is discharged through the four picking components 43, and the four picking components 43 perform a releasing operation.

[0075] In summary, in the adjustable transport system provided by the embodiment of the present disclosure, the adjustable transporter has multiple picking devices arranged in an array, which can pick up and transport multiple chips to be tested at one time, thereby improving the test efficiency of the packaged chips. The adjustable tray can be suitable for accommodating packaged chips of various sizes by adjusting the positions of the first grid bar and the second grid bar, and the array arrangement of the chips to be tested on the adjustable tray can be adjusted according to the test fixture array. At the same time, the array arrangement of the picking components of the adjustable transporter matches the test fixture array, so as to realize the rapid transport of the packaged chips on the adjustable tray to the test fixture array for testing. It is suitable for packaged chips of different sizes and test fixture arrays of different layouts, thereby improving the test efficiency.

[0076] Finally, it should be noted that the various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other. For the system or device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the method part description.

[0077] The above embodiments are only used to illustrate the technical solutions of the present disclosure, rather than to limit them. Although the present disclosure has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present disclosure.

Claims

1. An adjustable transport system for chip testing, characterized in that: The adjustable transport system comprises: An adjustable tray is configured to accommodate the chips to be tested, and the array arrangement of the chips to be tested on the adjustable tray is configured to be adjusted to match the array of the test fixture, and the adjustable tray includes: Pallet frames; A plurality of first bars are arranged in the tray frame, extending along a first direction and arranged parallel to each other, and configured to be able to slide along a second direction, wherein the first direction is orthogonal to the second direction; a plurality of second bars, arranged in the tray frame, extending along the second direction and arranged upwardly in parallel, and configured to be able to slide along the first direction, and The adjustable transporter is configured to pick up the chip to be tested from the adjustable tray and transport it to the test fixture array. The adjustable transporter includes a plurality of picking components arranged in an array. The array arrangement of the picking components is configured to be adjusted to match the test fixture array.

2. The adjustable transport system for chip testing according to claim 1, characterized in that: Each first grid bar includes a through hole, the through hole penetrates the first grid bar along the second direction, the through hole is a long strip-shaped through hole extending along the first direction, and the through hole is configured to allow the plurality of second grid bars to pass through.

3. The adjustable transport system for chip testing according to claim 2, characterized in that: Each second grid bar comprises: A fence rod extending along the second direction and passing through the through holes of the plurality of first fence bars; and A plurality of sliders are arranged on the fence bar and are configured to slide along the extension direction of the fence bar. Wherein, each slider is arranged between two adjacent first bars or between the side wall of the tray frame and the first bar closest to the side wall of the tray frame, and the through hole does not allow the slider to pass through.

4. The adjustable transport system for chip testing according to claim 3, characterized in that The top surfaces of the tray frame, the first grid bar and the slider are basically located on the same horizontal plane.

5. The adjustable transport system for chip testing according to claim 3, characterized in that , the length of the slider in the second direction is less than or equal to the size of the chip.

6. The adjustable transport system for chip testing according to any one of claims 1 to 5, characterized in that: The adjustable transporter comprises: A casing having a hollow structure; A first T-tube and a second T-tube are arranged opposite to each other, wherein the first T-tube comprises a first guide tube and a first connecting tube perpendicular to each other, and the second T-tube comprises a second guide tube and a second connecting tube perpendicular to each other, and a first free end of the first connecting tube away from the first guide tube and a second free end of the second connecting tube away from the second guide tube are slidably inserted into two ends of the sleeve respectively so that the first guide tube and the second guide tube are arranged in parallel; The first group of picking components and the second group of picking components are slidably disposed on the first guide tube and the second guide tube, respectively.

7. The adjustable transport system for chip testing according to claim 6, characterized in that: The adjustable transporter also includes: A handle is arranged on the sleeve, and one end of the handle away from the sleeve is connected to a suction device, and the suction device is connected to each picking component through a pipeline arranged inside the adjustable transporter.

8. The adjustable transport system for chip testing according to claim 6, characterized in that: The adjustable transporter also includes: A first locking member, disposed on the sleeve, configured to lock the position of the first connecting tube and / or the second connecting tube relative to the sleeve; and / or A second locking member is disposed on the first guide tube and / or the second guide tube, and is configured to lock the position of the first group of picking components relative to the first guide tube and / or the position of the second group of picking components relative to the second guide tube.

9. The adjustable transport system for chip testing according to any one of claims 1 to 5, characterized in that: The adjustable transporter comprises: A cross sleeve having a hollow structure; Four sliding tubes, slidably inserted into four free ends of the cross sleeve; Four picking components are respectively arranged at free ends of the four sliding tubes away from the cross sleeve.

10. The adjustable transport system for chip testing according to claim 9, characterized in that: The adjustable transporter also includes: The squeezable handle is arranged on the cross sleeve. When the squeezable handle is switched from a squeezed state to a relaxed state, the four picking components perform a picking operation. When the squeezable handle is switched from a relaxed state to a squeezed state, the four picking components perform a releasing operation.

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