Back contact solar cell testing device

Abstract

The invention discloses a back contact solar cell testing device which is used for testing a back contact solar cell and comprises a supporting part, a fixing plate, a moving mechanism, a conductive device and a testing system. The supporting part is of a rigid structure, and a plurality of adsorption holes are formed in the side, facing the back contact solar cell, of the supporting part to adsorb the back contact solar cell. The fixing plate is arranged on the side, away from the supporting part, of the back contact solar cell. The conductive device is fixed at one end of the moving mechanism facing the supporting part. The back contact solar cell is firmly adsorbed on the supporting part by the negative pressure compressed air in the adsorption hole, and the supporting part is of a rigid structure, so that when the back contact solar cell is clamped by the conductive device and the supporting part, the supporting part stably supports the back contact solar cell, the back contact solar cell does not move, and the service life of the back contact solar cell is prolonged. Accurate contact between the conductive device and the back contact solar cell is ensured, so that accurate test results are ensured.

Description

Technical Field

[0001] The present application relates to the field of solar cell testing, and in particular to a back-contact solar cell testing device. Background Art

[0002] BC (Back Contact) integrates the PN junction and metal electrode on the back of the battery, eliminating the shading of the front electrode, maximizing the incident light absorption area, reducing optical losses, and improving conversion efficiency. Its core technology lies in the cross-finger PN partition design of the back electrode (P-type and N-type electrodes are arranged alternately), which reduces resistance losses by shortening the current transmission path. In recent years, "PN partition densification" has further compressed the electrode spacing to the sub-millimeter level, improving carrier collection efficiency.

[0003] Currently, 0BB (Zero Busbar, busbar-free battery) technology reduces silver consumption by eliminating the main grid and gradually reducing the width of the fine grid lines (less than 20μm). The test system needs to contact the fine grid lines on the back of the battery through a conductive device to complete the test. Since the fine grid lines of 0BB or BC batteries are less than 20μm wide and have a dense PN area, the conductive device must achieve precise and full contact with the fine grid lines on the back of the battery.

[0004] When the back-contact solar cell is undergoing IV testing and EL (Electroluminescence) testing, a light-transmitting support structure is used on the light-receiving surface to ensure that the light-receiving surface of the cell is evenly exposed to light and free of mechanical damage during the test.

[0005] In the existing back-contact solar cell testing device, during the contact process between the conductive device and the back electrode of the back-contact cell, contact deviation occurs because the back-contact cell is in a free-moving state, which affects the accuracy of the test result. Summary of the invention

[0006] The main purpose of the present application is to provide a back-contact solar cell testing device, which aims to solve the problem that the back-contact solar cell is prone to move when the conductive device clamps the back-contact solar cell, thereby affecting the accuracy of the test results.

[0007] To achieve the above-mentioned purpose, the present application provides a back-contact solar cell testing device for testing back-contact solar cells, the back-contact solar cell testing device comprising a support portion, a fixing plate, a moving mechanism, a conductive device and a testing system, the back-contact solar cell is arranged on one side of the support portion, the support portion is a rigid structure and has a plurality of adsorption holes on a side facing the back-contact solar cell to adsorb the back-contact solar cell, and the support portion is an optically highly light-transmitting material; the fixing plate is arranged on a side of the back-contact solar cell away from the support portion and has a gap between the fixing plate and the support portion, wherein the fixing plate is opposite to the support portion in a first direction; the moving mechanism passes through the fixing plate and has the freedom to move along the first direction; the conductive device is fixed to one end of the moving mechanism facing the support portion; the testing system is arranged on a side of the support portion away from the back-contact solar cell and is electrically connected to the conductive device, and the testing system is used to cooperate with the conductive device to test the back-contact solar cell.

[0008] Optionally, a side of the support portion facing the back-contact solar cell is flat.

[0009] Optionally, the plurality of adsorption holes are distributed in a rectangular array.

[0010] Optionally, the moving mechanism includes a telescopic member, which extends along the first direction and passes through the fixed plate, and has the freedom to telescope along the first direction; wherein the conductive device is fixed to one end of the telescopic member close to the support portion.

[0011] Optionally, the moving mechanism further includes a guide rod, which is fixed to a side of the conductive device away from the back-contact solar cell and extends along the first direction, and the guide rod passes through the fixing plate and is slidably engaged with the fixing plate.

[0012] Optionally, the telescopic member is an electric cylinder.

[0013] Optionally, there are multiple guide rods, and the multiple guide rods are arranged around the outer circumference of the telescopic member.

[0014] The embodiment of the present application proposes a back-contact solar cell testing device. When in use, the back-contact solar cell can be placed in a fixed position on a support portion. This position ensures that when the conductive device is pressed down, it is in complete and accurate contact with the battery grid line. At this time, the fine grid line of the back-contact solar cell is located on the side of the back-contact solar cell facing the conductive device. Negative pressure compressed air passes through the adsorption holes on the support portion to firmly adsorb the back-contact solar cell on the support portion. Then, the moving mechanism is started, and the moving mechanism drives the conductive device to move along a first direction, so that the conductive device is close to and fits the back-contact solar cell, so that the conductive device cooperates with the support portion to move the back contact. The solar cell is clamped, and the conductive device contacts the fine grid lines on the back-contact solar cell, so that the test can be completed in cooperation with the test system. During the test, the test system illuminates the back-contact solar cell, and the light passes through the support part to reach the back-contact solar cell; at the same time, the back-contact solar cell is firmly adsorbed on the support part by the negative pressure compressed air in the adsorption hole, and the support part is a rigid structure. In this way, when the conductive device and the support part clamp the back-contact solar cell, the support part stably supports the back-contact solar cell, and the back-contact solar cell will not move, thereby ensuring accurate contact between the conductive device and the back-contact solar cell, thereby ensuring accurate test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly explain the prior art and the present invention, the drawings required for describing the prior art and the embodiments of the present invention are briefly introduced below. Obviously, the drawings described below are only exemplary, and for ordinary technicians in this field, other drawings can be derived from the provided drawings without creative work.

[0016] The structures, proportions, sizes, etc. illustrated in this specification are only used to match the contents disclosed in the specification so that people familiar with this technology can understand and read them. They are not used to limit the conditions under which the present invention can be implemented. Any structural modification, change in proportion or adjustment of size should still fall within the scope of the technical contents disclosed in the present invention without affecting the effects and purposes that can be achieved by the present invention.

[0017] Figure 1 This is a schematic diagram of the overall structure of a back-contact solar cell testing device proposed in Example 1 of the present application;

[0018] Figure 2 for Figure 1 A schematic diagram of the structure of the embodiment after removing the fixing plate;

[0019] Figure 3 for Figure 1 Another perspective structural diagram of the embodiment;

[0020] Figure 4 for Figure 1Schematic diagram of the structure of the support part of the embodiment.

[0021] In the figure: 1. Support part; 11. Adsorption hole; 14. Air nozzle; 2. Fixing plate; 3. Moving mechanism; 31. Telescopic part; 32. Guide rod; 4. Conductive device; 5. Test system.

[0022] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0024] It should be noted that all directional indications in the embodiments of the present invention (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0025] In the present invention, unless otherwise clearly specified and limited, the terms "connection", "fixation", etc. should be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0026] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the present invention, the descriptions of "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the meaning of "and / or" appearing in the full text includes three parallel schemes. Taking "A and / or B" as an example, it includes scheme A, or scheme B, or a scheme that satisfies both A and B. In addition, the technical solutions between the various embodiments can be combined with each other, but it must be based on the ability of ordinary technicians in the field to implement. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0027] The present application is described in detail below with reference to the accompanying drawings and embodiments.

[0028] Figure 1 This is a schematic diagram of the overall structure of a back-contact solar cell testing device proposed in Example 1 of the present application; Figure 2 for Figure 1 A schematic diagram of the structure of the embodiment after removing the fixing plate; Figure 3 for Figure 1 Another perspective structural schematic diagram of the embodiment; Figure 4 for Figure 1 Schematic diagram of the structure of the support part of the embodiment.

[0029] refer to Figure 1 to Figure 4 , an embodiment of the present application provides a back-contact solar cell testing device for testing back-contact solar cells, the back-contact solar cell testing device may include a support portion 1, a fixing plate 2, a moving mechanism 3, a conductive device 4 and a testing system 5, a back-contact solar cell is arranged on one side of the support portion 1, the support portion 1 is a rigid structure and has a plurality of adsorption holes 11 on the side facing the back-contact solar cell to adsorb the back-contact solar cell, the support portion 1 is an optically highly light-transmitting material; the fixing plate 2 is arranged on the side of the back-contact solar cell away from the support portion 1 and has a gap between the fixing plate 2 and the support portion 1, wherein the fixing plate 2 is opposite to the support portion 1 in a first direction; the moving mechanism 3 passes through the fixing plate 2 and has the freedom to move along the first direction; the conductive device 4 is fixed to one end of the moving mechanism 3 facing the support portion 1; the testing system 5 is arranged on the side of the support portion 1 away from the back-contact solar cell and is electrically connected to the conductive device 4, the testing system 5 is used to cooperate with the conductive device 4 to test the back-contact solar cell.

[0030] The embodiment of the present application proposes a back-contact solar cell testing device. When in use, the back-contact solar cell can be placed in a fixed position on the support part 1. This position ensures that when the conductive device 4 is pressed down, it is in complete and accurate contact with the battery grid line. At this time, the fine grid line of the back-contact solar cell is located on the side of the back-contact solar cell facing the conductive device 4. Negative pressure compressed air is introduced into the adsorption hole 11 on the support part 1 to firmly adsorb the back-contact solar cell on the support part 1. Then, the moving mechanism 3 is started, and the moving mechanism 3 drives the conductive device 4 to move along the first direction, so that the conductive device 4 is close to and fits the back-contact solar cell, so that the conductive device 4 cooperates with the support part 1 to move the back contact The solar cell is clamped, and the conductive device 4 contacts the fine grid lines on the back-contact solar cell, so that the test can be completed in cooperation with the test system 5. During the test, the test system 5 illuminates the back-contact solar cell, and the light passes through the support 1 to reach the back-contact solar cell; at the same time, the back-contact solar cell is firmly adsorbed on the support 1 by the negative pressure compressed air in the adsorption hole 11, and the support 1 is a rigid structure, so when the conductive device 4 and the support 1 clamp the back-contact solar cell, the support 1 stably supports the back-contact solar cell, and the back-contact solar cell will not move, ensuring that the conductive device 4 is in accurate contact with the back-contact solar cell, thereby ensuring accurate test results.

[0031] Specifically, Figure 1 or Figure 3 As shown, the first direction is the X direction. The back-contact solar cell testing device can be placed vertically when in use, so that the first direction is the same as the gravity direction. For ease of explanation, the following explanation will be based on the assumption that the first direction is the same as the gravity direction.

[0032] In addition, for the convenience of explanation, the conductive device 4 contacts the fine grid lines on the back side of the back-contact solar cell as an example.

[0033] Among them, Figure 1 and Figure 2 As shown, the support portion 1 can be a plate-like member, and the thickness direction of the support portion 1 is the same as the first direction. A plurality of adsorption holes 11 are arranged on the top of the support portion 1, and an air nozzle 14 is arranged on the side of the support portion 1 to communicate with the adsorption holes 11. When the back-contact solar cell covers the adsorption holes 11 on the support portion 1, negative pressure compressed air is passed into the air nozzle 14 to generate a vacuum, and the back-contact solar cell is adsorbed on the support portion 1. At this time, the back-contact solar cell and the support portion 1 are relatively still and will not be displaced by external force, thereby ensuring that the position of the fine grid line of the back-contact solar cell is determined, so that when the conductive device 4 directly contacts the back-contact solar cell, the contact position is accurate.

[0034] It should be understood that the support portion 1 has a cavity inside, and the cavity is connected to the air nozzle 14 and the adsorption holes 11 respectively, so that when negative pressure compressed air is passed into the air nozzle 14, each adsorption hole 11 can be adsorbed.

[0035] In addition, in some traditional solutions, two horizontal and spaced support rods are often used to support the back-contact solar cell. The fine grid lines of the back-contact solar cell are located below the back-contact solar cell. The test fixture is divided into upper and lower parts. The conductive device is located below the back-contact solar cell, and the clamping part that cooperates with the conductive device is located above the back-contact solar cell. When testing, the conductive device and the clamping part are close to each other so that the conductive device lifts the back-contact solar cell and cooperates with the clamping part to clamp the back-contact solar cell. At this time, the back-contact solar cell is separated from the support rod, and the back-contact solar cell is in good contact with the conductive device, so as to perform the test. In this process, the conductive device needs to avoid the support rod before it can clamp the back-contact solar cell together with the clamping part. This will cause the fine grid lines of the back-contact solar cell located at the support rod to avoid the conductive device, so that the conductive device cannot fully contact with the fine grid lines on the back-contact solar cell, affecting the test effect.

[0036] In the embodiment of the present application, the support portion 1 and the conductive device 4 are directly used to clamp the back-contact solar cell. There is no redundant structure between the conductive device 4 and the back-contact solar cell. Therefore, the conductive device 4 does not need to avoid any structure during movement, so that the conductive device 4 can be in full contact with the fine grid lines on the back-contact solar cell, and the test effect is better.

[0037] Furthermore, in the embodiment of the present application, the adsorption holes 11 on the support portion 1 adsorb and fix the back-contact solar cell. In this way, even when testing back-contact solar cells of different sizes, the back-contact solar cell can be adsorbed and fixed through the adsorption holes 11. This is convenient and quick, and it is only necessary to ensure that the back-contact solar cell can cover the adsorption holes 11. However, in the traditional solution, it is necessary to adjust the distance between the two support rods to adapt to back-contact solar cells of different sizes, and after the distance between the two support rods is adjusted, the process of the conductive device avoiding the support rods also needs to be adjusted accordingly, and the operation is extremely complicated and inconvenient.

[0038] It should be noted that if Figure 1 As shown, the fixing plate 2 may also be a plate-shaped member, and the fixing plate 2 and the supporting portion 1 are arranged opposite to each other in the first direction, which means that the thickness direction of the fixing plate 2 is also the same as the first direction, and the fixing plate 2 and the supporting portion 1 are opposite to each other in the first direction.

[0039] Further, such as Figure 1 As shown, the fixing plate 2 can be connected to the supporting part 1 through two fixing members, and the fixing members support the fixing plate 2 .

[0040] Among them, the adsorption holes 11, cavities and air nozzles 14 that cooperate with each other constitute an adsorption structure. A group of adsorption structures can include a group of adsorption holes 11, cavities and air nozzles 14 that cooperate to adsorb a back-contact solar cell. A group of adsorption structures can also include multiple groups of adsorption holes 11, cavities and air nozzles 14 that cooperate to adsorb multiple back-contact solar cells.

[0041] Of course, even if a set of adsorption structures only includes a set of adsorption holes 11, cavities and air nozzles 14, multiple back-contact solar cells can be adsorbed, as long as the multiple back-contact solar cells cover all the adsorption holes 11 in the corresponding adsorption structure.

[0042] Furthermore, when multiple back-contact solar cells are adsorbed on the support portion, the conductive device 4 can be arranged in conjunction with the multiple back-contact solar cells, so that the conductive device 4 can contact the fine grid lines on multiple back-contact solar cells at one time and test the multiple back-contact solar cells simultaneously.

[0043] Specifically, the test system 5 can be electrically connected to the conductive device 4 to perform IV test and EL test on the back-contact solar cell. There are many existing solutions for how the test system 5 performs the test, which will not be described in detail here.

[0044] In addition, the light source can be integrated into the test system 5, so that the test system 5 can be set on the side of the support part 1 away from the back-contact solar cell, and the back-contact solar cell can be illuminated by the light source for testing.

[0045] It should be understood that if Figure 1 As shown, when the test system 5 is located below the support portion 1 , support legs may be added below the support portion 1 so that the test system 5 can be accommodated below the support portion 1 .

[0046] In addition, the support part 1 is made of optically highly transparent material, such as highly transparent glass. Thus, when the back-contact solar cell needs to be illuminated for testing, the testing system 5 can directly illuminate it, so that the light can pass through the support part 1 and illuminate the light-receiving surface of the back-contact solar cell for testing.

[0047] refer to Figure 1 and Figure 2 The support part 1 can also be arranged on a plate-like member, and a hollow is arranged on the plate-like member, and the support part 1 can be arranged in the hollow. In this way, it is convenient to disassemble the support part 1 separately, so as to clean, maintain and replace the adsorption hole 11, the air nozzle 14 and other structures. Among them, the hollow can ensure that the light emitted by the test system 5 reaches the back contact solar cell.

[0048] refer to Figure 1 and Figure 2 In an exemplary embodiment, the side of the support portion 1 facing the back contact solar cell is flat.

[0049] It should be understood that the conductive device 4 is a plate-shaped member. When the side of the support portion 1 facing the back-contact solar cell is flat, the back-contact solar cell is also in a flat state when supported by the support portion 1. In this way, the plate-shaped conductive device 4 has a better contact effect with the fine grid lines on the back-contact solar cell, and the test result is more accurate.

[0050] refer to Figure 2 In an exemplary embodiment, the plurality of adsorption holes 11 are distributed in a rectangular array.

[0051] It should be understood that most back-contact solar cells are rectangular structures, so the multiple adsorption holes 11 are distributed in a rectangular array. In this way, when the adsorption holes 11 adsorb the back-contact solar cell, the adsorption holes 11 are arranged more evenly at different positions of the back-contact solar cell, and the adsorption effect is better, ensuring that there is almost no movement between the back-contact solar cell and the support part 1.

[0052] refer to Figure 1 In an exemplary embodiment, the moving mechanism 3 may include a telescopic member 31, which extends along a first direction and penetrates the fixed plate 2, and the telescopic member 31 has the freedom to telescope along the first direction; wherein the conductive device 4 is fixed to one end of the telescopic member 31 close to the support part 1.

[0053] Specifically, the telescopic member 31 may be an electric cylinder, which is connected to an external power source. Of course, a battery may also be provided on the back contact solar cell testing device, and the electric cylinder and the battery may be electrically connected.

[0054] Among them, the cylinder body of the electric cylinder is fixed to the side of the fixed plate 2 away from the support part 1, the piston rod of the electric cylinder passes through the fixed plate 2, the piston rod can slide along the first direction relative to the cylinder body, and the conductive device 4 is fixed on the side of the piston rod close to the support part 1. In this way, the electric cylinder can control the conductive device 4 to descend or rise by controlling the piston rod to extend or retract the cylinder body.

[0055] Furthermore, a through hole extending along the first direction can be provided on the fixed plate 2, the diameter of the through hole is larger than the diameter of the piston rod, and the piston rod passes through the through hole. In this way, when the electric cylinder drives the piston rod to extend or retract into the cylinder body, no friction will be generated between the piston rod and the fixed plate 2, thereby effectively improving the service life of the piston rod.

[0056] refer to Figure 1 In an exemplary embodiment, the moving mechanism 3 may further include a guide rod 32, which is fixed to a side of the conductive device 4 away from the back-contact solar cell and extends along the first direction, and the guide rod 32 passes through the fixed plate 2 and slidably cooperates with the fixed plate 2.

[0057] Specifically, Figure 1As shown, the guide rod 32 has the freedom to slide along the first direction and is fixed to the conductive device 4, so that when the electric cylinder drives the conductive device 4 to move in the first direction, the guide rod 32 limits the conductive device 4, so that the movement process of the conductive device 4 in the first direction is more stable, and the conductive device 4 is effectively prevented from shaking during the movement, thereby ensuring the contact effect between the conductive device 4 and the fine grid lines on the back-contact solar cell.

[0058] refer to Figure 1 In the exemplary embodiment, there are multiple guide rods 32 , and the multiple guide rods 32 are arranged around the outer circumference of the telescopic member 31 .

[0059] It should be understood that if Figure 1 As shown, the more the number of guide rods 32 is, the more stable the movement process of the conductive device 4 is, so that the contact effect between the conductive device 4 and the fine grid lines on the back-contact solar cell is better.

[0060] Among them, a plurality of guide rods 32 are disposed around the outer circumference of the telescopic member 31 , so that the conductive device 4 is subjected to a more uniform force as a whole.

[0061] The above are only preferred embodiments of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A back contact solar cell testing device, characterized in that: Used to test back-contact solar cells, the back-contact solar cell testing device comprises: A support portion (1), one side of which is provided with the back-contact solar cell, the support portion (1) being a rigid structure and having a plurality of adsorption holes (11) on the side facing the back-contact solar cell for adsorbing the back-contact solar cell, the support portion (1) being made of an optically highly light-transmitting material; a fixing plate (2), arranged on a side of the back-contact solar cell facing away from the supporting portion (1) and having a gap between the fixing plate (2) and the supporting portion (1), wherein the fixing plate (2) and the supporting portion (1) are opposite to each other in a first direction; A moving mechanism (3) that penetrates the fixed plate (2) and has the freedom to move along the first direction; A conductive device (4) fixed to one end of the moving mechanism (3) facing the supporting portion (1); A test system (5) is arranged on a side of the support portion (1) away from the back-contact solar cell and is electrically connected to the conductive device (4). The test system (5) is used to cooperate with the conductive device (4) to test the back-contact solar cell.

2. The back contact solar cell testing device according to claim 1, characterized in that: The side of the support portion (1) facing the back contact solar cell is flat.

3. The back contact solar cell testing device according to claim 1, characterized in that: The plurality of adsorption holes (11) are distributed in a rectangular array.

4. The back contact solar cell testing device according to claim 1, characterized in that: The moving mechanism (3) comprises: A telescopic member (31) extending along the first direction and penetrating the fixed plate (2), the telescopic member (31) having a degree of freedom to telescope along the first direction; Wherein, the conductive device (4) is fixed to one end of the telescopic member (31) close to the supporting portion (1).

5. The back contact solar cell testing device according to claim 4, characterized in that: The moving mechanism (3) further comprises: A guide rod (32) is fixed to a side of the conductive device (4) away from the back-contact solar cell and extends along the first direction; the guide rod (32) penetrates the fixing plate (2) and is slidably matched with the fixing plate (2).

6. The back contact solar cell testing device according to claim 4, characterized in that: The telescopic member (31) is an electric cylinder.

7. The back contact solar cell testing device according to claim 5, characterized in that: There are a plurality of guide rods (32), and the plurality of guide rods (32) are arranged around the outer circumference of the telescopic member (31).

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