Testing device

Abstract

The invention provides a testing device, and relates to the technical field of camera modules. The problems that the test result of an existing test device is inaccurate, and the test precision of a camera module is affected are solved. The testing device comprises a calibration module, a reflection module and a fixing assembly. The reflection module is provided with a plurality of reflection surfaces, the calibration module is arranged on the light incident side of the first reflection surface along the propagation path of light, and the light is sequentially reflected by the plurality of reflection surfaces; the reflection module can slide along a first direction relative to the calibration module. The fixing assembly is fixed relative to the calibration module, the fixing assembly is used for fixing equipment to be tested, and the fixing assembly is arranged on the light emitting side of the last reflecting surface along the light propagation path. Wherein along the propagation path of the light, the propagation direction of the incident light of the first reflecting surface is opposite to the propagation direction of the emergent light of the last reflecting surface.

Description

Technical Field

[0001] The present application relates to the field of camera module technology, and in particular to a testing device. Background Art

[0002] Most electronic devices (e.g., mobile phones) are equipped with camera modules, which enable users to take photos and improve user experience. Currently, there are multiple camera modules on electronic devices, and the focal lengths of the multiple camera modules are different. Multiple camera modules need to be tested during the production stage. However, the test results of existing testing devices are inaccurate, which affects the test accuracy of the camera module. Summary of the invention

[0003] The embodiment of the present application provides a testing device for solving the problem that the testing results of the testing device are inaccurate, affecting the testing accuracy of the camera module.

[0004] To achieve the above objectives, the embodiments of the present application adopt the following technical solutions:

[0005] The present application provides a testing device, which includes a calibration module, a reflection module and a fixing component. The reflection module has multiple reflection surfaces. Along the propagation path of the light, the calibration module is arranged on the light incident side of the first reflection surface, and the light is reflected in sequence by the multiple reflection surfaces; the reflection module can slide along a first direction relative to the calibration module. The fixing component is fixed relative to the calibration module, and the fixing component is used to fix the device to be tested. Along the propagation path of the light, the fixing component is arranged on the light exit side of the last reflection surface. Among them, along the propagation path of the light, the propagation direction of the incident light of the first reflection surface is opposite to that of the outgoing light of the last reflection surface.

[0006] In the test device provided by the present application, since the calibration module and the fixed component are relatively fixed, the relative position error between the calibration module and the fixed component can be avoided. In addition, the propagation direction of the incident light of the first reflection surface is opposite to the propagation direction of the outgoing light of the last reflection surface, that is, the propagation direction of the incident light of the reflection module is opposite to that of the outgoing light. In this way, when the reflection module slides along the first direction, the optical path distance between the calibration module and the fixed component can be changed to achieve the test of camera modules with different focal lengths. And when changing the camera module to be tested, there is no need to change the relative position between the calibration module and the fixed component (i.e., the camera module), which is conducive to improving the accuracy of the test results after the test device tests the camera module.

[0007] In a possible implementation of the present application, the multiple reflective surfaces include a first reflective surface and a second reflective surface, the calibration module is arranged on the light incident side of the first reflective surface; the second reflective surface is arranged on the light exiting side of the first reflective surface, and the fixing component is arranged on the light exiting side of the second reflective surface. The propagation direction of the incident light of the first reflective surface is opposite to that of the outgoing light of the second reflective surface. Under this structure, the first reflective surface and the second reflective surface both make the light turn 90° so that the light is deflected 180°, thereby realizing that the propagation direction of the incident light of the reflective module is opposite to that of the outgoing light.

[0008] In a possible implementation of the present application, multiple reflection modules are provided, and the multiple reflection modules reflect light in turn; along the propagation path of the light, the second reflection surface of each reflection module is arranged on the light incident side of the first reflection surface of the next reflection module, and the calibration module is arranged on the light incident side of the first reflection surface of the first reflection module, and the fixing component is arranged on the light exit side of the second reflection surface of the last reflection module; at least one reflection module among the multiple reflection modules can move along the first direction relative to the calibration module. Under this structure, the moving distance of the movable reflection module can be shortened, which is conducive to improving the integration of the test device.

[0009] In a possible implementation of the present application, the multiple reflection modules include a first reflection module and a second reflection module. The first reflection module is fixed relative to the calibration module, and the calibration module is arranged on the light incident side of the first reflection surface of the first reflection module. The second reflection module can move along the first direction relative to the calibration module; the first reflection surface of the second reflection module is arranged on the light emitting side of the second reflection surface of the first reflection module, and the fixed component is arranged on the light emitting side of the second reflection surface of the second reflection module. Under this structure, along the propagation path of the light path, the calibration module, the first reflection module, the second reflection module and the fixed component are distributed in sequence, and the distance between the first reflection module and the calibration module remains unchanged, which is conducive to reducing the volume of the first reflection module, thereby helping to reduce the overall volume of the test device.

[0010] In a possible implementation of the present application, the testing device further includes a sliding assembly, the sliding assembly includes a sliding portion and a fixed portion, the fixed portion is fixed relative to the calibration module, the sliding portion is slidably connected to the fixed portion, and the sliding portion can slide relative to the fixed portion along a first direction, and the second reflection module is disposed on the sliding portion. Under this structure, the second reflection module slides relative to the fixed portion via the sliding portion, thereby achieving the fixation of the second reflection module relative to the calibration module.

[0011] For example, the sliding part may be a slider, and the fixed part may be a slide rail. Alternatively, the sliding part may be a nut, and the fixed part may be a screw rod. Alternatively, the sliding part may be a rack, and the fixed part may be a gear, so as to achieve linear relative motion between the two.

[0012] In a possible implementation of the present application, the reflection module includes a reflection prism and a support frame, the reflection prism is arranged on the support frame, and the reflection prism has a first reflection surface and a second reflection surface. Under this structure, the two reflection surfaces on a reflection prism realize 180° deflection of light, which is conducive to reducing parts and reducing costs.

[0013] In a possible implementation of the present application, the reflecting prism includes a first reflecting prism and a second reflecting prism, the supporting frame includes a first supporting frame and a second supporting frame, the first reflecting prism is arranged on the first supporting frame, the second reflecting prism is arranged on the second supporting frame, the first reflecting prism has a first reflecting surface, and the second reflecting prism has a second reflecting surface. Under this structure, only one reflecting surface is arranged on a reflecting prism, and the deflection of the light path is achieved by two reflecting prisms, which is conducive to reducing the difficulty of processing the reflecting prism.

[0014] In a possible implementation of the present application, the reflection module further includes a first adjustment module, the first adjustment module is connected to the first support frame, and the first adjustment module is used to adjust the position of the first support frame along the second direction. Under this structure, the first adjustment module can be used to fine-tune the position of the first support frame along the two directions to improve the test accuracy of the test device.

[0015] In a possible implementation of the present application, the reflection module further includes a second adjustment module, the second adjustment module is connected to the second support frame, and the second adjustment module is used to adjust the position of the second support frame along a third direction, and the third direction is perpendicular to the second direction. Under this structure, the position of the second support member along the third direction can be fine-tuned, which can further improve the test accuracy of the test device.

[0016] In a possible implementation of the present application, the reflection module further includes a fixing frame and a third adjustment module, the first support frame and the second support frame are both arranged on the fixing frame, the third adjustment module is connected to the fixing frame, and the third adjustment module is used to adjust the position of the fixing frame along a fourth direction, and the fourth direction is perpendicular to the second direction and the third direction. Under this structure, the position of the reflection module can be adjusted in three directions through three adjustment modules, thereby ensuring that the camera module to be tested can take calibration pictures, thereby further improving the test accuracy.

[0017] In a possible implementation of the present application, one of the second direction, the third direction and the fourth direction is parallel to the first direction. This helps to reduce the difficulty of fine-tuning the reflection module and improve the adjustment accuracy.

[0018] In a possible implementation of the present application, the calibration module includes a calibration plate and a driving member, and the driving member is used to drive the calibration plate to rotate.

[0019] In a possible implementation of the present application, the calibration module further includes a backlight panel, and the backlight panel is fixed to a side of the calibration panel away from the reflection module.

[0020] In a possible implementation of the present application, the fixing assembly includes a fixing seat and a clamping member, the fixing seat is fixed relative to the calibration module, the clamping member is fixed on the fixing seat, and the clamping member is used to clamp the device to be detected. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 A structural diagram of a testing device provided in an embodiment of the present application;

[0022] Figure 2 A structural diagram of another testing device provided in an embodiment of the present application;

[0023] Figure 3 A structural diagram of another testing device provided in an embodiment of the present application;

[0024] Figure 4 for Figure 3 A schematic diagram of the structure of the optical path propagation of the test device provided;

[0025] Figure 5 for Figure 3 A schematic diagram of the structure of the light path propagation after the second reflection module of the testing device moves a certain distance along the first direction is provided;

[0026] Figure 6 for Figure 3 A structural schematic diagram of the optical path propagation after the second reflection module of the provided testing device moves to a limit distance along the first direction;

[0027] Figure 7 A structural diagram of a sliding assembly provided in an embodiment of the present application;

[0028] Figure 8 A structural diagram of a reflection module provided in an embodiment of the present application;

[0029] Fig. 9 for Figure 8 A structural diagram of a reflective prism of a provided reflective module;

[0030] Fig.10 A structural diagram of a second reflection module provided in an embodiment of the present application;

[0031] Fig.11 A structural diagram of another reflection module provided in an embodiment of the present application;

[0032] Fig.12 A structural diagram of another reflection module provided in an embodiment of the present application;

[0033] Fig.13A structural diagram of a calibration module provided in an embodiment of the present application;

[0034] Fig.14 A structural diagram of a fixing assembly provided in an embodiment of the present application;

[0035] Fig.15 A schematic diagram of the test principle of the test device provided in the embodiment of the present application;

[0036] Fig.16 for Fig.15 A zoom ratio-viewing range curve obtained by testing the provided test device;

[0037] Fig.17 for Fig.15 The zoom ratio-center position offset curve obtained by testing the provided test device.

[0038] Figure numerals: 10-test device; 100-calibration module; 110-calibration plate; 120-driving member; 130-backlight panel; 200-reflection module; 210-reflection surface; 200a-first reflection module; 210a-first reflection surface; 210b-second reflection surface; 200b-second reflection module; 210c-third reflection surface; 210d-fourth reflection surface; 220-reflection prism; 220a-first reflection prism ; 220b-second reflecting prism; 230-support frame; 230a-first support frame; 230b-second support frame; 240-fixed frame; 250-first adjusting module; 260-second adjusting module; 270-third adjusting module; 300-fixed assembly; 310-fixed seat; 320-clamping piece; 400-sliding assembly; 410-sliding part; 420-fixed part; 500-fixed platform; 20-equipment to be tested. DETAILED DESCRIPTION

[0039] The technical solutions in the embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments.

[0040] In the following, the terms "first", "second", etc. are used for descriptive purposes only and are not to be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first", "second", etc. may explicitly or implicitly include one or more of the features.

[0041] In addition, in the present application, directional terms such as "upper" and "lower" are defined relative to the orientation of the components in the drawings. It should be understood that these directional terms are relative concepts. They are used for relative description and clarification, and they can change accordingly according to the changes in the orientation of the components in the drawings.

[0042] In the present application, unless otherwise clearly specified and limited, the term "connection" should be understood in a broad sense. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a direct connection or an indirect connection through an intermediate medium.

[0043] Electronic devices, such as mobile phones, tablet personal computers, laptop computers, personal digital assistants (PDAs), cameras, personal computers, and notebook computers, are common terminal products in daily life. In addition, most electronic devices are equipped with camera modules, through which users can take photos, record videos, and have video chats, which helps to improve user experience.

[0044] However, during the production test phase of the above electronic devices (taking mobile phones as an example), the camera modules of the electronic devices need to be tested to determine whether the camera modules meet the standards. The camera modules of electronic devices can be tested using a test device. Please refer to Figure 1 , Figure 1 This is a structural diagram of a test device 10 provided in an embodiment of the present application. The test device 10 may include a calibration plate 110 for taking calibration pictures and a fixed platform 500 for fixing a device to be tested 20, and then controls the device to be tested 20 to take calibration pictures for lens calibration.

[0045] Since electronic devices currently used are generally provided with multiple camera modules, such as ultra-wide angle, wide angle, telephoto and other camera modules, they can adapt to the user's shooting needs in different scenes. Therefore, it is necessary to set up multiple calibration plates 110 in the above-mentioned test device 10 to test camera modules with different focal lengths. However, when the device to be tested 20 takes calibration pictures for different calibration plates 110, it is necessary to move to different positions respectively. In this way, during the movement of the device to be tested 20, the relative position between the device to be tested 20 and the calibration plate 110 may cause errors, resulting in inaccurate test results.

[0046] Based on this, see Figure 2 , Figure 2 This is a structural diagram of another testing device 10 provided in an embodiment of the present application, and the testing device 10 can be used to test the camera module on the above-mentioned device to be tested 20. During the test process, various performances of the camera module can be tested and evaluated, including resolution, distortion, field of view, color accuracy, eccentricity, uniformity, sensor tilt, etc.

[0047] Specifically, the testing device 10 may include a calibration module 100, a reflection module 200, and a fixing assembly 300. The reflection module 200 has a plurality of reflection surfaces 210 along the propagation path of the light ( Figure 2 As shown by the dashed arrow in the middle, the calibration module 100 is arranged on the light incident side of the first reflective surface 210, and the fixing component 300 is arranged on the light emitting side of the last reflective surface 210, and the light is sequentially reflected by the multiple reflective surfaces 210. The fixing component 300 is used to fix the above-mentioned device 20 to be tested.

[0048] Furthermore, the reflection module 200 can be relative to the calibration module 100 along a first direction ( Figure 2 The fixing assembly 300 is fixed relative to the calibration module 100, and along the propagation path of the light, the propagation direction of the incident light of the first reflection surface 210 is opposite to that of the outgoing light of the last reflection surface 210. It should be noted that the movement of the reflection module 200 relative to the calibration module 100 along the first direction includes movement in a direction close to the calibration module 100 and movement in a direction away from the calibration module 100, that is, the reflection module 200 can move back and forth along the first direction.

[0049] For example, please refer to Figure 2 The multiple reflective surfaces 210 may include a first reflective surface 210a and a second reflective surface 210b. The calibration module 100 may be arranged on the light incident side of the first reflective surface 210a, the second reflective surface 210b may be arranged on the light emitting side of the first reflective surface 210a, and the fixing component 300 may be arranged on the light emitting side of the second emitting surface.

[0050] Furthermore, the propagation direction of the incident light of the first reflective surface 210a is opposite to that of the outgoing light of the second reflective surface 210b. That is, the first reflective surface 210a is used to reflect the light at an angle of 90°, and the second reflective surface 210b reflects the light at an angle of 90° again, so that the incident light of the first reflective surface 210a and the outgoing light of the second reflective surface 210b are opposite in direction, that is, the optical path of the light is deflected by 180° through the first reflective surface 210a and the second reflective surface 210b.

[0051] At the same time, the incident light of the first reflective surface 210a and the outgoing light of the second reflective surface 210b can both be parallel to the first direction. It can be understood that the incident light and the outgoing light are parallel to the first direction means that the propagation paths of the incident light and the outgoing light are parallel to the first direction, so that when the reflective module 200 moves along the first direction, the camera module of the device to be tested 20 can still take calibration pictures.

[0052] Based on this, the calibration module 100 and the fixing assembly 300 can be fixed, that is, they are relatively fixed and do not need to move relative to each other, so as to avoid errors in the relative position between the calibration module 100 and the fixing assembly 300. At the same time, since the propagation directions of the incident light of the first reflection surface 210a and the outgoing light of the second reflection surface 210b are opposite, the distance between the first reflection surface 210a and the calibration module 100, and the distance between the second reflection surface 210b and the fixing assembly 300 can be adjusted during the movement of the reflection module 200 along the first direction. In other words, the length of the path of light propagation can be adjusted.

[0053] In this way, by moving the reflection module 200 along the first direction, the light stroke between the calibration module 100 and the fixing component 300 can be changed. The adjustment of the light stroke can adapt to the focal lengths of different camera modules of the device to be tested 10, so that calibration tests can be performed on multiple camera modules of the device to be tested 10. During the test, the test results will not be inaccurate due to errors in the relative positions of the calibration module 100 and the fixing component 300, which is beneficial to improving the accuracy of the test results of the camera module.

[0054] On this basis, the above-mentioned reflection module 200 can also be provided with multiple ones, and one side of the multiple reflection modules 200 reflects the light; along the propagation path of the light, the second reflection surface 210b of each reflection module 200 is arranged on the light incident side of the first reflection surface 210a of the next reflection module 200, and the calibration module 100 is arranged on the light incident side of the first reflection surface 210a of the first reflection module 200, and the fixing component 300 is arranged on the light emitting side of the second reflection surface 210b of the last reflection module 200; at least one reflection module 200 among the multiple reflection modules 200 can move relative to the calibration module 100 along the above-mentioned first direction.

[0055] For example, see Figure 3 , Figure 3 A structural diagram of another test device 10 provided in an embodiment of the present application. The plurality of reflection modules 200 may include a first reflection module 200a and a second reflection module 200b, and the first reflection module 200a and the second reflection module 200b each include two reflection surfaces 210. For ease of description, the two reflection surfaces 210 of the first reflection module 200a are referred to as the first reflection surface 210a and the second reflection surface 210b, and the two reflection surfaces 210 of the second reflection module 200b are referred to as the third reflection surface 210c (i.e., the first reflection surface 210a of the second reflection module 200b) and the fourth reflection surface 210d (i.e., the second reflection surface 210b of the second reflection module 200b).

[0056] The first reflection module 200a is fixed relative to the calibration module 100, and the calibration module 100 is arranged on the light incident side of the first reflection surface 210a (i.e., the first reflection surface 210a of the first reflection module 200a). The second reflection module 200b can move along the first direction relative to the calibration module 100, the third reflection surface 210c (i.e., the first reflection surface 210a of the second reflection module 200b) is arranged on the light emitting side of the second reflection surface 210b (i.e., the second reflection surface 210b of the first reflection module 200a), and the fixing component 300 is arranged on the light emitting side of the fourth reflection surface 210d (i.e., the second reflection surface 210b of the second reflection module 200b).

[0057] Among them, see Figure 4 , Figure 4 for Figure 3 A structural schematic diagram of light path propagation of a testing device 10 is provided. The distance between the calibration plate 110 and the reflection point on the first reflection surface 210a is A, the distance between the reflection point on the first reflection surface 210a and the reflection point on the second reflection surface 210b is B, the distance between the reflection point on the second reflection surface 210b and the reflection point on the third reflection surface 210c is C, the distance between the reflection point on the third reflection surface 210c and the reflection point on the fourth reflection surface 210d is D, the distance between the reflection point on the fourth reflection surface 210d and the camera module (i.e., the fixing component 300) of the device to be tested 20 is E, the propagation distance of the light in the first reflection module 200a along the first direction (i.e., the distance between the surface of the light entering the first reflection module 200a and the reflection point on the first reflection surface 210a along the first direction) is F, the propagation distance of the light in the second reflection module 200b along the first direction is G, the refractive index of the reflection module 200 (i.e., the reflection prism 220) is n, and the movement stroke of the second reflection module 200b along the first direction is X.

[0058] Based on this, the total optical path distance L between the calibration module 100 and the fixed component 300 (i.e., the camera module of the device to be tested 20) can be divided into multiple sections, namely, the distance between the calibration plate 110 and the first reflection module 200a, i.e., AF. In the first reflection module 200a, the propagation distance along the first direction is 2*n*F (including the light entering the first reflection module 200a to the first reflection surface 210a and the light emitting from the first reflection module 200a from the second reflection surface 210b, the two sections are equal and in opposite directions). In the first reflection module 200a, the distance from the reflection point of the first reflection surface 210a to the reflection point of the second reflection surface 210b is n*B. The distance between the first reflection module 200a and the second reflection module 200b (at this time, the second reflection module 200b is at the initial position) is CFG. The propagation distance of the light in the second reflection module 200b along the first direction is 2*n*G (including the travel and in opposite directions). In the second reflection module 200b, the distance from the reflection point of the third reflection surface 210c to the reflection point of the fourth reflection surface 210d is n*D. The distance between the second reflection module 200b and the fixed component 300 (the second reflection module 200b is at the initial position at this time) is E. And the movement stroke of the second reflection module 200b is 2*X (along the propagation path of the light, including two strokes, namely, the stroke between the first reflection module 200a and the second reflection module 200b, and the stroke between the second reflection module 200b and the fixed component 300. And the second reflection module 200b is located Figure 4 When the initial position is shown, X=0).

[0059] By adding the above multiple travel segments, it can be concluded that the optical path travel between the calibration module 100 and the fixed component 300 (i.e., the camera module of the device to be tested) is: L=A+n*B+C+n*D+E+2(F+G)*(n-1)+2*X.

[0060] When the second reflection module 200b is in the initial position, X=0. In this case, please continue to refer to Figure 4 , the total distance of the optical path is the minimum value, that is, the total distance of the optical path is L=A+n*B+C+n*D+E+2(F+G)*(n-1).

[0061] When the second reflection module 200b moves a distance X1 along the first direction, X=X1. In this case, refer to Figure 5 , Figure 5 for Figure 3 A structural schematic diagram of the optical path propagation after the second reflection module 200b of the test device 10 moves a certain distance along the first direction is provided, and the total optical path distance is: L=A+n*B+C+n*D+E+2(F+G)*(n-1)+2*X1.

[0062] When the second reflection module 200b moves to the limit distance along the first direction, X=X2. In this case, please refer to Figure 6 , Figure 6 for Figure 3 A structural schematic diagram of the optical path propagation after the second reflection module 200b of the test device 10 moves to a limit distance along the first direction is provided, and its total optical path travel is at a maximum value, that is, L=A+n*B+C+n*D+E+2(F+G)*(n-1)+2*X2.

[0063] From the above, it can be seen that by adjusting the position of the second reflection module 200b, that is, the movement displacement along the first direction (direction a shown in the figure), the total optical path stroke can be adjusted so that the total optical path stroke L can match the focal length of different camera modules of the device to be tested 20 (for example, the above-mentioned ultra-wide-angle, wide-angle, telephoto, etc. lenses), thereby calibrating and testing different camera modules to improve the accuracy of the calibration test.

[0064] In order to enable the second reflection module 200b to slide along the first direction, the testing device 10 provided in the embodiment of the present application may further include a sliding assembly 400, see Figure 7 , Figure 7 The structure diagram of the sliding assembly 400 provided in the embodiment of the present application. The sliding assembly 400 may include a sliding portion 410 and a fixed portion 420, the fixed portion 420 is fixed relative to the calibration module 100, the sliding portion 410 is slidably connected to the fixed portion 420, and the sliding portion 410 can be slidably connected relative to the fixed portion 420 along a first direction, Figure 3 The second reflection module 200 b shown is disposed on the sliding portion 410 , so that the second reflection module 200 b can move along the first direction.

[0065] For example, the sliding part 410 may be a slider, and the fixing part 420 may be a slide rail, which is arranged along the first direction. The slider is slidably connected to the slide rail, so that the second reflection module 200b can be moved along the first direction by fixing the slider to the second reflection module 200b.

[0066] In addition, the sliding part 410 and the fixed part 420 may also be composed of other parts to form the sliding assembly 400. For example, the fixed part 420 may be a screw and the sliding part 410 may be a nut. By driving the screw to rotate, the nut can slide along the length direction of the screw (i.e., the first direction). Alternatively, the fixed part 420 may be a gear and the sliding part 410 may be a rack. By driving the gear to rotate, the rack can move along its length direction. Therefore, the present application does not specifically limit the specific structure of the sliding assembly 400.

[0067] It should be noted that when multiple of the multiple reflection modules 200 are capable of sliding relative to the calibration module 100, multiple sliding components 400 are correspondingly provided. In addition, the multiple groups of sliding components 400 may have the same structure or different structures. Therefore, the embodiment of the present application does not specifically limit this.

[0068] Furthermore, in order to improve the integration of the above-mentioned test device 10, the test device 10 may further include a substrate (not shown in the figure), that is, the above-mentioned calibration module 100, the fixing assembly 300, the first reflection module 200a and the fixing portion 420 of the sliding assembly 400 are all fixed on the substrate, so as to achieve relative fixation of the calibration module 100, the fixing assembly 300, the first reflection module 200a and the fixing portion 420. Since the substrate is only used to fix and support the above-mentioned calibration module 100, the fixing assembly 300, the first reflection module 200a and the fixing portion 420, that is, the specific structure of the substrate and the fixed connection method can be determined according to actual needs, therefore, the present application does not specifically limit the specific structure of the substrate and the connection method with other components.

[0069] In some embodiments, see Figure 8 and Fig. 9 , Figure 8 A structural diagram of a reflection module 200 provided in an embodiment of the present application, Fig. 9 for Figure 8 A structural diagram of a reflection prism 220 of a reflection module 200 is provided. The reflection module 200 may include a reflection prism 220 and a support frame 230. The reflection prism 220 has the first reflection surface 210a and the second reflection surface 210b. The reflection prism 220 is fixed to the support frame 230. The support frame 230 is used to connect with a structural member. For example, the first reflection module 200a is fixed relative to the calibration module 100, and therefore, the support frame 230 of the first reflection module 200a is fixed to the substrate.

[0070] The second reflection module 200b can move along the first direction. Fig.10 , Fig.10 The structural diagram of the second reflection module 200b provided in the embodiment of the present application, the support frame 230 of the second reflection module 200b is fixed to the above Figure 7 The sliding portion 410 shown in the figure is used to enable the second reflection module 200b to slide along the fixing portion 420, that is, the first direction ( Fig.10 a direction shown in ).

[0071] In other embodiments, in order to further improve the accuracy of the test results of the above-mentioned testing device 10. Fig.11 , Fig.11A structural diagram of another reflection module 200 provided in an embodiment of the present application. The reflection prism 220 of the reflection module 200 may include a first reflection prism 220a and a second reflection prism 220b, the first reflection prism 220a having the first reflection surface 210a, and the second reflection prism 220b having the second reflection surface 210b; the support frame 230 of the reflection module 200 may include a first support frame 230a and a second support frame 230b, the first reflection prism 220a is disposed on the first support frame 230a, and the second reflection prism 220b is disposed on the second support frame 230b.

[0072] In addition, the reflection module 200 further includes a fixing frame 240, a first adjustment module 250, a second adjustment module 260 and a third adjustment module 270. The first support frame 230a and the second support frame 230b are both disposed on the fixing frame 240, and the fixing frame 240 is fixedly connected to the fixing portion 420 of the base or the sliding assembly 400, that is, the fixing frame 240 of the immovable reflection module 200 (for example, the first reflection module 200a) is fixedly connected to the base.

[0073] Also, see Fig.12 , Fig.12 A structural diagram of another reflection module 200 provided in an embodiment of the present application, namely, a movable reflection module 200 (for example, the second reflection module 200b described above, the second reflection module 200b having a third reflection surface 210c and a fourth reflection surface 210d), wherein a fixing frame 240 of the reflection module 200 is connected to Figure 7 The sliding portion 410 of the sliding assembly 400 is shown to be fixedly connected.

[0074] The first adjustment module 250 is connected to the first support frame 230a, and the first adjustment module 250 is used to adjust the position of the first support frame 230a along the second direction. The second adjustment module 260 is connected to the second support frame 230b, and the second adjustment module 260 is used to adjust the position of the second support frame 230b along the third direction. The third adjustment module 270 is connected to the fixing frame 240, and the third adjustment module 270 is used to adjust the position of the fixing frame 240 along the fourth direction. Any two of the second direction, the third direction and the fourth direction are perpendicular to each other.

[0075] In this way, the displacement in three directions is adjusted respectively by the first adjustment module 250, the second adjustment module 260 and the third adjustment module 270, so that the position of the reflection module 200 in space can be adjusted, so that the device to be tested 20 on the fixed component 300 can take a complete calibration picture of the calibration module 100, which is beneficial to further improve the accuracy of the test results of the testing device 10.

[0076] It can be understood that the second direction, the third direction and the fourth direction in the figure are only examples, and the directions can be flexibly changed according to actual needs. Therefore, the present application does not make any special limitations on this.

[0077] In a possible example, one of the second direction, the third direction, and the fourth direction is parallel to the first direction. In this case, one of the three adjustment directions of the reflective module 200 is parallel to the moving direction (i.e., the first direction) of the reflective module 200, i.e., the other two directions are perpendicular to the first direction. In the process of adjusting the reflective module 200, it is helpful to reduce the influence of the position adjustment of the reflective module 200 on the focusing accuracy during the test, and it can reduce the difficulty of fine-tuning the position of the reflective module 200.

[0078] In addition, the first adjusting device, the second adjusting device and the third adjusting device can all adopt a sliding mechanism capable of linear motion. For example, a sliding mechanism composed of the slider and the slide rail, the screw rod and the nut, or the gear and the rack. Moreover, the first adjusting device, the second adjusting device and the third adjusting device can adopt the same structure or different structures. Therefore, the present application does not specifically limit the specific structure of the first adjusting device, the second adjusting device and the third adjusting device.

[0079] On this basis, see Fig.13 , Fig.13 The structural diagram of the calibration module 100 provided in the embodiment of the present application, the calibration module 100 may include a calibration plate 110 and a driving member 120, and the driving member 120 is used to drive the calibration plate 110 to rotate. Under this structure, the angle of the calibration plate 110 can be adjusted to adapt to different scenes and testing requirements at different angles, so as to further improve the test accuracy of the device to be tested 20. Exemplarily, the driving member 120 can be a driving motor, a driving motor, etc.

[0080] In addition, the calibration module 100 may further include a backlight plate 130, which is fixed to a side of the calibration plate 110 away from the reflection module 200, that is, the calibration plate 110 is located between the first reflection surface 210a of the reflection module 200 and the backlight plate 130. The backlight plate 130 can adjust the brightness of the calibration plate 110 to improve the imaging quality of the camera module of the device 20 to be tested.

[0081] Also, see Fig.14 , Fig.14A structural diagram of a fixing assembly 300 provided in an embodiment of the present application. The fixing assembly 300 may include a fixing seat 310 and a clamping member 320, wherein the fixing seat 310 is used to be fixedly connected to the base, and the clamping member 320 is used to fix the device to be tested 20. During the test process of the camera module, the positions of the fixing seat 310 and the clamping member 320 are fixed. In some embodiments, the fixing assembly 300 may also not include the fixing seat 310, that is, the clamping member 320 may be directly fixed to the base. Therefore, the embodiment of the present application does not specifically limit this.

[0082] Based on the above-mentioned test device 10, the embodiment of the present application provides a test method for fusion calibration of multiple camera modules of an electronic device. Fig.15 , Fig.15 Schematic diagram of the test principle of the test device 10 provided in the embodiment of the present application, marking the center position (such as Fig.15 The camera module of the device to be tested 20 has multiple optical focal lengths, such as ultra-wide angle, wide angle and telephoto lens, and the multiple optical focal lengths of the camera module are continuously zoomed by digital zoom. The test method may include:

[0083] Step 1: The testing device 10 is initialized, and the second reflection module is located at an initial position, that is, X=0 as mentioned above.

[0084] Step 2: The camera module of the device to be tested 20 is adjusted to an initial focal length, and an image of the calibration plate 110 at the current focal length is acquired.

[0085] Step 3: Control the device to be tested 20 to continuously zoom, move the second reflection module 200b at the same time, and draw a zoom ratio-viewing range curve and a zoom ratio-center position offset curve. Fig.16 and Fig.17 , Fig.16 for Fig.15 The zoom ratio-viewing range curve obtained by testing the provided testing device 10 is as follows: Fig.17 for Fig.15 The zoom ratio-center position offset curve obtained by the test device 10 provided. Fig.16 and Fig.17 The line segment a1 in the figure represents an ultra-wide-angle lens, a2 represents a wide-angle lens, and a3 represents a telephoto lens.

[0086] Step 4: The position where the curve gradient suddenly changes is the digital zoom-optical zoom switching ratio, that is, the connection between the curves in the figure (between a1 and a2, and between a2 and a3). Calculate the deviation of the zoom ratio-viewing range curve and the zoom ratio-centerline position offset curve and compensate for it, thereby completing the imaging fusion calibration of the camera module.

[0087] By the attached Fig.16 and Fig.17 It can be seen that the test device 10 of the present application can reduce or even eliminate the jump in the framing range caused by switching between digital zoom and optical zoom during the test process. That is, in the above curve graph, two adjacent straight lines can be connected without a breakpoint between them.

[0088] In this way, when the camera module of the device to be tested 20 realizes continuous zooming between different optical focal lengths, the image will not visually jump, thereby improving the calibration accuracy of the test device 10, which is beneficial to improving product quality and user experience.

[0089] In the description of this specification, specific features, structures, materials or characteristics may be combined in an appropriate manner in any one or more embodiments or examples.

[0090] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A testing device, characterized in that: include: Calibration module; The reflection module has a plurality of reflection surfaces. The calibration module is arranged on the light incident side of the first reflection surface along the propagation path of the light. The light is reflected in sequence by the plurality of reflection surfaces. The reflection module can slide along the first direction relative to the calibration module. A fixing component, fixed relative to the calibration module, the fixing component is used to fix the device to be tested, and along the propagation path of the light, the fixing component is arranged on the light emitting side of the last reflecting surface; Wherein, along the propagation path of the light, the propagation direction of the incident light of the first reflecting surface and the propagation direction of the outgoing light of the last reflecting surface are opposite.

2. The testing device according to claim 1, characterized in that: The plurality of reflective surfaces include a first reflective surface and a second reflective surface, the calibration module is arranged on the light incident side of the first reflective surface; the second reflective surface is arranged on the light emitting side of the first reflective surface, and the fixing component is arranged on the light emitting side of the second reflective surface; The propagation directions of the incident light on the first reflective surface and the outgoing light on the second reflective surface are opposite.

3. The testing device according to claim 2, characterized in that: There are multiple reflection modules, and the multiple reflection modules reflect light in turn; along the propagation path of the light, the second reflection surface of each reflection module is arranged on the light incident side of the first reflection surface of the subsequent reflection module, and the calibration module is arranged on the light incident side of the first reflection surface of the first reflection module, and the fixing component is arranged on the light emitting side of the second reflection surface of the last reflection module; at least one of the multiple reflection modules can move along the first direction relative to the calibration module.

4. The testing device according to claim 3, characterized in that: The plurality of reflection modules include: A first reflection module, fixed relative to the calibration module, wherein the calibration module is arranged on the light incident side of the first reflection surface of the first reflection module; The second reflection module can move along the first direction relative to the calibration module; the first reflection surface of the second reflection module is arranged on the light-emitting side of the second reflection surface of the first reflection module, and the fixing component is arranged on the light-emitting side of the second reflection surface of the second reflection module.

5. The testing device according to claim 4, characterized in that: The testing device also includes a sliding assembly, which includes a sliding part and a fixed part. The fixed part is fixed relative to the calibration module, the sliding part is slidably connected to the fixed part, and the sliding part can slide relative to the fixed part along the first direction, and the second reflection module is arranged on the sliding part.

6. The testing device according to any one of claims 1 to 5, characterized in that: The reflection module includes a reflection prism and a support frame. The reflection prism is arranged on the support frame. The reflection prism has the first reflection surface and the second reflection surface.

7. The testing device according to claim 6, characterized in that: The reflecting prism includes a first reflecting prism and a second reflecting prism, the supporting frame includes a first supporting frame and a second supporting frame, the first reflecting prism is arranged on the first supporting frame, the second reflecting prism is arranged on the second supporting frame, the first reflecting prism has the first reflecting surface, and the second reflecting prism has the second reflecting surface.

8. The testing device according to claim 7, characterized in that: The reflection module further includes a first adjustment module, the first adjustment module is connected to the first support frame, and the first adjustment module is used to adjust the position of the first support frame along the second direction.

9. The testing device according to claim 8, characterized in that: The reflection module further includes a second adjustment module, the second adjustment module is connected to the second support frame, and the second adjustment module is used to adjust the position of the second support frame along a third direction, and the third direction is perpendicular to the second direction.

10. The testing device according to claim 9, characterized in that: The reflection module also includes a fixing frame and a third adjustment module, the first support frame and the second support frame are both arranged on the fixing frame, the third adjustment module is connected to the fixing frame, and the third adjustment module is used to adjust the position of the fixing frame along a fourth direction, and the fourth direction is perpendicular to the second direction and the third direction.

11. The testing device according to claim 10, characterized in that: One of the second direction, the third direction, and the fourth direction is parallel to the first direction.

12. The testing device according to any one of claims 1 to 11, characterized in that: The calibration module includes a calibration plate and a driving member, and the driving member is used to drive the calibration plate to rotate.

13. The testing device according to claim 12, characterized in that: The calibration module further comprises a backlight panel, and the backlight panel is fixed to a side of the calibration plate away from the reflection module.

14. The testing device according to any one of claims 1 to 13, characterized in that: The fixing assembly includes a fixing seat and a clamping member. The fixing seat is fixed relative to the calibration module. The clamping member is fixed on the fixing seat. The clamping member is used to clamp the device to be detected.

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