Method and device for high-precision dynamic coupling of variable-cone surface bent crystal and x-ray streak camera

By irradiating the variable-cone curved crystal with visible light and X-rays respectively in a non-vacuum environment, and combining it with an image acquisition device and a three-dimensional adjustment mechanism, the problem of high-precision coupling between the variable-cone curved crystal and the X-ray streak camera was solved. This ensures that the X-ray focusing line and the cathode slit are precisely aligned, avoiding signal loss and distortion, and meeting the requirements of high time-resolution X-ray diagnosis.

CN120009316BActive Publication Date: 2025-12-09LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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Patent Information

Application Number
CN202510503865.8
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-04-22
Publication Date
2025-12-09
Estimated Expiration
2045-04-22

AI Technical Summary

Technical Problem

In the existing technology, high-precision dynamic coupling between the variable conical curved crystal and the X-ray streak camera is difficult to achieve in a vacuum environment, which causes the X-ray focusing line to easily deviate from the effective area of ​​the cathode slit, resulting in loss of time scanning signal or intensity nonlinear distortion.

Method used

In a non-vacuum environment, the variable-cone curved crystal is irradiated with visible light and X-rays respectively. The position information of the focal line is obtained through an image acquisition device, the relative deviation is calculated, and the position of the variable-cone curved crystal is adjusted through a three-dimensional adjustment mechanism so that the X-ray focal line coincides with the cathode slit of the X-ray streak camera.

Benefits of technology

It achieves high-precision dynamic coupling between a variable-cone curved crystal and an X-ray streak camera in a non-vacuum environment, avoiding signal loss and distortion, and meeting the needs of high-time-resolution X-ray diagnostics.

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Abstract

The present application relates to the technical field of laser imaging, and in particular to a high-precision dynamic coupling method and device for a variable-tapered curved crystal and an X-ray streak camera, the method comprising: under the same optical path, respectively irradiating a variable-tapered curved crystal with a visible light source and X-rays, so that the variable-tapered curved crystal forms a visible light source focal line and an X-ray focal line on an imaging plate; acquiring position information of the visible light source focal line and the X-ray focal line by means of an image acquisition device, and extracting a focal line relative deviation; coupling the variable-tapered curved crystal and the X-ray streak camera by means of a three-dimensional adjustment mechanism, and continuously irradiating the variable-tapered curved crystal with the visible light source; and adjusting the position of the variable-tapered curved crystal by means of the three-dimensional adjustment mechanism according to the image acquisition device and the focal line relative deviation, so that the X-ray focal line coincides with a cathode slit of the X-ray streak camera. The purpose is to achieve high-precision coupling of the variable-tapered curved crystal and the X-ray streak camera.
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Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of laser imaging, in particular to a high-precision dynamic coupling method and device of a variable-taper bent crystal and an X-ray streak camera. BACKGROUND

[0002] Variable-taper bent crystal diagnostic technology is a cutting-edge optical design based on X-ray diffraction theory. In recent years, it has been proposed and applied to the field of high-resolution X-ray spectral signal diagnosis. The core principle is to replace the traditional plane crystal Bragg diffraction light path with a curved surface structure with continuously changing curvature radius and inclination angle, compress the divergent X-ray spectrum in the spatial dimension, and form a line focusing mode perpendicular to the crystal surface. Compared with the plane crystal, this structure significantly improves the light flux efficiency of the crystal by optimizing the photon collection solid angle, and is more easily coupled with subsequent diagnostic equipment such as X-ray streak cameras and spectrometers due to its focusing characteristics. However, there are still technical bottlenecks in the high-precision dynamic coupling of variable-taper bent crystals and X-ray streak cameras.

[0003] In order to realize high-precision time-distributed X-ray spectral signal diagnosis, it is necessary to ensure that the X-ray focusing line of the variable-taper bent crystal and the cathode slit of the X-ray streak camera are highly precisely overlapped in three-dimensional space. However, the X-ray streak camera must work in a vacuum environment to receive X-ray signals, and in-situ debugging under vacuum conditions is extremely difficult. The existing technology usually uses visible light to simulate the X-ray light path in a non-vacuum environment for pre-alignment. However, since there is a deviation between the focusing line of visible light and the X-ray focusing line, and this deviation cannot be predicted, after the coupling of the variable-taper bent crystal and the X-ray streak camera, the X-ray focusing line is easy to deviate from the effective area of the cathode slit, causing loss of time scanning signals or nonlinear distortion of intensity. SUMMARY

[0004] In order to realize high-precision coupling of the variable-taper bent crystal and the X-ray streak camera, the present application provides a high-precision dynamic coupling method and device of a variable-taper bent crystal and an X-ray streak camera, and the technical solutions adopted are as follows:

[0005] The technical solution of the first aspect of the present application provides a high-precision dynamic coupling method of a variable-taper bent crystal and an X-ray streak camera, which comprises:

[0006] Under the same light path, the variable-taper bent crystal is irradiated by a visible light source and an X-ray, respectively, so that the variable-taper bent crystal forms a visible light source focusing line and an X-ray focusing line on an imaging plate, respectively;

[0007] The position information of the visible light source focusing line and the X-ray focusing line is obtained by an image acquisition device, and the relative deviation of the focusing lines is extracted;

[0008] The variable-cone-face bent crystal is coupled with the X-ray streak camera through a three-dimensional adjustment mechanism, and the variable-cone-face bent crystal is continuously irradiated by a visible light source;

[0009] According to the relative deviation of the image acquisition device and the focal line, the position of the variable-cone-face bent crystal is adjusted by the three-dimensional adjustment mechanism, so that the X-ray focal line coincides with the cathode slit of the X-ray streak camera.

[0010] Further, the position information of the visible light source focal line and the X-ray focal line is acquired by the image acquisition device, and the relative deviation of the focal line is extracted, including:

[0011] The relative position between the visible light source focal line and the scale line of the imaging plate is acquired by the image acquisition device;

[0012] The relative position between the X-ray focal line and the scale line of the imaging plate is acquired by the image acquisition device;

[0013] Based on the relative positions between the visible light source focal line and the X-ray focal line and the scale line of the imaging plate, the relative deviation of the focal line is calculated.

[0014] Further, according to the relative deviation of the image acquisition device and the focal line, the position of the variable-cone-face bent crystal is adjusted by the three-dimensional adjustment mechanism, so that the X-ray focal line coincides with the cathode slit of the X-ray streak camera, including:

[0015] The spatial position of the X-ray focal line and the cathode slit of the X-ray streak camera is observed in real time according to the image acquisition device;

[0016] The three-dimensional adjustment mechanism adjusts the spatial pose of the variable-cone-face bent crystal based on the relative deviation of the focal line, so that the X-ray focal line coincides with the cathode slit of the X-ray streak camera.

[0017] Further, the visible light source is a white light source.

[0018] Further, the surface of the imaging plate is provided with a scale line matched with the pixel coordinates of the image acquisition device.

[0019] Further, the image acquisition device is a CCD or CMOS camera configured with a fixed focal length.

[0020] Further, the three-dimensional adjustment mechanism is used to adjust the pitch angle, horizontal translation and vertical translation degrees of freedom of the variable-cone-face bent crystal, and the adjustment step precision of the three-dimensional adjustment mechanism is 1 micrometer.

[0021] Further, the method further includes: the relative deviation of the focal line is extracted by the image acquisition device using sub-pixel level alignment, and the image acquisition device feeds back the coincidence degree of the X-ray focal line and the cathode slit in real time.

[0022] Further, the dynamic adjustment of the three-dimensional adjustment mechanism is closed-loop control, and an adjustment instruction is generated by a real-time feedback signal of the image acquisition device.

[0023] The technical scheme of the second aspect of the present application provides a high-precision dynamic coupling device of a variable-taper curved crystal and an X-ray streak camera, which adopts the high-precision dynamic coupling method of the variable-taper curved crystal and the X-ray streak camera according to the technical scheme of the first aspect of the present application, and the device comprises:

[0024] A visible light source module is configured to provide visible light with a spot size of no more than 200 microns.

[0025] An X-ray source module is configured to generate an X-ray signal.

[0026] A variable-taper curved crystal is configured to dynamically match a radius of curvature with an X-ray diffraction angle, and diffract incident light into a focused line.

[0027] An imaging plate is provided with scale lines on a surface, and is configured to record the focused line of the visible light source and the focused line of the X-ray.

[0028] An image acquisition device is configured to acquire position information of the focused line and calculate a relative deviation.

[0029] A three-dimensional adjustment mechanism is configured to dynamically adjust a spatial pose of the variable-taper curved crystal.

[0030] An X-ray streak camera is configured to receive the focused line signal of the X-ray coinciding with the cathode slit, and perform time-resolved spectral diagnosis.

[0031] The present application has the following beneficial effects:

[0032] The high-precision dynamic coupling method of the variable-taper curved crystal and the X-ray streak camera provided by the present application realizes quantitative comparison of the focused line of the visible light source and the focused line of the X-ray through the imaging plate and the image acquisition device, solves the technical problem of high-precision dynamic coupling of the variable-taper curved crystal and the X-ray streak camera in a non-vacuum environment, and avoids deviation of the cathode slit effective area caused by deviation of the focused line of the visible light source and the focused line of the X-ray in actual application. On the other hand, according to the image acquisition device and the relative deviation of the focused line, the three-dimensional adjustment mechanism adjusts the position of the variable-taper curved crystal, so that the focused line of the X-ray coincides with the cathode slit of the X-ray streak camera, significantly improves the coupling precision of the variable-taper curved crystal and the streak camera, ensures efficient capture of the X-ray signal by the cathode slit, avoids spectral signal loss and distortion, and meets the needs of high-time-resolution X-ray diagnostic experiments. BRIEF DESCRIPTION OF DRAWINGS

[0033] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art and the advantages thereof, simple introduction will be made to the drawings needed in the embodiments or prior art description. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without any creative effort based on these drawings.

[0034] Figure 1 A method flow chart of a variable taper curved crystal and X-ray streak camera high-precision dynamic coupling method provided by an embodiment of the present application;

[0035] Figure 2 An experimental schematic diagram of a visible light source focusing line provided by an embodiment of the present application;

[0036] Figure 3 An experimental schematic diagram of an X-ray focusing line provided by an embodiment of the present application;

[0037] Figure 4 A structural schematic diagram of a variable taper curved crystal and X-ray streak camera high-precision dynamic coupling device provided by an embodiment of the present application;

[0038] Figure legend: 1-variable taper curved crystal, 2-imaging plate, 3-CCD camera, 4-visible light source, 5-X-ray tube. DETAILED DESCRIPTION

[0039] In order to further illustrate the technical means and effects adopted by the present application to achieve the predetermined purposes, the following describes in detail the specific implementation, structure, features and effects of a variable taper curved crystal and X-ray streak camera high-precision dynamic coupling method and device according to the present application, with reference to the drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. In addition, the specific features, structures or characteristics in one or more embodiments can be combined in any suitable form.

[0040] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the present application belongs.

[0041] The following specifically describes the specific scheme of a variable taper curved crystal and X-ray streak camera high-precision dynamic coupling method and device provided by the present application, with reference to the drawings.

[0042] Please refer to Figure 1 which shows a method flow chart of a variable taper curved crystal and X-ray streak camera high-precision dynamic coupling method provided by an embodiment of the present application, the method comprising:

[0043] Step S100: Under the same optical path, the variable-tapered bend crystal is irradiated by a visible light source and an X-ray respectively, so that the variable-tapered bend crystal forms a visible light source focusing line and an X-ray focusing line on an imaging plate respectively; preferably, the visible light source is a white light source, the surface of the imaging plate is provided with a scale line matched with the pixel coordinates of an image acquisition device, and the imaging plate can be supported by a fluorescent material, and the surface is etched with a cross scale line with a precision of 10 μm, so that the scale line of the imaging plate can be mapped with the pixel coordinates of the image acquisition device through a calibration algorithm; the image acquisition device is a CCD camera or a CMOS camera with a fixed focal length, so as to ensure that the imaging focal plane is fixed when the visible light and the X-ray are switched.

[0044] Specifically, referring to FIG. 1, Figure 2 the variable-tapered bend crystal 1 is irradiated by a white light as a visible light source 4, and then focused on the imaging plate 2 with a scale line as a visible light source focusing line; during the experiment, the position of the imaging plate 2 is the space position of the X-ray streak camera cathode, and then the spatial position of the visible light source focusing line is recorded by the CCD camera 3; referring to FIG. 2, Figure 3 under the same experimental conditions, the variable-tapered bend crystal 1 is irradiated by an X-ray emitted by the X-ray tube 5, that is, the position of the X-ray tube 5 coincides with the position of the visible light source 4, and then focused on the imaging plate 2 with a scale line as an X-ray focusing line, and then the spatial position of the X-ray focusing line is recorded by the CCD camera 3; finally, a composite image capable of simultaneously displaying the X-ray focusing line, the visible light source focusing line and the imaging plate scale can be obtained by using a signal reading device;

[0045] In this embodiment, the visible light source, the imaging plate with a scale line and the image acquisition device are used to record the positions of the visible light source focusing line and the X-ray focusing line on the imaging plate under the same optical path, and finally integrated into an image containing multiple information. This provides intuitive and accurate data sources for subsequent quantitative comparison of the position relationship between the visible light source focusing line and the X-ray focusing line. The synchronous calibration of the two focusing lines is realized in a non-vacuum environment, and then the spatial deviation of the two focusing lines can be quantified, which not only avoids the limitation of the X-ray in-situ debugging in a vacuum environment, but also provides a high-precision initial positioning reference for subsequent dynamic coupling, and lays a foundation for realizing high-precision dynamic coupling of the variable-tapered bend crystal and the X-ray streak camera in a non-vacuum environment.

[0046] Step S200: Obtain the position information of the visible light source focusing line and the X-ray focusing line by the image acquisition device, and extract the relative deviation of the focusing lines; specifically, the image data of the visible light source focusing line, the X-ray focusing line and the imaging plate scale line obtained in step S100 are imported into an image processing software, and then the relative position information of the visible light source focusing line and the X-ray focusing line can be obtained by using an edge detection algorithm, for example.

[0047] The step S200 specifically comprises:

[0048] The step S210: obtaining the relative position between the visible light source focal line and the imaging plate scale line by the image acquisition device;

[0049] The step S220: obtaining the relative position between the X-ray focal line and the imaging plate scale line by the image acquisition device;

[0050] The step S230: calculating the focal line relative deviation based on the relative positions between the visible light source focal line and the X-ray focal line and the imaging plate scale line; specifically, since the scale line on the imaging plate is fixed, it can be used as a reference to correct the relative deviation of the visible light source focal line and the X-ray focal line, and the pixel mark is indicated by the image acquisition device at the fixed position;

[0051] Preferably, the method further comprises: extracting the focal line relative deviation by the image acquisition device using sub-pixel level alignment, and the image acquisition device feeds back the coincidence degree of the X-ray focal line and the cathode slit in real time; specifically, the present embodiment can use the phase correlation method (Phase Correlation Method) to perform sub-pixel level alignment on the visible light and the X-ray focal line, and the specific process is as follows: first, perform fast Fourier transform on two images, calculate the cross power spectrum, and the cross power spectrum contains the phase information between the two images; then obtain the phase correlation matrix by inverse FFT, and extract the peak position; then use cubic spline interpolation to improve the peak positioning accuracy to a preset pixel level; finally, based on the scale line reference, the spatial relative deviation of the visible light and the X-ray focal line is calculated, and the deviation vector is outputted;

[0052] The embodiment accurately obtains the relative positions between the visible light source focusing line and the X-ray focusing line and the scale line based on the imaging plate scale line by an image acquisition device and an image processing algorithm, and further calculates the relative deviation of the focusing line. The relative deviation is intuitively presented by pixel marking, which facilitates the operator to quickly understand the position difference between the two. At the same time, the embodiment uses the phase correlation method for sub-pixel alignment, which can improve the accuracy of the relative deviation calculation and obtain a more accurate spatial relative deviation vector; finally, the image acquisition device provides real-time and accurate data support for the high-precision dynamic coupling of the variable taper crystal and the X-ray streak camera by feeding back the coincidence degree of the X-ray focusing line and the cathode slit. The embodiment effectively solves the problem of accurately determining the relative positions of the visible light and the X-ray focusing line and the coincidence of the X-ray focusing line and the cathode slit in a non-vacuum environment, provides key data support for realizing high-precision dynamic coupling of the variable taper crystal and the X-ray streak camera, and helps to reduce signal loss and distortion caused by position deviation, which meets the strict requirements of high-time-resolution X-ray diagnostic experiments on high-precision coupling of equipment. It should be noted that the computer algorithm provided by the embodiment calculates the relative deviation, and the relative deviation can be calculated by mathematical method according to the position information of the visible light source focusing line and the X-ray focusing line according to actual needs.

[0053] Step S300: coupling the variable taper crystal and the X-ray streak camera through a three-dimensional adjustment mechanism, and continuously irradiating the variable taper crystal with a visible light source; specifically, please refer to Figure 4 It should be noted that when the variable taper crystal and the X-ray streak camera are coupled through the three-dimensional adjustment mechanism, the optical path configuration is consistent with that in step S100; then the relative position and attitude of the visible light source focusing line and the X-ray streak camera can be observed in real time by the image acquisition device; wherein the three-dimensional adjustment mechanism is a key component connecting the variable taper crystal and the X-ray streak camera, and an adjustment mechanism with the functions of accurate translation in three mutually perpendicular directions and rotation adjustment is selected, for example, a six-axis precision adjustment table, which has the following degrees of freedom: translation degrees of freedom: horizontal, vertical; rotation degrees of freedom: pitch angle, yaw angle, roll angle;

[0054] The embodiment realizes dynamic precise coupling of the variable taper crystal and the X-ray streak camera in a non-vacuum environment through the synergistic effect of the high-precision three-dimensional adjustment mechanism and the real-time closed-loop feedback system. The visible light real-time monitoring replaces the X-ray in-situ debugging, breaks through the limitation of vacuum environment, and finally ensures that the spatial coincidence precision of the X-ray focusing line and the cathode slit is stable within hundreds of microns, which provides a reliable technical foundation for high-time-resolution X-ray spectral diagnosis.

[0055] Step S400: According to the relative deviation between the image acquisition device and the focusing line, the position of the variable-tapered bender is adjusted by a three-dimensional adjustment mechanism to make the X-ray focusing line coincide with the cathode slit of the X-ray streak camera; preferably, the three-dimensional adjustment mechanism is used to adjust the pitch angle, horizontal translation and vertical translation degrees of freedom of the variable-tapered bender, and the adjustment step precision of the three-dimensional adjustment mechanism is 1 micrometer.

[0056] Step S400 specifically includes:

[0057] Step S410: The spatial position of the X-ray focusing line and the cathode slit of the X-ray streak camera is observed in real time according to the image acquisition device;

[0058] Step S420: The three-dimensional adjustment mechanism adjusts the spatial pose of the variable-tapered bender based on the focusing line relative deviation to make the X-ray focusing line coincide with the cathode slit of the X-ray streak camera; specifically, a manually adjustable three-dimensional adjustment mechanism can be used to adjust the spatial pose of the variable-tapered bender;

[0059] As a preferred technical solution, the dynamic adjustment of the three-dimensional adjustment mechanism is closed-loop control, and the adjustment instruction is generated by the real-time feedback signal of the image acquisition device; specifically, after the three-dimensional adjustment mechanism adjusts the variable-tapered bender once, the image acquisition device collects a new image, re-determines the spatial position relationship between the X-ray focusing line and the cathode slit, and feeds back the new position deviation information to the three-dimensional adjustment mechanism. The three-dimensional adjustment mechanism calculates and generates a new adjustment instruction again according to the real-time feedback deviation information, and further adjusts the variable-tapered bender. Until the X-ray focusing line coincides with the cathode slit; using this closed-loop control method can continuously correct the error in the adjustment process, ensure the accuracy and stability of the adjustment, and avoid the situation of over-adjustment or insufficient adjustment due to inaccurate one-time adjustment.

[0060] The embodiment realizes real-time monitoring of the spatial position of the X-ray focusing line and the cathode slit of the X-ray streak camera by the image acquisition device, combines the focusing line relative deviation obtained in step S200, and accurately adjusts the spatial pose of the variable-tapered bender by the three-dimensional adjustment mechanism, thereby solving the problem of high-precision coupling between the variable-tapered bender and the X-ray streak camera in a non-vacuum environment, i.e., accurately coinciding the X-ray focusing line with the cathode slit in a non-vacuum condition.

[0061] In summary, the application provides a high-precision dynamic coupling method of the variable-cone curved crystal and the X-ray streak camera, which realizes quantitative comparison of the visible light source focusing line and the X-ray focusing line through the imaging plate and the image acquisition device, solves the technical problem of high-precision dynamic coupling of the variable-cone curved crystal and the X-ray streak camera in a non-vacuum environment, and avoids the situation of deviating from the effective area of the cathode slit caused by the deviation of the visible light source focusing line and the X-ray focusing line in actual application. On the other hand, according to the relative deviation of the image acquisition device and the focusing line, the position of the variable-cone curved crystal is adjusted through the three-dimensional adjustment mechanism, so that the X-ray focusing line is overlapped with the cathode slit of the X-ray streak camera, the coupling precision of the variable-cone curved crystal and the X-ray streak camera is significantly improved, the efficient capture of the X-ray signal by the cathode slit is ensured, the problems of spectrum signal loss and distortion are avoided, and the demand of high-time-resolution X-ray diagnostic experiment is met.

[0062] Please refer to Figure 4 which shows a structure schematic diagram of a high-precision dynamic coupling device of a variable-cone curved crystal and an X-ray streak camera provided by an embodiment of the application, and the device comprises:

[0063] a visible light source module for providing visible light with a spot size of no more than 200 microns;

[0064] an X-ray source module for generating an X-ray signal;

[0065] a variable-cone curved crystal with a curvature radius dynamically matched with an X-ray diffraction angle, for diffracting incident light into a focusing line;

[0066] an imaging plate with scale lines on the surface, for recording the visible light source focusing line and the X-ray focusing line;

[0067] an image acquisition device for acquiring the position information of the focusing line and calculating the relative deviation;

[0068] a three-dimensional adjustment mechanism for dynamically adjusting the spatial pose of the variable-cone curved crystal;

[0069] an X-ray streak camera for receiving the X-ray focusing line signal overlapped with the cathode slit and performing time-resolved spectral diagnosis.

[0070] It should be noted that the above-mentioned sequence of the embodiments of the application is only for description, and does not represent the advantages and disadvantages of the embodiments. The processes depicted in the drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multi-task processing and parallel processing are also possible or may be advantageous.

[0071] Each embodiment in the specification is described in a progressive manner, and the same and similar parts between each embodiment can be referred to each other, and each embodiment mainly describes the differences from other embodiments.

Claims

1. A method for high-precision dynamic coupling of a variable-cone surface bending crystal and an X-ray streak camera, characterized in that, The method comprises: Under the same optical path, a variable-cone-face bending crystal is irradiated by a visible light source and an X-ray respectively, so that the variable-cone-face bending crystal forms a visible light source focusing line and an X-ray focusing line on an imaging plate respectively; Position information of the visible light source focusing line and the X-ray focusing line is acquired by an image acquisition device, and a focusing line relative deviation is extracted; The variable-cone-face bending crystal is coupled with an X-ray streak camera through a three-dimensional adjustment mechanism, and the variable-cone-face bending crystal is continuously irradiated by the visible light source; According to the image acquisition device and the focusing line relative deviation, the position of the variable-cone-face bending crystal is adjusted by the three-dimensional adjustment mechanism, so that the X-ray focusing line coincides with a cathode slit of the X-ray streak camera.

2. The method of claim 1, wherein the method further comprises: rotating the variable-tapered crystal around the rotation axis to dynamically couple the variable-tapered crystal with the X-ray streak camera. The position information of the visible light source focusing line and the X-ray focusing line is acquired by the image acquisition device, and the focusing line relative deviation is extracted, comprising: The relative position between the visible light source focusing line and the scale line of the imaging plate is acquired by the image acquisition device; The relative position between the X-ray focusing line and the scale line of the imaging plate is acquired by the image acquisition device; Based on the relative positions between the visible light source focusing line and the X-ray focusing line and the scale line of the imaging plate, the focusing line relative deviation is calculated.

3. The method of claim 1, wherein the method further comprises: rotating the variable-tapered crystal around the X-ray beam axis to dynamically couple the variable-tapered crystal with the X-ray streak camera. According to the image acquisition device and the focusing line relative deviation, the position of the variable-cone-face bending crystal is adjusted by the three-dimensional adjustment mechanism, so that the X-ray focusing line coincides with the cathode slit of the X-ray streak camera, comprising: The spatial position of the X-ray focusing line and the cathode slit of the X-ray streak camera is observed in real time by the image acquisition device; The three-dimensional adjustment mechanism adjusts the spatial pose of the variable-cone-face bending crystal based on the focusing line relative deviation, so that the X-ray focusing line coincides with the cathode slit of the X-ray streak camera.

4. The method of claim 1, wherein the method further comprises: rotating the variable-tapered crystal around the X-ray beam axis to dynamically couple the variable-tapered crystal with the X-ray streak camera. The visible light source is a white light source.

5. The method of claim 1, wherein the method further comprises: adjusting the angle of the variable taper lens to a first angle; and adjusting the angle of the variable taper lens to a second angle. The surface of the imaging plate is provided with a scale line matched with the pixel coordinates of the image acquisition device.

6. The method of claim 1, wherein the method further comprises: rotating the variable-tapered crystal around the X-ray beam axis to dynamically couple the variable-tapered crystal with the X-ray streak camera. The image acquisition device is a CCD or CMOS camera configured with a fixed focal length.

7. The method of claim 1, wherein the method further comprises: a step of adjusting the coupling angle of the variable taper lens to the X-ray stripe camera. The three-dimensional adjustment mechanism is used to adjust the pitch angle, horizontal translation and vertical translation degrees of freedom of the variable-cone-face bending crystal, and the adjustment step precision of the three-dimensional adjustment mechanism is 1 micrometer.

8. The method of claim 1 to 7, wherein, The method further comprises: the focusing line relative deviation is extracted by the image acquisition device using sub-pixel level alignment, and the image acquisition device feeds back the coincidence degree of the X-ray focusing line and the cathode slit in real time.

9. The method of claim 8, wherein the method further comprises: rotating the variable-tapered crystal around the rotation axis to dynamically couple the variable-tapered crystal with the X-ray streak camera. The dynamic adjustment of the three-dimensional adjustment mechanism is closed-loop control, and the adjustment instruction is generated by the real-time feedback signal of the image acquisition device.

10. A high-precision dynamic coupling device of a variable-cone surface bending crystal and an X-ray streak camera, characterized in that, The device comprises: A visible light source module for providing visible light with a spot size not greater than 200 micrometers; An X-ray source module for generating an X-ray signal; A variable-cone-face bending crystal with a curvature radius dynamically matched with an X-ray diffraction angle, for diffracting incident light into a focusing line; An imaging plate with a scale line on the surface, for recording the visible light source focusing line and the X-ray focusing line; An image acquisition device for acquiring focusing line position information and calculating a relative deviation; A three-dimensional adjustment mechanism for dynamically adjusting the spatial pose of the variable-cone-face bending crystal; An X-ray streak camera for receiving the X-ray focusing line signal coinciding with the cathode slit and performing time-resolved spectral diagnosis.

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