Display panel and display device

Abstract

The invention provides a display panel and a display device, the display panel comprises a display area, a wiring area and a bending area connecting the display area and the wiring area, and the wiring area comprises a flexible circuit board; the bending area comprises M sensors, the M sensors are connected with N pins on the flexible circuit board, the M sensors are used for measuring capacitance values of different positions of the bending area, the capacitance values are used for indicating the bending form of the bending area, M is a positive integer, and N is smaller than or equal to M. The sensor arranged in the display panel can efficiently detect the bending form of the bending area, so that the related risk of the bending process of the display panel is effectively evaluated.

Description

Technical Field

[0001] The present application relates to the field of display technology, and, more specifically, to a display panel and a display device. Background Art

[0002] With the continuous development of display technology, users' requirements for display panel products are also increasing; users' expectations for display panel products are not limited to the expansion of screen size, but also include more exquisite appearance design. In flexible organic light emitting diode (OLED) display panels, the width of the bottom frame is an important factor affecting the appearance design of the display panel. In order to achieve a narrower bottom frame, the display panel usually adopts a bending structure, that is, a bending area is set above the wiring area of ​​the display panel. By reducing the bending radius, the panel space can be used more effectively, and components such as driver chips can be hidden behind the display panel, thereby achieving a narrower bottom frame design.

[0003] However, due to the manufacturing process, the bending shape of the bending zone is difficult to maintain in an arc state, which may cause cracks in the bending zone during the manufacturing process, thereby reducing the mechanical strength of the bending zone, and further causing the display panel to display abnormalities. Summary of the invention

[0004] The present application provides a display panel and a display device, wherein a sensor deployed in the display panel can efficiently detect the bending shape of a bending zone, thereby effectively evaluating the risks associated with the bending process of the display panel.

[0005] In a first aspect, a display panel is provided, comprising: a display area, a wiring area, and a bending area connecting the display area and the wiring area, wherein the wiring area comprises a flexible circuit board; the bending area comprises M sensors, wherein the M sensors are connected to N pins on the flexible circuit board, and the M sensors are used to measure capacitance values ​​at different positions of the bending area, wherein the capacitance values ​​are used to indicate a bending shape of the bending area, and M is a positive integer, and N is less than or equal to M.

[0006] In the embodiment of the present application, M sensors are arranged in the bending zone to measure the capacitance values ​​at different positions of the bending zone, thereby efficiently detecting the bending shape of the bending zone. By comparing the measured capacitance value with the ideal capacitance value, the risks related to the bending process of the display panel can be effectively evaluated, thereby improving the efficiency of defect detection of the display panel.

[0007] In combination with the first aspect, in certain implementations of the first aspect, the M sensors include P sensors and Q sensors, where P and Q are positive integers; the P sensors are used to send a first signal; the Q sensors are used to receive the first signal and determine the capacitance values ​​at different positions of the bending zone based on the signal strength of the first signal.

[0008] In an embodiment of the present application, M sensors are divided into two groups, namely P sensors that send a first signal and Q sensors that receive the first signal; based on the signal strength of the first signal, the Q sensors can quickly determine the capacitance values ​​at different positions of the bending zone, thereby more efficiently evaluating the risks associated with the bending process of the display panel.

[0009] In combination with the first aspect, in some implementations of the first aspect, the display area includes X sensors, the routing area includes Y sensors, the X sensors and the Y sensors are connected to pins on the flexible circuit board, and X and Y are positive integers; the X sensors are used to send a first signal, the Y sensors are used to receive the first signal, and the capacitance values ​​at different positions of the bending area are determined according to the signal strength of the first signal.

[0010] In the embodiment of the present application, the X sensors arranged in the display area and the Y sensors arranged in the routing area can assist in measuring the capacitance values ​​at different positions (especially the edge positions) of the bending area, thereby improving the accuracy of the bending shape detection of the bending area, which is conducive to more accurately evaluating the risks related to the bending process of the display panel.

[0011] In combination with the first aspect, in some implementations of the first aspect, the bending zone includes a first edge and a second edge, the first edge is an edge connecting the display area and the bending zone, and the second edge is an edge connecting the routing area and the bending zone; the distance between the X sensors and the first edge is less than or equal to a first threshold, and / or the distance between the Y sensors and the second edge is less than or equal to a second threshold.

[0012] In the embodiment of the present application, by limiting the distance between X sensors and the first edge, and limiting the distance between Y sensors and the second edge, it is possible to ensure that the capacitance measurement results of the Y sensors can accurately reflect the capacitance values ​​at different positions (especially the edge positions) of the bending zone, thereby further improving the accuracy of the bending shape detection of the bending zone.

[0013] In combination with the first aspect, in certain implementations of the first aspect, the M sensors are connected to the N pins of the flexible circuit board through a bending line; the M sensors are located in the first metal layer, the bending line is located in the second metal layer, the first metal layer and the second metal layer are different metal layers, and the first metal layer and the second metal layer are connected in parallel.

[0014] In the embodiment of the present application, by respectively arranging M sensors and meander lines on different metal layers, the interference between the sensors and the meander lines can be effectively reduced, the signal transmission path can be optimized, and the influence of parasitic capacitance and parasitic inductance can be reduced. On the other hand, by adopting a structure in which multiple metal layers are connected in parallel, the equivalent resistance can be significantly reduced, the power loss during signal transmission can be reduced, and the signal transmission efficiency can be improved. In addition, this design can not only increase the signal amount, but also improve the stability and reliability of the signal.

[0015] In combination with the first aspect, in some implementations of the first aspect, the N pins include a first pin, and the first pin is connected to at least two sensors among the M sensors.

[0016] In the embodiment of the present application, multiple sensors share the pins of a flexible circuit board, which can not only increase the signal quantity, but also optimize the circuit design, making the bending area more integrated and space-efficient. This shared pin design reduces the number of traces on the flexible circuit board, helps reduce signal interference, improves signal integrity, and facilitates the bending shape test of the bending area.

[0017] In combination with the first aspect, in some implementations of the first aspect, the at least two sensors are connected by a meander line.

[0018] In combination with the first aspect, in some implementations of the first aspect, the M sensors include a sensing pattern, and a cross-sectional shape of the sensing pattern is a rectangle or a square.

[0019] In combination with the first aspect, in some implementations of the first aspect, the sensing pattern includes a plurality of through holes, and a cross-sectional shape of the plurality of through holes is a square or a rectangle.

[0020] In the embodiment of the present application, by reasonably arranging a plurality of through holes with a square or rectangular cross-sectional shape in the sensing pattern, the stress distribution of the sensing pattern can be effectively adjusted to improve the overall durability and reliability of the sensor.

[0021] In a second aspect, a display device is provided, wherein the display device comprises a display panel in any one of the implementations of the first aspect.

[0022] In combination with the second aspect, in some implementations of the second aspect, the display device further includes: components such as a housing, a power supply, and control buttons. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 is a structural schematic diagram of a display panel provided in an embodiment of the present application;

[0024] Figure 2 is a schematic diagram of the structure of another display panel provided in an embodiment of the present application;

[0025] Figure 3 This is a schematic diagram of the bending shape of a bending zone under an ideal state provided in an embodiment of the present application;

[0026] Figure 4 This is a schematic diagram of the bending shape of a bending zone in an actual preparation process provided in an embodiment of the present application;

[0027] Figure 5 is a schematic diagram of the structure of another display panel provided in an embodiment of the present application;

[0028] Figure 6 is a schematic diagram of the structure of another display panel provided in an embodiment of the present application;

[0029] Figure 7 is a schematic diagram of the distribution of a sensor provided in an embodiment of the present application;

[0030] Figure 8 This is an enlarged schematic diagram of the connection between a sensor and a pin provided in an embodiment of the present application;

[0031] Fig. 9 It is a schematic diagram of the distribution of a sensor and a bending line provided in an embodiment of the present application;

[0032] Fig.10 is a schematic diagram of the distribution of another sensor and bending lines provided in an embodiment of the present application;

[0033] Fig.11 is a schematic diagram of the distribution of another sensor and bending lines provided in an embodiment of the present application;

[0034] Fig.12 is a schematic diagram of the distribution of another sensor and bending lines provided in an embodiment of the present application;

[0035] Fig.13 is a schematic diagram of a sensing pattern of a sensor provided in an embodiment of the present application;

[0036] Fig.14 It is a principle diagram of a bending zone bending morphology test provided in an embodiment of the present application;

[0037] Fig.15 It is a principle diagram of a bending zone bending morphology test provided in an embodiment of the present application;

[0038] Fig.16 is a schematic diagram of applying an electrical signal to a sensor using a test fixture provided in an embodiment of the present application;

[0039] Fig.17 It is a waveform diagram of a sensor transmitting signal and receiving signal provided in an embodiment of the present application;

[0040] Fig.18 is a corresponding relationship diagram between the position of a sensor in a bending area and an ideal capacitance value provided by an embodiment of the present application;

[0041] Fig.19 This is a schematic diagram of an embodiment of the present application for using a measured capacitance value and an ideal capacitance value to determine whether the bending shape of a bending zone is qualified;

[0042] Fig. 20 is a schematic diagram of the distribution of another sensor provided in an embodiment of the present application;

[0043] Fig.21 is an enlarged schematic diagram of another sensor and pin connection provided in an embodiment of the present application;

[0044] Fig. 22 It is a principle diagram of another bending zone bending shape test provided in an embodiment of the present application;

[0045] Fig.23 It is a schematic diagram of another bending zone bending shape test provided in an embodiment of the present application. DETAILED DESCRIPTION

[0046] In the description of the embodiments of the present application, unless otherwise specified, " / " means or, for example, A / B can mean A or B; "and / or" in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships, for example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. In the present application, "at least one" means one or more, and "multiple" means two or more. "At least one of the following items" or similar expressions refers to any combination of these items, including any combination of single items or plural items. For example, at least one of a, b, or c can mean: a, b, c, ab, ac, bc, or abc, where a, b, c can be single or multiple.

[0047] In the embodiments of the present application, prefix words such as "first" and "second" are only used to distinguish different described objects, and have no restrictive effect on the position, order, priority, quantity, content, etc. of the described objects. In the embodiments of the present application, the use of prefix words such as ordinal numbers for distinguishing described objects does not constitute a limitation on the described objects. The statement of the described objects refers to the description in the context of the claims or embodiments, and should not constitute an unnecessary limitation due to the use of such prefix words.

[0048] Next, the technical solutions in the present application will be described with reference to the accompanying drawings.

[0049] As described in the background art, in an OLED display panel, the width of the lower border is an important factor affecting the appearance design of the display panel. In order to achieve a narrower lower border, the display panel usually adopts a bending area.

[0050] Exemplarily, as Figure 1 shown, the display panel includes a display area 101, a bending area 102, a wiring area 103, and a driving chip 104. The setting of the bending area 102 realizes the further reduction of the width of the lower border of the display panel and optimizes the space utilization rate of the display panel.

[0051] As another example, as Figure 2 shown, the display panel may include a cover glass 201, an optical transparent adhesive 202, a polarizer 203, a display area 204, a bottom film 205, a substrate covering film 206, a bending gasket 207, a bottom film 208, a panel 209, a driving chip 210, and a bending area 211. Among them, the cover glass 201 is used to protect the display panel, and the optical transparent adhesive 202 is used to bond the cover glass 201 and the polarizer 203. The polarizer 203 is used to adjust the polarization direction of light and adjust the display contrast. The display area 204 is used to display images. The bottom films 205 and 208 are used to provide structural support and at the same time protect the display panel from damage. The substrate covering film 206 is used to protect the flexible substrate and at the same time provide a supporting role. The bending gasket 207 is used to control the shape of the bending area 211, that is, it can control the size of the bending radius R. The panel 209 may include a light-emitting layer, and the light-emitting layer may be composed of an organic light-emitting material to achieve the light-emitting function. The driving chip 210 is used to control the pixel points in the panel 209 to emit light. The bending area 211 includes a bending radius R. By reducing the bending radius R, the space of the panel can be more effectively utilized, thereby achieving a narrower lower border design.

[0052] In an ideal state, as Figure 3 shown, the bending shape of the bending area 211 is an arc state, aiming to disperse stress and reduce stress concentration points through the arc shape, thereby improving the mechanical strength and durability of the bending area. However, due to the limitations of the manufacturing process and the instability of process parameters. As Figure 4As shown, Figure 4 is a schematic diagram of the bending shape of the bending zone in an actual preparation process provided in an embodiment of the present application, Figure 4 (a) and Figure 4 As can be seen from (b) in the figure, the bending shape of the bending zone 211 may deform to a certain extent during the actual processing process, and it is difficult to completely maintain the arc state. This deformation may cause stress concentration in the bending zone, especially in multiple bending or stress tests, cracks or microcracks are more likely to occur. These cracks not only reduce the mechanical strength of the bending zone, making it more susceptible to structural damage during use, but may also have a serious impact on the functionality of the display panel. For example, cracks in the bending zone may damage circuit connections, resulting in abnormal transmission of local electrical signals, thereby causing display abnormalities (such as uneven brightness, poor line shape, color distortion, etc.). In addition, the cracks may further expand over time, significantly reducing the reliability and service life of the display panel.

[0053] At present, the detection of the bending shape of the bending zone requires a lot of testing and process optimization. For example, first take a photo and a microscope for inspection, and then turn on the light to confirm whether there is a poor process in the bending area. However, the above detection method cannot effectively monitor the symmetry of the bending, nor can it quantitatively monitor and evaluate the risks related to the bending process.

[0054] The embodiments of the present application provide a display panel and a display device, wherein a sensor deployed in the display panel can efficiently detect the bending shape of a bending zone, thereby effectively evaluating the risks associated with the bending process of the display panel.

[0055] The display panel provided in the embodiment of the present application includes: a display area 101, a wiring area 103, and a bending area 102 connecting the display area 101 and the wiring area 103, the wiring area 103 includes a flexible circuit board; the bending area 102 includes M sensors 105, the M sensors 105 are connected to N pins 106 on the flexible circuit board, the M sensors 105 are used to measure the capacitance values ​​at different positions of the bending area 102, the capacitance value is used to indicate the bending shape of the bending area 102, M is a positive integer, and N is less than or equal to M.

[0056] In the embodiment of the present application, M sensors are arranged in the bending zone to measure the capacitance values ​​at different positions of the bending zone, thereby efficiently detecting the bending shape of the bending zone. By comparing the measured capacitance value with the ideal capacitance value, the risks related to the bending process of the display panel can be effectively evaluated, thereby improving the efficiency of defect detection of the display panel.

[0057] For example, Figure 5As shown, the bending zone includes 8 sensors 105, each sensor 105 is connected to a pin 106; the sensors 105 are distributed at different positions of the bending zone 102 to measure the capacitance values ​​at different positions of the bending zone 102.

[0058] According to some embodiments, the M sensors 105 include P sensors and Q sensors, where P and Q are positive integers; the P sensors are used to send a first signal; the Q sensors are used to receive the first signal and determine the capacitance values ​​at different positions of the bending zone based on the signal strength of the first signal.

[0059] In an embodiment of the present application, M sensors are divided into two groups, namely P sensors that send a first signal and Q sensors that receive the first signal; based on the signal strength of the first signal, the Q sensors can quickly determine the capacitance values ​​at different positions of the bending zone, thereby more efficiently evaluating the risks associated with the bending process of the display panel.

[0060] Optionally, P=Q.

[0061] According to some embodiments, the display area 101 includes X sensors 107, the routing area 103 includes Y sensors 108, the X sensors 107 and the Y sensors 108 are connected to pins on the flexible circuit board, and X and Y are positive integers; the X sensors 107 are used to send a first signal, and the Y sensors 108 are used to receive the first signal, and determine the capacitance values ​​at different positions of the bending area according to the signal strength of the first signal.

[0062] In the embodiment of the present application, the X sensors arranged in the display area and the Y sensors arranged in the wiring area can assist in measuring the capacitance values ​​at different positions (especially the edge positions) of the bending area, thereby improving the accuracy of the bending shape detection of the bending area, which is conducive to more accurately evaluating the risks related to the bending process of the display panel.

[0063] For example, Figure 6 and Figure 7 As shown, the display area 101 includes a sensor 107, and the routing area 103 includes a sensor 108. The sensors 107 and 108 are connected to the pins in the flexible circuit board. The sensor 107 is used to send a first signal, and the sensor 108 is used to receive the first signal, and determine the capacitance value at the edge of the bending area according to the signal strength of the first signal.

[0064] According to some embodiments, the bending zone 102 includes a first edge 1021 and a second edge 1022, the first edge 1021 is an edge connecting the display area 101 and the bending zone 102, and the second edge 1022 is an edge connecting the routing area 103 and the bending zone 102; the distance between the X sensors 107 and the first edge 1021 is less than or equal to a first threshold, and / or the distance between the Y sensors 108 and the second edge 1022 is less than or equal to a second threshold.

[0065] In the embodiment of the present application, by limiting the distance between X sensors and the first edge, and limiting the distance between Y sensors and the second edge, it is possible to ensure that the capacitance measurement results of the Y sensors can accurately reflect the capacitance values ​​at different positions (especially the edge positions) of the bending zone, thereby further improving the accuracy of the bending shape detection of the bending zone.

[0066] Optionally, the values ​​of the first threshold and the second threshold may be the same or different.

[0067] For example, Figure 8 As shown, the display area 101 includes a sensor 107, the routing area 103 includes a sensor 108, the distance between the sensor 107 and the first edge 1021 is less than or equal to a first threshold, and / or the distance between the sensor 108 and the second edge 1022 is less than or equal to a second threshold.

[0068] According to some embodiments, the M sensors 105 and the N pins 106 may be connected by a bending line 109, and the M sensors 105 and the bending line 109 may be located in the same metal layer or in different metal layers. Similarly, the connection method and deployment position of the X sensor 107 and the Y sensors 108 and the pins of the flexible circuit board may also refer to the M sensors 105.

[0069] In one possible implementation, Fig. 9 As shown, the display panel includes: a pixel definition layer 801, a second flat layer 802 (including a second metal layer), a first flat layer 803 (including a first metal layer), an insulating layer 804, a gate insulating layer 805, a buffer layer 806 and a substrate 807. The M sensors 105 can be located in the first metal layer, and the meander line 109 can be located in the second metal layer. In this way, by arranging the M sensors and the meander line on different metal layers, the interference between the sensors and the meander line can be effectively reduced, the signal transmission path can be optimized, and the influence of parasitic capacitance and parasitic inductance can be reduced.

[0070] In one possible implementation, Fig.10 As shown, M sensors 105 and bending lines 109 ( Fig.10 The metal layers (not shown) may all be located in the second metal layer.

[0071] In one possible implementation, Fig.11 As shown, the pixel definition layer 801 includes a third metal layer, the M sensors 105 may be located in the third metal layer, and the bending line 109 may be located in the second metal layer.

[0072] In one possible implementation, Fig.12 As shown, in Fig.11 On the basis of Fig.12 A top optical layer 808 is also included. The top optical layer 808 may include a top metal layer. The M sensors 105 may be located in the top metal layer, and the bending line 109 may be located in a second metal layer.

[0073] Optionally, in the above possible implementations, the first metal layer and the second metal layer can be connected in parallel, thereby significantly reducing the equivalent resistance, reducing the power loss during signal transmission, and improving the transmission efficiency of the signal. In addition, the parallel connection of the first metal layer and the second metal layer can not only increase the signal amount, but also improve the stability and reliability of the signal.

[0074] According to some embodiments, the M sensors 105 include a sensing pattern, and a cross-sectional shape of the sensing pattern is a rectangle or a square.

[0075] For example, Fig.13 This is a schematic diagram of a sensing pattern of a sensor provided in an embodiment of the present application:

[0076] For example, Fig.13 As shown in (a) in FIG. 1 , the sensing pattern can be a whole surface of metal.

[0077] For example, Fig.13 As shown in (b), the sensing pattern may include a plurality of through holes, and the cross-sections of the plurality of through holes are square. The through holes may effectively adjust the stress distribution of the sensing pattern and improve the overall durability and reliability of the sensor.

[0078] For example, Fig.13 As shown in (c), the sensing pattern can have multiple through holes, and the cross-sections of the multiple through holes are rectangular. The above-mentioned through holes can effectively adjust the stress distribution of the sensing pattern and improve the overall durability and reliability of the sensor.

[0079] Combine the following Figures 14 to 19 The specific process of using sensors to test the bending shape of the bending zone is described in detail.

[0080] like Fig.14As shown, the Y sensors 108 include sensor TX1, the M sensors 105 include sensor TX2, sensor TX3, sensor RX2 and sensor RX3, and the X sensors 107 include sensor RX1, that is, M=4, P=Q=2, and X=Y=1.

[0081] Among them, sensors TX1 to TX3 are used to send radio frequency signals, and RX1 to RX3 are used to receive radio frequency signals. Fig.15 As shown, capacitance can be formed between sensor TX1 and sensor RX1, between sensor TX2 and sensor RX2, and between sensor TX3 and sensor RX3, and RX1 to RX3 can measure capacitance values ​​at different positions of the bending zone based on the signal strength of the received signal. Specifically, as Fig.16 As shown, the display panel that has undergone the bending process can be connected to a test fixture and connected to a terminal device. The test fixture can be used to input electrical signals to sensors TX1 to TX3, and electrical signals can be read from sensors RX1 to RX3, or signals can be directly input from a driver chip. For example, Fig.17 is a waveform diagram of a sensor transmitting signal and receiving signal provided in an embodiment of the present application, such as Fig.17 As shown in (a) in FIG. 1 , the electrical signals input by sensors TX1 to TX3 may be square wave signals, such as Fig.17 As shown in (b) in FIG. 1 , since a capacitance is formed between the sensor TXn and the sensor RXn, n=1 to 3. Therefore, an induction waveform can be generated on the sensor RXn.

[0082] According to formula (1-1), when signals are applied to different sensors TXn, the corresponding sensor RXn's sensing signal strengths are also different, that is, the closer the sensor is to the arc vertex of the bending zone, the greater the theoretical and measured capacitance value. Fig.18 As shown, the ideal capacitance between the sensor TX1 and the sensor RX1 is C1, the ideal capacitance between the sensor TX2 and the sensor RX2 is C2, the ideal capacitance between the sensor TX3 and the sensor RX3 is C3, and C3>C2>C1.

[0083]

[0084] Wherein, C is capacitance, ε is dielectric constant, S is plate area (sensing pattern area), k is scale factor, and d is the distance between sensor TXn and sensor RXn.

[0085] Therefore, when detecting the bending shape of the bending zone, the measured capacitance can be compared with the ideal capacitance. When the difference between the measured capacitance and the ideal capacitance is large, it can be considered that the bending shape of the bending zone is not good and there is a certain risk of fracture. Otherwise, it can be considered that the bending shape of the bending zone meets the production standards. Fig.19 is a schematic diagram of using the measured capacitance value and the ideal capacitance value to judge whether the bending shape of the bending zone is qualified, as provided in an embodiment of the present application. Fig.19 As shown in (a) in FIG. 1 , when the difference between the measured capacitance and the ideal capacitance is less than or equal to the preset value, it can be considered that the bending shape of the bending zone meets the production standard, such as Fig.19 As shown in (b), when the difference between the measured capacitance and the ideal capacitance is greater than a preset value, it can be considered that the bending shape of the bending zone is not good.

[0086] It should be noted that the above-mentioned ideal capacitance may be a calculated value obtained through calculation, or may be a fitting value obtained after actual testing based on good products. The present application does not limit the method for obtaining the ideal capacitance.

[0087] It should also be noted that Figures 14 to 19 The method of using sensors to measure the bending shape of the bending zone is only an exemplary description, and its purpose is to provide an intuitive understanding of the implementation principle of the sensor testing the bending shape of the bending zone, and does not constitute any limitation. Those skilled in the art can flexibly adjust the test method according to specific actual needs. For example, increase or decrease the number of sensors, change the arrangement of sensors and bending lines, etc.

[0088] According to some embodiments, the N pins 106 include a first pin 1061 , and the first pin 1061 is connected to at least two sensors among the M sensors 105 .

[0089] In the embodiment of the present application, multiple sensors share the pins of a flexible circuit board, which can not only increase the signal quantity, but also optimize the circuit design, making the bending area more integrated and space-efficient. This shared pin design reduces the number of traces on the flexible circuit board, helps reduce signal interference, improves signal integrity, and facilitates the bending shape test of the bending area.

[0090] Optionally, at least two sensors are connected via a meander line.

[0091] For example, Fig. 20 and Fig.21 As shown, the M sensors 105 include: a sensor 1051 and a sensor 1052, and the sensor 1051 and the sensor 1052 are connected to the first pin 1061. In addition, the sensor 108 can also be connected to the first pin 1061.

[0092] Among them, Fig. 22As shown, sensor 108 may be sensor TX1, sensor 1052 may be sensor TX2, and sensor 1051 may be sensor TX3; sensor TX2 may be connected to sensor TX3 via a meander line, and sensor TX1 may also be connected to sensor TX2 via a meander line, that is, TX1 to TX3 may be used as a signal transmitting source to send a first signal. Accordingly, as Fig.23 As shown, RX1 to RX3 can receive the first signal and measure the bending capacitance value based on the first signal. After obtaining the measured capacitance values ​​at different positions of the bending zone, they are compared with the ideal capacitance values ​​to determine whether the bending shape of the bending zone is qualified.

[0093] An embodiment of the present application further provides a display device, which includes the display panel introduced in the above embodiment.

[0094] Optionally, the display device further includes components such as a housing, a power supply, and control buttons.

[0095] Optionally, the display device may be: a mobile phone, a flat-panel computer, a monitor, a virtual reality device or an augmented reality device.

[0096] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A display panel, characterized in that: The display panel comprises: a display area, a wiring area, and a bending area connecting the display area and the wiring area, wherein the wiring area comprises a flexible circuit board; The bending zone includes M sensors, which are connected to N pins on the flexible circuit board. The M sensors are used to measure the capacitance values ​​at different positions of the bending zone, and the capacitance values ​​are used to indicate the bending shape of the bending zone. M is a positive integer, and N is less than or equal to M.

2. The display panel according to claim 1, characterized in that: The M sensors include P sensors and Q sensors, where P and Q are positive integers; The P sensors are used to send a first signal; The Q sensors are used to receive the first signal and determine the capacitance values ​​at different positions of the bending zone according to the signal strength of the first signal.

3. The display panel according to claim 1 or 2, characterized in that: The display area includes X sensors, the routing area includes Y sensors, the X sensors and the Y sensors are connected to pins on the flexible circuit board, and X and Y are positive integers; The X sensors are used to send a first signal, and the Y sensors are used to receive the first signal, and determine the capacitance values ​​at different positions of the bending zone according to the signal strength of the first signal.

4. The display panel according to claim 3, wherein: The bending area includes a first edge and a second edge, the first edge is an edge connecting the display area and the bending area, and the second edge is an edge connecting the wiring area and the bending area; The distances between the X sensors and the first edge are less than or equal to a first threshold, and / or the distances between the Y sensors and the second edge are less than or equal to a second threshold.

5. The display panel according to claim 1 or 2, characterized in that: The M sensors are connected to the N pins of the flexible circuit board through bending lines; The M sensors are located in a first metal layer, the bending line is located in a second metal layer, the first metal layer and the second metal layer are different metal layers, and the first metal layer and the second metal layer are connected in parallel.

6. The display panel according to claim 1 or 2, characterized in that: The N pins include a first pin connected to at least two sensors among the M sensors.

7. The display panel according to claim 6, wherein: The at least two sensors are connected by a meander line.

8. The display panel according to claim 1 or 2, characterized in that: The M sensors include sensing patterns, and a cross-sectional shape of the sensing pattern is a rectangle or a square.

9. The display panel according to claim 8, wherein: The sensing pattern includes a plurality of through holes, and the cross-sectional shape of the plurality of through holes is a square or a rectangle.

10. A display device, characterized in that: The invention comprises the display panel as claimed in any one of claims 1 to 9.

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