Enameled wire insulation thickness and conductor measuring method based on optical principle

Abstract

The invention provides an enameled wire insulation thickness and conductor measurement method based on an optical principle, and belongs to the field of optical measurement. The problem of low enameled wire insulation thickness and conductor measurement efficiency is solved; the method specifically comprises the following steps: S1, obtaining index data; s2, constructing an incidence distance equation, calculating a standard proportionality coefficient and a proportionality coefficient according to the index data, and judging whether the enameled wire is qualified or not; if qualified, not processing, and if not qualified, measuring and calculating the thickness of the insulating layer and the radius of the conductor; s3, calculating the thickness of an insulating layer and the radius of a conductor of the enameled wire according to the incidence distance equation to obtain an inspection report; s4, measuring and calculating the thickness of an insulating layer and the radius of a conductor of each enameled wire, and updating an inspection report; by acquiring, analyzing and processing related data of the enameled wire, the thickness of the insulating layer and the radius of the conductor of the enameled wire are measured and calculated, and the measurement efficiency is improved.

Description

Technical Field

[0001] A method for measuring the insulation thickness and conductor of enameled wire based on optical principle according to the present invention relates to the field of optical measurement. Background Technique

[0002] The existing methods for measuring the insulation thickness of enameled wire have the following deficiencies:

[0003] Complexity and cost of the optical system: The design of the optical measurement system is relatively complex. Especially in high-precision measurements, high requirements are imposed on hardware devices such as light sources, optical elements, and detectors; high-precision optical instruments may require high-cost optical elements, resulting in a large investment in equipment; in addition, the maintenance of the optical measurement system is also relatively complex, and optical elements need to be calibrated and maintained regularly.

[0004] Complex data processing: The existing optical measurement methods need to process a large amount of data during the measurement process, especially the three-dimensional information obtained through images. This leads to the need for data processing algorithms to effectively identify the noise in the signal and extract useful information, increasing the difficulty of data processing and data calculation.

[0005] Instability of the light source: Optical measurement relies on the light source for signal reflection or transmission, especially laser light sources; if the output intensity of the laser light source fluctuates, it will directly affect the stability of the measurement results, and the same light source will experience attenuation or unevenness during long-term use, resulting in inaccurate data and inability to unify the quantization standard for data processing. Summary of the Invention

[0006] Aiming at the deficiencies of the existing technology, the purpose of the present invention is to provide a method for measuring the insulation thickness and conductor of enameled wire based on optical principle, aiming to solve the problem of low measurement efficiency of the insulation thickness and conductor of enameled wire.

[0007] To achieve the above object, the present invention is realized through the following technical solutions: A method for measuring the insulation thickness and conductor of enameled wire based on optical principle includes:

[0008] Step S1: Obtain the standard thickness of the insulation layer of the enameled wire, the refractive index of the insulating material, the standard radius of the enameled wire conductor, the wavelength of the laser, and the distance from the interferometer light source to the screen as index data;

[0009] Step S2: Adjust the incident angle of the laser, and count the optical path difference and the interference fringe width when the incident angle changes from 1° to 360°; construct the incident distance equation, and calculate the standard incident distance and the standard optical path difference of the laser according to the index data to obtain the standard proportionality coefficient; based on the optical path difference, the interference fringe width, and the incident distance equation, calculate the proportionality coefficient of the laser at each incident angle; judge whether the enameled wire is qualified according to the standard proportionality coefficient and the proportionality coefficient; if it is qualified, skip Step S3, and if it is unqualified, analyze the proportionality coefficient and measure the insulation layer thickness and the conductor radius of the enameled wire.

[0010] Step S3: Analyze the proportionality coefficient to judge whether the insulation layer thickness of the enameled wire is uniform; if it is uniform, record the insulation layer thickness according to the standard proportionality coefficient and end the step; if it is not uniform, calculate the insulation layer thickness and the conductor radius of the enameled wire according to the incident distance equation to obtain the inspection report.

[0011] Step S4: Obtain the quantity of all enameled wires, measure the insulation layer thickness and the conductor radius of each enameled wire, eliminate the unqualified products, and update the inspection report.

[0012] Furthermore, the specific steps of Step S2 are as follows:

[0013] Step S21: Set the geometric center of the enameled wire as the vertex, denoted as point O; set the position directly to the right of the vertex as the starting position, denoted as point C.

[0014] Set the position where the laser enters the enameled wire as point A, the position where the laser contacts the conductor and reflects inside the enameled wire as point E, and the position where the laser refracts out of the enameled wire as point B.

[0015] Step S22: Based on the points preset in Step S21, denote the magnitude of the incident angle ∠AOC of the enameled wire as α, and the magnitude of the refraction angle ∠EAO as β.

[0016] Denote the wavelength of the laser as λ (0) , and denote the refractive index of the insulation layer as n; satisfy: sin(α) / sin(β) = n.

[0017] Denote the wavelength of the laser when propagating in the insulation layer as λ, and the calculation formula of λ is: λ = λ (0) / n;

[0018] Adjust the incident angle α of the laser counterclockwise from 1° to 360° in sequence, and count the optical path differences when the incident angles are from 1° to 360°, denoted as: ix (1) ~ix (360) ;

[0019] Count the interference fringe widths when the incident angles are from 1° to 360°, denoted as: iw (1) ~iw (360) ;

[0020] Step S23: the standard radius of the enameled wire conductor is recorded as r, and the standard thickness of the enameled wire insulation layer is recorded as td;

[0021] Assuming that the insulation layer of the enameled wire is uniform and meets the standard, the thickness of the insulation layer of the enameled wire is preset to d, and based on the data in step S21 to step S23, the laser refraction-reflection equation group is constructed to obtain formula B (1) ~Formula B (7) ;

[0022] Step S24: Combining the calculation formula in step S23 to construct an equation for the incident and exiting distance of the laser;

[0023] Step S25: Using the standard thickness td of the insulation layer of the enameled wire as formula B (1) ~Formula B (7) d in the figure, calculate the standard incident and exit distances when the laser incident angle is 1° to 360°, recorded as: gd (1) ~gd (360) ;

[0024] Let the distance from the interferometer light source to the screen be Ll, and define calculation formula 1-1:

[0025] tad (i) =(λ×Ll) / ix (i) Among them, tad (i) It represents the distance of the laser beam when the incident angle is i°, ix (i) It indicates the optical path difference of the laser when the incident angle is i°; i indicates the angle, and the value range of i is: 1~360;

[0026] ix (1) ~ix (360) Substituting into the calculation formula 1-1, calculate the laser's one-time incident distance when the incident angle is 1° to 360°, and get: tad (1) ~tad (360) .

[0027] Furthermore, the subsequent steps of step S25 are as follows:

[0028] Step S26: Define calculation formula 1-2:

[0029] Among them, tbd (i) Indicates the secondary incident distance of the laser when the incident angle is i°, iw (i) It indicates the interference fringe width of the laser when the incident angle is i°; i indicates the angle, and the value range of i is: 1~360;

[0030] IW (1) ~iw(360) Substitute into calculation formula 1-2, and calculate the secondary incident and exit distance of the laser when the incident angle is from 1° to 360°, and obtain: tbd (1) ~tbd (360) ;

[0031] Define calculation formula 1-3: ttd (i) =(tad (i) +tbd (i) ) / 2; where, ttd (i) represents the true incident and exit distance of the laser when the incident angle is i°;

[0032] Substitute tad (1) ~tad (360) and tbd (1) ~tbd (360) into calculation formula 1-3, and calculate the true incident and exit distance of the laser when the incident angle is from 1° to 360°, and obtain: ttd (1) ~ttd (360) ;

[0033] Step S27: Define calculation formula 1-4: gw (i) =(λ×Ll) / gd (i) ; where, gd (i) represents the standard incident and exit distance of the laser when the incident angle is i°, gw (i) represents the standard optical path difference corresponding to gd (i) ; i represents the angle, and the value range of i is: 1~360;

[0034] Substitute gd (1) ~gd (360) into calculation formula 1-4, and calculate the standard optical path difference of the standard incident and exit distance of the laser when the incident angle is from 1° to 360°, and obtain gw (1) ~gw (360) ;

[0035] Calculate the standard proportionality coefficient of the incident and exit distance of the enameled wire and the optical path difference, denoted as gdw; the calculation formula of gdw is:

[0036]

[0037] Step S28: Define calculation formula 1-5: tdw (i) =ttd (i) / ix (i) ; where, ttd (i) represents the true incident and exit distance of the laser when the incident angle is i°, ix (i) represents the optical path difference of the laser when the incident angle is i°, tdw (i)It represents the proportionality coefficient of the incident and outgoing distance to the optical path difference when the incident angle of the laser is i°; i represents the angle, and the value range of i is: 1 to 360;

[0038] Substitute ttd (1) ~ttd (360) and ix (1) ~ix (360) into the calculation formula 1-5 to calculate the proportionality coefficient of the incident and outgoing distance to the optical path difference when the incident angle of the laser is from 1 to 360°, and obtain: tdw (1) ~tdw (360) ;

[0039] Step S29: Determine whether tdw (1) = tdw (2) = ~= tdw (360) = gdw holds;

[0040] If it holds, it means that the enameled wire is qualified, the insulation layer thickness of the enameled wire is the standard thickness and the conductor radius is the standard radius, and skip step S3;

[0041] If it does not hold, it means that the enameled wire is unqualified, analyze the proportionality coefficient, mark the non-compliant position, and enter step S3.

[0042] Furthermore, the specific steps of the said step S23 are as follows:

[0043] Step S231: Denote the line segment from point O to point A as l (OA) , and the length of l (OA) is (r + d);

[0044] In triangle △OEA, denote the size of angle ∠OEA as θ, and the size of angle ∠EOA as μ; denote the line segment from point O to point E as l (OE) , and the length of l (OE) is r; denote the line segment from point E to point A as l (EA) ;

[0045] In triangle △OEA, according to the sine theorem, obtain the relational expression a-1-1:

[0046]

[0047] Substitute the data of ∠OEA, l (OA) , l (OA) and ∠EAO, and obtain the relational expression a-1-2:

[0048]

[0049] Based on the relational expression a-1-2: obtain the calculation formula of θ:

[0050] Take the calculation formula of θ as Formula B (1) ;

[0051] Step S232: Denote the line segment from point E to point A as l (EA) , and denote the length of l (OA) as l;

[0052] In triangle △OEA, obtain relationship a-1-3 and relationship a-1-4 according to the sine theorem;

[0053] Relationship a-1-3:

[0054]

[0055] Relationship a-1-4: ∠EOA = μ = π - β - θ;

[0056] According to relationship a-1-3 and relationship a-1-4, obtain the calculation formula of l:

[0057] Take the calculation formula of l as Formula B (2) ;

[0058] Step S233: Denote the line segment from point A to point B as l (AB) , draw a straight line along the extension of l (OE) in the direction of l (AB) and intersect it at l (AB) , and denote the intersection point as point F; Denote the line segment from point F to point A as l (FA) , and denote the length of l (FA) as h;

[0059] In triangle △OBF, the calculation formula of h is: h = sin(μ) × (r + d); Take the calculation formula of h as Formula B (3) ;

[0060] Denote the size of angle ∠EBF as δ, in triangle △EBF, the calculation formula of δ is:

[0061] δ = arccos(h / l); Take the calculation formula of δ as Formula B (4) .

[0062] Furthermore, the subsequent steps of step S233 are as follows:

[0063] Step S234: Denote the line segment from point O to point C as l (OC) , draw a perpendicular line from point B to l (OC) in the direction of l (OC) , and the foot of the perpendicular is point G; Rotate l (OD) counterclockwise by 90° to obtain a straight line l

[0064] Denote the line segment from point B to point G as l (BG) , according to the angle transformation of the triangle, the magnitudes of ∠EBO and ∠EAO are equal, both being β;

[0065] Denote the line segment from point B to point G as l (BG) , l (BG) Divide ∠EBO into ∠OBG and ∠GBE; Denote the magnitude of ∠OBG as β 1 , and the magnitude of ∠GBE as β 2 ;

[0066] According to the principle of parallel lines, the magnitudes of ∠DOB and ∠OBG are equal, both being β 1 ; of β 1 The calculation formula is: β 1 =(π / 2) - α - (2×μ); Take the calculation formula of β 1 as formula B (5) ;

[0067] Step S235: Extend point B along the direction of l (OC) , and extend point A along the direction of l (OD) , and the intersection of the extension lines is H;

[0068] Denote the magnitude of ∠ABH as η, and obtain relationship a - 2 - 1 and relationship a - 2 - 2 from angle transformation;

[0069] Relationship a - 2 - 1: η=(π / 2) - δ - β 2 ;

[0070] Relationship a - 2 - 1: β 2 =β - β 1 ;

[0071] Combine relationship a - 2 - 1, relationship a - 2 - 2 and formula B (5) , and obtain the calculation formula of η:

[0072] η = π - δ - β - α - (2×μ); Take the calculation formula of η as formula B (6) ;

[0073] Step S236: Denote the line segment from point H to point A as l (HA) , in triangle △ABF, the incident and exit distance of the laser is l (HA) , and denote the length of l (HA) as il;

[0074] Combine formula B (1) ~formula B (6) and obtain the calculation formula of il: il=(2×h)×sin(η);

[0075] Take the calculation formula of il as Formula B (7) , and take Formula B (1) to Formula B (7) as the laser folding and reflection equation set.

[0076] Furthermore, the workflow of step S24 is as follows:

[0077] Step S241: Extract Formula B (1) : where d represents the preset thickness of the enameled wire insulation layer (d = td or d ≠ td);

[0078] Relationship a - 1 - 4: μ = π - β - θ;

[0079] Formula B (2) :

[0080] Formula B (3) : h = sin(μ) × (r + d);

[0081] Formula B (4) : δ = arccos(h / l);

[0082] Formula B (6) : η = π - δ - β - α - (2 × μ);

[0083] Step S242: Substitute Formula B (2) and Formula B (3) into Formula B (4) to obtain Formula C (1) :

[0084]

[0085] Substitute Formula B (1) into Relationship a - 1 - 4 to obtain Formula C (2) :

[0086]

[0087] According to the properties of inverse trigonometric functions, obtain Formula C (3) :

[0088]

[0089] Step S243: Substitute Formula C (2) and Formula C (3) into Formula B (6) to obtain Formula C (4) :

[0090] η = (π / 2) - α - μ;

[0091] Extract formula B (7) : il = (2 × h) × sin(η);

[0092] Substitute formula C (4) and formula B (3) into formula B (7) to obtain formula C (5) :

[0093]

[0094] Substitute formula C (2) into formula C (5) to obtain the laser incident and exit distance equation:

[0095]

[0096] where α and β represent the incident angle and the refraction angle respectively, and r represents the standard radius of the enameled wire conductor;

[0097] d represents the preset thickness of the enameled wire insulation layer, i.e., the independent variable; redefine il as the laser incident and exit distance, i.e., the dependent variable.

[0098] Furthermore, the specific steps of step S3 are as follows:

[0099] Step S31: Extract the standard proportionality coefficient gdw, and extract the proportionality coefficients of the incident and exit distance and the optical path difference when the laser incident angle is from 1° to 360°: tdw (1) 、tdw (2) ~tdw (360) ;

[0100] Judge whether tdw (1) = tdw (2) =~= tdw (360) holds;

[0101] If it holds, it means that the conductor radius of the enameled wire is the standard radius and the insulation layer thickness of the enameled wire is uniform. Calculate the insulation layer thickness of the enameled wire and enter step S32;

[0102] If it does not hold, it means that the insulation layer thickness of the enameled wire is not uniform. Perform a secondary analysis on the proportionality coefficient, calculate the insulation layer thickness of the enameled wire, and enter step S33;

[0103] Step S32: tdw (1) = tdw (2) =~= tdw (360) holds; Calculate tdw (1) ~tdw (360)The average value is denoted as ddw, the thickness of the enameled wire insulation layer is denoted as cod, and the value of cod is calculated; the wavelength λ of the laser is extracted. (0) , the refractive index n of the insulation layer;

[0104] Step S33: tdw (1) = tdw (2) = ~= tdw (360) Does not hold; extract the incident distance equation and calculate the thickness of the enameled wire insulation layer and the conductor radius.

[0105] The incident distance equation is:

[0106]

[0107] where α and β represent the incident angle and the refraction angle respectively, r represents the standard radius of the enameled wire conductor; the relationship between α and β satisfies: sin(α) / sin(β) = n;

[0108] d represents the preset thickness of the enameled wire insulation layer, that is, the independent variable; il is redefined as the incident and exit distance of the laser, that is, the dependent variable;

[0109] Step S34: Summarize the data in steps S31 to S33 as an inspection report.

[0110] Furthermore, the specific steps of step S32 are as follows:

[0111] Step S321: Extract the optical path difference ix when the incident angle of the laser is 1°, 2° up to 360° (1) , ix (2) ~ix (360) ;

[0112] Step S322: Denote the interference order of the laser when the incident angle is i° as mn (i) ; where mn (i) is a positive integer; i represents the angle, and the value range of i is: 1 to 360;

[0113] Define relationship 2-1 and relationship 2-2;

[0114] Relationship 2-1: ix (i) = (mn (i) + 0.5) × (λ (0) / n); where ix (i) represents the optical path difference of the laser when the incident angle is i°;

[0115] Relationship 2-2: ix (i) = mn (i) × (λ (0) / n);

[0116] Substitute ix (1) to ix (360) into the relational expression 2-1 or relational expression 2-2 in reverse, calculate the interference order of the laser when the incident angle is 1°, 2° up to 360°, and obtain: mn (1) and mn (2) to mn (360) ;

[0117] Step S323: Calculate mn (1) to mn (360) average value, denoted as amn; the calculation formula of cod is:

[0118]

[0119] Furthermore, the specific steps of the said step S33 are as follows:

[0120] Step S331: Extract the true incident and exit distances of the laser when the incident angle is 1°, 2° up to 360°: ttd (1) and ttd (2) to ttd (360) ;

[0121] Substitute ttd (1) to ttd (360) into the incident and exit distance equation as il in reverse, calculate the insulation layer thickness of the enameled wire when the incident angle is 1°, 2° up to 360°, and obtain: ted (1) and ted (2) to ted (360) ;

[0122] Step S332: Extract the standard thickness td of the insulation layer of the enameled wire;

[0123] Denote the insulation layer thickness of the enameled wire when the incident angle is i° as ted (i) ; where, i represents the angle, and the value range of i is: 1 to 360;

[0124] Step S333: Compare the magnitudes of ted (i) and td, and define relational expression 2-3 and relational expression 2-4;

[0125] ted (i) ≥td, relational expression 2-3:

[0126] where, tdw (i) represents the proportionality coefficient between the incident and exit distance and the optical path difference when the incident angle of the laser (emitted by the interferometer) is i°;

[0127] ted (i) <td, relational expression 2-4:

[0128]

[0129] Step S334: Substitute tdw (1) ~tdw (360) into Equation 2-3 or Equation 2-4, extract the proportionality coefficient that satisfies Equation 2-3 as the Class A coefficient; extract the proportionality coefficient that satisfies Equation 2-4 as the Class B coefficient; extract the proportionality coefficient that does not satisfy Equation 2-3 and Equation 2-4 as the Class C coefficient;

[0130] Count the number of Class A coefficients as ua, the number of Class B coefficients as ub, and the number of Class C coefficients as uc;

[0131] Step S335: Denote the angles of the 1st to the ua-th Class A coefficients as ana (1) ~ana (ua) ;

[0132] Denote the insulation layer thickness of the enameled wire corresponding to ana (1) ~ana (ua) as: aad (1) ~aad (ua) ;

[0133] The enameled wire has a normal conductor radius and a relatively thick insulation layer with a thickness of: aad (1) ~aad (ua) at the angle of ana (1) ~aad (ua) ;

[0134] Step S336: Denote the angles of the 1st to the ub-th Class B coefficients as anb (1) ~anb (ub) ;

[0135] Denote the insulation layer thickness of the enameled wire corresponding to anb (1) ~anb (ub) as: bbd (1) ~bbd (ub) ;

[0136] The enameled wire has a normal conductor radius and a relatively thin insulation layer with a thickness of: bbd (1) ~anb (ub) at the angle of anb (1) ~bbd (ub) ;

[0137] Furthermore, the subsequent steps of Step S336 are as follows:

[0138] Step S337: Denote the angles of the 1st to the uc-th Class C coefficients as anc (1) ~anc(uc) ;

[0139] The insulation layer thickness of the enameled wire corresponding to anc (1) ~anc (uc) is denoted as: ccd (1) ~ccd (uc) ;

[0140] The proportionality coefficient corresponding to anc (1) ~anc (uc) is denoted as cdw (1) ~cdw (uc) ;

[0141] The offset coefficient of the conductor radius corresponding to the jth C-type coefficient is denoted as bur (j) ;

[0142] The proportionality coefficient corresponding to the jth C-type coefficient is denoted as cdw (j) ; The value range of j is: 1~uc;

[0143] Step S338: Compare the magnitudes of cdw (j) and td, and define relational expressions 2-5 and 2-6;

[0144] cdw (j) ≥td, relational expression 2-5:

[0145]

[0146] cdw (j) <td, relational expression 2-6:

[0147]

[0148] Substitute ccd (1) ~ccd (uc) and cdw (1) ~cdw (uc) into relational expression 2-5 or relational expression 2-6, and calculate the offset coefficient of the conductor radius of the 1st to uc-th C-type coefficients to obtain: bur (1) ~bur (uc) ;

[0149] Step S339: Determine the positive or negative of bur (1) ~bur (uc) to determine the conductor radius;

[0150] Step S3391: The insulation layer thickness at the angle ana (1) of the enameled wire is relatively thin, and the thickness is: ccd (1) ;

[0151] If bur(1) If it is positive, the angle of the enameled wire is ana (1) The conductor at this position is thicker, and the conductor radius is: (1 + bur (1) ) × r; where r represents the standard radius of the enameled wire radius;

[0152] If bur (1) is negative, the angle of the enameled wire is ana (1) The conductor at this position is thinner, and the conductor radius is: (1 - |bur (1) |) × r; where r represents the standard radius of the enameled wire radius;

[0153] Step S3392: The thickness of the insulation layer at the position where the angle of the enameled wire is ana (2) is thinner, and the thickness is: ccd (2) ;

[0154] If bur (2) is positive, the angle of the enameled wire is ana (2) The conductor at this position is thicker, and the conductor radius is: (1 + bur (2) ) × r; where r represents the standard radius of the enameled wire radius;

[0155] If bur (2) is negative, the angle of the enameled wire is ana (2) The conductor at this position is thinner, and the conductor radius is: (1 - |bur (2) |) × r; where r represents the standard radius of the enameled wire radius;

[0156] Step S3393: And so on, the thickness of the insulation layer at the position where the angle of the enameled wire is ana (uc) is thinner, and the thickness is: ccd (uc) ;

[0157] If bur (uc) is positive, the angle of the enameled wire is ana (uc) The conductor at this position is thicker, and the conductor radius is: (1 + bur (uc) ) × r; where r represents the standard radius of the enameled wire radius;

[0158] If bur (uc) is negative, the angle of the enameled wire is ana (uc) The conductor at this position is thinner, and the conductor radius is: (1 - |bur (uc) |) × r.

[0159] Compared with the prior art, the beneficial effects of the present invention are:

[0160] Non-contact measurement: The measurement method of the present invention based on the optical principle obtains information through the characteristics of light reflection, refraction, etc., without damaging any part of the sample. The greatest advantage is non-contact. During the manufacturing and use of enameled wires, the optical measurement method can be used for the insulation layer thickness of enameled wires, avoiding direct contact with the enameled wire and preventing damage or errors caused by physical contact. Compared with traditional contact measurement methods (such as resistance measurement or mechanical measurement), optical measurement does not change the physical properties of the object to be measured. Especially in the fine production process of enameled wires, the optical measurement method can accurately maintain the original state of the wire.

[0161] High precision: The optical measurement method has a very high resolution and can reach micron-level precision, suitable for accurately measuring the small dimensions of enameled wires. Using laser interferometry or optical microscopy methods, the thickness of the insulation layer can be measured at the nanoscale, ensuring the consistency and stability of the product.

[0162] Suitable for mass production: The present invention can be integrated with production line automation equipment and is suitable for rapid detection of enameled wires in mass production. The optical measurement method is not limited by the skill level of operators and can achieve high-throughput and low-error detection in an efficient production process. BRIEF DESCRIPTION OF THE DRAWINGS

[0163] By reading the following detailed description of the non-limiting embodiments with reference to the accompanying drawings, other features, objects, and advantages of the present invention will become more apparent:

[0164] Figure 1 It is a schematic diagram of the method of the present invention;

[0165] Figure 2 It is a schematic diagram of the enameled wire of the present invention;

[0166] Figure 3 It is a schematic diagram of light refraction and reflection of the present invention;

[0167] Figure 4 It is a schematic diagram of light refraction and reflection of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0168] To make the above objects, features, and advantages of the present invention more obvious and understandable, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0169] Please refer to Figure 1 and Figure 2 , a method for measuring the insulation thickness and conductor of enameled wires based on the optical principle includes:

[0170] Step S1: Obtain the standard thickness of the enameled wire insulation layer, the refractive index of the insulating material, the standard radius of the enameled wire conductor, the wavelength of the laser (emitted by the interferometer), and the distance from the interferometer light source to the screen as index data;

[0171] Step S2: Adjust the incident angle of the laser (emitted by the interferometer), and count the optical path difference and the interference fringe width when the incident angle changes from 1° to 360°; construct an incident distance equation (based on the principle of light interference and trigonometric transformation), and calculate the standard incident distance and the standard optical path difference of the laser (emitted by the interferometer) according to the index data to obtain the standard proportionality coefficient; calculate the proportionality coefficient of the laser (emitted by the interferometer) at each incident angle based on the optical path difference, the interference fringe width, and the incident distance equation; judge whether the enameled wire is qualified according to the standard proportionality coefficient and the proportionality coefficient; if it is qualified, skip Step S3 (that is, the insulation layer thickness of the enameled wire is the standard thickness, and the radius of the enameled wire conductor is the standard radius), if it is unqualified, analyze the proportionality coefficient and measure the insulation layer thickness and the conductor radius of the enameled wire (enter Step S3);

[0172] The specific steps of Step S2 are as follows:

[0173] Step S21: Please refer to Figure 3 , take the geometric center of the enameled wire as the vertex, denoted as point O; take the position directly to the right of the vertex as the starting position, denoted as point C;

[0174] (Use the interferometer to measure the insulation layer thickness of the enameled wire) Let the position where the laser (emitted by the interferometer) enters the enameled wire be point A, the position where the laser (emitted by the interferometer) contacts the conductor and is reflected inside the enameled wire be point E, and the position where the laser (emitted by the interferometer) refracts out of the enameled wire be point B;

[0175] It should be noted that the "laser" in the present invention generally refers to a light source that can produce an interference phenomenon, such as: white light with a wavelength range of 400 - 700 nm (white light interference band 400 - 700 nm) or infrared light with a wavelength range of 800 - 1300 nm (infrared interference band 800 - 1300 nm); the user can adjust the light source of the "laser" according to actual needs;

[0176] Step S22: Based on the points preset in Step S21 (and trigonometric transformation), denote the magnitude of the incident angle ∠AOC of the enameled wire as α, and the magnitude of the refraction angle ∠EAO as β;

[0177] Denote the wavelength of the laser (emitted by the interferometer) as λ (0) , denote the refractive index of the insulation layer as n; satisfy: sin(α) / sin(β) = n;

[0178] Denote the wavelength when the laser propagates in the insulation layer as λ, and the calculation formula of λ is: λ = λ (0) / n;

[0179] Adjust the incident angle α of the laser counterclockwise from 1° to 360° in sequence, and count the optical path differences when the incident angles are 1°, 2° up to 360°, denoted as: ix (1) , ix (2) ~ix (360) ;

[0180] Count the fringe widths when the incident angles are 1°, 2° up to 360°, denoted as: iw (1) , iw (2) ~iw (360) ;

[0181] Step S23: Please refer to Figure 3 and Figure 4 , denote the standard radius of the enameled wire conductor as r, and denote the standard thickness of the enameled wire insulation layer as td;

[0182] Assume that the insulation layer of the enameled wire is uniform and meets the standard, preset the thickness of the enameled wire insulation layer as d, and based on the data in construction steps S21 to S23, construct a laser refraction and reflection equation system to obtain formula B (1) ~formula B (7) ;

[0183] Step S231: Denote the line segment from point O to point A as l (OA) , the length of l (OA) is (r + d);

[0184] In triangle △OEA, denote the size of angle ∠OEA as θ, and the size of angle ∠EOA as μ; denote the line segment from point O to point E as l (OE) , the length of l (OE) is r; denote the line segment from point E to point A as l (EA) ;

[0185] In triangle △OEA, according to the sine theorem, obtain the relationship a - 1 - 1:

[0186]

[0187] Substitute the data of ∠OEA, l (OA) , l (OA) and ∠EAO to obtain the relationship a - 1 - 2:

[0188]

[0189] Based on the relationship a - 1 - 2: obtain the calculation formula of θ:

[0190] Take the calculation formula of θ as formula B (1) ;

[0191] Step S232: Denote the line segment from point E to point A as l (EA) , and denote the length of l (OA) as l;

[0192] In triangle △OEA, obtain relationship a-1-3 and relationship a-1-4 according to the sine theorem;

[0193] Relationship a-1-3:

[0194]

[0195] Relationship a-1-4: ∠EOA = μ = π - β - θ;

[0196] According to relationship a-1-3 and relationship a-1-4, obtain the calculation formula of l:

[0197] Take the calculation formula of l as formula B (2) ;

[0198] Step S233: Denote the line segment from point A to point B as l (AB) , draw a straight line along the extension of l (OE) in the direction of l (AB) and intersect it with l (AB) , and denote the intersection point as point F; Denote the line segment from point F to point A as l (FA) , and denote the length of l (FA) as h;

[0199] In triangle △OBF, the calculation formula of h is: h = sin(μ) × (r + d); Take the calculation formula of h as formula B (3) ;

[0200] Denote the size of angle ∠EBF as δ, in triangle △EBF, the calculation formula of δ is:

[0201] δ = arccos(h / l); Take the calculation formula of δ as formula B (4) ;

[0202] Step S234: Denote the line segment from point O to point C as l (OC) , draw a perpendicular line from point B to l (OC) in the direction of l (OC) , and rotate l (OD) counterclockwise by 90° to obtain a straight line l

[0203] Denote the line segment from point B to point G as l (BG) , according to the angle transformation of the triangle, the sizes of angle ∠EBO and angle ∠EAO are equal, both being β;

[0204] Denote the line segment from point B to point G as l (BG) , l (BG) Divide the angle ∠EBO into ∠OBG and ∠GBE; Denote the magnitude of ∠OBG as β 1 , and the magnitude of ∠GBE as β 2 ;

[0205] According to the principle of parallel lines, the magnitude of ∠DOB is equal to that of ∠OBG, both being β 1 ; of β 1 The calculation formula is: β 1 =(π / 2) - α - (2×μ); Denote the calculation formula of β 1 as formula B (5) ;

[0206] Step S235: Extend the line in the direction of point B along l (OC) , and extend the line in the direction of point A along l (OD) . The intersection point of the extended lines is H;

[0207] Denote the magnitude of ∠ABH as η, and obtain relationship a - 2 - 1 and relationship a - 2 - 2 from angle transformation;

[0208] Relationship a - 2 - 1: η=(π / 2) - δ - β 2 ;

[0209] Relationship a - 2 - 1: β 2 =β - β 1 ;

[0210] Simultaneously solve relationship a - 2 - 1, relationship a - 2 - 2 and formula B (5) , and obtain the calculation formula of η:

[0211] η = π - δ - β - α - (2×μ); Denote the calculation formula of η as formula B (6) ;

[0212] Step S236: Denote the line segment from point H to point A as l (HA) . In triangle △ABF, the incident and exit distance of the laser is l (HA) . Denote the length of l (HA) as il; (il also represents the incident and exit distance of the laser, see step S243)

[0213] Simultaneously solve formula B (1) ~formula B (6) to obtain the calculation formula of il: il=(2×h)×sin(η);

[0214] Denote the calculation formula of il as formula B (7) , and denote formula B (1) ~formula B (7)As the laser catadioptric equation system;

[0215] Step S24: Combine the calculation formulas in Step S23 to construct the laser incident and exit distance equation;

[0216] Step S241: Extract formula B (1) : where d represents the thickness of the enameled wire insulation layer preset (d = td or d ≠ td);

[0217] Relationship a-1-4: μ = π - β - θ;

[0218] Formula B (2) :

[0219] Formula B (3) : h = sin(μ) × (r + d);

[0220] Formula B (4) : δ = arccos(h / l);

[0221] Formula B (6) : η = π - δ - β - α - (2 × μ);

[0222] Step S242: Substitute formula B (2) and formula B (3) into formula B (4) to obtain formula C (1) :

[0223]

[0224] Substitute formula B (1) into relationship a-1-4 to obtain formula C (2) :

[0225]

[0226] According to the properties of inverse trigonometric functions, obtain formula C (3) :

[0227]

[0228] Step S243: Substitute formula C (2) and formula C (3) into formula B (6) to obtain formula C (4) :

[0229] η = (π / 2) - α - μ;

[0230] Extract formula B (7) : il = (2 × h) × sin(η);

[0231] Substitute formula C (4) and formula B (3) into formula B (7) to obtain formula C (5) :

[0232]

[0233] Substitute formula C (2) into formula C (5) to obtain the laser incident and exit distance equation:

[0234]

[0235] where α and β represent the incident angle and the refraction angle respectively, and r represents the standard radius of the enameled wire conductor;

[0236] d represents the preset thickness of the enameled wire insulation layer, that is, the independent variable; redefine il as the laser incident and exit distance, that is, the dependent variable;

[0237] Step S25: Take the standard thickness td of the enameled wire insulation layer as d in formula B (1) ~formula B (7) and calculate the standard incident and exit distances when the laser incident angle (emitted by the interferometer) is 1°, 2° up to 360° in sequence, denoted as: gd (1) 、gd (2) ~gd (360) ;

[0238] Denote the distance from the interferometer light source to the screen as Ll and define calculation formula 1-1:

[0239] tad (i) =(λ × Ll) / ix (i) ; where tad (i) represents the one-way incident and exit distance of the laser (emitted by the interferometer) when the incident angle is i°, and ix (i) represents the optical path difference of the laser (emitted by the interferometer) when the incident angle is i°; i represents the angle, and the value range of i is: 1~360;

[0240] Substitute ix (1) ~ix (360) into calculation formula 1-1 to calculate the one-way incident and exit distances of the laser (emitted by the interferometer) when the incident angle is 1°, 2° up to 360°, and obtain: tad (1) 、tad (2) ~tad (360) ;

[0241] Step S26: Define calculation formula 1-2:

[0242] Among them, tbd (i) represents the secondary incident and exit distance of the laser (emitted by the interferometer) when the incident angle is i°, iw (i) represents the fringe width of the laser (emitted by the interferometer) when the incident angle is i°; i represents the angle, and the value range of i is: 1 to 360;

[0243] Substitute iw (1) ~iw (360) into calculation formula 1-2, and calculate the secondary incident and exit distance of the laser (emitted by the interferometer) when the incident angles are 1°, 2° up to 360°, and obtain: tbd (1) 、tbd (2) ~tbd (360) ;

[0244] Define calculation formula 1-3: ttd (i) =(tad (i) +tbd (i) ) / 2; Among them, ttd (i) represents the true incident and exit distance of the laser (emitted by the interferometer) when the incident angle is i°;

[0245] Substitute tad (1) ~tad (360) and tbd (1) ~tbd (360) into calculation formula 1-3, and calculate the true incident and exit distance of the laser (emitted by the interferometer) when the incident angles are 1°, 2° up to 360°, and obtain: ttd (1) 、ttd (2) ~ttd (360) ;

[0246] Step S27: Define calculation formula 1-4: gw (i) =(λ×Ll) / gd (i) ; Among them, gd (i) represents the standard incident and exit distance of the laser (emitted by the interferometer) when the incident angle is i°, gw (i) represents the standard optical path difference corresponding to gd (i) ; i represents the angle, and the value range of i is: 1 to 360;

[0247] Substitute gd (1) ~gd (360) into calculation formula 1-4, and calculate the standard optical path difference of the standard incident and exit distance of the laser (emitted by the interferometer) when the incident angles are 1°, 2° up to 360°, and obtain gw (1) 、gw (2) ~gw (360) ;

[0248] Calculate the standard proportionality coefficient of the incident and exit distances and the optical path difference of the enameled wire, denoted as gdw; the calculation formula for gdw is:

[0249]

[0250] Step S28: Define calculation formulas 1-5: tdw (i) = ttd (i) / ix (i) ; where, ttd (i) represents the true incident and exit distance of the laser (emitted by the interferometer) when the incident angle is i°, ix (i) represents the optical path difference of the laser (emitted by the interferometer) when the incident angle is i°, and tdw (i) represents the proportionality coefficient of the incident and exit distance to the optical path difference of the laser (emitted by the interferometer) when the incident angle is i°; i represents the angle, and the value range of i is: 1 to 360;

[0251] Substitute ttd (1) ~ ttd (360) and ix (1) ~ ix (360) into calculation formulas 1-5, and calculate the proportionality coefficient of the incident and exit distance to the optical path difference of the laser (emitted by the interferometer) when the incident angles are 1°, 2° up to 360°, to obtain: tdw (1) 、tdw (2) ~ tdw (360) ;

[0252] Step S29: Determine whether tdw (1) = tdw (2) = ~= tdw (360) = gdw holds;

[0253] If it holds, it means the enameled wire is qualified, the insulation layer thickness of the enameled wire is the standard thickness and the conductor radius is the standard radius, and skip step S3;

[0254] If it does not hold, it means the enameled wire is unqualified, analyze the proportionality coefficient, mark the non-compliant positions, and enter step S3.

[0255] Step S3: Analyze the proportionality coefficient and determine whether the insulation layer thickness of the enameled wire is uniform; if it is uniform, record the insulation layer thickness according to the standard proportionality coefficient and end the step; if it is not uniform, calculate the insulation layer thickness and conductor radius of the enameled wire according to the incident and exit distance equation to obtain an inspection report;

[0256] Step S4: Obtain the quantity of all enameled wires, measure the insulation layer thickness and conductor radius of each enameled wire, remove the unqualified products, and update the inspection report;

[0257] The specific steps of step S3 are as follows:

[0258] Step S31: Extract the standard proportionality coefficient gdw, and extract the proportionality coefficients tdw of the incident and exit distances to the optical path difference when the laser incident angle (emitted by the interferometer) is from 1° to 360°: tdw (1) , tdw (2) ~tdw (360) ;

[0259] Judge whether tdw (1) = tdw (2) =~= tdw (360) holds;

[0260] If it holds, it means that the conductor radius of the enameled wire is the standard radius and the insulation layer thickness of the enameled wire is uniform. Calculate the insulation layer thickness of the enameled wire and enter Step S32;

[0261] If it does not hold, it means that the insulation layer thickness of the enameled wire is non-uniform. Conduct a secondary analysis of the proportionality coefficient, calculate the insulation layer thickness of the enameled wire, and enter Step S33;

[0262] Step S32: tdw (1) = tdw (2) =~= tdw (360) holds; Calculate the average value of tdw (1) ~tdw (360) and denote it as ddw. Denote the uniform insulation layer thickness of the enameled wire as cod and calculate the value of cod; Extract the wavelength λ (0) of the laser (emitted by the interferometer), and the refractive index n of the insulation layer;

[0263] Step S321: Extract the optical path differences ix (1) , ix (2) ~ix (360) when the laser incident angle (emitted by the interferometer) is from 1° to 360°;

[0264] Step S322: Denote the interference order of the laser (emitted by the interferometer) at the incident angle of i° as mn (i) ; where mn (i) is a positive integer; i represents the angle, and the value range of i is: 1~360;

[0265] Define relational expressions 2-1 and 2-2;

[0266] Relational expression 2-1: ix (i) =(mn (i) +0.5)×(λ (0) / n); where ix (i) represents the optical path difference of the laser (emitted by the interferometer) at the incident angle of i°;

[0267] Relationship 2-2: ix (i) = mn (i) ×(λ (0) / n);

[0268] Substitute ix (1) ~ ix (360) backward into Relationship 2-1 or Relationship 2-2, and calculate the interference order of the laser (emitted by the interferometer) when the incident angle is from 1° to 360°, and obtain: mn (1) 、mn (2) ~ mn (360) ;

[0269] Step S323: Calculate the average value of mn (1) ~ mn (360) , denoted as amn; The calculation formula of cod is:

[0270]

[0271] Step S33: tdw (1) = tdw (2) = ~ = tdw (360) does not hold; Extract the incident distance equation and calculate the insulation layer thickness and conductor radius of the enameled wire;

[0272] The incident distance equation is:

[0273]

[0274] where α and β represent the incident angle and the refraction angle respectively, and r represents the standard radius of the enameled wire conductor; The relationship between α and β satisfies: sin(α) / sin(β) = n;

[0275] d represents the preset thickness of the insulation layer of the enameled wire, that is, the independent variable; Redefine il as the incident and exit distance of the laser, that is, the dependent variable;

[0276] Step S331: Extract the true incident and exit distances of the laser (emitted by the interferometer) when the incident angle is from 1° to 360°: ttd (1) 、ttd (2) ~ ttd (360) ;

[0277] Substitute ttd (1) ~ ttd (360) backward into the incident distance equation as il, and calculate the insulation layer thickness of the enameled wire when the incident angle is from 1° to 360° (emitted by the interferometer), and obtain: ted (1) 、ted (2) ~ ted (360) ;

[0278] Step S332: Extract the standard thickness td of the insulating layer of the enameled wire;

[0279] Record the thickness of the insulating layer of the enameled wire when the incident angle is i° (emitted by the interferometer) as ted (i) ; where i represents the angle, and the value range of i is: 1 to 360;

[0280] Step S333: Compare ted (i) with td, and define relational expressions 2-3 and relational expression 2-4;

[0281] ted (i) ≥td, relational expression 2-3:

[0282] where tdw (i) represents the proportionality coefficient of the incident and exit distance to the optical path difference when the laser incident angle (emitted by the interferometer) is i°;

[0283] ted (i) <td, relational expression 2-4:

[0284]

[0285] Step S334: Substitute tdw (1) ~tdw (360) into relational expression 2-3 or relational expression 2-4, extract the proportionality coefficient that satisfies relational expression 2-3 as the type A coefficient; extract the proportionality coefficient that satisfies relational expression 2-4 as the type B coefficient; extract the proportionality coefficient that does not satisfy relational expressions 2-3 and 2-4 as the type C coefficient;

[0286] Count the number of type A coefficients as ua, the number of type B coefficients as ub, and the number of type C coefficients as uc;

[0287] Step S335: Denote the angles of the 1st to the ua-th type A coefficients as ana (1) ~ana (ua) ;

[0288] Denote the thickness of the insulating layer of the enameled wire corresponding to ana (1) ~ana (ua) as: aad (1) ~aad (ua) ;

[0289] The conductor radius of the enameled wire (relative to line segment l (OC) ) at the angles of ana (1) ~ana (ua) is normal, and the insulating layer is thicker, with a thickness of: aad (1) ~aad (ua) ;

[0290] Step S336: Denote the angles of the 1st to the ub-th B-type coefficients as anb (1) ~anb (ub) ;

[0291] Denote the insulation layer thickness of the enameled wire corresponding to anb (1) ~anb (ub) as: bbd (1) ~bbd (ub) ;

[0292] The enameled wire (relative to the line segment l (OC) ) with an angle of anb (1) ~anb (ub) has a normal conductor radius and a relatively thin insulation layer with a thickness of: bbd (1) ~bbd (ub) ;

[0293] Step S337: Denote the angles of the 1st to the uc-th C-type coefficients as anc (1) ~anc (uc) ;

[0294] Denote the insulation layer thickness of the enameled wire corresponding to anc (1) ~anc (uc) as: ccd (1) ~ccd (uc) ;

[0295] Denote the proportionality coefficient corresponding to anc (1) ~anc (uc) as cdw (1) ~cdw (uc) ;

[0296] Denote the offset coefficient of the conductor radius corresponding to the j-th C-type coefficient as bur (j) ;

[0297] Denote the proportionality coefficient corresponding to the j-th C-type coefficient as cdw (j) ; The value range of j is: 1 to uc;

[0298] Step S338: Compare the magnitudes of cdw (j) and td, and define relation 2-5 and relation 2-6;

[0299] cdw (j) ≥td, relation 2-5:

[0300]

[0301] cdw (j) <td, relation 2-6:

[0302]

[0303] Substitute ccd (1) ~ccd (uc) and cdw (1) ~cdw (uc) into relational expression 2-5 or relational expression 2-6, calculate the offset coefficient of the conductor radius of the 1st to uc-th C-type coefficients, and obtain: bur (1) ~bur (uc) ;

[0304] Step S339: Determine the positive or negative of bur (1) ~bur (uc) to determine the conductor radius;

[0305] Step S3391: The insulation layer thickness at the angle ana (OC) of the enameled wire (relative to line segment l (1) ) is relatively thin, and the thickness is: ccd (1) ;

[0306] If bur (1) is positive, the conductor at the angle ana (OC) of the enameled wire (relative to line segment l (1) ) is relatively thick, and the conductor radius is: (1 + bur (1) ) × r; where r represents the standard radius of the enameled wire radius;

[0307] If bur (1) is negative, the conductor at the angle ana (OC) of the enameled wire (relative to line segment l (1) ) is relatively thin, and the conductor radius is: (1 - |bur (1) |) × r; where r represents the standard radius of the enameled wire radius;

[0308] Step S3392: The insulation layer thickness at the angle ana (OC) of the enameled wire (relative to line segment l (2) ) is relatively thin, and the thickness is: ccd (2) ;

[0309] If bur (2) is positive, the conductor at the angle ana (OC) of the enameled wire (relative to line segment l (2) ) is relatively thick, and the conductor radius is: (1 + bur (2) ) × r; where r represents the standard radius of the enameled wire radius;

[0310] If bur (2) is negative, the conductor at the angle ana (OC)) The angle is ana (2) The conductor at (2) is thinner, and the conductor radius is: (1 - |bur

[0311] Step S3393: And so on, for the enameled wire (relative to the line segment l (OC) ) The angle is ana (uc) The insulation layer thickness at is thinner, and the thickness is: ccd (uc) ;

[0312] If bur (uc) is positive, then for the enameled wire (relative to the line segment l (OC) ) The angle is ana (uc) The conductor at is thicker, and the conductor radius is: (1 + bur (uc) ) × r; where r represents the standard radius of the enameled wire radius;

[0313] If bur (uc) is negative, then for the enameled wire (relative to the line segment l (OC) ) The angle is ana (uc) The conductor at is thinner, and the conductor radius is: (1 - |bur (uc) |) × r;

[0314] Step S34: Summarize the data in Steps S31 to S33 as an inspection report.

[0315] Step S4: Obtain the quantity of all enameled wires, measure the insulation layer thickness and conductor radius of each enameled wire, eliminate unqualified products, and obtain an inspection report.

[0316] The above formulas are all dimensionless and take their numerical values for calculation. The formulas are obtained by collecting a large amount of data for software simulation to get a formula closest to the actual situation. The preset parameters in the formulas are set by technicians in this field according to the actual situation. For example, there are weight coefficients and proportionality coefficients, and the sizes of their settings are for quantifying each parameter to obtain a specific numerical value for subsequent comparison. Regarding the sizes of the weight coefficients and proportionality coefficients, as long as they do not affect the proportional relationship between the parameters and the quantified numerical values.

[0317] Finally, it should be noted that the above-described embodiments are only specific embodiments of the present invention, which are used to illustrate the technical solutions of the present invention, rather than limiting it. The protection scope of the present invention is not limited thereto. Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that any person skilled in the art within the technical scope disclosed by the present invention can still modify the technical solutions described in the foregoing embodiments or can easily think of changes, or perform equivalent replacements on some of the technical features; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims described herein.

Claims

1. A method for measuring the insulation thickness and conductor of an enameled wire based on optical principles, characterized in that: The method comprises: Step S1: obtaining the standard thickness of the enameled wire insulation layer, the refractive index of the insulation material, the standard radius of the enameled wire conductor, the wavelength of the laser, and the distance from the interferometer light source to the screen as indicator data; Step S2: adjust the incident angle of the laser, calculate the optical path difference and the interference fringe width; construct an incident distance equation, and calculate the standard incident distance and standard optical path difference of the laser according to the index data to obtain the standard proportional coefficient; calculate the proportional coefficient of the laser at each incident angle based on the optical path difference, the interference fringe width and the incident distance equation; judge whether the enameled wire is qualified according to the standard proportional coefficient and the proportional coefficient; if qualified, skip step S3; if unqualified, analyze the proportional coefficient and measure the insulation thickness and conductor radius of the enameled wire; Step S3: Analyze the proportionality coefficient to determine whether the insulation thickness of the enameled wire is uniform; if it is uniform, record it as the insulation thickness according to the standard proportionality coefficient and end the step; if it is not uniform, calculate the insulation thickness and conductor radius of the enameled wire according to the incident distance equation to obtain an inspection report; Step S4: Obtain the number of all enameled wires, and measure the insulation thickness and conductor radius of each enameled wire, eliminate unqualified products, and update the inspection report.

2. The method for measuring insulation thickness and conductor of enameled wire based on optical principle according to claim 1, characterized in that: The specific steps of step S2 are as follows: Step S21: Set the geometric center of the enameled wire as the vertex, recorded as point O; set the right side of the vertex as the starting position, recorded as point C; Assume that the position where the laser enters the enameled wire is point A, the position where the laser contacts the conductor inside the enameled wire and is reflected is point E, and the position where the laser is refracted from the enameled wire is point B; Step S22: Based on the point preset in step S21, the magnitude of the incident angle ∠AOC of the enameled wire is recorded as α, and the magnitude of the refraction angle ∠EAO is recorded as β; The wavelength of the laser is denoted by λ (0) , let the refractive index of the insulating layer be n; satisfy: sin(α) / sin(β)=n; The wavelength of the laser when it propagates in the insulating layer is recorded as λ, and the calculation formula of λ is: λ=λ (0) / n; The incident angle α of the laser is adjusted from 1° to 360° in a counterclockwise direction, and the optical path difference between the incident angles of 1° and 360° is calculated and recorded as: (1) ~ix (360) ; Statistical interference fringe width for incident angles from 1° to 360°, denoted as: iw (1) ~iw (360) ; Step S23: the standard radius of the enameled wire conductor is recorded as r, and the standard thickness of the enameled wire insulation layer is recorded as td; The thickness of the insulating layer of the enameled wire is preset to d, and based on the data in steps S21 to S23, the laser refraction-reflection equations are constructed to obtain formula B (1) ~Formula B (7) ; Step S24: Combining the calculation formula in step S23 to construct an equation for the incident and exiting distance of the laser; Step S25: Using the standard thickness td of the insulation layer of the enameled wire as formula B (1) ~Formula B (7) d in the figure, calculate the standard incident and exit distances when the laser incident angle is 1o to 360o, recorded as: gd (1) ~gd (360) ; Let the distance from the interferometer light source to the screen be Ll, and define calculation formula 1-1: tad (i) =(λ×Ll) / ix (i) Among them, tad (i) It represents the distance of the laser beam when the incident angle is i°, ix (i) It indicates the optical path difference of the laser when the incident angle is i°; i indicates the angle, and the value range of i is: 1~360; ix (1) ~ix (360) Substituting into the calculation formula 1-1, calculate the laser's one-time incident distance when the incident angle is 1o to 360o, and get: tad (1) ~tad (360) .

3. The method for measuring insulation thickness and conductor of enameled wire based on optical principle according to claim 2, characterized in that: The subsequent steps of step S25 are as follows: Step S26: Define calculation formula 1-2: Among them, tbd (i) Indicates the secondary incident distance of the laser when the incident angle is i°, iw (i) It indicates the interference fringe width of the laser when the incident angle is i°; i indicates the angle, and the value range of i is: 1~360; IW (1) ~iw (360) Substituting into equation 1-2, calculate the secondary incident distance of the laser when the incident angle is 1° to 360°, and obtain: tbd (1) ~tbd (360) ; Define calculation formula 1-3: ttd (i) =(tad (i) +tbd (i) ) / 2; where ttd (i) It indicates the actual incident and exiting distance of the laser when the incident angle is i°; The tad (1) ~tad (360) and tbd (1) ~tbd (360) Substituting into equation 1-3, calculate the actual incident and exit distance of the laser when the incident angle is 1o to 360o, and get: ttd (1) ~ttd (360) ; Step S27: Define calculation formula 1-4: gw (i) =(λ×Ll) / gd (i) Among them, gd (i) Indicates the standard incident and exit distance of the laser when the incident angle is i°, gw (i) Indicates gd (i) Corresponding to the standard optical path difference; i represents the angle; GD (1) ~gd (360) Substituting into equation 1-4, calculate the standard optical path difference of the laser incident angle from 1o to 360o standard incident distance, and get gw (1) ~gw (360) ; Calculate the standard proportional coefficient of the incident distance and optical path difference of the enameled wire, recorded as gdw; the calculation formula of gdw is: Step S28: Define calculation formula 1-5: tdw (i) =ttd (i) / ix (i) ; Among them, ttd (i) Indicates the actual incident and exit distance of the laser when the incident angle is i°, ix (i) It represents the optical path difference of the laser when the incident angle is i°, tdw (i) It indicates the proportional coefficient between the incident distance and the optical path difference when the laser incident angle is i°; i indicates the angle, and the value range of i is: 1~360; ttd (1) ~ttd (360) and ix (1) ~ix (360) Substitute into formula 1-5 to calculate the proportional coefficient of the incident distance and the optical path difference when the laser incident angle is 1 to 360°, and we get: tdw (1) ~tdw (360) ; Step S29: Determine tdw (1) =tdw (2) =~=tdw (360) =Whether gdw is established; If so, it means that the enameled wire is qualified, the insulation thickness of the enameled wire is the standard thickness and the conductor radius is the standard radius, and step S3 is skipped; If not, it means that the enameled wire is unqualified, the proportional coefficient is analyzed, the non-compliant position is marked, and the process goes to step S3.

4. The method for measuring insulation thickness and conductor of enameled wire based on optical principle according to claim 2, characterized in that: The specific steps of step S23 are as follows: Step S231: The line segment from point O to point A is denoted as l (OA) , l (OA) The length of is (r+d); In triangle △OEA, let the angle ∠OEA be θ, the angle ∠EOA be μ; let the line segment from point O to point E be l (OE) , l (OE) The length of the line from point E to point A is r; let l (EA) ; In triangle △OEA, according to the sine theorem, we get the relationship a-1-1: Substitute ∠OEA, l (OA) , l (OA) And the data of ∠EAO, we get the relationship a-1-2: Based on the relationship a-1-2: the calculation formula for θ is obtained: The calculation formula of θ is used as formula B (1) ; Step S232: The line segment from point E to point A is recorded as l (EA) , will l (OA) The length of is denoted as l; In triangle △OEA, the law of sine gives relations a-1-3 and a-1-4; Relationship a-1-3: Relational expression a-1-4: ∠EOA=μ=π-β-θ; According to the relationship a-1-3 and a-1-4, the calculation formula of l is obtained: The calculation formula of l is used as formula B (2) ; Step S233: The line segment from point A to point B is recorded as l (AB) , make a straight line l (OE) To l (AB) The extension line of the direction intersects at l (AB) , the intersection point is recorded as point F; the line segment from point F to point A is recorded as l (FA) , will l (FA) The length of is denoted as h; In triangle △OBF, h is calculated as: h = sin(μ) × (r + d); use the calculation formula of h as formula B (3) ; The angle ∠EBF is denoted as δ. In the triangle △EBF, the calculation formula for δ is: δ = arccos(h / l); use the calculation formula of δ as formula B (4) .

5. The method for measuring insulation thickness and conductor of enameled wire based on optical principle according to claim 4, characterized in that: The subsequent steps of step S233 are as follows: Step S234: The line segment from point O to point C is recorded as l (OC) , do some B to l (OC) The perpendicular line of the direction, with the foot of the perpendicular being point G; (OC) Rotate 90° counterclockwise to get straight line l (OD) ; Let the line segment from point B to point G be l (BG) According to the angle transformation of the triangle, the angle ∠EBO is equal to the angle ∠EAO, both of which are β; Let the line segment from point B to point G be l (BG) , l (BG) Divide the angle ∠EBO into the angle ∠OBG and the angle ∠GBE; denote the size of the angle ∠OBG as β1, and the size of the angle ∠GBE as β2; According to the principle of parallel lines, the size of angle ∠DOB is equal to that of angle ∠OBG, both of which are β1; the calculation formula of β1 is: β1 = (π / 2) - α - (2 × μ); the calculation formula of β1 is used as formula B (5) ; Step S235: Make point B along l (OC) Direction, point A along l (OD) The extension line of the direction, the intersection point of the extension line is H; Let the angle ∠ABH be η, and the equations a-2-1 and a-2-2 can be obtained by angle transformation; Relational expression a-2-1: η=(π / 2)-δ-β2; Relationship a-2-1: β2 = β - β1; Combine equation a-2-1, equation a-2-2, and formula B (5) , and the calculation formula for η is obtained: η=π-δ-β-α-(2×μ); The calculation formula of η is used as formula B (6) ; Step S236: The line segment from point H to point A is recorded as l (HA) In the triangle △ABF, the laser's incident and exiting distance is l (HA) , will l (HA) The length of is denoted as il; Simultaneous formula B (1) ~Formula B (6) The calculation formula of il is: il = (2 × h) × sin (η); The calculation formula of il is used as formula B (7) , replace formula B (1) ~Formula B (7) As the laser refraction-reflection equation group, enter step S24.

6. The method for measuring insulation thickness and conductor of enameled wire based on optical principle according to claim 5, characterized in that: The workflow of step S24 is as follows: Step S241: Extract formula B (1) : Wherein, d represents the thickness of the preset enameled wire insulation layer; Relational expression a-1-4: μ=π-β-θ; Formula B (2) : Formula B (3) :h=sin(μ)×(r+d); Formula B (4) : δ = arccos (h / l); Formula B (6) : η = π - δ - β - α - (2 × μ); Step S242: Formula B (2) and Formula B (3) Substitute into formula B (4) In the formula C (1) : Formula B (1) Substituting into the relationship a-1-4, we get formula C (2) : According to the properties of inverse trigonometric functions, we get formula C (3) : Step S243: Formula C (2) and formula C (3) Substitute into formula B (6) In the formula C (4) : η=(π / 2)-α-μ; Extract formula B (7) :il=(2×h)×sin(η); Formula C (4) and Formula B (3) Substitute into formula B (7) In the formula C (5) : Formula C (2) Substitute into formula C (5) In the equation, the incident and exit distance equation of the laser is obtained: Wherein, α and β represent the angle of incidence and the angle of refraction respectively, and r represents the standard radius of the enameled wire conductor; d represents the preset thickness of the insulation layer of the enameled wire, that is, the independent variable; il is redefined as the incident distance of the laser, that is, the dependent variable.

7. The method for measuring insulation thickness and conductor of enameled wire based on optical principle according to claim 3, characterized in that: The specific steps of step S3 are as follows: Step S31: extract the standard proportional coefficient gdw, and extract the proportional coefficient of the incident distance and the optical path difference when the laser incident angle is 1o, 2o, or even 360o: tdw (1) 、tdw (2) ~tdw (360) ; Determine tdw (1) =tdw (2) =~=tdw (360) whether it is established; If it is established, it means that the conductor radius of the enameled wire is the standard radius, and the insulation layer thickness of the enameled wire is uniform. The insulation layer thickness of the enameled wire is calculated, and the process goes to step S32; If not, it means that the thickness of the insulation layer of the enameled wire is uneven, and the proportionality coefficient is analyzed twice to calculate the thickness of the insulation layer of the enameled wire, and then the process goes to step S33; Step S32: tdw (1) =tdw (2) =~=tdw (360) Established; calculate tdw (1) ~tdw (360) The average value is recorded as ddw, the uniform thickness of the enameled wire insulation layer is recorded as cod, and the value of cod is calculated; the wavelength λ of the laser is extracted (0) , the refractive index n of the insulating layer; Step S33: tdw (1) =tdw (2) =~=tdw (360) Not true; extract the incident distance equation and calculate the insulation thickness and conductor radius of the enameled wire; The equation for the incident and exiting distance is: Wherein, α and β represent the incident angle and the refraction angle respectively, and r represents the standard radius of the enameled wire conductor; the relationship between α and β satisfies: sin(α) / sin(β)=n; d represents the preset thickness of the insulation layer of the enameled wire, i.e., the independent variable; il is redefined as the incident distance of the laser, i.e., the dependent variable; Step S34: Summarize the data in steps S31 to S33 as an inspection report.

8. The method for measuring insulation thickness and conductor of enameled wire based on optical principle according to claim 7, characterized in that: The specific steps of step S32 are as follows: Step S321: Extracting the optical path difference ix when the laser incident angle is 1° to 360° (1) ~ix (360) ; Step S322: The interference order of the laser light when the incident angle is i° is recorded as mn (i) ; Among them, mn (i) is a positive integer; i represents the angle, and the value range of i is: 1~360; Define equation 2-1 and equation 2-2; Relation 2-1: ix (i) =(mn (i) +0.5)×(λ (0) / n); where ix (i) It represents the optical path difference of the laser when the incident angle is i°; Relation 2-2: ix (i) =mn (i) ×(λ (0) / n); ix (1) ~ix (360) Substituting the reverse into equation 2-1 or equation 2-2, calculate the interference order of the laser when the incident angle is 1° to 360°, and get: mn (1) ~mn (360) ; Step S323: Calculate mn (1) ~mn (360) The average value is recorded as amn; the calculation formula of cod is:

9. The method for measuring insulation thickness and conductor of enameled wire based on optical principle according to claim 7, characterized in that: The specific steps of step S33 are as follows: Step S331: extract the actual incident and exit distance of the laser when the incident angle is 1° to 360°: ttd (1) ~ttd (360) ; ttd (1) ~ttd (360) Substitute il into the incident distance equation in reverse to calculate the insulation thickness of the enameled wire when the incident angle is 1o to 360o, and we get: (1) ~ted (360) ; Step S332: extracting the standard thickness td of the insulation layer of the enameled wire; The thickness of the insulation layer of the enameled wire when the incident angle is i° is recorded as ted (i) ; Where i represents the angle, and the value range of i is: 1 to 360; Step S333: Compare ted (i) With the size of td, define equations 2-3 and 2-4; ted (i) ≥td, Relationship 2-3: Among them, tdw (i) It indicates the proportional coefficient between the incident distance and the optical path difference when the laser incident angle is i°; ted (i) <td, Relationship 2-4: Step S334: tdw (1) ~tdw (360) Substitute into equation 2-3 or equation 2-4, extract the proportional coefficient that satisfies equation 2-3 as the type A coefficient; extract the proportional coefficient that satisfies equation 2-4 as the type B coefficient; extract the proportional coefficient that does not satisfy equation 2-3 and equation 2-4 as the type C coefficient; The number of statistical type A coefficients is recorded as ua, the number of type B coefficients is recorded as ub, and the number of type C coefficients is recorded as uc; Step S335: The angles of the first to uath type A coefficients are recorded as ana (1) ~ana (ua) ; ana (1) ~ana (ua) The corresponding insulation thickness of the enameled wire is denoted as: aad (1) ~aad (ua) ; The enameled wire angle is ana (1) ~ana (ua) The conductor radius at is normal, and the insulation layer is thicker, with a thickness of: aad (1) ~aad (ua) ; Step S336: The angles of the first to ubth B-type coefficients are recorded as anb (1) ~anb (ub) ; will anb (1) ~anb (ub) The corresponding insulation thickness of the enameled wire is denoted as: bbd (1) ~bbd (ub) ; The angle of enameled wire is anb (1) ~anb (ub) The conductor radius at is normal, and the insulation layer thickness is thin, with a thickness of: bbd (1) ~bbd (ub) .

10. The method for measuring insulation thickness and conductor of enameled wire based on optical principle according to claim 9, characterized in that: The subsequent steps of step S336 are as follows: Step S337: The angles of the first to ucth C-type coefficients are recorded as anc (1) ~anc (uc) ; will anc (1) ~anc (uc) The corresponding insulation thickness of the enameled wire is denoted as: ccd (1) ~ccd (uc) ; will anc (1) ~anc (uc) The corresponding proportionality coefficient is denoted as cdw (1) ~cdw (uc) ; The offset coefficient of the conductor radius corresponding to the jth C-type coefficient is denoted as bur (j) ; The proportional coefficient corresponding to the j-th C-type coefficient is denoted as cdw (j) ; The value range of j is: 1~uc; Step S338: Compare cdw (j) With the size of td, define equations 2-5 and 2-6; cdw (j) ≥td, Relationship 2-5: cdw (j) <td, relation 2-6: CCD (1) ~ccd (uc) and cdw (1) ~cdw (uc) Substituting into equation 2-5 or equation 2-6, the offset coefficient of the conductor radius of the 1st to ucth C-type coefficients is calculated to obtain: bur (1) ~bur (uc) ; Step S339: Determine bur (1) ~bur (uc) The positive or negative value of determines the conductor radius; Step S3391: The enameled wire angle is ana (1) The thickness of the insulating layer at is relatively thin, and the thickness is: ccd (1) ; If bur (1) is positive, the enameled wire angle is ana (1) The conductor is thicker at the point where the conductor radius is: (1+bur (1) )×r; where r represents the standard radius of the enameled wire; If bur (1) If it is negative, the angle of the enameled wire is ana (1) The conductor at the point is thinner, and the conductor radius is: (1-|bur (1) |)×r; Step S3392: The enameled wire angle is ana (2) The thickness of the insulating layer at is relatively thin, and the thickness is: ccd (2) ; If bur (2) is positive, the enameled wire angle is ana (2) The conductor is thicker at the point where the conductor radius is: (1+bur (2) )×r; If bur (2) If it is negative, the angle of the enameled wire is ana (2) The conductor at the point is thinner, and the conductor radius is: (1-|bur (2) |)×r; Step S3393: Similarly, the angle of the enameled wire is ana (uc) The thickness of the insulating layer at is relatively thin, and the thickness is: ccd (uc) ; If bur (uc) is positive, the enameled wire angle is ana (uc) The conductor is thicker at the point where the conductor radius is: (1+bur (uc) )×r; If bur (uc) If it is negative, the angle of the enameled wire is ana (uc) The conductor at the point is thinner, and the conductor radius is: (1-|bur (uc) |)×r.

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