Optical thin film quality detection equipment and control method thereof

Abstract

The invention relates to the technical field of film quality detection, and discloses optical film quality detection equipment and a control method thereof. Optical thin film quality detection equipment comprises a winding roller mechanism which comprises a flattening roller assembly and a storage roller assembly, and the flattening roller assembly unfolds a thin film to the storage roller assembly and conveys the thin film; the detection mechanism is arranged between the flattening roller assembly and the storage roller assembly and comprises an overall detection module and a local detection module; overall detection and local detection are combined, the defect position of the thin film is obtained through overall detection, then the defect position area is locally detected, and the analysis process of local detection can be operated offline, so that the detection of the optical thin film focuses on a key area, offline fine analysis can be performed, and the detection accuracy can be ensured by equipment. The detection efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of thin film quality detection, and particularly to an optical thin film quality detection device and a control method thereof. Background Art

[0002] An optical thin film is a thin film material that regulates the behavior of light by precisely controlling the thickness and refractive index, and is widely used in the fields of optics, electronics, display, energy, etc. Optical thin films are an important part of modern optical technology, and their performance directly affects the efficiency and accuracy of optical systems. With the progress of technology, optical thin films have continuously broken through in materials, preparation technologies, and application fields, and will play an important role in more high-tech fields in the future.

[0003] The surface defect detection of optical thin films is a key link to ensure their optical performance, reliability, and application effects. Through detection, defect problems can be discovered and solved in a timely manner, product quality can be improved, production costs can be reduced, and the requirements of high-precision applications and industry standards can be met. Existing thin film detection technologies generally perform high-resolution image acquisition and real-time analysis on the entire thin film surface during the process of conveying the flattened thin film. However, this detection method requires a huge amount of data to be processed in real time, and the conveying speed of the thin film is slow, so the detection speed is also slow. In addition, only the overall image is analyzed and processed during the detection process, and details are easily missed. Summary of the Invention

[0004] The purpose of the present invention is to provide an optical thin film quality detection device and a control method thereof to solve the above technical problems:

[0005] The purpose of the present invention can be achieved by the following technical solutions:

[0006] An optical thin film quality detection device includes:

[0007] A roll mechanism, including a flattening roll assembly and a receiving roll assembly, and the flattening roll assembly unfolds and conveys the thin film to the receiving roll assembly;

[0008] A detection mechanism, arranged between the flattening roll assembly and the receiving roll assembly, includes an overall detection module and a local detection module; the overall detection module is used to collect and preliminarily analyze the overall image of the thin film, and mark the defect positions of the thin film according to the preliminary analysis results; the local detection module is used to collect the local images of the marked positions of the thin film, and identify and analyze the local images to judge the types of defects;

[0009] An operating table, used to support the roll mechanism and the detection mechanism;

[0010] A control module, used to adjust the conveying speed of the thin film according to the distribution of the marked positions of the thin film;

[0011] An interaction module for displaying the detection results of the film quality, where the detection result content includes the local image of the defect position and the corresponding defect type.

[0012] As a further technical solution, the flattening roller assembly includes:

[0013] A first bracket on which a first roller and a plurality of first guide rollers are installed;

[0014] A first motor installed on the first bracket for driving the first roller to rotate;

[0015] A first electric slide rail fixedly installed at the upper end of the operating table, on which a limit frame is slidably connected, and an upper clamping plate and a lower clamping plate are slidably connected within the limit frame.

[0016] As a further technical solution, a screw is rotatably connected to the upper end of the upper clamping plate, and the screw is threadedly connected to the upper end of the limit frame; an electric push rod is fixedly installed within the limit frame, and the telescopic end of the electric push rod is fixedly connected to the lower end of the lower clamping plate.

[0017] As a further technical solution, the storage roller assembly includes:

[0018] A second bracket fixedly installed at the upper end of the operating table, on which a second roller and a plurality of second guide rollers are installed;

[0019] A second motor fixedly installed on the second bracket for driving the second roller to rotate.

[0020] As a further technical solution, the overall detection module includes:

[0021] Two second electric slide rails, both of which are vertically installed at the upper end of the operating table and are respectively located on both sides of the unfolded film;

[0022] A movable beam, the two ends of which are respectively slidably connected to the two second electric slide rails, and a first camera for collecting the overall image of the film is installed on the movable beam;

[0023] A light bar arranged at the lower end of the unfolded film;

[0024] An analysis unit for preliminarily analyzing and positioning the defect position of the film according to the edge detection algorithm;

[0025] A marking unit for marking the defect position of the film and recording the defect position coordinates.

[0026] As a further technical solution, the local detection module includes:

[0027] Support column, the support column is fixedly installed at the upper end of the operating table, and a third electric slide rail is fixedly installed at the upper end of the support column;

[0028] Installation block, the installation block is slidably connected to the third slide rail, and a second camera is fixedly installed at the lower end of the installation block;

[0029] Surface light source, the surface light source is arranged at the upper end of the operating table and is located below the third electric slide rail.

[0030] A control method for an optical thin film quality detection device, comprising the following steps:

[0031] Step 1: Drive the first motor and the second motor to run synchronously, and establish a rectangular coordinate system with any point on the end edge of the thin film as the origin;

[0032] Step 2: Conduct a preliminary analysis on the overall image of the thin film collected by the first camera to obtain the coordinate of the thin film defect position;

[0033] Step 3: Determine the movement trajectory of the second camera along the third electric slide rail according to the thin film defect position coordinate and the thin film conveying speed;

[0034] Step 4: Calculate and analyze the coordinates of two adjacent thin film defect positions, and determine the thin film conveying speed adjustment strategy according to the calculation and analysis results.

[0035] As a further technical solution, the process of the preliminary analysis in Step 2 includes:

[0036] Use a filtering algorithm to remove noise in the overall image;

[0037] Enhance the image contrast through histogram equalization or contrast stretching, and convert the image into a binary image;

[0038] Detect the edges in the image through an edge detection algorithm to locate potential defects; mark the detected defect areas with rectangular frames, and use the center points of the rectangular frames as the thin film defect position coordinate points.

[0039] As a further technical solution, the process of calculating and analyzing the coordinates of two adjacent thin film defect positions includes:

[0040] The positive direction of the x-axis of the rectangular coordinate system is the opposite direction of the thin film transmission direction;

[0041] The coordinates of two adjacent thin film defect positions are successively x a , y a ), (x b , y b );

[0042] If x a ≠x b , then the required value K of the moving speed of the second camera is calculated through the formula , where V 0 is the conveying speed of the film;

[0043] Compare the required value K of the moving speed with the moving speed threshold K max of the second camera:

[0044] If K≤K max , then continue to convey the film at the speed V 0 ;

[0045] If K>K max , then during the process of the second camera collecting the local images corresponding to (x a , y a ), (x b , y b ), adjust the film conveying speed downwards, and convey the film at the speed value ;

[0046] As a further technical solution, the process of calculating and analyzing the coordinates of adjacent two film defect positions further includes:

[0047] If x a =x b , then during the process of the second camera collecting the local images corresponding to (x a , y a ), (x b , y b ), the film conveying is paused, and the pause duration is

[0048] Advantages of the present invention:

[0049] The present invention combines overall detection and local detection. The film defect positions are obtained through overall detection, and then the defect position areas are locally detected. The analysis process of local detection can be operated offline. Therefore, the detection of the optical film focuses on the key areas and can be finely analyzed offline. The device can improve the detection efficiency while ensuring the detection accuracy. In addition, by collecting the local images of the defects, the problem that details are easily missed in detection is also solved. Description of the drawings

[0050] The present invention will be further described below with reference to the drawings.

[0051] Figure 1 is a schematic three-dimensional structure diagram of the optical film quality detection device in the present invention;

[0052] Figure 2Schematic diagram of the three-dimensional structure of the optical thin film quality detection device in the present invention from another perspective;

[0053] Figure 3 is Figure 2 local structure diagram at position A in;

[0054] Figure 4 Front view of the optical thin film quality detection device in the present invention;

[0055] Figure 5 Top view of the optical thin film quality detection device in the present invention;

[0056] Figure 6 Flowchart of the control method for the optical thin film quality detection device in the present invention.

[0057] Description of the drawings: 1. Operating table; 2. Roller mechanism; 3. Detection mechanism; 4. Interaction module; 21. Flattening roller assembly; 22. Storage roller assembly; 31. Overall detection module; 32. Local detection module; 211. First bracket; 212. First roller; 213. First guide roller; 215. First electric slide rail; 216. Limit frame; 217. Upper clamping plate; 218. Lower clamping plate; 221. Second bracket; 222. Second roller; 223. Second guide roller; 311. Second electric slide rail; 312. First camera; 313. Light bar; 321. Support column; 322. Third electric slide rail; 323. Mounting block; 324. Surface light source. Detailed implementation manners

[0058] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without making creative efforts belong to the scope of protection of the present invention.

[0059] Please refer to Figure 1 , 2 shown, an optical thin film quality detection device includes:

[0060] The roller mechanism is mainly responsible for the unfolding, conveying and storage of the thin film. The roller mechanism specifically includes a flattening roller assembly 21 and a storage roller assembly 22. The flattening roller assembly 21 unfolds and conveys the thin film to the storage roller assembly 22. The function of the flattening roller assembly 21 is to ensure that the thin film remains flat during the conveying process, avoiding affecting the detection accuracy due to wrinkles or uneven tension. The storage roller assembly 22 is used to rewind the detected thin film for subsequent processing or storage.

[0061] The detection mechanism 3 is arranged between the flattening roller assembly 21 and the storage roller assembly 22, and includes an overall detection module 31 and a local detection module 32; the overall detection module 31 is used to collect and preliminarily analyze the overall image of the film, and mark the defect positions of the film according to the preliminary analysis results; the local detection module 32 is used to collect the local images of the marked positions of the film, and perform identification and analysis on the local images to judge the types of defects. This identification and analysis can be an offline analysis process without considering the impact of real-time performance on the detection results. In summary, the overall detection module 31 is responsible for globally scanning the film to identify potential defect areas; the local detection module 32 then performs high-precision detection on the marked defect areas to further analyze the type and severity of the defects. The overall detection module 31 usually adopts a high-resolution camera and a wide-angle lens, combined with image processing algorithms, to quickly scan the surface of the film and identify possible defect areas. The local detection module 32 is usually equipped with a high-magnification lens and a precision positioning system, and can perform high-precision imaging on the marked defect areas. Through image recognition algorithms, specifically, a convolutional neural network can be used to complete the image recognition and analysis, and the type and severity of the defects can be judged.

[0062] The operating table 1 is used to support the roll mechanism and the detection mechanism 3;

[0063] The control module is used to adjust the conveying speed of the film according to the distribution of the marked positions of the film. The control module can be equipped with a PLC or an industrial computer to realize the automatic operation of the equipment.

[0064] The interaction module 4 is used to display the detection results of the film quality. The content of the detection results includes the local images of the defect positions and the corresponding defect types. Through the interaction module 4, the operator can view the detection results of the film in real time, including the positions, types and severities of the defects. In addition, the interaction module 4 can also store the detection results in the database for subsequent analysis and quality traceability.

[0065] Through the above technical solutions, this embodiment provides an optical film quality detection device. Specifically, this embodiment combines the overall detection and local detection of the optical film. The defect positions of the film are obtained through the overall detection. Although this process has real-time requirements, the amount of data processed is small. Then, the defect position areas are locally detected, and the analysis process of the local detection can be operated offline. Therefore, the detection process focuses on the key areas and can be finely analyzed offline, enabling the device to improve the detection efficiency while ensuring the detection accuracy. In addition, by collecting the local images of the defects, the problem of easy omission of details in the detection is also solved. The real-time display and data storage functions of the interaction module 4 provide strong support for quality management and process optimization.

[0066] Please refer to Figure 3 、 4As shown, the flattening roller assembly 21 includes:

[0067] A first bracket 211, on which a first roller 212 and a plurality of first guide rollers 213 are installed;

[0068] A first motor, which is installed on the first bracket 211 and is used to drive the first roller 212 to rotate;

[0069] A first electric slide rail 215 is fixedly installed at the upper end of the operation table 1. A limit frame 216 is slidably connected to the first electric slide rail 215. An upper clamping plate 217 and a lower clamping plate 218 are slidably connected within the limit frame 216.

[0070] Through the above technical solution, this embodiment provides the specific structural content of the flattening roller assembly 21. The upper clamping plate 217 and the lower clamping plate 218 clamp the end of the film. As the first roller 212 rotates, the limit frame 216 slides on the first slide rail towards the storage roller assembly 22. This process can realize the detection of the film at the starting section of the film transportation.

[0071] Please refer to Figure 3 As shown, a screw is rotatably connected to the upper end of the upper clamping plate 217. The screw is threadedly connected to the upper end of the limit frame 216. By rotating the screw, the height of the upper clamping plate 217 can be adjusted, thereby adjusting the final clamping height. An electric push rod is fixedly installed within the limit frame 216. The telescopic end of the electric push rod is fixedly connected to the lower end of the lower clamping plate 218. The lower clamping plate 218 is driven by the electric push rod to move upward within the limit frame 216 to cooperate with the upper clamping plate 217 to complete the clamping action of the film.

[0072] Through the above technical solution, this embodiment provides the driving method of the clamping action of the upper clamping plate 217 and the lower clamping plate 218, as well as the adjustment method of the clamping height.

[0073] Please refer to Figure 4 As shown, the storage roller assembly 22 includes:

[0074] A second bracket 221 is fixedly installed at the upper end of the operation table 1. A second roller 222 and a plurality of second guide rollers 223 are installed on the second bracket 221. The second motor is fixedly installed on the second bracket 221 and is used to drive the second roller 222 to rotate. The second roller 222 is used to wind the detected film. The second motor drives the second roller 222 to rotate, and winds the film that has passed the detection from the detection mechanism 3 onto the second roller 222. The second guide rollers 223 ensure that the film remains flat during the winding process, avoiding wrinkles or deviation. The control module dynamically adjusts the rotation speed of the second motor according to the transportation speed and tension of the film to ensure a smooth winding process.

[0075] Through the above technical solution, this embodiment provides the specific content of the storage roller assembly 22.

[0076] Please refer to Figure 4 , 5 as shown, the overall detection module 31 includes:

[0077] Two second electric slide rails 311 are provided, and both of the two second electric slide rails 311 are vertically installed at the upper end of the operating table 1 and are respectively located on both sides of the unfolded film; both ends of the movable beam are respectively slidably connected to the two second electric slide rails 311, and a first camera 312 for collecting the overall image of the film is installed on the movable beam. The movable beam can be made of lightweight and high-strength materials such as carbon fiber or aluminum alloy to reduce the movement inertia and improve the response speed. The beam body design also needs to consider rigidity and stability to avoid affecting the image acquisition quality due to vibration or deformation. The main function of the second electric slide rail 311 is to support the movable beam and guide its movement in the vertical direction, so that the first camera 312 can cover the entire width of the film and collect high-quality overall images.

[0078] A light bar 313 is provided at the lower end of the unfolded film. The light bar 313 is used to provide uniform illumination to ensure that the first camera 312 can collect clear images. Specifically, an LED light source can be used.

[0079] An analysis unit is used to preliminarily analyze and locate the defect position of the film according to the edge detection algorithm. The image processing algorithms (such as Canny edge detection, Sobel operator, etc.) adopted by the analysis unit can identify the edges and abnormal areas in the film image. By comparing with the standard image, the analysis unit can quickly locate the potential defect areas.

[0080] A marking unit is used to mark the defect position of the film and record the defect position coordinates. The marking process does not need to contact the film, and the marking process can just record the defect position coordinates.

[0081] Through the above technical solution, this embodiment provides the composition and functions of the overall detection module 31.

[0082] Please refer to Figure 4 , 5 as shown, the local detection module 32 includes:

[0083] Support columns 321 are fixedly installed at the upper end of the operating table 1, and a third electric slide rail 322 is fixedly installed at the upper end of the support columns 321;

[0084] The mounting block 323 is slidably connected to the third slide rail, and a second camera is fixedly installed at the lower end of the mounting block 323. After determining the coordinates of the defect marking area, the second camera slides on the ground slide rail along with the mounting block 323. When the marking area moves below the third slide rail, the camera can move to the corresponding position to collect a partial image of the marking area. Through offline analysis, the partial image is imported into the trained convolutional neural network, and the output result indicates the defect type of the marking area.

[0085] The surface light source 324, usually an LED light source, has the characteristics of high brightness, low power consumption and long life. The color temperature and brightness of the LED light source are adjustable to meet the detection requirements of different materials of the thin film. The surface light source 324 is arranged at the upper end of the operating table 1 and is located below the third electric slide rail 322.

[0086] Through the above technical solution, this embodiment provides the composition and corresponding functions of the local detection module 32.

[0087] Please refer to Figure 6 As shown in the figure, a control method for an optical thin film quality detection device includes the following steps:

[0088] Step 1: Drive the first motor and the second motor to run synchronously: The first motor drives the first roller 212, and the second motor drives the second roller 222. The two need to run synchronously to ensure uniform tension of the thin film during transportation, avoid stretching or wrinkling of the thin film, and establish a rectangular coordinate system with any point on the end edge of the thin film as the origin. For example, the x-axis is the transportation direction of the thin film, and the y-axis is the width direction of the thin film.

[0089] Step 2: Perform a preliminary analysis on the overall image of the thin film collected by the first camera 312 to obtain the coordinates of the thin film defect positions. The analysis unit processes the overall image using edge detection algorithms (such as Canny edge detection, Sobel operator, etc.) to identify the defect areas on the surface of the thin film. By comparing with the standard image, the analysis unit extracts the defect features and calculates the coordinates of the defects in the rectangular coordinate system.

[0090] Step 3: Determine the movement trajectory of the second camera along the third electric slide rail 322 according to the coordinates of the thin film defect positions and the transportation speed of the thin film; the control module receives the defect position coordinates transmitted by the analysis unit and calculates the movement trajectory of the second camera in combination with the current transportation speed of the thin film. For example, if the defect is located at the coordinates (x 1 , y 1 ), the second camera needs to be on the straight line x = x 1 When it is directly below the third electric slide rail 322, move to the y 1 position for local image acquisition.

[0091] Step 4: Calculate and analyze the position coordinates of adjacent two film defects, and establish the film conveying speed adjustment strategy according to the calculation and analysis results.

[0092] Through the above technical solutions, the present embodiment provides a control method for an optical film quality detection device. By real-time monitoring of the defect distribution information, the control module can flexibly adjust the detection strategy to ensure the stable operation of the device under different working conditions, providing strong technical support for the quality control of optical films.

[0093] The process of preliminary analysis in Step 2 includes:

[0094] Use a filtering algorithm to remove the noise in the overall image. For example, for the overall image of the film collected, use Gaussian filtering (kernel size is 5x5) to remove the noise, and retain the main textures and defect features on the film surface;

[0095] Enhance the image contrast through histogram equalization or contrast stretching, and convert the image into a binary image; perform histogram equalization processing on the filtered image to make the contrast between the defect area and the background area on the film surface more obvious. Perform threshold segmentation (threshold is 128) on the image with enhanced contrast to convert the defect area on the film surface into white and the background area into black

[0096] Detect the edges in the image through an edge detection algorithm to locate potential defects; mark the detected defect areas with rectangular frames, and use the center points of the rectangular frames as the position coordinate points of the film defects. Through the above technical solutions, the present embodiment provides the process of preliminary analysis.

[0097] The process of calculating and analyzing the position coordinates of adjacent two film defects includes:

[0098] In the rectangular coordinate system, the reverse direction of the film transmission direction is the positive direction of the x-axis;

[0099] The position coordinates of adjacent two film defects are successively x a , y a ), (x b , y b );

[0100] If x a ≠x b , then calculate and obtain the motion speed requirement value K of the second camera through the formula , where V 0 is the conveying speed of the film;

[0101] Compare the motion speed requirement value K with the motion speed threshold K max of the second camera:

[0102] If K ≤ Kmax , then continue to convey the film at a speed V 0 ;

[0103] If K > K max , then during the process of the second camera collecting the local images corresponding to (x a , y a ), (x b , y b ), adjust the film conveyance speed downwards, and convey the film at a speed value .

[0104] The process of calculating and analyzing the coordinates of the positions of two adjacent film defects further includes:

[0105] If x a = x b , then during the process of the second camera collecting the local images corresponding to (x a , y a ), (x b , y b ), the film conveyance is paused, and the pause duration is

[0106] Through the above technical solution, this embodiment provides a process for calculating and analyzing the coordinates of the positions of two adjacent film defects. Specifically, first, in the rectangular coordinate system, the positive direction of the x-axis is the opposite direction of the film transmission direction. The coordinates of the positions of two adjacent film defects are successively (x a , y a ), (x b , y b ) in the order of being marked; if x a = x b , it indicates that the two adjacent defects are collinear in the film width direction. Therefore, during the process of the second camera collecting the local images of x a , y a ), (x b , y b ), the film conveyance needs to be paused, and the pause duration is to ensure that the second camera can collect the local images of the two defect areas. If x a ≠ x b , then calculate the required motion speed value K of the second camera through the formula , where V 0 is the conveyance speed of the film. Compare the required motion speed value K with the motion speed threshold K max of the second camera: if K ≤ K max , then continue to convey the film at a speed V 0 ; if K > K max , then during the process of the second camera collecting (xa , y a ), (x b , y b ), during the process of corresponding to the partial image, the film conveyance speed is adjusted to decrease, and the film is conveyed at the speed value Convey the film. It should be noted that the motion speed threshold K max is empirical data obtained by taking into account time errors such as data transmission and analysis, and is not the maximum speed of the second camera's movement. Therefore, the film is conveyed at the speed value Convey the film. The second camera can then capture the partial images of the two defect areas.

[0107] The above has described an embodiment of the present invention in detail, but the content described is only a preferred embodiment of the present invention and cannot be considered as defining the scope of implementation of the present invention. All equivalent changes and improvements made according to the scope of the present invention application should still fall within the scope covered by the patent of the present invention.

Claims

1. An optical film quality inspection device, characterized in that: include: The winding roller mechanism comprises a flattening roller assembly (21) and a receiving roller assembly (22), wherein the flattening roller assembly (21) unfolds and conveys the film toward the receiving roller assembly (22); The detection mechanism (3) is arranged between the flattening roller assembly (21) and the storage roller assembly (22), and comprises an overall detection module (31) and a local detection module (32); the overall detection module (31) is used to collect and preliminarily analyze the overall image of the film, and mark the defect position of the film according to the preliminary analysis result; the local detection module (32) is used to collect the local image of the marked position of the film, and identify and analyze the local image to determine the type of defect; An operating table (1) for supporting a rolling mechanism and a detection mechanism (3); A control module, used for adjusting the conveying speed of the film according to the distribution of the marked positions of the film; The interactive module (4) is used to display the test results of the film quality, and the test results include a local image of the defect position and the corresponding defect type.

2. The optical film quality inspection device according to claim 1, characterized in that: The flattening roller assembly (21) comprises: A first bracket (211), wherein a first winding roller (212) and a plurality of first guide rollers (213) are mounted on the first bracket (211); a first motor, the first motor being mounted on the first bracket (211) and being used for driving the first roller (212) to rotate; The first electric slide rail (215) is fixedly mounted on the upper end of the operating table (1); a limit frame (216) is slidably connected to the first electric slide rail (215); an upper clamping plate (217) and a lower clamping plate (218) are slidably connected inside the limit frame (216).

3. The optical film quality inspection device according to claim 2, characterized in that: The upper end of the upper clamping plate (217) is rotatably connected to a screw, and the screw is threadedly connected to the upper end of the limit frame (216); an electric push rod is fixedly installed in the limit frame (216), and the telescopic end of the electric push rod is fixedly connected to the lower end of the lower clamping plate (218).

4. The optical film quality inspection device according to claim 3, characterized in that: The receiving roller assembly (22) comprises: A second bracket (221) is fixedly mounted on the upper end of the operating table (1), and a second winding roller (222) and a plurality of second guide rollers (223) are mounted on the second bracket (221); A second motor, the second motor is fixedly mounted on the second bracket (221) and is used for driving the second roller (222) to rotate.

5. The optical film quality inspection device according to claim 4, characterized in that: The overall detection module (31) comprises: Two second electric slide rails (311) are provided, and the two second electric slide rails (311) are both vertically mounted on the upper end of the operating table (1) and are respectively located on both sides of the unfolded film; A movable beam, the two ends of which are respectively slidably connected to the two second electric slide rails (311), and a first camera (312) for collecting an overall image of the film is installed on the movable beam; A light bar (313), wherein the light bar (313) is arranged at the lower end of the unfolded film; An analysis unit, used for preliminarily analyzing and locating defect positions of the film according to an edge detection algorithm; The marking unit is used to mark the defect position of the film and record the coordinates of the defect position.

6. The optical film quality inspection device according to claim 5, characterized in that: The local detection module (32) comprises: A support column (321), the support column (321) is fixedly mounted on the upper end of the operating table (1), and a third electric slide rail (322) is fixedly mounted on the upper end of the support column (321); A mounting block (323), the mounting block (323) being slidably connected to the third slide rail, and a second camera being fixedly mounted on the lower end of the mounting block (323); A surface light source (324), the surface light source (324) being arranged at the upper end of the operating table (1) and located below the third electric slide rail (322).

7. A control method for optical film quality detection equipment, characterized in that: The control method is applied to the optical film quality detection device according to any one of claims 1 to 6, and the control method comprises the following steps: Step 1: drive the first motor and the second motor to operate synchronously, and establish a rectangular coordinate system with any point on the end edge of the film as the origin; Step 2: Perform a preliminary analysis on the overall image of the film captured by the first camera (312) to obtain the coordinates of the film defect position; Step 3: establishing a motion trajectory of the second camera along the third electric slide rail (322) according to the film defect position coordinates and the film conveying speed; Step 4: Calculate and analyze the coordinates of the positions of two adjacent film defects, and establish a film conveying speed adjustment strategy based on the calculation and analysis results.

8. The control method of an optical film quality detection device according to claim 7, characterized in that: The preliminary analysis process in step 2 includes: Use filtering algorithms to remove noise from the overall image; Enhance the image contrast by histogram equalization or contrast stretching, and convert the image into a binary image; The edge detection algorithm is used to detect the edges in the image and locate potential defects; the detected defect area is marked with a rectangular frame, and the center point of the rectangular frame is the coordinate point of the film defect position.

9. The control method of an optical film quality detection device according to claim 8, characterized in that: The process of calculating and analyzing the coordinates of two adjacent film defect positions includes: The rectangular coordinate system takes the opposite direction of the film's transport direction as the positive direction of the x-axis; The coordinates of the positions of two adjacent film defects are x in the order in which they are marked. a ,y a )、(x b ,y b ); If x a ≠x b , then by the formula Calculate and obtain the motion speed requirement value K of the second camera, where V0 is the conveying speed of the film; The motion speed requirement value K and the motion speed threshold value K of the second camera are max For comparison: If K≤K max , the film continues to be transported at speed V0; If K>K max , then the second camera collects (x a ,y a )、(x b ,y b ) In the process of corresponding local images, the film conveying is slowed down and the speed value is adjusted. Conveying film.

10. The control method of an optical film quality inspection device according to claim 9, characterized in that: The process of calculating and analyzing the coordinates of two adjacent film defect positions also includes: If x a =x b , then the second camera collects (x a ,y a )、(x b ,y b ) corresponds to the local image, the film conveying is suspended for a period of

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