Derating test method and related device

Abstract

The invention discloses a derating test method and a related device. The method comprises the following steps: acquiring an input parameter; the input parameters comprise precondition parameters, derating condition parameters and a derating formula; determining N groups of expected power sets according to the precondition parameters, the derating condition parameters and a derating formula, wherein N is an integer greater than or equal to 1; generating N test cases according to the input parameters and the N groups of expected power sets; and executing the N test cases to generate a test result. The test effect of the derating test of the energy conversion device can be improved.

Description

Technical Field

[0001] This application relates to the field of testing technologies, and particularly to a derating test method and related devices. Background Art

[0002] Before energy conversion devices, such as on-board chargers (OBCs), direct current / direct current converters (DC / DC converters), etc., leave the factory, corresponding tests will be carried out on them. Among them, the derating test is an important test. At present, the derating test for energy conversion devices still remains in the manual test stage. During manual testing, it is affected by the technical level of the test personnel and the execution environment, resulting in poor test effects. Summary of the Invention

[0003] Embodiments of this application provide a derating test method and related devices, which can improve the test effect of the derating test for energy conversion devices.

[0004] The first aspect of the embodiments of this application provides a derating test method, including:

[0005] Obtain input parameters; the input parameters include precondition parameters, derating condition parameters, and derating formulas;

[0006] Determine N sets of expected power sets according to the precondition parameters, the derating condition parameters, and the derating formulas, where N is an integer greater than or equal to 1;

[0007] Generate N test cases according to the input parameters and the N sets of expected power sets;

[0008] Execute the N test cases to generate test results.

[0009] Optionally, the derating condition parameters include M temperature parameters, and the derating formulas include M temperature derating formulas. The M temperature parameters and the M temperature derating formulas are in one-to-one correspondence, where M is an integer greater than or equal to 1.

[0010] Optionally, when M is equal to 1, N is equal to 1, and the N test cases are single-point test cases;

[0011] When M is equal to 2, N is an integer greater than or equal to 2, and the N test cases include at least one of single-point test cases and multi-point test cases.

[0012] Optionally, the determining N sets of expected power sets according to the precondition parameters, the derating condition parameters, and the derating formulas includes:

[0013] When M equals 1, a set of expected power sets is determined according to a temperature parameter and a corresponding temperature derating formula, and the set of expected power sets is used to generate a single-point test case;

[0014] When M is greater than or equal to 2, M sets of first expected power sets and P sets of second expected power sets are determined according to the M temperature parameters and the M temperature derating formulas. The M sets of first expected power sets are used to generate M single-point test cases, and the P sets of second expected power sets are used to generate P multi-point test cases, where N = M + P and P is an integer greater than or equal to 1.

[0015] Optionally, determining M sets of first expected power sets and P sets of second expected power sets according to the M temperature parameters and the M temperature derating formulas includes:

[0016] Determining M sets of first expected power sets according to the M temperature parameters and the corresponding M temperature derating formulas;

[0017] Combining the M temperature parameters to obtain P combinations of temperature parameters, and determining P sets of second expected power sets according to the P combinations of temperature parameters and the corresponding P combinations of temperature derating formulas.

[0018] Optionally, determining P sets of second expected power sets according to the P combinations of temperature parameters and the corresponding P combinations of temperature derating formulas includes:

[0019] Determining at least two sets of second expected power sets according to a first combination of temperature parameters and a corresponding first combination of temperature derating formulas, and determining a set of the lowest power in the at least two sets of second expected power sets as a first set of second expected power sets; the first combination of temperature parameters is any one of the P combinations of temperature parameters, the first combination of temperature derating formulas is a combination of temperature derating formulas corresponding to the first combination of temperature parameters among the P combinations of temperature derating formulas, and the first set of second expected power sets is the second expected power set corresponding to the first combination of temperature parameters among the P sets of second expected power sets.

[0020] Optionally, the derating condition parameters include at least one of water channel temperature, radiator temperature, and ambient temperature.

[0021] Optionally, the precondition parameters include at least one of the input voltage of the energy conversion device, the input current of the energy conversion device, the output voltage of the energy conversion device, and the output current of the energy conversion device.

[0022] A second aspect of the embodiments of the present application provides a derating test device, including:

[0023] An acquisition unit for acquiring input parameters; the input parameters include precondition parameters, derating condition parameters, and a derating formula;

[0024] A determination unit for determining N sets of expected power sets according to the precondition parameters, the derating condition parameters, and the derating formula, where N is an integer greater than or equal to 1;

[0025] A generation unit for generating N test cases according to the input parameters and the N sets of expected power sets;

[0026] A test unit for executing the N test cases and generating test results.

[0027] A third aspect of the embodiments of the present application provides an electronic device, including a processor and a memory, where the memory is used to store a computer program, the computer program includes program instructions, and the processor is configured to call the program instructions to execute the step instructions in the first aspect of the embodiments of the present application.

[0028] A fourth aspect of the embodiments of the present application provides a computer-readable storage medium, where the computer-readable storage medium stores a computer program for electronic data exchange, the computer program includes program instructions, and when the program instructions are executed by a processor, the processor is caused to execute the step instructions in the first aspect of the embodiments of the present application.

[0029] A fifth aspect of the embodiments of the present application provides a computer program product, where the computer program product includes a computer program, the computer program includes program instructions, and when the program instructions are executed by a processor, the processor is caused to execute the step instructions in the first aspect of the embodiments of the present application.

[0030] In the embodiments of the present application, the derating test method is used to perform a derating test on an energy conversion device. During the derating test, N test cases can be generated according to the input parameters and N sets of expected power sets. Compared with test personnel manually writing test cases, only the input parameters are required to automatically generate test cases, which can quickly generate test cases and improve test efficiency. The input parameters include precondition parameters, derating condition parameters, and a derating formula, which fully consider the parameters required for testing, can improve the test coverage, improve the test quality, and thus improve the test effect of the derating test of the energy conversion device. Description of the Drawings

[0031] To more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the accompanying drawings required for the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only some embodiments of the present application. For those skilled in the art, without creative efforts, other accompanying drawings can be obtained based on these drawings.

[0032] Figure 1 It is a schematic flowchart of a derating test method provided by an embodiment of the present application;

[0033] Figure 2 It is a schematic diagram of a derating test case based on the water channel temperature provided by an embodiment of the present application;

[0034] Figure 3 It is a schematic diagram of a derating test case based on the water channel temperature and the radiator temperature provided by an embodiment of the present application;

[0035] Figure 4 It is a schematic structural diagram of a derating test device provided by an embodiment of the present application;

[0036] Figure 5 It is a schematic structural diagram of an electronic device provided by an embodiment of the present application. Detailed implementation manners

[0037] The following will clearly and completely describe the technical solutions in the embodiments of the present application in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only some embodiments of the present application, rather than all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative efforts fall within the scope of protection of the present application.

[0038] The terms "first", "second", etc. in the specification, claims and above-mentioned accompanying drawings of the present application are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally further includes steps or units not listed, or optionally further includes other steps or units inherent to these processes, products or devices.

[0039] References to "embodiments" in this application mean that the specific features, structures, or characteristics described in connection with the embodiments can be included in at least one embodiment of this application. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment each time, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described in this application can be combined with other embodiments.

[0040] Currently, the derating test for energy conversion devices still remains in the manual test stage. During manual testing, it is affected by the technical level of the test personnel and the execution environment, resulting in poor test effects. For example, when manually writing test cases for test points, the written cases may not be comprehensive enough, leading to low test coverage and degraded quality.

[0041] Based on this, the embodiments of this application provide a derating test method and related device, which can improve the test effect of the derating test for energy conversion devices.

[0042] Please refer to Figure 1 , Figure 1 which is a schematic flowchart of a derating test method provided by the embodiments of this application. As Figure 1 shown, the method may include the following steps.

[0043] 101. The electronic device obtains input parameters; the input parameters include precondition parameters, derating condition parameters, and derating formulas.

[0044] The derating test method of the embodiments of this application is for the derating test of energy conversion devices, and the energy conversion device may include one of a direct current / direct current converter (DC / DC), a direct current / alternating current converter (DC / AC), and an alternating current / direct current converter (AC / DC). Exemplarily, the AC / DC converter may include an on-board charger (OBC).

[0045] The precondition parameters are the working parameters of the energy conversion device during the derating test.

[0046] Optionally, the precondition parameters include at least one of the input voltage of the energy conversion device, the input current of the energy conversion device, the output voltage of the energy conversion device, the output current of the energy conversion device, the output power of the energy conversion device, and the efficiency of the energy conversion device.

[0047] Exemplarily, for a DC / DC converter, the precondition parameters include the input voltage of the DC / DC converter and the output power of the energy conversion device. For example, the precondition parameters include that the input voltage of the DC / DC converter is 360V and the output power of the energy conversion device is the rated power (i.e., the energy conversion device is in a full-load working state).

[0048] The derating condition parameters are the parameters for derating test when the energy conversion device is in the precondition parameters.

[0049] Optionally, the derating condition parameters may include at least one of the water channel temperature, the radiator temperature, and the ambient temperature.

[0050] The water channel temperature is the temperature of the water channel of the energy conversion device. The radiator temperature is the temperature of the radiator of the energy conversion device. The ambient temperature is the air temperature of the environment where the energy conversion device is located.

[0051] The magnitude of the derating condition parameters will affect the derating amplitude of the energy conversion device. Exemplarily, taking the water channel temperature as an example, after the water channel temperature exceeds 60 degrees Celsius (°C), the output power of the energy conversion device will be limited. Generally, during the derating test, as the temperature increases, the output power of the energy conversion device will gradually decrease. The embodiments of the present application can measure the difference between the actual output power and the expected output power of the energy conversion device, so as to obtain the measurement result of the derating test.

[0052] 102. The electronic device determines N sets of expected power sets according to the precondition parameters, the derating condition parameters, and the derating formula, where N is an integer greater than or equal to 1.

[0053] In the embodiments of the present application, N is positively correlated with the number of parameters M included in the derating condition parameters. N is the sum of one or more combinations of M parameters, and N = 2 M - 1. When the number of parameters M included in the derating condition parameters is 1, N = 1; when the number of parameters M included in the derating condition parameters is 2, N = 3; when the number of parameters M included in the derating condition parameters is 3, N = 7.

[0054] A set of expected power sets is a set composed of the test ranges of one or a set of derating condition parameters. For example, if the derating condition parameter includes one parameter (e.g., water channel temperature) and the range of the water channel temperature is -40 to 108 °C, then this set of expected power sets includes: the expected power corresponding to a water channel temperature of -40 °C, the expected power corresponding to a water channel temperature of -39 °C, the expected power corresponding to a water channel temperature of -38 °C,... the expected power corresponding to a water channel temperature of 108 °C. Another example, if the derating condition parameter includes two parameters (e.g., water channel temperature and radiator temperature), the range of the water channel temperature is -40 to 108 °C, and the range of the radiator temperature is -40 to 134 °C, then this set of expected power sets includes: the expected power corresponding to a water channel temperature of -40 °C and a radiator temperature of -40 °C, the expected power corresponding to a water channel temperature of -39 °C and a radiator temperature of -35 °C,... the expected power corresponding to a water channel temperature of 108 °C and a radiator temperature of 95 °C.

[0055] The derating formula is a formula used to calculate the expected power, and the derating formula can be preset. The derating formula can be determined according to the performance of the energy conversion device. Exemplarily, a hardware engineer can conduct high-temperature tests and low-temperature tests on the energy conversion device to obtain the curve of the power of the energy conversion device changing with temperature. The fitting formula obtained from this test curve is the derating formula. When the precondition parameters are determined, the performance parameters of the energy conversion device are all determined. Under different precondition parameters, the range of the output voltage of the energy conversion device is different, and the performance parameters of the energy conversion device also change.

[0056] 103. The electronic device generates N test cases according to the input parameters and N sets of expected power sets.

[0057] In the embodiments of the present application, each set of expected power can generate one test case.

[0058] Optionally, the derating condition parameter includes M temperature parameters, the derating formula includes M temperature derating formulas, and the M temperature parameters correspond one-to-one with the M temperature derating formulas, where M is an integer greater than or equal to 1.

[0059] In the embodiments of the present application, the derating condition parameter can include one or more temperature parameters. The derating formula can include one or more temperature derating formulas. Each temperature parameter can correspond to one temperature derating formula.

[0060] Optionally, when M is equal to 1, N is equal to 1, and the N test cases are single-point test cases;

[0061] When M is equal to 2, N is an integer greater than or equal to 2, and the N test cases include at least one of single-point test cases and multi-point test cases.

[0062] In the embodiments of the present application, a single-point test case is a test case generated when the derating condition parameter includes one temperature parameter. A multi-point test case is a test case generated when the derating condition parameter includes two or more temperature parameters.

[0063] Optionally, in step 102, the electronic device determines N sets of expected power sets according to the precondition parameters, the derating condition parameters, and the derating formula, which may specifically include the following steps:

[0064] (11) When M is equal to 1, the electronic device determines a set of expected power sets according to one temperature parameter and a corresponding temperature derating formula, and the set of expected power sets is used to generate a single-point test case;

[0065] (12) When M is greater than or equal to 2, the electronic device determines M sets of first expected power sets and P sets of second expected power sets according to the M temperature parameters and the M temperature derating formulas. The M sets of first expected power sets are used to generate M single-point test cases, and the P sets of second expected power sets are used to generate P multi-point test cases, where N = M + P, and P is an integer greater than or equal to 1.

[0066] In the embodiments of the present application, the first expected power set is an expected power set for generating a single-point test case, and the second expected power set is an expected power set for generating a multi-point test case. When M is equal to 1, one single-point test case is generated. When M is greater than or equal to 2, M single-point test cases and P multi-point test cases are generated.

[0067] Exemplarily, when M = 1, 1 test case (single-point test case) is generated. When M = 2, 3 test cases (2 single-point test cases and 1 multi-point test case) are generated. When M = 3, 7 test cases (3 single-point test cases and 4 multi-point test cases) are generated.

[0068] In the embodiments of the present application, the number of temperature parameters included in the derating condition parameter will determine the number and types of generated test cases. Single-point test cases and multi-point test cases can be automatically generated according to the M temperature parameters included in the derating condition parameter, improving the test effect under multiple temperature parameters.

[0069] Optionally, in step (12), the electronic device determines M sets of first expected power sets and P sets of second expected power sets according to the M temperature parameters and the M temperature derating formulas, which may specifically include the following steps:

[0070] (121) The electronic device determines M sets of first expected power sets according to the M temperature parameters and the corresponding M temperature derating formulas;

[0071] (122) The electronic device combines the M temperature parameters to obtain P temperature parameter combinations, and determines P sets of second expected power sets according to the P temperature parameter combinations and the corresponding P temperature derating formula combinations.

[0072] In the embodiment of the present application, M sets of first expected power sets are determined according to the M temperature parameters and the corresponding M temperature derating formulas. Among them, each temperature parameter corresponds to a temperature derating formula, corresponding to a set of first expected power sets.

[0073] The M temperature parameters are combined to obtain P temperature parameter combinations. The relationship between M and P satisfies the following condition: P = 2 M -M - 1. The P temperature parameter combinations include: combinations of any two of the M temperature parameters, combinations of any three temperature parameters, and combinations of the M temperature parameters. Exemplarily, when M = 4, P = 11. The P temperature parameter combinations include: combinations of two temperature parameters (6), combinations of three temperature parameters (4), and combinations of four temperature parameters (1).

[0074] Optionally, the determining P sets of second expected power sets according to the P temperature parameter combinations and the corresponding P temperature derating formula combinations includes:

[0075] Determine at least two sets of second expected power sets according to the first temperature parameter combination and the corresponding first temperature derating formula combination, and determine the set of the lowest power in the at least two sets of second expected power sets as the first set of second expected power sets; the first temperature parameter combination is any one of the P temperature parameter combinations, the first temperature derating formula combination is a temperature derating formula combination corresponding to the first temperature parameter combination among the P temperature derating formula combinations, and the first set of second expected power sets is the second expected power set corresponding to the first temperature parameter combination among the P sets of second expected power sets.

[0076] In the embodiment of the present application, for each temperature parameter combination among the P temperature parameter combinations, at least two sets of second expected power sets can be determined, and the second expected power set determined based on this temperature parameter combination is the set of the lowest power in the at least two sets of second expected power sets. During multi-point testing, the second expected power set determined by each temperature parameter combination is the set of the second expected power sets with the lowest power determined by this temperature parameter combination, so that the derating test can meet the derating requirements of multiple temperature parameters, thereby improving the test effect of multi-point testing during the derating test.

[0077] 104, the electronic device executes N test cases and generates test results.

[0078] In the embodiments of the present application, the test result can reflect the difference between the actual power and the expected power. Generally speaking, the actual power is less than or equal to the expected power, and the closer the actual power is to the expected power, the better the test result indicates.

[0079] In the embodiments of the present application, N test cases can be generated according to the input parameters and N sets of expected power sets. The test cases can be automatically generated and can also be automatically executed. Compared with manually writing test cases, test cases can be quickly generated, improving the test efficiency.

[0080] In the embodiments of the present application, the derating test method is used to perform a derating test on the energy conversion device. During the derating test, N test cases can be generated according to the input parameters and N sets of expected power sets. Compared with testers manually writing test cases, only the input parameters are required to automatically generate test cases, and test cases can be quickly generated, improving the test efficiency. The input parameters include precondition parameters, derating condition parameters, and derating formulas, fully considering the parameters required for testing, which can improve the test coverage and test quality, thereby improving the test effect of the derating test of the energy conversion device.

[0081] The following takes the energy conversion device as a DC / DC converter as an example for illustration.

[0082] The precondition parameters include: input voltage (e.g., 120V - 550V), input maximum current (e.g., 32A), output voltage (e.g., 5V - 16V), output maximum current (e.g., 255A).

[0083] The derating condition parameters include: water channel temperature. The water channel temperature can be obtained from the signal value reported by the CAN matrix. Exemplarily, the signal value reporting of the water channel temperature can be obtained from the values of 1.5 - 1.6 of the CAN matrix with ID 0x30A. That is, the values of byte1, bite5 and byte1, bite6 of the CAN matrix with ID 0x30A (corresponding to the values of 13 and 14 of the CAN matrix) can be read. The CAN matrix can also be referred to as the CAN communication matrix.

[0084] For example, when the DC / DC converter is in the step-down full-load condition, the input voltage in the precondition parameters is 360V.

[0085] Exemplarily, the derating formula corresponding to the water channel temperature is as follows:

[0086]

[0087] Among them, Tc is the water channel temperature, Iout_Limit_Water is the expected power based on the water channel temperature, Iout_DC_Max is the full-load power, and Iout_Rated is the rated output power. Iout_Limit_Water = 0 indicates that the DC / DC converter does not work. When Tc is less than -40°C or greater than 108°C, the DC / DC converter does not work, that is, the power of the DC / DC converter is 0. When Tc is between -30°C and 60°C, the DC / DC converter outputs full-load power. When Tc is between -40°C and -30°C or between 60°C and 108°C, the output of the DC / DC converter is derated. Exemplarily, Iout_DC_Max can be 2000W.

[0088] Exemplarily, the derating formula corresponding to the radiator temperature is as follows:

[0089]

[0090] Among them, Ts is the radiator temperature, Iout_Limit_MOS is the expected power based on the radiator temperature, Iout_DC_Max is the full-load power, and Iout_Rated is the rated output power. Iout_Limit_MOS = 0 indicates that the DC / DC converter does not work. When Ts is less than -40°C or greater than 134°C, the DC / DC converter does not work, that is, the power of the DC / DC converter is 0. When Ts is between -30°C and 90°C, the DC / DC converter outputs full-load power. When Ts is between -40°C and -30°C or between 90°C and 134°C, the output of the DC / DC converter is derated.

[0091] The precondition parameters also include the input voltage derating formula.

[0092] Exemplarily, the input voltage derating formula is as follows:

[0093]

[0094] Among them, Vout_SET is the expected low-voltage output when the input is high. The DC / DC converter in the embodiments of the present application can convert the high-voltage voltage and current into low-voltage voltage and current. It should be noted that the input voltage derating formula can be adjusted according to the customized requirements.

[0095] Please refer to Figure 2 , Figure 2 which is a schematic diagram of a derating test case based on the water channel temperature provided by the embodiments of the present application. Figure 2 The derating test case of

[0096] Please refer to Figure 3 , Figure 3It is a schematic diagram of a derating test case based on water channel temperature and radiator temperature provided by an embodiment of the present application. Figure 3 The derating test case of

[0097] It should be noted that at the same moment, the water channel temperature and the radiator temperature are not necessarily the same. For example, at a certain moment, the ambient temperature is measured as 30 °C, the water channel temperature is measured as 35 °C, and the radiator is measured as 50 °C.

[0098] The above mainly introduces the solution of the embodiment of the present application from the perspective of the execution process on the method side. It can be understood that in order for the electronic device to implement the above functions, it includes the corresponding hardware structure and / or software module for executing each function. Those skilled in the art should easily realize that, combining the units and algorithm steps of each example described in the embodiments provided in this article, the present application can be implemented in the form of hardware or a combination of hardware and computer software. Whether a certain function is executed in the way of hardware or computer software driving hardware depends on the specific application and design constraint conditions of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present application.

[0099] The embodiment of the present application can divide the functional units of the electronic device according to the above method examples. For example, each functional unit can be divided corresponding to each function, or two or more functions can be integrated into one processing unit. The above integrated unit can be implemented in the form of hardware or in the form of a software functional unit. It should be noted that the division of units in the embodiment of the present application is schematic, only a logical function division, and there can be other division methods in actual implementation.

[0100] Please refer to Figure 4 , Figure 4 It is a schematic structural diagram of a derating test device provided by an embodiment of the present application. The derating test device 400 may include an acquisition unit 401, a determination unit 402, a generation unit 403, and a test unit 404, where:

[0101] The acquisition unit 401 is configured to acquire input parameters; the input parameters include precondition parameters, derating condition parameters, and derating formulas;

[0102] The determination unit 402 is configured to determine N groups of expected power sets according to the precondition parameters, the derating condition parameters, and the derating formulas, where N is an integer greater than or equal to 1;

[0103] The generation unit 403 is configured to generate N test cases according to the input parameters and the N groups of expected power sets;

[0104] A test unit 404 for executing the N test cases and generating test results.

[0105] Optionally, the derating condition parameter includes M temperature parameters, the derating formula includes M temperature derating formulas, the M temperature parameters and the M temperature derating formulas are in one-to-one correspondence, and M is an integer greater than or equal to 1.

[0106] Optionally, when M is equal to 1, N is equal to 1, and the N test cases are single-point test cases;

[0107] When M is equal to 2, N is an integer greater than or equal to 2, and the N test cases include at least one of single-point test cases and multi-point test cases.

[0108] Optionally, the determining unit 402 determines N sets of expected power sets according to the precondition parameter, the derating condition parameter, and the derating formula, including: when M is equal to 1, determining a set of expected power sets according to one temperature parameter and the corresponding one temperature derating formula, and the set of expected power sets is used to generate a single-point test case; when M is greater than or equal to 2, determining M sets of first expected power sets and P sets of second expected power sets according to the M temperature parameters and the M temperature derating formulas, the M sets of first expected power sets are used to generate M single-point test cases, the P sets of second expected power sets are used to generate P multi-point test cases, N = M + P, and P is an integer greater than or equal to 1.

[0109] Optionally, the determining unit 402 determines M sets of first expected power sets and P sets of second expected power sets according to the M temperature parameters and the M temperature derating formulas, including: determining M sets of first expected power sets according to the M temperature parameters and the corresponding M temperature derating formulas; combining the M temperature parameters to obtain P temperature parameter combinations, and determining P sets of second expected power sets according to the P temperature parameter combinations and the corresponding P temperature derating formula combinations.

[0110] Optionally, the determining unit 402 determines P sets of second expected power sets according to the P temperature parameter combinations and the corresponding P temperature derating formula combinations, including: determining at least two sets of second expected power sets according to the first temperature parameter combination and the corresponding first temperature derating formula combination, and determining the set of the lowest power in the at least two sets of second expected power sets as the first set of second expected power sets; the first temperature parameter combination is any one of the P temperature parameter combinations, the first temperature derating formula combination is a temperature derating formula combination corresponding to the first temperature parameter combination among the P temperature derating formula combinations, and the first set of second expected power sets is the second expected power set corresponding to the first temperature parameter combination among the P sets of second expected power sets.

[0111] Optionally, the derating condition parameter includes at least one of a water channel temperature, a radiator temperature, and an ambient temperature.

[0112] Optionally, the precondition parameter includes at least one of an input voltage of the energy conversion device, an input current of the energy conversion device, an output voltage of the energy conversion device, and an output current of the energy conversion device.

[0113] Among them, the obtaining unit 401, the determining unit 402, the generating unit 403, and the testing unit 404 in the embodiments of the present application may be processors in an electronic device.

[0114] Figure 4 For the specific implementation of the shown derating test device 400, reference may be made to Figure 1 the method embodiments shown, which will not be elaborated here.

[0115] In the embodiments of the present application, the derating test method is used to perform a derating test on an energy conversion device. During the derating test, N test cases can be generated according to input parameters and N sets of expected power sets. Compared with manually writing test cases by testers, only input parameters are required to automatically generate test cases, which can quickly generate test cases and improve test efficiency. The input parameters include precondition parameters, derating condition parameters, and derating formulas, fully considering the parameters required for testing, which can improve the test coverage and test quality, thereby improving the test effect of the derating test of the energy conversion device.

[0116] Please refer to Figure 5 , Figure 5 which is a schematic structural diagram of an electronic device provided by an embodiment of the present application. As Figure 5 shown, the electronic device 500 includes a processor 501 and a memory 502, and the processor 501 and the memory 502 can be interconnected through a communication bus 503. The communication bus 503 may be a peripheral component interconnect (PCI) bus or an extended industry standard architecture (EISA) bus, etc. The communication bus 503 can be divided into an address bus, a data bus, a control bus, etc. For the sake of simplicity of representation, Figure 5 only a thick line is shown in Figure 1 but it does not mean that there is only one bus or one type of bus. The memory 502 is used to store a computer program, and the computer program includes program instructions. The processor 501 is configured to call the program instructions, and the above program includes instructions for executing

[0117] The memory 502 can be a read-only memory (ROM) or other types of static storage devices that can store static information and instructions, a random access memory (RAM) or other types of dynamic storage devices that can store information and instructions, or can also be an electrically erasable programmable read-only memory (EEPROM), a compact disc read-only memory (CD-ROM), or other optical disc storage, optical disc storage (including compact discs, laser discs, optical discs, digital versatile discs, Blu-ray discs, etc.), magnetic disk storage media, or other magnetic storage devices, or any other medium that can be used to carry or store the desired program code in the form of instructions or data structures and can be accessed by a computer, but is not limited thereto. The memory can exist independently and be connected to the processor through a bus. The memory can also be integrated with the processor.

[0118] The electronic device 500 can be various terminal devices with communication functions (such as mobile phones, computers, etc.).

[0119] In the embodiments of the present application, the derating test method is used to perform a derating test on an energy conversion device. During the derating test, N test cases can be generated according to the input parameters and N sets of expected power sets. Compared with manually writing test cases by testers, only the input parameters are required to automatically generate test cases, which can quickly generate test cases and improve the test efficiency. The input parameters include precondition parameters, derating condition parameters, and derating formulas, fully considering the parameters required for testing, which can improve the test coverage and test quality, thereby improving the test effect of the derating test of the energy conversion device.

[0120] The embodiments of the present application also provide a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program for electronic data exchange, and the computer program enables a computer to execute some or all of the steps of any one of the derating test methods described in the above method embodiments.

[0121] It should be noted that for the foregoing method embodiments, for the sake of simple description, they are all expressed as a series of action combinations. However, those skilled in the art should know that the present application is not limited by the described action sequence, because according to the present application, certain steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily essential to the present application.

[0122] In the above embodiments, the descriptions of the various embodiments have their own emphases. For parts not detailed in a certain embodiment, reference may be made to the relevant descriptions of other embodiments.

[0123] In several embodiments provided in the present application, it should be understood that the disclosed device can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection between each other can be through some interfaces. The indirect coupling or communication connection of the device or unit can be in an electrical or other form.

[0124] The units described as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0125] In addition, in each embodiment of the application, the various functional units can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above integrated units can be implemented in the form of hardware or in the form of software program modules.

[0126] If the above integrated unit is implemented in the form of a software program module and sold or used as an independent product, it can be stored in a computer-readable memory. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a memory and includes several instructions for causing a computer device (which can be a personal computer, an electronic device or a network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present application. And the aforementioned memory includes: various media such as USB flash drives, read-only memories (ROM), random access memories (RAM), mobile hard disks, magnetic disks or optical discs that can store program codes.

[0127] Those of ordinary skill in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing relevant hardware through a program, and the program can be stored in a computer-readable memory, which may include: a flash drive, a read-only memory, a random access memory, a magnetic disk, an optical disk, etc.

[0128] The above embodiments of the present application have been described in detail. Specific examples are used in this article to elaborate on the principle and implementation manner of the present application. The description of the above embodiments is only used to help understand the method and its core idea of the present application; at the same time, for those of ordinary skill in the art, according to the idea of the present application, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present application.

Claims

1. A derating test method, characterized in that: include: Obtaining input parameters; the input parameters include precondition parameters, derating condition parameters and derating formula; Determine N groups of expected power sets according to the precondition parameter, the derating condition parameter and the derating formula, where N is an integer greater than or equal to 1; Generate N test cases according to the input parameters and the N groups of expected power sets; Execute the N test cases and generate test results.

2. The method according to claim 1, characterized in that The derating condition parameters include M temperature parameters, the derating formula includes M temperature derating formulas, the M temperature parameters correspond one-to-one to the M temperature derating formulas, and M is an integer greater than or equal to 1.

3. The method according to claim 2, characterized in that When M is equal to 1, N is equal to 1, and the N test cases are single-point test cases; When M is equal to 2, N is an integer greater than or equal to 2, and the N test cases include at least one of a single-point test case and a multi-point test case.

4. The method according to claim 2, characterized in that: The determining N groups of expected power sets according to the precondition parameter, the derating condition parameter and the derating formula includes: When M is equal to 1, a set of expected power sets is determined according to a temperature parameter and a corresponding temperature derating formula, and the set of expected power sets is used to generate a single-point test case; When M is greater than or equal to 2, M groups of first expected power sets and P groups of second expected power sets are determined according to the M temperature parameters and the M temperature derating formulas. The M groups of first expected power sets are used to generate M single-point test cases, and the P groups of second expected power sets are used to generate P multi-point test cases. N=M+P, and P is an integer greater than or equal to 1.

5. The method according to claim 4, characterized in that The determining, according to the M temperature parameters and the M temperature derating formulas, M groups of first expected power sets and P groups of second expected power sets comprises: Determine M groups of first expected power sets according to M temperature parameters and corresponding M temperature derating formulas; The M temperature parameters are combined to obtain P temperature parameter combinations, and P groups of second expected power sets are determined according to the P temperature parameter combinations and corresponding P temperature derating formula combinations.

6. The method according to claim 5, characterized in that The determining of the P second expected power sets according to the P temperature parameter combinations and the corresponding P temperature derating formula combinations includes: At least two groups of second expected power sets are determined according to the first temperature parameter combination and the corresponding first temperature derating formula combination, and the set of lowest powers in the at least two groups of second expected power sets is determined as the first group of second expected power sets; the first temperature parameter combination is any one of the P temperature parameter combinations, the first temperature derating formula combination is a temperature derating formula combination among the P temperature derating formula combinations corresponding to the first temperature parameter combination, and the first group of second expected power sets is the second expected power set in the P group of second expected power sets corresponding to the first temperature parameter combination.

7. The method according to any one of claims 1 to 6, characterized in that: The derating condition parameters include: at least one of water channel temperature, radiator temperature, and ambient temperature; and / or, the precondition parameters include: at least one of the input voltage of the energy conversion device, the input current of the energy conversion device, the output voltage of the energy conversion device, and the output current of the energy conversion device.

8. A derating test device, characterized in that: include: An acquisition unit, used to acquire input parameters; The input parameters include precondition parameters, derating condition parameters and derating formula; A determining unit, configured to determine N groups of expected power sets according to the precondition parameter, the derating condition parameter and the derating formula, where N is an integer greater than or equal to 1; A generating unit, configured to generate N test cases according to the input parameters and the N groups of expected power sets; The test unit is used to execute the N test cases and generate test results.

9. An electronic device, characterized in that: The method comprises a processor and a memory, wherein the memory is used to store a computer program, the computer program comprises program instructions, and the processor is configured to call the program instructions to execute the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, wherein the computer program includes program instructions, and when the program instructions are executed by a processor, the processor is enabled to perform the method according to any one of claims 1 to 7.

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