Cable testing device and cable testing method

Abstract

The invention provides a cable testing device and a cable testing method. The cable testing device comprises a base, a curvature testing disc and a pressure applying part, the base is used for bearing the curvature testing disc and the pressure applying part, the curvature testing disc is provided with an arc-shaped side face, and the pressure applying part is located outside the arc-shaped side face; a tested cable can be wound on the arc-shaped side surface, and the pressure applying part is used for applying pressure to the bent part of the tested cable from the outer side of the tested cable, so that the tested cable is bent according to the curvature corresponding to the arc-shaped side surface and is tested in a pressure bearing state. By using the cable testing device, the cable testing efficiency can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of cable testing, and in particular to a cable testing device and a cable testing method. Background Art

[0002] During the use of various cables, there is usually a need for the cables to be deformed (such as being bent), and it is necessary to ensure that the cables can still have good performance under the condition of deformation.

[0003] Usually, before the cable is actually used, it is necessary to conduct sampling tests on it to determine the performance of the cable under various deformation conditions, and then determine the cable's use conditions or applicable scenarios based on the test results. Especially for high-temperature superconducting cables, they have high requirements for the environment and their performance is more easily affected by deformation. Testing of high-temperature superconducting cables is crucial for their actual use.

[0004] However, the testing efficiency for cables still needs to be improved. Summary of the invention

[0005] The present application provides a cable testing device and method, which can improve the testing efficiency of cables.

[0006] According to one aspect of the present application, there is provided a cable testing device, comprising: a base, a curvature testing disc and a pressure applying component; The base is used to carry the curvature test disc and the pressure-applying component, the curvature test disc has an arc-shaped side surface, and the pressure-applying component is located outside the arc-shaped side surface; The cable under test can be wound around the arcuate side surface, and the pressure applying component is used to apply pressure to the bent portion of the cable under test from the outside of the cable under test, so as to test the cable under test in a state where it is bent according to the curvature corresponding to the arcuate side surface and subjected to pressure.

[0007] In one embodiment, the cable testing device includes a plurality of pressure-applying components, which surround at least a portion of the arc-shaped side surface, and are used to apply pressure to different points in the tested cable.

[0008] In one embodiment, the base has a depression area and a raised structure surrounding the depression area; The curvature test plate is located in the settlement area; the pressure-applying component is arranged in the protruding structure and can extend from the protruding structure to the curvature test plate to apply pressure to the tested cable wound on the curvature test plate.

[0009] In one embodiment, the cable testing device further comprises a connecting terminal and a pressure strip; The connecting terminal is arranged on the base, the pressing strip is connected to the base, and presses the connecting terminal from a side of the connecting terminal away from the base; The end of the tested cable is fixed to the connecting terminal and is electrically connected to an external power source through the connecting terminal.

[0010] In one embodiment, the base has a depression area and a raised structure surrounding the depression area; The curvature test plate, the tested cable and the connecting terminal are located in the settlement area; A slot is provided on the side of the raised structure, the end of the pressure strip extends into the slot, and the middle position of the pressure strip is connected to the settlement area through a connecting piece; the portion of the pressure strip located between the slot and the connecting piece is used to press the connecting terminal.

[0011] In one embodiment, the connecting terminal is T-shaped, and includes a first strip portion and a second strip portion connected to each other, and the second strip portion protrudes from the first strip portion in a direction away from the base; The first strip portion has a receiving hole for receiving and fixing the end of the tested cable; The second strip portion has a lead connection hole for arranging a lead connected to the external power source; The pressing strip is pressed on a surface of the first strip portion away from the base.

[0012] In one embodiment, the curvature test disc comprises a plurality of sub-test discs which are nested and detachable with each other, and the sub-test discs have curved edges; the curved side surface of the curvature test disc is a curved edge of the sub-test disc which is located outside the plurality of sub-test discs, and the plurality of sub-test discs are used to provide the curved side surfaces with different curvatures; And / or, the base has a slide groove, and the curvature test disc is connected to the slide groove and can move along the slide groove; and / or, the pressure applying member comprises a spring damper; And / or, the cable under test includes a high-temperature superconducting cable.

[0013] According to another aspect of the present application, a cable testing method is provided, which is applied to the above-mentioned cable testing device, and the method includes: Winding the tested cable around the curved side of the curvature test plate in the cable testing device; Controlling a pressure-applying component in the cable testing device to apply a target pressure to a curved portion of the cable under test from the outside of the cable under test; Power is supplied to the tested cable to detect performance parameters of the tested cable, and a test result is obtained when the tested cable is bent according to the curvature corresponding to the arc-shaped side surface and subjected to the target pressure.

[0014] In one embodiment, the cable testing device includes a plurality of pressure applying components, and the plurality of pressure applying components surround the arc-shaped side surface; after the cable to be tested is wound around the arc-shaped side surface of the curvature test disk in the cable testing device, the method further includes: Controlling the multiple pressure-applying components to move toward the tested cable to limit the position of the tested cable; The controlling the pressure applying component in the cable testing device to apply a target pressure to the bending portion of the tested cable from the outside of the tested cable comprises: Any one of the plurality of pressure applying members is controlled to apply a target pressure to a bent portion of the cable under test from an outer side of the cable under test.

[0015] In one embodiment, the cable testing device further includes a connecting terminal and a pressure strip; the method of winding the tested cable around the curved side of the curvature testing disk in the cable testing device includes: Fixing the two ends of the tested cable to the two connecting terminals respectively; Winding the tested cable fixed with the connecting terminal around the arc-shaped side surface of the curvature test plate in the cable testing device, and placing the two connecting terminals in parallel; The pressing strip is pressed onto the connecting terminal and connected to the base to press the connecting terminal tightly.

[0016] In the embodiment of the present application, the cable testing device includes a curvature test plate and a pressure component, and the pressure component is located outside the curved side of the curvature test plate, and the tested cable can be bent around the curved side, and the pressure component applies pressure to the curved part of the tested cable from the outside. In this way, the performance of the tested cable can be directly tested when it is bent according to the curvature corresponding to the curved side and under pressure, without the need to perform bending test and pressure test separately and then integrate them, which can improve the accuracy of performance testing and test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a partial structural schematic diagram of a high-temperature superconducting cable provided in an embodiment of the present application; Figure 2 is a schematic diagram of a cable test provided in an embodiment of the present application; Figure 3 is a schematic diagram of another cable test provided in an embodiment of the present application; Figure 4It is a structural schematic diagram of a base provided in an embodiment of the present application; Figure 5 It is a flow chart of a cable testing method provided in an embodiment of the present application. DETAILED DESCRIPTION

[0018] Many specific details are described in the following description to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways than those described herein, and those skilled in the art can make similar generalizations without violating the connotation of the present application. Therefore, the present application is not limited to the specific implementation disclosed below.

[0019] The terms used in one or more embodiments of the present application are only for the purpose of describing specific embodiments, and are not intended to limit one or more embodiments of the present application. The singular forms of "one", "said" and "the" used in one or more embodiments of the present application and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings. It should also be understood that the term "and / or" used in one or more embodiments of the present application refers to and includes any or all possible combinations of one or more associated listed items. The term "at least one" in one or more embodiments of the present application refers to "one or more", and "multiple" refers to "two or more". The term "including" is an open description and should be understood as "including but not limited to", and may include other content on the basis of the content described.

[0020] It should be understood that, although the terms "first", "second", etc. may be used to describe various information in one or more embodiments of the present application, these information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of one or more embodiments of the present application, "first" may also be referred to as "second", and similarly, "second" may also be referred to as "first". Depending on the context, the word "if" as used herein may be interpreted as "at the time of" or "when" or "in response to determining".

[0021] At present, the corresponding cables are used in various scenarios, and the cables usually need to be tested for performance before use. Since the advent of high-temperature superconducting materials, high-temperature superconducting technology has developed rapidly. Cables made of high-temperature superconducting materials (hereinafter referred to as high-temperature superconducting cables) are widely used due to their excellent current carrying capacity, high field performance and mechanical strength. There are some high-temperature superconducting cables with simple preparation processes and strong current carrying capacity, such as stacked torsion type (TSTC) high-temperature superconducting cables, wound type (CORC) high-temperature superconducting cables and Roebel type high-temperature superconducting cables. High-temperature superconducting cables can be used in power and strong magnetic equipment in the fields of energy, power, medical and military. High-temperature superconducting cables can carry tens of kiloamperes of current and can replace low-temperature niobium titanium alloy (NbTi) and tri-tin niobium (Nb3Sn) cables. They are used in the magnet systems of large scientific facilities such as high-field (such as magnetic induction intensity greater than 20 Tesla) tokamaks and large accelerators for current transmission or magnet formation. For example, high-temperature superconducting cables can be used to prepare toroidal field (TF) coils, center solenoid (CS) coils and poloidal field (PF) coils in tokamaks.

[0022] High-temperature superconducting cables require a relatively low ambient temperature during the current flow process, such as operating in a low-temperature environment below 77K (Kelvin). High-temperature superconducting cables will not only be subjected to mechanical stresses such as stretching, torsion, bending and transverse pressure when winding multi-stage cables and winding magnets, but will also be subjected to huge low-temperature contraction stress and electromagnetic stress under high fields and large currents when the magnets are running, all of which will affect the critical current and mechanical stability of high-temperature superconducting cables, and even threaten the safety of the entire device.

[0023] It is usually necessary to sample and test the prepared high-temperature superconducting cable to determine the performance of the high-temperature superconducting cable under various conditions, such as determining the critical current and current density that the high-temperature superconducting cable can support under different bending degrees and stress conditions. The mechanical experimental parameters obtained from the test are key factors affecting cable winding, magnet preparation and its safe operation. Testing the bending characteristics of high-temperature superconducting cables can provide experimental data support for the design and manufacture of multi-stage cable winding and magnets. Based on the test results, it can be determined whether the high-temperature superconducting cable is available, and if it is available, the corresponding use conditions or applicable scenarios can be determined. Therefore, how to test high-temperature superconducting cables conveniently and efficiently is crucial for their actual use.

[0024] The current devices for testing the bending characteristics of high-temperature superconducting cables are relatively rough or complex. In one test method, the high-temperature superconducting cable is bent by drawing arc lines on the epoxy board and using nails or bolts as bending support points. This method will cause uneven and inadequate bending of the cable test, and it is also very easy to cause the high-temperature superconducting cable to be subjected to concentrated force at the support point, causing damage to the high-temperature superconducting cable, affecting the test results and test efficiency. In addition, in the current test method, the clamp is used to connect the two ends of the high-temperature superconducting cable, and the clamp needs to be fixed again separately. The installation, fixing and replacement of the clamps at both ends of the high-temperature superconducting cable are extremely inconvenient. The test radius is also easy to be damaged by improper operation, which will reduce the effectiveness and efficiency of the test. In another test method, the cable is fixed by opening an arc groove on the bending plate. This cable fixing method is relatively complicated, and the thickness of various cables is different, so bending plates with different groove widths need to be designed for different cables.

[0025] In addition, a bending test device is used to test the performance of high-temperature superconducting cables under various bending degrees, and a force test device is used to test the performance of high-temperature superconducting cables when flattened and subjected to different pressures. After the two tests are completed, the results of the two tests can be integrated and calculated to determine the performance when bent and stressed at the same time. This test method is relatively cumbersome and complex, and the overall test efficiency is low. In addition, the error between the results obtained by the integrated calculation method and the actual situation may be large, resulting in low accuracy of performance testing.

[0026] The embodiment of the present application provides a cable testing device and a cable testing method, the overall structure of the cable testing device is relatively simple, the operation is flexible and convenient, and the cable testing efficiency can be improved. The cable testing device and the cable testing method are introduced below.

[0027] Figure 1 is a partial structural diagram of a high-temperature superconducting cable provided in an embodiment of the present application. In an application scenario, the cable testing device provided in an embodiment of the present application can be used to Figure 1 The high temperature superconducting cable 10 shown is subjected to a bending test, and the high temperature superconducting cable 10 may be a flexible laminated torsion cable. The cable testing device provided in the embodiment of the present application may also be applied to other types of high temperature superconducting cables, or may also be applied to other cables that are not made of high temperature superconducting materials.

[0028] like Figure 1As shown, the high temperature superconducting cable 10 includes a spiral tube 101 and a plurality of high temperature superconducting tapes, such as two first high temperature superconducting tapes 102 and two second high temperature superconducting tapes 103. The spiral tube 101 may be a flexible metal spiral tube. The spiral tube 101 may play a supporting role, and in some embodiments, may also be used as a cooling component. The two first high temperature superconducting tapes 102 are spirally wound side by side on the spiral tube 101 to form a first layer of superconducting tape in the high temperature superconducting cable 10; the two second high temperature superconducting tapes 103 are spirally wound side by side on the first high temperature superconducting tape 102 to form a second layer of superconducting tape. The high temperature superconducting cable 10 may also include more layers of superconducting tapes, and the first high temperature superconducting tape 102 and the second high temperature superconducting tape 103 are repeatedly wound in sequence outside the second layer of superconducting tape in the winding manner to form a flexible laminated twisted cable with a multi-layer structure.

[0029] Figure 2 is a schematic diagram of a cable test provided in an embodiment of the present application, Figure 2 In one example, the cable 30 under test is tested by using a cable testing device. Figure 1 The high temperature superconducting cable 10 shown in FIG. Figure 2 As shown, the cable testing device 20 includes: a base 201, a curvature test plate 202 and a pressure component 203. The base 201 is used to carry the curvature test plate 202 and the pressure component 203. The curvature test plate 202 has an arc-shaped side surface, and the pressure component 203 is located outside the arc-shaped side surface. The tested cable 30 can be wound around the arc-shaped side surface, and the pressure component 203 is used to apply pressure to the curved part of the tested cable 30 from the outside of the tested cable 30, so as to test the state of the tested cable 30 being bent according to the curvature corresponding to the arc-shaped side surface and under pressure.

[0030] In the cable testing device 20, other components besides the base 201 can be arranged on the base 201, and the base 201 is used to carry other components. For example, the base 201 is used to carry the curvature test plate 202 and the pressure component 203. In some embodiments, there may be other supporting structures under the base 201, which is not limited in the embodiment of the present application. In some embodiments, the base 201 may be made of insulating material to avoid electrical connection during the cable testing process and to avoid affecting the cable testing effect.

[0031] In the embodiment of the present application, the curvature test plate 202 is disposed on the base 201, and the plate surface of the curvature test plate 202 is parallel to the bearing surface of the base 201. The curvature test plate 202 has an arc-shaped side surface, and the arc-shaped side surface is used to perform a bending test on the tested cable 30. By winding the tested cable 30 around the arc-shaped side surface, the tested cable 30 can be bent according to the curvature corresponding to the arc-shaped side surface, and then the performance test of the bent state of the tested cable 30 can be performed.

[0032] For example, after the cable 30 under test is bent, current can be transmitted to the cable 30 under test to detect parameters such as voltage and current of the cable 30 under test in the bent state. By observing the measured voltage and current for a certain period of time, information on various performance indicators of the cable 30 under test can be determined to achieve performance testing of the cable 30 under test. For example, these performance indicators can include indicators such as critical current, resistance, and n value. The n value refers to the critical current density index of the superconducting material, which is used to reflect the nonlinear behavior of the superconducting material when it is close to its critical current. Before testing the cable 30 under test, voltage leads can be welded on the cable 30 under test at certain intervals to measure the voltage and current at various positions on the cable 30 under test through the voltage leads.

[0033] In the embodiment of the present application, the curvature test plate 202 is taken as an example in which the curvature test plate 202 is in a circular shape as a whole. Accordingly, the side surface of the curvature test plate 202 is a curved surface that forms a circle. The arc-shaped side surface of the curvature test plate 202 refers to the entire side surface thereof. Figure 2 As shown, for this curvature test plate 202, during the test, the tested cable 30 contacts a part of the arc-shaped side surface. The middle part of the tested cable 30 can be wound around the curvature test plate 202, and the two ends of the tested cable 30 extend outward from the curvature test plate 202, and the parts at the two ends can be parallel to each other, so as to ensure that the tested cable 30 can fit the arc-shaped side surface well and avoid cable damage.

[0034] In some embodiments, the curvature test plate 202 may also be semicircular or fan-shaped. The embodiment of the present application does not limit the shape of the curvature test plate 202, and only needs to ensure that it has a circular arc side. In addition to the arc portion, the side of the curvature test plate 202 also includes a straight portion. The arc portion serves as the above-mentioned arc side, and the tested cable 30 can contact the entire area of ​​its arc side.

[0035] In some embodiments, the portion of the curvature test plate 202 that contacts the tested cable 30 may be insulated to avoid electrical connection with the tested cable 30 and affect the performance test result of the tested cable 30. For example, the curvature test plate 202 may be made of an insulating material as a whole, or an insulating layer may be plated on the curved side.

[0036] The number of the pressure applying components 203 in the cable testing device 20 can be one or more. Figure 2The seven pressure components 203 are schematically shown as an example. The pressure components 203 are connected to the base 201 to fix the position. The pressure components 203 are located in the area outside the curved side of the curvature test plate 202 on the base 201, and can move toward the curvature test plate 202 to apply pressure to the curved portion of the tested cable 30 when the tested cable 30 is wound on the curved side of the curvature test plate 202. Figure 2 Taking the curvature test disk 202 as an example in which the curved side of the curvature test disk 202 includes its entire side, the pressure component 203 can be located outside the target area in the curved side, and the target area refers to the area in the curved side for contacting the cable 30 under test.

[0037] When the cable testing device 20 includes a plurality of pressure components 203, the plurality of pressure components 203 may surround at least a portion of the arc-shaped side surface of the curvature testing plate 202, and the plurality of pressure components 203 are used to apply pressure to different points in the tested cable 30. Figure 2 In the circular curvature test plate 202 shown, the plurality of pressure components 203 surround the target area in the curved side, or may only surround a portion of the target area. In one embodiment, if the curvature test plate 202 is semicircular or fan-shaped, the plurality of pressure components 203 may be arranged around the entire curved side of the curvature test plate 202.

[0038] Different pressure components 203 can apply pressure to different positions of the tested cable 30. Different pressure components 203 can be controlled individually or as a whole, which is not limited here. In the process of testing the tested cable 30, the pressure component 203 corresponding to a specific position in the tested cable 30 can be controlled to apply pressure to the position, so as to simulate the performance of the tested cable 30 under the condition of stress concentration at the position. In some methods, multiple pressure components 203 can also be controlled to simultaneously apply pressure to multiple positions in the tested cable 30 to test the performance in this state.

[0039] In one embodiment, the multiple pressure components 203 can also be used to assist in the stability of the bending state of the tested cable 30. For example, after the tested cable 30 is wound around the curved side of the curvature test plate 202, the multiple pressure components 203 can be controlled to move toward the tested cable 30 to get close to the tested cable 30, limit the tested cable 30, and avoid displacement of the tested cable 30. For example, the pressure component 203 is moved to just contact with the tested cable 30, but does not apply pressure to the tested cable 30, or is moved to a position where there is still some gap between the tested cable 30 and the tested cable 30.

[0040] If the cable testing device 20 includes only one pressure component 203, the position of the pressure component 203 can be set according to the position of the test pressure required for the tested cable 30. In some embodiments, the position of the pressure component 203 can also be moved, such as a moving track of the pressure component 203 is provided on the base 201, and the moving track can surround the curved side of the curvature test plate 202. The pressure component 203 can move along the moving track and be fixed when it moves to any position, and apply pressure to the tested cable 30 from this position. In this way, it is possible to use one pressure component 203 to apply pressure to different positions of the tested cable 30.

[0041] In the embodiment of the present application, the pressure applied by the pressure-applying component 203 to the tested cable 30 is adjustable. The pressure can be determined by the distance that the pressure-applying component 202 moves toward the tested cable 30. For example, the distance can be manually controlled by a staff member, or the pressure-applying component 203 can be connected to an electric control device, by which the distance that the pressure-applying component 202 moves is automatically controlled based on the required pressure. In the process of testing the tested cable 30, the pressure applied by the pressure-applying component 203 to the tested cable 30 can be gradually increased, and the electrical parameters of the tested cable 30 can be continuously monitored during the process to test the performance of the tested cable 30 under different pressures. In this way, the effects of different pressures on the performance of the tested cable 30 under a certain bending radius can be determined, and the maximum pressure that the tested cable 30 can withstand under this bending condition can also be determined.

[0042] In some embodiments, the pressure-applying component 203 includes a spring damper. After the spring damper is prepared, a certain relationship can be satisfied between its deformation and the applied pressure. The applied pressure can be determined by the spring deformation in the spring damper, and this pressure determination method is relatively simple and convenient. For example, a certain spring deformation scale can be provided on the spring damper, and the pressure currently applied by the spring damper can be directly determined by the scale. In addition, the spring damper applies appropriate pressure in a purely mechanical manner, avoiding damage to the pressure-applying component 203 when performing cable testing under some special environmental requirements, and ensuring the stability of the cable test. For example, when the cable 30 under test is a high-temperature superconducting cable, the entire test device needs to be placed in a low-temperature environment when testing it. This environment may be more easily damaged for some electronic equipment, but the spring damper can adapt well to the test environment.

[0043] In the embodiment of the present application, the tested cable 30 can be wound around the curved side surface of the curvature test plate 202, so that the tested cable 30 is bent at the curvature corresponding to the curved side surface, and in this state, the pressure applying component 203 can also apply pressure to the curved portion of the tested cable 30. In this way, the performance of the tested cable 30 can be directly tested in the state of being bent at the curvature corresponding to the curved side surface and under pressure, without the need to separately perform the bending test and the pressure test and then integrate the processing, which can improve the performance test accuracy and test efficiency of the tested cable 30.

[0044] Figure 3 This is a schematic diagram of another cable test provided by an embodiment of the present application. Figure 3 Introduce the various components in the cable testing device. Figure 4 This is a schematic diagram of the structure of a base provided in an embodiment of the present application. Figure 3 and Figure 4 As shown, the base 201 has a settling area 2011 and a protruding structure 2012 surrounding the settling area 2011. The curvature test plate 202 is located in the settling area 2011; the pressure member 203 is disposed in the protruding structure 2012 and can extend from the protruding structure 2012 to the curvature test plate 202 to apply pressure to the tested cable 30 wound on the curvature test plate 202. Figure 3 Take the example of a cable testing device including a plurality of pressure applying components 203 surrounding the curvature testing plate 202. The plurality of pressure applying components 203 may be evenly distributed to ensure that the points on the tested cable 30 where pressure can be applied are evenly distributed.

[0045] The bottom surface of the subsidence area 2011 is the bearing surface of the base 201, which is used to bear the curvature test plate 202 and other components. The plate surface of the curvature test plate 202 can be parallel to the bottom surface of the subsidence area 2011. The raised structure 2012 can half surround the subsidence area 2011, leaving an opening on one side of the subsidence area 2011, so as to facilitate related operations on the tested cable 30 from this side, such as connecting leads, moving positions or fixing positions, etc. In some embodiments, the raised structure 2012 can also fully surround the subsidence area 2011, which is not limited here.

[0046] The protruding structure 2012 is used to carry the pressure component 203. For example, a plurality of through holes K are provided on the side of the protruding structure 2012, and each through hole K is used to set a pressure component 203. The pressure component 203 is in the shape of a strip, and can extend from the protruding structure 2012 to the curvature test disk 202 through the through hole K, and apply pressure to the curved part of the tested cable 30 when the tested cable 30 is wound around the curvature test disk 202. In one embodiment, the through hole K is a threaded hole, and the pressure component 203 is moved toward the curvature test disk 202 or toward the outside of the protruding structure 2012 by twisting it. The pressure component 203 can be a spring damper, and the displacement distance is different, the deformation of the spring in the spring damper is different, and the pressure applied accordingly can be different.

[0047] In the embodiment of the present application, the base 201 is rectangular, and the raised structure 2012 covers the three complete side edges of the settlement area 2011 (such as Figure 4 As shown, the first side edge D1, the second side edge D2 and the third side edge D3 are taken as examples. In some embodiments, the covering position of the protruding structure 2012 can be determined according to the area in the curved side of the curvature test plate 202 that is used to contact the tested cable 30. Since the protruding structure 2012 is used to carry the pressure component 203, and the pressure component 203 is used to apply pressure to the curved part of the tested cable 30, or to limit the bending state of the tested cable 30, the protruding structure 2012 can only surround the curved part of the tested cable 30. For example, the protruding structure 2012 covers the entire first side edge D1 of the settlement area 2011, half of the second side edge D2 adjacent to the first side, and half of the third side edge D3 adjacent to the first side.

[0048] In one implementation, the base 201 does not have a settling area, and a fixing component corresponding to each pressure component 203 may protrude from the base 201, and each pressure component 203 is disposed on the corresponding fixing component.

[0049] Please continue to refer to Figure 3 and Figure 4 The curvature test plate 202 can be placed on the base 201 along the target direction ( Figure 3The base 201 is shown in the figure with a solid line with arrows at both ends). By way of example, a chute H is provided in the middle of the base 201, and the chute H is a strip-shaped groove, and its length direction is the target direction. The curvature test disk 202 is connected to the chute H and can move along the chute H. The bottom of the curvature test disk 202 may have a connecting piece (not shown in the figure), and the curvature test disk 202 is connected to the base 201 through the connecting piece. The connecting piece protruding from the bottom of the curvature test disk 202 extends into the chute H, so that the curvature test disk 202 is connected to the chute H using the connecting piece. The connecting piece can move in the chute H, and accordingly the curvature test disk 202 is moved along the target direction.

[0050] In one example, the connecting member includes a threaded rod and a nut sleeved on the threaded rod, and the curvature test plate 202 can be fixed at any position in the slide slot H by locking the nut. The bottom of the slide slot H is hollow, the threaded rod passes through the slide slot H, and the nut can be sleeved on the protruding portion of the threaded rod after passing through the slide slot H. The curvature test plate 202 and the nut are respectively located on both sides of the slide slot H. Figure 3 As shown, a nut may also be provided on the connecting member at the side of the curvature test disc 202 away from the base 201, and the nut is used to prevent the curvature test disc 202 from slipping out of the connecting member from the side away from the base 201. In another example, the connecting member may be a strip-shaped protrusion, and the extending direction of the strip-shaped protrusion is the same as the extending direction of the slide slot H. The strip-shaped protrusion may also pass through the slide slot H and be fixed in position by some other fixing components.

[0051] In another moving mode of the curvature test plate 202, a raised moving track can be provided on the base 201 along the target direction, and a clamping component capable of clamping on the moving track is provided at the bottom of the curvature test plate 202. The curvature test plate 202 is connected to the moving track through the clamping component, and can be moved on the moving track, and the clamping component can be locked to fix the position of the curvature test plate 202 when it is moved to any position.

[0052] The curvature test tray 202 may include a plurality of sub-test trays that are nested and detachable, each of which has a curved edge. The plurality of sub-test trays may have the same center of a circle. The curved side of the curvature test tray 202 is the curved edge of the outer sub-test tray among the plurality of sub-test trays, and the plurality of sub-test trays are used to provide curved sides with different curvatures. The curvature of the curved side provided by the outer sub-test tray is less than the curvature of the curved side provided by the inner sub-test tray. Figure 3 For example, the curvature test plate 202 includes three sub-test plates, namely a first sub-test plate 2021, a second sub-test plate 2022 and a third sub-test plate 2023, and the three sub-test plates are arranged from the inside to the outside in sequence. Figure 3Taking the example that the curved edges of the sub-test discs are all in a complete circle, in some embodiments, the curved edges of the sub-test discs may also be in a semicircular or fan-shaped shape, which is not limited here.

[0053] In one implementation, among the multiple sub-test disks, the outer sub-test disk is annular (such as a circular ring, a semicircular ring, or a sector ring, etc.), and the arc-shaped side surface of the curvature test disk 202 is the outer arc surface of the outer sub-test disk. The multiple sub-test disks include multiple concentric circular rings with different radii. Figure 3 In the embodiment, the second sub-test disk 2022 and the third sub-test disk 2023 on the outside are in annular shape. The plurality of sub-test disks may further include a circular sub-test disk located in the enclosed area of ​​the annular sub-test disk, the circular sub-test disk being used to provide an arc-shaped side surface with a target curvature, the target curvature being greater than the curvature of the outer arc surface of the outer sub-test disk. Figure 3 The first sub-test disk 2021 is circular, and the curvature of the curved edge of the first sub-test disk 2021 is greater than the curvature of the outer arc surface of the second sub-test disk 2022 and the third sub-test disk 2023. In one embodiment, the innermost sub-test disk may also be annular, which is not limited here.

[0054] Each sub-test disc is detachable, for example, each sub-test disc is connected to the base 201 through a connector and can move along the target direction. The connection and movement of the sub-test discs can refer to the above-mentioned introduction to the curvature test disc 202, which will not be repeated here. Figure 3 Each sub-test disc is sleeved on a corresponding threaded rod, connected to the base 201 through the threaded rod, and can move along the slide groove H. Each sub-test disc is also prevented from falling out of the threaded rod by a nut sleeved on the threaded rod. By removing the connecting piece corresponding to any sub-test disc, the sub-test disc can be disassembled.

[0055] When testing the tested cable 30, the bending degree of the tested cable 30 can be changed to perform performance tests on the tested cable 30 at different bending degrees. When the curvature test plate 202 includes multiple sub-test plates that can provide different test curvatures, during the testing process of the tested cable 30, the tested cable 30 can be wound around the arc-shaped sides provided by different sub-test plates in batches to test the performance of the tested cable 30 at different curvatures.

[0056] In one method, the tested cable 30 can be tested in order from small to large curvatures to avoid cable damage caused by direct bending to a large degree and ensure the accuracy of the test at each curvature. The tested cable 30 can be first wound around the outermost sub-test disk in the curvature test disk 202 to perform a performance test at the minimum curvature. After that, the outermost sub-test disk is removed, and the tested cable 30 is wound around the sub-test disk of the next curvature for testing. In this way, the performance test of the tested cable 30 at each curvature is performed in turn. In some methods, the test can be performed in a different order, and any curvature can be tested as required.

[0057] For example, the tested cable 30 is first wound around the outermost sub-test disk in the curvature test disk 202, and the tested cable 30 is placed in a taut state by moving the curvature test disk 202 and fixing the end of the tested cable 30, and then the performance test under the current bending degree is conducted through the current. After the test is completed, the curvature test disk 202 can be moved to make the tested cable become relaxed, and then the outermost sub-test disk is removed, and then the curvature test disk 202 is moved again to make the tested cable 30 in a taut state, and then the performance test under the next bending degree is conducted through the current. After replacing the sub-test disk, the distance between the two ends of the tested cable 30 can also be adjusted according to the arc side provided by the sub-test disk used in the current test to ensure that the distance between the two ends matches the size of the arc side.

[0058] Please continue to refer to Figure 3 In some embodiments, the cable testing device further includes a connection terminal 204 and a pressure strip 205. The connection terminal 204 is disposed on the base 201, and the pressure strip 205 is connected to the base 201, and presses the connection terminal 204 from the side of the connection terminal 204 away from the base 201. The end of the tested cable 30 is fixed to the connection terminal 204, and is electrically connected to an external power supply through the connection terminal 204. The connection terminal 204 can be made of a conductive material, such as copper, iron or other conductive materials. In the embodiment of the present application, the current can be transmitted to the end of the tested cable 30 by energizing the connection terminal 204, thereby realizing the transmission of current to the tested cable 30.

[0059] The cable testing device may include two connection terminals 204, which are respectively connected to the two ends of the tested cable 30. The ends of the tested cable 30 may be embedded in the connection terminals 204, so that the cable ends are effectively protected by the connection terminals 204, and the tested cable 30 may be more conveniently fixed and otherwise operated by the connection terminals 204. In one embodiment, the connection terminal 204 has a receiving hole for receiving and fixing the ends of the tested cable 30. The ends of the tested cable 30 may be extended into the receiving hole and welded, so that the ends of the tested cable 30 are fixed to the connection terminals 204, and the tested cable 30 is electrically connected to the connection terminals 204.

[0060] In the embodiment of the present application, the end of the tested cable 30 is connected by the connection terminal 204, and the position of the connection terminal 204 is fixed by pressing the connection terminal 204 with the pressure strip 205, thereby fixing the end of the tested cable 30. In this way, the position of the connection terminal 204 can be flexibly adjusted by removing and fixing the pressure strip 205 without damaging the tested cable 30, thereby ensuring the integrity of the tested cable 30 during the test.

[0061] The structure of the base 201 can be as follows Figure 4 As shown, the base 201 has a settlement area 2011 and a raised structure 2012 surrounding the settlement area. The settlement area 2011 is also used to carry the connection terminal 204, and the curvature test plate 202, the tested cable 30 and the connection terminal 204 are located in the settlement area 2011. For this kind of base 201, a slot C can be opened on the side of the raised structure 2012, and the end of the pressure strip 205 extends into the slot C, and the middle position of the pressure strip 205 is connected to the settlement area 2011 through a connector; the portion of the pressure strip 205 located between the slot C and the connector is used to press the connection terminal 204. In some embodiments, the material of the pressure strip 205 can be an insulating material to avoid affecting the working performance of the tested cable 30 during the flow process. The hardness of the pressure strip 205 can be relatively high, and a certain degree of deformation can also be achieved to ensure a better fixing effect on the connection terminal 204.

[0062] Both ends of the slot C may be open, and the two openings are connected. For example, a slit that runs through the inside and outside may be opened on the side of the protruding structure 2012, and the slit serves as the slot C. The two opposite sides of the protruding structure 2012 are symmetrically provided with slots C, and the two ends of the pressure strip 205 may be respectively extended into the two slots C, and the ends of the pressure strip 205 are limited by the slots C. For example, one end of the pressure strip 205 may be extended from the outermost side of one slot C into the slot C, and then pass through the slot C into another slot C, so that the two ends of the pressure strip 205 are respectively located in the two slots C, so that the positions of the two ends of the pressure strip 205 are limited.

[0063] In one embodiment, the protruding structure 2012 may have a slot C on only one side, and the side of the slot C is open so that the end of the pressure strip 205 can enter the slot C from the side. One end of the pressure strip 205 may be movably connected (such as hinged) to one side of the protruding structure 2012, and the other end rotates around the hinge position to extend into the slot C from the side opening of the slot C, thereby realizing position restriction of the two ends of the pressure strip 205.

[0064] In the embodiment of the present application, the opening position of the card slot C can match the size of the connecting terminal 204. The height of the card slot C can be equal to or slightly lower than the height of the connecting terminal 204, so as to ensure that the connecting terminal 204 can be pressed when the pressure strip 205 is fixed by the card slot C. The height of the card slot C refers to the distance between the card slot C and the bottom surface of the settlement area 2011, and the height of the connecting terminal 204 refers to the distance between the surface of the connecting terminal 204 that contacts the pressure strip 205 and the bottom surface of the settlement area 2011. When preparing a cable testing device, the size of the connecting terminal 204 can be set first, and then the opening position of the card slot C can be determined accordingly; or the opening position of the card slot C can be determined first, and then the connecting terminal 204 of the corresponding size can be prepared based on it.

[0065] In order to ensure the fixing effect of the pressure strip 205 on the connecting terminal 204, it is also necessary to apply pressure to the middle position of the pressure strip 205. In the embodiment of the present application, the middle position of the pressure strip 205 is connected to the settlement area 2011 through a connector, so that a downward pressure (that is, toward the bottom surface of the settlement area 2011) is applied to the middle position of the pressure strip 205 through the connector. Under the action of this pressure and in combination with the state that both ends of the pressure strip 205 are limited, it can be ensured that the pressure strip can press the connecting terminal 204. For example, an opening is provided in the middle position of the pressure strip 205, and an opening or a slot corresponding to the opening is provided on the base 201. The connector includes a threaded rod and a nut, and the threaded rod passes through the opening on the pressure strip 205 and is connected and fixed to the base 201 (such as extending into the opening or the slot on the base 201). The nut is sleeved on the threaded rod and is located on the side of the pressure strip 205 away from the bottom surface of the settlement area 2011. By screwing the nut to move it downward on the threaded rod, downward pressure is applied to the pressure strip 205 . Under the action of the pressure, the pressure strip can apply pressure to the connection terminal 204 , thereby pressing the connection terminal 204 .

[0066] During the test of the tested cable 30, the test curvature needs to be changed. At this time, the position of the connecting terminal 204 may need to be adjusted accordingly, and the setting position of the pressure strip 205 also needs to be adjusted accordingly. In the embodiment of the present application, the opening of the card slot C is in the shape of a long strip (such as extending along the target direction), and the length of the opening is greater than the width of the pressure strip 205, so as to ensure that the end of the pressure strip 205 can be adjusted to a certain position in the target direction in the card slot C. The connector (such as a pressure strip connector) used to connect the pressure strip 205 to the base 201 can be moved along the target direction on the base 201. Please continue to refer to Figure 3 The moving track of the layering strip connector and the moving track of the curvature test plate 202 can share the slide groove H, and the layering strip connector is disposed in the slide groove H on the base 201 and can move in the slide groove H. In some embodiments, a slide groove independent of the slide groove H can also be disposed on the base 201 to dispose the layering strip connector in the slide groove.

[0067] In the embodiment of the present application, the card slot C provides movable controls for both ends of the pressure strip 205, and the pressure strip connector can be moved on the base 201, so as to ensure that the position of the pressure strip 205 can be adjusted as the position of the connecting terminal 204 is adjusted. After the position is adjusted, the pressure strip connector can be used for corresponding fixation to achieve adaptation with the connecting terminal 204, ensuring that the connecting terminal 204 can be better fixed when moved to any position.

[0068] In one embodiment, the two ends of the pressure strip 205 can also be connected to the base 201 through a pressure strip connector, and the pressure strip connector corresponding to the end can also move on the base 201, such as setting corresponding slide grooves on the two side areas of the base 201. For the specific connection method, please refer to the above-mentioned introduction about the pressure strip connector. In this way, the base 201 may not have a settlement area and a protruding structure, such as Figure 2 The flat plate shown.

[0069] In the embodiment of the present application, the connection terminal 204 may be in a square shape, and a lead connection hole is provided at one end thereof for setting a lead connected to an external power source. The external power source transmits current to the connection terminal 204 through the lead, and then transmits the current to the tested cable 30 through the connection terminal 204. In one embodiment, please continue to refer to Figure 3The connection terminal 204 is T-shaped, and includes a first strip portion 2041 and a second strip portion 2042 connected to each other, and the second strip portion 2042 protrudes from the first strip portion 2041 in a direction away from the base 201. The first strip portion 2041 is close to the base 201, and the second strip portion 2042 is located on the side of the first strip portion 2041 away from the base 201. The first strip portion 2041 has a receiving hole (not shown in the figure) for receiving and fixing the end of the cable 30 under test; the second strip portion 2042 has a lead connection hole Y for setting a lead connected to an external power supply; the pressure strip 205 is pressed on the surface of the first strip portion 2041 away from the base 201. For Figure 3 , away from the base 201 , that is, away from the bottom surface of the sinking area 2011 . The lead connection hole Y may be disposed at one end of the second strip portion 2042 away from the first strip portion 2041 .

[0070] By using the T-shaped connection terminal 204, it is possible to ensure that the lead wire connected to the external power source is fixed in a direction relatively parallel to the base 201, reduce the bending of the lead wire, reduce the pulling of the cable testing device, ensure the stability of the setting of the cable testing device, and accordingly ensure the stability of the cable testing process. In the T-shaped connection terminal 204, since the second strip portion 2042 protrudes from the first strip portion 2041, when the pressure strip 205 is pressed on the surface of the first strip portion 2041 away from the base 201, the second strip portion 2042 can limit the pressure strip 205 to prevent the pressure strip 205 from moving, which can improve the position fixing effect of the connection terminal 204.

[0071] The pressure strip 205 can be pressed on either side of the second strip portion 2042 on the first strip portion 2041. In some embodiments, the cable testing device may include two pressure strips 205, with a pressure strip 205 pressed on both sides of the second strip portion 2042 to enhance the fixing effect of the connection terminal 204, ensure a stable electrical connection between the connection terminal 204 and the tested cable 30, avoid twisting of the end of the tested cable 30 during the test, and ensure test stability.

[0072] In some test situations, the distance between the two connection terminals 204 may be relatively close, and the connection terminals 204 are made of conductive materials. In order to avoid electrical connection between the two connection terminals 204, an insulating material may be provided on the target surface of the connection terminal 204. The target surface is the surface of the two connection terminals 204 that is close to each other. For example, an insulating layer may be plated on the target surface or an insulating tape may be attached.

[0073] In the embodiment of the present application, the base 201 can be used to carry the curvature test disc 202 and the pressure component 203. For example, the base 201 has a settlement area 2011, and the curvature test disc 202 is a circular tooling, which is composed of a plurality of annular sub-test discs nested and combined with each other, fixed in the settlement area of ​​the base 201 by bolts, and can move with the slide slot H on the base 201 to provide different bending radii for the tested cable 30. In addition, there is a protruding structure 2012 on the side of the settlement area 2011, and the pressure component 203 (such as a spring damper) is arranged on the protruding structure 2012, which is used to limit and tighten the tested cable 30, so that the tested cable 30 can be completely and tightly fitted to the curvature test disc 202, so as to measure the real and accurate bending radius data. At the same time, the relationship between the deformation and pressure of the spring damper can be calibrated in advance, so as to measure the performance influence of different pressures on the tested cable 30 under any cable bending radius.

[0074] The end of the tested cable 30 can be integrally encapsulated in the T-shaped connecting terminal 204 by soldering, and the lead connection hole Y of the connecting terminal 204 is used to fix the current lead, provide a stable electrical connection for the tested cable 30, and also ensure the stability of the cable end during the subsequent test process to prevent the tested cable 30 from twisting. In addition, a pressure strip 205 is also provided on the connecting terminal 204, and the specific position of the connecting terminal 204 can be fixed by bolts and the slit on the side of the base 201. The use of the pressure strip 205 and the pressure component 203 can ensure that the overall position of the end of the tested cable 30 is fixed. After the tested cable is installed, no matter how the cable testing device is moved, it will not cause damage to the tested cable 30, and the tested cable 30 can be protected to the greatest extent.

[0075] When performing a bending test on the cable 30 under test, the end of the prepared cable 30 under test can be first encapsulated in the connection terminal 204 by soldering, and the direction of the connection terminal 204 is ensured not to be twisted. Then, the cable 30 under test and the connection terminal 204 are placed around the arc side of the curvature test plate 202 in the settlement area of ​​the base 201, and the two connection terminals 204 are placed in parallel, and then all the pressure components 203 are tightened to fix the cable 30 under test. Then, the pressure strip 205 is fixed to complete the assembly of the cable 30 under test before the flow is passed.

[0076] In the case where the tested cable 30 is a high-temperature superconducting cable, since the high-temperature superconducting cable needs to work in a low-temperature environment, the current flow test process of the tested cable 30 also needs to be performed in a low-temperature environment. For example, after the tested cable 30 and the cable testing device are assembled, the cable testing device with the tested cable 30 fixed thereon can be placed in a low-temperature medium (for example, liquid nitrogen, liquid helium), and the tested cable 30 is cooled to a superconducting state by the low-temperature medium, and then the power is turned on to start the actual test.

[0077] In the embodiment of the present application, the performance test of the tested cable 30 can be performed under various curvature bending conditions, such as winding the tested cable 30 around different sub-test discs in the curvature test disc 202 to achieve bending of different curvatures. For each curvature, the assembly method of the tested cable 30 and the cable testing device is the same. In the case where the tested cable 30 is a high-temperature superconducting cable, when a test is completed and the curvature needs to be adjusted to continue testing the tested cable 30, the cable testing device and the tested cable 30 can be taken out of the low-temperature medium, and the assembly method of the tested cable 30 and the cable testing device can be adjusted based on the next curvature to be tested, and after the adjustment is completed, the tested cable 30 is put into the low-temperature medium again for testing.

[0078] The cable testing device provided in the embodiment of the present application has a simpler overall structure and is easy to operate. The addition of a pressure-applying component (such as a spring damper) can realize bending tests on flexible cables of different diameters and cross-sections, and can also test the effects of different pressures on the performance of the tested cable in a bent state. By connecting the terminal and the pressure strip, the end of the tested cable can be well fixed to achieve the purpose of protecting the cable during the test.

[0079] Figure 5 1 is a flow chart of a cable testing method provided in an embodiment of the present application. The method can be applied to any of the above-mentioned cable testing devices, and the method can be cross-referenced with the above-mentioned introduction to the cable testing device. Figure 5 As shown, the method includes the following steps 502 to 506.

[0080] Step 502: Wind the cable to be tested around the curved side surface of the curvature test plate in the cable testing device.

[0081] When testing the cable under test, the curvature required for the cable under test can be determined first, and based on this, a curved side with a suitable curvature can be selected for the curvature test plate. By way of example, the curvature test plate includes sub-test plates that can provide curved sides with different curvatures, respectively, and a suitable sub-test plate can be selected for testing the cable under test. For example, for the cable under test, the performance test under each curvature can be carried out in order from small to large, and the curved side provided by each sub-test plate from the outside to the inside of the curvature test plate can be used to bend the cable under test accordingly. After the test for a certain curvature is completed, the corresponding sub-test plate can be removed to bend the cable using the curved side provided by the next sub-test plate, and the corresponding test can be carried out. The following introduces the process of testing the cable under test for any curved side of curvature that can be provided by the curvature test plate.

[0082] In the embodiment of the present application, the cable testing device includes a connecting terminal and a pressure strip, and the connecting terminal and the pressure strip are used to assist in fixing the cable under test. Accordingly, in step 502, the cable under test is wound around the arc-shaped side of the curvature test disk in the cable testing device, including: fixing the two ends of the cable under test to the two connecting terminals respectively; winding the cable under test fixed to the connecting terminals around the arc-shaped side of the curvature test disk in the cable testing device, and placing the two connecting terminals in parallel; pressing the pressure strip on the connecting terminal and connecting it to the base to press the connecting terminal tightly, so that the cable under test is in a taut state.

[0083] For example, for Figure 3 In the cable testing device shown, after placing two connection terminals 204 in parallel, the pressure strip 205 is passed through the card slot C on either side and extended into the other card slot C on the other side, so that the two ends of the pressure strip 205 are respectively located in the two card slots C. The pressure strip 205 is moved above the connection terminal 204. Then, a screw is passed through the opening in the middle of the pressure strip 205 to connect it to the base 201, and a nut is put on the screw on the side of the pressure strip 205 away from the base 201, and the nut is tightened downward to apply pressure to the pressure strip 205, so that the pressure strip 205 presses the connection terminal 204 and fixes the position of the connection terminal 204.

[0084] In an embodiment of the present application, the cable testing device may include a plurality of pressure components, and the plurality of pressure components surround the curved side surface of the curvature test product. After the tested cable is wound around the curved side surface of the curvature test disk in the cable testing device, the cable testing method provided in the embodiment of the present application further includes: controlling the plurality of pressure components to move toward the tested cable, limiting the position of the tested cable, and then fixing the connection terminal. In this way, the stability of the bending state of the cable can be ensured.

[0085] Step 504: Control the pressure-applying component in the cable testing device to apply a target pressure to the curved portion of the cable under test from the outside of the cable under test.

[0086] For the cable under test, the performance of any position on it when it is bent and under pressure can be tested according to specific needs. In this way, when the cable under test is wrapped around the curved side and is in a bent state, the pressure-applying component corresponding to the position can be controlled to apply pressure to the cable under test. Step 504 may include: controlling any one of the multiple pressure-applying components to apply a target pressure to the bent portion of the cable under test from the outside of the cable under test. Applying pressure to the cable under test can simulate the state of stress concentration at a certain position of the cable under test during actual use. By testing this state, the stress condition that the cable under test can withstand can be determined. By way of example, the target pressure applied by the pressure-applying component to the cable under test can be gradually increased to test the performance of the cable under test under different pressures when it is bent.

[0087] In the embodiment of the present application, the pressure-applying component may be a spring damper, and the distance from the protruding structure of the base to the tested cable can be controlled by twisting the spring damper to adjust the applied pressure. The deformation of the spring in the spring damper has a certain relationship with the pressure applied by it, and the current applied pressure can be determined by the deformation of the spring.

[0088] Step 506 , power on the tested cable, detect the performance parameters of the tested cable, and obtain the test result of the tested cable when it is bent according to the curvature corresponding to the arc-shaped side surface and subjected to the target pressure.

[0089] In an embodiment of the present application, after the cable under test and the cable testing device are assembled, the lead of the external power supply can be connected to the end of the cable under test, such as fixing the lead of the external power supply to the lead connection hole of the connecting terminal. Afterwards, the cable under test is powered on through the connecting terminal using the lead, and the performance parameters of the cable under test are tested during the power-on process. For example, the performance parameters include the current of the cable under test and the voltage at each position. Based on the performance parameters, the test results of the current state of the cable under test (such as the state of being bent according to the curvature corresponding to the arc-shaped side and subjected to the target pressure) can be obtained.

[0090] After a test, you can also adjust at least one of the factors including the degree of bending of the tested cable, the target pressure applied to the tested cable, and the position where the pressure is applied to the tested cable, and then conduct the next test to test the performance of the tested cable under different conditions. If you need to adjust the degree of bending of the tested cable, you can remove the pressure strip, loosen the pressure component, and move the curvature test disk to make the tested cable relaxed. Then adjust the curvature test disk, such as removing certain sub-test disks, replacing sub-test disks, or adding sub-test disks. You can also rewind the tested cable around the adjusted curvature test disk, move the adjusted curvature test disk to a suitable position, adjust the pressure component, set the pressure strip to fix the connection terminal, and control the specific pressure component to apply the target pressure to the tested cable. Then re-perform the current flow test on the tested cable.

[0091] If the cable under test is a high-temperature superconducting cable, then after assembly, the cable testing device with the cable under test fixed thereon can be placed in a low-temperature medium (e.g., liquid nitrogen, liquid helium), and the cable under test can be cooled to a superconducting state using the low-temperature medium. Current is then transmitted to the connecting terminals in the cable testing device, and the current is transmitted to the cable under test through the connecting terminals, thereby measuring various performance indicators of the cable under test 30.

[0092] In summary, in the embodiment of the present application, the cable testing device includes a curvature test plate and a pressure component, and the pressure component is located outside the curved side of the curvature test plate, and the tested cable can be bent around the curved side, and the pressure component applies pressure to the curved part of the tested cable from the outside. In this way, the performance of the tested cable can be directly tested when it is bent according to the curvature corresponding to the curved side and under pressure, without the need to perform bending test and pressure test separately and then integrate them, which can improve the accuracy of performance testing and test efficiency.

[0093] The above describes specific embodiments of the present application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the embodiments and still achieve the desired results. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0094] Those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the present application. In the above embodiments, the description of each embodiment has its own emphasis, and for parts not described in detail in a certain embodiment, reference can be made to the relevant description of other embodiments.

[0095] The preferred embodiments of the present application disclosed above are only used to help explain the present application. The optional embodiments do not describe all the details in detail, nor do they limit the present application to the specific implementation methods described. Obviously, many modifications and changes can be made according to the content of the present application. The present application selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present application, so that those skilled in the art can understand and use the present application well.

Claims

1. A cable testing device, characterized in that: include: Base, curvature test plate and pressure member; The base is used to carry the curvature test disc and the pressure-applying component, the curvature test disc has an arc-shaped side surface, and the pressure-applying component is located outside the arc-shaped side surface; The cable under test can be wound around the arcuate side surface, and the pressure applying component is used to apply pressure to the bent portion of the cable under test from the outside of the cable under test, so as to test the cable under test in a state where it is bent according to the curvature corresponding to the arcuate side surface and subjected to pressure.

2. The cable testing device according to claim 1, characterized in that: It comprises a plurality of pressure-applying components, which surround at least a portion of the arc-shaped side surface and are used to apply pressure to different points in the tested cable.

3. The cable testing device according to claim 1, characterized in that: The base has a settling area and a raised structure surrounding the settling area; The curvature test disc is located in the settling area; The pressure-applying component is disposed in the protruding structure and can extend from the protruding structure toward the curvature test disk to apply pressure to the tested cable wound on the curvature test disk.

4. The cable testing device according to any one of claims 1 to 3, characterized in that: It also includes connection terminals and pressure strips; The connecting terminal is arranged on the base, the pressing strip is connected to the base, and presses the connecting terminal from a side of the connecting terminal away from the base; The end of the tested cable is fixed to the connecting terminal and is electrically connected to an external power source through the connecting terminal.

5. The cable testing device according to claim 4, characterized in that: The base has a settling area and a raised structure surrounding the settling area; The curvature test plate, the tested cable and the connecting terminal are located in the settlement area; A slot is provided on the side of the raised structure, the end of the pressure strip extends into the slot, and the middle position of the pressure strip is connected to the settlement area through a connecting piece; the portion of the pressure strip located between the slot and the connecting piece is used to press the connecting terminal.

6. The cable testing device according to claim 4, characterized in that: The connecting terminal is T-shaped, and comprises a first strip portion and a second strip portion connected to each other, wherein the second strip portion protrudes from the first strip portion in a direction away from the base; The first strip portion has a receiving hole for receiving and fixing the end of the tested cable; The second strip portion has a lead connection hole for arranging a lead connected to the external power source; The pressing strip is pressed on a surface of the first strip portion away from the base.

7. The cable testing device according to any one of claims 1 to 3, characterized in that: The curvature test plate comprises a plurality of sub-test plates which are nested and detachable with each other, and the sub-test plates have curved edges; the curved side surface of the curvature test plate is the curved edge of the sub-test plate which is located outside the plurality of sub-test plates, and the plurality of sub-test plates are used to provide the curved side surfaces with different curvatures; And / or, the base has a slide groove, and the curvature test disc is connected to the slide groove and can move along the slide groove; and / or, the pressure applying member comprises a spring damper; And / or, the cable under test includes a high-temperature superconducting cable.

8. A cable testing method, characterized in that: Applied to the cable testing device according to any one of claims 1 to 7, the method comprising: Winding the tested cable around the curved side of the curvature test plate in the cable testing device; Controlling a pressure-applying component in the cable testing device to apply a target pressure to a curved portion of the cable under test from the outside of the cable under test; Power is supplied to the tested cable to detect performance parameters of the tested cable, and a test result is obtained when the tested cable is bent according to the curvature corresponding to the arc-shaped side surface and subjected to the target pressure.

9. The method according to claim 8, characterized in that The cable testing device comprises a plurality of pressure applying components, and the plurality of pressure applying components surround the arc-shaped side surface; After the tested cable is wound around the curved side surface of the curvature test disk in the cable testing device, the method further comprises: Controlling the multiple pressure-applying components to move toward the tested cable to limit the position of the tested cable; The controlling the pressure applying component in the cable testing device to apply a target pressure to the bending portion of the tested cable from the outside of the tested cable comprises: Any one of the plurality of pressure applying members is controlled to apply a target pressure to a bent portion of the cable under test from an outer side of the cable under test.

10. The method according to claim 8, characterized in that The cable testing device further includes a connecting terminal and a pressure strip; the cable to be tested is wound around the arc-shaped side surface of the curvature testing disk in the cable testing device, including: Fixing the two ends of the tested cable to the two connecting terminals respectively; Winding the tested cable fixed with the connecting terminal around the arc-shaped side surface of the curvature test plate in the cable testing device, and placing the two connecting terminals in parallel; The pressing strip is pressed onto the connecting terminal and connected to the base to press the connecting terminal tightly.

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