Ultrafast compression imaging system testing method and device based on ns-level dynamic light-emitting object

Abstract

The invention discloses an ultra-fast compression imaging system testing method and device based on an ns-level dynamic light-emitting object, and solves the problem that in the prior art, experimental conditions of the ns-level dynamic light-emitting object are lacked in the research process of the ultra-fast compression imaging technology. The controllable ns-level light-emitting diode array established by combining the ns-level light-emitting diode array and the pulse signal source is adopted, a dynamic light-emitting object to be shot with the time scale covering from the ns level to the s level can be generated, experimental conditions for performance testing can be provided for research of the ultrafast compression imaging technology, and compared with a performance verification mode only through numerical simulation, the performance verification method has the advantages that the performance verification efficiency is improved, and the cost is reduced. And the real application effect of the ultrafast compression imaging system can be verified.

Description

Technical Field

[0001] The present invention relates to an experimental method and device for ultrafast compressed imaging technology research, and particularly to a test method and device for an ultrafast compressed imaging system based on ns-level dynamic light-emitting objects. Background Art

[0002] Ultrafast compressed imaging technology is a technology that widens the slit of a streak camera, cooperates with coding, and then uses compressed sensing technology to achieve hundreds of high-time-resolution two-dimensional images in a single shot. It is of great significance for studying ultrafast phenomena in the fields of physics, chemistry, biomedicine, etc. In recent years, ultrafast compressed imaging technology has developed rapidly, and a large amount of work has been carried out in improving image quality such as spatial resolution. However, related work is usually verified through numerical simulation experiments, but due to experimental conditions limitations, there is a lack of experimental verification. Therefore, it cannot fully and truly reflect the performance of the system. Solving the experimental conditions for compressed imaging technology research is of great significance for promoting the development of compressed imaging technology. At present, however, no report has proposed a method and device for generating ns-level dynamic light-emitting objects specifically for experimental research on ultrafast compressed imaging technology. Summary of the Invention

[0003] In order to solve the technical problem of the lack of experimental conditions for ns-level dynamic light-emitting objects in the process of researching ultrafast compressed imaging technology in the prior art, the present invention provides a test method and device for an ultrafast compressed imaging system based on ns-level dynamic light-emitting objects.

[0004] In order to achieve the above object, the present invention adopts the following technical solutions:

[0005] A test method for an ultrafast compressed imaging system based on ns-level dynamic light-emitting objects, characterized in that it includes the following steps:

[0006] Step 1, arranging an ns-level light-emitting diode array based on the shape characteristics of the dynamic light-emitting object to be photographed;

[0007] Step 2, connecting the drive signal output end of the pulse signal source to each ns-level light-emitting diode in the ns-level light-emitting diode array, and connecting the trigger signal output end of the pulse signal source to the signal input end of the ultrafast compressed imaging system to be tested;

[0008] Step 3, connecting a computer to the signal output end of the ultrafast compressed imaging system to be tested;

[0009] Step 4, starting the pulse signal source, so that the pulse signal source sends a drive signal to the ns-level light-emitting diode array with a light-emitting timing relationship and a light-emitting intensity relationship matching the dynamic light-emitting object to be photographed, and at the same time sends a trigger signal to the ultrafast compressed imaging system to be tested;

[0010] Step 5: The ns-level light-emitting diode array emits light according to the above-mentioned light-emitting timing relationship and light intensity relationship. Meanwhile, the ultrafast compressive imaging system to be tested captures the light-emitting diode array according to the above-mentioned light-emitting timing relationship and sends the captured image to the computer;

[0011] Step 6: The computer performs restoration processing on the captured image to obtain a sequence of images of the ns-level light-emitting diode array during the light-emitting process. The relevant performance parameters of the ultrafast compressive imaging system to be tested for the dynamic light-emitting object to be captured are obtained using this sequence of images, and the test of the ultrafast compressive imaging system to be tested is completed.

[0012] Further, step 1 is specifically as follows: Based on the shape characteristics of the dynamic light-emitting object to be captured, the ns-level light-emitting diode array is arranged with each ns-level light-emitting diode as a pixel unit.

[0013] Further, step 1 is specifically as follows: Based on the shape characteristics of the dynamic light-emitting object to be captured, the ns-level light-emitting diode array is arranged with each ns-level light-emitting diode as all or part of the dynamic light-emitting object to be captured.

[0014] Further, in step 1, the ns-level light-emitting diode array is arranged on a connection circuit board;

[0015] Step 2 is specifically as follows: The drive signal output terminal of the pulse signal source is connected to each ns-level light-emitting diode in the ns-level light-emitting diode array through the connection circuit board, and the trigger signal output terminal of the pulse signal source is connected to the signal input terminal of the ultrafast compressive imaging system to be tested.

[0016] An ultrafast compressive imaging system test device based on an ns-level dynamic light-emitting object, which is used for the above-mentioned ultrafast compressive imaging system test method based on an ns-level dynamic light-emitting object, is characterized in that:

[0017] It includes an ns-level light-emitting diode array composed of multiple ns-level light-emitting diodes, a pulse signal source, and a computer;

[0018] The multiple ns-level light-emitting diodes in the ns-level light-emitting diode array are arranged according to the shape characteristics of the dynamic light-emitting object to be captured;

[0019] The drive signal output terminal of the pulse signal source is connected to each ns-level light-emitting diode in the ns-level light-emitting diode array, and the trigger signal output terminal of the pulse signal source is used to connect to the signal input terminal of the ultrafast compressive imaging system to be tested;

[0020] The computer is used to connect to the signal output end of the ultrafast compressive imaging system to be tested, so as to perform restoration processing on the captured images output by it, obtain a sequence of images of the ns-level light-emitting diode array during the light-emitting process, and use this sequence of images to obtain the relevant performance parameters of the ultrafast compressive imaging system to be tested when used for the dynamic light-emitting object to be photographed.

[0021] Further, the driving signal output end of the pulse signal source includes a plurality of, each driving signal output end is respectively connected to an ns-level light-emitting diode, or each driving signal output end is respectively connected to a plurality of ns-level light-emitting diodes, or some of the driving signal output ends among the plurality of driving signal output ends are respectively connected to an ns-level light-emitting diode, and the other part of the driving signal output ends are respectively connected to a plurality of ns-level light-emitting diodes.

[0022] Further, it further includes a connection circuit board;

[0023] The ns-level light-emitting diode array is arranged on the connection circuit board; the driving signal output end of the pulse signal source is connected to each ns-level light-emitting diode in the ns-level light-emitting diode array through the connection circuit board.

[0024] Further, the pulse signal source is a pulse signal generator.

[0025] Advantages of the present invention:

[0026] 1. The ultrafast compressive imaging system test method and device based on ns-level dynamic light-emitting objects provided by the present invention adopt a controllable ns-level light-emitting diode array established by combining an ns-level light-emitting diode array and a pulse signal source, which can generate a dynamic light-emitting object to be photographed with a time scale covering from the ns magnitude to the s level, and can provide experimental conditions for performance testing of ultrafast compressive imaging technology. Compared with the performance verification method only through numerical simulation, it can better verify the actual application effect of the ultrafast compressive imaging system.

[0027] 2. In the ultrafast compressive imaging system test method based on ns-level dynamic light-emitting objects provided by the present invention, two ways of generating dynamic light-emitting objects are proposed, namely using a single ns-level light-emitting diode as a single pixel unit and as all or part of the light-emitting object. The first way can solve the problem of generating complex light-emitting objects, and the second way can solve the problem of generating simple light-emitting objects in a more concise way. The two ways can be flexibly selected according to the actual situation. The first way can more accurately simulate the dynamic light-emitting object to be photographed, making the test results of the ultrafast compressive imaging system more accurate, and the second way can obtain test results more efficiently.

[0028] 3. The test method and device for an ultrafast compressed imaging system based on ns-level dynamic light-emitting objects provided by the present invention can generate dynamic light-emitting objects that can simulate the dynamic light-emitting process with combined spatial, temporal, and intensity variations. In addition, the emission wavelength of the light-emitting diode can be set as needed. Therefore, it can be applied to the establishment of simulation experimental conditions for many scenarios and has a relatively wide application range.

[0029] 4. The test method and device for an ultrafast compressed imaging system based on ns-level dynamic light-emitting objects provided by the present invention, while providing an ns-level driving signal for the light-emitting diode, also provides multiple channels of synchronous trigger signals, which can provide synchronous trigger signals with an accurate light-emitting timing relationship with the ns-level light-emitting diode for carrying out the test of the ultrafast compressed imaging system, solve the synchronization problem between the light-emitting object and the ultrafast compressed imaging system to be tested, and facilitate the development of experiments. Description of the Drawings

[0030] Figure 1 is a schematic structural diagram of an embodiment of a test device for an ultrafast compressed imaging system based on ns-level dynamic light-emitting objects of the present invention;

[0031] Figure 2 is a schematic structural diagram in which each driving signal output terminal of the pulse signal source in the embodiment of the present invention is respectively connected to an ns-level light-emitting diode;

[0032] Figure 3 is a schematic structural diagram in which some driving signal output terminals of the pulse signal source in the embodiment of the present invention are connected to multiple ns-level light-emitting diodes;

[0033] Figure 4 is an image of the light-emitting process captured by the streak camera for the ns-level light-emitting diode in the embodiment of the present invention;

[0034] Figure 5 is a time-integrated image of the light-emitting process captured by the image intensifier camera for the ns-level light-emitting diode in the embodiment of the present invention.

[0035] Reference Numerals in the Drawings:

[0036] 1 - ns-level light-emitting diode array, 2 - pulse signal source, 3 - computer, 4 - ultrafast compressed imaging system to be tested, 5 - connection circuit board. Detailed Embodiments

[0037] Next, the technical solutions of the present invention will be clearly and completely described in conjunction with the drawings and embodiments. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0038] An ultrafast compressive imaging system test device based on ns-level dynamic light-emitting objects provided by an embodiment of the present invention is as follows Figure 1 shown. The device includes an ns-level light-emitting diode array 1, a pulse signal source 2, a computer 3, and a connection circuit board 5. The ns-level light-emitting diode array 1 is arranged and welded on the connection circuit board 5 according to the characteristics of the dynamic light-emitting object to be generated (i.e., the shape characteristics of the dynamic light-emitting object to be photographed). The connection circuit board 5 provides a circuit and a driving signal interface for the ns-level light-emitting diode array 1. Each ns-level light-emitting diode in the ns-level light-emitting diode array 1 can select a specific emission wavelength or band as needed, such as red light, blue light, or green light. When the spatial and temporal characteristics of the dynamic light-emitting object to be photographed are relatively complex, such as the light-emitting area being an irregular pattern and the pattern changing continuously over time, each single ns-level light-emitting diode can be used as a pixel unit. By arranging the ns-level light-emitting diodes into a pixel array, a dynamic light-emitting object with any complex shape characteristics can be generated; when the spatial and temporal characteristics of the dynamic light-emitting object to be photographed are relatively simple, such as the light-emitting area being a regular circle or rectangle, etc., and the pattern change law over time is simple, a single ns-level light-emitting diode can be used as all or part of the dynamic light-emitting object to be photographed, and a single or multiple ns-level light-emitting diodes generate a simple dynamic light-emitting object.

[0039] As Figure 2 and Figure 3 shown, the driving signal output end of the pulse signal source 2 includes multiple ones, and each driving signal output end is respectively connected to an ns-level light-emitting diode. Then, each driving signal of the pulse signal source 2 can independently drive an ns-level light-emitting diode; alternatively, each driving signal output end is respectively connected to multiple ns-level light-emitting diodes, or some of the driving signal output ends among the multiple driving signal output ends are respectively connected to an ns-level light-emitting diode, and the other part of the driving signal output ends are respectively connected to multiple ns-level light-emitting diodes. Then, some driving signals drive multiple ns-level light-emitting diodes simultaneously; one or more pulse signals with adjustable time and amplitude are output according to the characteristics of the dynamic light-emitting object to be photographed. Time adjustment can adjust the light-emitting timing of the light-emitting diode, and amplitude adjustment can adjust the light-emitting intensity of the light-emitting diode.

[0040] The trigger signal can trigger the streak camera scanning circuit, image intensifier, and recording camera of the ultrafast compressive imaging system 4 to be measured. It can also trigger devices such as the image intensifier type camera used for algorithm restoration constraint in the ultrafast compressive imaging system 4 to be measured.

[0041] The pulse signal source 2 provides corresponding drive signals for each ns-level light-emitting diode according to the light-emitting timing relationship and light-emitting intensity relationship that match the dynamic light-emitting object to be photographed. At the same time, a trigger signal is synchronously provided for the ultrafast compressive imaging system 4 to be measured. After being driven by the drive signal, the ns-level light-emitting diode array 1 becomes an ns-level dynamic light-emitting object. The trigger signal triggers the ultrafast compressive imaging system 4 to be measured to synchronously detect and record the ns-level dynamic light-emitting object, providing experimental conditions for the research on ultrafast compressive imaging technology.

[0042] As Figure 1 shown, the ns-level light-emitting diodes in the array 1 can be arranged in a triangle on the connection circuit board 5. One ns-level light-emitting diode is placed in the first row, two ns-level light-emitting diodes are placed in the second row, three ns-level light-emitting diodes are placed in the third row, and four ns-level light-emitting diodes are placed in each of the fourth and fifth rows. The interval time for each row of ns-level light-emitting diodes to start emitting light is about 10 ns, the light-emitting duration of each row of ns-level light-emitting diodes is about 20 ns, and the ns-level light-emitting diodes in the same row are driven by the same drive signal. The ns-level light-emitting diode array 1 is imaged onto the ultrafast compressive imaging system 4 to be measured. During the test, while the pulse signal source 2 provides drive signals for multiple ns-level light-emitting diodes, a trigger signal is synchronously provided for the ultrafast compressive imaging system 4 to be measured. By controlling the timing relationship of the signals given, it is ensured that the light-emitting action of the ns-level light-emitting diode array 1, the stripe camera in the ultrafast compressive imaging system 4 to be measured scans to obtain the compressive image of the entire light-emitting process of the ns-level light-emitting diode array 1 (as Figure 4 shown), the image intensifier camera used for image restoration constraint in the ultrafast compressive imaging system 4 to be measured obtains the integral image of the entire light-emitting process of the ns-level light-emitting diode array 1 (as Figure 5 shown), and the obtained images are sent to the computer 3. The computer 3 can obtain the sequence images of the light-emitting process of the ns-level light-emitting diode array 1 after being processed by the image restoration algorithm. The specific operation steps are as follows:

[0043] Step 1: Based on the shape characteristics of the dynamic light-emitting object to be photographed, arrange the ns-level light-emitting diode array 1 on the connection circuit board 5 with each ns-level light-emitting diode as a pixel unit, or arrange the ns-level light-emitting diode array 1 on the connection circuit board 5 with each ns-level light-emitting diode as all or part of the dynamic light-emitting object to be photographed.

[0044] Step 2: Connect the drive signal output terminal of the pulse signal source 2 to each ns-level light-emitting diode in the ns-level light-emitting diode array 1 through the connection circuit board 5, and connect the trigger signal output terminal of the pulse signal source 2 to the signal input terminal of the ultrafast compressive imaging system 4 to be measured;

[0045] Step 3: Connect the computer 3 to the signal output terminal of the ultrafast compressive imaging system 4 to be measured;

[0046] Step 4: Start the pulse signal source 2. The pulse signal source 2 sends a driving signal to the ns-level light-emitting diode array 1 according to the light-emitting timing relationship and light-emitting intensity relationship that match the dynamic light-emitting object to be photographed, and at the same time sends a trigger signal to the ultrafast compressive imaging system 4 to be measured;

[0047] Step 5: The ns-level light-emitting diode array 1 emits light according to the light-emitting timing relationship and light-emitting intensity relationship. At the same time, the ultrafast compressive imaging system 4 to be measured photographs the light-emitting diode array 1 according to the light-emitting timing relationship, and sends the photographed image to the computer 3;

[0048] Step 6: Perform restoration processing on the photographed image through the computer 3 to obtain a sequence of images of the light-emitting process of the ns-level light-emitting diode array 1. Use this sequence of images to obtain the relevant performance parameters of the ultrafast compressive imaging system 4 to be measured when used for the dynamic light-emitting object to be photographed, and complete the test of the ultrafast compressive imaging system to be measured.

[0049] As described above, it is only the specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any change or replacement within the technical scope disclosed by the present invention should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claimed rights.

Claims

1. A method for testing an ultrafast compressed imaging system based on ns-level dynamic luminous objects, characterized in that: The following steps are involved: Step 1: Arranging a ns-level light-emitting diode array (1) based on the shape characteristics of the dynamic light-emitting object to be photographed; Step 2, connecting the driving signal output end of the pulse signal source (2) to each ns-level light-emitting diode in the ns-level light-emitting diode array (1), and connecting the trigger signal output end of the pulse signal source (2) to the signal input end of the ultrafast compression imaging system (4) to be tested; Step 3, connecting the computer (3) to the signal output terminal of the ultrafast compression imaging system (4) to be tested; Step 4, starting the pulse signal source (2), so that the pulse signal source (2) sends a driving signal to the ns-level light-emitting diode array (1) with a light-emitting timing relationship and a light-emitting intensity relationship that match the dynamic light-emitting object to be photographed, and simultaneously sends a trigger signal to the ultrafast compression imaging system (4) to be tested; Step 5, the ns-level light emitting diode array (1) emits light according to the light emitting timing relationship and the light emitting intensity relationship, and at the same time, the ultrafast compression imaging system to be tested (4) photographs the light emitting diode array (1) according to the light emitting timing relationship, and sends the photographed image to the computer (3); Step 6: The captured images are restored by a computer (3) to obtain a sequence of images of the luminescence process of the ns-level light-emitting diode array (1), and the sequence of images is used to obtain relevant performance parameters of the ultrafast compression imaging system (4) to be tested when used for the dynamic luminous object to be photographed, thereby completing the test of the ultrafast compression imaging system to be tested.

2. The method for testing an ultrafast compressed imaging system based on a ns-level dynamic luminous object according to claim 1, characterized in that: Step 1 specifically comprises arranging an ns-level light-emitting diode array (1) with each ns-level light-emitting diode as a pixel unit based on the shape characteristics of the dynamic light-emitting object to be photographed.

3. The method for testing an ultrafast compressed imaging system based on a ns-level dynamic luminous object according to claim 1, characterized in that: Step 1 specifically comprises, based on the shape characteristics of the dynamic luminous object to be photographed, arranging an ns-level light emitting diode array (1) with each ns-level light emitting diode representing all or part of the dynamic luminous object to be photographed.

4. The method for testing an ultrafast compressed imaging system based on a ns-level dynamic luminous object according to claim 2 or 3, characterized in that: In step 1, the ns-level light-emitting diode array (1) is arranged on a connecting circuit board (5); Step 2 specifically comprises connecting the driving signal output end of the pulse signal source (1) to each ns-level light-emitting diode in the ns-level light-emitting diode array (1) via a connecting circuit board (5), and connecting the trigger signal output end of the pulse signal source (2) to the signal input end of the ultrafast compression imaging system (4) to be tested.

5. A test device for an ultrafast compression imaging system based on a ns-level dynamic luminous object, used in the test method for an ultrafast compression imaging system based on a ns-level dynamic luminous object according to any one of claims 1 to 4, characterized in that: It comprises a ns-level light emitting diode array (1) composed of a plurality of ns-level light emitting diodes, a pulse signal source (2) and a computer (3); The plurality of ns-level light-emitting diodes in the ns-level light-emitting diode array (1) are arranged according to the shape characteristics of the dynamic light-emitting object to be photographed; The driving signal output end of the pulse signal source (2) is connected to each ns-level light-emitting diode in the ns-level light-emitting diode array (1), and the trigger signal output end of the pulse signal source (2) is used to connect to the signal input end of the ultrafast compression imaging system (4) to be tested; The computer (3) is used to connect to the signal output end of the ultrafast compression imaging system (4) to be tested, so as to restore the captured images outputted by the system, obtain a sequence of images of the luminescence process of the ns-level light-emitting diode array (1), and use the sequence of images to obtain relevant performance parameters of the ultrafast compression imaging system (4) to be tested when used for the dynamic luminous object to be photographed.

6. The ultrafast compression imaging system test device based on ns-level dynamic luminous objects according to claim 5, characterized in that: The pulse signal source (2) includes a plurality of drive signal output terminals, each of which is connected to a ns-level light-emitting diode, or each of which is connected to a plurality of ns-level light-emitting diodes, or some of the plurality of drive signal output terminals are connected to a ns-level light-emitting diode, and the other portion of the drive signal output terminals are connected to a plurality of ns-level light-emitting diodes.

7. The ultrafast compression imaging system testing device based on ns-level dynamic luminous objects according to claim 6, characterized in that: Also includes a connecting circuit board (5); The ns-level light-emitting diode array (1) is arranged on a connecting circuit board (5); the driving signal output end of the pulse signal source (2) is connected to each ns-level light-emitting diode in the ns-level light-emitting diode array (1) via the connecting circuit board (5).

8. The ultrafast compression imaging system testing device based on ns-level dynamic luminous objects according to any one of claims 5 to 7, characterized in that: The pulse signal source (2) is a pulse signal generator.

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