Antenna testing device and antenna testing system

Abstract

The invention provides an antenna testing device and an antenna testing system. The test antenna device comprises a first dielectric substrate, one surface of the first dielectric substrate comprises a first area and a second area, and the second area surrounds the first area; the radiation units are arranged in the first area and the second area in an array mode in a preset arrangement mode, and the preset arrangement mode corresponds to the arrangement mode of the antennas on the antenna array; the plurality of second dielectric substrates are stacked on the other surface, far away from the plurality of radiation units, of the first dielectric substrate; and the plurality of power dividers are arranged among the plurality of second dielectric substrates, and the plurality of power dividers are connected to the radiation unit located in the first area. The test antenna device provided by the invention can improve the test correction speed of the antenna array.

Description

Technical Field

[0001] The present invention relates to the technical field of antennas, and in particular, to a test antenna device and an antenna test system. Background Art

[0002] In the related art, a near-field one-to-one antenna is often used to test and calibrate an antenna to be tested. However, this method has the problem of low efficiency. Especially in a large phased antenna array, its test and calibration speed is severely limited. For example, when a phased antenna array has 1024 radiation units, the antenna needs to transmit and receive test and calibration 1024 times each, and the displacement of the antenna must also be accurately moved. This obviously greatly affects the test and calibration speed of the antenna array. Summary of the Invention

[0003] In view of the above, the present invention provides a test antenna device and an antenna test system, which can improve the test and calibration speed of an antenna array.

[0004] A first aspect of the present application provides a test antenna device for testing an antenna array. The test antenna device includes: a first dielectric substrate, one surface of the first dielectric substrate includes a first region and a second region, and the second region surrounds the first region; a plurality of radiation units, arranged in an array in a preset arrangement manner in the first region and the second region, and the preset arrangement manner corresponds to the arrangement manner of the antenna radiation units on the antenna array; a plurality of second dielectric substrates, stacked on the other surface of the first dielectric substrate away from the plurality of radiation units; a plurality of power dividers, arranged between the plurality of second dielectric substrates, and the plurality of power dividers are connected to the radiation units located in the first region.

[0005] In an embodiment, the radiation units located in the first region among the plurality of radiation units are used to transmit signals or receive signals, and the radiation units located in the second region among the plurality of radiation units are grounded.

[0006] In an embodiment, the plurality of radiation units include loop antennas.

[0007] In an embodiment, the preset arrangement manner includes: in each two rows of radiation units, each radiation unit in one row is misaligned between two radiation units in the other row to form a triangular arrangement manner.

[0008] In an embodiment, the plurality of power dividers are connected to the radiation units located in the first region.

[0009] In an embodiment, the radiation units in the second region are grounded through a load, and the load is arranged between the plurality of second dielectric substrates.

[0010] In an embodiment, the load is a 50-ohm resistor.

[0011] The second aspect of the present application provides an antenna test system for testing an antenna array. The antenna test system includes the test antenna device described in any one of the above.

[0012] In one embodiment, the antenna test system further includes a network analyzer. The network analyzer includes a radio frequency output port and a radio frequency input port. The radio frequency output port is connected to a plurality of power dividers, and the radio frequency input port is connected to the signal input port of the antenna array; or the radio frequency output port is connected to the signal input port of the antenna array, and the radio frequency input port is connected to a plurality of power dividers.

[0013] In one embodiment, the preset arrangement of a plurality of radiation units corresponds to the arrangement of the antenna radiation units on the antenna array to be tested.

[0014] The test antenna device provided by the present application includes a first dielectric substrate, a plurality of radiation units, a plurality of second dielectric substrates, and a plurality of power dividers. Among them, the surface of the first dielectric substrate includes a first region and a second region, and the second region surrounds the first region. A plurality of radiation units are arranged in an array in the first region and the second region in a preset arrangement. In this way, the environment of the radiation units arranged in the first region is the same. Also, a plurality of power dividers are connected to the radiation units arranged in the first region among the plurality of radiation units to provide an input signal. In this way, the signal intensity and signal phase of the signals excited by the radiation units arranged in the first region among the plurality of radiation units have high consistency, meeting the design requirements of multiple test antenna devices, and can simultaneously test and correct multiple antennas on the antenna array, improving the test and correction efficiency. Further, a plurality of second dielectric substrates are stacked on the side of the first dielectric substrate away from the plurality of radiation units, and a plurality of power dividers are arranged between the plurality of second dielectric substrates, which can reduce the area of the test antenna device. Description of the Drawings

[0015] Figure 1 It is a schematic diagram when the antenna test system provided by an embodiment of the present application tests and corrects the antenna array.

[0016] Figure 2 It is a schematic structural diagram of the test antenna device provided by an embodiment of the present application presented in the XZ plane.

[0017] Figure 3 It is Figure 2 A schematic diagram of the first dielectric substrate in the test antenna device shown presented in the XY plane.

[0018] Figure 4 It is Figure 3 A schematic diagram of one radiation unit among a plurality of radiation units in the embodiment.

[0019] Figure 5ASchematic diagram of a radiation unit provided by another embodiment of the present application.

[0020] Figure 5B Schematic diagram of a radiation unit provided by another embodiment of the present application.

[0021] Figure 6 Schematic diagram of a plurality of power dividers connecting the radiation units located in the first region among a plurality of radiation units provided by one embodiment of the present application.

[0022] Figure 7 Schematic diagram of a plurality of power dividers connecting the radiation units located in the first region among a plurality of radiation units provided by another embodiment of the present application.

[0023] Figure 8 Schematic diagram of a cascade circuit structure formed by connecting a plurality of power dividers in one embodiment of the present application.

[0024] Figure 9 Schematic diagram of a test antenna device including 6 sensing radiation units and 2 ground radiation units in one embodiment of the present application.

[0025] Figure 10 For Figure 9 Schematic diagram of the power intensity of the S parameters measured by the 6 sensing radiation units shown.

[0026] Figure 11 For Figure 9 Schematic diagram of the phase of the S parameters measured by the 6 sensing radiation units shown.

[0027] Figure 12 Schematic diagram of a test antenna device including only 6 sensing radiation units in one embodiment of the present application.

[0028] Figure 13 For Figure 12 Schematic diagram of the power intensity of the S parameters measured by the 6 sensing radiation units shown.

[0029] Figure 14 For Figure 12 Schematic diagram of the phase of the S parameters measured by the 6 sensing radiation units shown.

[0030] Figure 15 For Figure 9 Schematic diagram when the third sensing radiation unit tests and calibrates one of the antennas on the antenna array.

[0031] Figure 16 For Figure 15 Graph of the transmission coefficient between the third sensing radiation unit in [] and the antennas RT1 to RT6 of the antenna array.

[0032] Figure 17 For Figure 2 Schematic diagram of the isolation curve between the seventh sensing radiation unit and the other six adjacent sensing radiation units in

[0033] Figure 18 Schematic diagram of a patch antenna provided by an embodiment of the present application.

[0034] Figure 19 Schematic diagram of a slot antenna provided by an embodiment of the present application.

[0035] Figure 20 Schematic diagram of the isolation curve between the central loop antenna and the other loop antennas among seven loop antennas.

[0036] Figure 21 Schematic diagram of the isolation curve between the central patch antenna and the other patch antennas among seven patch antennas.

[0037] Figure 22 Schematic diagram of the isolation curve between the central slot antenna and the other slot antennas among seven slot antennas.

[0038] Figure 23 First arrangement diagram of several radiation units and the corresponding antenna array provided by an embodiment of the present application.

[0039] Figure 24 Second arrangement diagram of several radiation units and the corresponding antenna array provided by an embodiment of the present application.

[0040] Figure 25 Third arrangement diagram of several radiation units and the corresponding antenna array provided by an embodiment of the present application.

[0041] Description of main component symbols

[0042] Test antenna devices 10, 10a, 10b, 10c

[0043] First dielectric substrate 110

[0044] Ground via 111

[0045] Clearance area 112

[0046] Ground post 114

[0047] First region 1101

[0048] Second region 1102

[0049] Radiation unit 120

[0050] Loop antennas 121, 121a, 121b

[0051] Radiating parts 1211, 1211a, 1211b

[0052] Ground parts 1212, 1212a, 1212b

[0053] Feeding parts 1213, 1213a, 1213b, 1233

[0054] Load 1214

[0055] Patch antenna 122

[0056] Conductive patch 1221

[0057] Feeding point 1223

[0058] Slot antenna 123

[0059] Slot 113

[0060] Second dielectric substrate 130

[0061] Power divider 140

[0062] Connection port 1411

[0063] Antenna arrays 20, 20a, 20b, 20c

[0064] Antenna radiation units 210, 210a

[0065] Signal port 220

[0066] Network analyzer 30

[0067] RF output port 31

[0068] RF input port 32

[0069] First slide rail 41

[0070] Second slide rail 42

[0071] Antenna test system 100

[0072] The following specific embodiments will further illustrate the present invention in conjunction with the above drawings. Specific embodiments

[0073] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0074] It should be noted that when an element is referred to as being "electrically connected" to another element, it can be directly on the other element or there can also be an intermediate element. When an element is considered to be "electrically connected" to another element, it can be a contact connection. For example, it can be in the form of a wire connection, or a non-contact connection. For example, it can be in the form of non-contact coupling.

[0075] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which the present invention belongs. The terms used in the description of the present invention herein are only for the purpose of describing specific embodiments, and are not intended to limit the present invention.

[0076] The following will describe in detail some embodiments of the present invention with reference to the accompanying drawings. Without conflict, the embodiments and features in the following embodiments can be combined with each other.

[0077] In the related art, a near-field one-to-one test antenna is often used to test and calibrate the antenna to be tested. However, this method has the problem of low efficiency. Especially in a large phased antenna array, its test and calibration speed is severely limited. For example, when the phased antenna array has 1024 radiation units, the test antenna needs to transmit and receive test and calibration 1024 times each, and the displacement of the test antenna must also be accurately moved. This obviously greatly affects the test and calibration speed of the antenna array.

[0078] Based on this, the present application provides a test antenna device for testing an antenna array and can improve the test and calibration speed of the antenna array.

[0079] First, please refer to Figure 1 , the present application provides an antenna test system 100, including a test antenna device 10 and a network analyzer 30. The test antenna device 10 is used to receive the signal radiated by the antenna array 20 to be tested, or to radiate a signal to the antenna array 20 to be tested. The network analyzer 30 is used to obtain the test data generated by the test antenna device 10 or the antenna array 20 for analysis, so as to test and calibrate the antenna array 20.

[0080] Please refer to Figure 2 to FIG. 5 together. The test antenna device 10 includes a first dielectric substrate 110 and a plurality of radiation units 120 arranged in an array (seeFigure 3 ) and a plurality of second dielectric substrates 130 and a plurality of power dividers 140 (see Figure 6 and Figure 7 ).

[0081] Please refer to Figure 2 and Figure 3 together. A plurality of radiation units 120 are disposed on one surface of the first dielectric substrate 110. Please refer to Figure 2 , Figure 6 and Figure 7 together. A plurality of power dividers 140 are disposed between the plurality of second dielectric substrates 130.

[0082] Please continue to refer to Figure 3 . One surface of the first dielectric substrate 110 includes a first region 1101 and a second region 1102, and the second region 1102 surrounds the first region 1101. Specifically, in this embodiment, the second region 1102 is generally located in the edge region of the first dielectric substrate 110, and the first region 1101 is located in the region inside the second region 1102. That is to say, the second region 1102 is located around the first region 1101 and surrounds the first region 1101.

[0083] A plurality of radiation units 120 are arranged in an array in a preset arrangement manner in the first region 1101 and the second region 1102. That is to say, a plurality of radiation units 120 are arranged in an array in a preset arrangement manner on one surface of the first dielectric substrate 110, and a part of the plurality of radiation units 120 is located on the first region 1101, and another part of the plurality of radiation units 120 is located on the second region 1102. Among them, the plurality of radiation units 120 located in the first region 1101 and the plurality of radiation units 120 located in the second region 1102 are the same radiation units. The difference is that the plurality of radiation units 120 located in the first region 1101 (hereinafter referred to as sensing radiation units) are used to transmit signals or receive signals, and the plurality of radiation units 120 located in the second region 1102 (hereinafter referred to as grounding radiation units) are grounded. In this way, by arranging the grounding radiation units around the sensing radiation units, each sensing radiation unit in the plurality of radiation units 120 can have adjacent radiation units (that is, each sensing radiation unit has adjacent sensing radiation units and / or grounding radiation units). That is to say, through such a design, the radiation units arranged in the edge area of the first region 1101 among the plurality of radiation units 120 are also surrounded by grounding radiation units, so that the environment of the radiation units arranged in the center of the first region 1101 among the plurality of radiation units 120 is the same as that of the radiation units arranged in the edge of the first region 1101, and finally the intensity (Amplitude) and phase (Phase) of the signals output by each sensing radiation unit have a highly consistent effect.

[0084] Please refer to Figure 4 , Figure 4 which is Figure 3 a schematic diagram of any one of a plurality of radiation units 120 in Figure 4 . Each of the plurality of radiation units 120 may be the loop antenna 121 shown in Figure 18 . In other embodiments, the radiation units among the plurality of radiation units 120 may also be other types of antennas, such as Figure 19 the patch antenna 122 shown in

[0085] , the slot antenna 123 shown in

[0085] , etc.

[0085] Specifically, the loop antenna 121 may be a loop patch antenna disposed on a surface of the first dielectric substrate 110. Among them, the loop antenna 121 includes a radiation portion 1211, a grounding portion 1212, and a feeding portion 1213. The radiation portion 1211 is substantially a circular microstrip line with one end open. Both the grounding portion 1212 and the feeding portion 1213 are substantially straight microstrip lines. Both the grounding portion 1212 and the feeding portion 1213 are disposed within the circle formed by the radiation portion 1211. One end of the grounding portion 1212 is connected to one end of the opening of the radiation portion 1211. The feeding portion 1213 is connected to the other end of the opening of the radiation portion 1211. The grounding portion 1212 can be connected to the ground pin 114 through a plurality of corresponding vias (not shown in the figure) on the first dielectric substrate 110 and a plurality of second dielectric substrates 130 for grounding. The feeding portion 1213 can also be connected to a plurality of power distributors 140 through a plurality of corresponding vias (not shown in the figure) on the first dielectric substrate 110 and a plurality of second dielectric substrates 130 to receive or transmit corresponding radio frequency signals.

[0086] A plurality of grounding vias 111 are also formed on the first dielectric substrate 110. The plurality of grounding vias 111 are disposed around the loop antenna 121. In this way, the plurality of grounding vias 111 pass through the first dielectric substrate 110 and a plurality of second dielectric substrates 130 for grounding to form a clearance area 112. Understandably, in the Z-axis direction of the first dielectric substrate 110, no electronic devices are disposed within the clearance area 112. In this way, the loop antenna 121 is disposed within the clearance area 112, which can significantly reduce interference. Moreover, since the loop antenna 121 is disposed within the clearance area 112, after the loop antenna 121 receives current through the feeding portion 1213, the current can be concentrated in the loop antenna 121, thereby reducing the coupling with other loop antennas 121 and improving the isolation of each radiation unit.

[0087] Understandably, when each of the plurality of radiation units 120 is a loop antenna, the present application does not limit the specific shape of the loop antenna. For example, please refer to Figure 5A, in other embodiments, each of the plurality of radiation units 120 may also be a loop antenna 121a. Among them, the loop antenna 121a has substantially the same structure as the loop antenna 121, and also includes a radiation portion 1211a, a grounding portion 1212a, and a feeding portion 1213a. The difference is that both sides of the radiation portion 1211a of the loop antenna 121A are recessed toward the center of the loop antenna 121A.

[0088] For another example, please refer to Figure 5B , in other embodiments, each of the plurality of radiation units 120 may also be a loop antenna 121b. Among them, the loop antenna 121b has substantially the same structure as the loop antenna 121, and includes a radiation portion 1211b, a grounding portion 1212b, and a feeding portion 1213b. The difference is that the grounding portion 1212b and the feeding portion 1213b of the loop antenna 121b are formed by extending a certain distance from both ends of the opening of the radiation portion 1211b in a direction away from the center of the loop antenna 121b. And the radiation portion 1211b also protrudes outward.

[0089] It can be understood that the present application does not limit the specific shape of the loop antenna 121. In other embodiments, the loop antenna may also be of other shapes.

[0090] Please refer to again Figure 1 , the antenna array 20 to be measured includes a plurality of antenna radiation units 210. When the test antenna device 10 is used to test and correct the antenna array 20, the side of the test antenna device 10 provided with the plurality of radiation units 120 needs to face the antenna array 20, and all the sensing radiation units and the same number of corresponding antenna radiation units 210 on the antenna array 20 need to correspond one by one, so as to realize the signal transceiving between the corresponding antenna radiation units 210 among all the sensing radiation units and the plurality of antenna radiation units 210. In this way, the preset arrangement of the plurality of radiation units 120 corresponds to the arrangement of the antenna radiation units 210 on the antenna array 20 to be measured.

[0091] Please refer to again Figure 3, for example, in this embodiment, corresponding to the arrangement of the antenna radiation units 210 on the antenna array 20, the preset arrangement of several radiation units 120 includes that in every two rows of radiation units 120, each radiation unit 120 in one row is arranged in a staggered manner between two radiation units 120 in the other row, so that any three radiation units 120 form a triangular arrangement. The present application does not limit the preset arrangement of several radiation units 120, as long as the preset arrangement of several radiation units 120 is the same as the arrangement of the antenna radiation units 210 on the antenna array 20 to be measured. For example, in other embodiments, corresponding to the arrangement of the antenna radiation units 210 on the antenna array 20 to be measured, the preset arrangement can also be that several radiation units 120 are arranged in a square, circular or diamond shape, etc.

[0092] Please refer to again Figure 2 , several second dielectric substrates 130 are stacked on the other surface of the first dielectric substrate 110 away from several radiation units 120.

[0093] Please refer to together Figure 6 and Figure 7 , Figure 6 and Figure 7 are respectively schematic diagrams of the connection relationship between several power dividers 140 and several radiation units 120 from the first perspective in two embodiments of the present application. Among them, the first perspective is the perspective seen from the YZ plane obtained by cutting the test antenna device 10 in the middle. As Figure 6 and Figure 7 shown, several power dividers 140 are arranged between several second dielectric substrates 130. In some embodiments, as Figure 6 shown, when several second dielectric substrates 130 include one second dielectric substrate 130, several power dividers 140 can be arranged on the side of the second dielectric substrate 130 close to the first dielectric substrate 110. In some embodiments, as Figure 7As shown, when several second dielectric substrates 130 include multiple layers of second dielectric substrates 130, several power dividers 140 can also be disposed between the multiple layers of second dielectric substrates 130, such as between three layers of second dielectric substrates 130. The several power dividers 140 are connected to the radiation units located in the first region 1101 among the several radiation units 120. That is, the several power dividers 140 are respectively connected to the feeding portions of the several sensing radiation units. The radiation units among the several radiation units 120 located in the second region 1102 are grounded through the loads 1214. That is, the feeding portion 1213 of each grounded radiation unit is grounded through the load 1214. Wherein, the load 1214 can be a resistor with a resistance value of 50 ohms. And the load 1214 can be disposed between the several second dielectric substrates 130. The present application does not limit the specific electronic components of the load 1214. For example, in other embodiments, the load 1214 can include at least one of a resistor, a capacitor, and an inductor.

[0094] Please refer to Figure 6 , in some embodiments, several power dividers 140 are connected in parallel to the radiation units located in the first region 1101 among the several radiation units 120. That is, the several power dividers 140 are connected in parallel to the several sensing radiation units. Specifically, the power divider 140 in the present application can be a Wilkinson Power Divider. The power divider 140 includes a first port and two second ports. The first port is connected to the radio frequency output port 31 of the network analyzer 30 (please refer to Figure 1 ) to receive the corresponding radio frequency signal, or the first port is connected to the radio frequency input port 32 to output the corresponding radio frequency signal to the network analyzer 30. Each second port is respectively connected to the feeding portion 1213 of the corresponding sensing radiation unit. For example, in the present embodiment, each second port is respectively connected to the feeding portion of the corresponding loop antenna 121 serving as a sensing radiation unit. The power divider 140 is configured to divide the energy of the radio frequency signal input through the first port into two feeding signals with equal energy and output them through the second ports. Thus, the energy of the feeding signal of each sensing radiation unit in the present application is the same. Or the power divider 140 is configured to collect the signals received by the two second ports and output them through the first port.

[0095] Please refer to Figure 7 , in some embodiments, multiple power dividers 140 can also be connected in sequence to form a cascade circuit structure to feed the feeding signals with the same energy to each sensing radiation unit. Specifically, Figure 7Taking the cascaded circuit structure shown as an example, in the first-stage circuit, the first port of the power divider 140 is used to connect to the RF output port, and the two second ports are respectively connected to the first ports of the other two power dividers 140. In the second-stage circuit, the four second ports of the two power dividers 140 are respectively connected to the first ports of the four power dividers 140. And so on, the number of power dividers 140 in the last-stage circuit is half of the number of sensing radiation units among several radiation units 120. For example, please refer to Figure 8 , Figure 8 FIG. Figure 8 is a schematic diagram of a cascaded circuit structure formed by connecting multiple power dividers 140 in an embodiment of the present application. Among them, the first port of the power divider 140 in the first-stage circuit serves as the connection port 1411. The connection port 1411 is used to connect to the RF output port 31 or the RF input port 32. It can be understood that each stage of the cascaded circuit structure can be respectively disposed on each of several second dielectric substrates 130. In this way, when receiving, the signals received by all sensing radiation units can be integrated at the connection port 1411 and output to the network analyzer 30 through the RF input port 32; when transmitting, the energy of the RF signal output from the RF output port 31 is evenly output to each sensing radiation unit through the connection port 1411.

[0096] It can be understood that in other embodiments, the power divider 140 can be not only a Wilkinson Power Divider, but also other types or a combination of other multiple types of power dividers, as long as the energy of the RF signal fed into each sensing radiation unit is the same in the end. The present application does not limit the type of the power divider 140.

[0097] It can be understood that when performing the test and calibration of the antenna array, mainly the two parameters of the phase and power intensity of the antenna array are tested and calibrated. In the prior art, a single sensing antenna is used to test the antenna array, so there is no problem of phase and power intensity consistency for a single sensing antenna. However, the test antenna device 10 proposed in the present application includes several sensing radiation units. If there are already phase or power intensity deviations among the several sensing radiation units, it will cause distortion when the test antenna device 10 performs the test and calibration on the antenna array 20. Therefore, the phase and power intensity of the several sensing radiation units in the test antenna device 10 should be kept highly consistent.

[0098] Please refer to Figure 9 , in this embodiment, in order to reduce the complexity of the test data and improve the readability of the test data, only Figure 9Taking the S-parameter test data of the illustrated test antenna device including six sensing radiation units (e.g., the first sensing radiation unit P1 to the sixth sensing radiation unit P6) and two ground radiation units as an example, the radiation characteristics of the test antenna device provided by the present application are described. Among them, Figure 9 The two illustrated ground radiation units are arranged on the upper and lower sides of the six sensing radiation units, so that each of the six sensing radiation units is arranged between the two radiation units, that is, the environment of the six sensing radiation units is the same. Figure 10 And Figure 11 Respectively are Figure 9 The schematic diagram of the power intensity of the S-parameters measured by the six illustrated sensing radiation units and the schematic diagram of the phase of the S-parameters. According to Figure 10 And Figure 11 It can be seen that Figure 9 The power intensity and phase of the signals excited by the sensing radiation units of the illustrated test antenna device have high consistency. This also shows that the return loss and output effect of each sensing radiation unit in the test antenna device 10 provided by the present application can maintain high consistency. Thus, the test antenna device 10 meets the design requirements for testing and calibrating the antenna array 20.

[0099] Please continue to refer to Figures 12 to 14 , as Figure 12 Illustrated, six sensing radiation units without ground radiation units are used for comparison. Figure 13 And Figure 14 Respectively are Figure 12 The schematic diagram of the power intensity of the S-parameters measured by the six illustrated sensing radiation units and the schematic diagram of the phase of the S-parameters. According to Figure 13 And Figure 14 It can be seen that Figure 13 And Figure 14 The consistency of the power intensity and phase of the signals excited by the illustrated sensing radiation units is poor. In particular, the first sensing radiation unit P1 and the sixth sensing radiation unit P6 arranged on the upper and lower sides respectively, due to the change of the surrounding environment, make the power intensity (please refer to curve S131 and curve S132) and phase (please refer to curve S141 and curve S142) of the S-parameters of the first sensing radiation unit P1 and the sixth sensing radiation unit P6 deviate far from those of other sensing radiation units. Obviously, according to Figures 9 to 11 , compared with Figures 12 to 14 , it can be seen that the test antenna device 10 provided with ground radiation units and sensing radiation units has higher consistency of the power intensity and phase of the signals and is more suitable for testing the antenna array 20. This also shows that the test antenna device 10 provided by the present application can effectively improve the consistency of the power intensity and phase of the signals of the sensing radiation units in the first region 1101 through the radiation units provided in the second region 1102.

[0100] Please refer to again Figure 1 , Understandably, when using the test antenna device 10 to test the antenna array 20, the sensing radiation units on the test antenna device 10 need to perform signal transmission and reception one-to-one with the antenna radiation units 210 on the antenna array 20, so as to better obtain the data of the corresponding antenna radiation units 210 on the corresponding antenna array 20, and then perform corresponding test correction. That is to say, there should be a higher coupling between each sensing radiation unit on the test antenna device 10 and the corresponding antenna radiation unit 210, and there should be a higher isolation between adjacent sensing radiation units. In this way, for the transmission or reception characteristics of each antenna radiation unit 210 on the corresponding antenna array 20 by the test antenna device 10, the interference generated by the mutual coupling between the radiation units in the test antenna device 10 can be reduced, thereby improving the test correction accuracy.

[0101] Please continue to refer to Figures 15 to 16 , Figure 15 Yes Figure 9 is a schematic diagram showing signal transmission and reception between the third sensing radiation unit P3 on the test antenna device shown and the antennas RT1 to RT6 on the antenna array. Figure 16 is a curve graph of the transmission coefficient between the third sensing radiation unit P3 and the antennas RT1 to RT6. Among them, the curve S161 is the transmission coefficient curve between the third sensing radiation unit P3 and the antenna RT1. The curve S162 is the transmission coefficient curve between the third sensing radiation unit P3 and the antenna RT2. The curve S163 is the transmission coefficient curve between the third sensing radiation unit P3 and the antenna RT3. The curve S164 is the transmission coefficient curve between the third sensing radiation unit P3 and the antenna RT4. The curve S165 is the transmission coefficient curve between the third sensing radiation unit P3 and the antenna RT5. The curve S166 is the transmission coefficient curve between the third sensing radiation unit P3 and the antenna RT6. From Figure 15 it can be seen that the transmission coefficient between the third sensing radiation unit P3 and the antenna RT3 is relatively high, while the transmission coefficients of the third sensing radiation unit P3 to the antennas RT1, RT2, RT4, RT5 and RT6 are relatively low. And in the LEO Ku frequency band, the difference between the transmission coefficient between the third sensing radiation unit P3 and the antenna RT3 and the transmission coefficients between the third sensing radiation unit P3 and other antennas reaches more than 15 dB. Thus, it shows that each sensing radiation unit on the test antenna device 10 provided in the present application has better independence, and the coupling between each sensing radiation unit and the corresponding antenna is better, meeting the design requirements for testing the antenna array 20.

[0102] Please refer to together Figure 3 and Figure 17 ,Figure 17 The Figure 3 schematic diagram of the isolation curve between the seventh sensing radiation unit P7 and the other six sensing radiation units (the eighth sensing radiation unit P8 to the thirteenth sensing radiation unit P13) on the first dielectric substrate 110. Among them, the curve S171 is the isolation curve between the seventh sensing radiation unit P7 and the eighth sensing radiation unit P8. The curve S172 is the isolation curve between the seventh sensing radiation unit P7 and the ninth sensing radiation unit P9. The curve S173 is the isolation curve between the seventh sensing radiation unit P7 and the tenth sensing radiation unit P10. The curve S174 is the isolation curve between the seventh sensing radiation unit P7 and the eleventh sensing radiation unit P11. The curve S175 is the isolation curve between the seventh sensing radiation unit P7 and the twelfth sensing radiation unit P12. The curve S176 is the isolation curve between the seventh sensing radiation unit P7 and the thirteenth sensing radiation unit P13. Understandably, the isolation index represents the degree of mutual influence between the sensing radiation units. From Figure 17 it can be seen that the isolation between the seventh sensing radiation unit P7 and the eighth sensing radiation unit P8 to the thirteenth sensing radiation unit P13 is all below -22 dB. Thus, it shows that in the test antenna device 10 provided in this application, the degree of mutual influence between each sensing radiation unit is small, and the isolation is large, which can meet the design requirements of multi-antenna test calibration.

[0103] Understandably, in other embodiments, the plurality of radiation units 120 may further include other types of antennas, such as Figure 18 the patch antenna 122 shown, Figure 19 the slot antenna 123 shown, etc.

[0104] Please refer to Figure 18 and Figure 19 together, where when the radiation unit on the first dielectric substrate 110 is the patch antenna 122 or the slot antenna 123, a ground via 111 is provided on the first dielectric substrate 110 to form a clearance area 112. And the patch antenna 122 and the slot antenna 123 are both arranged in the clearance area 112.

[0105] Specifically, the patch antenna 122 includes a conductive patch 1221 that is generally circular. And a feeding point 1223 is provided on the conductive patch 1221.

[0106] The slot antenna 123 includes a slot 113 and a feeding portion 1233. The slot 113 is opened in the clearance area 112 of the first dielectric substrate 110. The projections of the feeding portion 1233 and the slot 113 in the Z-axis direction at least partially overlap. Thus, after receiving the feeding signal, the feeding portion 1233 can couple the feeding signal to the slot 113.

[0107] Please refer to Figures 20 to 22 , Figure 20 Figure 7 shows the isolation curve between the loop antenna 121 located at the center position and other loop antennas when the 7 loop antennas 121 are arranged in the arrangement of the seventh sensing radiation unit P7 to the thirteenth sensing radiation unit P13 in Figure 3 . Figure 21 Figure 8 shows the isolation curve between the patch antenna 122 located at the center position and other patch antennas 122 when the 7 patch antennas 122 are arranged in the arrangement of the seventh sensing radiation unit P7 to the thirteenth sensing radiation unit P13 in Figure 2 . Figure 22 Figure 9 shows the isolation curve between the slot antenna 123 located at the center position and other slot antennas 123 when the 7 slot antennas 123 are arranged in the arrangement of the seventh sensing radiation unit P7 to the thirteenth sensing radiation unit P13 in Figure 2 . It can be seen from Figures 20 to 22 that the isolation between the loop antenna 121 located at the center position and other loop antennas 121 is less than -25 dB, the isolation between the patch antenna 122 located at the center position and other patch antennas 122 is less than -12 dB, and the isolation between the slot antenna 123 located at the center position and other slot antennas 123 is less than -14 dB.

[0108] In summary, the test antenna device 10 provided in the present application includes a first dielectric substrate 110, a plurality of radiation units 120, a plurality of second dielectric substrates 130, and a plurality of power dividers 140. Among them, the surface of the first dielectric substrate 110 includes a first region 1101 and a second region 1102, and the second region 1102 surrounds the first region 1101. The plurality of radiation units 120 are arranged in an array in the first region 1101 and the second region 1102 in a preset arrangement. In this way, the environment of the radiation units of the plurality of radiation units 120 arranged in the first region 1101 is the same. Also, the plurality of power dividers 140 are connected to the radiation units of the plurality of radiation units 120 arranged in the first region 1101 to provide an input signal. In this way, the signal intensity and signal phase of the signals excited by the radiation units of the plurality of radiation units 120 arranged in the first region 1101 have high consistency, meeting the design requirements of the multi-test antenna device, and can simultaneously perform test correction on multiple antenna radiation units 210 on the antenna array 20, improving the test correction efficiency. Further, the plurality of second dielectric substrates 130 are stacked on one side of the first dielectric substrate 110 away from the plurality of radiation units 120, and the plurality of power dividers 140 are arranged between the plurality of second dielectric substrates 130, which can reduce the area of the test antenna device 10.

[0109] Please refer to again Figure 1, the antenna test system for testing the antenna device, the network analyzer 30 includes a radio frequency output port 31 and a radio frequency input port 32. This application does not limit the number of the radio frequency output port 31 and the radio frequency input port 32 on the network analyzer 30. The antenna array 20 includes a signal port 220. Understandably, when performing signal transmission test calibration on the antenna array 20, the radio frequency output port 31 is connected to the signal port 220 of the antenna array 20, and the radio frequency input port 32 is connected to the input port of a plurality of power dividers 140 (or the connection port 1411 of the first-stage circuit in the cascaded circuit structure formed by a plurality of power dividers 140). In this way, after the antenna radiation units 210 on the antenna array 20 receive the electrical signal fed by the network analyzer 30, they can transmit signals externally and the signals are received by the radiation units of a plurality of radiation units 120 located in the first area 1101. After the radiation units of a plurality of radiation units 120 located in the first area 1101 receive the signals, the received return signals are output to the network analyzer 30 through a plurality of power dividers and the radio frequency input port, and the network analyzer 30 analyzes the return signals to obtain the transmission data of the antenna array 20.

[0110] When performing signal reception test calibration on the antenna array 20, the radio frequency output port 31 is connected to the input port of a plurality of power dividers 140 (or the connection port 1411 of the first-stage circuit in the cascaded circuit structure formed by a plurality of power dividers 140), and the radio frequency input port 32 is connected to the signal port 220 of the antenna array 20. In this way, after the radiation units of a plurality of radiation units 120 located in the first area 1101 receive the electrical signal fed by the network analyzer 30, they can transmit signals externally and the signals are received by a plurality of antenna radiation units 210 on the antenna array 20. After a plurality of antenna radiation units 210 on the antenna array 20 receive the signals, the received return signals are output to the network analyzer 30 through the signal port 220, and the network analyzer 30 analyzes the return signals to obtain the reception data of the antenna array 20.

[0111] The antenna test system 100 further includes a first slide rail 41, a second slide rail 42, a driving unit, and a processor (not shown in the figure). The driving unit is connected to the test antenna device 10. The driving unit 43 is configured to move according to a control instruction issued by the processor, so as to drive the test antenna device 10 to move on the first slide rail 41 or the second slide rail 42. Wherein, the first slide rail 41 and the second slide rail 42 may be perpendicular to each other, and the first slide rail 41 may be a horizontal axis slide rail, and the second slide rail 42 may be a vertical axis slide rail. Understandably, a plurality of positioning holes may also be formed on the first dielectric substrate 110 and the antenna array 20. Thus, by driving the test antenna device 10 to move, the positioning holes on the first dielectric substrate 110 are aligned with the corresponding positioning holes on the antenna array 20, so that the radiation units located in the first region 1101 among the plurality of radiation units 120 in the test antenna device 10 can be aligned with the same number of antenna radiation units 210 on the antenna array 20 for testing.

[0112] Understandably, corresponding to different antenna arrangements on the antenna array, the arrangements of the radiation units located in the first region 1101 among the plurality of radiation units 120 are also different. For example, please refer to Figures 23 to 25 together. When the arrangement of the antennas on the antenna array 20a is square, the radiation units located in the first region among the plurality of radiation units on the corresponding test antenna device 10a are also arranged in a square; when the arrangement of the antennas on the antenna array 20b is diamond-shaped, the radiation units located in the first region among the plurality of radiation units on the corresponding test antenna device 10b are also arranged in a diamond shape; when the arrangement of the antennas on the antenna array 20c is octagonal, the radiation units located in the first region among the plurality of radiation units on the corresponding test antenna device 10c are also arranged in an octagon.

[0113] The above embodiments are only used to illustrate the technical solutions of the present invention and not to limit them. Although the present invention has been described in detail with reference to the above preferred embodiments, those of ordinary skill in the art should understand that the technical solutions of the present invention can be modified or equivalently replaced without departing from the spirit and scope of the technical solutions of the present invention. Those skilled in the art can also make other changes within the spirit of the present invention for use in the design of the present invention, as long as they do not deviate from the technical effects of the present invention. These changes made according to the spirit of the present invention should all be included within the scope claimed by the present invention.

Claims

1. A test antenna device for testing an antenna array, characterized in that, it comprises: A first dielectric substrate, one surface of the first dielectric substrate includes a first region and a second region, and the second region surrounds the first region; A plurality of radiation units are arranged in an array in a preset arrangement manner on the first region and the second region, and the preset arrangement manner corresponds to the arrangement manner of the antenna radiation units on the antenna array; A plurality of second dielectric substrates are stacked on the other surface of the first dielectric substrate away from the plurality of radiation units; A plurality of power dividers are arranged between the plurality of second dielectric substrates, and the plurality of power dividers are connected to the radiation units located in the first region.

2. The test antenna device according to claim 1, characterized in that, The radiation units located in the first region among the plurality of radiation units are used to transmit signals or receive signals, and the radiation units located in the second region among the plurality of radiation units are grounded.

3. The test antenna device according to claim 1, characterized in that, The plurality of radiation units include loop antennas.

4. The test antenna device according to claim 1, characterized in that, The preset arrangement manner includes: in each two rows of the radiation units, each radiation unit in one row is misaligned between two radiation units in the other row to form a triangular arrangement manner.

5. The test antenna device according to claim 1, characterized in that, The plurality of power dividers are connected to the radiation units located in the first region.

6. The test antenna device according to claim 1, characterized in that, The radiation units in the second region are grounded through a load, and the load is arranged between the plurality of second dielectric substrates.

7. The test antenna device according to claim 6, characterized in that, The load is a 50-ohm resistor.

8. An antenna test system for testing an antenna array, characterized in that, The antenna test system includes the test antenna device according to any one of claims 1 to 7.

9. The antenna test system according to claim 8, characterized in that, The antenna test system further includes a network analyzer, the network analyzer includes a radio frequency output port and a radio frequency input port, the radio frequency output port is connected to the plurality of power dividers, and the radio frequency input port is connected to the signal input port of the antenna array; or the radio frequency output port is connected to the signal input port of the antenna array, and the radio frequency input port is connected to the plurality of power dividers.

10. The antenna test system according to claim 8, characterized in that, The preset arrangement manner of the plurality of radiation units corresponds to the arrangement manner of the antenna radiation units on the antenna array to be tested.

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